M76DW63000A-70ZT [STMICROELECTRONICS]

64Mbit (x8/ x16, Multiple Bank, Boot Block) Flash Memory and 8Mbit/4Mbit SRAM, 3V Supply, Multiple Memory Product; 64Mbit的( X8 / X16 ,多个银行,引导块)快闪记忆体和8Mbit的/ 4Mbit的SRAM , 3V电源,多个存储产品
M76DW63000A-70ZT
型号: M76DW63000A-70ZT
厂家: ST    ST
描述:

64Mbit (x8/ x16, Multiple Bank, Boot Block) Flash Memory and 8Mbit/4Mbit SRAM, 3V Supply, Multiple Memory Product
64Mbit的( X8 / X16 ,多个银行,引导块)快闪记忆体和8Mbit的/ 4Mbit的SRAM , 3V电源,多个存储产品

存储 静态存储器
文件: 总27页 (文件大小:407K)
中文:  中文翻译
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M76DW63000A  
M76DW62000A  
64Mbit (x8/ x16, Multiple Bank, Boot Block) Flash Memory and  
8Mbit/4Mbit SRAM, 3V Supply, Multiple Memory Product  
PRELIMINARY DATA  
FEATURES SUMMARY  
MULTIPLE MEMORY PRODUCT  
Figure 1. Package  
– 64 Mbit (8Mb x8 or 4Mb x16), Multiple Bank,  
Page, Boot Block, Flash Memory  
– SRAM: 8Mbit (512K x 16) for  
M76DW63000A, or 4Mbit (256K x 16) for  
M76DW62000A  
SUPPLY VOLTAGE  
FBGA  
– V  
– V  
= V  
= 2.7V to 3.3V  
CCF  
PPF  
CCS  
= 12V for Fast Program (optional)  
ACCESS TIME: 70, 90ns  
LOW POWER CONSUMPTION  
ELECTRONIC SIGNATURE  
– Manufacturer Code: 0020h  
LFBGA73 (ZA)  
8 x 11.6mm  
– Device Code: 227Eh + 2202h + 2201h  
FLASH MEMORY  
ASYNCHRONOUS PAGE READ MODE  
– Page Width: 4 Words  
– Page Access: 25, 30ns  
V /WP PIN for FAST PROGRAM and WRITE  
– Random Access: 70, 90ns  
PROGRAMMING TIME  
– 10µs per Byte/Word typical  
– 4 Words/ 8 Bytes at-a-time Program  
MEMORY BLOCKS  
PP  
PROTECT  
TEMPORARY BLOCK UNPROTECTION  
MODE  
COMMON FLASH INTERFACE  
– 64 bit Security Code  
– Quadruple Bank Memory Array:  
8Mbits + 24Mbits + 24Mbits + 8Mbits  
EXTENDED MEMORY BLOCK  
– Extra block used as security block or to store  
additional information  
– Parameter Blocks (at both Top and Bottom)  
DUAL OPERATIONS  
100,000 PROGRAM/ERASE CYCLES per  
– While Program or Erase in a group of banks  
(from 1 to 3), Read in any of the other banks  
BLOCK  
SRAM  
PROGRAM/ERASE SUSPEND and RESUME  
8Mbit (512K x 16) or 4Mbit (256K x 16)  
MODES  
ACCESS TIME: 70ns  
– Read from any Block during Program  
Suspend  
LOW V  
DATA RETENTION: 1.5V  
CCS  
– Read and Program another Block during  
Erase Suspend  
POWER DOWN FEATURES USING TWO  
CHIP ENABLE INPUTS  
UNLOCK BYPASS PROGRAM COMMAND  
– Faster Production/Batch Programming  
September 2003  
1/27  
This is preliminary information on a new product now in development or undergoing evaluation. Details are subject to change without notice.  
M76DW63000A, M76DW62000A  
TABLE OF CONTENTS  
SUMMARY DESCRIPTION. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4  
Figure 2. Logic Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4  
Table 1. Signal Names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4  
Figure 3. LFBGA Connections (Top view through package). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5  
SIGNAL DESCRIPTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
Address Inputs (A0-A21). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
Data Inputs/Outputs (DQ0-DQ7). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
Data Inputs/Outputs (DQ8-DQ14). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
Data Input/Output or Address Input (DQ15A–1).. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
Flash Chip Enable (EF). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
Output Enable (G). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
Write Enable (W). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
V
Write Protect (V WP). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
PP/ PP/  
Reset/Block Temporary Unprotect (RPF).. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
Ready/Busy Output (RB). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7  
Byte/Word Organization Select (BYTE). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7  
SRAM Chip Enable (E1S, E2S). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7  
SRAM Upper Byte Enable (UBS). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7  
SRAM Lower Byte Enable (LBS). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7  
V
V
V
Supply Voltage (2.7V to 3.3V).. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7  
Supply Voltage (2.7V to 3.3V).. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7  
CCF  
CCS  
Ground.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7  
SS  
FUNCTIONAL DESCRIPTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
Figure 4. Functional Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
Table 2. Main Operation Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9  
MAXIMUM RATING. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
Table 3. Absolute Maximum Ratings. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
DC AND AC PARAMETERS. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
Table 4. Operating and AC Measurement Conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
Figure 5. AC Measurement I/O Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
Figure 6. AC Measurement Load Circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
Table 5. Device Capacitance. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
Table 6. Flash Memory DC Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12  
Table 7. SRAM DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13  
PACKAGE MECHANICAL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14  
Figure 7. Stacked LFBGA73 8x11.6mm, 10x12 array, 0.8mm pitch, Bottom View Package Outline14  
Table 8. Stacked LFBGA73 8x11.6mm, 10x12 array, 0.8mm pitch, Package Mechanical Data. . . 15  
2/27  
M76DW63000A, M76DW62000A  
PART NUMBERING . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16  
Table 9. Ordering Information Scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16  
FLASH MEMORY DEVICE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17  
SRAM DEVICE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17  
SRAM SUMMARY DESCRIPTION. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17  
Figure 8. SRAM Logic Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17  
SRAM OPERATIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
Write . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
Standby/Power-Down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
Data Retention . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
Output Disable . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
Figure 9. SRAM Read Mode AC Waveforms, Address Controlled . . . . . . . . . . . . . . . . . . . . . . 19  
Figure 10. SRAM Read AC Waveforms, G Controlled . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19  
Figure 11. SRAM Standby AC Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19  
Table 10. SRAM Read AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20  
Figure 12. SRAM Write AC Waveforms, W Controlled . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21  
Figure 13. SRAM Write AC Waveforms, E1S Controlled . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22  
Figure 14. SRAM Write AC Waveforms, W Controlled with G Low. . . . . . . . . . . . . . . . . . . . . . 23  
Figure 15. SRAM Write Cycle Waveform, UBS and LBS Controlled, G Low . . . . . . . . . . . . . . 23  
Table 11. SRAM Write AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24  
Figure 16. SRAM Low V  
Data Retention AC Waveforms, E1 or UB / LB Controlled . . 25  
S S S  
CCS  
CCS  
Table 12. SRAM Low V  
Data Retention Characteristic. . . . . . . . . . . . . . . . . . . . . . . . . . . . 25  
REVISION HISTORY. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26  
Table 13. Document Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26  
3/27  
M76DW63000A, M76DW62000A  
SUMMARY DESCRIPTION  
The M76DW62000A is a low voltage Multiple  
Memory Product which combines two memory de-  
vices; a 64 Mbit Multiple Bank, Boot Block Flash  
memory (M29DW640D) and an 8 or 4Mbit SRAM.  
