74LVQ241T [STMICROELECTRONICS]

LOW VOLTAGE OCTAL BUS BUFFER WITH 3 STATE OUTPUTS NON INVERTED; 具有三态输出非反相低电压八路总线缓冲器
74LVQ241T
型号: 74LVQ241T
厂家: ST    ST
描述:

LOW VOLTAGE OCTAL BUS BUFFER WITH 3 STATE OUTPUTS NON INVERTED
具有三态输出非反相低电压八路总线缓冲器

总线驱动器 总线收发器 逻辑集成电路 光电二极管 输出元件
文件: 总8页 (文件大小:67K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
74LVQ241  
LOW VOLTAGE OCTAL BUS BUFFER  
WITH 3 STATE OUTPUTS (NON INVERTED)  
HIGH SPEED:  
tPD =6 ns (TYP.)at VCC = 3.3V  
COMPATIBLEWITHTTL OUTPUT  
LOW POWER DISSIPATION:  
I
CC =4 µA (MAX.) at TA =25 oC  
M
T
LOWNOISE:  
(Micro Package)  
(TSSOPPackage)  
VOLP =0.4V(TYP.)at VCC = 3.3V  
75TRANSMISSIONLINEOUTPUT DRIVE  
CAPABILITY  
SYMMETRICAL OUTPUT IMPEDANCE:  
|IOH| = IOL = 12 mA (MIN)  
ORDER CODES :  
74LVQ241M  
74LVQ241T  
PCI BUSLEVELSGUARANTEED AT 24mA  
BALANCEDPROPAGATIONDELAYS:  
tPLH tPHL  
3.3V applications.  
It has better speed performance at 3.3V than 5V  
LSTTL family combined with the true CMOS low  
power consumption.  
OPERATING VOLTAGERANGE:  
VCC (OPR)= 2V to 3.6V (1.2VData Retention)  
G and G output controls govern four BUS  
BUFFERs.  
This device is designed to be used with 3 state  
memory address drivers, etc.  
PIN AND FUNCTION COMPATIBLEWITH  
74 SERIES241  
IMPROVED LATCH-UP IMMUNITY  
All inputs and outputs are equipped with  
protection circuits against static discharge, giving  
them 2KV ESD immunity and transient excess  
voltage.  
DESCRIPTION  
The LVQ241 is a low voltage CMOS OCTAL BUS  
BUFFER fabricated with sub-micron silicon gate  
and  
double-layer metal  
wiring  
C2MOS  
technology.It is ideal for low power and low noise  
PIN CONNECTION AND IEC LOGIC SYMBOLS  
1/8  
February 1999  
74LVQ241  
INPUT AND OUTPUT EQUIVALENT CIRCUIT  
PIN DESCRIPTION  
PIN No  
1
SYMBOL NAME AND FUNCTION  
1G Output Enable Input  
2,4,6,8  
9,7,5,3  
1A1to1A4 Data Inputs  
2Y1to2Y4 Data Outputs  
11,13, 15,17 2A1to2A4 Data Inputs  
18,16, 14,12 1Y1to1Y4 Data Outputs  
19  
10  
20  
2G  
GND  
VCC  
Output Enable Input  
Ground (0V)  
Positive Supply Voltage  
TRUTH TABLE  
INPUT  
OUTPUT  
G
L
G
H
H
L
An  
L
Yn  
L
L
H
H
H
X
Z
X:”H” orL”  
Z:Highimpedance  
ABSOLUTE MAXIMUM RATING  
Symbol  
Parameter  
Value  
-0.5to+7  
Unit  
VCC  
VI  
Supply Voltage  
V
V
DC Input Voltage  
DC Output Voltage  
DC Input Diode Current  
-0.5toVCC +0.5  
-0.5toVCC +0.5  
VO  
IIK  
V
20  
mA  
mA  
mA  
mA  
oC  
oC  
±
IOK  
IO  
DC Output Diode Current  
DC Output Current  
± 20  
± 50  
ICC orIGND DC VCC or Ground Current  
± 400  
Tstg  
Storage Temperature  
-65to+150  
TL  
Lead Temperature (10 sec)  
300  
AbsoluteMaximum Ratingsarethose values beyond whichdamage tothe device may occur. Functional operation under these condition isnot implied.  
