ADS7828-Q1_16 [TI]

12-Bit 8-Channel Sampling Analog-to-Digital Converter;
ADS7828-Q1_16
型号: ADS7828-Q1_16
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

12-Bit 8-Channel Sampling Analog-to-Digital Converter

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ADS7828-Q1  
www.ti.com.......................................................................................................................................... SBAS456A DECEMBER 2008REVISED OCTOBER 2009  
12-BIT 8-CHANNEL SAMPLING ANALOG-TO-DIGITAL CONVERTER  
WITH I2CINTERFACE  
Check for Samples: ADS7828-Q1  
1
FEATURES  
APPLICATIONS  
Voltage-Supply Monitoring  
Isolated Data Acquisition  
Transducer Interfaces  
Battery-Operated Systems  
Remote Data Acquisition  
2
Qualified for Automotive Applications  
8-Channel Multiplexer  
50-kHz Sampling Rate  
No Missing Codes  
2.7-V to 5-V Operation  
Internal 2.5-V Reference  
I2C™ Interface Supports Standard, Fast, and  
High-Speed Modes  
TSSOP-16 Package  
DESCRIPTION  
The ADS7828 is a single-supply low-power 12-bit data acquisition device that features a serial I2C interface and  
an 8-channel multiplexer. The analog-to-digital (A/D) converter features a sample-and-hold amplifier and internal  
asynchronous clock. The combination of an I2C serial 2-wire interface and micropower consumption makes the  
ADS7828 ideal for applications requiring the A/D converter to be close to the input source in remote locations  
and for applications requiring isolation. The ADS7828 is available in a TSSOP-16 package.  
CH0  
SAR  
CH1  
CH2  
CH3  
8-Channel  
CH4  
Multiplexer  
S/H Amp  
Comparator  
CH5  
CH6  
CH7  
COM  
SDA  
SCL  
CDAC  
Serial  
Interface  
A0  
A1  
2.5-V VREF  
REFIN/REFOUT  
Buffer  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
2
I2C is a trademark of NXP Semiconductors.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2008–2009, Texas Instruments Incorporated  
ADS7828-Q1  
SBAS456A DECEMBER 2008REVISED OCTOBER 2009.......................................................................................................................................... www.ti.com  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more  
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.  
ORDERING INFORMATION(1)  
MAXIMUM  
INTEGRAL  
LINEARITY ERROR  
(LSB)  
ORDERABLE  
PART NUMBER  
(2)  
TA  
PACKAGE  
TOP-SIDE MARKING  
±2  
±1  
ADS7828EIPWRQ1  
ADS7828EBIPWRQ1  
7828EI  
–40°C to 85°C  
TSSOP – PW  
Reel of 2500  
PREVIEW  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.  
PW PACKAGE  
(TOP VIEW)  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
CH0  
CH1  
CH2  
CH3  
CH4  
CH5  
CH6  
CH7  
+VDD  
SDA  
SCL  
A1  
A0  
COM  
REFIN/REFOUT  
GND  
TERMINAL FUNCTIONS  
TERMINAL  
DESCRIPTION  
NAME  
CH0  
CH1  
CH2  
CH3  
CH4  
CH5  
CH6  
CH7  
GND  
NO.  
1
Analog input channel 0  
Analog input channel 1  
Analog input channel 2  
Analog input channel 3  
Analog input channel 4  
Analog input channel 5  
Analog input channel 6  
Analog input channel 7  
Analog ground  
2
3
4
5
6
7
8
9
REFIN/REFOUT  
10  
11  
12  
13  
14  
15  
16  
Internal 2.5-V reference / external reference input  
Common to analog input channel  
Slave address bit 0  
COM  
A0  
A1  
Slave address bit 1  
SCL  
SDA  
+VDD  
Serial clock  
Serial data  
Power supply, 3.3 V (nominal)  
2
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Copyright © 2008–2009, Texas Instruments Incorporated  
Product Folder Link(s): ADS7828-Q1  
ADS7828-Q1  
www.ti.com.......................................................................................................................................... SBAS456A DECEMBER 2008REVISED OCTOBER 2009  
ABSOLUTE MAXIMUM RATINGS(1) (2)  
over operating free-air temperature range (unless otherwise noted)  
VDD  
VIN  
θJA  
TA  
Supply voltage  
–0.3 V to 6 V  
–0.3 V to (+VDD + 0.3 V)  
108.4°C/W  
Digital input voltage  
Thermal impedance, junction to free air(3) (4)  
Operating free-air temperature  
Operating virtual-junction temperature  
Storage temperature  
–40°C to 85°C  
150°C  
TJ  
Tstg  
–65°C to 150°C  
215°C  
Vapor phase (60 seconds)  
Infrared (15 seconds)  
Tlead  
Lead temperature during soldering  
220°C  
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings  
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating  
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
(2) All voltages are with respect to the GND terminal.  
(3) The package thermal impedance is calculated in accordance with JESD 51-7.  
(4) Maximum power dissipation is a function of TJ(max), θJA, and TA. The maximum allowable power dissipation at any allowable ambient  
temperature is PD = (TJ(max) – TA)/θJA. Operating at the absolute maximum TJ of 150°C can impact reliability.  
