550VH1134M000DG [SILICON]

Oscillator, 10MHz Min, 1417MHz Max, 1134MHz Nom;
550VH1134M000DG
型号: 550VH1134M000DG
厂家: SILICON    SILICON
描述:

Oscillator, 10MHz Min, 1417MHz Max, 1134MHz Nom

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中文:  中文翻译
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Si550  
REVISION D  
VOLTAGE-CONTROLLED CRYSTAL OSCILLATOR (VCXO)  
10 MHZ TO 1.4 GHZ  
Features  
Available with any-rate output Internal fixed crystal frequency  
Si5602  
frequencies from 10 to 945 MHz  
and selected frequencies to  
1.4 GHz  
ensures high reliability and low  
aging  
Available CMOS, LVPECL,  
LVDS, and CML outputs  
3.3, 2.5, and 1.8 V supply options  
Industry-standard 5 x 7 mm  
package and pinout  
®
3rd generation DSPLL with  
superior jitter performance  
3x better frequency stability than  
SAW-based oscillators  
Lead-free/RoHS-compliant  
Ordering Information:  
Applications  
See page 8.  
SONET/SDH  
xDSL  
10 GbE LAN/WAN  
Low-jitter clock generation  
Optical modules  
Clock and data recovery  
Pin Assignments:  
See page 7.  
Description  
(Top View)  
®
The Si550 VCXO utilizes Silicon Laboratories’ advanced DSPLL circuitry to  
provide a low-jitter clock at high frequencies. The Si550 is available with  
any-rate output frequency from 10 to 945 MHz and selected frequencies to  
1400 MHz. Unlike traditional VCXOs, where a different crystal is required for  
each output frequency, the Si550 uses one fixed crystal to provide a wide  
range of output frequencies. This IC-based approach allows the crystal  
resonator to provide exceptional frequency stability and reliability. In  
addition, DSPLL clock synthesis provides superior supply noise rejection,  
simplifying the task of generating low-jitter clocks in noisy environments  
typically found in communication systems. The Si550 IC-based VCXO is  
factory-configurable for a wide variety of user specifications, including  
frequency, supply voltage, output format, tuning slope, and temperature  
stability. Specific configurations are factory programmed at time of shipment,  
thereby eliminating the long lead times associated with custom oscillators.  
VC  
VDD  
1
2
3
6
5
4
OE  
CLK–  
CLK+  
GND  
Functional Block Diagram  
CLK– CLK+  
VDD  
Any-rate  
10-1400 MHz  
DSPLL®  
Fixed  
Frequency  
XO  
Clock Synthesis  
ADC  
Vc  
OE  
GND  
Rev. 0.6 6/07  
Copyright © 2007 by Silicon Laboratories  
Si550  
Si550  
1. Electrical Specifications  
Table 1. Recommended Operating Conditions  
Parameter  
Symbol  
Test Condition  
3.3 V option  
2.5 V option  
1.8 V option  
Min  
2.97  
2.25  
1.71  
Typ  
3.3  
2.5  
1.8  
Max  
3.63  
2.75  
1.89  
Units  
1
V
DD  
Supply Voltage  
V
Supply Current  
I
Output enabled  
LVPECL  
CML  
DD  
130  
117  
108  
98  
120  
108  
99  
mA  
LVDS  
CMOS  
90  
tristate mode  
0.75 x V  
60  
75  
2
Output Enable (OE)  
V
IH  
DD  
V
V
0.5  
85  
IL  
Operating Temperature Range  
T
–40  
°C  
A
Notes:  
1. Selectable parameter specified by part number. See 3. "Ordering Information" on page 8 for further details.  
2. OE pin includes a 17 kresistor to VDD  
.
