ADS8504IBDWR [TI]

具有并行接口 2.5V 内部基准的 12 位 250kHz CMOS 模数转换器 | DW | 28 | -40 to 85;
ADS8504IBDWR
型号: ADS8504IBDWR
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

具有并行接口 2.5V 内部基准的 12 位 250kHz CMOS 模数转换器 | DW | 28 | -40 to 85

光电二极管 转换器 模数转换器
文件: 总25页 (文件大小:1011K)
中文:  中文翻译
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ADS8504  
SLAS434AJUNE 2005REVISED JUNE 2007  
12-BIT 250-KSPS SAMPLING CMOS ANALOG-TO-DIGITAL CONVERTER  
FEATURES  
APPLICATIONS  
Industrial Process Control  
Data Acquisition Systems  
Digital Signal Processing  
Medical Equipment  
250-kHz Sampling Rate  
Standard ±10-V Input Range  
73-dB SINAD With 45-kHz Input  
±0.45 LSB Max INL  
Instrumentation  
±0.45 LSB Max DNL  
12 Bit No Missing Code  
DESCRIPTION  
±1 LSB Bipolar Zero Errors  
±0.4 PPM/°C Bipolar Zero Error Drift  
Single 5-V Supply Operation  
The ADS8504 is a complete 12-bit sampling A/D  
converter using state-of-the-art CMOS structures. It  
contains a complete 12-bit, capacitor-based, SAR  
A/D with S/H, reference, clock, interface for  
microprocessor use, and 3-state output drivers.  
Pin-Compatible With ADS7804/05 (Low Speed)  
and 16-Bit ADS8505  
The ADS8504 is specified at a 250-kHz sampling  
rate over the full temperature range. Precision  
resistors provide an industry standard ±10-V input  
range, while the innovative design allows operation  
from a single +5-V supply, with power dissipation  
under 100 mW.  
Uses Internal or External Reference  
Full Parallel Data Output  
70-mW Typ Power Dissipation at 250 KSPS  
28-Pin SOIC Package  
The ADS8504 is available in a 28-pin SOIC package  
and is fully specified for operation over the industrial  
-40°C to 85°C temperature range.  
R/C  
CS  
Clock  
Successive Approximation Register and Control Logic  
BYTE  
BUSY  
CDAC  
Output  
Latches  
and  
Three  
State  
Three  
State  
Parallel  
Data  
9.8 k  
± 10 V Input  
2 kΩ  
5 kΩ  
Comparator  
Bus  
Drivers  
CAP  
Internal  
+2.5 V Ref  
Buffer  
4 kΩ  
REF  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2005–2007, Texas Instruments Incorporated  
ADS8504  
www.ti.com  
SLAS434AJUNE 2005REVISED JUNE 2007  
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam  
during storage or handling to prevent electrostatic damage to the MOS gates.  
PACKAGE/ORDERING INFORMATION(1)  
MINIMUM  
NO  
MISSING  
CODE  
MINIMUM  
SINAD  
(dB)  
SPECIFICATION  
TEMPERATURE  
RANGE  
RELATIVE  
ACCURACY  
(LSB)  
PACKAGE  
LEAD  
PACKAGE  
DESIGNATOR  
ORDERING  
NUMBER  
TRANSPORT  
MEDIA, QTY  
PRODUCT  
ADS8504IBDW  
Tube, 20  
Tape and Reel, 1000  
ADS8504IB  
±0.45  
12  
72  
-40°C to 85°C  
SO-28  
DW  
ADS8504IBDWR  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
ABSOLUTE MAXIMUM RATINGS(1)  
over operating free-air temperature range (unless otherwise noted)(2)  
ADS8504  
Analog inputs  
VIN  
±25V  
CAP  
+VANA + 0.3 V to AGND2 - 0.3 V  
REF  
Indefinite short to AGND2, momentary short to VANA  
Ground voltage differences  
DGND, AGND1, AGND2  
±0.3 V  
VANA  
6 V  
VDIG to VANA  
VDIG  
0.3 V  
6 V  
Digital inputs  
-0.3 V to +VDIG + 0.3 V  
165°C  
Maximum junction temperature  
Internal power dissipation  
825 mW  
Lead temperature (soldering, 1,6mm from case, 10 seconds)  
260°C  
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings  
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating  
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
(2) All voltage values are with respect to network ground terminal.  
ELECTRICAL CHARACTERISTICS  
TA = -40°C to 85°C, fs = 250 kHz, VDIG = VANA = 5 V, using internal reference (unless otherwise noted)  
PARAMETER  
Resolution  
ANALOG INPUT  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
12  
Bits  
Voltage range  
Impedance  
±10  
11.5  
50  
V
kΩ  
pF  
Capacitance  
THROUGHPUT SPEED  
Conversion cycle  
Throughput rate  
DC ACCURACY  
Acquire and convert  
4
µs  
250  
kHz  
INL  
Integral linearity error  
Differentiall linearity error  
No missing codes  
-0.45  
-0.45  
12  
0.45  
0.45  
LSB(1)  
LSB(1)  
Bits  
DNL  
Transition noise(2)  
0.1  
LSB  
(1) LSB means least significant bit. For the 12-bit, ±10-V input ADS8504, one LSB is 4.88 mV.  
