ADS8371IPFBTG4 [TI]

ANALOG-TO-DIGITAL CONVERTER WITH PARALLEL INTERFACE;
ADS8371IPFBTG4
型号: ADS8371IPFBTG4
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

ANALOG-TO-DIGITAL CONVERTER WITH PARALLEL INTERFACE

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ADS8406  
SLAS426AAUGUST 2004REVISED DECEMBER 2004  
16-BIT, 1.25 MSPS, PSEUDO-BIPOLAR, FULLY DIFFERENTIAL INPUT, MICRO POWER  
SAMPLING ANALOG-TO-DIGITAL CONVERTER WITH PARALLEL INTERFACE  
FEATURES  
APPLICATIONS  
DWDM  
Instrumentation  
High-Speed, High-Resolution, Zero Latency  
Data Acquisition Systems  
Pseudo-Bipolar, Fully Differential Input, -VREF  
to VREF  
16-Bit NMC at 1.25 MSPS  
±2 LSB INL Max, -1/+1.25 LSB DNL  
90 dB SNR, -95 dB THD at 100 kHz Input  
Zero Latency  
Transducer Interface  
Medical Instruments  
Communications  
Internal 4.096 V Reference  
High-Speed Parallel Interface  
Single 5 V Analog Supply  
Wide I/O Supply: 2.7 V to 5.25 V  
Low Power: 155 mW at 1.25 MHz Typ  
Pin Compatible With ADS8412/8402  
48-Pin TQFP Package  
DESCRIPTION  
The ADS8406 is a 16-bit, 1.25 MHz A/D converter  
with an internal 4.096-V reference. The device in-  
cludes a 16-bit capacitor-based SAR A/D converter  
with inherent sample and hold. The ADS8406 offers a  
full 16-bit interface and an 8-bit option where data is  
read using two 8-bit read cycles.  
The ADS8406 has a pseudo-bipolar, fully differential  
input. It is available in a 48-lead TQFP package and  
is characterized over the industrial -40°C to 85°C  
temperature range.  
High Speed SAR Converter Family  
Type/Speed  
500 kHz  
ADS8383  
580 kHz  
ADS8381  
750 MHZ  
1.25 MHz  
2 MHz  
3 MHz  
4 MHz  
18 Bit Pseudo-Diff  
ADS8371  
ADS8401  
ADS8411  
16 Bit Pseudo-Diff  
ADS8405  
ADS8402  
ADS8406  
ADS7890 (S)  
ADS8412  
16 Bit Pseudo Bipolar,  
Fully Differential  
14 Bit Pseudo-Diff  
12 Bit Pseudo-Diff  
ADS7891  
ADS7881  
BYTE  
16-/8-Bit  
Parallel DATA  
Output Bus  
Output  
Latches  
and  
3-State  
Drivers  
SAR  
+
_
+IN  
−IN  
CDAC  
Comparator  
RESET  
CONVST  
BUSY  
CS  
REFIN  
Conversion  
and  
Control Logic  
4.096-V  
Internal  
Reference  
REFOUT  
Clock  
RD  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2004, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
ADS8406  
www.ti.com  
SLAS426AAUGUST 2004REVISED DECEMBER 2004  
ORDERING INFORMATION(1)  
MAXIMUM  
INTEGRAL  
LINEARITY  
(LSB)  
MAXIMUM  
DIFFERENTIAL  
LINEARITY  
(LSB)  
NO MISSING  
PACKAGE  
DESIG-  
NATOR  
TEMPERA-  
TURE  
RANGE  
TRANSPORT  
MEDIA  
QUANTITY  
CODES  
RESOLUTION  
(BIT)  
PACKAGE  
TYPE  
ORDERING  
INFORMATION  
MODEL  
Tape and reel  
250  
ADS8406IPFBT  
ADS8406IPFBR  
ADS8406IBPFBT  
ADS8406IBPFBR  
48 Pin  
TQFP  
ADS8406I  
–4 to +4  
–2 to +2  
–2 to +2  
15  
16  
PFB  
PFB  
–40°C to 85°C  
–40°C to 85°C  
Tape and reel  
1000  
Tape and reel  
250  
48 Pin  
TQFP  
ADS8406IB  
–1 to +1.25  
Tape and reel  
1000  
(1) For the most current specifications and package information, refer to our website at www.ti.com.  
ABSOLUTE MAXIMUM RATINGS  
over operating free-air temperature range unless otherwise noted(1)  
UNIT  
+IN to AGND  
Voltage  
–0.4 V to +VA + 0.1 V  
–0.4 V to +VA + 0.1 V  
–0.3 V to 7 V  
–IN to AGND  
+VA to AGND  
Voltage range  
+VBD to BDGND  
+VA to +VBD  
–0.3 V to 7 V  
–0.3 V to 2.55 V  
–0.3 V to +VBD + 0.3 V  
–0.3 V to +VBD + 0.3 V  
–40°C to 85°C  
–65°C to 150°C  
150°C  
Digital input voltage to BDGND  
Digital output voltage to BDGND  
Operating free-air temperature range  
Storage temperature range  
TA  
Tstg  
Junction temperature (TJ max)  
Power dissipation  
TQFP package  
(TJMax - TA)/θJA  
86°C/W  
θJA thermal impedance  
Vapor phase (60 sec)  
Infrared (15 sec)  
215°C  
Lead temperature, soldering  
220°C  
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings  
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating  
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
2
ADS8406  
www.ti.com  
SLAS426AAUGUST 2004REVISED DECEMBER 2004  
SPECIFICATIONS  
TA = –40°C to 85°C, +VA = 5 V, +VBD = 3 V or 5 V, Vref = 4.096 V, fSAMPLE = 1.25 MHz (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
ANALOG INPUT  
(1)  
Full-scale input voltage  
+IN – (–IN)  
–Vref  
–0.2  
–0.2  
Vref  
Vref + 0.2  
Vref + 0.2  
V
V
+IN  
–IN  
Absolute input voltage  
Input capacitance  
Input leakage current  
SYSTEM PERFORMANCE  
Resolution  
25  
pF  
nA  
0.5  
16  
Bits  
Bits  
ADS8406I  
ADS8406IB  
ADS8406I  
ADS8406IB  
ADS8406I  
ADS8406IB  
ADS8406I  
ADS8406IB  
ADS8406I  
ADS8406IB  
15  
16  
No missing codes  
–4  
±2  
±1  
4
2
(2)(3)  
INL  
DNL  
EO  
Integral linearity  
Differential linearity  
Offset error(4)  
LSB  
LSB  
–2  
–2  
±1  
2
–1  
±0.5  
±1  
1.25  
2.5  
–2.5  
–1.5  
–0.12  
–0.098  
mV  
mV  
±0.5  
1.5  
0.12  
0.098  
EG  
Gain error(4)(5)  
%FS  
dB  
At dc (0.2 V around Vref/2)  
+IN – (–IN) = 1 Vpp at 1 MHz  
At 7FFFh output code, +VA  
80  
80  
CMRR Common mode rejection ratio  
PSRR  
DC Power supply rejection ratio  
= 4.75 V to 5.25 V, Vref  
4.096 V  
=
2
LSB  
(4)  
SAMPLING DYNAMICS  
Conversion time  
500  
150  
650  
ns  
ns  
Acquisition time  
Throughput rate  
1.25  
MHz  
ns  
Aperture delay  
2
25  
Aperture jitter  
ps  
Step response  
100  
100  
ns  
Overvoltage recovery  
DYNAMIC CHARACTERISTICS  
ns  
VIN = 8 Vpp at 100 kHz  
VIN = 8 Vpp at 500 kHz  
VIN = 8 Vpp at 100 kHz  
VIN = 8 Vpp at 100 kHz  
VIN = 8 Vpp at 100 kHz  
VIN = 8 Vpp at 500 kHz  
–95  
–90  
90  
88  
95  
93  
5
(6)  
THD  
SNR  
Total harmonic distortion  
Signal-to-noise ratio  
dB  
dB  
dB  
SINAD Signal-to-noise + distortion  
SFDR  
Spurious free dynamic range  
-3dB Small signal bandwidth  
dB  
MHz  
EXTERNAL VOLTAGE REFERENCE INPUT  
Reference voltage at REFIN, Vref  
2.5  
4.096  
500  
4.2  
V
(7)  
Reference resistance  
kΩ  
(1) Ideal input span, does not include gain or offset error.  
