M381L6523BUM-LCC [SAMSUNG]

DDR SDRAM Unbuffered Module 184pin Unbuffered Module based on 512Mb B-die with 64/72-bit Non ECC/ECC 66 TSOP-II; 基于512Mb的DDR SDRAM的无缓冲模块184PIN无缓冲模块B -死亡64 /72-位非ECC / ECC 66 TSOP -II
M381L6523BUM-LCC
型号: M381L6523BUM-LCC
厂家: SAMSUNG    SAMSUNG
描述:

DDR SDRAM Unbuffered Module 184pin Unbuffered Module based on 512Mb B-die with 64/72-bit Non ECC/ECC 66 TSOP-II
基于512Mb的DDR SDRAM的无缓冲模块184PIN无缓冲模块B -死亡64 /72-位非ECC / ECC 66 TSOP -II

存储 内存集成电路 动态存储器 双倍数据速率 时钟
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256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
DDR SDRAM Unbuffered Module  
184pin Unbuffered Module based on 512Mb B-die  
with 64/72-bit Non ECC/ECC  
66 TSOP-II  
INFORMATION IN THIS DOCUMENT IS PROVIDED IN RELATION TO SAMSUNG PRODUCTS,  
AND IS SUBJECT TO CHANGE WITHOUT NOTICE.  
NOTHING IN THIS DOCUMENT SHALL BE CONSTRUED AS GRANTING ANY LICENSE,  
EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE,  
TO ANY INTELLECTUAL PROPERTY RIGHTS IN SAMSUNG PRODUCTS OR TECHNOLOGY. ALL  
INFORMATION IN THIS DOCUMENT IS PROVIDED  
ON AS "AS IS" BASIS WITHOUT GUARANTEE OR WARRANTY OF ANY KIND.  
1. For updates or additional information about Samsung products, contact your nearest Samsung office.  
2. Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar  
applications where Product failure could result in loss of life or personal or physical harm, or any military or  
defense application, or any governmental procurement to which special terms or provisions may apply.  
* Samsung Electronics reserves the right to change products or specification without notice.  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
Table of Contents  
1.0 Ordering Information................................................................................................................... 4  
2.0 Operating Frequencies................................................................................................................ 4  
3.0 Feature.......................................................................................................................................... 4  
4.0 Pin Configuration (Front side/back side) ................................................................................. 5  
5.0 Pin Description ............................................................................................................................ 5  
6.0 Functional Block Diagram .......................................................................................................... 6  
6.1 256MB, 32M x 64 Non ECC Module (M368L3324BT(U)).....................................................................................6  
6.2 512MB, 64M x 64 Non ECC Module (M368L6523BT(U))....................................................................................7  
6.3 512MB, 64M x 72 ECC Module (M381L6523B(U)) ..............................................................................................8  
6.4 1GB, 128M x 64 Non ECC Module (M368L2923BT(U)) .......................................................................................9  
6.5 1GB, 128M x 72 ECC Module (M381L2923BT(U)) ........................................................................................... 10  
7.0 Absolute Maximum Ratings...................................................................................................... 11  
8.0 DC Operating Conditions.......................................................................................................... 11  
9.0 DDR SDRAM IDD spec table..................................................................................................... 12  
9.1 M368L3324BT(U) [ (32M x 16) * 4, 256MB Non ECC Module ]............................................................................... 12  
9.2 M368L6523BT(U) [ (64M x 8) * 8, 512MB Non ECC Module ]................................................................................. 12  
9.3 M381L6523BT(U) [ (64M x 8) * 9, 512MB ECC Module ].......................................................................................... 13  
9.4 M368L2923BT(U) [ (64M x 8) * 16, 1GB Non ECC Module ].................................................................................... 13  
9.5 M381L2923BT(U) [ (64M x 8) * 18, 1GB ECC Module ] ............................................................................................ 14  
10.0 AC Operating Conditions........................................................................................................ 15  
11.0 Input/Output Capacitance....................................................................................................... 15  
12.0 AC Timming Parameters & Specifications............................................................................ 16  
13.0 System Characteristics for DDR SDRAM .............................................................................. 17  
14.0 Component Notes.................................................................................................................... 18  
15.0 System Notes........................................................................................................................... 19  
16.0 Command Truth Table............................................................................................................. 20  
17.0 Physical Dimensions............................................................................................................... 21  
17.1 32M x 64 (M368L3324BT(U)) ..................................................................................................... 21  
17.2 64Mx64 (M368L6523BT(U))....................................................................................................... 22  
17.3 64Mx72 (M381L6523BT(U))....................................................................................................... 23  
17.4 128Mx64 (M368L2923BT(U)) ..................................................................................................... 24  
17.5 128Mx72 (M381L2923BT(U)) ..................................................................................................... 25  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
Revision History  
Revision  
Month  
February  
August  
June  
Year  
2003  
2003  
2005  
History  
0.0  
- First version for internal review  
- Revision 1.0 spec release.  
1.0  
1.1  
- Deleted “B0, AA, A2” speed and changed master format.  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
184Pin Unbuffered DIMM based on 512Mb B-die (x8, x16)  
1.0 Ordering Information  
Part Number  
Density  
Organization  
Component Composition  
Height  
M368L3324BT(U)M-C(L)CC/B3  
M368L6523BT(U)M-C(L)CC  
M368L6523BT(U)N-C(L)B3  
M381L6523BT(U)M-C(L)CC/B3  
M368L2923BT(U)M-C(L)CC  
M368L2923BT(U)N-C(L)B3  
M381L2923BT(U)M-C(L)CC/B3  
256MB  
32M x 64  
32Mx16 (K4H511638B) * 4EA  
64Mx8 (K4H510838B) * 8EA  
64Mx8 (K4H510838B) * 9EA  
64Mx8 (K4H510838B) * 16EA  
64Mx8 (K4H510838B) * 18EA  
1,250mil  
512MB  
512MB  
1GB  
64M x 64  
64M x 72  
128M x 64  
128M x 72  
1,250mil  
1,250mil  
1,250mil  
1,250mil  
1GB  
Note : Leaded and Lead-free(Pb-free) can be discriminated by PKG P/N (T : 66 TSOP with Leaded, U : 66 TSOP with Lead-free)  
2.0 Operating Frequencies  
CC(DDR400@CL=3)  
B3(DDR333@CL=2.5)  
Speed @CL2  
Speed @CL2.5  
Speed @CL3  
CL-tRCD-tRP  
-
133MHz  
166MHz  
-
166MHz  
200MHz  
3-3-3  
2.5-3-3  
3.0 Feature  
• VDD : 2.5V ± 0.2V, VDDQ : 2.5V ± 0.2V for DDR333  
• VDD : 2.6V ± 0.1V, VDDQ : 2.6V ± 0.1V for DDR400  
• Double-data-rate architecture; two data transfers per clock cycle  
• Bidirectional data strobe [DQ] (x4,x8) & [L(U)DQS] (x16)  
• Differential clock inputs(CK and CK)  
• DLL aligns DQ and DQS transition with CK transition  
• Programmable Read latency : DDR333(2.5 Clock), DDR400(3 Clock)  
• Programmable Burst length (2, 4, 8)  
• Programmable Burst type (sequential & interleave)  
• Edge aligned data output, center aligned data input  
• Auto & Self refresh, 7.8us refresh interval(8K/64ms refresh)  
• Serial presence detect with EEPROM  
• PCB : Height 1,250 (mil) & single (256, 512MB), double (1GB) sided  
• SSTL_2 Interface  
• 66pin TSOP II (Leaded & Pb-Free(RoHS compliant)) package  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
4.0 Pin Configuration (Front side/back side)  
Pin  
Front  
VREF  
DQ0  
VSS  
Pin  
32  
33  
34  
35  
36  
37  
38  
39  
40  
41  
42  
43  
44  
45  
46  
47  
48  
49  
50  
51  
52  
Front  
Pin  
62  
63  
64  
65  
66  
67  
68  
69  
70  
71  
72  
73  
74  
75  
76  
77  
78  
79  
80  
81  
82  
83  
84  
85  
86  
87  
88  
89  
90  
91  
92  
Front  
VDDQ  
WE  
Pin  
Back  
VSS  
Pin  
124  
125  
126  
127  
128  
129  
130  
131  
132  
133  
134  
135  
136  
137  
138  
139  
140  
141  
142  
143  
144  
Back  
VSS  
A6  
Pin  
154  
155  
156  
157  
158  
159  
160  
161  
162  
163  
164  
165  
166  
167  
168  
169  
170  
171  
172  
173  
174  
175  
176  
177  
178  
179  
180  
181  
182  
183  
184  
Back  
RAS  
1
A5  
93  
2
DQ24  
VSS  
DQ25  
DQS3  
A4  
94  
DQ4  
DQ5  
VDDQ  
DM0  
DQ6  
DQ7  
VSS  
DQ45  
VDDQ  
CS0  
3
DQ41  
CAS  
95  
DQ28  
DQ29  
VDDQ  
DM3  
A3  
4
DQ1  
DQS0  
DQ2  
VDD  
DQ3  
NC  
96  
5
VSS  
97  
CS1  
6
DQS5  
DQ42  
DQ43  
VDD  
98  
DM5  
7
VDD  
DQ26  
DQ27  
A2  
99  
VSS  
8
100  
101  
102  
103  
104  
105  
106  
107  
108  
109  
110  
111  
112  
113  
114  
115  
116  
117  
118  
119  
120  
121  
122  
123  
DQ30  
VSS  
DQ31  
CB4  
DQ46  
DQ47  
*CS3  
VDDQ  
DQ52  
DQ53  
*A13  
9
NC  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
31  
NC  
*CS2  
DQ48  
DQ49  
VSS  
NC  
VSS  
VSS  
A1  
NC  
DQ8  
DQ9  
DQS1  
VDDQ  
CK1  
VDDQ  
DQ12  
DQ13  
DM1  
VDD  
DQ14  
DQ15  
CKE1  
VDDQ  
*BA2  
DQ20  
A12  
CB5  
CB0  
CB1  
VDD  
DQS8  
A0  
VDDQ  
CK0  
*CK2  
*CK2  
VDDQ  
DQS6  
DQ50  
DQ51  
VSS  
CK0  
VDD  
VSS  
DM8  
A10  
DM6  
CK1  
DQ54  
DQ55  
VDDQ  
NC  
VSS  
CB2  
VSS  
CB3  
BA1  
DQ10  
DQ11  
CKE0  
VDDQ  
DQ16  
DQ17  
DQS2  
VSS  
CB6  
VDDQ  
CB7  
VDDID  
DQ56  
DQ57  
VDD  
DQ60  
DQ61  
VSS  
KEY  
KEY  
53  
54  
55  
56  
57  
58  
59  
60  
61  
DQ32  
VDDQ  
DQ33  
DQS4  
DQ34  
VSS  
145  
146  
147  
148  
149  
150  
151  
152  
153  
VSS  
DQ36  
DQ37  
VDD  
VSS  
DM7  
DQS7  
DQ58  
DQ59  
VSS  
DQ21  
A11  
DQ62  
DQ63  
VDDQ  
SA0  
A9  
DM2  
VDD  
DQ22  
A8  
DM4  
DQ18  
A7  
DQ38  
DQ39  
VSS  
BA0  
NC  
SA1  
VDDQ  
DQ19  
DQ35  
DQ40  
SDA  
SA2  
SCL  
DQ23  
DQ44  
VDDSPD  
Note :  
1. * : These pins are not used in this module.  