(2) Typical rms noise at worst case transitions and temperatures.  
2
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ADS8504  
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SLAS434AJUNE 2005REVISED JUNE 2007  
ELECTRICAL CHARACTERISTICS (continued)  
TA = -40°C to 85°C, fs = 250 kHz, VDIG = VANA = 5 V, using internal reference (unless otherwise noted)  
PARAMETER  
Full-scale error(3)(4)  
TEST CONDITIONS  
Int. Ref.  
MIN  
TYP  
MAX  
UNIT  
%FSR  
ppm/°C  
%FSR  
ppm/°C  
LSB  
-0.25  
0.25  
Full-scale error drift  
Full-scale error(3)(4)  
Full-scale error drift  
Bipolar zero error(3)  
Bipolar zero error drift  
Int. Ref.  
±7  
Ext. 2.5-V Ref.  
Ext. 2.5-V Ref.  
-0.25  
-1  
0.25  
1
±2  
±0.4  
ppm/°C  
Power supply sensitivity  
(VDIG = VANA = VD)  
-0.5  
0.5  
+4.75 V < VD < +5.25 V  
LSB  
AC ACCURACY  
SFDR  
THD  
Spurious-free dynamic range  
Total harmonic distortion  
fI = 45 kHz  
fI = 45 kHz  
fI = 45 kHz  
–60-dB Input  
fI = 45 kHz  
86  
72  
72  
94  
-95  
73  
dB(5)  
dB  
-86  
dB  
SINAD  
SNR  
Signal-to-(noise+distortion)  
32  
dB  
Signal-to-noise ratio  
73  
dB  
Full-power bandwidth(6)  
500  
kHz  
SAMPLING DYNAMICS  
Aperture delay  
5
ns  
µs  
ns  
Transient response  
Overvoltage recovery(7)  
REFERENCE  
FS Step  
2
150  
Internal reference voltage  
2.48  
2.3  
2.5  
1
2.52  
V
µA  
Internal reference source current (must use  
external buffer)  
Internal reference drift  
8
ppm/°C  
V
External reference voltage range for specified  
linearity  
2.5  
2.7  
External reference current drain  
Ext. 2.5-V Ref.  
100  
µA  
DIGITAL INPUTS  
Logic levels  
VIL  
VIH  
IIL  
Low-level input voltage  
High-level input voltage  
Low-level input current  
High-level input current  
-0.3  
2.0  
0.8  
VDIG +0.3 V  
±10  
V
V
µA  
µA  
IIH  
±10  
DIGITAL OUTPUTS  
Data format (Parallel 12-bits)  
Data coding (Binary 2's complement)  
Low-level output voltage  
High-level output voltage  
Leakage current  
VOL  
VOH  
ISINK = 1.6 mA  
0.4  
V
V
ISOURCE = 500 µA  
Hi-Z state, VOUT = 0 V to VDIG  
Hi-Z state  
4
±5  
µA  
pF  
Output capacitance  
15  
DIGITAL TIMING  
Bus access timing  
83  
ns  
(3) As measured with fixed resistors shown in Figure 24. Adjustable to zero with external potentiometer.  
(4) Full-scale error is the worst case of -full-scale or +full-scale deviation from ideal first and last code transitions, divided by the transition  
voltage (not divided by the full-scale range) and includes the effect of offset error.  
(5) All specifications in dB are referred to a full-scale ±10-V input.  
(6) Full-power bandwidth is defined as the full-scale input frequency at which signal-to-(noise + distortion) degrades to 60 dB, or 10 bits of  
accuracy.  
(7) Recovers to specified performance after 2 x FS input overvoltage.  
3
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SLAS434AJUNE 2005REVISED JUNE 2007  
ELECTRICAL CHARACTERISTICS (continued)  
TA = -40°C to 85°C, fs = 250 kHz, VDIG = VANA = 5 V, using internal reference (unless otherwise noted)  
PARAMETER  
Bus relinquish timing  
POWER SUPPLIES  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
83  
ns  
VDIG  
VANA  
IDIG  
Digital input voltage  
Analog input voltage  
Digital input current  
Analog input current  
Power dissipation  
4.75  
4.75  
5
5
5.25  
5.25  
V
V
Must be VANA  
4
mA  
mA  
mW  
IANA  
10  
70  
fS = 250 kHz  
100  
TEMPERATURE RANGE  
Specified performance  
-40  
-55  
-65  
85  
125  
150  
°C  
°C  
°C  
Derated performance(8)  
Storage  
THERMAL RESISTANCE (ΘJA  
)
SO  
46  
°C/W  
(8) The internal reference may not be started correctly beyond the industrial temperature range (-40°C to 85°C), therefore use of an  
external reference is recommended.  
