DLP7000BFLP [TI]
DLP® 0.7 XGA 2xLVDS A 型 DMD | FLP | 203 | 10 to 65;型号: | DLP7000BFLP |
厂家: | TEXAS INSTRUMENTS |
描述: | DLP® 0.7 XGA 2xLVDS A 型 DMD | FLP | 203 | 10 to 65 |
文件: | 总54页 (文件大小:1725K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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DLP7000
ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
DLP7000 DLP®0.7 XGA 2x LVDS A 型 DMD
1 特性
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–
3D 生物识别
共焦显微镜
1
•
•
•
0.7 英寸对角线微镜阵列
•
显示
–
–
–
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1024 × 768 铝制微米级微镜阵列
13.68µm 微镜间距
–
–
–
3D 成像显微镜
自适应照明
±12° 微镜倾斜角(相对于平面)
设计用于角落照明
增强现实和信息覆盖
用于可见光(400nm 至 700nm):
3 说明
–
–
–
–
窗透射率为 97%(单通,两个窗面)
微镜反射率为 88%
DLP7000 XGA 芯片组是 DLP® Discovery™4100 平台
的一部分,用于实现高分辨率、高性能的空间照明调
制。0.7 XGA 芯片组的基础是一款数字微镜器件
(DMD) DLP7000,这款器件是目前 DLP 系列产品组合
中模式速率最快的一款。DLP Discovery 4100 平台还
提供带有随机行寻址的最高级独立微镜控制。除了采用
密封封装外,DLP7000 具有独特的功能和价值,非常
适合支持各种工业、医疗和高级显示 应用。
阵列衍射效率为 86%
阵列填充系数为 92%
两条 16 位低电压差分信令 (LVDS) 双倍数据速率
(DDR) 输入数据总线
•
•
•
输入数据时钟速率高达 400MHz
40.64mm × 31.75mm × 6.0mm 封装
密封封装
除了 DLP7000 DMD 外,0.7XGA 芯片组还包括以下
组件:
2 应用
•
工业
•
•
•
DLPC410 控制器,专用于 32000Hz(1 位二进
制)和 4000Hz(8 位灰度)以上的高速图形速率
一个 DLPR410(DLP Discovery 4100 配置
PROM)
–
–
–
–
–
–
–
数字成像印刷
激光打标
LCD 和 OLED 修复
计算机直接制版打印机
SLA 3D 打印机
一个 DLPA200(DMD 微镜驱动器)
器件信息(1)
器件型号
DLP7000
封装
封装尺寸(标称值)
适用于机器视觉和工厂自动化的 3D 扫描仪
平板印刷
将 FLP (203)
40.64mm × 31.75mm
(1) 如需了解所有可用封装,请参阅数据表末尾的可订购产品附
录。
•
医疗
–
–
–
–
光照治疗设备
眼科
直接制造
高光谱成像
简化应用
1
本文档旨在为方便起见,提供有关 TI 产品中文版本的信息,以确认产品的概要。 有关适用的官方英文版本的最新信息,请访问 www.ti.com,其内容始终优先。 TI 不保证翻译的准确
性和有效性。 在实际设计之前,请务必参考最新版本的英文版本。
English Data Sheet: DLPS026
DLP7000
ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
www.ti.com.cn
目录
8.2 Functional Block Diagram ....................................... 23
8.3 Feature Description................................................. 25
8.4 Device Functional Modes........................................ 32
1
2
3
4
5
6
7
特性.......................................................................... 1
应用.......................................................................... 1
说明.......................................................................... 1
修订历史记录 ........................................................... 2
说明 (续).............................................................. 5
Pin Configuration and Functions......................... 5
Specifications....................................................... 12
7.1 Absolute Maximum Ratings .................................... 12
7.2 Storage Conditions.................................................. 12
7.3 ESD Ratings............................................................ 12
7.4 Recommended Operating Conditions..................... 13
7.5 Thermal Information................................................ 14
7.6 Electrical Characteristics......................................... 15
7.7 LVDS Timing Requirements ................................... 16
7.8 LVDS Waveform Requirements.............................. 16
7.9 Serial Control Bus Timing Requirements................ 16
7.10 Systems Mounting Interface Loads....................... 19
7.11 Micromirror Array Physical Characteristics........... 20
7.12 Micromirror Array Optical Characteristics ............. 21
7.13 Window Characteristics......................................... 22
7.14 Chipset Component Usage Specification ............. 22
Detailed Description ............................................ 23
8.1 Overview ................................................................. 23
8.5 Optical Interface and System Image Quality
Considerations ........................................................ 34
8.6 Micromirror Array Temperature Calculation............ 35
8.7 Micromirror Landed-On/Landed-Off Duty Cycle ..... 37
Application and Implementation ........................ 40
9.1 Application Information............................................ 40
9.2 Typical Application .................................................. 41
9
10 Power Supply Recommendations ..................... 44
10.1 DMD Power-Up and Power-Down Procedures..... 44
11 Layout................................................................... 44
11.1 Layout Guidelines ................................................. 44
11.2 Layout Example .................................................... 45
12 器件和文档支持 ..................................................... 47
12.1 器件支持................................................................ 47
12.2 文档支持................................................................ 47
12.3 相关链接................................................................ 48
12.4 商标....................................................................... 48
12.5 静电放电警告......................................................... 48
12.6 Glossary................................................................ 48
13 机械、封装和可订购信息....................................... 48
8
4 修订历史记录
注:之前版本的页码可能与当前版本有所不同。
Changes from Revision E (May 2017) to Revision F
Page
•
•
•
•
•
•
•
•
已删除 “宽带” .......................................................................................................................................................................... 1
已更改 更改了高速图形速率的数值......................................................................................................................................... 1
已更改 封装类型更改为 FLP (203).......................................................................................................................................... 1
Changed package type to FLP; deleted reference to LCCC ................................................................................................. 5
Changed FLP package figure "bottom view".......................................................................................................................... 5
Changed "Case temperature" to "Array temperature" ......................................................................................................... 12
Changed "Case temperature" to "Array temperature" ......................................................................................................... 12
Changed "Device temperature gradient - operational" to "Absolute temperature delta between the window test
points (TP2, TP3) and the ceramic test point TP1" ............................................................................................................. 12
•
•
Deleted "RH" after "%" ........................................................................................................................................................ 12
Changed "Applicable before the DMD is installed in the final product" to "Applicable for the DMD as a component or
non-operating system".......................................................................................................................................................... 12
•
•
Changed ", non-condensing" to "(non-condensing)" ........................................................................................................... 12
Changed "JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control
process." to "JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD
control process. Manufacturing with less than 500-V HBM is possible if necessary precautions are taken." .................... 12
•
•
•
•
•
•
Changed Table "Recommended Operating Conditions" ...................................................................................................... 13
Added "RH" under "Environmental" ..................................................................................................................................... 13
Added cross reference to table note at row "ILLVIS" ............................................................................................................ 13
Changed Array temperature, Long-term operational MAX from "30" to "40" ....................................................................... 13
Changed package type to FLP in table "THERMAL METRIC" ............................................................................................ 14
Added "or the combined loads of the thermal and electrical areas reduced" ...................................................................... 19
2
版权 © 2012–2019, Texas Instruments Incorporated
DLP7000
www.ti.com.cn
ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
修订历史记录 (接下页)
•
•
•
•
•
•
•
Deleted row "Window artifact size" in table "Window Characteristics"................................................................................. 22
Changed mirror pitch to 13.68 μm........................................................................................................................................ 25
Changed figure "DLPC410 Data Flow" to correct signals of LVDS BUS B out.................................................................... 27
Changed "Window Characteristics and Optics" to "Optical Interface and System Image Quality Considerations" ............ 34
Changed "a Thermal Test Point locations 1 and 2" to "thermal test points TP1, TP2, and TP3" ........................................ 35
Added "(typically used for display applications)" to "Micromirror Array Temperature Calculation - Lumens based" .......... 36
Deleted Subsection "Fiducials" ............................................................................................................................................ 44
Changes from Revision D (November 2015) to Revision E
Page
•
•
•
•
Clarified TGRADIENT footnote................................................................................................................................................... 12
Changed TC2 to TP1 to follow latest thermal test point nomenclature convention in Thermal Information ........................ 14
Changed Micromirror active border from 10 to correct value of 6 ....................................................................................... 20
Changed micromirror crossover to mean transition time and renamed previous crossover to micromirror switching
time typical micromirror crossover time typo (16 µs to 13 µs).............................................................................................. 21
•
•
•
•
•
•
•
•
•
•
Added typical micromirror switching time - 13 µs................................................................................................................. 21
Changed "Micromirror switching time" to "Array switching time" for clarity ......................................................................... 21
Added clarification to Micromirror switching time at 400 MHz with global reset ................................................................. 21
Changed references to D4100 Discovery to DPC410 ......................................................................................................... 23
Changed Thermal Test Point Location drawing to current numbering convention ............................................................. 35
Changed Micromirror Array Temperature Calculations to indicate that it is based on lumens ............................................ 36
Added Micromirror Array Temperature Calculation based on power ................................................................................... 37
更新了图 22 .......................................................................................................................................................................... 47
删除了 DLP Discovery 4100 芯片组数据表的链接................................................................................................................ 47
已添加 “将 DLPR410 添加到了“相关链接”表......................................................................................................................... 48
Changes from Revision C (April 2014) to Revision D
Page
•
•
更新了器件命名规则的 图 21 和图........................................................................................................................................ 47
更新了器件标记的 图 22 和图............................................................................................................................................... 47
Changes from Revision B (June 2013) to Revision C
Page
•
已添加 添加了引脚配置和功能 部分、ESD 额定值 表、特性 说明 部分、器件功能模式、应用和实施 部分、电源相关
建议 部分、布局 部分、器件和文档支持 部分以及机械、封装和可订购信息 部分 ................................................................. 1
已删除 芯片组列表中的 /DLPR4101 增强型 PROM ............................................................................................................... 1
Corrected VCC2 max to 8 V ................................................................................................................................................ 12
Added array temperature vs duty cycle graph...................................................................................................................... 14
Replaced serial communications bus timing parameters ..................................................................................................... 18
Converted interface loads to Newtons.................................................................................................................................. 19
Grayed out LVDS buses that are unused on DLP7000 ....................................................................................................... 27
Added micromirror landed duty cycle section....................................................................................................................... 37
Changed to DLP7000 ........................................................................................................................................................... 42
已删除 从相关文档中删除了 / DLPR4101 增强型 PROM ..................................................................................................... 47
•
•
•
•
•
•
•
•
•
版权 © 2012–2019, Texas Instruments Incorporated
3
DLP7000
ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
www.ti.com.cn
Changes from Revision A (September 2012) to Revision B
Page
•
•
•
•
•
•
已添加 /DLPR4101 增强型 PROM 至芯片组列表中的 DLPR410 部分................................................................................... 1
Changed pin number of DCLK_AN From: D19 To: B22 ....................................................................................................... 9
Changed pin number of DCLK_AP From: E19 To: B24 ........................................................................................................ 9
Changed pin number of DCLK_BN From: M19 To: AB22 ..................................................................................................... 9
Changed pin number of DCLK_BP From: N19 To: AB24 ..................................................................................................... 9
已添加 将 / DLPR4101 增强型 PROM 添加至相关文档中的 DLPR410 部分 ....................................................................... 47
Changes from Original (August 2012) to Revision A
Page
•
将器件状态从“产品预览”更改成了“生产” ................................................................................................................................. 1
4
版权 © 2012–2019, Texas Instruments Incorporated
DLP7000
www.ti.com.cn
ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
5 说明 (续)
DLP7000 需要与芯片组的其他元件结合使用才能实现可靠功能和操作。一套专用的芯片组能够使开发人员更加轻
松地访问 DMD 并使用高速而独立的微镜控制。
DLP7000 是一款数控微光机电系统 (MEMS) 空间照明调制器 (SLM)。当与适当的光系统成对使用时,DLP7000 能
够可用于调制进入光的振幅、方向和/或相位。
电子方面,DLP7000 由 1 位 CMOS 内存单元的两维阵列组成,其组织结构为 1024 内存单元列乘以 768 内存单元
行的栅格。CMOS 存储器阵列通过两条 16 位低压差分信令 (LVDS) 双倍数据速率 (DDR) 总线逐行进行寻址。寻址
由一个串行控制总线处理。特定的 CMOS 存储器访问协议由 DLPC410 数字控制器处理。
6 Pin Configuration and Functions
FLP Package
203-Pin CLGA
Bottom View
15
9
29 27 25 23 21 19 17
13 11
7
5
3
1
30 26 24 22 20 18 16 14 12 10
8
2
28
6
4
A
C
E
B
D
F
G
J
H
K
M
P
T
L
N
R
U
W
AA
V
Y
AB
AC
Copyright © 2012–2019, Texas Instruments Incorporated
5
DLP7000
ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
www.ti.com.cn
TRACE
Pin Functions
PIN(1)
TYPE
DATA
INTERNAL
TERM(3)
SIGNAL
CLOCK
DESCRIPTION
(I/O/P)
RATE(2)
NAME
NO.
