AM27C010-45DC5 [SPANSION]
UVPROM, 128KX8, 45ns, CMOS, CDIP32, CERAMIC, DIP-32;型号: | AM27C010-45DC5 |
厂家: | SPANSION |
描述: | UVPROM, 128KX8, 45ns, CMOS, CDIP32, CERAMIC, DIP-32 可编程只读存储器 电动程控只读存储器 CD 内存集成电路 |
文件: | 总12页 (文件大小:178K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
FINAL
Am27C010
1 Megabit (128 K x 8-Bit) CMOS EPROM
DISTINCTIVE CHARACTERISTICS
■ Fast access time
■ 100% Flashrite™ programming
— Speed options as fast as 45 ns
■ Low power consumption
— Typical programming time of 16 seconds
■ Latch-up protected to 100 mA from –1 V to
V
+ 1 V
CC
— 20 µA typical CMOS standby current
■ JEDEC-approved pinout
■ High noise immunity
■ Versatile features for simple interfacing
— Both CMOS and TTL input/output compatibility
— Two line control functions
■ Single +5 V power supply
■ ±10% power supply tolerance standard
■ Standard 32-pin DIP, PDIP, and PLCC packages
GENERAL DESCRIPTION
The Am27C010 is a 1 Megabit, ultraviolet erasable pro-
grammable read-only memory. It is organized as 128K
words by 8 bits per word, operates from a single +5 V
supply, has a static standby mode, and features fast
single address location programming. Products are
available in windowed ceramic DIP packages, as well
as plastic one time programmable (OTP) PDIP and
PLCC packages.
thus eliminating bus contention in a multiple bus micro-
processor system.
AMD’s CMOS process technology provides high
speed, low power, and high noise immunity. Typical
power consumption is only 100 mW in active mode,
and 100 µW in standby mode.
All signals are TTL levels, including programming sig-
nals. Bit locations may be programmed singly, in
blocks, or at random. The device supports AMD’s
Flashrite programming algorithm (100 µs pulses), re-
sulting in a typical programming time of 16 seconds.
Data can be typically accessed in less than 45 ns, al-
lowing high-performance microprocessors to operate
without any WAIT states. The device offers separate
Output Enable (OE#) and Chip Enable (CE#) controls,
BLOCK DIAGRAM
V
Data Outputs
DQ0–DQ7
CC
V
V
SS
PP
Output Enable
Chip Enable
and
OE#
CE#
Output
Buffers
Prog Logic
PGM#
Y
Y
Gating
Decoder
A0–A16
Address
Inputs
1,048,576
Bit Cell
Matrix
X
Decoder
10205J-1
Publication# 10205 Rev: J Amendment/0
Issue Date: July 2, 1999
PRODUCT SELECTOR GUIDE
Family Part Number
Am27C010
V
V
= 5.0 V ± 5%
= 5.0 V ± 10%
-45
-45
45
-255
CC
CC
Speed Options
-55
55
55
35
-70
70
70
35
-90
-120
120
120
50
-150
150
150
65
-200
200
200
75
Max Access Time (ns)
CE# (E#) Access (ns)
OE# (G#) Access (ns)
90
90
40
250
250
75
45
25
CONNECTION DIAGRAMS
Top View
DIP
PLCC
1
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
VCC
VPP
A16
A15
A12
A7
2
PGM# (P#)
NC
3
4
3 2 1 32 31 30
4
A14
A7
5
6
A14
29
28
5
A13
A6
A13
A6
6
A8
A5
A4
7
A8
27
26
25
24
23
22
21
A5
7
A9
8
A9
A4
8
A11
A3
9
A11
A3
9
OE# (G#)
A10
A2
10
11
12
13
OE# (G#)
A10
A2
10
11
12
13
14
15
16
A1
A1
CE# (E#)
DQ7
A0
CE# (E#)
DQ7
A0
DQ0
DQ0
DQ6
16 17
19 20
18
15
14
DQ1
DQ2
VSS
DQ5
DQ4
DQ3
10205J-3
10205J-2
Notes:
1. JEDEC nomenclature is in parenthesis.
2. The 32-pin DIP to 32-pin PLCC configuration varies from the JEDEC 28-pin DIP to 32-pin PLCC configuration.
PIN DESIGNATIONS
LOGIC SYMBOL
A0–A16
= Address Inputs
CE# (E#)
= Chip Enable Input
17
DQ0–DQ7 = Data Input/Outputs
OE# (G#) = Output Enable Input
PGM# (P#) = Program Enable Input
8
A0–A16
DQ0–DQ7
CE# (E#)
PGM# (P#)
OE# (G#)
V
V
V
= V Supply Voltage
CC
PP
SS
CC
= Program Voltage Input
= Ground
10205J-4
2
Am27C010
ORDERING INFORMATION
UV EPROM Products
AMD standard products are available in several packages and operating ranges. The order number (Valid Combination) is formed
by a combination of the following:
5
AM27C010
-45
D
C
B
OPTIONAL PROCESSING
Blank = Standard Processing
B
= Burn-In
VOLTAGE TOLERANCE
= V ± 5%, 45 ns only
5
CC
See Product Selector Guide and Valid Combinations
TEMPERATURE RANGE
C
I
E
= Commercial (0°C to +70°C)
= Industrial (–40°C to +85°C)
= Extended (–55°C to +125°C)
PACKAGE TYPE
= 32-Pin Ceramic DIP (CDV032)
D
SPEED OPTION
See Product Selector Guide and Valid Combinations
DEVICE NUMBER/DESCRIPTION
Am27C010
1 Megabit (128 K x 8-Bit) CMOS UV EPROM
Valid Combinations
Valid Combinations list configurations planned to be sup-
ported in volume for this device. Consult the local AMD sales
office to confirm availability of specific valid combinations and
to check on newly released combinations.
Valid Combinations
AM27C010-45
= 5.0 V ± 5%
DC5, DC5B, DI5, DI5B
V
CC
AM27C010-45
= 5.0 V ± 10%
V
CC
AM27C010-55
AM27C010-70
AM27C010-90
DC, DCB, DI, DIB
AM27C010-120
AM27C010-150
AM27C010-200
AM27C010-255
DC, DCB, DI, DIB, DE, DEB
DC, DCB, DI, DIB
V
= 5.0 V ± 5%
CC
Am27C010
3
ORDERING INFORMATION
OTP EPROM Products
AMD standard products are available in several packages and operating ranges. The order number (Valid Combination) is formed
by a combination of the following:
5
AM27C010
-45
J
C
OPTIONAL PROCESSING
Blank = Standard Processing
VOLTAGE TOLERANCE
5
= V ± 5%, 45 ns only
CC
See Product Selector Guide and Valid Combinations
TEMPERATURE RANGE
C
I
= Commercial (0°C to +70°C)
= Industrial (–40°C to +85°C)
PACKAGE TYPE
P
J
= 32-Pin Plastic DIP (PD 032)
= 32-Pin Plastic Leaded Chip Carrier (PL 032)
SPEED OPTION
See Product Selector Guide and Valid Combinations
DEVICE NUMBER/DESCRIPTION
Am27C010
1 Megabit (128 K x 8-Bit) CMOS OTP EPROM
Valid Combinations
Valid Combinations
AM27C010-45
Valid Combinations list configurations planned to be sup-
ported in volume for this device. Consult the local AMD sales
office to confirm availability of specific valid combinations and
to check on newly released combinations.
PC5, PI5, JC5, JI5
V
= 5.0 V ± 5%
CC
AM27C010-45
= 5.0 V ± 10%
JC, PC
V
CC
AM27C010-55
AM27C010-70
AM27C010-90
AM27C010-120
AM27C010-150
AM27C010-200
AM27C010-255
JC, PC, JI, PI
V
= 5.0 V ± 5%
CC
4
Am27C010
FUNCTIONAL DESCRIPTION
Device Erasure
V
= 12.75 V ± 0.25 V and PGM# LOW and OE#
PP
HIGH will program that particular device. A high-level
CE# input inhibits the other devices from being pro-
grammed.
In order to clear all locations of their programmed con-
tents, the device must be exposed to an ultraviolet light
source. A dosage of 15 W seconds/cm is required to
2
completely erase the device. This dosage can be ob-
Program Verify
tained by exposure to an ultraviolet lamp—wavelength
A verification should be performed on the programmed
bits to determine that they were correctly programmed.