Table 2. VC Control Voltage Input  
Parameter  
Symbol  
Test Condition  
Min  
Typ  
Max  
Units  
1,2,3  
Control Voltage Tuning Slope  
K
10 to 90% of V  
33  
45  
ppm/V  
V
DD  
90  
135  
180  
356  
4
Control Voltage Linearity  
L
BSL  
–5  
–10  
9.3  
500  
±1  
±5  
+5  
+10  
10.7  
VC  
%
Incremental  
Modulation Bandwidth  
BW  
10.0  
kHz  
k  
V
V Input Impedance  
Z
C
VC  
Nominal Control Voltage  
V
@ f  
V /2  
DD  
CNOM  
O
Control Voltage Tuning Range  
V
0
V
V
C
DD  
Notes:  
1. Positive slope; selectable option by part number. See 3. "Ordering Information" on page 8.  
2. For best jitter and phase noise performance, always choose the smallest KV that meets the application’s minimum APR  
requirements. See “AN266: VCXO Tuning Slope (KV), Stability, and Absolute Pull Range (APR)” for more information.  
3. KV variation is ±10% of typical values.  
4. BSL determined from deviation from best straight line fit with VC ranging from 10 to 90% of VDD. Incremental slope  
determined with VC ranging from 10 to 90% of VDD  
.
2
Rev. 0.6  
Si550  
Table 3. CLK± Output Frequency Characteristics  
Parameter  
Symbol  
Test Condition  
LVDS/CML/LVPECL  
CMOS  
Min  
10  
Typ  
Max  
Units  
1,2,3  
f
945  
160  
O
Nominal Frequency  
MHz  
10  
1,4  
Temperature Stability  
T = –40 to +85 ºC  
–20  
–50  
–100  
+20  
+50  
+100  
A
ppm  
1,4  
Absolute Pull Range  
Aging  
APR  
tOSC  
±25  
±375  
±3  
ppm  
ppm  
ms  
Frequency drift over first year.  
Frequency drift over 15 year life.  
±10  
10  
5
Power up Time  
Notes:  
1. See Section 3. "Ordering Information" on page 8 for further details.  
2. Specified at time of order by part number. Also available in frequencies from 970 to 1134 MHz and 1213 to 1417 MHz.  
3. Nominal output frequency set by VCNOM = VDD/2.  
4. Selectable parameter specified by part number.  
5. Time from power up or tristate mode to fO.  
Table 4. CLK± Output Levels and Symmetry  
Parameter  
Symbol  
Test Condition  
mid-level  
Min  
VDD – 1.42  
1.1  
Typ  
Max  
VDD – 1.25  
1.9  
Units  
V
1
LVPECL Output Option  
V
O
VOD  
VSE  
swing (diff)  
VPP  
VPP  
swing (single-ended)  
mid-level  
0.55  
0.95  
2
LVDS Output Option  
V
1.125  
0.5  
1.20  
0.7  
1.275  
0.9  
V
O
swing (diff)  
VOD  
VPP  
2
VO  
CML Output Option  
mid-level  
0.70  
0.8 x VDD  
V
– 0.75  
1.20  
VDD  
0.4  
V
DD  
VOD  
VOH  
VOL  
swing (diff)  
0.95  
VPP  
3
CMOS Output Option  
I
= 32 mA  
OH  
V
IOL = 32 mA  
Rise/Fall time (20/80%)  
Symmetry (duty cycle)  
tR, F  
t
LVPECL/LVDS/CML  
350  
ps  
ns  
CMOS with C = 15 pF  
1
L
SYM  
LVPECL:  
LVDS:  
CMOS:  
V
– 1.3 V (diff)  
DD  
1.25 V (diff)  
/2  
45  
55  
%
V
DD  
Notes:  
1. 50 to VDD – 2.0 V.  