2. Pins 44, 45, 47, 49, 51, 134, 135, 140, 142, 144 are used on x72 module ( M381~ ), and are not used on x64 module.  
3. Pins 111, 158 are NC for 1row modules & used for 2row modules[ M368(81)L2923B ].  
4. Pins 137, 138 are NC for x16 1Row module (M368L3324B).  
5.0 Pin Description  
Pin Name  
Function  
Pin Name  
Function  
A0 ~ A12  
Address input (Multiplexed)  
DM0 ~7,8(for ECC) Data - in mask  
Power supply  
VDD  
BA0 ~ BA1A  
DQ0 ~ DQ63  
Bank Select Address  
Data input/output  
(2.5V for DDR333, 2.6V for DDR400)  
Power Supply for DQS  
VDDQ  
(2.5V for DDR333, 2.6V for DDR400)  
DQS0 ~ DQS8  
Data Strobe input/output  
Clock input  
VSS  
VREF  
VDDSPD  
SDA  
Ground  
CK0,CK0 ~ CK2, CK2  
Power supply for reference  
CKE0, CKE1(for double banks) Clock enable input  
Serial EEPROM Power/Supply ( 2.3V to 3.6V )  
Serial data I/O  
CS0, CS1(for double banks)  
Chip select input  
RAS  
Row address strobe  
Column address strobe  
Write enable  
SCL  
Serial clock  
CAS  
SA0 ~ 2  
VDDID  
NC  
Address in EEPROM  
VDD, VDDQ level detection  
No connection  
WE  
CB0 ~ CB7(for x72 module)  
Check bit(Data-in/data-out)  
Note : VDDID defines relationship of VDD and VDDQ, and the default status of it is open (VDD=VDDQ)  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
6.0 Functional Block Diagram  
6.1 256MB, 32M x 64 Non ECC Module (M368L3324BT(U))  
(Populated as 1 bank of x16 DDR SDRAM Module)  
CS0  
LDQS  
LDM  
LDQS  
LDM  
DQS1  
DM1  
DQS5  
DM5  
CS  
CS  
DQ13  
DQ14  
DQ12  
DQ15  
DQ9  
DQ10  
DQ8  
I/O 0  
I/O 1  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
I/O 6  
I/O 7  
UDQS  
DQ41  
DQ42  
DQ45  
DQ43  
DQ44  
DQ46  
DQ40  
DQ47  
I/O 0  
I/O 1  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
I/O 6  
I/O 7  
UDQS  
D0  
D2  
DQ11  
DQS0  
DM0  
DQS0  
DM0  
UDM  
I/O 8  
I/O 9  
I/O 10  
I/O 11  
I/O 12  
I/O 13  
I/O 14  
I/O 15  
UDM  
I/O 8  
I/O 9  
I/O 10  
I/O 11  
I/O 12  
I/O 13  
I/O 14  
I/O 15  
DQ0  
DQ3  
DQ4  
DQ7  
DQ5  
DQ2  
DQ1  
DQ6  
DQ32  
DQ35  
DQ36  
DQ39  
DQ33  
DQ38  
DQ37  
DQ34  
LDQS  
LDQS  
DQS3  
DM3  
CS  
DQS3  
DM3  
CS  
LDM  
I/O 0  
I/O 1  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
I/O 6  
I/O 7  
UDQS  
LDM  
I/O 0  
I/O 1  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
I/O 6  
I/O 7  
UDQS  
DQ57  
DQ62  
DQ56  
DQ58  
DQ61  
DQ63  
DQ60  
DQ59  
DQ29  
DQ26  
DQ25  
DQ30  
DQ28  
DQ27  
DQ24  
DQ31  
D1  
D3  
DQS0  
DM0  
DQS0  
DM0  
UDM  
UDM  
I/O 8  
I/O 9  
DQ20  
DQ23  
DQ16  
DQ19  
DQ17  
DQ22  
DQ21  
DQ18  
DQ48  
DQ51  
DQ52  
DQ50  
DQ49  
DQ55  
DQ53  
DQ54  
I/O 8  
I/O 9  
I/O 10  
I/O 11  
I/O 12  
I/O 13  
I/O 14  
I/O 15  
I/O 10  
I/O 11  
I/O 12  
I/O 13  
I/O 14  
I/O 15  
BA0-BA1: DDR SDRAMs D0 - D3  
A0-A12: DDR SDRAMs D0 - D3  
BA0 - BA1  
A0 - A12  
RAS  
RAS: DDR SDRAMs D0 - D3  
CAS: DDR SDRAMs D0 - D3  
Clock Wiring  
CAS  
Clock  
CKE: DDR SDRAMs D0 - D3  
Input  
CKE0  
DDR SDRAMs  
NC  
WE  
WE: DDR SDRAMs D0 - D3  
CK0/CK0  
CK1/CK1  
CK2/CK2  
2 DDR SDRAMs  
2 DDR SDRAMs  
V
DDSPD  
SPD  
Notes:  
Serial PD  
V
/V  
DD DDQ  
D0 - D3  
1. DQ-to-I/O wiring is shown as recomended but  
may be changed.  
2. DQ/DQS/DM/CKE/CS relationships must be  
maintained as shown.  