ELECTROSTATIC DISCHARGE (ESD) RATINGS  
TEST CONDITIONS  
Human-Body Model (HBM)  
RATING  
2000 V  
200 V  
ESD  
Electrostatic discharge rating  
Machine Model (MM)  
Charged-Device Model (CDM)  
1000 V  
RECOMMENDED OPERATING CONDITIONS  
over operating free-air temperature range (unless otherwise noted)  
MIN  
2.7  
NOM  
MAX UNIT  
2.7-V nominal  
3.6  
V
+VDD  
Supply voltage  
5-V nominal  
4.75  
–0.2  
–0.2  
5
5.25  
Positive input  
Negative input  
+VDD + 0.2  
V
0.2  
VIN  
Analog input voltage  
Full-scale differential  
(Positive input – Negative input)  
0
VREF  
V
V
VIN(RE  
F)  
Voltage reference input voltage  
0.05  
+VDD  
VIH  
High-level digital input voltage  
Low-level digital input voltage  
Operating free-air temperature  
0.7 × +VDD  
–0.3  
+VDD + 0.5  
0.3 × +VDD  
85  
V
V
VIL  
TA  
–40  
°C  
Copyright © 2008–2009, Texas Instruments Incorporated  
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ADS7828-Q1  
SBAS456A DECEMBER 2008REVISED OCTOBER 2009.......................................................................................................................................... www.ti.com  
ELECTRICAL CHARACTERISTICS  
+VDD = 2.7 V, VREF = 2.5 V, SCL clock frequency = 3.4 MHz (high-speed mode), over operating free-air temperature range  
(unless otherwise noted)  
ADS7828E  
ADS7828EB  
PARAMETER  
TEST CONDITIONS  
UNIT  
MIN  
TYP  
MAX  
MIN  
TYP  
MAX  
Analog Input  
Ileak  
Ci  
Leakage current  
Input capacitance  
±1  
25  
±1  
25  
μA  
pF  
Overall Performance  
No missing codes  
Integral linearity error  
Differential linearity error  
Offset error  
12  
12  
bits  
±1 LSB(1)  
±1  
±1  
±2  
±0.5  
±0.5 –1/+2 LSB  
±1  
±3  
±1  
±4  
±1  
±0.75  
±0.2  
±0.75  
±0.2  
33  
±2 LSB  
±1 LSB  
±3 LSB  
±1 LSB  
μV  
Offset error match  
Gain error  
±0.2  
±1  
Gain error match  
±0.2  
33  
Vn  
Noise  
RMS  
PSRR Power-supply ripple rejection  
82  
82  
dB  
Sampling Dynamics  
High-speed mode: SCL = 3.4 MHz  
Fast mode: SCL = 400 kHz  
50  
8
50  
Throughput frequency  
8
2
kHz  
Standard mode: SCL = 100 kHz  
2
Conversion time  
6
6
μs  
AC Accuracy  
THD  
Total harmonic distortion(2)  
VIN = 2.5 VPP at 10 kHz  
VIN = 2.5 VPP at 10 kHz  
–82  
72  
–82  
72  
dB  
dB  
Signal-to- ratio  
Signal-to-(noise+distortion)  
ratio  
VIN = 2.5 VPP at 10 kHz  
71  
71  
dB  
Spurious-free dynamic range VIN = 2.5 VPP at 10 kHz  
Channel-to-channel isolation  
86  
86  
dB  
dB  
120  
120  
Voltage Reference Output  
VO  
Output voltage  
2.475  
2.5 2.525 2.475  
15  
2.5 2.525  
15  
V
ppm/°  
C
Internal reference drift  
Internal reference on  
Internal reference off  
110  
1
110  
1
zo  
IQ  
Output impedance  
Quiescent current  
GΩ  
μA  
850  
850  
Voltage Reference Input  
ri  
Input resistance  
Current drain  
1
1
GΩ  
μA  
20  
20  
Digital Input/Output  
VOL  
IIH  
Low-level output voltage  
Minimum 3-mA sink current  
VIH = +VDD + 0.5 V  
VIL = –0.3 V  
0.4  
10  
0.4  
10  
V
High-level input current  
Low-level input current  
μA  
μA  
IIL  
–10  
–10  
(1) LSB means least significant bit; with VREF equal to 2.5 V, one LSB is 610 μV.  
(2) THD is measured to the ninth harmonic.  
