ISL6142CB-T [RENESAS]

1-CHANNEL POWER SUPPLY SUPPORT CKT, PDSO14, PLASTIC, MS-012-AB, SOIC-14;
ISL6142CB-T
型号: ISL6142CB-T
厂家: RENESAS TECHNOLOGY CORP    RENESAS TECHNOLOGY CORP
描述:

1-CHANNEL POWER SUPPLY SUPPORT CKT, PDSO14, PLASTIC, MS-012-AB, SOIC-14

光电二极管
文件: 总23页 (文件大小:959K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
DATASHEET  
ISL6142, ISL6152  
Negative Voltage Hot Plug Controller  
FN9086  
Rev 1.00  
July 2004  
The ISL6142/52 are 14 pin, negative voltage hot plug  
controllers that allow a board to be safely inserted and  
removed from a live backplane. Inrush current is limited to a  
programmable value by controlling the gate voltage of an  
external N-channel pass transistor. The pass transistor is  
turned off if the input voltage is less than the Under-Voltage  
threshold, or greater than the Over-Voltage threshold. The  
PWRGD/PWRGD outputs can be used to directly enable a  
power module. When the Gate and DRAIN voltages are both  
considered good the output is latched in the active state.  
Typical Application  
GND  
Logic  
GND  
Supply  
V
DD  
FAULT  
PWRGD  
PWRGD  
DIS  
IS  
R10  
OUT  
R4  
R5  
R6  
ISL6142/ISL6152  
UV  
OV  
CT  
IS+ SENSE  
V
GATE DRAIN  
IS-  
EE  
LOAD  
R3  
C2  
C1  
The IntelliTripTM electronic circuit breaker and programmable  
current limit features protect the system against short  
circuits. When the Over-Current threshold is exceeded, the  
output current is limited for a time-out period before the  
circuit breaker trips and shuts down the FET. The time-out  
period is programmable with an external capacitor  
connected to the CT pin. If the fault disappears before the  
programmed time-out, normal operation resumes. In  
addition, the IntelliTripTM electronic circuit breaker has a fast  
Hard Fault shutdown, with a threshold set at 4 times the  
Over-Current trip point. When activated, the GATE is  
immediately turned off and then slowly turned back on for a  
single retry.  
R7  
CL  
RL  
R8  
R9  
C3  
R2  
-48V IN  
R1  
Q1  
-48V OUT  
C2 = 3.3nF (100V)  
C3 = 1500pF (25V)  
Q1 = IRF530  
CL = 100uF (100V)  
RL = Equivalent load  
R1 = 0.02  
(1%)  
R6 = 10K  
R7 = R8 = 400(1%)  
R9 = 4.99K  
R10 = 5.1K  
C1 = 150nF (25V)  
(1%)  
R2 = 10  
R3 = 18K  
R4 = 549K  
(5%)  
(5%)  
(1%)  
(1%)  
(1%)  
(10%)  
R5 = 6.49K  
Features  
• Operates from -20V to -80V (-100V Absolute Max Rating)  
• Programmable Inrush Current  
• Programmable Time-Out  
• Programmable Current Limit  
• Programmable Over-Voltage Protection  
• Programmable Under-Voltage Protection  
The IS+, IS-, and IS  
OUT  
pins combine to provide a load  
current monitor feature that presents a scaled version of the  
load current at the IS pin. Current to voltage conversion  
- 135 mV of hysteresis ~4.7V of hysteresis at the power  
supply  
OUT  
is accomplished by placing a resistor (R9) from IS  
negative input (-48V).  
to the  
OUT  
• V  
DD  
Under-Voltage Lock-Out (UVLO) ~ 16.5V  
• IntelliTripTM Electronic Circuit Breaker distinguishes  
between severe and moderate faults  
Related Literature  
- Fast shutdown for short circuit faults with a single retry  
(fault current > 4X current limit value).  
ISL6142/52EVAL1 Board Set, Document AN1000  
• ISL6140/50EVAL1 Board Set, Document AN9967  
• ISL6140/41EVAL1 Board Set, Document AN1020  
• ISL6141/51 Hot Plug Controller, Document FN9079  
• ISL6141/51 Hot Plug Controller, Document FN9039  
• ISL6116 Hot Plug Controller, Document FN4778  
NOTE: See www.intersil.com/hotplug for more information.  
• FAULT pin reports the occurrence of an Over-Current  
Time-Out  
• Disable input controls GATE shutdown and resets Over-  
Current fault latch  
• Load Current Monitor Function  
- IS  
OUT  
- A resistor from IS  
provides a scaled version of the load current  
to -V provides current to  
OUT  
IN  
Pinout  
voltage conversion  
ISL6142 OR ISL6152 (14 LEAD SOIC)  
• Power Good Control Output  
14  
13  
12  
11  
10  
9
PWRGD/PWRGD  
1
V
DD  
Top View  
- Output latched “good” when DRAIN and GATE voltage  
thresholds are met.  
2
FAULT  
DIS  
CT  
IS  
3
4
5
OUT  
ISL6142/52  
OV  
- (PWRGD active low: ISL6142 (L version)  
- PWRGD active high: ISL6152 (H version)  
• Pb-free available  
DRAIN  
GATE  
IS+  
UV  
IS-  
6
7
8
V
SENSE  
EE  
Applications  
• VoIP (Voice over Internet Protocol) Servers  
Telecom systems at -48V  
• Negative Power Supply Control  
• +24V Wireless Base Station Power  
FN9086 Rev 1.00  
July 2004  
Page 1 of 23  
ISL6142, ISL6152  
Ordering Information  
PKG.  
DWG. #  
o
PART NUMBER TEMP. RANGE ( C) PACKAGE  
ISL6142CB  
0 to 70  
0 to 70  
14 Lead SOIC M14.15  
ISL6142CBZA  
(See Note)  
14 Lead SOIC M14.15  
(Pb-free)  
ISL6152CB  
0 to 70  
0 to 70  
14 Lead SOIC M14.15  
ISL6152CBZA  
(See Note)  
14 Lead SOIC M14.15  
(Pb-free)  
ISL6142IB  
-40 to 85  
-40 to 85  
14 Lead SOIC M14.15  
ISL6142IBZA  
(See Note)  
14 Lead SOIC M14.15  
(Pb-free)  
ISL6152IB  
-40 to 85  
-40 to 85  
14 Lead SOIC M14.15  
ISL6152IBZA  
(See Note)  
14 Lead SOIC M14.15  
(Pb-free)  
*Add “-T” suffix to part number for tape and reel packaging.  
NOTE: Intersil Pb-free products employ special Pb-free material  
sets; molding compounds/die attach materials and 100% matte tin  
plate termination finish, which is compatible with both SnPb and  
Pb-free soldering operations. Intersil Pb-free products are MSL  
classified at Pb-free peak reflow temperatures that meet or exceed  
the Pb-free requirements of IPC/JEDEC J Std-020B.  
FN9086 Rev 1.00  
July 2004  
Page 2 of 23  
ISL6142, ISL6152  
ISL6142, ISL6152 Block Diagram  
GND  
GND  
V
DD  
-
UVLO  
1.265V  
R4  
R5  
+
+
REGULATOR,  
REFERENCES  
-
V
V
EE  
EE  
UV  
OV  
-
UV  
OV  
1.255V  
+
13V  
+
-
V
EE  
+
-
1.255V  
LOGIC,  
+
-
V
TIMING,  
GATE  
EE  
DRIVE  
-
HARD  
FAULT  
R6  
210mV  
+
+
-
V
EE  
-
GATE  
11.1V  
+
+
PWRGD  
(ISL6142)  
-
V
EE  
LATCH,  
LOGIC,  
OUTPUT  
DRIVE  
CURRENT  
LIMIT  
REGULATOR  
-
-
LOGIC  
SUPPLY  
PWRGD  
(ISL6152)  
50mV  
+
1.3V  
+
+
-
+
-
V
EE  
V
EE  
R10  
FAULT  
DIS  
FAULT  
-
V
8.0V  
EE  
+
DISABLE  
+
-
LOGIC  
INPUT  
V
EE  
13V  
V
EE+5V  
CT  
-
TIMER  
8.5V  
+
+
-
V
C3  
V
EE  
EE  
GATE  
STOP  
CURRENT  
SENSE  
IS  
OUT  
TO ADC  
V
GATE  
DRAIN  
EE IS-  
R8  
IS+  
SENSE  
LOAD  
CL  
R7  
R3 C2  
R9  
R2  
C1  
RL  
Q1  
FIGURE 1. BLOCK DIAGRAM  
-48V OUT  
R1  
-48V IN  
FN9086 Rev 1.00  
July 2004  
Page 3 of 23  
ISL6142, ISL6152  
Pin Descriptions  
PWRGD (ISL6142; L Version) Pin 1 - This digital output is an  
open-drain pull-down device and can be used to directly enable  
an external module. During start-up the DRAIN and GATE  
voltages are monitored with two separate comparators. The first  
comparator looks at the DRAIN pin voltage compared to the  
FAULT Pin 2- This digital output is an open-drain, pull-down  
device, referenced to V . It is pulled active low whenever the  
EE  
Over-Current latch is set. It goes to a high impedance state  
when the fault latch is reset by toggling the UV or DIS pins. An  
external pull-up resistor to a logic supply (5V or less) is  
required; the fault outputs of multiple IC’s can be wire-OR’d  
together. If the pin is not used it should be left open.  
internal V  
reference (1.3V); this measures the voltage drop  
PG  
across the external FET and sense resistor. When the DRAIN to  
voltage drop is less than 1.3V, the first of two conditions  
V
EE  
DIS Pin 3 - This digital input disables the FET when driven to a  
logic high state. It has a weak internal pull-up device to an  
internal 5V rail (10A), so an open pin will also act as a logic  
high. The input has a nominal trip point of 1.6 V while rising,  
and a hysteresis of 1.0V. The threshold voltage is referenced to  
required for the power to be considered good are met. In  
addition, the GATE voltage monitored by the second comparator  
must be within approximately 2.5V of its normal operating  
voltage (13.6V). When both criteria are met the PWRGD output  
will transition low and be latched in the active state, enabling the  
external module. When this occurs the two comparators  
discussed above no longer control the output. However a third  
comparator continues to monitor the DRAIN voltage, and will  
drive the PWRGD output inactive if the DRAIN voltage raises  
V
, and is compatible with CMOS logic levels. A logic low will  
EE  
allow the GATE to turn on (assuming the 4 other conditions  
described in the GATE section are also true). The DIS pin can  
also be used to reset the Over-Current latch when toggled high  
to low. If not used the pin should be tied to the negative supply  
more than 8V above V . In addition, any of the signals that  
EE  
rail (-V ).  