3. DQ, DQS, DM/DQS resistors: 22 Ohms + 5%.  
4. BAx, Ax, RAS, CAS, WE resistors: 7.5 Ohms  
+ 5%  
SCL  
WP  
D0 - D3  
SDA  
VREF  
A0  
A1  
A2  
D0 - D3  
D0 - D3  
V
SS  
SA0 SA1 SA2  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
6.2 512MB, 64M x 64 Non ECC Module (M368L6523BT(U))  
(Populated as 1 bank of x8 DDR SDRAM Module)  
CS0  
DQS0  
DM0  
DQS4  
DM4  
DM/  
CS DQS  
DM/  
CS DQS  
Serial PD  
DQ0  
DQ1  
DQ2  
DQ3  
DQ4  
DQ5  
DQ6  
DQ7  
DQ32  
DQ33  
DQ34  
DQ35  
DQ36  
DQ37  
DQ38  
DQ39  
I/O 6  
I/O 4  
I/O 2  
I/O 0  
I/O 7  
I/O 5  
I/O 3  
I/O 1  
I/O 7  
SCL  
WP  
I/O 4  
I/O 1  
I/O 3  
I/O 6  
I/O 5  
I/O 0  
I/O 2  
D0  
D4  
SDA  
A0  
A1  
A2  
SA0 SA1  
SA2  
DQS1  
DM1  
DQS5  
DM5  
DM/  
CS DQS  
DM/  
CS DQS  
V
V
SPD  
DDSPD  
DQ8  
DQ9  
DQ40  
DQ41  
DQ42  
DQ43  
DQ44  
DQ45  
DQ46  
DQ47  
I/O 7  
I/O 5  
I/O 1  
I/O 0  
I/O 6  
I/O 4  
I/O 3  
I/O 2  
I/O 6  
I/O 4  
I/O 3  
I/O 1  
I/O 7  
I/O 5  
I/O 2  
I/O 0  
D0 - D7  
D0 - D7  
/V  
D1  
D5  
DD DDQ  
DQ10  
DQ11  
DQ12  
DQ13  
DQ14  
DQ15  
D0 - D7  
D0 - D7  
VREF  
V
SS  
DQS2  
DM2  
DQS6  
DM6  
D3/D0/D5  
DM/  
CS DQS  
DM/  
CS DQS  
Cap/Cap/Cap  
Cap/D1/D6  
DQ16  
DQ17  
DQ18  
DQ19  
DQ20  
DQ21  
DQ22  
DQ23  
DQ48  
DQ49  
DQ50  
DQ51  
DQ52  
DQ53  
DQ54  
DQ55  
I/O 6  
I/O 5  
I/O 3  
I/O 0  
I/O 7  
I/O 4  
I/O 2  
I/O 1  
I/O 7  
I/O 5  
I/O 1  
I/O 0  
I/O 6  
I/O 4  
I/O 3  
I/O 2  
D2  
D6  
R=120Ω  
CK0/1/2  
Card  
Edge  
CK0/1/2  
Cap/Cap/Cap  
D4/D2/C7  
DQS3  
DM3  
DQS7  
DM7  
Cap  
Cap/Cap/Cap  
DM/  
CS DQS  
DM/  
CS DQS  
DQ24  
DQ25  
DQ26  
DQ27  
DQ28  
DQ29  
DQ30  
DQ31  
DQ56  
DQ57  
DQ58  
DQ59  
DQ60  
DQ61  
DQ62  
DQ63  
I/O 7  
I/O 4  
I/O 2  
I/O 1  
I/O 6  
I/O 5  
I/O 3  
I/O 0  
I/O 5  
I/O 4  
I/O 1  
I/O 0  
I/O 7  
I/O 6  
I/O 3  
I/O 2  
D3  
D7  
Notes :  
1. DQ-to-I/O wiring is shown as recommended  
but may be changed.  
2. DQ/DQS/DM/CKE/CS relationships must be  
maintained as shown.  
3. DQ, DQS, DM/DQS resistors: 22 Ohms + 5%.  
4. BAx, Ax, RAS, CAS, WE resistors: 5.1 Ohms +  
5%  
* Clock Wiring  
DDR SDRAMs  
BA0 - BA1  
A0 - A12  
RAS  
BA0-BA1 : DDR SDRAMs D0 - D7  
Clock  
Input  
A0-A12 : DDR SDRAMs D0 - D7  
RAS : DDR SDRAMs D0 - D7  
CAS : DDR SDRAMs D0 - D7  
CKE : DDR SDRAMs D0 - D7  
WE : DDR SDRAMs D0 - D7  
*CK0/CK0 2 DDR SDRAMs  
*CK1/CK1 3 DDR SDRAMs  
*CK2/CK2 3 DDR SDRAMs  
CAS  
CKE0  
WE  
*Clock Net Wiring  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
6.3 512MB, 64M x 72 ECC Module (M381L6523BT(U))  
(Populated as 1 bank of x8 DDR SDRAM Module)  
CS0  
DQS0  
DM0  
DQS4  
DM4  
DM/  
CS DQS  
DM/  
CS DQS  
DQ0  
DQ1  
DQ2  
DQ3  
DQ4  
DQ5  
DQ6  
DQ7  
DQ32  
DQ33  
DQ34  
DQ35  
DQ36  
DQ37  
DQ38  
DQ39  
I/O 6  
I/O 4  
I/O 2  
I/O 0  
I/O 7  
I/O 5  
I/O 3  
I/O 1  
I/O 7  
Serial PD  
I/O 4  
I/O 3  
I/O 0  
I/O 6  
I/O 5  
I/O 2  
I/O 1  
D0  
D4  
SCL  
WP  
SDA  
SPD  
A0  
A1  
A2  
SA0 SA1 SA2  
DQS1  
DM1  
DQS5  
DM5  
DM/  
CS DQS  
DM/  
CS DQS  
V
DDSPD  
DQ8  
DQ9  
DQ40  
DQ41  
DQ42  
DQ43  
DQ44  
DQ45  
DQ46  
DQ47  
I/O 7  
I/O 5  
I/O 1  
I/O 0  
I/O 6  
I/O 4  
I/O 3  
I/O 2  
I/O 6  
I/O 4  
I/O 3  
I/O 2  
I/O 7  
I/O 5  
I/O 1  
I/O 0  
D0 - D8  
D0 - D8  
V
/V  
DD DDQ  
D1  
D5  
DQ10  
DQ11  
DQ12  
DQ13  
DQ14  
DQ15  
D0 - D8  
D0 - D8  
VREF  
V
SS  
DQS2  
DM2  
DQS6  
DM6  
D3/D0/D6  
DM/  
CS DQS  
DM/  
CS DQS  
Cap/Cap/Cap  
D4/D1/D7  
DQ16  
DQ17  
DQ18  
DQ19  
DQ20  
DQ21  
DQ22  
DQ23  
DQ48  
DQ49  
DQ50  
DQ51  
DQ52  
DQ53  
DQ54  
DQ55  
I/O 6  
I/O 5  
I/O 3  
I/O 0  
I/O 7  
I/O 4  
I/O 2  
I/O 1  
I/O 7  
I/O 6  
I/O 1  
I/O 0  
I/O 5  
I/O 4  
I/O 3  
I/O 2  
D2  
D6  
R=120Ω  
CK0/1/2  
CK0/1/2  
Card  
Edge  
Cap/Cap/Cap  
D5/D2/D8  
DQS3  
DM3  
DQS7  
DM7  
Cap/Cap/Cap  
DM/  
CS DQS  
DM/  
CS DQS  
DQ24  
DQ25  
DQ26  
DQ27  
DQ28  
DQ29  
DQ30  
DQ31  
DQ56  
DQ57  
DQ58  
DQ59  
DQ60  
DQ61  
DQ62  
DQ63  
I/O 7  
I/O 4  
I/O 3  
I/O 1  
I/O 6  
I/O 5  
I/O 2  
I/O 0  
I/O 5  
I/O 4  
I/O 1  
I/O 0  
I/O 7  
I/O 6  
I/O 3  
I/O 2  
D3  
D7  
DQS8  
DM8  
DM/  
CS DQS  
CB0  
CB1  
CB2  
CB3  
CB4  
CB5  
CB6  
CB7  
I/O 5  
I/O 4  
I/O 3  
I/O 1  
I/O 7  
I/O 6  
I/O 2  
I/O 0  
D8  
BA0 - BA1  
A0 - A12  
RAS  
BA0-BA1 : DDR SDRAMs D0 - D8  
A0-A12 : DDR SDRAMs D0 - D8  
RAS : DDR SDRAMs D0 - D8  
CAS : DDR SDRAMs D0 - D8  
CKE : DDR SDRAMs D0 - D8  
WE : DDR SDRAMs D0 - D8  
Notes :  
1. DQ-to-I/O wiring is shown as recommended  
but may be changed.  
2. DQ/DQS/DM/CKE/CS relationships must be  
maintained as shown.  
