M95080-FDW6P/G [STMICROELECTRONICS]

16 Kbit and 8 Kbit serial SPI bus EEPROM with high speed clock; 16 Kb和8千位串行SPI总线的EEPROM与高速时钟
M95080-FDW6P/G
型号: M95080-FDW6P/G
厂家: ST    ST
描述:

16 Kbit and 8 Kbit serial SPI bus EEPROM with high speed clock
16 Kb和8千位串行SPI总线的EEPROM与高速时钟

可编程只读存储器 电动程控只读存储器 电可擦编程只读存储器 时钟
文件: 总50页 (文件大小:432K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
M95160-x  
M95080-x  
16 Kbit and 8 Kbit serial SPI bus EEPROM  
with high speed clock  
Features  
Compatible with SPI bus serial interface  
(positive clock SPI modes)  
Single supply voltage:  
– 4.5 V to 5.5 V for M95xxx  
– 2.5 V to 5.5 V for M95xxx-W  
– 1.8 V to 5.5 V for M95xxx-R  
– 1.7 V to 5.5 V for M95xxx-F  
SO8 (MN)  
150 mil width  
High speed: 10 MHz  
Status Register  
Hardware protection of the Status Register  
Byte and page write (up to 32 bytes)  
Self-timed programming cycle  
Adjustable size read-only EEPROM area  
Enhanced ESD protection  
More than 1 million write cycles  
More than 40-year data retention  
Packages  
TSSOP8 (DW)  
169 mil width  
UFDFPN8 (MB)  
2 x 3 mm (MLP)  
®
– ECOPACK (RoHS compliant)  
Table 1.  
Device summary  
Part number  
Reference  
WLCSP (CS)1)  
M95160  
M95160-W  
M95160-R  
M95160-F  
M95080  
M95160-x  
1. Preliminary data.  
M95080-x  
M95080-W  
M95080-R  
October 2009  
Doc ID 8028 Rev 10  
1/50  
www.st.com  
1
Contents  
M95160-x, M95080-x  
Contents  
1
2
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
Signal description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
2.1  
2.2  
2.3  
2.4  
2.5  
2.6  
2.7  
2.8  
Serial Data output (Q) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
Serial Data input (D) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
Serial Clock (C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
Chip Select (S) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
Hold (HOLD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
Write Protect (W) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9  
VCC supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9  
VSS ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9  
3
4
Connecting to the SPI bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
3.1  
SPI modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
Operating features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12  
4.1  
Supply voltage (VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12  
4.1.1  
4.1.2  
4.1.3  
4.1.4  
Operating supply voltage V  
CC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12  
Device reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12  
Power-up conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12  
Power-down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13  
4.2  
4.3  
4.4  
4.5  
Active Power and Standby Power modes . . . . . . . . . . . . . . . . . . . . . . . . . 13  
Hold condition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13  
Status Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13  
Data protection and protocol control . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14  
5
6
Memory organization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15  
Instructions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16  
6.1  
6.2  
6.3  
Write Enable (WREN) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16  
Write Disable (WRDI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17  
Read Status Register (RDSR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
6.3.1  
WIP bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
2/50  
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M95160-x, M95080-x  
6.3.2  
Contents  
WEL bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
BP1, BP0 bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
SRWD bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
6.3.3  
6.3.4  
6.4  
6.5  
6.6  
Write Status Register (WRSR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20  
Read from Memory Array (READ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22  
Write to Memory Array (WRITE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23  
7
Delivery state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25  
7.1  
Initial delivery state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25  
8
Maximum rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25  
DC and AC parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26  
Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41  
Part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45  
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47  
9
10  
11  
12  
Doc ID 8028 Rev 10  
3/50  
List of tables  
M95160-x, M95080-x  
List of tables  
Table 1.  
Table 2.  
Table 3.  
Table 4.  
Table 5.  
Table 6.  
Table 7.  
Table 8.  
Device summary. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Signal names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
Write-protected block size . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14  
Instruction set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16  
Status Register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
Protection modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20  
Address range bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21  
Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25  
Operating conditions (M95160 and M95080) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26  
Operating conditions (M95160-W and M95080-W) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26  
Operating conditions (M95160-R and M95080-R) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26  
Operating conditions (M95160-F) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26  
AC measurement conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26  
Capacitance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27  
DC characteristics (M95160 and M95080, device grade 3) . . . . . . . . . . . . . . . . . . . . . . . . 27  
DC characteristics (M95160 and M95080, device grade 6) . . . . . . . . . . . . . . . . . . . . . . . . 28  
DC characteristics (M95160-W and M95080-W, device grade 3). . . . . . . . . . . . . . . . . . . . 28  
DC characteristics (M95160-W and M95080-W, device grade 6). . . . . . . . . . . . . . . . . . . . 29  
DC characteristics (M95160-R and M95080-R) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30  
DC characteristics (M95160-F). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31  
AC characteristics (M95160 and M95080, device grade 3) . . . . . . . . . . . . . . . . . . . . . . . . 32  
AC characteristics (M95160 and M95080, device grade 6) . . . . . . . . . . . . . . . . . . . . . . . . 33  
AC characteristics (M95160-W and M95080-W, device grade 3). . . . . . . . . . . . . . . . . . . . 34  
AC characteristics (M95160-W and M95080-W, device grade 6). . . . . . . . . . . . . . . . . . . . 35  
AC characteristics for M95160-Wxx6/S and M95080-Wxx6/S . . . . . . . . . . . . . . . . . . . . . . 36  
AC characteristics (M95160-R and M95080-R) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37  
AC characteristics (M95160-F) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38  
SO8N – 8-lead plastic small outline, 150 mils body width, mechanical data . . . . . . . . . . . 41  
UFDFPN8 (MLP8) 8-lead ultra thin fine pitch dual flat package no lead  
Table 9.  
Table 10.  
Table 11.  
Table 12.  
Table 13.  
Table 14.  
Table 15.  
Table 16.  
Table 17.  
Table 18.  
Table 19.  
Table 20.  
Table 21.  
Table 22.  
Table 23.  
Table 24.  
Table 25.  
Table 26.  
Table 27.  
Table 28.  
Table 29.  
2 x 3 mm, package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42  
WLCSP-R 1.350 x 1.365 mm 0.4 mm pitch 8 bumps, package mechanical  
Table 30.  
data. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43  
TSSOP8 – 8-lead thin shrink small outline, package mechanical data. . . . . . . . . . . . . . . . 44  
Ordering information scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45  
Available M95160 products (package, voltage range, temperature grade) . . . . . . . . . . . . 46  
Available M95080 products (package, voltage range, temperature grade) . . . . . . . . . . . . 46  
Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47  
Table 31.  
Table 32.  
Table 33.  
Table 34.  
Table 35.  
4/50  
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M95160-x, M95080-x  
List of figures  
List of figures  
Figure 1.  
Figure 2.  
Figure 3.  
Figure 4.  
Figure 5.  
Figure 6.  
Figure 7.  
Figure 8.  
Figure 9.  
Logic diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
8-pin package connections (top view) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7  
M95160 WLCSP connections (top view, marking side, with balls on the underside) . . . . . . 7  
Bus master and memory devices on the SPI bus. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
SPI modes supported . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15  
Write Enable (WREN) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16  
Write Disable (WRDI) sequence. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17  
Read Status Register (RDSR) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19  
Figure 10. Write Status Register (WRSR) sequence. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21  
Figure 11. Read from Memory Array (READ) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22  
Figure 12. Byte Write (WRITE) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23  
Figure 13. Page Write (WRITE) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24  
Figure 14. AC measurement I/O waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27  
Figure 15. Serial input timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39  
Figure 16. Hold timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39  
Figure 17. Serial output timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40  
Figure 18. SO8N – 8-lead plastic small outline, 150 mils body width, package outline . . . . . . . . . . . . 41  
Figure 19. UFDFPN8 (MLP8) 8-lead ultra thin fine pitch dual flat package no lead  
2 x 3 mm, package outline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42  
Figure 20. WLCSP-R 1.350 x 1.365 mm 0.4 mm pitch 8 bumps, package outline . . . . . . . . . . . . . . . 43  
Figure 21. TSSOP8 – 8-lead thin shrink small outline, package outline . . . . . . . . . . . . . . . . . . . . . . . 44  
Doc ID 8028 Rev 10  
5/50  
Description  
M95160-x, M95080-x  
1
Description  
The M95160-x and M95080-x are electrically erasable programmable memory (EEPROM)  
devices. They are accessed by a high-speed SPI-compatible bus. The memory array is  
organized as 2048 x 8 bit (M95160-x), and 1024 x 8 bit (M95080-x).  
The device is accessed by a simple serial interface that is SPI-compatible. The bus signals  
are C, D and Q, as shown in Table 2 and Figure 1.  
The device is selected when Chip Select (S) is taken low. Communications with the device  
can be interrupted using Hold (HOLD).  
Figure 1.  
Logic diagram  
V
CC  
D
C
S
Q
M95xxx  
W
HOLD  
V
SS  
AI01789C  
Table 2.  
Signal names  
Signal name  
Function  
Direction  
C
Serial Clock  
Input  
Input  
Output  
Input  
Input  
Input  
D
Serial Data input  
Serial Data output  
Chip Select  
Write Protect  
Hold  
Q
S
W
HOLD  
VCC  
VSS  
Supply voltage  
Ground  
6/50  
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M95160-x, M95080-x  
Figure 2.  
Description  
8-pin package connections (top view)  
M95xxx  
S
Q
1
2
3
4
8
V
CC  
HOLD  
7
W
6
5
C
D
V
SS  
AI01790D  
1. See Package mechanical data section for package dimensions, and how to identify pin-1.  
Figure 3.  
M95160 WLCSP connections (top view, marking side, with balls on the  
underside)  
V
Q
S
W
D
SS  
V
HOLD  
C
CC  
Orientation reference  
ai15166  
Doc ID 8028 Rev 10  
7/50  
Signal description  
M95160-x, M95080-x  
2
Signal description  
During all operations, V must be held stable and within the specified valid range:  
CC  
V
(min) to V (max).  
