DLP6500BFYE [TI]

DLP® 0.65 1080p s600 DMD | FYE | 350 | 0 to 90;
DLP6500BFYE
型号: DLP6500BFYE
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

DLP® 0.65 1080p s600 DMD | FYE | 350 | 0 to 90

文件: 总51页 (文件大小:1081K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
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DLP6500FYE  
ZHCSD23A OCTOBER 2014REVISED FEBRUARY 2016  
DLP6500FYE 0.65 1080p MVSP S600 DMD  
1 特性  
3 说明  
1
高分辨率 WQXGA (1920x1080) 阵列,微镜数超过  
2 百万  
高分辨率 0.65 1080p 数字微镜器件 (DMD) 是一款可  
调制入射光幅度、方向和/或位相的空间照明调制器  
(SLM),微镜数达 2 百万以上。DLP6500FYE 具有独  
特功能,广泛适用于各种工业、医疗和高级成像 应  
用。DLP6500FYE 需要与 DLPC900 数字控制器结合  
使用才能实现可靠功能和操作。此专用芯片组可在高速  
条件下提供全高清 (HD) 分辨率,并且能够轻松集成到  
多种终端设备解决方案中。  
0.65 英寸微镜阵列对角线  
7.56µm 微镜间距  
±12° 微镜倾斜角(相对于平面)  
2.5µs 微镜交叉时间  
设计用于边缘照明  
设计用于宽频带可见光 (420nm – 700nm)  
窗口传输 97%(单通、通过双窗面)  
微镜反射率 88%  
器件信息(1)  
器件型号  
DLP6500  
封装  
封装尺寸(标称值)  
阵列衍射效率 86%  
FYE (350)  
35.0mm × 32.2mm × 5.1mm  
阵列填充因子 92%  
(1) 如需了解所有可用封装,请见数据表末尾的可订购产品附录。  
两条 16 位低压差分信令 (LVDS)、双倍数据速率  
(DDR) 输入数据总线  
简化图表  
专用 DLPC900 控制器,支持 9500Hz1 位二进  
制)和 250Hz8 位灰度)高速模式速率  
Red,Green,Blue PWM  
LED  
Driver  
PCLK, DE  
LED Strobes  
HSYNC, VSYNC  
24-bit RGB Data  
高达 400MHz 的输入数据时钟速率  
集成微镜驱动器电路  
Flash  
DLPC900  
FAN  
USB  
I2C  
2 应用  
工业  
DMD CTL, DATA  
SCP  
针对机器视觉和质量控制的 3D 扫描仪  
OSC  
3D 打印  
DLP6500FYE  
直接成像平版印刷术  
激光打标和修复  
Voltage  
Supplies  
医疗  
眼科  
针对四肢和皮肤测量的 3D 扫描仪  
高光谱成像  
高光谱扫描  
显示屏  
3D 成像显微镜  
智能和自适应照明  
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  
English Data Sheet: DLPS053  
 
 
 
 
DLP6500FYE  
ZHCSD23A OCTOBER 2014REVISED FEBRUARY 2016  
www.ti.com.cn  
目录  
7.4 Device Functional Modes........................................ 29  
7.5 Window Characteristics and Optics ....................... 29  
7.6 Micromirror Array Temperature Calculation............ 30  
7.7 Micromirror Landed-on/Landed-Off Duty Cycle ...... 31  
Application and Implementation ........................ 34  
8.1 Application Information............................................ 34  
8.2 Typical Application ................................................. 34  
Power Supply Recommendations...................... 35  
9.1 DMD Power Supply Requirements ........................ 35  
9.2 DMD Power Supply Power-Up Procedure ............. 35  
9.3 DMD Power Supply Power-Down Procedure ........ 35  
1
2
3
4
5
6
特性.......................................................................... 1  
应用.......................................................................... 1  
说明.......................................................................... 1  
修订历史记录 ........................................................... 2  
Pin Configuration and Functions......................... 3  
Specifications....................................................... 10  
6.1 Absolute Maximum Ratings .................................... 10  
6.2 Storage Conditions.................................................. 10  
6.3 ESD Ratings............................................................ 10  
6.4 Recommended Operating Conditions..................... 11  
6.5 Thermal Information................................................ 13  
6.6 Electrical Characteristics......................................... 14  
6.7 Timing Requirements.............................................. 15  
6.8 Typical Characteristics............................................ 19  
6.9 System Mounting Interface Loads .......................... 20  
6.10 Micromirror Array Physical Characteristics .......... 21  
6.11 Micromirror Array Optical Characteristics ............ 22  
6.12 Window Characteristics......................................... 23  
6.13 Chipset Component Usage Specification ............. 23  
Detailed Description ............................................ 24  
7.1 Overview ................................................................. 24  
7.2 Functional Block Diagram ....................................... 25  
7.3 Feature Description................................................. 26  
8
9
10 Layout................................................................... 38  
10.1 Layout Guidelines ................................................. 38  
10.2 Layout Example .................................................... 38  
11 器件文档支持......................................................... 43  
11.1 器件支持 ............................................................... 43  
11.2 文档支持................................................................ 44  
11.3 社区资源................................................................ 44  
11.4 ....................................................................... 44  
11.5 静电放电警告......................................................... 44  
11.6 Glossary................................................................ 44  
12 机械、封装和可订购信息....................................... 44  
7
4 修订历史记录  
Changes from Original (October 2014) to Revision A  
Page  
已更改 器件信息表中的封装尺寸“40.6mm x 31.8mm x 6mm”“35.0mm × 32.2mm × 5.1mm”............................................. 1  
Changed Note (4) of the Pin Functions table From: "Dielectric Constant for the DMD" Type A To: "Dielectric  
Constant for the DMD S600" ................................................................................................................................................. 4  
Removed pin number Z27 in the Pin Functions (continued) table ......................................................................................... 8  
Deleted pin number AA25 from VOFFSET in the Pin Functions (continued) table ............................................................... 8  
Changed ƒclock in Absolute Maximum Ratings From: "DCLK_A and DCLK_B rows To: one row "DCLK (all channels)" ... 10  
Changed Note (9) of the Absolute Maximum Ratings table................................................................................................. 10  
Added the Storage Conditions table .................................................................................................................................... 10  
Added the ESD Ratings table .............................................................................................................................................. 10  
Changed the test conditions in row 1 of the Window Characteristics table From: "Corning 7056" To: "Corning Eagle  
XG" ....................................................................................................................................................................................... 23  
Changed the test conditions in row 2 of the Window Characteristics table From: "at wavelength 589 nm" To: "at  
wavelength 546.1 nm" and the NOM value From: 1.487 To 1.5119.................................................................................... 23  
2
Copyright © 2014–2016, Texas Instruments Incorporated  
 
DLP6500FYE  
www.ti.com.cn  
ZHCSD23A OCTOBER 2014REVISED FEBRUARY 2016  
5 Pin Configuration and Functions  
Package Connector Terminals  
(Bottom View) for FYE (350)  
Copyright © 2014–2016, Texas Instruments Incorporated  
3
 
DLP6500FYE  
ZHCSD23A OCTOBER 2014REVISED FEBRUARY 2016  
www.ti.com.cn  
Pin Functions  
PIN(1)  
TYPE  
(I/O/P)  
DATA  
INTERNAL  
TERM(3)  
TRACE  
(mils)(4)  
SIGNAL  
DESCRIPTION  
RATE(2)  
NAME  
DATA BUS A  
D_AN(0)  
D_AN(1)  
D_AN(2)  
D_AN(3)  
D_AN(4)  
D_AN(5)  
D_AN(6)  
D_AN(7)  
D_AN(8)  
D_AN(9)  
D_AN(10)  
D_AN(11)  
D_AN(12)  
D_AN(13)  
D_AN(14)  
D_AN(15)  
D_AP(0)  
D_AP(1)  
D_AP(2)  
D_AP(3)  
D_AP(4)  
D_AP(5)  
D_AP(6)  
D_AP(7)  
D_AP(8)  
D_AP(9)  
D_AP(10)  
D_AP(11)  
D_AP(12)  
D_AP(13)  
D_AP(14)  
D_AP(15)  
DATA BUS B  
D_BN(0)  
D_BN(1)  
D_BN(2)  
D_BN(3)  
D_BN(4)  
D_BN(5)  
D_BN(6)  
D_BN(7)  
NO.  
B14  
B15  
C16  
K24  
B18  
L24  
C19  
H24  
H23  
B25  
D24  
E25  
F25  
H25  
L25  
G24  
C14  
B16  
C17  
K23  
B19  
L23  
C20  
J24  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Data, Negative  
494.88  
486.18  
495.16  
485.67  
494.76  
490.63  
495.16  
485.55  
495.16  
485.59  
495.16  
495.16  
490.04  
485.91  
495.16  
495.16  
494.84  
486.22  
494.65  
488.42  
495.16  
490.67  
498.11  
486.22  
495.47  
485.94  
495.16  
494.13  
488.98  
492.56  
495.16  
495.16  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
J23  
C25  
E24  
D25  
G25  
J25  
K25  
F24  
Z14  
Z15  
Y16  
P24  
Z18  
N24  
Y19  
T24  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
494.92  
486.18  
496.46  
493.74  
494.76  
495.16  
492.16  
492.68  
(1) The following power supplies are required to operate the DMD: VCC, VCCI, VOFFSET, VBIAS, and VRESET. VSS must also be  
connected.  
(2) DDR = Double Data Rate.  
SDR = Single Data Rate.  
Refer to the Timing Requirements for specifications and relationships.  
(3) Internal term = CMOS level internal termination. Refer to Recommended Operating Conditions for differential termination specification.  
(4) Dielectric Constant for the DMD S600 ceramic package is approximately 9.6.  
For the package trace lengths shown:  
Propagation Speed = 11.8 / sqrt(9.6) = 3.808 in/ns.  
Propagation Delay = 0.262 ns/in = 262 ps/in = 10.315 ps/mm.  
4
Copyright © 2014–2016, Texas Instruments Incorporated  
DLP6500FYE  
www.ti.com.cn  
ZHCSD23A OCTOBER 2014REVISED FEBRUARY 2016  
Pin Functions (continued)  
PIN(1)  
TYPE  
(I/O/P)  
DATA  
RATE(2)  
INTERNAL  
TERM(3)  
TRACE  
DESCRIPTION  
SIGNAL  
(mils)(4)  
NAME  
D_BN(8)  
NO.  