4
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Copyright © 2008–2009, Texas Instruments Incorporated  
Product Folder Link(s): ADS7828-Q1  
ADS7828-Q1  
www.ti.com.......................................................................................................................................... SBAS456A DECEMBER 2008REVISED OCTOBER 2009  
ELECTRICAL CHARACTERISTICS (continued)  
+VDD = 2.7 V, VREF = 2.5 V, SCL clock frequency = 3.4 MHz (high-speed mode), over operating free-air temperature range  
(unless otherwise noted)  
ADS7828E  
ADS7828EB  
PARAMETER  
Power Supply  
TEST CONDITIONS  
UNIT  
MIN  
TYP  
MAX  
MIN  
TYP  
MAX  
High-speed mode: SCL = 3.4 MHz  
Fast mode: SCL = 400 kHz  
225  
100  
60  
320  
225  
100  
60  
320  
IQ  
Quiescent current  
Power dissipation  
μA  
Standard mode: SCL = 100 kHz  
High-speed mode: SCL = 3.4 MHz  
Fast mode: SCL = 400 kHz  
675  
300  
180  
70  
1000  
3000  
675  
300  
180  
70  
1000  
3000  
PD  
μW  
Standard mode: SCL = 100 kHz  
High-speed mode: SCL = 3.4 MHz  
Fast mode: SCL = 400 kHz  
Power-down current with  
wrong address selected  
25  
25  
μA  
Standard mode: SCL = 100 kHz  
SCL pulled high, SDA pulled high  
6
6
IPD  
Full power-down current  
400  
400  
nA  
Copyright © 2008–2009, Texas Instruments Incorporated  
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5
Product Folder Link(s): ADS7828-Q1  
ADS7828-Q1  
SBAS456A DECEMBER 2008REVISED OCTOBER 2009.......................................................................................................................................... www.ti.com  
ELECTRICAL CHARACTERISTICS  
+VDD = 5 V, VREF = External 5 V, SCL clock frequency = 3.4 MHz (high-speed mode), over operating free-air temperature  
range (unless otherwise noted)  
ADS7828E  
ADS7828EB  
PARAMETER  
TEST CONDITIONS  
UNIT  
MIN  
TYP  
MAX  
MIN  
TYP  
MAX  
Analog Input  
Ileak  
Ci  
Leakage current  
Input capacitance  
±1  
25  
±1  
25  
μA  
pF  
Overall Performance  
No missing codes  
Integral linearity error  
Differential linearity error  
Offset error  
12  
12  
bits  
±1 LSB(1)  
±1  
±1  
±1  
±2  
±0.5  
±0.5 –1/+2 LSB  
±3  
±1.5  
±3  
±0.75  
±2 LSB  
±1 LSB  
±2 LSB  
±1 LSB  
μV  
Offset error match  
Gain error  
±1  
±0.75  
Gain error match  
±1  
Vn  
Noise  
RMS  
33  
82  
33  
82  
PSRR Power-supply ripple rejection  
dB  
Sampling Dynamics  
High-speed mode: SCL = 3.4 MHz  
Fast mode: SCL = 400 kHz  
50  
8
50  
Throughput frequency  
8
2
kHz  
Standard mode: SCL = 100 kHz  
2
Conversion time  
6
6
μs  
AC Accuracy  
THD  
Total harmonic distortion(2)  
VIN = 2.5 VPP at 10 kHz  
VIN = 2.5 VPP at 10 kHz  
–82  
72  
–82  
72  
dB  
dB  
Signal-to- ratio  
Signal-to-(noise+distortion)  
ratio  
VIN = 2.5 VPP at 10 kHz  
71  
71  
dB  
Spurious-free dynamic range VIN = 2.5 VPP at 10 kHz  
Channel-to-channel isolation  
86  
86  
dB  
dB  
120  
120  
Voltage Reference Output  
VO  
Output voltage  
2.475  
2.5 2.525 2.475  
15  
2.5 2.525  
15  
V
ppm/°  
C
Internal reference drift  
Internal reference on  
Internal reference off  
110  
1
110  
1
zo  
IQ  
Output impedance  
Quiescent current  
GΩ  
μA  
1300  
1300  
Voltage Reference Input  
ri  
Input resistance  
Current drain  
1
1
GΩ  
μA  
20  
20  
Digital Input/Output  
VOL  
IIH  
Low-level output voltage  
Minimum 3-mA sink current  
VIH = +VDD + 0.5 V  
VIL = –0.3 V  
0.4  
10  
0.4  
10  
V
High-level input current  
Low-level input current  
μA  
μA  
IIL  
–10  
–10  
(1) LSB means least significant bit; with VREF equal to 5 V, one LSB is 1.22 mV.  
(2) THD is measured to the ninth harmonic.  
6
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Copyright © 2008–2009, Texas Instruments Incorporated  
Product Folder Link(s): ADS7828-Q1  
ADS7828-Q1  
www.ti.com.......................................................................................................................................... SBAS456A DECEMBER 2008REVISED OCTOBER 2009  
ELECTRICAL CHARACTERISTICS (continued)  
+VDD = 5 V, VREF = External 5 V, SCL clock frequency = 3.4 MHz (high-speed mode), over operating free-air temperature  
range (unless otherwise noted)  
ADS7828E  
ADS7828EB  
PARAMETER  
Power Supply  
TEST CONDITIONS  
UNIT  
MIN  
TYP  
MAX  
MIN  
TYP  
MAX  
High-speed mode: SCL = 3.4 MHz  
Fast mode: SCL = 400 kHz  
750  
300  
150  
3.75  
1.5  
1000  
750  
300  
150  
3.75  
1.5  
1000  
IQ  
Quiescent current  
Power dissipation  
μA  
Standard mode: SCL = 100 kHz  
High-speed mode: SCL = 3.4 MHz  
Fast mode: SCL = 400 kHz  
5
5
PD  
μW  
Standard mode: SCL = 100 kHz  
High-speed mode: SCL = 3.4 MHz  
Fast mode: SCL = 400 kHz  
0.75  
400  
