M27V160-120M6TR [STMICROELECTRONICS]
1MX16 OTPROM, 120ns, PDSO44, 0.525 INCH, ROHS COMPLIANT, PLASTIC, SOP-44;型号: | M27V160-120M6TR |
厂家: | ST |
描述: | 1MX16 OTPROM, 120ns, PDSO44, 0.525 INCH, ROHS COMPLIANT, PLASTIC, SOP-44 可编程只读存储器 OTP只读存储器 光电二极管 内存集成电路 |
文件: | 总17页 (文件大小:181K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
M27V160
16 Mbit (2Mb x8 or 1Mb x16)
Low Voltage UV EPROM and OTP EPROM
■ 3V to 3.6V LOW VOLTAGE in READ
OPERATION
■ ACCESS TIME: 100ns
■ BYTE-WIDE or WORD-WIDE
42
42
CONFIGURABLE
1
1
■ 16 Mbit MASK ROM REPLACEMENT
■ LOW POWER CONSUMPTION
– Active Current 30mA at 8MHz
– Standby Current 60µA
PDIP42 (B)
FDIP42W (F)
■ PROGRAMMING VOLTAGE: 12.5V ± 0.25V
■ PROGRAMMING TIME: 50µs/word
■ ELECTRONIC SIGNATURE
– Manufacturer Code: 20h
42
1
SDIP42 (S)
– Device Code: B1h
DESCRIPTION
The M27V160 is a low voltage 16 Mbit EPROM of-
fered in the two ranges UV (ultra violet erase) and
OTP (one time programmable). It is ideally suited
for microprocessor systems requiring large data or
program storage. It is organised as either 2 Mbit
words of 8 bit or 1 Mbit words of 16 bit. The pin-out
is compatible with a 16 Mbit Mask ROM.
SO44 (M)
PLCC44 (K)
Figure 1. Logic Diagram
The M27V160 operates in the read mode with a
supply voltage as low as 3V. The decrease in op-
erating power allows either a reduction of the size
of the battery or an increase in the time between
battery recharges.
The FDIP42W (window ceramic frit-seal package)
has a transparent lid which allows the user to ex-
pose the chip to ultraviolet light to erase the bit pat-
tern. A new pattern can then be written rapidly to
the device by following the programming proce-
dure.
V
CC
20
Q15A–1
A0-A19
15
Q0-Q14
E
M27V160
For applications where the content is programmed
only one time and erasure is not required, the
M27V160 is offered in PDIP42, SDIP42, PLCC44
and SO44 packages.
G
BYTEV
PP
V
SS
AI01898
March 2002
1/17
M27V160
Figure 2A. DIP Connections
Figure 2B. SO Connections
NC
A18
A17
A7
A6
A5
A4
A3
A2
A1
A0
E
1
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
NC
A18
A17
A7
1
2
3
4
5
6
7
8
9
42 A19
41 A8
2
A19
A8
3
40 A9
4
A9
A6
39 A10
38 A11
37 A12
36 A13
35 A14
34 A15
33 A16
32 BYTEV
5
A10
A11
A12
A13
A14
A15
A16
BYTEV
A5
6
A4
7
A3
8
A2
9
A1
10
11
12
13
14
15
16
17
18
19
20
21
22
A0 10
M27V160
M27V160
E
11
12
13
PP
PP
V
31
V
SS
SS
G
V
V
SS
Q15A-1
SS
G
30 Q15A-1
Q0 14
Q8 15
Q1 16
Q9 17
Q2 18
29 Q7
Q0
Q8
Q7
28 Q14
27 Q6
Q14
Q6
Q1
26 Q13
25 Q5
Q9
Q13
Q5
Q2
Q10 19
Q3 20
24 Q12
23 Q4
Q10
Q3
Q12
Q4
Q11 21
22
V
CC
Q11
V
CC
AI01899
AI01900
Table 1. Signal Names
Figure 2C. PLCC Connections
A0-A19
Q0-Q7
Q8-Q14
Q15A–1
E
Address Inputs
Data Outputs
Data Outputs
1 44
A4
A12
A13
A14
A15
A16
Data Output / Address Input
Chip Enable
A3
A2
A1
A0
G
Output Enable
E
12
M27V160
34 BYTEV
PP
V
V
BYTEV
SS
G
SS
Byte Mode / Program Supply
Supply Voltage
PP
Q15A–1
Q0
Q8
Q1
Q7
V
V
CC
SS
Q14
Q6
Ground
23
NC
Not Connected Internally
AI04829
2/17
M27V160
(1)
Table 2. Absolute Maximum Ratings
Symbol
Parameter
Value
–40 to 125
–50 to 125
–65 to 150
–2 to 7
Unit
°C
°C
°C
V
(3)
T
A
Ambient Operating Temperature
T
Temperature Under Bias
Storage Temperature
Input or Output Voltage (except A9)
Supply Voltage
BIAS
T
STG
(2)
V
IO
V
–2 to 7
V
CC
(2)
A9 Voltage
–2 to 13.5
–2 to 14
V
V
A9
V
Program Supply Voltage
V
PP
Note: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings" may
cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions
above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating condi-
tions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant qual-
ity documents.
