CD54AC161 [TI]

4-BIT SYNCHRONOUS BINARY COUNTERS; 4位同步二进制计数器
CD54AC161
型号: CD54AC161
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

4-BIT SYNCHRONOUS BINARY COUNTERS
4位同步二进制计数器

计数器
文件: 总12页 (文件大小:158K)
中文:  中文翻译
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CD54AC161, CD74AC161  
4-BIT SYNCHRONOUS BINARY COUNTERS  
SCHS239A – SEPTEMBER 1998 – REVISED APRIL 2000  
CD54AC161 . . . F PACKAGE  
CD74AC161 . . . E OR M PACKAGE  
(TOP VIEW)  
Internal Look-Ahead for Fast Counting  
Carry Output for n-Bit Cascading  
Synchronous Counting  
CLR  
CLK  
A
V
CC  
RCO  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
Synchronously Programmable  
SCR-Latchup-Resistant CMOS Process and  
Circuit Design  
Q
A
B
Q
B
Exceeds 2 kV ESD Protection per  
MIL-STD-883, Method 3015  
C
Q
C
D
Q
D
ENP  
GND  
ENT  
LOAD  
Package Options Include Plastic  
Small-Outline (M), Standard Plastic (E) and  
Ceramic (F) DIPs  
description  
The CD54AC161 and CD74AC161 devices are 4-bit binary counters. These synchronous, presettable counters  
feature an internal carry look-ahead for application in high-speed counting designs. Synchronous operation is  
provided by having all flip-flops clocked simultaneously so that the outputs change coincident with each other  
when so instructed by the count-enable (ENP, ENT) inputs and internal gating. This mode of operation  
eliminates the output counting spikes that normally are associated with synchronous (ripple-clock) counters.  
A buffered clock (CLK) input triggers the four flip-flops on the rising (positive-going) edge of the clock waveform.  
These devices are fully programmable; that is, they can be preset to any number between 0 and 9 or 15.  
Presetting is synchronous; therefore, setting up a low level at the load input disables the counter and causes  
the outputs to agree with the setup data after the next clock pulse, regardless of the levels of the enable inputs.  
The clear function is asynchronous. A low level at the clear (CLR) input sets all four of the flip-flop outputs low,  
regardless of the levels of the CLK, load (LOAD), or enable inputs.  
The carry look-ahead circuitry provides for cascading counters for n-bit synchronous applications without  
additional gating. Instrumental in accomplishing this function are ENP, ENT, and a ripple-carry output (RCO).  
Both ENP and ENT must be high to count, and ENT is fed forward to enable RCO. Enabling RCO produces a  
high-level pulse while the count is maximum (9 or 15 with Q high). This high-level overflow ripple-carry pulse  
A
can be used to enable successive cascaded stages. Transitions at ENP or ENT are allowed, regardless of the  
level of CLK.  
The counters feature a fully independent clock circuit. Changes at control inputs (ENP, ENT, or LOAD) that  
modify the operating mode have no effect on the contents of the counter until clocking occurs. The function of  
the counter (whether enabled, disabled, loading, or counting) is dictated solely by the conditions meeting the  
stable setup and hold times.  
The CD54AC161 is characterized for operation over the full military temperature range of –55°C to 125°C.  
The CD74AC161 is characterized for operation from –40°C to 85°C.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Copyright 2000, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
CD54AC161, CD74AC161  
4-BIT SYNCHRONOUS BINARY COUNTERS  
SCHS239A – SEPTEMBER 1998 – REVISED APRIL 2000  
FUNCTION TABLE  
INPUTS  
OUTPUTS  
Q RCO  
n
FUNCTION  
Reset (clear)  
Parallel load  
CLR  
L
CLK  
ENP  
ENT  
LOAD  
A,B,C,D  
X
X
X
X
h
l
X
X
X
h
X
l
X
l
X
l
L
L
L
H
L
H
H
l
h
X
X
X
Note 1  
H
h
h
h
Count  
Note 1 Count  
H
X
X
q
q
Note 1  
Inhibit  
L
n
H
X
n
H = high level, L = low level, X = don’t care, h = high level one setup time prior to the CLK  
low-to-high transition, l = low level one setup time prior to the CLK low-to-high transition, q = the  
state of the referenced output prior to the CLK low-to-high transition, = CLK low-to-high  
transition.  
