M27V160-120M6TR [STMICROELECTRONICS]

1MX16 OTPROM, 120ns, PDSO44, 0.525 INCH, ROHS COMPLIANT, PLASTIC, SOP-44;
M27V160-120M6TR
型号: M27V160-120M6TR
厂家: ST    ST
描述:

1MX16 OTPROM, 120ns, PDSO44, 0.525 INCH, ROHS COMPLIANT, PLASTIC, SOP-44

可编程只读存储器 OTP只读存储器 光电二极管 内存集成电路
文件: 总17页 (文件大小:181K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
M27V160  
16 Mbit (2Mb x8 or 1Mb x16)  
Low Voltage UV EPROM and OTP EPROM  
3V to 3.6V LOW VOLTAGE in READ  
OPERATION  
ACCESS TIME: 100ns  
BYTE-WIDE or WORD-WIDE  
42  
42  
CONFIGURABLE  
1
1
16 Mbit MASK ROM REPLACEMENT  
LOW POWER CONSUMPTION  
– Active Current 30mA at 8MHz  
– Standby Current 60µA  
PDIP42 (B)  
FDIP42W (F)  
PROGRAMMING VOLTAGE: 12.5V ± 0.25V  
PROGRAMMING TIME: 50µs/word  
ELECTRONIC SIGNATURE  
– Manufacturer Code: 20h  
42  
1
SDIP42 (S)  
– Device Code: B1h  
DESCRIPTION  
The M27V160 is a low voltage 16 Mbit EPROM of-  
fered in the two ranges UV (ultra violet erase) and  
OTP (one time programmable). It is ideally suited  
for microprocessor systems requiring large data or  
program storage. It is organised as either 2 Mbit  
words of 8 bit or 1 Mbit words of 16 bit. The pin-out  
is compatible with a 16 Mbit Mask ROM.  
SO44 (M)  
PLCC44 (K)  
Figure 1. Logic Diagram  
The M27V160 operates in the read mode with a  
supply voltage as low as 3V. The decrease in op-  
erating power allows either a reduction of the size  
of the battery or an increase in the time between  
battery recharges.  
The FDIP42W (window ceramic frit-seal package)  
has a transparent lid which allows the user to ex-  
pose the chip to ultraviolet light to erase the bit pat-  
tern. A new pattern can then be written rapidly to  
the device by following the programming proce-  
dure.  
V
CC  
20  
Q15A–1  
A0-A19  
15  
Q0-Q14  
E
M27V160  
For applications where the content is programmed  
only one time and erasure is not required, the  
M27V160 is offered in PDIP42, SDIP42, PLCC44  
and SO44 packages.  
G
BYTEV  
PP  
V
SS  
AI01898  
March 2002  
1/17  
M27V160  
Figure 2A. DIP Connections  
Figure 2B. SO Connections  
NC  
A18  
A17  
A7  
A6  
A5  
A4  
A3  
A2  
A1  
A0  
E
1
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
NC  
A18  
A17  
A7  
1
2
3
4
5
6
7
8
9
42 A19  
41 A8  
2
A19  
A8  
3
40 A9  
4
A9  
A6  
39 A10  
38 A11  
37 A12  
36 A13  
35 A14  
34 A15  
33 A16  
32 BYTEV  
5
A10  
A11  
A12  
A13  
A14  
A15  
A16  
BYTEV  
A5  
6
A4  
7
A3  
8
A2  
9
A1  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
A0 10  
M27V160  
M27V160  
E
11  
12  
13  
PP  
PP  
V
31  
V
SS  
SS  
G
V
V
SS  
Q15A-1  
SS  
G
30 Q15A-1  
Q0 14  
Q8 15  
Q1 16  
Q9 17  
Q2 18  
29 Q7  
Q0  
Q8  
Q7  
28 Q14  
27 Q6  
Q14  
Q6  
Q1  
26 Q13  
25 Q5  
Q9  
Q13  
Q5  
Q2  
Q10 19  
Q3 20  
24 Q12  
23 Q4  
Q10  
Q3  
Q12  
Q4  
Q11 21  
22  
V
CC  
Q11  
V
CC  
AI01899  
AI01900  
Table 1. Signal Names  
Figure 2C. PLCC Connections  
A0-A19  
Q0-Q7  
Q8-Q14  
Q15A–1  
E
Address Inputs  
Data Outputs  
Data Outputs  
1 44  
A4  
A12  
A13  
A14  
A15  
A16  
Data Output / Address Input  
Chip Enable  
A3  
A2  
A1  
