CD74HCT4075 [TI]

High Speed CMOS Logic Triple 3-Input OR Gate; 高速CMOS逻辑三路3输入或门
CD74HCT4075
型号: CD74HCT4075
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

High Speed CMOS Logic Triple 3-Input OR Gate
高速CMOS逻辑三路3输入或门

文件: 总6页 (文件大小:36K)
中文:  中文翻译
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CD74HC4075,  
CD74HCT4075  
Data sheet acquired from Harris Semiconductor  
SCHS210  
High Speed CMOS Logic  
Triple 3-Input OR Gate  
August 1997  
Features  
Description  
• Buffered Inputs  
The Harris CD74HC4075, CD74HCT4075 logic gates utilize  
silicon-gate CMOS technology to achieve operating speeds  
similar to LSTTL gates with the low power consumption of  
standard CMOS integrated circuits. All devices have the  
ability to drive 10 LSTTL loads. The 74HCT logic family is  
functionally pin compatible with the standard 74LS logic  
family.  
• Typical Propagation Delay: 8ns at V  
o
= 5V,  
[ /Title  
(CD74H  
C4075,  
CD74H  
CT4075)  
/Subject  
(High  
Speed  
CMOS  
Logic  
CC  
C = 15pF, T = 25 C  
L
A
• Fanout (Over Temperature Range)  
- Standard Outputs. . . . . . . . . . . . . . . 10 LSTTL Loads  
- Bus Driver Outputs . . . . . . . . . . . . . 15 LSTTL Loads  
o
o
• Wide Operating Temperature Range . . . -55 C to 125 C  
• Balanced Propagation Delay and Transition Times  
Ordering Information  
PKG.  
o
PART NUMBER TEMP. RANGE ( C) PACKAGE  
NO.  
E14.3  
E14.3  
• Significant Power Reduction Compared to LSTTL  
Logic ICs  
CD74HC4075E  
CD74HC4075E  
CD74HC4075M  
CD74HC4075M  
CD54HC4075H  
CD54HCT4075H  
CD54HC4075W  
CD54HCT4075W  
-55 to 125  
-55 to 125  
-55 to 125  
-55 to 125  
-55 to 125  
-55 to 125  
-55 to 125  
-55 to 125  
14 Ld PDIP  
14 Ld PDIP  
• HC Types  
Triple 3-  
Input  
- 2V to 6V Operation  
14 Ld SOIC M14.15  
- High Noise Immunity: N = 30%, N = 30% of V  
IL IH CC  
at V  
= 5V  
CC  
14 Ld SOIC M14.15  
• HCT Types  
Die  
- 4.5V to 5.5V Operation  
Die  
- Direct LSTTL Input Logic Compatibility,  
V = 0.8V (Max), V = 2V (Min)  
IL IH  
Wafer  
Wafer  
- CMOS Input Compatibility, I 1µA at V , V  
OL OH  
l
NOTE: When ordering, use the entire part number. Add the suffix 96  
to obtain the variant in the tape and reel.  
Pinout  
CD74HC4075, CD74HCT4075  
(PDIP, SOIC)  
TOP VIEW  
2A  
2B  
1
2
3
4
5
6
7
14 V  
CC  
13 3C  
12 3B  
11 3A  
10 3Y  
1A  
1B  
1C  
1C  
9
8
2Y  
2C  
GND  
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.  
File Number 1778.1  
Copyright © Harris Corporation 1997  
1
CD74HC4075, CD74HCT4075  
Functional Diagram  
3
1A  
6
9
4
5
1Y  
2Y  
1B  
1C  
1
2A  
2B  
2C  
2
8
11  
12  
13  
3A  
10  
3Y  
3B  
3C  
GND = 7  
= 14  
V
CC  
TRUTH TABLE  
INPUTS  
OUTPUT  
nA  
L
nB  
L
nC  
L
nY  
L
H
X
X
X
H
H
X
X
H
X
H
H
NOTE: H = High Voltage Level, L = Low Voltage Level, X = Irrelevant  
Logic Diagram  
nA  
nB  
nC  
nY  
2
CD74HC4075, CD74HCT4075  
Absolute Maximum Ratings  
Thermal Information  
o
o
DC Supply Voltage, V  
. . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V Thermal Resistance (Typical, Note 1)  
θ
( C/W)  
θ
( C/W)  
CC  
DC Input Diode Current, I  
JA  
JC  
PDIP Package . . . . . . . . . . . . . . . . . . .  
SOIC Package. . . . . . . . . . . . . . . . . . .  