IN  
shut off the GATE (Over-Voltage, Under-Voltage, Under-Voltage  
Lock-Out, Over-Current time-out, pulling the DIS pin high, or  
powering down) will reset the latch and drive the PWRGD output  
high to disable the module. In this case, the output pull-down  
device shuts off, and the pin becomes high impedance. Typically  
an external pull-up of some kind is used to pull the pin high  
(many brick regulators have a pull-up function built in).  
OV (Over-Voltage) Pin 4 - This analog input compares the  
voltage on the pin to an internal voltage reference of 1.255 V  
(nominal). When the input goes above the reference the GATE  
pin is immediately pulled low to shut off the external FET. The  
built in 25mV hysteresis will keep the GATE off until the OV pin  
drops below 1.230V (the nominal high to low threshold). A  
typical application will use an external resistor divider from  
PWRGD (ISL6152; H Version) Pin 1 - This digital output is  
used to provide an active high signal to enable an external  
module. The Power Good comparators are the same as  
described above, but the active state of the output is reversed  
(reference figure 37).  
V
to -V to set the OV trip level. A three-resistor divider can  
DD  
IN  
be used to set both OV and UV trip points to reduce  
component count.  
UV (Under-Voltage) Pin 5 - This analog input compares the  
voltage on the pin to an internal comparator with a built in  
hysteresis of 135mv. When the UV input goes below the  
nominal reference voltage of 1.120V, the GATE pin is  
immediately pulled low to shut off the external FET. The GATE  
will remain off until the UV pin rises above a 1.255V low to high  
threshold. A typical application will use an external resistor  
When power is considered good (both DRAIN and GATE are  
normal) the output is latched in the active high state, the DMOS  
device (Q3) turns on and sinks current to V through a 6.2K  
EE  
resistor. The base of Q2 is clamped to V to turn it off. If the  
EE  
external pull-up current is high enough (>1mA, for example), the  
voltage drop across the resistor will be large enough to produce  
a logic high output and enable the external module (in this  
example, 1mA x 6.2K= 6.2V).  
divider from V  
to -V to set the UV level as desired. A  
DD  
IN  
three-resistor divider can be used to set both OV and UV trip  
points to reduce component count.  
Note that for all H versions, although this is a digital pin  
functionally, the logic high level is determined by the external  
pull-up device, and the power supply to which it is connected;  
The UV pin is also used to reset the Over-Current latch. The  
pin must be cycled below 1.120V (nominal) and then above  
1.255V (nominal) to clear the latch and initiate a normal start-  
up sequence.  
the IC will not clamp it below the V  
voltage. Therefore, if the  
DD  
external device does not have its own clamp, or if it would be  
damaged by a high voltage, an external clamp might be  
necessary.  
IS- Pin 6 - This analog pin is the negative input of the current  
sense circuit. A sensing resistor (R7) is connected between  
this pin and the V side of resistor R1. The ratio of R1/R7  
EE  
If the power good latch is reset (GATE turns off), the internal  
DMOS device (Q3) is turned off, and Q2 (NPN) turns on to  
clamp the output one diode drop above the DRAIN voltage to  
produce a logic low, indicating power is no longer good.  
defines the I  
to IS current scaling factor. If current  
OUT  
SENSE  
sensing is not used in the application, the IS- pin should be tied  
directly to the IS+ pin and the node should be left floating.  
FN9086 Rev 1.00  
July 2004  
Page 4 of 23  
ISL6142, ISL6152  
Pin 7 - This is the most Negative Supply Voltage, such  
V
1.3v and 8.0V. At initial start-up the DRAIN to V voltage  
EE  
EE  
as in a -48V system. Most of the other signals are  
referenced relative to this pin, even though it may be far  
away from what is considered a GND reference.  
differential must be less than 1.3V, and the GATE voltage  
must be within 2.5V of its normal operating voltage (13.6V)  
for power to be considered good. When both conditions are  
met, the PWRGD/PWRGD output is latched into the active  
state. At this point only the 8V DRAIN comparator can  
control the PWRGD/PWRGD output, and will drive it inactive  
SENSE Pin 8 - This analog input monitors the voltage drop  
across the external sense resistor to determine if the current  
flowing through it exceeds the programmed Over-Current  
trip point (50mV / Rsense). If the Over-Current threshold is  
exceeded, the circuit will regulate the current to maintain a  
nominal voltage drop of 50mV across the R1 sense resistor,  
also referred to as Rsense. If current is limited for more than  
the programmed time-out period the IntelliTripTM electronic  
circuit breaker will trip and turn off the FET.  
if the DRAIN voltage exceeds V by more than 8.0V.  
EE  
IS  
Pin 12 - This analog pin is the output of the current  
sense circuit. The current flowing out of this pin (IS ) is  
OUT  
OUT  
proportional to the current flowing through the R1 sense  
resistor (I ). The scaling factor, IS /I is  
SENSE OUT SENSE  
defined by the resistor ratio of R1/R7. Current to voltage  
conversion is accomplished by placing a resistor from this  
pin to -V . The current flowing out of the pin is supplied by  
IN  
the internal 13V regulator and should not exceed 600A.  
The output voltage will clamp at approximately 8V. If current  
sensing is not used in the application the pin should be left  
open.  
A second comparator is employed to detect and respond  
quickly to hard faults. The threshold of this comparator is set  
approximately four times higher (210mV) than the Over-  
Current trip point. When the hard fault comparator threshold  
is exceeded the GATE is immediately (10s typical) shut off  
(V  
= V ), the timer is reset, and a single retry (soft  
GATE  
EE  
start) is initiated.  
CT Pin 13 - This analog I/O pin is used to program the Over-  
Current Time-Out period with a capacitor connected to the  
IS+ Pin 9 - This analog pin is the positive input of the current  
sense circuit. A sensing resistor (R8) is connected between  
this pin and the output side of R1, which is also connected to  
the SENSE pin. It should match the IS- resistor (R7) as  
closely as possible (1%) to minimize output current error  
negative supply rail (-V which is equal to V ). During  
IN EE  
normal operation, the pin is pulled down to V . During  
EE  
current limiting, the capacitor is charged with a 20A  
(nominal) current source. When the CT pin charges to 8.5V,  
it times out and the GATE is latched off. If the short circuit  
goes away prior to the time-out, the GATE will remain on. If  
no capacitor is connected, the time-out will be much quicker,  
with only the package pin capacitance (~ 5 to 10 pF) to  
charge. If no external capacitor is connected to the CT pin  
the time-out will occur in a few sec. To set the desired time-  
out period use:  
(IS  
). If current sensing is not used in the application, the  
OUT  
IS+ pin should be tied directly to the IS- pin and the node  
should be left floating.  
GATE Pin 10 - This analog output drives the gate of the  
external FET used as a pass transistor. The GATE pin is  
high (FET is on) when the following conditions are met:  
6
• V  
DD  
UVLO is above its trip point (~16.5V)  
dt = (C * dV) / I = (C * 8.5) / 20 A = 0.425*10 * C  
• Voltage on the UV pin is above its trip point (1.255V)  
• Voltage on the OV pin is below its trip point (1.255V)  
• No Over-Current conditions are present.  
• The Disable pin is low.  
NOTE: The printed circuit board’s parasitic capacitance (CT pin to  
the negative input, -V ) should be taken into consideration when  
IN  
calculating the value of C3 needed for the desired time-out.  
V
Pin 14 - This is the most positive Power Supply pin. It  
DD  
can range from the Under-Voltage lockout threshold (16.5V)  
If any of the 5 conditions are violated, the GATE pin will be  
pulled low to shut off or regulate current through the FET.  
The GATE is latched off only when an Over-Current event  
exceeds the programmed time-out period.  
to +80V (Relative to V ). The pin can tolerate up to 100V  
EE  
without damage to the IC.  
The GATE is driven high by a weak (-50A nominal) pull-up  
current source, in order to slowly turn on the FET. It is driven  
low by a 70mA (nominal) pull-down device for three of the  
above shut-off conditions. A larger (350mA nominal) pull-  
down current shuts off the FET very quickly in the event of a  
hard fault where the sense pin voltage exceeds  
approximately 210mV.  
DRAIN Pin 11 - This analog input monitors the voltage of the  
FET drain for the Power Good function. The DRAIN input is  
tied to two comparators with internal reference voltages of  
FN9086 Rev 1.00  
July 2004  
Page 5 of 23  
ISL6142, ISL6152  
.