NOTE 1: The RCO output is high when ENT is high and the counter is at terminal count (HHHH).  
logic symbol  
CTRDIV16  
1
CT=0  
CLR  
9
M1  
M2  
G3  
LOAD  
15  
3CT=15  
RCO  
10  
ENT  
7
2
ENP  
CLK  
G4  
C5/2,3,4+  
3
4
5
6
14  
13  
12  
11  
[1]  
[2]  
[4]  
[8]  
Q
A
A
B
C
D
1,5D  
Q
B
Q
C
Q
D
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.  
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
CD54AC161, CD74AC161  
4-BIT SYNCHRONOUS BINARY COUNTERS  
SCHS239A – SEPTEMBER 1998 – REVISED APRIL 2000  
logic diagram (positive logic)  
9
LOAD  
10  
ENT  
15  
RCO  
LD  
7
ENP  
CK  
2
CLK  
CK  
LD  
1
CLR  
R
M1  
G2  
1, 2T/1C3  
14  
13  
Q
Q
A
B
G4  
3D  
4R  
3
A
M1  
G2  
1, 2T/1C3  
G4  
3D  
4R  
4
B
M1  
G2  
1, 2T/1C3  
12  
Q
C
G4  
3D  
4R  
5
C
M1  
G2  
1, 2T/1C3  
11  
Q
D
G4  
3D  
4R  
6
D
For simplicity, routing of complementary signals LD and CK is not shown on this overall logic diagram. The uses of these signals are shown  
on the logic diagram of the D/T flip-flops.  
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
CD54AC161, CD74AC161  
4-BIT SYNCHRONOUS BINARY COUNTERS  
SCHS239A – SEPTEMBER 1998 – REVISED APRIL 2000  
logic symbol, each D/T flip-flop  
LD (Load)  
M1  
G2  
1, 2T/1C3  
TE (Toggle Enable)  
CK (Clock)  
Q (Output)  
G4  
3D  
4R  
D (Inverted Data)  
R (Inverted Reset)  
logic diagram, each D/T flip-flop (positive logic)  
CK  
LD  
TE  
TG  
TG  
LD  
TG  
Q
TG  
LD  
CK  
D
R
CK  
TG  
TG  
CK  
CK  
The origins of LD and CK are shown in the logic diagram of the overall device.  
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
CD54AC161, CD74AC161  
4-BIT SYNCHRONOUS BINARY COUNTERS  
SCHS239A – SEPTEMBER 1998 – REVISED APRIL 2000  
typical clear, preset, count, and inhibit sequence  
The following sequence is illustrated below:  
1. Clear outputs to zero (asynchronous)  
2. Preset to binary 12  
3. Count to 13, 14, 15, 0, 1, and 2  
4. Inhibit  
CLR  
LOAD  
A
B
Data  
Inputs  
C
D
CLK  
ENP  
ENT  
Q
A
Q
Q
Q
B
C
D
Data  
Outputs  
RCO  
12  
13  
14  
15  
0
1
2
Count  
Inhibit  
Preset  
Async  
Clear  
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
CD54AC161, CD74AC161  
4-BIT SYNCHRONOUS BINARY COUNTERS  
SCHS239A – SEPTEMBER 1998 – REVISED APRIL 2000  
absolute maximum ratings over operating free-air temperature range  
Supply voltage range, V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 6 V  
CC  
I
Input clamp current, I (V < 0 V or V > V ) (see Note 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA  
IK  
I
CC  
Output clamp current, I  
(V < 0 V or V > V ) (see Note 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA  
OK  
O O CC  
Continuous output current, I (V > 0 V or V < V ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA  
Continuous current through V  
Package thermal impedance, θ (see Note 3): E package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67°C/W  
O
O
CC  
O
CC  
or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±100 mA  
JA  
M package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73°C/W  
Storage temperature range, T  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C  
stg  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
NOTES: 2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.  