150  
35  
0.75  
400  
150  
35  
Power-down current with  
wrong address selected  
μA  
Standard mode: SCL = 100 kHz  
SCL pulled high, SDA pulled high  
IPD  
Full power-down current  
400  
3000  
400  
3000  
nA  
Copyright © 2008–2009, Texas Instruments Incorporated  
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Product Folder Link(s): ADS7828-Q1  
ADS7828-Q1  
SBAS456A DECEMBER 2008REVISED OCTOBER 2009.......................................................................................................................................... www.ti.com  
SWITCHING CHARACTERISTICS(1) (2)  
+VDD = 2.7 V, over operating free-air temperature range (unless otherwise noted) (see Figure 1)  
PARAMETER  
TEST CONDITIONS  
MIN  
MAX UNIT  
Standard mode  
100  
kHz  
400  
Fast mode  
fSCL  
SCL clock frequency  
Cb = 100 pF max  
Cb = 400 pF max  
3.4  
High-speed mode  
MHz  
1.7  
Standard mode  
Fast mode  
4.7  
1.3  
4
Bus free time between Stop and Start  
conditions  
tBUF  
μs  
μs  
ns  
Standard mode  
Fast mode  
tHD; STA  
Hold time (repeated) Start condition  
Low period of the SCL clock  
600  
160  
4.7  
1.3  
160  
320  
4
High-speed mode  
Standard mode  
Fast mode  
μs  
tlow  
Cb = 100 pF max  
Cb = 400 pF max  
High-speed mode(3)  
ns  
Standard mode  
Fast mode  
μs  
600  
60  
thigh  
High period of the SCL clock  
Cb = 100 pF max  
Cb = 400 pF max  
ns  
High-speed mode(3)  
120  
4.7  
600  
160  
250  
100  
10  
Standard mode  
Fast mode  
μs  
tSU; STA  
Setup time for a repeated Start condition  
Data setup time  
ns  
High-speed mode  
Standard mode  
Fast mode  
tSU; DAT  
ns  
High-speed mode  
Standard mode  
Fast mode  
0
3.45  
μs  
0
0.9  
tHD; DAT  
Data hold time  
Cb = 100 pF max  
Cb = 400 pF max  
0
82  
ns  
High-speed mode(3) (4)  
0
162  
Standard mode  
Fast mode  
1000  
20 + 0.1Cb  
300  
ns  
trCL  
Rise time of SCL signal  
Cb = 100 pF max  
Cb = 400 pF max  
10  
20  
40  
High-speed mode(3)  
80  
Standard mode  
Fast mode  
1000  
20 + 0.1Cb  
300  
ns  
Rise time of SCL signal after a repeated Start  
condition and after an acknowledge bit  
trCL1  
Cb = 100 pF max  
Cb = 400 pF max  
10  
20  
80  
High-speed mode(3)  
160  
300  
Standard mode  
Fast mode  
20 + 0.1Cb  
300  
ns  
tfCL  
Fall time of SCL signal  
Rise time of SDA signal  
Cb = 100 pF max  
Cb = 400 pF max  
10  
20  
40  
High-speed mode(3)  
80  
Standard mode  
Fast mode  
1000  
20 + 0.1Cb  
300  
ns  
trDA  
Cb = 100 pF max  
Cb = 400 pF max  
10  
20  
80  
High-speed mode(3)  
160  
(1) All values referred to VIH(MIN) and VIL(MAX) levels.  
(2) Not production tested, except for the parameter tHD; DAT, data hold time, high-speed mode, Cb = 100 pF max.  
(3) For bus line loads (CB) between 100 pF and 400 pF, the timing parameters must be linearly interpolated.  
(4) A device must internally provide a data hold time to bridge the undefined part between VIH and VIL of the falling edge of the SCLH  
signal. An input circuit with a threshold as low as possible for the falling edge of the SCLH signal minimizes this hold time.  
8
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Product Folder Link(s): ADS7828-Q1  
ADS7828-Q1  
www.ti.com.......................................................................................................................................... SBAS456A DECEMBER 2008REVISED OCTOBER 2009  
(1) (2)  
SWITCHING CHARACTERISTICS  
(continued)  
+VDD = 2.7 V, over operating free-air temperature range (unless otherwise noted) (see Figure 1 )  
PARAMETER  
TEST CONDITIONS  
Standard mode  
MIN  
MAX UNIT  
300  
Fast mode  
20 + 0.1Cb  
300  
ns  
tfDA  
Fall time of SDA signal  
Cb = 100 pF max  
Cb = 400 pF max  
10  
20  
80  
High-speed mode(3)  
160  
Standard mode  
Fast mode  
4
μs  
tSU; STO  
Setup time for Stop condition  
600  
160  
ns  
High-speed mode  
Cb  
Capacitive load for SDA or SCL  
Pulse width of spike suppressed  
400  
50  
pF  
ns  
Fast mode  
tSP  
High-speed mode  
10  
Noise margin at the high level for each  
connected device (including hysteresis)  
VnH  
VnL  
0.2 × VDD  
0.1 × VDD  
V
V
Noise margin at the low level for each  
connected device (including hysteresis)  
SDA  
tBUF  
tHD;STA  
tSP  
tr  
tf  
tLOW  
SCL  
tSU;DAT  
tHD;STA  
tSU;STO  
tHD;DAT  
tSU;DAT  
tHIGH  
Stop  
Start  
Repeated  
Start  
Figure 1. I2C Timing  
Copyright © 2008–2009, Texas Instruments Incorporated  
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Product Folder Link(s): ADS7828-Q1  
 
ADS7828-Q1  
SBAS456A DECEMBER 2008REVISED OCTOBER 2009.......................................................................................................................................... www.ti.com  