T23  
Z25  
X24  
W25  
V25  
T25  
N25  
U24  
Y14  
Z16  
Y17  
P23  
Z19  
N23  
Y20  
R24  
R23  
Y25  
W24  
X25  
U25  
R25  
P25  
V24  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
LVDS  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
DDR  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Differential  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Negative  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
Data, Positive  
484.45  
492.09  
497.72  
495.16  
484.17  
481.42  
495.16  
489.8  
D_BN(9)  
D_BN(10)  
D_BN(11)  
D_BN(12)  
D_BN(13)  
D_BN(14)  
D_BN(15)  
D_BP(0)  
494.88  
486.26  
495.16  
492.48  
495.16  
497.99  
495.16  
492.05  
484.45  
492.24  
495.16  
494.72  
483.78  
489.13  
499.53  
488.66  
D_BP(1)  
D_BP(2)  
D_BP(3)  
D_BP(4)  
D_BP(5)  
D_BP(6)  
D_BP(7)  
D_BP(8)  
D_BP(9)  
D_BP(10)  
D_BP(11)  
D_BP(12)  
D_BP(13)  
D_BP(14)  
D_BP(15)  
SERIAL CONTROL  
SCTRL_AN  
SCTRL_BN  
SCTRL_AP  
SCTRL_BP  
CLOCKS  
DCLK_AN  
DCLK_BN  
DCLK_AP  
DCLK_BP  
C23  
Y23  
C24  
Y24  
Input  
Input  
Input  
Input  
LVDS  
LVDS  
LVDS  
LVDS  
DDR  
DDR  
DDR  
DDR  
Differential  
Differential  
Differential  
Differential  
Serial Control, Negative  
Serial Control, Negative  
Serial Control, Positive  
Serial Control, Positive  
492.95  
493.78  
493.78  
493.11  
B23  
Z23  
B22  
Z22  
Input  
Input  
Input  
Input  
LVDS  
LVDS  
LVDS  
LVDS  
Differential  
Differential  
Differential  
Differential  
Clock, Negative  
Clock, Negative  
Clock, Positive  
Clock, Positive  
480.35  
486.22  
485.83  
491.93  
SERIAL COMMUNICATIONS PORT (SCP)  
SCP_DO  
SCP_DI  
B8  
B7  
Output  
Input  
LVCMOS  
LVCMOS  
SDR  
SDR  
Serial Communications Port Output  
Pull-Down  
Serial Communications Port Data  
Input  
SCP_CLK  
SCP_ENZ  
B6  
C8  
Input  
Input  
LVCMOS  
LVCMOS  
Pull-Down  
Pull-Down  
Serial Communications Port Clock  
Active-low Serial Communications  
Port Enable  
MICROMIRROR RESET CONTROL  
RESET_ADDR(0)  
RESET_ADDR(1)  
RESET_ADDR(2)  
RESET_ADDR(3)  
RESET_MODE(0)  
RESET_MODE(1)  
RESET_SEL(0)  
X9  
X8  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
LVCMOS  
LVCMOS  
LVCMOS  
LVCMOS  
LVCMOS  
LVCMOS  
LVCMOS  
LVCMOS  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Reset Driver Address Select  
Reset Driver Address Select  
Reset Driver Address Select  
Reset Driver Address Select  
Reset Driver Mode Select  
Reset Driver Mode Select  
Reset Driver Level Select  
Reset Driver Level Select  
Z8  
Z7  
W11  
Z10  
Y10  
Y9  
RESET_SEL(1)  
Copyright © 2014–2016, Texas Instruments Incorporated  
5
DLP6500FYE  
ZHCSD23A OCTOBER 2014REVISED FEBRUARY 2016  
www.ti.com.cn  
Pin Functions (continued)  
PIN(1)  
TYPE  
(I/O/P)  
DATA  
RATE(2)  
INTERNAL  
TERM(3)  
TRACE  
(mils)(4)  
SIGNAL  
DESCRIPTION  
NAME  
NO.  
RESET_STROBE  
Y7  
Input  
LVCMOS  
Pull-Down  
Reset Address, Mode, & Level  
latched on rising-edge  
ENABLES and INTERRUPTS  
PWRDNZ  
D2  
Input  
Input  
LVCMOS  
LVCMOS  
Pull-Down  
Pull-Down  
Active-low Device Reset  
RESET_OEZ  
W7  
Active-low output enable for DMD  
reset driver circuits  
RESETZ  
Z6  
Input  
LVCMOS  
LVCMOS  
Pull-Down  
Active-low sets Reset circuits in  
known VOFFSET state  
RESET_IRQZ  
Z5  
Output  
Active-low, output interrupt to ASIC  
VOLTAGE REGULATOR MONITORING  
PG_BIAS  
E11  
B10  
D11  
D9  
Input  
Input  
LVCMOS  
LVCMOS  
LVCMOS  
LVCMOS  
LVCMOS  
LVCMOS  
Pull-Up  
Pull-Up  
Pull-Up  
Active-low fault from external VBIAS  
regulator  
PG_OFFSET  
PG_RESET  
EN_BIAS  
Active-low fault from external  
VOFFSET regulator  
Input  
Active-low fault from external  
VRESET regulator  
Output  
Output  
Output  
Active-high enable for external  
VBIAS regulator  
EN_OFFSET  
EN_RESET  
C9  
Active-high enable for external  
VOFFSET regulator  
E9  
Active-high enable for external  
VRESET regulator  
LEAVE PIN UNCONNECTED  
MBRST(0)  
MBRST(1)  
MBRST(2)  
MBRST(3)  
MBRST(4)  
MBRST(5)  
MBRST(6)  
MBRST(7)  
MBRST(8)  
MBRST(9)  
MBRST(10)  
MBRST(11)  
MBRST(12)  
MBRST(13)  
MBRST(14)  
MBRST(15)  
C2  
C3  
C5  
C4  
E5  
E4  
E3  
G4  
G3  
G2  
J4  
Output  
Output  
Output  
Output  
Output  
Output  
Output  
Output  
Output  
Output  
Output  
Output  
Output  
Output  
Output  
Output  
Analog  
Analog  
Analog  
Analog  
Analog  
Analog  
Analog  
Analog  
Analog  
Analog  
Analog  
Analog  
Analog  
Analog  
Analog  
Analog  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
Pull-Down  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
J3  
For proper DMD operation, do not  
connect  
J2  
For proper DMD operation, do not  
connect  
L4  
L3  
L2  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
6
Copyright © 2014–2016, Texas Instruments Incorporated  
DLP6500FYE  
www.ti.com.cn  
ZHCSD23A OCTOBER 2014REVISED FEBRUARY 2016  
Pin Functions (continued)  
PIN(1)  
TYPE  
(I/O/P)  
DATA  
RATE(2)  
INTERNAL  
TERM(3)  
TRACE  
DESCRIPTION  
SIGNAL  
(mils)(4)  
NAME  
NO.  
LEAVE PIN UNCONNECTED  
RESERVED_PFE  
RESERVED_TM  
RESERVED_XI1  
RESERVED_TP0  
RESERVED_TP1  
RESERVED_TP2  
E7  
Input  
Input  
Input  
Input  
Input  
Input  
LVCMOS  
LVCMOS  
LVCMOS  
Analog  
Pull-Down  
Pull-Down  
Pull-Down  
For proper DMD operation, do not  
connect  
D13  
E13  
W12  
Y11  
X11  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
Analog  
For proper DMD operation, do not  
connect  
Analog  
For proper DMD operation, do not  
connect  
LEAVE PIN UNCONNECTED  
RESERVED_BA  
RESERVED_BB  
RESERVED_TS  
Y12  
C12  
D5  
Output  
Output  
Output  
LVCMOS  
LVCMOS  
LVCMOS  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
LEAVE PIN UNCONNECTED  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
B11  
C11  
C13  
E12  
E14  
E23  
H4  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
N2  
For proper DMD operation, do not  
connect  
N3  
For proper DMD operation, do not  
connect  
N4  
For proper DMD operation, do not  
connect  
R2  
For proper DMD operation, do not  
connect  
R3  
For proper DMD operation, do not  
connect  
R4  
For proper DMD operation, do not  
connect  
T4  
For proper DMD operation, do not  
connect  
U2  
For proper DMD operation, do not  
connect  
U3  
For proper DMD operation, do not  
connect  
U4  
For proper DMD operation, do not  
connect  
W3  
W4  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
Copyright © 2014–2016, Texas Instruments Incorporated  
7
DLP6500FYE  
ZHCSD23A OCTOBER 2014REVISED FEBRUARY 2016  
www.ti.com.cn  
Pin Functions (continued)  
PIN(1)  
TYPE  
(I/O/P)  
DATA  
RATE(2)  
INTERNAL  
TERM(3)  
TRACE  
(mils)(4)  
SIGNAL  
DESCRIPTION  
NAME  
NO.  
NO CONNECT  
W5  
For proper DMD operation, do not  
connect  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
NO CONNECT  
W13  
W14  
W23  
X4  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
X5  
For proper DMD operation, do not  
connect  
X13  
Y2  
For proper DMD operation, do not  
connect  
For proper DMD operation, do not  
connect  
Y3  
For proper DMD operation, do not  
connect  
Y4  
For proper DMD operation, do not  
connect  
Y5  
For proper DMD operation, do not  
connect  
Z11  
For proper DMD operation, do not  
connect  
Pin Functions (continued)  
PIN  
TYPE  
SIGNAL DESCRIPTION  
(I/O/P)  
NAME(1)  
VBIAS  
NO.  
A6  
NO.  
NO.  
A8  
A7  
Power  
Power  
Analog Supply voltage for positive Bias level of Micromirror reset signal.  
Analog Supply voltage for positive Bias level of Micromirror reset signal.  
VBIAS  
AA6  
AA7  
AA8  
VOFFSET  
VOFFSET  
VOFFSET  
VOFFSET  
A3  
A4  
A25  
M26  
Power  
Power  
Power  
Power  
Analog Supply voltage for HVCMOS logic.  
B26  
N26  
AA3  
L26  
Z26  
AA4  
Analog Supply voltage for stepped high voltage at Micromirror address electrodes.  
Analog Supply voltage for positive Offset level of Micromirror reset signal.  
Analog  
VRESET  
VRESET  
G1  
R1  
H1  
T1  
J1  
Power  
Power  
Analog Supply voltage for negative Reset level of Micromirror reset signal.  
Analog Supply voltage for negative Reset level of Micromirror reset signal.  
U1  
VCC  
VCC  
VCC  
VCC  
VCC  
VCC  
VCC  
VCC  
VCC  
VCC  
VCC  
VCC  
VCC  
VCC  
VCC  
A9  
B12  
C10  
D8  
B3  
C1  
B5  
C6  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Analog  
Analog  
D4  
D6  
Analog  
E1  
E2  
Analog Supply voltage for LVCMOS core logic.  
E10  
E17  
K1  
E15  
F3  
E16  
H2  
Analog Supply voltage for normal high level at Micromirror address electrodes.  
Analog Supply voltage for positive Offset level of Micromirror reset signal during  
Power Down sequence.  
K3  
M4  
T2  
Analog  
P1  
P3  
Analog  
Analog  
Analog  
Analog  
Analog  
Analog  
Analog  
Analog  
V3  
W1  
W9  
W16  
X6  
W2  
W10  
W17  
W6  
W15  
X3  
Y1  
Y8  
Y13  
Z12  
Z1  
Z3  
AA2  
AA9  
AA10  
(1) The following power supplies are required to operate the DMD: VCC, VCCI, VOFFSET, VBIAS, and VRESET. VSS must also be  
connected.  
8
Copyright © 2014–2016, Texas Instruments Incorporated  
DLP6500FYE  
www.ti.com.cn  
ZHCSD23A OCTOBER 2014REVISED FEBRUARY 2016  
Pin Functions (continued) (continued)  
PIN  
TYPE  
(I/O/P)  
SIGNAL DESCRIPTION  
NAME(1)  
VCCI  
NO.  
A16  
NO.  
A17  
NO.  
A18  
Power  
Analog Supply voltage for LVDS receivers.  
Analog Supply voltage for LVDS receivers.  
Analog Supply voltage for LVDS receivers.  
Analog Supply voltage for LVDS receivers.  
VCCI  
A20  
A21  
A23  
Power  
Power  
Power  
VCCI  
AA16  
AA20  
AA17  
AA21  
AA18  
AA23  
VCCI  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
A5  
A19  
B2  
A10  
A22  
B4  
A11  
A24  
B9  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Power  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
Analog Device Ground. Common return for all power.  