The verify should be performed with OE# and CE#, at
2
of 2537 Å—with intensity of 12,000 µW/cm for 15 to 20
minutes. The device should be directly under and about
one inch from the source, and all filters should be re-
moved from the UV light source prior to erasure.
V , PGM# at V , and V between 12.5 V and 13.0 V.
IL
IH
PP
Autoselect Mode
Note that all UV erasable devices will erase with light
sources having wavelengths shorter than 4000 Å, such
as fluorescent light and sunlight. Although the erasure
process happens over a much longer time period, ex-
posure to any light source should be prevented for
maximum system reliability. Simply cover the package
window with an opaque label or substance.
The autoselect mode provides manufacturer and de-
vice identification through identifier codes on DQ0–
DQ7. This mode is primarily intended for programming
equipment to automatically match a device to be pro-
grammed with its corresponding programming algo-
rithm. This mode is functional in the 25°C ± 5°C
ambient temperature range that is required when pro-
gramming the device.
Device Programming
Upon delivery, or after each erasure, the device has
all of its bits in the “ONE”, or HIGH state. “ZEROs” are
loaded into the device through the programming pro-
cedure.
To activate this mode, the programming equipment
must force V on address line A9. Two identifier bytes
H
may then be sequenced from the device outputs by tog-
gling address line A0 from V to V (that is, changing
IL
IH
The device enters the programming mode when 12.75
the address from 00h to 01h). All other address lines
must be held at V during the autoselect mode.
V ± 0.25 V is applied to the V
pin, and CE# and
PP
IL
PGM# are at V and OE# is at V .
IL
IH
Byte 0 (A0 = V ) represents the manufacturer code,
IL
For programming, the data to be programmed is ap-
plied 8 bits in parallel to the data pins.
and Byte 1 (A0 = V ), the device identifier code. Both
codes have odd parity, with DQ7 as the parity bit.
IH
The flowchart in the Programming section of the
EPROM Products Data Book (Section 5, Figure 5-1)
shows AMD’s Flashrite algorithm. The Flashrite algo-
rithm reduces programming time by using a 100 µs pro-
gramming pulse and by giving each address only as
many pulses to reliably program the data. After each
pulse is applied to a given address, the data in that ad-
dress is verified. If the data does not verify, additional
pulses are given until it verifies or the maximum pulses
allowed is reached. This process is repeated while se-
quencing through each address of the device. This part
Read Mode
To obtain data at the device outputs, Chip Enable (CE#)
and Output Enable (OE#) must be driven low. CE# con-
trols the power to the device and is typically used to se-
lect the device. OE# enables the device to output data,
independent of device selection. Addresses must be
stable for at least t
Waveforms section for the timing diagram.
–t . Refer to the Switching
ACC OE
Standby Mode
The device enters the CMOS standby mode when CE#
of the algorithm is done at V = 6.25 V to assure that
CC
is at V ± 0.3 V. Maximum V current is reduced to
CC
CC
each EPROM bit is programmed to a sufficiently high
threshold voltage. After the final address is completed,
100 µA. The device enters the TTL-standby mode
when CE# is at V . Maximum V current is reduced
to 1.0 mA. When in either standby mode, the device
places its outputs in a high-impedance state, indepen-
dent of the OE# input.
IH
CC
the entire EPROM memory is verified at V
5.25 V.
= V
=
CC
PP
Please refer to Section 5 of the EPROM Products Data
Book for additional programming information and spec-
ifications.
Output OR-Tieing
To accommodate multiple memory connections, a
two-line control function provides:
Program Inhibit
Programming different data to multiple devices in par-
allel is easily accomplished. Except for CE#, all like in-
puts of the devices may be common. A TTL low-level
program pulse applied to one device’s CE# input with
■ Low memory power dissipation, and
■ Assurance that output bus contention will not occur.