2. Rterm = 100 (differential).  
3. CL = 15 pF  
Rev. 0.6  
3
Si550  
Table 5. CLK± Output Phase Jitter  
Parameter  
Symbol  
Test Condition  
Kv = 33 ppm/V  
Min  
Typ  
Max  
Units  
1,2,3  
Phase Jitter (RMS)  
for F > 500 MHz  
φJ  
ps  
12 kHz to 20 MHz (OC-48)  
50 kHz to 80 MHz (OC-192)  
0.26  
0.26  
OUT  
Kv = 45 ppm/V  
12 kHz to 20 MHz (OC-48)  
50 kHz to 80 MHz (OC-192)  
0.27  
0.26  
Kv = 90 ppm/V  
12 kHz to 20 MHz (OC-48)  
50 kHz to 80 MHz (OC-192)  
0.32  
0.26  
Kv = 135 ppm/V  
12 kHz to 20 MHz (OC-48)  
50 kHz to 80 MHz (OC-192)  
0.40  
0.27  
Kv = 180 ppm/V  
12 kHz to 20 MHz (OC-48)  
50 kHz to 80 MHz (OC-192)  
0.49  
0.28  
Kv = 356 ppm/V  
12 kHz to 20 MHz (OC-48)  
50 kHz to 80 MHz (OC-192)  
0.87  
0.33  
Notes:  
1. Differential Modes: LVPECL/LVDS/CML. Refer to AN255, AN256, and AN266 for further information.  
2. For best jitter and phase noise performance, always choose the smallest KV that meets the application’s minimum APR  
requirements. See “AN266: VCXO Tuning Slope (KV), Stability, and Absolute Pull Range (APR)” for more information.  
3. See “AN255: Replacing 622 MHz VCSO devices with the Si550 VCXO” for comparison highlighting power supply  
rejection (PSR) advantage of Si55x versus SAW-based solutions.  
4
Rev. 0.6  
Si550  
Table 5. CLK± Output Phase Jitter (Continued)  
Parameter  
Symbol  
Test Condition  
Kv = 33 ppm/V  
Min  
Typ  
Max  
Units  
1,2,3  
Phase Jitter (RMS)  
for F of 125 to 500 MHz  
φJ  
ps  
12 kHz to 20 MHz (OC-48)  
50 kHz to 80 MHz (OC-192)  
0.37  
0.33  
OUT  
Kv = 45 ppm/V  
12 kHz to 20 MHz (OC-48)  
50 kHz to 80 MHz (OC-192)  
0.37  
0.33  
Kv = 90 ppm/V  
12 kHz to 20 MHz (OC-48)  
50 kHz to 80 MHz (OC-192)  
0.43  
0.34  
Kv = 135 ppm/V  
12 kHz to 20 MHz (OC-48)  
50 kHz to 80 MHz (OC-192)  
0.50  
0.34  
Kv = 180 ppm/V  
12 kHz to 20 MHz (OC-48)  
50 kHz to 80 MHz (OC-192)  
0.59  
0.35  
Kv = 356 ppm/V  
12 kHz to 20 MHz (OC-48)  
50 kHz to 80 MHz (OC-192)  
1.00  
0.39  
Notes:  
1. Differential Modes: LVPECL/LVDS/CML. Refer to AN255, AN256, and AN266 for further information.  
2. For best jitter and phase noise performance, always choose the smallest KV that meets the application’s minimum APR  
requirements. See “AN266: VCXO Tuning Slope (KV), Stability, and Absolute Pull Range (APR)” for more information.  
3. See “AN255: Replacing 622 MHz VCSO devices with the Si550 VCXO” for comparison highlighting power supply  
rejection (PSR) advantage of Si55x versus SAW-based solutions.  
Table 6. CLK± Output Period Jitter  
Parameter  
Period Jitter*  
Symbol  
Test Condition  
RMS  
Min  
Typ  
2
Max  
Units  
J
ps  
PER  
Peak-to-Peak  
14  
*Note: Any output mode, including CMOS, LVPECL, LVDS, CML. N = 1000 cycles. Refer to AN279 for further information.  
