ADS62P43RGC [TI]

Dual Channel 14-Bit, 125/105/80/65 MSPS ADC with Parallel CMOS/DDR LVDS outputs; 双通道14位, 125/105/80/65 MSPS ADC,具有并行CMOS / DDR LVDS输出
ADS62P43RGC
型号: ADS62P43RGC
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

Dual Channel 14-Bit, 125/105/80/65 MSPS ADC with Parallel CMOS/DDR LVDS outputs
双通道14位, 125/105/80/65 MSPS ADC,具有并行CMOS / DDR LVDS输出

转换器 模数转换器 双倍数据速率
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ADS62P45, ADS62P44  
www.ti.com  
ADS62P43, ADS62P42  
REV1P0 SEP 2007  
Dual Channel 14-Bit, 125/105/80/65 MSPS ADC with  
Parallel CMOS/DDR LVDS outputs  
FEATURES  
§ Maximum Sample Rate: 125 MSPS  
§ 14-bit Resolution with No Missing Codes  
§ 92 dB Crosstalk at 50MHz  
§ Clock duty cycle stabilizer  
§ Internal reference, supports external  
reference also  
§ 64-QFN Package (9mm x 9mm)  
§ Pin compatible 12-bit family (ADS62P2X)  
§ Parallel CMOS and DDR LVDS Output Options  
§ 3.5 dB Coarse Gain and Programmable Fine  
Gain up to 6 dB for SNR/SFDR trade-off  
§ Supports Sine, LVPECL, LVDS & CMOS clock  
Table 1 ADS62PXX Dual Channel Family  
inputs & amplitude down to 400 mV p-p  
§
Digital Processing Block with  
§ Offset correction  
§ Fine gain correction, (0.05 dB step)  
125 MSPS  
105 MSPS  
80 MSPS  
65 MSPS  
14 bit  
12 bit  
11 bit  
ADS62P45 ADS62P44 ADS62P43 ADS62P42  
ADS62P25 ADS62P24 ADS62P23 ADS62P22  
§ Decimation by 2/4/8  
ADS62P15  
-
-
-
§ Built-in & Custom programmable 24-tap  
Low / High / Band pass filters  
Table 2 Performance Summary  
ADS62P45  
92  
ADS62P44  
92  
ADS62P43  
94  
ADS62P42  
Fin = 10 MHz  
94  
84  
SFDR, dBc  
Fin = 170 MHz, 3.5dB gain  
Fin = 10 MHz  
81  
82  
83  
73.8  
70.3  
396  
73.8  
70.3  
350  
73.9  
70.6  
294  
74  
SINAD, dBFS  
Fin = 170 MHz, 3.5dB gain  
70.6  
259  
Power, mW per channel  
DESCRIPTION  
ADS62P4X is a family of dual channel 14-bit A/D converters with maximum sample rates up to 125 MSPS. It  
combines high performance and low power consumption in a compact 64 QFN package. Using an internal sample  
and hold and low jitter clock buffer, the ADC supports high SNR and high SFDR at high input frequencies. It has  
coarse and fine gain options that can be used to improve SFDR performance at lower full-scale input ranges.  
PRODUCT PREVIEW information concerns products in  
Copyright © 2007, Texas Instruments Incorporated  
the formative or design phase of development.  
Characteristic data and other specifications are design  
goals. Texas Instruments reserves the right to change or  
discontinue these products without notice.  
1
www.ti.com  
ADS62P45, ADS62P44  
www.ti.com  
ADS62P43, ADS62P42  
REV1P0 SEP 2007  
ADS62P4X includes a digital processing block that consists of several useful & commonly used digital functions  
such as ADC offset correction, fine gain correction (in steps of 0.05 dB), decimation by 2,4,8 & in-built & custom  
programmable filters. By default, the digital processing block is bypassed & its functions are disabled.  
Two output interface options exist – parallel CMOS and DDR LVDS (Double Data Rate). ADS62P4X includes  
internal references while traditional reference pins and associated decoupling capacitors have been eliminated.  
The device also supports an external reference mode. The device is specified over the industrial temperature  
range (-40°C to +85°C).  
DIGITAL PROCESSING  
BLOCK  
DA0  
DA1  
DA2  
DA3  
DA4  
Channel A  
OUTPUT  
BUFFERS  
DA5  
DA6  
DA7  
DA8  
INA_P  
INA_M  
14 BIT ADC  
DIGITAL  
ENCODER  
SHA  
CHANNEL A  
14bit  
14bit  
DA9  
DA10  
DA11  
DA12  
DA13  
OUTPUT  
CLOCK  
BUFFER  
CLKP  
CLKM  
CLOCKGEN  
CLKOUT  
DB0  
DB1  
DB2  
DB3  
DB4  
OUTPUT  
INB_P  
INB_M  
14bit  
BUFFERS  
DB5  
DB6  
14bit  
14 BIT ADC  
DIGITAL  
ENCODER  
SHA  
CHANNEL B  
DB7  
DB8  
DB9  
DB10  
DIGITAL PROCESSING  
BLOCK  
DB11  
DB12  
Channel B  
DB13  
CONTROL  
INTERFACE  
VCM  
REFERENCE  
CMOS INTERFACE  
PRODUCT PREVIEW information concerns products in  
the formative or design phase of development.  
Characteristic data and other specifications are design  
goals. Texas Instruments reserves the right to change or  
discontinue these products without notice.  
2
www.ti.com  
ADS62P45, ADS62P44  
www.ti.com  
ADS62P43, ADS62P42  
REV1P0 SEP 2007  
CLIPPER  
From ADC  
output  
14 bits  
14 bits  
14 bits  
14 bits  
14 bits  
To output buffers  
LVDS or CMOS  
24 TAP FILTER  
- LOW PASS  
- HIGH PASS  
- BAND PASS  
Fine Gain  
(0 to 6 dB  
0.5 dB steps)  
Gain Correction  
(0.05 dB steps)  
DECIMATION  
14 bits  
BY 2/4/8  
0
OFFSET  
ESTIMATION  
BLOCK  
Filter Select  
Disable offset  
correction  
Bypass filter  
Bypass  
decimation  
Freeze offset  
correction  
DIGITAL  
FILTER & DECIMATION  
OFFSET  
CORRECTION  
GAIN  
CORRECTION  
FINE GAIN  
DIGITAL PROCESSING BLOCK  
Figure 1 Digital Processing Block Diagram  
PACKAGE/ORDERING INFORMATION (1)  
PRODUCT  
PACKAGE-  
PACKAGE  
DESIGNATOR TEMPERATURE  
RANGE  
SPECIFIED  
ECO  
PLAN  
(2)  
LEAD/BALL PACKAGE  
ORDERING  
NUMBER  
TRANSPORT  
MEDIA,  
LEAD  
FINISH  
MARKING  
QUANTITY  
TUBE  
ADS62P45  
ADS62P44  
ADS62P43  
ADS62P42  
QFN-64  
QFN-64  
QFN-64  
QFN-64  
RGC  
RGC  
RGC  
RGC  
-40C to +85C  
-40C to +85C  
-40C to +85C  
-40C to +85C  
GREEN  
(RoHS  
& no  
Cu NiPdAu  
AZ62P45  
AZ62P44  
AZ62P43  
AZ62P42  
ADS62P45RGC  
ADS62P44RGC  
ADS62P43RGC  
ADS62P42RGC  
TUBE  
TUBE  
Sb/Br)  
TUBE  
(1) θ JA =TBD, θ JC =TBD.  
(2) Eco Plan - The planned eco-friendly classification:  
Green (RoHS & no Sb/Br) : TI defines "Green" to mean Pb-Free (RoHS compatible) and free of Bromine (Br) and Antimony (Sb)  
based flame retardants.  
PRODUCT PREVIEW information concerns products in  
the formative or design phase of development.  
Characteristic data and other specifications are design  
goals. Texas Instruments reserves the right to change or  
discontinue these products without notice.  
3
www.ti.com  
ADS62P45, ADS62P44  
www.ti.com  
ADS62P43, ADS62P42  
REV1P0 SEP 2007  
(1)  
ABSOLUTE MAXIMUM RATINGS  
VALUE  
UNIT  
Supply voltage range, AVDD  
- 0.3 V to 3.9  
V
V
Supply voltage range, DRVDD  
Voltage between AGND and DRGND  
Voltage between AVDD to DRVDD  
-0.3 V to 3.9  
-0.3 to 0.3  
V
-0.3 to 3.3  
V
Voltage applied to external pin, CM (in external reference mode)  
Voltage applied to analog input pins, INA_P, INA_M, INB_P, INB_M  
Voltage applied to clock input pins, CLKP, CLKM  
-0.3 to 2.0  
V
-0.3V to minimum( 3.6, AVDD + 0.3V )  
V
-0.3V to AVDD + 0.3V  
V
Operating free-air temperature range, T  
-40 to 85  
125  
°C  
°C  
°C  
°C  
A
Operating junction temperature range, T  
J
Storage temperature range, T  
-65 to 150  
220  
stg  
Lead temperature 1.6 mm (1/16 “ ) from the case for 10 seconds  
(1) Stresses beyond those listed under “ absolute maximum ratings” may cause permanent damage to thedevice. These are stress ratings  
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating  
conditions” is not implied. Exposure to absolutemaximum rated conditions for extended periods may affect device reliability.  
PRODUCT PREVIEW information concerns products in  
the formative or design phase of development.  
Characteristic data and other specifications are design  
goals. Texas Instruments reserves the right to change or  
discontinue these products without notice.  
4
www.ti.com  
ADS62P45, ADS62P44  
www.ti.com  
ADS62P43, ADS62P42  
REV1P0 SEP 2007  
RECOMMENDED OPERATING CONDITIONS  
PARAMETER  
MIN  
TYP  
MAX  
UNIT  
SUPPLIES  
AVDD Analog supply voltage  
3.0  
1.65  
3.0  
3.3  
1.8 to 3.3  
3.3  
3.6  
3.6  
3.6  
V
V
V
CMOS interface  
DRVDD Digital supply voltage  
LVDS interface  
ANALOG INPUTS  
Differential input voltage range  
Input common-mode voltage  
2
V
PP  
1.5 +/- 0.1  
1.5 ± 0.05  
V
V
Voltage applied on CM in external reference mode  
CLOCK INPUT  
ADS62P45  
1
1
125  
105  
80  
MSPS  
MSPS  
MSPS  
MSPS  
V pp  
V pp  
V pp  
V
ADS62P44  
Input clock sample rate, Fs  
ADS62P43  
1
ADS62P42  
1
65  
Sine wave, ac-coupled  
0.3  
3.0  
1.6  
0.7  
LVPECL, ac-coupled  
Input Clock amplitude  
LVDS, ac-coupled  
differential (V  
-V  
)
CLKP CLKM  
LVCMOS, single-ended,  
ac-coupled  
3.3  
Input clock duty cycle  
35 %  
50 %  
65 %  
DIGITAL OUTPUTS  
Default strength  
Maximum strength  
Maximum strength  
For CLOAD <= 5 pF and DRVDD >= 2.2V  
Output buffer drive strength  
For CLOAD > 5 pF and DRVDD > 2.2V  
For DRVDD < 2.2V  
CMOS interface  
5
pF  
pF  
CLOAD  
,
LVDS interface, without internal  
termination  
5
Maximum external load  
capacitance from each output  
pin to DRGND  
LVDS interface, with 100 Ω internal  
termination  
10  
pF  
RLOAD,  
100  
Ω
Differential load resistance between the LVDS output pairs (LVDS mode)  
Operating free-air temperature, TA  
-40  
85  
°C  
PRODUCT PREVIEW information concerns products in  
the formative or design phase of development.  