DATA INPUT
Differential
Terminated -
100 Ω
D_AN(0)
D_AN(1)
D_AN(2)
D_AN(3)
D_AN(4)
D_AN(5)
D_AN(6)
D_AN(7)
D_AN(8)
D_AN(9)
D_AN(10)
D_AN(11)
D_AN(12)
D_AN(13)
D_AN(14)
D_AN(15)
D_AP(0)
D_AP(1)
B10
A13
D16
C17
B18
A17
A25
D22
C29
D28
E27
F26
G29
H28
J27
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
368.72
424.61
433.87
391.39
438.57
391.13
563.26
411.62
595.11
543.07
455.98
359.5
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Input data bus A
(2x LVDS)
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
542.67
551.51
528.04
484.38
366.99
417.47
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
K26
B12
A11
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
(1) The following power supplies are required to operate the DMD: VCC, VCC1, VCC2. VSS must also be connected.
(2) DDR = Double Data Rate. SDR = Single Data Rate. Refer to the LVDS Timing Requirements for specifications and relationships.
(3) Refer to Electrical Characteristics for differential termination specification.
6
Copyright © 2012–2019, Texas Instruments Incorporated
DLP7000
www.ti.com.cn
ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
Pin Functions (continued)
PIN(1)
TYPE
(I/O/P)
DATA
INTERNAL
TERM(3)
SIGNAL
CLOCK
DESCRIPTION
TRACE
RATE(2)
NAME
NO.
Differential
Terminated -
100 Ω
D_AP(2)
D14
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
LVCMOS
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DCLK_A
434.89
Differential
Terminated -
100 Ω
D_AP(3)
D_AP(4)
D_AP(5)
D_AP(6)
D_AP(7)
D_AP(8)
D_AP(9)
D_AP(10)
D_AP(11)
D_AP(12)
D_AP(13)
D_AP(14)
D_AP(15)
D_BN(0)
D_BN(1)
D_BN(2)
D_BN(3)
D_BN(4)
C15
B16
A19
A23
D20
A29
B28
C27
D26
F30
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
394.67
437.3
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
389.01
562.92
410.34
594.61
539.88
456.78
360.68
543.97
570.85
527.18
481.02
368.72
424.61
433.87
391.39
438.57
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Input data bus A -
continued (2x
LVDS)
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
H30
J29
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
K28
AB10
AC13
Y16
AA17
AB18
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Input data bus B
(2x LVDS)
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Copyright © 2012–2019, Texas Instruments Incorporated
7
DLP7000
ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
www.ti.com.cn
Pin Functions (continued)
PIN(1)
TYPE
DATA
INTERNAL
TERM(3)
SIGNAL
CLOCK
DESCRIPTION
TRACE
(I/O/P)
RATE(2)
NAME
NO.
Differential
Terminated -
100 Ω
D_BN(5)
AC17
Input
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DCLK_B
391.13
Differential
Terminated -
100 Ω
D_BN(6)
D_BN(7)
D_BN(8)
D_BN(9)
D_BN(10)
D_BN(11)
D_BN(12)
D_BN(13)
D_BN(14)
D_BN(15)
D_BP(0)
D_BP(1)
D_BP(2)
D_BP(3)
D_BP(4)
D_BP(5)
D_BP(6)
D_BP(7)
AC25
Y22
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
563.26
411.62
595.11
543.07
455.98
360.94
575.85
519.37
532.59
441.14
366.99
417.47
434.89
394.67
437.3
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
AA29
Y28
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
W27
V26
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
T30
Differential
Terminated -
100 Ω
R29
Differential
Terminated -
100 Ω
Input data bus B -
continued (2x
LVDS)
R27
Differential
Terminated -
100 Ω
N27
Differential
Terminated -
100 Ω
AB12
AC11
Y14
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
AA15
AB16
AC19
AC23
Y20
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
389.01
562.92
410.34
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
8
Copyright © 2012–2019, Texas Instruments Incorporated
DLP7000
www.ti.com.cn
ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
Pin Functions (continued)
PIN(1)
TYPE
(I/O/P)
DATA
INTERNAL
TERM(3)
SIGNAL
CLOCK
DESCRIPTION
TRACE
RATE(2)
NAME
NO.
Differential
Terminated -
100 Ω
D_BP(8)
AC29
Input
Input
Input
Input
Input
Input
Input
Input
LVCMOS
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DCLK_B
594.61
Differential
Terminated -
100 Ω
D_BP(9)
AB28
AA27
Y26
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
539.88
456.78
360.68
578.46
509.74
534.59
440
Differential
Terminated -
100 Ω
D_BP(10)
D_BP(11)
D_BP(12)
D_BP(13)
D_BP(14)
Differential
Terminated -
100 Ω
Input data bus B -
continued (2x
LVDS)
Differential
Terminated -
100 Ω
U29
T28
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
P28
Differential
Terminated -
100 Ω
D_BP(15)
P26
DATA CLOCK
DCLK_AN
Differential
Terminated -
100 Ω
B22
B24
Input
Input
Input
Input
LVCMOS
LVCMOS
LVCMOS
LVCMOS
–
–
–
–
–
–
–
–
477.1
477.14
477.07
477.14
DCLK for data
bus A (2x LVDS)
Differential
Terminated -
100 Ω
DCLK_AP
DCLK_BN
DCLK_BP
Differential
Terminated -
100 Ω
AB22
AB24
DCLK for data
bus B (2x LVDS)
Differential
Terminated -
100 Ω
DATA CONTROL INPUTS
Differential
Terminated -
100 Ω
SCTRL_AN
SCTRL_AP
SCTRL_BN
SCTRL_BP
C21
C23
Input
Input
Input
Input
LVCMOS
LVCMOS
LVCMOS
LVCMOS
DDR
DDR
DDR
DDR
DCLK_A
DCLK_A
DCLK_B
DCLK_B
477.07
477.14
477.07
477.14
Serial control for
data bus A (2x
LVDS)
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
AA21
AA23
Serial control for
data bus B (2x
LVDS)
Differential
Terminated -
100 Ω
SERIAL COMMUNICATION AND CONFIGURATION
SCPCLK
SCPDO
SCPDI
E3
B2
F4
D4
C3
Input
Output
Input
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
–
–
–
–
–
Pull-down
–
–
Serial port clock
Serial port output
Serial port input
Serial port enable
Device Reset
379.29
480.91
323.56
326.99
406.28
SCPCLK
SCPCLK
SCPCLK
–
Pull-down
Pull-down
Pull-down
SCPENZ
PWRDNZ
Input
Input
Copyright © 2012–2019, Texas Instruments Incorporated
9
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ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
www.ti.com.cn
TRACE
Pin Functions (continued)
PIN(1)
TYPE
DATA
INTERNAL
TERM(3)
SIGNAL
CLOCK
DESCRIPTION
(I/O/P)
RATE(2)
NAME
NO.
Data bandwidth
mode select A
MODE_A
D8
Input
LVCMOS
LVCMOS
–
–
Pull-down
Pull-down
–
–
396.05
208.86
Data bandwidth
mode select B
MODE_B
C11
Input
MICROMIRROR BIAS CLOCKING PULSE
MBRST(0)
MBRST(1)
MBRST(2)
MBRST(3)
MBRST(4)
MBRST(5)
MBRST(6)
MBRST(7)
MBRST(8)
MBRST(9)
MBRST(10)
MBRST(11)
MBRST(12)
MBRST(13)
MBRST(14)
MBRST(15)
POWER
P2
AB4
AA7
N3
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Analog
Analog
Analog
Analog
Analog
Analog
Analog
Analog
Analog
Analog
Analog
Analog
Analog
Analog
Analog
Analog
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
M4
AB6
AA5
L3
Micromirror Bias
Clocking Pulse
"MBRST" signals
"clock"
micromirrors into
state of LVCMOS
memory cell
Y6
K4
associated with
each mirror.
L5
AC5
Y8
J5
K6
AC7
A7, A15,
C1, E1, U1,
W1, AB2,
Power for
LVCMOS Logic
VCC
Power
Analog
–
–
–
–
AC9, AC15
A21, A27,
D30, M30,
Y30, AC21,
AC27
Power supply for
LVDS Interface
VCC1
Power
Power
Analog
Analog
–
–
–
–
–
–
–
–
Power for High
Voltage CMOS
Logic
G1, J1, L1,
N1, R1
VCC2
10
Copyright © 2012–2019, Texas Instruments Incorporated
DLP7000
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ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
Pin Functions (continued)
PIN(1)
TYPE
(I/O/P)
DATA
INTERNAL
TERM(3)
SIGNAL
CLOCK
DESCRIPTION
TRACE
RATE(2)
NAME
NO.