Rev. 0.6  
5
Si550  
Table 7. CLK± Output Phase Noise (Typical)  
Offset Frequency  
74.25 MHz  
90 ppm/V  
LVPECL  
491.52 MHz  
45 ppm/V  
LVPECL  
622.08 MHz  
135 ppm/V  
LVPECL  
Units  
100 Hz  
1 kHz  
10 kHz  
100 kHz  
1 MHz  
–87  
–114  
–132  
–142  
–148  
–150  
n/a  
–75  
–65  
–90  
–100  
–116  
–124  
–135  
–146  
–147  
–109  
–121  
–134  
–146  
–147  
dBc/Hz  
10 MHz  
100 MHz  
Table 8. Absolute Maximum Ratings1  
Parameter  
Maximum Operating Temperature  
Supply Voltage  
Symbol  
Rating  
Units  
T
85  
ºC  
Volts  
Volts  
ºC  
AMAX  
V
–0.5 to +3.8  
DD  
Input Voltage  
V
–0.5 to V + 0.3  
I
DD  
Storage Temperature  
T
–55 to +125  
2500  
S
ESD Sensitivity (HBM, per JESD22-A114)  
ESD  
Volts  
ºC  
2
Soldering Temperature (Pb-free profile)  
T
260  
PEAK  
2
Soldering Temperature Time @ T  
(Pb-free profile)  
t
20–40  
seconds  
PEAK  
P
Notes:  
1. Stresses beyond those listed in Absolute Maximum Ratings may cause permanent damage to the device. Functional  
operation or specification compliance is not implied at these conditions. Exposure to maximum rating conditions for  
extended periods may affect device reliability.  
2. The device is compliant with JEDEC J-STD-020C. Refer to Si5xx Packaging FAQ available for download from  
www.silabs.com/VCXO for further information, including soldering profiles.  
Table 9. Environmental Compliance  
The Si550 meets the following qualification test requirements.  
Parameter  
Conditions/Test Method  
MIL-STD-883F, Method 2002.3 B  
MIL-STD-883F, Method 2007.3 A  
MIL-STD-883F, Method 203.8  
MIL-STD-883F, Method 1014.7  
MIL-STD-883F, Method 2016  
Mechanical Shock  
Mechanical Vibration  
Solderability  
Gross & Fine Leak  
Resistance to Solvents  
6
Rev. 0.6  
Si550  
2. Pin Descriptions  
(Top View)  
VC  
VDD  
1
2
3
6
5
4
OE  
CLK–  
CLK+  
GND  
Table 10. Si550 Pin Descriptions  
Type  
Pin  
Name  
Function  
1
V
Analog Input  
Control Voltage  
C
Output Enable (Polarity = High):  
0 = clock output disabled (outputs tri-stated)  
1 = clock output enabled  
2
OE*  
Input  
3
4
GND  
Ground  
Output  
Output  
Electrical and Case Ground  
Oscillator Output  
CLK+  
CLK–  
(N/A for CMOS)  
Complementary Output  
(N/C for CMOS)  
5
6
V
Power  
Power Supply Voltage  
DD  
*Note: OE includes 17 kpullup resistor to VDD. See Section 3. "Ordering Information" on page 8 for details on OE polarity  
ordering options.  
Rev. 0.6  
7
Si550  
3. Ordering Information  
The Si550 supports a variety of options including frequency, temperature stability, tuning slope, output format, and  
V
.
Specific device configurations are programmed into the Si550 at time of shipment. Configurations are  
DD  
specified using the Part Number Configuration chart shown below. Silicon Labs provides a web browser-based part  
number configuration utility to simplify this process. Refer to www.silabs.com/VCXOPartNumber to access this tool  
and for further ordering instructions. The Si550 VCXO series is supplied in an industry-standard, RoHS compliant,  
lead-free, 6-pad, 5 x 7 mm package. Tape and reel packaging is an ordering option.  
X
X
D
G
R
550  
XXXMXXX  
R = Tape & Reel  
Blank = Trays  
550 VCXO  
Product Family  
Operating Temp Range (°C)  
–40 to +85 °C  
G
Device Revision Letter  
Frequency (e.g. 622M080 is 622.080 MHz)  
Available frequency range is 10 to 945 MHz, 970 to 1134, and 1213 to  
1417 MHz. The position of “M” shifts to denote higher or lower  
frequencies. If the frequency of interest requires greater than 6 digit  
resolution, a six digit code will be assigned for the specific frequency.  