Characteristic data and other specifications are design  
goals. Texas Instruments reserves the right to change or  
discontinue these products without notice.  
5
www.ti.com  
ADS62P45, ADS62P44  
www.ti.com  
ADS62P43, ADS62P42  
REV1P0 SEP 2007  
ELECTRICAL CHARACTERISTICS  
Typical values at 25C, min & max values are across the full temperature range TMIN = -40C to TMAX = 85C, AVDD = 3.3V, DRVDD = 1.8V to  
3.3V, 50% clock duty cycle, -1dBFS differential analog input, internal reference, applies to CMOS & LVDS interfaces unless otherwise noted.  
ADS62P45  
125 MSPS  
TYP  
ADS62P44  
105 MSPS  
TYP  
ADS62P43  
80 MSPS  
TYP  
ADS62P42  
65 MSPS  
PARAMETER  
UNIT  
MIN  
MAX  
MIN  
MAX MIN  
MAX MIN TYP  
MAX  
Resolution  
14  
14  
14  
14  
bits  
Analog Input  
Differential input voltage range  
V pp  
2.0  
1
2.0  
1
2.0  
1
2.0  
1
Differential input resistance (at dc),  
MΩ  
see Figure 10  
Differential input capacitance,  
pF  
MHz  
µA  
7
7
7
7
see Figure 11  
Analog input bandwidth  
450  
165  
450  
140  
450  
110  
450  
91  
Analog input common mode current  
(per input pin of each channel)  
VCM common mode voltage output  
VCM output current capability  
1.5  
4
1.5  
4
1.5  
4
1.5  
4
V
mA  
Power Supply  
IAVDD Analog supply current  
232  
15  
205  
13  
172  
152  
9
mA  
mA  
IDRVDD Output buffer supply  
current, CMOS interface  
10.5  
2.5MHz input signal,  
(1)  
no load capacitance  
Total power – CMOS interface,  
DRVDD = 1.8V  
792  
TBD  
TBD  
700  
TBD  
TBD  
587  
TBD  
TBD  
518  
TBD  
TBD  
mW  
Total power – LVDS interface,  
DRVDD = 3.3V  
TBD  
50  
TBD  
50  
TBD  
50  
TBD  
50  
mW  
mW  
Global power down  
(1) In CMOS mode, the DRVDD current scales with the sampling frequency and the load capacitance on output pins.  
PRODUCT PREVIEW information concerns products in  
the formative or design phase of development.  
Characteristic data and other specifications are design  
goals. Texas Instruments reserves the right to change or  
discontinue these products without notice.  
6
www.ti.com  
ADS62P45, ADS62P44  
www.ti.com  
ADS62P43, ADS62P42  
REV1P0 SEP 2007  
ELECTRICAL CHARACTERISTICS  
Typical values at 25C, min & max values are across the full temperature range TMIN = -40C to TMAX = 85C, AVDD = 3.3V, DRVDD = 3.3V, 50%  
clock duty cycle, -1dBFS differential analog input, internal reference, applies to CMOS & LVDS interfaces, unless otherwise noted.  
ADS62P45  
125 MSPS  
TYP  
ADS62P44  
105 MSPS  
TYP  
ADS62P43  
80 MSPS  
TYP  
ADS62P42  
65 MSPS  
TYP  
PARAMETERS  
UNIT  
MIN  
MAX  
MIN  
MAX  
MIN  
MAX MIN  
MAX  
DC ACCURACY  
No Missing Codes  
Assured  
+/- 0.8  
+/- 3  
Assured  
+/- 0.7  
+/- 2.5  
TBD  
Assured  
+/- 0.5  
+/-1.5  
TBD  
Assured  
+/- 0.4  
+/-1.5  
TBD  
DNL Differential Non-Linearity  
INL Integral Non-Linearity  
Offset Error  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD TBD  
TBD TBD  
TBD TBD  
TBD TBD  
TBD TBD  
TBD TBD  
TBD  
TBD  
TBD  
LSB  
LSB  
mV  
TBD  
Offset error temperature  
coefficient  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
μV/ °C  
Offset error variation with  
supply  
mV/V  
There are two sources of gain error – internal reference inaccuracy and channel gain error  
Gain error due to internal  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD TBD  
TBD  
TBD  
TBD  
TBD TBD  
TBD TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
% FS  
D%/ °C  
% FS  
reference inaccuracy alone  
Reference gain error  
temperature coefficient  
Gain error of channel alone  
(1)  
TBD  
TBD  
TBD  
TBD TBD  
Channel gain error  
D%/ °C  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
temperature coefficient  
Gain matching  
(1) This is specified by design and characterization; it is not tested in production.  
PRODUCT PREVIEW information concerns products in  
the formative or design phase of development.  
Characteristic data and other specifications are design  
goals. Texas Instruments reserves the right to change or  
discontinue these products without notice.  
7
www.ti.com  
ADS62P45, ADS62P44  
www.ti.com  
ADS62P43, ADS62P42  
REV1P0 SEP 2007  
ELECTRICAL CHARACTERISTICS  
Typical values at 25C, min & max values are across the full temperature range TMIN = -40C to TMAX = 85C, AVDD = 3.3V, DRVDD = 3.3V, 50%  
clock duty cycle, -1dBFS differential analog input, internal reference, applies to CMOS & LVDS interfaces, unless otherwise noted.  
ADS62P45  
125 MSPS  
ADS62P44  
105 MSPS  
ADS62P43  
80 MSPS  
ADS62P42  
65 MSPS  
UNIT  
PARAMETERS  
MIN TYP MAX MIN TYP MAX MIN TYP MAX MIN TYP MAX  
Dynamic Characteristics  
Fin= 10MHz  
74.3  
74.3  
74.4  
TBD 74.1  
74  
74.5  
74.2  
Fin = 50MHz  
TBD 73.8  
73.8  
Fin = 70MHz  
73.6  
71.8  
71  
TBD 73.6  
TBD 74.1  
72.5  
SNR  
Signal to  
dBFS  
0 dB gain  
71.8  
72.5  
Fin =  
noise ratio,  
170MHz  
CMOS  
3.5 dB gain  
0 dB gain  
71  
71.4  
71.4  
71  
71  
72  
72  
Fin =  
230MHz  
3.5 dB gain  
70  
70  
71  
71  
Fin= 10MHz  
Fin = 50MHz  
Fin = 70MHz  
74.5  
74.5  
74.6  
74.7  
TBD  
74  
74  
TBD 73.8  
72.1  
TBD 74.3  
74.2  
74.4  
73.8  
72.1  
71  
TBD 74.3  
72.7  
SNR  
Signal to  
dBFS  
Fin =  
0 dB gain  
72.7  
noise ratio,  
170MHz  
LVDS  
3.5 dB gain  
0 dB gain  
71  
71.8  
71.8  
Fin =  
71.2  
70.1  
71  
72.2  
72.2  
230MHz  
3.5 dB gain  
70.1  
71.2  
71.2  
RMS output  
noise  
Inputs tied to common-  
mode  
0.96  
0.96  
0.96  
0.96  
LSB  
PRODUCT PREVIEW information concerns products in  
the formative or design phase of development.  
Characteristic data and other specifications are design  
goals. Texas Instruments reserves the right to change or  
discontinue these products without notice.  
8
www.ti.com  
ADS62P45, ADS62P44  
www.ti.com  
ADS62P43, ADS62P42  
REV1P0 SEP 2007  
ELECTRICAL CHARACTERISTICS  
Typical values at 25C, min & max values are across the full temperature range TMIN = -40C to TMAX = 85C, AVDD = 3.3V, DRVDD = 3.3V, 50%  
clock duty cycle, -1dBFS differential analog input, internal reference, applies to CMOS & LVDS interfaces, unless otherwise noted.  
ADS62P45  
125 MSPS  
ADS62P44  
105 MSPS  
ADS62P43  
80 MSPS  
ADS62P42  
65 MSPS  
UNIT  
PARAMETERS  
MIN TYP MAX MIN TYP MAX MIN TYP MAX MIN TYP MAX  
Fin= 10MHz  
Fin = 50MHz  
Fin = 70MHz  
73.8  
TBD 73.2  
73  
73.8  
73.2  
73  
73.9  
TBD 73.6  
73.4  
74  
73.7  
SINAD  
TBD  
TBD 73.5  
71.5  
Signal to  
noise &  
distortion  
ratio,  
dBFS  
Fin =  
0 dB gain  
70.6  
70.7  
70.2  
68.7  
68.5  
74  
71.5  
170MHz  
3.5 dB gain  
0 dB gain  
70.1  
70.6  
70.6  
CMOS  
Fin =  
68.7  
69.7  
69.9  
230MHz  
3.5 dB gain  
68.4  
69.5  
69.6  
Fin= 10MHz  
Fin = 50MHz  
Fin = 70MHz  
74  
74.1  
74.1  
TBD 73.4  
73.2  
73.4  
TBD 73.8  
73.6  
73.8  
SINAD  
TBD 73.4  
70.8  
TBD 73.6  
71.6  
Signal to  
noise &  
distortion  
ratio,  
dBFS  
Fin =  
0 dB gain  
70.8  
71.7  
170MHz  
3.5 dB gain  
0 dB gain  
70.5  
70.5  
70.8  
70.7  
LVDS  
Fin =  
68.9  
68.9  
68.1  
68  
230MHz  
3.5 dB gain  
68.6  
68.7  
69.7  
69.7  
ENOB,  
Effective  
number of  
bits  
Fin = 50 MHz  
TBD 11.8  
11.8  
TBD 11.9  
12  
LSB  
PRODUCT PREVIEW information concerns products in  
the formative or design phase of development.  
Characteristic data and other specifications are design  
goals. Texas Instruments reserves the right to change or  
discontinue these products without notice.  
9
www.ti.com  
ADS62P45, ADS62P44  
www.ti.com  
ADS62P43, ADS62P42  
REV1P0 SEP 2007  
ELECTRICAL CHARACTERISTICS  
Typical values at 25C, min & max values are across the full temperature range TMIN = -40C to TMAX = 85C, AVDD = 3.3V, DRVDD = 3.3V, 50%  
clock duty cycle, -1dBFS differential analog input, internal reference, applies to CMOS & LVDS interfaces, unless otherwise noted.  
ADS62P45  
125 MSPS  
ADS62P44  
105 MSPS  
ADS62P43  
80 MSPS  
ADS62P42  
65 MSPS  
UNIT  
PARAMETERS  
MIN TYP MAX MIN TYP MAX MIN TYP MAX MIN TYP MAX  
Fin= 10MHz  
92  
82  
85  
79  
81  
76  
78  
90  
92  
82  
86  
80  
82  
78  
80  
90  
80.5  
84  
77  
79  
75  
77  
94  
88  
86  
81  
83  
79  
81  
92  
86  
84  
78  
80  
76  
78  
94  
88  
86  
82  
84  
80  
82  
92  
86  
84  
79  
81  
77  
79  
Fin = 50MHz  
Fin = 70MHz  
TBD  
TBD  
SFDR  
TBD  
TBD  
Spurious  
Free  
dBc  
Fin =  
0 dB gain  
Dynamic  
Range  
170MHz  
3.5 dB gain  
0 dB gain  
Fin =  
230MHz  
3.5 dB gain  
Fin= 10MHz  
Fin = 50MHz  
Fin = 70MHz  
TBD 80.5  
TBD  
83.5  
76  
TBD  
TBD  
THD,  
Total  
dBc  
Fin =  
0 dB gain  
Harmonic  
Distortion  
170MHz  
3.5 dB gain  
0 dB gain  
78  
Fin =  
73  
230MHz  
3.5 dB gain  
75  
PRODUCT PREVIEW information concerns products in  
the formative or design phase of development.  
