AN279 [SILICON]

ESTIMATING PERIOD JITTER FROM PHASE NOISE; 估算周期抖动相位噪声
AN279
型号: AN279
厂家: SILICON    SILICON
描述:

ESTIMATING PERIOD JITTER FROM PHASE NOISE
估算周期抖动相位噪声

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AN279  
ESTIMATING PERIOD JITTER FROM PHASE NOISE  
1. Introduction  
This application note reviews how RMS period jitter may be estimated from phase noise data. This approach is  
useful for estimating period jitter when sufficiently accurate time domain instruments, such as jitter measuring  
oscilloscopes or Time Interval Analyzers (TIAs), are unavailable.  
2. Terminology  
In this application note, the following definitions apply:  
„ Cycle-to-cycle jitter—The short-term variation in clock period between adjacent clock cycles. This jitter  
measure, abbreviated here as J , may be specified as either an RMS or peak-to-peak quantity.  
CC  
„ Jitter—Short-term variations of the significant instants of a digital signal from their ideal positions in time  
(Ref: Telcordia GR-499-CORE). In this application note, the digital signal is a clock source or oscillator. Short-  
term here means phase noise contributions are restricted to frequencies greater than or equal to 10 Hz  
(Ref: Telcordia GR-1244-CORE).  
„ Period jitter—The short-term variation in clock period over all measured clock cycles, compared to the average  
clock period. This jitter measure, abbreviated here as J  
, may be specified as either an RMS or peak-to-peak  
PER  
quantity. This application note will concentrate on estimating the RMS value of this jitter parameter.  
The illustration in Figure 1 suggests how one might measure the RMS period jitter in the time domain. The first  
edge is the reference edge or trigger edge as if we were using an oscilloscope.  
Clock Period  
Distribution  
σ
J
PER(RMS) = σ  
T =0  
T = TPER  
Figure 1. RMS Period Jitter Example  
„ Phase jitter—The integrated jitter (area under the curve) of a phase noise plot over a particular jitter bandwidth.  
Phase noise data may be recorded as either SSB phase noise L(f) in dBc/Hz or phase noise spectral density  
2
Sφ(f) in rad /Hz where:  
Sϕ(f)  
2
-------------  
L(f) ≡  
RMS phase jitter may be expressed in units of dBc, radians, time, or Unit Intervals (UI).  
Rev. 0.1 7/06  
Copyright © 2006 by Silicon Laboratories  
AN279  
AN279  
3. Basic Approach  
By definition, period jitter compares two similar instants in time of a clock source such as two successive rising  
edges or two successive falling edges. Since the two instants are separated in time by approximately one period, it  
is reasonable to expect that higher frequency jitter components will contribute more to period jitter than lower-  
frequency jitter components (f<<1/T.)  
A number of authors, e.g., Drakhlis (2001), have derived the basic relationship between J  
(rms) and phase  
PER  
noise spectral density Sφ(f). It can be shown that  
2
2
ΔϕRMS = 4 Sϕ(f)xsin (πfτ)df  
0
and, therefore:  
T0  
Δϕ2RMS  
------  
JPER(rms) =  
2π  
2
In short, period jitter is integrated similarly to phase jitter but with a frequency weighting factor of 4sin (πfτ).  
See "Appendix A—Derivation" on page 5.  
There are practical limits to integrating phase noise from f = 0 to . Phase noise is measured from a low-frequency  
limit, f , to a high-frequency limit, f . In practice, the minimum and maximum phase noise offset frequencies are  
L
H
determined by the measurement system bandwidth.  
2
Phase noise integration using the sin weighting factor is not typically sensitive to contributions from offset  
frequencies well below the half-carrier frequency. Therefore, the choice of f in theoretical period jitter calculations  
L
is generally not critical. For the purposes of this application note, the minimum offset frequency for phase noise  
measurements is 10 Hz, coinciding with the usual dividing line between wander and jitter.  
2
The period jitter sin weighting factor reaches its first maximum at the half-carrier frequency and becomes periodic  
thereafter. It is clear that phase noise in the vicinity of this offset will make a significant contribution to the period  
jitter.  
The maximum offset frequency for the purposes of integration is determined by the bandwidth of interest. One  
practical high-frequency limit is to set f equal to the half-carrier frequency. For an example, see Underhill and  
H
2
Brown (2004). Another, more conservative, approach is to integrate out to the carrier frequency where the sin  
weighting factor reaches its first null. This method appears to correlate well with at least one popular Time Interval  
Analyzer or TIA, presumably due to aliasing components above f /2. See Smith (2006).  