Am27C010
5
CE# should be decoded and used as the primary de-
vice-selecting function, while OE# be made a common
connection to all devices in the array and connected to
the READ line from the system control bus. This as-
sures that all deselected memory devices are in their
low-power standby mode and that the output pins are
only active when data is desired from a particular mem-
ory device.
ing and falling edges of Chip Enable. The magnitude of
these transient current peaks is dependent on the out-
put capacitance loading of the device. At a minimum, a
0.1 µF ceramic capacitor (high frequency, low inherent
inductance) should be used on each device between
V
and V to minimize transient effects. In addition,
CC
SS
to overcome the voltage drop caused by the inductive
effects of the printed circuit board traces on EPROM ar-
rays, a 4.7 µF bulk electrolytic capacitor should be used
System Applications
between V and V for each eight devices. The loca-
CC
SS
During the switch between active and standby condi-
tions, transient current peaks are produced on the ris-
tion of the capacitor should be close to where the
power supply is connected to the array.
MODE SELECT TABLE
Mode
CE#
OE#
PGM#
A0
X
A9
X
V
Outputs
PP
Read
V
V
X
X
X
X
X
X
X
X
D
OUT
IL
IL
Output Disable
Standby (TTL)
Standby (CMOS)
Program
X
V
X
X
High Z
High Z
High Z
IH
V
X
X
X
IH
V
± 0.3 V
X
X
X
CC
V
V
V
V
X
X
V
D
IN
IL
IL
IH
IH
IL
PP
PP
PP
Program Verify
Program Inhibit
V
V
X
X
V
V
D
OUT
IL
IH
V
X
X
X
X
High Z
01h
Manufacturer Code
Device Code
V
V
X
X
V
V
V
X
X
IL
IL
IL
IL
IL
H
H
Autoselect
(Note 3)
V
V
V
0Eh
IH
Notes:
1. V = 12.0 V ± 0.5 V.
H
2. X = Either V or V .
IH
IL
3. A1–A8 and A10–16 = V
IL
4. See DC Programming Characteristics for V voltage during programming.
PP
6
Am27C010
ABSOLUTE MAXIMUM RATINGS
OPERATING RANGES
Storage Temperature
Commercial (C) Devices
OTP Products. . . . . . . . . . . . . . . . . . –65°C to +125°C
All Other Products . . . . . . . . . . . . . . –65°C to +150°C
Ambient Temperature (T ) . . . . . . . . . . .0°C to +70°C
A
Industrial (I) Devices
Ambient Temperature
with Power Applied. . . . . . . . . . . . . . –55°C to +125°C
Ambient Temperature (T ) . . . . . . . . .–40°C to +85°C
A
Extended (E) Devices
Voltage with Respect to V
SS
All pins except A9, V , V
. . –0.6 V to V + 0.6 V
Ambient Temperature (T ) . . . . . . . .–55°C to +125°C
PP CC
CC
A
A9 and V (Note 2) . . . . . . . . . . . . .–0.6 V to 13.5 V
Supply Read Voltages
PP
V
(Note 1). . . . . . . . . . . . . . . . . . . . .–0.6 V to 7.0 V
V
V
for ± 5% devices . . . . . . . . . . +4.75 V to +5.25 V
for ± 10% devices . . . . . . . . . +4.50 V to +5.50 V
CC
CC
CC
Notes:
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
1. Minimum DC voltage on input or I/O pins –0.5 V. During
voltage transitions, the input may overshoot V to –2.0 V
SS
for periods of up to 20 ns. Maximum DC voltage on input
and I/O pins is V + 5 V. During voltage transitions, input
CC
and I/O pins may overshoot to V + 2.0 V for periods up
CC
to 20 ns.
2. Minimum DC input voltage on A9 is –0.5 V. During voltage
transitions, A9 and V may overshoot V to –2.0 V for
PP
SS
periods of up to 20 ns. A9 and V must not exceed +13.5
PP
V at any time.
Stresses above those listed under “Absolute Maximum Rat-
ings” may cause permanent damage to the device. This is a
stress rating only; functional operation of the device at these
or any other conditions above those indicated in the opera-
tional sections of this specification is not implied. Exposure of
the device to absolute maximum ratings for extended periods
may affect device reliability.