B13  
B21  
C15  
C22  
D3  
B17  
B24  
C18  
C26  
D7  
B20  
C7  
C21  
D1  
D10  
D15  
D18  
D21  
D26  
E18  
E21  
F1  
D12  
D16  
D19  
D22  
E6  
D14  
D17  
D20  
D23  
E8  
E19  
E22  
F2  
E20  
E26  
F4  
F23  
G26  
J26  
K26  
M2  
F26  
H3  
G23  
H26  
K4  
K2  
L1  
M1  
M3  
M23  
N1  
M24  
P2  
M25  
P4  
P26  
T26  
V1  
R26  
U23  
V2  
T3  
U26  
V4  
V23  
W18  
W21  
X1  
V26  
W19  
W22  
X2  
W8  
W20  
W26  
X7  
X10  
X15  
X18  
X21  
X26  
Y18  
Y26  
Z9  
X12  
X16  
X19  
X22  
Y6  
X14  
X17  
X20  
X23  
Y15  
Y22  
Z4  
Y21  
Z2  
Z13  
Z21  
AA11  
AA24  
Z17  
Z24  
AA19  
Z20  
AA5  
AA22  
Copyright © 2014–2016, Texas Instruments Incorporated  
9
DLP6500FYE  
ZHCSD23A OCTOBER 2014REVISED FEBRUARY 2016  
www.ti.com.cn  
6 Specifications  
6.1 Absolute Maximum Ratings  
over operating free-air temperature range (unless otherwise noted)  
(1)  
SUPPLY VOLTAGES  
MIN  
–0.5  
–0.5  
–0.5  
–0.5  
–11  
MAX  
4
UNIT  
V
(2)  
VCC  
Supply voltage for LVCMOS core logic  
(2)  
VCCI  
Supply voltage for LVDS receivers  
4
V
(2) (3)  
VOFFSET  
Supply voltage for HVCMOS and micromirror electrode  
9
V
(2)  
VBIAS  
Supply voltage for micromirror electrode  
17  
0.5  
0.3  
8.75  
V
(2)  
VRESET  
Supply voltage for micromirror electrode  
V
(4)  
| VCC – VCCI |  
| VBIAS – VOFFSET |  
INPUT VOLTAGES  
Supply voltage delta (absolute value)  
V
(5)  
Supply voltage delta (absolute value)  
V
(2)  
Input voltage for all other LVCMOS input pins  
–0.5  
–0.5  
VCC + 0.15  
V
V
(2) (6)  
Input voltage for all other LVDS input pins  
VCCI + 0.15  
(7)  
| VID  
IID  
|
Input differential voltage (absolute value)  
700  
7
mV  
mA  
(7)  
Input differential current  
CLOCKS  
ƒclock  
Clock frequency for LVDS interface, DCLK (all channels)  
460  
MHz  
ENVIRONMENTAL  
(8) (9)  
Case temperature: operational  
–20  
–40  
90  
90  
81  
ºC  
ºC  
ºC  
TCASE  
(9)  
Case temperature: non–operational  
Dew Point (Operating and non-Operating)  
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings  
only, and functional operation of the device is not implied at these or any other conditions beyond those indicated under Recommended  
Operating Conditions . Exposure above Recommended Operating Conditions for extended periods may affect device reliability.  
(2) All voltages are referenced to common ground VSS. Supply voltages VCC, VCCI, VOFFSET, VBIAS, and VRESET are all required for  
proper DMD operation. VSS must also be connected  
(3) VOFFSET supply transients must fall within specified voltages.  
(4) To prevent excess current, the supply voltage delta |VCCI – VCC| must be less than specified limit.  
(5) To prevent excess current, the supply voltage delta |VBIAS – VOFFSET| must be less than specified limit. Refer to Power Supply  
Recommendations for additional information.  
(6) This maximum LVDS input voltage rating applies when each input of a differential pair is at the same voltage potential. .  
(7) LVDS differential inputs must not exceed the specified limit or damage may result to the internal termination resistors  
(8) Exposure of the DMD simultaneously to any combination of the maximum operating conditions for case temperature, differential  
temperature, or illumination power density will reduce the device lifetime.  
(9) DMD Temperature is the worst-case of any test point shown in Figure 15, or the active array as calculated by the Micromirror Array  
Temperature Calculation , or any point along the Window Edge as defined in Figure 15. The locations of thermal test points TP2, TP3,  
TP4 and TP5 in Figure 15 are intended to measure the highest window edge temperature. If a particular application causes another  
point on the window edge to be at a higher temperature, a test point should be added to that location.  
6.2 Storage Conditions  
applicable before the DMD is installed in the final product  
MIN  
MAX  
85  
UNIT  
°C  
Tstg  
TDP  
DMD Storage Temperature  
Storage Dew Point - long-term  
Storage Dew Point - short-term  
–40  
(1)  
(2)  
24  
°C  
28  
°C  
(1) Long-term is defined as the usable life of the device.  
(2) Dew points beyond the specified long-term dew point are for short-term conditions only, where short-term is defined as less than 60  
cumulative days over the usable life of the device (operating, non-operating, or storage).  
6.3 ESD Ratings  
VALUE  
UNIT  
V(ESD)  
Electrostatic discharge  
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)  
±2000  
V
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.  
10  
Copyright © 2014–2016, Texas Instruments Incorporated  
 
DLP6500FYE  
www.ti.com.cn  
ZHCSD23A OCTOBER 2014REVISED FEBRUARY 2016  
6.4 Recommended Operating Conditions  
over operating free-air temperature range (unless otherwise noted)  
MIN  
NOM  
MAX  
UNIT  
(2)  
SUPPLY VOLTAGES(1)  
VCC  
Supply voltage for LVCMOS core logic  
3.15  
3.15  
8.25  
15.5  
–9.5  
3.3  
3.3  
8.5  
16  
3.45  
3.45  
8.75  
16.5  
–10.5  
0.3  
V
V
V
V
V
V
V
VCCI  
Supply voltage for LVDS receivers  
VOFFSET  
VBIAS  
Supply voltage for HVCMOS and micromirror electrodes(2)  
Supply voltage for micromirror electrodes  
Supply voltage for micromirror electrodes  
VRESET  
|VCCI–VCC|  
|VBIAS–VOFFSET|  
LVCMOS PINS  
VIH  
–10  
(3)  
Supply voltage delta (absolute value)  
Supply voltage delta (absolute value)(4)  
8.75  
(5)  
High level Input voltage  
1.7  
2.5 VCC + 0.15  
V
V
VIL  
Low level Input voltage(5)  
– 0.3  
0.7  
–20  
15  
IOH  
High level output current at VOH = 2.4 V  
Low level output current at VOL = 0.4 V  
PWRDNZ pulse width(6)  
mA  
mA  
ns  
IOL  
TPWRDNZ  
10  
SCP INTERFACE(7)  
ƒclock  
SCP clock frequency(8)  
500  
800  
700  
kHz  
ns  
tSCP_SKEW  
tSCP_DELAY  
tSCP_BYTE_INTERVAL  
tSCP_NEG_ENZ  
tSCP_PW_ENZ  
tSCP_OUT_EN  
ƒclock  
Time between valid SCPDI and rising edge of SCPCLK(9)  
Time between valid SCPDO and rising edge of SCPCLK(9)  
Time between consecutive bytes  
–800  
ns  
1
30  
1
µs  
Time between falling edge of SCPENZ and the first rising edge of SCPCLK  
SCPENZ inactive pulse width (high level)  
ns  
µs  
Time required for SCP output buffer to recover after SCPENZ (from tri-state)  
1.5  
ns  
(10)  
SCP circuit clock oscillator frequency  
9.6  
11.1  
MHz  
(1) Supply voltages VCC, VCCI, VOFFSET, VBIAS, and VRESET are all required for proper DMD operation. VSS must also be connected.  
(2) VOFFSET supply transients must fall within specified max voltages.  
(3) To prevent excess current, the supply voltage delta |VCCI – VCC| must be less than specified limit.  
(4) To prevent excess current, the supply voltage delta |VBIAS – VOFFSET| must be less than specified limit. Refer to Power Supply  
Recommendations for additional information.  
(5) Tester Conditions for VIH and VIL:  
Frequency = 60MHz. Maximum Rise Time = 2.5 ns at (20% to 80%)  
Frequency = 60MHz. Maximum Fall Time = 2.5 ns at (80% to 20%)  
(6) PWRDNZ input pin resets the SCP and disables the LVDS receivers. PWRDNZ input pin overrides SCPENZ input pin and tri-states the  
SCPDO output pin.  
(7) For all Serial Communications Port (SCP) operations, DCLK_A and DCLK_B are required.  
(8) The SCP clock is a gated clock. Duty cycle shall be 50% ± 10%. SCP parameter is related to the frequency of DCLK.  
(9) Refer to Figure 3.  
(10) SCP internal oscillator is specified to operate all SCP registers. For all SCP operations, DCLK is required.  
Copyright © 2014–2016, Texas Instruments Incorporated  
11  
 
DLP6500FYE  
ZHCSD23A OCTOBER 2014REVISED FEBRUARY 2016  
www.ti.com.cn  
Recommended Operating Conditions (continued)  
over operating free-air temperature range (unless otherwise noted)  
MIN  
NOM  
MAX  
UNIT  
LVDS INTERFACE  
ƒclock  
|VID  
Clock frequency for LVDS interface, DCLK (all channels)  
Input differential voltage (absolute value)(11)  
400  
600  
MHz  
mV  
mV  
mV  
ns  
|
100  
0
400  
(11)  
VCM  
Common mode  
1200  
VLVDS  
LVDS voltage(11)  
2000  
10  
tLVDS_RSTZ  
Time required for LVDS receivers to recover from PWRDNZ  
Internal differential termination resistance  
Line differential impedance (PWB/trace)  
ZIN  
95  
90  
105  
110  
Ω
ZLINE  
100  
Ω
(12)  
ENVIRONMENTAL  
(13) (14) (15)  
DMD temperature–operational, long-term  
0
40 to 70(14)  
°C  
°C  
TDMD  
DMD temperature – operational, short-term  
Window temperature – operational(16)  
–20  
75  
90  
TWINDOW  
°C  
(16) (17)  
TCERAMIC-WINDOW-DELTA  
Delta ceramic-to-window temperature -operational  
30  
°C  
Long-term dew point (operational, non-operational, long-term)  
Short-term dew point(15) (18) (operational, non-operational, short-term)  
Illumination, wavelength < 420 nm  
24  
°C  
28  
°C  
mW/cm2  
ILLUV  
ILLVIS  
ILLIR  
0.68  
Thermally  
Limited(19)  
mW/cm2  
mW/cm2  
Illumination, wavelengths between 420 and 700 nm  
Illumination, wavelength > 700 nm  
10  
(11) Refer to Figure 4, Figure 5, and Figure 6.  
(12) Optimal, long-term performance and optical efficiency of the Digital Micromirror Device (DMD) can be affected by various application  
parameters, including illumination spectrum, illumination power density, micromirror landed duty-cycle, ambient temperature (storage  
and operating), DMD temperature, ambient humidity (storage and operating), and power on or off duty cycle. TI recommends that  
application-specific effects be considered as early as possible in the design cycle.  