(2) LSB means least significant bit  
(3) This is endpoint INL, not best fit.  
(4) Measured relative to an ideal full-scale input [+IN – (–IN)] of 8.192 V  
(5) This specification does not include the internal reference voltage error and drift.  
(6) Calculated on the first nine harmonics of the input frequency  
(7) Can vary ±20%  
3
ADS8406  
www.ti.com  
SLAS426AAUGUST 2004REVISED DECEMBER 2004  
SPECIFICATIONS (continued)  
TA = –40°C to 85°C, +VA = 5 V, +VBD = 3 V or 5 V, Vref = 4.096 V, fSAMPLE = 1.25 MHz (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
INTERNAL REFERENCE OUTPUT  
From 95% (+VA) with 1-µF  
storage capacitor  
Internal reference start-up time  
120  
ms  
Vref  
Reference voltage  
Source current  
Line regulation  
Drift  
IOUT = 0  
4.065  
4.096  
4.13  
10  
V
µA  
Static load  
+VA = 4.75 to 5.25 V  
IOUT = 0  
0.6  
36  
mV  
PPM/°C  
DIGITAL INPUT/OUTPUT  
Logic family — CMOS  
VIH  
VIL  
High level input voltage  
Low level input voltage  
IIH = 5 µA  
+VBD – 1  
–0.3  
+VBD + 0.3  
0.8  
IIL = 5 µA  
V
VOH  
VOL  
High level output voltage  
Low level output voltage  
Data format — 2's complement  
IOH = 2 TTL loads  
IOL = 2 TTL loads  
+VBD – 0.6  
0
+VBD  
0.4  
POWER SUPPLY REQUIREMENTS  
+VBD  
+VA  
2.7  
3
5
5.25  
5.25  
34  
V
V
Power supply voltage  
4.75  
Supply current, +VA(8)  
Power dissipation(8)  
fs = 1.25 MHz  
fs = 1.25 MHz  
31  
mA  
mW  
PD  
TEMPERATURE RANGE  
TA Operating free-air temperature  
155  
170  
–40  
85  
°C  
(8) This includes only +VA current. +VBD current is typically 1 mA with 5-pF load capacitance on output pins.  
4
ADS8406  
www.ti.com  
SLAS426AAUGUST 2004REVISED DECEMBER 2004  
TIMING CHARACTERISTICS  
All specifications typical at –40°C to 85°C, +VA = +VBD = 5 V  
(1)(2)(3)  
PARAMETER  
MIN  
500  
150  
TYP  
MAX  
UNIT  
ns  
tCONV Conversion time  
650  
tACQ  
tpd1  
tpd2  
tw1  
Acquisition time  
ns  
CONVST low to BUSY high  
40  
5
ns  
Propagation delay time, end of conversion to BUSY low  
Pulse duration, CONVST low  
Setup time, CS low to CONVST low  
Pulse duration, CONVST high  
CONVST falling edge jitter  
ns  
20  
0
ns  
tsu1  
tw2  
ns  
20  
ns  
10  
ps  
tw3  
tw4  
Pulse duration, BUSY signal low  
Pulse duration, BUSY signal high  
Min(tACQ  
)
ns  
610  
ns  
Hold time, First data bus data transition (RD low, or CS low for  
read cycle, or BYTE input changes) after CONVST low  
th1  
td1  
40  
0
ns  
ns  
Delay time, CS low to RD low (or BUSY low to RD low when CS =  
0)  
tsu2  
tw5  
ten  
td2  
td3  
tw6  
tw7  
Setup time, RD high to CS high  
0
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Pulse duration, RD low time  
50  
Enable time, RD low (or CS low for read cycle) to data valid  
Delay time, data hold from RD high  
Delay time, BYTE rising edge or falling edge to data valid  
Pulse duration, RD high  
20  
20  
0
2
20  
20  
Pulse duration, CS high time  
Hold time, last RD (or CS for read cycle ) rising edge to CONVST  
falling edge  
th2  
50  
ns  
tsu3  
th3  
Setup time, BYTE transition to RD falling edge  
Hold time, BYTE transition to RD falling edge  
0
0
ns  
ns  
Disable time, RD high (CS high for read cycle) to 3-stated data  
bus  
tdis  
td5  
20  
10  
ns  
ns  
ns  
Delay time, end of conversion to MSB data valid  
Byte transition setup time, from BYTE transition to next BYTE  
transition  
tsu4  
50  
td6  
td7  
Delay time, CS rising edge to BUSY falling edge  
Delay time, BUSY falling edge to CS rising edge  
50  
50  
ns  
ns  
Setup time, from the falling edge of CONVST (used to start the  
valid conversion) to the next falling edge of CONVST (when CS =  
0 and CONVST used to abort) or to the next falling edge of CS  
(when CS is used to abort)  
tsu(AB)  
60  
500  
ns  
Setup time, falling edge of CONVST to read valid data (MSB) from  
current conversion  
tsu5  
th4  
MAX(tCONV) + MAX(td5  
)
ns  
ns  
Hold time, data (MSB) from previous conversion hold valid from  
falling edge of CONVST  
MIN(tCONV  
)
(1) All input signals are specified with tr = tf = 5 ns (10% to 90% of +VBD) and timed from a voltage level of (VIL + VIH)/2.  
