SSM9962GM [SSC]

DUAL N-CHANNEL ENHANCEMENT-MODE POWER MOSFETS; 双N沟道增强型功率MOSFET
SSM9962GM
型号: SSM9962GM
厂家: SILICON STANDARD CORP.    SILICON STANDARD CORP.
描述:

DUAL N-CHANNEL ENHANCEMENT-MODE POWER MOSFETS
双N沟道增强型功率MOSFET

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中文:  中文翻译
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SSM9962M/GM  
DUAL N-CHANNEL ENHANCEMENT-MODE POWER MOSFETS  
Simple drive requirement  
Lower gate charge  
BV DSS  
R DS(ON)  
ID  
40V  
25m  
7A  
D2  
D2  
D1  
D1  
Fast switching characteristics  
G2  
S2  
G1  
SO-8  
S1  
Description  
D2  
S2  
D1  
Advanced Power MOSFETs from Silicon Standard provide the  
designer with the best combination of fast switching,  
ruggedized device design, low on-resistance and cost-effectiveness.  
G2  
G1  
S1  
The SSM9962M is in the SO-8 package, which is widely preferred for  
commercial and industrial surface mount applications, and is well suited  
for low voltage applications such as DC/DC converters.  
This device is available with Pb-free lead finish (second-level interconnect) as SSM9962GM.  
Absolute Maximum Ratings  
Symbol  
Parameter  
Rating  
Units  
V
VDS  
VGS  
Drain-Source Voltage  
40  
± 20  
Gate-Source Voltage  
V
ID @ TA=25°C  
ID @ TA=100°C  
IDM  
Continuous Drain Current3  
Continuous Drain Current3  
Pulsed Drain Current1  
7
A
5.5  
A
20  
A
PD @ TA=25°C  
Total Power Dissipation  
2
W
Linear Derating Factor  
0.016  
-55 to 150  
-55 to 150  
W/°C  
°C  
°C  
TSTG  
TJ  
Storage Temperature Range  
Operating Junction Temperature Range  
Thermal Data  
Symbol  
Parameter  
Value  
62.5  
Unit  
Rthj-a  
Thermal Resistance Junction-ambient3  
Max.  
°C/W  
8/21/2004 Rev.2.01  
www.SiliconStandard.com  
1 of 5  
SSM9962M/GM  
Electrical Characteristics @ Tj=25oC (unless otherwise specified)  
Symbol  
BVDSS  
Parameter  
Test Conditions  
VGS=0V, ID=250uA  
Min. Typ. Max. Units  
Drain-Source Breakdown Voltage  
40  
-
-
0.1  
-
-
V
BVDSS/Tj  
Breakdown Voltage Temperature Coefficient Reference to 25°C, ID=1mA  
Static Drain-Source On-Resistance2 VGS=10V, ID=7A  
-
V/°C  
mΩ  
RDS(ON)  
-
25  
V
GS=4.5V, ID=5A  
-
1
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
40  
mΩ  
V
VGS(th)  
gfs  
Gate Threshold Voltage  
Forward Transconductance  
Drain-Source Leakage Current (Tj=25oC)  
Drain-Source Leakage Current (Tj=70oC)  
Gate-Source Leakage  
Total Gate Charge2  
VDS=VGS, ID=250uA  
VDS=10V, ID=7A  
VDS=40V, VGS=0V  
VDS=32V ,VGS=0V  
VGS= ± 20V  
ID=7A  
3
11  
-
S
IDSS  
uA  
uA  
nA  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
pF  
pF  
pF  
-
1
-
25  
IGSS  
Qg  
-
±100  
25.8  
4.4  
9.1  
10.6  
6.8  
26.3  
12  
-
-
-
-
-
-
-
-
-
-
Qgs  
Qgd  
td(on)  
tr  
Gate-Source Charge  
VDS=32V  
Gate-Drain ("Miller") Charge  
Turn-on Delay Time2  
VGS=4.5V  
VDS=20V  
Rise Time  
ID=1A  
td(off)  
tf  
Turn-off Delay Time  
RG=5.7,VGS=10V  
RD=20Ω  
Fall Time  
Ciss  
Coss  
Crss  
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
VGS=0V  
1165  
205  
142  
VDS=25V  
f=1.0MHz  
Source-Drain Diode  
Symbol  
Parameter  
Forward On Voltage2  
Test Conditions  
IS=1.7A, VGS=0V  
Is=1.7A, VGS=0V,  
dI/dt=100A/µs  