Am27C010
7
DC CHARACTERISTICS over operating range (unless otherwise specified)
Parameter
Symbol
Parameter Description
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Test Conditions
Min
Max
Unit
V
V
I
= –400 µA
= 2.1 mA
2.4
OH
OH
V
I
0.45
V
OL
OL
V
2.0
V
+ 0.5
CC
V
IH
V
Input LOW Voltage
–0.5
+0.8
1.0
5.0
30
V
IL
I
Input Load Current
V
V
= 0 V to V
CC
LI
IN
I
Output Leakage Current
= 0 V to V
CC
µA
LO
OUT
I
V
Active Current (Note 2)
C/I Devices
E Devices
CC1
CC
CE# = V , f = 10 MHz,
IL
mA
I
= 0 mA
OUT
60
I
I
V
V
V
TTL Standby Current
CMOS Standby Current
Supply Current (Read)
CE# = V
IH
1.0
100
100
mA
µA
µA
CC2
CC
CC
PP
CE# = V ± 0.3 V
CC3
CC
I
CE# = OE# = V , V = V
IL PP CC
PP1
Caution: The device must not be removed from (or inserted into) a socket when V or V is applied.
CC
PP
Notes:
1. V must be applied simultaneously or before V , and removed simultaneously or after V ..
CC
PP
PP
2. I
is tested with OE# = V to simulate open outputs.
IH
CC1
3. Minimum DC Input Voltage is –0.5 V. During transitions, the inputs may overshoot to –2.0 V for periods less than 20 ns.
Maximum DC Voltage on output pins is V + 0.5 V, which may overshoot to V + 2.0 V for periods less than 20 ns.
CC
CC
30
25
20
15
10
30
25
20
15
10
–75 –50 –55
0
25 50 75 100 125 150
1
2
3
4
5
6
7
8
9
10
Temperature in °C
Frequency in MHz
10205J-5
10205J-6
Figure 1. Typical Supply Current vs. Frequency
= 5.5 V, T = 25°C
Figure 2. Typical Supply Current vs. Temperature
= 5.5 V, f = 10 MHz
V
CC
V
CC
8
Am27C010
TEST CONDITIONS
5.0 V
Table 1. Test Specifications
-45,
-55
All
others
Test Condition
Output Load
Output Load Capacitance, C
(including jig capacitance)
Input Rise and Fall Times
Input Pulse Levels
Unit
2.7 kΩ
Device
Under
Test
1 TTL gate
L
30
100
pF
C
L
6.2 kΩ
≤ 20
ns
0.0–3.0 0.45–2.4
V
Input timing measurement
reference levels
1.5
1.5
0.8, 2.0
0.8, 2.0
V
V
Note:
Diodes are IN3064 or equivalents.
Output timing measurement
reference levels
10205J-7
Figure 3. Test Setup
SWITCHING TEST WAVEFORM
3 V
2.4 V
2.0 V
0.8 V
2.0 V
Test Points
1.5 V
Test Points
1.5 V
0.8 V
0 V
0.45 V
Input
Input
Output
Output
Note: For C = 30 pF.
Note: For C = 100 pF.
L
L
10205J-8
KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
OUTPUTS
Steady
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Does Not Apply
Changing, State Unknown
Center Line is High Impedance State (High Z)
KS000010-PAL
Am27C010
9
AC CHARACTERISTICS
Parameter Symbols
Am27C010
JEDEC Standard
Description
Address to Output Delay
Test Setup
CE#,
-45 -55 -70 -90 -120 -150 -200 -255 Unit
t
t
Max 45
55
55
35
70
70
35
90 120 150 200 250 ns
90 120 150 200 250 ns
AVQV
ACC
OE# = V
IL
t
t
Chip Enable to Output Delay OE# = V Max 45
ELQV
GLQV
CE
OE
IL
Output Enable to Output
Delay
t
t
CE# = V Max 25
40
25
50
35
65
35
75
40
75
40
ns
ns
IL
Chip Enable High or Output
Enable High to Output High Z,
Whichever Occurs First
t
t
t
EHQZ
GHQZ
DF
Max 25
25
0
25
0
(Note 2)
Output Hold Time from
Addresses, CE# or OE#,
Whichever Occurs First
t
t
Min
0
0
0
0
0
0
ns
AXQX
OH
Caution: Do not remove the device from (or insert it into) a socket or board that has V or V applied.