1st Option Code  
VDD Output Format Output Enable Polarity  
2nd Option Code  
Temperature  
Stability  
± ppm (max)  
Tuning Slope  
Minimum APR  
A
B
C
D
E
F
G
H
J
K
M
N
P
Q
R
S
T
3.3 LVPECL  
3.3 LVDS  
3.3 CMOS  
3.3 CML  
2.5 LVPECL  
2.5 LVDS  
2.5 CMOS  
2.5 CML  
1.8 CMOS  
1.8 CML  
3.3 LVPECL  
3.3 LVDS  
3.3 CMOS  
3.3 CML  
2.5 LVPECL  
2.5 LVDS  
2.5 CMOS  
2.5 CML  
1.8 CMOS  
1.8 CML  
High  
High  
High  
High  
High  
High  
High  
High  
High  
High  
Low  
Low  
Low  
Low  
Low  
Low  
Low  
Low  
Low  
Low  
Kv  
ppm/V (typ)  
180  
(±ppm) for VDD @  
Code  
A
B
C
D
E
F
G
H
J
K
M
3.3 V  
100  
30  
2.5 V  
75  
Note 6  
125  
30  
Note 6  
75  
300  
145  
104  
220  
1.8 V  
25  
Note 6  
75  
25  
Note 6  
50  
235  
105  
70  
155  
100  
100  
50  
50  
20  
50  
20  
20  
20  
90  
180  
90  
45  
135  
356  
180  
135  
150  
80  
25  
100  
375  
185  
130  
295  
12  
100  
20  
356  
33  
Note 6  
Note 6  
Notes:  
1. For best jitter and phase noise performance, always choose the smallest Kv that meets  
the application’s minimum APR requirements. Unlike SAW-based solutions which  
require higher higher Kv values to account for their higher temperature dependence,  
the Si55x series provides lower Kv options to minimize noise coupling and jitter in real-  
world PLL designs. See AN255 and AN266 for more information.  
2. APR is the ability of a VCXO to track a signal over the product lifetime. A VCXO with an  
APR of ±25 ppm is able to lock to a clock with a ±25 ppm stability over 15 years over all  
operating conditions.  
U
V
W
Note:  
CMOS available to 160 MHz.  
3. Nominal Pull range (±) = 0.5 x VDD x tuning slope.  
4. Nominal Absolute Pull Range (±APR) = Pull range – stability – lifetime aging  
=0.5 x VDD x tuning slope – stability – 10 ppm  
5. Minimum APR values noted above include worst case values for all parameters.  
6. Combination not available.  
Example Part Number: 550AF622M080DGR is a 5 x 7 mm VCXO in a 6 pad package. The nominal frequency is 622.080 MHz, with a 3.3 V supply,  
LVPECL output, and Output Enable active high polarity. Temperature stability is specified as ±50 ppm and the tuning slope is 135 ppm/V. The part  
is specified for a –40 to +85 C° ambient temperature range operation and is shipped in tape and reel format.  
Figure 1. Part Number Convention  
8
Rev. 0.6  
Si550  
4. Si55x Mark Specification  
Figure 2 illustrates the mark specification for the Si550. Table 11 lists the line information.  
6
4
5
SiLabs 123  
1 2 3 4 5 6 7 8 9 0  
R T T T T Y W W +  
1
2
3
Figure 2. Mark Specification  
Table 11. Si55x Top Mark Description  
Description  
Line  
Position  
1–10  
1
2
“SiLabs”+ Part Family Number, 5xx (First 3 characters in part number)  
1–10  
Si550: Option1+Option2+Freq(7)+Temp  
Si552, Si554, Si550 w/ 8-digit resolution: Option1+Option2+ConfigNum(6)+Temp  
3
Trace Code  
Position 1  
Pin 1 orientation mark (dot)  
Product Revision (D)  
Position 2  
Tiny Trace Code (4 alphanumeric characters per assembly release instructions)  
Year (least significant year digit), to be assigned by assembly site (ex: 2007 = 7)  
Calendar Work Week number (1–53), to be assigned by assembly site  
“+” to indicate Pb-Free and RoHS-compliant  
Position 3–6  
Position 7  
Position 8–9  
Position 10  
Rev. 0.6  
9
Si550  
5. Outline Diagram and Suggested Pad Layout  
Figure 3 illustrates the package details for the Si550. Table 12 lists the values for the dimensions shown in the  
illustration.  
