74ACT11032DB [TI]

QUADRUPLE 2-INPUT POSITIVE-OR GATES; 四路2输入正或门
74ACT11032DB
型号: 74ACT11032DB
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

QUADRUPLE 2-INPUT POSITIVE-OR GATES
四路2输入正或门

输入元件
文件: 总5页 (文件大小:79K)
中文:  中文翻译
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74ACT11032  
QUADRUPLE 2-INPUT POSITIVE-OR GATES  
SCAS008C – JULY 1987 – REVISED APRIL 1996  
D, DB, N, OR PW PACKAGE  
(TOP VIEW)  
Inputs Are TTL-Voltage Compatible  
Center-Pin V and GND Configurations to  
Minimize High-Speed Switching Noise  
CC  
1A  
1Y  
1B  
2A  
2B  
V
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
EPIC (Enhanced-Performance Implanted  
CMOS) 1- m Process  
2Y  
GND  
GND  
3Y  
500-mA Typical Latch-Up Immunity at 125°C  
CC  
V
CC  
Package Options Include Plastic  
3A  
3B  
4A  
Small-Outline Packages (D), Plastic Shrink  
Small-Outline Packages (DB), Plastic Thin  
Shrink Small-Outline Packages (PW), and  
Standard Plastic 300-mil DIPs (N)  
4Y  
4B  
description  
This device contains four independent 2-input OR gates. It performs the Boolean function Y = A + B or  
A B  
Y
in positive logic.  
The 74ACT11032 is characterized for operation from –40°C to 85°C.  
FUNCTION TABLE  
(each gate)  
OUTPUT  
Y
INPUTS  
A
B
X
H
L
H
X
L
H
H
L
logic symbol  
logic diagram (positive logic)  
1
1A  
16  
1A  
1Y  
1B  
2
3
6
7
1Y  
2Y  
3Y  
4Y  
1B  
15  
2A  
2A  
14  
2Y  
2B  
2B  
11  
3A  
10  
3A  
3Y  
3B  
9
3B  
4A  
4A  
8
4Y  
4B  
4B  
This symbol is in accordance with ANSI/IEEE Std 91-1984  
and IEC Publication 617-12.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
EPIC is a trademark of Texas Instruments Incorporated.  
Copyright 1996, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
74ACT11032  
QUADRUPLE 2-INPUT POSITIVE-OR GATES  
SCAS008C – JULY 1987 – REVISED APRIL 1996  
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)  
Supply voltage range, V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.5 V to 6V  
CC  
Input voltage range, V (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.5 V to V  
+ 0.5 V  
+ 0.5 V  
I
CC  
CC  
Output voltage range, V (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.5 V to V  
O
Input clamp current, I (V < 0 or V > V ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA  
IK  
I
I
CC  
Output clamp current, I  
(V < 0 or V > V ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA  
OK  
O O CC  
Continuous output current, I (V = 0 to V ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA  
Continuous current through V  
Maximum power dissipation at T = 55°C (in still air) (see Note 2): D package . . . . . . . . . . . . . . . . . . . . 1.3 W  
O
O
CC  
CC  
or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±100 mA  
A
DB package . . . . . . . . . . . . . . . . . . 0.55 W  
N package . . . . . . . . . . . . . . . . . . . . 1.1 W  
PW package . . . . . . . . . . . . . . . . . . . 0.5 W  
Storage temperature range, T . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 65°C to 150°C  
stg  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.  
2. The maximum package power dissipation is calculated using a junction temperature of 150 C and a board trace length of 750 mils,  
except for the N package, which has a trace length of zero.  
recommended operating conditions  
MIN  
4.5  
2
MAX  
UNIT  
V
V
V
V
V
V
Supply voltage  
5.5  
CC  
IH  
IL  
High-level input voltage  
Low-level input voltage  
Input voltage  
V
0.8  
V
0
0
V
V
V
I
CC  
Output voltage  
V
O
CC  
I
I
High-level output current  
Low-level output current  
Input transition rise or fall rate  
Operating free-air temperature  
24  
24  
mA  
mA  
ns/V  
°C  
OH  
OL  
t/ v  
0
10  
T
–40  
85  
A
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
74ACT11032  
QUADRUPLE 2-INPUT POSITIVE-OR GATES  
SCAS008C – JULY 1987 – REVISED APRIL 1996  
electrical characteristics over recommended operating free-air temperature range (unless  
otherwise noted)  
T
A
= 25°C  
PARAMETER  
TEST CONDITIONS  
V
MIN  
MAX  
UNIT  
CC  
MIN  
4.4  
TYP  
MAX  
4.5 V  
5.5 V  
4.5 V  
5.5 V  
5.5 V  
4.5 V  
5.5 V  
4.5 V  
5.5 V  
5.5 V  
5.5 V  
5.5 V  
4.4  
5.4  
I
= –50 A  
OH  
5.4  
V
3.94  
4.94  
3.8  
V
OH  
OL  
I
I
I
= –24 mA  
= –75 mA  
OH  
OH  
OL  
4.8  
3.85  
0.1  
0.1  
0.1  
0.1  
= 50  
A
V
0.36  
0.36  
0.44  
0.44  
1.65  
±1  
V
I
I
= 24 mA  
= 75 mA  
OL  
OL  
I
I
V = V  
or GND  
or GND,  
±0.1  
A
A
I
I
CC  
CC  
V = V  
I
O
= 0  
CC  
4
40  
CC  
I
One input at 3.4 V,  
Other inputs at GND or V  
5.5 V  
5 V  
0.9  
1
mA  
pF  
I
CC  
C
V = V or GND  
3.5  
i
I
CC  
Not more than one output should be tested at a time, and the duration of the test should not exceed 10 ms.  
This is the increase in supply current for each input that is at one of the specified TTL voltage levels rather than 0 V or V  
.
CC  
switching characteristics over recommended ranges of supply voltage and free-air temperature  
(unless otherwise noted) (see Figure 1)  
T
A
= 25°C  
TYP  
6.2  
FROM  
(INPUT)  
TO  
(OUTPUT)  
PARAMETER  
MIN  
MAX  
UNIT  
MIN  
1.5  
MAX  
8.1  
t
t
1.5  
1.5  
9
8
PLH  
A or B  
Y
ns  
1.5  
4.9  
7.4  
PHL  
operating characteristics, V  
= 5 V, T = 25°C  
A
CC  
PARAMETER  
Power dissipation capacitance per gate  
TEST CONDITIONS  
= 50 pF, f = 1 MHz  
L
TYP  
UNIT  
C
C
29  
pF  
pd  
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
74ACT11032  
QUADRUPLE 2-INPUT POSITIVE-OR GATES  
SCAS008C – JULY 1987 – REVISED APRIL 1996  
PARAMETER MEASUREMENT INFORMATION  
3 V  
0 V  
Input  
(see Note B)  
From Output  
Under Test  
1.5 V  
1.5 V  
t
PLH  
C
= 50 pF  
t
PHL  
L
500  
(see Note A)  
V
OH  
50% V  
50% V  
Output  
CC  
CC  
V
OL  
LOAD CIRCUIT  
VOLTAGE WAVEFORMS  
NOTES: A.  
C includes probe and jig capacitance.  
L
B. Input pulses are supplied by generators having the following characteristics: PRR 1 MHz, Z = 50 , t = 3 ns,  
O
r
t = 3 ns.  
f
C. The outputs are measured one at a time with one input transition per measurement.  
Figure 1. Load Circuit and Voltage Waveforms  
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL  
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In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
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Copyright 1998, Texas Instruments Incorporated  

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