A0  
G
Output Enable  
E
12  
M27V160  
34 BYTEV  
PP  
V
V
BYTEV  
SS  
G
SS  
Byte Mode / Program Supply  
Supply Voltage  
PP  
Q15A–1  
Q0  
Q8  
Q1  
Q7  
V
V
CC  
SS  
Q14  
Q6  
Ground  
23  
NC  
Not Connected Internally  
AI04829  
2/17  
M27V160  
(1)  
Table 2. Absolute Maximum Ratings  
Symbol  
Parameter  
Value  
–40 to 125  
–50 to 125  
–65 to 150  
–2 to 7  
Unit  
°C  
°C  
°C  
V
(3)  
T
A
Ambient Operating Temperature  
T
Temperature Under Bias  
Storage Temperature  
Input or Output Voltage (except A9)  
Supply Voltage  
BIAS  
T
STG  
(2)  
V
IO  
V
–2 to 7  
V
CC  
(2)  
A9 Voltage  
–2 to 13.5  
–2 to 14  
V
V
A9  
V
Program Supply Voltage  
V
PP  
Note: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings" may  
cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions  
above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating condi-  
tions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant qual-  
ity documents.  
2. Minimum DC voltage on Input or Output is –0.5V with possible undershoot to –2.0V for a period less than 20ns. Maximum DC  
voltage on Output is V  
3. Depends on range.  
+0.5V with possible overshoot to V  
+2V for a period less than 20ns.  
CC  
CC  
Table 3. Operating Modes  
Mode  
BYTEV  
E
G
A9  
X
Q15A–1  
Q14-Q8  
Data Out  
Hi-Z  
Q7-Q0  
Data Out  
Data Out  
Data Out  
Hi-Z  
PP  
V
V
V
IH  
Read Word-wide  
Data Out  
IL  
IL  
IL  
IL  
IL  
IL  
IL  
V
V
V
V
V
V
V
V
IH  
Read Byte-wide Upper  
Read Byte-wide Lower  
Output Disable  
X
IL  
V
V
IL  
X
Hi-Z  
IL  
X
X
Hi-Z  
Data In  
Data Out  
Hi-Z  
Hi-Z  
IH  
IH  
V
Pulse  
V
V
PP  
Program  
X
Data In  
Data Out  
Hi-Z  
Data In  
Data Out  
Hi-Z  
IL  
V
V
V
V
PP  
Verify  
X
IH  
IH  
IH  
IL  
V
V
V
PP  
Program Inhibit  
Standby  
X
IH  
X
X
X
Hi-Z  
Hi-Z  
Hi-Z  
V
IL  
V
V
IH  
V
ID  
Electronic Signature  
Code  
Codes  
Codes  
IL  
Note: X = V or V , V = 12V ± 0.5V.  
IH IL ID  
Table 4. Electronic Signature  
Q15  
and  
Q7  
Q14  
and  
Q6  
Q13  
and  
Q5  
Q12  
and  
Q4  
Q11  
and  
Q3  
Q10  
and  
Q2  
Q9  
and  
Q1  
Q8  
and  
Q0  
Identifier  
A0  
Hex Data  
V
Manufacturer’s Code  
Device Code  
0
1
0
0
1
1
0
1
0
0
0
0
0
0
0
1
20h  
B1h  
IL  
V
IH  
3/17  
M27V160  
Table 5. AC Measurement Conditions  
High Speed  
10ns  
Standard  
20ns  
Input Rise and Fall Times  
Input Pulse Voltages  
0 to 3V  
1.5V  
0.4V to 2.4V  
0.8V and 2V  
Input and Output Timing Ref. Voltages  
Figure 3. AC Testing Input Output Waveform  
Figure 4. AC Testing Load Circuit  
1.3V  
High Speed  
1N914  
3V  
1.5V  
3.3k  
0V  
DEVICE  
UNDER  
TEST  
OUT  
Standard  
C
L
2.4V  
2.0V  
0.8V  
0.4V  
C
C
C
= 30pF for High Speed  
= 100pF for Standard  
includes JIG capacitance  
L
L
L
AI01822  
AI01823B  
(1)  
Table 6. Capacitance  
Symbol  
(T = 25 °C, f = 1 MHz)  
A
Parameter  
Test Condition  
Min  
Max  
10  
Unit  
pF  
Input Capacitance (except BYTEV  
)
V
V
= 0V  
= 0V  
= 0V  
PP  
IN  
IN  
C
IN  
Input Capacitance (BYTEV  
Output Capacitance  
)
PP  
120  
12  
pF  
C
V
OUT  
pF  
OUT  
Note: 1. Sampled only, not 100% tested.  
