DLP7000UV [TI]
DLP® 0.7XGA 2xLVDS UV A 型 DMD;型号: | DLP7000UV |
厂家: | TEXAS INSTRUMENTS |
描述: | DLP® 0.7XGA 2xLVDS UV A 型 DMD |
文件: | 总53页 (文件大小:2002K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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DLP7000UV
ZHCSE66D –MAY 2015–REVISED MAY 2017
DLP7000UV DLP®0.7 UV XGA 2x LVDS A 类 DMD
1 特性
3 说明
1
•
•
•
0.7 英寸对角线微镜阵列
DLP7000UV 是一种数控 MEMS(微机电系统)空间
光调制器 (SLM)。当与适当的光学系统配合使用
时,DLP7000UV 可用于调制入射光的振幅、方向和/
或相位。
–
–
–
–
1024 × 768 铝微米尺寸微镜阵列
13.68µm 微镜间距
±12°微镜倾斜角(相对于平板状态)
设计用于边缘照明
DLP7000UV 数字微镜器件 (DMD) 作为 DLP®
设计用于紫外光(363nm 至 420nm):
Discovery™ 4100 平台的新成员,可确保非常快速的
图形速率,同时还可在深入 UVA 光谱(363nm 至
420nm)的可见光谱之外实现高性能的空间光调制。
DLP7000UV DMD 设计采用了针对 UV 透射进行优化
的特殊窗口。DLP Discovery 4100 平台还提供具有随
机行寻址选项的最高级独立微镜控制。除了采用密封封
装外,DLP7000UV 具有独特的功能和价值,非常适合
支持各种工业、医疗和高级显示 应用。
–
–
–
–
窗透射率 98%(单通,通过两个窗面)
微镜反射率 88%
阵列衍射效率 85%
阵列填充因子 92%(标称值)
两条 16 位低压差分信令 (LVDS) 双倍数据速率
(DDR) 输入数据总线
•
•
•
高达 400MHz 的输入数据时钟速率
40.64mm x 31.75mm x 6.0mm 封装尺寸
气密封装
采用密封封装的 DLP7000UV DMD 与一个专用的
DLPC410 控制器(用于支持大于 32000Hz(1 位二进
制)和大于 1900Hz(8 位灰度)的高速图形速率)、
一个 DLPR410(DLP Discovery 4100 配置 PROM)
和一个 DLPA200(DMD 微镜驱动器)配套出售。
2 应用
•
工业
–
–
–
–
–
直接成像平版印刷术
激光打标和修复系统
计算机直接制版打印机
快速成型机
器件信息 (1)
部件号
封装
封装尺寸(标称值)
DLP7000UV
LCCC (203)
40.64mm × 31.75mm
3D 打印机
(1) 如需了解所有可用封装,请参阅产品说明书末尾的可订购产品
附录。
•
医疗
–
–
–
眼科
简化电路原理图
光化疗法
高光谱成像
Illumination
Driver
DLPC410
DLP7000UV
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
English Data Sheet: DLPS061
DLP7000UV
ZHCSE66D –MAY 2015–REVISED MAY 2017
www.ti.com.cn
目录
8.2 Functional Block Diagram ....................................... 23
8.3 Feature Description................................................. 23
8.4 Device Functional Modes........................................ 31
8.5 Window Characteristics and Optics ....................... 33
8.6 Micromirror Array Temperature Calculation............ 34
8.7 Micromirror Landed-On/Landed-Off Duty Cycle ..... 36
Application and Implementation ........................ 38
9.1 Application Information............................................ 38
9.2 Typical Application .................................................. 39
1
2
3
4
5
6
7
特性.......................................................................... 1
应用.......................................................................... 1
说明.......................................................................... 1
修订历史记录 ........................................................... 2
说明 (续).............................................................. 4
Pin Configuration and Functions......................... 4
Specifications....................................................... 11
7.1 Absolute Maximum Ratings .................................... 11
7.2 Storage Conditions.................................................. 11
7.3 ESD Ratings............................................................ 11
7.4 Recommended Operating Conditions..................... 12
7.5 Thermal Information................................................ 13
7.6 Electrical Characteristics......................................... 14
7.7 LVDS Timing Requirements ................................... 15
7.8 LVDS Waveform Requirements.............................. 16
7.9 Serial Control Bus Timing Requirements................ 17
7.10 Systems Mounting Interface Loads....................... 18
7.11 Micromirror Array Physical Characteristics........... 19
7.12 Micromirror Array Optical Characteristics ............. 20
7.13 Window Characteristics......................................... 21
7.14 Chipset Component Usage Specification ............. 21
Detailed Description ............................................ 22
8.1 Overview ................................................................. 22
9
10 Power Supply Recommendations ..................... 42
10.1 Power-Up Sequence (Handled by the DLPC410)
................................................................................. 42
11 Layout................................................................... 42
11.1 Layout Guidelines ................................................. 42
11.2 Layout Example .................................................... 44
12 器件和文档支持 ..................................................... 45
12.1 器件支持................................................................ 45
12.2 文档支持................................................................ 45
12.3 相关链接................................................................ 46
12.4 社区资源................................................................ 47