2. Minimum DC voltage on Input or Output is –0.5V with possible undershoot to –2.0V for a period less than 20ns. Maximum DC
voltage on Output is V
3. Depends on range.
+0.5V with possible overshoot to V
+2V for a period less than 20ns.
CC
CC
Table 3. Operating Modes
Mode
BYTEV
E
G
A9
X
Q15A–1
Q14-Q8
Data Out
Hi-Z
Q7-Q0
Data Out
Data Out
Data Out
Hi-Z
PP
V
V
V
IH
Read Word-wide
Data Out
IL
IL
IL
IL
IL
IL
IL
V
V
V
V
V
V
V
V
IH
Read Byte-wide Upper
Read Byte-wide Lower
Output Disable
X
IL
V
V
IL
X
Hi-Z
IL
X
X
Hi-Z
Data In
Data Out
Hi-Z
Hi-Z
IH
IH
V
Pulse
V
V
PP
Program
X
Data In
Data Out
Hi-Z
Data In
Data Out
Hi-Z
IL
V
V
V
V
PP
Verify
X
IH
IH
IH
IL
V
V
V
PP
Program Inhibit
Standby
X
IH
X
X
X
Hi-Z
Hi-Z
Hi-Z
V
IL
V
V
IH
V
ID
Electronic Signature
Code
Codes
Codes
IL
Note: X = V or V , V = 12V ± 0.5V.
IH IL ID
Table 4. Electronic Signature
Q15
and
Q7
Q14
and
Q6
Q13
and
Q5
Q12
and
Q4
Q11
and
Q3
Q10
and
Q2
Q9
and
Q1
Q8
and
Q0
Identifier
A0
Hex Data
V
Manufacturer’s Code
Device Code
0
1
0
0
1
1
0
1
0
0
0
0
0
0
0
1
20h
B1h
IL
V
IH
3/17
M27V160
Table 5. AC Measurement Conditions
High Speed
≤ 10ns
Standard
≤ 20ns
Input Rise and Fall Times
Input Pulse Voltages
0 to 3V
1.5V
0.4V to 2.4V
0.8V and 2V
Input and Output Timing Ref. Voltages
Figure 3. AC Testing Input Output Waveform
Figure 4. AC Testing Load Circuit
1.3V
High Speed
1N914
3V
1.5V
3.3kΩ
0V
DEVICE
UNDER
TEST
OUT
Standard
C
L
2.4V
2.0V
0.8V
0.4V
C
C
C
= 30pF for High Speed
= 100pF for Standard
includes JIG capacitance
L
L
L
AI01822
AI01823B
(1)
Table 6. Capacitance
Symbol
(T = 25 °C, f = 1 MHz)
A
Parameter
Test Condition
Min
Max
10
Unit
pF
Input Capacitance (except BYTEV
)
V
V
= 0V
= 0V
= 0V
PP
IN
IN
C
IN
Input Capacitance (BYTEV
Output Capacitance
)
PP
120
12
pF
C
V
OUT
pF
OUT
Note: 1. Sampled only, not 100% tested.
DEVICE OPERATION
lower 8 bits of the 16 bit data are selected and with
A–1 at V the upper 8 bits of the 16 bit data are
IH
The operating modes of the M27V160 are listed in
the Operating Modes Table. A single power supply
is required in the read mode. All inputs are TTL
compatible except for V and 12V on A9 for the
Electronic Signature.
selected.
The M27V160 has two control functions, both of
which must be logically active in order to obtain
data at the outputs. In addition the Word-wide or
Byte- wide organisation must be selected.