This document should be read in conjunction with  
the M29DW640D datasheet.  
Recommended operating conditions do not allow  
both the Flash and SRAM devices to be active at  
the same time.  
Table 1. Signal Names  
1
Address Inputs  
A0-A21  
DQ0-DQ7  
DQ8-DQ14  
DQ15A–1  
G
Data Inputs/Outputs  
Data Inputs/Outputs  
Data Input/Output or Address Input  
Output Enable input  
The memory is offered in an LFBGA73  
(8 x 11.6mm, 0.8 mm pitch) package and is sup-  
plied with all the bits erased (set to ‘1’).  
W
Write Enable input  
V
CCF  
Flash Power Supply  
Figure 2. Logic Diagram  
V
V
/WP  
V
/Write Protect  
PP  
PP  
Ground  
SS  
V
/WP  
V
PP  
V
CCS  
V
SSS  
SRAM Power Supply  
SRAM Ground  
V
CCF  
CCS  
22  
NC  
Not Connected Internally  
A0-A21  
Flash Memory Control Functions  
15  
E
F
E
Chip Enable input  
F
DQ0-DQ14  
DQ15A–1  
G
RP  
Reset/Block Temporary Unprotect  
Ready/Busy Output  
F
W
RB  
RP  
M76DW63000A  
M76DW62000A  
F
BYTE  
Byte/Word Organization Select  
RB  
BYTE  
SRAM Control Functions  
E1 , E2  
Chip Enable inputs  
E1  
E2  
S
S
S
UB  
Upper Byte Enable input  
Lower Byte Enable input  
S
S
LB  
S
UB  
LB  
S
Note: 1. A21-A19 are not connected to the SRAM component of  
the M76DW63000A, and A21-A18 are not connected to  
the SRAM component of the M76DW62000A.  
S
V
SS  
AI08188B  
4/27  
M76DW63000A, M76DW62000A  
Figure 3. LFBGA Connections (Top view through package)  
9
10  
1
2
3
4
5
6
7
8
A
B
C
D
E
F
NC  
NC  
NC  
NC  
NC  
NC  
NC  
V
/WP  
PP  
A8  
A19  
A9  
A7  
A6  
A5  
A4  
A11  
A12  
A13  
A14  
NC  
W
LB  
S
A3  
A2  
A1  
A0  
UB  
RP  
F
E2S  
A20  
A15  
A21  
S
A18  
A17  
DQ1  
RB  
NC  
NC  
A10  
DQ6  
NC  
NC  
NC  
G
H
J
V
A16  
SS  
DQ15  
/A-1  
E
F
G
DQ9  
DQ10  
DQ2  
DQ3  
DQ4  
DQ13  
DQ12  
DQ5  
BYTE  
E1  
V
V
V
DQ0  
DQ8  
DQ7  
S
CCF  
DQ11  
NC  
CCS  
SS  
K
M
N
NC  
DQ14  
NC  
NC  
NC  
NC  
NC  
AI08189  
5/27  
M76DW63000A, M76DW62000A  
SIGNAL DESCRIPTION  
See Figure 2 Logic Diagram and Table 1,Signal  
Names, for a brief overview of the signals connect-  
ed to this device.  
by bypassing the unlock cycles and/or using the  
multiple Word (2 or 4 at-a-time) or multiple Byte  
Program (2, 4 or 8 at-a-time) commands. The  
Write Protect function provides a hardware meth-  
od of protecting the four outermost boot blocks  
(two at the top, and two at the bottom of the ad-  
dress space).  
Address Inputs (A0-A21). Addresses A0-A18  
(for  
M76DW63000A),  
or  
A0-A17  
(for  
M76DW62000A), are common inputs for the Flash  
Memory and the SRAM components. The other  
lines (A19-A21, or A18-21, respectively) are inputs  
for the Flash Memory component only.  
The Address Inputs select the cells in the memory  
array to access during Bus Read operations. Dur-  
ing Bus Write operations they control the com-  
mands sent to the Command Interface of the  
internal state machine. The Flash memory is ac-  
When V /Write Protect is Low, V , the memory  
PP  
IL  
protects the four outermost boot blocks; Program  
and Erase operations in these blocks are ignored  
while V /Write Protect is Low, even when RP is  
PP  
F
at V .  
ID  
When V /Write Protect is High, V , the memory  
PP  
IH  
reverts to the previous protection status of the four  
outermost boot blocks (two at the top, and two at  
the bottom of the address space). Program and  
Erase operations can now modify the data in these  
blocks unless the blocks are protected using Block  
Protection.  
cessed through the Chip Enable (E ) and Write  
F
Enable (W) signals, while the SRAM is accessed  
through two Chip Enable signals (E1S and E2S)  
and the Write Enable signal (W).  