Absolute Maximum Ratings  
Thermal Information  
o
Supply Voltage (V  
to V ). . . . . . . . . . . . . . . . . . . . -0.3V to 100V  
EE  
Thermal Resistance (Typical, Note 1)  
( C/W)  
DD  
JA  
DRAIN, PWRGD, PWRGD Voltage . . . . . . . . . . . . . . .-0.3V to 100V  
UV, OV Input Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to 60V  
SENSE, GATE Voltage . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to 20V  
14 Lead SOIC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70  
o
Maximum Junction Temperature (Plastic Package) . . . . . . . .150 C  
o
o
Maximum Storage Temperature Range. . . . . . . . . . -65 C to 150 C  
o
FAULT, DIS, IS+, IS-, IS  
, CT . . . . . . . . . . . . . . . . . -0.3V to 8.0V  
OUT  
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300 C  
ESD Rating  
Human Body Model (Per MIL-STD-883 Method 3015.7) . . .2000V  
Operating Conditions  
o
o
Temperature Range (Industrial) . . . . . . . . . . . . . . . . . -40 C to 85 C  
Temperature Range (Commercial). . . . . . . . . . . . . . . . . 0 C to 70 C  
Supply Voltage Range (Typical). . . . . . . . . . . . . . . . . . . 36V to 72V  
o
o
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the  
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.  
NOTES:  
1. is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details.  
JA  
2. PWRGD is referenced to DRAIN; V = 0V.  
-V  
PWRGD DRAIN  
Electrical Specifications  
V
= +48V, V = +0V Unless Otherwise Specified. All tests are over the full temperature range; either  
EE  
DD  
Commercial (0 C to 70 C) or Industrial (-40 C to 85 C). Typical specs are at 25 C.  
o
o
o
o
o
PARAMETER  
SYMBOL  
TEST CONDITIONS  
MIN  
TYP  
MAX UNITS  
DC PARAMETRIC  
V
PIN  
DD  
Supply Operating Range  
Supply Current  
V
20  
-
80  
V
DD  
I
UV = 3V; OV = V ; SENSE = V ; V  
=
2.6  
4.0  
mA  
DD  
EE  
EE DD  
80V  
UVLO High  
V
V
V
Low to High transition  
High to Low transition  
15  
13  
16.7  
15.0  
1.9  
19  
17  
V
V
V
UVLOH  
DD  
DD  
UVLO Low  
V
UVLOL  
UVLO hysteresis  
GATE PIN  
GATE Pin Pull-Up Current  
GATE Pin Pull-Down Current  
GATE Pin Pull-Down Current  
GATE Pin Pull-Down Current  
External Gate Drive (at 20V, at 80V)  
GATE High Threshold (PWRGD/PWRGD active)  
SENSE PIN  
I
GATE Drive on, V  
V
GATE = EE  
-30  
12  
-50  
70  
-60  
15  
A  
mA  
mA  
mA  
V
PU  
I
GATE Drive off, UV or OV false  
PD1  
PD2  
PD3  
I
I
GATE Drive off, Over-Current Time-Out  
70  
GATE Drive off; Hard Fault, Vsense > 210mv  
350  
13.6  
2.5  
V  
(V  
V
, 20V <=V  
<=80V  
DD  
GATE  
GATE - EE)  
V - V  
GATE  
V
V
GH  
GATE  
Current Limit Trip Voltage  
Hard Fault Trip Voltage  
SENSE Pin Current  
V
V
= (V  
- V  
)
40  
-
50  
210  
0
60  
mV  
mV  
A  
CL  
CL  
SENSE  
EE  
HFTV  
HFTV = (V  
- V  
)
SENSE  
= 50mV  
SENSE  
EE  
I
V
-0.5  
SENSE  
UV PIN  
UV Pin High Threshold Voltage  
UV Pin Low Threshold Voltage  
UV Pin Hysteresis  
V
UV Low to High Transition  
UV High to Low Transition  
1.240  
1.105  
1.255 1.270  
1.120 1.145  
135  
V
V
UVH  
V
UVL  
V
mV  
UVHY  
FN9086 Rev 1.00  
July 2004  
Page 6 of 23  
 
ISL6142, ISL6152  
Electrical Specifications  
V
= +48V, V = +0V Unless Otherwise Specified. All tests are over the full temperature range; either  
EE  
DD  
Commercial (0 C to 70 C) or Industrial (-40 C to 85 C). Typical specs are at 25 C. (Continued)  
o
o
o
o
o
PARAMETER  
UV Pin Input Current  
OV pin  
SYMBOL  
TEST CONDITIONS  
MIN  
TYP  
MAX UNITS  
I
V
= V  
EE  
-
-0.05  
-0.5  
A  
INUV  
UV  
OV Pin High Threshold Voltage  
OV Pin Low Threshold Voltage  
OV Pin Hysteresis  
V
OV Low to High Transition  
OV High to Low Transition  
1.235  
1.215  
1.255 1.275  
1.230 1.255  
25  
V
V
OVH  
V
OVL  
V
mV  
A  
OVHY  
INOV  
OV Pin Input Current  
DRAIN Pin  
I
V
V
= V  
-
-0.05  
-0.5  
OV  
EE  
Power Good Threshold (Enable PWRGD/PWRGD  
Output)  
V
- V  
0.80  
1.30  
2.00  
V
PG  
DRAIN  
EE  
Drain Input Bias Current  
I
V
V
= 48V  
10  
38  
60  
A  
DRAIN  
VDH  
DRAIN  
DRAIN  
DRAIN Pin Comparator Trip Point  
(PWRGD/PWRGD Inactive)  
- V > 8.0V  
EE  
7.0  
8.0V  
9.0  
V
ISL6142 (PWRGD Pin: L Version)  
PWRGD Output Low Voltage  
V
V
(V  
(V  
- V  
- V  
< V  
< V  
I
PG; OUT  
= 1mA  
= 5mA  
-
-
-
0.3  
0.8  
3.0  
10  
V
V
OL1  
OL5  
DRAIN  
DRAIN  
DRAIN  
EE)  
EE)  
I
1.50  
0.05  
PG; OUT  
Output Leakage  
I
V
= 48V, V  
= 80V  
PWRGD  
A  
OH  
ISL6152 (PWRGD Pin: H Version)  
PWRGD Output Low Voltage (PWRGD-DRAIN)  
PWRGD Output Impedance  
DIS PIN  
V
V
= 5V, I  
OUT  
= 1mA  
PG  
-
0.80  
6.2  
1.0  
7.5  
V
OL  
DRAIN  
R
(V  
- V < V  
EE)  
4.5  
k  
OUT  
DRAIN  
DIS Pin High Threshold Voltage  
DIS Pin Low Threshold Voltage  
DIS Pin Hysteresis  
V
DIS Low to High Transition  
DIS High to Low Transition  
DIS Hysteresis  
1.60  
2.20  
1.1  
1.0  
0.1  
10  
3.00  
1.50  
V
V
DISH  
V
DISL  
V
V
DISHY  
DIS Pin Input High Leakage  
DIS Pin Input Low Current  
FAULT PIN  
I
Input Voltage = 5V  
1.0  
A  
A  
DISINH  
I
Input Voltage = 0V  
DISINL  
FAULT Output Voltage  
FAULT Output Leakage  
CT PIN  
VF  
I = 1.6 mA  
V = 5.0V  
0.4  
V
VOL  
IF  
10  
A  
IOH  
CT Pin Charging Current  
CT Pin Input Threshold  
I
V
= 0V  
CT  
20  
A  
CTINL  
V
7.5  
8.5  
9.5  
V
CT  
IS PINS (IS-, IS+, IS  
)
OUT  
IS  
IS  
Error  
Error  
VSENSE = 50mV, R7 = 400, R8 = 404  
VSENSE = 200mV, R7 = 400, R8 = 404  
VSENSE = 0.0mV, R7 = 400, R8 = 404  
2.0  
1.0  
4.5  
5
%
%
A  
V
OUT  
OUT  
ISOUT Offset Current  
Output Voltage Range (IS  
Pin)  
0
8
OUT  
FN9086 Rev 1.00  
July 2004  
Page 7 of 23  
ISL6142, ISL6152  
Electrical Specifications  
V
= +48V, V = +0V Unless Otherwise Specified. All tests are over the full temperature range; either  
EE  
DD  
Commercial (0 C to 70 C) or Industrial (-40 C to 85 C). Typical specs are at 25 C. (Continued)  
o
o
o
o
o
PARAMETER  
AC TIMING  
SYMBOL  
TEST CONDITIONS  
MIN  
TYP  
MAX UNITS  
OV High to GATE Low  
OV Low to GATE High  
UV Low to GATE Low  
t
t
Figures 2A, 3A  
0.6  
1.0  
0.6  
1.0  
1.6  
7.8  
1.3  
8.4  
0.6  
2.5  
0.5  
1.2  
4.0  
1
3.0  
12.0  
3.0  
s  
s  
s  
s  
s  
s  
s  
s  
s  
s  
s  
PHLOV  
PLHOV  
Figures 2A, 3A  
Figures 2A, 3B  
Figures 2A, 3B  
Figure 2A, 7  
t
t
PHLUV  
PLHUV  
UV High to GATE High  
DIS Low to GATE Low  
DIS High to GATE High  
GATE Low (Over-Current) to FAULT Low  
12.0  
t
t
PHLDIS  
Figure 2A, 7  
PLHDIS  
t
Figure 2A, 8  
PHLGF  
IS  
IS  
Rise Time  
Fall Time  
t
Figure 2A, 12  
Figure 2A, 12  
Figures 2A, 9  
OUT  
OUT  
R
t
F
SENSE High to GATE Low  
Current Limit to GATE Low  
t
3
PHLSENSE  
t
Figures 2B, 11, Effective Capacitance During  
Test = 2550pF  
1200  
PHLCB  
Hard Fault to GATE Low (200mV comparator)  
Typical GATE shutdown based on application ckt.  