(13) DMD Temperature is the worst-case of any test point shown in Figure 15, or the active array as calculated by the Micromirror Array  
Temperature Calculation , or any point along the Window Edge as defined in Figure 15. The locations of thermal test points TP2, TP3,  
TP4 and TP5 in Figure 15 are intended to measure the highest window edge temperature. If a particular application causes another  
point on the window edge to be at a higher temperature, a test point should be added to that location.  
(14) Per Figure 1, the maximum operational case temperature should be derated based on the micromirror landed duty cycle that the DMD  
experiences in the end application. Refer to Micromirror Landed-on/Landed-Off Duty Cycle for a definition of micromirror landed duty  
cycle.  
(15) Long-term is defined as the average over the usable life.  
(16) Window temperature as measured at thermal test points TP2, TP3, TP4 and TP5 in Figure 15.The locations of thermal test points TP2,  
TP3, TP4 and TP5 in Figure 15 are intended to measure the highest window edge temperature. If a particular application causes  
another point on the window edge to be at a higher temperature, a test point should be added to that location.  
(17) Ceramic package temperature as measured at test point 1 (TP1) in Figure 15.  
(18) Dew points beyond the specified long-term dew point (operating, non-operating, or storage) are for short-term conditions only, where  
short-term is defined as< 60 cumulative days over the usable life of the device.  
(19) Refer to Thermal Information and Micromirror Array Temperature Calculation .  
12  
Copyright © 2014–2016, Texas Instruments Incorporated  
DLP6500FYE  
www.ti.com.cn  
ZHCSD23A OCTOBER 2014REVISED FEBRUARY 2016  
80  
70  
60  
50  
40  
30  
0/100 5/95 10/90 15/85 20/80 25/75 30/70 35/65 40/60 45/55 50/50  
90/10 85/15 80/20 75/25 70/30 65/35 60/40 55/45  
100/0 95/5  
D001  
Micromirror Landed Duty Cycle  
Figure 1. Max Recommended DMD Temperature – Derating Curve  
6.5 Thermal Information  
THERMAL METRIC(1)  
DLP6500FYE  
FYE (350)  
UNIT  
MIN  
MAX  
(1)  
Active Area-to-Case Ceramic Thermal resistance  
0.6  
°C/W  
(1) The DMD is designed to conduct absorbed and dissipated heat to the back of the package where it can be removed by an appropriate  
heat sink. The heat sink and cooling system must be capable of maintaining the package within the temperature range specified in the  
Recommended Operating Conditions . The total heat load on the DMD is largely driven by the incident light absorbed by the active area;  
although other contributions include light energy absorbed by the window aperture and electrical power dissipation of the array. Optical  
systems should be designed to minimize the light energy falling outside the window clear aperture since any additional thermal load in  
this area can significantly degrade the reliability of the device.  
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6.6 Electrical Characteristics  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
VOH  
DESCRIPTION  
High-level output voltage  
Low level output voltage  
High–level input current(2) (3)  
Low level input current  
TEST CONDITIONS(1)  
MIN TYP MAX  
UNIT  
V
VCC = 3.3 V, IOH = –20 mA  
2.4  
VOL  
VCC = 3.45 V, IOL = 15 mA  
VCC = 3.45 V , VI = VCC  
VCC = 3.45 V, VI = 0  
VCC = 3.45 V  
0.4  
V
IIH  
250  
µA  
µA  
µA  
IlL  
–250  
IOZ  
High–impedance output current  
10  
CURRENT  
ICC  
VCC = 3.6 V  
1076  
518  
4
(4)  
Supply current  
mA  
mA  
mA  
ICCI  
VCCI = 3.6 V  
IOFFSET  
IBIAS  
VOFFSET = 8.75 V  
VBIAS = 16.5 V  
VRESET = –10.5 V  
Total Sum  
(5)  
Supply current  
14  
IRESET  
ITOTAL  
POWER  
PCC  
11  
Supply current  
1623  
VCC = 3.6 V  
3874  
1865  
35  
PCCI  
VCCI = 3.6 V  
POFFSET  
PBIAS  
PRESET  
PTOTAL  
CAPACITANCE  
CI  
Supply power dissipation  
Supply power dissipation(6)  
VOFFSET = 8.75 V  
VBIAS = 16.5 V  
VRESET = –10.5 V  
Total Sum  
mW  
231  
116  
6300  
Input capacitance  
Output capacitance  
ƒ = 1 MHz  
ƒ = 1 MHz  
10  
10  
pF  
pF  
CO  
Reset group capacitance  
MBRST(14:0)  
CM  
ƒ = 1 MHz 1920 × 72 micromirrors  
330  
390  
pF  
(1) All voltages are referenced to common ground VSS. Supply voltages VCC, VCCI, VOFFSET, VBIAS, and VRESET are all required for  
proper DMD operation. VSS must also be connected.  
(2) Applies to LVCMOS input pins only. Does not apply to LVDS pins and MBRST pins.  
(3) LVCMOS input pins utilize an internal 18000 Ω passive resistor for pull-up and pull-down configurations. Refer to Pin Configuration and  
Functions to determine pull-up or pull-down configuration used.  
(4) To prevent excess current, the supply voltage delta |VCCI – VCC| must be less than specified limit.  
(5) To prevent excess current, the supply voltage delta |VBIAS – VOFFSET| must be less than specified limit.  
(6) Total power on the active micromirror array is the sum of the electrical power dissipation and the absorbed power from the illumination  
source. See the Micromirror Array Temperature Calculation .  
14  
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6.7 Timing Requirements  
Over Recommended Operating Conditions unless otherwise noted.  
DESCRIPTION(1)  
MIN  
TYP  
MAX  
UNIT  
SCP INTERFACE(2)  
tr  
Rise time  
Fall time  
20% to 80%  
80% to 20%  
200  
200  
ns  
ns  
tƒ  
LVDS INTERFACE(2)  
tr  
Rise time  
Fall time  
20% to 80%  
80% to 20%  
100  
100  
400  
400  
ps  
ps  
tƒ  
LVDS CLOCKS(3)  
DCLK_A, 50% to 50%  
DCLK_B, 50% to 50%  
DCLK_A, 50% to 50%  
DCLK_B, 50% to 50%  
2.5  
2.5  
tc  
Cycle time  
ns  
ns  
1.19  
1.19  
1.25  
1.25  
Pulse  
duration  
tw  
LVDS INTERFACE(3)  
D_A(15:0) before rising or falling edge of DCLK_A  
D_B(15:0) before rising or falling edge of DCLK_B  
SCTRL_A before rising or falling edge of DCLK_A  
SCTRL_B before rising or falling edge of DCLK_B  
D_A(15:0) after rising or falling edge of DCLK_A  
D_B(15:0) after rising or falling edge of DCLK_B  
SCTRL_A after rising or falling edge of DCLK_A  
SCTRL_B after rising or falling edge of DCLK_B  
0.1  
0.1  
0.1  
0.1  
0.4  
0.4  
0.3  
0.3  
tsu  
tsu  
th  
Setup time  
Setup time  
Hold time  
Hold time  
ns  
ns  
ns  
ns  
th  
LVDS INTERFACE(4)  
Channel A includes the following LVDS  
pairs:  
DCLK_AP and DCLK_AN  
SCTRL_AP and SCTRL_AN  
D_AP(15:0) and D_AN(15:0)  
(4)  
tskew  
Skew time  
Channel B relative to Channel A  
–1.25  
1.25  
ns  
Channel B includes the following LVDS  
pairs:  
DCLK_BP and DCLK_BN  
SCTRL_BP and SCTRL_BN  
D_BP(15:0) and D_BN(15:0)  
(1) Refer to Pin Configuration and Functions for pin details.  
(2) Refer to Figure 7  
(3) Refer to Figure 8  
(4) Refer to Figure 9  
Timing Requirements  
The data sheet provides timing at the device pin. For output timing analysis, the tester pin electronics and its  
transmission line effects must be taken into account. Figure 2 shows an equivalent test load circuit for the output  
under test. The load capacitance value stated is only for characterization and measurement of AC timing signals.  
This load capacitance value does not indicate the maximum load the device is capable of driving.  
Timing reference loads are not intended as a precise representation of any particular system environment or  
depiction of the actual load presented by a production test. System designers should use IBIS or other simulation  
tools to correlate the timing reference load to a system environment. Refer to the Application and Implementation  
section.  
Device Pin  
Tester Channel  
Output Under Test  
CLOAD  
Figure 2. Test Load Circuit  
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t
f
= 1 / t  
clock c  
c
SCPCLK  
50%  
50%  
tSCP_SKEW  
SCPDI  
50%  
tSCP_DELAY  
SCPD0  
50%  
Not to scale.  
Refer to SCP Interface section of the Recommended Operating Conditions table.  
Figure 3. SCP Timing Parameters  
(VIP + VIN) / 2  
DCLK_P , SCTRL_P , D_P(0:?)  
LVDS  
Receiver  
VID  
VIP  
DCLK_N , SCTRL_N , D_N(0:?)  
VCM  
VIN  
Refer to LVDS Interface section of the Recommended Operating Conditions table.  
Refer to Pin Configuration and Functions for list of LVDS pins.  
Figure 4. LVDS Voltage Definitions (References)  
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VLVDS max = VCM max + | 1/2 * VID max  
|
VCM  
VID  
VLVDS min = VCM min œ | 1/2 * VID max  
|
Not to scale.  
Refer to LVDS Interface section of the Recommended Operating Conditions table.  
Figure 5. LVDS Voltage Parameters  
DCLK_P , SCTRL_P , D_P(0:?)  
ESD  
Internal  
Termination  
LVDS  
Receiver  
DCLK_N , SCTRL_N , D_N(0:?)  
ESD  
Refer to LVDS Interface section of the Recommended Operating Conditions table.  
Refer to Pin Configuration and Functions for list of LVDS pins.  
Figure 6. LVDS Equivalent Input Circuit  
LVDS Interface  
SCP Interface  
1.0 * VCC  
1.0 * V  
ID  
V
CM  
0.0 * VCC  
0.0 * V  
ID  
tr  
tf  
tr  
tf  
Not to scale.  
Refer to the Timing Requirements  
Refer to Pin Configuration and Functions for list of LVDS pins and SCP pins..  
Figure 7. Rise Time and Fall Time  
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t
c
t
t
w
w
DCLK_P  
DCLK_N  
50%  
t
t
t
t
h
h
h
h
t
t
t
t
su  
su  
su  
su  
D_P(0:?)  
D_N(0:?)  
50%  
SCTRL_P  
SCTRL_N  
50%  
Not to scale.  
Refer to LVDS INTERFACE section in the Timing Requirements table.  
Figure 8. Timing Requirement Parameter Definitions  
DCLK_P  
DCLK_N  
50%  
D_P(0:?)  
D_N(0:?)  
50%  
SCTRL_P  
SCTRL_N  
50%  
t
skew  
DCLK_P  
DCLK_N  
50%  
D_P(0:?)  
D_N(0:?)  
50%  
50%  
SCTRL_P  
SCTRL_N  
Not to scale.  
Refer to LVDS INTERFACE section in the Timing Requirements table.  
Figure 9. LVDS Interface Channel Skew Definition  
18  
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6.8 Typical Characteristics  
The DLP6500FYE DMD is controlled by the DLPC900 controller. The controller has two modes of operation. The first is Video  
mode where the video source is displayed on the DMD. The second is Pattern mode, where the patterns are pre-stored in  
flash memory and then streamed to the DMD. The allowed DMD pattern rate depends on which mode and bit-depth is  
selected.  