DEVICE INFORMATION  
DW PACKAGE  
(TOP VIEW)  
V
1
2
3
4
5
6
7
8
9
28 V  
DIG  
IN  
AGND1  
REF  
27 V  
ANA  
26  
BUSY  
CAP  
25 CS  
AGND2  
D11 (MSB)  
D10  
24 R/C  
23  
BYTE  
22 DZ  
21  
20  
D9  
DZ  
DZ  
D8  
D7 10  
19 DZ  
11  
18  
17  
D0 (LSB)  
D1  
D6  
12  
D5  
13  
14  
16 D2  
15  
D4  
D3  
DGND  
4
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SLAS434AJUNE 2005REVISED JUNE 2007  
DEVICE INFORMATION (continued)  
Terminal Functions  
TERMINAL  
DIGITAL  
DESCRIPTION  
I/O  
NAME  
AGND1  
DW NO.  
2
5
Analog ground. Used internally as ground reference point.  
AGND2  
BUSY  
Analog ground.  
26  
O
I
At the start of a conversion, BUSY goes low and stays low until the conversion is  
completed and the digital outputs have been updated.  
BYTE  
CAP  
23  
4
Selects 8 most significant bits (low) or 8 least significant bits (high).  
Reference buffer capacitor. 2.2-µF tantalum capacitor to ground.  
Internally ORed with R/C. If R/C low, a falling edge on CS initiates a new conversion.  
Digital ground.  
CS  
25  
14  
6
I
DGND  
D11 (MSB)  
O
Data bit 11. Most significant bit (MSB) of conversion results. Hi-Z state when CS is  
high, or when R/C is low.  
D10  
D9  
7
O
O
O
O
O
O
O
O
O
O
O
Data bit 10. Hi-Z state when CS is high, or when R/C is low.  
Data bit 9. Hi-Z state when CS is high, or when R/C is low.  
Data bit 8. Hi-Z state when CS is high, or when R/C is low.  
Data bit 7. Hi-Z state when CS is high, or when R/C is low.  
Data bit 6. Hi-Z state when CS is high, or when R/C is low.  
Data bit 5. Hi-Z state when CS is high, or when R/C is low.  
Data bit 4. Hi-Z state when CS is high, or when R/C is low.  
Data bit 3. Hi-Z state when CS is high, or when R/C is low.  
Data bit 2. Hi-Z state when CS is high, or when R/C is low.  
Data bit 1. Hi-Z state when CS is high, or when R/C is low.  
8
D8  
9
D7  
10  
11  
12  
13  
15  
16  
17  
18  
D6  
D5  
D4  
D3  
D2  
D1  
D0 (LSB)  
Data bit 0. Least significant bit (LSB) of conversion results. Hi-Z state when CS is high,  
or when R/C is low.  
DZ  
DZ  
DZ  
DZ  
R/C  
19  
20  
21  
22  
24  
O
O
O
O
I
Low when CS low, R/C high. Hi-Z state when CS is high, or when R/C is low.  
Low when CS low, R/C high. Hi-Z state when CS is high, or when R/C is low.  
Low when CS low, R/C high. Hi-Z state when CS is high, or when R/C is low.  
Low when CS low, R/C high. Hi-Z state when CS is high, or when R/C is low.  
With CS low and BUSY high, a falling edge on R/C initiates a new conversion. With CS  
low, a rising edge on R/C enables the parallel output.  
REF  
3
Reference input/output. 2.2-µF tantalum capacitor to ground.  
VANA  
27  
Analog supply input. Nominally +5 V. Decouple to ground with 0.1-µF ceramic and  
10-µF tantalum capacitors.  
VDIG  
VIN  
28  
1
Digital supply input. Nominally +5 V. Connect directly to pin 27. Must be VANA.  
Analog input.  
5
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SLAS434AJUNE 2005REVISED JUNE 2007  
Typical Characteristics  
SPURIOUS FREE DYNAMIC RANGE  
TOTAL HARMONIC DISTORTION  
vs  
SIGNAL-TO-NOISE RATIO  
vs  
FREE-AIR TEMPERATURE  
vs  
FREE-AIR TEMPERATURE  
FREE-AIR TEMPERATURE  
110  
80  
70  
60  
−100  
f = 45 kHz  
i
−95  
−90  
−85  
−80  
−75  
−70  
100  
90  
80  
50  
40  
f = 45 kHz  
i
70  
−40  
−20  
0
20  
40  
60  
80  
−40  
−20  
0
20  
40  
60  
80  
−40  
−20  
0
20  
40  
60  
80  
T
A
− Free-Air-Temperature − 5C  
T
A
− Free-Air-Temperature − 5C  
T
A
− Free-Air-Temperature − 5C  
Figure 1.  
Figure 2.  
Figure 3.  