(2) See timing diagrams.  
(3) All timings are measured with 20-pF equivalent loads on all data bits and BUSY pins.  
5
ADS8406  
www.ti.com  
SLAS426AAUGUST 2004REVISED DECEMBER 2004  
TIMING CHARACTERISTICS  
All specifications typical at –40°C to 85°C, +VA = 5 V, +VBD = 3 V(1)(2)(3)  
PARAMETER  
MIN  
500  
150  
TYP  
MAX  
650  
UNIT  
ns  
tCONV Conversion time  
tACQ  
tpd1  
tpd2  
tw1  
Acquisition time  
ns  
ns  
ns  
ns  
ns  
ns  
ps  
ns  
ns  
CONVST low to BUSY high  
50  
10  
Propagation delay time, end of conversion to BUSY low  
Pulse duration, CONVST low  
Setup time, CS low to CONVST low  
Pulse duration, CONVST high  
CONVST falling edge jitter  
20  
0
tsu1  
tw2  
20  
10  
tw3  
tw4  
Pulse duration, BUSY signal low  
Pulse duration, BUSY signal high  
Min(tACQ)  
610  
Hold time, first data bus transition (RD low, or CS low for read  
cycle, or BYTE or BUS 16/16 input changes) after CONVST low  
th1  
td1  
40  
0
ns  
ns  
Delay time, CS low to RD low (or BUSY low to RD low when CS =  
0)  
tsu2  
tw5  
ten  
td2  
td3  
tw6  
tw7  
Setup time, RD high to CS high  
0
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Pulse duration, RD low  
50  
Enable time, RD low (or CS low for read cycle) to data valid  
Delay time, data hold from RD high  
Delay time, BYTE rising edge or falling edge to data valid  
Pulse duration, RD high time  
30  
30  
0
2
20  
20  
Pulse duration, CS high time  
Hold time, last RD (or CS for read cycle ) rising edge to CONVST  
falling edge  
th2  
50  
ns  
tsu3  
th3  
tdis  
td5  
Setup time, BYTE transition to RD falling edge  
0
0
ns  
ns  
ns  
ns  
Hold time, BYTE transition to RD falling edge  
Disable time, RD high (CS high for read cycle) to 3-stated data bus  
Delay time, end of conversion to MSB data valid  
30  
20  
Byte transition setup time, from BYTE transition to next BYTE  
transition  
tsu4  
50  
ns  
td6  
td7  
Delay time, CS rising edge to BUSY falling edge  
Delay time, BUSY falling edge to CS rising edge  
50  
50  
ns  
ns  
Setup time, from the falling edge of CONVST (used to start the  
valid conversion) to the next falling edge of CONVST (when CS = 0  
and CONVST used to abort) or to the next falling edge of CS  
(when CS is used to abort)  
tsu(AB)  
70  
500  
ns  
Setup time, falling edge of CONVST to read valid data (MSB) from  
current conversion  
tsu5  
th4  
MAX(tCONV) + MAX(td5  
)
ns  
ns  
Hold time, data (MSB) from previous conversion hold valid from  
falling edge of CONVST  
MIN(tCONV  
)
(1) All input signals are specified with tr = tf = 5 ns (10% to 90% of +VBD) and timed from a voltage level of (VIL + VIH)/2.  
(2) See timing diagrams.  
(3) All timings are measured with 20-pF equivalent loads on all data bits and BUSY pins.  
6
ADS8406  
www.ti.com  
SLAS426AAUGUST 2004REVISED DECEMBER 2004  
PIN ASSIGNMENTS  
PFB PACKAGE  
(TOP VIEW)  
36 35 34 33 32 31 30 29 28 27 26 25  
24  
+VBD  
RESET  
BYTE  
CONVST  
RD  
+VBD  
DB8  
DB9  
37  
38  
39  
40  
41  
42  
43  
44  
45  
46  
47  
48  
23  
22  
21  
20  
19  
18  
17  
16  
15  
14  
13  
DB10  
DB11  
DB12  
DB13  
DB14  
DB15  
AGND  
AGND  
+VA  
CS  
+VA  
AGND  
AGND  
+VA  
REFM  
REFM  
1
2
3
4
5
6
7
8
9 10 11 12  
NC - No connection  
7
ADS8406  
www.ti.com  
SLAS426AAUGUST 2004REVISED DECEMBER 2004  
Terminal Functions  
NAME  
NO.  
I/O  
DESCRIPTION  
AGND  
5, 8, 11, 12, 14,  
15, 44, 45  
Analog ground  
BDGND  
BUSY  
BYTE  
25, 35  
36  
O
I
Digital ground for bus interface digital supply  
Status output. High when a conversion is in progress.  
39  
Byte select input. Used for 8-bit bus reading. 0: No fold back 1: Low byte D[7:0] of the 16 most  
significant bits is folded back to high byte of the 16 most significant pins DB[15:8].  
CONVST  
40  
42  
I
I
Convert start. The falling edge of this input ends the acquisition period and starts the hold  
period.  
CS  
Chip select. The falling edge of this input starts the acquisition period.  
8-Bit Bus  
16-Bit Bus  
BYTE = 0  
D15 (MSB)  
D14  
Data Bus  
BYTE = 0  
BYTE = 1  
D7  
DB15  
DB14  
DB13  
DB12  
DB11  
DB10  
DB9  
16  
17  
18  
19  
20  
21  
22  
23  
26  
27  
28  
29  
30  
31  
32  
33  
7
O
O
O
O
O
O
O
O
O
O
O
O
O
O
O
O
I
D15 (MSB)  
D14  
D6  
D13  
D5  
D13  
D12  
D4  
D12  
D11  
D3  
D11  
D10  
D2  
D10  
D9  
D1  
D9  
DB8  
D8  
D0 (LSB)  
All ones  
All ones  
All ones  
All ones  
All ones  
All ones  
All ones  
All ones  
D8  
DB7  
D7  
D7  
DB6  
D6  
D6  
DB5  
D5  
D5  
DB4  
D4  
D4  
DB3  
D3  
D3  
DB2  
D2  
D1  
D2  
DB1  
D1  
DB0  
D0 (LSB)  
D0 (LSB)  
–IN  
Inverting input channel  
+IN  
6
I
Non inverting input channel  
No connection  
NC  
3
REFIN  
REFM  
REFOUT  
1
I
Reference input  
47, 48  
2
I
Reference ground  
O
Reference output. Add 1-µF capacitor between the REFOUT pin and REFM pin when internal  
reference is used.  