TYPICAL CHARACTERISTICS  
FREQUENCY SPECTRUM  
INTEGRAL LINEARITY ERROR vs CODE  
(2.5V Internal Reference)  
(4096 Point FFT: fIN = 1 kHz, 0 dB)  
2.00  
1.50  
0.00  
–40.00  
–80.00  
–120.0  
1.00  
0.50  
0.00  
–0.50  
–1.00  
–1.50  
–2.00  
0
10  
20  
25  
4095  
4095  
0
1024  
2048  
3072  
4095  
Output Code  
Frequency (kHz)  
DIFFERENTIAL LINEARITY ERROR vs CODE  
(2.5-V Internal Reference)  
INTEGRAL LINEARITY ERROR vs CODE  
(2.5-V External Reference)  
2.00  
1.50  
2.00  
1.50  
1.00  
1.00  
0.50  
0.50  
0.00  
0.00  
–0.50  
–1.00  
–1.50  
–2.00  
–0.50  
–1.00  
–1.50  
–2.00  
0
1024  
2048  
3072  
0
1024  
2048  
3072  
4095  
Output Code  
Output Code  
DIFFERENTIAL LINEARITY ERROR vs CODE  
(2.5-V External Reference)  
CHANGE IN OFFSET vs TEMPERATURE  
1.5  
1.0  
2.00  
1.50  
1.00  
0.5  
0.50  
0.0  
0.00  
–0.5  
–1.0  
–1.5  
–0.50  
–1.00  
–1.50  
–2.00  
–50  
–25  
0
25  
50  
75  
100  
0
1024  
2048  
3072  
Temperature (°C)  
Output Code  
10  
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TYPICAL CHARACTERISTICS (continued)  
CHANGE IN GAIN vs TEMPERATURE  
INTERNAL REFERENCE vs TEMPERATURE  
1.5  
1.0  
2.51875  
2.51250  
2.50625  
2.50000  
2.49375  
2.48750  
2.48125  
0.5  
0.0  
–0.5  
–1.0  
–1.5  
–50  
–25  
0
25  
50  
75  
100  
–50  
–25  
0
25  
50  
75  
100  
Temperature (°C)  
Temperature (°C)  
POWER-DOWN SUPPLY CURRENT  
vs TEMPERATURE  
SUPPLY CURRENT vs TEMPERATURE  
400  
350  
300  
250  
200  
150  
100  
750  
600  
450  
300  
150  
0
–150  
–50  
–25  
0
25  
50  
75  
100  
–50  
–25  
0
25  
50  
75  
100  
125  
Temperature (°C)  
Temperature (°C)  
SUPPLY CURRENT vs I2C BUS RATE  
INTERNAL V  
vs TURN-ON TIME  
REF  
100  
80  
60  
40  
20  
0
300  
250  
200  
150  
100  
50  
No Cap  
(42 µs)  
12-Bit Settling  
1-µF Cap  
(1240 µs)  
12-Bit Settling  
0
0
200  
400  
600  
800  
1000  
1200  
1400  
10  
100  
1k  
10k  
I2C Bus Rate (kHz)  
Turn-On Time (µs)  
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DEVICE INFORMATION  
The ADS7828 is a classic Successive Approximation Register (SAR) A/D converter. The architecture is based on  
capacitive redistribution which inherently includes a sample-and-hold function. The converter is fabricated on a  
0.6μ CMOS process.  
The ADS7828 core is controlled by an internally generated free-running clock. When the ADS7828 is not  
performing conversions or being addressed, it keeps the A/D converter core powered off, and the internal clock  
does not operate.  
The simplified diagram of input and output for the ADS7828 is shown in Figure 2.  
2.7 V to 3.6 V  
5 W  
+
1 µF to  
10 µF  
ADS7828  
2 kW  
2 kW  
REFIN  
/
VDD  
+
REFOUT  
0.1 µF  
1 µF to  
10 µF  
Microcontroller  
CH0  
SDA  
CH1  
CH2  
CH3  
CH4  
CH5  
CH6  
CH7  
COM  
SCL  
A0  
A1  
GND  
Figure 2. Simplified I/O Diagram  
Analog Input  
When the converter enters the hold mode, the voltage on the selected CHx pin is captured on the internal  
capacitor array. The input current on the analog inputs depends on the conversion rate of the device. During the  
sample period, the source must charge the internal sampling capacitor (typically 25 pF). After the capacitor has  
been fully charged, there is no further input current. The amount of charge transfer from the analog source to the  
converter is a function of conversion rate.  
Reference  
The ADS7828 can operate with an internal 2.5-V reference or an external reference. If a 5-V supply is used, an  
external 5-V reference is required in order to provide full dynamic range for a 0 V to +VDD analog input. This  
external reference can be as low as 50 mV. When using a 2.7-V supply, the internal 2.5-V reference will provide  
full dynamic range for a 0 V to +VDD analog input.  
As the reference voltage is reduced, the analog voltage weight of each digital output code is reduced. This is  
often referred to as the LSB (least significant bit) size and is equal to the reference voltage divided by 4096. This  
means that any offset or gain error inherent in the A/D converter will appear to increase, in terms of LSB size, as  
the reference voltage is reduced.  
The noise inherent in the converter will also appear to increase with lower LSB size. With a 2.5-V reference, the  
internal noise of the converter typically contributes only 0.32 LSB peak-to-peak of potential error to the output  
code. When the external reference is 50 mV, the potential error contribution from the internal noise is 50 times  
larger—16 LSBs. The errors due to the internal noise are Gaussian in nature and can be reduced by averaging  
consecutive conversion results.  