SIGNAL-TO-NOISE  
AND DISTORTION  
vs  
SIGNAL-TO-NOISE  
AND DISTORTION  
vs  
SIGNAL-TO-NOISE RATIO  
vs  
FREE-AIR TEMPERATURE  
INPUT FREQUENCY  
INPUT FREQUENCY  
80  
75  
70  
65  
60  
55  
50  
80  
80  
75  
70  
65  
60  
55  
50  
70  
60  
50  
40  
f = 45 kHz  
i
−40  
−20  
0
20  
40  
60  
80  
1
10  
100  
1000  
1
10  
100  
1000  
T
A
− Free-Air-Temperature − 5C  
f − Input Frequency − kHz  
i
f − Input Frequency − kHz  
i
Figure 4.  
Figure 5.  
Figure 6.  
SPURIOUS FREE DYNAMIC RANGE  
TOTAL HARMONIC DISTORTION  
BIPOLAR ZERO ERROR  
vs  
FREE-AIR TEMPERATURE  
vs  
vs  
INPUT FREQUENCY  
INPUT FREQUENCY  
100  
5
−100  
−90  
−80  
−70  
−60  
−50  
−40  
4
3
2
1
90  
80  
70  
0
−1  
−30  
−20  
−10  
−2  
−3  
−4  
−5  
60  
50  
0
10  
100  
1000  
1
10  
100  
1000  
−40  
−20  
0
20  
40  
60  
80  
1
f − Input Frequency − kHz  
i
5
f − Input Frequency − kHz  
i
T
− Free-Air Temperature − C  
A
Figure 7.  
Figure 8.  
Figure 9.  
6
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SLAS434AJUNE 2005REVISED JUNE 2007  
Typical Characteristics (continued)  
NEGATIVE FULL-SCALE ERROR  
POSITIVE FULL-SCALE ERROR  
vs  
FREE-AIR TEMPERATURE  
SUPPLY CURRENT  
vs  
FREE-AIR TEMPERATURE  
vs  
FREE-AIR TEMPERATURE  
20  
19  
18  
17  
16  
15  
14  
13  
12  
11  
10  
0.25  
0.2  
0.25  
0.2  
0.15  
0.1  
0.15  
0.1  
0.05  
0.05  
0
−0.05  
−0.1  
0
−0.05  
−0.1  
−0.15  
−0.2  
−0.15  
−0.2  
−0.25  
−0.25  
−40  
−20  
0
20  
40  
60  
80  
−40  
−20  
0
20  
40  
60  
80  
−40  
−20  
0
20  
40  
60  
80  
5
5
T
− Free-Air Temperature −  
C
5
T
− Free-Air Temperature −  
C
T
− Free-Air Temperature − C  
A
A
A
Figure 10.  
Figure 11.  
Figure 12.  
INL  
0.5  
f
= 250 KSPS  
0.4  
0.3  
0.2  
0.1  
s
0
−0.1  
−0.2  
−0.3  
−0.4  
−0.5  
0
512  
1024  
1536  
2048  
2560  
3072  
3584  
4096  
Code  
(Binary 2’s Complement in Decimal)  
Figure 13.  
DNL  
0.5  
0.4  
0.3  
0.2  
0.1  
f
= 250 KSPS  
s
0
−0.1  
−0.2  
−0.3  
−0.4  
−0.5  
0
512  
1024  
1536  
2048  
2560  
3072  
3584  
4096  
Code  
(Binary 2’s Complement in Decimal)  
Figure 14.  
7
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SLAS434AJUNE 2005REVISED JUNE 2007  
Typical Characteristics (continued)  
FFT  
20  
0
8192 Points  
= 250 KSPS  
f
s
f = 1 kHz, 0dB  
SINAD = 73.47 dB  
THD = −94.03 dB  
i
−20  
−40  
−60  
−80  
−100  
−120  
−140  
−160  
0
25  
50  
75  
100  
125  
f − Frequency − Hz  
Figure 15.  
FFT  
20  
8192 Points  
0
−20  
f
= 250 KSPS  
s
f = 45 kHz, 0dB  
SINAD = 73.62 dB  
THD = −94.03 dB  
i
−40  
−60  
−80  
−100  
−120  
−140  
−160  
0
25  
50  
75  
100  
125  
f − Frequency − Hz  
Figure 16.  
BASIC OPERATION  
Figure 17 shows a basic circuit to operate the ADS8504 with a full parallel data output. Taking R/C (pin 24) low  
for a minimum of 40 ns (1.75 µs max if BUSY is used to latch the data) initiates a conversion. BUSY (pin 26)  
goes low and stays low until the conversion is completed and the output registers are updated. Data is output in  
binary 2's complement with the MSB on pin 6. BUSY going high can be used to latch the data.  
The ADS8504 begins tracking the input signal at the end of the conversion. Allowing 4 µs between convert  
commands assures accurate acquisition of a new signal.  
The offset and gain are adjusted internally to allow external trimming with a single supply. The external resistors  
compensate for this adjustment and can be left out if the offset and gain are corrected in software (refer to the  
Calibration section).  
STARTING A CONVERSION  
The combination of CS (pin 25) and R/C (pin 24) low for a minimum of 40 ns immediately puts the sample/hold  
of the ADS8504 in the hold state and starts conversion n. BUSY (pin 26) goes low and stays low until  
conversion n is completed and the internal output register has been updated. All new convert commands during  
BUSY low will abort the conversion in progress and reset the ADC (see Figure 22).  
