CSD18543Q3A [TI]

采用 3mm x 3mm SON 封装的单路、9.9mΩ、60V、N 沟道 NexFET™ 功率 MOSFET;
CSD18543Q3A
型号: CSD18543Q3A
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

采用 3mm x 3mm SON 封装的单路、9.9mΩ、60V、N 沟道 NexFET™ 功率 MOSFET

局域网 PC 开关 脉冲 光电二极管 晶体管
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CSD18543Q3A  
ZHCSFS2 DECEMBER 2016  
CSD18543Q3A 60VN 沟道 NexFET™ 功率 MOSFET  
1 特性  
.
1
超低 Qg Qgd  
低导通电阻 RDS(on)  
产品概要  
TA=25°C  
VDS  
典型值  
60  
单位  
V
低热阻  
漏源电压  
雪崩额定值  
无铅  
Qg  
栅极电荷总量 (10V)  
栅极电荷(栅极到漏极)  
11.1  
1.7  
nC  
nC  
Qgd  
VGS = 4.5V  
VGS = 10V  
2.0  
12.0  
8.1  
符合 RoHS 环保标准  
无卤素  
RDS(on) 漏源导通电阻  
VGS(th) 阈值电压  
mΩ  
V
小外形尺寸无引线 (SON) 3.3mm × 3.3mm 塑料封  
器件信息(1)  
数量  
器件  
包装介质  
封装  
运输  
2 应用范围  
CSD18543Q3A  
CSD18543Q3AT  
13 英寸卷带 2500  
小外形尺寸无引线  
(SON)  
固态继电器开关  
直流 - 直流转换  
次级侧同步整流器  
经隔离转换器主级侧开关  
电机控制  
卷带式  
3.30mm × 3.30mm  
塑料封装  
7 英寸卷带  
250  
(1) 要了解所有可用封装,请见数据表末尾的可订购产品附录。  
绝对最大额定值  
TA = 25°C  
60  
单位  
V
VDS 漏源电压  
VGS 栅源电压  
3 说明  
±20  
35  
V
这款采用 3.3mm × 3.3mm SON 封装的 60V、  
8.1mΩNexFET™功率 MOSFET 被设计成在功率转  
换应用中大大降低 损耗。  
持续漏极电流(受封装限制)  
持续漏极电流(受芯片限制),TC = 25°C 时  
测得  
ID  
60  
A
持续漏极电流(1)  
脉冲漏极电流(2)  
功率耗散(1)  
12  
156  
2.8  
66  
俯视图  
IDM  
PD  
A
W
S
S
S
G
1
2
3
4
8
7
6
5
D
D
D
功率耗散,TC = 25°C  
TJ, 工作结温,  
-55 150  
°C  
Tstg  
储存温度  
雪崩能量,单一脉冲  
ID = 33AL = 0.1mHRG = 25Ω  
EAS  
55  
mJ  
D
(1) RθJA = 45°C/W,这是在一块厚度为 0.06 英寸环氧树脂 (FR4)  
印刷电路板 (PCB) 上的 1 英寸22 盎司铜焊盘上测得的典型  
值。  
D
P0093-01  
(2) 最大 RθJC = 1.9°C/W,脉冲持续时间 100μs,占空比 1%。  
.
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  
English Data Sheet: SLPS633  
 
 
 
 
 
 
CSD18543Q3A  
ZHCSFS2 DECEMBER 2016  
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RDS(on) VGS 间的关系  
栅极电荷  
30  
27  
24  
21  
18  
15  
12  
9
10  
9
8
7
6
5
4
3
2
1
0
ID = 12 A  
VDS = 30 V  
TC = 25°C, I D = 12 A  
TC = 125°C, I D = 12 A  
6
3
0
0
2
4
6
8
10  
12  
14  
16  
18  
20  
0
2
4
6
8
10  
12  
VGS - Gate-to-Source Voltage (V)  
Qg - Gate Charge (nC)  
D007  
D004  
2
版权 © 2016, Texas Instruments Incorporated  
CSD18543Q3A  
www.ti.com.cn  
ZHCSFS2 DECEMBER 2016  
目录  
6.1 接收文档更新通知 ..................................................... 8  
6.2 社区资源.................................................................... 8  
6.3 ........................................................................... 8  
6.4 静电放电警告............................................................. 8  
6.5 Glossary.................................................................... 8  
机械、封装和可订购信息 ......................................... 9  
7.1 Q3A 封装尺寸............................................................ 9  
7.2 Q3A 建议的 PCB 布局 ............................................ 10  
7.3 Q3A 建议的模板布局............................................... 11  
7.4 Q3A 卷带信息.......................................................... 11  
1
2
3
4
5
特性.......................................................................... 1  
应用范围................................................................... 1  
说明.......................................................................... 1  
修订历史记录 ........................................................... 3  
