N74F125D [PHILIPS]

Bus Driver, 1-Func, 4-Bit, True Output, TTL, PDSO14;
N74F125D
型号: N74F125D
厂家: PHILIPS SEMICONDUCTORS    PHILIPS SEMICONDUCTORS
描述:

Bus Driver, 1-Func, 4-Bit, True Output, TTL, PDSO14

驱动 光电二极管 逻辑集成电路
文件: 总10页 (文件大小:83K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
INTEGRATED CIRCUITS  
74F125, 74F126  
Quad buffers (3-State)  
Product specification  
IC15 Data Handbook  
1989 March 28  
Philips  
Semiconductors  
Philips Semiconductors  
Product specification  
Quad buffers (3-State)  
74F125, 74F126  
FEATURE  
ORDERING INFORMATION  
High impedance NPN base inputs for reduced loading  
(20µA in High and Low states)  
COMMERCIAL RANGE  
= 5V ±10%,  
V
DESCRIPTION  
PKG DWG #  
CC  
T
amb  
= 0°C to +70°C  
14-pin plastic DIP  
14-pin plastic SO  
N74F125N, N74F126N  
N74F125D, N74F126D  
SOT27-1  
TYPICAL  
PROPAGATION  
DELAY  
TYPICAL  
SUPPLY CURRENT  
(TOTAL)  
TYPE  
SOT108-1  
74F125  
74F126  
5.0ns  
5.0ns  
23mA  
26mA  
INPUT AND OUTPUT LOADING AND FAN OUT TABLE  
PINS  
D0–D3  
DESCRIPTION  
74F (U.L.) HIGH/LOW  
LOAD VALUE HIGH/LOW  
20µA/20µA  
Data inputs  
1.0/0.033  
1.0/0.033  
1.0/0.033  
750/106.7  
OE0–OE3  
OE0–OE3  
Q0–Q3  
Output Enable inputs (active Low), 74F125  
Output Enable inputs (active High), 74F126  
Data outputs  
20µA/20µA  
20µA/20µA  
15mA/64mA  
NOTE: One (1.0) FAST unit load is defined as: 20µA in the High state and 0.6mA in the Low state.  
PIN CONFIGURATIONS  
74F126  
74F125  
OE0  
D0  
1
2
3
4
5
14  
V
OE0  
D0  
1
2
3
4
5
14  
V
CC  
CC  
13 OE3  
12 D3  
13 OE3  
12 D3  
Q0  
Q0  
OE1  
D1  
11 Q3  
OE1  
D1  
11 Q3  
10 OE2  
10 OE2  
Q1  
6
7
9
8
D2  
Q2  
Q1  
6
7
9
8
D2  
Q2  
GND  
GND  
SF00117  
SF00118  
LOGIC SYMBOLS  
74F126  
74F125  
2
5
9
12  
2
5
9
12  
D0  
D1  
D2  
D3  
D0  
D1  
D2  
D3  
1
1
4
OE0  
OE0  
OE1  
4
10  
13  
OE1  
OE2  
OE3  
10  
13  
OE2  
OE3  
Q1 Q1  
Q0 Q0  
Q1 Q1  
Q0 Q0  
8
11  
3
6
V
= Pin 14  
8
11  
3
6
V
= Pin 14  
CC  
CC  
GND = Pin 7  
GND = Pin 7  
SF00119  
SF00120  
2
March 28, 1989  
853–0341 96146  
Philips Semiconductors  
Product specification  
Quad buffers (3-State)  
74F125, 74F126  
IEC/IEEE SYMBOLS  
74F125  
74F126  
1
1
1
1
EN  
EN  
3
6
3
6
2
2
4
4
5
5
10  
9
10  
9
8
8
13  
12  
13  
12  
11  
11  
SF00121  
SF00122  
LOGIC DIAGRAMS  
74F125  
74F126  
1
1
2
OE0  
OE0  
D0  
3
3
6
2
4
Q0  
Q1  
Q2  
Q3  
Q0  
Q1  
Q2  
Q3  
D0  
OE1  
D1  
4
OE1  
D1  
6
8
5
5
10  
9
10  
9
OE2  
D2  
OE2  
D2  
8
13  
12  
13  
12  
OE3  
D3  
OE3  
D3  
11  
11  
V
= Pin 14  
V
= Pin 14  
CC  
CC  
GND = Pin 7  
GND = Pin 7  
SF00123  
SF00124  
FUNCTION TABLE, 74F125  
FUNCTION TABLE, 74F126  
I NPUTS  
OUTPUT  
Qn  
I NPUTS  
OUTPUT  
Qn  
OEn  
Dn  
OEn  
Dn  
L
L
H
L
H
X
L
H
Z
H
H
L
L
H
X
L
H
Z
NOTES TO THE FUNCTION TABLES:  
H = High voltage level  
L = Low voltage level  
X = Don’t care  
Z = High impedance “off” state  
ABSOLUTE MAXIMUM RATINGS  
(Operation beyond the limit set forth in this table may impair the useful life of the device.  