RECOMMENDED OPERATING CONDITIONS  
Symbol  
VCC  
VI  
Parameter  
Supply Voltage (note 1)  
Value  
2to3.6  
0toVCC  
0toVCC  
-40to+85  
0to10  
Unit  
V
Input Voltage  
V
VO  
Output Voltage  
V
oC  
Top  
Operating Temperature:  
dt/dv  
Input Rise and Fall Time (VCC = 3V) (note 2)  
ns/V  
1) Truth Table guaranteed: 1.2V to 3.6V  
2)VIN from0.8Vto2V  
2/8  
74LVQ241  
DC SPECIFICATIONS  
Symbol  
Parameter  
Test Conditions  
Value  
TA = 25 oC  
Min. Typ. Max. Min. Max.  
Unit  
VCC  
(V)  
-40 to 85 oC  
VIH  
VIL  
High Level Input Voltage  
Low Level Input Voltage  
2.0  
2.0  
V
V
3.0 to 3.6  
3.0  
0.8  
0.8  
VOH  
High Level Output  
Voltage  
V(*)  
VIHor  
V
IL  
=
IO=-50µA  
IO=-12 mA  
IO=-24mA  
IO=50µA  
2.9  
2.99  
2.9  
2.48  
2.2  
I
V
2.58  
VOL  
Low Level Output  
Voltage  
3.0  
V(*)  
=
0.002  
0
0.1  
0.1  
0.44  
0.55  
±1  
I
VIHor  
V
IL  
V
IO=12mA  
IO=24mA  
0.36  
II  
Input Leakage Current  
VI = VCC orGND  
±0.1  
µA  
3.6  
3.6  
3.6  
IOZ  
3 State Output Leakage  
Current  
VI =VIHorVIL  
VO = VCC orGND  
0.5  
±
5
±
A
µ
ICC  
Quiescent Supply  
Current  
VI = VCC orGND  
4
40  
µA  
IOLD  
IOHD  
Dynamic Output Current  
(note 1, 2)  
3.6  
VOLD = 0.8V max  
VOHD =2 Vmin  
36  
mA  
mA  
-25  
1) Maximum test duration 2ms, one output loaded attime  
2)Incident wave switchingis guaranteed ontransmission lines withimpedances aslowas50 .  
(*) All outputs loaded.  
DYNAMIC SWITCHING CHARACTERISTICS  
Symbol  
Parameter  
Test Conditions  
Value  
TA = 25 oC  
Unit  
VCC  
-40 to 85 oC  
(V)  
Min. Typ. Max. Min. Max.  
VOLP  
VOLV  
Dynamic Low Voltage  
Quiet Output (note 1, 2)  
3.3  
0.4  
0.8  
-0.8  
-0.5  
V
Dynamic High Voltage  
Input (note 1, 3)  
3.3  
3.3  
2
CL = 50pF  
V
IHD  
VILD  
Dynamic Low Voltage  
Input (note 1, 3)  
0.8  
1)Worstcase package  
2)Max number ofoutputs defined as (n). Datainputs aredriven 0Vto3.3V, (n -1)outputs switching andone outputatGND  
3)max number ofdatainputs (n)switching.(n-1)switching 0Vto3.3V. Inputsunder testswitching: 3.3Vtothreshold (VILD),0V tothreshold (VIHD).f=1MHz  
3/8  
74LVQ241  
AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, RL = 500 , Input tr = t =3 ns)  
f
Symbol  
Parameter  
Test Condition  
Value  
TA = 25 oC  
Min. Typ. Max. Min. Max.  
