CY5474FCT163T [TI]

4-Bit Binary Counter; 4位二进制计数器
CY5474FCT163T
型号: CY5474FCT163T
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

4-Bit Binary Counter
4位二进制计数器

计数器
文件: 总7页 (文件大小:70K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Data sheet acquired from Cypress Semiconductor Corporation.  
Data sheet modified to remove devices not offered.  
CY54/74FCT163T  
SCCS015 - May 1994 - Revised February 2000  
4-Bit Binary Counter  
• Sink current  
Source current  
64 mA (Com’l),  
32 mA (Mil)  
32 mA (Com’l),  
12 mA (Mil)  
Features  
• Function, pinout, and drive compatible with FCT and  
F logic  
• FCT-C speed at 5.8 ns max. (Com’l),  
• Reduced VOH (typically = 3.3V) versions of equivalent  
FCT functions  
Functional Description  
The FCT163T is a high-speed synchronous modulo-16 binary  
counter. It is synchronously presettable for application in pro-  
grammable dividers and has two types of count enable inputs  
plus a terminal count output for versatility in forming synchro-  
nous multi-staged counters. The FCT163T has a Synchronous  
Reset input that overrides counting and parallel loading and  
allows the outputs to be simultaneously reset on the rising  
edge of the clock.  
• Edge-rate control circuitry for significantly improved  
noise characteristics  
• Power-off disable feature  
• ESD > 2000V  
• Matched rise and fall times  
• Fully compatible with TTL input and output logic levels  
• Extended commercial range of 40˚C to +85˚C  
The outputs are designed with a power-off disable feature to  
allow for live insertion of boards.  
Logic Block Diagram  
P
0
P
1
P
2
P
3
PE  
CEP  
CET  
TC  
CP  
CP  
CP  
CP  
D
D
Q
Q
Detail A  
Detail A  
Detail A  
Q
0
Q
0
Detail A  
SR  
Q
0
Q
1
Q
2
Q
3
Pin Configurations  
LCC  
Top View  
SOIC/QSOP  
Top View  
SR  
CP  
1
2
3
4
5
6
V
16  
CC  
7
6 5 4  
8
15  
14  
13  
12  
TC  
CEP  
CP  
SR  
9
3
2
1
P
0
Q
Q
Q
0
1
2
GND  
NC  
10  
11  
P
1
NC  
V
P2  
PE  
CC  
12  
13  
20  
19  
P
3
Q3  
TC  
11  
10  
9
CET  
CEP  
GND  
1516 17 18  
14  
CET  
PE  
7
8
Copyright © 2000, Texas Instruments Incorporated  
CY54/74FCT163T  
Maximum Ratings[2,3]  
Function Table[1]  
Inputs  
(Above which the useful life may be impaired. For user guide-  
lines, not tested.)  
Action on the Rising  
Clock Edge(s)  
SR  
PE  
CET  
CEP  
Storage Temperature .....................................65°C to +150°C  
L
X
L
H
H
H
X
X
H
L
X
X
H
X
L
Reset (Clear)  
Load (Pn Qn)  
Count (Incremental)  
No Charge (Hold)  
No Charge (Hold)  
H
H
H
H
Ambient Temperature with  
Power Applied..................................................65°C to +135°C  
Supply Voltage to Ground Potential..................−0.5V to +7.0V  
DC Input Voltage .................................................−0.5V to +7.0V  
DC Output Voltage ..............................................−0.5V to +7.0V  
DC Output Current (Maximum Sink Current/Pin) ......120 mA  
Power Dissipation..........................................................0.5W  
X
Pin Description  
Name  
Description  
CEP  
CET  
CP  
SR  
P
Count Enable Parallel Input  
Count Enable Trickle Input  
Clock Pulse Input (Active Rising Edge)  
Synchronous Reset Input (Active LOW)  
Parallel Data Inputs  
Static Discharge Voltage............................................>2001V  
(per MIL-STD-883, Method 3015)  
Operating Range  
Ambient  
Range  
Range  
Temperature  
40°C to +85°C  
55°C to +125°C  
VCC  
PE  
Q
Parallel Enable Input (Active LOW)  
Flip-Flop Outputs  
Commercial All  
Military[4]  
5V ± 5%  
5V ± 10%  
All  
TC  
Terminal Count Output  
Electrical Characteristics Over the Operating Range  
Parameter  
Description  
Test Conditions  
Min.  