RESET  
RD  
38  
41  
I
I
Current conversion is aborted and output latches are cleared (set to zeros) when this pin is  
asserted low. RESET works independantly of CS.  
Synchronization pulse for the parallel output. When CS is low, this serves as the output enable  
and puts the previous conversion result on the bus.  
+VA  
4, 9, 10, 13, 43,  
46  
Analog power supplies, 5-V dc  
+VBD  
24, 34, 37  
Digital power supply for bus  
8
ADS8406  
www.ti.com  
SLAS426AAUGUST 2004REVISED DECEMBER 2004  
TIMING DIAGRAMS  
t
w2  
t
w1  
CONVST  
(used in normal  
conversion)  
t
cycle  
CONVST  
(used in ABORT)  
t
t
su(AB)  
su(AB)  
t
t
pd1  
pd2  
t
pd1  
t
w4  
t
w3  
BUSY  
t
t
w7  
su1  
t
d7  
CS  
t
d6  
CONVERT  
t
CONV  
t
CONV  
SAMPLING  
(When CS Toggle)  
t
ACQ  
BYTE  
t
su4  
t
h1  
t
su2  
t
d1  
t
h2  
RD  
Invalid  
Invalid  
Data to  
be read  
Previous Conversion  
Current Conversion  
t
h4  
t
t
en  
t
dis  
su5  
Hi−Z  
Hi−Z  
Hi−Z  
Hi−Z  
DB[15:8]  
DB[7:0]  
D [7:0]  
D [15:8]  
D [7:0]  
Signal internal to device  
Figure 1. Timing for Conversion and Acquisition Cycles With CS and RD Toggling  
9
ADS8406  
www.ti.com  
SLAS426AAUGUST 2004REVISED DECEMBER 2004  
TIMING DIAGRAMS (continued)  
t
w1  
t
w2  
CONVST  
(used in normal  
conversion)  
t
cycle  
CONVST  
(used in ABORT)  
t
t
su(AB)  
su(AB)  
t
t
pd2  
pd1  
t
w4  
t
w3  
BUSY  
t
w7  
t
su1  
t
d7  
CS  
t
d6  
CONVERT  
t
CONV  
t
CONV  
SAMPLING  
(When CS Toggle)  
t
ACQ  
BYTE  
t
t
h1  
su4  
t
en  
t
h2  
RD = 0  
t
dis  
t
dis  
t
en  
Invalid  
Invalid  
Data to  
be read  
Previous Conversion  
Current Conversion  
t
h4  
t
su5  
Repeated  
D [15:8]  
Previous  
D [15:8]  
Hi−Z  
Hi−Z  
Hi−Z  
Hi−Z  
Hi−Z  
Hi−Z  
DB[15:8]  
DB[7:0]  
D [15:8]  
D [7:0]  
D [7:0]  
Repeated  
D [7:0]  
Previous  
D [7:0]  
t
en  
Signal internal to device  
Figure 2. Timing for Conversion and Acquisition Cycles With CS Toggling, RD Tied to BDGND  
10  
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SLAS426AAUGUST 2004REVISED DECEMBER 2004  
TIMING DIAGRAMS (continued)  
t
w1  
t
w2  
CONVST  
(used in normal  
t
cycle  
conversion)  
CONVST  
(used in ABORT)  
t
t
su(AB)  
su(AB)  
t
t
pd2  
t
pd1  
pd1  
t
w4  
t
w3  
BUSY  
CS = 0  
CONVERT  
t
CONV  
t
CONV  
t
(ACQ)  
SAMPLING  
(When CS = 0)  
BYTE  
t
su4  
t
h1  
t
h2  
RD  
t
dis  
t
en  
Invalid  
Invalid  
Data to  
be read  
Previous Conversion  
Current Conversion  
t
h4  
t
su5  
Hi−Z  
Hi−Z  
Hi−Z  
Hi−Z  
DB[15:8]  
D [15:8]  
D [7:0]  
D [7:0]  
DB[7:0]  
Signal internal to device  
Figure 3. Timing for Conversion and Acquisition Cycles With CS Tied to BDGND, RD Toggling  
11  
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SLAS426AAUGUST 2004REVISED DECEMBER 2004  
TIMING DIAGRAMS (continued)  
t
w1  
t
w2  
CONVST  
(used in normal  
conversion)  
t
cycle  
CONVST  
(used in ABORT)  
t
t
su(AB)  
su(AB)  
t
t
pd2  
pd1  
t
w4  
t
pd1  
t
pd2  
t
w3  
BUSY  
CS = 0  
CONVERT  
t
CONV  
t
CONV  
t
ACQ  
SAMPLING  
(When CS Toggle)  
t
h1  
t
h1  
BYTE  
RD = 0  
t
d3  
t
d3  
t
d5  
t
d5  
t
h4  
t
h4  
t
t
d3  
su5  
t
su5  
Previous  
MSB  
Invalid  
Invalid  
DB[15:8]  
MSB  
MSB  
MSB  
MSB  
LSB  
LSB  
Invalid  
Previous  
Previous  
LSB  
Invalid  
DB[7:0]  
LSB  
Signal internal to device  
Figure 4. Timing for Conversion and Acquisition Cycles With CS and RD Tied to BDGND—Auto Read  
CS  
RD  
t
su4  
BYTE  
t
en  
t
d3  
t
dis  
t
dis  
t
en  
Hi−Z  
Hi−Z  
Hi−Z  
Valid  
Valid  
Valid  
DB[15:0]  
Figure 5. Detailed Timing for Read Cycles  
12  
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SLAS426AAUGUST 2004REVISED DECEMBER 2004  
TYPICAL CHARACTERISTICS  
At –40°C to 85°C, +VA = 5 V, +VBD = 5 V, REFIN = 4.096 V (internal reference used) and fsample = 1.25 MHz  
(unless otherwise noted)  
SIGNAL-TO-NOISE RATIO  
HISTOGRAM (DC Code Spread)  
HALF SCALE 131071 CONVERSIONS  
vs  
FREE-AIR TEMPERATURE  
90.9  
90.8  
80000  
f = 50 kHz,  
i
+VA = 5 V,  
Full Scale Input,  
VA = 5 V,  
70000  
+VBD = 3.3 V,  
VBD = 3 V,  
Internal Reference = 4.096 V  
T
A
= 25°C,  
60000  
50000  
40000  
Code = 65292  
90.7  
90.6  
90.5  
30000  
20000  
90.4  
90.3  
10000  
0
−40 −25 −10  
5
20 35 50 65 80  
T
A
− Free-Air Temperature − 5C  
Figure 6.  