Data Inputs/Outputs (DQ0-DQ7). The Data I/O  
outputs the data stored at the selected address  
during a Bus Read operation. During Bus Write  
operations they represent the commands sent to  
the Command Interface of the Program/Erase  
Controller.  
When V /Write Protect is raised to V the mem-  
PP  
PP  
ory automatically enters the Unlock Bypass mode.  
When V /Write Protect returns to V or V nor-  
PP  
IH  
IL  
mal operation resumes. During Unlock Bypass  
Program operations the memory draws I from  
PP  
the pin to supply the programming circuits. See the  
description of the Unlock Bypass command in the  
Command Interface section. The transitions from  
Data Inputs/Outputs (DQ8-DQ14). The Data I/O  
outputs the data stored at the selected address  
during a Bus Read operation when BYTE is High,  
V
than t  
to V  
VHVPP  
and from V  
. See the M29DW640D datasheet for  
to V must be slower  
IH  
PP  
PP IH  
V . When BYTE is Low, V , these pins are not  
IH  
IL  
used and are high impedance. During Bus Write  
operations the Command Register does not use  
these bits. When reading the Status Register  
these bits should be ignored.  
more details.  
Never raise V /Write Protect to V  
from any  
PP  
PP  
mode except Read mode, otherwise the memory  
may be left in an indeterminate state.  
Data Input/Output or Address Input (DQ15A–  
1). When BYTE is High, V , this pin behaves as  
a Data Input/Output pin (as DQ8-DQ14). When  
The V /Write Protect pin must not be left floating  
or unconnected or the device may become unreli-  
IH  
PP  
BYTE is Low, V , this pin behaves as an address  
able. A 0.1µF capacitor should be connected be-  
tween the V /Write Protect pin and the V  
PP SS  
Ground pin to decouple the current surges from  
the power supply. The PCB track widths must be  
sufficient to carry the currents required during  
IL  
pin; DQ15A–1 Low will select the LSB of the ad-  
dressed Word, DQ15A–1 High will select the MSB.  
Throughout the text consider references to the  
Data Input/Output to include this pin when BYTE is  
High and references to the Address Inputs to in-  
clude this pin when BYTE is Low except when  
stated explicitly otherwise.  
Unlock Bypass Program, I  
.
PP  
Reset/Block Temporary Unprotect (RP ). The  
F
Reset/Block Temporary Unprotect pin can be  
used to apply a Hardware Reset to the memory or  
to temporarily unprotect all Blocks that have been  
protected.  
Flash Chip Enable (E ). The Chip Enable input  
F
activates the memory, allowing Bus Read and Bus  
Write operations to be performed. When Chip En-  
able is High, V , all other pins are ignored.  
IH  
Note that if V /WP is at V , then the two outer-  
PP  
IL  
Output Enable (G). The Output Enable, G, con-  
trols the Bus Read operation of the device.  
most boot blocks will remain protected even if RP  
is at V .  
ID  
F
Write Enable (W). The Write Enable, W, controls  
the Bus Write operation of the device.  
A Hardware Reset is achieved by holding Reset/  
Block Temporary Unprotect Low, V , for at least  
IL  
t
. After Reset/Block Temporary Unprotect  
PLPX  
V
Write Protect (V /WP). The  
V
/Write  
PP  
PP/  
PP  
PP  
goes High, V , the memory will be ready for Bus  
Read and Bus Write operations after t  
IH  
Protect pin provides two functions. The V func-  
or  
PHEL  
tion allows the Flash memory to use an external  
high voltage power supply to reduce the time re-  
quired for Program operations. This is achieved  
t
,
whichever occurs last. See the  
RHEL  
M29DW640D datasheet for more details.  
6/27  
M76DW63000A, M76DW62000A  
Holding RP at V will temporarily unprotect the  
protected Blocks in the memory. Program and  
not allowed to set E at V E1 at V and E2 at  
F
ID  
F
IL,  
S
IL  
S
V
at the same time.  
IH  
Erase operations on all blocks will be possible.  
SRAM Upper Byte Enable (UB ). The Upper  
Byte Enable enables the upper bytes for SRAM  
S
The transition from V to V must be slower than  
IH  
ID  
t
.
PHPHH  
(DQ8-DQ15). UB is active low.  
S
Ready/Busy Output (RB). The Ready/Busy pin  
is an open-drain output that can be used to identify  
when the Flash memory is performing a Program  
or Erase operation. During Program or Erase op-  
SRAM Lower Byte Enable (LB ). The  
Lower  
Byte Enable enables the lower bytes for SRAM  
(DQ0-DQ7). LB is active low.  
S
S
V
Supply Voltage (2.7V to 3.3V). V  
pro-  
CCF  
CCF  
erations Ready/Busy is Low, V . Ready/Busy is  
OL  
vides the power supply for all operations (Read,  
Program and Erase).  
high-impedance during Read mode, Auto Select  
mode and Erase Suspend mode.  
After a Hardware Reset, Bus Read and Bus Write  
operations cannot begin until Ready/Busy be-  
comes high-impedance.  
The use of an open-drain output allows the Ready/  
Busy pins from several memories to be connected  
to a single pull-up resistor. A Low will then indicate  
that one, or more, of the memories is busy.  
The Command Interface is disabled when the  
V
Supply Voltage is less than the Lockout Volt-  
CCF  
age, V  
. This prevents Bus Write operations  
LKO  
from accidentally damaging the data during power  
up, power down and power surges. If the Program/  
Erase Controller is programming or erasing during  
this time then the operation aborts and the memo-  
ry contents being altered will be invalid.  
Byte/Word Organization Select (BYTE). The  
Byte/Word Organization Select pin is used to  
switch between the x8 and x16 Bus modes of the  
Flash memory. When Byte/Word Organization Se-  
A 0.1µF capacitor should be connected between  
the V  
Supply Voltage pin and the V Ground  
CCF  
SS  
pin to decouple the current surges from the power  
supply. The PCB track widths must be sufficient to  
carry the currents required during Program and  
lect is Low, V , the Flash memory is in x8 mode,  
IL  
when it is High, V , the Flash memory is in x16  
IH  
Erase operations, I  
.