DEVICE OPERATION  
lower 8 bits of the 16 bit data are selected and with  
A–1 at V the upper 8 bits of the 16 bit data are  
IH  
The operating modes of the M27V160 are listed in  
the Operating Modes Table. A single power supply  
is required in the read mode. All inputs are TTL  
compatible except for V and 12V on A9 for the  
Electronic Signature.  
selected.  
The M27V160 has two control functions, both of  
which must be logically active in order to obtain  
data at the outputs. In addition the Word-wide or  
Byte- wide organisation must be selected.  
PP  
Read Mode  
Chip Enable (E) is the power control and should be  
used for device selection. Output Enable (G) is the  
output control and should be used to gate data to  
the output pins independent of device selection.  
Assuming that the addresses are stable, the ad-  
The M27V160 has two organisations, Word-wide  
and Byte-wide. The organisation is selected by the  
signal level on the BYTEV pin. When BYTEV  
PP  
PP  
is at V the Word-wide organisation is selected  
IH  
and the Q15A–1 pin is used for Q15 Data Output.  
dress access time (t  
) is equal to the delay  
). Data is available at the  
AVQV  
When the BYTEV pin is at V the Byte-wide or-  
PP  
IL  
from E to output (t  
ELQV  
ganisation is selected and the Q15A–1 pin is used  
for the Address Input A–1. When the memory is  
logically regarded as 16 bit wide, but read in the  
output after a delay of t  
from the falling edge  
GLQV  
of G, assuming that E has been low and the ad-  
dresses have been stable for at least t -t  
.
AVQV GLQV  
Byte-wide organisation, then with A–1 at V the  
IL  
4/17  
M27V160  
(1)  
Table 7. Read Mode DC Characteristics  
(T = 0 to 70°C or –40 to 85°C; V = 3.3V ± 10%; V = V  
)
A
CC  
PP  
CC  
Symbol  
Parameter  
Input Leakage Current  
Output Leakage Current  
Test Condition  
Min  
Max  
±1  
Unit  
µA  
I
LI  
0V V V  
IN  
CC  
I
0V V  
V  
OUT CC  
±10  
µA  
LO  
E = V , G = V , I  
= 0mA,  
IL  
IL OUT  
30  
20  
mA  
mA  
f = 8MHz, V 3.6V  
CC  
I
Supply Current  
CC  
E = V , G = V , I  
= 0mA,  
IL  
IL OUT  
f = 5MHz, V 3.6V  
CC  
I
E = V  
Supply Current (Standby) TTL  
Supply Current (Standby) CMOS  
Program Current  
1
mA  
µA  
µA  
CC1  
IH  
I
E > V – 0.2V, V 3.6V  
60  
10  
CC2  
CC  
CC  
I
V
= V  
PP CC  
PP  
V
0.2V  
CC  
Input Low Voltage  
–0.3  
V
IL  
(2)  
0.7V  
V + 1  
CC  
Input High Voltage  
V
V
V
V
CC  
IH  
V
I
= 2.1mA  
Output Low Voltage  
Output High Voltage TTL  
0.4  
OL  
OL  
V
I
= –400µA  
2.4  
OH  
OH  
Note: 1. V must be applied simultaneously with or before V and removed simultaneously or after V .  
