ISL6142CB-T [RENESAS]
1-CHANNEL POWER SUPPLY SUPPORT CKT, PDSO14, PLASTIC, MS-012-AB, SOIC-14;型号: | ISL6142CB-T |
厂家: | RENESAS TECHNOLOGY CORP |
描述: | 1-CHANNEL POWER SUPPLY SUPPORT CKT, PDSO14, PLASTIC, MS-012-AB, SOIC-14 光电二极管 |
文件: | 总23页 (文件大小:959K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
DATASHEET
ISL6142, ISL6152
Negative Voltage Hot Plug Controller
FN9086
Rev 1.00
July 2004
The ISL6142/52 are 14 pin, negative voltage hot plug
controllers that allow a board to be safely inserted and
removed from a live backplane. Inrush current is limited to a
programmable value by controlling the gate voltage of an
external N-channel pass transistor. The pass transistor is
turned off if the input voltage is less than the Under-Voltage
threshold, or greater than the Over-Voltage threshold. The
PWRGD/PWRGD outputs can be used to directly enable a
power module. When the Gate and DRAIN voltages are both
considered good the output is latched in the active state.
Typical Application
GND
Logic
GND
Supply
V
DD
FAULT
PWRGD
PWRGD
DIS
IS
R10
OUT
R4
R5
R6
ISL6142/ISL6152
UV
OV
CT
IS+ SENSE
V
GATE DRAIN
IS-
EE
LOAD
R3
C2
C1
The IntelliTripTM electronic circuit breaker and programmable
current limit features protect the system against short
circuits. When the Over-Current threshold is exceeded, the
output current is limited for a time-out period before the
circuit breaker trips and shuts down the FET. The time-out
period is programmable with an external capacitor
connected to the CT pin. If the fault disappears before the
programmed time-out, normal operation resumes. In
addition, the IntelliTripTM electronic circuit breaker has a fast
Hard Fault shutdown, with a threshold set at 4 times the
Over-Current trip point. When activated, the GATE is
immediately turned off and then slowly turned back on for a
single retry.
R7
CL
RL
R8
R9
C3
R2
-48V IN
R1
Q1
-48V OUT
C2 = 3.3nF (100V)
C3 = 1500pF (25V)
Q1 = IRF530
CL = 100uF (100V)
RL = Equivalent load
R1 = 0.02
(1%)
R6 = 10K
R7 = R8 = 400 (1%)
R9 = 4.99K
R10 = 5.1K
C1 = 150nF (25V)
(1%)
R2 = 10
R3 = 18K
R4 = 549K
(5%)
(5%)
(1%)
(1%)
(1%)
(10%)
R5 = 6.49K
Features
• Operates from -20V to -80V (-100V Absolute Max Rating)
• Programmable Inrush Current
• Programmable Time-Out
• Programmable Current Limit
• Programmable Over-Voltage Protection
• Programmable Under-Voltage Protection
The IS+, IS-, and IS
OUT
pins combine to provide a load
current monitor feature that presents a scaled version of the
load current at the IS pin. Current to voltage conversion
- 135 mV of hysteresis ~4.7V of hysteresis at the power
supply
OUT
is accomplished by placing a resistor (R9) from IS
negative input (-48V).
to the
OUT
• V
DD
Under-Voltage Lock-Out (UVLO) ~ 16.5V
• IntelliTripTM Electronic Circuit Breaker distinguishes
between severe and moderate faults
Related Literature
- Fast shutdown for short circuit faults with a single retry
(fault current > 4X current limit value).
• ISL6142/52EVAL1 Board Set, Document AN1000
• ISL6140/50EVAL1 Board Set, Document AN9967
• ISL6140/41EVAL1 Board Set, Document AN1020
• ISL6141/51 Hot Plug Controller, Document FN9079
• ISL6141/51 Hot Plug Controller, Document FN9039
• ISL6116 Hot Plug Controller, Document FN4778
NOTE: See www.intersil.com/hotplug for more information.
• FAULT pin reports the occurrence of an Over-Current
Time-Out
• Disable input controls GATE shutdown and resets Over-
Current fault latch
• Load Current Monitor Function
- IS
OUT
- A resistor from IS
provides a scaled version of the load current
to -V provides current to
OUT
IN
Pinout
voltage conversion
ISL6142 OR ISL6152 (14 LEAD SOIC)
• Power Good Control Output
14
13
12
11
10
9
PWRGD/PWRGD
1
V
DD
Top View
- Output latched “good” when DRAIN and GATE voltage
thresholds are met.
2
FAULT
DIS
CT
IS
3
4
5
OUT
ISL6142/52
OV
- (PWRGD active low: ISL6142 (L version)
- PWRGD active high: ISL6152 (H version)
• Pb-free available
DRAIN
GATE
IS+
UV
IS-
6
7
8
V
SENSE
EE
Applications
• VoIP (Voice over Internet Protocol) Servers
• Telecom systems at -48V
• Negative Power Supply Control
• +24V Wireless Base Station Power
FN9086 Rev 1.00
July 2004
Page 1 of 23
ISL6142, ISL6152
Ordering Information
PKG.
DWG. #
o
PART NUMBER TEMP. RANGE ( C) PACKAGE
ISL6142CB
0 to 70
0 to 70
14 Lead SOIC M14.15
ISL6142CBZA
(See Note)
14 Lead SOIC M14.15
(Pb-free)
ISL6152CB
0 to 70
0 to 70
14 Lead SOIC M14.15
ISL6152CBZA
(See Note)
14 Lead SOIC M14.15
(Pb-free)
ISL6142IB
-40 to 85
-40 to 85
14 Lead SOIC M14.15
ISL6142IBZA
(See Note)
14 Lead SOIC M14.15
(Pb-free)
ISL6152IB
-40 to 85
-40 to 85
14 Lead SOIC M14.15
ISL6152IBZA
(See Note)
14 Lead SOIC M14.15
(Pb-free)
*Add “-T” suffix to part number for tape and reel packaging.
NOTE: Intersil Pb-free products employ special Pb-free material
sets; molding compounds/die attach materials and 100% matte tin
plate termination finish, which is compatible with both SnPb and
Pb-free soldering operations. Intersil Pb-free products are MSL
classified at Pb-free peak reflow temperatures that meet or exceed
the Pb-free requirements of IPC/JEDEC J Std-020B.
FN9086 Rev 1.00
July 2004
Page 2 of 23
ISL6142, ISL6152
ISL6142, ISL6152 Block Diagram
GND
GND
V
DD
-
UVLO
1.265V
R4
R5
+
+
REGULATOR,
REFERENCES
-
V
V
EE
EE
UV
OV
-
UV
OV
1.255V
+
13V
+
-
V
EE
+
-
1.255V
LOGIC,
+
-
V
TIMING,
GATE
EE
DRIVE
-
HARD
FAULT
R6
210mV
+
+
-
V
EE
-
GATE
11.1V
+
+
PWRGD
(ISL6142)
-
V
EE
LATCH,
LOGIC,
OUTPUT
DRIVE
CURRENT
LIMIT
REGULATOR
-
-
LOGIC
SUPPLY
PWRGD
(ISL6152)
50mV
+
1.3V
+
+
-
+
-
V
EE
V
EE
R10
FAULT
DIS
FAULT
-
V
8.0V
EE
+
DISABLE
+
-
LOGIC
INPUT
V
EE
13V
V
EE+5V
CT
-
TIMER
8.5V
+
+
-
V
C3
V
EE
EE
GATE
STOP
CURRENT
SENSE
IS
OUT
TO ADC
V
GATE
DRAIN
EE IS-
R8
IS+
SENSE
LOAD
CL
R7
R3 C2
R9
R2
C1
RL
Q1
FIGURE 1. BLOCK DIAGRAM
-48V OUT
R1
-48V IN
FN9086 Rev 1.00
July 2004
Page 3 of 23
ISL6142, ISL6152
Pin Descriptions
PWRGD (ISL6142; L Version) Pin 1 - This digital output is an
open-drain pull-down device and can be used to directly enable
an external module. During start-up the DRAIN and GATE
voltages are monitored with two separate comparators. The first
comparator looks at the DRAIN pin voltage compared to the
FAULT Pin 2- This digital output is an open-drain, pull-down
device, referenced to V . It is pulled active low whenever the
EE
Over-Current latch is set. It goes to a high impedance state
when the fault latch is reset by toggling the UV or DIS pins. An
external pull-up resistor to a logic supply (5V or less) is
required; the fault outputs of multiple IC’s can be wire-OR’d
together. If the pin is not used it should be left open.
internal V
reference (1.3V); this measures the voltage drop
PG
across the external FET and sense resistor. When the DRAIN to
voltage drop is less than 1.3V, the first of two conditions
V
EE
DIS Pin 3 - This digital input disables the FET when driven to a
logic high state. It has a weak internal pull-up device to an
internal 5V rail (10A), so an open pin will also act as a logic
high. The input has a nominal trip point of 1.6 V while rising,
and a hysteresis of 1.0V. The threshold voltage is referenced to
required for the power to be considered good are met. In
addition, the GATE voltage monitored by the second comparator
must be within approximately 2.5V of its normal operating
voltage (13.6V). When both criteria are met the PWRGD output
will transition low and be latched in the active state, enabling the
external module. When this occurs the two comparators
discussed above no longer control the output. However a third
comparator continues to monitor the DRAIN voltage, and will
drive the PWRGD output inactive if the DRAIN voltage raises
V
, and is compatible with CMOS logic levels. A logic low will
EE
allow the GATE to turn on (assuming the 4 other conditions
described in the GATE section are also true). The DIS pin can
also be used to reset the Over-Current latch when toggled high
to low. If not used the pin should be tied to the negative supply
more than 8V above V . In addition, any of the signals that
EE
rail (-V ).