3. The package thermal impedance is calculated in accordance with JESD 51.  
recommended operating conditions (see Note 4)  
T
= 25°C  
CD54AC161  
CD74AC161  
A
UNIT  
MIN  
1.5  
MAX  
MIN  
1.5  
MAX  
MIN  
1.5  
MAX  
V
V
Supply voltage  
5.5  
5.5  
5.5  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
= 1.5 V  
= 3 V  
1.2  
1.2  
1.2  
High-level input voltage  
2.1  
2.1  
2.1  
V
V
IH  
= 5.5 V  
= 1.5 V  
= 3 V  
3.85  
3.85  
3.85  
0.3  
0.9  
0.3  
0.9  
0.3  
0.9  
V
IL  
Low-level input voltage  
= 5.5 V  
1.65  
1.65  
1.65  
V
V
Input voltage  
0
0
V
V
0
0
V
V
0
0
V
V
V
V
I
CC  
CC  
CC  
Output voltage  
O
CC  
CC  
CC  
I
I
High-level output current  
Low-level output current  
–24  
24  
–24  
24  
–24  
24  
50  
20  
85  
mA  
mA  
OH  
OL  
V
V
= 1.5 V to 3 V  
0
0
50  
0
0
50  
0
0
CC  
t/v  
Input transition rise or fall rate  
ns  
= 3.6 V to 5.5 V  
20  
20  
CC  
T
Operating free-air temperature  
– 55  
125  
– 40  
°C  
A
NOTE 4: All unused inputs of the device must be held at V  
or GND to ensure proper device operation. Refer to the TI application report,  
CC  
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.  
6
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
CD54AC161, CD74AC161  
4-BIT SYNCHRONOUS BINARY COUNTERS  
SCHS239A – SEPTEMBER 1998 – REVISED APRIL 2000  
electrical characteristics over recommended operating free-air temperature range (unless  
otherwise noted)  
T
= 25°C  
CD54AC161  
CD74AC161  
A
PARAMETER  
TEST CONDITIONS  
V
UNIT  
CC  
MIN  
1.4  
2.9  
4.4  
2.58  
3.94  
MAX  
MIN  
1.4  
2.9  
4.4  
2.4  
3.7  
3.85  
MAX  
MIN  
1.4  
2.9  
4.4  
2.48  
3.8  
MAX  
1.5 V  
3 V  
I
= –50 µA  
OH  
4.5 V  
3 V  
V
OH  
V = V or V  
IH  
I
I
I
I
= –4 mA  
V
I
IL  
OH  
OH  
OH  
OH  
= –24 mA  
= –50 mA  
= –75 mA  
4.5 V  
5.5 V  
5.5 V  
1.5 V  
3 V  
3.85  
0.1  
0.1  
0.1  
0.36  
0.36  
0.1  
0.1  
0.1  
0.5  
0.5  
1.65  
0.1  
0.1  
0.1  
0.44  
0.44  
I
= 50 µA  
OL  
4.5 V  
3 V  
V
OL  
V = V or V  
I
I
I
I
= 12 mA  
= 24 mA  
V
I
IH  
IL  
OL  
OL  
OL  
OL  
4.5 V  
5.5 V  
5.5 V  
5.5 V  
5.5 V  
= 50 mA  
= 75 mA  
1.65  
±1  
I
I
V = V  
I
or GND  
or GND,  
±0.1  
8
±1  
µA  
µA  
pF  
I
CC  
CC  
V = V  
I
I
O
= 0  
160  
10  
80  
CC  
C
10  
10  
i
Testoneoutputatatime, notexceeding1-secondduration. Measurementismadebyforcingindicatedcurrentandmeasuringvoltagetominimize  
power dissipation. Test verifies a minimum 50-transmission-line drive capability at 85°C and 75-transmission-line drive capability at 125°C.  