PP  
CC  
PP  
2. Maximum DC voltage on Output is V +0.5V.  
CC  
Standby Mode  
System Considerations  
The M27V160 has a standby mode which reduces  
the active current from 20mA to 20µA with low volt-  
The power switching characteristics of Advanced  
CMOS EPROMs require careful decoupling of the  
age operation V  
3.6V, see Read Mode DC  
supplies to the devices. The supply current I  
CC  
CC  
Characteristics table for details.The M27V160 is  
placed in the standby mode by applying a CMOS  
high signal to the E input. When in the standby  
mode, the outputs are in a high impedance state,  
independent of the G input.  
has three segments of importance to the system  
designer: the standby current, the active current  
and the transient peaks that are produced by the  
falling and rising edges of E. The magnitude of the  
transient current peaks is dependent on the ca-  
pacitive and inductive loading of the device out-  
puts. The associated transient voltage peaks can  
be suppressed by complying with the two line out-  
put control and by properly selected decoupling  
capacitors. It is recommended that a 0.1µF ceram-  
Two Line Output Control  
Because EPROMs are usually used in larger  
memory arrays, this product features a 2 line con-  
trol function which accommodates the use of mul-  
tiple memory connection. The two line control  
function allows:  
a. the lowest possible memory power dissipation,  
b. complete assurance that output bus contention  
will not occur.  
For the most efficient use of these two control  
lines, E should be decoded and used as the prima-  
ry device selecting function, while G should be  
made a common connection to all devices in the  
array and connected to the READ line from the  
system control bus. This ensures that all deselect-  
ed memory devices are in their low power standby  
mode and that the output pins are only active  
when data is required from a particular memory  
device.  
ic capacitor is used on every device between V  
CC  
and V . This should be a high frequency type of  
SS  
low inherent inductance and should be placed as  
close as possible to the device. In addition, a  
4.7µF electrolytic capacitor should be used be-  
tween V  
and V for every eight devices. This  
CC  
SS  
capacitor should be mounted near the power sup-  
ply connection point. The purpose of this capacitor  
is to overcome the voltage drop caused by the in-  
ductive effects of PCB traces.  
5/17  
M27V160  
(1)  
Table 8. Read Mode AC Characteristics  
(T = 0 to 70°C or –40 to 85°C; V = 3.3V ± 10%; V = V  
)
A
CC  
PP  
CC  
M27V160  
-120  
(3)  
Symbol  
Alt  
Parameter  
Test Condition  
-150  
Unit  
-100  
Min Max Min Max Min Max  
t
t
E = V , G = V  
Address Valid to Output Valid  
BYTE High to Output Valid  
100  
100  
100  
120  
120  
120  
150  
150  
150  
ns  
ns  
ns  
AVQV  
ACC  
IL  
IL  
t
t
ST  
E = V , G = V  
BHQV  
IL  
IL  
t
t
G = V  
Chip Enable Low to Output Valid  
ELQV  
CE  
IL  
Output Enable Low to Output  
Valid  
t
t
E = V  
50  
60  
60  
ns  
GLQV  
OE  
IL  
(2)  
t
E = V , G = V  
BYTE Low to Output Hi-Z  
45  
45  
50  
50  
50  
50  
ns  
ns  
t
STD  
IL  
IL  
BLQZ  
(2)  
t
G = V  
Chip Enable High to Output Hi-Z  
0
0
0
0
0
0
t
DF  
DF  
IL  
EHQZ  
Output Enable High to Output  
Hi-Z  
(2)  
t
E = V  
45  
50  
50  
ns  
t
IL  
GHQZ  
Address Transition to Output  
Transition  
t
t
E = V , G = V  
5
5
5
5
5
5
ns  
ns  
AXQX  
OH  
IL  
IL  
t
t
E = V , G = V  
BYTE Low to Output Transition  
BLQX  
OH  
IL  
IL  
Note: 1. V must be applied simultaneously with or before V and removed simultaneously or after V  
PP  
CC  
PP  
2. Sampled only, not 100% tested.  
3. Speed obtained with High Speed measurement conditions.  
Figure 5. Word-Wide Read Mode AC Waveforms  
VALID  
VALID  
A0-A19  
tAVQV  
tAXQX  
E
tEHQZ  
tGHQZ  
tGLQV  
G
tELQV  
Hi-Z  
Q0-Q15  
AI00741B  
Note: BYTEV = V  
PP  
.
IH  
6/17  
M27V160  
Figure 6. Byte-Wide Read Mode AC Waveforms  
VALID  
VALID  
A–1,A0-A19  
tAVQV  
tAXQX  
E
tEHQZ  
tGHQZ  
tGLQV  
G
tELQV  
Hi-Z  
Q0-Q7  
AI00742B  
Note: BYTEV = V  
.