A1, A3, A5,
A9, B4, B8,
B14, B20,
B26, B30,
C7, C13,
C19, C25,
D6, D12,
D18, D24,
E29, F2,
F28, G3,
G27, H2,
H4, H26, J3,
J25, K2,
K30, L25,
L27, L29,
M2, M6,
M26, M28,
N5, N25,
N29, P4,
P30, R3,
R5, R25,
T2, T26,
Common return
for all power
inputs
VSS
Power
Analog
–
–
–
–
U27, V28,
V30, W5,
W29, Y4,
Y12, Y18,
Y24, AA3,
AA9, AA13,
AA19,
AA25, AB8,
AB14,
AB20,
AB26, AB30
RESERVED SIGNALS (NOT FOR USE IN SYSTEM)
RESERVED
_AA1
Pins should be
connected to VSS
AA1
B6
Input
Input
Input
Input
LVCMOS
LVCMOS
LVCMOS
LVCMOS
–
–
–
–
Pull-down
Pull-down
Pull-down
Pull-down
–
–
–
–
–
–
–
–
RESERVED
_B6
–
–
–
RESERVED
_T4
T4
RESERVED
_U5
U5
AA11, AC3,
C5, C9,
D10, D2,
NO_CONN
ECT
E5, G5, H6,
P6, T6, U3,
V2, V4, W3,
Y10, Y2
–
–
–
–
–
Do not connect
–
Copyright © 2012–2019, Texas Instruments Incorporated
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www.ti.com.cn
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN
MAX
UNIT
ELECTRICAL
(2) (3)
VCC
Voltage applied to VCC
Voltage applied to VCCI
–0.5
–0.5
–0.5
4
4
8
V
V
V
(2) (3)
VCCI
VCC2
(2) (3) (4)
Voltage applied to VVCC2
Micromirror Clocking Pulse Waveform Voltage applied to MBRST[15:0]
Input Pins (supplied by DLPA200)
VMBRST
–28
28
V
(4)
|VCC – VCCI
|
Supply voltage delta (absolute value)
0.3
V
V
Voltage applied to all other input pins(2)
–0.5
VCC + 0.3
Maximum differential voltage, damage can occur to internal termination
resistor if exceeded, see Figure 3
|VID
IOH
IOL
|
700
–20
15
mV
mA
mA
Current required from a high-level
VOH = 2.4 V
VOL = 0.4 V
output
Current required from a low-level
output
ENVIRONMENTAL
Array temperature: operational(5)
Array temperature: non-operational(5)
10
65
80
°C
°C
TARRAY
–40
Absolute temperature delta between the window test points (TP2, TP3)
and the ceramic test point TP1(6)
TDELTA
RH
10
95
°C
%
Operating relative humidity (non-condensing)
0
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages referenced to VSS (ground).
(3) VOFFSET supply transients must fall within specified max voltages.
(4) To prevent excess current, the supply voltage delta |VCC – VCCI| must be less than specified limit.
(5) DMD Temperature is the worst-case of any test point shown in Figure 18, or the active array as calculated by the Micromirror Array
Temperature Calculation.
(6) As either measured, predicted, or both between any two points -- measured on the exterior of the package, or as predicted at any point
inside the micromirror array cavity. Refer to Thermal Information and Micromirror Array Temperature Calculation.
7.2 Storage Conditions
Applicable for the DMD as a component or non-operating in a system
MIN
MAX
80
UNIT
°C
Storage temperature
–40
Tstg
Storage humidity (non-condensing)
95
%
7.3 ESD Ratings
VALUE
UNIT
All pins except MBRST[15:0]
Pins MBRST[15:0]
±2000
±250
Electrostatic
V(ESD)
Human-body model (HBM), per
ANSI/ESDA/JEDEC JS-001(1)
V
discharge
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Manufacturing with
less than 500-V HBM is possible if necessary precautions are taken.
12
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ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
7.4 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)(1)
MIN
NOM
MAX
UNIT
(2) (3)
ELECTRICAL
VCC
Supply voltage for LVCMOS core logic
Supply voltage for LVDS receivers
3.0
3.0
3.3
3.3
7.5
3.6
3.6
V
V
V
VCC1
VCC2
Mirror electrode and HVCMOS supply voltage
7.25
7.75
Clocking Pulse Waveform Voltage applied to MBRST[29:0] Input Pins (supplied by
DLPA200s)
VMBRST
-27
26.5
0.3
V
V
(4)
|VCCI–VCC|
Supply voltage delta (absolute value)
ENVIRONMENTAL
RH
Operating relative humidity (non-condensing)
95
%
ENVIRONMENTAL (5) For Illumination Source Between 420 nm and 700 nm
(6)(7) (8)(9)
(10)
Array temperature, Long–term operational
10
0
25-45
65
TARRAY
°C
(6)(7) (11)
Array temperature, Short–term operational
10
65
TWINDOW
|TDELTA
ILLVIS
Window Temperature test points TP2 and TP3, Long-term operational(9)
10
°C
°C
Absolute Temperature delta between the window test points (TP2, TP3) and the
ceramic test point TP1.(12)
|
10
Thermally
limited
Illumination(13)
W/cm2
ENVIRONMENTAL (5) For Illumination Source Between 400 nm and 420 nm
(6)(7) (8)(9)
TARRAY
Array temperature, Long–term operational
20
30
30
°C
°C
TWINDOW
Window Temperature test points TP2 and TP3, Long-term operational(9)
Absolute Temperature delta between the window test points (TP2, TP3) and the
ceramic test point TP1.(12)
|TDELTA
|
10
°C
W/cm2
W
11
ILL
Illumination(13)
16.2
ENVIRONMENTAL (5) For Illumination Source <400 nm and >700 nm
(6)(7) (8)(9)
(10)
Array temperature, Long–term operational
20
0
40
TARRAY
°C
(6)(7) (11)
Array temperature, Short–term operational
20
65
10
TWINDOW
ILL
Window Temperature test points TP2 and TP3, Long-term operational(9)
Illumination(13)
10
°C
mW/cm2
(1) The functional performance of the device specified in this data sheet is achieved when operating the device within the limits defined by
the Recommended Operating Conditions. No level of performance is implied when operating the device above or below the
Recommended Operating Conditions limits.
(2) Voltages VCC, VCC1, and VCC2 are required for proper DMD operation. VSS must also be connected.
(3) All voltages are referenced to common ground VSS
.
(4) Exceeding the recommended allowable absolute voltage difference between VCC and VCC1 may result in excess current draw. The
difference between VCC and VCC1, |VCC – VCC1|, should be less than the specified limit.
(5) Optimal, long-term performance and optical efficiency of the Digital Micromirror Device (DMD) can be affected by various application
parameters, including illumination spectrum, illumination power density, micromirror landed duty-cycle, ambient temperature (storage
and operating), DMD temperature, ambient humidity (storage and operating), and power on or off duty cycle. TI recommends that
application-specific effects be considered as early as possible in the design cycle.
(6) In some applications, the total DMD heat load can be dominated by the amount of incident light energy absorbed. See Micromirror Array
Temperature Calculation for further details.
(7) The array temperature cannot be measured directly and must be computed analytically from the temperature measured at test point 1
(TP1) shown in Figure 18 and the package thermal resistance in Thermal Information using Micromirror Array Temperature Calculation.
(8) Simultaneous exposure of the DMD to the maximum Recommended Operating Conditions for temperature and UV illumination will
reduce device lifetime.
(9) Long-term is defined as the usable life of the device.
(10) Per Figure 1, the maximum operational case temperature should be derated based on the micromirror landed duty cycle that the DMD
experiences in the end application. Refer to Micromirror Landed-On/Landed-Off Duty Cycle for a definition of micromirror landed duty
cycle.
(11) Array temperatures beyond those specified as long-term are recommended for short-term conditions only (power-up). Short-term is
defined as cumulative time over the usable life of the device and is less than 500 hours.
(12) The temperature delta is the highest difference between the ceramic test point (TP1) and window test points (TP2) and (TP3) in
Figure 18.
(13) Total integrated illumination power density, above or below the indicated wavelength threshold or in the indicated wavelength range.
Copyright © 2012–2019, Texas Instruments Incorporated
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www.ti.com.cn
Figure 1. Max Recommended DMD Temperature – Derating Curve
7.5 Thermal Information
DLP7000
FLP (Package)
203 PINS
0.90
THERMAL METRIC
Thermal resistance, active area to TP1(1)
UNIT
°C/W
(1) The DMD is designed to conduct absorbed and dissipated heat to the back of the package where it can be removed by an appropriate
heat sink. The heat sink and cooling system must be capable of maintaining the package within the temperature range specified in the
Recommended Operating Conditions. The total heat load on the DMD is largely driven by the incident light absorbed by the active area;
although other contributions include light energy absorbed by the window aperture and electrical power dissipation of the array. Optical
systems should be designed to minimize the light energy falling outside the window clear aperture since any additional thermal load in
this area can significantly degrade the reliability of the device.
14
Copyright © 2012–2019, Texas Instruments Incorporated
DLP7000
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ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
7.6 Electrical Characteristics
over the range of recommended supply voltage and recommended case operating temperature (unless otherwise noted).
PARAMETERS
High-level output voltage(1)
See Figure 11
TEST CONDITIONS
VCC = 3.0 V, IOH = –20 mA
MIN
NOM
MAX
UNIT
,
VOH
VOL
2.4
V
Low-level output voltage(1)
See Figure 11
,
VCC = 3.6 V, IOH = 15 mA
0.4
V
V
Clocking Pulse Waveform applied to
VMBRST MBRST[29:0] Input Pins (supplied
by DLPA200)
–27
26.5
IOZ
IOH
IOL
High impedance output current(1)
VCC = 3.6 V
10
–20
µA
VOH = 2.4 V, VCC ≥ 3 V
VOH = 1.7 V, VCC ≥ 2.25 V
VOL = 0.4 V, VCC ≥ 3 V
VOL = 0.4 V, VCC ≥ 2.25 V
High-level output current(1)
mA
–15
15
Low-level output current(1)
mA
14
VIH
VIL
IIL
High-level input voltage(1)
Low-level input voltage(1)
Low-level input current(1)
High-level input current(1)
Current into VCC pin
1.7
VCC + .3
0.7
V
V
–0.3
VCC = 3.6 V, VI = 0 V
VCC = 3.6 V, VI = VCC
VCC = 3.6 V
–60
µA
µA
mA
mA
mA
Ω
IIH
200
ICC
ICCI
ICC2
ZIN
1475
450
Current into VCCI pin(2)
VCCI = 3.6 V
Current into VCC2 pin
VCC2 = 8.75 V
25
Internal Differential Impedance
95
90
105
Line Differential Impedance (PWB,
Trace)
ZLINE
100
110
Ω
CI
Input capacitance(1)
Output capacitance(1)
f = 1 MHz
f = 1 MHz
10
10
pF
pF
CO
CIM
Input capacitance for MBRST[29:0]
pins
f = 1 MHz
220
270
pF
(1) Applies to LVCMOS pins only.
