DAC8551IADGKR [TI]

16-BIT, ULTRA-LOW GLITCH, VOLTAGE OUTPUT; 16位,超低干扰,电压输出
DAC8551IADGKR
型号: DAC8551IADGKR
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

16-BIT, ULTRA-LOW GLITCH, VOLTAGE OUTPUT
16位,超低干扰,电压输出

转换器 数模转换器 光电二极管 输出元件
文件: 总26页 (文件大小:1009K)
中文:  中文翻译
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DAC8551  
SLAS429BAPRIL 2005REVISED OCTOBER 2006  
16-BIT, ULTRA-LOW GLITCH, VOLTAGE OUTPUT  
DIGITAL-TO-ANALOG CONVERTER  
FEATURES  
DESCRIPTION  
Relative Accuracy: 3LSB  
The DAC8551 is a small, low-power, voltage output,  
16-bit digital-to-analog converter (DAC). It is  
monotonic, provides good linearity, and minimizes  
undesired code-to-code transient voltages. The  
DAC8551 uses a versatile 3-wire serial interface that  
operates at clock rates to 30MHz and is compatible  
with standard SPI™, QSPI™, Microwire™, and  
digital signal processor (DSP) interfaces.  
Glitch Energy: 0.1nV-s  
MicroPower Operation:  
140µA at 2.7V  
Power-On Reset to Zero  
Power Supply: +2.7V to +5.5V  
16-Bit Monotonic Over Temperature  
Settling Time: 10µs to ±0.003% FSR  
The DAC8551 requires an external reference voltage  
to set its output range. The DAC8551 incorporates a  
power-on-reset circuit that ensures the DAC output  
powers up at 0V and remains there until a valid write  
takes place to the device. The DAC8551 contains a  
power-down feature, accessed over the serial  
interface, that reduces the current consumption of  
the device to 200nA at 5V.  
Low-Power Serial Interface with  
Schmitt-Triggered Inputs  
On-Chip Output Buffer Amplifier with  
Rail-to-Rail Operation  
Power-Down Capability  
Binary Input  
The low-power consumption of this device in normal  
operation makes it ideally suited for portable, battery-  
operated equipment. The power consumption is  
0.38mW at 2.7V, reducing to less than 1µW in  
power-down mode.  
SYNC Interrupt Facility  
Drop-In Compatible With DAC8531/01  
and DAC8550 (2's Complement Input)  
Available in a Tiny MSOP-8 Package  
The DAC8551 is available in an MSOP-8 package.  
APPLICATIONS  
For additional flexibilty, see the DAC8550, a 2's  
complement-input counterpart to the DAC8551.  
Process Control  
Data Acquisition Systems  
Closed-Loop Servo-Control  
PC Peripherals  
Portable Instrumentation  
Programmable Attenuation  
FUNCTIONAL BLOCK DIAGRAM  
VDD  
VFB  
VREF  
Ref (+)  
VOUT  
16-Bit DAC  
16  
DAC Register  
16  
SYNC  
SCLK  
DIN  
Resistor  
Network  
Shift Register  
PWD Control  
GND  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SPI, QSPI are trademarks of Motorola, Inc.  
Microwire is a trademark of National Semiconductor.  
All other trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2005–2006, Texas Instruments Incorporated  
DAC8551  
www.ti.com  
SLAS429BAPRIL 2005REVISED OCTOBER 2006  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be  
more susceptible to damage because very small parametric changes could cause the device not to meet its published  
specifications.  
PACKAGING/ORDERING INFORMATION(1)  
MAXIMUM  
RELATIVE  
ACCURACY  
(LSB)  
MAXIMUM  
DIFFERENTIAL  
NONLINEARITY GAIN ERROR PACKAGE  
MAXIMUM  
SPECIFIED  
TEMPERATURE  
RANGE  
PACKAGE  
DESIGNATOR  
PACKAGE  
MARKING  
ORDERING  
NUMBER  
TRANSPORT  
MEDIA, QUANTITY  
PRODUCT  
(LSB)  
(% OF FSR)  
LEAD  
DAC8551IDGK  
DAC8551IDGKT  
DAC8551IDGKR  
DAC8551IADGK  
DAC8551IADGKT  
DAC8551IADGKR  
Tube, 80  
DAC8551  
±8  
±1  
±0.15  
MSOP-8  
DGK  
DGK  
–40°C to +105°C  
–40°C to +105°C  
D81  
D81  
Tape and Reel, 250  
Tape and Reel, 2500  
Tube, 80  
DAC8551A  
±12  
±1  
±0.2  
MSOP-8  
Tape and Reel, 250  
Tape and Reel, 2500  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this data sheet, or see the TI  
website at www.ti.com.  
ABSOLUTE MAXIMUM RATINGS(1)  
UNIT  
VDD to GND  
–0.3V to 6V  
–0.3V to +VDD + 0.3V  
–0.3V to +VDD + 0.3V  
–40°C to +105°C  
–65°C to +150°C  
+150°C  
Digital input voltage to GND  
VOUT to GND  
Operating temperature range  
Storage temperature range  
Junction temperature range (TJ max)  
Power dissipation (DGK)  
(TJ max – TA)/θJA  
206°C/W  
θJA  
Thermal impedance  
θJC  
44°C/W  
(1) Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute  
maximum conditions for extended periods may affect device reliability.  
ELECTRICAL CHARACTERISTICS  
VDD = 2.7V to 5.5V,and –40°C to +105°C range, unless otherwise noted.  