C
However, in many high-frequency applications, phase noise equipment cannot measure phase noise all the way  
out to either the half-carrier or carrier frequencies. Provided that the phase noise data reaches the phase noise  
floor at its highest measured offset, the phase noise floor may be extended from f  
estimation approach adopted in this application note.  
to f . This is the  
H, MEASURED  
H
2
Rev. 0.1  
AN279  
4. Example  
Consider the example in Figure 2, which represents the SSB phase noise in dBc/Hz measured for a 160 MHz  
oscillator.  
Figure 2. 160 MHz Oscillator SSB Phase Noise  
For this particular plot, there are three curves illustrated as follows:  
„ Phase Noise—This is the upper solid curve going from –78.32 dBc/Hz @10 Hz on the left down to  
–142 dBc @80 MHz on the right.  
2
„ Period Jitter Weighting Function—This is the dashed line depicting the 4sin (πfτ) weighting factor in dB. It is  
predominately a +20 dB/dec sloped line until reaching a peak at the half-carrier frequency where it turns over to  
a null at the carrier frequency.  
„ Resulting Phase Noise—This is the lower, thicker solid curve representing the summation of the phase noise in  
dBc/Hz with the Period Jitter Weighting Function in dB.  
The particular phase noise instrument that took the original phase noise data had a default maximum offset  
frequency of 20 MHz when measuring clocks less than 250 MHz. For the purpose of estimating the period jitter, the  
"ultimate noise floor" of the original data set has been extended from the last data point at 20 MHz out to the carrier  
frequency of 160 MHz.  
In this example, there are no discrete components or spurs. However, if there had been any significant spurs in the  
vicinity of the half-carrier frequency, they would need to be weighted similarly as described in "Appendix B—  
Calculating with Spurs Included" on page 7.  
By numerical integration, we can determine that the integrated phase noise under the entire SSB phase noise  
curve from 10 Hz to 160 MHz yields a total phase noise power = –54.46 dBc. This "brick wall" integration is  
equivalent to wideband RMS phase jitter of 2.663 ps or 0.00268 radians.  
Rev. 0.1  
3
AN279  
By contrast, if we weight L(f) using the period jitter weighting function and integrate the resulting curve over 10 Hz  
to 160 MHz, we obtain a total phase noise power = –56.84 dBC, equivalent to RMS period jitter of 2.025 ps or  
0.00204 radians; so, we can estimate the period jitter as being roughly 2 ps RMS, based solely on the available  
phase noise measurement. This estimate can be correlated with measurements from complementary time domain  
equipment when available. See Smith (2006) for example.  
The estimation process may be simplified further by treating the period jitter weighting function as if it was a single-  
pole, high-pass filter function out to fc/2 only. As noted in Figure 2, the J  
weighting function, based on the  
PER  
4sin2(πfτ) weighting factor in dB, looks like a +20 dB/dec sloped line until it gets close to the half-carrier frequency,  
2
where it starts to curve down. If one instead approximates the weighting function as 4(πfτ) in dB, this yields a  
straight +20 dB/dec line. The maximum or intercept at the half-carrier frequency is, therefore,  
2
2
10log(4(π(fc/2)τ) ) = 10log(π ) = 9.94 dB or approximately 10 dB. Integrating the weighted phase noise in this  
fashion, one obtains –57.62 dBc, equivalent to RMS period jitter of 1.849 ps or 0.00186 radians. In this particular  
example, the simplified “single pole filter” weighting out to the half carrier frequency resulted in a roughly 9% lower  
estimate. This is a less conservative approach, which may still yield a sufficiently accurate estimate depending on  
the application.  
Since this approach does not directly measure period jitter in the time domain, we cannot make definitive  
statements about the peak-to-peak values of the period jitter. However, if other evidence suggests that the edge  
jitter or period jitter distribution is Gaussian, we can apply the usual statistical estimates.  
5. Summary  
This application note has reviewed how RMS period jitter may be estimated from phase noise data. The key points  
to keep in mind are as follows:  
„ Period jitter is dominated by high-frequency phase noise.  
„ Channel bandwidth plays a determining role in the apparent jitter observed.  
„ Spurs contribute very little to the period jitter unless they are large and located in the vicinity of the half-carrier  
frequency.  
Generally speaking, hybrid crystal oscillators, such as the Si5xx series devices, have excellent period jitter due to  
their relatively low noise floor.  
6. References  
Drakhlis, Boris, "Calculate Oscillator Jitter By Using Phase-Noise Analysis,"  
Microwaves & RF, Jan. 2001 pp. 82-90, 157.  