7
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
CD54AC161, CD74AC161  
4-BIT SYNCHRONOUS BINARY COUNTERS  
SCHS239A – SEPTEMBER 1998 – REVISED APRIL 2000  
timing requirements over recommended operating free-air temperature range (unless otherwise  
noted)  
CD54AC161  
CD74AC161  
V
UNIT  
CC  
MIN  
MAX  
7
MIN  
MAX  
8
1.5 V  
3.3 V ± 0.3 V  
5 V ± 0.5 V  
1.5 V  
f
Clock frequency  
Pulse duration  
64  
73  
MHz  
clock  
90  
103  
69  
7.7  
5.5  
63  
7
61  
6.8  
4.8  
55  
6.1  
4.4  
55  
6.1  
4.4  
66  
7.4  
5.3  
0
CLK high or low  
CLR low  
3.3 V ± 0.3 V  
5 V ± 0.5 V  
1.5 V  
t
w
ns  
3.3 V ± 0.3 V  
5 V ± 0.5 V  
1.5 V  
5
63  
7
A, B, C, or D  
LOAD  
3.3 V ± 0.3 V  
5 V ± 0.5 V  
1.5 V  
5
t
su  
Setup time, before CLK↑  
ns  
75  
8.4  
6
3.3 V ± 0.3 V  
5 V ± 0.5 V  
1.5 V  
0
A, B, C, or D  
ENP or ENT  
3.3 V ± 0.3 V  
5 V ± 0.5 V  
1.5 V  
0
0
0
0
t
t
Hold time, after CLK↑  
ns  
ns  
h
0
0
3.3 V ± 0.3 V  
5 V ± 0.5 V  
1.5 V  
0
0
0
0
75  
8.4  
6
66  
7.4  
5.3  
Recovery time, CLRbefore CLK↑  
3.3 V ± 0.3 V  
5 V ± 0.5 V  
rec  
8
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
CD54AC161, CD74AC161  
4-BIT SYNCHRONOUS BINARY COUNTERS  
SCHS239A – SEPTEMBER 1998 – REVISED APRIL 2000  
switching characteristics over recommended operating free-air temperature range, C = 50 pF  
L
(unless otherwise noted) (see Figure 1)  
CD54AC161  
CD74AC161  
FROM  
(INPUT)  
TO  
(OUTPUT)  
PARAMETER  
V
UNIT  
CC  
MIN  
7
MAX  
MIN  
8
MAX  
1.5 V  
f
max  
3.3 V ± 0.3 V  
5 V ± 0.5 V  
1.5 V  
64  
90  
73  
103  
MHz  
209  
23.4  
16.7  
207  
190  
21  
RCO  
Any Q  
RCO  
3.3 V ± 0.3 V  
5 V ± 0.5 V  
1.5 V  
6
6
4.3  
4.3  
15.2  
188  
21  
CLK  
ENT  
CLR  
3.3 V ± 0.3 V  
5 V ± 0.5 V  
1.5 V  
5.9  
4.2  
23.1  
16.5  
129  
5.9  
4.2  
15  
117  
13.1  
9.4  
188  
21  
t
pd  
3.3 V ± 0.3 V  
5 V ± 0.5 V  
1.5 V  
3.6  
2.6  
14.4  
10.3  
207  
3.7  
2.7  
ns  
Any Q  
RCO  
3.3 V ± 0.3 V  
5 V ± 0.5 V  
1.5 V  
5.9  
4.2  
23.1  
16.5  
207  
5.9  
4.2  
15  
188  
21  
3.3 V ± 0.3 V  
5 V ± 0.5 V  
5.9  
4.2  
23.1  
16.5  
5.9  
4.2  
15  
operating characteristics, T = 25°C  
A
PARAMETER  
TEST CONDITIONS  
TYP  
UNIT  
C
Power dissipation capacitance  
No load  
66  
pF  
pd  
9
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
CD54AC161, CD74AC161  
4-BIT SYNCHRONOUS BINARY COUNTERS  
SCHS239A – SEPTEMBER 1998 – REVISED APRIL 2000  
PARAMETER MEASUREMENT INFORMATION  
2 × V  
CC  
Open  
GND  
TEST  
S1  
S1  
R1 = 500 Ω  
R2 = 500 Ω  
t
/t  
Open  
PLH PHL  
From Output  
Under Test  
t
/t  
2 × V  
CC  
GND  
PLZ PZL  
t
/t  
PHZ PZH  
C
= 50 pF  
L
(see Note A)  
t
w
V
CC  
NOTE: When V  
= 1.5 V, R1 and R2 = 1 k.  
