CD74HCT280 [TI]

High Speed CMOS Logic 9-Bit Odd/Even Parity Generator/Checker; 高速CMOS逻辑9位奇/偶校验发生器/校验器
CD74HCT280
型号: CD74HCT280
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

High Speed CMOS Logic 9-Bit Odd/Even Parity Generator/Checker
高速CMOS逻辑9位奇/偶校验发生器/校验器

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CD74HC280,  
CD74HCT280  
Data sheet acquired from Harris Semiconductor  
SCHS175  
High Speed CMOS Logic  
November 1997  
9-Bit Odd/Even Parity Generator/Checker  
at V  
= 5V  
Features  
CC  
• HCT Types  
- 4.5V to 5.5V Operation  
- Direct LSTTL Input Logic Compatibility,  
V = 0.8V (Max), V = 2V (Min)  
IL IH  
• Typical Propagation Delay = 17ns at V  
o
= 5V,  
CC  
C = 15pF, T = 25 C  
L
A
[ /Title  
(CD74  
HC280  
,
CD74  
HCT28  
0)  
• Replaces 74LS180 Types  
• Easily Cascadable  
- CMOS Input Compatibility, I 1µA at V , V  
l
OL OH  
• Fanout (Over Temperature Range)  
- Standard Outputs. . . . . . . . . . . . . . . 10 LSTTL Loads  
- Bus Driver Outputs . . . . . . . . . . . . . 15 LSTTL Loads  
Description  
The Harris CD74HC280 and CD74HCT280 are 9-bit  
odd/even parity, generator checker devices. Both even and  
odd parity outputs are available for checking or generating  
parity for words up to nine bits long. Even parity is indicated  
(ΣE output is high) when an even number of data inputs is  
high. Odd parity is indicated (ΣO output is high) when an odd  
number of data inputs is high. Parity checking for words larger  
than 9 bits can be accomplished by tying the ΣE output to any  
input of an additional HC/HCT280 parity checker.  
o
o
• Wide Operating Temperature Range . . . -55 C to 125 C  
• Balanced Propagation Delay and Transition Times  
/Sub-  
ject  
• Significant Power Reduction Compared to LSTTL  
Logic ICs  
(High  
Speed  
CMOS  
Logic  
9-Bit  
Odd/E  
ven  
• HC Types  
- 2V to 6V Operation  
- High Noise Immunity: N = 30%, N = 30% of V  
IL IH CC  
Ordering Information  
Functional Diagram  
Pinout  
CD74HC280, CD74HCT280  
(PDIP)  
Parity  
8
I0  
TOP VIEW  
9
I1  
I6  
I7  
1
2
3
4
5
6
7
14 V  
CC  
10  
I2  
I3  
5
6
13 I5  
12 I4  
11 I3  
10 I2  
EVEN  
ODD  
11  
12  
13  
1
NC  
I8  
I4  
I5  
I6  
ΣE  
ΣO  
GND  
9
8
I1  
I0  
2
4
I7  
I8  
GND = 7  
= 14  
V
CC  
NC = 3  
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.  
File Number 1669.1  
Copyright © Harris Corporation 1997  
1
CD74HC280, CD74HCT280  
Absolute Maximum Ratings  
Thermal Information  
o
DC Supply Voltage, V  
. . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V  
Thermal Resistance (Typical, Note 3)  
θ
( C/W)  
CC  
DC Input Diode Current, I  
For V < -0.5V or V > V  
JA  
IK  
PDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
SOIC Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
90  
+ 0.5V. . . . . . . . . . . . . . . . . . . . . .±20mA  
OK  
For V < -0.5V or V > V  
I
I
CC  
175  
o
DC Output Diode Current, I  
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . 150 C  
Maximum Storage Temperature Range . . . . . . . . . .-65 C to 150 C  
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . . 300 C  
o
o
+ 0.5V . . . . . . . . . . . . . . . . . . . .±20mA  
O
O
CC  
o
DC Drain Current, per Output, I  
O
For -0.5V < V < V  
+ 0.5V. . . . . . . . . . . . . . . . . . . . . . . . . .±25mA  
O
CC  
(SOIC - Lead Tips Only)  
DC Output Source or Sink Current per Output Pin, I  
O
For V > -0.5V or V < V  
+ 0.5V . . . . . . . . . . . . . . . . . . . .±25mA  
O
O
CC  
DC V  
or Ground Current, I  
. . . . . . . . . . . . . . . . . . . . . . . . .±50mA  
CC  
CC  
Operating Conditions  
o
o
Temperature Range, T . . . . . . . . . . . . . . . . . . . . . . -55 C to 125 C  
A
Supply Voltage Range, V  
CC  
HC Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2V to 6V  
HCT Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 5.5V  
DC Input or Output Voltage, V , V . . . . . . . . . . . . . . . . . 0V to V  
I
O
CC  
Input Rise and Fall Time  
2V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000ns (Max)  
4.5V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500ns (Max)  
6V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400ns (Max)  
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation  
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.  