Characteristic data and other specifications are design  
goals. Texas Instruments reserves the right to change or  
discontinue these products without notice.  
10  
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REV1P0 SEP 2007  
ELECTRICAL CHARACTERISTICS  
Typical values at 25C, min & max values are across the full temperature range TMIN = -40C to TMAX = 85C, AVDD = 3.3V, DRVDD = 3.3V, 50%  
clock duty cycle, -1dBFS differential analog input, internal reference, applies to CMOS & LVDS interfaces, unless otherwise noted.  
ADS62P45  
125 MSPS  
ADS62P44  
105 MSPS  
ADS62P43  
80 MSPS  
ADS62P42  
65 MSPS  
UNIT  
PARAMETERS  
MIN TYP MAX MIN TYP MAX MIN TYP MAX MIN TYP MAX  
Fin= 10MHz  
94  
85  
88  
79  
81  
76  
78  
92  
82  
85  
79  
81  
76  
78  
94  
85  
88  
80  
82  
78  
80  
92  
82  
86  
80  
82  
78  
80  
96  
90  
88  
81  
83  
79  
81  
94  
88  
86  
81  
83  
79  
81  
96  
90  
88  
82  
84  
80  
82  
94  
88  
86  
82  
84  
80  
82  
Fin = 50MHz  
Fin = 70MHz  
TBD  
TBD  
HD2  
TBD  
TBD  
Second  
dBc  
Harmonic  
Distortion  
Fin =  
0 dB gain  
170MHz  
3.5 dB gain  
0 dB gain  
Fin =  
230MHz  
3.5 dB gain  
Fin= 10MHz  
Fin = 50MHz  
Fin = 70MHz  
TBD  
TBD  
HD3  
TBD  
TBD  
Third  
dBc  
Harmonic  
Distortion  
Fin =  
0 dB gain  
3.5 dB gain  
0 dB gain  
3.5 dB gain  
170MHz  
Fin =  
230MHz  
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the formative or design phase of development.  
Characteristic data and other specifications are design  
goals. Texas Instruments reserves the right to change or  
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REV1P0 SEP 2007  
ELECTRICAL CHARACTERISTICS  
Typical values at 25C, min & max values are across the full temperature range TMIN = -40C to TMAX = 85C, AVDD = 3.3V, DRVDD = 3.3V, 50%  
clock duty cycle, -1dBFS differential analog input, internal reference, applies to CMOS & LVDS interfaces, unless otherwise noted.  
ADS62P45  
125 MSPS  
ADS62P44  
105 MSPS  
ADS62P43  
80 MSPS  
ADS62P42  
65 MSPS  
UNIT  
PARAMETERS  
MIN TYP MAX MIN TYP MAX MIN TYP MAX MIN TYP MAX  
Fin= 10MHz  
96  
88  
91  
83  
85  
96  
88  
91  
84  
86  
98  
92  
91  
85  
87  
98  
94  
91  
86  
88  
Fin = 50MHz  
Worst Spur  
Other than  
second, third  
harmonics  
dBc  
Fin = 70MHz  
Fin = 170MHz  
Fin = 230MHz  
F1 = 46 MHz,  
F2 = 50 MHZ,  
each tone at -7 dBFS  
IMD  
2-Tone  
95  
95  
98  
98  
dBFS  
Intermodulation  
Distortion  
Recovery to within 1%  
(of final value) for 6-dB  
overload with sine  
wave input  
Input Overload  
recovery  
clock  
1
1
1
1
cycles  
Cross-talk signal  
100  
95  
100  
95  
100  
95  
100  
95  
dB  
dB  
frequency = 10 MHZ  
Cross-talk  
Cross-talk signal  
frequency = 50 MHZ  
PSRR  
AC Power  
Supply  
For 100 mV pp, 1MHz  
signal on AVDD supply  
TBD  
TBD  
TBD  
TBD  
dBc  
Rejection Ratio  
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DIGITAL CHARACTERISTICS  
The DC specifications refer to the condition where the digital outputs are not switching, but are permanently at a valid logic level 0 or 1.  
AVDD=3.3V, DRVDD=1.8V to 3.3V, unless otherwise specified.  
ADS62P45 / ADS62P44 /  
ADS62P43 / ADS62P42  
TYP  
PARAMETER  
CONDITIONS  
UNIT  
MIN  
MAX  
DIGITAL INPUTS  
High-level input voltage  
2.4  
V
V
Low-level input voltage  
0.8  
High-level input current  
33  
-33  
4
μ A  
μ A  
pF  
Low-level input current  
Input capacitance  
DIGITAL OUTPUTS – CMOS MODE  
High-level output voltage  
Low-level output voltage  
Output capacitance (internal to device)  
DRVDD  
V
V
0
2
pF  
(1) (2)  
DIGITAL OUTPUTS – LVDS MODE  
High-level output voltage  
, DRVDD = 3.3V  
1375  
1025  
350  
1200  
2
mV  
mV  
Low-level output voltage  
Output Differential Voltage, |VOD|  
VOS Output Offset Voltage  
Output Capacitance  
mV  
Common-mode voltage of OUTP and  
OUTM  
Output capacitance inside the device,  
from either output to ground  
mV  
pF  
(1) LVDS buffer current setting, IO = 3.5 mA  
(2) External differential load resistance between the LVDS output pairs, RLOAD = 50 Ω  
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(1)  
TIMING CHARACTERISTICS – LVDS AND CMOS MODES  
Typical values at 25C, min and max values are across the full temperature range TMIN = -40C to TMAX = 85C, AVDD = 3.3V, DRVDD = 1.8V  
(2)  
(3)  
to 3.3V, 3.0 Vpp sine wave input clock, C  
= 5pF , I = 3.5mA, R  
o
= 100Ω , no internal termination, unless otherwise noted.  
LOAD  
LOAD  
ADS62P45  
ADS62P44  
ADS62P43  
ADS62P42  
PARAMETER  
CONDITIONS  
UNIT  
MIN TYP MAX MIN TYP MAX MIN TYP MAX MIN TYP MAX  
TBD  
TBD  
TBD  
TBD TBD  
130  
TBD TBD  
130  
TBD  
130  
TBD TBD  
130  
TBD  
TBD  
ns  
t , Aperture delay  
a
t , Aperture jitter  
j
fs rms  
from power down  
global  
15  
15  
15  
15  
μs  
ns  
ns  
from channel  
standby  
100  
100  
100  
100  
Wake-up time  
100  
100  
100  
100  
from output buffer  
disable  
Clock  
cycles  
14  
10  
14  
10  
Default  
14  
10  
14  
10  
Latency  
Clock  
cycles  
Low latency mode  
DDR LVDS INTERFACE (4) DRVDD = 3.3V  
(6)  
Data valid  
to  
tsu  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
1.5  
2.3  
2.3  
2.3  
3.8  
2.3  
5.2  
2.3  
ns  
ns  
zero-crossing of  
CLKOUTP  
(5)  
Data setup time  
Zero-crossing of  
CLKOUTP to data  
th  
(5)  
Data hold time  
(6)  
becoming invalid  
Input clock rising  
edge cross-over to  
output clock rising  
edge cross-over  
Duty cycle of  
tPDI  
TBD  
TBD TBD  
TBD TBD  
TBD TBD  
TBD  
5.5  
5.5  
5.5  
5.5  
ns  
Clock  
propagation delay  
LVDS bit clock  
duty cycle  
50%  
110  
50%  
110  
50%  
110  
50%  
110  
differential clock  
tRISE, tFALL  
Rise time measured  
from -100mV to  
+100mV,  
ps  
ps  
Data rise time,  
Data fall time  
tCLKRISE, tCLKFALL  
Fall time measured  
from +100mV to -  
100mV  
Output clock rise  
time,  
Output clock fall  
time  
120  
120  
120  
120  
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REV1P0 SEP 2007  
ADS62P45  
ADS62P44  
ADS62P43  
ADS62P42  
PARAMETER  
CONDITIONS  
UNIT  
MIN TYP MAX MIN TYP MAX MIN TYP MAX MIN TYP MAX  
PARALLEL CMOS INTERFACE, DRVDD = 2.5V TO 3.3V  
(7)  
tsu  
Data valid  
to zero-  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
3.5  
3.2  
4.3  
4
5.8  
5.5  
7.2  
7
ns  
ns  
crossing of CLKOUT  
(5)  
Data setup time  
th  
Zero-crossing of  
CLKOUT to data  
(7)  
(5)  
becoming invalid  
Data hold time  
tPDI  
Input clock rising edge  
cross-over to output  
clock rising edge  
cross-over  
TBD  
TBD TBD  
TBD TBD  
TBD TBD  
TBD  
7.3  
53  
7.3  
53  
7.3  
53  
7.3  
53  
ns  
Clock propagation  
delay  
Output clock duty  
cycle  
Duty cycle of output  
clock, CLKOUT  
Rise time measured  
from 20% to 80% of  
DRVDD,  
tRISE, tFALL  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
ns  
ns  
Data rise time,  
Data fall time  
Fall time measured  
from 80% to 20% of  
DRVDD  
Rise time measured  
from 20% to 80% of  
DRVDD  
tCLKRISE, tCLKFALL  
Output clock rise  
Fall time measured  
from 80% to 20% of  
DRVDD  
time,  
clock fall time  
Output  
Notes:  
1. Timing parameters are ensured by design and characterization and not tested in production.  
2. CLOAD is the effective external single-ended load capacitance between each output pin and ground  
3. I refers to the LVDS buffer current setting; R  
is the differential load resistance between the LVDS output pair.  
LOAD  
o
4. Measurements are done with a transmission line of 100Ω characteristic impedance between the device and the load.  
5. Setup and hold time specifications take into account the effect of jitter on the output data and clock. These specifications also assume that  
the data and clock paths are perfectly matched within the receiver. Any mismatch in these paths within the receiver would appear as  
reduced timing margin.  
6. Data valid refers to LOGIC HIGH of +100.0mV and LOGIC LOW of -100.0mV.  
7. Data valid refers to LOGIC HIGH of 2.0V and LOGIC LOW of 0.8V for DRVDD = 3.3V &  
LOGIC HIGH of 1.7V and LOGIC LOW of 0.7V for DRVDD = 2.5V.  
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the formative or design phase of development.  
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REV1P0 SEP 2007  
N+16  
N+3  
N+4  
N+15  
N+2  
N+1  
N+14  
Sample  
N
INPUT  
SIGNAL  
t a  
CLKM  
INPUT  
CLOCK  
CLKP  
CLKOUTM  
CLKOUTP  
t PDI  
t SU  
t h  
DDR  
LVDS  
14 clock cycles *  
OUTPUT DATA  
DXP, DXM  
O
E
O
E
O
E
O
E
O
E
O
E
O
E
O
E
O
E
O
E
E – Even bits D0, D2, D4, D6, D8, D10, D12  
O – Odd bits D1, D3, D5, D7, D9, D11, D13  
N+2  
N+1  
N-1  
N
N-10  
N-9  
t PDI  
CLKOUT  
t SU  
PARALLEL  
CMOS  
t h  
14 clock cycles *  
N-10  
OUTPUT DATA  
D0-D13  
N-9  
N-1  
N
N+1  
N+2  
* Latency is 10 clock cycles in low latency mode  
Figure 2 Latency diagram  
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Figure 3 LVDS mode timing  
Figure 4 CMOS mode timing  
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REV1P0 SEP 2007  
DEVICE CONFIGURATION  
ADS62P4X can be configured independently using either parallel interface control or serial interface programming.  