PP
Read Mode
Chip Enable (E) is the power control and should be
used for device selection. Output Enable (G) is the
output control and should be used to gate data to
the output pins independent of device selection.
Assuming that the addresses are stable, the ad-
The M27V160 has two organisations, Word-wide
and Byte-wide. The organisation is selected by the
signal level on the BYTEV pin. When BYTEV
PP
PP
is at V the Word-wide organisation is selected
IH
and the Q15A–1 pin is used for Q15 Data Output.
dress access time (t
) is equal to the delay
). Data is available at the
AVQV
When the BYTEV pin is at V the Byte-wide or-
PP
IL
from E to output (t
ELQV
ganisation is selected and the Q15A–1 pin is used
for the Address Input A–1. When the memory is
logically regarded as 16 bit wide, but read in the
output after a delay of t
from the falling edge
GLQV
of G, assuming that E has been low and the ad-
dresses have been stable for at least t -t
.
AVQV GLQV
Byte-wide organisation, then with A–1 at V the
IL
4/17
M27V160
(1)
Table 7. Read Mode DC Characteristics
(T = 0 to 70°C or –40 to 85°C; V = 3.3V ± 10%; V = V
)
A
CC
PP
CC
Symbol
Parameter
Input Leakage Current
Output Leakage Current
Test Condition
Min
Max
±1
Unit
µA
I
LI
0V ≤ V ≤ V
IN
CC
I
0V ≤ V
≤ V
OUT CC
±10
µA
LO
E = V , G = V , I
= 0mA,
IL
IL OUT
30
20
mA
mA
f = 8MHz, V ≤ 3.6V
CC
I
Supply Current
CC
E = V , G = V , I
= 0mA,
IL
IL OUT
f = 5MHz, V ≤ 3.6V
CC
I
E = V
Supply Current (Standby) TTL
Supply Current (Standby) CMOS
Program Current
1
mA
µA
µA
CC1
IH
I
E > V – 0.2V, V ≤ 3.6V
60
10
CC2
CC
CC
I
V
= V
PP CC
PP
V
0.2V
CC
Input Low Voltage
–0.3
V
IL
(2)
0.7V
V + 1
CC
Input High Voltage
V
V
V
V
CC
IH
V
I
= 2.1mA
Output Low Voltage
Output High Voltage TTL
0.4
OL
OL
V
I
= –400µA
2.4
OH
OH
Note: 1. V must be applied simultaneously with or before V and removed simultaneously or after V .
PP
CC
PP
2. Maximum DC voltage on Output is V +0.5V.
CC
Standby Mode
System Considerations
The M27V160 has a standby mode which reduces
the active current from 20mA to 20µA with low volt-
The power switching characteristics of Advanced
CMOS EPROMs require careful decoupling of the
age operation V
≤ 3.6V, see Read Mode DC
supplies to the devices. The supply current I
CC
CC
Characteristics table for details.The M27V160 is
placed in the standby mode by applying a CMOS
high signal to the E input. When in the standby
mode, the outputs are in a high impedance state,
independent of the G input.
has three segments of importance to the system
designer: the standby current, the active current
and the transient peaks that are produced by the
falling and rising edges of E. The magnitude of the
transient current peaks is dependent on the ca-
pacitive and inductive loading of the device out-
puts. The associated transient voltage peaks can
be suppressed by complying with the two line out-
put control and by properly selected decoupling
capacitors. It is recommended that a 0.1µF ceram-
Two Line Output Control
Because EPROMs are usually used in larger
memory arrays, this product features a 2 line con-
trol function which accommodates the use of mul-
tiple memory connection. The two line control
function allows:
a. the lowest possible memory power dissipation,
b. complete assurance that output bus contention
will not occur.
For the most efficient use of these two control
lines, E should be decoded and used as the prima-
ry device selecting function, while G should be
made a common connection to all devices in the
array and connected to the READ line from the
system control bus. This ensures that all deselect-
ed memory devices are in their low power standby
mode and that the output pins are only active
when data is required from a particular memory
device.
ic capacitor is used on every device between V
CC
and V . This should be a high frequency type of
SS
low inherent inductance and should be placed as
close as possible to the device. In addition, a
4.7µF electrolytic capacitor should be used be-
tween V
and V for every eight devices. This
CC
SS
capacitor should be mounted near the power sup-
ply connection point. The purpose of this capacitor
is to overcome the voltage drop caused by the in-
ductive effects of PCB traces.
