S-5840BAH-M5T1G [SII]
TEMPERATURE SWITCH IC WITH LATCH; 温度开关IC与LATCH
| 型号： | S-5840BAH-M5T1G |
| 厂家： | 
SEIKO INSTRUMENTS INC |
| 描述： | TEMPERATURE SWITCH IC WITH LATCH |
| 文件： | 总13页 (文件大小：374K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Rev.1.2_00
TEMPERATURE SWITCH IC WITH LATCH
S-5840B Series
The temperature switch IC S-5840B Series with a latch function detects
temperature with the accuracy of 2.5°C. When the temperature reaches
the detection temperature, the output signal is inverted and being latched
until this IC detects decrease in a power supply voltage.
The minimum power supply voltage is 1.0 V which is required to operate
this IC, the current consumption is as low as 12 µA (typ.) due to CMOS
configuration. The S-5840B Series has a temperature sensor using
negative temperature coefficient, a reference voltage source, comparator,
voltage detection circuit and noise suppression circuit on a chip, and they
are enclosed in package SOT-23-5.
Since the temperature range of this IC is −40 to +100°C, it is possible to
achieve the extensive application for temperature control.
Features
•
•
•
•
•
•
•
•
•
•
Detection temperature :
+55 to +95°C, 1°C step, detection accuracy : 2.5°C
Wide voltage range during operation : VDD = 1.0 to 10.0 V
Release voltage :
2.2 to 3.4 V, 0.1 V step
12 µA typ. (+25°C)
Low current consumption :
Built-in circuit for preventing temperature detection malfunction
Output logic level is fixed by the latch after temperature detection
Output logic active high or active low is selectable
Output CMOS or Nch open drain is selectable
Package :
Lead-free product
SOT-23-5
Applications
•
•
Game consoles
Electronic devices
Package
Drawing Code
Tape
MP005-A
Package Name
SOT-23-5
Package
MP005-A
Reel
MP005-A
Seiko Instruments Inc.
1
TEMPERATURE SWITCH IC WITH LATCH
S-5840B Series
Rev.1.2_00
Block Diagram
1. S-5840B with CMOS output
VDD
Temperature
Sensor
+
-
CD
VREF
Reference
Voltage
Source
DET
Q
D-F/F
D
CK
R
Voltage
Detector
RT
VSS
Figure 1
2. S-5840B with Nch open drain output
VDD
Temperature
Sensor
+
-
CD
VREF
Reference
Voltage
Source
DET
Q
D
D-F/F
CK
R
Voltage
Detector
RT
VSS
Figure 2
2
Seiko Instruments Inc.
TEMPERATURE SWITCH IC WITH LATCH
S-5840B Series
Rev.1.2_00
Product Name Structure
1. Product name
S-5840B xx
-
M5T1
G
Package abbreviation and IC packing specifications*1
M5T1 : SOT-23-5, tape
Option code*2
*1. Refer to the taping specifications at the end of this booklet.
*2. Option list
•
•
•
•
Detection temperature (TDET) is selectable in 1°C step in the range of 55 to 95°C.
DET output is selectable in active high or active low.
DET output is selectable in CMOS or Nch open drain.
Release voltage (VRET) is selectable in 0.1 V step in the range of 2.2 to 3.4 V.
2. Product name list
Table 1
Output form
Product name
Detection temperature
(TDET
Output logic
Release voltage (VRET)
)
S-5840BAG-M5T1G
S-5840BAH-M5T1G
S-5840BAJ-M5T1G
60°C
90°C
80°C
CMOS
CMOS
Nch open drain
Active low
Active high
Active low
2.9 V
2.9 V
2.2 V
Remark Please contact our sales office for options other than that specified above.
Seiko Instruments Inc.
3
TEMPERATURE SWITCH IC WITH LATCH
S-5840B Series
Rev.1.2_00
Pin Configuration
Table 2
SOT-23-5
Top view
Pin No.
Symbol
RT *1
VSS
Description
5
4
1
2
Test pin
GND pin
Capacitor connection pin for setting
malfunction prevention time
Output pin
3
CD
4
5
DET
VDD
Power supply pin
*1. Set the RT pin open in use.
1
2
3
Figure 3
Remark See Dimensions for details of the package drawings.
Absolute Maximum Ratings
Table 3
(Ta = 25°C unless otherwise specified)
Parameter
Power supply voltage (VSS = 0 V)
Pin voltage
Symbol
Rating
Unit
V
V
V
V
VDD
VSS + 12
VRT, VCD
V
V
V
SS − 0.3 to VDD + 0.3
SS − 0.3 to VDD + 0.3
SS − 0.3 to VSS + 12.0
CMOS output
Output voltage
VDET
Nch open drain output
300 (When not mounted on board)
mW
mW
°C
°C
Power dissipation
PD
600*1
Operating temperature
Storage temperature
Topr
Tstg
−40 to +100
−55 to +125
*1. When mounted on board
[Mounted board]
(1) Board size :
114.3 mm × 76.2 mm × t1.6 mm
(2) Board name : JEDEC STANDARD51-7
Caution The absolute maximum ratings are rated values exceeding which the product could suffer physical
damage. These values must therefore not be exceeded under any conditions.