Figure 7.  
SIGNAL-TO-NOISE AND DISTORTION  
EFFECTIVE NUMBER OF BITS  
vs  
FREE-AIR TEMPERATURE  
vs  
FREE-AIR TEMPERATURE  
91  
14.8  
f = 50 kHz,  
i
Full Scale Input,  
VA = 5 V,  
VBD = 3 V,  
Internal Reference = 4.096 V  
90.5  
14.7  
14.6  
90  
f = 50 kHz,  
i
89.5  
14.5  
14.4  
Full Scale Input,  
VA = 5 V,  
VBD = 3 V,  
Internal Reference = 4.096 V  
89  
−40 −25 −10  
5
20 35 50 65 80  
−40 −25 −10  
5
20 35 50 65 80  
T
A
− Free-Air Temperature − 5C  
T
A
− Free-Air Temperature − 5C  
Figure 8.  
Figure 9.  
13  
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SLAS426AAUGUST 2004REVISED DECEMBER 2004  
TYPICAL CHARACTERISTICS (continued)  
SPURIOUS FREE DYNAMIC RANGE  
TOTAL HARMONIC DISTORTION  
vs  
vs  
FREE-AIR TEMPERATURE  
FREE-AIR TEMPERATURE  
−94  
−95  
102  
f = 50 kHz,  
i
Full Scale Input,  
VA = 5 V,  
101  
100  
VBD = 3 V,  
Internal Reference = 4.096 V  
−96  
−97  
−98  
−99  
99  
98  
97  
f = 50 kHz,  
−100  
i
96  
95  
94  
Full Scale Input,  
VA = 5 V,  
VBD = 3 V,  
Internal Reference = 4.096 V  
−101  
−102  
−40 −25 −10  
5
20 35 50 65 80  
−40 −25 −10  
5
20 35 50 65 80  
T
A
− Free-Air Temperature − 5C  
T
A
− Free-Air Temperature − 5C  
Figure 10.  
Figure 11.  
SIGNAL-TO-NOISE RATIO  
vs  
EFFECTIVE NUMBER OF BITS  
vs  
INPUT FREQUENCY  
INPUT FREQUENCY  
92  
14.9  
14.8  
Full Scale Input,  
VA = 5 V,  
91.8  
91.6  
91.4  
VBD = 5 V,  
T
= 25°C,  
A
Internal Reference = 4.096 V  
91.2  
91  
14.7  
14.6  
90.8  
90.6  
90.4  
90.2  
Full Scale Input,  
VA = 5 V,  
14.5  
14.4  
VBD = 5 V,  
90  
T
= 25°C,  
A
Internal Reference = 4.096 V  
89.8  
0
10 20 30 40 50 60 70 80 90 100  
0
10 20 30 40 50 60 70 80 90 100  
f − Input Frequency − kHz  
i
f − Input Frequency − kHz  
i
Figure 12.  
Figure 13.  
SIGNAL-TO-NOISE AND DISTORTION  
SPURIOUS FREE DYNAMIC RANGE  
vs  
vs  
INPUT FREQUENCY  
INPUT FREQUENCY  
91.5  
101  
100  
99  
91  
90.5  
98  
97  
90  
89.5  
96  
Full Scale Input,  
VA = 5 V,  
VBD = 5 V,  
Full Scale Input,  
VA = 5 V,  
89  
VBD = 5 V,  
95  
94  
T
= 25°C,  
A
T
= 25°C,  
A
Internal Reference = 4.096 V  
Internal Reference = 4.096 V  
88.5  
0
10 20 30 40 50 60 70 80 90 100  
10 20 30 40 50 60 70 80 90 100  
0
f − Input Frequency − kHz  
i
f − Input Frequency − kHz  
i
Figure 14.  
Figure 15.  
14  
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SLAS426AAUGUST 2004REVISED DECEMBER 2004  
TYPICAL CHARACTERISTICS (continued)  
TOTAL HARMONIC DISTORTION  
SUPPLY CURRENT  
vs  
SAMPLE RATE  
vs  
INPUT FREQUENCY  
30.5  
30  
−94  
Full Scale Input,  
VA = 5 V,  
T
= 25°C,  
A
−95  
−96  
−97  
−98  
−99  
VBD = 5 V,  
= 25°C,  
Current of +VA Only,  
VBD = 5 V,  
VA = 5 V  
T
A
Internal Reference = 4.096 V  
29.5  
29  
28.5  
28  
27.5  
−100  
−101  
27  
26.5  
0
10 20 30 40 50 60 70 80 90 100  
250  
500  
750  
1000  
1250  
f − Input Frequency − kHz  
i
Throughput − KSPS  
Figure 16.  
Figure 17.  
GAIN ERROR  
vs  
SUPPLY VOLTAGE  
OFFSET ERROR  
vs  
SUPPLY VOLTAGE  
0.4  
0.2  
T
= 25°C,  
A
0.18  
External Reference = 4.096 V,  
VBD = 5 V  
0.3  
0.2  
0.1  
0
0.16  
0.14  
0.12  
0.1  
0.08  
−0.1  
−0.2  
T
A
= 25°C,  
0.06  
External Reference = 4.096 V,  
VBD = 5 V  
0.04  
0.02  
0
−0.3  
−0.4  
4.75  
5
5.25  
4.75  
5
5.25  
V
− Supply Voltage − V  
V
− Supply Voltage − V  
CC  
CC  
Figure 18.  
Figure 19.  
INTERNAL VOLTAGE REFERENCE  
GAIN ERROR  
vs  
FREE-AIR TEMPERATURE  
vs  
FREE-AIR TEMPERATURE  
1.5  
4.1  
VBD = 5 V,  
VA = 5 V  
4.098  
4.096  
4.094  
1
0.5  
0
4.092  
4.09  
−0.5  
External Refence = 4.096 V,  
VBD = 5 V,  
VA = 5 V  
−1  
4.088  
4.086  
−1.5  
−40 −25 −10  
5
20 35 50 65 80  
−40 −25 −10  
5
20 35 50 65 80  
T
A
− Free-Air Temperature − 5C  
T
A
− Free-Air Temperature − 5C  
Figure 20.  