CC  
CC  
All of the input and output signals must be held high or low (according to voltages of V ,  
IH  
V
, V or V , as specified in Table 14. to Table 19.). These signals are described next.  
OH  
IL OL  
2.1  
2.2  
Serial Data output (Q)  
This output signal is used to transfer data serially out of the device. Data is shifted out on the  
falling edge of Serial Clock (C).  
Serial Data input (D)  
This input signal is used to transfer data serially into the device. It receives instructions,  
addresses, and the data to be written. Values are latched on the rising edge of Serial Clock  
(C).  
2.3  
2.4  
Serial Clock (C)  
This input signal provides the timing of the serial interface. Instructions, addresses, or data  
present at Serial Data Input (D) are latched on the rising edge of Serial Clock (C). Data on  
Serial Data Output (Q) changes after the falling edge of Serial Clock (C).  
Chip Select (S)  
When this input signal is high, the device is deselected and Serial Data Output (Q) is at high  
impedance. Unless an internal Write cycle is in progress, the device will be in the Standby  
Power mode. Driving Chip Select (S) low selects the device, placing it in the Active Power  
mode.  
After Power-up, a falling edge on Chip Select (S) is required prior to the start of any  
instruction.  
2.5  
Hold (HOLD)  
The Hold (HOLD) signal is used to pause any serial communications with the device without  
deselecting the device.  
During the Hold condition, the Serial Data Output (Q) is high impedance, and Serial Data  
Input (D) and Serial Clock (C) are Don’t Care.  
To start the Hold condition, the device must be selected, with Chip Select (S) driven low.  
8/50  
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M95160-x, M95080-x  
Signal description  
2.6  
Write Protect (W)  
The main purpose of this input signal is to freeze the size of the area of memory that is  
protected against Write instructions (as specified by the values in the BP1 and BP0 bits of  
the Status Register).  
This pin must be driven either high or low, and must be stable during all write instructions.  
2.7  
2.8  
VCC supply voltage  
V
is the supply voltage.  
CC  
VSS ground  
V
is the reference for the V supply voltage.  
SS  
CC  
Doc ID 8028 Rev 10  
9/50  
Connecting to the SPI bus  
M95160-x, M95080-x  
3
Connecting to the SPI bus  
These devices are fully compatible with the SPI protocol.  
All instructions, addresses and input data bytes are shifted in to the device, most significant  
bit first. The Serial Data input (D) is sampled on the first rising edge of the Serial Clock (C)  
after Chip Select (S) goes low.  
All output data bytes are shifted out of the device, most significant bit first. The Serial Data  
output (Q) is latched on the first falling edge of the Serial Clock (C) after the instruction (such  
as the Read from Memory Array and Read Status Register instructions) have been clocked  
into the device.  
Figure 4. shows three devices, connected to an MCU, on an SPI bus. Only one device is  
selected at a time, so only one device drives the Serial Data output (Q) line at a time, all the  
others being high impedance.  
Figure 4.  
Bus master and memory devices on the SPI bus  
VSS  
VCC  
R
SDO  
SPI Interface with  
(CPOL, CPHA) =  
(0, 0) or (1, 1)  
SDI  
SCK  
VCC  
VCC  
VCC  
C
Q
D
C
Q
D
C Q D  
VSS  
VSS  
VSS  
SPI Bus Master  
SPI Memory  
Device  
SPI Memory  
Device  
SPI Memory  
Device  
R
R
R
CS3 CS2 CS1  
S
S
S
W
HOLD  
W
HOLD  
HOLD  
W
AI12836b  
1. The Write Protect (W) and Hold (HOLD) signals should be driven, high or low as appropriate.  
Figure 4 shows an example of three memory devices connected to an MCU, on an SPI bus.  
Only one memory device is selected at a time, so only one memory device drives the Serial  
Data output (Q) line at a time, the other memory devices are high impedance.  
The pull-up resistor R (represented in Figure 4) ensures that a device is not selected if the  
Bus Master leaves the S line in the high impedance state.  
In applications where the Bus Master may be in a state where all input/output SPI buses are  
high impedance at the same time (for example, if the Bus Master is reset during the  
transmission of an instruction), the clock line (C) must be connected to an external pull-  
down resistor so that, if all inputs/outputs become high impedance, the C line is pulled low  
(while the S line is pulled high): this ensures that S and C do not become high at the same  
time, and so, that the t  
requirement is met. The typical value of R is 100 k.  
SHCH  
10/50  
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M95160-x, M95080-x  
Connecting to the SPI bus  
3.1  
SPI modes  
These devices can be driven by a microcontroller with its SPI peripheral running in either of  
the two following modes:  
CPOL=0, CPHA=0  
CPOL=1, CPHA=1  
For these two modes, input data is latched in on the rising edge of Serial Clock (C), and  
output data is available from the falling edge of Serial Clock (C).  
The difference between the two modes, as shown in Figure 5., is the clock polarity when the  
bus master is in Stand-by mode and not transferring data:  
C remains at 0 for (CPOL=0, CPHA=0)  
C remains at 1 for (CPOL=1, CPHA=1)  
Figure 5.  
SPI modes supported  
CPOL CPHA  
C
0
1
0
1
C
D
MSB  
Q
MSB  
AI01438B  
Doc ID 8028 Rev 10  
11/50  
Operating features  
M95160-x, M95080-x  
4
Operating features  
4.1  
Supply voltage (VCC)  
4.1.1  
Operating supply voltage V  
CC  
Prior to selecting the memory and issuing instructions to it, a valid and stable V voltage  
CC  
within the specified [V (min), V (max)] range must be applied (see Table 9, Table 10 and  
CC  
CC  
Table 11). This voltage must remain stable and valid until the end of the transmission of the  
instruction and, for a Write instruction, until the completion of the internal write cycle (t ). In  
W
order to secure a stable DC supply voltage, it is recommended to decouple the V line with  
CC  
a suitable capacitor (usually of the order of 10 nF to 100 nF) close to the V /V package  
CC SS  
pins.  
4.1.2  
Device reset  
In order to prevent inadvertent write operations during power-up, a power-on-reset (POR)  
circuit is included. At power-up, the device does not respond to any instruction until V  
CC  
reaches the POR threshold voltage (this threshold is defined in DC characteristics tables 15,  
16, 17, 18, 19 and 20 as V ).  
RES  
When V passes over the POR threshold, the device is reset and is in the following state:  
CC  
in Standby Power mode  
deselected (note that, to be executed, an instruction must be preceded by a falling  
edge on Chip Select (S))  
Status Register value:  
the Write Enable Latch (WEL) is reset to 0  
Write In Progress (WIP) is reset to 0  
The SRWD, BP1 and BP0 bits remain unchanged (non-volatile bits)  
When V passes over the POR threshold, the device is reset and enters the Standby  
CC  
Power mode. The device must not be accessed until V reaches a valid and stable V  
CC  
CC  
voltage within the specified [V (min), V (max)] range defined in Table 9, Table 10 and  
CC  
CC  
Table 11.  
4.1.3  
Power-up conditions  
When the power supply is turned on, V rises continuously from V to V . During this  
CC  
SS  
CC  
time, the Chip Select (S) line is not allowed to float but should follow the V voltage. It is  
CC  
therefore recommended to connect the S line to V via a suitable pull-up resistor (see  
CC  
Figure 4).  
In addition, the Chip Select (S) input offers a built-in safety feature, as the S input is edge  
sensitive as well as level sensitive: after power-up, the device does not become selected  
until a falling edge has first been detected on Chip Select (S). This ensures that Chip Select  
(S) must have been high, prior to going low to start the first operation.  
The V voltage has to rise continuously from 0 V up to the minimum V operating voltage  
CC  
CC  
defined in Table 9, Table 10 and Table 11 and the rise time must not vary faster than 1 V/µs.  
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Operating features  
4.1.4  
Power-down  
During power-down (continuous decrease in the V supply voltage below the minimum  
CC  
V
operating voltage defined in Table 9, Table 10 and Table 11), the device must be:  
CC  
deselected (Chip Select S should be allowed to follow the voltage applied on V  
)
CC  
in Standby Power mode (there should not be any internal write cycle in progress).  
4.2  
Active Power and Standby Power modes  
When Chip Select (S) is low, the device is selected, and in the Active Power mode. The  
device consumes I , as specified in Table 14. to Table 19.  
CC  
When Chip Select (S) is high, the device is deselected. If a Write cycle is not currently in  
progress, the device then goes into the Standby Power mode, and the device consumption  
drops to I  
.
CC1  
4.3  
Hold condition  
The Hold (HOLD) signal is used to pause any serial communications with the device without  
resetting the clocking sequence.  
During the Hold condition, the Serial Data Output (Q) is high impedance, and Serial Data  
Input (D) and Serial Clock (C) are Don’t Care.  
To enter the Hold condition, the device must be selected, with Chip Select (S) low.  
Normally, the device is kept selected, for the whole duration of the Hold condition.  
Deselecting the device while it is in the Hold condition, has the effect of resetting the state of  
the device, and this mechanism can be used if it is required to reset any processes that had  
been in progress.  
The Hold condition starts when the Hold (HOLD) signal is driven low at the same time as  
Serial Clock (C) already being low.  
The Hold condition ends when the Hold (HOLD) signal is driven high at the same time as  
Serial Clock (C) already being low.  
4.4  
Status Register  
Figure 6. shows the position of the Status Register in the control logic of the device. The  
Status Register contains a number of status and control bits that can be read or set (as  
appropriate) by specific instructions. See Section 6.3: Read Status Register (RDSR) for a  
detailed description of the Status Register bits  
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Operating features  
M95160-x, M95080-x  
4.5  
Data protection and protocol control  
Non-volatile memory devices can be used in environments that are particularly noisy, and  
within applications that could experience problems if memory bytes are corrupted.  
Consequently, the device features the following data protection mechanisms:  
Write and Write Status Register instructions are checked that they consist of a number  
of clock pulses that is a multiple of eight, before they are accepted for execution.  