USING PARALLEL INTERFACE CONTROL ONLY  
To control the device using parallel interface, keep RESET tied to high (AVDD).  
Pins SEN, SCLK, CTRL1, CTRL2 and CTRL3 can be used to directly control certain functions of the ADC. After power-up, the  
device will automatically get configured as per the parallel pin voltage settings (Table 4 to Table 6).  
In this mode, SEN and SCLK function as parallel analog control pins, which can be configured using a simple resistor divider as  
shown in Figure 5. The table below has a description of the modes controlled by the parallel pins.  
Table 3 PARALLEL PIN DEFINITION  
Control Pin  
Type of pin  
Controls modes  
SCLK  
Coarse gain and Internal/external reference  
Analog control pins (controlled by analog  
voltage levels, see Figure 5).  
SEN  
LVDS/CMOS interface and Output Data Format  
CTRL1  
CTRL2  
CTRL3  
Digital control pins (controlled by digital logic  
levels)  
Together control various power down modes and  
MUX mode.  
USING SERIAL INTERFACE PROGRAMMING ONLY  
To program the device using the serial interface, keep RESET low.  
Pins SEN, SDATA, and SCLK function as serial interface digital pins and are used to access the internal registers of ADC. The  
registers must first be reset to their default values either by applying a pulse on RESET pin or setting bit <RST> = 1. After  
reset, the RESET pin must be kept low.  
The serial interface section describes the register programming and register reset in more detail. Since the parallel pins  
(CTRL1, CTRL2, CTRL3) are not used in this mode, they must be tied to ground.  
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USING BOTH SERIAL INTERFACE AND PARALLEL CONTROLS  
For increased flexibility, a combination of serial interface registers and parallel pin controls (CTRL1 to CTRL3) can also be used  
to configure the device. To allow this, keep RESET low.  
The parallel interface control pins CTRL1 to CTRL3 are available. After power-up, the device will automatically get configured  
as per the voltage settings on these pins (Table 6).  
SEN, SDATA, and SCLK function as serial interface digital pins and are used to access the internal registers of ADC. The  
registers must first be reset to their default values either by applying a pulse on RESET pin or by setting bit <RST> = 1. After  
reset, the RESET pin must be kept low. The serial interface section describes the register programming and register reset in  
more detail.  
Since the power down modes can be controlled using both the parallel pins and serial registers, the priority between the two is  
determined by <OVRD> bit. When <OVRD> bit = 0, pins CTRL1 to CTRL3 control the power down modes. With <OVRD> = 1,  
register bits <POWER DOWN> control these modes, over-riding the pin settings.  
DETAILS OF PARALLEL CONFIGURATION ONLY  
The functions controlled by each parallel pin are described below.  
Table 4 SCLK (ANALOG CONTROL PIN)  
SCLK  
0
DESCRIPTION  
0dB gain and Internal reference  
(3/8)AVDD  
(5/8)2AVDD  
AVDD  
0dB gain and External reference  
3.5dB Coarse gain and External reference  
3.5dB Coarse gain and Internal reference  
Table 5 SEN (ANALOG CONTROL PIN)  
DESCRIPTION  
SEN  
0
2’ s complement format and DDR LVDS output  
(3/8)AVDD  
(5/8)AVDD  
AVDD  
Straight binary and DDR LVDS output  
Straight binary and parallel CMOS output  
2’ s complement format and parallel CMOS output  
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Table 6 CTRL1, CTRL2 and CTRL3 (DIGITAL CONTROL PINS)  
CTRL1  
LOW  
LOW  
LOW  
LOW  
HIGH  
HIGH  
HIGH  
CTRL2  
LOW  
LOW  
HIGH  
HIGH  
LOW  
LOW  
HIGH  
CTRL3  
LOW  
HIGH  
LOW  
HIGH  
LOW  
HIGH  
LOW  
DESCRIPTION  
Normal operation  
Channel A output buffer disabled  
Channel B output buffer disabled  
Channel A and B output buffer disabled  
Power global down  
Channel A standby  
Channel B standby  
MUX mode of operation, Channel A and B data is multiplexed and output on  
HIGH  
HIGH  
HIGH  
DB13 to DB0 pins. See Multiplexed output mode for detailed description.  
Figure 5 Simple scheme to configure analog control pins (SCLK, SEN)  
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SERIAL INTERFACE  
The ADC has a set of internal registers, which can be accessed by the serial interface formed by pins SEN (Serial interface  
Enable), SCLK (Serial Interface Clock) and SDATA (Serial Interface Data).  
Serial shift of bits into the device is enabled when SEN is low. Serial data SDATA is latched at every falling edge of SCLK when  
SEN is active (low). The serial data is loaded into the register at every 16th SCLK falling edge when SEN is low. In case the  
word length exceeds a multiple of 16 bits, the excess bits are ignored. Data can be loaded in multiple of 16-bit words within a  
single active SEN pulse.  
The first 8 bits form the register address & the remaining 8 bits the register data. The interface can work with SCLK frequency  
from 20 MHz down to very low speeds (few Hertz) and also with non-50% SCLK duty cycle.  
Register Initialization  
After power-up, the internal registers must be initialized to their default values. This can be done in one of two ways –  
1) Either through hardware reset by applying a high-going pulse on RESET pin (of width greater than 10ns) as  
shown in Figure 6  
OR  
2) By applying software reset. Using the serial interface, set bit <RST> = 1. This initializes internal registers to their  
default values and then self-resets the <RST> bit to low. In this case, keep RESET pin low.  
Figure 6 Serial Interface Timing  
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SERIAL INTERFACE TIMING CHARACTERISTICS  
Typical values at 25C, min and max values across the full temperature range TMIN = -40C to TMAX = 85C, AVDD = 3.3V, DRVDD = 1.8V to 3.3V,  
unless otherwise noted.  
PARAMETER  
SCLK frequency  
MIN  
TYP  
MAX  
UNIT  
> DC  
20  
MHz  
f
t
t
t
t
SCLK  
SLOADS  
SLOADH  
DS  
SEN to SCLK setup time  
SCLK to SEN hold time  
SDATA setup time  
25  
25  
25  
25  
ns  
ns  
ns  
ns  
SDATA hold time  
DH  
RESET TIMING  
Typical values at 25C, min and max values across the full temperature range TMIN = -40C to TMAX = 85C, unless otherwise noted.  
PARAMETER  
CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
Delay from power-up of AVDD and DRVDD to  
RESET pulse active  
5
Power-on delay  
ms  
t1  
10  
25  
Reset pulse width  
Pulse width of active RESET signal  
ns  
ns  
t2  
t3  
Register write delay  
Delay from RESET disable to SEN active  
Delay from power-up of AVDD and DRVDD to  
output stable  
Power-up time  
7
ms  
tPO  
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Figure 7 Reset timing diagram  
Note: A high-going pulse on RESET pin is required in serial interface mode in case of initialization through hardware reset. For parallel  
interface operation, RESET has to be tied permanently HIGH.  
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SERIAL REGISTER MAP  
Table 7 Summary of functions supported by serial interface (1) (2)  
REGISTER  
ADDRESS  
A7 - A0 IN  
HEX  
REGISTER FUNCTIONS  
D7  
0
D6  
0
D5  
0
D4  
0
D3  
0
D2  
0
D1  
D0  
<RST>  
00  
10  
0
0
Software Reset  
<CLKOUT  
0
0
0
0
0
STRENGTH>  
<LVDS CURRENT>  
LVDS buffer current  
<CURRENT DOUBLE>  
LVDS buffer current double  
11  
0
0
<DATAOUT STRENGTH>  
programmability  
<LVDS TERMINATION>  
12  
13  
0
0
0
0
Internal termination programmability  
<OFFSET  
FREEZE>  
0
0
0
0
0
<OUTPUT  
INTERFACE>  
LVDS or CMOS  
interface  
<REF>  
Internal /  
External  
reference  
<OVRD>  
<COARSE GAIN>  
14  
0
<POWER DOWN MODES>  
Over-ride bit  
3.5 dB gain  
<DATA FORMAT>  
2s complement or  
straight binary  
Bit/Byte wise  
(LVDS only)  
16  
17  
0
0
0
0
0
0
0
<TEST PATTERNS>  
<FINE GAIN>  
0 to 6 dB gain in 0.5 dB steps  
0
18  
19  
<CUSTOM LOW> Lower 8 bits  
0
<CUSTOM HIGH> Upper 6 bits  
<LOW  
<OFFSET TC>  
<GAIN CORRECTION>  
1A  
LATENCY>  
<OFFSET EN>  
Offset  
Offset correction time constant  
0 to 0.5 dB, steps of 0.05 dB  
<FILTER COEFF  
<DECIMATION  
<ODD TAP  
Enable>  
<DECIMATION RATE>  
SELECT>  
In-built or custom  
coefficients  
1B  
0
0
Enable>  
correction  
enable  
Decimate by 2,4,8  
Enable decimation  
<DECIMATION FILTER FREQ  
BANDS>  
1D  
0
0
0
0
0
<FILTER COEFFICIENTS>  
1E to 2F  
12 coefficients, each 12 bit signed  
1) Multiple functions in a register can be programmed in a single write operation.  
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REV1P0 SEP 2007  
DESCRIPTION OF SERIAL REGISTERS  
A7 - A0  
D7  
0
D6  
0
D5  
0
D4  
0
D3  
0
D2  
0
D1  
D0  
0
(hex)  
<RST>  
00  
Software Reset  
D1  
<RST>  
Software reset applied – resets all internal registers and self-clears to 0.  