IL  
PP  
Figure 7. BYTE Transition AC Waveforms  
A0-A19  
VALID  
A–1  
VALID  
tAVQV  
tAXQX  
BYTEV  
PP  
tBHQV  
Q0-Q7  
tBLQX  
Q8-Q15  
tBLQZ  
DATA OUT  
Hi-Z  
DATA OUT  
AI00743C  
Note: Chip Enable (E) and Output Enable (G) = V  
.
IL  
7/17  
M27V160  
(1)  
Table 9. Programming Mode DC Characteristics  
(T = 25 °C; V = 6.25V ± 0.25V; V = 12.5V ± 0.25V)  
A
CC  
PP  
Symbol  
Parameter  
Test Condition  
Min  
Max  
±1  
Unit  
µA  
mA  
mA  
V
I
LI  
0 V V  
Input Leakage Current  
Supply Current  
IN  
CC  
I
50  
CC  
I
PP  
E = V  
Program Current  
Input Low Voltage  
Input High Voltage  
Output Low Voltage  
Output High Voltage TTL  
A9 Voltage  
50  
IL  
V
–0.3  
2.4  
0.8  
IL  
V
V
+ 0.5  
V
IH  
CC  
V
I
OL  
= 2.1mA  
0.4  
V
OL  
V
I
= –2.5mA  
3.6  
V
OH  
OH  
V
11.5  
12.5  
V
ID  
Note: 1. V must be applied simultaneously with or before V and removed simultaneously or after V .  
PP  
CC  
PP  
(1)  
Table 10. Programming Mode AC Characteristics  
(T = 25 °C; V = 6.25V ± 0.25V; V = 12.5V ± 0.25V)  
A
CC  
PP  
Symbol  
Alt  
Parameter  
Test Condition  
Min  
Max  
Unit  
t
t
t
t
Address Valid to Chip Enable Low  
Input Valid to Chip Enable Low  
2
2
µs  
µs  
µs  
µs  
µs  
µs  
µs  
ns  
ns  
AVEL  
AS  
QVEL  
VPHAV  
VCHAV  
DS  
t
t
t
V
V
High to Address Valid  
High to Address Valid  
2
VPS  
VCS  
PP  
CC  
t
2
t
t
PW  
Chip Enable Program Pulse Width  
Chip Enable High to Input Transition  
Input Transition to Output Enable Low  
Output Enable Low to Output Valid  
Output Enable High to Output Hi-Z  
45  
2
55  
ELEH  
t
t
DH  
EHQX  
t
t
2
QXGL  
GLQV  
OES  
t
t
120  
130  
OE  
(2)  
t
0
0
t
DFP  
GHQZ  
Output Enable High to Address  
Transition  
t
t
ns  
GHAX  
AH  
Note: 1. V must be applied simultaneously with or before V and removed simultaneously or after V .  
PP  
CC  
PP  
2. Sampled only, not 100% tested.  
Programming  
cations. Although only '0's will be programmed,  
both '1's and '0's can be present in the data word.  
The only way to change a '0' to a '1' is by die expo-  
sure to ultraviolet light (UV EPROM). The  
The M27V160 has been designed to be fully com-  
patible with the M27C160. As a result the  
M27V160 can be programmed as the M27C160  
on the same programming equipments applying  
M27V160 is in the programming mode when V  
pp  
input is at 12.5V, G is at V and E is pulsed to V .  
IH  
IL  
12.75V on V and 6.25V on V by the use of the  
PP  
CC  
The data to be programmed is applied to 16 bits in  
parallel to the data output pins. The levels required  
same PRESTO III algorithm. When delivered (and  
after each erasure for UV EPROM), all bits of the  
M27V160 are in the '1' state. Data is introduced by  
selectively programming '0's to the desired bit lo-  
for the address and data inputs are TTL. V  
specified to be 6.25V ± 0.25V.  
is  
CC  
8/17  
M27V160  
Figure 8. Programming and Verify Modes AC Waveforms  
A0-A19  
Q0-Q15  
VALID  
tAVEL  
DATA IN  
tQVEL  
DATA OUT  
tEHQX  
BYTEV  
PP  
tVPHAV  
tVCHAV  
tGLQV  
tGHQZ  
V
E
CC  
tGHAX  
tELEH  
tQXGL  
G
PROGRAM  
VERIFY  
AI00744  
Figure 9. Programming Flowchart  
PRESTO III Programming Algorithm  
The PRESTO III Programming Algorithm allows  
the whole array to be programed with a guaran-  
teed margin in a typical time of 52.5 seconds. Pro-  
gramming with PRESTO III consists of applying a  
sequence of 50µs program pulses to each word  
until a correct verify occurs (see Figure 9).  