Unless otherwise noted these limits are over the operating free-air temperature range.)  
SYMBOL  
PARAMETER  
RATING  
UNIT  
V
Supply voltage  
Input voltage  
Input current  
–0.5 to +7.0  
–0.5 to +7.0  
–30 to +5  
V
V
CC  
IN  
V
I
IN  
mA  
V
V
Voltage applied to output in High output state  
Current applied to output in Low output state  
Operating free-air temperature range  
Storage temperature range  
–0.5 to V  
OUT  
OUT  
CC  
I
128  
mA  
°C  
°C  
T
amb  
0 to +70  
T
stg  
–65 to +150  
3
March 28, 1989  
Philips Semiconductors  
Product specification  
Quad buffers (3-State)  
74F125, 74F126  
RECOMMENDED OPERATING CONDITIONS  
LIMITS  
SYMBOL  
PARAMETER  
UNIT  
MIN  
4.5  
NOM  
MAX  
V
Supply voltage  
5.0  
5.5  
V
V
CC  
IH  
IL  
V
V
High-level input voltage  
Low-level input voltage  
Input clamp current  
2.0  
0.8  
–18  
–15  
64  
V
I
I
I
mA  
mA  
mA  
°C  
IK  
High-level output current  
Low-level output current  
OH  
OL  
T
amb  
Operating free air temperature range  
0
+70  
DC ELECTRICAL CHARACTERISTICS  
(Over recommended operating free-air temperature range unless otherwise noted.)  
LIMITS  
1
SYMBOL  
PARAMETER  
TEST CONDITIONS  
UNIT  
2
MIN  
TYP  
MAX  
±10%V  
2.4  
2.7  
2.0  
2.0  
V
V
V
V
V
CC  
CC  
CC  
I
I
=–3mA  
OH  
V
V
V
= MIN,  
= MAX,  
= MIN  
CC  
IL  
±5%V  
3.3  
CC  
V
OH  
High-level output voltage  
±10%V  
±5%V  
IH  
=–15mA  
OH  
CC  
V
V
V
= MIN,  
= MAX,  
= MIN  
±10%V  
±5%V  
0.55  
CC  
IL  
V
V
Low-level output voltage  
I
= MAX  
OL  
OH  
0.42  
0.55  
–1.2  
100  
20  
V
IH  
CC  
Input clamp voltage  
V
V
V
V
= MIN, I = I  
IK  
–0.73  
V
IK  
CC  
CC  
CC  
CC  
I
I
I
I
Input current at maximum input voltage  
High-level input current  
= 0.0V, V = 7.0V  
µA  
µA  
µA  
I
I
= MAX, V = 2.7V  
IH  
IL  
I
Low-level input current  
= MAX, V = 0.5V  
–20  
I
Off-state output current,  
High-level voltage applied  
I
V
= MAX, V = 2.7V  
50  
µA  
µA  
OZH  
CC  
O
Off-state output current,  
Low-level voltage applied  
I
I
V
V
= MAX, V = 0.5V  
–50  
OZL  
CC  
O
3
Short circuit output current  
= MAX  
–100  
–225  
24  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
OS  
CC  
I
I
I
I
I
I
OEn = GND, Dn = 4.5V  
OEn = Dn = GND  
17  
28  
25  
20  
32  
26  
CCH  
CCL  
CCZ  
CCH  
CCL  
CCZ  
40  
74F125  
74F126  
V
CC  
= MAX  
= MAX  
OEn = Dn = 4.5V  
35  
I
Supply current (total)  
CC  
OEn = Dn = 4.5V  
30  
OEn = 4.5V, Dn = GND  
OEn = GND, Dn = 4.5V  
48  
V
CC  
39  
NOTES:  
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.  