1
A7 - A0  
(hex)  
10  
D7  
D6  
D5  
0
D4  
0
D3  
0
D2  
0
D1  
0
D0  
0
<CLKOUT STRENGTH>  
D7-D6 <CLKOUT STRENGTH> Output clock buffer drive strength control  
01  
00  
11  
10  
WEAKER than default drive  
DEFAULT drive strength  
STRONGER than default drive strength (recommended for load capacitances > 5 pF)  
MAXIMUM drive strength (recommended for load capacitances > 5 pF)  
A7 - A0  
D7  
0
D6  
0
D5  
D4  
D3  
D2  
D1  
D0  
(hex)  
<LVDS CURRENT>  
LVDS buffer current  
programmability  
<CURRENT DOUBLE>  
11  
<DATAOUT STRENGTH>  
LVDS buffer current double  
D1-D0 <DATAOUT STRENGTH> Output data buffer drive strength control  
01  
00  
11  
10  
WEAKER than default drive  
DEFAULT drive strength  
STRONGER than default drive strength (recommended for load capacitances > 5 pF)  
MAXIMUM drive strength (recommended for load capacitances > 5 pF)  
D3-D2 <LVDS CURRENT> LVDS Current programmability  
00  
01  
10  
11  
3.5mA  
2.5mA  
4.5mA  
1.75mA  
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REV1P0 SEP 2007  
D5-D4 <CURRENT DOUBLE> LVDS Current double control  
00  
01  
10  
11  
default current, set by <LVDS CURR>  
LVDS clock buffer current is doubled, 2x <LVDS CURR>  
LVDS data & clock buffers current are doubled, 2x <LVDS CURR>  
unused  
A7 - A0  
D7  
0
D6  
0
D5  
D4  
D3  
D2  
D1  
D0  
(hex)  
<LVDS TERMINATION>  
12  
Internal termination programmability  
D5-D3 <LVDS DATA TERM> Internal termination control for data outputs  
000  
001  
010  
011  
100  
101  
110  
111  
No internal termination  
300 Ω  
180 Ω  
110 Ω  
150 Ω  
100 Ω  
81 Ω  
60 Ω  
D2-D0 <LVDS CLK TERM> Internal termination control for clock output  
000  
001  
010  
011  
100  
101  
110  
111  
No internal termination  
300 Ω  
180 Ω  
110 Ω  
150 Ω  
100 Ω  
81 Ω  
60 Ω  
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ADS62P43, ADS62P42  
REV1P0 SEP 2007  
A7 - A0  
D7  
0
D6  
0
D5  
0
D4  
D3  
0
D2  
0
D1  
0
D0  
0
(hex)  
13  
<OFFSET FREEZE>  
D4  
<OFFSET FREEZE> Offset correction becomes inactive and the last estimated offset value is used to cancel the  
offset  
0
1
Offset correction active  
Offset correction inactive  
A7 - A0  
D7  
D6  
0
D5  
D4  
D3  
D2  
D1  
D0  
(hex)  
<OUTPUT  
INTERFACE>  
LVDS or CMOS  
interface  
<OVRD>  
Over-ride  
bit  
<COARSE  
GAIN>  
<REF>  
Internal / External  
reference  
<POWER DOWN  
MODES>  
14  
3.5 dB gain  
D2-D0 <POWER DOWN MODES>  
000  
001  
010  
011  
100  
101  
110  
111  
Normal operation  
Channel A output buffer disabled  
Channel B output buffer disabled  
Channel A & B output buffers disabled  
Power down global  
Channel A standby  
Channel B standby  
Multiplexed mode, MUX- (only with CMOS interface)  
Channel A and B data is multiplexed and output on DB13 to DB0 pins.  
D3  
0
<REF> Reference mode  
Internal reference enabled  
External reference enabled  
1
D4  
0
<COARSE GAIN> Coarse gain control  
0 dB coarse gain  
1
3.5 dB coarse gain  
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REV1P0 SEP 2007  
D5  
0
<OUTPUT INTERFACE> Output Interface selection  
Parallel CMOS data outputs  
1
DDR LVDS data outputs  
D7  
<OVRD> Over-ride bit - the power down modes can also be controlled using parallel pins. By setting <OVRD> = 1,  
register bits <POWER DOWN MODES> will over-ride the settings of the parallel pins.  
0
1
Disable over-ride – pins CTRL1 to CTRL3 control power down modes.  
Enable over-ride - bits <POWER DOWN MODES> control power down modes.  
A7 - A0  
(hex)  
D7  
0
D6  
0
D5  
0
D4  
D3  
D2  
D1  
D0  
<DATA FORMAT>  
16  
Bit / Byte wise (LVDS only)  
<TEST PATTERNS>  
2s complement or straight binary  
D2-D0 <TEST PATTERNS> Test Patterns to verify capture  
000  
Normal ADC operation  
001  
010  
011  
100  
101  
110  
111  
Outputs all zeros  
Outputs all ones  
Outputs toggle pattern  
Outputs digital ramp  
Outputs custom pattern  
Unused  
Unused  
D3  
Bit-wise/Byte-wise selection (DDR LVDS mode ONLY)  
0
Bit wise – Even bits (D0, D2, D4, D6, D8, D10, D12) on CLKOUT rising edge and Odd bits (D1, D3, D5, D7, D9, D11,  
D13) on CLKOUT falling edge  
1
Byte wise – Lower 7 bits (D0-D6) at CLKOUT rising edge and Upper 7 bits (D7-D13) at CLKOUT falling edge  
D4  
0
<DATA FORMAT> Data format selection  
2s complement  
1
Straight binary  
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ADS62P43, ADS62P42  
REV1P0 SEP 2007  
A7 - A0  
(hex)  
D7  
0
D6  
0
D5  
0
D4  
0
D3  
D2  
D1  
D0  
<FINE GAIN>  
0 to 6 dB gain in 0.5 dB steps  
17  
D3-D0 <FINE GAIN> Gain programmability in 0.5 dB steps  
0000  
0001  
0010  
0011  
0100  
0101  
0110  
0111  
1000  
1001  
1010  
1011  
1100  
0 dB gain, default after reset  
0.5 dB gain  
1.0 dB gain  
1.5 dB gain  
2.0 dB gain  
2.5 dB gain  
3.0 dB gain  
3.5 dB gain  
4.0 dB gain  
4.5 dB gain  
5.0 dB gain  
5.5 dB gain  
6.0 dB gain  
Others Unused  
A7 - A0  
D7  
0
D6  
0
D5  
D4  
D3  
D2  
D1  
D0  
(hex)  
18  
<CUSTOM LOW> Lower 8 bits  
<CUSTOM HIGH> Upper 6 bits  
19  
D7-D0  
D5-D0  
<CUSTOM LOW>  
8 lower bits of custom pattern available at the output instead of ADC data.  
<CUSTOM HIGH>  
6 upper bits of custom pattern available at the output instead of ADC data  
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ADS62P43, ADS62P42  
REV1P0 SEP 2007  
A7 - A0  
D7  
D6  
D5  
D4  
D3  
D2  
D1  
D0  
(hex)  
<OFFSET TC>  
<GAIN CORRECTION>  
1A  
<LOW LATENCY>  
Offset correction time constant  
0 to 0.5 dB, steps of 0.05 dB  
D3-D0 <GAIN CORRECTION> Enables fine gain correction in steps of 0.05 dB (same correction applies to both channels)  
0000  
0001  
0010  
0011  
0100  
0101  
0110  
0111  
1000  
1001  
1010  
0 dB  
+0.05 dB  
+0.10 dB  
+0.15 dB  
+0.20 dB  
+0.25 dB  
+0.30 dB  
+0.35 dB  
+0.40 dB  
+0.45 dB  
+0.5 dB  
D6-D4 <OFFSET TC>, Time constant of offset correction in number of clock cycles (seconds, for sampling frequency =  
125MSPS)  
000  
001  
010  
011  
100  
101  
110  
111  
227 (1.1 s)  
226 (0.55 s)  
225 (0.27 s)  
224 (0.13 s)  
228 (2.15 s)  
229 (4.3 s)  
227 (1.1 s)  
227 (1.1 s)  
D7  
0
<LOW LATENCY>  
Default latency, 14 clock cycles  
Low latency enabled, 10 clock cycles  
1
- Digital Processing Block is bypassed.  
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REV1P0 SEP 2007  
A7 - A0  
D7  
D6  
0
D5  
D4  
D3  
D2  
D1  
D0  
(hex)  
<FILTER COEFF  
SELECT>  
<OFFSET Enable>  
Offset correction  
enable  
<DECIMATION  
Enable>  
<DECIMATION  
RATE>  
1B  
<ODD TAP Enable>  
In-built or custom  
coefficients  
Enable decimation  
Decimate by 2,4,8  
D2-D0 <DECIMATION RATE>  
000  
001  
011  
100  
Decimate by 2 (pre-defined or user coefficients can be used)  
Decimate by 4 (pre-defined or user coefficients can be used)  
No decimation (Pre-defined coefficients are disabled, only custom coefficients are available)  
Decimate by 8 (Only custom coefficients are available)  
D3  
0
<ODD TAP ENABLE>  
Even taps enabled (24 coefficients)  
Odd taps enabled (23 coefficients)  
1
D4  
0
<DECIMATION ENABLE>  
Decimation disabled  
Decimation enabled  
1
D5  
0
<FILTER COEFF SELECT>  
Pre-defined coefficients are loaded in the filter  
1
User-defined coefficients are loaded in the filter (coefficients have to be loaded in registers – to - )  
D7  
0
<OFFSET Enable>  
Offset correction disabled  
Offset correction enabled  
1
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REV1P0 SEP 2007  
A7 - A0  
D7  
0
D6  
0
D5  
0
D4  
0
D3  
0
D2  
0
D1  
D0  
(hex)  
1D  
<DECIMATION FILTER FREQ BANDS>  
D1-D0 <DECIMATION FILTER FREQ BAND>  
With decimate by 2, <DECIMATION RATE> = 000:  
Low pass filter (-6 dB frequency at Fs/4)  
High pass filter (-6 dB frequency at Fs/4)  
00  
01  
10,11 Unused  
With decimate by 4, <DECIMATION RATE> = 001:  
00  
01  
10  
11  
Low pass filter (-3 dB frequency at Fs/8)  
Band pass filter (center frequency at 3Fs/16)  
Band pass filter (center frequency at 5Fs/16)  
High pass filter (-3 dB frequency at 3Fs/8)  
A7 - A0  
D7  
D6  
D5  
D4  
D3  
D2  
D1  
D0  
(hex)  
Custom FIR coefficients  
1E to 2F  
See Table 14  
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REV1P0 SEP 2007  
PIN DESCRIPTION (CMOS INTERFACE)  
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PIN ASSIGNMENTS (CMOS INTERFACE)  
Number  
Pin  
Pin Name  
Description  
of  
Number  
pins  
AVDD  
Analog power supply  
AGND  
Analog ground  
CLKP, CLKM  
INP_A, INM_A  
INP_B, INM_B  
VCM  
Differential input clock  
Differential input signal – channel A  
Differential input signal – channel B  
Internal reference mode – Common-mode voltage output.  
External reference mode – Reference input. The voltage forced on  
this pin sets the ADC internal references.  
RESET  
Serial interface RESET input.  
In serial interface mode, the user MUST initialize internal registers through  
hardware RESET by applying a high-going pulse on this pin or by using software  
reset (refer to Serial Interface section).  
In parallel interface mode, the user has to tie RESET pin permanently HIGH.  
(SCLK, SDATA and SEN are used as parallel pin controls in this mode)  
The pin has an internal 100KΩ pull-down resistor.  
SCLK  
This pin functions as serial interface clock input when RESET is low.  
It functions as analog control pin when RESET is tied high & controls coarse gain  
and internal/external reference selection. See Table 4 for details.  
This pin has an internal pull-down resistor to ground.  
SDATA  
SEN  
This pin functions as serial interface data input when RESET is low.  
This pin has an internal pull-down resistor to ground.  
This pin functions as serial interface enable input when RESET is low.  
It functions as analog control pin when RESET is tied high & controls the output  
interface (LVDS/CMOS) and data format selection. See Table 5 for details.  
This pin has an internal pull-up resistor to AVDD.  
CTRL1  
These are digital logic input pins. They control various power down and multiplexed  
mode. See Table 6 for details.  
CTRL2  
CTRL3  
DA13 to DA0  
Channel A 14-bit data outputs, CMOS  
DB13 to DB0  
CLKOUT  
DRVDD  
DRGND  
PAD  
Channel B 14-bit data outputs, CMOS  
CMOS Output clock  
Digital supply  
Digital ground  
Digital ground. Solder the pad to the digital ground on the board using multiple vias  
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ADS62P43, ADS62P42  
REV1P0 SEP 2007  
for good electrical & thermal performance.  