3. DQ, DQS, DM/DQS resistors: 22 Ohms + 5%.  
4. BAx, Ax, RAS, CAS, WE resistors: 5.1 Ohms +  
5%  
* Clock Wiring  
DDR SDRAMs  
Clock  
Input  
CAS  
*CK0/CK0 3 DDR SDRAMs  
*CK1/CK1 3 DDR SDRAMs  
*CK2/CK2 3 DDR SDRAMs  
CKE0  
WE  
*Clock Net Wiring  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
6.4 1GB, 128M x 64 Non ECC Module (M368L2923BT(U))  
(Populated as 2 bank of x8 DDR SDRAM Module)  
CS1  
CS0  
DQS0  
DM0  
DQS4  
DM4  
DM/  
CS DQS  
DM/  
CS DQS  
DM/  
CS DQS  
DM/  
CS DQS  
DQ0  
DQ1  
DQ2  
DQ3  
DQ4  
DQ5  
DQ6  
DQ7  
DQ32  
DQ33  
DQ34  
DQ35  
DQ36  
DQ37  
DQ38  
DQ39  
I/O 7  
I/O 6  
I/O 1  
I/O 0  
I/O 5  
I/O 4  
I/O 3  
I/O 2  
I/O 0  
I/O 1  
I/O 6  
I/O 7  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
I/O 7  
I/O 0  
I/O 1  
I/O 6  
I/O 5  
I/O 2  
I/O 3  
I/O 4  
I/O 7  
I/O 6  
I/O 1  
I/O 2  
I/O 5  
I/O 4  
I/O 3  
I/O 0  
D8  
D4  
D12  
D0  
DQS1  
DM1  
DQS5  
DM5  
DM/  
CS DQS  
DM/  
CS DQS  
DM/  
CS DQS  
DM/  
CS DQS  
DQ8  
DQ9  
DQ40  
DQ41  
DQ42  
DQ43  
DQ44  
DQ45  
DQ46  
DQ47  
I/O 5  
I/O 6  
I/O 1  
I/O 0  
I/O 7  
I/O 4  
I/O 3  
I/O 2  
I/O 2  
I/O 1  
I/O 6  
I/O 7  
I/O 0  
I/O 3  
I/O 4  
I/O 5  
I/O 7  
I/O 6  
I/O 1  
I/O 0  
I/O 5  
I/O 4  
I/O 3  
I/O 2  
I/O 0  
I/O 1  
I/O 6  
I/O 7  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
D1  
D9  
D5  
D13  
DQ10  
DQ11  
DQ12  
DQ13  
DQ14  
DQ15  
DQS2  
DM2  
DQS6  
DM6  
DM/  
CS DQS  
DM/  
CS DQS  
DM/  
CS DQS  
DM/  
CS DQS  
DQ16  
DQ17  
DQ18  
DQ19  
DQ20  
DQ21  
DQ22  
DQ23  
DQ48  
DQ49  
DQ50  
DQ51  
DQ52  
DQ53  
DQ54  
DQ55  
I/O 5  
I/O 4  
I/O 1  
I/O 0  
I/O 7  
I/O 6  
I/O 3  
I/O 2  
I/O 7  
I/O 6  
I/O 1  
I/O 2  
I/O 5  
I/O 4  
I/O 3  
I/O 0  
I/O 2  
I/O 3  
I/O 6  
I/O 7  
I/O 0  
I/O 1  
I/O 4  
I/O 5  
I/O 0  
I/O 1  
I/O 6  
I/O 5  
I/O 2  
I/O 3  
I/O 4  
I/O 7  
D2  
D10  
D6  
D14  
DQS3  
DM3  
DQS7  
DM7  
DM/  
CS DQS  
DM/  
CS DQS  
DM/  
CS DQS  
DM/  
CS DQS  
DQ24  
DQ25  
DQ26  
DQ27  
DQ28  
DQ29  
DQ30  
DQ31  
DQ56  
DQ57  
DQ58  
DQ59  
DQ60  
DQ61  
DQ62  
DQ63  
I/O 5  
I/O 6  
I/O 1  
I/O 0  
I/O 7  
I/O 4  
I/O 3  
I/O 2  
I/O 7  
I/O 6  
I/O 1  
I/O 0  
I/O 5  
I/O 4  
I/O 3  
I/O 2  
I/O 2  
I/O 1  
I/O 6  
I/O 7  
I/O 0  
I/O 3  
I/O 4  
I/O 5  
I/O 0  
I/O 1  
I/O 6  
I/O 7  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
D3  
D7  
D11  
D15  
D3/D0/D5  
V
V
SPD  
DDSPD  
D11/D8/D13  
Serial PD  
D0 - D15  
D0 - D15  
/V  
DD DDQ  
R=120Ω  
SCL  
WP  
*
Cap/D1/D6  
CK0/1/2  
CK0/1/2  
SDA  
D0 - D15  
D0 - D15  
VREF  
A0  
A1  
A2  
Card  
Edge  
*
Cap/D9/D14  
V
SA0 SA1  
SA2  
SS  
D4/D2/D7  
D12/D10/D15  
BA0 - BA1  
A0 - A12  
RAS  
BA0-BA1 : DDR SDRAMs D0 - D15  
A0-A12: DDR SDRAMs D0 - D15  
RAS : DDR SDRAMs D0 - D15  
Notes :  
1. DQ-to-I/O wiring is shown as recommended  
but may be changed.  
2. DQ/DQS/DM/CKE/CS relationships must be  
maintained as shown.  
* Clock Wiring  
DDR SDRAMs  
Clock  
Input  
CAS  
CKE 0/1  
WE  
CAS : DDR SDRAMs D0 - D15  
CKE : DDR SDRAMs D0 - D15  
WE : DDR SDRAMs D0 - D15  
3. DQ, DQS, DM/DQS resistors: 22 Ohms + 5%.  
4. BAx, Ax, RAS, CAS, WE resistors: 3 Ohms +  
5%  
*CK0/CK0 4 DDR SDRAMs  
*CK1/CK1 6 DDR SDRAMs  
*CK2/CK2 6 DDR SDRAMs  
*Clock Net Wiring  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
6.5 1GB, 128M x 72 ECC Module (M381L2923BT(U))  
(Populated as 2 bank of x8 DDR SDRAM Module)  
CS1  
CS0  
DQS0  
DM0  
DQS4  
DM4  
DM/  
CS DQS  
DM/  
CS DQS  
DM/  
CS DQS  
DM/  
CS DQS  
DQ0  
DQ1  
DQ2  
DQ3  
DQ4  
DQ5  
DQ6  
DQ7  
DQ32  
DQ33  
DQ34  
DQ35  
DQ36  
DQ37  
DQ38  
DQ39  
I/O 7  
I/O 6  
I/O 1  
I/O 0  
I/O 5  
I/O 4  
I/O 3  
I/O 2  
I/O 0  
I/O 1  
I/O 6  
I/O 7  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
I/O 7  
I/O 0  
I/O 1  
I/O 6  
I/O 7  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
I/O 6  
I/O 1  
I/O 0  
I/O 5  
I/O 4  
I/O 3  
I/O 2  
D9  
D4  
D13  
D0  
DQS1  
DM1  
DQS5  
DM5  
DM/  
CS DQS  
DM/  
CS DQS  
DM/  
CS DQS  
DM/  
CS DQS  
DQ8  
DQ9  
DQ40  
DQ41  
DQ42  
DQ43  
DQ44  
DQ45  
DQ46  
DQ47  
I/O 7  
I/O 6  
I/O 1  
I/O 0  
I/O 5  
I/O 4  
I/O 3  
I/O 2  
I/O 0  
I/O 1  
I/O 6  
I/O 7  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
I/O 7  
I/O 6  
I/O 1  
I/O 0  
I/O 5  
I/O 4  
I/O 3  
I/O 2  
I/O 0  
I/O 1  
I/O 6  
I/O 7  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
D1  
D10  
D5  
D14  
DQ10  
DQ11  
DQ12  
DQ13  
DQ14  
DQ15  
DQS2  
DM2  
DQS6  
DM6  
DM/  
CS DQS  
DM/  
CS DQS  
DM/  
CS DQS  
DM/  
CS DQS  
DQ16  
DQ17  
DQ18  
DQ19  
DQ20  
DQ21  
DQ22  
DQ23  
DQ48  
DQ49  
DQ50  
DQ51  
DQ52  
DQ53  
DQ54  
DQ55  
I/O 7  
I/O 6  
I/O 1  
I/O 0  
I/O 5  
I/O 4  
I/O 3  
I/O 2  
I/O 7  
I/O 6  
I/O 1  
I/O 0  
I/O 5  
I/O 4  
I/O 3  
I/O 2  
I/O 0  
I/O 1  
I/O 6  
I/O 7  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
I/O 0  
I/O 1  
I/O 6  
I/O 7  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
D2  
D11  
D15  
D6  
DQS3  
DM3  
DQS7  
DM7  
DM/  
CS DQS  
DM/  
CS DQS  
DM/  
CS DQS  
DM/  
CS DQS  
DQ24  
DQ25  
DQ26  
DQ27  
DQ28  
DQ29  
DQ30  
DQ31  
DQ56  
DQ57  
DQ58  
DQ59  
DQ60  
DQ61  
DQ62  
DQ63  
I/O 7  
I/O 6  
I/O 1  
I/O 0  
I/O 5  
I/O 4  
I/O 3  
I/O 2  
I/O 7  
I/O 6  
I/O 1  
I/O 0  
I/O 5  
I/O 4  
I/O 3  
I/O 2  
I/O 0  
I/O 1  
I/O 6  
I/O 7  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
I/O 0  
I/O 1  
I/O 6  
I/O 7  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
D3  
D7  
D12  
D16  
DQS8  
DM8  
DM/  
CS DQS  
DM/  
CS DQS  
I/O 7  
I/O 6  
I/O 1  
I/O 0  
I/O 5  
I/O 4  
I/O 3  
I/O 2  
CB0  
CB1  
CB2  
CB3  
CB4  
CB5  
CB6  
CB7  
I/O 0  
I/O 1  
I/O 6  
I/O 7  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
D8  
D17  
D3/D0/D5  
D12/D9/D14  
R=120Ω  
D8/D1/D6  
V
V
SPD  
DDSPD  
Serial PD  
CK0/1/2  
SCL  
WP  
Card  
Edge  
D0 - D17  
D0 - D17  
/V  
DD DDQ  
D17/D10/D15  
D4/D2/D7  
SDA  
A0  
A1  
A2  
D0 - D17  
D0 - D17  
VREF  
SA0 SA1  
SA2  
V
D13/D11/D16  
SS  
Notes :  
BA0 - BA1  
A0 - A12  
RAS  
BA0-BA1 : DDR SDRAMs D0 - D17  
A0-A12 : DDR SDRAMs D0 - D17  
RAS : DDR SDRAMs D0 - D17  
1. DQ-to-I/O wiring is shown as recommended  
but may be changed.  