The ADS8504 begins tracking the input signal at the end of the conversion. Allowing 4 µs between convert  
commands assures accurate acquisition of a new signal. Refer to Table 1 for a summary of CS, R/C, and BUSY  
states and Figure 19, Figure 20, and Figure 21 for the timing diagrams.  
8
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SLAS434AJUNE 2005REVISED JUNE 2007  
BASIC OPERATION (continued)  
CS and R/C are internally ORed and level triggered. There is not a requirement which input goes low first when  
initiating a conversion. If, however, it is critical that CS or R/C initiates conversion n, be sure the less critical  
input is low at least 10 ns prior to the initiating input.  
To reduce the number of control pins, CS can be tied low using R/C to control the read and convert modes. The  
parallel output becomes active whenever R/C goes high. Refer to the READING DATA section.  
Table 1. Control Line Functions for Read and Convert  
CS  
1
R/C  
X
0
BUSY  
OPERATION  
X
1
1
None. Databus is in Hi-Z state.  
Initiates conversion n. Databus remains in Hi-Z state.  
0
Initiates conversion n. Databus enters Hi-Z state.  
0
1
Conversion n completed. Valid data from conversion n on the databus.  
1
1
0
0
Enables databus with valid data from conversion n.  
1
Enables databus with valid data from conversion n-1(1). Conversion n in progress.  
Enables databus with valid data from conversion n-1(1). Conversion n in progress.  
Data is invalid. CS and/or R/C must be high when BUSY goes high.  
Conversion n is halted. Causes ADC to reset.(2)  
0
0
0
X
0
(1) See Figure 19 and Figure 20 for constraints on data valid from conversion n-1.  
(2) See Figure 22 for details on ADC reset.  
200  
1
2
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
+5V  
10 µF  
+
+
33.2 kΩ  
0.1 µF  
3
+
2.2 µF  
BUSY  
R/C  
4
+
Convert Pulse  
40 ns Min  
2.2 µF  
5
6
D11 (MSB)  
D10  
7
DZ Low  
DZ Low  
DZ Low  
DZ Low  
D0 (LSB)  
D1  
ADS8504  
8
D9  
9
D8  
D7  
D6  
D5  
D4  
10  
11  
12  
13  
14  
D2  
D3  
Figure 17. Basic Operation  
READING DATA  
The ADS8504 outputs full or byte-reading parallel data in binary 2's complement data output format. The parallel  
output is active when R/C (pin 24) is high and CS (pin 25) is low. Any other combination of CS and R/C 3-states  
the parallel output. Valid conversion data can be read in a full parallel, 12-bit word or two 8-bit bytes on pins  
6-13 and pins 15-22. BYTE (pin 23) can be toggled to read both bytes within one conversion cycle. Refer to  
Table 2 for ideal output codes and Figure 18 for bit locations relative to the state of BYTE.  
9
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Table 2. Ideal Input Voltages and Output Codes  
DIGITAL OUTPUT BINARY 2's COMPLEMENT  
DESCRIPTION  
ANALOG INPUT  
BINARY CODE  
HEX CODE  
Full-scale range  
Least significant bit (LSB)  
Full scale (10 V-1 LSB)  
Midscale  
±10 V  
4.88 mV  
9.99512 V  
0 V  
0111 1111 1111  
0000 0000 0000  
1111 1111 1111  
1000 0000 0000  
7FF  
000  
FFF  
800  
One LSB below midscale  
-Full scale  
-4.88 mV  
-10 V  
PARALLEL OUTPUT (After a Conversion)  
After conversion n is completed and the output registers have been updated, BUSY (pin 26) goes high. Valid  
data from conversion n is available on D11-D0 (pins 6-13 and 15-18). BUSY going high can be used to latch the  
data. Refer to Table 3 and Figure 19, Figure 20, and Figure 21 for timing specifications.  
PARALLEL OUTPUT (During a Conversion)  
After conversion n has been initiated, valid data from conversion n-1 can be read and is valid up to t2 (2.2 µs  
typ) after the start of conversion n. Do not attempt to read data from t2 (2.2 µs typ) after the start of conversion n  
until BUSY (pin 26) goes high; this may result in reading invalid data. Refer to Table 3 and Figure 19, Figure 20,  
and Figure 21 for timing specifications.  
Note: For the best possible performance, data should not be read during a conversion. The switching noise of  
the asynchronous data transfer can cause digital feedthrough degrading the converter's performance.  
The number of control lines can be reduced by tying CS low while using the falling edge of R/C to initiate  
conversions and the rising edge of R/C to activate the output mode of the converter. See Figure 19.  