IN
shut off the GATE (Over-Voltage, Under-Voltage, Under-Voltage
Lock-Out, Over-Current time-out, pulling the DIS pin high, or
powering down) will reset the latch and drive the PWRGD output
high to disable the module. In this case, the output pull-down
device shuts off, and the pin becomes high impedance. Typically
an external pull-up of some kind is used to pull the pin high
(many brick regulators have a pull-up function built in).
OV (Over-Voltage) Pin 4 - This analog input compares the
voltage on the pin to an internal voltage reference of 1.255 V
(nominal). When the input goes above the reference the GATE
pin is immediately pulled low to shut off the external FET. The
built in 25mV hysteresis will keep the GATE off until the OV pin
drops below 1.230V (the nominal high to low threshold). A
typical application will use an external resistor divider from
PWRGD (ISL6152; H Version) Pin 1 - This digital output is
used to provide an active high signal to enable an external
module. The Power Good comparators are the same as
described above, but the active state of the output is reversed
(reference figure 37).
V
to -V to set the OV trip level. A three-resistor divider can
DD
IN
be used to set both OV and UV trip points to reduce
component count.
UV (Under-Voltage) Pin 5 - This analog input compares the
voltage on the pin to an internal comparator with a built in
hysteresis of 135mv. When the UV input goes below the
nominal reference voltage of 1.120V, the GATE pin is
immediately pulled low to shut off the external FET. The GATE
will remain off until the UV pin rises above a 1.255V low to high
threshold. A typical application will use an external resistor
When power is considered good (both DRAIN and GATE are
normal) the output is latched in the active high state, the DMOS
device (Q3) turns on and sinks current to V through a 6.2K
EE
resistor. The base of Q2 is clamped to V to turn it off. If the
EE
external pull-up current is high enough (>1mA, for example), the
voltage drop across the resistor will be large enough to produce
a logic high output and enable the external module (in this
example, 1mA x 6.2K = 6.2V).
divider from V
to -V to set the UV level as desired. A
DD
IN
three-resistor divider can be used to set both OV and UV trip
points to reduce component count.
Note that for all H versions, although this is a digital pin
functionally, the logic high level is determined by the external
pull-up device, and the power supply to which it is connected;
The UV pin is also used to reset the Over-Current latch. The
pin must be cycled below 1.120V (nominal) and then above
1.255V (nominal) to clear the latch and initiate a normal start-
up sequence.
the IC will not clamp it below the V
voltage. Therefore, if the
DD
external device does not have its own clamp, or if it would be
damaged by a high voltage, an external clamp might be
necessary.
IS- Pin 6 - This analog pin is the negative input of the current
sense circuit. A sensing resistor (R7) is connected between
this pin and the V side of resistor R1. The ratio of R1/R7
EE
If the power good latch is reset (GATE turns off), the internal
DMOS device (Q3) is turned off, and Q2 (NPN) turns on to
clamp the output one diode drop above the DRAIN voltage to
produce a logic low, indicating power is no longer good.
defines the I
to IS current scaling factor. If current
OUT
SENSE
sensing is not used in the application, the IS- pin should be tied
directly to the IS+ pin and the node should be left floating.
FN9086 Rev 1.00
July 2004
Page 4 of 23
ISL6142, ISL6152
Pin 7 - This is the most Negative Supply Voltage, such
V
1.3v and 8.0V. At initial start-up the DRAIN to V voltage
EE
EE
as in a -48V system. Most of the other signals are
referenced relative to this pin, even though it may be far
away from what is considered a GND reference.
differential must be less than 1.3V, and the GATE voltage
must be within 2.5V of its normal operating voltage (13.6V)
for power to be considered good. When both conditions are
met, the PWRGD/PWRGD output is latched into the active
state. At this point only the 8V DRAIN comparator can
control the PWRGD/PWRGD output, and will drive it inactive
SENSE Pin 8 - This analog input monitors the voltage drop
across the external sense resistor to determine if the current
flowing through it exceeds the programmed Over-Current
trip point (50mV / Rsense). If the Over-Current threshold is
exceeded, the circuit will regulate the current to maintain a
nominal voltage drop of 50mV across the R1 sense resistor,
also referred to as Rsense. If current is limited for more than
the programmed time-out period the IntelliTripTM electronic
circuit breaker will trip and turn off the FET.
if the DRAIN voltage exceeds V by more than 8.0V.
EE
IS
Pin 12 - This analog pin is the output of the current
sense circuit. The current flowing out of this pin (IS ) is
OUT
OUT
proportional to the current flowing through the R1 sense
resistor (I ). The scaling factor, IS /I is
SENSE OUT SENSE
defined by the resistor ratio of R1/R7. Current to voltage
conversion is accomplished by placing a resistor from this
pin to -V . The current flowing out of the pin is supplied by
IN
the internal 13V regulator and should not exceed 600A.
The output voltage will clamp at approximately 8V. If current
sensing is not used in the application the pin should be left
open.
A second comparator is employed to detect and respond
quickly to hard faults. The threshold of this comparator is set
approximately four times higher (210mV) than the Over-
Current trip point. When the hard fault comparator threshold
is exceeded the GATE is immediately (10s typical) shut off
(V
= V ), the timer is reset, and a single retry (soft
GATE
EE
start) is initiated.
CT Pin 13 - This analog I/O pin is used to program the Over-
Current Time-Out period with a capacitor connected to the
IS+ Pin 9 - This analog pin is the positive input of the current
sense circuit. A sensing resistor (R8) is connected between
this pin and the output side of R1, which is also connected to
the SENSE pin. It should match the IS- resistor (R7) as
closely as possible (1%) to minimize output current error
negative supply rail (-V which is equal to V ). During
IN EE
normal operation, the pin is pulled down to V . During
EE
current limiting, the capacitor is charged with a 20A
(nominal) current source. When the CT pin charges to 8.5V,
it times out and the GATE is latched off. If the short circuit
goes away prior to the time-out, the GATE will remain on. If
no capacitor is connected, the time-out will be much quicker,
with only the package pin capacitance (~ 5 to 10 pF) to
charge. If no external capacitor is connected to the CT pin
the time-out will occur in a few sec. To set the desired time-
out period use:
(IS
). If current sensing is not used in the application, the
OUT
IS+ pin should be tied directly to the IS- pin and the node
should be left floating.
GATE Pin 10 - This analog output drives the gate of the
external FET used as a pass transistor. The GATE pin is
high (FET is on) when the following conditions are met:
6
• V
DD
UVLO is above its trip point (~16.5V)
dt = (C * dV) / I = (C * 8.5) / 20 A = 0.425*10 * C
• Voltage on the UV pin is above its trip point (1.255V)
• Voltage on the OV pin is below its trip point (1.255V)
• No Over-Current conditions are present.
• The Disable pin is low.
NOTE: The printed circuit board’s parasitic capacitance (CT pin to
the negative input, -V ) should be taken into consideration when
IN
calculating the value of C3 needed for the desired time-out.
V
Pin 14 - This is the most positive Power Supply pin. It
DD
can range from the Under-Voltage lockout threshold (16.5V)
If any of the 5 conditions are violated, the GATE pin will be
pulled low to shut off or regulate current through the FET.
The GATE is latched off only when an Over-Current event
exceeds the programmed time-out period.
to +80V (Relative to V ). The pin can tolerate up to 100V
EE
without damage to the IC.
The GATE is driven high by a weak (-50A nominal) pull-up
current source, in order to slowly turn on the FET. It is driven
low by a 70mA (nominal) pull-down device for three of the
above shut-off conditions. A larger (350mA nominal) pull-
down current shuts off the FET very quickly in the event of a
hard fault where the sense pin voltage exceeds
approximately 210mV.
DRAIN Pin 11 - This analog input monitors the voltage of the
FET drain for the Power Good function. The DRAIN input is
tied to two comparators with internal reference voltages of
FN9086 Rev 1.00
July 2004
Page 5 of 23
ISL6142, ISL6152
.