5/17
M27V160
(1)
Table 8. Read Mode AC Characteristics
(T = 0 to 70°C or –40 to 85°C; V = 3.3V ± 10%; V = V
)
A
CC
PP
CC
M27V160
-120
(3)
Symbol
Alt
Parameter
Test Condition
-150
Unit
-100
Min Max Min Max Min Max
t
t
E = V , G = V
Address Valid to Output Valid
BYTE High to Output Valid
100
100
100
120
120
120
150
150
150
ns
ns
ns
AVQV
ACC
IL
IL
t
t
ST
E = V , G = V
BHQV
IL
IL
t
t
G = V
Chip Enable Low to Output Valid
ELQV
CE
IL
Output Enable Low to Output
Valid
t
t
E = V
50
60
60
ns
GLQV
OE
IL
(2)
t
E = V , G = V
BYTE Low to Output Hi-Z
45
45
50
50
50
50
ns
ns
t
STD
IL
IL
BLQZ
(2)
t
G = V
Chip Enable High to Output Hi-Z
0
0
0
0
0
0
t
DF
DF
IL
EHQZ
Output Enable High to Output
Hi-Z
(2)
t
E = V
45
50
50
ns
t
IL
GHQZ
Address Transition to Output
Transition
t
t
E = V , G = V
5
5
5
5
5
5
ns
ns
AXQX
OH
IL
IL
t
t
E = V , G = V
BYTE Low to Output Transition
BLQX
OH
IL
IL
Note: 1. V must be applied simultaneously with or before V and removed simultaneously or after V
PP
CC
PP
2. Sampled only, not 100% tested.
3. Speed obtained with High Speed measurement conditions.
Figure 5. Word-Wide Read Mode AC Waveforms
VALID
VALID
A0-A19
tAVQV
tAXQX
E
tEHQZ
tGHQZ
tGLQV
G
tELQV
Hi-Z
Q0-Q15
AI00741B
Note: BYTEV = V
PP
.
IH
6/17
M27V160
Figure 6. Byte-Wide Read Mode AC Waveforms
VALID
VALID
A–1,A0-A19
tAVQV
tAXQX
E
tEHQZ
tGHQZ
tGLQV
G
tELQV
Hi-Z
Q0-Q7
AI00742B
Note: BYTEV = V
.
IL
PP
Figure 7. BYTE Transition AC Waveforms
A0-A19
VALID
A–1
VALID
tAVQV
tAXQX
BYTEV
PP
tBHQV
Q0-Q7
tBLQX
Q8-Q15
tBLQZ
DATA OUT
Hi-Z
DATA OUT
AI00743C
Note: Chip Enable (E) and Output Enable (G) = V
.
IL
7/17
M27V160
(1)
Table 9. Programming Mode DC Characteristics
(T = 25 °C; V = 6.25V ± 0.25V; V = 12.5V ± 0.25V)
A
CC
PP
Symbol
Parameter
Test Condition
Min
Max
±1
Unit
µA
mA
mA
V
I
LI
0 ≤ V ≤ V
Input Leakage Current
Supply Current
IN
CC
I
50
CC
I
PP
E = V
Program Current
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage TTL
A9 Voltage
50
IL
V
–0.3
2.4
0.8
IL
V
V
+ 0.5
V
IH
CC
V
I
OL
= 2.1mA
0.4
V
OL
V
I
= –2.5mA
3.6
V
OH
OH
V
11.5
12.5
V
ID
Note: 1. V must be applied simultaneously with or before V and removed simultaneously or after V .
PP
CC
PP
(1)
Table 10. Programming Mode AC Characteristics
(T = 25 °C; V = 6.25V ± 0.25V; V = 12.5V ± 0.25V)
A
CC
PP
Symbol
Alt
Parameter
Test Condition
Min
Max
Unit
t
t
t
t
Address Valid to Chip Enable Low
Input Valid to Chip Enable Low
2
2
µs
µs
µs
µs
µs
µs
µs
ns
ns
AVEL
AS
QVEL
VPHAV
VCHAV
DS
t
t
t
V
V
High to Address Valid
High to Address Valid
2
VPS
VCS
PP
CC
t
2
t
t
PW
Chip Enable Program Pulse Width
Chip Enable High to Input Transition
Input Transition to Output Enable Low
Output Enable Low to Output Valid
Output Enable High to Output Hi-Z
45
2
55
ELEH
t
t
DH
EHQX
t
t
2
QXGL
GLQV
OES
t
t
120
130
OE
(2)
t
0
0
t
DFP
GHQZ
Output Enable High to Address
Transition
t
t
ns
GHAX
AH
Note: 1. V must be applied simultaneously with or before V and removed simultaneously or after V .