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Digital Interface  
The ADS7828 supports the I2C serial bus and data transmission protocol, in all three defined modes: standard,  
fast, and high-speed. A device that sends data onto the bus is defined as a transmitter, and a device receiving  
data as a receiver. The device that controls the message is called a master. The devices that are controlled by  
the master are slaves. The bus must be controlled by a master device that generates the serial clock (SCL),  
controls the bus access, and generates the Start and Stop conditions. The ADS7828 operates as a slave on the  
I2C bus. Connections to the bus are made via the open-drain I/O lines SDA and SCL.  
The following bus protocol has been defined (see Figure 3):  
Data transfer may be initiated only when the bus is not busy.  
During data transfer, the data line must remain stable whenever the clock line is high. Changes in the data  
line while the clock line is high will be interpreted as control signals.  
SDA  
MSB  
Slave Address  
R/W  
Direction  
Bit  
Acknowledgement  
Signal from  
Receiver  
Acknowledgement  
Signal from  
Receiver  
1
2
6
7
8
9
1
2
3-8  
8
9
SCL  
ACK  
ACK  
Start  
Condition  
Stop Condition  
or Repeated  
Start Condition  
Repeated If More Bytes Are Transferred  
Figure 3. Basic Operation  
Accordingly, the following bus conditions have been defined:  
Bus Not Busy  
Both data and clock lines remain high.  
Start Data Transfer  
A change in the state of the data line, from high to low, while the clock is high, defines a Start condition.  
Stop Data Transfer  
A change in the state of the data line, from low to high, while the clock line is high, defines the Stop condition.  
Data Valid  
The state of the data line represents valid data, when, after a Start condition, the data line is stable for the  
duration of the high period of the clock signal. There is one clock pulse per bit of data.  
Each data transfer is initiated with a Start condition and terminated with a Stop condition. The number of data  
bytes transferred between Start and Stop conditions is not limited and is determined by the master device.  
The information is transferred byte-wise and each receiver acknowledges with a ninth-bit.  
Within the I2C bus specifications a standard mode (100-kHz clock rate), a fast mode (400-kHz clock rate), and  
a highspeed mode (3.4-MHz clock rate) are defined. The ADS7828 works in all three modes.  
Acknowledge  
Each receiving device, when addressed, is obliged to generate an acknowledge after the reception of each  
byte. The master device must generate an extra clock pulse that is associated with this acknowledge bit.  
A device that acknowledges must pull down the SDA line during the acknowledge clock pulse in such a way  
that the SDA line is stable low during the high period of the acknowledge clock pulse. Of course, setup and  
hold times must be taken into account. A master must signal an end of data to the slave by not generating an  
acknowledge bit on the last byte that has been clocked out of the slave. In this case, the slave must leave the  
data line high to enable the master to generate the Stop condition.  
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Figure 3 shows how data transfer is accomplished on the I2C bus. Depending upon the state of the R/W bit, two  
types of data transfer are possible:  
Data transfer from a master transmitter to a slave receiver.  
The first byte transmitted by the master is the slave address. Next follows a number of data bytes. The slave  
returns an acknowledge bit after the slave address and each received byte.  
Data transfer from a slave transmitter to a master receiver.  
The first byte, the slave address, is transmitted by the master. The slave then returns an acknowledge bit.  
Next, a number of data bytes are transmitted by the slave to the master. The master returns an acknowledge  
bit after all received bytes other than the last byte. At the end of the last received byte, a not-acknowledge is  
returned.  
The master device generates all of the serial clock pulses and the Start and Stop conditions. A transfer is ended  
with a Stop condition or a repeated Start condition. Since a repeated Start condition is also the beginning of the  
next serial transfer, the bus will not be released.  
The ADS7828 may operate in the following two modes:  
Slave Receiver Mode  
Serial data and clock are received through SDA and SCL. After each byte is received, an acknowledge bit is  
transmitted. Start and Stop conditions are recognized as the beginning and end of a serial transfer. Address  
recognition is performed by hardware after reception of the slave address and direction bit.  
Slave Transmitter Mode  
The first byte (the slave address) is received and handled as in the slave receiver mode. However, in this  
mode the direction bit will indicate that the transfer direction is reversed. Serial data is transmitted on SDA by  
the ADS7828 while the serial clock is input on SCL. Start and Stop conditions are recognized as the  
beginning and end of a serial transfer.  
Address Byte  
The address byte is the first byte received following the Start condition from the master device (see Figure 4).  
The first five bits (MSBs) of the slave address are factory pre-set to 10010. The next two bits of the address byte  
are the device select bits, A1 and A0. Input pins (A1-A0) on the ADS7828 determine these two bits of the device  
address for a particular ADS7828. A maximum of four devices with the same pre-set code can therefore be  
connected on the same bus at one time.  
MSB  
1
6
0
5
0
4
1
3
0
2
1
LSB  
R/W  
A1  
A0  
Figure 4. Address Byte  
The A1/A0 address inputs can be connected to VDD or digital ground. The device address is set by the state of  
these pins upon power-up.  