Specifications......................................................... 4  
5.1 Electrical Characteristics........................................... 4  
5.2 Thermal Information.................................................. 4  
5.3 Typical MOSFET Characteristics.............................. 5  
器件和文档支持........................................................ 8  
7
6
4 修订历史记录  
日期  
修订版本  
注释  
2016 12 月  
*
最初发布。  
版权 © 2016, Texas Instruments Incorporated  
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ZHCSFS2 DECEMBER 2016  
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5 Specifications  
5.1 Electrical Characteristics  
TA = 25°C (unless otherwise stated)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
STATIC CHARACTERISTICS  
BVDSS  
IDSS  
Drain-to-source voltage  
VGS = 0 V, ID = 250 μA  
60  
V
Drain-to-source leakage current  
Gate-to-source leakage current  
Gate-to-source threshold voltage  
VGS = 0 V, VDS = 48 V  
VDS = 0 V, VGS = 20 V  
VDS = VGS, ID = 250 μA  
VGS = 4.5 V, ID = 12 A  
VGS = 10 V, ID = 12 A  
VDS = 6 V, ID = 12 A  
1
100  
2.7  
μA  
nA  
V
IGSS  
VGS(th)  
1.5  
2.0  
12.0  
8.1  
15.6  
9.9  
mΩ  
mΩ  
S
Drain-to-source  
on resistance  
RDS(on)  
gfs  
Transconductance  
40  
DYNAMIC CHARACTERISTICS  
Ciss  
Coss  
Crss  
RG  
Input capacitance  
885  
168  
4.8  
0.5  
5.6  
11.1  
1.7  
3.1  
2.0  
24  
1150  
218  
6.2  
pF  
pF  
pF  
Output capacitance  
Reverse transfer capacitance  
Series gate resistance  
Gate charge total (4.5 V)  
Gate charge total (10 V)  
Gate charge gate-to-drain  
Gate charge gate-to-source  
Gate charge at Vth  
Output charge  
VGS = 0 V, VDS = 30 V, ƒ = 1 MHz  
1.0  
Qg  
7.3  
nC  
Qg  
14.5  
Qgd  
Qgs  
Qg(th)  
Qoss  
td(on)  
tr  
VDS = 30 V, ID = 12 A  
VDS = 30 V, VGS = 0 V  
nC  
nC  
nC  
nC  
ns  
Turnon delay time  
Rise time  
9
18  
ns  
VDS = 30 V, VGS = 10 V,  
IDS = 12 A, RG = 0 Ω  
td(off)  
tf  
Turnoff delay time  
Fall time  
8
ns  
4
ns  
DIODE CHARACTERISTICS  
VSD  
Qrr  
trr  
Diode forward voltage  
Reverse recovery charge  
Reverse recovery time  
ISD = 12 A, VGS = 0 V  
0.8  
37  
27  
1.0  
V
nC  
ns  
VDS= 30 V, IF = 12 A,  
di/dt = 300 A/μs  
5.2 Thermal Information  
TA = 25°C (unless otherwise stated)  
THERMAL METRIC  
Junction-to-case thermal resistance(1)  
Junction-to-ambient thermal resistance(1)(2)  
θJC is determined with the device mounted on a 1-in2 (6.45-cm2), 2-oz (0.071-mm) thick Cu pad on a 1.5-in × 1.5-in  
MIN  
TYP  
MAX  
UNIT  
RθJC  
RθJA  
1.9  
55  
°C/W  
(1)  
R
(3.81-cm × 3.81-cm), 0.06-in (1.52-mm) thick FR4 PCB. RθJC is specified by design, whereas RθJA is determined by the user’s board  
design.  
(2) Device mounted on FR4 material with 1-in2 (6.45-cm2), 2-oz (0.071-mm) thick Cu.  
4
Copyright © 2016, Texas Instruments Incorporated  
CSD18543Q3A  
www.ti.com.cn  
ZHCSFS2 DECEMBER 2016  
GATE  
Source  
GATE  
Source  
Max RθJA = 55°C/W  
when mounted on 1 in2  
(6.45 cm2) of  
2-oz (0.071-mm) thick  
Cu.  
Max RθJA = 160°C/W  
when mounted on a  
minimum pad area of  
2-oz (0.071-mm) thick  
Cu.  