PP
CC
Notes:
1. V must be applied simultaneously or before V , and removed simultaneously or after V .
PP
CC
PP
2. This parameter is sampled and not 100% tested.
3. Switching characteristics are over operating range, unless otherwise specified.
4. See Figure 3 and Table 1 for test specifications.
SWITCHING WAVEFORMS
2.4
2.0
0.8
2.0
0.8
Addresses
0.45
Addresses Valid
CE#
t
CE
OE#
t
(Note 2)
DF
t
OE
t
ACC
t
OH
(Note 1)
High Z
High Z
Output
Valid Output
10205J-9
Notes:
1. OE# may be delayed up to t
– t after the falling edge of the addresses without impact on t .
ACC
ACC
OE
2.
t
is specified from OE# or CE#, whichever occurs first.
DF
PACKAGE CAPACITANCE
CDV032
PL 032
Typ Max
PD 028
Parameter
Description
Parameter Symbol
Test Conditions
Typ
Max
12
Typ
Max
12
Unit
pF
C
Input Capacitance
Output Capacitance
V
V
= 0
9
8
12
14
8
IN
IN
C
= 0
13
15
11
11
14
pF
OUT
OUT
Notes:
1. This parameter is only sampled and not 100% tested.
2. T = +25°C, f = 1 MHz.
A
10
Am27C010
PHYSICAL DIMENSIONS*
CDV032—32-Pin Ceramic Dual In-Line Package, UV Lens (measured in inches)
DATUM D
CENTER PLANE
UV Lens
.565
.605
1
INDEX AND
TERMINAL NO. 1
I.D. AREA
TOP VIEW
DATUM D
CENTER PLANE
.700
MAX
1.635
1.680
.160
.220
BASE PLANE
SEATING PLANE
94°
105°
.125
.200
.015
.060
.300 BSC
.005 MIN
.600
BSC
.045
.065
.008
.018
.100 BSC
.014
.026
END VIEW
SIDE VIEW
16-000038H-3
CDV032
DF11
3-30-95 ae
* For reference only. BSC is an ANSI standard for Basic Space Centering.
PD 032—32-Pin Plastic Dual In-Line Package (measured in inches)
1.640
1.670
.600
.625
17
16
32
.009
.015
.530
.580
Pin 1 I.D.
.630
.700
.045
.065
0°
10°
.005 MIN
.140
.225
16-038-S_AG
PD 032
EC75
SEATING PLANE
.090
.110
.015
.060
.016
.022
5-28-97 lv
.120
.160
Am27C010
11
PHYSICAL DIMENSIONS
PL 032—32-Pin Plastic Leaded Chip Carrier (measured in inches)
.485
.495
.447
.453
.009
.015
.042
.056
.125
.140
.585
.595
Pin 1 I.D.
.080
.095
.547
.553
SEATING
PLANE
.400
REF.
.490
.530
.013
.021
.050 REF.
16-038FPO-5
PL 032
DA79
.026
.032
TOP VIEW
SIDE VIEW
6-28-94 ae
l
REVISION SUMMARY
Revision G (May 1998)
Global
Revision I (April 26, 1999)
Distinctive Characteristics
Changed formatting to match current data sheets.
Corrected description of packages to 32 pin.
Ordering Information—OTP EPROM Products
Physical Dimensions
Valid Combinations: Removed the JI and PI package
On CerDIP and PDIP package drawings, corrected pin
count to 32.
options for speed option AM27C010-45, V = 5.0 V ±
CC
10%.
Revision J (July 2, 1999)
Package Capacitance
Revision H (January 1999)
Ordering Information—UV EPROM Products
Corrected package type to 32-pin CERDIP.
Corrected table heading for CDV032.
Trademarks
Copyright © 1999 Advanced Micro Devices, Inc. All rights reserved.
AMD, the AMD logo, and combinations thereof are trademarks of Advanced Micro Devices, Inc.
Flashrite is a trademark of Advanced Micro Devices, Inc.
Product names used in this publication are for identification purposes only and may be trademarks of their respective companies.
12
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