CY74FCT543TSOIC [TI]
8-Bit Latched Registered Transceiver; 8位锁存寄存收发器型号: | CY74FCT543TSOIC |
厂家: | TEXAS INSTRUMENTS |
描述: | 8-Bit Latched Registered Transceiver |
文件: | 总9页 (文件大小:76K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Data sheet acquired from Cypress Semiconductor Corporation.
Data sheet modified to remove devices not offered.
CY54/74FCT543T
SCCS030 - May 1994 - Revised March 2000
8-Bit Latched Registered Transceiver
Features
Functional Description
• Function, pinout, and drive compatible with FCT and
The FCT543T octal latched transceiver contains two sets of
eight D-type latches with separate latch enable (LEAB, LEBA)
and output enable (OEAB, OEBA) controls for each set to
permit independent control of inputting and outputting in either
direction of data flow. For data flow from A to B, for example,
the A-to-B enable (CEAB) input must be LOW in order to enter
data from A or to take data from B, as indicated in the truth
table. With CEAB LOW, a LOW signal on the A-to-B latch
enable (LEAB) input makes the A-to-B latches transparent; a
subsequent LOW-to-HIGH transition of the LEAB signal puts
the A latches in the storage mode and their output no longer
change with the A inputs. With CEAB and OEAB both LOW,
the three-stage B output buffers are active and reflect the data
present at the output of the A latches. Control of data from B
to A is similar, but uses CEAB, LEAB, and OEAB inputs.
F logic
• FCT-C speed at 5.3 ns max. (Com’l)
FCT-A speed at 6.5 ns max. (Com’l)
• Reduced VOH (typically = 3.3V) versions of equivalent
FCT functions
• Edge-rate control circuitry for significantly improved
noise characteristics
• Power-off disable feature
• Matched rise and fall times
• Fully compatible with TTL input and output logic levels
• ESD > 2000V
• Sink current
Source current
64 mA (Com’l), 48 mA (Mil)
32 mA (Com’l), 12 mA (Mil)
• Separation controls for data flow in each direction
• Back to back latches for storage
The outputs are designed with a power-off disable feature to
allow for live insertion of boards.
• Extended commercial range of −40˚C to +85˚C
Functional Block Diagram
Logic Block Diagram
DetailA
B
D Q
LE
0
A
0
A
1
A
2
A
3
A
4
A
5
A
6
A
7
CEAB
OEAB
A
0
Q D
LE
CEBA
LEAB
LEBA
OEBA
A
B
B
B
B
B
B
B
1
1
2
3
4
5
6
7
B
B
B
B
B
B
B
B
7
0
1
2
3
4
5
6
A
2
A
3
A
4
DetailA x 7
A
5
A
6
Pin Configurations
A
7
SOIC/QSOP
Top View
OEBA
OEAB
1
LEBA
OEBA
24
23
22
21
CEBA
LEBA
V
CC
2
CEBA
CEAB
LEAB
3
A
0
B
0
4
A
1
B
1
A
2
5
B
2
20
19
18
17
16
A
3
6
B
3
A
4
B
4
7
A
5
B
5
8
A
6
B
6
9
A
7
B
7
10
11
12
15
14
13
CEAB
GND
LEAB
OEAB
Copyright © 2000, Texas Instruments Incorporated
CY54/74FCT543T
Maximum Ratings[4, 5]
Pin Description
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Name
Description
OEAB
OEBA
CEAB
CEBA
LEAB
LEBA
A
A-to-B Output Enable Input (Active LOW)
B-to-A Output Enable Input (Active LOW)
A-to-B Enable Input (Active LOW)
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied............................................. –65°C to +135°C
B-to-A Enable Input (Active LOW)
Supply Voltage to Ground Potential............... –0.5V to +7.0V
DC Input Voltage ........................................... –0.5V to +7.0V
DC Output Voltage......................................... –0.5V to +7.0V
DC Output Current (Maximum Sink Current/Pin) ......120 mA
Power Dissipation..........................................................0.5W
A-to-B Latch Enable Input (Active LOW)
B-to-A Latch Enable Input (Active LOW)
A-to-B Data Inputs or B-to-A Three-State Outputs
B-to-A Data Inputs or A-to-B Three-State Outputs
B
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Function Table[1, 2]
Inputs
Latch
OEAB A-to-B[3]
Outputs
B
Operating Range
CEAB
LEAB
Ambient
H
X
X
L
X
H
X
L
X
X
H
L
Storing
Storing
X
High Z
X
Range
Range
Temperature
VCC
Commercial DT
0°C to +70°C
5V ± 5%
5V ± 5%
5V ± 10%
High Z
Commercial T, AT, CT
Military[6]
–40°C to +85°C
–55°C to +125°C
Transpar- Current A Inputs
ent
All
L
H
L
Storing
Previous A Inputs
Notes:
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care.