2. DQ/DQS/DM/CKE/CS relationships must be  
maintained as shown.  
3. DQ, DQS, DM/DQS resistors: 22 Ohms + 5%.  
4. BAx, Ax, RAS, CAS, WE resistors:3 Ohms +  
5%  
* Clock Wiring  
DDR SDRAMs  
Clock  
Input  
CAS  
CKE0/1  
WE  
CAS : DDR SDRAMs D0 - D17  
CKE : DDR SDRAMs D0 - D17  
WE : DDR SDRAMs D0 - D17  
*CK0/CK0 6 DDR SDRAMs  
*CK1/CK1 6 DDR SDRAMs  
*CK2/CK2 6 DDR SDRAMs  
*Clock Net Wiring  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
7.0 Absolute Maximum Ratings  
Parameter  
Symbol  
Value  
Unit  
Voltage on any pin relative to VSS  
VIN,VOUT  
-0.5 ~ 3.6  
V
Voltage on VDD & VDDQ supply relative to VSS  
Storage temperature  
Power dissipation  
VDD,VDDQ  
TSTG  
PD  
-1.0 ~ 3.6  
V
-55 ~ +150  
°C  
1.5 * # of component  
50  
W
Short circuit current  
IOS  
mA  
Note :  
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.  
Functional operation should be restricted to recommended operating condition.  
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.  
8.0 DC Operating Conditions  
Recommended operating conditions(Voltage referenced to VSS=0V, TA=0 to 70°C)  
Parameter  
Symbol  
Min  
Max  
Unit Note  
Supply voltage(for device with a nominal VDD of 2.5V for DDR333)  
VDD  
2.3  
2.7  
V
Supply voltage(for device with a nominal VDD of 2.6V for DDR400)  
VDD  
2.5  
2.7  
2.7  
V
V
V
I/O Supply voltage(for device with a nominal VDD of 2.5V for DDR333)  
I/O Supply voltage(for device with a nominal VDD of 2.6V for DDR400)  
I/O Reference voltage  
VDDQ  
VDDQ  
VREF  
VTT  
2.3  
2.5  
2.7  
0.49*VDDQ  
VREF-0.04  
0.51*VDDQ  
VREF+0.04  
V
V
1
2
I/O Termination voltage(system)  
Input logic high voltage  
VIH(DC)  
VIL(DC)  
VIN(DC)  
VID(DC)  
VI(Ratio)  
II  
VREF+0.15  
-0.3  
VDDQ+0.3  
VREF-0.15  
VDDQ+0.3  
VDDQ+0.6  
1.4  
V
Input logic low voltage  
V
Input Voltage Level, CK and CK inputs  
Input Differential Voltage, CK and CK inputs  
V-I Matching: Pullup to Pulldown Current Ratio  
Input leakage current  
-0.3  
V
0.36  
0.71  
-2  
V
3
4
-
2
uA  
uA  
mA  
Output leakage current  
IOZ  
-5  
5
Output High Current(Normal strengh driver) ;VOUT = VTT + 0.84V  
IOH  
-16.8  
Output High Current(Normal strengh driver) ;VOUT = VTT - 0.84V  
Output High Current(Half strengh driver) ;VOUT = VTT + 0.45V  
Output High Current(Half strengh driver) ;VOUT = VTT - 0.45V  
Note :  
IOL  
IOH  
IOL  
16.8  
-9  
mA  
mA  
mA  
9
1. VREF is expected to be equal to 0.5*VDDQ of the transmitting device, and to track variations in the dc level of same. Peak-to peak noise on VREF may  
not exceed +/-2% of the dc value.  
2. VTT is not applied directly to the device. VTT is a system supply for signal termination resistors, is expected to be set equal to VREF, and must track  
variations in the DC level of VREF  
.
3. VID is the magnitude of the difference between the input level on CK and the input level on CK.  
4. The ratio of the pullup current to the pulldown current is specified for the same temperature and voltage, over the entire temperature and voltage range,  
for device drain to source voltages from 0.25V to 1.0V. For a given output, it represents the maximum difference between pullup and pulldown drivers  
due to process variation. The full variation in the ratio of the maximum to minimum pullup and pulldown current will not exceed 1.7 for device drain to  
source voltages from 0.1 to 1.0.  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
9.0 DDR SDRAM IDD spec table  
9.1 M368L3324BT(U) [ (32M x 16) * 4, 256MB Non ECC Module ]  
(VDD=2.7V, T = 10°C)  
Symbol  
IDD0  
CC(DDR400@CL=3)  
B3(DDR333@CL=2.5)  
Unit  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
Notes  
660  
760  
20  
500  
620  
20  
IDD1  
IDD2P  
IDD2F  
IDD2Q  
IDD3P  
IDD3N  
IDD4R  
IDD4W  
IDD5  
120  
100  
220  
400  
920  
1,120  
1,060  
20  
120  
100  
120  
200  
780  
860  
1,000  
20  
Normal  
Low power  
IDD7A  
IDD6  
12  
12  
Optional  
1,800  
1,620  
* Module IDD was calculated on the basis of component IDD and can be differently measured according to DQ loading cap.  
9.2 M368L6523BT(U) [ (64M x 8) * 8, 512MB Non ECC Module ]  
(VDD=2.7V, T = 10°C)  
Symbol  
IDD0  
CC(DDR400@CL=3)  
B3(DDR333@CL=2.5)  
Unit  
Notes  
1,320  
1,480  
40  
1,000  
1,200  
40  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
IDD1  
IDD2P  
IDD2F  
IDD2Q  
IDD3P  
IDD3N  
IDD4R  
IDD4W  
IDD5  
240  
240  
200  
200  
440  
240  
760  
400  
1,600  
1,920  
2,120  
40  
1,320  
1,520  
2,000  
40  
Normal  
Low power  
IDD7A  
IDD6  
24  
24  
Optional  
3,440  
3,200  
* Module IDD was calculated on the basis of component IDD and can be differently measured according to DQ loading cap.  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
9.3 M381L6523BT(U) [ (64M x 8) * 9, 512MB ECC Module ]  
(VDD=2.7V, T = 10°C)  
Symbol  
IDD0  
CC(DDR400@CL=3)  
B0(DDR333@CL=2.5)  
Unit  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
Notes  
1,485  
1,665  
45  
1,130  
1,350  
45  
IDD1  
IDD2P  
IDD2F  
IDD2Q  
IDD3P  
IDD3N  
IDD4R  
IDD4W  
IDD5  
270  
270  
225  
230  
500  
270  
855  
450  
1,800  
2,160  
2,385  
45  
1,490  
1,710  
2,250  
45  
Normal  
Low power  
IDD7A  
IDD6  
27  
27  
Optional  
3,870  
3,600  
* Module IDD was calculated on the basis of component IDD and can be differently measured according to DQ loading cap.  
9.4 M368L2923BT(U) [ (64M x 8) * 16, 1GB Non ECC Module ]  
(VDD=2.7V, T = 10°C)  
Unit Notes  
Symbol  
IDD0  
CC(DDR400@CL=3)  
B0(DDR333@CL=2.5)  
2,080  
2,240  
80  
1,400  
1,600  
80  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
IDD1  
IDD2P  
IDD2F  
IDD2Q  
IDD3P  
IDD3N  
IDD4R  
IDD4W  
IDD5  
480  
480  
400  
400  
880  
480  
1,520  
2,360  
2,680  
2,880  
80  
800  
1,720  
1,920  
2,400  
80  
Normal  
Low power  
IDD7A  
IDD6  
48  
48  
Optional  
4,200  
3,600  
* Module IDD was calculated on the basis of component IDD and can be differently measured according to DQ loading cap.  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
9.5 M381L2923BT(U) [ (64M x 8) * 18, 1GB ECC Module ]  
(VDD=2.7V, T = 10°C)  
Symbol  
IDD0  
CC (DDR400@CL=3)  
B3 (DDR333@CL=2.5)  
Unit  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
Notes  
2,340  
2,520  
90  
1,580  
1,800  
90  
IDD1  
IDD2P  
IDD2F  
IDD2Q  
IDD3P  
IDD3N  
IDD4R  
IDD4W  
IDD5  
540  
540  
450  
450  
990  
540  
1,710  
2,655  
3,015  
3,240  
90  
900  
1,940  
2,160  
2,700  
90  
Normal  
Low power  
IDD7A  
IDD6  
54  
54  
Optional  
4,725  
4,050  
* Module IDD was calculated on the basis of component IDD and can be differently measured according to DQ loading cap.  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
10.0 AC Operating Conditions  
Parameter/Condition  
Symbol  
Min  
Max  
Unit  
V
Note  
Input High (Logic 1) Voltage, DQ, DQS and DM signals  
Input Low (Logic 0) Voltage, DQ, DQS and DM signals.  