NOTE:  
3. θ is measured with the component mounted on an evaluation PC board in free air.  
JA  
DC Electrical Specifications  
TEST  
CONDITIONS  
o
o
o
o
o
25 C  
-40 C TO 85 C  
-55 C TO 125 C  
PARAMETER  
HC TYPES  
SYMBOL V (V)  
I
(mA)  
V
(V) MIN TYP MAX  
MIN  
MAX  
MIN  
MAX  
UNITS  
I
O
CC  
High Level Input  
Voltage  
V
-
-
-
2
1.5  
3.15  
4.2  
-
-
-
-
-
-
-
-
-
-
-
-
-
1.5  
3.15  
4.2  
-
-
1.5  
3.15  
4.2  
-
-
V
V
V
V
V
V
V
V
V
V
V
IH  
4.5  
-
-
-
6
2
-
-
-
Low Level Input  
Voltage  
V
-
0.5  
0.5  
0.5  
IL  
4.5  
6
-
1.35  
-
1.35  
-
1.35  
-
1.8  
-
1.8  
-
1.8  
High Level Output  
Voltage  
CMOS Loads  
V
V
V
or  
-0.02  
2
1.9  
4.4  
5.9  
3.98  
5.48  
-
-
-
-
-
1.9  
4.4  
5.9  
3.84  
5.34  
-
-
-
-
-
1.9  
4.4  
5.9  
3.7  
5.2  
-
-
-
-
-
OH  
IH  
V
IL  
-0.02  
-0.02  
-4  
4.5  
6
High Level Output  
Voltage  
TTL Loads  
4.5  
6
-5.2  
Low Level Output  
Voltage  
CMOS Loads  
V
or  
0.02  
0.02  
0.02  
4
2
4.5  
6
-
-
-
-
-
-
-
-
-
-
0.1  
0.1  
-
-
-
-
-
0.1  
0.1  
-
-
-
-
-
0.1  
0.1  
0.1  
0.4  
0.4  
V
V
V
V
V
OL  
IH  
V
IL  
0.1  
0.1  
Low Level Output  
Voltage  
TTL Loads  
4.5  
6
0.26  
0.26  
0.33  
0.33  
5.2  
Input Leakage  
Current  
I
V
or  
-
6
6
-
-
-
-
±0.1  
-
-
±1  
-
-
±1  
µA  
µA  
I
CC  
GND  
Quiescent Device  
Current  
I
V
or  
0
8
80  
160  
CC  
CC  
GND  
2
CD74HC280, CD74HCT280  
DC Electrical Specifications  
(Continued)  
TEST  
CONDITIONS  
o
o
o
o
o
25 C  
-40 C TO 85 C  
-55 C TO 125 C  
PARAMETER  
HCT TYPES  
SYMBOL V (V)  
I
(mA)  
V (V) MIN TYP MAX  
CC  
MIN  
MAX  
MIN  
MAX  
UNITS  
I
O
High Level Input  
Voltage  
V
-
-
-
-
4.5 to  
5.5  
2
-
-
-
-
-
0.8  
-
2
-
-
0.8  
-
2
-
-
0.8  
-
V
V
V
IH  
Low Level Input  
Voltage  
V
4.5 to  
5.5  
IL  
High Level Output  
Voltage  
CMOS Loads  
V
V
V
or  
IH  
-0.02  
4.5  
4.5  
4.5  
4.5  
4.4  
4.4  
4.4  
OH  
V
IL  
High Level Output  
Voltage  
TTL Loads  
-4  
3.98  
-
-
-
-
3.84  
-
3.7  
-
V
V
V
Low Level Output  
Voltage  
CMOS Loads  
V
or  
0.02  
4
-
-
0.1  
0.26  
-
-
0.1  
0.33  
-
-
0.1  
0.4  
OL  
IH  
V
IL  
Low Level Output  
Voltage  
TTL Loads  
Input Leakage  
Current  
I
V
to  
0
0
-
5.5  
5.5  
-
-
-
-
-
±0.1  
8
-
-
-
±1  
80  
-
-
-
±1  
µA  
µA  
µA  
I
CC  
GND  
Quiescent Device  
Current  
I
V
or  
160  
490  
CC  
CC  
GND  
Additional Quiescent  
Device Current Per  
Input Pin: 1 Unit Load  
(Note 4)  
I  
CC  
V
4.5 to  
5.5  
100  
360  
450  
CC  
-2.1  
NOTE:  
4. For dual-supply systems theoretical worst case (V = 2.4V, V  
I
= 5.5V) specification is 1.8mA.  