DRAIN  
DRAIN  
M0161-02  
M0161-01  
5.3 Typical MOSFET Characteristics  
TA = 25°C (unless otherwise stated)  
Figure 1. Transient Thermal Impedance  
Copyright © 2016, Texas Instruments Incorporated  
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ZHCSFS2 DECEMBER 2016  
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Typical MOSFET Characteristics (continued)  
TA = 25°C (unless otherwise stated)  
160  
80  
70  
60  
50  
40  
30  
20  
10  
0
VGS = 4.5 V  
VGS = 6 V  
TC = 125°C  
TC = 25°C  
TC = -55°C  
140  
VGS = 10 V  
120  
100  
80  
60  
40  
20  
0
0
0.5  
1
1.5  
2
2.5  
3
0
1
2
3
4
5
6
VDS - Drain-to-Source Voltage (V)  
VGS - Gate-to-Source Voltage (V)  
D002  
D003  
VDS = 5 V  
Figure 2. Saturation Characteristics  
Figure 3. Transfer Characteristics  
10  
9
8
7
6
5
4
3
2
1
0
10000  
1000  
100  
10  
Ciss = Cgd + Cgs  
Coss = Cds + Cgd  
Crss = Cgd  
1
0
2
4
6
8
10  
12  
0
6
12  
18  
24  
30  
36  
42  
48  
54  
60  
Qg - Gate Charge (nC)  
VDS - Drain-to-Source Voltage (V)  
D004  
D005  
VDS = 30 V  
ID = 12 A  
Figure 4. Gate Charge  
Figure 5. Capacitance  
30  
27  
24  
21  
18  
15  
12  
9
2.6  
2.4  
2.2  
2
TC = 25°C, I D = 12 A  
TC = 125°C, I D = 12 A  
1.8  
1.6  
1.4  
1.2  
1
6
3
0
0
-75 -50 -25  
0
25  
50  
75 100 125 150 175  
2
4
6
8
10  
12  
14  
16  
18  
20  
TC - Case Temperature (°C)  
VGS - Gate-to-Source Voltage (V)  
D006  
D007  
ID = 250 µA  
Figure 6. Threshold Voltage vs Temperature  
Figure 7. On-State Resistance vs Gate-to-Source Voltage  
6
Copyright © 2016, Texas Instruments Incorporated  
CSD18543Q3A  
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ZHCSFS2 DECEMBER 2016  
Typical MOSFET Characteristics (continued)  
TA = 25°C (unless otherwise stated)  
100  
10  
2
TC = 25èC  
TC = 125èC  
VGS = 4.5 V  
VGS = 10 V  
1.8  
1.6  
1.4  
1.2  
1
1
0.1  
0.01  
0.001  
0.0001  
0.8  
0.6  
0.4  
-75 -50 -25  
0
25  
50  
75 100 125 150 175  
0
0.2  
0.4  
0.6  
0.8  
1
TC - Case Temperature (èC)  
VSD - Source-To-Drain Voltage (V)  
D008  
D009  
ID = 12 A  
Figure 8. Normalized On-State Resistance vs Temperature  
Figure 9. Typical Diode Forward Voltage  
1000  
100  
10  
1
TC = 25è C  
TC = 125è C  
100  
10  
1
DC  
10 ms  
1 ms  
100 µs  
0.1  
0.1  
1
10  
100  
0.01  
0.1  
1
VDS - Drain-To-Source Voltage (V)  
TAV - Time in Avalanche (ms)  
D010  
D011  
Single pulse, max RθJC = 1.9°C/W  
Figure 10. Maximum Safe Operating Area (SOA)  
Figure 11. Single Pulse Unclamped Inductive Switching  
40  
35  
30  
25  
20  
15  
10  
5
0
-50  
-25  
0
25  
50  
75  
100 125 150 175  
TC - Case Temperature (°C)  
D012  
Max RθJC = 1.9°C/W  
Figure 12. Maximum Drain Current vs Temperature  
Copyright © 2016, Texas Instruments Incorporated  
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6 器件和文档支持  
6.1 接收文档更新通知  
如需接收文档更新通知,请访问 www.ti.com.cn 网站上的器件产品文件夹。点击右上角的提醒我 (Alert me) 注册  
后,即可每周定期收到已更改的产品信息。有关更改的详细信息,请查阅已修订文档中包含的修订历史记录。  
6.2 社区资源  
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective  
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of  
Use.  
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration  
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help  
solve problems with fellow engineers.  
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and  
contact information for technical support.  
6.3 商标  
NexFET, E2E are trademarks of Texas Instruments.  
All other trademarks are the property of their respective owners.  
6.4 静电放电警告  
这些装置包含有限的内置 ESD 保护。 存储或装卸时,应将导线一起截短或将装置放置于导电泡棉中,以防止 MOS 门极遭受静电损  
伤。  
6.5 Glossary  
SLYZ022 TI Glossary.  
This glossary lists and explains terms, acronyms, and definitions.  