Figure 21.  
15  
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SLAS426AAUGUST 2004REVISED DECEMBER 2004  
TYPICAL CHARACTERISTICS (continued)  
OFFSET ERROR  
vs  
FREE-AIR TEMPERATURE  
SUPPLY CURRENT  
vs  
FREE-AIR TEMPERATURE  
0.14  
0.12  
0.1  
30.4  
30.2  
30  
29.8  
0.08  
0.06  
29.6  
29.4  
29.2  
0.04  
External Reference = 4.096 V,  
External Reference = 4.096 V,  
Current of +VA Only,  
VBD = 5 V,  
VBD = 5 V,  
VA = 5 V  
0.02  
29  
VA = 5 V  
0
28.8  
−40 −25 −10  
5
20 35 50 65 80  
−40 −25 −10  
5
20 35 50 65 80  
T
A
− Free-Air Temperature − 5C  
T
A
− Free-Air Temperature − 5C  
Figure 22.  
Figure 23.  
DIFFERENTIAL NONLINEARITY  
vs  
FREE-AIR TEMPERATURE  
INTEGRAL NONLINEARITY  
vs  
FREE-AIR TEMPERATURE  
1.5  
1.5  
Max  
1
1
Max  
0.5  
0.5  
0
0
Min  
External Reference = 4.096 V,  
VBD = 5 V,  
VA = 5 V  
−0.5  
−0.5  
−1  
External Reference = 4.096 V,  
VBD = 5 V,  
−1  
Min  
VA = 5 V  
−1.5  
−1.5  
−40 −25 −10  
5
20 35 50 65 80  
−40 −25 −10  
5
20 35 50 65 80  
T
A
− Free-Air Temperature − 5C  
T
A
− Free-Air Temperature − 5C  
Figure 24.  
Figure 25.  
DIFFERENTIAL NONLINEARITY  
vs  
INTEGRAL NONLINEARITY  
vs  
REFERENCE VOLTAGE  
REFERENCE VOLTAGE  
2
2
T
= 25°C,  
T
= 25°C,  
A
A
VA = 5 V,  
VA = 5 V,  
VBD = 5 V  
1.5  
1.5  
1
Max  
VBD = 5 V  
Max  
1
0.5  
0
0.5  
0
Min  
−0.5  
−0.5  
−1  
−1  
−1.5  
−2  
Min  
−1.5  
−2  
2.5  
3
3.5  
4
2.5  
3
3.5  
4
V
− Reference Voltage − V  
V
− Reference Voltage − V  
REF  
REF  
Figure 26.  
Figure 27.  
16  
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SLAS426AAUGUST 2004REVISED DECEMBER 2004  
TYPICAL CHARACTERISTICS (continued)  
DNL  
2.5  
2
1.5  
1
0.5  
0
−0.5  
−1  
−1.5  
−2  
−2.5  
0
16384  
32768  
49152  
65536  
Code  
Figure 28.  
INL  
2.5  
2
1.5  
1
0.5  
0
−0.5  
−1  
−1.5  
−2  
−2.5  
0
16384  
32768  
Code  
49152  
65536  
Figure 29.  
FFT  
0
f = 100 kHz,  
i
−20  
−40  
−60  
−80  
f
= 1.25 MHz,  
s
A
T
= 25°C,  
Internal Reference = 4.096 V  
−100  
−120  
−140  
−160  
−180  
−200  
0
100 k  
200 k  
300 k  
400 k  
500 k  
600 k  
Samples  
Figure 30.  
17  
ADS8406  
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SLAS426AAUGUST 2004REVISED DECEMBER 2004  
APPLICATION INFORMATION  
MICROCONTROLLER INTERFACING  
ADS8406 to 8-Bit Microcontroller Interface  
Figure 31 shows a parallel interface between the ADS8406 and a typical microcontroller using the 8-bit data bus.  
The BUSY signal is used as a falling-edge interrupt to the microcontroller.  
Analog 5 V  
0.1 µF  
AGND  
10 µF  
Ext Ref Input  
0.1 µF  
1 µF  
Analog Input  
Micro  
Controller  
Digital 3 V  
ADS8406  
GPIO  
CS  
0.1 µF  
GPIO  
P[7:0]  
BYTE  
BDGND  
DB[15:8]  
RD  
CONVST  
BUSY  
BDGND  
RD  
GPIO  
INT  
+VBD  
Figure 31. ADS8406 Application Circuitry (using external reference)  
Analog 5 V  
AGND  
0.1 µF  
10 µF  
0.1 µF  
1 µF  
AGND  
ADS8406  
Figure 32. Use Internal Reference  
PRINCIPLES OF OPERATION  
The ADS8406 is a high-speed successive approximation register (SAR) analog-to-digital converter (ADC). The  
architecture is based on charge redistribution, which inherently includes a sample/hold function. See Figure 31  
for the application circuit for the ADS8406.  
The conversion clock is generated internally. The conversion time of 650 ns is capable of sustaining a 1.25-MHz  
throughput.  
18  
 
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SLAS426AAUGUST 2004REVISED DECEMBER 2004  
PRINCIPLES OF OPERATION (continued)  
The analog input is provided to two input pins: +IN and –IN. When a conversion is initiated, the differential input  
on these pins is sampled on the internal capacitor array. While a conversion is in progress, both inputs are  
disconnected from any internal function.  
REFERENCE  
The ADS8406 can operate with an external reference with a range from 2.5 V to 4.2 V. A 4.096-V internal  
reference is included. When internal reference is used, pin 2 (REFOUT) should be connected to pin 1 (REFIN)  
with a 0.1-µF decoupling capacitor and 1-µF storage capacitor between pin 2 (REFOUT) and pins 47 and 48  
(REFM) (see Figure 33). The internal reference of the converter is double buffered. If an external reference is  
used, the second buffer provides isolation between the external reference and the CDAC. This buffer is also  
used to recharge all of the capacitors of the CDAC during conversion. Pin 2 (REFOUT) can be left unconnected  
(floating) if external reference is used.  
ANALOG INPUT  
When the converter enters the hold mode, the voltage difference between the +IN and -IN inputs is captured on  
the internal capacitor array. Both +IN and –IN inputs have a range of –0.2 V to Vref + 0.2 V. The input span (+IN  
– (–IN)) is limited to -Vref to Vref..  