CC3  
mode.  
V
Supply Voltage (2.7V to 3.3V). V  
pro-  
CCS  
CCS  
SRAM Chip Enable (E1 , E2 ). The Chip En-  
S
S
vides the power supply for the SRAM control pins.  
able inputs activate the SRAM memory control  
V
Ground. V is the ground reference for all  
SS  
SS  
logic, input buffers and decoders. E1 at V or  
S
IH  
voltage measurements in the Flash and SRAM  
E2 at V deselects the memory and reduces the  
S
IL  
chips. The device features two V pins both of  
SS  
power consumption to the standby level. E1 and  
S
which must be connected to the system ground.  
E2 can also be used to control writing to the  
S
SRAM memory array, while W remains at V It is  
IL.  
7/27  
M76DW63000A, M76DW62000A  
FUNCTIONAL DESCRIPTION  
The Flash and SRAM components have separate  
power supplies. They are distinguished by three  
simultaneous read operations on the Flash and  
the SRAM which would result in a data bus con-  
tention. Therefore it is recommended to put the  
SRAM in the high impedance state when reading  
the Flash and vice versa (see Table 2 Main Oper-  
ation Modes for details).  
chip enable inputs: E for the Flash memory and,  
F
E1 and E2 for the SRAM.  
S
S
Recommended operating conditions do not allow  
both the Flash and the SRAM to be in active mode  
at the same time. The most common example is  
Figure 4. Functional Block Diagram  
V
/WP  
V
PP  
CCF  
E
F
F
RB  
RP  
BYTE  
Flash Memory  
64 Mbit (x8 or x16)  
A[n]-A21  
A0-A[m]  
G
V
DQ0-DQ15/A-1  
CCS  
W
SRAM  
8Mbit or 4Mbit (x16)  
E1  
E2  
S
S
UB  
LB  
S
S
V
SS  
AI08190B  
Note: Where n=19 and m=18 for M76DW63000A, and n=18 and m=17 for M76DW62000A.  
8/27  
M76DW63000A, M76DW62000A  
Table 2. Main Operation Modes  
Operation  
E
RP  
E1  
E2  
UB  
LB  
S
G
W
DQ15-DQ8  
DQ7-DQ0  
F
F
S
S
S
(2)  
Mode  
V
V
V
V
IH  
Read  
Write  
SRAM must be disabled  
SRAM must be disabled  
Data Output  
IL  
IH  
IL  
V
V
V
IH  
V
IH  
V
IL  
Data Input  
Hi-Z  
IL  
V
CC  
Standby  
X
X
Any SRAM mode is allowed  
IH  
±0.3  
Output  
Disable  
V
V
V
X
Any SRAM mode is allowed  
Any SRAM mode is allowed  
Hi-Z  
IH  
IH  
IH  
V
Reset  
X
X
X
Hi-Z  
IL  
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
Data out Word Read  
IL  
IL  
IL  
IH  
IH  
IH  
IL  
IL  
IL  
IL  
IL  
IL  
IH  
IH  
IH  
IH  
IH  
IH  
IL  
IL  
Flash Memory must be  
disabled  
Read  
Data out  
Hi-Z  
Hi-Z  
IL  
IH  
V
IL  
Data out  
IH  
V
V
V
V
V
V
X
Data in Word Write  
IL  
IL  
IL  
IL  
IL  
IL  
Flash Memory must be  
disabled  
V
V
Write  
X
X
X
X
X
Data in  
Hi-Z  
Hi-Z  
IH  
V
IL  
Data in  
IH  
X
X
X
X
Hi-Z  
Hi-Z  
Hi-Z  
Hi-Z  
Hi-Z  
Hi-Z  
IH  
Standby/  
Power  
Down  
Any Flash Memory  
mode is allowable  
V
IH  
V
IH  
X
X
X
X
V
X
X
X
IL  
IH  
IH  
IH  
V
V
V
V
V
V
V
V
V
V
IL  
IH  
IH  
IH  
IH  
IH  
IH  
IL  
IL  
IL  
IL  
Output  
Disable  
Any Flash Memory  
mode is allowable  
V
V
V
V
V
V
V
IH  
IL  
V
IL  
IH  
Note: 1. X = Don’t Care = V or V  
.
IH  
IL  
2. This table is valid when BYTE = V . This table is also valid when BYTE = V , with the only difference that DQ15-DQ8 are always  
IH  
IL  
high impedance when the Flash Memory component is being accessed.  
3. For the Block Protect and Unprotect features, refer to the M29DW640D datasheet. Only the In-System Technique is available in  
the stacked product.  
4. To read the Manufacturer Code, the Device Code, the Block Protection Status and the Extended Block indicator bit, refer to the  
“Auto Select Command” in the M29DW640D datasheet.  
9/27  
M76DW63000A, M76DW62000A  
MAXIMUM RATING  
Stressing the device above the rating listed in the  
Absolute Maximum Ratings table may cause per-  
manent damage to the device. These are stress  
ratings only and operation of the device at these or  
any other conditions above those indicated in the  
Operating sections of this specification is not im-  
plied. Exposure to Absolute Maximum Rating con-  
ditions for extended periods may affect device  
reliability. Refer also to the STMicroelectronics  
SURE Program and other relevant quality docu-  
ments.  
Table 3. Absolute Maximum Ratings  
Value  
Symbol  
Parameter  
Unit  
Min  
–40  
Max  
85  
(1)  
T
°C  
°C  
°C  
V
A
Ambient Operating Temperature  
Temperature Under Bias  
Storage Temperature  
Input or Output Voltage  
Flash Supply Voltage  
Identification Voltage  
Program Voltage  
T
–50  
125  
150  
BIAS  
T
–65  
STG  
V
IO  
V
+0.3  
–0.5  
–0.6  
–0.6  
–0.6  
–0.5  
CCF  
V
4
V
CCF  
V
ID  
13.5  
13.5  
3.8  
V
V
PPF  
V
V
SRAM Supply Voltage  
V
CCS  
Note: 1. Depends on range.  