Underhill, M. J. and P. J. Brown, "Estimation of Total Jitter and Jitter Probability Density Function from the Signal  
Spectrum", Proc. 18th EFTF (European Time and Frequency Forum), University of Surrey, Guildford, UK, 5-7 April  
2004.  
Smith, Kevin G., “Practical Issues Correlating Theoretical Period Jitter vs. T1A Measured Period Jitter”, Austin  
Conference on Integrated Systems & Circuits, 2006.  
4
Rev. 0.1  
AN279  
APPENDIX A—DERIVATION  
The following calculations are based on the zero crossings derivation of Drakhlis (2001).  
Let Δt represent the jitter accumulated in one period.  
T0  
------  
Δt =  
(ϕ(t1) ϕ(t2))[seconds]  
2π  
Where: T = nominal period.  
0
t = first zero crossing.  
1
t = second zero crossing.  
2
2
T0  
〈Δt2=  
〈(ϕ(t1) ϕ(t2))2〉  
------  
2π  
We can drop the T /2π factor for simplicity and add it back in later.  
0
<Δϕ2> = [<ϕ(t1)2> 2 <ϕ(t1)> x <ϕ(t2)> + <ϕ(t2)2>][radians2]  
Since ϕ(t) is stationary:  
<ϕ(t1)2> = <ϕ(t2)2> = <ϕ(t)2>  
Per Parseval’s theorem:  
<ϕ(t)2> = Sϕ(f)  
0
Further:  
<ϕ(t1) x ϕ(t2)> = Rϕ(t2 t1)  
<ϕ(t1) x ϕ(t2)> = Rϕ(τ)  
Where R (τ) is the autocorrelation of Φ(f), and τ = T0  
ϕ
The phase noise autocorrelation equals the cosine transform of the phase noise.  
<ϕ(t1) x ϕ(t2)> = Sϕ(f)cos(2πfτ)df  
0
Δϕ2RMS = 2 Sϕ(f)(1 cos(2πfτ))df  
0
2
2
ΔϕRMS = 2 Sϕ(f) x 2sin (πfτ)df  
0
2
2
ΔϕRMS = 4 Sϕ(f) x sin (πfτ)df  
0
Rev. 0.1  
5
AN279  
2
2
ΔϕRMS = 2x 4 L(f)sin (πfτ)df  
0
Now, convert back to time units:  
fU  
T0  
------  
2π  
T20  
π2  
T20  
π2  
2
Δt2RMS  
=
ΔϕRMS = 2  
L(f)sin (πfτ)df = 2  
L(f)sin (πfτ)df  
2
2
2
-----  
-----  
0
fL  
where f and f are the practical lower and upper frequency integration limits.  
L
U
J
PERRMS = Δt2RMS  
6
Rev. 0.1  
AN279  
APPENDIX B—CALCULATING WITH SPURS INCLUDED  
Spurs that are small and few in number and do not contribute significantly to phase jitter may typically be omitted  
from period jitter calculations. This is especially true for low offset frequency spurs. Each significant spur  
th  
contribution should be accounted for separately as for the weighted i spur below:  
2
2
ΔϕRMS_i = 8L(fi) x sin (πfiτ)  
2
2
T0  
------  
2π  
2T0  
π2  
Δτ2RMS_i  
=
8L(fi)sin (πfiτ) =  
L(fi)sin2(πfiτ)  
2
------------  
Each spur's contributions are then added in sum square fashion as follows:  
ΔtR2MS_TOTAL = Δt2RMS_NOISE + Δt2RMS_1 + + ΔtR2MS_i + + ΔtR2MS_N  
or:  
N
Δt2RMS_TOTAL = ΔtR2MS_NOISE  
+
Δt2RMS_i  
i = 1  
JPER_TOTAL(rms) = ΔtR2MS_TOTAL  
Rev. 0.1  
7
AN279  
CONTACT INFORMATION  
Silicon Laboratories Inc.  
4635 Boston Lane  
Austin, TX 78735  
Tel: 1+(512) 416-8500  
Fax: 1+(512) 416-9669  
Toll Free: 1+(877) 444-3032  
Email: VCXOinfo@silabs.com  
Internet: www.silabs.com  
The information in this document is believed to be accurate in all respects at the time of publication but is subject to change without notice.  
Silicon Laboratories assumes no responsibility for errors and omissions, and disclaims responsibility for any consequences resulting from  
the use of information included herein. Additionally, Silicon Laboratories assumes no responsibility for the functioning of undescribed features  
or parameters. Silicon Laboratories reserves the right to make changes without further notice. Silicon Laboratories makes no warranty, rep-  
resentation or guarantee regarding the suitability of its products for any particular purpose, nor does Silicon Laboratories assume any liability  
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8
Rev. 0.1  

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