The last bit of the address byte (R/W) defines the operation to be performed. When set to a 1, a read operation is  
selected; when set to a 0, a write operation is selected. Following the Start condition, the ADS7828 monitors the  
SDA bus, checking the device type identifier being transmitted. Upon receiving the 10010 code, the appropriate  
device select bits, and the R/W bit, the slave device outputs an acknowledge signal on the SDA line.  
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Command Byte  
The operating mode is determined by a command byte (see Figure 5).  
MSB  
SD  
6
5
4
3
2
1
LSB  
X
C2  
C1  
C0  
PD1  
PD0  
X
Figure 5. Command Byte  
SD: Single-ended or differential inputs  
0 = Differential inputs  
1 = Single-ended inputs  
C2 to C0: Channel selections (see Table 1)  
PD1, PD0: Power-down selection (see Table 2)  
X: Unused  
Table 1. Channel Selection Control Addressed by Command Byte  
COMMAND BYTE INPUTS  
CHANNEL SELECTIONS  
SD  
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
C2  
0
0
0
0
1
1
1
1
0
0
0
0
1
1
1
1
C1  
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
C0  
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
CH0  
+IN  
CH1  
–IN  
CH2  
CH3  
CH4  
CH5  
CH6  
CH7  
COM  
+IN  
–IN  
+IN  
–IN  
+IN  
–IN  
–IN  
+IN  
–IN  
+IN  
–IN  
+IN  
–IN  
+IN  
+IN  
–IN  
–IN  
–IN  
–IN  
–IN  
–IN  
–IN  
–IN  
+IN  
+IN  
+IN  
+IN  
+IN  
+IN  
+IN  
Table 2. Power-Down Selection  
PD1  
PD0  
DESCRIPTION  
Power down between A/D converter conversions  
Internal reference off and A/D converter on  
Internal reference on and A/D converter off  
Internal reference on and A/D converter on  
0
0
1
1
0
1
0
1
Initiating Conversion  
Provided the master has write-addressed it, the ADS7828 turns on the A/D converter section and begins  
conversions when it receives bit 4 of the command byte shown in Figure 5. If the command byte is correct, the  
ADS7828 returns an ACK condition.  
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Reading Data  
Data can be read from the ADS7828 by read addressing the part (LSB of address byte set to 1) and receiving  
the transmitted bytes. Converted data can be read from the ADS7828 only after a conversion has been initiated  
as described in the preceding section.  
Each 12-bit data word is returned in two bytes (see Figure 6), where D11 is the MSB of the data word, and D0 is  
the LSB. Byte 0 is sent first, followed by byte 1.  
MSB  
0
6
0
5
0
4
0
3
2
1
LSB  
D8  
Byte 0  
Byte 1  
D11  
D3  
D10  
D2  
D9  
D1  
D7  
D6  
D5  
D4  
D0  
Figure 6. Reading Data  
Reading in Fast or Standard (F/S) Mode  
Figure 7 shows the interaction between the master and the slave ADS7828 in fast or standard (F/S) mode. At the  
end of reading conversion data, the ADS7828 can be issued a repeated Start condition by the master to secure  
bus operation for subsequent conversions of the A/D converter. This would be the most efficient way to perform  
continuous conversions.  
ADC Power-Down Mode  
ADC Sampling Mode  
S
1
0
0
1
0
A1 A0  
W
A
SD C2 C1 C0 PD1 PD0  
Command Byte  
X
X
A
Write-Addressing Byte  
ADC Converting Mode  
ADC Power-Down Mode  
(depending on power-down selection bits)  
Sr  
1
0
0
1
0
A1 A0  
R
A
0
0
0
0
D11 D10 D9 D8  
A
D7 D6...D1 D0  
N
P
See Note (1)  
Read-Addressing Byte  
2 x (8 bits + ack/nack)  
A = Acknowledge (SDA low)  
N = Not acknowledge (SDA high)  
S = Start condition  
W = 0 (write)  
R = 1 (read)  
From Master to Slave  
From Slave to Master  
P = Stop condition  
Sr = Repeated Start condition  
NOTE: (1) To secure bus operation and loop back to the stage of write-addressing for next conversion, use Repeated Start.  
Figure 7. Typical Read Sequence in F/S Mode  
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Reading in High-Speed (HS) Mode  
High Speed (HS) mode is fast enough that codes can be read out one at a time. In HS mode, there is not  
enough time for a single conversion to complete between the reception of a repeated Start condition and the  
read-addressing byte, so the ADS7828 stretches the clock after the read-addressing byte has been fully  
received, holding it low until the conversion is complete.  
See Figure 8 for a typical read sequence for HS mode. Included in the read sequence is the shift from F/S to HS  
modes. It may be desirable to remain in HS mode after reading a conversion; to do this, issue a repeated Start  
instead of a Stop at the end of the read sequence, since a Stop causes the part to return to F/S mode.  
F/S Mode  
S
0
0
0
0
1
X
X
X
N
HS Mode Master Code  
HS Mode Enabled  
ADC Power-Down Mode  
ADC Sampling Mode  
Sr  
1
0
0
1
0
A1 A0  
A
SD C2 C1 C0 PD1 PD0  
Command Byte  
X
X
A
W
Write-Addressing Byte  
ADC Converting Mode  
HS Mode Enabled  
Sr  
1
0
0
1
0
A1 A0  
R
A
SCLH(2) is stretched low waiting for data conversion  
Read-Addressing Byte  
Return to F/S Mode(1)  
HS Mode Enabled  
ADC Power-Down Mode  
(depending on power-down selection bits)  
0
0
0
0
D11 D10 D9 D8  
A
D7 D6...D1  
D0  
N
P
2 x (8 Bits + ack/not-ack)  
A = Acknowledge (SDA low)  
W = 0 (write)  
R = 1 (read)  
From Master to Slave  
From Slave to Master  
N = Not acknowledge (SDA high)  
S = StartCondition  
P = Stop Condition  
Sr = Repeated Start condition  
NOTES: (1) To remain in HS mode, use Repeated Start instead of Stop.  