Input Differential Voltage, CK and CK inputs  
Input Crossing Point Voltage, CK and CK inputs  
VIH(AC)  
VIL(AC)  
VID(AC)  
VREF + 0.31  
3
3
1
2
VREF - 0.31  
VDDQ+0.6  
V
0.7  
V
VIX(AC) 0.5*VDDQ-0.2 0.5*VDDQ+0.2  
V
Note :  
1. VID is the magnitude of the difference between the input level on CK and the input on CK.  
2. The value of VIX is expected to equal 0.5*VDDQ of the transmitting device and must track variations in the DC level of the same.  
3. These parameters should be tested at the pim on actual components and may be checked at either the pin or the pad in  
simulation. the AC and DC input specificatims are refation to a Vref envelope that has been bandwidth limited 20MHz.  
Vtt=0.5*VDDQ  
RT=50Ω  
Output  
Z0=50Ω  
VREF  
=0.5*VDDQ  
CLOAD=30pF  
Output Load Circuit (SSTL_2)  
11.0 Input/Output Capacitance  
(VDD=2.5V, VDDQ=2.5V, TA= 25°C, f=1MHz)  
M368L3324BT(U) M368L6523BT(U) M381L6523BT(U)  
Symbol Unit  
Parameter  
Min  
41  
34  
34  
25  
6
Max  
45  
38  
38  
30  
7
Min  
49  
42  
42  
25  
6
Max  
57  
50  
50  
30  
7
Min  
51  
44  
44  
25  
6
Max  
60  
53  
53  
30  
7
Input capacitance(A0 ~ A12, BA0 ~ BA1,RAS,CAS,WE ) CIN1  
pF  
pF  
pF  
pF  
pF  
pF  
pF  
Input capacitance(CKE0)  
CIN2  
CIN3  
CIN4  
CIN5  
Cout1  
Cout2  
Input capacitance( CS0)  
Input capacitance( CLK0, CLK1,CLK2)  
Input capacitance(DM0~DM7, DM8(for ECC))  
Data & DQS input/output capacitance(DQ0~DQ63)  
Data input/output capacitance (CB0~CB7)  
6
7
6
7
6
7
-
-
-
-
6
7
M368L2923BT(U)  
M381L2923BT(U)  
Parameter  
Symbol  
Unit  
Min  
65  
42  
42  
28  
10  
10  
-
Max  
81  
50  
50  
34  
12  
12  
-
Min  
69  
44  
44  
28  
10  
10  
10  
Max  
87  
53  
53  
34  
12  
12  
12  
Input capacitance(A0 ~ A12, BA0 ~ BA1,RAS,CAS,WE ) CIN1  
pF  
pF  
pF  
pF  
pF  
pF  
pF  
Input capacitance(CKE0,CKE1)  
CIN2  
CIN3  
CIN4  
CIN5  
Cout1  
Cout2  
Input capacitance( CS0, CS1)  
Input capacitance( CLK0, CLK1,CLK2)  
Input capacitance(DM0~DM7, DM8(for ECC))  
Data & DQS input/output capacitance(DQ0~DQ63)  
Data input/output capacitance (CB0~CB7)  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
12.0 AC Timming Parameters & Specifications  
CC  
(DDR400@CL=3.0)  
B3  
(DDR333@CL=2.5)  
Parameter  
Symbol  
Unit  
Note  
Min  
55  
Max  
Min  
60  
Max  
Row cycle time  
tRC  
tRFC  
tRAS  
tRCD  
tRP  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tCK  
ns  
ns  
Refresh row cycle time  
Row active time  
70  
72  
40  
70K  
42  
70K  
RAS to CAS delay  
Row precharge time  
15  
18  
15  
18  
Row active to Row active delay  
Write recovery time  
tRRD  
tWR  
10  
12  
15  
15  
Last data in to Read command  
tWTR  
2
1
CL=2.0  
CL=2.5  
CL=3.0  
-
-
7.5  
6
12  
12  
Clock cycle time  
tCK  
6
12  
5
10  
-
-
Clock high level width  
tCH  
tCL  
0.45  
0.45  
-0.55  
-0.65  
-
0.55  
0.55  
+0.55  
+0.65  
0.4  
0.45  
0.45  
-0.6  
-0.7  
-
0.55  
0.55  
+0.6  
+0.7  
0.45  
1.1  
tCK  
tCK  
ns  
Clock low level width  
DQS-out access time from CK/CK  
Output data access time from CK/CK  
Data strobe edge to ouput data edge  
Read Preamble  
tDQSCK  
tAC  
ns  
tDQSQ  
tRPRE  
tRPST  
tDQSS  
tWPRES  
tWPRE  
tDSS  
tDSH  
tDQSH  
tDQSL  
tIS  
ns  
22  
13  
0.9  
0.4  
0.72  
0
1.1  
0.9  
0.4  
0.75  
0
tCK  
tCK  
tCK  
ns  
Read Postamble  
0.6  
0.6  
CK to valid DQS-in  
1.28  
1.25  
DQS-in setup time  
DQS-in hold time  
0.25  
0.2  
0.2  
0.35  
0.35  
0.6  
0.6  
0.7  
0.7  
-0.65  
-0.65  
10  
0.25  
0.2  
0.2  
0.35  
0.35  
0.75  
0.75  
0.8  
0.8  
-0.7  
-0.7  
12  
tCK  
tCK  
tCK  
tCK  
tCK  
ns  
DQS falling edge to CK rising-setup time  
DQS falling edge from CK rising-hold time  
DQS-in high level width  
DQS-in low level width  
Address and Control Input setup time(fast)  
Address and Control Input hold time(fast)  
Address and Control Input setup time(slow)  
Address and Control Input hold time(slow)  
Data-out high impedence time from CK/CK  
Data-out low impedence time from CK/CK  
Mode register set cycle time  
DQ & DM setup time to DQS  
15, 17~19  
15, 17~19  
16~19  
16~19  
11  
tIH  
ns  
tIS  
ns  
tIH  
ns  
tHZ  
+0.65  
+0.65  
+0.7  
+0.7  
ns  
tLZ  
ns  
11  
tMRD  
tDS  
ns  
0.4  
0.45  
ns  
j, k  
j, k  
ns  
DQ & DM hold time to DQS  
tDH  
0.4  
0.45  
Control & Address input pulse width  
DQ & DM input pulse width  
tIPW  
tDIPW  
tXSNR  
tXSRD  
tREFI  
2.2  
1.75  
75  
2.2  
1.75  
75  
ns  
ns  
18  
18  
Exit self refresh to non-Read command  
Exit self refresh to read command  
Refresh interval time  
ns  
200  
200  
tCK  
us  
7.8  
-
7.8  
-
14  
21  
tHP  
-tQHS  
tHP  
-tQHS  
Output DQS valid window  
Clock half period  
tQH  
tHP  
ns  
ns  
tCLmin  
or tCHmin  
tCLmin  
or tCHmin  
-
-
20, 21  
Data hold skew factor  
tQHS  
0.5  
0.6  
0.55  
0.6  
ns  
21  
12  
DQS write postamble time  
tWPST  
0.4  
15  
0.4  
18  
tCK  
Active to Read with Auto precharge  
command  
tRAP  
(tWR/tCK)  
+
(tRP/tCK)  
(tWR/tCK)  
+
(tRP/tCK)  
Autoprecharge write recovery +  
Precharge time  
tDAL  
tCK  
23  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
13.0 System Characteristics for DDR SDRAM  
The following specification parameters are required in systems using DDR333 devices to ensure proper system performance. these  
characteristics are for system simulation purposes and are guaranteed by design.  
Table 1 : Input Slew Rate for DQ, DQS, and DM  
AC CHARACTERISTICS  
DDR400  
DDR333  
PARAMETER  
SYMBOL  
MIN  
TBD  
MAX  
MIN  
TBD  
MAX  
Units  
Notes  
DQ/DM/DQS input slew rate measured between  
VIH(DC), VIL(DC) and VIL(DC), VIH(DC)  
DCSLEW  
TBD  
TBD  
V/ns  
a, m  
Table 2 : Input Setup & Hold Time Derating for Slew Rate  
Input Slew Rate  
0.5 V/ns  
tIS  
0
tIH  
Units  
ps  
Notes  
0
0
0
i
i
i
0.4 V/ns  
+50  
+100  
ps  
0.3 V/ns  
ps  
Table 3 : Input/Output Setup & Hold Time Derating for Slew Rate  
Input Slew Rate  
0.5 V/ns  
tDS  
0
tDH  
0
Units  
ps  
Notes  
k
k
k
0.4 V/ns  
+75  
+150  
+75  
+150  
ps  
0.3 V/ns  
ps  
Table 4 : Input/Output Setup & Hold Derating for Rise/Fall Delta Slew Rate  
Delta Slew Rate  
+/- 0.0 V/ns  
tDS  
0
tDH  
0
Units  
ps  
Notes  
j
j
j
+/- 0.25 V/ns  
+/- 0.5 V/ns  
+50  
+100  
+50  
+100  
ps  
ps  
Table 5 : Output Slew Rate Characteristice (X4, X8 Devices only)  
Typical Range  
(V/ns)  
Minimum  
(V/ns)  
Maximum  
(V/ns)  
Slew Rate Characteristic  
Notes  
Pullup Slew Rate  
Pulldown slew  
1.2 ~ 2.5  
1.2 ~ 2.5  
1.0  
1.0  
4.5  
4.5  
a,c,d,f,g,h  
b,c,d,f,g,h  
Table 6 : Output Slew Rate Characteristice (X16 Devices only)  
Typical Range  
(V/ns)  
Minimum  
(V/ns)  
Maximum  
(V/ns)  
Slew Rate Characteristic  
Notes  
Pullup Slew Rate  
Pulldown slew  
1.2 ~ 2.5  
1.2 ~ 2.5  
0.7  
0.7  
5.0  
5.0  
a,c,d,f,g,h  
b,c,d,f,g,h  
Table 7 : Output Slew Rate Matching Ratio Characteristics  
AC CHARACTERISTICS  
DDR400  
DDR333  
PARAMETER  
Output Slew Rate Matching Ratio (Pullup to Pulldown)  