PP
CC
PP
2. Sampled only, not 100% tested.
Programming
cations. Although only '0's will be programmed,
both '1's and '0's can be present in the data word.
The only way to change a '0' to a '1' is by die expo-
sure to ultraviolet light (UV EPROM). The
The M27V160 has been designed to be fully com-
patible with the M27C160. As a result the
M27V160 can be programmed as the M27C160
on the same programming equipments applying
M27V160 is in the programming mode when V
pp
input is at 12.5V, G is at V and E is pulsed to V .
IH
IL
12.75V on V and 6.25V on V by the use of the
PP
CC
The data to be programmed is applied to 16 bits in
parallel to the data output pins. The levels required
same PRESTO III algorithm. When delivered (and
after each erasure for UV EPROM), all bits of the
M27V160 are in the '1' state. Data is introduced by
selectively programming '0's to the desired bit lo-
for the address and data inputs are TTL. V
specified to be 6.25V ± 0.25V.
is
CC
8/17
M27V160
Figure 8. Programming and Verify Modes AC Waveforms
A0-A19
Q0-Q15
VALID
tAVEL
DATA IN
tQVEL
DATA OUT
tEHQX
BYTEV
PP
tVPHAV
tVCHAV
tGLQV
tGHQZ
V
E
CC
tGHAX
tELEH
tQXGL
G
PROGRAM
VERIFY
AI00744
Figure 9. Programming Flowchart
PRESTO III Programming Algorithm
The PRESTO III Programming Algorithm allows
the whole array to be programed with a guaran-
teed margin in a typical time of 52.5 seconds. Pro-
gramming with PRESTO III consists of applying a
sequence of 50µs program pulses to each word
until a correct verify occurs (see Figure 9).
V
= 6.25V, V
= 12.5V
PP
CC
n = 0
During programing and verify operation a MAR-
GIN MODE circuit is automatically activated to
guarantee that each cell is programed with enough
margin. No overprogram pulse is applied since the
E = 50µs Pulse
verify in MARGIN MODE at V much higher than
NO
CC
3.6V provides the necessary margin to each pro-
grammed cell.
Program Inhibit
Programming of multiple M27V160s in parallel
with different data is also easily accomplished. Ex-
cept for E, all like inputs including G of the parallel
M27V160 may be common. A TTL low level pulse
NO
++n
= 25
VERIFY
YES
++ Addr
YES
Last
NO
FAIL
Addr
applied to a M27V160's E input and V at 12.5V,
PP
YES
will program that M27V160. A high level E input in-
hibits the other M27V160s from being pro-
grammed.
CHECK ALL WORDS
BYTEV
1st: V
=V
IH
PP
= 5V
= 3V
CC
Program Verify
2nd: V
CC
A verify (read) should be performed on the pro-
grammed bits to determine that they were correct-
ly programmed. The verify is accomplished with E
AI00901B
at V and G at V , V
at 12.5V and V
at
IH
IL
PP
CC
6.25V.
9/17
M27V160
On-Board Programming
ERASURE OPERATION (applies to UV EPROM)
The M27V160 can be directly programmed in the
application circuit. See the relevant Application
Note AN620.
The erasure characteristics of the M27V160 is
such that erasure begins when the cells are ex-
posed to light with wavelengths shorter than ap-
proximately 4000 Å. It should be noted that
sunlight and some type of fluorescent lamps have
wavelengths in the 3000-4000 Å range. Research
shows that constant exposure to room level fluo-
rescent lighting could erase a typical M27V160 in
about 3 years, while it would take approximately 1
week to cause erasure when exposed to direct
sunlight. If the M27V160 is to be exposed to these
types of lighting conditions for extended periods of
time, it is suggested that opaque labels be put over
the M27V160 window to prevent unintentional era-
sure. The recommended erasure procedure for
M27V160 is exposure to short wave ultraviolet
light which has a wavelength of 2537 Å. The inte-
grated dose (i.e. UV intensity x exposure time) for
Electronic Signature
The Electronic Signature (ES) mode allows the
reading out of a binary code from an EPROM that
will identify its manufacturer and type. This mode
is intended for use by programming equipment to
automatically match the device to be programmed
with its corresponding programming algorithm.