PARAMETER  
STATIC PERFORMANCE(1)  
Resolution  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
16  
Bits  
LSB  
DAC8551  
±3  
±3  
±8  
±12  
Measured by line passing through  
Relative accuracy  
codes 485 and 64741  
DAC8551A  
LSB  
Differential nonlinearity  
Zero-code error  
16-bit monotonic  
±0.25  
±2  
±1  
LSB  
±12  
mV  
Measured by line passing through codes 485 and 64741  
Full-scale error  
±0.05  
±0.02  
±0.02  
±5  
±0.5  
±0.15  
±0.2  
% of FSR  
% of FSR  
% of FSR  
µV/°C  
DAC8551  
Measured by line passing through  
codes 485 and 64741  
Gain error  
DAC8551A  
Zero-code error drift  
ppm of  
FSR/°C  
Gain temperature coefficient  
PSRR Power-supply rejection ratio  
±1  
RL = 2k, CL = 200pF  
0.75  
mV/V  
(1) Linearity calculated using a reduced code range of 485 to 64741; output unloaded.  
2
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DAC8551  
www.ti.com  
SLAS429BAPRIL 2005REVISED OCTOBER 2006  
ELECTRICAL CHARACTERISTICS (continued)  
VDD = 2.7V to 5.5V,and –40°C to +105°C range, unless otherwise noted.  
PARAMETER  
OUTPUT CHARACTERISTICS(2)  
Output voltage range  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
0
VREF  
10  
V
To ±0.003% FSR, 0200h to FD00h, RL = 2k,  
8
µs  
0pF < CL < 200pF  
Output voltage settling time  
RL = 2k, CL = 50 pF  
12  
1.8  
470  
1000  
0.1  
0.1  
1
µs  
V/µs  
pF  
Slew rate  
RL = ∞  
Capacitive load stability  
RL = 2kΩ  
pF  
Code change glitch impulse  
Digital feedthrough  
1LSB change around major carry  
50kseries resistance on digital lines  
At mid-code input  
nV-s  
DC output impedance  
VDD = 5V  
50  
Short-circuit current  
Power-up time  
mA  
VDD = 3V  
20  
Coming out of power-down mode, VDD = 5V  
Coming out of power-down mode, VDD = 3V  
2.5  
5
µs  
AC PERFORMANCE  
SNR  
95  
–85  
87  
THD  
BW = 20kHz, VDD = 5V, fOUT = 1kHz, 1st 19 harmonics removed  
for SNR calculation  
dB  
SFDR  
SINAD  
84  
REFERENCE INPUT  
VREF = VDD = 5V  
40  
30  
75  
45  
µA  
µA  
V
Reference current  
VREF = VDD = 3.6V  
Reference input range  
Reference input impedance  
LOGIC INPUTS(2)  
0
VDD  
125  
kΩ  
Input current  
±1  
µA  
VDD = 5V  
VDD = 3V  
VDD = 5V  
VDD = 3V  
0.8  
0.6  
VIN  
L
Input LOW voltage  
Input HIGH voltage  
V
2.4  
2.1  
VINH  
V
Pin capacitance  
POWER REQUIREMENTS  
VDD  
3
pF  
2.7  
5.5  
V
IDD  
(normal mode)  
Input code = 32768, no load, does not include reference current  
VIH = VDD and VIL = GND  
VDD = 3.6V to 5.5V  
VDD = 2.7V to 3.6V  
(all power-down modes)  
VDD = 3.6V to 5.5V  
VDD = 2.7V to 3.6V  
160  
140  
250  
240  
µA  
IDD  
VIH = VDD and VIL = GND  
ILOAD = 2mA, VDD = 5V  
0.2  
2
2
µA  
0.05  
POWER EFFICIENCY  
IOUT/IDD  
89  
%
TEMPERATURE RANGE  
Specified performance  
–40  
+105  
°C  
(2) Specified by design and characterization; not production tested.  
3
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DAC8551  
www.ti.com  
SLAS429BAPRIL 2005REVISED OCTOBER 2006  
PIN CONFIGURATION  
DGK PACKAGE  
MSOP-8  
(Top View)  
VDD  
VREF  
VFB  
GND  
DIN  
1
2
3
4
8
7
6
5
DAC8551  
SCLK  
SYNC  
VOUT  
PIN DESCRIPTIONS  
PIN NAME  
DESCRIPTION  
1
2
3
4
VDD  
VREF  
VFB  
Power supply input, 2.7V to 5.5V.  
Reference voltage input.  
Feedback connection for the output amplifier. For voltage output operation, tie to VOUT externally.  
VOUT Analog output voltage from DAC. The output amplifier has rail-to-rail operation.  
Level-triggered control input (active LOW). This is the frame synchronization signal for the input data. When SYNC goes  
LOW, it enables the input shift register and data is transferred in on the falling edges of the following clocks. The DAC is  
updated following the 24th clock (unless SYNC is taken HIGH before this edge, in which case the rising edge of SYNC  
acts as an interrupt and the write sequence is ignored by the DAC8551). Schmitt-Trigger logic input.  
5
SYNC  
6
7
8
SCLK Serial clock input. Data can be transferred at rates up to 30MHz. Schmitt-Trigger logic input.  
Serial data input. Data is clocked into the 24-bit input shift register on each falling edge of the serial clock input.  
Schmitt-Trigger logic input.  
DIN  
GND Ground reference point for all circuitry on the part.  
4
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DAC8551  
www.ti.com  
SLAS429BAPRIL 2005REVISED OCTOBER 2006  
SERIAL WRITE OPERATION  
t9  
t1  
SCLK  
1
24  
t8  
t2  
t3  
t7  
t4  
SYNC  
t6  
t5  
DB23  
DIN  
DB0  
DB23  
TIMING CHARACTERISTICS(1)(2)  
VDD = 2.7V to 5.5V, all specifications –40°C to +105°C (unless otherwise noted).  