V
= 6.25V, V  
= 12.5V  
PP  
CC  
n = 0  
During programing and verify operation a MAR-  
GIN MODE circuit is automatically activated to  
guarantee that each cell is programed with enough  
margin. No overprogram pulse is applied since the  
E = 50µs Pulse  
verify in MARGIN MODE at V much higher than  
NO  
CC  
3.6V provides the necessary margin to each pro-  
grammed cell.  
Program Inhibit  
Programming of multiple M27V160s in parallel  
with different data is also easily accomplished. Ex-  
cept for E, all like inputs including G of the parallel  
M27V160 may be common. A TTL low level pulse  
NO  
++n  
= 25  
VERIFY  
YES  
++ Addr  
YES  
Last  
NO  
FAIL  
Addr  
applied to a M27V160's E input and V at 12.5V,  
PP  
YES  
will program that M27V160. A high level E input in-  
hibits the other M27V160s from being pro-  
grammed.  
CHECK ALL WORDS  
BYTEV  
1st: V  
=V  
IH  
PP  
= 5V  
= 3V  
CC  
Program Verify  
2nd: V  
CC  
A verify (read) should be performed on the pro-  
grammed bits to determine that they were correct-  
ly programmed. The verify is accomplished with E  
AI00901B  
at V and G at V , V  
at 12.5V and V  
at  
IH  
IL  
PP  
CC  
6.25V.  
9/17  
M27V160  
On-Board Programming  
ERASURE OPERATION (applies to UV EPROM)  
The M27V160 can be directly programmed in the  
application circuit. See the relevant Application  
Note AN620.  
The erasure characteristics of the M27V160 is  
such that erasure begins when the cells are ex-  
posed to light with wavelengths shorter than ap-  
proximately 4000 Å. It should be noted that  
sunlight and some type of fluorescent lamps have  
wavelengths in the 3000-4000 Å range. Research  
shows that constant exposure to room level fluo-  
rescent lighting could erase a typical M27V160 in  
about 3 years, while it would take approximately 1  
week to cause erasure when exposed to direct  
sunlight. If the M27V160 is to be exposed to these  
types of lighting conditions for extended periods of  
time, it is suggested that opaque labels be put over  
the M27V160 window to prevent unintentional era-  
sure. The recommended erasure procedure for  
M27V160 is exposure to short wave ultraviolet  
light which has a wavelength of 2537 Å. The inte-  
grated dose (i.e. UV intensity x exposure time) for  
Electronic Signature  
The Electronic Signature (ES) mode allows the  
reading out of a binary code from an EPROM that  
will identify its manufacturer and type. This mode  
is intended for use by programming equipment to  
automatically match the device to be programmed  
with its corresponding programming algorithm.  
The ES mode is functional in the 25°C ± 5°C am-  
bient temperature range that is required when pro-  
gramming the M27V160. To activate the ES mode,  
the programming equipment must force 11.5V to  
12.5V on address line A9 of the M27V160, with  
V
= V = 5V.  
PP  
CC  
Two identifier bytes may then be sequenced from  
the device outputs by toggling address line A0  
2
erasure should be a minimum of 30 W-sec/cm .  
from V to V . All other address lines must be  
IL  
IH  
The erasure time with this dosage is approximate-  
ly 30 to 40 minutes using an ultraviolet lamp with  
held at V during Electronic Signature mode.  
IL  
2
12000 µW/cm power rating. The M27V160  
Byte 0 (A0 = V ) represents the manufacturer  
IL  
should be placed within 2.5cm (1 inch) of the lamp  
tubes during the erasure. Some lamps have a filter  
on their tubes which should be removed before  
erasure.  
code and byte 1 (A0 = V ) the device identifier  
IH  
code. For the STMicroelectronics M27V160, these  
two identifier bytes are given in Table 4 and can be  
read-out on outputs Q7 to Q0. Note that the  
M27V160 and M27C160 have the same identifier  
bytes.  