2.0  
Typ.[5]  
Max.  
Unit  
V
VOH  
Output HIGH Voltage  
VCC=Min., IOH=32 mA  
Com’l  
Com’l  
Mil  
VCC=Min., IOH=15 mA  
VCC=Min., IOH=12 mA  
VCC=Min., IOL=64 mA  
VCC=Min., IOL=32 mA  
2.4  
3.3  
3.3  
0.3  
0.3  
V
2.4  
V
VOL  
Output LOW Voltage  
Com’l  
Mil  
0.55  
0.55  
V
V
VIH  
VIL  
VH  
VIK  
II  
Input HIGH Voltage  
Input LOW Voltage  
Hysteresis[6]  
2.0  
V
0.8  
V
All inputs  
0.2  
V
Input Clamp Diode Voltage  
Input HIGH Current  
Input HIGH Current  
Input LOW Current  
VCC=Min., IIN=18 mA  
VCC=Max., VIN=VCC  
VCC=Max., VIN=2.7V  
VCC=Max., VIN=0.5V  
0.7  
1.2  
5
V
µA  
µA  
µA  
mA  
µA  
IIH  
IIL  
±1  
±1  
IOS  
Output Short Circuit Current[7] VCC=Max., VOUT=0.0V  
60  
120  
225  
±1  
IOFF  
Power-Off Disable VCC=0V, VOUT=4.5V  
Notes:  
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care.  
2. Unless otherwise noted, these limits are over the operating free-air temperature range.  
3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.  
4. TA is the “instant on” case temperature.  
5. Typical values are at VCC=5.0V, TA=+25˚C ambient.  
6. This parameter is specified but not tested.  
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample  
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of  
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter  
tests, IOS tests should be performed last.  
2
CY54/74FCT163T  
Capacitance[6]  
Parameter  
CIN  
Description  
Typ.[5]  
Max.  
10  
Unit  
pF  
Input Capacitance  
Output Capacitance  
5
9
COUT  
12  
pF  
Power Supply Characteristics  
Parameter  
ICC  
Description  
Test Conditions  
Typ.[5]  
0.1  
Max.  
0.2  
Unit  
Quiescent Power Supply Current  
VCC=Max., VIN0.2V, VINVCC0.2V  
VCC=Max., VIN=3.4V,[8]  
f1=0, Outputs Open  
mA  
mA  
ICC  
Quiescent Power Supply Current  
(TTL inputs HIGH)  
0.2  
2.0  
ICCD  
Dynamic Power Supply Current[9]  
VCC=Max., One Bit Toggling, Load Mode,  
50% Duty Cycle, Outputs Open,  
CEP=CET=PE=GND,  
0.06  
0.7  
0.12  
1.4  
mA/MHz  
SR=VCC, VIN0.2V or VINVCC0.2V  
IC  
Total Power Supply Current[10]  
VCC=Max., f0=10 MHz, Load Mode,  
50% Duty Cycle, Outputs Open,  
One Bit Toggling at f1=5 MHz,  
CEP=CET=PE=GND,  
mA  
SR=VCC, VIN0.2V or VINVCC0.2V  
VCC=Max., f0=10 MHz, Load Mode,  
50% Duty Cycle, Outputs Open,  
One Bit Toggling at f1=5 MHz,  
1.2  
1.6  
2.9  
3.4  
mA  
mA  
mA  
CEP=CET=PE=GND, SR=VCC  
,
VIN=3.4V or VIN=GND  
VCC=Max., f0=10 MHz, Load Mode,  
50% Duty Cycle, Outputs Open,  
Four Bits Toggling at f1=5 MHz,  
CEP=CET=PE=GND,  
3.2[11]  
SR=VCC, VIN0.2V or VINVCC0.2V  
VCC=Max., f0=10 MHz, Load Mode,  
50% Duty Cycle, Outputs Open,  
Four Bits Toggling at f1=5 MHz,  
8.2[11]  
CEP=CET=PE=GND, SR=VCC  
,
VIN=3.4V or VIN=GND  
Notes:  
8. Per TTL driven input (VIN=3.4V); all other inputs at VCC or GND.  
9. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.  