2. All typical values are at V = 5V, T = 25°C.  
CC  
amb  
3. Not more than one output should be shorted at a time. For testing I , the use of high-speed test apparatus and/or sample-and-hold  
OS  
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting  
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any  
sequence of parameter tests, I tests should be performed last.  
OS  
4
March 28, 1989  
Philips Semiconductors  
Product specification  
Quad buffers (3-State)  
74F125, 74F126  
AC ELECTRICAL CHARACTERISTICS  
LIMITS  
V
= +5.0V  
= +25°C  
V
= +5.0V ± 10%  
= 0°C to +70°C  
CC  
CC  
TEST  
CONDITION  
SYMBOL  
PARAMETER  
T
amb  
T
amb  
UNIT  
C = 50pF, R = 500Ω  
C = 50pF, R = 500Ω  
L L  
L
L
MIN  
TYP  
MAX  
MIN  
MAX  
t
t
Propagation delay  
Dn to Qn  
2.0  
3.0  
4.0  
5.5  
6.0  
7.5  
2.0  
3.0  
6.5  
8.0  
PLH  
PHL  
Waveform 1  
ns  
ns  
ns  
ns  
ns  
ns  
t
t
Output Enable time  
to High or Low level  
Waveform 2  
Waveform 3  
3.5  
4.0  
5.5  
6.0  
7.5  
8.0  
3.5  
4.0  
8.5  
9.0  
PZH  
PZL  
74F125  
74F126  
t
t
Output Disable time  
from High or Low level  
Waveform 2  
Waveform 3  
1.5  
1.5  
3.5  
3.5  
5.0  
5.5  
1.5  
1.5  
6.0  
6.0  
PHZ  
PLZ  
t
t
Propagation delay  
Dn to Qn  
2.0  
3.0  
4.0  
5.5  
6.5  
8.0  
2.0  
3.0  
7.0  
8.5  
PLH  
PHL  
Waveform 1  
t
t
Output Enable time  
to High or Low level  
Waveform 2  
Waveform 3  
4.0  
4.0  
6.0  
6.0  
7.5  
8.0  
3.5  
3.5  
8.5  
8.5  
PZH  
PZL  
t
t
Output Disable time  
from High or Low level  
Waveform 2  
Waveform 3  
2.0  
3.0  
4.5  
5.5  
6.5  
7.5  
2.0  
3.0  
7.5  
8.0  
PHZ  
PLZ  
AC WAVEFORMS  
For all waveforms, V = 1.5V.  