Do not connect  
NC  
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REV1P0 SEP 2007  
PIN DESCRIPTION (LVDS INTERFACE)  
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REV1P0 SEP 2007  
PIN ASSIGNMENTS (LVDS INTERFACE)  
Pin  
Pin Name  
Description  
Number of pins  
Number  
AVDD  
AGND  
Analog power supply  
Analog ground  
CLKP, CLKM  
INP_A, INM_A  
INP_B, INM_B  
VCM  
Differential input clock  
Differential input signal – Channel A  
Differential input signal – Channel B  
Internal reference mode – Common-mode voltage output.  
External reference mode – Reference input. The voltage forced on  
this pin sets the ADC internal references.  
RESET  
Serial interface RESET input.  
In serial interface mode, the user MUST initialize internal registers through  
hardware RESET by applying a high-going pulse on this pin or by using  
software reset (refer to Serial Interface section).  
In parallel interface mode, the user has to tie RESET pin permanently HIGH.  
(SCLK, SDATA and SEN are used as parallel pin controls in this mode)  
The pin has an internal 100KΩ pull-down resistor.  
SCLK  
This pin functions as serial interface clock input when RESET is low.  
It functions as analog control pin when RESET is tied high & controls coarse  
gain and internal/external reference selection. See Table 4 for details.  
This pin has an internal pull-down resistor to ground.  
SDATA  
SEN  
This pin functions as serial interface data input when RESET is low.  
This pin has an internal pull-down resistor to ground.  
This pin functions as serial interface enable input when RESET is low.  
It functions as analog control pin when RESET is tied high & controls the  
output interface (LVDS/CMOS) and data format selection. See Table 5 for  
details.  
This pin has an internal pull-up resistor to AVDD.  
CTRL1  
These are digital logic input pins. Together they control various power  
down and multiplexed mode. See Table 6 for details.  
CTRL2  
CTRL3  
NC  
Do not connect  
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Number of  
pins  
Pin Name  
Description  
Pin Number  
DA0P  
Channel A Differential output data D0 & D1, true  
Channel A Differential output data D0 & D1 , complement  
Channel A Differential output data D2 & D3 , true  
Channel A Differential output data D2 & D3 , complement  
Channel A Differential output data D4 & D5 , true  
Channel A Differential output data D4 & D5 , complement  
Channel A Differential output data D6 & D7 , true  
Channel A Differential output data D6 & D7 , complement  
Channel A Differential output data D8 & D9 , true  
Channel A Differential output data D8 & D9 , complement  
Channel A Differential output data D10 & D11 , true  
Channel A Differential output data D10 & D11 , complement  
Channel A Differential output data D12 & D13 , true  
Channel A Differential output data D12 & D13 , complement  
Differential output clock, true  
DA0M  
DA2P  
DA2M  
DA4P  
DA4M  
DA6P  
DA6M  
DA8P  
DA8M  
DA10P  
DA10M  
DA12P  
DA12M  
CLKOUTP  
CLKOUTM  
DB0P  
Differential output clock, complement  
Channel B Differential output data D0 & D1 , true  
Channel B Differential output data D0 & D1 , complement  
Channel B Differential output data D2 & D3 , true  
Channel B Differential output data D2 & D3 , complement  
Channel B Differential output data D4 & D5 , true  
Channel B Differential output data D4 & D5 , complement  
Channel B Differential output data D6 & D7 , true  
Channel B Differential output data D6 & D7 , complement  
Channel B Differential output data D8 & D9 , true  
Channel B Differential output data D8 & D9 , complement  
Channel B Differential output data D10 & D11 , true  
Channel B Differential output data D10 & D11 , complement  
Channel B Differential output data D12 & D13 , true  
Channel B Differential output data D12 & D13 , complement  
Digital supply  
DB0M  
DB2P  
DB2M  
DB4P  
DB4M  
DB6P  
DB6M  
DB8P  
DB8M  
DB10P  
DB10M  
DB12P  
DB12M  
DRVDD  
DRGND  
PAD  
Digital ground  
Digital ground. Solder the pad to the digital ground on the board using  
multiple vias for good electrical & thermal performance.  
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APPLICATION INFORMATION  
THEORY OF OPERATION  
ADS62P4X is a low power 14 bit dual channel pipeline ADC family fabricated in a CMOS process using switched capacitor  
techniques.  
The conversion process is initiated by a rising edge of the external input clock. Once the signal is captured by the input sample  
& hold, the input sample is sequentially converted by a series of small resolution stages, with the outputs combined in a digital  
correction logic block. At every clock edge the sample propagates through the pipeline resulting in a data latency of 14 clock  
cycles. The output is available as 14-bit data, in DDR LVDS or CMOS and coded in either straight offset binary or binary 2s  
complement format.  
ANALOG INPUT  
The analog input consists of a switched-capacitor based differential sample and hold architecture. This differential topology  
results in very good AC performance even for high input frequencies at high sampling rates. The INP and INM pins have to be  
externally biased around a common-mode voltage of 1.5V, available on VCM pin 13. For a full-scale differential input, each  
input pin INP, INM has to swing symmetrically between VCM + 0.5V and VCM - 0.5V, resulting in a 2Vpp differential input  
swing. The maximum swing is determined by the internal reference voltages REFP (2.5V nominal) and REFM (0.5V, nominal).  
Sampling  
switch  
Sampling  
capacitor  
Lpkg~ 2 nH  
RCR Filter  
INP  
Ron  
15 E  
25 E  
Cbond  
~ 1 pF  
Csamp  
4.0 pF  
Cpar2  
1 pF  
50 E  
Resr  
100 E  
Ron  
10 E  
3.2 pF  
Cpar1  
0.8 pF  
Csamp  
4.0 pF  
50 E  
Ron  
15 E  
Lpkg~ 2 nH  
25 E  
INM  
Cbond  
~ 1 pF  
Sampling  
capacitor  
Cpar2  
1 pF  
Resr  
100 E  
Sampling  
switch  
Figure 8 Analog Input Equivalent Circuit  
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The input sampling circuit has a high 3-dB bandwidth that extends up to 450 MHz (measured from the input pins to the  
sampled voltage).  
TBD  
Figure 9 ADC Analog Bandwidth  
Drive Circuit Requirements  
For optimum performance, the analog inputs must be driven differentially. This improves the common-mode noise immunity  
and even order harmonic rejection. A 5 Ω resistor in series with each input pin is recommended to damp out ringing caused by  
the package parasitics.  
It is also necessary to present low impedance (< 50 Ω) for the common mode switching currents. This can be achieved by  
using two resistors from each input terminated to the common mode voltage (VCM).  
In addition to the above, the drive circuit may have to be designed to provide a low insertion loss over the desired frequency  
range and matched impedance to the source. While doing this, the ADC input impedance must be considered. Figure 10 &  
Figure 11 show the impedance (Zin = Rin || Cin) looking into the ADC input pins.  
100.0  
10.0  
1.0  
0.1  
0.0  
0
100  
200  
300  
400  
500  
600  
Frequency,MHz  
Figure 10 ADC Analog Input Resistance (Rin) across frequency  
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9
8
7
6
5
4
3
2
1
0
0
100  
200  
300  
400  
500  
600  
Frequency, MHz  
Figure 11 ADC Analog Input Capacitance (Cin) across frequency  
Using RF-Transformer based drive circuits  
Figure 12 shows a configuration using a single 1:1 turns ratio transformer (for example, Coilcraft WBC1-1) that can be used for  
low input frequencies (about 100 MHz). The single-ended signal is fed to the primary winding of the RF transformer. The  
transformer is terminated on the secondary side. Putting the termination on the secondary side helps to shield the kickbacks  
caused by the sampling circuit from the RF transformer’ s leakage inductances. The termination is accomplished by two  
resistors connected in series, with the center point connected to the 1.5 V common mode (VCM pin). The value of the  
termination resistors (connected to common mode) has to be low (< 100 Ω) to provide a low-impedance path for the ADC  
common-mode switching currents.  
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Figure 12 Drive circuit at low input frequencies  
At high input frequencies, the mismatch in the transformer parasitic capacitance (between the windings) results in degraded  
even-order harmonic performance. Connecting two identical RF transformers back-to-back helps minimize this mismatch, and  
good performance is obtained for high frequency input signals. Figure 13 shows an example using two transformers (Coilcraft  
WBC1-1). An additional termination resistor pair (enclosed within the shaded box) may be required between the two  
transformers to improve the balance between the P and M sides. The center point of this termination must be connected to  
ground.  
Figure 13 Drive circuit at high input frequencies  
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Using Differential Amplifier drive circuits  
Figure 14 shows a drive circuit using a differential amplifier (TI's THS4509) to convert a single-ended input to differential output  
that can be interface to the ADC analog input pins. In addition to the single-ended to differential conversion, the amplifier also  
provides gain (10 dB). RFIL helps to isolate the amplifier outputs from the switching input of the ADC. Together with CFIL it also  
forms a low-pass filter that band-limits the noise (and signal) at the ADC input. As the amplifier output is ac-coupled, the  
common-mode voltage of the ADC input pins is set using two 200 W resistors connected to VCM.  
The amplifier output can also be dc-coupled. Using the output common-mode control of the THS4509, the ADC input pins can  
be biased to 1.5 V. In this case, use +4 V and -1 V supplies for the THS4509 so that its output common-mode voltage (1.5 V) is  
at mid-supply.  
RF  
+VS  
500 E  
5 E  
RFIL  
0.1 uF  
0.1 uF 10 uF  
0.1 uF  
INP  
RG  
200 E  
200 E  
CFIL  
RS  
0.1 uF  
RT  
CM  
THS4509  
CFIL  
INM  
RG  
VCM  
0.1 uF  
RFIL  
5 E  
500 E  
RS || RT  
0.1 uF  
0.1 uF  
- VS  
10 uF  
0.1 uF  
RF  
Figure 14 Drive Circuit using the THS4509  
Input common-mode  
To ensure a low-noise common-mode reference, the VCM pin is filtered with a 0.1uF low-inductance capacitor connected to  
ground. The VCM pin is designed to directly drive the ADC inputs. Each input pin of the ADC sinks a common-mode current,  
about 165 uA (at 125MSPS). Equation 1 describes the dependency of the common-mode current and the sampling frequency.  
165mAxFs  
125MSPS  
Equation 1  
This equation helps to design the output capability and impedance of the CM driving circuit accordingly.  
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REFERENCE  
ADS62P4X has built-in internal references REFP and REFM, requiring no external components. Design schemes are used to  
linearize the converter load seen by the references; this and the on-chip integration of the requisite reference capacitors  
eliminates the need for external decoupling. The full-scale input range of the converter can be controlled in the external  
reference mode as explained below. The internal or external reference modes can be selected by programming the serial  
interface register bit <REF>.  
Figure 15 Reference section  
Internal reference  
When the device is in internal reference mode, the REFP and REFM voltages are generated internally. Common-mode voltage  
(1.5V nominal) is output on VCM pin, which can be used to externally bias the analog input pins.  
External reference  
When the device is in external reference mode, the VCM acts as a reference input pin. The voltage forced on the VCM pin is  
buffered and gained by 1.33 internally, generating the REFP and REFM voltages. The differential input voltage corresponding  
to full-scale is given by  
Equation 2.  
Full-scale differential input pp = (Voltage forced on VCM) x 1.33  
Equation 2  
In this mode, the 1.5V common-mode voltage to bias the input pins has to be generated externally.  
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COARSE GAIN AND PROGRAMMABLE FINE GAIN  
ADS62P4X includes gain settings that can be used to get improved SFDR performance (over 0dB gain mode). For each gain  
setting, the analog input full-scale range scales proportionally, as shown in Table 8 .  