PARAMETER  
TEST CONDITIONS  
VDD = 2.7V to 3.6V  
MIN  
50  
33  
13  
13  
22.5  
13  
0
TYP  
MAX  
UNIT  
(3)  
t1  
t2  
t3  
t4  
t5  
t6  
t7  
SCLK cycle time  
SCLK HIGH time  
SCLK LOW time  
ns  
VDD = 3.6V to 5.5V  
VDD = 2.7V to 3.6V  
VDD = 3.6V to 5.5V  
VDD = 2.7V to 3.6V  
VDD = 3.6V to 5.5V  
VDD = 2.7V to 3.6V  
VDD = 3.6V to 5.5V  
VDD = 2.7V to 3.6V  
VDD = 3.6V to 5.5V  
VDD = 2.7V to 3.6V  
VDD = 3.6V to 5.5V  
VDD = 2.7V to 3.6V  
VDD = 3.6V to 5.5V  
VDD = 2.7V to 3.6V  
VDD = 3.6V to 5.5V  
VDD = 2.7V to 5.5V  
ns  
ns  
ns  
ns  
ns  
ns  
SYNC to SCLK rising edge setup time  
Data setup time  
0
5
5
4.5  
4.5  
0
Data hold time  
24th SCLK falling edge to SYNC rising edge  
0
50  
33  
100  
t8  
t9  
Minimum SYNC HIGH time  
ns  
ns  
24th SCLK falling edge to SYNC falling edge  
(1) All input signals are specified with tR = tF = 5ns (10% to 90% of VDD) and timed from a voltage level of (VIL + VIH)/2.  
(2) See Serial Write Operation Timing Diagram.  
(3) Maximum SCLK frequency is 30MHz at VDD = 3.6V to 5.5V and 20MHz at VDD = 2.7V to 3.6V.  
5
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DAC8551  
www.ti.com  
SLAS429BAPRIL 2005REVISED OCTOBER 2006  
TYPICAL CHARACTERISTICS: VDD = 5 V  
At TA = +25°C, unless otherwise noted.  
LINEARITY ERROR AND  
LINEARITY ERROR AND  
DIFFERENTIAL LINEARITY ERROR  
DIFFERENTIAL LINEARITY ERROR  
vs DIGITAL INPUT CODE (-40°C)  
vs DIGITAL INPUT CODE (+25°C)  
6
4
6
4
VDD = 5V, VREF = 4.99V  
VDD = 5V, VREF = 4.99V  
2
2
0
0
-2  
-4  
-6  
-2  
-4  
-6  
1.0  
0.5  
1.0  
0.5  
0
0
-0.5  
-1.0  
-0.5  
-1.0  
0
8192 16384 24576 32768 40960 49152 57344 65536  
Digital Input Code  
0
8192 16384 24576 32768 40960 49152 57344 65536  
Digital Input Code  
Figure 1.  
Figure 2.  
LINEARITY ERROR AND  
DIFFERENTIAL LINEARITY ERROR  
vs DIGITAL INPUT CODE (+105°C)  
ZERO-SCALE ERROR  
vs TEMPERATURE  
6
4
10  
5
VDD = 5V  
VREF = 4.99V  
VDD = 5V, VREF = 4.99V  
2
0
-2  
-4  
-6  
1.0  
0.5  
0
0
-0.5  
-1.0  
-5  
0
8192 16384 24576 32768 40960 49152 57344 65536  
Digital Input Code  
-40  
0
40  
80  
120  
Temperature (°C)  
Figure 3.  
Figure 4.  
FULL-SCALE ERROR  
vs TEMPERATURE  
SOURCE AND SINK CURRENT CAPABILITY  
0
6
5
4
3
2
1
0
VDD = 5V  
VREF = 4.99V  
DAC Loaded with FFFFh  
-5  
VDD = 5.5V  
VREF = VDD - 10mV  
DAC Loaded with 0000h  
-10  
-40  
0
40  
80  
120  
0
2
4
6
8
10  
Temperature (°C)  
I(SOURCE/SINK) (mA)  
Figure 5.  
Figure 6.  
6
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DAC8551  
www.ti.com  
SLAS429BAPRIL 2005REVISED OCTOBER 2006  
TYPICAL CHARACTERISTICS: VDD = 5 V (continued)  
At TA = +25°C, unless otherwise noted.  
SUPPLY CURRENT  
vs DIGITAL INPUT CODE  
POWER-SUPPLY CURRENT  
vs TEMPERATURE  
300  
250  
200  
150  
100  
50  
VREF = VDD = 5V  
VDD = VREF = 5V  
250  
200  
Reference Current Included  
150  
100  
50  
0
0
-40  
-10  
20  
50  
80  
110  
0
8192 16384 24576 32768 40960 49152 57344 65536  
Digital Input Code  
Temperature (°C)  
Figure 7.  
Figure 8.  
SUPPLY CURRENT  
vs SUPPLY VOLTAGE  
POWER-DOWN CURRENT  
vs SUPPLY VOLTAGE  
300  
1.0  
0.8  
0.6  
0.4  
0.2  
0
VREF = VDD  
VREF = VDD  
280  
260  
240  
220  
200  
180  
160  
140  
120  
100  
Reference Current Included, No Load  
2.7  
3.1  
3.5  
3.9  
4.3  
4.7  
5.1  
5.5  
2.7  
3.1  
3.5  
4.3  
4.7  
5.1  
5.5  
VDD (V)  
VDD (V)  
Figure 9.  
Figure 10.  