8
版权 © 2016, Texas Instruments Incorporated  
CSD18543Q3A  
www.ti.com.cn  
ZHCSFS2 DECEMBER 2016  
7 机械、封装和可订购信息  
以下页中包括机械、封装和可订购信息。这些信息是针对指定器件可提供的最新数据。这些数据会在无通知且不对  
本文档进行修订的情况下发生改变。要获得这份数据表的浏览器版本,请查阅左侧的导航栏。  
7.1 Q3A 封装尺寸  
3.1  
2.9  
A
B
PIN 1 INDEX AREA  
3.25  
3.05  
2X 0.15 MAX  
2X (0.2)  
3.5  
3.1  
TYP  
C
0.9 MAX  
SEATING PLANE  
0.05  
0.00  
(0.2)  
1.74±0.1  
0.52  
0.32  
4X  
0.565±0.1  
4
(0.15) TYP  
EXPOSED THERMAL PAD  
NOTE 3  
5
9
2X 1.95  
2.45±0.1  
0.65 TYP  
8
1
0.35  
8X  
0.55  
4X  
0.25  
0.25  
0.1  
C B  
C
A
4X 1.45  
0.05  
2X  
NOTE 4  
1. 所有线性尺寸的单位均为毫米。括号中的任何尺寸仅供参考。尺寸和容限值遵循 ASME Y14.5M。  
2. 本图纸如有变更,恕不通知。  
3. 必须在印刷电路板上焊接封装散热焊盘,以获得良好的散热和机械性能。  
4. 金属化 特性 为供应商选配特性,因此封装上可能不具备。  
5. 所有尺寸不包括模具毛边或突出部分。  
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ZHCSFS2 DECEMBER 2016  
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7.2 Q3A 建议的 PCB 布局  
(1.775)  
PKG  
0.05 MIN  
ALL SIDES  
(0.635)  
TYP  
(0.56)  
4X (0.3)  
4X (0.6)  
1
8
4X (0.3)  
(R0.05)  
TYP  
(0.975)  
TYP  
9
SYMM  
(2.45)  
3X (0.65)  
3X (0.65)  
4
5
(
(R0.05) TYP  
SOLDER MASK  
OPENING  
(0.207)  
(0.245)  
0.2) VIA  
TYP  
METAL UNDER  
SOLDER MASK  
(0.905)  
TYP  
(1.55)  
1. 此封装设计用于焊接到电路板的散热焊盘上。更多信息,请参见QFN/SON  
号:SLUA271)。  
PCB  
连接》(文献编  
2. 根据应用决定是否选用过孔,详情请参见器件数据表。如果实现了部分或全部过孔,则会显示建议的过孔位  
置。  
有关针对  
PCB  
设计的建议电路布局布线,请参见《通过  
PCB  
布局布线技巧来减少振铃》(文献编  
号:SLPA005)。  
10  
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ZHCSFS2 DECEMBER 2016  
7.3 Q3A 建议的模板布局  
(0.905)  
PKG  
8X (0.6)  
8X (0.3)  
(0.208)  
SOLDER MASK EDGE  
1
8
(0.663)  
SYMM  
9
(1.325)  
6X (0.65)  
4X 1.125  
5
4
(R0.05) TYP  
METAL  
TYP  
4X 0.705  
(3.1)  
1. 具有漏斗形壁和圆角的激光切割窗孔将提供更佳的焊锡膏脱离。IPC-7525 可能提供其他替代性设计建议。  
7.4 Q3A 卷带信息  
4.00 0.ꢀ0 ꢁ(SS ꢂNoS ꢀ1  
8.00 0.ꢀ0  
2.00 0.0ꢃ  
Ø ꢀ.ꢃ0  
+0.ꢀ0  
–0.00  
3.60  
M0ꢀ44-0ꢀ  
Notes: 1. 10 个链齿孔的累积容差为 ±0.2。  
2. 100mm 长度的翘曲不能超过 1mm,在 250mm 长度上不累积。  
3. 材料:黑色抗静电聚苯乙烯。  
4. 全部尺寸单位为 mm,除非另外注明。  
5. 厚度:0.30 ± 0.05mm。  
6. MSL1 260°C(红外 (IR) 和传导)PbF 回流焊兼容。  
版权 © 2016, Texas Instruments Incorporated  
11  
PACKAGE OPTION ADDENDUM  
www.ti.com  
10-Dec-2020  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
CSD18543Q3A  
CSD18543Q3AT  
ACTIVE  
ACTIVE  
VSONP  
VSONP  
DNH  
DNH  
8
8
2500 RoHS & Green  
250 RoHS & Green  
SN  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
-55 to 150  
-55 to 150  
18543  
18543  
SN  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
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(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
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(6)  
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PACKAGE OPTION ADDENDUM  
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10-Dec-2020  
Addendum-Page 2  
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