The ES mode is functional in the 25°C ± 5°C am-
bient temperature range that is required when pro-
gramming the M27V160. To activate the ES mode,
the programming equipment must force 11.5V to
12.5V on address line A9 of the M27V160, with
V
= V = 5V.
PP
CC
Two identifier bytes may then be sequenced from
the device outputs by toggling address line A0
2
erasure should be a minimum of 30 W-sec/cm .
from V to V . All other address lines must be
IL
IH
The erasure time with this dosage is approximate-
ly 30 to 40 minutes using an ultraviolet lamp with
held at V during Electronic Signature mode.
IL
2
12000 µW/cm power rating. The M27V160
Byte 0 (A0 = V ) represents the manufacturer
IL
should be placed within 2.5cm (1 inch) of the lamp
tubes during the erasure. Some lamps have a filter
on their tubes which should be removed before
erasure.
code and byte 1 (A0 = V ) the device identifier
IH
code. For the STMicroelectronics M27V160, these
two identifier bytes are given in Table 4 and can be
read-out on outputs Q7 to Q0. Note that the
M27V160 and M27C160 have the same identifier
bytes.
10/17
M27V160
Table 11. Ordering Information Scheme
Example:
M27V160
-100 X
M
1
TR
Device Type
M27
Supply Voltage
V = 3V to 3.6V
Device Function
160 = 16 Mbit (2Mb x 8 or 1Mb x 16)
Speed
(1)
-100 = 100 ns
-120 = 120 ns
-150 = 150 ns
V
CC
Tolerance
blank = 3.3V ± 10%
X = 3.3V ± 5%
Package
(2)
F = FDIP42W
B = PDIP42
S = SDIP42
K = PLCC44
(2)
M = SO44
Temperature Range
1 = 0 to 70 °C
6 = –40 to 85 °C
Options
TR = Tape & Reel Packing
Note: 1. High Speed, see AC Characteristics section for further information.
2. Packages option available on request. Please contact STMicroelectronics local Sales Office.
For a list of available options (Speed, Package, etc...) or for further information on any aspect of this de-
vice, please contact the STMicroelectronics Sales Office nearest to you.
Table 12. Revision History
Date
March 2000
23-Apr-2001
19-Jul-2001
21-Mar-2002
Revision Details
First Issue
PLCC44 package added
SDIP42 package added
SO44 package mechanical and data clarified
11/17
M27V160
Table 13. FDIP42W - 42 pin Ceramic Frit-seal DIP, with window, Package Mechanical Data
mm
Min
–
inches
Min
–
Symb
Typ
Max
5.72
1.40
4.57
4.50
0.56
–
Typ
Max
0.225
0.055
0.180
0.177
0.022
–
A
A1
A2
A3
B
0.51
3.91
3.89
0.41
–
0.020
0.154
0.153
0.016
–
B1
C
1.45
0.057
0.23
54.41
–
0.30
54.86
–
0.009
2.142
–
0.012
2.160
–
D
D2
E
50.80
15.24
2.000
0.600
–
–
–
–
E1
e
14.50
–
14.90
–
0.571
–
0.587
–
2.54
0.100
0.590
eA
eB
L
14.99
–
–
–
–
16.18
3.18
1.52
–
18.03
4.10
2.49
–
0.637
0.125
0.060
–
0.710
0.161
0.098
–
S
K
9.40
0.370
0.450
K1
α
11.43
–
–
–
–
4°
11°
4°
11°
N
42
42
Figure 10. FDIP42W - 42 pin Ceramic Frit-seal DIP, with window, Package Outline
A2
A3
A
L
A1
e1
α
B1
B
C
eA
eB
D2
D
S
N
1
K
E1
E
K1
FDIPW-b
Drawing is not to scale.
12/17
M27V160
Table 14. PDIP42 - 42 pin Plastic DIP, 600 mils width, Package Mechanical Data
mm
Min
–
inches
Min
–
Symb
Typ
Max
5.08
–
Typ
Max
0.200
–
A
A1
A2
B
0.25
3.56
0.38
1.27
0.20
52.20
–
0.010
0.140
0.015
0.050
0.008
2.055
–
4.06
0.53
1.65
0.36
52.71
–
0.160
0.021
0.065
0.014
2.075
–
B1
C
D
D2
E
50.80
15.24
2.000
0.600
–
–
–
–
E1
e1
eA
eB
L
13.59
–
13.84
–
0.535
–
0.545
–
2.54
0.100
0.590
14.99
–
–
–
–
15.24
3.18
0.86
0°
17.78
3.43
1.37
10°
0.600
0.125
0.034
0°
0.700
0.135
0.054
10°
S
α
N
42
42
Figure 11. PDIP42 - 42 pin Plastic DIP, 600 mils width, Package Outline
A2
A
L
A1
e1
α
C
B1
B
eA
eB
D2
D
S
N
1
E1
E
PDIP
Drawing is not to scale.