SUPPLY CURRENT  
vs LOGIC INPUT VOLTAGE  
FULL-SCALE SETTLING TIME: 5V RISING EDGE  
1800  
1600  
1400  
1200  
1000  
800  
600  
400  
200  
0
TA = 25°C, SCL Input (all other inputs = GND)  
Trigger Pulse 5V/div  
VDD = VREF = 5.5V  
VDD = 5V  
VREF = 4.096V  
From Code: D000  
To Code: FFFF  
Rising Edge  
1V/div  
Zoomed Rising Edge  
1mV/div  
Time (2ms/div)  
0
1
2
3
4
5
VLOGIC (V)  
Figure 11.  
Figure 12.  
7
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DAC8551  
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SLAS429BAPRIL 2005REVISED OCTOBER 2006  
TYPICAL CHARACTERISTICS: VDD = 5 V (continued)  
At TA = +25°C, unless otherwise noted.  
FULL-SCALE SETTLING TIME: 5V FALLING EDGE  
HALF-SCALE SETTLING TIME: 5V RISING EDGE  
Trigger Pulse 5V/div  
Trigger Pulse 5V/div  
VDD = 5V  
VREF = 4.096V  
From Code: FFFF  
To Code: 0000  
VDD = 5V  
VREF = 4.096V  
Rising  
Edge  
1V/div  
From Code: 4000  
To Code: CFFF  
Falling  
Edge  
1V/div  
Zoomed Falling Edge  
1mV/div  
Zoomed Rising Edge  
1mV/div  
Time (2ms/div)  
Time (2ms/div)  
Figure 13.  
Figure 14.  
HALF-SCALE SETTLING TIME: 5V FALLING EDGE  
GLITCH ENERGY: 5V, 1LSB STEP, RISING EDGE  
Trigger Pulse 5V/div  
VDD = 5V  
VREF = 4.096V  
From Code: CFFF  
To Code: 4000  
VDD = 5V  
VREF = 4.096V  
From Code: 7FFF  
To Code: 8000  
Glitch: 0.08nV-s  
Falling  
Edge  
1V/div  
Zoomed Falling Edge  
1mV/div  
Time (2ms/div)  
Time (400ns/div)  
Figure 15.  
Figure 16.  
GLITCH ENERGY: 5V, 1LSB STEP, FALLING EDGE  
GLITCH ENERGY: 5V, 16LSB STEP, RISING EDGE  
VDD = 5V  
VDD = 5V  
VREF = 4.096V  
From Code: 8000  
To Code: 7FFF  
Glitch: 0.16nV-s  
Measured Worst Case  
VREF = 4.096V  
From Code: 8000  
To Code: 8010  
Glitch: 0.04nV-s  
Time (400ns/div)  
Time (400ns/div)  
Figure 17.  
Figure 18.  
8
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DAC8551  
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SLAS429BAPRIL 2005REVISED OCTOBER 2006  
TYPICAL CHARACTERISTICS: VDD = 5 V (continued)  
At TA = +25°C, unless otherwise noted.  
GLITCH ENERGY: 5V, 16LSB STEP, FALLING EDGE  
GLITCH ENERGY: 5V, 256LSB STEP, RISING EDGE  
VDD = 5V  
VREF = 4.096V  
From Code: 8010  
To Code: 8000  
Glitch: 0.08nV-s  
VDD = 5V  
VREF = 4.096V  
From Code: 8000  
To Code: 80FF  
Glitch: Not Detected  
Theoretical Worst Case  
Time (400ns/div)  
Time (400ns/div)  
Figure 19.  
Figure 20.  
TOTAL HARMONIC DISTORTION  
vs OUTPUT FREQUENCY  
GLITCH ENERGY: 5V, 256LSB STEP, FALLING EDGE  
-40  
VDD = 5V  
VDD = 5V  
VREF = 4.096V  
From Code: 80FF  
To Code: 8000  
VREF = 4.9V  
-50  
-60  
-1dB FSR Digital Input  
fS = 1MSPS  
Measurement Bandwidth = 20kHz  
Glitch: Not Detected  
Theoretical Worst Case  
-70  
THD  
-80  
-90  
2nd Harmonic  
1
3rd Harmonic  
-100  
Time (400ns/div)  
0
2
3
4
5
fOUT (kHz)  
Figure 21.  
Figure 22.  
SIGNAL-TO-NOISE RATIO  
vs OUTPUT FREQUENCY  
POWER SPECTRAL DENSITY  
98  
VREF = VDD = 5V  
VDD = 5V  
-10  
-30  
-1dB FSR Digital Input  
VREF = 4.096V  
fOUT = 1kHz  
96  
fS = 1MSPS  
Measurement Bandwidth = 20kHz  
94  
f
= 1MSPS  
CLK  
-50  
92  
90  
88  
86  
84  
-70  
-90  
-110  
-130  
0
5
10  
15  
20  
0
0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.5  
fOUT (kHz)  
Frequency (kHz)  
Figure 23.  
Figure 24.  
9
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DAC8551  
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SLAS429BAPRIL 2005REVISED OCTOBER 2006  
TYPICAL CHARACTERISTICS: VDD = 5 V (continued)  
At TA = +25°C, unless otherwise noted.  
OUTPUT NOISE DENSITY  
350  
VDD = 5V  
VREF = 4.99V  
Code = 7FFFh  
No Load  
300  
250  
200  
150  
100  
100  
1k  
10k  
100k  
Frequency (Hz)  
Figure 25.  
10  
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DAC8551  
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SLAS429BAPRIL 2005REVISED OCTOBER 2006  
TYPICAL CHARACTERISTICS: VDD = 2.7 V  
At TA = +25°C, unless otherwise noted.  