Guaranteed by design.  
t
Figures 10, 20, 33  
10.0  
s  
PHLHF  
ISL6142 (L Version)  
DRAIN Low to PWRGD Low (Active)  
DRAIN High to PWRGD High (Inactive)  
GATE High to PWRGD Low (Active)  
ISL6152 (H Version)  
t
Figures 2A, 4A  
Figure 2A, 6A  
Figures 2A, 5A  
0.1  
0.1  
3.1  
0.2  
1.0  
5.0  
5.0  
s  
s  
s  
PHLDL  
t
PLHDH  
t
PHLGH  
DRAIN Low to (PWRGD-DRAIN) High (Active)  
DRAIN High to (PWRGD -DRAIN) Low (Inactive)  
GATE High to (PWRGD-DRAIN) High (Active)  
t
Figures 2A, 4B  
Figure 2A, 6B  
Figures 2A, 5B  
0.2  
0.5  
0.4  
s  
s  
s  
PLHDL  
PHLDH  
PLHGH  
t
t
FN9086 Rev 1.00  
July 2004  
Page 8 of 23  
ISL6142, ISL6152  
?
Test Circuit and Timing Diagrams  
5K  
5V  
+
-
48V  
5K  
5V  
+
48V  
5K  
-
PWRGD  
FAULT  
V
DD  
14  
13  
12  
11  
10  
1
2
3
V
DD  
PWRGD  
FAULT  
5K  
CT  
14  
13  
12  
11  
10  
1
2
3
V
DIS  
V
OV  
ISL6142  
4.99K  
OV  
UV  
DRAIN  
GATE  
4
ISL6142  
V
V
OV  
V
UV  
DRAIN  
OV  
UV  
4
V
5
6
7
DRAIN  
UV  
V
DRAIN  
9.0K  
5
6
7
GATE  
9
8
400  
404  
V
EE  
SENSE  
9
8
V
0.90K  
EE  
SENSE  
.
0.1K  
V
SENSE  
FIGURE 2B. TEST CIRCUIT FOR TIMEOUT  
FIGURE 2A. TYPICAL TEST CIRCUIT  
2V  
2V  
0V  
1.125V  
1.255V  
1.255V  
1.230V  
UV Pin  
GATE  
0V  
13.6V  
t
t
PLHUV  
t
PHLUV  
t
PHLOV  
PLHOV  
13.6V  
GATE  
0V  
1V  
1V  
1V  
1V  
0V  
FIGURE 3B. UV TO GATE TIMING  
FIGURE 3A. OV TO GATE TIMING  
FIGURE 3. OV AND UV TO GATE TIMING  
DRAIN  
DRAIN  
1.3V  
1.3V  
V
PG  
V
PG  
V
EE  
t
t
PHLDL  
PLHDL  
PWRGD  
1.0V  
1.0V  
PWRGD  
FIGURE 4A. DRAIN TO PWRGD ACTIVE TIMING (ISL6142)  
FIGURE 4B. DRAIN TO PWRGD ACTIVE TIMING (ISL6152)  
FIGURE 4. DRAIN TO PWRGD/PWRGD TIMING  
13.6V  
V  
- V  
= 0V  
GATE  
GATE  
V  
- V = 0V  
GATE  
13.6V  
GATE  
V
2.5V  
GH  
V
2.5V  
GH  
GATE  
t
PLHGH  
GATE  
t
PHLGH  
PWRGD  
1.0V  
= 0V  
PWRGD  
1.0V  
V
- V  
DRAIN  
PWRGD  
FIGURE 5A. GATE TO PWRGD ACTIVE (ISL6142)  
FIGURE 5B. GATE TO PWRGD ACTIVE (ISL6152)  
FN9086 Rev 1.00  
July 2004  
Page 9 of 23  
ISL6142, ISL6152  
Test Circuit and Timing Diagrams (Continued)  
V
- V = 8.0V  
EE  
DRAIN  
V
- V = 8.0V  
EE  
DRAIN  
V
DH  
8.0V  
8.0V  
V
DH  
DRAIN  
PWRGD  
V
- V = 0V  
DRAIN  
t
EE  
PHLDH  
V
- V = 0V  
DRAIN  
EE  
t
PLHDH  
DRAIN  
1.0V  
1.0V  
PWRGD  
V
- V  
= 0V  
DRAIN  
PWRGD  
FIGURE 6A. DRAIN HIGH TO PWRGD (INACTIVE) HIGH  
(ISL6142)  
FIGURE 6B. DRAIN HIGH TO PWRGD (INACTIVE) LOW  
(ISL6152)  
FIGURE 6. DRAIN TO PWRGD/PWRGD INACTIVE TIMING  
3V  
V  
- V  
= 0V  
GATE  
GATE  
DIS  
1.50V  
1.4V  
GATE  
2.2V  
1V  
t
0V  
PHLF  
t
t
PLHDIS  
PHLDIS  
GATE  
FAULT  
13.6V  
1V  
1.0V  
0V  
FIGURE 7. DISABLE TO GATE TIMING (ISL6142/52)  
FIGURE 8. FAULT TO GATE TIMING (ISL6142/52)  
50mV  
210mV  
SENSE  
0V  
SENSE  
0V  
13.6V  
t
PHLHF  
t
13.6V  
PHLSENSE  
GATE  
GATE  
V
EE  
~4V (depends on FET threshold)  
FIGURE 9. SENSE TO GATE (CURRENT LIMIT) TIMING  
FIGURE 10. SENSE TO GATE (HARD FAULT) TIMING  
V
SENSE  
UV  
t
R
t
PHLCB  
t
F
90%  
90%  
V
GATE  
OUT  
10%  
1.0V  
1.0V  
10%  
Over-Current Time-Out  
FIGURE 11. CURRENT LIMIT TO GATE TIMING  
FIGURE 12. OUTPUT CURRENT RISE AND FALL TIME  
FN9086 Rev 1.00  
July 2004  
Page 10 of 23  
ISL6142, ISL6152  
Typical Performance Curves  
16  
14  
12  
10  
8
4.5  
4
3.5  
3
2.5  
2
1.5  
1
6
4
2
0.5  
0
0
10 20 30 40 50 60 70 80 90 100  
Supply Voltage (VDD)  
10  
20  
30  
40  
50  
60  
70  
80 100  
Supply Voltage (VDD)  
o
o
FIGURE 13. SUPPLY CURRENT VS. SUPPLY VOLTAGE (25 C)  
FIGURE 14. GATE VOLTAGE VS SUPPLY VOLTAGE (25 C)  
14  
13.9  
13.8  
13.7  
13.6  
13.5  
13.4  
13.3  
2.75  
2.7  
2.65  
2.6  
2.55  
2.5  
2.45  
2.4  
2.35  
2.3  
2.25  
-40 -20  
0
20  
40  
60  
80  
100  
-40  
-20  
0
20  
40  
60  
80  
100  
Temperature (C)  
Temperature (C)  
FIGURE 16. GATE VOLTAGE VS TEMPERATURE V  
= 48V  
FIGURE 15. SUPPLY CURRENT VS TEMPERATURE, V  
= 80V  
DD  
DD  
50  
49  
48  
47  
46  
45  
44  
43  
42  
41  
14  
13.9  
V
= 80V  
DD  
13.8  
13.7  
13.6  
13.5  
13.4  
V
= 20V  
DD  
-40  
-20  
0
20  
40  
60  
80  
100  
-40 -20  
0
20 40 60 80 100  
Temperature (C)  
Temperature (C)  
FIGURE 17. GATE VOLTAGE VS TEMPERATURE  
FIGURE 18. GATE PULL-UP CURRENT VS TEMPERATURE  
FN9086 Rev 1.00  
July 2004  
Page 11 of 23  
ISL6142, ISL6152  
450  
400  
350  
300  
250  
200  
150  
100  
50  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
0
-40  
-20  
0
20  
40  
60  
80  
100  
-40  
-20  
0
20  
40  
60  
80  
100  
Temperature (C)  
Temperature (C)  
FIGURE 20. HARD FAULT GATE PULL-DOWN CURRENT VS  
TEMPERATURE  
FIGURE 19. GATE PULL-DOWN CURRENT  
(UV/OV/TIME-OUT) VS TEMPERATURE  
54  
52  
50  
48  
46  
44  
42  
40  
1.6  
5mA  
1.4  
1.2  
1
0.8  
0.6  
0.4  
1mA  
0.2  
0
-40  
-20  
0
20  
40  
60  
80  
100  
-40  
-20  
0
20  
40  
60  
80  
100  
Temperature (C)  
Temperature (C)  
FIGURE 21. OVER-CURRENT TRIP VOLTAGE VS  
TEMPERATURE  
FIGURE 22. PWRGD (ISL6142) VOL VS TEMPERATURE  
2
1.5  
1
6.8  
6.7  
6.6  
6.5  
6.4  
6.3  
6.2  
6.1  
0.5  
0
-40  
-20  
0
20  
40  
60  
80  
100  
-40  
-20  
0
20  
40  
60  
80  
100  
Temperature (C)  
Temperature (C)  
FIGURE 23. DRAIN to PWRGD / PWRGD TRIP VOLTAGE (V  
VS TEMPERATURE  
)
FIGURE 24. PWRGD (ISL6152) OUTPUT IMPEDANCE VS  
TEMPERATURE  
PG  
FN9086 Rev 1.00  
July 2004  
Page 12 of 23  
ISL6142, ISL6152  
6
5
4
3
2
1
2.5  
2
-40oC  
-40oC  
1.5  
1
85oC  
85oC  
0.5  
0
0
50  
100  
150  
200  
0
50  
100  
150  
SENSE Pin Voltage (mV)  
SENSE pin Voltage (mV)  
FIGURE 25. IS  
ERROR VS SENSE PIN VOLTAGE  
VSENSE = 0V  
FIGURE 26. IS  
ERROR VS SENSE PIN VOLTAGE  
OUT  
OUT  
20.5  
4.475  
4.47  
4.465  
4.46  
20  
19.5  
19  
4.455  
4.45  
18.5  
18  
4.445  
4.44  
17.5  
17  
4.435  
-40 -20  
0
20  
40  
60  
80  
100  
-40  
-20  
0
20  
40  
60  
80  
100  
Temperature (C)  
Temperature (C)  
FIGURE 27. ISOUT OFFSET CURRENT VS TEMPERATURE  
FIGURE 28. CT CHARGING CURRENT VS TEMPERATURE  
FN9086 Rev 1.00  
July 2004  
Page 13 of 23  
ISL6142, ISL6152  
Applications Information  
GND  
GND  
V
FAULT  
DIS  
PWRGD  
DD  
IS  
Logic  
OUT  
Supply  
R4  
R5  
ISL6142  
UV  
OV  
R10  
V
CT  
IS-  
IS+ SENSE GATE  
DRAIN  
C2  
R6  
R9  
EE  
ADC  
Q2  
R3  
C1  
R2  
C3  
R7  
CL  
R8  
RL  
-48V OUT  
-48V IN  
R1  
Q1  
FIGURE 29. TYPICAL APPLICATION WITH MINIMUM COMPONENTS  
Typical Values for a representative system;  
which assumes:  
Quick Guide to Choosing Component  
Values  
43V to 71V supply range; 48 nominal; UV = 43V; OV = 71V  
(See Fig 29 for reference)  
1A of typical current draw; 2.5 Amp Over-Current  
This section will describe the minimum components needed for  
a typical application, and will show how to select component  
values. Note that “typical” values may only be good for this  
application; the user may have to select alternate component  
values to optimize performance for other applications. Each  
block will then have more detailed explanation of how the  
device works, and alternatives.  