Absolute Maximum Ratings
Thermal Information
o
Supply Voltage (V
to V ). . . . . . . . . . . . . . . . . . . . -0.3V to 100V
EE
Thermal Resistance (Typical, Note 1)
( C/W)
DD
JA
DRAIN, PWRGD, PWRGD Voltage . . . . . . . . . . . . . . .-0.3V to 100V
UV, OV Input Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to 60V
SENSE, GATE Voltage . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to 20V
14 Lead SOIC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
o
Maximum Junction Temperature (Plastic Package) . . . . . . . .150 C
o
o
Maximum Storage Temperature Range. . . . . . . . . . -65 C to 150 C
o
FAULT, DIS, IS+, IS-, IS
, CT . . . . . . . . . . . . . . . . . -0.3V to 8.0V
OUT
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300 C
ESD Rating
Human Body Model (Per MIL-STD-883 Method 3015.7) . . .2000V
Operating Conditions
o
o
Temperature Range (Industrial) . . . . . . . . . . . . . . . . . -40 C to 85 C
Temperature Range (Commercial). . . . . . . . . . . . . . . . . 0 C to 70 C
Supply Voltage Range (Typical). . . . . . . . . . . . . . . . . . . 36V to 72V
o
o
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES:
1. is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
JA
2. PWRGD is referenced to DRAIN; V = 0V.
-V
PWRGD DRAIN
Electrical Specifications
V
= +48V, V = +0V Unless Otherwise Specified. All tests are over the full temperature range; either
EE
DD
Commercial (0 C to 70 C) or Industrial (-40 C to 85 C). Typical specs are at 25 C.
o
o
o
o
o
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX UNITS
DC PARAMETRIC
V
PIN
DD
Supply Operating Range
Supply Current
V
20
-
80
V
DD
I
UV = 3V; OV = V ; SENSE = V ; V
=
2.6
4.0
mA
DD
EE
EE DD
80V
UVLO High
V
V
V
Low to High transition
High to Low transition
15
13
16.7
15.0
1.9
19
17
V
V
V
UVLOH
DD
DD
UVLO Low
V
UVLOL
UVLO hysteresis
GATE PIN
GATE Pin Pull-Up Current
GATE Pin Pull-Down Current
GATE Pin Pull-Down Current
GATE Pin Pull-Down Current
External Gate Drive (at 20V, at 80V)
GATE High Threshold (PWRGD/PWRGD active)
SENSE PIN
I
GATE Drive on, V
V
GATE = EE
-30
12
-50
70
-60
15
A
mA
mA
mA
V
PU
I
GATE Drive off, UV or OV false
PD1
PD2
PD3
I
I
GATE Drive off, Over-Current Time-Out
70
GATE Drive off; Hard Fault, Vsense > 210mv
350
13.6
2.5
V
(V
V
, 20V <=V
<=80V
DD
GATE
GATE - EE)
V - V
GATE
V
V
GH
GATE
Current Limit Trip Voltage
Hard Fault Trip Voltage
SENSE Pin Current
V
V
= (V
- V
)
40
-
50
210
0
60
mV
mV
A
CL
CL
SENSE
EE
HFTV
HFTV = (V
- V
)
SENSE
= 50mV
SENSE
EE
I
V
-0.5
SENSE
UV PIN
UV Pin High Threshold Voltage
UV Pin Low Threshold Voltage
UV Pin Hysteresis
V
UV Low to High Transition
UV High to Low Transition
1.240
1.105
1.255 1.270
1.120 1.145
135
V
V
UVH
V
UVL
V
mV
UVHY
FN9086 Rev 1.00
July 2004
Page 6 of 23
ISL6142, ISL6152
Electrical Specifications
V
= +48V, V = +0V Unless Otherwise Specified. All tests are over the full temperature range; either
EE
DD
Commercial (0 C to 70 C) or Industrial (-40 C to 85 C). Typical specs are at 25 C. (Continued)
o
o
o
o
o
PARAMETER
UV Pin Input Current
OV pin
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX UNITS
I
V
= V
EE
-
-0.05
-0.5
A
INUV
UV
OV Pin High Threshold Voltage
OV Pin Low Threshold Voltage
OV Pin Hysteresis
V
OV Low to High Transition
OV High to Low Transition
1.235
1.215
1.255 1.275
1.230 1.255
25
V
V
OVH
V
OVL
V
mV
A
OVHY
INOV
OV Pin Input Current
DRAIN Pin
I
V
V
= V
-
-0.05
-0.5
OV
EE
Power Good Threshold (Enable PWRGD/PWRGD
Output)
V
- V
0.80
1.30
2.00
V
PG
DRAIN
EE
Drain Input Bias Current
I
V
V
= 48V
10
38
60
A
DRAIN
VDH
DRAIN
DRAIN
DRAIN Pin Comparator Trip Point
(PWRGD/PWRGD Inactive)
- V > 8.0V
EE
7.0
8.0V
9.0
V
ISL6142 (PWRGD Pin: L Version)
PWRGD Output Low Voltage
V
V
(V
(V
- V
- V
< V
< V
I
PG; OUT
= 1mA
= 5mA
-
-
-
0.3
0.8
3.0
10
V
V
OL1
OL5
DRAIN
DRAIN
DRAIN
EE)
EE)
I
1.50
0.05
PG; OUT
Output Leakage
I
V
= 48V, V
= 80V
PWRGD
A
OH
ISL6152 (PWRGD Pin: H Version)
PWRGD Output Low Voltage (PWRGD-DRAIN)
PWRGD Output Impedance
DIS PIN
V
V
= 5V, I
OUT
= 1mA
PG
-
0.80
6.2
1.0
7.5
V
OL
DRAIN
R
(V
- V < V
EE)
4.5
k
OUT
DRAIN
DIS Pin High Threshold Voltage
DIS Pin Low Threshold Voltage
DIS Pin Hysteresis
V
DIS Low to High Transition
DIS High to Low Transition
DIS Hysteresis
1.60
2.20
1.1
1.0
0.1
10
3.00
1.50
V
V
DISH
V
DISL
V
V
DISHY
DIS Pin Input High Leakage
DIS Pin Input Low Current
FAULT PIN
I
Input Voltage = 5V
1.0
A
A
DISINH
I
Input Voltage = 0V
DISINL
FAULT Output Voltage
FAULT Output Leakage
CT PIN
VF
I = 1.6 mA
V = 5.0V
0.4
V
VOL
IF
10
A
IOH
CT Pin Charging Current
CT Pin Input Threshold
I
V
= 0V
CT
20
A
CTINL
V
7.5
8.5
9.5
V
CT
IS PINS (IS-, IS+, IS
)
OUT
IS
IS
Error
Error
VSENSE = 50mV, R7 = 400, R8 = 404
VSENSE = 200mV, R7 = 400, R8 = 404
VSENSE = 0.0mV, R7 = 400, R8 = 404
2.0
1.0
4.5
5
%
%
A
V
OUT
OUT
ISOUT Offset Current
Output Voltage Range (IS
Pin)
0
8
OUT
FN9086 Rev 1.00
July 2004
Page 7 of 23
ISL6142, ISL6152
Electrical Specifications
V
= +48V, V = +0V Unless Otherwise Specified. All tests are over the full temperature range; either
EE
DD
Commercial (0 C to 70 C) or Industrial (-40 C to 85 C). Typical specs are at 25 C. (Continued)
o
o
o
o
o
PARAMETER
AC TIMING
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX UNITS
OV High to GATE Low
OV Low to GATE High
UV Low to GATE Low
t
t
Figures 2A, 3A
0.6
1.0
0.6
1.0
1.6
7.8
1.3
8.4
0.6
2.5
0.5
1.2
4.0
1
3.0
12.0
3.0
s
s
s
s
s
s
s
s
s
s
s
PHLOV
PLHOV
Figures 2A, 3A
Figures 2A, 3B
Figures 2A, 3B
Figure 2A, 7
t
t
PHLUV
PLHUV
UV High to GATE High
DIS Low to GATE Low
DIS High to GATE High
GATE Low (Over-Current) to FAULT Low
12.0
t
t
PHLDIS
Figure 2A, 7
PLHDIS
t
Figure 2A, 8
PHLGF
IS
IS
Rise Time
Fall Time
t
Figure 2A, 12
Figure 2A, 12
Figures 2A, 9
OUT
OUT
R
t
F
SENSE High to GATE Low
Current Limit to GATE Low
t
3
PHLSENSE
t
Figures 2B, 11, Effective Capacitance During
Test = 2550pF
1200
PHLCB
Hard Fault to GATE Low (200mV comparator)
Typical GATE shutdown based on application ckt.
Guaranteed by design.
t
Figures 10, 20, 33
10.0
s
PHLHF
ISL6142 (L Version)
DRAIN Low to PWRGD Low (Active)
DRAIN High to PWRGD High (Inactive)
GATE High to PWRGD Low (Active)
ISL6152 (H Version)
t
Figures 2A, 4A
Figure 2A, 6A
Figures 2A, 5A
0.1
0.1
3.1
0.2
1.0
5.0
5.0
s
s
s
PHLDL
t
PLHDH
t
PHLGH
DRAIN Low to (PWRGD-DRAIN) High (Active)
DRAIN High to (PWRGD -DRAIN) Low (Inactive)
GATE High to (PWRGD-DRAIN) High (Active)
t
Figures 2A, 4B
Figure 2A, 6B
Figures 2A, 5B
0.2
0.5
0.4
s
s
s
PLHDL
PHLDH
PLHGH
t
t
FN9086 Rev 1.00
July 2004
Page 8 of 23
ISL6142, ISL6152
?