Recommended Values for External Parts
Table 4
Parameter
CD capacitance
Symbol
CD
Value
4.7
Unit
nF
4
Seiko Instruments Inc.
TEMPERATURE SWITCH IC WITH LATCH
S-5840B Series
Rev.1.2_00
DC Electrical Characteristics
1. Product with CMOS output
Table 5
(Ta = 25°C, unless otherwise specified)
Parameter
Power supply voltage
Detection temperature
Symbol
VDD
TD
Conditions
Min.
1.0
DET − 2.5
Typ.
−
TDET
Max.
10.0
DET + 2.5
Unit
V
°C
−
−
T
T
V
DD = 3.5 V,
IDETH
IDETL
VDET = 2.7 V
DET = 0.4 V
2
9.4
2.8
−
mA
mA
Output current
Apply for DET
pin
V
0.5
−
Release voltage for
VRET
×
0.98
VRET ×
VR
−
−
VRET
V
V
built-in voltage detector
Hysteresis width for
built-in voltage detector
1.02
VRET
×
VHYS
−
−
0.05
Temperature
coefficient for built-in
voltage detector
∆VRET
∆Ta• VRET
ppm/
°C
Ta = −40 to +100°C
−
−
100
12
−
Operating current
IDD
VDD = 3.5 V
24
µA
2. Product with Nch open drain output
Table 6
Conditions
(Ta = 25°C, unless otherwise specified)
Parameter
Power supply voltage
Detection temperature
Symbol
VDD
Min.
1.0
DET − 2.5
Typ.
−
TDET
2.8
Max.
10.0
DET + 2.5
Unit
V
°C
−
−
TD
T
T
IDETL
VDET = 0.4 V, VDD = 3.5 V
0.5
−
mA
Output current
ILEAK
VDET = 10.0 V, VDD = 3.5 V
−
−
100
nA
Release voltage for
built-in voltage detector
VRET
×
0.98
VRET ×
1.02
VR
−
VRET
V
Hysteresis width for
built-in voltage detector
VRET
×
0.05
VHYS
−
−
−
V
Temperature
coefficient for built-in
voltage detector
∆VRET
∆Ta• VRET
ppm/
°C
Ta = −40 to +100°C
−
−
100
12
−
Operating current
IDD
VDD = 3.5 V
24
µA
AC Electrical Characteristics
Table 7
Parameter
Noise filtering time
Symbol
tnoise
Conditions
CD = 4.7 nF, VDD = 3.5 V,
Ta = detection temperature
Min.
10
Typ.
30
Max.
50
Unit
ms
Seiko Instruments Inc.
5
TEMPERATURE SWITCH IC WITH LATCH
S-5840B Series
Rev.1.2_00
Operation
Basic operation
The S-5840B Series is a temperature switch IC which detects the temperature and sends a signal to an external device.
The users can select a combination of the parameters such as detection temperature and release voltage.
The following explains the case when DET output is assumed to be active high.
When the power supply voltage is turned on, the DET pin voltage goes to low since the flip-flop circuit in the detection
circuit is cleared by the voltage detection circuit. Temperature detection then starts and the DET pin is held low as long
as the temperature is lower than the detection temperature. When the temperature rises and when the temperature
exceeds the detection temperature; longer than the time defined by the capacitor connected to the CD pin, the DET pin
goes to high. Once the over-temperature is detected and the DET pin goes to high, the state is held by the flip-flop
circuit. In order to release the state, the power supply voltage should be set under the detection voltage (VR − VHYS) of
the built-in voltage detector circuit to reset the internal circuit.
Using the internal reference voltage and built-in temperature sensor, a detection temperature accuracy of 2.5°C is
achieved in the IC.
[Noise filtering circuit]
The noise filtering circuit prevents malfunction of the temperature switch caused by noise.
The noise filtering circuit starts charging the capacitor connected to the CD pin when the output of the internal
comparator enters the active state due to an external noise or a rapid change in the power supply voltage. In the
normal operation, the flip-flop circuit is set when the capacitor is charged to a certain voltage. But in the noise
triggered operation, the comparator output goes back to the inactive state and the CD pin voltage is held low since the
charging of the capacitor is insufficient. As a result, the DET pin is held low and malfunction does not occur.
Noise filtering time (tnoise) is determined by the time constant consisting of internal constant current and the
capacitance (CD), and calculated by the following equation.
t
noise (ms) = Noise filtering time coefficient × CD (nF)
Noise filtering time coefficient (25°C) : Typ. 6.4
Capacitance of the external capacitor CD has no limitation as long as its leak current is negligible compared to the
internal constant current. The difference occurs in delay time if the capacitor has a leak current.
6
Seiko Instruments Inc.