(2) Exceeding the maximum allowable absolute voltage difference between VCC and VCCI may result in excess current draw. See the
Absolute Maximum Ratings for details.
Copyright © 2012–2019, Texas Instruments Incorporated
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ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
www.ti.com.cn
7.7 LVDS Timing Requirements
over operating free-air temperature range (unless otherwise noted). See Figure 2
MIN
200
2.5
NOM
MAX
UNIT
MHz
ns
fDCLK_*
DCLK_* clock frequency {where * = [A, or B]}
Clock Cycle - DLCK_*
400
tc
tw
Pulse Width - DLCK_*
1.25
ns
ts
Setup Time - D_*[15:0] and SCTRL_* before DCLK_*
Hold Time, D_*[15:0] and SCTRL_* after DCLK_*
Skew between bus A and B
0.35
0.35
ns
th
ns
tskew
–1.25
1.25
ns
7.8 LVDS Waveform Requirements
over operating free-air temperature range (unless otherwise noted). See Figure 3
MIN
NOM
400
MAX
UNIT
mV
mV
mV
ps
|VID
|
Input Differential Voltage (absolute difference)
Common Mode Voltage
100
600
VCM
1200
VLVDS
LVDS Voltage
0
100
100
2000
400
tr
tr
Rise Time (20% to 80%)
Fall Time (80% to 20%)
400
ps
7.9 Serial Control Bus Timing Requirements
over operating free-air temperature range (unless otherwise noted). See Figure 4 and Figure 5
MIN
NOM
MAX
500
300
960
UNIT
kHz
ns
fSCP_CLK
SCP Clock Frequency
50
tSCP_SKEW
tSCP_DELAY
Time between valid SCP_DI and rising edge of SCP_CLK
Time between valid SCP_DO and rising edge of SCP_CLK
–300
ns
Time between falling edge of SCP_EN and the first rising edge of
SCP_CLK
tSCP_EN
30
ns
t_SCP
tf_SCP
Rise time for SCP signals
Fall time for SCP signals
200
200
ns
ns
16
Copyright © 2012–2019, Texas Instruments Incorporated
DLP7000
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ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
DCLK_AN
DCLK_AP
t
t
h
s
t
c
t
t
s
h
SCTRL_AN
SCTRL_AP
D_AN(15:0)
D_AP(15:0)
DCLK_BN
DCLK_BP
t
t
h
s
t
c
t
t
s
h
SCTRL_BN
SCTRL_BP
D_BN(15:0)
D_BP(15:0)
Figure 2. LVDS Timing Waveforms
VLVDS (v)
VLVDSmax = VCM + |½VID|
VLVDSmax
Tf (20% - 80%)
VLVDS = VCM +/- | 1/2 VID
|
VCM
VID
Tr (20% - 80%)
VLVDS min
VLVDS min = 0
Time
Figure 3. LVDS Waveform Requirements
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ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
www.ti.com.cn
t
f
= 1 / t
clock c
c
SCPCLK
50%
50%
tSCP_SKEW
SCPDI
50%
tSCP_DELAY
SCPD0
50%
Figure 4. Serial Communications Bus Timing Parameters
tf_SCP
tr_SCP
Input Controller VCC
SCP_CLK,
SCP_DI,
SCP_EN
VCC/2
0 v
Figure 5. Serial Communications Bus Waveform Requirements
18
Copyright © 2012–2019, Texas Instruments Incorporated
DLP7000
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ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
7.10 Systems Mounting Interface Loads
MIN
NOM
MAX UNIT
Maximum system mounting interface
load to be applied to the:
Thermal Interface area
Electrical Interface area
Datum “A” Interface area(1)
(See Figure 6)
111
423
400
N
N
N
(1) Combined loads of the thermal and electrical interface areas in excess of Datum “A” load shall be evenly distributed outside the Datum
“A” area (425 + 111 – Datum “A"), or the combined loads of the thermal and electrical areas reduced.
Thermal Interface Area
Electrical Interface Area
(all area except thermal area)
Other Areas
Datum 'A' Areas
Figure 6. System Interface Loads
Copyright © 2012–2019, Texas Instruments Incorporated
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7.11 Micromirror Array Physical Characteristics
PARAMETER
VALUE
1024
768
UNIT
micromirrors
micromirrors
µm
M
N
P
Number of active columns
Number of active rows
Micromirror (pixel) pitch
See Figure 7
13.68
14.008
10.506
6
Micromirror active array width
Micromirror active array height
Micromirror active border
M × P
mm
N × P
mm
Pond of micromirror (POM)(1)
micromirrors/side
(1) The structure and qualities of the border around the active array includes a band of partially functional micromirrors called the POM.
These micromirrors are structurally and/or electrically prevented from tilting toward the bright or ON state, but still require an electrical
bias to tilt toward OFF.
0
1
2
3
DMD Active Array
N x P
M x N Micromirrors
N œ 4
N œ 3
N œ 2
N œ 1
M x P
P
Border micromirrors omitted for clarity.
Details omitted for clarity.
P
Not to scale.
P
P
Refer to Micromirror Array Physical Characteristics table for M, N, and P specifications.
Figure 7. Micromirror Array Physical Characteristics
20
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ZHCSA87F –AUGUST 2012–REVISED JUNE 2019
7.12 Micromirror Array Optical Characteristics
TI assumes no responsibility for end-equipment optical performance. Achieving the desired end-equipment
optical performance involves making trade-offs between numerous component and system design parameters.
PARAMETER
CONDITIONS
MIN
NOM
MAX
UNIT
DMD “parked” state(1) (2) (3), see
Figure 13
DMD “landed” state(1) (4) (5)
see Figure 13
0
a
Micromirror tilt angle
degrees
12
β
Micromirror tilt angle tolerance(1) (4) (6) (7) (8)
Micromirror crossover time(9)
Micromirror switching time(10)
See Figure 13
–1
43
1
degrees
µs
4
13
22
µs
Array switching time at 400 MHz with global
reset(11)
µs
Non-adjacent micromirrors
adjacent micromirrors
10
0
Non-operating micromirrors(12)
micromirrors
degrees
Orientation of the micromirror axis-of-
rotation(13)
See Figure 12
44
45
46
400 nm to 700 nm, with all
micromirrors in the ON state
Micromirror array optical efficiency(14) (15)
68%
(1) Measured relative to the plane formed by the overall micromirror array.
(2) “Parking” the micromirror array returns all of the micromirrors to an essentially flat (0˚) state (as measured relative to the plane formed
by the overall micromirror array).
(3) When the micromirror array is “parked”, the tilt angle of each individual micromirror is uncontrolled.
(4) Additional variation exists between the micromirror array and the package datums, as shown in the 机械、封装和可订购信息.
(5) When the micromirror array is “landed”, the tilt angle of each individual micromirror is dictated by the binary contents of the CMOS
memory cell associated with each individual micromirror. A binary value of “1” will result in a micromirror “landing” in an nominal angular
position of “+12°”. A binary value of 0 results in a micromirror “landing” in an nominal angular position of “–12°”.
(6) Represents the “landed” tilt angle variation relative to the Nominal “landed” tilt angle.
(7) Represents the variation that can occur between any two individual micromirrors, located on the same device or located on different
devices.
(8) For some applications, it is critical to account for the micromirror tilt angle variation in the overall System Optical Design. With some
System Optical Designs, the micromirror tilt angle variation within a device may result in perceivable non-uniformities in the light field
reflected from the micromirror array. With some System Optical Designs, the micromirror tilt angle variation between devices may result
in colorimetry variations and/or system contrast variations.
(9) Micromirror crossover time is primarily a function of the natural response time of the micromirrors and is the time it takes for the
micromirror to crossover to the other state, but does not include mechanical settling time.
(10) Micromirror switching time is the time before a micromirror may be addressed again. Crossover time plus mechanical settling time.
(11) Array switching is controlled and coordinated by the DLPC410 (DLPS024) and DLPA200 (DLPS015). Nominal Switching time depends
on the system implementation and represents the time for the entire micromirror array to be refreshed (array loaded plus reset and
mirror settling time).
(12) Non-operating micromirror is defined as a micromirror that is unable to transition nominally from the –12° position to +12° or vice versa.
(13) Measured relative to the package datums “B” and “C”, shown in 机械、封装和可订购信息.
(14) The minimum or maximum DMD optical efficiency observed depends on numerous application-specific design variables, such as:
–
–
–
–
–
–
Illumination wavelength, bandwidth/line-width, degree of coherence
Illumination angle, plus angle tolerance
Illumination and projection aperture size, and location in the system optical path
IIlumination overfill of the DMD micromirror array
Aberrations present in the illumination source and/or path
Aberrations present in the projection path
The specified nominal DMD optical efficiency is based on the following use conditions:
–
–
–
–
–
Visible illumination (400 nm – 700 nm)
Input illumination optical axis oriented at 24° relative to the window normal
Projection optical axis oriented at 0° relative to the window normal
f/3.0 illumination aperture
f/2.4 projection aperture
Based on these use conditions, the nominal DMD optical efficiency results from the following four components:
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–
–
–
–
Micromirror array fill factor: nominally 92%
Micromirror array diffraction efficiency: nominally 86%
Micromirror surface reflectivity: nominally 88%
Window transmission: nominally 97% (single pass, through two surface transitions)
(15) Does not account for the effect of micromirror switching duty cycle, which is application dependent. Micromirror switching duty cycle
represents the percentage of time that the micromirror is actually reflecting light from the optical illumination path to the optical projection
path. This duty cycle depends on the illumination aperture size, the projection aperture size, and the micromirror array update rate.
7.13 Window Characteristics
PARAMETER(1)
Window material designation
Window refractive index
Window flatness(2)
CONDITIONS
MIN
TYP
MAX UNIT
Corning 7056
at wavelength 589 nm
Per 25 mm
1.487
4
fringes
(3)
Window aperture
See
Illumination overfill
Refer to Illumination Overfill
At wavelength 405 nm. Applies to 0° and 24° AOI only.
95%
97%
Minimum within the wavelength range 420 nm to 680 nm.
Applies to all angles 0° to 30° AOI.
Window transmittance, single–pass
(4)
through both surfaces and glass
Average over the wavelength range 420 nm to 680 nm.
Applies to all angles 30° to 45° AOI.
97%
(1) See Optical Interface and System Image Quality Considerations for more information.
(2) At a wavelength of 632.8 nm.
(3) For details regarding the size and location of the window aperture, see the package mechanical characteristics listed in the Mechanical
ICD in the 机械、封装和可订购信息.