Test Circuit and Timing Diagrams
5K
5V
+
-
48V
5K
5V
+
48V
5K
-
PWRGD
FAULT
V
DD
14
13
12
11
10
1
2
3
V
DD
PWRGD
FAULT
5K
CT
14
13
12
11
10
1
2
3
V
DIS
V
OV
ISL6142
4.99K
OV
UV
DRAIN
GATE
4
ISL6142
V
V
OV
V
UV
DRAIN
OV
UV
4
V
5
6
7
DRAIN
UV
V
DRAIN
9.0K
5
6
7
GATE
9
8
400
404
V
EE
SENSE
9
8
V
0.90K
EE
SENSE
.
0.1K
V
SENSE
FIGURE 2B. TEST CIRCUIT FOR TIMEOUT
FIGURE 2A. TYPICAL TEST CIRCUIT
2V
2V
0V
1.125V
1.255V
1.255V
1.230V
UV Pin
GATE
0V
13.6V
t
t
PLHUV
t
PHLUV
t
PHLOV
PLHOV
13.6V
GATE
0V
1V
1V
1V
1V
0V
FIGURE 3B. UV TO GATE TIMING
FIGURE 3A. OV TO GATE TIMING
FIGURE 3. OV AND UV TO GATE TIMING
DRAIN
DRAIN
1.3V
1.3V
V
PG
V
PG
V
EE
t
t
PHLDL
PLHDL
PWRGD
1.0V
1.0V
PWRGD
FIGURE 4A. DRAIN TO PWRGD ACTIVE TIMING (ISL6142)
FIGURE 4B. DRAIN TO PWRGD ACTIVE TIMING (ISL6152)
FIGURE 4. DRAIN TO PWRGD/PWRGD TIMING
13.6V
V
- V
= 0V
GATE
GATE
V
- V = 0V
GATE
13.6V
GATE
V
2.5V
GH
V
2.5V
GH
GATE
t
PLHGH
GATE
t
PHLGH
PWRGD
1.0V
= 0V
PWRGD
1.0V
V
- V
DRAIN
PWRGD
FIGURE 5A. GATE TO PWRGD ACTIVE (ISL6142)
FIGURE 5B. GATE TO PWRGD ACTIVE (ISL6152)
FN9086 Rev 1.00
July 2004
Page 9 of 23
ISL6142, ISL6152
Test Circuit and Timing Diagrams (Continued)
V
- V = 8.0V
EE
DRAIN
V
- V = 8.0V
EE
DRAIN
V
DH
8.0V
8.0V
V
DH
DRAIN
PWRGD
V
- V = 0V
DRAIN
t
EE
PHLDH
V
- V = 0V
DRAIN
EE
t
PLHDH
DRAIN
1.0V
1.0V
PWRGD
V
- V
= 0V
DRAIN
PWRGD
FIGURE 6A. DRAIN HIGH TO PWRGD (INACTIVE) HIGH
(ISL6142)
FIGURE 6B. DRAIN HIGH TO PWRGD (INACTIVE) LOW
(ISL6152)
FIGURE 6. DRAIN TO PWRGD/PWRGD INACTIVE TIMING
3V
V
- V
= 0V
GATE
GATE
DIS
1.50V
1.4V
GATE
2.2V
1V
t
0V
PHLF
t
t
PLHDIS
PHLDIS
GATE
FAULT
13.6V
1V
1.0V
0V
FIGURE 7. DISABLE TO GATE TIMING (ISL6142/52)
FIGURE 8. FAULT TO GATE TIMING (ISL6142/52)
50mV
210mV
SENSE
0V
SENSE
0V
13.6V
t
PHLHF
t
13.6V
PHLSENSE
GATE
GATE
V
EE
~4V (depends on FET threshold)
FIGURE 9. SENSE TO GATE (CURRENT LIMIT) TIMING
FIGURE 10. SENSE TO GATE (HARD FAULT) TIMING
V
SENSE
UV
t
R
t
PHLCB
t
F
90%
90%
V
GATE
OUT
10%
1.0V
1.0V
10%
Over-Current Time-Out
FIGURE 11. CURRENT LIMIT TO GATE TIMING
FIGURE 12. OUTPUT CURRENT RISE AND FALL TIME
FN9086 Rev 1.00
July 2004
Page 10 of 23
ISL6142, ISL6152
Typical Performance Curves
16
14
12
10
8
4.5
4
3.5
3
2.5
2
1.5
1
6
4
2
0.5
0
0
10 20 30 40 50 60 70 80 90 100
Supply Voltage (VDD)
10
20
30
40
50
60
70
80 100
Supply Voltage (VDD)
o
o
FIGURE 13. SUPPLY CURRENT VS. SUPPLY VOLTAGE (25 C)
FIGURE 14. GATE VOLTAGE VS SUPPLY VOLTAGE (25 C)
14
13.9
13.8
13.7
13.6
13.5
13.4
13.3
2.75
2.7
2.65
2.6
2.55
2.5
2.45
2.4
2.35
2.3
2.25
-40 -20
0
20
40
60
80
100
-40
-20
0
20
40
60
80
100
Temperature (C)
Temperature (C)
FIGURE 16. GATE VOLTAGE VS TEMPERATURE V
= 48V
FIGURE 15. SUPPLY CURRENT VS TEMPERATURE, V
= 80V
DD
DD
50
49
48
47
46
45
44
43
42
41
14
13.9
V
= 80V
DD
13.8
13.7
13.6
13.5
13.4
V
= 20V
DD
-40
-20
0
20
40
60
80
100
-40 -20
0
20 40 60 80 100
Temperature (C)
Temperature (C)
FIGURE 17. GATE VOLTAGE VS TEMPERATURE
FIGURE 18. GATE PULL-UP CURRENT VS TEMPERATURE
FN9086 Rev 1.00
July 2004
Page 11 of 23
ISL6142, ISL6152
450
400
350
300
250
200
150
100
50
90
80
70
60
50
40
30
20
10
0
0
-40
-20
0
20
40
60
80
100
-40
-20
0
20
40
60
80
100
Temperature (C)
Temperature (C)
FIGURE 20. HARD FAULT GATE PULL-DOWN CURRENT VS
TEMPERATURE
FIGURE 19. GATE PULL-DOWN CURRENT
(UV/OV/TIME-OUT) VS TEMPERATURE
54
52
50
48
46
44
42
40
1.6
5mA
1.4
1.2
1
0.8
0.6
0.4
1mA
0.2
0
-40
-20
0
20
40
60
80
100
-40
-20
0
20
40
60
80
100
Temperature (C)
Temperature (C)
FIGURE 21. OVER-CURRENT TRIP VOLTAGE VS
TEMPERATURE
FIGURE 22. PWRGD (ISL6142) VOL VS TEMPERATURE
2
1.5
1
6.8
6.7
6.6
6.5
6.4
6.3
6.2
6.1
0.5
0
-40
-20
0
20
40
60
80
100
-40
-20
0
20
40
60
80
100
Temperature (C)
Temperature (C)
FIGURE 23. DRAIN to PWRGD / PWRGD TRIP VOLTAGE (V
VS TEMPERATURE
)
FIGURE 24. PWRGD (ISL6152) OUTPUT IMPEDANCE VS
TEMPERATURE
PG
FN9086 Rev 1.00
July 2004
Page 12 of 23
ISL6142, ISL6152
6
5
4
3
2
1
2.5
2
-40oC
-40oC
1.5
1
85oC
85oC
0.5
0
0
50
100
150
200
0
50
100
150
SENSE Pin Voltage (mV)
SENSE pin Voltage (mV)
FIGURE 25. IS
ERROR VS SENSE PIN VOLTAGE
VSENSE = 0V
FIGURE 26. IS
ERROR VS SENSE PIN VOLTAGE
OUT
OUT
20.5
4.475
4.47
4.465
4.46
20
19.5
19
4.455
4.45
18.5
18
4.445
4.44
17.5
17
4.435
-40 -20
0
20
40
60
80
100
-40
-20
0
20
40
60
80
100
Temperature (C)
Temperature (C)
FIGURE 27. ISOUT OFFSET CURRENT VS TEMPERATURE
FIGURE 28. CT CHARGING CURRENT VS TEMPERATURE
FN9086 Rev 1.00
July 2004
Page 13 of 23
ISL6142, ISL6152
Applications Information
GND
GND
V
FAULT
DIS
PWRGD
DD
IS
Logic
OUT
Supply
R4
R5
ISL6142
UV
OV
R10
V
CT
IS-
IS+ SENSE GATE
DRAIN
C2
R6
R9
EE
ADC
Q2
R3
C1
R2
C3
R7
CL
R8
RL
-48V OUT
-48V IN
R1
Q1
FIGURE 29. TYPICAL APPLICATION WITH MINIMUM COMPONENTS
Typical Values for a representative system;
which assumes:
Quick Guide to Choosing Component
Values
43V to 71V supply range; 48 nominal; UV = 43V; OV = 71V
(See Fig 29 for reference)
1A of typical current draw; 2.5 Amp Over-Current
This section will describe the minimum components needed for
a typical application, and will show how to select component
values. Note that “typical” values may only be good for this
application; the user may have to select alternate component
values to optimize performance for other applications. Each
block will then have more detailed explanation of how the
device works, and alternatives.