100F of load capacitance (CL); equivalent RL of 48  
(R = V/I = 48V/1A)  
R1: 0.02(1%)  
R2: 10(5%)  
R3: 18k(5%)  
R4, R5, R6 - together set the Under-Voltage (UV) and Over-  
Voltage (OV) trip points. When the power supply ramps up and  
down, these trip points (and their hysteresis) will determine  
when the GATE is allowed to turn on and off (UV and OV do  
not control the PWRGD / PWRGD output). The input power  
supply is divided down such that when the voltage on the OV  
pin is below its threshold and the UV pin is above its threshold  
their comparator outputs will be in the proper state signaling  
the supply is within its desired operating range, allowing the  
GATE to turn on. The equations below define the comparator  
thresholds for an increasing (in magnitude) supply voltage.  
R + R + R   
R4: 549k(1%)  
R5: 6.49k(1%)  
R6: 10k(1%)  
R7/R8: 400(1%)  
R9: 4.99K(1%)  
R10: 5.10K(10%)  
C1: 150nF (25V)  
C2: 3.3nF (100V)  
C3: 1500pF (25V)  
Q1: IRF530 (100V, 17A, 0.11)  
Q2: N-Channel logic FET  
4
5
6
(EQ. 1)  
V
= ---------------------------------------- 1.255  
UV  
R + R   
5
6
R + R + R   
4
5
6
(EQ. 2)  
V
= ---------------------------------------- 1.255  
OV  
R   
6
The values of R4 = 549K, R5 = 6.49K, and R6 = 10K shown in  
figure 29 set the Under-Voltage threshold at 43V, and the Over-  
FN9086 Rev 1.00  
July 2004  
Page 14 of 23  
ISL6142, ISL6152  
Voltage, turn off threshold to 71V. The Under-Voltage (UV)  
comparator has a hysteresis of 135mv’s (4.6V of hysteresis on  
the supply) which correlates to a 38.4V turn off voltage. The  
Over-Voltage comparator has a 25mv hysteresis (1.4V of  
hysteresis on the supply) which translates to a turn on voltage  
(supply decreasing) of approximately 69.6V.  
Figure 30 the traces from each side of the R1 resistor also  
connect to the R8 (IS+), and R7 (IS-) current sensing resistors.  
CORRECT  
INCORRECT  
To V  
EE  
and R7  
Q1 - is the FET that connects the input supply voltage to the  
output load, when properly enabled. It needs to be selected  
based on several criteria:  
• Maximum voltage expected on the input supply (including  
transients) as well as transients on the output side.  
• Maximum current and power dissipation expected during  
normal operation, usually at a level just below the current  
limit threshold.  
To SENSE  
and R8  
CURRENT  
SENSE RESISTOR  
• Power dissipation and/or safe-operating-area considerations  
during current limiting and single retry events.  
FIGURE 30. SENSE RESISTOR LAYOUT GUIDELINES  
• Other considerations include the GATE voltage threshold  
which affects the r  
(which in turn, affects the voltage  
CL - is the sum of all load capacitances, including the load’s  
input capacitance itself. Its value is usually determined by the  
needs of the load circuitry, and not the hot plug (although there  
can be interaction). For example, if the load is a regulator, then  
the capacitance may be chosen based on the input  
DS(ON)  
drop across the FET during normal operation), and the  
maximum gate voltage allowed (the IC’s GATE output is  
clamped to ~14V).  
R1 - is the Over-Current sense resistor also referred to as  
requirements of that circuit (holding regulation under current  
spikes or loading, filtering noise, etc.) The value chosen will  
affect the peak inrush current. Note that in the case of a  
regulator, there may be capacitors on the output of that circuit  
as well; these need to be added into the capacitance  
calculation during inrush (unless the regulator is delayed from  
operation by the PWRGD/PWRGD signal).  
R
. If the input current is high enough, such that the  
SENSE  
voltage drop across R1 exceeds the SENSE comparator trip  
point (50mV nominal), the GATE pin will be pulled lower (to  
~4V) and current will be regulated to 50mV/Rsense for the  
programmed time-out period which is set by C3. The Over-  
Current threshold is defined in Equation 3 below. If the time-out  
period is exceeded the Over-Current latch will be set and the  
FET will be turned off to protect the load from excessive  
current. A typical value for R1 is 0.02which sets an Over-  
RL - is the equivalent resistive value of the load and  
determines the normal operating current delivered through the  
FET. It also affects some dynamic conditions (such as the  
discharge time of the load capacitors during a power-down). A  
typical value might be 48(I=V/R = 48/48 = 1A).  
Current trip point of; I  
select the appropriate value for R1, the user must first  
= V/R = 0.05/0.02 = 2.5 Amps. To  
OC  
determine at what level of current it should trip, take into  
account worst case variations for the trip point (50mV 10mV =  
20%), and the tolerances of the resistor (typically 1% or 5%).  
Note that the Over-Current threshold should be set above the  
inrush current level plus the expected load current to avoid  
activating the current limit and time-out circuitry during start-up.  
If the power good output (PWRGD/PWRGD) is used to enable  
an external module, the desired inrush current only needs to  
be considered. One rule of thumb is to set the Over-Current  
threshold 2-3 times higher than the normal operating current.  
R2, C1, R3, C2 - are related to the GATE driver, as it controls  
the inrush current.  
R2 prevents high frequency oscillations; 10is a typical value.  
R2 = 10.  
R3 and C2 act as a feedback network to control the inrush  
current as shown in equation 4, where CL is the load  
50mv  
capacitance (including module input capacitance), and I  
is  
I
= -------------------  
PU  
OC  
(EQ. 3)  
R
sense  
the GATE pin charging current, nominally 50A.  
C
L
(EQ. 4)  
I
= I  
------  
The physical layout of the R1 sense resistor is critical to avoid  
the possibility of false over current events. Since it is in the  
main input-to-output path, the traces should be wide enough to  
support both the normal current, and currents up to the over-  
current trip point. The trace routing between the R1 resistor,  
inrush  
PU  
C
2
Begin by choosing a value of acceptable inrush current for the  
system, and then solve for C2.  
C1 and R3 prevent Q1 from turning on momentarily when  
power is first applied. Without them, C2 would pull the gate of  
and the V and SENSE pins should be direct and as short as  
possible with zero current in the sense lines. Note that in  
EE  
Q1 up to a voltage roughly equal to V *C2/Cgs(Q1) (where  
EE  
Cgs is the FET gate-source capacitance) before the  
Page 15 of 23  
FN9086 Rev 1.00  
July 2004  
ISL6142, ISL6152  
ISL6142/52 could power up and actively pull the gate low.  
Place C1 in parallel with the gate capacitance of Q1; isolate  
them from C2 by R3.  
less, with respect to V . A typical value of 5Kis  
EE  
recommended. A fault indicator LED can be placed in series  
with the pull-up resistor if desired. The resistor value should be  
selected such that it will allow enough current to drive the LED  
adequately (brightness).  
C1 =[(Vinmax - Vth)/Vth] * (C2+Cgd) - where Vth is the FET’s  
minimum gate threshold, Vinmax is the maximum operating  
input voltage, and Cgd is the FET gate-drain capacitance.  
C3 - is the capacitor used to program the current limit time-out  
period. When the Over-Current threshold is exceeded a 20A  
(nominal) current source will charge the C3 capacitor from V  
to approximately 8.5V. When the voltage on the CT pin  
exceeds the 8.5V threshold, the GATE pin will immediately be  
pulled low with a 70ma pull down device, the Over-Current  
latch will be set, and the FET will be turned off. If the Over-  
Current condition goes away before the time-out period  
R3 - its value is not critical, a typical value of 18kis  
recommended but values down to 1Kcan be used. Lower  
values of R3 will add delay to gate turn-on for hot insertion and  
the single retry event following a hard fault.  
EE  
R7/R8/R9 - are used to sense the load current (R7/R8) and  
convert the scaled output current (IS  
) to a voltage (R9) that  
OUT  
would typically be the input signal to an A to D converter.  
expires, the CT pin will be pulled back down to V , and  
EE  
normal operation will resume. Note that any parasitic  
R7 is connected between -IS and the R1 sense resistor. These  
capacitance from the CT pin to -V will effectively add to C3.  