Min. Typ. Max. Units  
VSD  
trr  
-
-
-
-
1.2  
V
Reverse Recovery Time  
Reverse Recovery Charge  
21.2  
16  
-
-
ns  
nC  
Qrr  
Notes:  
1.Pulse width limited by max. junction temperature.  
2.Pulse width <300us , duty cycle <2%.  
3.Surface mounted on 1 in2 copper pad of FR4 board ; 135°C/W when mounted on min. copper pad.  
8/21/2004 Rev.2.01  
www.SiliconStandard.com  
2 of 5  
SSM9962M/GM  
25  
20  
15  
10  
5
25  
20  
15  
10  
5
T C =150 o C  
10V  
8.0V  
5.0V  
10V  
T C =25 o C  
8.0V  
5.0V  
4.0V  
4.0V  
V G =3.0V  
V G =3.0V  
0
0
0
1
2
3
4
5
0
1
2
3
4
5
6
V DS , Drain-to-Source Voltage (V)  
V DS , Drain-to-Source Voltage (V)  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
1.8  
35  
I D = 7 A  
I D =7A  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
T
C =25 o C  
VG=10V  
30  
25  
20  
15  
-50  
0
50  
100  
150  
3
4
5
6
7
8
9
10  
11  
T j , Junction Temperature ( o C)  
V GS (V)  
Fig 3. On-Resistance vs. Gate Voltage  
Fig 4. Normalized On-Resistance  
vs. Junction Temperature  
3
100  
2.8  
2.6  
2.4  
2.2  
2
10  
T j =150 o C  
T j =25 o C  
1
1.8  
1.6  
1.4  
1.2  
1
0.1  
0.01  
-50  
0
50  
100  
150  
0
0.4  
0.8  
1.2  
1.6  
V SD (V)  
Junction Temperature ( o C )  
Fig 5. Forward Characteristic of  
Reverse Diode  
Fig 6. Gate Threshold Voltage vs.  
Junction Temperature  
8/21/2004 Rev.2.01  
www.SiliconStandard.com  
3 of 5  
SSM9962M/GM  
f=1.0MHz  
10000  
1000  
100  
14  
12  
10  
8
I D =7A  
V DS =20V  
Ciss  
V
V
DS =25V  
DS =32V  
Coss  
Crss  
6
4
2
0
10  
0
5
10  
15  
20  
25  
30  
35  
1
5
9
13  
17  
21  
25  
29  
Q G , Total Gate Charge (nC)  
VDS (V)  
Fig 7. Gate Charge Characteristics  
Fig 8. Typical Capacitance Characteristics  
1
100  
DUTY=0.5  
0.2  
10  
0.1  
0.1  
1ms  
0.05  
PDM  
10ms  
1
0.02  
0.01  
t
T
Single Pulse  
100ms  
Duty factor = t/T  
0.01  
T c =25 o  
C
Peak T = PDM x Rthja + Ta  
j
1s  
0.1  
Rthja = 135°C/W  
Single Pulse  
DC  
0.001  
0.01  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
0.1  
1
10  
100  
t , Pulse Width (s)  
V DS (V)  
Fig 9. Maximum Safe Operating Area  
Fig 10. Effective Transient Thermal Impedance  
8/21/2004 Rev.2.01  
www.SiliconStandard.com  
4 of 5  
SSM9962M/GM  
VDS  
RD  
90%  
VDS  
TO THE  
OSCILLOSCOPE  
D
S
0.5 x RATED VDS  
RG  
G
10%  
VGS  
+
-
10 v  
VGS  
td(off)  
td(on) tr  
tf  
Fig 11. Switching Time Circuit  
Fig 12. Switching Time Waveform  
VG  
VDS  
QG  
TO THE  
OSCILLOSCOPE  
D
S
4.5V  
0.5 x RATED VDS  
QGD  
QGS  
G
VGS  
+
1~ 3 mA  
IG  
-
I
D
Q
Charge  
Fig 13. Gate Charge Circuit  
Fig 14. Gate Charge Waveform  
Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no  
guarantee or warranty, express or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no  
responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its  
use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including  
without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to  
the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of  
Silicon Standard Corporation or any third parties.  
8/21/2004 Rev.2.01  
www.SiliconStandard.com  
5 of 5  

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