LINEARITY ERROR AND  
LINEARITY ERROR AND  
DIFFERENTIAL LINEARITY ERROR  
vs DIGITAL INPUT CODE (+25°C)  
DIFFERENTIAL LINEARITY ERROR  
vs DIGITAL INPUT CODE (-40°C)  
6
6
4
VDD = 2.7V, VREF = 2.69V  
VDD = 2.7V, VREF = 2.69V  
4
2
2
0
0
-2  
-4  
-6  
-2  
-4  
-6  
1.0  
0.5  
1.0  
0.5  
0
0
-0.5  
-1.0  
-0.5  
-1.0  
0
8192 16384 24576 32768 40960 49152 57344 65536  
Digital Input Code  
0
8192 16384 24576 32768 40960 49152 57344 65536  
Digital Input Code  
Figure 26.  
Figure 27.  
LINEARITY ERROR AND  
DIFFERENTIAL LINEARITY ERROR  
vs DIGITAL INPUT CODE (+105°C)  
ZERO-SCALE ERROR  
vs TEMPERATURE  
6
4
10  
5
VDD = 2.7V  
VREF = 2.69V  
VDD = 2.7V, VREF = 2.69V  
2
0
-2  
-4  
-6  
1.0  
0.5  
0
0
-0.5  
-1.0  
-5  
0
8192 16384 24576 32768 40960 49152 57344 65536  
Digital Input Code  
-40  
0
40  
80  
120  
Temperature (°C)  
Figure 28.  
Figure 29.  
FULL-SCALE ERROR  
vs TEMPERATURE  
SOURCE AND SINK CURRENT CAPABILITY  
5
0
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0
VDD = 2.7V  
VREF = 2.69V  
DAC Loaded with FFFFh  
VDD = 2.7V  
VREF = VDD - 10mV  
-5  
DAC Loaded with 0000h  
-10  
-40  
0
40  
80  
120  
0
2
4
6
8
10  
Temperature (°C)  
I(SOURCE/SINK) (mA)  
Figure 30.  
Figure 31.  
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TYPICAL CHARACTERISTICS: VDD = 2.7 V (continued)  
At TA = +25°C, unless otherwise noted.  
SUPPLY CURRENT  
vs DIGITAL INPUT CODE  
POWER-SUPPLY CURRENT  
vs TEMPERATURE  
180  
VDD = VREF = 2.7V  
160  
250  
200  
150  
100  
50  
VREF = VDD = 2.7V  
140  
Reference Current Included  
120  
100  
80  
60  
40  
20  
0
0
-40  
-10  
20  
50  
80  
110  
0
8192 16384 24576 32768 40960 49152 57344 65536  
Digital Input Code  
Temperature (°C)  
Figure 32.  
Figure 33.  
SUPPLY CURRENT  
vs LOGIC INPUT VOLTAGE  
FULL-SCALE SETTLING TIME: 2.7V RISING EDGE  
800  
TA = 25°C, SCL Input (all other inputs = GND)  
Trigger Pulse 2.7V/div  
700  
600  
500  
400  
300  
200  
100  
0
VDD = VREF = 2.7V  
Rising  
Edge  
0.5V/div  
VDD = 2.7V  
VREF = 2.5V  
From Code: 0000  
To Code: FFFF  
Zoomed Rising Edge  
1mV/div  
Time (2ms/div)  
0
0.5  
1.0  
1.5  
2.0  
2.5 2.7  
VLOGIC (V)  
Figure 34.  
Figure 35.  
FULL-SCALE SETTLING TIME: 2.7V FALLING EDGE  
HALF-SCALE SETTLING TIME: 2.7V RISING EDGE  
Trigger Pulse 2.7V/div  
Trigger Pulse 2.7V/div  
VDD = 2.7V  
VREF = 2.5V  
From Code: FFFF  
To Code: 0000  
VDD = 2.7V  
VREF = 2.5V  
From Code: 4000  
To Code: CFFF  
Rising  
Zoomed Falling Edge  
1mV/div  
Falling  
Edge  
0.5V/div  
Zoomed Rising Edge  
1mV/div  
Edge  
0.5V/div  
Time (2ms/div)  
Time (2ms/div)  
Figure 36.  
Figure 37.  
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TYPICAL CHARACTERISTICS: VDD = 2.7 V (continued)  
At TA = +25°C, unless otherwise noted.  
HALF-SCALE SETTLING TIME: 2.7V FALLING EDGE  
GLITCH ENERGY: 2.7V, 1LSB STEP, RISING EDGE  
Trigger Pulse 2.7V/div  
VDD = 2.7V  
VREF = 2.5V  
From Code: CFFF  
To Code: 4000  
VDD = 2.7V  
VREF = 2.5V  
From Code: 7FFF  
To Code: 8000  
Glitch: 0.08nV-s  
Falling  
Edge  
0.5V/div  
Zoomed Falling Edge  
1mV/div  
Time (2ms/div)  
Time (400ns/div)  
Figure 38.  
Figure 39.  
GLITCH ENERGY: 2.7V, 1LSB STEP, FALLING EDGE  
GLITCH ENERGY: 2.7V, 16LSB STEP, RISING EDGE  
VDD = 2.7V  
VREF = 2.5V  
From Code: 8000  
To Code: 7FFF  
Glitch: 0.16nV-s  
Measured Worst Case  
VDD = 2.7V  
VREF = 2.5V  
From Code: 8000  
To Code: 8010  
Glitch: 0.04nV-s  
Time (400ns/div)  
Time (400ns/div)  
Figure 40.  
Figure 41.  
GLITCH ENERGY: 2.7V, 16LSB STEP, FALLING EDGE  
GLITCH ENERGY: 2.7V, 256LSB STEP, RISING EDGE  
VDD = 2.7V  
VREF = 2.5V  
From Code: 8010  
To Code: 8000  
Glitch: 0.12nV-s  
VDD = 2.7V  
VREF = 2.5V  
From Code: 8000  
To Code: 80FF  
Glitch: Not Detected  
Theoretical Worst Case  
Time (400ns/div)  
Time (400ns/div)  
Figure 42.  