(4) See the TI application report DLPA031, Wavelength Transmittance Considerations for DLP DMD Window.
7.14 Chipset Component Usage Specification
The DLP7000 is a component of one or more DLP chipsets. Reliable function and operation of the DLP7000
requires that it be used in conjunction with the other components of the applicable DLP chipset, including those
components that contain or implement TI DMD control technology. TI DMD control technology is the TI
technology and devices for operating or controlling a DLP DMD.
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8 Detailed Description
8.1 Overview
Optically, the DLP7000 consists of 786,432 highly reflective, digitally switchable, micrometer-sized mirrors
(“micromirrors”), organized in a two-dimensional array of 1024 micromirror columns by 768 micromirror rows
(Figure 12). Each aluminum micromirror is approximately 13.68 microns in size (see the “Micromirror Pitch” in
Figure 12), and is switchable between two discrete angular positions: –12° and +12°. The angular positions are
measured relative to a 0° “flat state”, which is parallel to the array plane (see Figure 13). The tilt direction is
perpendicular to the hinge-axis which is positioned diagonally relative to the overall array. The “On State” landed
position is directed towards “Row 0, Column 0” (upper left) corner of the device package (see the “Micromirror
Hinge-Axis Orientation” in Figure 12). In the field of visual displays, the 1024 by 768 “pixel” resolution is referred
to as "XGA".
Each individual micromirror is positioned over a corresponding CMOS memory cell. The angular position of a
specific micromirror is determined by the binary state (logic 0 or 1) of the corresponding CMOS memory cell
contents, after the micromirror "clocking pulse" is applied. The angular position (–12° or +12°) of the individual
micromirrors changes synchronously with a micromirror “clocking pulse”, rather than being synchronous with the
CMOS memory cell data update. Therefore, writing a logic 1 into a memory cell followed by a micromirror
"clocking pulse" will result in the corresponding micromirror switching to a +12° position. Writing a logic 0 into a
memory cell followed by a micromirror "clocking pulse" will result in the corresponding micromirror switching to a
–12° position.
Updating the angular position of the micromirror array consists of two steps. First, updating the contents of the
CMOS memory. Second, application of a Micromirror Clocking Pulse to all or a portion of the micromirror array
(depending upon the configuration of the system). Micromirror Clocking Pulses are generated externally by a
DLPA200, with application of the pulses being coordinated by the DLPC410 controller.
Around the perimeter of the 1024 by 768 array of micromirrors is a uniform band of “border” micromirrors. The
border micromirrors are not user-addressable. The border micromirrors land in the –12° position once power has
been applied to the device. There are 10 border micromirrors on each side of the 1024 by 768 active array.
Figure 8 shows a DLPC410 and DLP7000 Chipset Block Diagram. The DLPC410 and DLPA200 control and
coordinate the data loading and micromirror switching for reliable DLP7000 operation. The DLPR410 is the
programmed PROM required to properly configure the DLPC410 controller. For more information on the chipset
components, see Application and Implementation. For a typical system application using the DLPC410 chipset
including the DLP7000, see Figure 19.
8.2 Functional Block Diagram
Figure 8 is a simplified system block diagram showing the use of the following components:
● DLPC410
● DLPR410
– Xilinx [XC5VLX30] FPGA configured to provide high-speed DMD data and
control, and DLPA200 timing and control
– [XCF16PFSG48C] serial flash PROM contains startup configuration information
(EEPROM)
● DLPA200
● DLP7000
– DMD micromirror driver for the DLP7000 DMD
– Spatial Light Modulator (DMD)
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Figure 8. DLPC410 and DLP7000 Chipset Block Diagram
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8.3 Feature Description
8.3.1 DLPC410 Chipset DMD Features
Table 1. DLP7000 Overview
DMD
ARRAY
PATTERNS/s
DATA RATE (Gbps)
25.6
MIRROR PITCH
DLP7000 - 0.7”XGA
1024 × 768
32552
13.68 μm
8.3.1.1 DLPC410 - Digital Controller for DLP Discovery 4100 Chipset
The DLP7000 chipset includes the DLPC410 controller which provides a high-speed LVDS data and control
interface for DMD control. This interface is also connected to a second FPGA used to drive applications (not
included in the chipset). The DLPC410 generates DMD and DLPA200 initialization and control signals in
response to the inputs on the control interface.
For more information, see the DLPC410 data sheet DLPS024.
8.3.1.2 DLPA200 - DMD Micromirror Driver
DLPA200 micromirror driver provides the micromirror clocking pulse driver functions for the DMD. One DLPA200
is required for DLP7000.
For more information on the DLPA200, see the DLPA200 data sheet DLPS015.
8.3.1.3 DLPR410 - PROM for DLP Discovery 4100 Chipset
The DLPC410 is configured at startup from the serial flash PROM. The contents of this PROM can not be
altered. For more information, see the DLPR410 data sheet (DLPS027) and the DLPC410 data sheet
(DLPS024).
8.3.1.4 DLP7000 - DLP 0.7 XGA 2xLVDS Type-A DMD
8.3.1.4.1 DLP7000 XGA Chip Set Interfaces
This section will describe the interface between the different components included in the chipset. For more
information on component interfacing, see Application and Implementation.
8.3.1.4.1.1 DLPC410 Interface Description
8.3.1.4.1.1.1 DLPC410 IO
Table 2 describes the inputs and outputs of the DLPC410 to the user. For more details on these signals, see the
DLPC410 data sheet (DLPS024).
Table 2. Input/Output Description
PIN NAME
DESCRIPTION
I/O
ARST
Asynchronous active low reset
Reference clock, 50 MHz
I
I
CLKIN_R
DIN_[A,B,C,D](15:0)
DCLKIN[A,B,C,D]
DVALID[A,B,C,D]
ROWMD(1:0)
ROWAD(10:0)
BLK_AD(3:0)
BLK_MD(1:0)
PWR_FLOAT
DMD_TYPE(3:0)
RST_ACTIVE
INIT_ACTIVE
LVDS DDR input for data bus A,B,C,D (15:0)
LVDS inputs for data clock (200 - 400 MHz) on bus A, B, C, and D
LVDS input used to start write sequence for bus A, B, C, and D
DMD row address and row counter control
DMD row address pointer
I
I
I
I
I
DMD mirror block address pointer
I
DMD mirror block reset and clear command modes
Used to float DMD mirrors before complete loss of power
DMD type in use
I
I
O
O
O
Indicates DMD mirror reset in progress
Initialization in progress.
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Table 2. Input/Output Description (continued)
PIN NAME
VLED0
DESCRIPTION
I/O
O
System “heartbeat” signal
VLED1
Denotes initialization complete
O
8.3.1.4.1.1.2 Initialization
The INIT_ACTIVE (Table 2) signal indicates that the DLP7000, DLPA200, and DLPC410 are in an initialization
state after power is applied. During this initialization period, the DLPC410 is initializing the DLP7000 and
DLPA200 by setting all internal registers to their correct states. When this signal goes low, the system has
completed initialization. System initialization takes approximately 220 ms to complete. Data and command write
cycles should not be asserted during the initialization.
During initialization the user must send a training pattern to the DLPC410 on all data and DVALID lines to
correctly align the data inputs to the data clock. For more information about the interface training pattern, see the
DLPC410 data sheet (DLPS024).
8.3.1.4.1.1.3 DMD Device Detection
The DLPC410 automatically detects the DMD type and device ID. DMD_TYPE (Table 2) is an output from the
DLPC410 that contains the DMD information. Only DMDs sold with the chipset or kit are recognized by the
automatic detection function. All other DMDs do not operate with the DLPC410.
8.3.1.4.1.1.4 Power Down
To ensure long term reliability of the DLP7000, a shutdown procedure must be executed. Prior to power removal,
assert the PWR_FLOAT (Table 2) signal and allow approximately 300 µs for the procedure to complete. This
procedure assures the mirrors are in a flat state.
8.3.1.4.2 DLPC410 to DMD Interface
8.3.1.4.2.1 DLPC410 to DMD IO Description
Table 3 lists the available controls and status pin names and their corresponding signal type, along with a brief
functional description.
Table 3. DLPC410 to DMD I/O Pin Descriptions
PIN NAME
DESCRIPTION
I/O
O
DDC_DOUT_[A,B,C,D](15:0)
DDC_DCLKOUT_[A,B,C,D]
DDC_SCTRL_[A,B,C,D]
LVDS DDR output to DMD data bus A,B,C,D (15:0)
LVDS output to DMD data clock A,B,C,D
LVDS DDR output to DMD data control A,B,C,D
O
O
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8.3.1.4.2.2 Data Flow
Figure 9 shows the data traffic through the DLPC410. Special considerations are necessary when laying out the
DLPC410 to allow best signal flow.
LVDS BUS D
ꢀDIN_D(15:0)
ꢀDCLK_D
LVDS BUS C
ꢀDIN_C(15:0)
ꢀDCLK_C
ꢀDVALID_D
ꢀDVALID_C
DLPC410
LVDS BUS A
ꢀDOUT_A(15:0)
ꢀDCLKOUT_A
ꢀSCTRL_A
LVDS BUS D
ꢀDOUT_D(15:0)
ꢀDCLKOUT_D
ꢀSCTRL_D
Figure 9. DLPC410 Data Flow
Two LVDS buses transfer the data from the user to the DLPC410. Each bus has its data clock that is input edge
aligned with the data (DCLK). Each bus also has its own validation signal that qualifies the data input to the
DLPC410 (DVALID).
Output LVDS buses transfer data from the DLPC410 to the DLP7000. Output buses LVDS A and LVDS B are
used as highlighted in Figure 9.
8.3.1.4.3 DLPC410 to DLPA200 Interface
8.3.1.4.3.1 DLPA200 Operation
The DLPA200 DMD Micromirror Driver is a mixed-signal Application Specific Integrated Circuit (ASIC) that
combines the necessary high-voltage power supply generation and Micromirror Clocking Pulse functions for a
family of DMDs. The DLPA200 is programmable and controllable to meet all current and anticipated DMD
requirements.
The DLPA200 operates from a 12-V power supply input. For more detailed information on the DLPA200, see the
DLPA200 data sheet.
8.3.1.4.3.2 DLPC410 to DLPA200 IO Description
The Serial Communications Port (SCP) is a full duplex, synchronous, character-oriented (byte) port that allows
exchange of commands from the DLPC410 to the DLPA200. One SCP bus is used for the DLP7000.
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DLPA200
SCP bus
SCP bus
DLPC410
DLPA200
(Only with 1080p DMD)
Figure 10. Serial Port System Configuration
There are five signal lines associated with the SCP bus: SCPEN, SCPCK, SCPDI, SCPDO, and IRQ.
Table 4 lists the available controls and status pin names and their corresponding signal type, along with a brief
functional description.