The coarse gain is a fixed setting of 3.5 dB and is designed to improve SFDR with little degradation in SNR. The fine gain is  
programmable in 0.5 dB steps from 0 to 6 dB; however the SFDR improvement is achieved at the expense of SNR. So, the  
programmable fine gain makes it possible to trade-off between SFDR and SNR. The coarse gain makes it possible to get best  
SFDR but without losing SNR significantly.  
The gains can be programmed using the serial interface (bits <COARSE GAIN> and <FINE GAIN>). Note that the default gain  
after reset is 0dB.  
Table 8 Full-scale range across gains  
Gain, dB  
0
Type  
Full-Scale, Vpp  
2V  
Default after reset  
Coarse (fixed)  
3.5  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
3.5  
4.0  
4.5  
5.0  
5.5  
6.0  
1.34  
1.89  
1.78  
1.68  
1.59  
1.50  
1.42  
Fine (programmable)  
1.34  
1.26  
1.19  
1.12  
1.06  
1.00  
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CLOCK INPUT  
The clock inputs can be driven differentially (SINE, LVPECL or LVDS) or single-ended (LVCMOS), with little or no difference in  
performance between them. The common-mode voltage of the clock inputs is set to VCM using internal 5 kΩ resistors as  
shown in Figure 16. This allows using transformer-coupled drive circuits for sine wave clock or ac-coupling for LVPECL, LVDS  
clock sources (Figure 18 and Figure 19).  
Clock buffer  
Lpkg  
~ 2 nH  
10 E  
CLKP  
Cbond  
~ 1 pF  
Ceq  
Ceq  
5 kE  
Resr  
~ 100 E  
VCM  
6 pF  
5 kE  
Lpkg  
~ 2 nH  
10 E  
CLKM  
Cbond  
~ 1 pF  
Resr  
~ 100 E  
Ceq ~ 1 to 3 pF, equivalent input capacitance of clock buffer  
Figure 16 Internal Clock buffer  
TBD  
Figure 17 Clock Input Impedance  
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Figure 18 Differential clock driving circuit  
Single-ended CMOS clock can be ac-coupled to the CLKP input, with CLKM (pin 11) connected to ground with a 0.1-μ F  
capacitor, as shown in Figure 19.  
Figure 19 Single-ended clock driving circuit  
For best performance, the clock inputs have to be driven differentially, reducing susceptibility to common-mode noise.  
For high input frequency sampling, it is recommended to use a clock source with very low jitter. Bandpass filtering of the clock  
source can help reduce the effect of jitter. There is no change in performance with a non-50% duty cycle clock input.  
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POWER DOWN  
ADS62P4X has three power down modes – power down global, channel standby and individual channel output buffer disable.  
These can be set using either the serial register bits or using the control pins CTRL1 to CTRL3.  
CONFIGURE USING  
TOTAL  
SERIAL INTERFACE  
PARALLEL CONTROL PINS  
POWER DOWN MODES  
POWER,  
WAKE-UP TIME  
<POWER DOWN  
(1)  
mW  
CTRL1  
CTRL2  
CTRL3  
MODES>  
000  
Normal operation  
low  
low  
low  
low  
low  
high  
low  
792  
782  
782  
772  
50  
-
Channel A output buffer disabled  
Channel B output buffer disabled  
Channel A & B output buffer disabled  
Power down global  
001  
Fast (100 ns)  
Fast (100 ns)  
Fast (100 ns)  
Slow (15 μ s)  
Fast (100 ns)  
Fast (100 ns)  
010  
low  
high  
high  
low  
011  
low  
high  
low  
100  
high  
high  
high  
high  
Channel A standby  
101  
low  
high  
low  
482  
482  
Channel B standby  
110  
high  
high  
Multiplexed (MUX) mode – Output data of  
channel A & B is multiplexed & available on  
DB13 to DB0 pins.  
111  
high  
-
-
1. Sampling frequency = 125 MSPS, DRVDD = 1.8V  
Power down global  
In this mode, the entire chip including both the A/D converters, internal reference and the output buffers are powered down  
resulting in reduced total power dissipation of about 50 mW. The output buffers are in high impedance state. The wake-up time  
from the global power down to data becoming valid in normal mode is typically 15 μ s.  
Channel standby (individual or both channels)  
This mode allows the individual ADCs to be powered down. The internal references are active & this results in fast wake-up  
time, about 100 ns. The total power dissipation in standby is about 482 mW.  
Output buffer disable (individual or both channels)  
Each channel’ s output buffer can be disabled & put in high impedance stat.eWakeup time is fast, about 100 ns.  
Input clock stop  
In addition to the above, the converter enters a low-power mode when the input clock frequency falls below 1 MSPS. The  
power dissipation is about 140 mW.  
POWER SUPPLY SEQUENCE  
During power-up, the AVDD and DRVDD supplies can come up in any sequence. The two supplies are separated in the  
device. Externally, they can be driven from separate supplies or from a single supply.  
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DIGITAL OUTPUT INFORMATION  
ADS62P4X provides 14 bit data per channel and a common output clock synchronized with the data. The output interface can  
be either parallel CMOS or DDR LVDS voltage levels and can be selected using serial register bit <OUTPUT INTERFACE> or  
parallel pin SEN.  
Parallel CMOS interface  
In the CMOS mode, the output buffer supply (DRVDD) can be operated over a wide range from 1.8 V to 3.3 V (typical). Each  
data bit is output on separate pin as CMOS voltage level, every clock cycle (Figure 20).  
For DRVDD > 2.2 V, it is recommended to use the CMOS output clock (CLKOUT) to latch data in the receiving chip. The rising  
edge of CLKOUT can be used to latch data in the receiver, even at the highest sampling speed. It is recommended to minimize  
the load capacitance seen by data and clock output pins by using short traces to the receiver. Also, match the output data and  
clock traces to minimize the skew between them.  
For DRVDD < 2.2 V, it is recommended to use external clock (for example, input clock delayed to get desired setup / hold  
times).  
CMOS  
Output Buffers  
DA0  
DA1  
DA2  
DA3  
14 bit Channel A  
data  
DA12  
DA13  
CLKOUT  
DB0  
DB1  
DB2  
DB3  
14 bit Channel B  
Data  
DB12  
DB13  
Figure 20 CMOS Output Interface  
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Output Buffer Strength Programmability  
Switching noise (caused by CMOS output data transitions) can couple into the analog inputs during the instant of sampling and  
degrade the SNR. The coupling and SNR degradation increases as the output buffer drive is made stronger. To minimize this,  
ADS62P4X CMOS output buffers are designed with controlled drive strength to get best SNR. The default drive strength also  
ensures wide data stable window for load capacitances up to 5 pF and DRVDD supply voltage > 2.2 V.  
To ensure wide data stable window for load capacitance > 5 pF, there exists option to increase the output data & clock drive  
strengths using the serial interface (<DATAOUT STRENGTH> & <CLKOUT STRENGTH>). Note that for DRVDD supply  
voltage < 2.2 V, it is recommended to use maximum drive strength (for any value of load capacitance).  
CMOS Interface Power Dissipation  
With CMOS outputs, the DRVDD current scales with the sampling frequency and the load capacitance on every output pin. The  
maximum DRVDD current occurs when each output bit toggles between 0 and 1 every clock cycle. In actual applications, this  
condition is unlikely to occur. The actual DRVDD current would be determined by the average number of output bits switching,  
which is a function of the sampling frequency and the nature of the analog input signal.  
Digital current due to CMOS output switching = CL x DRVDD x (N x FAVG),  
where CL = load capacitance, N x FAVG = average number of output bits switching.  
Figure TBD shows the current with various load capacitances across sampling frequencies at 2 MHz analog input frequency.  
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DDR LVDS Interface  
The LVDS interface works only with 3.3V DRVDD supply. In this mode, the 14 data bits of each channel and a common output  
clock are available as LVDS (Low Voltage Differential Signal) levels. Two successive data bits are multiplexed and output on  
each LVDS differential pair every clock cycle (DDR - Double Data Rate,  
Figure 22).  
Pins  
LVDS Buffers  
DA0P  
Data bits D0, D1  
DA0M  
DA2P  
Data bits D2, D3  
14 bit Channel A  
data  
DA2M  
DA12P  
DA12M  
Data bits D12, D13  
Output Clock  
CLKOUTP  
CLKOUTM  
DB0P  
DB0M  
Data bits D0, D1  
Data bits D2, D3  
DB2P  
DB2M  
14 bit Channel B  
data  
DB12P  
DB12M  
Data bits D12, D13  
Figure 21 DDR LVDS outputs  
Even data bits D0, D2, D4, D6, D8, D10 and D12 are output at the rising edge of CLKOUTP and the odd data bits D1, D3, D5,  
D7, D9, D11 and D13 are output at the falling edge of CLKOUTP. Both the rising and falling edges of CLKOUTP have to be  
used to capture all the data bits.  
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Figure 22 DDR LVDS interface  
LVDS Buffer Current Programmability  
The default LVDS buffer output current is 3.5 mA. When terminated by 100 Ω, this results in a 350-mV single-ended voltage  
swing (700-mVPP differential swing). The LVDS buffer currents can also be programmed to 2.5 mA, 4.5 mA, and 1.75 mA  
(<LVDS CURRENT>). In addition, there exists a current double mode, where this current is doubled for the data and output  
clock buffers (register bits <CURRENT DOUBLE>).  
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LVDS Buffer Internal Termination  
An internal termination option is available (using the serial interface), by which the LVDS buffers are differentially terminated  
inside the device. The termination resistances available are – 300 Ω, 185 Ω, and 150 Ω (nominal with ±20% variation). Any  
combination of these three terminations can be programmed; the effective termination is the parallel combination of the  
selected resistances. This results in eight effective terminations from open (no termination) to 60 Ω.  
The internal termination helps to absorb any reflections coming from the receiver end, improving the signal integrity. With 100 Ω  
internal and 100 Ω external termination, the voltage swing at the receiver end is halved (compared to no internal termination).  
The voltage swing can be restored by using the LVDS current double mode. Figure 23 &  
TBD  
Figure 24 compare the LVDS eye diagrams without and with 100 Ω internal termination. With internal termination, the eye looks  
clean even with 10 pF load capacitance (from each output pin to ground). The terminations can be programmed using register  
bits <LVDS TERMINATION>.  
TBD  
Figure 23 LVDS Eye Diagram – No Internal Termination  
TBD  
Figure 24 LVDS Eye Diagram – With 100Ω Internal Termination  
Output Data Format  
Two output data formats are supported – 2s complement and straight binary. They can be selected using the serial interface  
register bit <DATA FORMAT> or controlling the SEN pin in parallel configuration mode.  
In the event of an input voltage overdrive, the digital outputs go to the appropriate full scale level. For a positive overdrive, the  
output code is 0x3FFF in offset binary output format, and 0x1FFF in 2s complement output format. For a negative input  
overdrive, the output code is 0x0000 in offset binary output format and 0x2000 in 2s complement output format.  
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Multiplexed Output mode  
This mode is available only with CMOS interface. In this mode, the digital outputs of both the channels are multiplexed and  
output on a single bus (DA0-DA13 pins), as per the timing diagram shown in Figure 25. The channel B output pins (DB0-DB13)  
are tri-stated. Since the output data rate on the DB bus is effectively doubled, this mode is recommended only for low sampling  
frequencies (< 65 MSPS).  
This mode can be enabled using register bits <POWER DOWN MODES> or using the parallel pins CTRL1 -3 ().  