10/17  
M27V160  
Table 11. Ordering Information Scheme  
Example:  
M27V160  
-100 X  
M
1
TR  
Device Type  
M27  
Supply Voltage  
V = 3V to 3.6V  
Device Function  
160 = 16 Mbit (2Mb x 8 or 1Mb x 16)  
Speed  
(1)  
-100 = 100 ns  
-120 = 120 ns  
-150 = 150 ns  
V
CC  
Tolerance  
blank = 3.3V ± 10%  
X = 3.3V ± 5%  
Package  
(2)  
F = FDIP42W  
B = PDIP42  
S = SDIP42  
K = PLCC44  
(2)  
M = SO44  
Temperature Range  
1 = 0 to 70 °C  
6 = –40 to 85 °C  
Options  
TR = Tape & Reel Packing  
Note: 1. High Speed, see AC Characteristics section for further information.  
2. Packages option available on request. Please contact STMicroelectronics local Sales Office.  
For a list of available options (Speed, Package, etc...) or for further information on any aspect of this de-  
vice, please contact the STMicroelectronics Sales Office nearest to you.  
Table 12. Revision History  
Date  
March 2000  
23-Apr-2001  
19-Jul-2001  
21-Mar-2002  
Revision Details  
First Issue  
PLCC44 package added  
SDIP42 package added  
SO44 package mechanical and data clarified  
11/17  
M27V160  
Table 13. FDIP42W - 42 pin Ceramic Frit-seal DIP, with window, Package Mechanical Data  
mm  
Min  
inches  
Min  
Symb  
Typ  
Max  
5.72  
1.40  
4.57  
4.50  
0.56  
Typ  
Max  
0.225  
0.055  
0.180  
0.177  
0.022  
A
A1  
A2  
A3  
B
0.51  
3.91  
3.89  
0.41  
0.020  
0.154  
0.153  
0.016  
B1  
C
1.45  
0.057  
0.23  
54.41  
0.30  
54.86  
0.009  
2.142  
0.012  
2.160  
D
D2  
E
50.80  
15.24  
2.000  
0.600  
E1  
e
14.50  
14.90  
0.571  
0.587  
2.54  
0.100  
0.590  
eA  
eB  
L
14.99  
16.18  
3.18  
1.52  
18.03  
4.10  
2.49  
0.637  
0.125  
0.060  
0.710  
0.161  
0.098  
S
K
9.40  
0.370  
0.450  
K1  
α
11.43  
4°  
11°  
4°  
11°  
N
42  
42  
Figure 10. FDIP42W - 42 pin Ceramic Frit-seal DIP, with window, Package Outline  
A2  
A3  
A
L
A1  
e1  
α
B1  
B
C
eA  
eB  
D2  
D
S
N
1
K
E1  
E
K1  
FDIPW-b  
Drawing is not to scale.  
12/17  
M27V160  
Table 14. PDIP42 - 42 pin Plastic DIP, 600 mils width, Package Mechanical Data  
mm  
Min  
inches  
Min  
Symb  
Typ  
Max  
5.08  
Typ  
Max  
0.200  
A
A1  
A2  
B
0.25  
3.56  
0.38  
1.27  
0.20  
52.20  
0.010  
0.140  
0.015  
0.050  
0.008  
2.055  
4.06  
0.53  
1.65  
0.36  
52.71  
0.160  
0.021  
0.065  
0.014  
2.075  
B1  
C
D
D2  
E
50.80  
15.24  
2.000  
0.600  
E1  
e1  
eA  
eB  
L
13.59  
13.84  
0.535  
0.545  
2.54  
0.100  
0.590  
14.99  
15.24  
3.18  
0.86  
0°  
17.78  
3.43  
1.37  
10°  
0.600  
0.125  
0.034  
0°  
0.700  
0.135  
0.054  
10°  
S
α
N
42  
42  
Figure 11. PDIP42 - 42 pin Plastic DIP, 600 mils width, Package Outline  
A2  
A
L
A1  
e1  
α
C
B1  
B
eA  
eB  
D2  
D
S
N
1
E1  
E
PDIP  
Drawing is not to scale.  