10/27  
M76DW63000A, M76DW62000A  
DC AND AC PARAMETERS  
This section summarizes the operating and mea-  
surement conditions, and the DC and AC charac-  
teristics of the device. The parameters in the DC  
and AC characteristics Tables that follow, are de-  
rived from tests performed under the Measure-  
ment Conditions summarized in Table 4,  
Operating and AC Measurement Conditions. De-  
signers should check that the operating conditions  
in their circuit match the measurement conditions  
when relying on the quoted parameters.  
The operating and AC measurement parameters  
given in this section (see Table 4 below) corre-  
spond to those of the stand-alone Flash and  
SRAM devices. For compatibility purposes, the  
M29DW640D voltage range is restricted to V  
in the stacked product.  
CCS  
Table 4. Operating and AC Measurement Conditions  
Flash Memory  
SRAM  
70  
Parameter  
70  
Units  
Min  
2.7  
Max  
3.6  
Min  
Max  
V
V
Supply Voltage  
V
V
CCF  
Supply Voltage  
2.7  
–40  
3.3  
85  
CCS  
Ambient Operating Temperature  
–40  
85  
°C  
pF  
ns  
V
Load Capacitance (C )  
30  
30  
L
Input Rise and Fall Times  
10  
3.3  
0 to V  
0 to V  
Input Pulse Voltages  
CCF  
CCF  
V
CCF  
/2  
V
/2  
CCF  
Input and Output Timing Ref. Voltages  
V
Figure 5. AC Measurement I/O Waveform  
Figure 6. AC Measurement Load Circuit  
V
CCF  
V
CCF  
V
/2  
CCF  
V
PP  
0V  
V
CCF  
25kΩ  
AI08186  
DEVICE  
UNDER  
TEST  
C
L
25kΩ  
0.1µF  
0.1µF  
C
includes JIG capacitance  
AI08187  
L
Table 5. Device Capacitance  
Symbol  
Parameter  
Test Condition  
Typ  
Max  
12  
Unit  
C
V
= 0V, f=1 MHz  
= 0V, f=1 MHz  
Input Capacitance  
Output Capacitance  
pF  
pF  
IN  
IN  
C
OUT  
V
OUT  
15  
Note: Sampled only, not 100% tested.  
11/27  
M76DW63000A, M76DW62000A  
Table 6. Flash Memory DC Characteristics  
M76DW63000A,  
M76DW62000A  
Symbol  
Parameter  
Test Condition  
Unit  
Min  
Max  
I
0V V V  
Input Leakage Current  
Output Leakage Current  
±1  
±1  
µA  
µA  
LI  
IN  
CC  
I
LO  
0V V V  
OUT CC  
E = V , G = V ,  
F
IL  
IH  
(2)  
Supply Current (Read)  
10  
100  
20  
mA  
µA  
mA  
I
CC1  
f = 6MHz  
E = V ±0.2V,  
F
CC  
I
Supply Current (Standby)  
CC2  
RP = V ±0.2V  
F
CC  
V
V
/WP =  
or V  
PP  
Supply Current (Program/  
Erase)  
Program/Erase  
Controller active  
(1,2)  
IL  
IH  
I
CC3  
V
/WP = V  
PP  
20  
mA  
V
PP  
V
V
Input Low Voltage  
Input High Voltage  
–0.5  
0.8  
IL  
0.7V  
V
+0.3  
CC  
V
IH  
CC  
Voltage for V /WP Program  
PP  
Acceleration  
V
V
= 3.0V ±10%  
11.5  
12.5  
V
V
I
CC  
CC  
PP  
Current for V /WP Program  
PP  
Acceleration  
= 3.0V ±10%  
= 1.8mA  
15  
mA  
PP  
V
OL  
I
I
Output Low Voltage  
Output High Voltage  
Identification Voltage  
0.45  
V
V
V
OL  
V
OH  
V
–0.4  
= –100µA  
CC  
OH  
V
11.5  
1.8  
12.5  
2.3  
ID  
Program/Erase Lockout Supply  
Voltage  
V
LKO  
V
Note: 1. Sampled only, not 100% tested.  
2. In Dual operations the Supply Current will be the sum of I  
(read) and I  
CC1  
(program/erase).  
CC3  
12/27  
M76DW63000A, M76DW62000A  
Table 7. SRAM DC Characteristics  
M76DW63000A  
M76DW62000A  
Symbol  
Parameter  
Test Condition  
Unit  
Min  
Typ  
Max Min  
Typ Max  
I
0V V V  
Input Leakage Current  
Output Leakage Current  
±1  
±1  
±1  
µA  
µA  
LI  
IN  
CCS  
0V V  
V  
CCS,  
OUT  
I
LO  
±1  
SRAM Outputs Hi-Z  
E1 V – 0.2V  
S
CCS  
V
V
V  
– 0.2V or V 0.2V  
IN  
CCS  
IN  
2
8
8
25  
7
7
15  
µA  
f = fmax (A0-A18 and DQ0-  
DQ15 only)  
f = 0 (G , W , UB and LB )  
I
V
Standby Current  
CCS  
CC  
S
S
S
S
E1 V  
– 0.2V  
S
CCS  
V  
– 0.2V or V 0.2V,  
25  
12  
15  
12  
µA  
IN  
CCS  
IN  
f = 0  
f = fmax = 1/  
,
AVAV  
5.5  
1.5  
5.5  
1.5  
mA  
V
CCS  
= 3.3V, I  
= 0 mA  
OUT  
I
Supply Current  
CC  
f = 1MHz,  
= 3.3V, I  
3
3
mA  
V
V
CCS  
= 0 mA  
OUT  
V
V
Input Low Voltage  
Input High Voltage  
–0.3  
2.2  
0.8  
–0.3  
2.2  
0.8  
IL  
V
V
CCS  
+0.3  
CCS  
V
IH  
+0.3  
V
= V min  
= 2.1mA  
CCS  
CC  
V
Output Low Voltage  
Output High Voltage  
0.4  
0.4  
V
V
OL  
I
OL  
V
CCS  
= V min  
CC  
= –1.0mA  
V
OH  
2.4  
2.4  
I
OH  
Note: 1. Sampled only, not 100% tested.  