100F of load capacitance (CL); equivalent RL of 48
(R = V/I = 48V/1A)
R1: 0.02 (1%)
R2: 10 (5%)
R3: 18k (5%)
R4, R5, R6 - together set the Under-Voltage (UV) and Over-
Voltage (OV) trip points. When the power supply ramps up and
down, these trip points (and their hysteresis) will determine
when the GATE is allowed to turn on and off (UV and OV do
not control the PWRGD / PWRGD output). The input power
supply is divided down such that when the voltage on the OV
pin is below its threshold and the UV pin is above its threshold
their comparator outputs will be in the proper state signaling
the supply is within its desired operating range, allowing the
GATE to turn on. The equations below define the comparator
thresholds for an increasing (in magnitude) supply voltage.
R + R + R
R4: 549k (1%)
R5: 6.49k (1%)
R6: 10k (1%)
R7/R8: 400 (1%)
R9: 4.99K (1%)
R10: 5.10K (10%)
C1: 150nF (25V)
C2: 3.3nF (100V)
C3: 1500pF (25V)
Q1: IRF530 (100V, 17A, 0.11)
Q2: N-Channel logic FET
4
5
6
(EQ. 1)
V
= ---------------------------------------- 1.255
UV
R + R
5
6
R + R + R
4
5
6
(EQ. 2)
V
= ---------------------------------------- 1.255
OV
R
6
The values of R4 = 549K, R5 = 6.49K, and R6 = 10K shown in
figure 29 set the Under-Voltage threshold at 43V, and the Over-
FN9086 Rev 1.00
July 2004
Page 14 of 23
ISL6142, ISL6152
Voltage, turn off threshold to 71V. The Under-Voltage (UV)
comparator has a hysteresis of 135mv’s (4.6V of hysteresis on
the supply) which correlates to a 38.4V turn off voltage. The
Over-Voltage comparator has a 25mv hysteresis (1.4V of
hysteresis on the supply) which translates to a turn on voltage
(supply decreasing) of approximately 69.6V.
Figure 30 the traces from each side of the R1 resistor also
connect to the R8 (IS+), and R7 (IS-) current sensing resistors.
CORRECT
INCORRECT
To V
EE
and R7
Q1 - is the FET that connects the input supply voltage to the
output load, when properly enabled. It needs to be selected
based on several criteria:
• Maximum voltage expected on the input supply (including
transients) as well as transients on the output side.
• Maximum current and power dissipation expected during
normal operation, usually at a level just below the current
limit threshold.
To SENSE
and R8
CURRENT
SENSE RESISTOR
• Power dissipation and/or safe-operating-area considerations
during current limiting and single retry events.
FIGURE 30. SENSE RESISTOR LAYOUT GUIDELINES
• Other considerations include the GATE voltage threshold
which affects the r
(which in turn, affects the voltage
CL - is the sum of all load capacitances, including the load’s
input capacitance itself. Its value is usually determined by the
needs of the load circuitry, and not the hot plug (although there
can be interaction). For example, if the load is a regulator, then
the capacitance may be chosen based on the input
DS(ON)
drop across the FET during normal operation), and the
maximum gate voltage allowed (the IC’s GATE output is
clamped to ~14V).
R1 - is the Over-Current sense resistor also referred to as
requirements of that circuit (holding regulation under current
spikes or loading, filtering noise, etc.) The value chosen will
affect the peak inrush current. Note that in the case of a
regulator, there may be capacitors on the output of that circuit
as well; these need to be added into the capacitance
calculation during inrush (unless the regulator is delayed from
operation by the PWRGD/PWRGD signal).
R
. If the input current is high enough, such that the
SENSE
voltage drop across R1 exceeds the SENSE comparator trip
point (50mV nominal), the GATE pin will be pulled lower (to
~4V) and current will be regulated to 50mV/Rsense for the
programmed time-out period which is set by C3. The Over-
Current threshold is defined in Equation 3 below. If the time-out
period is exceeded the Over-Current latch will be set and the
FET will be turned off to protect the load from excessive
current. A typical value for R1 is 0.02which sets an Over-
RL - is the equivalent resistive value of the load and
determines the normal operating current delivered through the
FET. It also affects some dynamic conditions (such as the
discharge time of the load capacitors during a power-down). A
typical value might be 48 (I=V/R = 48/48 = 1A).
Current trip point of; I
select the appropriate value for R1, the user must first
= V/R = 0.05/0.02 = 2.5 Amps. To
OC
determine at what level of current it should trip, take into
account worst case variations for the trip point (50mV 10mV =
20%), and the tolerances of the resistor (typically 1% or 5%).
Note that the Over-Current threshold should be set above the
inrush current level plus the expected load current to avoid
activating the current limit and time-out circuitry during start-up.
If the power good output (PWRGD/PWRGD) is used to enable
an external module, the desired inrush current only needs to
be considered. One rule of thumb is to set the Over-Current
threshold 2-3 times higher than the normal operating current.
R2, C1, R3, C2 - are related to the GATE driver, as it controls
the inrush current.
R2 prevents high frequency oscillations; 10 is a typical value.
R2 = 10.
R3 and C2 act as a feedback network to control the inrush
current as shown in equation 4, where CL is the load
50mv
capacitance (including module input capacitance), and I
is
I
= -------------------
PU
OC
(EQ. 3)
R
sense
the GATE pin charging current, nominally 50A.
C
L
(EQ. 4)
I
= I
------
The physical layout of the R1 sense resistor is critical to avoid
the possibility of false over current events. Since it is in the
main input-to-output path, the traces should be wide enough to
support both the normal current, and currents up to the over-
current trip point. The trace routing between the R1 resistor,
inrush
PU
C
2
Begin by choosing a value of acceptable inrush current for the
system, and then solve for C2.
C1 and R3 prevent Q1 from turning on momentarily when
power is first applied. Without them, C2 would pull the gate of
and the V and SENSE pins should be direct and as short as
possible with zero current in the sense lines. Note that in
EE
Q1 up to a voltage roughly equal to V *C2/Cgs(Q1) (where
EE
Cgs is the FET gate-source capacitance) before the
Page 15 of 23
FN9086 Rev 1.00
July 2004
ISL6142, ISL6152
ISL6142/52 could power up and actively pull the gate low.
Place C1 in parallel with the gate capacitance of Q1; isolate
them from C2 by R3.
less, with respect to V . A typical value of 5K is
EE
recommended. A fault indicator LED can be placed in series
with the pull-up resistor if desired. The resistor value should be
selected such that it will allow enough current to drive the LED
adequately (brightness).
C1 =[(Vinmax - Vth)/Vth] * (C2+Cgd) - where Vth is the FET’s
minimum gate threshold, Vinmax is the maximum operating
input voltage, and Cgd is the FET gate-drain capacitance.
C3 - is the capacitor used to program the current limit time-out
period. When the Over-Current threshold is exceeded a 20A
(nominal) current source will charge the C3 capacitor from V
to approximately 8.5V. When the voltage on the CT pin
exceeds the 8.5V threshold, the GATE pin will immediately be
pulled low with a 70ma pull down device, the Over-Current
latch will be set, and the FET will be turned off. If the Over-
Current condition goes away before the time-out period
R3 - its value is not critical, a typical value of 18k is
recommended but values down to 1K can be used. Lower
values of R3 will add delay to gate turn-on for hot insertion and
the single retry event following a hard fault.
EE
R7/R8/R9 - are used to sense the load current (R7/R8) and
convert the scaled output current (IS
) to a voltage (R9) that
OUT
would typically be the input signal to an A to D converter.
expires, the CT pin will be pulled back down to V , and
EE
normal operation will resume. Note that any parasitic
R7 is connected between -IS and the R1 sense resistor. These
capacitance from the CT pin to -V will effectively add to C3.
IN
two resistors set the I
resistor) to IS
OUT
(current through the Rsense
scaling factor based on equation 5 below. R8
SENSE
This additional capacitance should be taken into account when
calculating the C3 value needed for the desired time-out
period.
does not effect the scaling factor but should match R7 to
minimize IS error. Their tolerance should be +/-1%, which
OUT
will typically result in an output current error of less than 5% for a
full scale condition. The trace layout is also critical to obtain
optimum performance. The traces connecting these resistors to
the device pins (IS+ and IS-) and to the R1 sense resistor should
be kept as short as possible, match in length, and be isolated
from the main current flow as illustrated in figure 30.