IN  
two resistors set the I  
resistor) to IS  
OUT  
(current through the Rsense  
scaling factor based on equation 5 below. R8  
SENSE  
This additional capacitance should be taken into account when  
calculating the C3 value needed for the desired time-out  
period.  
does not effect the scaling factor but should match R7 to  
minimize IS error. Their tolerance should be +/-1%, which  
OUT  
will typically result in an output current error of less than 5% for a  
full scale condition. The trace layout is also critical to obtain  
optimum performance. The traces connecting these resistors to  
the device pins (IS+ and IS-) and to the R1 sense resistor should  
be kept as short as possible, match in length, and be isolated  
from the main current flow as illustrated in figure 30.  
The value of C3 can be calculated using equation 6 where dt is  
the time-out period, dv is the CT pin threshold, and I is the  
CT  
capacitor charging current.  
6  
dt  
C3 = ------ I  
dv  
timeout  
= --------------------- 2010  
8.5V  
(EQ. 6  
CT  
R9 is used to convert the IS  
OUT  
current to voltage and is  
Q2- is an N-channel logic FET used to drive the disable pin  
(DIS). The DIS pin is used to enable/disable the external pass  
transistor (Q1) by turning the GATE drive voltage on or off. The  
DIS pin can also be used to reset the Over-Current latch by  
toggling the pin high and then low. When Q2 is off, the DIS pin  
is pulled high with an internal 500Kresistor, connected to an  
connected between the IS  
pin and -V . The current flowing  
OUT  
IN  
through the resistor (EQ. 5) should not exceed 600A and the  
voltage on the CT pin will clamp at approximately 8V.  
R
internal +5V (V + 5V) supply rail (10A). In this condition the  
GATE pin is low, and Q1 is turned off. When Q2 is on, the DIS  
SENSE  
R7  
EE  
IS  
= I  
-----------------------  
(EQ. 5)  
OUT  
SENSE  
pin is pulled low to V allowing the GATE pin to pull up and  
EE  
turn on Q1. The gate of Q2 will typically be driven low (<1.5V)  
or High (>3.0V) with external logic circuitry referenced to the  
negative input (-V ).  
IN  
To select the appropriate resistor values for the application the  
user must first define the R1 sense resistor value and the  
maximum load current to be detected/measured. The value of  
Low-side Application  
R7 should then be selected such that the maximum IS  
OUT  
current is in the 400-500A range. For example, if the user  
wanted to detect and measure fault currents up to the hard  
Although this IC was designed for -48V systems, it can also be  
used as a low-side switch for positive 48V systems; the  
operation and components are usually similar. One possible  
difference is the kind of level shifting that may be needed to  
interface logic signals to the IC. For example, many of the IC  
functions are referenced to the IC substrate, connected to the  
fault comparator trip point (10A); the maximum IS  
current  
OUT  
using the application components in figure 23 would be [10A x  
(.02/400] = 500A. The value of R9 should be set to  
accommodate the dynamic range of the A to D converter. For  
this example, a 5Kresistor would produce a full scale input  
voltage to the converter of 2.5V (500A x 5K). Figures 32 and  
33 illustrate the typical output voltage response of the current  
sense circuit for the Over-Current Time-out and hard fault  
single retry events.  
V
pin, but this pin may be considered -48V or GND,  
EE  
depending upon the polarity of the system. Also, the input or  
output logic (running at 5V or 3.3V or even lower) might be  
externally referenced to either V  
GND.  
or V of the IC, instead of  
EE  
DD  
R10 - is a pull-up resistor for the open drain FAULT output pin  
which goes active low when the Over-Current latch is set  
(Over-Current Time-Out). The output signal is referenced to  
V
and the resistor is connected to a positive voltage, 5V or  
EE  
FN9086 Rev 1.00  
July 2004  
Page 16 of 23  
ISL6142, ISL6152  
Electronic Circuit Breaker/Current Limit  
Inrush Current Control  
The primary function of the ISL6142/52 hot plug controller is to  
control the inrush current. When a board is plugged into a live  
backplane, the input capacitors of the board’s power supply  
circuit can produce large current transients as they charge up.  
This can cause glitches on the system power supply (which can  
affect other boards!), as well as possibly cause some permanent  
damage to the power supply.  
The ISL6142/52 allows the user to program both the current limit  
and the time-out period to protect the system against excessive  
TM  
supply or fault currents. The IntelliTrip  
electronic circuit  
breaker is capable of detecting both hard faults, and less severe  
Over-Current conditions.  
The Over-Current trip point is determined by R1 (EQ. 3) also  
referred to as Rsense. When the voltage across this resistor  
exceeds 50mV, the current limit regulator will turn on, and the  
GATE will be pulled lower (to ~4V) to regulate current through  
the FET at 50mV/Rsense. If the fault persists and current limiting  
exceeds the programmed time-out period, the FET will be turned  
The key to allowing boards to be inserted into a live backplane is  
to turn on the power to the board in a controlled manner, usually  
by limiting the current allowed to flow through a FET switch, until  
the input capacitors are fully charged. At that point, the FET is  
fully on, for the smallest voltage drop across it. Figure 31  
illustrates the typical inrush current response for a hot insertion  
under the following conditions:  
off by discharging the GATE pin to V . This will set the Over-  
EE  
Current latch and the PWRGD/PWRGD output will transition to  
the inactive state, indicating power is no longer good. To clear  
the latch and initiate a normal start-up sequence, the user must  
either power down the system (below the UVLO voltage), toggle  
the UV pin below and above its threshold (usually with an  
external transistor), or toggle the DIS pin high to low. Figure 32  
shows the Over-Current shut down and current limiting  
response for a 10short to ground on the output. Prior to the  
short circuit the output load is 110producing an operating  
current of about 0.44A (48V/110). A 10short is then applied  
to the output causing an initial fault current of 4.8A. This  
produces a voltage drop across the 0.02sense resistor of  
approximately 95mV, roughly two times the Over-Current  
threshold of 50mV. The GATE is quickly pulled low to limit the  
current to 2.5A (50mV/Rsense) and the timer is enabled. The  
fault condition persists for the duration of the programmed time-  
out period (C3 = 1500pF) and the GATE is latched off in about  
740s. There is a short filter (3s nominal) on the comparator,  
so current transients shorter than this will be ignored. Longer  
transients will initiate the GATE pull down, current limiting, and  
the timer. If the fault current goes away before the time-out  
period expires the device will exit the current limiting mode and  
resume normal operation.  
V
= -48V, Rsense = 0.02W  
IN  
Current limit = 50mV / 0.02= 2.5A  
C1 = 150nF, C2 = 3.3nF, R3 = 18k  
CL = 100F, RL = 50, I  
= 48V / 50~1.0A  
LOAD  
= 50A (100F / 3.3nF) = 1.5A  
I
inrush  
After the contact bounce subsides the UVLO and UV criteria are  
quickly met and the GATE begins to ramp up. As the GATE  
reaches approximately 4V with respect to the source, the FET  
begins to turn on allowing current to charge the 100F load  
capacitor. As the drain to source voltage begins to drop, the  
feedback network of C2 and R3 hold the GATE constant, in this  
case limiting the current to approximately 1.5A. When the  
DRAIN voltage completes its ramp down, the load current  
remains constant at approximately 1.0A as the GATE voltage  
increases to its final value.  
FIGURE 31. HOT INSERTION INRUSH CURRENT LIMITING,  
DISABLE PIN TIED TO V  
EE  
FIGURE 32. CURRENT LIMITING AND TIME-OUT  
FN9086 Rev 1.00  
July 2004  
Page 17 of 23  
ISL6142, ISL6152  
In addition to current limiting and programmable time-out, there  
is a hard fault comparator to respond to short circuits with an  
immediate GATE shutdown (typically 10s) and a single retry.  
The trip point of this comparator is set ~4 times (210mV) higher  
than the Over-Current threshold of 50mV. If the hard fault  
comparator trip point is exceeded, a hard pull down current  
(350mA) is enabled to quickly pull down the GATE and  
momentarily turn off the FET. The fast shutdown resets the  
timer and is followed by a soft start, single retry event. If the  
fault is still present after the GATE is slowly turned on, the  
current limit regulator will trip (sense pin voltage > 50mV), turn  
on the timer, and limit the current to 50mV/Rsense. If the fault  
remains and the time-out period is exceeded the GATE pin will  
be latched low. Note: Since the timer starts when the SENSE  
pin exceeds the 50mV threshold, then depending on the speed  
of the current transient exceeding 200mV; it’s possible that the  
current limit time-out and shutdown can occur before the hard  
fault comparator trips (and thus no retry). Figure 33 illustrates  
the hard fault response with a zero ohm short circuit at the  
output.  
used to set the trip points on the UV and OV pins. If the voltage  
on the UV pin is above its threshold and the voltage on the OV  
pin is below its threshold, the supply is within its expected  
operating range and the GATE will be allowed to turn on, or  
remain on. If the UV pin voltage drops below its high to low  
threshold, or the OV pin voltage increases above its low to high  
threshold, the GATE pin will be pulled low, turning off the FET  
until the supply is back within tolerance.  
The OV and UV inputs are high impedance, so the value of the  
external resistor divider is not critical with respect to input  
current. Therefore, the next consideration is total current; the  
resistors will always draw current, equal to the supply voltage  
divided by the total resistance of the divider (R4+R5+R6) so  
the values should be chosen high enough to get an acceptable  
current. However, to the extent that the noise on the power  
supply can be transmitted to the pins, the resistor values might  
be chosen to be lower. A filter capacitor from UV to -V or OV  
IN  
to -V is a possibility, if certain transients need to be filtered.  
IN  
(Note that even some transients which could momentarily shut  
off the GATE might recover fast enough such that the GATE or  
the output current does not even see the interruption).  
Finally, take into account whether the resistor values are  
readily available, or need to be custom ordered. Tolerances of  
1% are recommended for accuracy. Note that for a typical 48V  
system (with a 43V to 72V range), the 43V or 72V is being  
divided down to 1.255V, a significant scaling factor. For UV, the  
ratio is roughly 35 times; every 3mV change on the UV pin  
represents roughly 0.1V change of power supply voltage.  