Table 1. Bit Depth versus Pattern Rate  
BIT DEPTH  
VIDEO MODE RATE (Hz)  
PATTERN MODE RATE (Hz)  
1
2
3
4
5
6
7
8
2880  
1440  
960  
720  
480  
480  
360  
247  
9523  
3289  
2638  
1364  
823  
672  
500  
247  
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6.9 System Mounting Interface Loads  
PARAMETER  
MIN  
NOM  
MAX  
UNIT  
Maximum system mounting interface  
load to be applied to the:  
(See Figure 10)  
(See Figure 10)  
11.30  
Kg  
Thermal Interface area  
Electrical Interface areas  
Maximum Load 22.64 Applied per  
condition 2  
0
Kg  
Thermal Interface area  
Electrical Interface areas  
22.60  
Electrical Interface Area  
Thermal Interface Area  
Figure 10. System Mounting Interface Loads  
20  
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6.10 Micromirror Array Physical Characteristics  
VALUE  
1920  
UNIT  
micromirrors  
micromirrors  
µm  
M
N
P
Number of active columns  
Number of active rows  
See Figure 11  
1080  
Micromirror (pixel) pitch  
7.56  
Micromirror active array width  
Micromirror active array height  
Micromirror active border  
M × P  
14.5152  
8.1648  
mm  
N × P  
mm  
Pond of micromirror (POM)(1)  
14 micromirrors /side  
(1) The structure and qualities of the border around the active array includes a band of partially functional micromirrors called the POM.  
These micromirrors are structurally and/or electrically prevented from tilting toward the bright or ON state, but still require an electrical  
bias to tilt toward OFF.  
0
1
2
3
DMD Active Array  
N x P  
M x N Micromirrors  
N œ 4  
N œ 3  
N œ 2  
N œ 1  
M x P  
P
Border micromirrors omitted for clarity.  
Details omitted for clarity.  
P
Not to scale.  
P
P
Refer to section Micromirror Array Physical Characteristics table for M, N, and P specifications.  
Figure 11. Micromirror Array Physical Characteristics  
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6.11 Micromirror Array Optical Characteristics  
See Optical Interface and System Image Quality for important information  
PARAMETER  
CONDITIONS  
MIN NOM  
MAX  
UNIT  
(1)  
α
β
Micromirror tilt angle  
DMD landed state  
12  
°
°
°
Micromirror tilt angle tolerance(1) (2) (3) (4) (5)  
Micromirror tilt direction(5) (6) (7)  
–1  
44  
1
46  
0
45  
Adjacent micromirrors  
Non-adjacent micromirrors  
Typical performance  
Typical performance  
(8)  
Number of out-of-specification micromirrors  
micromirrors  
10  
(9) (10)  
Micromirror crossover time  
2.5  
5
μs  
μs  
(10)  
Micromirror switching time  
DMD photopic efficiency within the wavelength range 420 nm  
to 700 nm  
66%  
(11)  
(1) Measured relative to the plane formed by the overall micromirror array.  
(2) Additional variation exists between the micromirror array and the package datums.  
(3) Represents the landed tilt angle variation relative to the nominal landed tilt angle.  
(4) Represents the variation that can occur between any two individual micromirrors, located on the same device or located on different  
devices.  
(5) For some applications, it is critical to account for the micromirror tilt angle variation in the overall system optical design. With some  
system optical designs, the micromirror tilt angle variation within a device may result in perceivable non-uniformities in the light field  
reflected from the micromirror array. With some system optical designs, the micromirror tilt angle variation between devices may result in  
colorimetry variations, system efficiency variations or system contrast variations.  
(6) When the micromirror array is landed (not parked), the tilt direction of each individual micromirror is dictated by the binary contents of  
the CMOS memory cell associated with each individual micromirror. A binary value of 1 results in a micromirror landing in the ON State  
direction. A binary value of 0 results in a micromirror landing in the OFF State direction.  
(7) Refer to Figure 12  
(8) An out-of-specification micromirror is defined as a micromirror that is unable to transition between the two landed states within the  
specified Micromirror Switching Time.  
(9) Micromirror crossover time is primarily a function of the natural response time of the micromirrors.  
(10) Performance as measured at the start of life.  
(11) Efficiency numbers assume 24-degree illumination angle, F/2.4 illumination and collection cones, uniform source spectrum, and uniform  
pupil illumination. Efficiency numbers assume 100% electronic mirror duty cycle and do not include optical overfill loss. Note that this  
number is specified under conditions described above and deviations from the specified conditions could result in decreased efficiency.  
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illumination  
Not To Scale  
0
1
2
3
On-State  
Tilt Direction  
Off-State  
Tilt Direction  
45°  
N œ 4  
N œ 3  
N œ 2  
N œ 1  
Refer to section Micromirror Array Physical Characteristics table for M, N, and P specifications.  
Figure 12. Micromirror Landed Orientation and Tilt  
6.12 Window Characteristics  
PARAMETER(1)  
CONDITIONS  
MIN  
NOM  
MAX UNIT  
Window material designation S600  
Window refractive index  
Window aperture  
Corning Eagle XG  
at wavelength 546.1 nm  
1.5119  
(2)  
See  
Illumination overfill  
Refer to Illumination Overfill  
Minimum within the wavelength range 420 nm to 680 nm.  
Applies to all angles 0° to 30° AOI.  
97%  
97%  
Window transmittance, single–pass  
through both surfaces and glass  
(3)  
Average over the wavelength range 420 nm to 680 nm.  
Applies to all angles 30° to 45° AOI.  
(1) See Window Characteristics and Optics for more information.  
(2) For details regarding the size and location of the window aperture, see the package mechanical characteristics listed in the Mechanical  
ICD in the Mechanical, Packaging, and Orderable Information section,  
(3) See the TI application report DLPA031, Wavelength Transmittance Considerations for DLP™ DMD Window.  
6.13 Chipset Component Usage Specification  
The DLP6500FYE is a component of one or more DLP® chipsets. Reliable function and operation of the  
DLP6500FYE requires that it be used in conjunction with the other components of the applicable DLP chipset,  
including those components that contain or implement TI DMD control technology. TI DMD control technology is  
the TI technology and devices for operating or controlling a DLP DMD.  
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7 Detailed Description  
7.1 Overview  
DLP6500FYE is a 0.65 inch diagonal spatial light modulator which consists of an array of highly reflective  
aluminum micromirrors. Pixel array size and square grid pixel arrangement are shown in Figure 11.  
The DMD is an electrical input, optical output micro-electrical-mechanical system (MEMS). The electrical  
interface is Low Voltage Differential Signaling (LVDS), Double Data Rate (DDR).  
DLP6500FYE DMD consists of a two-dimensional array of 1-bit CMOS memory cells. The array is organized in a  
grid of M memory cell columns by N memory cell rows. Refer to the Functional Block Diagram .  
The positive or negative deflection angle of the micromirrors can be individually controlled by changing the  
address voltage of underlying CMOS addressing circuitry and micromirror reset signals (MBRST).  
Each cell of the M × N memory array drives its true and complement (‘Q’ and ‘QB’) data to two electrodes  
underlying one micromirror, one electrode on each side of the diagonal axis of rotation. Refer to Micromirror  
Array Optical Characteristics . The micromirrors are electrically tied to the micromirror reset signals (MBRST) and  
the micromirror array is divided into reset groups.  
Electrostatic potentials between a micromirror and its memory data electrodes cause the micromirror to tilt  
toward the illumination source in a DLP projection system or away from it, thus reflecting its incident light into or  
out of an optical collection aperture. The positive (+) tilt angle state corresponds to an 'on' pixel, and the negative  
(–) tilt angle state corresponds to an 'off' pixel.  
Refer to Micromirror Array Optical Characteristics for the ± tilt angle specifications. Refer to Pin Configuration  
and Functions for more information on micromirror reset control.  
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7.2 Functional Block Diagram  
Not to Scale. Details Omitted for Clarity. See Accompanying Notes in this Section.  
Channel A  
Interface  
Control  
Column Read & Write  
Control  
(0,0)  
Voltages  
Word Lines  
Voltage  
Generators  
Row  
Micromirror Array  
(M-1, N-1)  
Control  
Column Read & Write  
Control  
Channel B  
Interface  
For pin details on Channels A, B, C, and D, refer to Pin Configuration and Functions and LVDS Interface section of  
Timing Requirements .  
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7.3 Feature Description  
DLP6500FYE device consists of highly reflective, digitally switchable, micrometer-sized mirrors (micromirrors)  
organized in a two-dimensional orthogonal pixel array. Refer to Figure 11 and Figure 13.  
Each aluminum micromirror is switchable between two discrete angular positions, –α and +α. The angular  
positions are measured relative to the micromirror array plane, which is parallel to the silicon substrate. Refer to  
Micromirror Array Optical Characteristics and Figure 14.  
The parked position of the micromirror is not a latched position and is therefore not necessarily perfectly parallel  
to the array plane. Individual micromirror flat state angular positions may vary. Tilt direction of the micromirror is  
perpendicular to the hinge-axis. The on-state landed position is directed toward the left-top edge of the package,  
as shown in Figure 13.  
Each individual micromirror is positioned over a corresponding CMOS memory cell. The angular position of a  
specific micromirror is determined by the binary state (logic 0 or 1) of the corresponding CMOS memory cell  
contents, after the mirror clocking pulse is applied. The angular position (–α and +α) of the individual  
micromirrors changes synchronously with a micromirror clocking pulse, rather than being coincident with the  
CMOS memory cell data update.  
Writing logic 1 into a memory cell followed by a mirror clocking pulse results in the corresponding micromirror  
switching to a +α position. Writing logic 0 into a memory cell followed by a mirror clocking pulse results in the  
corresponding micromirror switching to a – α position.  
Updating the angular position of the micromirror array consists of two steps:  
1. update the contents of the CMOS memory .  
2. apply a micromirror reset to all or a portion of the micromirror array (depending upon the configuration of the  
system).  
Micromirror reset pulses are generated internally by the DLP6500FYE DMD , with application of the pulses being  
coordinated by the DLPC900 display controller.  
For more information, see the TI application report DLPA008A, DMD101: Introduction to Digital Micromirror  
Device (DMD) Technology.  
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Feature Description (continued)  
Incident  
Illumination  
Package Pin  
A1 Corner  
Details Omitted For Clarity.  
Not To Scale.  
DMD  
Micromirror  
Array  
Active Micromirror Array  
(Border micromirrors eliminated for clarity)  
0
Nœ1  
Micromirror Pitch  
Micromirror Hinge-Axis Orientation  
P (um)  
—On-State“  
Tilt Direction  
45°  
—Off-State“  
Tilt Direction  
P (um)  
Refer to Micromirror Array Physical Characteristics, Figure 11, and Micromirror Landed Orientation and Tilt  
Figure 13. Micromirror Array, Pitch, Hinge Axis Orientation  
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Feature Description (continued)  
Details Omitted For Clarity.  
Not To Scale.  
Package Pin  
A1 Corner  
DMD  
Incident  
Illumination  
Two  
—On-State“  
Two  
—Off-State“  
Micromirrors Micromirrors  
For Reference  
Flat-State  
( —parked“ )  
Micromirror Position  
a ± b  
-a ± b  
Silicon Substrate  
Silicon Substrate  
—On-State“  
Micromirror  
—Off-State“  
Micromirror  
Micromirror States: On, Off, Flat  
Figure 14. Micromirror States: On, Off, Flat  
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7.4 Device Functional Modes  
DLP6500FYE is part of the chipset comprising of the DLP6500FYE DMD and DLPC900 display controller. To  
ensure reliable operation, DLP6500FYE DMD must always be used with a DLPC900 display controller.  