The value of C3 can be calculated using equation 6 where dt is
the time-out period, dv is the CT pin threshold, and I is the
CT
capacitor charging current.
–6
dt
C3 = ------ I
dv
timeout
= --------------------- 2010
8.5V
(EQ. 6
CT
R9 is used to convert the IS
OUT
current to voltage and is
Q2- is an N-channel logic FET used to drive the disable pin
(DIS). The DIS pin is used to enable/disable the external pass
transistor (Q1) by turning the GATE drive voltage on or off. The
DIS pin can also be used to reset the Over-Current latch by
toggling the pin high and then low. When Q2 is off, the DIS pin
is pulled high with an internal 500K resistor, connected to an
connected between the IS
pin and -V . The current flowing
OUT
IN
through the resistor (EQ. 5) should not exceed 600A and the
voltage on the CT pin will clamp at approximately 8V.
R
internal +5V (V + 5V) supply rail (10A). In this condition the
GATE pin is low, and Q1 is turned off. When Q2 is on, the DIS
SENSE
R7
EE
IS
= I
-----------------------
(EQ. 5)
OUT
SENSE
pin is pulled low to V allowing the GATE pin to pull up and
EE
turn on Q1. The gate of Q2 will typically be driven low (<1.5V)
or High (>3.0V) with external logic circuitry referenced to the
negative input (-V ).
IN
To select the appropriate resistor values for the application the
user must first define the R1 sense resistor value and the
maximum load current to be detected/measured. The value of
Low-side Application
R7 should then be selected such that the maximum IS
OUT
current is in the 400-500A range. For example, if the user
wanted to detect and measure fault currents up to the hard
Although this IC was designed for -48V systems, it can also be
used as a low-side switch for positive 48V systems; the
operation and components are usually similar. One possible
difference is the kind of level shifting that may be needed to
interface logic signals to the IC. For example, many of the IC
functions are referenced to the IC substrate, connected to the
fault comparator trip point (10A); the maximum IS
current
OUT
using the application components in figure 23 would be [10A x
(.02/400] = 500A. The value of R9 should be set to
accommodate the dynamic range of the A to D converter. For
this example, a 5K resistor would produce a full scale input
voltage to the converter of 2.5V (500A x 5K). Figures 32 and
33 illustrate the typical output voltage response of the current
sense circuit for the Over-Current Time-out and hard fault
single retry events.
V
pin, but this pin may be considered -48V or GND,
EE
depending upon the polarity of the system. Also, the input or
output logic (running at 5V or 3.3V or even lower) might be
externally referenced to either V
GND.
or V of the IC, instead of
EE
DD
R10 - is a pull-up resistor for the open drain FAULT output pin
which goes active low when the Over-Current latch is set
(Over-Current Time-Out). The output signal is referenced to
V
and the resistor is connected to a positive voltage, 5V or
EE
FN9086 Rev 1.00
July 2004
Page 16 of 23
ISL6142, ISL6152
Electronic Circuit Breaker/Current Limit
Inrush Current Control
The primary function of the ISL6142/52 hot plug controller is to
control the inrush current. When a board is plugged into a live
backplane, the input capacitors of the board’s power supply
circuit can produce large current transients as they charge up.
This can cause glitches on the system power supply (which can
affect other boards!), as well as possibly cause some permanent
damage to the power supply.
The ISL6142/52 allows the user to program both the current limit
and the time-out period to protect the system against excessive
TM
supply or fault currents. The IntelliTrip
electronic circuit
breaker is capable of detecting both hard faults, and less severe
Over-Current conditions.
The Over-Current trip point is determined by R1 (EQ. 3) also
referred to as Rsense. When the voltage across this resistor
exceeds 50mV, the current limit regulator will turn on, and the
GATE will be pulled lower (to ~4V) to regulate current through
the FET at 50mV/Rsense. If the fault persists and current limiting
exceeds the programmed time-out period, the FET will be turned
The key to allowing boards to be inserted into a live backplane is
to turn on the power to the board in a controlled manner, usually
by limiting the current allowed to flow through a FET switch, until
the input capacitors are fully charged. At that point, the FET is
fully on, for the smallest voltage drop across it. Figure 31
illustrates the typical inrush current response for a hot insertion
under the following conditions:
off by discharging the GATE pin to V . This will set the Over-
EE
Current latch and the PWRGD/PWRGD output will transition to
the inactive state, indicating power is no longer good. To clear
the latch and initiate a normal start-up sequence, the user must
either power down the system (below the UVLO voltage), toggle
the UV pin below and above its threshold (usually with an
external transistor), or toggle the DIS pin high to low. Figure 32
shows the Over-Current shut down and current limiting
response for a 10 short to ground on the output. Prior to the
short circuit the output load is 110 producing an operating
current of about 0.44A (48V/110). A 10 short is then applied
to the output causing an initial fault current of 4.8A. This
produces a voltage drop across the 0.02 sense resistor of
approximately 95mV, roughly two times the Over-Current
threshold of 50mV. The GATE is quickly pulled low to limit the
current to 2.5A (50mV/Rsense) and the timer is enabled. The
fault condition persists for the duration of the programmed time-
out period (C3 = 1500pF) and the GATE is latched off in about
740s. There is a short filter (3s nominal) on the comparator,
so current transients shorter than this will be ignored. Longer
transients will initiate the GATE pull down, current limiting, and
the timer. If the fault current goes away before the time-out
period expires the device will exit the current limiting mode and
resume normal operation.
V
= -48V, Rsense = 0.02W
IN
Current limit = 50mV / 0.02 = 2.5A
C1 = 150nF, C2 = 3.3nF, R3 = 18k
CL = 100F, RL = 50, I
= 48V / 50 ~1.0A
LOAD
= 50A (100F / 3.3nF) = 1.5A
I
inrush
After the contact bounce subsides the UVLO and UV criteria are
quickly met and the GATE begins to ramp up. As the GATE
reaches approximately 4V with respect to the source, the FET
begins to turn on allowing current to charge the 100F load
capacitor. As the drain to source voltage begins to drop, the
feedback network of C2 and R3 hold the GATE constant, in this
case limiting the current to approximately 1.5A. When the
DRAIN voltage completes its ramp down, the load current
remains constant at approximately 1.0A as the GATE voltage
increases to its final value.
FIGURE 31. HOT INSERTION INRUSH CURRENT LIMITING,
DISABLE PIN TIED TO V
EE
FIGURE 32. CURRENT LIMITING AND TIME-OUT
FN9086 Rev 1.00
July 2004
Page 17 of 23
ISL6142, ISL6152
In addition to current limiting and programmable time-out, there
is a hard fault comparator to respond to short circuits with an
immediate GATE shutdown (typically 10s) and a single retry.
The trip point of this comparator is set ~4 times (210mV) higher
than the Over-Current threshold of 50mV. If the hard fault
comparator trip point is exceeded, a hard pull down current
(350mA) is enabled to quickly pull down the GATE and
momentarily turn off the FET. The fast shutdown resets the
timer and is followed by a soft start, single retry event. If the
fault is still present after the GATE is slowly turned on, the
current limit regulator will trip (sense pin voltage > 50mV), turn
on the timer, and limit the current to 50mV/Rsense. If the fault
remains and the time-out period is exceeded the GATE pin will
be latched low. Note: Since the timer starts when the SENSE
pin exceeds the 50mV threshold, then depending on the speed
of the current transient exceeding 200mV; it’s possible that the
current limit time-out and shutdown can occur before the hard
fault comparator trips (and thus no retry). Figure 33 illustrates
the hard fault response with a zero ohm short circuit at the
output.
used to set the trip points on the UV and OV pins. If the voltage
on the UV pin is above its threshold and the voltage on the OV
pin is below its threshold, the supply is within its expected
operating range and the GATE will be allowed to turn on, or
remain on. If the UV pin voltage drops below its high to low
threshold, or the OV pin voltage increases above its low to high
threshold, the GATE pin will be pulled low, turning off the FET
until the supply is back within tolerance.
The OV and UV inputs are high impedance, so the value of the
external resistor divider is not critical with respect to input
current. Therefore, the next consideration is total current; the
resistors will always draw current, equal to the supply voltage
divided by the total resistance of the divider (R4+R5+R6) so
the values should be chosen high enough to get an acceptable
current. However, to the extent that the noise on the power
supply can be transmitted to the pins, the resistor values might
be chosen to be lower. A filter capacitor from UV to -V or OV
IN
to -V is a possibility, if certain transients need to be filtered.
IN
(Note that even some transients which could momentarily shut
off the GATE might recover fast enough such that the GATE or
the output current does not even see the interruption).
Finally, take into account whether the resistor values are
readily available, or need to be custom ordered. Tolerances of
1% are recommended for accuracy. Note that for a typical 48V
system (with a 43V to 72V range), the 43V or 72V is being
divided down to 1.255V, a significant scaling factor. For UV, the
ratio is roughly 35 times; every 3mV change on the UV pin
represents roughly 0.1V change of power supply voltage.