CLKOUT  
DA0  
DA1  
DB0  
DB1  
DA0  
DA1  
DB0  
DB1  
DB0  
DB1  
DA2  
DB2  
DA2  
DB2  
DB2  
DA13  
DB13  
DA13  
DB13  
DB13  
SAMPLE N  
SAMPLE N+1  
Figure 25 Multiplexed mode - Output Timing  
Low Latency mode  
The default latency of ADS62P4X is 14 clock cycles. For applications, which cannot tolerate large latency, ADS62P4X includes  
a special mode with 10 clock cycles latency. In the low latency condition, the Digital Processing block is bypassed and its  
features (offset correction, fine gain, decimation filters) are not available.  
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DETAILS OF THE DIGITAL PROCESSING BLOCK  
CLIPPER  
From ADC  
output  
14 bits  
14 bits  
14 bits  
14 bits  
14 bits  
To output buffers  
LVDS or CMOS  
24 TAP FILTER  
- LOW PASS  
- HIGH PASS  
- BAND PASS  
Fine Gain  
(0 to 6 dB  
0.5 dB steps)  
Gain Correction  
(0.05 dB steps)  
DECIMATION  
14 bits  
BY 2/4/8  
0
OFFSET  
ESTIMATION  
BLOCK  
Filter Select  
Disable offset  
correction  
Bypass filter  
Bypass  
decimation  
Freeze offset  
correction  
DIGITAL  
FILTER & DECIMATION  
OFFSET  
CORRECTION  
GAIN  
CORRECTION  
FINE GAIN  
DIGITAL PROCESSING BLOCK  
Figure 26 Digital Processing Block Diagram  
Several common digital processing functions have been integrated in the device – offset correction, fine gain, gain correction  
decimation & digital filters. By default after reset, the digital processing block is bypassed & all its functions are disabled.  
OFFSET CORRECTION  
ADS62P4X has an internal offset correction algorithm that estimates and corrects dc offset up to +/-10mV. The correction can  
be enabled using the serial register bit <OFFSET LOOP EN>. Once enabled, the algorithm estimates the channel offset and  
applies the correction every clock cycle. The time constant of the correction loop is a function of the sampling clock frequency.  
The time constant can be controlled using register bits <OFFSET LOOP TC> as described in Table 9.  
It is also possible to freeze the offset correction using the serial interface (<OFFSET LOOP FREEZE>). Once frozen, the offset  
estimation becomes inactive and the last estimated value is used for correction every clock cycle. Note that the offset  
correction is disabled by default after reset.  
Figure 27 shows the time response of the offset correction algorithm, after it is enabled.  
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Table 9 Time Constant of Offset Correction Algorithm  
<OFFSET LOOP TC>  
Time constant (TCCLK),  
Time constant, sec  
D6-D5-D4  
000  
number of clock cycles  
(=TCCLK x 1/Fs) (1)  
227  
226  
225  
224  
228  
229  
227  
227  
1.1  
0.55  
0.27  
0.13  
2.15  
4.3  
001  
010  
011  
100  
101  
110  
1.1  
111  
1.1  
(1) Sampling frequency, Fs = 125 MSPS  
TBD  
Figure 27 Time Response of Offset Correction  
GAIN CORRECTION  
ADS62P4X includes option to make fine corrections to the ADC channel gain. The corrections can be done in steps of 0.05 dB,  
up to a maximum of 0.5 dB, using the register bits <GAIN CORRECTION>. Only positive corrections are supported and the  
same correction applies to both the channels.  
Table 10 Gain Correction Values  
<GAIN CORRECTION>  
Amount of correction, dB  
D3-D2-D1-D0  
0000  
0001  
0
+0.05  
+0.1  
0010  
0011  
+0.15  
+0.20  
+0.25  
+0.30  
+0.35  
+0.40  
+0.45  
+0.5  
0100  
0101  
0110  
0111  
1000  
1001  
1010  
Other combinations  
Unused  
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DECIMATION FILTER  
ADS62P4X includes option to decimate the ADC output data with in-built low pass, high pass or band pass filters.  
The decimation rates & the type of filter can be selected using register bits <DECIMATION RATE> & <DECIMATION FILTER  
TYPE>. Decimation rates of 2, 4 or 8 are available and either low pass, high pass or band pass filters can be selected (Table  
11). By default, the decimation filter is disabled - use register bit <DECIMATION ENABLE> to enable it.  
(1)  
Table 11 Decimation Filter Modes  
Combination of decimation rates & filter types  
Decimation Type of filter  
Serial interface settings  
<DECIMATION  
FILTER FREQ  
BAND>  
<FILTER  
COEFF  
SELECT>  
<DECIMATION  
RATE>  
<DECIMATION  
ENABLE>  
In-built low pass filter  
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
1
1
1
0
0
0
0
1
1
0
1
0
1
0
1
0
0
0
0
0
0
1
1
1
1
1
1
(pass band = 0 to Fs/4)  
Decimate by 2  
In-built high pass filter  
(pass band = Fs/4 to Fs/2)  
In-built low pass filter  
(pass band = 0 to Fs/8)  
nd  
In-built 2 band pass filter  
Decimate by 4  
Decimate by 4  
(pass band = Fs/8 to Fs/4)  
In-built 3rd band pass filter  
(pass band = Fs/4 to 3Fs/8)  
In-built last band pass filter  
(pass band = 3Fs/8 to Fs/2)  
Decimate by 2  
Decimate by 4  
Decimate by 8  
No decimation  
Custom filter (user programmable coefficients)  
Custom filter (user programmable coefficients)  
Custom filter (user programmable coefficients)  
Custom filter (user programmable coefficients)  
0
0
1
0
0
0
0
1
0
1
0
1
X
X
X
X
X
X
X
X
1
1
1
1
1
1
1
0
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Decimation filter equation  
The decimation filter is implemented as 24-tap FIR with symmetrical coefficients (each coefficient is 12-bit signed).  
The filter equation is:  
æ
ö
1
11  
ç
ç
÷
÷
y(n) =  
· (h0 · x(n) + h1· x(n -1) + h2 · x(n - 2) + ¼ + h11· x(n -11) + h11· x(n -12) + ¼ + h1· x(n - 22) + h0 · x(n - 23))  
2
è
ø
By setting the register bit <ODD TAP ENABLE> = 1, a 23-tap FIR is implemented:  
æ
ö
1
11  
ç
ç
÷
÷
y(n) =  
· (h0· x(n) + h1· x(n -1) + h2· x(n - 2) +¼ + h10· x(n -10) + h11· x(n -11) + h10· x(n -12) + ¼ + h1· x(n - 21) + h0· x(n - 22)  
2
è
ø
In the above equations,  
h0, h1 …h11 are 12 bit signed representation of the coefficients,  
x(n) is the input data sequence to the filter &  
y(n) is the filter output sequence.  
Pre-defined coefficients  
The in-built filter types (low pass, high pass & band pass) use pre-defined coefficients. The frequency response of the in-built  
filters is shown in Figure 28 & Figure 29.  
TBD  
Figure 28 Decimate by 2 filter response  
TBD  
Figure 29 Decimate by 4 filter response  
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Table 12 Pre-defined coefficients for Decimate by 2 filters  
Decimate by 2  
Coefficients  
Low pass filter High pass filter  
h0  
h1  
23  
-37  
-6  
-22  
-65  
-52  
30  
h2  
h3  
68  
h4  
-36  
-61  
35  
66  
h5  
-35  
-107  
38  
h6  
h7  
118  
-100  
-197  
273  
943  
h8  
202  
-41  
-644  
1061  
h9  
h10  
h11  
Table 13 Pre-defined coefficients for Decimate by 4 filters  
Decimate by 4  
1st Band-pass 2nd Band-pass  
High pass  
filter  
32  
Coefficients  
Low pass filter  
filter  
-7  
filter  
-34  
-34  
-101  
43  
h0  
h1  
-17  
-50  
71  
19  
-15  
h2  
-47  
127  
73  
-95  
h3  
46  
22  
h4  
24  
58  
-8  
h5  
-42  
-100  
-97  
8
0
-28  
-5  
-81  
h6  
86  
106  
-62  
h7  
117  
-190  
-464  
-113  
526  
-179  
294  
86  
h8  
-97  
h9  
202  
414  
554  
310  
-501  
575  
h10  
h11  
-563  
352  
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Custom filter coefficients with decimation  
The filter coefficients can also be programmed by the user (custom). For custom coefficients, set the register bit  
<FILTER COEFF SELECT> & load the coefficients (h0 to h11) in registers 1E to 2F using the serial interface (Table 14) as:  
Register content = 12 bit signed representation of [real coefficient value x 211]  
Custom filter coefficients without decimation  
The filter with custom coefficients can also be used with the decimation mode disabled. In this mode, the filter implementation  
is 12-tap FIR:  
æ
ö
1
11  
ç
ç
÷
÷
y(n) =  
·
(h6 · x(n) + h7· x(n -1) + h8 · x(n - 2) + ¼ + h11· x(n - 5) + h11· x(n - 6) +¼ + h7· x(n -10) + h6 · x(n -11)  
)
2
è
ø
Table 14 Register Map for Custom FIR coefficients  
REGISTER  
ADDRESS  
A7 - A0  
in hex  
REGISTER FUNCTIONS  
D7  
D6  
D5  
D4  
D3  
D2  
D1  
D0  
1E  
Coefficient h0 <7:0>  
1F  
Coefficient h1 <3:0>  
Coefficient h3 <3:0>  
Coefficient h5 <3:0>  
Coefficient h7 <3:0>  
Coefficient h9 <3:0>  
Coefficient h11 <3:0>  
Coefficient h0 <11:8>  
Coefficient h2 <11:8>  
Coefficient h4 <11:8>  
Coefficient h6 <11:8>  
Coefficient h8 <11:8>  
Coefficient h10 <11:8>  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
2A  
2B  
2C  
2D  
2E  
2F  
Coefficient h1 <11:4>  
Coefficient h2 <7:0>  
Coefficient h3 <11:4>  
Coefficient h4 <7:0>  
Coefficient h5 <11:4>  
Coefficient h6 <7:0>  
Coefficient h7 <11:4>  
Coefficient h8 <7:0>  
Coefficient h9 <11:4>  
Coefficient h10 <7:0>  
Coefficient h11 <11:4>  
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PACKAGE INFORMATION  
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www.ti.com  
22-Jan-2008  
PACKAGING INFORMATION  
Orderable Device  
Status (1)  
Package Package  
Pins Package Eco Plan (2) Lead/Ball Finish MSL Peak Temp (3)  
Qty  
Type  
QFN  
QFN  
QFN  
QFN  
QFN  
QFN  
QFN  
QFN  
Drawing  
RGC  
RGC  
RGC  
RGC  
RGC  
RGC  
RGC  
RGC  
ADS62P42IRGCR  
ADS62P42IRGCT  
ADS62P43IRGCR  
ADS62P43IRGCT  
ADS62P44IRGCR  
ADS62P44IRGCT  
ADS62P45IRGCR  
ADS62P45IRGCT  
PREVIEW  
PREVIEW  
PREVIEW  
PREVIEW  
PREVIEW  
PREVIEW  
PREVIEW  
PREVIEW  
64  
64  
64  
64  
64  
64  
64  
64  
2500  
250  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Call TI  
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2500  
250  
2500  
250  
2500  
250  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in  
a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2)  
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check  
http://www.ti.com/productcontent for the latest availability information and additional product content details.  
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for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered  
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and  
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS  
compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame  
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)  
(3)  
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder  
temperature.  
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