Figure 43.  
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TYPICAL CHARACTERISTICS: VDD = 2.7 V (continued)  
At TA = +25°C, unless otherwise noted.  
GLITCH ENERGY: 2.7V, 256LSB STEP, FALLING EDGE  
VDD = 2.7V  
VREF = 2.5V  
From Code: 80FF  
To Code: 8000  
Glitch: Not Detected  
Theoretical Worst Case  
Time (400ns/div)  
Figure 44.  
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SLAS429BAPRIL 2005REVISED OCTOBER 2006  
THEORY OF OPERATION  
DAC SECTION  
VREF  
The DAC8551 architecture consists of a string DAC  
followed by an output buffer amplifier. Figure 45  
shows a block diagram of the DAC architecture.  
RDIVIDER  
VREF  
2
VREF  
50kW  
50kW  
VFB  
R
62kW  
REF (+)  
VOUT  
DAC  
Register  
Register String  
To Output Amplifier  
(2x Gain)  
R
REF (-)  
GND  
Figure 45. DAC8551 Architecture  
The input coding to the DAC8551 is straight binary,  
so the ideal output voltage is given by:  
DIN  
65536  
VOUT  
+
  VREF  
R
R
(1)  
where DIN = decimal equivalent of the binary code  
that is loaded to the DAC register; it can range from  
0 to 65535.  
RESISTOR STRING  
The resistor string section is shown in Figure 46. It is  
simply a string of resistors, each of value R. The  
code loaded into the DAC register determines at  
which node on the string the voltage is tapped off to  
be fed into the output amplifier by closing one of the  
switches connecting the string to the amplifier.  
Monotonicity is ensured because of the string  
resistor architecture.  
Figure 46. Resistor String  
SERIAL INTERFACE  
The DAC8551 has a 3-wire serial interface (SYNC,  
SCLK, and DIN), which is compatible with SPI, QSPI,  
and Microwire interface standards, as well as most  
DSPs. See the Serial Write Operation Timing  
Diagram for an example of a typical write sequence.  
OUTPUT AMPLIFIER  
The output buffer amplifier is capable of generating  
rail-to-rail voltages on its output, giving an output  
range of 0V to VDD. It is capable of driving a load of  
2kin parallel with 1000pF to GND. The source and  
sink capabilities of the output amplifier can be seen  
in the Typical Characteristics. The slew rate is  
1.8V/µs with a full-scale setting time of 8µs with the  
output unloaded.  
The write sequence begins by bringing the SYNC  
line LOW. Data from the DIN line are clocked into the  
24-bit shift register on each falling edge of SCLK.  
The serial clock frequency can be as high as 30MHz,  
making the DAC8551 compatible with high-speed  
DSPs. On the 24th falling edge of the serial clock,  
the last data bit is clocked in and the programmed  
function is executed (that is, a change in DAC  
register contents and/or a change in the mode of  
operation).  
The inverting input of the output amplifier is brought  
out to the VFB pin. This configuration allows for better  
accuracy in critical applications by tying the VFB point  
and the amplifier output together directly at the load.  
Other signal conditioning circuitry may also be  
connected between these points for specific  
applications.  
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At this point, the SYNC line may be kept LOW or  
brought HIGH. In either case, it must be brought  
HIGH for a minimum of 33ns before the next write  
sequence so that a falling edge of SYNC can initiate  
the next write sequence. As previously mentioned, it  
must be brought HIGH again just before the next  
write sequence.  
SYNC INTERRUPT  
In a normal write sequence, the SYNC line is kept  
LOW for at least 24 falling edges of SCLK and the  
DAC is updated on the 24th falling edge. However, if  
SYNC is brought HIGH before the 24th falling edge,  
it acts as an interrupt to the write sequence. The shift  
register is reset, and the write sequence is seen as  
invalid. Neither an update of the DAC register  
contents nor a change in the operating mode occurs,  
as shown in Figure 48.  
INPUT SHIFT REGISTER  
The input shift register is 24 bits wide, as shown in  
Figure 47. The first six bits are don't care bits. The  
next two bits (PD1 andPD0) are control bits that  
control which mode of operation the part is in  
(normal mode or any one of three power-down  
modes). A more complete description of the various  
modes is located in the Power-Down Modes section.  
The next 16 bits are the data bits. These bits are  
transferred to the DAC register on the 24th falling  
edge of SCLK.  
POWER-ON RESET  
The DAC8551 contains a power-on-reset circuit that  
controls the output voltage during power up. On  
power up, the DAC registers are filled with zeros and  
the output voltages are 0V; they remain that way  
until a valid write sequence is made to the DAC. The  
power-on reset is useful in applications where it is  
important to know the state of the output of the DAC  
while it is in the process of powering up.  
DB23  
DB0  
X
X
X
X
X
X
PD1 PD0 D15 D14 D13 D12 D11 D10 D9  
D8  
D7  
D6  
D5  
D4  
D3  
D2  
D1  
D0  
Figure 47. DAC8551 Data Input Register Format  
24th Falling Edge  
24th Falling Edge  
CLK  
SYNC  
DIN  
DB23  
DB80  
DB23  
DB80  
Valid Write Sequence: Output Updates  
on the 24th Falling Edge  
Figure 48. SYNC Interrupt Facility  
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POWER-DOWN MODES  
power-down mode. There are three different options.  
The output is connected internally to GND through a  
The DAC8551 supports four separate modes of  
operation. These modes are programmable by  
setting two bits (PD1 and PD0) in the control  
register. Table 1 shows how the state of the bits  
corresponds to the mode of operation of the device.  