Conversely, an error of 3mV (due to the resistors, for example)
results in an error of 0.1V for the supply trip point. The OV ratio
is around 60. So the accuracy of the resistors comes into play.
The hysteresis of the comparators is also multiplied by the
scale factor of 35 for the UV pin (35 * 135mV = 4.7V of
hysteresis at the power supply) and 60 for the OV pin (60 *
25mV = 1.5V of hysteresis at the power supply).
With the three resistors, the UV equation is based on the
simple resistor divider:
FIGURE 33. HARD FAULT SHUTDOWN AND RETRY
1.255 = V
[(R5 + R6)/(R4 + R5 + R6)] or
= 1.255 [(R4 + R5 + R6)/(R5 + R6)]
UV
As in the Over-Current Time-Out response discussed
previously, the supply is set at -48V and the current limit is set
at 2.5A. After the initial gate shutdown (10s) a soft start is
initiated with the short circuit still present. As the GATE slowly
turns on the current ramps up and exceeds the Over-Current
threshold (50mV) enabling the timer and current limiting (2.5A).
The fault remains for the duration of the time-out period and
the GATE pin is quickly pulled low and latched off.
V
UV
Similarly, for OV:
1.255 = V [(R6)/(R4 + R5 + R6)] or
OV
= 1.255 [(R4 + R5 + R6)/(R6)]
V
OV
Note that there are two equations, but 3 unknowns. Because of
the scale factor, R4 has to be much bigger than the other two;
chose its value first, to set the current (for example, 50V / 500k
draws 100A), and then the other two will be in the 10k range.
Solve the two equations for two unknowns. Note that some
iteration may be necessary to select values that meet the
requirement, and are also readily available standard values.
Applications: OV and UV
The UV and OV pins can be used to detect Over-Voltage and
Under-Voltage conditions on the input supply and quickly shut
down the external FET to protect the system. Each pin is tied
to an internal comparator with a nominal reference of 1.255V. A
The three resistor divider (R4, R5, R6) is the recommended
approach for most applications, but if acceptable values can’t
be found, then consider 2 separate resistor dividers (one for
resistor divider between the V
(gnd) and -V is typically
IN
DD
FN9086 Rev 1.00
July 2004
Page 18 of 23
ISL6142, ISL6152
each pin, both from V
adjust or trim either trip point independently. Some applications
employ a short pin ground on the connector tied to R4 to
ensure the hot plug device is fully powered up before the UV
and OV pins (tied to the short pin ground) are biased. This
ensures proper control of the GATE is maintained during power
up. This is not a requirement for the ISL6142/52 however the
circuit will perform properly if a short pin scheme is
to -V ). This also allows the user to
IN
acceptable logic levels to whatever signal it is driving. An
external clamp may be used to limit the voltage range.
DD
VDD
VIN+
VOUT+
V
(SECTION OF) ISL6142
(L VERSION)
GATE
V
PWRGD
GH
ON/OFF
-
GATE
+
V
implemented (reference Figure 38).
PG
+
ACTIVE LOW
ENABLE
MODULE
+
-
CL
+
-
LATCH
LOGIC
Q2
Applications: PWRGD/PWRGD
V
EE
The PWRGD/PWRGD outputs are typically used to directly
enable a power module, such as a DC/DC converter. The
PWRGD (ISL6142) is used for modules with active low enable
(L version), and PWRGD (ISL6152) for those with an active
high enable (H version). The modules usually have a pull-up
device built-in, as well as an internal clamp. If not, an external
pull-up resistor may be needed. If the pin is not used, it can be
left open.
V
EE
V
DH
+
-
VIN- VOUT-
+
-
V
EE
DRAIN
FIGURE 34. ACTIVE LOW ENABLE MODULE
The PWRGD can also drive an opto-coupler (such as a 4N25),
as shown in Figure 35 or LED (Figure 36). In both cases, they
are on (active) when power is good. Resistors R13 or R14 are
chosen based on the supply voltage, and the amount of current
needed by the loads.
For both versions at initial start-up, when the DRAIN to V
EE
voltage differential is less than 1.3V and the GATE voltage is
within 2.5V (V ) of its normal operating voltage (13.6V),
GH
power is considered good and the PWRGD/PWRGD pins will
go active. At this point the output is latched and the
V
DD
comparators above no longer control the output. However a
second DRAIN comparator remains active and will drive the
PWRGD/PWRGD output inactive if the DRAIN voltage
(SECTION OF) ISL6142
(L VERSION)
PWRGD
R13
PWRGD
LOGIC
LATCH
Q2
OPTO
exceeds V by more than 8V. The latch is reset by any of the
EE
signals that shut off the GATE (Over-Voltage, Under-Voltage;
Under-Voltage-Lock-Out; Over-Current Time-Out, disable pin
high, or powering down). In this case the PWRGD/PWRGD
output will go inactive, indicating power is no longer good.
COMPARATORS
V
EE
DRAIN
ISL6142 (L version; Figure 34): Under normal conditions
FIGURE 35. ACTIVE LOW ENABLE OPTO-ISOLATOR
(DRAIN voltage - V < V , and V
Q2 DMOS will turn on, pulling PWRGD low, enabling the
module.
- V
< V ) the
EE PG GATE
GATE
GH
V
DD
(SECTION OF) ISL6142
(L VERSION)
PWRGD
R14
When any of the 5 conditions occur that turn off the GATE (OV,
UV, UVLO, Over-Current Time-Out, disable pin high) the
PWRGD latch is reset and the Q2 DMOS device will shut off
(high impedance). The pin will quickly be pulled high by the
external module (or an optional pull-up resistor or equivalent)
which in turn will disable it. If a pull-up resistor is used, it can be
connected to any supply voltage that doesn’t exceed the IC pin
maximum ratings on the high end, but is high enough to give
LOGIC
LATCH
Q2
LED (GREEN)
COMPARATORS
V
EE
DRAIN
FIGURE 36. ACTIVE LOW ENABLE LED
ISL6152 (H version; Figure 37): Under normal conditions
(DRAIN voltage - V < V , and V
- V
< V ), the
EE PG GATE
GATE
GH
Q3 DMOS will be on, shorting the bottom of the internal resistor
to V , turning Q2 off. If the pull-up current from the external
EE
module is high enough, the voltage drop across the 6.2k
resistor will look like a logic high (relative to DRAIN). Note that
the module is only referenced to DRAIN, not V (but under
EE
FN9086 Rev 1.00
July 2004
Page 19 of 23
ISL6142, ISL6152
normal conditions, the FET is on, and the DRAIN and V are
EE
almost the same voltage).
The input capacitance of the brick is chosen to match its
system requirements, such as filtering noise, and maintaining
regulation under varying loads. Note that this input capacitance
appears as the load capacitance of the ISL6142/52.
When any of the 5 conditions occur that turn off the GATE, the
Q3 DMOS turns off, and the resistor and Q2 clamp the PWRGD
pin to one diode drop (~0.7V) above the DRAIN pin. This should
be able to pull low against the module pull-up current, and
The brick’s output capacitance is also determined by the
system, including load regulation considerations. However, it
can affect the ISL6142/52, depending upon how it is enabled.
For example, if the PWRGD/PWRGD signal is not used to
enable the brick, the following could occur. Sometime during
the inrush current time, as the main power supply starts
charging the brick input capacitors, the brick itself will start
working, and start charging its output capacitors and load; that
current has to be added to the inrush current. In some cases,
the sum could exceed the Over-Current threshold, which could
shut down the system if the time-out period is exceeded!
Therefore, whenever practical, it is advantageous to use the
PWRGD/PWRGD output to keep the brick off at least until the
input caps are charged up, and then start-up the brick to
charge its output caps.
disable the module.
VDD
VIN+
VOUT+
V
PWRGD
(SECTION OF) ISL6152
(H VERSION)
GATE
V
GH
ON/OFF
-
6.2K
GATE
+
V
PG
+
ACTIVE HIGH
ENABLE
MODULE
+
-
Q2
CL
+
-
LATCH
LOGIC
Q3
V
V
EE
EE
V
DH
+
-
VIN- VOUT-
+
-
V
EE
Typical brick regulators include models such as Lucent
JW050A1-E or Vicor VI-J30-CY. These are nominal -48V input,
and 5V outputs, with some isolation between the input and
output.
DRAIN
FIGURE 37. ACTIVE HIGH ENABLE MODULE
Applications: GATE Pin
To help protect the external FET, the output of the GATE pin is
internally clamped; up to an 80V supply and will not be any
higher than 15V. Under normal operation when the supply
voltage is above 20V, the GATE voltage will be regulated to a
Applications: Optional Components
In addition to the typical application, and the variations already
mentioned, there are a few other possible components that
might be used in specific cases. See Figure 38 for some
possibilities.
nominal 13.6V above V
.