All instructions that modify data must be preceded by a Write Enable (WREN)  
instruction to set the Write Enable Latch (WEL) bit. This bit is returned to its reset state  
by the following events:  
Power-up  
Write Disable (WRDI) instruction completion  
Write Status Register (WRSR) instruction completion  
Write (WRITE) instruction completion  
The Block Protect (BP1, BP0) bits in the Status Register allow part of the memory to be  
configured as read-only.  
The Write Protect (W) signal allows the Block Protect (BP1, BP0) bits of the Status  
Register to be protected.  
For any instruction to be accepted, and executed, Chip Select (S) must be driven high after  
the rising edge of Serial Clock (C) for the last bit of the instruction, and before the next rising  
edge of Serial Clock (C).  
Two points need to be noted in the previous sentence:  
The ‘last bit of the instruction’ can be the eighth bit of the instruction code, or the eighth  
bit of a data byte, depending on the instruction (except for Read Status Register  
(RDSR) and Read (READ) instructions).  
The ‘next rising edge of Serial Clock (C)’ might (or might not) be the next bus  
transaction for some other device on the SPI bus.  
Table 3.  
Write-protected block size  
Status Register bits  
Protected array addresses  
Protected block  
BP1  
BP0  
M95160-x  
M95080-x  
0
0
1
1
0
1
0
1
none  
none  
none  
Upper quarter  
Upper half  
0600h - 07FFh  
0400h - 07FFh  
0000h - 07FFh  
0300h - 03FFh  
0200h - 03FFh  
0000h - 03FFh  
Whole memory  
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Memory organization  
5
Memory organization  
The memory is organized as shown in Figure 6.  
Figure 6.  
Block diagram  
HOLD  
W
High voltage  
generator  
Control logic  
S
C
D
Q
I/O shift register  
Address register  
and counter  
Data  
register  
Status  
Register  
Size of the  
read-only  
EEPROM  
area  
1 page  
X decoder  
AI01272d  
Doc ID 8028 Rev 10  
15/50  
Instructions  
M95160-x, M95080-x  
6
Instructions  
Each instruction starts with a single-byte code, as summarized in Table 4.  
If an invalid instruction is sent (one not contained in Table 4.), the device automatically  
deselects itself.  
Table 4.  
Instruction set  
Instruction  
Description  
Write Enable  
Instruction format  
WREN  
WRDI  
0000 0110  
0000 0100  
0000 0101  
0000 0001  
0000 0011  
0000 0010  
Write Disable  
RDSR  
WRSR  
READ  
WRITE  
Read Status Register  
Write Status Register  
Read from Memory Array  
Write to Memory Array  
6.1  
Write Enable (WREN)  
The Write Enable Latch (WEL) bit must be set prior to each WRITE and WRSR instruction.  
The only way to do this is to send a Write Enable instruction to the device.  
As shown in Figure 7., to send this instruction to the device, Chip Select (S) is driven low,  
and the bits of the instruction byte are shifted in, on Serial Data Input (D). The device then  
enters a wait state. It waits for the device to be deselected, by Chip Select (S) being driven  
high.  
Figure 7.  
Write Enable (WREN) sequence  
S
0
1
2
3
4
5
6
7
C
D
Q
Instruction  
High Impedance  
AI02281E  
16/50  
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Instructions  
6.2  
Write Disable (WRDI)  
One way of resetting the Write Enable Latch (WEL) bit is to send a Write Disable instruction  
to the device.  
As shown in Figure 8., to send this instruction to the device, Chip Select (S) is driven low,  
and the bits of the instruction byte are shifted in, on Serial Data Input (D).  
The device then enters a wait state. It waits for a the device to be deselected, by Chip Select  
(S) being driven high.  
The Write Enable Latch (WEL) bit, in fact, becomes reset by any of the following events:  
Power-up  
WRDI instruction execution  
WRSR instruction completion  
WRITE instruction completion.  
Figure 8.  
Write Disable (WRDI) sequence  
S
0
1
2
3
4
5
6
7
C
D
Q
Instruction  
High Impedance  
AI03750D  
Doc ID 8028 Rev 10  
17/50  
Instructions  
M95160-x, M95080-x  
6.3  
Read Status Register (RDSR)  
The Read Status Register (RDSR) instruction allows the Status Register to be read. The  
Status Register may be read at any time, even while a Write or Write Status Register cycle  
is in progress. When one of these cycles is in progress, it is recommended to check the  
Write In Progress (WIP) bit before sending a new instruction to the device. It is also possible  
to read the Status Register continuously, as shown in Figure 9.  
The status and control bits of the Status Register are as follows:  
6.3.1  
6.3.2  
6.3.3  
WIP bit  
The Write In Progress (WIP) bit indicates whether the memory is busy with a Write or Write  
Status Register cycle. When set to 1, such a cycle is in progress, when reset to 0 no such  
cycle is in progress.  
WEL bit  
The Write Enable Latch (WEL) bit indicates the status of the internal Write Enable Latch.  
When set to 1 the internal Write Enable Latch is set, when set to 0 the internal Write Enable  
Latch is reset and no Write or Write Status Register instruction is accepted.  
BP1, BP0 bits  
The Block Protect (BP1, BP0) bits are non-volatile. They define the size of the area to be  
software protected against Write instructions. These bits are written with the Write Status  
Register (WRSR) instruction. When one or both of the Block Protect (BP1, BP0) bits is set to  
1, the relevant memory area (as defined in Table 5.) becomes protected against Write  
(WRITE) instructions. The Block Protect (BP1, BP0) bits can be written provided that the  
Hardware Protected mode has not been set.  
6.3.4  
SRWD bit  
The Status Register Write Disable (SRWD) bit is operated in conjunction with the Write  
Protect (W) signal. The Status Register Write Disable (SRWD) bit and Write Protect (W)  
signal allow the device to be put in the Hardware Protected mode (when the Status Register  
Write Disable (SRWD) bit is set to 1, and Write Protect (W) is driven low). In this mode, the  
non-volatile bits of the Status Register (SRWD, BP1, BP0) become read-only bits and the  
Write Status Register (WRSR) instruction is no longer accepted for execution.  
Table 5.  
Status Register format  
b7  
b0  
SRWD  
0
0
0
BP1  
BP0  
WEL  
WIP  
Status Register Write Protect  
Block Protect Bits  
Write Enable Latch Bit  
Write In Progress Bit  
18/50  
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Instructions  
Figure 9.  
Read Status Register (RDSR) sequence  
S
0
1
2
3
4
5
6
7
8
9 10 11 12 13 14 15  
C
D
Instruction  
Status Register Out  
Status Register Out  
High Impedance  
Q
7
6
5
4
3
2
1
0
7
6
5
4
3
2
1
0
7
MSB  
MSB  
AI02031E  
Doc ID 8028 Rev 10  
19/50  
Instructions  
M95160-x, M95080-x  
6.4  
Write Status Register (WRSR)  
The Write Status Register (WRSR) instruction allows new values to be written to the Status  
Register. Before it can be accepted, a Write Enable (WREN) instruction must previously  
have been executed.  
The Write Status Register (WRSR) instruction is entered by driving Chip Select (S) low,  
followed by the instruction code, the data byte on Serial Data input (D) and Chip Select (S)  
driven high. Chip Select (S) must be driven high after the rising edge of Serial Clock (C) that  
latches in the eighth bit of the data byte, and before the next rising edge of Serial Clock (C).  
Otherwise, the Write Status Register (WRSR) instruction is not executed.  
The instruction sequence is shown in Figure 10.  
Driving the Chip Select (S) signal high at a byte boundary of the input data triggers the self-  
timed write cycle that takes t to complete (as specified in Table 21, Table 22, Table 23,  
W
Table 24, Table 26 and Table 27).  
While the Write Status Register cycle is in progress, the Status Register may still be read to  
check the value of the Write in progress (WIP) bit: the WIP bit is 1 during the self-timed write  
cycle t , and, 0 when the write cycle is complete. The WEL bit (Write enable latch) is also  
W
reset at the end of the write cycle t .  
W
The Write Status Register (WRSR) instruction allows the user to change the values of the  
BP1, BP0 and SRWD bits:  
The Block Protect (BP1, BP0) bits define the size of the area that is to be treated as  
read only, as defined in Table 3.  
The SRWD bit (Status Register Write Disable bit), in accordance with the signal read  
on the Write Protect pin (W), allows the user to set or reset the Write protection mode  
of the Status Register itself, as defined in Table 6. When in Write-protected mode, the  
Write Status Register (WRSR) instruction is not executed.  
The contents of the SRWD and BP1, BP0 bits are updated after the completion of the  
WRSR instruction, including the t Write cycle.  
W
The Write Status Register (WRSR) instruction has no effect on the b6, b5, b4, b1, b0 bits in  
the Status Register. Bits b6, b5, b4 are always read as 0.  
Table 6.  
Protection modes  
Memory content  
W
signal  
SRWD Write protection of the  
Mode  
bit  
Status Register  
Protected area(1) Unprotected area(1)  
1
0
0
0
Status Register is  
writable (if the WREN  
Software- instruction has set the  
protected WEL bit)  
Ready to accept  
Write-protected  
Write instructions  
(SPM)  
The values in the BP1  
and BP0 bits can be  
changed  
1
0
1
1
Status Register is  
Hardware- Hardware write-protected  
protected The values in the BP1  
Ready to accept  
Write-protected  
Write instructions  
(HPM)  
and BP0 bits cannot be  
changed  
1. As defined by the values in the Block Protect (BP1, BP0) bits of the Status Register, as shown in Table 3.  
20/50  
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The protection features of the device are summarized in Table 6.  
Instructions  
When the Status Register Write Disable (SRWD) bit in the Status Register is 0 (its initial  
delivery state), it is possible to write to the Status Register (provided that the WEL bit has  
previously been set by a WREN instruction), regardless of the logic level applied on the  
Write Protect (W) input pin.  
When the Status Register Write Disable (SRWD) bit in the Status Register is set to 1, two  
cases need to be considered, depending on the state of the Write Protect (W) input pin:  
If Write Protect (W) is driven high, it is possible to write to the Status Register (provided  
that the WEL bit has previously been set by a WREN instruction.  