MIN  
TBD  
MAX  
MIN  
MAX  
Notes  
e,m  
TBD  
TBD  
TBD  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
14.0 Component Notes  
1. All voltages referenced to Vss.  
2. Tests for ac timing, IDD, and electrical, ac and dc characteristics, may be conducted at nominal reference/supply voltage levels, but the related speci-  
fications and device operation are guaranteed for the full voltage range specified.  
3. Figure 1 represents the timing reference load used in defining the relevant timing parameters of the part. It is not intended to be either a precise rep-  
resentation of the typical system environment nor a depiction of the actual load presented by a production tester. System designers will use IBIS or  
other simulation tools to correlate the timing reference load to a system environment. Manufacturers will correlate to their production test conditions  
(generally a coaxial transmission line terminated at the tester electronics).  
VDDQ  
50Ω  
Output  
(Vout)  
30pF  
Figure 1 : Timing Reference Load  
4. AC timing and IDD tests may use a VIL to VIH swing of up to 1.5 V in the test environment, but input timing is still referenced to VREF (or to the cross-  
ing point for CK/CK), and parameter specifications are guaranteed for the specified ac input levels under normal use conditions. The minimum slew  
rate for the input signals is 1 V/ns in the range between VIL(ac) and VIH(ac).  
5. The ac and dc input level specifications are as defined in the SSTL_2 Standard (i.e., the receiver will effectively switch as a result of the signal crossing  
the ac input level and will remain in that state as long as the signal does not ring back above (below) the dc input LOW (HIGH) level.  
6. Inputs are not recognized as valid until VREF stabilizes. Exception: during the period before VREF stabilizes, CKE 0.2VDDQ is recognized as LOW.  
7. Enables on.chip refresh and address counters.  
8. IDD specifications are tested after the device is properly initialized.  
9. The CK/CK input reference level (for timing referenced to CK/CK) is the point at which CK and CK cross; the input reference level for signals other  
than CK/CK, is VREF.  
10. The output timing reference voltage level is VTT.  
11. tHZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not referenced to a specific voltage  
level but specify when the device output is no longer driving (HZ), or begins driving (LZ).  
12. The maximum limit for this parameter is not a device limit. The device will operate with a greater value for this parameter, but sys tem performance  
(bus turnaround) will degrade accordingly.  
13. The specific requirement is that DQS be valid (HIGH, LOW, or at some point on a valid transition) on or before this CK edge. A valid transition is  
defined as monotonic and meeting the input slew rate specifications of the device. when no writes were previ ously in progress on the bus, DQS will  
be tran sitioning from High- Z to logic LOW. If a previous write was in progress, DQS could be HIGH, LOW, or transitioning from HIGH to LOW at this  
time, depending on tDQSS.  
14. A maximum of eight AUTO REFRESH commands can be posted to any given DDR SDRAM device.  
15. For command/address input slew rate 1.0 V/ns  
16. For command/address input slew rate 0.5 V/ns and < 1.0 V/ns  
17. For CK & CK slew rate 1.0 V/ns  
18. These parameters guarantee device timing, but they are not necessarily tested on each device. They may be guaranteed by device design or tester  
correlation.  
19. Slew Rate is measured between VOH(ac) and VOL(ac).  
20. Min (tCL, tCH) refers to the smaller of the actual clock low time and the actual clock high time as provided to the device (i.e. this value can be greater  
than the minimum specification limits for tCL and tCH).....For example, tCL and tCH are = 50% of the period, less the half period jitter (tJIT(HP)) of the  
clock source, and less the half period jitter due to crosstalk (tJIT(crosstalk)) into the clock traces.  
21. tQH = tHP - tQHS, where:  
tHP = minimum half clock period for any given cycle and is defined by clock high or clock low (tCH, tCL). tQHS accounts for 1) The pulse duration dis-  
tortion of on-chip clock circuits; and 2) The worst case push-out of DQS on one tansition followed by the worst case pull-in of DQ on the next transi-  
tion, both of which are, separately, due to data pin skew and output pattern effects, and p channel to n-channel variation of the output drivers.  
22. tDQSQ - Consists of data pin skew and output pattern effects, and p-channel to n-channel variation of the output drivers for any given cycle.  
23. tDAL = (tWR/tCK) + (tRP/tCK)  
For each of the terms above, if not already an integer, round to the next highest integer. Example: For DDR266B at CL=2.5 and tCK=7.5ns tDAL = (15  
ns / 7.5 ns) + (20 ns/ 7.5ns) = (2) + (3) tDAL = 5 clocks  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
15.0 System Notes:  
a. Pullup slew rate is characteristized under the test conditions as shown in Figure 2.  
Test point  
50Ω  
Output  
VSSQ  
Figure 2 : Pullup slew rate test load  
b. Pulldown slew rate is measured under the test conditions shown in Figure 3.  
VDDQ  
50Ω  
Output  
Test point  
Figure 3 : Pulldown slew rate test load  
c. Pullup slew rate is measured between (VDDQ/2 - 320 mV +/- 250 mV)  
Pulldown slew rate is measured between (VDDQ/2 + 320 mV +/- 250 mV)  
Pullup and Pulldown slew rate conditions are to be met for any pattern of data, including all outputs switching and only one output switching.  
Example : For typical slew rate, DQ0 is switching  
For minmum slew rate, all DQ bits are switching from either high to low, or low to high.  
The remaining DQ bits remain the same as for previous state.  
d. Evaluation conditions  
Typical : 25 °C (T Ambient), VDDQ = 2.5V(for DDR266/333) and 2.6V(for DDR400), typical process  
Minimum : 70 °C (T Ambient), VDDQ = 2.3V(for DDR266/333) and 2.5V(for DDR400), slow - slow process  
Maximum : 0 °C (T Ambient), VDDQ = 2.7V(for DDR266/333) and 2.7V(for DDR400), fast - fast process  
e. The ratio of pullup slew rate to pulldown slew rate is specified for the same temperature and voltage, over the entire temperature and voltage range.  
For a given output, it represents the maximum difference between pullup and pulldown drivers due to process variation.  
f. Verified under typical conditions for qualification purposes.  
g. TSOPII package divices only.  
h. Only intended for operation up to 266 Mbps per pin.  
i. A derating factor will be used to increase tIS and tIH in the case where the input slew rate is below 0.5V/ns as shown in Table 2. The Input slew rate is  
based on the lesser of the slew rates detemined by either VIH(AC) to VIL(AC) or VIH(DC) to VIL(DC), similarly for rising transitions.  
j. A derating factor will be used to increase tDS and tDH in the case where DQ, DM, and DQS slew rates differ, as shown in Tables 3 & 4. Input slew rate  
is based on the larger of AC-AC delta rise, fall rate and DC-DC delta rise, Input slew rate is based on the lesser of the slew rates determined by either  
VIH(AC) to VIL(AC) or VIH(DC) to VIL(DC), similarly for rising transitions. The delta rise/fall rate is calculated as: {1/(Slew Rate1)} - {1/(Slew Rate2)}  
For example : If Slew Rate 1 is 0.5 V/ns and slew Rate 2 is 0.4 V/ns, then the delta rise, fall rate is - 0.5ns/V . Using the table given, this  
would result in the need for an increase in tDS and tDH of 100 ps.  
k. Table 3 is used to increase tDS and tDH in the case where the I/O slew rate is below 0.5 V/ns. The I/O slew rate is based on the lesser on the lesser of  
the AC - AC slew rate and the DC- DC slew rate. The inut slew rate is based on the lesser of the slew rates deter mined by either VIH(ac) to VIL(ac) or  
VIH(DC) to VIL(DC), and similarly for rising transitions.  
m. DQS, DM, and DQ input slew rate is specified to prevent double clocking of data and preserve setup and hold times. Signal transi tions through the  
DC region must be monotonic.  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
16.0 Command Truth Table  
(V=Valid, X=Dont Care, H=Logic High, L=Logic Low)  
A0 ~ A9  
Note  
COMMAND  
CKEn-1 CKEn CS RAS CAS WE BA0,1 A10/AP  
A11, A12  
Register  
Register  
Extended MRS  
H
H
X
X
H
L
L
L
L
L
L
L
L
L
OP CODE  
OP CODE  
1, 2  
1, 2  
3
Mode Register Set  
Auto Refresh  
H
L
L
L
H
X
X
Entry  
Self  
3
Refresh  
L
H
X
H
X
H
X
3
Refresh  
Exit  
L
H
H
H
X
X
H
3
Row Address  
(A0~A9, A11,A12)  
Bank Active & Row Addr.  