Table 4. DLPC410 to DLPA200 I/O Pin Descriptions
PIN NAME
DESCRIPTION
I/O
O
O
O
O
O
O
O
O
O
O
A_SCPEN
Active low chip select for DLPA200 serial bus
DLPA200 control signal strobe
DLPA200 mode control
A_STROBE
A_MODE(1:0)
A_SEL(1:0)
A_ADDR(3:0)
B_SCPEN
DLPA200 select control
DLPA200 address control
Active low chip select for DLPA200 serial bus (2)
DLPA200 control signal strobe (2)
DLPA200 mode control
B_STROBE
B_MODE(1:0)
B_SEL(1:0)
B_ADDR(3:0)
DLPA200 select control
DLPA200 address control
The DLPA200 provides a variety of output options to the DMD by selecting logic control inputs: MODE[1:0],
SEL[1:0] and reset group address A[3:0] (Table 4). The MODE[1:0] input determines whether a single output, two
outputs, four outputs, or all outputs, will be selected. Output levels (VBIAS, VOFFSET, or VRESET) are selected
by SEL[1:0] pins. Selected outputs are tri-stated on the rising edge of the STROBE signal and latched to the
selected voltage level after a break-before-make delay. Outputs will remain latched at the last Micromirror
Clocking Pulse waveform level until the next Micromirror Clocking Pulse waveform cycle.
8.3.1.4.4 DLPA200 to DLP7000 Interface
8.3.1.4.4.1 DLPA200 to DLP7000 Interface Overview
The DLPA200 generates three voltages: VBIAS, VRESET, and VOFFSET that are supplied to the DMD MBRST
lines in various sequences through the Micromirror Clocking Pulse driver function. VOFFSET is also supplied
directly to the DMD as DMDVCC2. A fourth DMD power supply, DMDVCC, is supplied directly to the DMD by
regulators.
The function of the Micromirror Clocking Pulse driver is to switch selected outputs in patterns between the three
voltage levels (VBIAS, VRESET and VOFFSET) to generate one of several Micromirror Clocking Pulse
waveforms. The order of these Micromirror Clocking Pulse waveform events is controlled externally by the logic
control inputs and timed by the STROBE signal. DLPC410 automatically detects the DMD type and then uses the
DMD type to determine the appropriate Micromirror Clocking Pulse waveform.
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A direct Micromirror Clocking Pulse operation causes a mirror to transition directly from one latched state to the
next. The address must already be set up on the mirror electrodes when the Micromirror Clocking Pulse is
initiated. Where the desired mirror display period does not allow for time to set up the address, a Micromirror
Clocking Pulse with release can be performed. This operation allows the mirror to go to a relaxed state
regardless of the address while a new address is set up, after which the mirror can be driven to a new latched
state.
A mirror in the relaxed state typically reflects light into a system collection aperture and can be thought of as “off”
although the light is likely to be more than a mirror latched in the “off” state. System designers should carefully
evaluate the impact of relaxed mirror conditions on optical performance.
8.3.1.5 Measurement Conditions
The data sheet provides timing at the device pin. For output timing analysis, the tester pin electronics and its
transmission line effects must be taken into account. Figure 11 shows an equivalent test load circuit for the
output under test. The load capacitance value stated is only for characterization and measurement of AC timing
signals. This load capacitance value does not indicate the maximum load the device is capable of driving. All rise
and fall transition timing parameters are referenced to VIL MAX and VIH MIN for input clocks, VOL MAX and VOH
MIN for output clocks.
LOAD CIRCUIT
R
L
From Output
Under Test
Tester
Channel
C
C
= 50 pF
L
L
= 5 pF for Disable Time
Figure 11. Test Load Circuit for AC Timing Measurements
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Incident
Illumination
Package Pin
A1 Corner
Details Omitted For Clarity.
Not To Scale.
DMD
Micromirror
Array
Active Micromirror Array
(Border micromirrors eliminated for clarity)
0
Nœ1
Micromirror Pitch
Micromirror Hinge-Axis Orientation
P (um)
—On-State“
Tilt Direction
45°
—Off-State“
Tilt Direction
P (um)
Figure 12. DMD Micromirror Array, Pitch, and Hinge-Axis Orientation
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Package Pin
A1 Corner
DLP7000
Two Two
“On-State” “Off-State”
Micromirrors Micromirrors
For Reference
Flat-State
( “parked” )
Micromirror Position
a
b
-a
b
Silicon Substrate
Silicon Substrate
“On-State”
Micromirror
“Off-State”
Micromirror
Figure 13. Micromirror Landed Positions and Light Paths
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8.4 Device Functional Modes
8.4.1 DMD Operation
The DLP7000 has only one functional mode, it is set to be highly optimized for low latency and high speed in
generating mirror clocking pulses and timings.
When operated with the DLPC410 controller in conjunction with the DLPA200 driver, the DLP7000 can be
operated in several display modes. The DLP7000 is loaded as 16 blocks of 48 rows each. Figure 14, Figure 15,
Figure 16, and Figure 17 show how the image is loaded by the different Micromirror Clocking Pulse modes.
There are four Micromirror Clocking Pulse modes that determine which blocks are "reset" when a Micromirror
Clocking Pulse command is issued:
•
•
•
•
Single block mode
Dual block mode
Quad block mode
Global mode
8.4.1.1 Single Block Mode
In single block mode, a single block can be loaded and reset in any order. After a block is loaded, it can be reset
to transfer the information to the mechanical state of the mirrors.
Data Loaded
Reset
Figure 14. Single Block Mode Diagram
8.4.1.2 Dual Block Mode
In dual block mode, reset blocks are paired together as follows (0-1), (2-3), (4-5) . . . (14-15). These pairs can be
reset in any order. After data is loaded a pair can be reset to transfer the information to the mechanical state of
the mirrors.
Data Loaded
Reset
Figure 15. Dual Block Mode Diagram
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Device Functional Modes (continued)
8.4.1.3 Quad Block Mode
In quad block mode, reset blocks are grouped together in fours as follows (0-3), (4-7), (8-11) and (12-15). Each
quad group can be randomly addressed and reset. After a quad group is loaded, it can be reset to transfer the
information to the mechanical state of the mirrors.
Data Loaded
Reset
Figure 16. Quad Block Mode Diagram
8.4.1.4 Global Mode
In global mode, all reset blocks are grouped into a single group and reset together. The entire DMD must be
loaded with the desired data before issuing a Global Reset to transfer the information to the mechanical state of
the mirrors.
Reset
Data Loaded
Figure 17. Global Mode Diagram
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8.5 Optical Interface and System Image Quality Considerations
NOTE
TI assumes no responsibility for image quality artifacts or DMD failures caused by optical
system operating conditions exceeding limits described previously.
8.5.1 Optical Interface and System Image Quality
TI assumes no responsibility for end-equipment optical performance. Achieving the desired end-equipment
optical performance involves making trade-offs between numerous component and system design parameters.
Optimizing system optical performance and image quality strongly relate to optical system design parameter
trades. Although it is not possible to anticipate every conceivable application, projector image quality and optical
performance is contingent on compliance to the optical system operating conditions described in the following
sections.
8.5.2 Numerical Aperture and Stray Light Control
The angle defined by the numerical aperture of the illumination and projection optics at the DMD optical area
should be the same. This angle should not exceed the nominal device mirror tilt angle unless appropriate
apertures are added in the illumination and/or projection pupils to block out flat-state and stray light from the
projection lens. The mirror tilt angle defines DMD capability to separate the "ON" optical path from any other light
path, including undesirable flat-state specular reflections from the DMD window, DMD border structures, or other
system surfaces near the DMD such as prism or lens surfaces. If the numerical aperture exceeds the mirror tilt
angle, or if the projection numerical aperture angle is more than two degrees larger than the illumination
numerical aperture angle, objectionable artifacts in the display’s border and/or active area could occur.
8.5.3 Pupil Match
TI recommends the exit pupil of the illumination is nominally centered within 2° of the entrance pupil of the
projection optics. Misalignment of pupils can create objectionable artifacts in the display’s border and/or active
area, which may require additional system apertures to control, especially if the numerical aperture of the system
exceeds the pixel tilt angle.
8.5.4 Illumination Overfill
The active area of the device is surrounded by an aperture on the inside DMD window surface that masks
structures of the DMD device assembly from normal view. The aperture is sized to anticipate several optical
operating conditions. Overfill light illuminating the window aperture can create artifacts from the edge of the
window aperture opening and other surface anomalies that may be visible on the screen. The illumination optical
system should be designed to limit light flux incident anywhere on the window aperture from exceeding
approximately 10% of the average flux level in the active area. Depending on the particular system’s optical
architecture, overfill light may have to be further reduced below the suggested 10% level in order to be
acceptable.
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8.6 Micromirror Array Temperature Calculation
Achieving optimal DMD performance requires proper management of the maximum DMD case temperature, the
maximum temperature of any individual micromirror in the active array, the maximum temperature of the window
aperture, and the temperature gradient between case temperature and the predicted micromirror array
temperature. (see Figure 18).
See the Recommended Operating Conditions for applicable temperature limits.
8.6.1 Package Thermal Resistance
The DMD is designed to conduct absorbed and dissipated heat to the back of the Type A package where it can
be removed by an appropriate heat sink. The heat sink and cooling system must be capable of maintaining the
package within the specified operational temperatures, refer to Figure 18. The total heat load on the DMD is
typically driven by the incident light absorbed by the active area; although other contributions include light energy
absorbed by the window aperture and electrical power dissipation of the array.
8.6.2 Case Temperature
The temperature of the DMD case can be measured directly. For consistency, thermal test points TP1, TP2, and
TP3 are defined, as shown in Figure 18.
3X 15.88
TP1
TP3
TP2
TP3 (TP2)
Array
TP3
TP2
TP1
10.16
Figure 18. Thermal Test Point Location
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Micromirror Array Temperature Calculation (continued)
8.6.3 Micromirror Array Temperature Calculation - Lumens Based (typically used for display
applications)
Micromirror array temperature cannot be measured directly; therefore, it must be computed analytically from:
•
•
•
•
the measurement points (Figure 18)
the package thermal resistance
the electrical power
the illumination heat load
The relationship between micromirror array temperature and the reference ceramic temperature (thermal test
point TP1 in Figure 18) is provided by the following equations:
TARRAY = T CERAMIC + (QARRAY × RARRAY-TO-CERAMIC
QARRAY = QELECTRICAL + QILLUMINATION
)
where
•
•
•
TARRAY = computed array temperature (°C)
TCERAMIC = measured ceramic temperature (°C) (TP1 location)
RARRAY-TO-CERAMIC = thermal resistance of DMD package (specified in Thermal Information) from array to
ceramic TP1 (°C/W)
•
•
•
•
•
QARRAY = total power (electrical + absorbed) on the array (Watts)
QELECTRICAL = nominal electrical power (Watts)
QILLUMINATION = (CL2W × SL) (Watts)
CL2W = conversion constant for screen lumens to power on DMD (Watts/lumen)
SL = measured screen lumens
The electrical power dissipation of the DMD is variable and depends on the voltages, data rates, and operating
frequencies. A nominal electrical power dissipation to use when calculating array temperature is 4.4 Watts. The
absorbed power from the illumination source is variable and depends on the operating state of the micromirrors
and the intensity of the light source. The conversion constant CL2W is based on the DMD input illumination
characteristics. It assumes a spectral efficiency of 300 lumens/Watt for the projected light and an illumination
distribution of 83.7% on the active array and 16.3% on the array border. The equations shown above are valid for
a system with a total projection efficiency through the projection lens from the DMD to the projection surface of
87%.