2. A0-A18 for the M76DW63000A, A0-A17 for the M76DW62000A.  
13/27  
M76DW63000A, M76DW62000A  
PACKAGE MECHANICAL  
Figure 7. Stacked LFBGA73 8x11.6mm, 10x12 array, 0.8mm pitch, Bottom View Package Outline  
D
D1  
FD  
FE  
SD  
SE  
E
E1  
BALL "A1"  
e
b
ddd  
A
A2  
A1  
BGA-Z50  
Note: Drawing is not to scale.  
14/27  
M76DW63000A, M76DW62000A  
Table 8. Stacked LFBGA73 8x11.6mm, 10x12 array, 0.8mm pitch, Package Mechanical Data  
millimeters  
Min  
inches  
Min  
Symbol  
Typ  
Max  
Typ  
Max  
A
A1  
A2  
b
1.400  
0.0551  
0.250  
0.0098  
0.910  
0.400  
8.000  
7.200  
0.0358  
0.0157  
0.3150  
0.2835  
0.350  
7.900  
0.450  
8.100  
0.0138  
0.3110  
0.0177  
0.3189  
D
D1  
ddd  
E
0.100  
0.0039  
0.4606  
11.600  
8.800  
0.800  
0.400  
1.400  
0.400  
0.400  
11.500  
11.700  
0.4567  
0.3465  
0.0315  
0.0157  
0.0551  
0.0157  
0.0157  
0.4528  
E1  
e
FD  
FE  
SD  
SE  
15/27  
M76DW63000A, M76DW62000A  
PART NUMBERING  
Table 9. Ordering Information Scheme  
Example:  
M76DW 6 2 0 0 0  
A
70 Z T  
Device Type  
M76 = MMP (Flash + SRAM)  
Architecture  
D = Dual Operation  
Operating Voltage  
W = V  
= V  
= 2.7V to 3.3V  
CCS  
CCF  
Flash Device Size (Die1 Density)  
6 = 64 Mbit  
SRAM Device Size (Die2 Density)  
2 = 4 Mbit  
3 = 8 Mbit  
Die3  
0 = Die3 Density  
Die4  
0 = Die4 Density  
Flash Specification Details  
0 = Multiple Bank  
Stacked Specification Details  
A = 0.15µm Flash & SRAM  
Speed  
70 = 70ns  
90 = 90ns  
Package and Temperature Range  
Z = LFBGA73: 8 x 11.6mm, 0.8mm pitch  
Option  
T = Tape & Reel packing  
Note: This product is also available with the Extended Block factory locked. For further details and ordering  
information contact your nearest ST sales office.  
Devices are shipped from the factory with the memory content bits erased to ’1’.  
For a list of available options (Speed, Package, etc.) or for further information on any aspect of this device,  
please contact the STMicroelectronics Sales Office nearest to you.  
16/27  
M76DW63000A, M76DW62000A  
FLASH MEMORY DEVICE  
The M76DW62000A contains one 64 Mbit Flash  
memory. For detailed information on how to use  
the Flash memory refer to the M29DW640D  
datasheet, which is available on the STMicroelec-  
tronics web site, www.st.com.  
SRAM DEVICE  
SRAM SUMMARY DESCRIPTION  
The SRAM is an 8Mbit or 4Mbit asynchronous ran-  
dom access memory which features a super low  
voltage operation and low current consumption  
with an access time of 70ns under all conditions.  
The memory operations can be performed using a  
single low voltage supply, 2.7V to 3.3V, which is  
the same as the Flash voltage supply.  
Figure 8. SRAM Logic Diagram  
DATA IN DRIVERS  
A0-A10  
256Kb x 16  
RAM Array  
DQ0-DQ7  
2048 x 2048  
DQ8-DQ15  
COLUMN DECODER  
UB  
S
W
S
A11-A18 or A11-A17  
G
S
LB  
S
E1  
S
POWER-DOWN  
CIRCUIT  
E2  
S
UB  
LB  
S
S
AI07939B  
17/27  
M76DW63000A, M76DW62000A  
SRAM OPERATIONS  
There are five standard operations that control the  
SRAM component. These are Bus Read, Bus  
Write, Standby/Power-down, Data Retention and  
Output Disable. A summary is shown in Table 2,  
Main Operation Modes  
Read. Read operations are used to output the  
contents of the SRAM Array. The SRAM is in Read  
If the Output is enabled (E1 =V , E2 =V and  
S IL S IH  
G =V ), then W will return the outputs to high im-  
S
IL  
pedance within t  
of its falling edge. Care must  
WLQZ  
be taken to avoid bus contention in this type of op-  
eration. The Data input must be valid for t  
be-  
DVWH  
fore the rising edge of Write Enable, for t  
DVE1H  
before the rising edge of E1 or for t  
before  
S
DVE2L  
the falling edge of E2 , whichever occurs first, and  
S
mode whenever Write Enable, W , is at V , Out-  
S
IH  
remain valid for t  
, t  
or t  
(see Table  
WHDX E1HAX  
E2LAX  
put Enable, G , is at V , Chip Enable, E1 , is at  
S
IL  
S
11, SRAM Write AC Characteristics, Figures 12,  
13, 14 and 15).  
V , Chip Enable, E2 , is at V , and Byte Enable  
IL  
S
IH  
inputs, UB and LB are at V .  
S
S
IL  
Standby/Power-Down. The SRAM component  
has a chip enabled power-down feature which in-  
vokes an automatic standby mode (see Table 10,  
SRAM Read AC Characteristics, Figure 11, SRAM  
Standby AC Waveforms). The SRAM is in Standby  
mode whenever either Chip Enable is deasserted,  
Valid data will be available on the output pins after  
a time of t after the last stable address. If the  
Chip Enable or Output Enable access times are  
AVQV  
not met, data access will be measured from the  
limiting parameter (t  
, t  
, or t  
) rath-  
E1LQV E2HQV  
GLQV  
er than the address. Data out may be indetermi-  
nate at t , t and t , but data lines  
E1 at V or E2 at V . It is also possible when  
S
IH  
S
IL  
E1LQX E2HQX  
GLQX  
UB and LB are at V .  
