CD74FCT373AT [TI]

FCT Interface Logic Octal Transparent Latch, Three-State; FCT接口逻辑八路透明锁存器,三态
CD74FCT373AT
型号: CD74FCT373AT
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

FCT Interface Logic Octal Transparent Latch, Three-State
FCT接口逻辑八路透明锁存器,三态

锁存器
文件: 总2页 (文件大小:19K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CD54/74FCT373,  
CD54/74FCT373AT,  
Data sheet acquired from Harris Semiconductor  
SCHS272  
CD54/74FCT533  
FCT Interface Logic  
Octal Transparent Latch, Three-State  
February 1996  
Features  
Description  
• CD54/74FCT373, CD54/74FCT373AT - Non-Inverting  
The CD54/74FCT373, 373AT, and 533 octal transparent  
latches use a small-geometry BiCMOS technology. The output  
stage is a combination of bipolar and CMOS transistors that  
limits the output-HIGH level to two diode drops below VCC. This  
resultant lowering of output swing (0V to 3.7V) reduces power  
bus ringing (a source of EMI) and minimizes VCC bounce and  
ground bounce and their effects during simultaneous output  
switching. The output configuration also enhances switching  
speed and is capable of sinking 32mA to 48mA.  
• CD54/74FCT533 - Inverting  
• Buffered inputs  
• Typical Propagation Delay: 3.9ns at VCC = 5V,  
o
TA = +25 C, CL = 50pF (FCT373AT)  
• SCR-Latchup-Resistant BiCMOS Process and Circuit  
Design  
The CD54/74FCT373, 373AT, and 533 outputs are transpar-  
ent to the inputs when the Latch Enable (LE) is HIGH. When  
the Latch Enable (LE) goes LOW, the data is latched. The  
Output Enable (OE) controls the three-state outputs. When  
the Output Enable (OE) is HIGH, the outputs are in the high-  
impedance state. The latch operation is independent of the  
state of the Output Enable.  
• FCTXXX Types - Speed of Bipolar FAST®/AS/S;  
FCTXXXAT Types - 30% Faster than FAST/AS/S with  
Significantly Reduced Power Consumption  
• 48mA to 32mA Output Sink Current (Commercial/  
Extended Industrial)  
• Output Voltage Swing Limited to 3.7V at VCC = 5V  
• Controlled Output-Edge Rates  
Ordering Information  
o
PART NUMBER  
CD54/74FCT373E  
CD54/74FCT373ATE  
CD54/74FCT533E  
CD54/74FCT373M  
CD54/74FCT373ATM  
CD54/74FCT533M  
CD54/74FCT373SM  
CD54/74FCT533SM  
CD54FCT373H  
TEMP. RANGE ( C)  
PACKAGE  
• Input/Output Isolation to VCC  
-55 to 125, 0 to 70 20 Ld PDIP  
-55 to 125, 0 to 70 20 Ld PDIP  
-55 to 125, 0 to 70 20 Ld PDIP  
-55 to 125, 0 to 70 20 Ld SOIC  
-55 to 125, 0 to 70 20 Ld SOIC  
-55 to 125, 0 to 70 20 Ld SOIC  
-55 to 125, 0 to 70 20 Ld SSOP  
-55 to 125, 0 to 70 20 Ld SSOP  
-55 to 125  
• BiCMOS Technology with Low Quiescent Power  
CD54FCT533H  
-55 to 125  
Functional Diagram  
TRUTH TABLE  
373  
533  
OUTPUT  
ENABLE  
LATCH  
ENABLE  
373,373AT  
OUTPUT  
533  
OUTPUT  
3
4
2
D0  
D1  
D2  
D3  
D4  
D5  
D6  
D7  
Q0  
Q1  
Q2  
Q3  
Q4  
Q5  
Q6  
Q7  
Q0  
Q1  
Q2  
Q3  
Q4  
Q5  
Q6  
Q7  
DATA  
5
7
6
L
L
L
L
H
H
H
L
H
L
I
H
L
L
H
H
L
8
9
13  
14  
17  
18  
12  
15  
16  
19  
L
L
h
X
H
Z
X
Z
11  
1
LE  
H = HIGH voltage level.  
L = LOW voltage level.  
X = Irrelevant.  
I = LOW voltage level one setup time  
prior to the high-to-low latch enable  
transition.  
OE  
Z = HIGH Impedance.  
h = HIGH voltage level one setup time  
prior to the high-to-low latch enable  
transition.  
FAST® is a registered trademark of Fairchild Semiconductor Corporation.  
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.  
File Number 2230.2  
Copyright © Harris Corporation 1996  
1
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL  
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR  
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER  
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO  
BE FULLY AT THE CUSTOMER’S RISK.  
In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other  
intellectual property right of TI covering or relating to any combination, machine, or process in which such  
semiconductor products or services might be or are used. TI’s publication of information regarding any third  
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.  
Copyright 1999, Texas Instruments Incorporated  

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