100  
180  
N/A  
N/A  
IK  
For V < -0.5V or V > V  
+ 0.5V. . . . . . . . . . . . . . . . . . . . . .±20mA  
OK  
For V < -0.5V or V > V  
I
I
CC  
o
DC Output Diode Current, I  
Maximum Junction Temperature (Hermetic Package or Die) . . . 175 C  
Maximum Junction Temperature (Plastic Package) . . . . . . . . 150 C  
Maximum Storage Temperature Range . . . . . . . . . .-65 C to 150 C  
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300 C  
o
+ 0.5V . . . . . . . . . . . . . . . . . . . .±20mA  
O
O
CC  
o
o
DC Output Source or Sink Current per Output Pin, I  
O
o
For V > -0.5V or V < V  
+ 0.5V . . . . . . . . . . . . . . . . . . . .±25mA  
O
O
CC  
DC V  
or Ground Current, I  
I
. . . . . . . . . . . . . . . . . .±50mA  
(SOIC - Lead Tips Only)  
CC  
CC or GND  
Operating Conditions  
o
o
Temperature Range (T ) . . . . . . . . . . . . . . . . . . . . . -55 C to 125 C  
A
Supply Voltage Range, V  
CC  
HC Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2V to 6V  
HCT Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 5.5V  
DC Input or Output Voltage, V , V . . . . . . . . . . . . . . . . . 0V to V  
I
O
CC  
Input Rise and Fall Time  
2V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000ns (Max)  
4.5V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500ns (Max)  
6V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400ns (Max)  
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation  
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.  
NOTE:  
1. θ is measured with the component mounted on an evaluation PC board in free air.  
JA  
DC Electrical Specifications  
TEST  
CONDITIONS  
o
o
o
o
o
25 C  
TYP  
-40 C TO 85 C -55 C TO 125 C  
V
(V)  
CC  
PARAMETER  
HC TYPES  
SYMBOL  
V (V)  
I
I
(mA)  
MIN  
MAX  
MIN  
MAX  
MIN  
MAX  
UNITS  
O
High Level Input  
Voltage  
V
-
-
-
2
4.5  
6
1.5  
3.15  
4.2  
-
-
-
-
-
-
-
-
-
-
-
-
-
1.5  
3.15  
4.2  
-
-
1.5  
3.15  
4.2  
-
-
V
V
V
V
V
V
V
V
V
V
V
IH  
-
-
-
-
-
-
Low Level Input  
Voltage  
V
-
2
0.5  
0.5  
0.5  
IL  
4.5  
6
-
1.35  
-
1.35  
-
1.35  
-
1.8  
-
1.8  
-
1.8  
High Level Output  
Voltage  
CMOS Loads  
V
V
V
or V  
IH IL  
-0.02  
2
1.9  
4.4  
5.9  
3.98  
5.48  
-
-
-
-
-
1.9  
4.4  
5.9  
3.84  
5.34  
-
-
-
-
-
1.9  
4.4  
5.9  
3.7  
5.2  
-
-
-
-
-
OH  
-0.02  
-0.02  
-4  
4.5  
6
High Level Output  
Voltage  
TTL Loads  
4.5  
6
-5.2  
Low Level Output  
Voltage  
CMOS Loads  
V
or V  
IH IL  
0.02  
0.02  
0.02  
4
2
4.5  
6
-
-
-
-
-
-
-
-
-
-
0.1  
0.1  
-
-
-
-
-
0.1  
0.1  
-
-
-
-
-
0.1  
0.1  
0.1  
0.4  
0.4  
V
V
V
V
V
OL  
0.1  
0.1  
Low Level Output  
Voltage  
TTL Loads  
4.5  
6
0.26  
0.26  
0.33  
0.33  
5.2  
Input Leakage  
Current  
I
V
or  
-
6
6
-
-
-
-
±0.1  
-
-
±1  
-
-
±1  
µA  
µA  
I
CC  
GND  
Quiescent Device  
Current  
I
V
or  
0
2
20  
40  
CC  
CC  
GND  
3
CD74HC4075, CD74HCT4075  
DC Electrical Specifications (Continued)  
TEST  
CONDITIONS  
o
o
o
o
o
25 C  
-40 C TO 85 C -55 C TO 125 C  
V
CC  
PARAMETER  
HCT TYPES  
SYMBOL  
V (V)  
I
I
(mA)  
(V)  
MIN  
TYP  
MAX  
MIN  
MAX  
MIN  
MAX  
UNITS  
O
High Level Input  
Voltage  
V
-
-
-
-
4.5 to  
5.5  
2
-
-
-
-
-
0.8  
-
2
-
-
0.8  
-
2
-
-
0.8  
-
V
V
V
IH  
Low Level Input  
Voltage  
V
4.5 to  
5.5  
IL  
High Level Output  
Voltage  
CMOS Loads  
V
V
V
or V  
-0.02  
4.5  
4.5  
4.5  
4.5  
4.4  
4.4  
4.4  
OH  
IH  
IH  
IL  
High Level Output  
Voltage  
TTL Loads  
-4  
3.98  
-
-
-
-
3.84  
-
3.7  
-
V
V
V
Low Level Output  
Voltage  
CMOS Loads  
V
or V  
0.02  
4
-
-
0.1  
0.26  
-
-
0.1  
0.33  
-
-
0.1  
0.4  
OL  
IL  
Low Level Output  
Voltage  
TTL Loads  
Input Leakage  
Current  
I
V
and  
0
0
-
5.5  
5.5  
-
-
-
±0.1  
2
-
-
-
±1  
20  
-
-
-
±1  
40  
µA  
µA  
µA  
I
CC  
GND  
Quiescent Device  
Current  
I
V
or  
-
CC  
CC  
GND  
Additional Quiescent  
Device Current Per  
Input Pin: 1 Unit Load  
(Note)  
I  
V
4.5 to  
5.5  
100  
360  
450  
490  
CC  
CC  
-2.1  
NOTE: For dual-supply systems theoretical worst case (V = 2.4V, V  
I
= 5.5V) specification is 1.8mA.  