CC  
50% V  
50% V  
CC  
Input  
CC  
LOAD CIRCUIT  
0 V  
VOLTAGE WAVEFORMS  
PULSE DURATION  
V
V
CC  
CC  
Reference  
Input  
CLR  
Input  
50% V  
50% V  
CC  
CC  
0 V  
0 V  
t
t
h
su  
t
rec  
V
V
CC  
CC  
Data  
Input  
90%  
90%  
50% V  
50%  
10%  
50% V  
10%  
CLK  
CC  
CC  
0 V  
0 V  
t
t
f
r
VOLTAGE WAVEFORMS  
RECOVERY TIME  
VOLTAGE WAVEFORMS  
SETUP AND HOLD AND INPUT RISE AND FALL TIMES  
V
CC  
V
CC  
Input  
50% V  
50% V  
CC  
CC  
PHL  
90%  
Output  
Control  
50% V  
50% V  
CC  
CC  
0 V  
0 V  
t
t
PLH  
t
t
PLZ  
PZL  
V
OH  
CC  
In-Phase  
Output  
Output  
Waveform 1  
90%  
t
V
CC  
50%  
10%  
50% V  
10%  
50% V  
CC  
CC  
V
V
V
+ 0.3 V  
OL  
OL  
S1 at 2 × V  
(see Note B)  
CC  
t
f
r
V
OL  
t
t
PLH  
PHL  
90%  
t
t
PZH  
PHZ  
V
V
OH  
90%  
Output  
Waveform 2  
S1 at Open  
(see Note B)  
Out-of-Phase  
Output  
V
50% V  
10%  
50%  
10%  
OH  
CC  
– 0.3 V  
OH  
50% V  
OL  
t
t
0 V  
f
r
VOLTAGE WAVEFORMS  
PROPAGATION DELAY AND OUTPUT TRANSITION TIMES  
VOLTAGE WAVEFORMS  
OUTPUT ENABLE AND DISABLE TIMES  
NOTES: A.  
C includes probe and test-fixture capacitance.  
L
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.  
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.  
C. All input pulses are supplied by generators having the following characteristics: PRR 1 MHz, Z = 50 , t = 3 ns, t = 3 ns.  
O
r
f
Phase relationships between waveforms are arbitrary.  
D. For clock inputs, f is measured with the input duty cycle at 50%.  
max  
E. The outputs are measured one at a time with one input transition per measurement.  
F.  
G.  
H.  
t
t
t
and t  
and t  
and t  
are the same as t  
.
pd  
PLH  
PZL  
PLZ  
PHL  
PZH  
PHZ  
are the same as t  
are the same as t  
.
en  
dis  
.
Figure 1. Load Circuit and Voltage Waveforms  
10  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgment, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
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