10. IC  
IC  
=
=
=
=
=
=
=
=
=
=
IQUIESCENT + IINPUTS + IDYNAMIC  
ICC+ICCDHNT+ICCD(f0/2 + f1N1)  
Quiescent Current with CMOS input levels  
Power Supply Current for a TTL HIGH input (VIN=3.4V)  
Duty Cycle for TTL inputs HIGH  
ICC  
ICC  
DH  
NT  
ICCD  
f0  
Number of TTL inputs at DH  
Dynamic Current caused by an input transition pair (HLH or LHL)  
Clock frequency for registered devices, otherwise zero  
Input signal frequency  
f1  
N1  
Number of inputs changing at f1  
All currents are in milliamps and all frequencies are in megahertz.  
11. Values for these conditions are examples of the ICC formula. These limits are specified but not tested.  
3
CY54/74FCT163T  
Switching Characteristics Over the Operating Range  
CY54FCT163T  
Military  
CY74FCT163CT  
Commercial  
Min.[12]  
Max.  
Parameter  
tPLH  
tPHL  
Description  
Min.[12]  
Max.  
11.5  
Unit Fig. No.[13]  
Propagation Delay CP to Q  
(PE Input HIGH)  
2.0  
1.5  
1.5  
1.5  
1.5  
5.8  
5.2  
7.8  
4.4  
ns  
ns  
ns  
ns  
1, 5  
1, 5  
1, 5  
1, 5  
tPLH  
tPHL  
Propagation Delay CP to TC  
(PE Input LOW)  
2.0  
2.0  
1.5  
10.0  
16.5  
9.0  
tPLH  
tPHL  
Propagation Delay CP to TC  
tPLH  
tPHL  
Propagation Delay CET to TC  
tS  
Set-Up Time, HIGH or LOW P to CP  
Hold Time, HIGH or LOW P to CP  
5.5  
2.0  
3.5  
1.5  
7.6  
ns  
ns  
ns  
4
4
4
tH  
tSU  
Set-Up Time HIGH or LOW  
PE or SR to CP  
13.5  
tH  
Hold Time HIGH or LOW  
PE or SR to CP  
1.5  
13.0  
0
1.0  
7.6  
0
ns  
ns  
ns  
ns  
ns  
4
4
4
5
5
tSU  
tH  
Set-Up Time HIGH or LOW  
CEP or CET to CP  
Hold Time HIGH or LOW  
CEP or CET to CP  
tW  
Clock Pulse Width (Load)  
HIGH or LOW  
5.0  
8.0  
4.0  
5.0  
tW  
Clock Pulse Width(Count)  
HIGH or LOW  
Notes:  
12. Minimum limits are specified but not tested on Propagation Delays.  
13. See “Parameter Measurement Information” in the General Information section.  
Ordering Information  
Speed  
(ns)  
Package  
Name  
Operating  
Range  
Ordering Code  
CY74FCT163CTQCT  
Package Type  
5.8  
Q1  
S1  
16-Lead (150-Mil) QSOP  
Commercial  
CY74FCT163CTSOC/SOCT  
CY54FCT163TLMB  
16-Lead (300-Mil) Molded SOIC  
20-Square Leadless Chip Carrier  
11.5  
L61  
Military  
Document #: 3800285B  
4
CY54/74FCT163T  
Package Diagrams  
20-Pin Square Leadless Chip Carrier L61  
MILSTD1835 C2A  
16-Lead Quarter Size Outline Q1  
5
CY54/74FCT163T  
Package Diagrams (continued)  
16-Lead Molded SOIC S1  
6
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL  
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR  
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER  
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO  
BE FULLY AT THE CUSTOMER’S RISK.  
In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other  
intellectual property right of TI covering or relating to any combination, machine, or process in which such  
semiconductor products or services might be or are used. TI’s publication of information regarding any third  
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.  
Copyright 2000, Texas Instruments Incorporated  

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