13/17  
M27V160  
Table 15. SDIP42 - 42 pin Shrink Plastic DIP, 600 mils width, Package Mechanical Data  
millimeters  
Min  
inches  
Min  
Symbol  
Typ  
Max  
Typ  
Max  
A
A1  
A2  
b
5.08  
0.200  
0.51  
3.05  
0.38  
0.89  
0.23  
36.58  
0.020  
0.120  
0.015  
0.035  
0.009  
1.440  
3.81  
0.46  
1.02  
0.25  
36.83  
1.78  
4.57  
0.56  
1.14  
0.38  
37.08  
0.150  
0.018  
0.040  
0.010  
1.450  
0.070  
0.180  
0.022  
0.045  
0.015  
1.460  
b2  
c
D
e
E
15.24  
12.70  
16.00  
14.48  
0.600  
0.500  
0.630  
0.570  
E1  
eA  
eB  
L
13.72  
15.24  
0.540  
0.600  
18.54  
3.56  
0.730  
0.140  
3.30  
0.64  
2.54  
42  
0.130  
0.025  
0.100  
42  
S
N
Figure 12. SDIP42 - 42 pin Shrink Plastic DIP, 600 mils width, Package Outline  
A2  
A1  
A
L
c
b2  
b
e
eA  
eB  
D2  
D
S
N
1
E1  
E
SDIP  
Drawing is not to scale.  
14/17  
M27V160  
Table 16. PLCC44 - 44 lead Plastic Leaded Chip Carrier, Package Mechanical Data  
mm  
Min  
4.20  
2.29  
inches  
Min  
Symbol  
Typ  
Max  
4.70  
3.04  
0.51  
0.53  
0.81  
17.65  
16.66  
16.00  
17.65  
16.66  
16.00  
Typ  
Max  
0.185  
0.120  
0.020  
0.021  
0.032  
0.695  
0.656  
0.630  
0.695  
0.656  
0.630  
A
A1  
A2  
B
0.165  
0.090  
0.33  
0.66  
17.40  
16.51  
14.99  
17.40  
16.51  
14.99  
0.013  
0.026  
0.685  
0.650  
0.590  
0.685  
0.650  
0.590  
B1  
D
D1  
D2  
E
E1  
E2  
e
1.27  
0.89  
0.050  
0.035  
F
0.00  
0.25  
0.000  
0.010  
R
N
44  
44  
CP  
0.10  
0.004  
Figure 13. PLCC44 - 44 lead Plastic Leaded Chip Carrier, Package Outline  
D
A1  
D1  
A2  
1 N  
B1  
e
Ne  
E1 E  
D2/E2  
F
B
0.51 (.020)  
1.14 (.045)  
Nd  
A
R
CP  
PLCC  
Drawing is not to scale.  
15/17  
M27V160  
Table 17. SO44 - 44 lead Plastic Small Outline, 525 mils body width, Package Mechanical Data  
millimeters  
Min  
inches  
Min  
Symbol  
Typ  
Max  
Typ  
Max  
A
A1  
A2  
b
2.80  
0.1102  
0.10  
2.20  
0.35  
0.10  
0.0039  
0.0866  
0.0138  
0.0039  
2.30  
0.40  
0.15  
2.40  
0.50  
0.20  
0.08  
13.50  
16.25  
28.40  
0.0906  
0.0157  
0.0059  
0.0945  
0.0197  
0.0079  
0.0030  
0.5315  
0.6398  
1.1181  
C
CP  
E
13.30  
16.00  
28.20  
1.27  
13.20  
15.75  
28.00  
0.5236  
0.6299  
1.1102  
0.0500  
0.0315  
0.5197  
0.6201  
1.1024  
EH  
D
e
L
0.80  
N
44  
44  
α
8°  
8°  
Figure 14. SO44 - 44 lead Plastic Small Outline, 525 mils body width, Package Outline  
A2  
A
C
b
e
CP  
D
N
E
EH  
1
A1  
α
L
SO-d  
Drawing is not to scale.  
16/17  
M27V160  
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences  
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted  
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject  
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not  
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.  
The ST logo is registered trademark of STMicroelectronics  
All other names are the property of their respective owners.  
© 2002 STMicroelectronics - All Rights Reserved  
STMicroelectronics GROUP OF COMPANIES  
Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan - Malaysia - Malta -  
Morocco - Singapore - Spain - Sweden - Switzerland - United Kingdom - United States  
www.st.com  
17/17  

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