M
OEn  
V
V
M
M
t
Dn  
V
V
M
t
M
OEn  
Qn  
t
PZL  
PLZ  
t
PLH  
PHL  
V
M
Qn  
V
V
M
M
V
+0.3V  
OL  
SF00125  
SF00127  
Waveform 1. Propagation Delay for Input to Output  
Waveform 3. 3-State Output Enable Time to Low Level and  
Output Disable Time from Low Level  
OEn  
OEn  
V
V
M
M
t
t
PZH  
PHZ  
V
–0.3V  
OH  
V
Qn  
M
0V  
SF00126  
Waveform 2. 3-State Output Enable Time to High Level and  
Output Disable Time from High Level  
5
March 28, 1989  
Philips Semiconductors  
Product specification  
Quad buffers (3-State)  
74F125, 74F126  
TEST CIRCUIT AND WAVEFORM  
V
CC  
t
w
AMP (V)  
90%  
7.0V  
90%  
NEGATIVE  
PULSE  
V
V
R
M
M
L
V
V
OUT  
IN  
10%  
10%  
PULSE  
GENERATOR  
D.U.T.  
0V  
t
t )  
t
t )  
THL ( f  
TLH ( r  
R
C
R
L
T
L
t
t )  
t
t )  
TLH ( r  
THL ( f  
AMP (V)  
0V  
90%  
M
90%  
POSITIVE  
PULSE  
V
V
M
Test Circuit for Open Collector Outputs  
10%  
10%  
t
w
SWITCH POSITION  
TEST  
SWITCH  
closed  
closed  
open  
Input Pulse Definition  
t
t
PLZ  
PZL  
All other  
DEFINITIONS:  
R
L
C
L
R
T
=
=
=
Load resistor;  
see AC electrical characteristics for value.  
Load capacitance includes jig and probe capacitance;  
see AC electrical characteristics for value.  
Termination resistance should be equal to Z  
pulse generators.  
INPUT PULSE REQUIREMENTS  
family  
V
M
rep. rate  
t
w
t
t
THL  
amplitude  
TLH  
of  
OUT  
2.5ns  
2.5ns  
74F  
3.0V  
1.5V  
1MHz  
500ns  
SF00128  
6
March 28, 1989  
Philips Semiconductors  
Product specification  
Quad buffers (3-State)  
74F125, 74F126  
DIP14: plastic dual in-line package; 14 leads (300 mil)  
SOT27-1  
7
1989 March 28  
Philips Semiconductors  
Product specification  
Quad buffers (3-State)  
74F125, 74F126  
SO14: plastic small outline package; 14 leads; body width 3.9 mm  
SOT108-1  
8
1989 March 28  
Philips Semiconductors  
Product specification  
Quad buffers (3-State)  
74F125, 74F126  
NOTES  
9
1989 March 28  
Philips Semiconductors  
Product specification  
Quad buffers (3-State)  
74F125, 74F126  
Data sheet status  
[1]  
Data sheet  
status  
Product  
status  
Definition  
Objective  
specification  
Development  
This data sheet contains the design target or goal specifications for product development.  
Specification may change in any manner without notice.  
Preliminary  
specification  
Qualification  
This data sheet contains preliminary data, and supplementary data will be published at a later date.  
Philips Semiconductors reserves the right to make chages at any time without notice in order to  
improve design and supply the best possible product.  
Product  
specification  
Production  
This data sheet contains final specifications. Philips Semiconductors reserves the right to make  
changes at any time without notice in order to improve design and supply the best possible product.  
[1] Please consult the most recently issued datasheet before initiating or completing a design.  
Definitions  
Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For  
detailed information see the relevant data sheet or data handbook.  
Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one  
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or  
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended  
periods may affect device reliability.  
Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips  
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or  
modification.  
Disclaimers  
Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can  
reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications  
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.  
RighttomakechangesPhilipsSemiconductorsreservestherighttomakechanges, withoutnotice, intheproducts, includingcircuits,standard  
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no  
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these  
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless  
otherwise specified.  
Philips Semiconductors  
811 East Arques Avenue  
P.O. Box 3409  
Copyright Philips Electronics North America Corporation 1998  
All rights reserved. Printed in U.S.A.  
Sunnyvale, California 94088–3409  
Telephone 800-234-7381  
print code  
Date of release: 10-98  
9397-750-05073  
Document order number:  
Philips  
Semiconductors  

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