1kresistor,  
a 100kresistor, or it is left  
open-circuited (High-Z). The output stage is  
illustrated in Figure 49.  
VFB  
Table 1. Operating Modes  
Amplifier  
VOUT  
Resistor  
String  
DAC  
PD1  
(DB17)  
PD0  
(DB16)  
OPERATING MODE  
Normal operation  
0
0
1
1
0
1
0
1
Power-down modes  
Output typically 1kto GND  
Output typically 100kto GND  
High-Z  
Power-Down  
Circuitry  
Resistor  
Network  
When both bits are set to '0', the device works  
normally with its typical current consumption of  
200µA at 5V. However, for the three power-down  
modes, the supply current falls to 200nA at 5V (50nA  
at 3V). Not only does the supply current fall, but the  
output stage is also internally switched from the  
output of the amplifier to a resistor network of known  
values. This configuration has the advantage that the  
output impedance of the device is known while it is in  
Figure 49. Output Stage During Power-Down  
All analog circuitry is shut down when the  
power-down mode is activated. However, the  
contents of the DAC register are unaffected when in  
power-down. The time to exit power-down is typically  
2.5µs for VDD = 5V, and 5µs for VDD = 3V. See the  
Typical Characteristics for more information.  
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MICROPROCESSOR INTERFACING  
MicrowireTM  
CS  
DAC8554(1)  
SYNC  
DAC8551 to 8051 Interface  
SCLK  
DIN  
SK  
SO  
See Figure 50 for a serial interface between the  
DAC8551 and a typical 8051-type microcontroller.  
The setup for the interface is as follows: TXD of the  
8051 drives SCLK of the DAC8551, while RXD  
drives the serial data line of the device. The SYNC  
signal is derived from a bit-programmable pin on the  
port of the 8051. In this case, port line P3.3 is used.  
When data are to be transmitted to the DAC8551,  
P3.3 is taken LOW. The 8051 transmits data in 8-bit  
bytes; thus, only eight falling clock edges occur in  
the transmit cycle. To load data to the DAC, P3.3 is  
left LOW after the first eight bits are transmitted, then  
a second write cycle is initiated to transmit the  
second byte of data. P3.3 is taken HIGH following  
the completion of the third write cycle. The 8051  
outputs the serial data in a format that has the LSB  
first. The DAC8551 requires data with the MSB as  
the first bit received. The 8051 transmit routine must  
therefore take this into account, and mirror the data  
as needed.  
NOTE: (1) Additional pins omitted for clarity.  
Figure 51. DAC8551 to Microwire Interface  
DAC8551 to 68HC11 Interface  
Figure 52 shows a serial interface between the  
DAC8551 and the 68HC11 microcontroller. SCK of  
the 68HC11 drives the SCLK of the DAC8551, while  
the MOSI output drives the serial data line of the  
DAC. The SYNC signal is derived from a port line  
(PC7), similar to the 8051 diagram.  
68HC11(1)  
DAC8551(1)  
PC7  
SYNC  
SCK  
SCLK  
DIN  
MOSI  
80C51/80L51(1)  
P3.3  
DAC8554(1)  
SYNC  
NOTE: (1) Additional pins omitted for clarity.  
Figure 52. DAC8551 to 68HC11 Interface  
TXD  
RXD  
SCLK  
DIN  
The 68HC11 should be configured so that its CPOL  
bit is '0' and its CPHA bit is '1'. This configuration  
causes data appearing on the MOSI output to be  
valid on the falling edge of SCK. When data are  
being transmitted to the DAC, the SYNC line is held  
LOW (PC7). Serial data from the 68HC11 are  
transmitted in 8-bit bytes with only eight falling clock  
edges occurring in the transmit cycle. (Data are  
transmitted MSB first.) In order to load data to the  
DAC8551, PC7 is left LOW after the first eight bits  
are transferred, then a second and third serial write  
operation are performed to the DAC. PC7 is taken  
HIGH at the end of this procedure.  
NOTE: (1) Additional pins omitted for clarity.  
Figure 50. DAC8551 to 80C51/80L51 Interface  
DAC8551 to Microwire Interface  
Figure 51 shows an interface between the DAC8551  
and any Microwire-compatible device. Serial data are  
shifted out on the falling edge of the serial clock and  
is clocked into the DAC8551 on the rising edge of  
the SK signal.  
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APPLICATION INFORMATION  
The total typical current required (with a 5kload on  
the DAC output) is:  
USING THE REF02 AS A POWER SUPPLY  
FOR THE DAC8551  
5V  
5kW  
200mA )  
+ 1.2mA  
Due to the extremely low supply current required by  
the DAC8551, an alternative option is to use the  
REF02 (+5 V precision voltage reference) to supply  
the required voltage to the device, as illustrated in  
Figure 53.  
(2)  
The load regulation of the REF02 is typically  
0.005%/mA, resulting in an error of 299µV for the  
1.2mA current drawn from it. This value corresponds  
to a 3.9LSB error.  
+15V  
BIPOLAR OPERATION USING THE DAC8551  
The DAC8551 has been designed for single-supply  
operation, but a bipolar output range is also possible  
using the circuit in Figure 54. The circuit shown gives  
+5V  
REF02  
an output voltage range of ±VREF  
. Rail-to-rail  
285mA  
operation at the amplifier output is achievable using  
an OPA703 as the output amplifier.  
SYNC  
The output voltage for any input code can be  
calculated as follows:  
Three-Wire  
Serial  
Interface  
VOUT = 0V to 5V  
SCLK  
DIN  
DAC8551  
ǒR1 ) R2Ǔ  
ǒR2Ǔ  
ƫ
D
ǒ Ǔ  
VO +  
ƪ
VREF  
 
 
* VREF  
 
65536  
R1  
R1  
(3)  
where D represents the input code in decimal  
(0–65535).  