S
S
IH  
will always be valid at t  
(see Table 10, Table  
AVQV  
10, Figures 9 and 10, SRAM Read AC Character-  
istics).  
Write. Write operations are used to write data to  
Data Retention. The SRAM data retention per-  
formance as V goes down to V are de-  
CCS  
DR  
scribed in Table 12, SRAM Low V  
Data  
CCS  
Retention Characteristic, and Figure 16, SRAM  
Low V Data Retention AC Waveforms, E1 or  
the SRAM. The SRAM is in Write mode whenever  
CCS  
S
W and E1 are at V , and E2 is at V . Either the  
S
IL  
S
IH  
UB / LB Controlled. In E1 controlled data reten-  
S
S
S
Chip Enable inputs, E1 and E2 , or the Write En-  
S
S
tion mode, the minimum standby current mode is  
entered when E1 V – 0.2V and E2 0.2V  
able input, W , must be deasserted during ad-  
S
S
CCS  
S
dress transitions for subsequent write cycles.  
or E2 V  
– 0.2V. In E2 controlled data re-  
S
CCS  
S
A Write operation is initiated when E1 is at V ,  
S
IL  
tention mode, minimum standby current mode is  
E2 is at V and W is at V . The data is latched  
S
IH  
IL  
entered when E2 0.2V.  
S
on the falling edge of E1 , the rising edge of E2  
S
S
Output Disable. The data outputs are high im-  
or the falling edge of W , whichever occurs last.  
S
pedance when the Output Enable, G , is at V  
S
IH  
The Write cycle is terminated on the rising edge of  
with Write Enable, W , at V .  
S
IH  
E1 , the rising edge of W or the falling edge of  
S
E2 , whichever occurs first.  
S
18/27  
M76DW63000A, M76DW62000A  
Figure 9. SRAM Read Mode AC Waveforms, Address Controlled  
tAVAV  
A0-A17  
VALID  
tAVQV  
tAXQX  
DATA VALID  
DQ0-DQ15  
DATA VALID  
AI07942  
Note: E1 = Low, E2 = High, G = Low, UB and/or LB = High, W = High.  
S
S
S
S
Figure 10. SRAM Read AC Waveforms, G Controlled  
tAVAV  
A0-A17  
E1S  
VALID  
tE1LQV  
tE1HQZ  
tE1LQX  
tE2HQV  
tE2LQZ  
E2S  
tE2HQX  
tBLQV  
tBHQZ  
UBS, LBS  
tBLQX  
tGLQV  
tGHQZ  
G
tGLQX  
DQ0-DQ15  
DATA VALID  
AI07943b  
Note: Write Enable (W) = High. Address Valid prior to or at the same time as E1 , UB and LB going Low.  
S
S
S
Figure 11. SRAM Standby AC Waveforms  
E1S  
E2S  
tPU  
tPD  
ICC  
50%  
AI07913b  
19/27  
M76DW63000A, M76DW62000A  
Table 10. SRAM Read AC Characteristics  
SRAM  
Symbol  
Alt  
Parameter  
Unit  
Min  
Max  
t
t
Read Cycle Time  
70  
ns  
ns  
ns  
ns  
ns  
ns  
AVAV  
RC  
t
t
ACC  
Address Valid to Output Valid  
70  
AVQV  
t
t
OH  
Address Transition to Output Transition  
UB , LB Disable to Hi-Z Output  
10  
AXQX  
t
t
BHZ  
25  
70  
BHQZ  
S
S
t
t
UB , LB Access Time  
S S  
BLQV  
AB  
t
t
UB , LB Enable to Low-Z Output  
S S  
5
BLQX  
BLZ  
t
E1LQV  
t
Chip Enable 1 Low or Chip Enable 2 High to Output Valid  
70  
ns  
ns  
ns  
ACS1  
t
E2HQV  
t
Chip Enable 1 Low or Chip Enable 2 High to Output  
Transition  
E1LQX  
t
10  
CLZ1  
t
E2HQX  
t
E1HQZ  
t
Chip Enable High or Chip Enable 2 Low to Output Hi-Z  
25  
HZCE  
t
E2LQZ  
t
t
OHZ  
Output Enable High to Output Hi-Z  
25  
35  
ns  
ns  
ns  
ns  
GHQZ  
t
t
Output Enable Low to Output Valid  
GLQV  
OE  
t
t
OLZ  
Output Enable Low to Output Transition  
Chip Enable 1 High or Chip Enable 2 Low to Power Down  
5
0
GLQX  
(1)  
70  
t
t
PD  
(1)  
Chip Enable 1 Low or Chip Enable 2 High to Power Up  
ns  
PU  
Note: 1. Sampled only. Not 100% tested.  
20/27  
M76DW63000A, M76DW62000A  
Figure 12. SRAM Write AC Waveforms, W Controlled  
tAVAV  
A0-A17  
VALID  
tAVWH  
tE1LWH  
tE2HWH  
tWHAX  
E1S  
E2S  
tAVWL  
tWLWH  
W
tBLWH  
UBS, LBS  
G
tGHQZ  
tDVWH  
INPUT VALID  
tWHDZ  
Note 2  
DQ0-DQ15  
AI07944b  
Note: 1. W, E1 , E2 , UB and/or LB must be asserted to initiate a write cycle. Output Enable (G) = Low (otherwise, DQ0-DQ15 are high  
S
S
S
S
impedance). If E1 , E2 and W are deasserted at the same time, DQ0-DQ15 remain high impedance.  
S
S
2. The I/O pins are in output mode and input signals must not be applied.  
21/27  
M76DW63000A, M76DW62000A  
Figure 13. SRAM Write AC Waveforms, E1 Controlled  
S
tAVAV  
A0-A17  
VALID  
tAVE1H  
tAVE2L  
tE1LE1H  
tE2HE2L  
tAVE1L  
tAVE2H  
tE1HAX  
tE2LAX  
E1S  
E2S  
tWLE1H  
tWLE2L  
W
tBLE1H  
tBLE2L  
UBS, LBS  
G
tDVE1H  
tDVE2L  
tE1HDZ  
tE2LDZ  
tGHQZ  
DQ0-DQ15  
INPUT VALID  
Note 3  
AI07945b  
Note: 1. W , E1 , E2 , UB and/or LB must be asserted to initiate a write cycle. Output Enable (G ) = Low (otherwise, DQ0-DQ15 are high  
S
S
S
S
S
S
impedance). If E1 , E2 and W are deasserted at the same time, DQ0-DQ15 remain high impedance.  