If Write Protect (W) is driven low, it is not possible to write to the Status Register even if  
the WEL bit has previously been set by a WREN instruction. (Attempts to write to the  
Status Register are rejected, and are not accepted for execution). As a consequence,  
all the data bytes in the memory area, which are software-protected (SPM) by the Block  
Protect (BP1, BP0) bits in the Status Register, are also hardware-protected against  
data modification.  
Regardless of the order of the two events, the Hardware-protected mode (HPM) can be  
entered by:  
either setting the SRWD bit after driving the Write Protect (W) input pin low  
or driving the Write Protect (W) input pin low after setting the SRWD bit  
Once the Hardware-protected mode (HPM) has been entered, the only way of exiting it is to  
pull high the Write Protect (W) input pin.  
If the Write Protect (W) input pin is permanently tied high, the Hardware-protected mode  
(HPM) can never be activated, and only the Software-protected mode (SPM), using the  
Block Protect (BP1, BP0) bits in the Status Register, can be used.  
(1)  
Table 7.  
Address range bits  
Device  
M95160-x  
M95080-x  
Address bits  
A10-A0  
A9-A0  
1. b15 to b11 are Don’t Care on the M95160-x.  
b15 to b10 are Don’t Care on the M95080-x.  
Figure 10. Write Status Register (WRSR) sequence  
S
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15  
C
Instruction  
Status  
Register In  
7
6
5
4
3
2
0
1
D
Q
High Impedance  
MSB  
AI02282D  
Doc ID 8028 Rev 10  
21/50  
Instructions  
M95160-x, M95080-x  
6.5  
Read from Memory Array (READ)  
As shown in Figure 11., to send this instruction to the device, Chip Select (S) is first driven  
low. The bits of the instruction byte and address bytes are then shifted in, on Serial Data  
Input (D). The address is loaded into an internal address register, and the byte of data at  
that address is shifted out, on Serial Data Output (Q).  
If Chip Select (S) continues to be driven low, the internal address register is automatically  
incremented, and the byte of data at the new address is shifted out.  
When the highest address is reached, the address counter rolls over to zero, allowing the  
Read cycle to be continued indefinitely. The whole memory can, therefore, be read with a  
single READ instruction.  
The Read cycle is terminated by driving Chip Select (S) high. The rising edge of the Chip  
Select (S) signal can occur at any time during the cycle.  
The first byte addressed can be any byte within any page.  
The instruction is not accepted, and is not executed, if a Write cycle is currently in progress.  
Figure 11. Read from Memory Array (READ) sequence  
S
0
1
2
3
4
5
6
7
8
9
10  
20 21 22 23 24 25 26 27 28 29 30 31  
C
Instruction  
16-Bit Address  
15 14 13  
MSB  
3
2
1
0
D
Q
Data Out 1  
Data Out 2  
High Impedance  
2
7
6
5
4
3
1
7
0
MSB  
AI01793D  
1. Depending on the memory size, as shown in Table 7., the most significant address bits are Don’t Care.  
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Instructions  
6.6  
Write to Memory Array (WRITE)  
As shown in Figure 12., to send this instruction to the device, Chip Select (S) is first driven  
low. The bits of the instruction byte, address byte, and at least one data byte are then shifted  
in, on Serial Data Input (D).  
The instruction is terminated by driving Chip Select (S) high at a byte boundary of the input  
data. The self-timed Write cycle, triggered by the Chip Select (S) rising edge, continues for a  
period t (as specified in Table 22. to Table 26.), at the end of which the Write in Progress  
W
(WIP) bit is reset to 0.  
In the case of Figure 12., Chip Select (S) is driven high after the eighth bit of the data byte  
has been latched in, indicating that the instruction is being used to write a single byte. If,  
though, Chip Select (S) continues to be driven low, as shown in Figure 13., the next byte of  
input data is shifted in, so that more than a single byte, starting from the given address  
towards the end of the same page, can be written in a single internal Write cycle.  
Each time a new data byte is shifted in, the least significant bits of the internal address  
counter are incremented. If the number of data bytes sent to the device exceeds the page  
boundary, the internal address counter rolls over to the beginning of the page, and the  
previous data there are overwritten with the incoming data. (The page size of these devices  
is 32 bytes).  
The instruction is not accepted, and is not executed, under the following conditions:  
if the Write Enable Latch (WEL) bit has not been set to 1 (by executing a Write Enable  
instruction just before)  
if a Write cycle is already in progress  
if the device has not been deselected, by Chip Select (S) being driven high, at a byte  
boundary (after the eighth bit, b0, of the last data byte that has been latched in)  
if the addressed page is in the region protected by the Block Protect (BP1 and BP0)  
bits.  
Note:  
The self-timed write cycle t is internally executed as a sequence of two consecutive  
W
events: [Erase addressed byte(s)], followed by [Program addressed byte(s)]. An erased bit is  
read as “0” and a programmed bit is read as “1”.  
Figure 12. Byte Write (WRITE) sequence  
S
0
1
2
3
4
5
6
7
8
9
10  
20 21 22 23 24 25 26 27 28 29 30 31  
C
Instruction  
16-Bit Address  
Data Byte  
15 14 13  
3
2
1
0
7
6
5
4
3
2
0
1
D
Q
High Impedance  
AI01795D  
1. Depending on the memory size, as shown in Table 7., the most significant address bits are Don’t Care.  
Doc ID 8028 Rev 10  
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Instructions  
M95160-x, M95080-x  
Figure 13. Page Write (WRITE) sequence  
S
0
1
2
3
4
5
6
7
8
9
10  
20 21 22 23 24 25 26 27 28 29 30 31  
C
D
Instruction  
16-Bit Address  
Data Byte 1  
15 14 13  
3
2
1
0
7
6
5
4
3
2
0
1
S
C
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47  
Data Byte 2  
Data Byte 3  
Data Byte N  
7
6
5
4
3
2
0
7
6
5
4
3
2
0
6
5
4
3
2
0
1
1
1
D
AI01796D  
1. Depending on the memory size, as shown in Table 7., the most significant address bits are Don’t Care.  
24/50  
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Delivery state  
7
Delivery state  
7.1  
Initial delivery state  
The device is delivered with the memory array set at all 1s (FFh). The Status Register Write  
Disable (SRWD) and Block Protect (BP1 and BP0) bits are initialized to 0.  
8
Maximum rating  
Stressing the device outside the ratings listed in Table 8. may cause permanent damage to  
the device. These are stress ratings only, and operation of the device at these, or any other  
conditions outside those indicated in the operating sections of this specification, is not  
implied. Exposure to absolute maximum rating conditions for extended periods may affect  
device reliability. Refer also to the STMicroelectronics SURE Program and other relevant  
quality documents.  
Table 8.  
Symbol  
Absolute maximum ratings  
Parameter  
Min.  
Max.  
Unit  
TA  
TSTG  
TLEAD  
VO  
Ambient operating temperature  
Storage temperature  
–40  
–65  
130  
150  
°C  
°C  
°C  
V
Lead temperature during soldering  
Output voltage  
See note (1)  
–0.50  
–0.50  
–0.50  
–4000  
VCC+0.6  
6.5  
VI  
Input voltage  
V
VCC  
VESD  
Supply voltage  
6.5  
V
Electrostatic discharge voltage (human body model)(2)  
4000  
V
1. Compliant with JEDEC Std J-STD-020C (for small body, Sn-Pb or Pb assembly), the ST ECOPACK®  
7191395 specification, and the European directive on Restrictions on Hazardous Substances (RoHS)  
2002/95/EU  
2. AEC-Q100-002 (compliant with JEDEC Std JESD22-A114, C1=100 pF, R1=1500 , R2=500 )  
Doc ID 8028 Rev 10  
25/50  
DC and AC parameters  
M95160-x, M95080-x  
9
DC and AC parameters  
This section summarizes the operating and measurement conditions, and the DC and AC  
characteristics of the device. The parameters in the DC and AC characteristic tables that  
follow are derived from tests performed under the measurement conditions summarized in  
the relevant tables. Designers should check that the operating conditions in their circuit  
match the measurement conditions when relying on the quoted parameters.  
Table 9.  
Symbol  
Operating conditions (M95160 and M95080)  
Parameter  
Min.  
Max.  
Unit  
VCC  
TA  
Supply voltage  
4.5  
–40  
–40  
5.5  
85  
V
Ambient operating temperature (device grade 6)  
Ambient operating temperature (device grade 3)  
°C  
°C  
125  
Table 10. Operating conditions (M95160-W and M95080-W)  
Symbol  
Parameter  
Min.  
Max.  
Unit  
VCC  
Supply voltage  
2.5  
–40  
–40  
5.5  
85  
V
Ambient operating temperature (device grade 6)  
Ambient operating temperature (device grade 3)  
°C  
°C  
TA  
125  
Table 11. Operating conditions (M95160-R and M95080-R)  
Symbol  
Parameter  
Min.  
Max.  
Unit  
VCC  
TA  
Supply voltage  
Ambient operating temperature  
1.8  
5.5  
85  
V
–40  
°C  
(1)  
Table 12. Operating conditions (M95160-F)  
Symbol  
Parameter  
Min.  
Max.  
Unit  
VCC  
TA  
Supply voltage  
Ambient operating temperature  
1.7  
5.5  
85  
V
–40  
°C  
1. Preliminary data.  
(1)  
Table 13. AC measurement conditions  
Symbol  
Parameter  
Min.  
Typ.  
Max.  
Unit  
CL  
Load capacitance  
30  
pF  
ns  
V
Input rise and fall times  
Input pulse voltages  
50  
0.2VCC to 0.8VCC  
0.3VCC to 0.7VCC  
Input and output timing reference voltages  
V
1. Output Hi-Z is defined as the point where data out is no longer driven.  
26/50  
Doc ID 8028 Rev 10  
M95160-x, M95080-x  
Figure 14. AC measurement I/O waveform  
DC and AC parameters  
Input Levels  
Input and Output  
Timing Reference Levels  
0.8V  
CC  
0.7V  
CC  
0.3V  
CC  
0.2V  
CC  
AI00825B  
(1)  
Table 14. Capacitance  
Symbol  
Parameter  
Test condition  
Min.  
Max.  