DMD functional modes are controlled by the DLPC900 digital display controller. See the DLPC900 data sheet  
listed in Related Documents. Contact a TI applications engineer for more information.  
7.5 Window Characteristics and Optics  
NOTE  
TI assumes no responsibility for image quality artifacts or DMD failures caused by optical  
system operating conditions exceeding limits described previously.  
7.5.1 Optical Interface and System Image Quality  
TI assumes no responsibility for end-equipment optical performance. Achieving the desired end-equipment  
optical performance involves making trade-offs between numerous component and system design parameters.  
Optimizing system optical performance and image quality strongly relate to optical system design parameter  
trades. Although it is not possible to anticipate every conceivable application, projector image quality and optical  
performance is contingent on compliance to the optical system operating conditions described in the following  
sections.  
7.5.2 Numerical Aperture and Stray Light Control  
The angle defined by the numerical aperture of the illumination and projection optics at the DMD optical area  
should be the same. This angle should not exceed the nominal device mirror tilt angle unless appropriate  
apertures are added in the illumination and/or projection pupils to block out flat-state and stray light from the  
projection lens. The mirror tilt angle defines DMD capability to separate the "ON" optical path from any other light  
path, including undesirable flat-state specular reflections from the DMD window, DMD border structures, or other  
system surfaces near the DMD such as prism or lens surfaces. If the numerical aperture exceeds the mirror tilt  
angle, or if the projection numerical aperture angle is more than two degrees larger than the illumination  
numerical aperture angle, objectionable artifacts in the display’s border and/or active area could occur.  
7.5.3 Pupil Match  
TI’s optical and image quality specifications assume that the exit pupil of the illumination optics is nominally  
centered within 2° (two degrees) of the entrance pupil of the projection optics. Misalignment of pupils can create  
objectionable artifacts in the display’s border and/or active area, which may require additional system apertures  
to control, especially if the numerical aperture of the system exceeds the pixel tilt angle.  
7.5.4 Illumination Overfill  
The active area of the device is surrounded by an aperture on the inside DMD window surface that masks  
structures of the DMD device assembly from normal view. The aperture is sized to anticipate several optical  
operating conditions. Overfill light illuminating the window aperture can create artifacts from the edge of the  
window aperture opening and other surface anomalies that may be visible on the screen. The illumination optical  
system should be designed to limit light flux incident anywhere on the window aperture from exceeding  
approximately 10% of the average flux level in the active area. Depending on the particular system’s optical  
architecture, overfill light may have to be further reduced below the suggested 10% level in order to be  
acceptable.  
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7.6 Micromirror Array Temperature Calculation  
Figure 15. DMD Thermal Test Points  
Micromirror array temperature can be computed analytically from measurement points on the outside of the  
package, the ceramic package thermal resistance, the electrical power dissipation, and the illumination heat load.  
The relationship between micromirror array temperature and the reference ceramic temperature is provided by  
the following equations:  
TARRAY = TCERAMIC + (QARRAY × RARRAY–TO–CERAMIC  
QARRAY = QELECTRICAL + QILLUMINATION  
QILLUMINATION = (CL2W × SL)  
)
(1)  
(2)  
where  
TARRAY = Computed micromirror array temperature (°C)  
TCERAMIC = Measured ceramic temperature (°C), TP1 location in Figure 15  
RARRAY–TO–CERAMIC = DMD package thermal resistance from micromirror array to outside ceramic (°C/W)  
specified in Thermal Information  
QARRAY = Total DMD power; electrical, specified in Electrical Characteristics , plus absorbed (calculated) (W)  
QELECTRICAL = Nominal DMD electrical power dissipation (W), specified in Electrical Characteristics  
30  
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Micromirror Array Temperature Calculation (continued)  
CL2W = Conversion constant for screen lumens to absorbed optical power on the DMD (W/lm) specified below  
SL = Measured ANSI screen lumens (lm) (3)  
Electrical power dissipation of the DMD is variable and depends on the voltages, data rates and operating  
frequencies. The nominal electrical power dissipation to use when calculating array temperature is 2.9 Watts .  
Absorbed optical power from the illumination source is variable and depends on the operating state of the  
micromirrors and the intensity of the light source. Equations shown above are valid for a 1-chip DMD system with  
total projection efficiency through the projection lens from DMD to the screen of 87%.  
The conversion constant CL2W is based on the DMD micromirror array characteristics. It assumes a spectral  
efficiency of 300 lm/W for the projected light and illumination distribution of 83.7% on the DMD active array, and  
16.3% on the DMD array border and window aperture. The conversion constant is calculated to be 0.00293  
W/lm.  
Sample Calculation for typical projection application:  
TCERAMIC = 55°C, assumed system measurement; see Recommended Operating Conditions for specific limits  
SL = 2000 lm  
QELECTRICAL = 2.9 W (see the maximum power specifications in Electrical Characteristics )  
CL2W = 0.00293 W/lm  
QARRAY = 2.9 W + (0.00293 W/lm × 2000 lm) = 8.76 W  
TARRAY = 55°C + (8.76 W × 0.6 × C/W) = 60.26°C  
7.7 Micromirror Landed-on/Landed-Off Duty Cycle  
7.7.1 Definition of Micromirror Landed-On/Landed-Off Duty Cycle  
The micromirror landed-on/landed-off duty cycle (landed duty cycle) denotes the amount of time (as a  
percentage) that an individual micromirror is landed in the On–state versus the amount of time the same  
micromirror is landed in the Off–state.  
As an example, a landed duty cycle of 100/0 indicates that the referenced pixel is in the On–state 100% of the  
time (and in the Off–state 0% of the time); whereas 0/100 would indicate that the pixel is in the Off–state 100% of  
the time. Likewise, 50/50 indicates that the pixel is On 50% of the time and Off 50% of the time.  
Note that when assessing landed duty cycle, the time spent switching from one state (ON or OFF) to the other  
state (OFF or ON) is considered negligible and is thus ignored.  
Since a micromirror can only be landed in one state or the other (On or Off), the two numbers (percentages)  
always add to 100.  
7.7.2 Landed Duty Cycle and Useful Life of the DMD  
Knowing the long-term average landed duty cycle (of the end product or application) is important because  
subjecting all (or a portion) of the DMD’s micromirror array (also called the active array) to an asymmetric landed  
duty cycle for a prolonged period of time can reduce the DMD’s usable life.  
Note that it is the symmetry/asymmetry of the landed duty cycle that is of relevance. The symmetry of the landed  
duty cycle is determined by how close the two numbers (percentages) are to being equal. For example, a landed  
duty cycle of 50/50 is perfectly symmetrical whereas a landed duty cycle of 100/0 or 0/100 is perfectly  
asymmetrical.  
7.7.3 Landed Duty Cycle and Operational DMD Temperature  
Operational DMD Temperature and Landed Duty Cycle interact to affect the DMD’s usable life, and this  
interaction can be exploited to reduce the impact that an asymmetrical Landed Duty Cycle has on the DMD’s  
usable life. This is quantified in the de-rating curve shown in Figure 1. The importance of this curve is that:  
All points along this curve represent the same usable life.  
All points above this curve represent lower usable life (and the further away from the curve, the lower the  
usable life).  
All points below this curve represent higher usable life (and the further away from the curve, the higher the  
usable life).  
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Micromirror Landed-on/Landed-Off Duty Cycle (continued)  
In practice, this curve specifies the Maximum Operating DMD Temperature that the DMD should be operated at  
for a give long-term average Landed Duty Cycle.  
7.7.4 Estimating the Long-Term Average Landed Duty Cycle of a Product or Application  
During a given period of time, the Landed Duty Cycle of a given pixel follows from the image content being  
displayed by that pixel.  
For example, in the simplest case, when displaying pure-white on a given pixel for a given time period, that pixel  
will experience a 100/0 Landed Duty Cycle during that time period. Likewise, when displaying pure-black, the  
pixel will experience a 0/100 Landed Duty Cycle.  
Between the two extremes (ignoring for the moment color and any image processing that may be applied to an  
incoming image), the Landed Duty Cycle tracks one-to-one with the gray scale value, as shown in Table 2.  
Table 2. Grayscale Value and Landed Duty Cycle  
GRAYSCALE VALUE  
LANDED DUTY CYCLE  
0%  
10%  
20%  
30%  
40%  
50%  
60%  
70%  
80%  
90%  
100%  
0/100  
10/90  
20/80  
30/70  
40/60  
50/50  
60/40  
70/30  
80/20  
90/10  
100/0  
Accounting for color rendition (but still ignoring image processing) requires knowing both the color intensity (from  
0% to 100%) for each constituent primary color (red, green, and/or blue) for the given pixel as well as the color  
cycle time for each primary color, where “color cycle time” is the total percentage of the frame time that a given  
primary must be displayed in order to achieve the desired white point.  
During a given period of time, the landed duty cycle of a given pixel can be calculated as follows:  
Landed Duty Cycle = (Red_Cycle_% × Red_Scale_Value) + (Green_Cycle_% × Green_Scale_Value) +  
(Blue_Cycle_% × Blue_Scale_Value)  
Where:  
Red_Cycle_%, Green_Cycle_%, and Blue_Cycle_%, represent the percentage of the frame time that Red,  
Green, and Blue are displayed (respectively) to achieve the desired white point.  
For example, assume that the red, green and blue color cycle times are 50%, 20%, and 30% respectively (in  
order to achieve the desired white point), then the Landed Duty Cycle for various combinations of red, green,  
blue color intensities would be as shown in Table 3.  
32  
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Table 3. Example Landed Duty Cycle for Full-Color  
Red Cycle Percentage  
Green Cycle Percentage  
20%  
Blue Cycle Percentage  
50%  
30%  
Landed Duty Cycle  
Red Scale Value  
Green Scale Value  
Blue Scale Value  
0%  
100%  
0%  
0%  
0%  
0%  
0%  
0/100  
50/50  
20/80  
30/70  
6/94  
100%  
0%  
0%  
0%  
100%  
0%  
12%  
0%  
0%  
35%  
0%  
0%  
7/93  
0%  
60%  
0%  
18/82  
70/30  
50/50  
80/20  
13/87  
25/75  
24/76  
100/0  
100%  
0%  
100%  
100%  
0%  
100%  
100%  
0%  
100%  
12%  
0%  
35%  
35%  
0%  
60%  
60%  
100%  
12%  
100%  
100%  
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8 Application and Implementation  
NOTE  
Information in the following applications sections is not part of the TI component  
specification, and TI does not warrant its accuracy or completeness. TI’s customers are  
responsible for determining suitability of components for their purposes. Customers should  
validate and test their design implementation to confirm system functionality.  
8.1 Application Information  
The DLP6500FYE along with the DLPC900 controller provides a solution for many applications including  
structured light and video projection. The DMD is a spatial light modulator, which reflects incoming light from an  
illumination source to one of two directions, with the primary direction being into a projection or collection optic.  
Each application is derived primarily from the optical architecture of the system and the format of the data  
coming into the DLPC900. Applications of interest include machine vision and 3D printing.  