EE
Applications: “Brick” Regulators
If the input power supply exceeds the 100V absolute maximum
rating, even for a short transient, that could cause permanent
damage to the IC, as well as other components on the board. If
this cannot be guaranteed, a voltage suppressor (such as the
One of the typical loads used are DC/DC regulators, some
commonly known as “brick” regulators, (partly due to their
shape, and because it can be considered a “building block” of
a system). For a given input voltage range, there are usually
whole families of different output voltages and current ranges.
There are also various standardized sizes and pinouts, starting
with the original “full” brick, and since getting smaller (half-
bricks and quarter-bricks are now common).
SMAT70A, D1) is recommended. When placed from V
to -
DD
V
on the board, it will clamp the voltage.
IN
If transients on the input power supply occur when the supply
is near either the OV or UV trip points, the GATE could turn on
or off momentarily. One possible solution is to add a filter cap
C4 to the V
pin, through isolation resistor R11. A large value
DD
Other common features may include: all components (except
some filter capacitors) are self-contained in a molded plastic
package; external pins for connections; and often an ENABLE
input pin to turn it on or off. A hot plug IC, such as the ISL6142
is often used to gate power to a brick, as well as turn it on.
of R11 is better for the filtering, but be aware of the voltage
drop across it. For example, a 1k resistor, with 2.4mA of I
would have 2.4V across it and dissipate 2.4mW. Since the UV
and OV comparators are referenced with respect to V they
DD
EE,
should not be affected, but the GATE clamp voltage could be
Many bricks have both logic polarities available (Enable high or
low input); select the ISL6142 (L-version) or ISL6152 (H-
version) to match. There is little difference between them,
although the L-version output is usually simpler to interface.
offset by the voltage across the extra resistor.
The Enable input often has a pull-up resistor or current source,
or equivalent built in; care must be taken in the ISL6152 (H
version) output that the given current will create a high enough
input voltage (remember that current through the RPG 6.2k
resistor generates the high voltage level; see Figure 34).
FN9086 Rev 1.00
July 2004
Page 20 of 23
ISL6142, ISL6152
The switch SW1 is shown as a simple push button. It can be
replaced by an active switch, such as an NPN or NFET; the
principle is the same; pull the UV node below its trip point, and
then release it (toggle low). To connect an NFET, for example,
R12 is a pull-up resistor for PWRGD, if there is no other
component acting as a pull-up device. The value of R12 is
determined by how much current is needed when the pin is
pulled low (also affected by the V
voltage); and it should be
DD
the DRAIN goes to UV; the source to -V , and the GATE is the
input; if it goes high (relative to -V ), it turns the NFET on, and
IN
UV is pulled low. Just make sure the NFET resistance is low
compared to the resistor divider, so that it has no problem
pulling down against it.
pulled low enough for a good logic low level. An LED can also
be placed in series with R12, if desired. In that case, the
criteria is the LED brightness versus current.
IN
GND
(SHORT PIN)
GND
GND
Logic
Supply
R11*
(V +5V)
R10
EE
R12*
V
FAULT
DIS
DD
PWRGD
IS
OUT
R4
ISL6142
UV
R5
R6
OV
CT
TO
ADC
SW1*
V
IS-
IS+ SENSE GATE
DRAIN
C2
EE
D1*
Logic
Input
R3
C1
R2
Q2
C3
R7
CL
R9
R8
C4*
RL
-48V OUT
-48V IN
R1
Q1
FIGURE 38. ISL6142/52 OPTIONAL COMPONENTS (SHOWN WITH *)
desired, consider the isolation resistor R10, as shown in
Figure 38.
Applications: Layout Considerations
For the minimum application, there are 10 resistors, 3
capacitors, one IC and 2 FETs. A sample layout is shown in
Figure 39. It assumes the IC is 8-SOIC; Q1 is in a D2PAK (or
similar SMD-220 package).
NOTE:
1. Layout scale is approximate; routing lines are just for illustration
purposes; they do not necessarily conform to normal PCB design
rules. High current buses are wider, shown with parallel lines.
Although GND planes are common with multi-level PCBs, for a
-48V system, the -48V rails (both input and output) act more
like a GND than the top 0V rail (mainly because the IC signals
are mostly referenced to the lower rail). So if separate planes
for each voltage are not an option, consider prioritizing the
bottom rails first.
2. Approximate size of the above layout is 0.8 x 0.8 inches, excluding
Q1 (D2PAK or similar SMD-220 package).
3. R1 sense resistor is size 2512; all other R’s and C’s shown are
0805; they can all potentially use smaller footprints, if desired.
4. The RL and CL are not shown on the layout.
5. Vias are needed to connect R4 and V
to GND on the bottom of
DD
the board, and R8 to pin 9; all other routing can be on the top level.
Note that with the placement shown, most of the signal lines
are short, and there should be minimal interaction between
them.
6. PWRGD signal is not used here.
Although decoupling capacitors across the IC supply pins are
often recommended in general, this application may not need
one, nor even tolerate one. For one thing, a decoupling cap
would add to (or be swamped out by) any other input
capacitance; it also needs to be charged up when power is
applied. But more importantly, there are no high speed (or any)
input signals to the IC that need to be conditioned. If still
FN9086 Rev 1.00
July 2004
Page 21 of 23
ISL6142, ISL6152
R9 = 4.99K (1%)
BOM (Bill Of Materials)
R1 = 0.02 (5%)
R10 = 5.10K (10%)
C1 = 150nF (25V)
R2 =10.0 (5%)
R3 = 18.0K (10%)
R4 = 549K (1%)
R5 = 6.49K (1%)
R6 = 10.0K (1%)
R7 = R8 = 400(1%)
C2 = 3.3nF (100V)
C3 = 1500pF (25V)
Q1 = IRF530 (100V, 17A, 0.11)
Q2 = N-channel Logic FEFT
GND
GND
TO
V
DD
R9
C3
-48V
IN
+5V
R10
1 PG
2 FLT
3 DIS
VDD 14
CT 13
C2
R3
LOGIC IN
G
D
-48V
IN
S
GATE
NFET
IS
O 12
R6
-48V
IN
ISL6142
4 OV
5 UV
D 11
DRAIN
G 10
IS+ 9
R5
R4
R2
6 IS-
GND
SOURCE
7 VEE
S 8
C1
-48V OUT
TO
PIN 9
R7
R8
-48V IN
R1
FIGURE 39. ISL6142 SAMPLE LAYOUT (NOT TO SCALE)
FN9086 Rev 1.00
July 2004
Page 22 of 23
ISL6142, ISL6152
ISL6142, ISL6152
Small Outline Plastic Packages (SOIC)
N
M14.15 (JEDEC MS-012-AB ISSUE C)
14 LEAD NARROW BODY SMALL OUTLINE PLASTIC
PACKAGE
INDEX
AREA
0.25(0.010)
M
B M
H
E
INCHES
MILLIMETERS
-B-
SYMBOL
MIN
MAX
MIN
1.35
0.10
0.33
0.19
4.80
3.80
MAX
1.75
0.25
0.51
0.25
5.00
4.00
NOTES
A
A1
B
C
D
E
e
0.0532
0.0040
0.013
0.0688
0.0098
0.020
-
1
2
3
L
-
SEATING PLANE
A
9
-A-
o
0.0075
0.1890
0.1497
0.0098
0.1968
0.1574
-
h x 45
D
3
-C-
4
µ
0.050 BSC
1.27 BSC
-
e
A1
C
H
h
0.2284
0.0099
0.016
0.2440
0.0196
0.050
5.80
0.25
0.40
6.20
0.50
1.27
-
B
0.10(0.004)
5
0.25(0.010) M
C A M B S
L
6
NOTES:
N
8
8
7
1. Symbols are defined in the “MO Series Symbol List” in Section
2.2 of Publication Number 95.
o
o
o
o
0
8
0
8
-
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
Rev. 0 12/93
3. Dimension “D” does not include mold flash, protrusions or gate
burrs. Mold flash, protrusion and gate burrs shall not exceed
0.15mm (0.006 inch) per side.
4. Dimension “E” does not include interlead flash or protrusions.
Interlead flash and protrusions shall not exceed 0.25mm
(0.010 inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual
index feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or great-
er above the seating plane, shall not exceed a maximum value
of 0.61mm (0.024 inch).
10. Controlling dimension: MILLIMETER. Converted inch dimen-
sions are not necessarily exact.
© Copyright Intersil Americas LLC 2004. All Rights Reserved.
All trademarks and registered trademarks are the property of their respective owners.
For additional products, see www.intersil.com/en/products.html
Intersil products are manufactured, assembled and tested utilizing ISO9001 quality systems as noted
in the quality certifications found at www.intersil.com/en/support/qualandreliability.html
Intersil products are sold by description only. Intersil may modify the circuit design and/or specifications of products at any time without notice, provided that such
modification does not, in Intersil's sole judgment, affect the form, fit or function of the product. Accordingly, the reader is cautioned to verify that datasheets are
current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its
subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
FN9086 Rev 1.00
July 2004
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