Conversely, an error of 3mV (due to the resistors, for example)  
results in an error of 0.1V for the supply trip point. The OV ratio  
is around 60. So the accuracy of the resistors comes into play.  
The hysteresis of the comparators is also multiplied by the  
scale factor of 35 for the UV pin (35 * 135mV = 4.7V of  
hysteresis at the power supply) and 60 for the OV pin (60 *  
25mV = 1.5V of hysteresis at the power supply).  
With the three resistors, the UV equation is based on the  
simple resistor divider:  
FIGURE 33. HARD FAULT SHUTDOWN AND RETRY  
1.255 = V  
[(R5 + R6)/(R4 + R5 + R6)] or  
= 1.255 [(R4 + R5 + R6)/(R5 + R6)]  
UV  
As in the Over-Current Time-Out response discussed  
previously, the supply is set at -48V and the current limit is set  
at 2.5A. After the initial gate shutdown (10s) a soft start is  
initiated with the short circuit still present. As the GATE slowly  
turns on the current ramps up and exceeds the Over-Current  
threshold (50mV) enabling the timer and current limiting (2.5A).  
The fault remains for the duration of the time-out period and  
the GATE pin is quickly pulled low and latched off.  
V
UV  
Similarly, for OV:  
1.255 = V [(R6)/(R4 + R5 + R6)] or  
OV  
= 1.255 [(R4 + R5 + R6)/(R6)]  
V
OV  
Note that there are two equations, but 3 unknowns. Because of  
the scale factor, R4 has to be much bigger than the other two;  
chose its value first, to set the current (for example, 50V / 500k  
draws 100A), and then the other two will be in the 10krange.  
Solve the two equations for two unknowns. Note that some  
iteration may be necessary to select values that meet the  
requirement, and are also readily available standard values.  
Applications: OV and UV  
The UV and OV pins can be used to detect Over-Voltage and  
Under-Voltage conditions on the input supply and quickly shut  
down the external FET to protect the system. Each pin is tied  
to an internal comparator with a nominal reference of 1.255V. A  
The three resistor divider (R4, R5, R6) is the recommended  
approach for most applications, but if acceptable values can’t  
be found, then consider 2 separate resistor dividers (one for  
resistor divider between the V  
(gnd) and -V is typically  
IN  
DD  
FN9086 Rev 1.00  
July 2004  
Page 18 of 23  
ISL6142, ISL6152  
each pin, both from V  
adjust or trim either trip point independently. Some applications  
employ a short pin ground on the connector tied to R4 to  
ensure the hot plug device is fully powered up before the UV  
and OV pins (tied to the short pin ground) are biased. This  
ensures proper control of the GATE is maintained during power  
up. This is not a requirement for the ISL6142/52 however the  
circuit will perform properly if a short pin scheme is  
to -V ). This also allows the user to  
IN  
acceptable logic levels to whatever signal it is driving. An  
external clamp may be used to limit the voltage range.  
DD  
VDD  
VIN+  
VOUT+  
V  
(SECTION OF) ISL6142  
(L VERSION)  
GATE  
V
PWRGD  
GH  
ON/OFF  
-
GATE  
+
V
implemented (reference Figure 38).  
PG  
+
ACTIVE LOW  
ENABLE  
MODULE  
+
-
CL  
+
-
LATCH  
LOGIC  
Q2  
Applications: PWRGD/PWRGD  
V
EE  
The PWRGD/PWRGD outputs are typically used to directly  
enable a power module, such as a DC/DC converter. The  
PWRGD (ISL6142) is used for modules with active low enable  
(L version), and PWRGD (ISL6152) for those with an active  
high enable (H version). The modules usually have a pull-up  
device built-in, as well as an internal clamp. If not, an external  
pull-up resistor may be needed. If the pin is not used, it can be  
left open.  
V
EE  
V
DH  
+
-
VIN- VOUT-  
+
-
V
EE  
DRAIN  
FIGURE 34. ACTIVE LOW ENABLE MODULE  
The PWRGD can also drive an opto-coupler (such as a 4N25),  
as shown in Figure 35 or LED (Figure 36). In both cases, they  
are on (active) when power is good. Resistors R13 or R14 are  
chosen based on the supply voltage, and the amount of current  
needed by the loads.  
For both versions at initial start-up, when the DRAIN to V  
EE  
voltage differential is less than 1.3V and the GATE voltage is  
within 2.5V (V ) of its normal operating voltage (13.6V),  
GH  
power is considered good and the PWRGD/PWRGD pins will  
go active. At this point the output is latched and the  
V
DD  
comparators above no longer control the output. However a  
second DRAIN comparator remains active and will drive the  
PWRGD/PWRGD output inactive if the DRAIN voltage  
(SECTION OF) ISL6142  
(L VERSION)  
PWRGD  
R13  
PWRGD  
LOGIC  
LATCH  
Q2  
OPTO  
exceeds V by more than 8V. The latch is reset by any of the  
EE  
signals that shut off the GATE (Over-Voltage, Under-Voltage;  
Under-Voltage-Lock-Out; Over-Current Time-Out, disable pin  
high, or powering down). In this case the PWRGD/PWRGD  
output will go inactive, indicating power is no longer good.  
COMPARATORS  
V
EE  
DRAIN  
ISL6142 (L version; Figure 34): Under normal conditions  
FIGURE 35. ACTIVE LOW ENABLE OPTO-ISOLATOR  
(DRAIN voltage - V < V , and V  
Q2 DMOS will turn on, pulling PWRGD low, enabling the  
module.  
- V  
< V ) the  
EE PG GATE  
GATE  
GH  
V
DD  
(SECTION OF) ISL6142  
(L VERSION)  
PWRGD  
R14  
When any of the 5 conditions occur that turn off the GATE (OV,  
UV, UVLO, Over-Current Time-Out, disable pin high) the  
PWRGD latch is reset and the Q2 DMOS device will shut off  
(high impedance). The pin will quickly be pulled high by the  
external module (or an optional pull-up resistor or equivalent)  
which in turn will disable it. If a pull-up resistor is used, it can be  
connected to any supply voltage that doesn’t exceed the IC pin  
maximum ratings on the high end, but is high enough to give  
LOGIC  
LATCH  
Q2  
LED (GREEN)  
COMPARATORS  
V
EE  
DRAIN  
FIGURE 36. ACTIVE LOW ENABLE LED  
ISL6152 (H version; Figure 37): Under normal conditions  
(DRAIN voltage - V < V , and V  
- V  
< V ), the  
EE PG GATE  
GATE  
GH  
Q3 DMOS will be on, shorting the bottom of the internal resistor  
to V , turning Q2 off. If the pull-up current from the external  
EE  
module is high enough, the voltage drop across the 6.2k  
resistor will look like a logic high (relative to DRAIN). Note that  
the module is only referenced to DRAIN, not V (but under  
EE  
FN9086 Rev 1.00  
July 2004  
Page 19 of 23  
ISL6142, ISL6152  
normal conditions, the FET is on, and the DRAIN and V are  
EE  
almost the same voltage).  
The input capacitance of the brick is chosen to match its  
system requirements, such as filtering noise, and maintaining  
regulation under varying loads. Note that this input capacitance  
appears as the load capacitance of the ISL6142/52.  
When any of the 5 conditions occur that turn off the GATE, the  
Q3 DMOS turns off, and the resistor and Q2 clamp the PWRGD  
pin to one diode drop (~0.7V) above the DRAIN pin. This should  
be able to pull low against the module pull-up current, and  
The brick’s output capacitance is also determined by the  
system, including load regulation considerations. However, it  
can affect the ISL6142/52, depending upon how it is enabled.  
For example, if the PWRGD/PWRGD signal is not used to  
enable the brick, the following could occur. Sometime during  
the inrush current time, as the main power supply starts  
charging the brick input capacitors, the brick itself will start  
working, and start charging its output capacitors and load; that  
current has to be added to the inrush current. In some cases,  
the sum could exceed the Over-Current threshold, which could  
shut down the system if the time-out period is exceeded!  
Therefore, whenever practical, it is advantageous to use the  
PWRGD/PWRGD output to keep the brick off at least until the  
input caps are charged up, and then start-up the brick to  
charge its output caps.  
disable the module.  
VDD  
VIN+  
VOUT+  
V  
PWRGD  
(SECTION OF) ISL6152  
(H VERSION)  
GATE  
V
GH  
ON/OFF  
-
6.2K  
GATE  
+
V
PG  
+
ACTIVE HIGH  
ENABLE  
MODULE  
+
-
Q2  
CL  
+
-
LATCH  
LOGIC  
Q3  
V
V
EE  
EE  
V
DH  
+
-
VIN- VOUT-  
+
-
V
EE  
Typical brick regulators include models such as Lucent  
JW050A1-E or Vicor VI-J30-CY. These are nominal -48V input,  
and 5V outputs, with some isolation between the input and  
output.  
DRAIN  
FIGURE 37. ACTIVE HIGH ENABLE MODULE  
Applications: GATE Pin  
To help protect the external FET, the output of the GATE pin is  
internally clamped; up to an 80V supply and will not be any  
higher than 15V. Under normal operation when the supply  
voltage is above 20V, the GATE voltage will be regulated to a  
Applications: Optional Components  
In addition to the typical application, and the variations already  
mentioned, there are a few other possible components that  
might be used in specific cases. See Figure 38 for some  
possibilities.  
nominal 13.6V above V  
.
EE  
Applications: “Brick” Regulators  
If the input power supply exceeds the 100V absolute maximum  
rating, even for a short transient, that could cause permanent  
damage to the IC, as well as other components on the board. If  
this cannot be guaranteed, a voltage suppressor (such as the  
One of the typical loads used are DC/DC regulators, some  
commonly known as “brick” regulators, (partly due to their  
shape, and because it can be considered a “building block” of  
a system). For a given input voltage range, there are usually  
whole families of different output voltages and current ranges.  