Unit  
COUT  
Output capacitance (Q)  
Input capacitance (D)  
VOUT = 0 V  
VIN = 0 V  
8
8
6
pF  
pF  
pF  
CIN  
Input capacitance (other pins)  
VIN = 0 V  
1. Sampled only, not 100% tested, at TA = 25 °C and a frequency of 5 MHz.  
Table 15.  
Symbol  
DC characteristics (M95160 and M95080, device grade 3)  
Parameter  
Test condition  
VIN = VSS or VCC  
Min.  
Max.  
Unit  
ILI  
Input leakage current  
Output leakage current  
2
2
µA  
µA  
ILO  
S = VCC, VOUT = VSS or VCC  
C = 0.1VCC/0.9VCC at 5 MHz,  
VCC = 5 V, Q = open  
ICC  
Supply current  
3
5
mA  
ICC1  
VIL  
Supply current (Standby) S = VCC, VCC = 5 V, VIN = VSS or VCC  
µA  
V
Input low voltage  
Input high voltage  
–0.45 0.3 VCC  
0.7 VCC VCC+1  
0.4  
VIH  
V
(1)  
VOL  
Output low voltage  
Output high voltage  
IOL = 2 mA, VCC = 5 V  
IOH = –2 mA, VCC = 5 V  
V
(1)  
VOH  
0.8 VCC  
V
Internal reset threshold  
voltage  
(2)  
VRES  
2.5  
3.5  
V
1. For all 5 V range devices, the device meets the output requirements for both TTL and CMOS standards.  
2. Characterized only, not 100% tested.  
Doc ID 8028 Rev 10  
27/50  
DC and AC parameters  
M95160-x, M95080-x  
Table 16.  
Symbol  
DC characteristics (M95160 and M95080, device grade 6)  
Parameter  
Input leakage current  
Test conditions  
VIN = VSS or VCC  
Min.  
Max.  
Unit  
ILI  
2
2
µA  
µA  
ILO  
Output leakage current S = VCC, VOUT = VSS or VCC  
C = 0.1VCC/0.9VCC at 10 MHz,  
Supply current  
ICC  
5
2
mA  
µA  
VCC = 5 V, Q = open  
Supply current  
(Standby)  
S = VCC, VCC = 5 V,  
VIN = VSS or VCC  
ICC1  
VIL  
VIH  
Input low voltage  
Input high voltage  
Output low voltage  
Output high voltage  
–0.45  
0.3 VCC  
VCC+1  
0.4  
V
V
V
V
0.7 VCC  
(1)  
VOL  
VOH  
IOL = 2 mA, VCC = 5 V  
IOH = –2 mA, VCC = 5 V  
(1)  
0.8 VCC  
2.5  
Internal reset threshold  
voltage  
(2)  
VRES  
3.5  
V
1. For all 5 V range devices, the device meets the output requirements for both TTL and CMOS standards.  
2. Characterized only, not 100% tested.  
Table 17. DC characteristics (M95160-W and M95080-W, device grade 3)  
Symbol  
Parameter  
Test conditions  
Min.  
Max.  
Unit  
Input leakage  
current  
ILI  
VIN = VSS or VCC  
2
µA  
Output leakage  
current  
ILO  
ICC  
S = VCC, VOUT = VSS or VCC  
2
2
µA  
mA  
µA  
C = 0.1VCC/0.9VCC at 5 MHz,  
VCC = 2.5 V, Q = open  
Supply current  
Supply current  
(Standby)  
ICC1  
S = VCC, VCC = 2.5 V, VIN = VSS or VCC  
2
VIL  
VIH  
Input low voltage  
Input high voltage  
–0.45  
0.3 VCC  
V
V
V
V
0.7 VCC VCC+1  
0.4  
VOL  
VOH  
Output low voltage IOL = 1.5 mA, VCC = 2.5 V  
Output high voltage IOH = –0.4 mA, VCC = 2.5 V  
0.8 VCC  
Internal reset  
threshold voltage  
(1)  
VRES  
1.0  
1.65  
V
1. Characterized only, not 100% tested.  
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Doc ID 8028 Rev 10  
M95160-x, M95080-x  
DC and AC parameters  
Table 18. DC characteristics (M95160-W and M95080-W, device grade 6)  
Symbol  
Parameter  
Test conditions  
Min.  
Max.  
Unit  
Input leakage  
current  
ILI  
VIN = VSS or VCC  
2
µA  
Output leakage  
current  
ILO  
S = VCC, VOUT = VSS or VCC  
2
2
µA  
C = 0.1VCC/0.9VCC at 5 MHz,  
VCC = 2.5V, Q = open, Process SA  
mA  
ICC  
Supply current  
C = 0.1VCC/0.9VCC at 10 MHz,  
VCC = 2.5 V, Q = open, Process GB or  
SB  
5
2
mA  
µA  
Supply current  
(Standby)  
S = VCC, 2.5 V <VCC < 5.5 V  
VIN = VSS or VCC  
ICC1  
VIL  
VIH  
Input low voltage  
Input high voltage  
–0.45 0.3 VCC  
0.7 VCC VCC+1  
0.4  
V
V
V
V
VOL  
VOH  
Output low voltage IOL = 1.5 mA, VCC = 2.5 V  
Output high voltage IOH = –0.4 mA, VCC = 2.5 V  
0.8 VCC  
Internal reset  
threshold voltage  
(1)  
VRES  
1.0  
1.65  
V
1. Characterized only, not 100% tested.  
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DC and AC parameters  
M95160-x, M95080-x  
(1)  
Table 19. DC characteristics (M95160-R and M95080-R)  
Symbol  
Parameter  
Test conditions  
Min.  
Max.  
Unit  
Input leakage  
current  
ILI  
VIN = VSS or VCC  
2
µA  
Output leakage  
current  
S = VCC, voltage applied on Q = VSS or  
VCC  
ILO  
2
3
µA  
mA  
mA  
VCC = 2.5 V, C = 0.1 VCC or 0.9VCC  
,
fC = 5 MHz, Q = open  
Supply current  
(Read)  
ICCR  
VCC = 1.8 V, C = 0.1VCC or 0.9VCC at  
2
max clock frequency, Q = open  
VCC = 5.0 V, S = VCC, VIN = VSS or VCC  
2
µA  
µA  
µA  
V
Supply current  
(Standby)  
ICC1  
VCC = 2.5 V, S = VCC, VIN = VSS or VCC  
1
1
VCC = 1.8 V, S = VCC, VIN = VSS or VCC  
2.5V < VCC < 5.5V  
–0.45  
0.3VCC  
VIL  
VIH  
Input low voltage  
Input high voltage  
1.8V < VCC < 2.5V  
–0.45 0.25VCC  
0.7VCC VCC+1  
0.75VCC VCC+1  
V
2.5V < VCC < 5.5V  
V
1.8V < VCC < 2.5V  
V
V
CC = 2.5 V, IOL = 1.5 mA,  
0.2VCC  
0.3  
V
V
or VCC = 5.5 V, IOL = 2 mA  
VOL  
Output low voltage  
V
CC = 1.8 V, IOL = 0.15 mA  
CC = 2.5 V, IOH = –0.4 mA,  
V
VOH  
Output high voltage or VCC = 5.5 V, IOH = –2 mA,  
or VCC = 1.8 V, IOH = –0.1 mA  
0.8VCC  
V
V
Internal reset  
threshold voltage  
(2)  
VRES  
1.0  
1.65  
1. If the application uses the M95080-R and M95160-R at 2.5 V VCC 5.5 V and –40 °C TA +85 °C,  
please refer to Table 16: DC characteristics (M95160 and M95080, device grade 6) instead of the above  
table.  
2. Characterized only, not 100% tested.  
30/50  
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M95160-x, M95080-x  
DC and AC parameters  
Table 20. DC characteristics (M95160-F)  
Symbol  
Parameter  
Test conditions  
Min.  
Max.  
Unit  
ILI  
Input leakage current VIN = VSS or VCC  
2
µA  
Output leakage  
current  
S = VCC, voltage applied on Q = VSS or  
VCC  
ILO  
2
3
µA  
mA  
mA  
VCC = 2.5 V, C = 0.1 VCC or 0.9VCC  
,
fC = 5 MHz, Q = open  
Supply current  
(Read)  
ICCR  
VCC = 1.7 V, C = 0.1VCC or 0.9VCC at  
max clock frequency, Q = open  
2
VCC = 5.0 V, S = VCC, VIN = VSS or VCC  
VCC = 2.5 V, S = VCC, VIN = VSS or VCC  
2
µA  
µA  
µA  
V
Supply current  
(Standby)  
ICC1  
1
1
VCC = 1.7 V, S = VCC, VIN = VSS or VCC  
2.5 V < VCC < 5.5 V  
1.8 < VCC < 2.5 V  
1.7 V < VCC < 1.8 V  
2.5 V < VCC < 5.5 V  
1.7 V < VCC < 2.5 V  
–0.45  
0.3VCC  
VIL  
Input low voltage  
–0.45 0.25VCC  
–0.45 0.20VCC  
0.7VCC VCC+1  
0.75VCC VCC+1  
V
V
V
VIH  
Input high voltage  
Output low voltage  
V
VCC = 2.5 V, IOL = 1.5 mA,  
0.2VCC  
0.2  
V
V
or VCC = 5.5 V, IOL = 2 mA  
VOL  
V
CC = 1.7 V, IOL = 0.15 mA  
CC = 2.5 V, IOH = –0.4 mA,  
V
VOH  
Output high voltage or VCC = 5.5 V, IOH = –2 mA,  
or VCC = 1.7 V, IOH = –0.1 mA  
0.8VCC  
V
V
Internal reset  
threshold voltage  
(1)  
VRES  
1.0  
1.65  
1. Characterized only, not 100% tested.  
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31/50  
DC and AC parameters  
Table 21.  
M95160-x, M95080-x  
AC characteristics (M95160 and M95080, device grade 3)  
Test conditions specified in Table 13. and Table 9.  
Symbol  
Alt.  
Parameter  
Min.  
Max.  
Unit  
fC  
fSCK  
tCSS1  
tCSS2  
tCS  
Clock frequency  
D.C.  