8.2 Typical Application  
A typical embedded system application using the DLPC900 controller and a DLP6500FYE is shown in Figure 16.  
In this configuration, the DLPC900 controller supports a 24-bit parallel RGB input, typical of LCD interfaces, from  
an external source or processor. This system configuration supports still and motion video sources plus  
sequential pattern mode. Refer to Related Documents for the DLPC900 digital controller data sheet.  
HEARTBEAT  
FAULT_STATUS  
LED  
Status  
Parallel  
Flash  
PM_ADDR[22:0],WE  
DATA[15:0],OE,CS  
Host  
USB  
I2C  
USB_DN,DP  
LEDs  
LED EN[2:0]  
LED PWM[2:0]  
I2C_SCL1, I2C_SDA1  
P1_A[9:0]  
P1_B[9:0]  
P1_C[9:0]  
PWM  
FAN  
Digital Receiver  
HDMI  
DP  
DLPC900  
HDMI  
DISPLAYPORT  
DMD_A,B[15:0]  
DMD Control  
DMD SSP  
P1A_CLK, P1_DATEN,  
P1_VSYNC, P1_HSYNC  
TRIG_OUT[1:0]  
TRIG_IN[1:0]  
POWER RAILS  
GUI  
Camera  
Crystal  
JTAG  
DLP6500FYE  
VCC  
PWRGOOD  
Power  
MOSC  
POSENSE Management  
I2C_SCL0  
I2C_SDA0  
TDO[1:0],TRST,TCK  
RMS[1:0],RTCK  
I2C  
12V DC IN  
Figure 16. Typical Application Schematic  
8.2.1 Design Requirements  
Detailed design requirements are located in the DLPC900 digital controller data sheet. Refer to Related  
Documents.  
8.2.2 Detailed Design Procedure  
See the reference design schematic for connecting together the DLPC900 display controller and the  
DLP6500FYE DMD. An example board layout is included in the reference design data base. Layout guidelines  
should be followed for reliability.  
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9 Power Supply Recommendations  
9.1 DMD Power Supply Requirements  
The following power supplies are all required to operate the DMD: VCC, VCCI, VOFFSET, VBIAS, and VRESET.  
VSS must also be connected. DMD power-up and power-down sequencing is strictly controlled by the DLPC900  
device.  
CAUTION  
For reliable operation of the DMD, the following power supply sequencing  
requirements must be followed. Failure to adhere to the prescribed power-up and  
power-down procedures may affect device reliability. VCC, VCCI, VOFFSET, VBIAS,  
and VRESET power supplies have to be coordinated during power-up and power-  
down operations. VSS must also be connected. Failure to meet any of the below  
requirements will result in a significant reduction in the DMD’s reliability and lifetime.  
Refer to Figure 17.  
9.2 DMD Power Supply Power-Up Procedure  
During power-up, VCC and VCCI must always start and settle before VOFFSET, VBIAS, and VRESET  
voltages are applied to the DMD.  
During power-up, it is a strict requirement that the delta between VBIAS and VOFFSET must be within the  
specified limit shown in Recommended Operating Conditions. During power-up, VBIAS does not have to start  
after VOFFSET.  
During power-up, there is no requirement for the relative timing of VRESET with respect to VOFFSET and  
VBIAS.  
Power supply slew rates during power-up are flexible, provided that the transient voltage levels follow the  
requirements listed in Absolute Maximum Ratings , in Recommended Operating Conditions , and in DMD  
Power Supply Sequencing Requirements .  
During power-up, LVCMOS input pins shall not be driven high until after VCC and VCCI have settled at  
operating voltages listed in Recommended Operating Conditions .  
9.3 DMD Power Supply Power-Down Procedure  
During power-down, VCC and VCCI must be supplied until after VBIAS, VRESET, and VOFFSET are  
discharged to within the specified limit of ground. Refer to Table 4.  
During power-down, it is a strict requirement that the delta between VBIAS and VOFFSET must be within the  
specified limit shown in Recommended Operating Conditions . During power-down, it is not mandatory to stop  
driving VBIAS prior to VOFFSET.  
During power-down, there is no requirement for the relative timing of VRESET with respect to VOFFSET and  
VBIAS.  
Power supply slew rates during power-down are flexible, provided that the transient voltage levels follow the  
requirements listed in Absolute Maximum Ratings , in Recommended Operating Conditions , and in  
Figure 17.  
During power-down, LVCMOS input pins must be less than specified in Recommended Operating  
Conditions .  
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DMD Power Supply Power-Down Procedure (continued)  
EN_BIAS, EN_OFFSET, and EN_RESET are disabled by  
DLP Controller software or PWRDNZ signal control  
Note 5  
Note 3  
Waveforms Not To Scale.  
Details Omitted For Clarity.  
Refer to Recommended Operating Conditions.  
VBIAS, VOFFSET, and VRESET are disabled by  
DLP Controller software  
Power Off  
Mirror Park Sequence  
VCC / VCCI  
VSS  
VSS  
VSS  
VSS  
VSS  
RESET_OEZ  
VCC / VCCI  
VSS  
PWRDNZ  
VCC,  
VCC / VCCI  
VCC / VCCI  
VSS  
VCCI  
EN_BIAS,  
EN_OFFSET,  
EN_RESET  
Note 3  
VSS  
VBIAS  
VBIAS  
VBIAS  
VBIAS < Specification  
Note 4  
Note 1  
ûV < Specification  
Note 1  
VSS  
VSS  
ûV < Specification  
VOFFSET  
VOFFSET  
VOFFSET < Specification  
Note 4  
VOFFSET  
VSS  
VSS  
VSS  
VSS  
VRESET < Specification  
Note 4  
VRESET > Specification  
VRESET  
VRESET  
VCC  
VRESET  
LVCMOS  
Inputs  
VSS  
VSS  
VSS  
VSS  
Waveforms Not To Scale.  
Note 2  
Refer to Recommended Operating Conditions.  
LVDS  
Inputs  
Note 2  
Figure 17. DMD Power Supply Sequencing Requirements  
1. To prevent excess current, the supply voltage delta |VBIAS – VOFFSET| must be less than specified in  
Recommended Operating Conditions . OEMs may find that the most reliable way to ensure this is to power  
VOFFSET prior to VBIAS during power-up and to remove VBIAS prior to VOFFSET during power-down.  
2. LVDS signals are less than the input differential voltage (VID) maximum specified in Recommended  
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DMD Power Supply Power-Down Procedure (continued)  
Operating Conditions . During power-down, LVDS signals are less than the high level input voltage (VIH)  
maximum specified in Recommended Operating Conditions .  
3. When system power is interrupted, the DLP controller (DLPC900) initiates a hardware power-down that  
activates PWRDNZ and disables VBIAS, VRESET and VOFFSET after the micromirror park sequence.  
Software power-down disables VBIAS, VRESET, and VOFFSET after the micromirror park sequence through  
software control. For either case, enable signals EN_BIAS, EN_OFFSET, and EN_RESET are used to  
disable VBIAS, VOFFSET, and VRESET, respectfully.  
4. Refer to Table 4.  
5. Figure not to scale. Details have been omitted for clarity. Refer to Recommended Operating Conditions .  
Table 4. DMD Power-Down Sequence Requirements  
PARAMETER  
VBIAS  
MIN  
MAX  
4.0  
UNIT  
V
V
V
VOFFSET  
VRESET  
Supply voltage level during power–down sequence  
4.0  
–4.0  
0.5  
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10 Layout  
10.1 Layout Guidelines  
The DLP6500FYE along with one DLPC900 controller provides a solution for many applications including  
structured light and video projection. This section provides layout guidelines for the DLP6500FYE.  
10.1.1 General PCB Recommendations  
The PCB shall be designed to IPC2221 and IPC2222, Class 2, Type Z, at level B producibility and built to  
IPC6011 and IPC6012, class 2. The PCB board thickness to be 0.062 inches +/- 10%, using standard FR-4  
material, and applies after all lamination and plating processes, measured from copper to copper.  
Two-ounce copper planes are recommended in the PCB design in order to achieve needed thermal connectivity.  
Refer to Related Documents for the DLPC900 Digital Controller Data Sheet for related information on the DMD  
Interface Considerations.  
High-speed interface waveform quality and timing on the DLPC900 controller (that is, the LVDS DMD interface)  
is dependent on the following factors:  
Total length of the interconnect system  
Spacing between traces  
Characteristic impedance  
Etch losses  
How well matched the lengths are across the interface  
Thus, ensuring positive timing margin requires attention to many factors.  
As an example, DMD interface system timing margin can be calculated as follows:  
Setup Margin = (controller output setup) – (DMD input setup) – (PCB routing mismatch) – (PCB SI  
degradation)  
Hold-time Margin = (controller output hold) – (DMD input hold) – (PCB routing mismatch) – (PCB SI  
degradation)  
The PCB SI degradation is the signal integrity degradation due to PCB affects which includes such things as  
simultaneously switching output (SSO) noise, crosstalk, and inter-symbol-interference (ISI) noise.  
DLPC900 I/O timing parameters can be found in DLPC900 Digital Controller Data Sheet. Similarly, PCB routing  
mismatch can be easily budgeted and met via controlled PCB routing. However, PCB SI degradation is not as  
easy to determine.  
In an attempt to minimize the signal integrity analysis that would otherwise be required, the following PCB design  
guidelines provide a reference of an interconnect system that satisfies both waveform quality and timing  
requirements (accounting for both PCB routing mismatch and PCB SI degradation). Deviation from these  
recommendations may work, but should be confirmed with PCB signal integrity analysis or lab measurements.  
10.2 Layout Example  
10.2.1 Board Stack and Impedance Requirements  
Refer to Figure 18 for guidance on the parameters.  
PCB design:  
Configuration:  
Asymmetric dual stripline  
1.0-oz copper (1.2 mil)  
0.5-oz copper (0.6 mil)  
50 Ω (±10%)  
Etch thickness (T):  
Flex etch thickness (T):  
Single-ended signal impedance:  
Differential signal impedance:  
100 Ω (±10%)  
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Layout Example (continued)  
PCB stack-up:  
Reference plane 1 is assumed to be a ground plane for proper return path.  
Reference plane 2 is assumed to be the I/O power plane or ground.  