CC  
HCT Input Loading Table  
INPUT  
All  
UNIT LOADS  
1
NOTE: Unit Load is I  
Specifications table, e.g., 360µA max at 25 C.  
limit specified in DC Electrical  
o
CC  
Switching Specifications Input t , t = 6ns  
r
f
o
-55 C TO  
125 C  
o
o
o
o
25 C  
-40 C TO 85 C  
TEST  
PARAMETER  
HC TYPES  
SYMBOL  
CONDITIONS  
V
(V)  
TYP  
MAX  
MAX  
MAX  
UNITS  
CC  
Propagation Delay,  
Any Input to ΣO  
t
, t  
C = 50pF  
2
-
-
200  
40  
34  
-
250  
50  
43  
-
300  
60  
51  
-
ns  
ns  
ns  
ns  
PLH PHL  
L
4.5  
6
5
-
C = 15pF  
17  
L
3
CD74HC280, CD74HCT280  
Switching Specifications Input t , t = 6ns (Continued)  
r
f
o
-55 C TO  
125 C  
o
o
o
o
25 C  
-40 C TO 85 C  
TEST  
PARAMETER  
SYMBOL  
CONDITIONS  
V
(V)  
TYP  
MAX  
200  
40  
34  
-
MAX  
250  
50  
43  
-
MAX  
300  
60  
51  
-
UNITS  
ns  
CC  
Propagation Delay,  
Any Input to ΣE  
t
, t  
C = 50pF  
2
-
-
PLH PHL  
L
4.5  
ns  
6
5
2
-
ns  
C = 15pF  
17  
-
ns  
L
Output Transition Time  
Input Capacitance  
t
, t  
TLH THL  
C = 50pF  
L
75  
15  
13  
10  
-
95  
19  
16  
10  
-
110  
22  
19  
10  
-
ns  
4.5  
6
-
ns  
-
ns  
C
-
-
-
-
pF  
pF  
I
Power Dissipation  
Capacitance  
C
5
58  
PD  
(Notes 5, 6)  
HCT TYPES  
Propagation Delay,  
Any Input to ΣO  
t
, t  
PLH PHL  
C = 50pF  
4.5  
5
-
19  
-
45  
-
56  
-
68  
-
ns  
ns  
ns  
ns  
ns  
pF  
pF  
L
C = 15pF  
L
Propagation Delay,  
Any Input to ΣE  
t , t  
PLH PHL  
C = 50pF  
4.5  
5
42  
-
53  
-
63  
-
L
C = 15pF  
18  
-
L
Output Transition Time  
Input Capacitance  
t
, t  
TLH THL  
C = 50pF  
L
4.5  
-
15  
10  
-
19  
10  
-
22  
10  
-
C
-
-
-
IN  
Power Dissipation  
Capacitance  
C
5
58  
PD  
(Notes 5, 6)  
NOTES:  
5. C  
is used to determine the dynamic power consumption, per package.  
2
PD  
6. P = V  
f (C  
PD  
+ C ) where f = Input Frequency, f = Output Frequency, C = Output Load Capacitance, V  
= Supply Voltage.  
D
CC  
i
L
i
O
L
CC  
Test Circuits and Waveforms  
t = 6ns  
t = 6ns  
t = 6ns  
t = 6ns  
r
f
r
f
V
3V  
CC  
90%  
50%  
10%  
2.7V  
1.3V  
0.3V  
INPUT  
INPUT  
GND  
GND  
t
t
t
t
THL  
TLH  
THL  
TLH  
90%  
1.3V  
90%  
50%  
10%  
INVERTING  
OUTPUT  
INVERTING  
OUTPUT  
10%  
t
t
PLH  
PHL  
t
t
PLH  
PHL  
FIGURE 1. HC TRANSITION TIMES AND PROPAGATION  
DELAY TIMES, COMBINATION LOGIC  
FIGURE 2. HCT TRANSITION TIMES AND PROPAGATION  
DELAY TIMES, COMBINATION LOGIC  
4
IMPORTANT NOTICE  
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any product or service without notice, and advise customers to obtain the latest version of relevant information  
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subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
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safeguards must be provided by the customer to minimize inherent or procedural hazards.  
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Copyright 1998, Texas Instruments Incorporated  

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