CY74FCT2827ATQCT [TI]

10-Bit Buffer; 10位缓冲


型号：	CY74FCT2827ATQCT
厂家：	TEXAS INSTRUMENTS
描述：	10-Bit Buffer 10位缓冲总线驱动器总线收发器逻辑集成电路光电二极管输出元件
文件：	总6页 (文件大小：44K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

1CY74FCT2827T

Data sheet acquired from Cypress Semiconductor Corporation.

Data sheet modiﬁed to remove devices not offered.

CY74FCT2827T

10-Bit Buffer

SCCS045 - May 1994 - Revised March 2000

Features

Functional Description

• Function and pinout compatible with FCT, F, and

AM29827 logic

• FCT-C speed at 5.0 ns max. (Com’l),

FCT-A speed at 8.0 ns max. (Com’l)

• 25Ω output series resistors to reduce transmission line

reﬂection noise

• Reduced V_OH(typically = 3.3V) versions of equivalent

FCT functions

• Edge-rate control circuitry for signiﬁcantly improved

noise characteristics

• Power-off disable feature

• ESD > 2000V

The FCT2827T 10-bit bus driver provides high-performance

bus interface buffering for wide data/address paths or buses

carrying parity. This 10-bit buffer has NAND-ed output enables for

maximum control flexibility. The FCT2827T is designed for

high-capacitance load drive capability, while providing low-capaci-

tance bus loading at both inputs and outputs. All inputs have clamp

diodesand all outputsare designedfor low-capacitancebus loading

in the high impedance state. On-chip termination resistors have

been added to the outputs to reduce system noise caused by re-

flections. The FCT2827T can be used to replace the FCT827T to

reduce noise in an existing design.

The outputs are designed with a power-off disable feature to

allow for live insertion of boards.

• Matched rise and fall times

• Fully compatible with TTL input and output logic levels

• Extended commercial temp. range of –40˚C to +85˚C

• Sink current

Source current

12 mA

15 mA

Pin Configurations

Logic Block Diagram

SOIC/QSOP

Top View

OE OE

FCT2827T–3

GND

FCT2827T–2

Function Table^[1]

Inputs

Outputs

OE₁

OE₂

Function

Transparent

Three-State

Note:

1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care.

CY74FCT2827T

Maximum Ratings^{[2, 3]}

DC Output Current (Maximum Sink Current/Pin) ......120 mA

Power Dissipation..........................................................0.5W

(Above which the useful life may be impaired. For user guide-

lines, not tested.)

Static Discharge Voltage............................................>2001V

(per MIL-STD-883, Method 3015)

Storage Temperature .................................–65°C to +150°C

Ambient Temperature with

Power Applied.............................................–65°C to +135°C

Operating Range

Ambient

Supply Voltage to Ground Potential ............... –0.5V to +7.0V

DC Input Voltage............................................ –0.5V to +7.0V

DC Output Voltage......................................... –0.5V to +7.0V

Range

Temperature

V_CC

Commercial

–40°C to +85°C

5V ± 5%

Electrical Characteristics Over the Operating Range

Parameter

V_OH

V_OL

R_OUT

V_IH

Description

Output HIGH Voltage

Output LOW Voltage

Output Resistance

Input HIGH Voltage

Input LOW Voltage

Hysteresis^[5]

Test Conditions

V_CC= Min., I_OH= –15 mA

V_CC= Min., I_OL= 12 mA

Min.

Typ.^[4]

Max.

Unit

2.4

3.3

0.3

0.55

Ω

2.0

V_IL

0.8

V_H

All inputs

0.2

V_IK

Input Clamp Diode Voltage

Input HIGH Current

Input LOW Current

V_CC= Min., I_IN= –18 mA

V_CC= Max., V_IN= V_CC

V_CC= Max., V_IN= 2.7V

V_CC= Max., V_IN= 0.5V

V_CC= Max., V_OUT= 2.7V

–0.7

–1.2

I_I

µA

I_IH

±1

I_IL

I_OZH

Off State HIGH-Level Output

Current

I_OZL

Off State LOW-Level

Output Current

V_CC= Max., V_OUT= 0.5V

–10

µA

I_OS

Output Short Circuit Current^[6]V_CC= Max., V_OUT= 0.0V

–60

–120

–225

I_OFF

Power-Off Disable

V_CC= 0V, V_OUT= 4.5V

±1

µA

Capacitance^[5]

Parameter

Description

Typ.^[4]

Max.

Unit

C_IN

Input Capacitance

Output Capacitance

C_OUT

Notes:

2. Unless otherwise noted, these limits are over the operating free-air temperature range.

3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V_CCor ground.

4. Typical values are at V_CC=5.0V, T_A=+25˚C ambient.

5. This parameter is speciﬁed but not tested.

6. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample

and hold techniques are preferable in order to minimize internal chip heating and more accurately reﬂect operational values. Otherwise prolonged shorting of

a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter

tests, I_OStests should be performed last.

CY74FCT2827T

Power Supply Characteristics

Parameter

I_CC

Description

Test Conditions

V_CC=Max., V_IN≤ 0.2V,

_IN≥ V_CC-0.2V

Typ.^[4]Max.