L
L
L
H
L
H
H
V
V
Auto Precharge Disable  
Auto Precharge Enable  
Auto Precharge Disable  
Auto Precharge Enable  
L
H
L
4
4
Read &  
Column Address  
Column  
Address  
H
4
Write &  
Column Address  
Column  
Address  
H
H
H
X
X
X
L
L
L
H
H
L
L
H
H
L
L
L
V
H
4, 6  
7
Burst Stop  
X
Bank Selection  
All Banks  
V
X
L
Precharge  
X
H
5
H
L
X
V
X
X
H
X
V
X
X
H
X
V
X
X
H
X
V
X
V
X
X
H
X
V
Entry  
H
L
L
H
L
Active Power Down  
X
X
Exit  
X
H
L
Entry  
H
Precharge Power Down Mode  
DM  
H
L
Exit  
L
H
H
H
X
X
X
8
9
9
H
L
X
H
X
H
No operation (NOP) : Not defined  
Note :  
1. OP Code : Operand Code. A0 ~ A12 & BA0 ~ BA1 : Program keys. (@EMRS/MRS)  
2. EMRS/ MRS can be issued only at all banks precharge state. A new command can be issued 2 clock cycles after EMRS or MRS.  
3. Auto refresh functions are same as the CBR refresh of DRAM.  
The automatical precharge without row precharge command is meant by "Auto".  
Auto/self refresh can be issued only at all banks precharge state.  
4. BA0 ~ BA1 : Bank select addresses.  
If both BA0 and BA1 are "Low" at read, write, row active and precharge, bank A is selected.  
If BA0 is "High" and BA1 is "Low" at read, write, row active and precharge, bank B is selected.  
If BA0 is "Low" and BA1 is "High" at read, write, row active and precharge, bank C is selected.  
If both BA0 and BA1 are "High" at read, write, row active and precharge, bank D is selected.  
5. If A10/AP is "High" at row precharge, BA0 and BA1 are ignored and all banks are selected.  
6. During burst write with auto precharge, new read/write command can not be issued.  
Another bank read/write command can be issued after the end of burst.  
New row active of the associated bank can be issued at tRP after the end of burst.  
7. Burst stop command is valid at every burst length.  
8. DM sampled at the rising and falling edges of the DQS and Data-in are masked at the both edges (Write DM latency is 0).  
9. This combination is not defined for any function, which means "No Operation(NOP)" in DDR SDRAM.  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
17.0 Physical Dimensions  
17.1 32M x 64 (M368L3324BT(U))  
Units : Inches (Millimeters)  
5.25 ± 0.005  
(133.350 ± 0.13)  
0.118 Min  
(3.00 Min)  
5.077  
(128.950)  
1.25 ± 0.006  
±0.15)  
(31.75  
A
B
2.500 +0.1/-0.0  
0.10 M  
C
B A  
1.95  
(49.53)  
2.55  
(64.77)  
0.098 Max  
(2.47 Max)  
0.050 ± 0.0039  
(1.270 ± 0.10)  
0.118 Min  
(3.00 Min)  
0.250  
(6.350)  
0.039 ± 0.002  
(1.000 ± 0.050)  
0.0787  
R (2.00)  
0.1496  
(3.80)  
0.0078 ±0.006  
(0.20 ±0.15)  
2.175  
0.071  
(1.80)  
0.050  
(1.270)  
0.1575 ± 0.004  
(4.00 ± 0.1)  
C
Detail A  
0.10  
B
AM  
M
Detail B  
Tolerances : ± 0.005(.13) unless otherwise specified.  
The used device is 32Mx16 DDR SDRAM, TSOPII.  
DDR SDRAM Part No : K4H511638B  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
17.2 64Mx64 (M368L6523BT(U))  
Units : Inches (Millimeters)  
5.25 ± 0.005  
(133.350 ± 0.13)  
0.118 Min  
(3.00Min)  
5.077  
(128.950)  
1.25 ± 0.006  
±0.15)  
(31.75  
A
B
2.500 +0.1/-0.0  
0.10 M  
C
B A  
0.07 Max  
2.55  
1.95  
(64.77)  
(49.53)  
(1.20 Max)  
0.050 ± 0.0039  
(1.270 ± 0.10)  
0.118 Min  
(3.00Min)  
0.250  
(6.350)  
0.039 ± 0.002  
(1.000 ± 0.050)  
0.0787  
R (2.00)  
0.1496  
(3.80)  
0.0078 ± 0.006  
(0.20 ± 0.15)  
2.175  
0.071  
(1.80)  
0.050  
(1.270)  
0.1575 ± 0.004  
(4.00 ± 0.1)  
C
Detail A  
0.10  
B
AM  
M
Detail B  
Tolerances : ± 0.005(.13) unless otherwise specified.  
The used device is 64Mx8 DDR SDRAM, TSOPII.  
DDR SDRAM Part No : K4H510838B  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
17.3 64Mx72 (M381L6523BT(U))  
Units : Inches (Millimeters)  
5.25 ± 0.005  
(133.350 ± 0.13)  
0.118 Min  
(3.00 Min)  
5.077  
(128.950)  
1.25 ± 0.006  
±0.15)  
(31.75  
A
B
2.500 +0.1/-0.0  
0.10 M  
C
B A  
0.07 Max  
2.55  
1.95  
(64.77)  
(49.53)  
(1.20 Max)  
0.050 ± 0.0039  
(1.270 ± 0.10)  
0.118 Min  
(3.00 Min)  
0.250  
(6.350)  
0.039 ± 0.002  
(1.000 ± 0.050)  
0.0787  
R (2.00)  
0.1496  
(3.80)  
0.0078 ± 0.006  
(0.20 ± 0.15)  
2.175  
0.071  
(1.80)  
0.050  
(1.270)  
0.1575 ± 0.004  
(4.00 ± 0.1)  
C
Detail A  
0.10  
B
AM  
M
Detail B  
Tolerances : ± 0.005(.13) unless otherwise specified.  
The used device is 64Mx8 DDR SDRAM, TSOPII.  
DDR SDRAM Part No : K4H510838B  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
17.4 128Mx64 (M368L2923BT(U))  
Units : Inches (Millimeters)  
5.25 ± 0.005  
(133.350 ± 0.13)  
0.118 Min  
(3.00 Min)  
5.077  
(128.950)  
1.25 ± 0.006  
±0.15)  
(31.75  
A
B
2.500 +0.1/-0.0  
0.10 M  
C
B A  
2.55  
(64.77)  
0.145 Max  
(3.67 Max)  
1.95  
(49.53)  
0.050 ± 0.0039  
(1.270 ± 0.10)  
0.118 Min  
(3.00 Min)  
0.250  
(6.350)  
0.039 ± 0.002  
(1.000 ± 0.050)  
0.0787  
R (2.00)  
0.1496  
(3.80)  
0.0078 ± 0.006  
(0.20 ± 0.15)  
2.175  
0.071  
(1.80)  
0.050  
(1.270)  
0.1575 ± 0.004  
(4.00 ± 0.1)  
C
Detail A  
0.10  
B
AM  
M
Detail B  
Tolerances : ± 0.005(.13) unless otherwise specified.  
The used device is 64Mx8 DDR SDRAM, TSOPII.  
DDR SDRAM Part No : K4H510838B  
Rev. 1.1 June 2005  
256MB, 512MB, 1GB Unbuffered DIMM  
DDR SDRAM  
17.5 128Mx72 (M381L2923BT(U))  
Units : Inches (Millimeters)  
5.25 ± 0.005  
(133.350 ± 0.13)  
0.118 Min  
(3.00 Min)  
5.077  
(128.950)  
1.25 ± 0.006  
±0.15)  
(31.75  
A
B
2.500 +0.1/-0.0  
0.10 M  
C
B A  
2.55  
(64.77)  
0.145 Max  
(3.67 Max)  
1.95  
(49.53)  
0.050 ± 0.0039  
(1.270 ± 0.10)  
0.118 Min  
(3.00 Min)  
0.250  
(6.350)  
0.039 ± 0.002  
(1.000 ± 0.050)  
0.0787  
R (2.00)  
0.1496  
(3.80)  
0.0078 ± 0.006  
(0.20 ± 0.15)  
2.175  
0.071  
(1.80)  
0.050  
(1.270)  
0.1575 ± 0.004  
(4.00 ± 0.1)  
C
AM  
B
Detail A  
0.10 M  
Detail B  
Tolerances : ± 0.005(.13) unless otherwise specified.  
The used device is 64Mx8 DDR SDRAM, TSOPII.  
DDR SDRAM Part No : K4H510838B  
Rev. 1.1 June 2005  

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