Table 3. Conversion Timing  
SYMBOL DESCRIPTION  
tw1 Pulse duration, convert  
ta  
MIN  
TYP  
MAX  
1750  
3.2  
UNITS  
ns  
40  
Access time, data valid after R/C low  
Propagation delay time, BUSY from R/C low  
Pulse duration, BUSY low  
2.2  
15  
µs  
ns  
tpd  
tw2  
td1  
td2  
tconv  
tacq  
tdis  
td3  
tv  
25  
2.2  
µs  
ns  
Delay time, BUSY after end of conversion  
Delay time, aperture  
5
5
ns  
Conversion time  
2.2  
83  
µs  
µs  
ns  
Acquisition time  
1.8  
10  
Disable time, bus  
30  
50  
2
Delay time, BUSY after data valid  
Valid time, previous data remains valid after R/C low  
35  
ns  
1.5  
µs  
µs  
ns  
tconv + tacq Throughput time  
4
tsu  
tc  
Setup time, R/C to CS  
10  
4
Cycle time between conversions  
Enable time, bus  
µs  
ns  
ten  
td4  
10  
5
30  
10  
83  
30  
Delay time, BYTE  
ns  
10  
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BYTE LOW  
ADS8504  
BYTE HIGH  
+5 V  
Bit 4  
Bit 11 (MSB)  
Bit 10  
6
7
23  
22  
21  
20  
19  
18  
17  
16  
15  
6
23  
22  
21  
20  
19  
18  
17  
16  
15  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
Low  
Low  
Low  
Low  
7
Low  
ADS8504  
Bit 9  
8
8
Bit 5  
Low  
Bit 8  
9
9
Bit 6  
Low  
Bit 7  
10  
10  
11  
12  
13  
14  
Bit 7  
Low  
Bit 6 11  
Bit 5 12  
Bit 8  
Bit 0 (LSB)  
Bit 1  
Bit 9  
Bit 4  
13  
14  
Bit 10  
Bit 11 (MSB)  
Bit 2  
Bit 3  
Figure 18. Bit Locations Relative to State of BYTE (Pin 23)  
t
w1  
R/C  
t
c
t
a1  
t
w2  
BUSY  
MODE  
t
t
pd  
t
d1  
d2  
Acquire  
Convert  
t
Acquire  
Convert  
t
conv  
acq  
Previous  
Data Valid  
Previous  
Data Valid  
Hi−Z  
Not Valid Data Valid  
Hi−Z  
Data Valid  
DATA BUS  
t
d3  
t
dis  
t
v
Figure 19. Conversion Timing with Outputs Enabled after Conversion (CS Tied Low)  
t
su  
t
su  
t
su  
t
su  
R/C  
CS  
t
w1  
t
pd  
t
w2  
BUSY  
MODE  
t
d2  
Convert  
conv  
Acquire  
Acquire  
t
Hi−Z State  
Data Valid  
DATA BUS  
Hi−Z State  
t
en  
t
dis  
Figure 20. Using CS to Control Conversion and Read Timing  
11  
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t
su  
t
su  
R/C  
CS  
BYTE  
Pins 6 − 13 Hi−Z  
Pins 15 − 18 Hi−Z  
High Byte  
Low Byte  
Hi−Z  
t
en  
t
d4  
t
dis  
Low Byte  
High Byte  
Hi−Z  
Figure 21. Using CS and BYTE to Control Data Bus  
tc  
tw1  
tw1  
R/C  
tpd  
tpd  
BUSY  
0 ns MIN  
4.75V  
VANA  
VDIG  
Unknown  
Hi-Z  
Not Valid  
Hi-Z  
Not Valid  
Data Valid  
td3  
DATA BUS  
Figure 22. ADC Reset  
ADC RESET  
The ADC reset function of the ADS8504 can be used to terminate the current conversion cycle. Bringing R/C low  
for at least 40 ns while BUSY is low will initiate the ADC reset. To initiate a new conversion, R/C must return to  
the high state and remain high long enough to acquire a new sample (see Table 3, tc) before going low to initiate  
the next conversion sequence. In applications that do not monitor the BUSY signal, it is recommended that the  
ADC reset function be implemented as part of a system initialization sequence.  
INPUT RANGES  
The ADS8504 offers a standard ±10-V input range. Figure 24 shows the necessary circuit connections for the  
ADS8504 with and without hardware trim. Offset and full-scale error specifications are tested and specified with  
the fixed resistors shown in Figure 24(b). Full-scale error includes offset and gain errors measured at both +FS  
and -FS. Adjustments for offset and gain are described in the Calibration section of this data sheet.  
The offset and gain are adjusted internally to allow external trimming with a single supply. The external resistors  
compensate for this adjustment and can be left out if the offset and gain are corrected in software (refer to the  
Calibration section).  
12  
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The nominal input impedance of 11.5 kresults from the combination of the internal resistor network shown on  
the front page of the product data sheet and the external resistors. The input resistor divider network provides  
inherent overvoltage protection assured to at least ±25 V. The 1% resistors used for the external circuitry do not  
compromise the accuracy or drift of the converter. They have little influence relative to the internal resistors, and  
tighter tolerances are not required.  
The input signal must be referenced to AGND1. This will minimize the ground loop problem typical to analog  
designs. The analog input should be driven by a low impedance source. A typical driving circuit using OPA627  
or OPA132 is shown in Figure 23.  