Figure 53. REF02 as a Power Supply to the  
DAC8551  
With VREF = 5V, R1 = R2 = 10k.  
10   D  
This configuration is especially useful if the power  
supply is quite noisy or if the system supply voltages  
are at some value other than 5V. The REF02 outputs  
a steady supply voltage for the DAC8551. If the  
REF02 is used, the current it needs to supply to the  
DAC8551 is 200µA. This configuration is with no  
load on the output of the DAC. When a DAC output  
is loaded, the REF02 also needs to supply the  
current to the load.  
ǒ Ǔ* 5V  
VO +  
65536  
(4)  
Using this example, an output voltage range of ±5V  
with 0000h corresponding to a –5V output and  
FFFFh corresponding to  
a 5V output can be  
achieved. Similarly, using VREF = 2.5V, a ±2.5V  
output voltage range can be achieved.  
VREF  
R2  
10kW  
+6V  
R1  
10kW  
5V  
OPA703  
VFB  
VREF  
VOUT  
DAC8551  
–6V  
10mF  
0.1mF  
Three-Wire  
Serial Interface  
Figure 54. Bipolar Output Range  
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LAYOUT  
The power applied to VDD should be well-regulated  
and low-noise. Switching power supplies and dc/dc  
converters often have high-frequency glitches or  
spikes riding on the output voltage. In addition, digital  
components can create similar high-frequency  
spikes. This noise can easily couple into the DAC  
output voltage through various paths between the  
power connections and analog output.  
A
precision analog component requires careful  
layout, adequate bypassing, and clean,  
well-regulated power supplies.  
The DAC8551 offers single-supply operation, and it  
often is used in close proximity with digital logic,  
microcontrollers, microprocessors, and digital signal  
processors. The more digital logic present in the  
design and the higher the switching speed, the more  
difficult it is to keep digital noise from appearing at  
the output.  
As with the GND connection, VDD should be  
connected to a 5V power-supply plane or trace that  
is separate from the connection for digital logic until  
they are connected at the power-entry point. In  
addition, a 1µF to 10µF capacitor and 0.1µF bypass  
capacitor are strongly recommended. In some  
situations, additional bypassing may be required,  
such as a 100µF electrolytic capacitor or even a Pi  
filter made up of inductors and capacitors—all  
designed to essentially low-pass filter the 5V supply,  
removing the high-frequency noise.  
Due to the single ground pin of the DAC8551, all  
return currents, including digital and analog return  
currents for the DAC, must flow through a single  
point. Ideally, GND would be connected directly to an  
analog ground plane. This plane would be separate  
from the ground connection for the digital  
components until they were connected at the  
power-entry point of the system.  
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PACKAGING INFORMATION  
Orderable Device  
DAC8551IADGKR  
DAC8551IADGKRG4  
DAC8551IADGKT  
DAC8551IADGKTG4  
DAC8551IDGKR  
Status Package Type Package Pins Package  
Eco Plan  
Lead/Ball Finish  
MSL Peak Temp  
Op Temp (°C)  
-40 to 105  
-40 to 105  
-40 to 105  
-40 to 105  
-40 to 105  
-40 to 105  
-40 to 105  
-40 to 105  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(6)  
(3)  
(4/5)  
ACTIVE  
VSSOP  
VSSOP  
VSSOP  
VSSOP  
VSSOP  
VSSOP  
VSSOP  
VSSOP  
DGK  
8
8
8
8
8
8
8
8
2500  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU |  
CU NIPDAUAG  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
D81  
D81  
D81  
D81  
D81  
D81  
D81  
D81  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
DGK  
DGK  
DGK  
DGK  
DGK  
DGK  
DGK  
2500  
250  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU |  
CU NIPDAUAG  
250  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU  
2500  
2500  
250  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU |  
CU NIPDAUAG  
DAC8551IDGKRG4  
DAC8551IDGKT  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU |  
CU NIPDAUAG  
DAC8551IDGKTG4  
250  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability  
information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that  
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between  
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight  
in homogeneous material)  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
18-Oct-2013  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
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value exceeds the maximum column width.  
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Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
5-Jun-2013  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
DAC8551IADGKR  
DAC8551IADGKT  
DAC8551IDGKR  
DAC8551IDGKT  
VSSOP  
VSSOP  
VSSOP  
VSSOP  
DGK  
DGK  
DGK  
DGK  
8
8
8
8
2500  
250  
330.0  
330.0  
330.0  
330.0  
12.4  
12.4  
12.4  
12.4  
5.3  
5.3  
5.3  
5.3  
3.4  
3.4  
3.4  
3.4  
1.4  
1.4  
1.4  
1.4  
8.0  
8.0  
8.0  
8.0  
12.0  
12.0  
12.0  
12.0  
Q1  
Q1  
Q1  
Q1  
2500  
250  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
5-Jun-2013  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SPQ  
Length (mm) Width (mm) Height (mm)  
DAC8551IADGKR  
DAC8551IADGKT  
DAC8551IDGKR  
DAC8551IDGKT  
VSSOP  
VSSOP  
VSSOP  
VSSOP  
DGK  
DGK  
DGK  
DGK  
8
8
8
8
2500  
250  
367.0  
367.0  
367.0  
367.0  
367.0  
367.0  
367.0  
367.0  
35.0  
35.0  
35.0  
35.0  
2500  
250  
Pack Materials-Page 2  
IMPORTANT NOTICE  
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other  
changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest  
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supplied at the time of order acknowledgment.  
TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms  
and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary  
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TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and  
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Copyright © 2013, Texas Instruments Incorporated  

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