The input current on the analog inputs depends upon a number of factors: sample rate, input voltage, and source  
impedance. Essentially, the current into the ADS8406 charges the internal capacitor array during the sample  
period. After this capacitance has been fully charged, there is no further input current. The source of the analog  
input voltage must be able to charge the input capacitance (25 pF) to an 16-bit settling level within the acquisition  
time (150 ns) of the device. When the converter goes into the hold mode, the input impedance is greater than 1  
G.  
Care must be taken regarding the absolute analog input voltage. To maintain the linearity of the converter, the  
+IN and –IN inputs and the span (+IN – (–IN)) should be within the limits specified. Outside of these ranges, the  
converter's linearity may not meet specifications. To minimize noise, low bandwidth input signals with low-pass  
filters should be used.  
Care should be taken to ensure that the output impedance of the sources driving +IN and –IN inputs are  
matched. If this is not observed, the two inputs could have different setting time. This may result in offset error,  
gain error and linearity error which varies with temperature and input voltage.  
A typical input circuit using TI's THS4503 is shown in Figure 33. Input from a single-ended source may be  
converted into a differential signal for the ADS8406 as shown in the figure. In case the source itself is differential,  
then the THS4503 may be used in differential input and differential output modes.  
68 pF  
R
S
R
G
1 k  
50 Ω  
V
CC+  
R
T
IN−  
ADS8406  
_
+
20 pF  
THS4503  
_
+
IN+  
+
_
OCM  
V
CC−  
1 kΩ  
1 kΩ  
50 Ω  
R
R
V
R , and R should be chosen such that  
S T  
68 pF  
G,  
R
|| R = 1 k Ω  
T
G +  
OCM  
S
= 2 V, +V = 7 V, and −V = −7 V  
CC CC  
Figure 33. Using the THS4503 With the ADS8406  
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SLAS426AAUGUST 2004REVISED DECEMBER 2004  
PRINCIPLES OF OPERATION (continued)  
DIGITAL INTERFACE  
Timing And Control  
See the timing diagrams in the specifications section for detailed information on timing signals and their  
requirements.  
The ADS8406 uses an internal oscillator generated clock which controls the conversion rate and in turn the  
throughput of the converter. No external clock input is required.  
Conversions are initiated by bringing the CONVST pin low for a minimum of 20 ns (after the 20 ns minimum  
requirement has been met, the CONVST pin can be brought high), while CS is low. The ADS8406 switches from  
the sample to the hold mode on the falling edge of the CONVST command. A clean and low jitter falling edge of  
this signal is important to the performance of the converter. The BUSY output is brought high after CONVST  
goes low. BUSY stays high throughout the conversion process and returns low when the conversion has ended.  
Sampling starts as soon as the conversion is over when CS is tied low or starts with the falling edge of CS when  
BUSY is low.  
Both RD and CS can be high during and before a conversion with one exception (CS must be low when  
CONVST goes low to initiate a conversion). Both the RD and CS pins are brought low in order to enable the  
parallel output bus with the conversion.  
Reading Data  
The ADS8406 outputs full parallel data in two's complement format as shown in Table 1. The parallel output is  
active when CS and RD are both low. There is a minimal quiet zone requirement around the falling edge of  
CONVST. This is 50 ns prior to the falling edge of CONVST and 40 ns after the falling edge. No data read should  
be attempted within this zone. Any other combination of CS and RD sets the parallel output to 3-state. BYTE is  
used for multiword read operations. BYTE is used whenever lower bits of the converter result are output on the  
higher byte of the bus. Refer to Table 1 for ideal output codes.  
Table 1. Ideal Input Voltages and Output Codes  
DESCRIPTION  
Full scale range  
ANALOG VALUE  
DIGITAL OUTPUT  
2'S COMPLEMENT  
2(+Vref  
)
Least significant bit (LSB)  
+Full scale  
2(+Vref)/65536  
(+Vref) – 1 LSB  
0 V  
BINARY CODE  
HEX CODE  
7FFF  
0111 1111 1111 1111  
0000 0000 0000 0000  
1111 1111 1111 1111  
1000 0000 0000 0000  
Midscale  
0000  
Midscale – 1 LSB  
– Full scale  
0 V– 1 LSB  
FFFF  
( –Vref  
)
8000  
The output data is a full 16-bit word (D15–D0) on DB15–DB0 pins (MSB–LSB) if BYTE is low.  
The result may also be read on an 8-bit bus for convenience. This is done by using only pins DB15–DB8. In this  
case two reads are necessary: the first as before, leaving BYTE low and reading the 8 most significant bits on  
pins DB15–DB8, then bringing BYTE high. When BYTE is high, the low bits (D7–D0) appear on pins DB15–D8.  
These multiword read operations can be done with multiple active RD (toggling) or with RD tied low for simplicity.  
Conversion Data Readout  
DATA READ OUT  
BYTE  
DB15–DB8 Pins  
D7–D0  
DB7–DB0 Pins  
All one's  
High  
Low  
D15–D8  
D7–D0  
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SLAS426AAUGUST 2004REVISED DECEMBER 2004  
RESET  
RESET is an asynchronous active low input signal (that works independently of CS). Minimum RESET low time  
is 25 ns. Current conversion will be aborted no later than 50 ns after the converter is in the reset mode. In  
addition, all output latches are cleared (set to zero's) after RESET. The converter goes back to normal operation  
mode no later than 20 ns after RESET input is brought high.  
The converter starts the first sampling period 20 ns after the rising edge of RESET. Any sampling period except  
for the one immediately after a RESET is started with the falling edge of the previous BUSY signal or the falling  
edge of CS, whichever is later.  
Another way to reset the device is through the use of the combination of CS and CONVST. This is useful when  
the dedicated RESET pin is tied to the system reset but there is a need to abort only the conversion in a specific  
converter. Since the BUSY signal is held high during the conversion, either one of these conditions triggers an  
internal self-clear reset to the converter just the same as a reset via the dedicated RESET pin. The reset does  
not have to be cleared as for the dedicated RESET pin. A reset can be started with either of the two following  
steps.  
Issue a CONVST when CS is low and a conversion is in progress. The falling edge of CONVST must satisfy  
the timing as specified by the timing parameter tsu(AB) mentioned in the timing characteristics table to ensure  
a reset. The falling edge of CONVST starts a reset. Timing is the same as a reset using the dedicated  
RESET pin except the instance of the falling edge is replaced by the falling edge of CONVST.  