2. A-to-B data flow shown: B-to-A flow control is the same, except using CEBA, LEBA, and OEBA.
3. Before LEAB LOW-to-HIGH Transition.
4. Unless otherwise noted, these limits are over the operating free-air temperature range.
5. Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.
6. TA is the “instant on” case temperature.
2
CY54/74FCT543T
Electrical Characteristics Over the Operating Range
Parameter
Description
Test Conditions
VCC=Min., IOH=–32 mA
Min.
2.0
Typ.[7]
Max.
Unit
V
VOH
Output HIGH Voltage
Com’l
Com’l
Mil
VCC=Min., IOH=–15 mA
VCC=Min., IOH=–12 mA
VCC=Min., IOL=64 mA
VCC=Min., IOL=48mA
2.4
3.3
3.3
0.3
0.3
V
2.4
V
VOL
Output LOW Voltage
Com’l
Mil
0.55
0.55
V
V
VIH
VIL
VH
VIK
IIH
Input HIGH Voltage
Input LOW Voltage
Hysteresis[8]
2.0
V
0.8
V
All inputs
0.2
V
Input Clamp Diode Voltage
Input HIGH Current
Input HIGH Current[8]
Input LOW Current[8]
VCC=Min., IIN=–18 mA
VCC=Max., VIN=VCC
VCC=Max., VIN=2.7V
VCC=Max., VIN=0.5V
VCC=Max., VOUT = 2.7V
–0.7
–1.2
5
V
µA
µA
µA
µA
IIH
±1
±1
10
IIL
IOZH
Off State HIGH-Level Output
Current
IOZL
Off State LOW-Level
Output Current
VCC= Max., VOUT = 0.5V
–10
µA
IOS
Output Short Circuit Current[9] VCC=Max., VOUT=0.0V
–60
–120
–225
mA
IOFF
Power-Off Disable
VCC=0V, VOUT=4.5V
±1
µA
Capacitance[8]
Parameter
Description
Typ.[7]
Max.
10
Unit
CIN
Input Capacitance
Output Capacitance
5
9
pF
pF
COUT
12
Notes:
7. Typical values are at VCC=5.0V, TA=+25˚C ambient.
8. This parameter is specified but not tested.
9. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last.
3
CY54/74FCT543T
Power Supply Characteristics
Parameter
ICC
Description
Test Conditions
Typ.[7]
0.1
Max.
0.2
Unit
mA
mA
Quiescent Power Supply Current VCC=Max., VIN≤0.2V, VIN≥VCC–0.2V
Quiescent Power Supply Current VCC=Max., VIN=3.4V,[10]
∆ICC
0.5
2.0
(TTL inputs)
f1=0, Outputs Open
ICCD
Dynamic Power Supply Current[11] VCC=Max., One Input Toggling,
0.06
0.7
0.12
1.4
mA/MHz
50% Duty Cycle, Outputs Open,
CEAB and OEAB=LOW, CEBA=HIGH,
VIN≤0.2V or VIN≥VCC–0.2V
IC
Total Power Supply Current[12]
VCC=Max., f0=10 MHz,
mA
50% Duty Cycle, Outputs Open,
One Bit Toggling at f1=5 MHz,
CEAB and OEAB=LOW,CEBA=HIGH,
f0=LEAB = 10 MHz,
VIN≤0.2V or VIN≥VCC–0.2V
VCC=Max., f0=10 MHz,
50% Duty Cycle, Outputs Open,
One Bit Toggling at f1=5 MHz,
CEAB and OEAB=LOW, CEBA=HIGH,
f0=LEAB = 10 MHz, VIN=3.4V or VIN=GND
1.2
2.8
3.4
mA
mA
VCC=Max., f0=10 MHz,
5.6[13]
50% Duty Cycle, Outputs Open,
Eight Bits Toggling at f1=5 MHz,
CEAB and OEAB=LOW, CEBA=HIGH,
f0=LEAB = 10 MHz,
VIN≤0.2V or VIN≥VCC–0.2V
VCC=Max., f0=10 MHz,
5.1
14.6[13]
mA
50% Duty Cycle, Outputs Open,
Eight Bits Toggling at f1=5 MHz,
CEAB and OEAB=LOW, CEBA=HIGH,
f0=LEAB = 10 MHz, VIN=3.4V or VIN=GND
Notes:
10. Per TTL driven input (VIN=3.4V); all other inputs at VCC or GND.
11. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
12. IC
IC
=
=
=
=
=
=
=
=
=
=
IQUIESCENT + IINPUTS + IDYNAMIC
ICC+∆ICCDHNT+ICCD(f0/2 + f1N1)
Quiescent Current with CMOS input levels
Power Supply Current for a TTL HIGH input (VIN=3.4V)
Duty Cycle for TTL inputs HIGH
ICC
∆ICC
DH
NT
ICCD
f0
Number of TTL inputs at DH
Dynamic Current caused by an input transition pair (HLH or LHL)
Clock frequency for registered devices, otherwise zero
Input signal frequency
f1
N1
Number of inputs changing at f1
All currents are in milliamps and all frequencies are in megahertz.
13. Values for these conditions are examples of the ICC formula. These limits are specified but not tested.
4
CY54/74FCT543T
Switching Characteristics Over the Operating Range[14]
FCT543T
Commercial
Min.[14] Max. Min.[14] Max. Min.[14]
FCT543AT
Military
Commercial
Parameter
Description
Propagation Delay
Transparent Mode A to B or B to A
Max.
Unit Fig. No.[15]
tPLH
tPHL
2.0
2.5
2.0
10.0
14.0
14.0
2.5
2.5
2.0
8.5
2.5
2.5
2.0
6.5
ns
ns
ns
1, 3
tPLH
tPHL
Propagation Delay
LEBA to A, LEAB to B
12.5
12.0
8.0
9.0
1, 5
tPZH
tPZL
Output Enable Time
OEBA or OEAB to A or B
CEBA or CEAB to A or B
1, 7, 8
tPZH
tPZL
Output Disable Time
OEBA or OEAB to A or B
CEBA or CEAB to A or B
2.0
13.0
2.0
9.0
2.0
7.5
ns
1, 7, 8
tS
Set-Up Time HIGH or LOW,
A or B to LEBA or LEAB
3.0
2.0
5.0
2.0
2.0
5.0
2.0
2.0
5.0
ns
ns
ns
9
9
5
tH
tW
Hold Time HIGH or LOW,
A or B to LEBA or LEAB
Pulse Width LOW[8]
LEBA or LEAB
FCT543CT
Commercial
Parameter
Description
Min.[14]
Max.
5.3
Unit
Fig. No.[15]
tPLH
tPHL
Propagation Delay
2.5
2.5
2.0
ns
ns
ns
1, 3
Transparent Mode A to B or B to A
tPLH
tPHL
Propagation Delay
LEBA to A, LEAB to B
7.0
8.0
1, 5
tPZH
tPZL
Output Enable Time
OEBA or OEAB to A or B
CEBA or CEAB to A or B
1, 7, 8
tPZH
tPZL
Output Disable Time
OEBA or OEAB to A or B
CEBA or CEAB to A or B
2.0
6.5
ns
1, 7, 8
tS
tH
Set-Up Time, HIGH or LOW,
A or B to LEBA or LEAB
2.0
2.0
5.0
ns
ns
ns
9
9
5
Hold Time, HIGH or LOW,
A or B to LEBA or LEAB
Pulse Width LOW LEBA or LEAB[8]
tW
Notes:
14. Minimum limits are specified but not tested on Propagation Delays.
15. See “Parameter Measurement Information” in the General Information Section.
5
CY54/74FCT543T
Ordering Information
Speed
Package
Name
Operating
Range
(ns)
Ordering Code
Package Type
24-Lead (150-Mil) QSOP
5.3
CY74FCT543CTQCT
Q13
S13
Q13
S13
Q13
S13
D14
Commercial
Commercial
Commercial
Military
CY74FCT543CTSOC/SOCT
CY74FCT543ATQCT
24-Lead (300-Mil) Molded SOIC
24-Lead (150-Mil) QSOP
6.5
8.5
CY74FCT543ATSOC/SOCT
CY74FCT543TQCT
24-Lead (300-Mil) Molded SOIC
24-Lead (150-Mil) QSOP
CY74FCT543TSOC/SOCT
CY54FCT543TDMB
24-Lead (300-Mil) Molded SOIC
24-Lead (300-Mil) CerDIP
10.0
Document #: 38-00264-B
6
CY54/74FCT543T
Package Diagrams
24-Lead (300-Mil) CerDIP D14
MIL-STD-1835 D-9 Config.A
24-Lead Quarter Size Outline Q13
7
CY54/74FCT543T
Package Diagrams (continued)
24-Lead (300-Mil) Molded SOIC S13
8
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pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
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DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
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Copyright 2000, Texas Instruments Incorporated
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