+15V  
2.2 mF  
22 pF  
ADS8504  
200 W  
100 nF  
VIN  
GND  
2 kW  
Pin 7  
Pin 2  
Pin1  
2 kW  
REF  
Vin  
OPA 627  
22 pF  
2.2 mF  
or  
33.2 kW  
2.2 mF  
Pin 6  
OPA 132  
+
AGND1  
CAP  
Pin3  
Pin4  
GND  
2.2 mF  
GND  
DGND  
GND  
100 nF  
GND  
AGND2  
15V  
GND  
Figure 23. Typical Driving Circuitry (±10 V, No Trim)  
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APPLICATION INFORMATION  
CALIBRATION  
The ADS8504 can be trimmed in hardware or software. The offset should be trimmed before the gain since the  
offset directly affects the gain. To achieve optimum performance, several iterations may be required.  
Hardware Calibration  
To calibrate the offset and gain of the ADS8504, install the proper resistors and potentiometers as shown in  
Figure 24(a).  
Software Calibration  
To calibrate the offset and gain of the ADS8504 in software, no external resistors are required. See the No  
Calibration section for details on the effects of the external resistors. Refer to Table 4 for range of offset and  
gain errors with and without external resistors.  
No Calibration  
See Figure 24(b) for circuit connections. The external resistors shown in Figure 24(b) may not be necessary in  
some applications. These resistors provide compensation for an internal adjustment of the offset and gain which  
allows calibration with a single supply. Refer to Table 4 for range of offset and gain errors with and without  
external resistors.  
Table 4. Typical Offset (Bipolar Zero Error, BPZ) and Gain Errors With and Without External Resistors  
WITH EXTERNAL RESISTORS  
-4.88 < BPZ < 4.88  
-1 < BPZ < 1  
WITHOUT EXTERNAL RESISTORS  
-56.6 < BPZ < -32.2  
UNITS  
mV  
BPZ  
-11.6 < BPZ < -6.6  
LSBs  
+Full scale  
–Full scale  
-0.25 < Error < 0.25  
-0.25 < Error < 0.25  
-2.5 < Error < -1.25  
Gain error  
% of FSR  
-3.5 < Error < -2.25  
200  
200 Ω  
1
1
2
3
4
5
±10 V  
V
IN  
V
±10 V  
IN  
2
3
4
5
AGND1  
AGND1  
REF  
33.2 kΩ  
+5 V  
2.2 µF  
2.2 µF  
2.2 µF  
33.2 kΩ  
+
+
+
REF  
576 kΩ  
50 kΩ  
Gain  
Offset  
CAP  
CAP  
+
50 kΩ  
2.2 µF  
AGND2  
AGND2  
(a) ±10 V With Hardware Trim  
Note: Use 1% metal film resistors.  
(b) ±10 V Without Hardware Trim  
Figure 24. Circuit Diagram With and Without External Trim Hardware  
REFERENCE  
The ADS8504 can operate with its internal 2.5-V reference or an external reference. By applying an external  
reference to pin 5, the internal reference can be bypassed. The reference voltage at REF is buffered internally  
with the output on CAP (pin 4).  
The internal reference has an 8 ppm/°C drift (typical) and accounts for approximately 20% of the full-scale error  
(FSE = ±0.5%).  
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REF  
REF (pin 3) is an input for an external reference or the output for the internal 2.5-V reference. A 2.2-µF capacitor  
should be connected as close to the REF pin as possible. The capacitor and the output resistance of REF create  
a low-pass filter to bandlimit noise on the reference. Using a smaller value capacitor introduces more noise to  
the reference degrading the SNR and SINAD. The REF pin should not be used to drive external ac or dc loads.  
The range for the external reference is 2.3 V to 2.7 V and determines the actual LSB size. Increasing the  
reference voltage increases the full-scale range and the LSB size of the converter which can improve the SNR.  
CAP  
CAP (pin 4) is the output of the internal reference buffer. A 2.2-µF capacitor should be placed as close to the  
CAP pin as possible to provide optimum switching currents for the CDAC throughout the conversion cycle and  
compensation for the output of the internal buffer. Using a capacitor any smaller than 1 µF can cause the output  
buffer to oscillate and may not have sufficient charge for the CDAC. Capacitor values larger than 2.2 µF have  
little affect on improving performance. The ESR (equivalent series resistance) of these compensation capacitors  
is also critical. Keep the total ESR under 3 . See the TYPICAL CHARACTERISTICS section for how  
performance is affected by ESR.  
The output of the buffer is capable of driving up to 2 mA of current to a dc load. A dc load requiring more than 2  
mA of current from the CAP pin begins to degrade the linearity of the ADS8504. Using an external buffer allows  
the internal reference to be used for larger dc loads and ac loads. Do not attempt to directly drive an ac load  
with the output voltage on CAP. This causes performance degradation of the converter.  
LAYOUT  
POWER  
For optimum performance, tie the analog and digital power pins to the same +5-V power supply and tie the  
analog and digital grounds together. As noted in the electrical specifications, the ADS8504 uses 90% of its  
power for the analog circuitry. The ADS8504 should be considered as an analog component.  