CC  
HCT Input Loading Table  
INPUT  
All  
UNIT LOADS  
1.6  
NOTE: Unit Load is I  
360µA max at 25 C.  
limit specified in DC Electrical Table, e.g.  
CC  
o
Switching Specifications Input t , t = 6ns  
r
f
o
-40 C TO  
85 C  
o
o
o
o
25 C  
-55 C TO 125 C  
TEST  
SYMBOL CONDITIONS  
PARAMETER  
HC TYPES  
V
(V) MIN  
TYP MAX  
MIN  
MAX  
MIN  
MAX UNITS  
CC  
Propagation Delay,  
Input to Output (Figure 1)  
t
t
C = 50pF  
2
-
-
-
100  
20  
17  
-
-
-
-
-
-
-
-
-
125  
25  
21  
-
-
-
-
-
-
-
-
-
150  
30  
26  
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
pF  
PLH, PHL  
L
4.5  
6
-
-
-
-
-
-
-
-
C = 15pF  
5
8
-
L
Transition Times (Figure 1)  
Input Capacitance  
t
, t  
TLH THL  
C = 50pF  
L
2
75  
15  
13  
10  
95  
19  
16  
10  
110  
22  
19  
10  
4.5  
6
-
-
C
-
-
-
IN  
4
CD74HC4075, CD74HCT4075  
Switching Specifications Input t , t = 6ns (Continued)  
r
f
o
-40 C TO  
85 C  
o
o
o
o
25 C  
-55 C TO 125 C  
TEST  
PARAMETER  
SYMBOL CONDITIONS  
V
(V) MIN  
TYP MAX  
MIN  
MAX  
MIN  
MAX UNITS  
CC  
Power Dissipation Capacitance  
(Notes 2, 3)  
C
-
5
-
26  
-
-
-
-
-
pF  
PD  
HCT TYPES  
Propagation Delay, Input to  
Output (Figure 2)  
t
, t  
C = 50pF  
4.5  
5
-
-
-
-
-
-
9
-
24  
-
-
-
-
-
-
30  
-
-
-
-
-
-
36  
-
ns  
ns  
ns  
pF  
pF  
PLH PHL  
L
C = 15pF  
L
Transition Times (Figure 2)  
Input Capacitance  
t
, t  
TLH THL  
C = 50pF  
L
4.5  
-
15  
10  
-
19  
10  
-
22  
10  
-
C
-
-
-
IN  
Power Dissipation Capacitance  
(Notes 2, 3)  
C
5
28  
PD  
NOTES:  
2. C  
PD  
is used to determine the dynamic power consumption, per gate.  
2
3. P = V  
CC  
f (C  
PD  
+ C ) where f = Input Frequency, C = Output Load Capacitance, V = Supply Voltage.  
CC  
D
i
L
i
L
Test Circuits and Waveforms  
t = 6ns  
t = 6ns  
f
r
t = 6ns  
f
t = 6ns  
r
V
CC  
3V  
90%  
50%  
10%  
2.7V  
1.3V  
0.3V  
INPUT  
INPUT  
GND  
GND  
t
t
TLH  
THL  
t
t
THL  
TLH  
90%  
1.3V  
90%  
50%  
10%  
INVERTING  
OUTPUT  
INVERTING  
OUTPUT  
10%  
t
t
t
t
PLH  
PLH  
PHL  
PHL  
FIGURE 1. HC AND HCU TRANSITION TIMES AND PROPAGA-  
TION DELAY TIMES, COMBINATION LOGIC  
FIGURE 2. HCT TRANSITION TIMES AND PROPAGATION  
DELAY TIMES, COMBINATION LOGIC  
5
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL  
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In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
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Copyright 1999, Texas Instruments Incorporated  

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