There are also various standardized sizes and pinouts, starting  
with the original “full” brick, and since getting smaller (half-  
bricks and quarter-bricks are now common).  
SMAT70A, D1) is recommended. When placed from V  
to -  
DD  
V
on the board, it will clamp the voltage.  
IN  
If transients on the input power supply occur when the supply  
is near either the OV or UV trip points, the GATE could turn on  
or off momentarily. One possible solution is to add a filter cap  
C4 to the V  
pin, through isolation resistor R11. A large value  
DD  
Other common features may include: all components (except  
some filter capacitors) are self-contained in a molded plastic  
package; external pins for connections; and often an ENABLE  
input pin to turn it on or off. A hot plug IC, such as the ISL6142  
is often used to gate power to a brick, as well as turn it on.  
of R11 is better for the filtering, but be aware of the voltage  
drop across it. For example, a 1kresistor, with 2.4mA of I  
would have 2.4V across it and dissipate 2.4mW. Since the UV  
and OV comparators are referenced with respect to V they  
DD  
EE,  
should not be affected, but the GATE clamp voltage could be  
Many bricks have both logic polarities available (Enable high or  
low input); select the ISL6142 (L-version) or ISL6152 (H-  
version) to match. There is little difference between them,  
although the L-version output is usually simpler to interface.  
offset by the voltage across the extra resistor.  
The Enable input often has a pull-up resistor or current source,  
or equivalent built in; care must be taken in the ISL6152 (H  
version) output that the given current will create a high enough  
input voltage (remember that current through the RPG 6.2k  
resistor generates the high voltage level; see Figure 34).  
FN9086 Rev 1.00  
July 2004  
Page 20 of 23  
ISL6142, ISL6152  
The switch SW1 is shown as a simple push button. It can be  
replaced by an active switch, such as an NPN or NFET; the  
principle is the same; pull the UV node below its trip point, and  
then release it (toggle low). To connect an NFET, for example,  
R12 is a pull-up resistor for PWRGD, if there is no other  
component acting as a pull-up device. The value of R12 is  
determined by how much current is needed when the pin is  
pulled low (also affected by the V  
voltage); and it should be  
DD  
the DRAIN goes to UV; the source to -V , and the GATE is the  
input; if it goes high (relative to -V ), it turns the NFET on, and  
IN  
UV is pulled low. Just make sure the NFET resistance is low  
compared to the resistor divider, so that it has no problem  
pulling down against it.  
pulled low enough for a good logic low level. An LED can also  
be placed in series with R12, if desired. In that case, the  
criteria is the LED brightness versus current.  
IN  
GND  
(SHORT PIN)  
GND  
GND  
Logic  
Supply  
R11*  
(V +5V)  
R10  
EE  
R12*  
V
FAULT  
DIS  
DD  
PWRGD  
IS  
OUT  
R4  
ISL6142  
UV  
R5  
R6  
OV  
CT  
TO  
ADC  
SW1*  
V
IS-  
IS+ SENSE GATE  
DRAIN  
C2  
EE  
D1*  
Logic  
Input  
R3  
C1  
R2  
Q2  
C3  
R7  
CL  
R9  
R8  
C4*  
RL  
-48V OUT  
-48V IN  
R1  
Q1  
FIGURE 38. ISL6142/52 OPTIONAL COMPONENTS (SHOWN WITH *)  
desired, consider the isolation resistor R10, as shown in  
Figure 38.  
Applications: Layout Considerations  
For the minimum application, there are 10 resistors, 3  
capacitors, one IC and 2 FETs. A sample layout is shown in  
Figure 39. It assumes the IC is 8-SOIC; Q1 is in a D2PAK (or  
similar SMD-220 package).  
NOTE:  
1. Layout scale is approximate; routing lines are just for illustration  
purposes; they do not necessarily conform to normal PCB design  
rules. High current buses are wider, shown with parallel lines.  
Although GND planes are common with multi-level PCBs, for a  
-48V system, the -48V rails (both input and output) act more  
like a GND than the top 0V rail (mainly because the IC signals  
are mostly referenced to the lower rail). So if separate planes  
for each voltage are not an option, consider prioritizing the  
bottom rails first.  
2. Approximate size of the above layout is 0.8 x 0.8 inches, excluding  
Q1 (D2PAK or similar SMD-220 package).  
3. R1 sense resistor is size 2512; all other R’s and C’s shown are  
0805; they can all potentially use smaller footprints, if desired.  
4. The RL and CL are not shown on the layout.  
5. Vias are needed to connect R4 and V  
to GND on the bottom of  
DD  
the board, and R8 to pin 9; all other routing can be on the top level.  
Note that with the placement shown, most of the signal lines  
are short, and there should be minimal interaction between  
them.  
6. PWRGD signal is not used here.  
Although decoupling capacitors across the IC supply pins are  
often recommended in general, this application may not need  
one, nor even tolerate one. For one thing, a decoupling cap  
would add to (or be swamped out by) any other input  
capacitance; it also needs to be charged up when power is  
applied. But more importantly, there are no high speed (or any)  
input signals to the IC that need to be conditioned. If still  
FN9086 Rev 1.00  
July 2004  
Page 21 of 23  
ISL6142, ISL6152  
R9 = 4.99K(1%)  
BOM (Bill Of Materials)  
R1 = 0.02(5%)  
R10 = 5.10K(10%)  
C1 = 150nF (25V)  
R2 =10.0(5%)  
R3 = 18.0K(10%)  
R4 = 549K(1%)  
R5 = 6.49K(1%)  
R6 = 10.0K(1%)  
R7 = R8 = 400(1%)  
C2 = 3.3nF (100V)  
C3 = 1500pF (25V)  
Q1 = IRF530 (100V, 17A, 0.11)  
Q2 = N-channel Logic FEFT  
GND  
GND  
TO  
V
DD  
R9  
C3  
-48V  
IN  
+5V  
R10  
1 PG  
2 FLT  
3 DIS  
VDD 14  
CT 13  
C2  
R3  
LOGIC IN  
G
D
-48V  
IN  
S
GATE  
NFET  
IS  
O 12  
R6  
-48V  
IN  
ISL6142  
4 OV  
5 UV  
D 11  
DRAIN  
G 10  
IS+ 9  
R5  
R4  
R2  
6 IS-  
GND  
SOURCE  
7 VEE  
S 8  
C1  
-48V OUT  
TO  
PIN 9  
R7  
R8  
-48V IN  
R1  
FIGURE 39. ISL6142 SAMPLE LAYOUT (NOT TO SCALE)  
FN9086 Rev 1.00  
July 2004  
Page 22 of 23  
ISL6142, ISL6152  
ISL6142, ISL6152  
Small Outline Plastic Packages (SOIC)  
N
M14.15 (JEDEC MS-012-AB ISSUE C)  
14 LEAD NARROW BODY SMALL OUTLINE PLASTIC  
PACKAGE  
INDEX  
AREA  
0.25(0.010)  
M
B M  
H
E
INCHES  
MILLIMETERS  
-B-  
SYMBOL  
MIN  
MAX  
MIN  
1.35  
0.10  
0.33  
0.19  
4.80  
3.80  
MAX  
1.75  
0.25  
0.51  
0.25  
5.00  
4.00  
NOTES  
A
A1  
B
C
D
E
e
0.0532  
0.0040  
0.013  
0.0688  
0.0098  
0.020  
-
1
2
3
L
-
SEATING PLANE  
A
9
-A-  
o
0.0075  
0.1890  
0.1497  
0.0098  
0.1968  
0.1574  
-
h x 45  
D
3
-C-  
4
µ
0.050 BSC  
1.27 BSC  
-
e
A1  
C
H
h
0.2284  
0.0099  
0.016  
0.2440  
0.0196  
0.050  
5.80  
0.25  
0.40  
6.20  
0.50  
1.27  
-
B
0.10(0.004)  
5
0.25(0.010) M  
C A M B S  
L
6
NOTES:  
N
8
8
7
1. Symbols are defined in the “MO Series Symbol List” in Section  
2.2 of Publication Number 95.  
o
o
o
o
0
8
0
8
-
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.  
Rev. 0 12/93  
3. Dimension “D” does not include mold flash, protrusions or gate  
burrs. Mold flash, protrusion and gate burrs shall not exceed  
0.15mm (0.006 inch) per side.  
4. Dimension “E” does not include interlead flash or protrusions.  
Interlead flash and protrusions shall not exceed 0.25mm  
(0.010 inch) per side.  
5. The chamfer on the body is optional. If it is not present, a visual  
index feature must be located within the crosshatched area.  
6. “L” is the length of terminal for soldering to a substrate.  
7. “N” is the number of terminal positions.  
8. Terminal numbers are shown for reference only.  
9. The lead width “B”, as measured 0.36mm (0.014 inch) or great-  
er above the seating plane, shall not exceed a maximum value  
of 0.61mm (0.024 inch).  
10. Controlling dimension: MILLIMETER. Converted inch dimen-  
sions are not necessarily exact.  
© Copyright Intersil Americas LLC 2004. All Rights Reserved.  
All trademarks and registered trademarks are the property of their respective owners.  
For additional products, see www.intersil.com/en/products.html  
Intersil products are manufactured, assembled and tested utilizing ISO9001 quality systems as noted  
in the quality certifications found at www.intersil.com/en/support/qualandreliability.html  
Intersil products are sold by description only. Intersil may modify the circuit design and/or specifications of products at any time without notice, provided that such  
modification does not, in Intersil's sole judgment, affect the form, fit or function of the product. Accordingly, the reader is cautioned to verify that datasheets are  
current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its  
subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or  
otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see www.intersil.com  
FN9086 Rev 1.00  
July 2004  
Page 23 of 23  

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