Unit

Quiescent Power Supply Current

0.1

0.2

∆I_CC

Quiescent Power Supply Current

(TTL inputs HIGH)

V_CC=Max., V_IN=3.4V,^[7]

f₁=0, Outputs Open

0.5

2.0

I_CCD

Dynamic Power Supply

Current^[8]

V_CC=Max., One Input Toggling,

50% Duty Cycle, Outputs Open,

OE₁or OE₂=GND,

0.06

0.12

mA/

MHz

V_IN≤ 0.2V or V_IN≥ V_CC-0.2V

I_C

Total Power Supply Current^[9]

V_CC=Max.,

0.7

1.0

1.6

1.4

2.4

50% Duty Cycle, Outputs Open,

One Bit Toggling at f₁=10 MHz,

OE₁or OE₂=GND,

V_IN≤ 0.2V or V_IN≥ V_CC-0.2V

V_CC=Max.,

50% Duty Cycle, Outputs Open,

One Bit Toggling at f₁=10 MHz,

OE₁or OE₂=GND,

V_IN=3.4V or V_IN=GND

V_CC=Max.,

3.2^[10]

50% Duty Cycle, Outputs Open,

Ten Bits Toggling at f₁=2.5 MHz,

OE₁or OE₂=GND,

V_IN≤ 0.2V or V_IN≥ V_CC-0.2V

V_CC=Max., 50% Duty Cycle, Outputs Open,

Ten Bits Toggling at f₁=2.5 MHz,

OE₁or OE₂=GND,

4.1 13.2^[10]mA

V_IN=3.4V or V_IN=GND

Notes:

7. Per TTL driven input (V_IN=3.4V); all other inputs at V_CCor GND.

8. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.

9. I_C

I_C

I_QUIESCENT+ I_INPUTS+ I_DYNAMIC

I_CC+∆I_CCD_HN_T+I_CCD(f₀/2 + f₁N₁)

Quiescent Current with CMOS input levels

Power Supply Current for a TTL HIGH input

(V_IN=3.4V)

I_CC

∆I_CC

D_H

N_T

I_CCD

Duty Cycle for TTL inputs HIGH

Number of TTL inputs at D_H

Dynamic Current caused by an input transition pair

(HLH or LHL)

f₀

f₁

N₁

Clock frequency for registered devices, otherwise zero

Input signal frequency

Number of inputs changing at f₁

All currents are in milliamps and all frequencies are in megahertz.

10. Values for these conditions are examples of the I_CCformula. These limits are speciﬁed but not tested.

]

CY74FCT2827T

Switching Characteristics Over the Operating Range^[11]

CY74FCT2827AT CY74FCT2827CT

Fig.

Param.

t_PLH

t_PHL

Description

Test Load

Min.

Max.

Min.

Max.

Unit No.^[12]

Propagation Delay D to Y

C_L=50 pF

R_L=500Ω

1.5

8.0

1.5

4.4

1, 3

t_PLH

t_PHL

Propagation Delay D to Y^[5]

Output Enable Time OE to Y

Output Enable Time OE to Y^[5]

Output Disable Time OE to Y^[5]

Output Disable Time OE to Y

C_L=300 pF

R_L=500Ω

1.5

15.0

12.0

23.0

9.0

1.5

10.0

7.0

1, 3

t_PZH

t_PZL

C_L=50 pF

R_L=500Ω

1, 7, 8

t_PZH

t_PZL

C_L=300 pF

R_L=500Ω

14.0

5.7

t_PHZ

t_PHL

C_L=5 pF

R_L=500Ω

t_PHZ

t_PHL

C_L=50 pF

R_L=500Ω

9.0

6.0

Ordering Information

Speed

(ns)

Package

Name

Operating

Range

Ordering Code

Package Type

4.4

CY74FCT2827CTQCT

CY74FCT2827ATQCT

Q13

24-Lead (150-Mil) QSOP

Commercial

8.0

Note:

11. Minimum limits are speciﬁed but not tested on Propagation Delays.

12. See “Parameter Measurement Information” in the General Information section.

Document #: 38-00347-A

CY74FCT2827T

Package Diagram

24-Lead Quarter Size Outline Q13

IMPORTANT NOTICE

Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue

any product or service without notice, and advise customers to obtain the latest version of relevant information

to verify, before placing orders, that information being relied on is current and complete. All products are sold

subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those

pertaining to warranty, patent infringement, and limitation of liability.

TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in

accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent

TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily

performed, except those mandated by government requirements.

CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF

DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL

APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR

WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER

CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO

BE FULLY AT THE CUSTOMER’S RISK.

In order to minimize risks associated with the customer’s applications, adequate design and operating

safeguards must be provided by the customer to minimize inherent or procedural hazards.

TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent

that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other

intellectual property right of TI covering or relating to any combination, machine, or process in which such

semiconductor products or services might be or are used. TI’s publication of information regarding any third

party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.

CY74FCT2827ATQCT [TI]

相关型号：

CY74FCT2827ATQCTE4

CY74FCT2827BTPC

CY74FCT2827BTSOCR

CY74FCT2827BTSOCT

CY74FCT2827CTQC

CY74FCT2827CTQCT

CY74FCT2827CTQCTE4

CY74FCT2827CTSOCR

CY74FCT2827T

CY74FCT2827TQSOP

CY74FCT2827TSOIC

CY74FCT373ATQCT