Dielectric FR4, (Er):  
4.2 (nominal)  
Signal trace distance to reference plane 1  
(H1):  
5.0 mil (nominal)  
Signal trace distance to reference plane 2  
(H2):  
34.2 mil (nominal)  
Figure 18. PCB Stack Geometries  
Table 5. General PCB Routing (Applies to All Corresponding PCB Signals)  
PARAMETER  
APPLICATION  
SINGLE-ENDED SIGNALS  
DIFFERENTIAL PAIRS  
UNIT  
4
(0.1)  
4
(0.1)  
mil  
(mm)  
Escape routing in ball field  
7
4.25  
(0.11)  
mil  
(mm)  
Line width (W)  
PCB etch data or control  
PCB etch clocks  
(0.18)  
7
4.25  
(0.11)  
mil  
(mm)  
(0.18)  
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Layout Example (continued)  
Table 5. General PCB Routing (Applies to All Corresponding PCB Signals) (continued)  
PARAMETER  
APPLICATION  
SINGLE-ENDED SIGNALS  
DIFFERENTIAL PAIRS  
UNIT  
5.75(1)  
–0.15  
5.75(1)  
–0.15  
mil  
(mm)  
PCB etch data or control  
N/A  
Differential signal pair spacing (S)  
mil  
(mm)  
PCB etch clocks  
N/A  
N/A  
N/A  
20  
(0.51)  
mil  
(mm)  
PCB etch data or control  
PCB etch clocks  
Minimum differential pair-to-pair  
spacing (S)  
20  
(0.51)  
mil  
(mm)  
4
(0.1)  
4
(0.1)  
mil  
(mm)  
Escape routing in ball field  
PCB etch data or control  
PCB etch clocks  
10  
(0.25)  
20  
(0.51)  
mil  
(mm)  
Minimum line spacing to other  
signals (S)  
20  
(0.51)  
20  
(0.51)  
mil  
(mm)  
12  
0.3  
mil  
(mm)  
Maximum differential pair P-to-N  
length mismatch  
Total data  
N/A  
N/A  
12  
0.3  
mil  
(mm)  
Total data  
(1) Spacing may vary to maintain differential impedance requirements  
Table 6. DMD Interface Specific Routing  
SIGNAL GROUP LENGTH MATCHING  
INTERFACE  
SIGNAL GROUP  
REFERENCE SIGNAL  
MAX MISMATCH  
UNIT  
± 150  
(± 3.81)  
mil  
(mm)  
SCTRL_AN / SCTRL_AP  
D_AP(15:0)/ D_AN(15:0)  
DMD (LVDS)  
DCKA_P/ DCKA_N  
± 150  
(± 3.81)  
mil  
(mm)  
SCTRL_BN/ SCTRL_BP  
D_BP(15:0)/ D_BN(15:0)  
DMD (LVDS)  
DCKB_P/ DCKB_N  
Number of layer changes:  
Single-ended signals: Minimize  
Differential signals: Individual differential pairs can be routed on different layers but the signals of a given pair  
should not change layers.  
Table 7. DMD Signal Routing Length(1)  
BUS  
MIN  
MAX  
UNIT  
DMD (LVDS)  
50  
375  
mm  
(1) Max signal routing length includes escape routing.  
Stubs: Stubs should be avoided.  
Termination Requirements: DMD interface: None – The DMD receiver is differentially terminated to 100 Ω  
internally.  
Connector (DMD-LVDS interface bus only):  
High-speed connectors that meet the following requirements should be used:  
Differential crosstalk:< 5%  
Differential impedance: 75 to 125 Ω  
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Routing requirements for right-angle connectors: When using right-angle connectors, P-N pairs should be routed  
in the same row to minimize delay mismatch. When using right-angle connectors, propagation delay difference  
for each row should be accounted for on associated PCB etch lengths. Voltage or low frequency signals should  
be routed on the outer layers. Signal trace corners shall be no sharper than 45 degrees. Adjacent signal layers  
shall have the predominant traces routed orthogonal to each other.  
These guidelines will produce a maximum PCB routing mismatch of 4.41 mm (0.174 inch) or approximately 30.4  
ps, assuming 175 ps/inch FR4 propagation delay.  
These PCB routing guidelines will result in approximately 25-ps system setup margin and 25-ps system hold  
margin for the DMD interface after accounting for signal integrity degradation as well as routing mismatch.  
Both the DLPC900 output timing parameters and the DLP6500FYE DMD input timing parameters include timing  
budget to account for their respective internal package routing skew.  
10.2.1.1 Power Planes  
Signal routing is NOT allowed on the power and ground planes. All device pin and via connections to this plane  
shall use a thermal relief with a minimum of four spokes. The power plane shall clear the edge of the PCB by  
0.2”.  
Prior to routing, vias connecting all digital ground layers (GND) should be placed around the edge of the rigid  
PWB regions 0.025” from the board edges with a 0.100” spacing. It is also desirable to have all internal digital  
ground (GND) planes connected together in as many places as possible. If possible, all internal ground planes  
should be connected together with a minimum distance between connections of 0.5”. Extra vias are not required  
if there are sufficient ground vias due to normal ground connections of devices. NOTE: All signal routing and  
signal vias should be inside the perimeter ring of ground vias.  
Power and Ground pins of each component shall be connected to the power and ground planes with one via for  
each pin. Trace lengths for component power and ground pins should be minimized (ideally, less than 0.100”).  
Unused or spare device pins that are connected to power or ground may be connected together with a single via  
to power or ground. Ground plane slots are NOT allowed.  
Route VOFFSET, VBIAS, and VRESET as a wide trace >20mils (wider if space allows) with 20 mils spacing.  
10.2.1.2 LVDS Signals  
The LVDS signals shall be first. Each pair of differential signals must be routed together at a constant separation  
such that constant differential impedance (as in section Board Stack and Impedance Requirements ) is  
maintained throughout the length. Avoid sharp turns and layer switching while keeping lengths to a minimum.  
The distance from one pair of differential signals to another shall be at least 2 times the distance within the pair.  
10.2.1.3 Critical Signals  
The critical signals on the board must be hand routed in the order specified below. In case of length matching  
requirements, the longer signals should be routed in a serpentine fashion, keeping the number of turns to a  
minimum and the turn angles no sharper than 45 degrees. Avoid routing long trace all around the PCB.  
Table 8. Timing Critical Signals  
GROUP  
SIGNAL  
CONSTRAINTS  
ROUTING LAYERS  
1
D_AP(0:15), D_AN(0:15), DCLK_AP,  
DCLK_AN, SCTRL_AN, SCTRL_AP,  
D_BP(0:15), D_BN (0:15), DCLK_BP,  
DCLK_BN, SCTRL_BN, SCTRL_BP  
Refer to Table 5 and Table 6  
Internal signal layers. Avoid layer switching  
when routing these signals.  
2
RESET_ADDR_(0:3),  
RESET_MODE_(0:1),  
RESET_OEZ,  
Internal signal layers. Top and bottom as  
required.  
RESET_SEL_(0:1)  
RESET_STROBE,  
RESET_IRQZ.  
3
4
SCP_CLK, SCP_DO,  
SCP_DI, SCP_DMD_CSZ.  
Any  
Any  
Others  
No matching/length requirement  
Copyright © 2014–2016, Texas Instruments Incorporated  
41  
DLP6500FYE  
ZHCSD23A OCTOBER 2014REVISED FEBRUARY 2016  
www.ti.com.cn  
10.2.1.4 Device Placement  
Unless otherwise specified, all major components should be placed on top layer. Small components such as  
ceramic, non-polarized capacitors, resistors and resistor networks can be placed on bottom layer. All high  
frequency de-coupling capacitors for the ICs shall be placed near the parts. Distribute the capacitors evenly  
around the IC and locate them as close to the device’s power pins as possible (preferably with no vias). In the  
case where an IC has multiple de-coupling capacitors with different values, alternate the values of those that are  
side by side as much as possible and place the smaller value capacitor closer to the device.  
10.2.1.5 Device Orientation  
It is desirable to have all polarized capacitors oriented with their positive terminals in the same direction. If  
polarized capacitors are oriented both horizontally and vertically, then all horizontal capacitors should be oriented  
with the “+” terminal the same direction and likewise for the vertically oriented ones.  
10.2.1.6 Fiducials  
Fiducials for automatic component insertion should be placed on the board according to the following guidelines  
or on recommendation from manufacturer:  
Fiducials for optical auto insertion alignment shall be placed on three corners of both sides of the PWB.  
Fiducials shall also be placed in the center of the land patterns for fine pitch components (lead spacing  
<0.05").  
Fiducials should be 0.050 inch copper with 0.100 inch cutout (antipad).  
42  
版权 © 2014–2016, Texas Instruments Incorporated  
DLP6500FYE  
www.ti.com.cn  
ZHCSD23A OCTOBER 2014REVISED FEBRUARY 2016  
11 器件文档支持  
11.1 器件支持  
11.1.1 器件命名规则  
9. 封装具体信息  
封装类型  
引脚  
连接器  
FYE  
350  
PGA  
DLP6500FYE  
Package Type  
Device Descriptor  
19. 器件型号 说明  
11.1.2 器件标记  
器件标记将包括可读信息和一个二维矩阵码。20 中显示了可读信息。二维矩阵码是一个字母数字字符串,其中  
包含 DMD 部件号、序列号的第 1 部分和序列号的第 2 部分。DMD 序列号(第 1 部分)的首字符为制造年份。  
DMD 序列号(第 1 部分)的第二个字符为制造月份。DMD 序列号(第 2 部分)的最后一个字符为偏置电压二进  
制字母。  
TI Internal Numbering  
2-Dimension Matrix Code  
(Part Number and  
DMD Part Number  
Serial Number)  
DLP6500FYE  
Part 1 of Serial Number  
Part 2 of Serial Number  
(7 characters)  
(7 characters)  
20. DMD 标记  
版权 © 2014–2016, Texas Instruments Incorporated  
43  
 
DLP6500FYE  
ZHCSD23A OCTOBER 2014REVISED FEBRUARY 2016  
www.ti.com.cn  
11.2 文档支持  
11.2.1 相关文档  
以下文档包含关于使用 DLP6500 器件的更多信息。  
10. 相关文档  
文档  
DLPC900 数字控制器数据表  
DLPC900 软件编程人员指南  
DMD 101:数字微镜器件 (DMD) 技术简介.  
DLPS037  
DLPU018  
DLPA008  
11.3 社区资源  
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective  
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of  
Use.  
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration  
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help  
solve problems with fellow engineers.  
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and  
contact information for technical support.  
11.4 商标  
DLP, E2E are trademarks of Texas Instruments.  
All other trademarks are the property of their respective owners.  
11.5 静电放电警告  
这些装置包含有限的内置 ESD 保护。 存储或装卸时,应将导线一起截短或将装置放置于导电泡棉中,以防止 MOS 门极遭受静电损  
伤。  
11.6 Glossary  
SLYZ022 TI Glossary.  
This glossary lists and explains terms, acronyms, and definitions.  
12 机械、封装和可订购信息  
以下页中包括机械封装和可订购信息。这些信息是针对指定器件可提供的最新数据。这些数据会在无通知且不对本  
文档进行修订的情况下发生改变。欲获得该数据表的浏览器版本,请查阅左侧的导航栏。  
44  
版权 © 2014–2016, Texas Instruments Incorporated  
PACKAGE OPTION ADDENDUM  
www.ti.com  
20-Aug-2021  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
DLP6500BFYE  
ACTIVE  
CPGA  
FYE  
350  
1
RoHS & Green  
NI-PD-AU  
N / A for Pkg Type  
0 to 90  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
5-Jan-2022  
TRAY  
Chamfer on Tray corner indicates Pin 1 orientation of packed units.  
*All dimensions are nominal  
Device  
Package Package Pins SPQ Unit array  
Max  
matrix temperature  
(°C)  
L (mm)  
W
K0  
P1  
CL  
CW  
Name  
Type  
(mm) (µm) (mm) (mm) (mm)  
DLP6500BFYE  
FYE  
CPGA  
350  
1
3 x 7  
150  
315 135.9 12190 43.9  
25.8 26.85  
Pack Materials-Page 1  
重要声明和免责声明  
TI“按原样提供技术和可靠性数据(包括数据表)、设计资源(包括参考设计)、应用或其他设计建议、网络工具、安全信息和其他资源,  
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保。  
这些资源可供使用 TI 产品进行设计的熟练开发人员使用。您将自行承担以下全部责任:(1) 针对您的应用选择合适的 TI 产品,(2) 设计、验  
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Copyright © 2022,德州仪器 (TI) 公司  

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