Issue a CS while a conversion is in progress. The falling edge of CS must satisfy the timing as specified by  
the timing parameter tsu(AB) mentioned in the timing characteristics table to ensure a reset.The falling edge of  
CS causes a reset. Timing is the same as a reset using the dedicated RESET pin except the instance of the  
falling edge is replaced by the falling edge of CS.  
POWER-ON INITIALIZATION  
RESET is not required after power on. An internal power-on-reset circuit generates the reset. To ensure that all  
of the registers are cleared, the three conversion cycles must be given to the converter after power on.  
LAYOUT  
For optimum performance, care should be taken with the physical layout of the ADS8406 circuitry.  
As the ADS8406 offers single-supply operation, it is often used in close proximity with digital logic,  
microcontrollers, microprocessors, and digital signal processors. The more digital logic present in the design and  
the higher the switching speed, the more difficult it is to achieve good performance from the converter.  
The basic SAR architecture is sensitive to glitches or sudden changes on the power supply, reference, ground  
connections and digital inputs that occur just prior to latching the output of the analog comparator. Thus, driving  
any single conversion for an n-bit SAR converter, there are at least n windows in which large external transient  
voltages can affect the conversion result. Such glitches might originate from switching power supplies, nearby  
digital logic, or high power devices.  
The degree of error in the digital output depends on the reference voltage, layout, and the exact timing of the  
external event.  
On average, the ADS8406 draws very little current from an external reference, as the reference voltage is  
internally buffered. If the reference voltage is external and originates from an op amp, make sure that it can drive  
the bypass capacitor or capacitors without oscillation. A 0.1-µF bypass capacitor and a 1-µF storage capacitor  
are recommended from pin 1 (REFIN) directly to pin 48 (REFM). REFM and AGND should be shorted on the  
same ground plane under the device.  
The AGND and BDGND pins should be connected to a clean ground point. In all cases, this should be the  
analog ground. Avoid connections which are close to the grounding point of a microcontroller or digital signal  
processor. If required, run a ground trace directly from the converter to the power supply entry point. The ideal  
layout consists of an analog ground plane dedicated to the converter and associated analog circuitry.  
21  
ADS8406  
www.ti.com  
SLAS426AAUGUST 2004REVISED DECEMBER 2004  
As with the AGND connections, +VA should be connected to a 5-V power supply plane or trace that is separate  
from the connection for digital logic until they are connected at the power entry point. Power to the ADS8406  
should be clean and well bypassed. A 0.1-µF ceramic bypass capacitor should be placed as close to the device  
as possible. See Table 2 for the placement of the capacitor. In addition, a 1-µF to 10-µF capacitor is  
recommended. In some situations, additional bypassing may be required, such as a 100-µF electrolytic capacitor  
or even a Pi filter made up of inductors and capacitors—all designed to essentially low-pass filter the 5-V supply,  
removing the high frequency noise.  
Table 2. Power Supply Decoupling Capacitor Placement  
POWER SUPPLY PLANE  
CONVERTER ANALOG SIDE  
CONVERTER DIGITAL SIDE  
SUPPLY PINS  
Pin pairs that require shortest path to decoupling capacitors  
Pins that require no decoupling  
(4,5), (8,9), (10,11), (13,15),  
(43,44), (45,46)  
(24,25), (34, 35)  
37  
12, 14  
22  
PACKAGE OPTION ADDENDUM  
www.ti.com  
30-Jul-2011  
PACKAGING INFORMATION  
Status (1)  
Eco Plan (2)  
MSL Peak Temp (3)  
Samples  
Orderable Device  
Package Type Package  
Drawing  
Pins  
Package Qty  
Lead/  
Ball Finish  
(Requires Login)  
ADS8406IBPFBR  
ADS8406IBPFBRG4  
ADS8406IBPFBT  
ADS8406IBPFBTG4  
ADS8406IPFBT  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
TQFP  
TQFP  
TQFP  
TQFP  
TQFP  
TQFP  
PFB  
PFB  
PFB  
PFB  
PFB  
PFB  
48  
48  
48  
48  
48  
48  
2000  
2000  
250  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU Level-2-260C-1 YEAR  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU Level-2-260C-1 YEAR  
CU NIPDAU Level-2-260C-1 YEAR  
CU NIPDAU Level-2-260C-1 YEAR  
CU NIPDAU Level-2-260C-1 YEAR  
CU NIPDAU Level-2-260C-1 YEAR  
Green (RoHS  
& no Sb/Br)  
250  
Green (RoHS  
& no Sb/Br)  
250  
Green (RoHS  
& no Sb/Br)  
ADS8406IPFBTG4  
250  
Green (RoHS  
& no Sb/Br)  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability  
information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that  
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between  
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight  
in homogeneous material)  
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
30-Jul-2011  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
14-Jul-2012  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
ADS8406IBPFBR  
ADS8406IBPFBT  
ADS8406IPFBT  
TQFP  
TQFP  
TQFP  
PFB  
PFB  
PFB  
48  
48  
48  
2000  
250  
330.0  
330.0  
330.0  
16.4  
16.4  
16.4  
9.6  
9.6  
9.6  
9.6  
9.6  
9.6  
1.5  
1.5  
1.5  
12.0  
12.0  
12.0  
16.0  
16.0  
16.0  
Q2  
Q2  
Q2  
250  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
14-Jul-2012  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SPQ  
Length (mm) Width (mm) Height (mm)  
ADS8406IBPFBR  
ADS8406IBPFBT  
ADS8406IPFBT  
TQFP  
TQFP  
TQFP  
PFB  
PFB  
PFB  
48  
48  
48  
2000  
250  
367.0  
367.0  
367.0  
367.0  
367.0  
367.0  
38.0  
38.0  
38.0  
250  
Pack Materials-Page 2  
MECHANICAL DATA  
MTQF019A – JANUARY 1995 – REVISED JANUARY 1998  
PFB (S-PQFP-G48)  
PLASTIC QUAD FLATPACK  
0,27  
0,17  
0,50  
M
0,08  
36  
25  
37  
24  
48  
13  
0,13 NOM  
1
12  
5,50 TYP  
7,20  
SQ  
Gage Plane  
6,80  
9,20  
SQ  
8,80  
0,25  
0,05 MIN  
0°7°  
1,05  
0,95  
0,75  
0,45  
Seating Plane  
0,08  
1,20 MAX  
4073176/B 10/96  
NOTES: A. All linear dimensions are in millimeters.  
B. This drawing is subject to change without notice.  
C. Falls within JEDEC MS-026  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other  
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TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms  
and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary  
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TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and  
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