Figure 3. Si550 Outline Diagram  
Table 12. Package Diagram Dimensions (mm)  
Dimension  
Min  
1.45  
1.2  
Nom  
1.65  
Max  
1.85  
1.6  
A
b
1.4  
c
0.60 TYP.  
7.00 BSC.  
6.2  
D
D1  
e
6.10  
6.30  
2.54 BSC.  
5.00 BSC.  
4.40  
E
E1  
L
4.30  
1.07  
4.50  
1.47  
1.27  
S
1.815 BSC.  
0.7 REF.  
R
aaa  
bbb  
ccc  
ddd  
0.15  
0.15  
0.10  
0.10  
10  
Rev. 0.6  
Si550  
6. 6-Pin PCB Land Pattern  
Figure 4 illustrates the 6-pin PCB land pattern for the Si550. Table 13 lists the values for the dimensions shown in  
the illustration.  
Figure 4. Si550 PCB Land Pattern  
Table 13. PCB Land Pattern Dimensions (mm)  
Dimension  
Min  
Max  
D2  
e
5.08 REF  
2.54 BSC  
4.15 REF  
E2  
GD  
GE  
VD  
VE  
X
0.84  
2.00  
8.20 REF  
7.30 REF  
1.70 TYP  
2.15 REF  
Y
ZD  
ZE  
6.78  
6.30  
Notes:  
1. Dimensioning and tolerancing per the ANSI Y14.5M-1994 specification.  
2. Land pattern design based on IPC-7351 guidelines.  
3. All dimensions shown are at maximum material condition (MMC).  
4. Controlling dimension is in millimeters (mm).  
Rev. 0.6  
11  
Si550  
DOCUMENT CHANGE LIST  
Revision 0.3 to Revision 0.4  
Updated Table 1, “Recommended Operating  
Conditions,” on page 2.  
Added maximum supply current specifications.  
Specified relationship between temperature at startup  
and operation temperature.  
Added Output Enable active polarity as an option in  
Figure 1, “Part Number Convention,” on page 8.  
Revision 0.4 to Revision 0.5  
Updated Note 3 in Table 1, “Recommended  
Operating Conditions,” on page 2.  
Updated Figure 1, “Part Number Convention,” on  
page 8.  
Revision 0.5 to Revision 0.6  
Updated Table 1, “Recommended Operating  
Conditions,” on page 2.  
Device maintains stable operation over –40 to +85 ºC  
operating temperature range.  
Supply current specifications updated for revision D.  
Updated Table 4, “CLK± Output Levels and  
Symmetry,” on page 3.  
Updated LVDS differential peak-peak swing  
specifications.  
Updated Table 5, “CLK± Output Phase Jitter,” on  
page 4.  
Updated Table 6, “CLK± Output Period Jitter,” on  
page 5.  
Revised period jitter specifications.  
1
Updated Table 8, “Absolute Maximum Ratings ,” on  
page 6 to reflect the soldering temperature time at  
260 ºC is 20–40 sec per JEDEC J-STD-020C.  
Updated 3. "Ordering Information" on page 8.  
Changed ordering instructions to revision D.  
Added 4. "Si55x Mark Specification" on page 9.  
12  
Rev. 0.6  
Si550  
NOTES:  
Rev. 0.6  
13  
Si550  
CONTACT INFORMATION  
Silicon Laboratories Inc.  
400 West Cesar Chavez  
Austin, TX 78701  
Tel: 1+(512) 416-8500  
Fax: 1+(512) 416-9669  
Toll Free: 1+(877) 444-3032  
Email: VCXOinfo@silabs.com  
Internet: www.silabs.com  
The information in this document is believed to be accurate in all respects at the time of publication but is subject to change without notice.  
Silicon Laboratories assumes no responsibility for errors and omissions, and disclaims responsibility for any consequences resulting from  
the use of information included herein. Additionally, Silicon Laboratories assumes no responsibility for the functioning of undescribed features  
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Silicon Laboratories, Silicon Labs, and DSPLL are trademarks of Silicon Laboratories Inc.  
Other products or brandnames mentioned herein are trademarks or registered trademarks of their respective holders.  
14  
Rev. 0.6  

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