13/17
M27V160
Table 15. SDIP42 - 42 pin Shrink Plastic DIP, 600 mils width, Package Mechanical Data
millimeters
Min
inches
Min
Symbol
Typ
Max
Typ
Max
A
A1
A2
b
5.08
0.200
0.51
3.05
0.38
0.89
0.23
36.58
–
0.020
0.120
0.015
0.035
0.009
1.440
–
3.81
0.46
1.02
0.25
36.83
1.78
4.57
0.56
1.14
0.38
37.08
–
0.150
0.018
0.040
0.010
1.450
0.070
0.180
0.022
0.045
0.015
1.460
–
b2
c
D
e
E
15.24
12.70
–
16.00
14.48
–
0.600
0.500
–
0.630
0.570
–
E1
eA
eB
L
13.72
15.24
0.540
0.600
18.54
3.56
0.730
0.140
3.30
0.64
2.54
42
0.130
0.025
0.100
42
S
N
Figure 12. SDIP42 - 42 pin Shrink Plastic DIP, 600 mils width, Package Outline
A2
A1
A
L
c
b2
b
e
eA
eB
D2
D
S
N
1
E1
E
SDIP
Drawing is not to scale.
14/17
M27V160
Table 16. PLCC44 - 44 lead Plastic Leaded Chip Carrier, Package Mechanical Data
mm
Min
4.20
2.29
–
inches
Min
Symbol
Typ
Max
4.70
3.04
0.51
0.53
0.81
17.65
16.66
16.00
17.65
16.66
16.00
–
Typ
Max
0.185
0.120
0.020
0.021
0.032
0.695
0.656
0.630
0.695
0.656
0.630
–
A
A1
A2
B
0.165
0.090
–
0.33
0.66
17.40
16.51
14.99
17.40
16.51
14.99
–
0.013
0.026
0.685
0.650
0.590
0.685
0.650
0.590
–
B1
D
D1
D2
E
E1
E2
e
1.27
0.89
0.050
0.035
F
0.00
–
0.25
–
0.000
–
0.010
–
R
N
44
44
CP
0.10
0.004
Figure 13. PLCC44 - 44 lead Plastic Leaded Chip Carrier, Package Outline
D
A1
D1
A2
1 N
B1
e
Ne
E1 E
D2/E2
F
B
0.51 (.020)
1.14 (.045)
Nd
A
R
CP
PLCC
Drawing is not to scale.
15/17
M27V160
Table 17. SO44 - 44 lead Plastic Small Outline, 525 mils body width, Package Mechanical Data
millimeters
Min
inches
Min
Symbol
Typ
Max
Typ
Max
A
A1
A2
b
2.80
0.1102
0.10
2.20
0.35
0.10
0.0039
0.0866
0.0138
0.0039
2.30
0.40
0.15
2.40
0.50
0.20
0.08
13.50
16.25
28.40
–
0.0906
0.0157
0.0059
0.0945
0.0197
0.0079
0.0030
0.5315
0.6398
1.1181
–
C
CP
E
13.30
16.00
28.20
1.27
13.20
15.75
28.00
–
0.5236
0.6299
1.1102
0.0500
0.0315
0.5197
0.6201
1.1024
–
EH
D
e
L
0.80
N
44
44
α
8°
8°
Figure 14. SO44 - 44 lead Plastic Small Outline, 525 mils body width, Package Outline
A2
A
C
b
e
CP
D
N
E
EH
1
A1
α
L
SO-d
Drawing is not to scale.
16/17
M27V160
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is registered trademark of STMicroelectronics
All other names are the property of their respective owners.
© 2002 STMicroelectronics - All Rights Reserved
STMicroelectronics GROUP OF COMPANIES
Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan - Malaysia - Malta -
Morocco - Singapore - Spain - Sweden - Switzerland - United Kingdom - United States
www.st.com
17/17
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