90  
5
MHz  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
µs  
µs  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ms  
tSLCH  
tSHCH  
tSHSL  
tCHSH  
tCHSL  
S active setup time  
S not active setup time  
S deselect time  
90  
100  
90  
tCSH  
S active hold time  
S not active hold time  
Clock high time  
90  
(1)  
tCH  
tCLH  
tCLL  
tRC  
90  
(1))  
tCL  
Clock low time  
90  
(2)  
tCLCH  
Clock rise time  
1
1
(2)  
tCHCL  
tFC  
Clock fall time  
tDVCH  
tCHDX  
tHHCH  
tHLCH  
tCLHL  
tCLHH  
tDSU  
tDH  
Data in setup time  
20  
30  
70  
40  
0
Data in hold time  
Clock low hold time after HOLD not active  
Clock low hold time after HOLD active  
Clock low set-up time before HOLD active  
Clock low set-up time before HOLD not active  
Output disable time  
0
(2)  
tSHQZ  
tDIS  
tV  
100  
60  
tCLQV  
Clock low to output valid  
Output hold time  
tCLQX  
tHO  
tRO  
tFO  
tLZ  
0
(2)  
tQLQH  
Output rise time  
50  
50  
50  
100  
5
(2)  
tQHQL  
Output fall time  
tHHQV  
HOLD high to output valid  
HOLD low to output high-Z  
Write time  
(2)  
tHLQZ  
tHZ  
tWC  
tW  
1. tCH + tCL must never be lower than the shortest possible clock period, 1/fC(max).  
2. Value guaranteed by characterization, not 100% tested in production.  
32/50  
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M95160-x, M95080-x  
Table 22.  
DC and AC parameters  
AC characteristics (M95160 and M95080, device grade 6)  
Test conditions specified in Table 13. and Table 9.  
Symbol  
Alt.  
Parameter  
Min.  
Max.  
Unit  
fC  
fSCK Clock frequency  
D.C.  
15  
15  
40  
25  
15  
40  
40  
10  
MHz  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
µs  
µs  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ms  
tSLCH  
tSHCH  
tSHSL  
tCHSH  
tCHSL  
tCSS1 S active setup time  
tCSS2 S not active setup time  
tCS S deselect time  
tCSH S active hold time  
S not active hold time  
(1)  
tCH  
tCLH  
tCLL  
tRC  
Clock high time  
Clock low time  
Clock rise time  
Clock fall time  
(1)  
tCL  
(2)  
tCLCH  
1
1
(2)  
tCHCL  
tFC  
tDVCH  
tCHDX  
tHHCH  
tHLCH  
tCLHL  
tCLHH  
tDSU Data in setup time  
15  
15  
15  
20  
0
tDH  
Data in hold time  
Clock low hold time after HOLD not active  
Clock low hold time after HOLD active  
Clock low set-up time before HOLD active  
Clock low set-up time before HOLD not active  
Output disable time  
0
(2)  
tSHQZ  
tDIS  
tV  
25  
35  
tCLQV  
Clock low to output valid  
Output hold time  
tCLQX  
tHO  
tRO  
tFO  
tLZ  
0
(2)  
tQLQH  
Output rise time  
20  
20  
25  
35  
5
(2)  
tQHQL  
Output fall time  
tHHQV  
HOLD high to output valid  
HOLD low to output high-Z  
Write Time  
((2))  
tHLQZ  
tHZ  
tWC  
tW  
1. tCH + tCL must never be lower than the shortest possible clock period, 1/fC(max).  
2. Value guaranteed by characterization, not 100% tested in production.  
Doc ID 8028 Rev 10  
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DC and AC parameters  
M95160-x, M95080-x  
Table 23. AC characteristics (M95160-W and M95080-W, device grade 3)  
Test conditions specified in Table 13. and Table 10.  
Symbol  
Alt.  
Parameter  
Min.  
Max. Unit  
fC  
fSCK  
Clock frequency  
D.C.  
90  
5
MHz  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
µs  
µs  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ms  
tSLCH  
tSHCH  
tSHSL  
tCHSH  
tCHSL  
tCSS1 S active setup time  
tCSS2 S not active setup time  
90  
tCS  
S deselect time  
100  
90  
tCSH S active hold time  
S not active hold time  
90  
(1)  
tCH  
tCLH  
tCLL  
tRC  
Clock high time  
Clock low time  
Clock rise time  
Clock fall time  
90  
(1)  
tCL  
90  
(2)  
tCLCH  
1
1
(2)  
tCHCL  
tFC  
tDVCH  
tCHDX  
tHHCH  
tHLCH  
tCLHL  
tCLHH  
tDSU Data in setup time  
20  
30  
70  
40  
0
tDH  
Data in hold time  
Clock low hold time after HOLD not active  
Clock low hold time after HOLD active  
Clock low set-up time before HOLD active  
Clock low set-up time before HOLD not active  
Output disable time  
0
(2)  
tSHQZ  
tDIS  
tV  
100  
60  
tCLQV  
Clock low to output valid  
Output hold time  
tCLQX  
tHO  
tRO  
tFO  
tLZ  
0
(2)  
tQLQH  
Output rise time  
50  
50  
50  
100  
5
(2)  
tQHQL  
Output fall time  
tHHQV  
HOLD high to output valid  
HOLD low to output high-Z  
Write time  
(2)  
tHLQZ  
tHZ  
tWC  
tW  
1. tCH + tCL must never be lower than the shortest possible clock period, 1/fC(max).  
2. Value guaranteed by characterization, not 100% tested in production.  
34/50  
Doc ID 8028 Rev 10  
M95160-x, M95080-x  
DC and AC parameters  
Table 24. AC characteristics (M95160-W and M95080-W, device grade 6)  
Test conditions specified in Table 13. and Table 10.  
Symbol  
Alt.  
Parameter  
Min.  
Max.  
Unit  
fC  
fSCK Clock frequency  
D.C.  
30  
30  
40  
30  
30  
40  
40  
10  
MHz  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
µs  
µs  
ns  
ns  
ns  
ns  
ns  
tSLCH  
tSHCH  
tSHSL  
tCHSH  
tCHSL  
tCSS1 S active setup time  
tCSS2 S not active setup time  
tCS  
S deselect time  
tCSH S active hold time  
S not active hold time  
(1)  
tCH  
tCLH  
tCLL  
tRC  
Clock high time  
Clock low time  
Clock rise time  
Clock fall time  
(1)  
tCL  
(2)  
tCLCH  
2
2
(2)  
tCHCL  
tFC  
tDVCH  
tCHDX  
tHHCH  
tHLCH  
tCLHL  
tDSU Data in setup time  
10  
10  
30  
30  
0
tDH  
Data in hold time  
Clock low hold time after HOLD not active  
Clock low hold time after HOLD active  
Clock low set-up time before HOLD active  
Clock low set-up time before HOLD not  
active  
tCLHH  
0
ns  
(2)  
tSHQZ  
tDIS  
tV  
Output disable time  
Clock low to output valid  
Output hold time  
40  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ms  
tCLQV  
tCLQX  
40(3)  
tHO  
tRO  
tFO  
tLZ  
0
(2)  
tQLQH  
Output rise time  
40  
40  
40  
40  
5
(2)  
tQHQL  
Output fall time  
tHHQV  
HOLD high to output valid  
HOLD low to output high-Z  
Write time  
(2)  
tHLQZ  
tHZ  
tWC  
tW  
1. tCH + tCL must never be lower than the shortest possible clock period, 1/fC(max).  
2. Value guaranteed by characterization, not 100% tested in production.  
3. tCLQV must be compatible with tCL (clock low time): if the SPI bus master offers a Read setup time tSU  
0 ns, tCL can be equal to (or greater than) tCLQV. In all other cases, tCL must be equal to (or greater than)  
CLQV + tSU  
=
t
.
Doc ID 8028 Rev 10  
35/50  
DC and AC parameters  
M95160-x, M95080-x  
Table 25. AC characteristics for M95160-Wxx6/S and M95080-Wxx6/S  
Test conditions specified in Table 10 and Table 13  
Symbol  
Alt.  
Parameter  
Min.  
Max.  
Unit  
fC  
fSCK Clock frequency  
D.C.  
90  
5
MHz  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
µs  
µs  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ms  
tSLCH  
tSHCH  
tSHSL  
tCHSH  
tCHSL  
tCSS1 S active setup time  
tCSS2 S not active setup time  
90  
tCS  
S deselect time  
100  
90  
tCSH S active hold time  
S not active hold time  
tCLH Clock high time  
tCLL Clock low time  
90  
(1)  
tCH  
90  
(1)  
tCL  
90  
(2)  
tCLCH  
tRC  
tFC  
Clock rise time  
Clock fall time  
1
1
(2)  
tCHCL  
tDVCH  
tCHDX  
tHHCH  
tHLCH  
tCLHL  
tCLHH  
tDSU Data in setup time  
20  
30  
70  
40  
0
tDH  
Data in hold time  
Clock low hold time after HOLD not active  
Clock low hold time after HOLD active  
Clock low set-up time before HOLD active  
Clock low set-up time before HOLD not active  
0
(2)  
tSHQZ  
tDIS Output disable time  
100  
60  
tCLQV  
tV  
Clock low to output valid  
Output hold time  
tCLQX  
tHO  
tRO  
tFO  
tLZ  
0
(2)  
tQLQH  
Output rise time  
50  
50  
50  
100  
5
(2)  
tQHQL  
Output fall time  
tHHQV  
HOLD high to output valid  
HOLD low to output high-Z  
(2)  
tHLQZ  
tHZ  
tW  
tWC Write time  
1. tCH + tCL must never be lower than the shortest possible clock period, 1/fC(max).  
2. Value guaranteed by characterization, not 100% tested in production.  
36/50  
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M95160-x, M95080-x  
DC and AC parameters  
Table 26. AC characteristics (M95160-R and M95080-R)  
Test conditions specified in Table 13 and Table 11  
Symbol Alt.  
Parameter  
Min.  
Max.  
Unit  
fC  
fSCK Clock frequency  
D.C.  