Sample calculation for typical application:
•
•
•
•
•
•
•
TCeramic = 55°C (measured)
SL = 2000 lm (measured)
QELECTRICAL = 2.0 Watts
RARRAY-TO-CERAMIC = 0.9 °C/W
CL2W = 0.00274 W/lm
QARRAY = 2.0 + (0.00274 W/lm × 2000 lm) = 7.48 W
TARRAY = 55°C + (7.48 W x 0.9 °C) = 61.7 °C
36
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Micromirror Array Temperature Calculation (continued)
8.6.4 Micromirror Array Temperature Calculation - Power Density Based
Micromirror array temperature cannot be measured directly; therefore, it must be computed analytically from:
•
•
•
•
the measurement points (Figure 18)
the package thermal resistance
the electrical power
the illumination heat load
The relationship between array temperature and the reference ceramic temperature (thermal test point TP1 in
Figure 18) is provided by the following equations:
TARRAY = T CERAMIC + (QARRAY × RARRAY-TO-CERAMIC
QARRAY = QELECTRICAL + (0.42 x QINCIDENT
)
)
where
•
•
•
TARRAY = computed array temperature (°C)
TCERAMIC = measured ceramic temperature (°C) (TP1 location)
RARRAY-TO-CERAMIC = thermal resistance of DMD package (specified in Thermal Information) from array to
ceramic TP1 (°C/W)
•
•
•
QARRAY = total power (electrical + absorbed) on the array (Watts)
QELECTRICAL = nominal electrical power (Watts)
QINCIDENT = total incident optical power on DMD (Watts)
The electrical power dissipation of the DMD is variable and depends on the voltages, data rates, and operating
frequencies. A nominal electrical power dissipation to use when calculating array temperature is 4.4 watts. The
absorbed power from the illumination source is variable and depends on the operating state of the micromirrors
and the intensity of the light source. The equations shown above are valid for each DMD chip in a system. It
assumes an illumination distribution of 83.7% on the active array and 16.3% on the array border.
Sample Calculation for each DMD in a system with a measured illumination power density:
•
•
•
•
•
•
•
•
•
•
TCeramic = 20°C (measured)
ILLDENSITY = 11 Watts per cm2 (optical power on DMD per unit area) (measured)
Overfill = 16.3% (optical design)
QELECTRICAL = 2.0 Watts
RARRAY-TO-CERAMIC = 0.9 °C/W
Area of array = ( 1.4008 cm x 1.0506 cm ) = 1.4717 cm2
ILLAREA = 1.4717 cm2 / (83.7%) = 1.7583 cm2
QINCIDENT =11 W/cm2 x 1.7583 cm2 = 19.34 W
QARRAY = 2.0 W + (0.42 x 19.34 W) = 10.12 W
TARRAY = 20°C + (10.12 W x 0.9 °C) = 29.11 °C
8.7 Micromirror Landed-On/Landed-Off Duty Cycle
8.7.1 Definition of Micromirror Landed-On/Landed-Off Duty Cycle
The micromirror landed-on/landed-off duty cycle (landed duty cycle) denotes the amount of time (as a
percentage) that an individual micromirror is landed in the On–state versus the amount of time the same
micromirror is landed in the Off–state.
As an example, a landed duty cycle of 100/0 indicates that the referenced pixel is in the On-state 100% of the
time (and in the Off-state 0% of the time); whereas 0/100 would indicate that the pixel is in the Off-state 100% of
the time. Likewise, 50/50 indicates that the pixel is On 50% of the time and Off 50% of the time.
Note that when assessing landed duty cycle, the time spent switching from one state (ON or OFF) to the other
state (OFF or ON) is considered negligible and is thus ignored.
Since a micromirror can only be landed in one state or the other (On or Off), the two numbers (percentages)
always add to 100.
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Micromirror Landed-On/Landed-Off Duty Cycle (continued)
8.7.2 Landed Duty Cycle and Useful Life of the DMD
Knowing the long-term average landed duty cycle (of the end product or application) is important because
subjecting all (or a portion) of the DMD’s micromirror array (also called the active array) to an asymmetric landed
duty cycle for a prolonged period of time can reduce the DMD’s usable life.
Note that it is the symmetry/asymmetry of the landed duty cycle that is of relevance. The symmetry of the landed
duty cycle is determined by how close the two numbers (percentages) are to being equal. For example, a landed
duty cycle of 50/50 is perfectly symmetrical whereas a landed duty cycle of 100/0 or 0/100 is perfectly
asymmetrical.
8.7.3 Landed Duty Cycle and Operational DMD Temperature
Operational DMD Temperature and Landed Duty Cycle interact to affect the DMD’s usable life, and this
interaction can be exploited to reduce the impact that an asymmetrical Landed Duty Cycle has on the DMD’s
usable life. This is quantified in the de-rating curve shown in Figure 1. The importance of this curve is that:
•
•
All points along this curve represent the same usable life.
All points above this curve represent lower usable life (and the further away from the curve, the lower the
usable life).
•
All points below this curve represent higher usable life (and the further away from the curve, the higher the
usable life).
In practice, this curve specifies the Maximum Operating DMD Temperature that the DMD should be operated at
for a give long-term average Landed Duty Cycle.
8.7.4 Estimating the Long-Term Average Landed Duty Cycle of a Product or Application
During a given period of time, the Landed Duty Cycle of a given pixel follows from the image content being
displayed by that pixel.
For example, in the simplest case, when displaying pure-white on a given pixel for a given time period, that pixel
will experience a 100/0 Landed Duty Cycle during that time period. Likewise, when displaying pure-black, the
pixel will experience a 0/100 Landed Duty Cycle.
Between the two extremes (ignoring for the moment color and any image processing that may be applied to an
incoming image), the Landed Duty Cycle tracks one-to-one with the gray scale value, as shown in Table 5.
Table 5. Grayscale Value and Landed Duty Cycle
GRAYSCALE VALUE
LANDED DUTY CYCLE
0%
10%
20%
30%
40%
50%
60%
70%
80%
90%
100%
0/100
10/90
20/80
30/70
40/60
50/50
60/40
70/30
80/20
90/10
100/0
Accounting for color rendition (but still ignoring image processing) requires knowing both the color intensity (from
0% to 100%) for each constituent primary color (red, green, and/or blue) for the given pixel as well as the color
cycle time for each primary color, where “color cycle time” is the total percentage of the frame time that a given
primary must be displayed in order to achieve the desired white point.
During a given period of time, the landed duty cycle of a given pixel can be calculated as follows:
Landed Duty Cycle = (Red_Cycle_% × Red_Scale_Value) + (Green_Cycle_% × Green_Scale_Value) + (Blue_Cycle_%
38
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× Blue_Scale_Value)
where
•
Red_Cycle_%, Green_Cycle_%, and Blue_Cycle_%, represent the percentage of the frame time that Red,
Green, and Blue are displayed (respectively) to achieve the desired white point.
(1)
For example, assume that the red, green and blue color cycle times are 50%, 20%, and 30% respectively (in
order to achieve the desired white point), then the Landed Duty Cycle for various combinations of red, green,
blue color intensities would be as shown in Table 6.
Table 6. Example Landed Duty Cycle for Full-Color
RED CYCLE PERCENTAGE
50%
GREEN CYCLE PERCENTAGE
20%
BLUE CYCLE PERCENTAGE
30%
LANDED DUTY CYCLE
RED SCALE VALUE
GREEN SCALE VALUE
BLUE SCALE VALUE
0%
100%
0%
0%
0%
0%
0%
0/100
50/50
20/80
30/70
6/94
100%
0%
0%
0%
100%
0%
12%
0%
0%
35%
0%
0%
7/93
0%
60%
0%
18/82
70/30
50/50
80/20
13/87
25/75
24/76
100/0
100%
0%
100%
100%
0%
100%
100%
0%
100%
12%
0%
35%
35%
0%
60%
60%
100%
12%
100%
100%
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
The DLP7000 devices require they be coupled with the DLPC410 controller to provide a reliable solution for
many different applications. The DMDs are spatial light modulators which reflect incoming light from an
illumination source to one of two directions, with the primary direction being into a projection collection optic.
Each application is derived primarily from the optical architecture of the system and the format of the data
coming into the DLPC410. Applications of interest include 3D measurement systems, lithography, medical
systems, and compressive sensing.
40
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9.2 Typical Application
A typical embedded system application using the DLPC410 controller and DLP7000 is shown in Figure 19. In this configuration, the DLPC410 controller
supports input from an FPGA. The FPGA sends low-level data to the controller, enabling the system to be highly optimized for low latency and high
speed.
Figure 19. DLPC410 and DLP7000 Embedded Example Block Diagram
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9.2.1 Design Requirements
All applications using the DLP7000 XGA chipset require both the controller and the DMD components for
operation. The system also requires an external parallel flash memory device loaded with the DLPC410
Configuration and Support Firmware. The chipset has several system interfaces and requires some support
circuitry. The following interfaces and support circuitry are required:
•
DLPC410 System Interfaces:
–
–
–
–
–
Control Interface
Trigger Interface
Input Data Interface
Illumination Interface
Reference Clock
•
DLP7000 Interfaces:
–
–
–
–
–
DLPC410 to DLP7000 Digital Data
DLPC410 to DLP7000 Control Interface
DLPC410 to DLP7000 Micromirror Reset Control Interface
DLPC410 to DLPA200 Micromirror Driver
DLPA200 to DLP7000 Micromirror Reset
9.2.2 Device Description
The DLP7000 XGA chipset offers developers a convenient way to design a wide variety of industrial, medical,
telecom and advanced display applications by delivering maximum flexibility in formatting data, sequencing data,
and light patterns.
The DLP7000 XGA chipset includes the following four components: DMD Digital Controller (DLPC410),
EEPROM (DLPR410), DMD Micromirror Driver (DLPA200), and a DMD (DLP7000).
DLPC410 Digital Controller for DLP Discovery 4100 chipset
•
•
•
Provides high speed LVDS data and control interface to the DLP7000.
