D2213UK [SEME-LAB]

METAL GATE RF SILICON FET; 金属闸极射频硅场效应管
D2213UK
型号: D2213UK
厂家: SEME LAB    SEME LAB
描述:

METAL GATE RF SILICON FET
金属闸极射频硅场效应管

射频
文件: 总2页 (文件大小:23K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
TetraFET  
D2213UK  
SEME  
METAL GATE RF SILICON FET  
LAB  
MECHANICAL DATA  
GOLD METALLISED  
MULTI-PURPOSE SILICON  
DMOS RF FET  
A
K
C
B
3
2
(
2 pls  
)
1
20W – 12.5V – 1GHz  
PUSH–PULL  
E
D
5
4
G
F
4 pls  
( )  
FEATURES  
• SIMPLIFIED AMPLIFIER DESIGN  
• SUITABLE FOR BROAD BAND APPLICATIONS  
H
J
I
M
N
DK  
• VERY LOW C  
PIN 1  
PIN 3  
PIN 5  
SOURCE (COMMON) PIN 2  
DRAIN 1  
GATE 2  
rss  
DRAIN 2  
GATE 1  
PIN 4  
• SIMPLE BIAS CIRCUITS  
• LOW NOISE  
DIM  
A
B
C
D
E
mm  
6.45  
1.65R  
45°  
16.51  
6.47  
18.41  
1.52  
4.82  
24.76  
1.52  
0.81R  
0.13  
2.16  
Tol.  
Inches  
Tol.  
0.13  
0.13  
5°  
0.254  
0.065R  
45°  
0.005  
0.005  
5°  
• HIGH GAIN – 10 dB MINIMUM  
0.76  
0.13  
0.13  
0.13  
0.25  
0.13  
0.13  
0.13  
0.02  
0.13  
0.650  
0.255  
0.725  
0.060  
0.190  
0.975  
0.060  
0.032R  
0.005  
0.085  
0.03  
0.005  
0.005  
0.005  
0.010  
0.005  
0.005  
0.005  
0.001  
0.005  
F
APPLICATIONS  
G
H
I
J
K
HF/VHF/UHF COMMUNICATIONS  
from 1MHz to 2 GHz  
M
N
ABSOLUTE MAXIMUM RATINGS (T  
= 25°C unless otherwise stated)  
83W  
case  
P
Power Dissipation  
D
BV  
BV  
Drain – Source Breakdown Voltage *  
Gate – Source Breakdown Voltage *  
Drain Current *  
40V  
±20V  
DSS  
GSS  
I
8A  
D(sat)  
T
T
Storage Temperature  
–65 to 150°C  
200°C  
stg  
Maximum Operating Junction Temperature  
j
* Per Side  
Prelim. 2/96  
Semelab plc. Telephone (01455) 556565. Telex: 341927. Fax (01455) 552612.  
D2213UK  
SEME  
LAB  
ELECTRICAL CHARACTERISTICS (T  
= 25°C unless otherwise stated)  
Test Conditions  
PER SIDE  
case  
Parameter  
Min.  
Typ.  
Max. Unit  
Drain–Source  
BV  
V
= 0  
I = 10mA  
40  
V
DSS  
GS  
D
Breakdown Voltage  
Zero Gate Voltage  
I
V
V
= 12.5V  
= 20V  
V
= 0  
4
mA  
DSS  
DS  
GS  
GS  
Drain Current  
I
Gate Leakage Current  
V
V
= 0  
= V  
4
7
µA  
V
GSS  
DS  
DS  
V
g
Gate Threshold Voltage *  
Forward Transconductance *  
I = 10mA  
0.5  
GS(th)  
D
GS  
V
= 10V  
I = 0.8A  
0.72  
S
fs  
DS  
D
TOTAL DEVICE  
G
Common Source Power Gain  
Drain Efficiency  
P
V
= 20W  
10  
40  
dB  
%
PS  
O
η
= 12.5V  
I
= 0.8A  
DQ  
DS  
VSWR Load Mismatch Tolerance  
f = 1GHz  
20:1  
PER SIDE  
C
C
C
Input Capacitance  
V
V
V
= 0  
V
= –5V f = 1MHz  
48  
40  
4
pF  
pF  
pF  
iss  
DS  
DS  
DS  
GS  
GS  
GS  
Output Capacitance  
= 12.5V V  
= 12.5V V  
= 0  
= 0  
f = 1MHz  
f = 1MHz  
oss  
rss  
Reverse Transfer Capacitance  
* Pulse Test:  
Pulse Duration = 300 µs , Duty Cycle 2%  
HAZARDOUS MATERIAL WARNING  
The ceramic portion of the device between leads and metal flange is beryllium oxide. Beryllium oxide dust is highly  
toxic and care must be taken during handling and mounting to avoid damage to this area.  
THESE DEVICES MUST NEVER BE THROWN AWAY WITH GENERAL INDUSTRIAL OR DOMESTIC WASTE.  
THERMAL DATA  
R
Thermal Resistance Junction – Case  
Max. 2.1°C / W  
THj–case  
Prelim. 2/96  
Semelab plc. Telephone (01455) 556565. Telex: 341927. Fax (01455) 552612.  

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