TEMPERATURE SWITCH IC WITH LATCH
S-5840B Series
Rev.1.2_00
Application Circuit
R *1
100 kΩ
Open
RT
VDD
Protection
Circuit
S-5840B Series
DET
VSS
CIN
CD
CD
CL
*1. Connecting a resistor (R) is unnecessary for the product with CMOS output.
Figure 4
Caution The above connection diagram will not guarantee successful operation.
evaluation using actual application to set the constant.
Perform thorough
Precautions
• Set a capacitor (CIN) of about 0.1 µF between VDD and VSS for stabilization.
• A capacitor (CL) of about 1 µF should be connected to the DET pin to prevent malfunction caused by noise due to the
power being on.
• Do not connect a capacitor to the RT pin (leave the RT pin open). Otherwise, this IC may oscillate.
• Do not apply an electrostatic discharge to this IC that exceeds the performance ratings of the built-in electrostatic
protection circuit.
• SII claims no responsibility for any disputes arising out of or in connection with any infringement by products, including
this IC, of patents owned by a third party.
Seiko Instruments Inc.
7
TEMPERATURE SWITCH IC WITH LATCH
S-5840B Series
Rev.1.2_00
Characteristics (Typical Data)
1. Current consumption vs. Power supply voltage characteristics
VSS = 0 V
13
12
100°C
25°C
−40°C
11
10
9
0
1 2 3 4 5 6 7 8 9 10 11 12
V
DD [V]
2. DET pin current H vs. Power supply voltage characteristics (product with CMOS output)
V
DET = VDD − 0.8 V
25
20
15
10
5
25°C
−40°C
100°C
0
0
1
2
3
4
5
6 7 8 9 10 11 12
V
DD [V]
3. DET pin current L vs. Power supply voltage characteristics
VDET = 0.4 V
10
8
25°C
−40°C
6
4
100°C
2
0
0
1
2
3
4
5
6
7
8
9 10 11 12
V
DD [V]
4. Noise filtering time vs. Power supply voltage characteristics
= 4.7 nF
C
D
50
45
40
35
30
25
20
15
10
−40°C
25°C
100°C
0
1 2 3 4 5 6 7 8 9 10 11 12
V
DD [V]
8
Seiko Instruments Inc.
TEMPERATURE SWITCH IC WITH LATCH
S-5840B Series
Rev.1.2_00
Marking Specification
SOT-23-5
SOT-23-5
Top view
(1) to (3) :
(4) :
Product code (refer to Product name vs. Product code)
Lot number
5
4
(1) (2) (3) (4)
1
2
3
Product name vs. Product code
Product Code
Product Name
(1)
H
(2)
8
8
(3)
M
N
S-5840BAG-M5T1G
S-5840BAH-M5T1G
S-5840BAJ-M5T1G
H
H
8
O
Seiko Instruments Inc.
9
2.9±0.2
1.9±0.2
4
5
+0.1
-0.06
1
2
3
0.16
0.95±0.1
0.4±0.1
No. MP005-A-P-SD-1.2
TITLE
SOT235-A-PKG Dimensions
MP005-A-P-SD-1.2
No.
SCALE
UNIT
mm
Seiko Instruments Inc.
4.0±0.1(10 pitches:40.0±0.2)
+0.1
-0
2.0±0.05
0.25±0.1
ø1.5
+0.2
-0
4.0±0.1
ø1.0
1.4±0.2
3.2±0.2
3
4
2 1
5
Feed direction
No. MP005-A-C-SD-2.1
TITLE
SOT235-A-Carrier Tape
MP005-A-C-SD-2.1
No.
SCALE
UNIT
mm
Seiko Instruments Inc.
12.5max.
9.0±0.3
Enlarged drawing in the central part
ø13±0.2
(60°)
(60°)
No. MP005-A-R-SD-1.1
TITLE
SOT235-A-Reel
MP005-A-R-SD-1.1
No.
SCALE
UNIT
QTY.
3,000
mm
Seiko Instruments Inc.
·
·
The information described herein is subject to change without notice.
Seiko Instruments Inc. is not responsible for any problems caused by circuits or diagrams described herein
whose related industrial properties, patents, or other rights belong to third parties. The application circuit
examples explain typical applications of the products, and do not guarantee the success of any specific
mass-production design.
·
·
·
When the products described herein are regulated products subject to the Wassenaar Arrangement or other
agreements, they may not be exported without authorization from the appropriate governmental authority.
Use of the information described herein for other purposes and/or reproduction or copying without the
express permission of Seiko Instruments Inc. is strictly prohibited.
The products described herein cannot be used as part of any device or equipment affecting the human
body, such as exercise equipment, medical equipment, security systems, gas equipment, or any apparatus
installed in airplanes and other vehicles, without prior written permission of Seiko Instruments Inc.
Although Seiko Instruments Inc. exerts the greatest possible effort to ensure high quality and reliability, the
failure or malfunction of semiconductor products may occur. The user of these products should therefore
give thorough consideration to safety design, including redundancy, fire-prevention measures, and
malfunction prevention, to prevent any accidents, fires, or community damage that may ensue.
·
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