Drives mirror clocking pulse and timing information to the DLPA200.
Supports random row addressing.
DLPR410 PROM for DLP Discovery 4100 chipset
Contains startup configuration information for the DLPC410.
DLPA200 DMD Micromirror Driver
Generates Micromirror Clocking Pulse control (sometimes referred to as a "Reset") of DMD mirrors.
DLP7000 DLP 0.7 XGA 2xLVDS Type-A DMD
•
•
•
Steers light in two digital positions (+12º and -12º) using 1024 x 768 micromirror array of aluminum
mirrors.
Table 7. DLPC410 Chipset Configuration for 0.7 XGA Chipset
QUANTITY
TI PART
DLP7000
DLPC410
DLPR410
DLPA200
DESCRIPTION
1
1
1
1
DLP 0.7 XGA 2xLVDS Type-A DMD
Digital Controller for DLP Discovery 4100 chipset
PROM for DLP Discovery 4100 chipset
DMD Micromirror Driver
42
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Reliable function and operation of DLP7000 XGA chipsets require the components be used in conjunction with
each other. This document describes the proper integration and use of the DLP7000 XGA chipset components.
The DLP7000 XGA chipset can be combined with a user programmable Application FPGA (not included) to
create high performance systems.
9.2.3 Detailed Design Procedure
The DLP7000 DMD is well suited for visible light applications requiring fast, spatially programmable light patterns
using the micromirror array. See the Functional Block Diagram to see the connections between the DLP7000
DMD, the DLPC410 digital controller, the DLPR410 EEPROM, and the DLPA200 DMD micromirror drivers. See
the Figure 19 for an application example. Follow the Layout Guidelines for reliability.
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10 Power Supply Recommendations
10.1 DMD Power-Up and Power-Down Procedures
Repeated failure to adhere to the prescribed power-up and power-down procedures may affect device reliability.
The DLP7000 power-up and power-down procedures are defined by the DLPC410 data sheet (DLPS024). These
procedures must be followed to ensure reliable operation of the device.
11 Layout
11.1 Layout Guidelines
The DLP7000 is part of a chipset that is controlled by the DLPC410 in conjunction with the DLPA200. These
guidelines are targeted at designing a PCB board with these components.
A target impedance of 50 Ω for single ended signals and 100 Ω between LVDS signals is specified for all signal
layers.
11.1.1 Impedance Requirements
Signals should be routed to have a matched impedance of 50 Ω ±10% except for LVDS differential pairs
(DMD_DAT_Xnn, DMD_DCKL_Xn, and DMD_SCTRL_Xn), which should be matched to 100 Ω ±10% across
each pair.
11.1.2 PCB Signal Routing
When designing a PCB for the DLP7000 controlled by the DLPC410 in conjunction with the DLPA200, the
following are recommended:
Signal trace corners should be no sharper than 45°. Adjacent signal layers should have the predominate traces
routed orthogonal to each other. TI recommends that critical signals be hand routed in the following order: DDR2
Memory, DMD (LVDS signals), then DLPA200 signals.
TI does not recommend signal routing on power or ground planes.
TI does not recommend ground plane slots.
High speed signal traces should not cross over slots in adjacent power and/or ground planes.
Table 8. Important Signal Trace Constraints
SIGNAL
CONSTRAINTS
P-to-N data, clock, and SCTRL: <10 mils (0.25 mm); Pair-to-pair <10 mils (0.25 mm); Bundle-to-bundle
<2000 mils (50 mm, for example DMD_DAT_Ann to DMD_DAT_Bnn)
Trace width: 4 mil (0.1 mm)
Trace spacing: In ball field – 4 mil (0.11 mm); PCB etch – 14 mil (0.36 mm)
Maximum recommended trace length <6 inches (150 mm)
LVDS (DMD_DAT_xnn,
DMD_DCKL_xn, and
DMD_SCTRL_xn)
Table 9. Power Trace Widths and Spacing
MINIMUM TRACE
MINIMUM TRACE
SPACING
SIGNAL NAME
LAYOUT REQUIREMENTS
WIDTH
GND
Maximize
5 mil (0.13 mm)
10 mil (0.25 mm)
15 mil (0.38 mm)
Maximize trace width to connecting pin as a minimum
VCC, VCC2
MBRST[15:0]
20 mil (0.51 mm)
11 mil (0.23 mm)
11.1.3 DMD Interface
The digital interface from the DLPC410 to the DMD are LVDS signals that run at clock rates up to 400 MHz. Data
is clocked into the DMD on both the rising and falling edge of the clock, so the data rate is 800 MHz. The LVDS
signals should have 100 Ω differential impedance. The differential signals should be matched but kept as short
as possible. Parallel termination at the LVDS receiver is in the DMD; therefore, on board termination is not
necessary.
44
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11.1.3.1 Trace Length Matching
The DLPC410 DMD data signals require precise length matching. Differential signals should have impedance of
100Ω (with 5% tolerance). It is important that the propagation delays are matched. The maximum differential pair
uncoupled length is 100 mils with a relative propagation delay of ±25 mil between the p and n. Matching all
signals exactly will maximize the channel margin. The signal path through all boards, flex cables and internal
DMD routing must be considered in this calculation.
11.1.4 DLP7000 Decoupling
General decoupling capacitors for the DLP7000 should be distributed around the PCB and placed to minimize
the distance from IC voltage and ground pads. Each decoupling capacitor (0.1 µF recommended) should have
vias directly to the ground and power planes. Via sharing between components (discreet or integrated) is
discouraged. The power and ground pads of the DLP7000 should be tied to the voltage and ground planes with
their own vias.
11.1.4.1 Decoupling Capacitors
Decoupling capacitors should be placed to minimize the distance from the decoupling capacitor to the supply and
ground pin of the component. It is recommended that the placement of and routing for the decoupling capacitors
meet the following guidelines:
•
The supply voltage pin of the capacitor should be located close to the device supply voltage pin(s). The
decoupling capacitor should have vias to ground and voltage planes. The device can be connected directly to
the decoupling capacitor (no via) if the trace length is less than 0.1 inch. Otherwise, the component should be
tied to the voltage or ground plane through separate vias.
•
•
•
•
The trace lengths of the voltage and ground connections for decoupling capacitors and components should
be less than 0.1 inch to minimize inductance.
The trace width of the power and ground connection to decoupling capacitors and components should be as
wide as possible to minimize inductance.
Connecting decoupling capacitors to ground and power planes through multiple vias can reduce inductance
and improve noise performance.
Decoupling performance can be improved by utilizing low ESR and low ESL capacitors.
11.1.5 VCC and VCC2
The VCC pins of the DMD should be connected directly to the DMD VCC plane. Decoupling for the VCC should
be distributed around the DMD and placed to minimize the distance from the voltage and ground pads. Each
decoupling capacitor should have vias directly connected to the ground and power planes. The VCC and GND
pads of the DMD should be tied to the VCC and ground planes with their own vias.
The VCC2 voltage can be routed to the DMD as a trace. Decoupling capacitors should be placed to minimize the
distance from the DMD’s VCC2 and ground pads. Using wide etch from the decoupling capacitors to the DMD
connection will reduce inductance and improve decoupling performance.
11.1.6 DMD Layout
See the respective sections in this data sheet for package dimensions, timing and pin out information.
11.1.7 DLPA200
The DLPA200 generates the micromirror clocking pulses for the DMD. The DMD-drive outputs from the
DLPA200 (MBRST[15:0] should be routed with minimum trace width of 11 mil and a minimum spacing of 15 mil.
The VCC and VCC2 traces from the output capacitors to the DLPA200 should also be routed with a minimum
trace width and spacing of 11 mil and 15 mil, respectively. See the DLPA200 customer data sheet for mechanical
package and layout information.
11.2 Layout Example
For LVDS (and other differential signal) pairs and groups, it is important to match trace lengths. In the area of the
dashed lines, Figure 20 shows correct matching of signal pair lengths with serpentine sections to maintain the
correct impedance.
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Layout Example (continued)
Figure 20. Mitering LVDS Traces to Match Lengths
46
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12 器件和文档支持
12.1 器件支持
12.1.1 器件命名规则
图 21 提供了读取任一 DLP 器件完整器件名称的图例。
DLP7000 FLP
Package
TI Internal Numbering
Device Descriptor
图 21. 器件命名规则
12.1.2 器件标记
器件标记由 图 22 中显示的字段组成。
TI Internal Numbering
DMD Part Number
2-Dimensional Matrix Code
(DMD Part Number and
Serial Number)
YYYYYYY
DLP7000_FLP
GHXXXXX LLLLLLM
LLLLLL
Part 1 of Serial Number
Part 2 of Serial Number
(7 characters)
(7 characters)
TI Internal Numbering
图 22. 器件标识
12.2 文档支持
12.2.1 相关文档
以下文档包含关于使用 DLP7000 器件的更多信息:
•
•
•
《适用于 DLP Discovery 4100 芯片组的 DLPC410 数字控制器数据表》,DLPS024
《DLPA200 DMD 微镜驱动器数据表》,DLPS015
《适用于 DLP Discovery 4100 的 DLPR410 PROM 数据表》,DLPS027
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12.3 相关链接
下表列出了快速访问链接。类别包括技术文档、支持与社区资源、工具和软件,以及申请样片或购买产品的快速链
接。
表 10. 相关链接
器件
产品文件夹
请单击此处
请单击此处
请单击此处
请单击此处
样片与购买
请单击此处
请单击此处
请单击此处
请单击此处
技术文档
请单击此处
请单击此处
请单击此处
请单击此处
工具与软件
请单击此处
请单击此处
请单击此处
请单击此处
支持和社区
请单击此处
请单击此处
请单击此处
请单击此处
DLP7000
DLPA200
DLPC410
DLPR410
12.4 商标
Discovery is a trademark of Texas Instruments.
DLP is a registered trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
12.5 静电放电警告
这些装置包含有限的内置 ESD 保护。 存储或装卸时,应将导线一起截短或将装置放置于导电泡棉中,以防止 MOS 门极遭受静电损
伤。
12.6 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 机械、封装和可订购信息
以下页面包含机械、封装和可订购信息。这些信息是指定器件的最新可用数据。数据如有变更,恕不另行通知,且
不会对此文档进行修订。如需获取此数据表的浏览器版本,请查阅左侧的导航栏。
48
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PACKAGE OPTION ADDENDUM
www.ti.com
14-Oct-2022
PACKAGING INFORMATION
Orderable Device
Status Package Type Package Pins Package
Eco Plan
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
Samples
Drawing
Qty
(1)
(2)
(3)
(4/5)
(6)
DLP7000BFLP
ACTIVE
CLGA
FLP
203
18
RoHS & Green
NI-PD-AU
N / A for Pkg Type
10 to 65
Samples
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
重要声明和免责声明
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