60  
60  
90  
60  
60  
80  
80  
5
MHz  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
µs  
µs  
ns  
ns  
ns  
ns  
0
tSLCH tCSS1 S active setup time  
tSHCH tCSS2 S not active setup time  
tSHSL  
tCHSH  
tCHSL  
tCS S deselect time  
tCSH S active hold time  
S not active hold time  
(1)  
tCH  
tCLH Clock high time  
(1)  
tCL  
tCLL Clock low time  
(2)  
tCLCH  
tRC Clock rise time  
2
2
(2)  
tCHCL  
tFC Clock fall time  
tDVCH  
tCHDX  
tHHCH  
tHLCH  
tCLHL  
tCLHH  
tDSU Data in setup time  
tDH Data in hold time  
20  
20  
60  
60  
0
Clock low hold time after HOLD not active  
Clock low hold time after HOLD active  
Clock low set-up time before HOLD active  
Clock low set-up time before HOLD not active  
tDIS Output disable time  
tV Clock low to output valid  
tHO Output hold time  
0
0
(2)  
tSHQZ  
tCLQV  
tCLQX  
80  
80  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ms  
0
(2)  
tQLQH  
tRO Output rise time  
80  
80  
80  
80  
5
(2)  
tQHQL  
tFO Output fall time  
tHHQV  
tLZ HOLD high to output valid  
tHZ HOLD low to output high-Z  
tWC Write time  
(2)  
tHLQZ  
tW  
1. tCH + tCL must never be lower than the shortest possible clock period, 1/fC(max).  
2. Value guaranteed by characterization, not 100% tested in production.  
Doc ID 8028 Rev 10  
37/50  
DC and AC parameters  
M95160-x, M95080-x  
(1)  
Table 27. AC characteristics (M95160-F)  
Test conditions specified in Table 12  
Symbol Alt.  
fC fSCK Clock frequency  
Parameter  
Min.  
Max.  
Unit  
D.C.  
85  
3.5  
MHz  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
µs  
µs  
ns  
ns  
ns  
ns  
0
tSLCH tCSS1 S active setup time  
tSHCH tCSS2 S not active setup time  
85  
tSHSL  
tCHSH  
tCHSL  
tCS S deselect time  
120  
85  
tCSH S active hold time  
S not active hold time  
85  
(2)  
tCH  
tCLH Clock high time  
110  
110  
(1)  
tCL  
tCLL Clock low time  
(3)  
tCLCH  
tRC Clock rise time  
2
2
(2)  
tCHCL  
tFC Clock fall time  
tDVCH  
tCHDX  
tHHCH  
tHLCH  
tCLHL  
tCLHH  
tDSU Data in setup time  
tDH Data in hold time  
30  
30  
85  
85  
0
Clock low hold time after HOLD not active  
Clock low hold time after HOLD active  
Clock low set-up time before HOLD active  
Clock low set-up time before HOLD not active  
tDIS Output disable time  
tV Clock low to output valid  
tHO Output hold time  
0
0
(2)  
tSHQZ  
tCLQV  
tCLQX  
120  
120  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ms  
0
(2)  
tQLQH  
tRO Output rise time  
100  
100  
110  
110  
5
(2)  
tQHQL  
tFO Output fall time  
tHHQV  
tLZ HOLD high to output valid  
tHZ HOLD low to output high-Z  
tWC Write time  
(2)  
tHLQZ  
tW  
1. Preliminary data.  
2. tCH + tCL must never be lower than the shortest possible clock period, 1/fC(max).  
3. Value guaranteed by characterization, not 100% tested in production.  
38/50  
Doc ID 8028 Rev 10  
M95160-x, M95080-x  
Figure 15. Serial input timing  
DC and AC parameters  
tSHSL  
tSHCH  
S
C
tCHSL  
tSLCH  
tCH  
tCHSH  
tDVCH  
tCHCL  
tCHDX  
tCL  
tCLCH  
MSB IN  
LSB IN  
D
Q
High impedance  
AI01447d  
Figure 16. Hold timing  
S
tHLCH  
tCLHL  
tHHCH  
C
tCLHH  
tHHQV  
tHLQZ  
Q
HOLD  
AI01448c  
Doc ID 8028 Rev 10  
39/50  
DC and AC parameters  
M95160-x, M95080-x  
Figure 17. Serial output timing  
S
tCH  
tSHSL  
C
tCLQV  
tCLQX  
tCLCH  
tCHCL  
tCL  
tSHQZ  
Q
D
tQLQH  
tQHQL  
ADDR  
LSB IN  
AI01449f  
40/50  
Doc ID 8028 Rev 10  
M95160-x, M95080-x  
Package mechanical data  
10  
Package mechanical data  
In order to meet environmental requirements, ST offers these devices in different grades of  
®
®
ECOPACK packages, depending on their level of environmental compliance. ECOPACK  
specifications, grade definitions and product status are available at: www.st.com.  
®
ECOPACK is an ST trademark.  
Figure 18. SO8N – 8-lead plastic small outline, 150 mils body width, package outline  
h x 45˚  
A2  
A
c
ccc  
b
e
0.25 mm  
D
GAUGE PLANE  
k
8
1
E1  
E
L
A1  
L1  
SO-A  
1. Drawing is not to scale.  
Table 28. SO8N – 8-lead plastic small outline, 150 mils body width, mechanical data  
millimeters  
inches(1)  
Symbol  
Typ  
Min  
Max  
Typ  
Min  
Max  
A
A1  
A2  
b
1.75  
0.25  
0.0689  
0.0098  
0.1  
0.0039  
0.0492  
0.011  
1.25  
0.28  
0.17  
0.48  
0.23  
0.1  
5
0.0189  
0.0091  
0.0039  
0.1969  
0.2441  
0.1575  
-
c
0.0067  
ccc  
D
4.9  
6
4.8  
5.8  
3.8  
-
0.1929  
0.2362  
0.1535  
0.05  
0.189  
0.2283  
0.1496  
-
E
6.2  
4
E1  
e
3.9  
1.27  
-
h
0.25  
0°  
0.5  
8°  
0.0098  
0°  
0.0197  
8°  
k
L
0.4  
1.27  
0.0157  
0.05  
L1  
1.04  
0.0409  
1. Values in inches are converted from mm and rounded to 4 decimal digits.  
Doc ID 8028 Rev 10  
41/50  
Package mechanical data  
M95160-x, M95080-x  
Figure 19. UFDFPN8 (MLP8) 8-lead ultra thin fine pitch dual flat package no lead  
2 x 3 mm, package outline  
e
b
D
L1  
L3  
E
E2  
L
A
D2  
ddd  
A1  
UFDFPN-01  
1. Drawing is not to scale.  
2. The central pad (the area E2 by D2 in the above illustration) is internally pulled to VSS. It must not be  
connected to any other voltage or signal line on the PCB, for example during the soldering process.  
Table 29. UFDFPN8 (MLP8) 8-lead ultra thin fine pitch dual flat package no lead  
2 x 3 mm, package mechanical data  
millimeters  
Min  
inches(1)  
Symbol  
Typ  
Max  
Typ  
Min  
Max  
A
A1  
b
0.55  
0.02  
0.25  
2
0.45  
0
0.6  
0.05  
0.3  
2.1  
1.7  
3.1  
0.3  
-
0.0217  
0.0008  
0.0098  
0.0787  
0.063  
0.0177  
0
0.0236  
0.002  
0.0118  
0.0827  
0.0669  
0.122  
0.0118  
-
0.2  
1.9  
1.5  
2.9  
0.1  
-
0.0079  
0.0748  
0.0591  
0.1142  
0.0039  
-
D
D2  
E
1.6  
3
0.1181  
0.0079  
0.0197  
0.0177  
E2  
e
0.2  
0.5  
0.45  
L
0.4  
0.5  
0.15  
0.0157  
0.0197  
0.0059  
L1  
L3  
ddd(2)  
0.3  
0.0118  
0.08  
0.08  
1. Values in inches are converted from mm and rounded to 4 decimal digits.  
2. Applied for exposed die paddle and terminals. Exclude embedding part of exposed die paddle from  
measuring.  
42/50  
Doc ID 8028 Rev 10  
M95160-x, M95080-x  
Package mechanical data  
Figure 20. WLCSP-R 1.350 x 1.365 mm 0.4 mm pitch 8 bumps, package outline  
e1  
G
e
D
C
B
e
Detail A  
e1  
F
E
Orientation  
reference  
A
aaa  
Orientation  
reference  
3
2
Bump side  
1
Wafer back side  
(×4)  
A1  
A
A2  
Side view  
Bump  
eee Z  
Z
b
Seating plane  
(see note 1)  
Detail A  
Rotated 90˚  
1C_ME  
1. Primary datum Z and seating plane are defined by the spherical crowns of the bump.  
2. Drawing is not to scale.  
3. Preliminary data.  
Table 30. WLCSP-R 1.350 x 1.365 mm 0.4 mm pitch 8 bumps, package mechanical  
(1)  
data  
millimeters  
inches(2)  
Symbol  
Typ  
Min  
Max  
Typ  
Min  
Max  
A
A1  
A2  
b(3)  
D
0.545  
0.190  
0.355  
0.270  
1.350  
1.365  
0.400  
0.800  
0.282  
0.275  
0.490  
0.600  
0.0193  
0.0075  
0.014  
0.0215  
0.0236  
0.240  
0.300  
1.475  
1.490  
0.0106  
0.0531  
0.0537  
0.0157  
0.0315  
0.0111  
0.0108  
0.0094  
0.0118  
0.0581  
0.0587  
E
e
e1  
F
G
N (total number of  
terminals)  