S
S
2. If E1 , E2 and W are deasserted at the same time, DQ0-DQ15 remain high impedance.  
S
S
3. The I/O pins are in output mode and input signals must not be applied.  
22/27  
M76DW63000A, M76DW62000A  
Figure 14. SRAM Write AC Waveforms, W Controlled with G Low  
tAVAV  
VALID  
A0-A17  
tAVWH  
tE1LWH  
tE2HWH  
tWHAX  
E1S  
E2S  
tBLWH  
UBS, LBS  
tAVWL  
tWLWH  
W
tWHQX  
tWHDZ  
tWLQZ  
tDVWH  
INPUT VALID  
DQ0-DQ15  
AI07946b  
Note: 1. If E1 , E2 and W are deasserted at the same time, DQ0-DQ15 remain high impedance.  
S
S
Figure 15. SRAM Write Cycle Waveform, UB and LB Controlled, G Low  
S
S
tAVAV  
VALID  
A0-A17  
tAVBH  
tE1LBH  
tE2HBH  
E1S  
E2S  
tAVBL  
tBLBH  
tBHAX  
UBS, LBS  
tWLBH  
W
tDVBH  
INPUT VALID  
tBHDZ  
DQ0-DQ15  
AI07947b  
Note: 1. If E1 , E2 and W are deasserted at the same time, DQ0-DQ15 remain high impedance.  
S
S
23/27  
M76DW63000A, M76DW62000A  
Table 11. SRAM Write AC Characteristics  
SRAM  
Symbol  
Alt  
Parameter  
Unit  
Min  
Max  
t
t
WC  
Write Cycle Time  
70  
ns  
AVAV  
t
,
AVE1L  
t
t
,
AVE2H  
t
AS  
Address Valid to Beginning of Write  
0
ns  
AVWL,  
t
AVBL  
t
t
,
Address Valid to Chip Enable 1 Low or Chip Enable 2  
High  
AVE1H  
t
t
60  
60  
ns  
ns  
AW  
AVE2L  
t
Address Valid to Write Enable High  
AVWH  
AW  
t
BLWH  
t
t
t
BLE1H  
t
UB , LB Valid to End of Write  
60  
60  
30  
ns  
ns  
ns  
BW  
BW  
DW  
S
S
BLE2L  
AVBH  
t
t
t
UB , LB Low to UB , LB High  
S S S S  
BLBH  
t
,
,
DVE1H  
t
DVE2L  
Input Valid to End of Write  
t
DVWH  
t
DVBH  
t
,
E1HAX  
t
t
t
,
E2LAX  
t
End of Write to Address Change  
Address Transition to End of Write  
0
0
ns  
ns  
WR  
WHAX  
BHAX  
t
,
,
E1HDZ  
t
E2LDZ  
t
HD  
t
WHDZ  
t
BHDZ  
t
,
E1LE1H  
t
t
Chip Enable 1 Low to End of Write  
Chip Enable 2 High to End of Write  
60  
60  
ns  
ns  
E1LBH  
CW1  
t
E1LWH  
t
E2HE2L,  
t
t
t
E2HBH,  
E2HWH  
CW2  
t
t
Output Enable High to Output Hi-Z  
Write Enable High to Input Transition  
Write Enable Low to UB , LB High  
25  
25  
ns  
ns  
ns  
ns  
GHQZ  
GHZ  
t
t
5
WHQX  
DH  
t
t
WP  
50  
WLBH  
S
S
t
t
Write Enable Low to Output Hi-Z  
WLQZ  
WHZ  
t
WLWH  
t
t
Write Enable Pulse Width  
50  
ns  
WLE1H  
WP  
t
WLE2L  
24/27  
M76DW63000A, M76DW62000A  
Figure 16. SRAM Low V  
Data Retention AC Waveforms, E1 or UB / LB Controlled  
S S S  
CCS  
DATA RETENTION MODE  
VCCS  
VCCS (min)  
VCCS (min)  
tCDR  
tR  
E1S or  
UBS, LBS  
AI07918b  
Table 12. SRAM Low V  
Data Retention Characteristic  
CCS  
M76DW63000A  
M76DW62000A  
Symbol  
Parameter  
Test Condition  
Unit  
Min  
Typ Max  
Min  
Typ  
Max  
V
CCS  
= 1.5V,  
E1 V  
– 0.2V,  
– 0.2V  
S
CCS  
I
Supply Current (Data Retention)  
4
12  
3
10  
µA  
CCDR  
V
IN  
V  
CCS  
or V 0.2V  
IN  
V
Supply Voltage (Data Retention)  
Chip Disable to Power Down  
Operation Recovery Time  
1.5  
0
3.3  
1.5  
0
3.3  
V
DR  
t
ns  
ns  
CDR  
t
70  
70  
R
2. Sampled only. Not 100% tested.  
25/27  
M76DW63000A, M76DW62000A  
REVISION HISTORY  
Table 13. Document Revision History  
Date  
Version  
1.0  
Revision Details  
16-Apr-2003  
19-May-2003  
12-Jun-2003  
24-Sep-2003  
First Issue  
1.1  
M76DW63000A, 8Mbit SRAM, added  
1.2  
M76DW63000A, 8Mbit SRAM, corrected to 512Kx16 on first page  
Voltage supply range extended 2.7V working at all speed options  
1.3  
26/27  
M76DW63000A, M76DW62000A  
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences  
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted  
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject  
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not  
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.  
The ST logo is a registered trademark of STMicroelectronics.  
All other names are the property of their respective owners  
© 2003 STMicroelectronics - All rights reserved  
STMicroelectronics GROUP OF COMPANIES  
Australia - Belgium - Brazil - Canada - China - Czech Republic - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan -  
Malaysia - Malta - Morocco - Singapore - Spain - Sweden - Switzerland - United Kingdom - United States  
www.st.com  
27/27  

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