(2) SCLH is SCL in HS mode.  
Figure 8. Typical Read Sequence in HS Mode  
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Reading With Reference On/Off  
The internal reference defaults to off when the ADS7828 power is on. To turn the internal reference on or off, see  
Table 2. If the reference (internal or external) is constantly turned on and off, a proper amount of settling time  
must be added before a normal conversion cycle can be started. The exact amount of settling time needed  
varies depending on the configuration.  
See Figure 9 for an example of the proper internal reference turn-on sequence before issuing the typical read  
sequences required for the F/S mode when an internal reference is used.  
Internal Reference  
Turn-On  
Settling Time  
Internal ReferenceTurn-On Sequence  
Wait until the required  
settling time is reached  
S
1
0
0
1
0
A1 A0  
A
X
X
X
X
1
X
X
X
A
P
W
Write-Addressing Byte  
Command Byte  
Typical Read  
Sequence(1)  
in F/S Mode  
Settled Internal Reference  
ADC Power-Down Mode  
ADC Sampling Mode  
S
1
0
0
1
0
A1 A0  
A
SD C2 C1 C0  
1
PD0  
X
X
A
W
Write-Addressing Byte  
ADC Converting Mode  
Command Byte  
Settled Internal Reference  
ADC Power-Down Mode  
(depending on power-down selection bits)  
Sr  
1
0
0
1
0
A1 A0  
R
A
0
0
0
0
D11 D10 D9 D8  
A
D7 D6...D1 D0  
N
P
See  
Note (2)  
Read-Addressing Byte  
2 x (8 bits + ack/nack)  
A = Acknowledge (SDA low)  
W = 0 (write)  
R = 1 (read)  
From Master to Slave  
From Slave to Master  
N = Not acknowledge (SDA high)  
S = Start condition  
P = Stop condition  
Sr = Repeated Start condition  
NOTES: (1) Typical read sequences can be reused after the internal reference is settled.  
(2) To secure bus operation and loop back to the stage of write-addressing for next conversion, use Repeated Start.  
Figure 9. Internal Reference Turn-On Sequence and Typical Read Sequence (F/S Mode Shown)  
When using an internal reference, there are three things that must be done:  
1. To use the internal reference, the PD1 bit of Command Byte must always be set to logic 1 for each sample  
conversion that is issued by the sequence, as shown in Figure 7.  
2. To achieve 12-bit accuracy conversion when using the internal reference, the internal reference settling time  
must be considered, as shown in the Internal VREF vs Turn-On Time Typical Characteristic plot. If the PD1  
bit has been set to logic 0 while using the ADS7828, then the settling time must be reconsidered after PD1 is  
set to logic 1. In other words, whenever the internal reference is turned on after it has been turned off, the  
settling time must be long enough to get 12-bit accuracy conversion.  
3. When the internal reference is off, it is not turned on until both the first Command Byte with PD1 = 1 is sent  
and then a Stop condition or repeated Start condition is issued. (The actual turn-on time occurs once the  
Stop or repeated Start condition is issued.) Any Command Byte with PD1 = 1 issued after the internal  
reference is turned on serves only to keep the internal reference on. Otherwise, the internal reference would  
be turned off by any Command Byte with PD1 = 0.  
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The example in Figure 9 can be generalized for an HS mode conversion cycle by changing the timing of the  
conversion cycle. If using an external reference, PD1 must be set to 0, and the external reference must be  
settled. The typical sequence in Figure 7 or Figure 8 can then be used.  
PCB Layout  
For optimum performance, care should be taken with the physical layout of the ADS7828 circuitry. The basic  
SAR architecture is sensitive to glitches or sudden changes on the power supply, reference, ground connections,  
and digital inputs that occur just prior to latching the output of the analog comparator. Therefore, during any  
single conversion for an "n-bit" SAR converter, there are n "windows" in which large external transient voltages  
can easily affect the conversion result. Such glitches might originate from switching power supplies, nearby  
digital logic, and high-power devices.  
With this in mind, power to the ADS7828 should be clean and well-bypassed. A 0.1-μF ceramic bypass capacitor  
should be placed as close to the device as possible. A 1-μF to 10-μF capacitor may also be needed if the  
impedance of the connection between +VDD and the power supply is high.  
The ADS7828 architecture offers no inherent rejection of noise or voltage variation in regards to using an  
external reference input. This is of particular concern when the reference input is tied to the power supply. Any  
noise and ripple from the supply will appear directly in the digital results. While high-frequency noise can be  
filtered out, voltage variation due to line frequency (50 Hz or 60 Hz) can be difficult to remove.  
The GND pin should be connected to a clean ground point. In many cases, this will be the "analog" ground.  
Avoid connections that are too near the grounding point of a microcontroller or digital signal processor. The ideal  
layout will include an analog ground plane dedicated to the converter and associated analog circuitry.  
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