8
8
aaa  
eee  
0.110  
0.060  
0.0043  
0.0024  
1. Preliminary data.  
2. Values in inches are converted from mm and rounded to 4 decimal digits.  
3. Dimension is measured at the maximum bump diameter parallel to primary datum Z.  
Doc ID 8028 Rev 10  
43/50  
Package mechanical data  
M95160-x, M95080-x  
Figure 21. TSSOP8 – 8-lead thin shrink small outline, package outline  
D
8
5
c
E1  
E
1
4
α
A1  
L
A
A2  
L1  
CP  
b
e
TSSOP8AM  
1. Drawing is not to scale.  
Table 31. TSSOP8 – 8-lead thin shrink small outline, package mechanical data  
millimeters  
Min  
inches(1)  
Symbol  
Typ  
Max  
Typ  
Min  
Max  
A
A1  
A2  
b
1.2  
0.15  
1.05  
0.3  
0.2  
0.1  
3.1  
-
0.0472  
0.0059  
0.0413  
0.0118  
0.0079  
0.0039  
0.122  
0.05  
0.8  
0.002  
0.0315  
0.0075  
0.0035  
1
0.0394  
0.19  
0.09  
c
CP  
D
3
0.65  
6.4  
4.4  
0.6  
1
2.9  
-
0.1181  
0.0256  
0.252  
0.1142  
-
e
-
E
6.2  
4.3  
0.45  
6.6  
4.5  
0.75  
0.2441  
0.1693  
0.0177  
0.2598  
0.1772  
0.0295  
E1  
L
0.1732  
0.0236  
0.0394  
L1  
0°  
8
8°  
0°  
8
8°  
N
1. Values in inches are converted from mm and rounded to 4 decimal digits.  
44/50  
Doc ID 8028 Rev 10  
M95160-x, M95080-x  
Part numbering  
11  
Part numbering  
Table 32. Ordering information scheme  
Example:  
M95160  
W MN 6  
T
P /S  
Device type  
M95 = SPI serial access EEPROM  
Device function  
160 = 16 Kbit (2048 x 8)  
080 = 8 Kbit (1024 x 8)  
Operating voltage  
blank = VCC = 4.5 to 5.5 V  
W = VCC = 2.5 to 5.5 V  
R = VCC = 1.8 to 5.5 V  
F = VCC = 1.7 to 5.5 V  
Package  
MN = SO8 (150 mil width)  
DW = TSSOP8  
MB = MLP8 (UFDFPN8)  
CS = WLCSP(1)  
Device grade  
6 = Industrial temperature range, –40 to 85 °C.  
Device tested with standard test flow  
3 = Device tested with high reliability certified flow(2)  
Automotive temperature range (–40 to 125 °C)  
.
Option  
blank = Standard packing  
T = Tape and reel packing  
Plating technology  
G or P = ECOPACK® (RoHS compliant)  
Process(3)  
/G or /S = F6SP36%  
1. Preliminary data.  
2. ST strongly recommends the use of the Automotive Grade devices for use in an automotive environment.  
The high reliability certified flow (HRCF) is described in the quality note QNEE9801. Please ask your  
nearest ST sales office for a copy.  
3. The Process letter (/G or /S) applies only to Range 3 devices. For Range 6 devices, the process letters do  
not appear in the Ordering Information but only appear on the device package (marking) and on the  
shipment box. Please contact your nearest ST Sales Office. For more information on how to identify  
products by the Process Identification Letter, please refer to AN2043: Serial EEPROM Device Marking.  
Doc ID 8028 Rev 10  
45/50  
Part numbering  
M95160-x, M95080-x  
For a list of available options (speed, package, etc.) or for further information on any aspect  
of this device, please contact your nearest ST sales office.  
Table 33. Available M95160 products (package, voltage range, temperature grade)  
M95160  
4.5 V to 5.5 V  
M95160-W  
2.5 V to 5.5 V  
M95160-R  
1.8 V to 5.5 V  
M95160-F  
1.7 V to 5.5 V  
Package  
SO8 (MN)  
Range 6  
Range3  
Range 6  
Range3  
Range 6  
Range 6  
NA(1)  
Range 6  
Range3  
TSSOP (DW)  
NA(1)  
Range 6  
MLP 2 x 3 mm (MB)  
WLCSP (CS)  
NA(1)  
NA(1)  
NA(1)  
NA(1)  
Range 6  
Range 6  
NA(1)  
Range 6  
1. NA = Not available  
Table 34. Available M95080 products (package, voltage range, temperature grade)  
M95080  
4.5 V to 5.5 V  
M95080-W  
2.5 V to 5.5 V  
M95080-R  
1.8 V to 5.5 V  
Package  
SO8 (MN)  
Range 6  
Range3  
Range 6  
Range3  
Range 6  
Range 6  
Range3  
TSSOP (DW)  
NA(1)  
NA(1)  
Range 6  
Range 6  
MLP 2 x 3mm (MB)  
1. NA = Not available  
Range 6  
46/50  
Doc ID 8028 Rev 10  
M95160-x, M95080-x  
Revision history  
12  
Revision history  
Table 35. Document revision history  
Date  
Revision  
Changes  
19-Jul-2001  
1.0  
Document written from previous M95640/320/160/080 datasheet  
Announcement made of planned upgrade to 10MHz clock for the 5V, 40  
to 85°C, range  
06-Feb-2002  
1.1  
18-Oct-2002  
04-Nov-2002  
13-Nov-2002  
1.2  
1.3  
1.4  
TSSOP8 (3x3mm body size, MSOP8) package added  
New products, identified by the process letter W, added  
Correction to footnote in Ordering Information table  
Table of contents, and Pb-free options added. VIL(min) improved to –  
0.45V  
21-Nov-2003  
2.0  
MLP8 package added. Absolute Maximum Ratings for VIO(min) and  
VCC(min) improved. Soldering temperature information clarified for RoHS  
compliant devices. Device Grade 3 clarified, with reference to HRCF and  
automotive environments. Process identification letter “G” information  
added. SO8 narrow and TSSOP8 Package mechanical specifications  
updated.  
08-Jun-2004  
3.0  
Product List summary table added. AEC-Q100-002 compliance. tHHQX  
corrected to tHHQV.  
07-Oct-2004  
21-Sep-2005  
4.0  
5.0  
10MHz, 5ms Write is now the present product. tCH+tCL<1/fC constraint  
clarified  
Added 20MHz and -S product information. Removed DIP package. Info on  
Pull-up resistors, VCC lines and Note 2. added to Figure 4.: Bus master  
and memory devices on the SPI bus. Device internal reset paragraph  
clarified. Packages compliant with the JEDEC Std J-STD-020C. Process  
info updated in DC and AC parameters and Table 32.: Ordering  
information scheme.  
Doc ID 8028 Rev 10  
47/50  
Revision history  
Table 35. Document revision history (continued)  
M95160-x, M95080-x  
Date  
Revision  
Changes  
Document reformatted. Small text changes.  
TSSOP8 3 x 3 mm (DS) package removed, 1.65 V to 5.5 V operating  
voltage range removed (M95080-S and M95160-S removed).  
Figure 4: Bus master and memory devices on the SPI bus updated, note 2  
removed and explanatory paragraph added (see Section 3: Connecting to  
the SPI bus).  
Section 2.7: VCC supply voltage and Section 2.8: VSS ground added.  
Power-up, Device Internal Reset and Power-down replaced by  
Section 4.1: Supply voltage (VCC).  
Command termination specified in Section 6.4: Write Status Register  
(WRSR).  
Blank process no longer available for M95160, M95080, M95160-W and  
M95080-W in the device grade 3 range.  
24-May-2007  
6
L, GB and SB processes no longer available for M95160 and M95080, in  
the device grade 6 range.  
L process no longer available for M95160-W and M95080-W in the device  
grade 6 range.  
ICC1 value and test conditions modified in Table 19: DC characteristics  
(M95160-R and M95080-R).  
End timing line of tSHQZ modified in Figure 17: Serial output timing.  
SO8N and UFDFPN8 package specifications updated. All packages are  
ECOPACK® compliant.  
Blank option removed below Plating technology and Note 2 modified in  
Table 32: Ordering information scheme.  
Table 33: Available M95160 products (package, voltage range,  
temperature grade) and Table 34: Available M95080 products (package,  
voltage range, temperature grade) added.  
Endurance modified on page 1. Small text changes.  
Section 4.1: Supply voltage (VCC) on page 12 modified.  
Section 6.6: Write to Memory Array (WRITE) on page 23 modified.  
Table 19: DC characteristics (M95160-R and M95080-R) updated.  
06-Mar-2008  
7
Note removed below Table 24: AC characteristics (M95160-W and  
M95080-W, device grade 6) on page 35.  
Inch values are calculated from millimeters and rounded to 4 decimal  
digits and UFDFPN package specifications updated (see Section 10:  
Package mechanical data on page 41).  
WLCSP (CS) package added (see Figure 20 and Table 30: WLCSP-R  
1.350 x 1.365 mm 0.4 mm pitch 8 bumps, package mechanical data).  
M95160-F part number added (delivered in WLCSP package and device  
grade 6 only).  
26-Jan-2009  
8
Section 2.7: VCC supply voltage and Section 6.4: Write Status Register  
(WRSR) updated.  
Table 27: AC characteristics (M95160-F) added.  
Figure 15: Serial input timing, Figure 16: Hold timing and Figure 17: Serial  
output timing updated.  
48/50  
Doc ID 8028 Rev 10  
M95160-x, M95080-x  
Table 35. Document revision history (continued)  
Revision history  
Date  
Revision  
Changes  
Section 4.1.2: Device reset updated.  
VRES added to DC characteristics tables 15, 16, 17, 18, 19 and 20.  
Note added to Section 6.6: Write to Memory Array (WRITE).  
Note 1 added to Table 19: DC characteristics (M95160-R and M95080-R).  
VIL and VOL modified in Table 20: DC characteristics (M95160-F).  
12-May-2009  
9
Table 24: AC characteristics (M95160-W and M95080-W, device grade 6)  
split into two tables: Table 24 for process GB or SB and Table 25 for  
process SA.  
M95160-F is now available in device grade 6 (Table 33: Available M95160  
products (package, voltage range, temperature grade) updated.  
Revision number of 12-May-2009 corrected in Table 35: Document  
revision history.  
09-Oct-2009  
10  
VRES corrected in Table 15: DC characteristics (M95160 and M95080,  
device grade 3) and Table 16: DC characteristics (M95160 and M95080,  
device grade 6).  
Doc ID 8028 Rev 10  
49/50  
M95160-x, M95080-x  
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Doc ID 8028 Rev 10  

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