Unit  
VCC  
(V)  
-40 to 85 oC  
tPLH  
tPHL  
Propagation Delay Time  
Output Enable Time  
Output Disable Time  
2.7  
7
6
13  
9
14  
9.5  
18  
ns  
ns  
(*)  
3.3  
tPZL  
tPZH  
2.7  
8.5  
7
17  
(*)  
3.3  
12  
12.5  
20  
tPLZ  
tPHZ  
2.7  
9
19  
ns  
ns  
(*)  
3.3  
7.5  
0.5  
0.5  
13.5  
1.5  
1.5  
14  
tOSLH Output to Output Skew  
tOSHL Time (note 1, 2)  
2.7  
1.5  
1.5  
(*)  
3.3  
1) Skewis defined astheabsolute value ofthe difference between theactual propagation delay for any twooutputs of thesame device switching inthe  
same direction, either HIGHor LOW (tOSLH = |tPLHm -tPLHn|,tOSHL =|tPHLm -tpHLn|)  
2) Parameter guaranteed bydesign  
(*) Voltagerangeis3.3V ± 0.3V  
CAPACITIVE CHARACTERISTICS  
Symbol  
Parameter  
Test Conditions  
Value  
TA = 25 oC  
Unit  
VCC  
-40 to 85 oC  
(V)  
Min. Typ. Max. Min. Max.  
CIN  
Input Capacitance  
3.3  
3.3  
3.3  
5
pF  
pF  
pF  
COUT Output Capacitance  
10  
15  
CPD  
Power Dissipation  
fIN =10MHz  
Capacitance (note 1)  
1)CPD isdefined as thevalue ofthe IC’sinternal equivalent capacitance whichiscalculated fromthe operating current consumption without load. (Referto  
TestCircuit).Average operting current can beobtained bythe followingequation. ICC(opr)= CPD VCC fIN + ICC/8(per circuit)  
TEST CIRCUIT  
TEST  
SWITCH  
Open  
tPLH, tPHL  
tPZL, tPLZ  
tPZH, tPHZ  
2VCC  
OPEN  
CL = 50 pF or equivalent (includes jigand probe capacitance)  
RL =R1 =500orequivalent  
)
RT = ZOUT ofpulse generator (typically50  
4/8  
74LVQ241  
WAVEFORM 1: PROPAGATION DELAYS  
(f=1MHz; 50% duty cicle)  
WAVEFORM 2: OUTPUT ENABLE AND DISABLE TIME (f=1MHz; 50% duty cicle)  
5/8  
74LVQ241  
SO-20 MECHANICAL DATA  
mm  
inch  
TYP.  
DIM.  
MIN.  
TYP.  
MAX.  
2.65  
0.20  
2.45  
0.49  
0.32  
MIN.  
MAX.  
0.104  
0.007  
0.096  
0.019  
0.012  
A
a1  
a2  
b
0.10  
0.004  
0.35  
0.23  
0.013  
0.009  
b1  
C
0.50  
0.020  
c1  
D
45 (typ.)  
12.60  
10.00  
13.00  
10.65  
0.496  
0.393  
0.512  
0.419  
E
e
1.27  
0.050  
0.450  
e3  
F
11.43  
7.40  
0.50  
7.60  
1.27  
0.75  
0.291  
0.19  
0.299  
0.050  
0.029  
L
M
S
8 (max.)  
P013L  
6/8  
74LVQ241  
TSSOP20 MECHANICAL DATA  
mm  
inch  
TYP.  
DIM.  
MIN.  
TYP.  
MAX.  
1.1  
MIN.  
MAX.  
0.433  
0.006  
0.374  
0.0118  
0.0079  
0.260  
0.256  
0.176  
A
A1  
A2  
b
0.05  
0.85  
0.19  
0.09  
6.4  
0.10  
0.9  
0.15  
0.95  
0.30  
0.2  
0.002  
0.335  
0.0075  
0.0035  
0.252  
0.246  
0.169  
0.004  
0.354  
c
D
6.5  
6.4  
6.6  
0.256  
0.252  
E
6.25  
4.3  
6.5  
E1  
e
4.4  
4.48  
0.173  
0.65 BSC  
4o  
0.0256 BSC  
4o  
K
0o  
8o  
0o  
8o  
L
0.50  
0.60  
0.70  
0.020  
0.024  
0.028  
A2  
A
K
L
b
e
A1  
E
c
D
E1  
PIN 1 IDENTIFICATION  
1
7/8  
74LVQ241  
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences  
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is  
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are  
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products  
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.  
The ST logo is a trademark of STMicroelectronics  
1999 STMicroelectronics – Printed in Italy – All Rights Reserved  
STMicroelectronics GROUP OF COMPANIES  
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Singapore - Spain - Sweden - Switzerland - Taiwan - Thailand - United Kingdom - U.S.A.  
http://www.st.com  
.
8/8  

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