The +5-V power for the A/D should be separate from the +5 V used for the system's digital logic. Connecting  
VDIG (pin 28) directly to a digital supply can reduce converter performance due to switching noise from the digital  
logic. For best performance, the +5-V supply can be produced from whatever analog supply is used for the rest  
of the analog signal conditioning. If +12-V or +15-V supplies are present, a simple +5-V regulator can be used.  
Although it is not suggested, if the digital supply must be used to power the converter, be sure to properly filter  
the supply. Either using a filtered digital supply or a regulated analog supply, both VDIG and VANA should be tied  
to the same +5-V source.  
GROUNDING  
Three ground pins are present on the ADS8504. DGND is the digital supply ground. AGND2 is the analog  
supply ground. AGND1 is the ground which all analog signals internal to the A/D are referenced. AGND1 is more  
susceptible to current induced voltage drops and must have the path of least resistance back to the power  
supply.  
All the ground pins of the A/D should be tied to the analog ground plane, separated from the system's digital  
logic ground, to achieve optimum performance. Both analog and digital ground planes should be tied to the  
system ground as near to the power supplies as possible. This helps to prevent dynamic digital ground currents  
from modulating the analog ground through a common impedance to power ground.  
SIGNAL CONDITIONING  
The FET switches used for the sample hold on many CMOS A/D converters release a significant amount of  
charge injection which can cause the driving op amp to oscillate. The FET switch on the ADS8504, compared to  
the FET switches on other CMOS A/D converters, releases 5%-10% of the charge. There is also a resistive front  
end which attenuates any charge which is released. The end result is a minimal requirement for the anti-alias  
filter on the front end. Any op amp sufficient for the signal in an application is sufficient to drive the ADS8504.  
The resistive front end of the ADS8504 also provides an assured ±25-V overvoltage protection. In most cases,  
this eliminates the need for external input protection circuitry.  
15  
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LAYOUT (continued)  
INTERMEDIATE LATCHES  
The ADS8504 does have 3-state outputs for the parallel port, but intermediate latches should be used if the bus  
is to be active during conversions. If the bus is not active during conversion, the 3-state outputs can be used to  
isolate the A/D from other peripherals on the same bus. The 3-state outputs can also be used when the A/D is  
the only peripheral on the data bus.  
Intermediate latches are beneficial on any monolithic A/D converter. The ADS8504 has an internal LSB size of  
610 µV. Transients from fast switching signals on the parallel port, even when the A/D is 3-stated, can be  
coupled through the substrate to the analog circuitry causing degradation of converter performance.  
16  
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Revision History  
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.  
Changes from Original (June, 2005) to A Revision ....................................................................................................... Page  
Deleted text from basic operation description ...................................................................................................................... 8  
Changed text in starting a conversion description................................................................................................................ 8  
Changed operation descriptions and R/C in table................................................................................................................ 9  
Added SAR Reset Timing................................................................................................................................................... 12  
Added ADC RESET section ............................................................................................................................................... 12  
17  
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PACKAGE OPTION ADDENDUM  
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10-Dec-2020  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
ADS8504IBDW  
ACTIVE  
ACTIVE  
SOIC  
SOIC  
DW  
DW  
28  
28  
20  
RoHS & Green  
NIPDAU  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
-40 to 85  
-40 to 85  
ADS8504IB  
ADS8504IB  
ADS8504IBDWR  
1000 RoHS & Green  
NIPDAU  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
10-Dec-2020  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
5-Jan-2022  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
ADS8504IBDWR  
SOIC  
DW  
28  
1000  
330.0  
32.4  
11.35 18.67  
3.1  
16.0  
32.0  
Q1  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
5-Jan-2022  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SOIC DW 28  
SPQ  
Length (mm) Width (mm) Height (mm)  
350.0 350.0 66.0  
ADS8504IBDWR  
1000  
Pack Materials-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
5-Jan-2022  
TUBE  
*All dimensions are nominal  
Device  
Package Name Package Type  
DW SOIC  
Pins  
SPQ  
L (mm)  
W (mm)  
T (µm)  
B (mm)  
ADS8504IBDW  
28  
20  
506.98  
12.7  
4826  
6.6  
Pack Materials-Page 3  
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AND WITH ALL FAULTS, AND DISCLAIMS ALL WARRANTIES, EXPRESS AND IMPLIED, INCLUDING WITHOUT LIMITATION ANY  
IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE OR NON-INFRINGEMENT OF THIRD  
PARTY INTELLECTUAL PROPERTY RIGHTS.  
These resources are intended for skilled developers designing with TI products. You are solely responsible for (1) selecting the appropriate  
TI products for your application, (2) designing, validating and testing your application, and (3) ensuring your application meets applicable  
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SI9137LG

Multi-Output, Sequence Selectable Power-Supply Controller for Mobile Applications

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SI9122E

500-kHz Half-Bridge DC/DC Controller with Integrated Secondary Synchronous Rectification Drivers

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