12.5 商标....................................................................... 47
12.6 静电放电警告......................................................... 47
12.7 Glossary................................................................ 47
13 机械、封装和可订购信息....................................... 47
8
4 修订历史记录
注:之前版本的页码可能与当前版本有所不同。
Changes from Revision C (September 2015) to Revision D
Page
•
•
Updated Pin Configuration and Functions diagram ............................................................................................................... 4
Changed TGRADIENT from 5 °C to 10 °C to accommodate increase in power density from 400 to 420 nm and added
RH symbol for relative humidity in Absolute Maximum Ratings........................................................................................... 11
•
•
•
Clarified TGRADIENT footnote in Absolute Maximum Ratings.................................................................................................. 11
Changed Tstg to TDMD in Storage Conditions ........................................................................................................................ 11
Changed 363 to 420 nm to 363 to 400 nm max for 2.5 W/cm2 power density and 3.7 W max optical power in
Recommended Operating Conditions ................................................................................................................................. 12
•
•
•
Added 400 to 420 nm max power density of 11 W/cm2 and max optical power of 16.2 W in Recommended
Operating Conditions ........................................................................................................................................................... 12
Added 363 to 420 nm total integrated max power density of 11 W/cm2 and total integrated max optical power of
16.2 W in Recommended Operating Conditions ................................................................................................................. 12
Changed TGRADIENT from 5 °C to 10 °C to accommodate increase in power density from 400 to 420 nm
Recommended Operating Conditions ................................................................................................................................. 12
•
•
Changed Micromirror active border value from 10 to correct value of 6 in Micromirror Array Physical Characteristics...... 19
Changed micromirror crossover to mean transition time and renamed previous crossover to micromirror switching
time typical micromirror crossover time typo (16 µs to 13 µs) in Micromirror Array Optical Characteristics........................ 20
•
•
•
Added typical micromirror switching time - 13 µs in Micromirror Array Optical Characteristics........................................... 20
Changed "Micromirror switching time" to "Array switching time" for clarity in Micromirror Array Optical Characteristics.... 20
Added clarification to Micromirror switching time at 400 MHz with global reset in Micromirror Array Optical
Characteristics...................................................................................................................................................................... 20
•
•
Changed Figure 17 drawing to current thermal test point numbering convention ............................................................... 34
已添加 “相关链接”表.............................................................................................................................................................. 46
2
版权 © 2015–2017, Texas Instruments Incorporated
DLP7000UV
www.ti.com.cn
ZHCSE66D –MAY 2015–REVISED MAY 2017
修订历史记录 (接下页)
Changes from Revision B (July 2015) to Revision C
Page
•
•
将器件状态从“产品预览”更改为“生产数据”.............................................................................................................................. 1
Added 3.7-W maximum value to illumination power (from 363 nm to 420 nm) in Recommended Operating
Conditions ............................................................................................................................................................................ 12
•
Updated Figure 18 ............................................................................................................................................................... 38
Changes from Revision A (June 2015) to Revision B
Page
•
•
发布完整版产品说明书............................................................................................................................................................ 1
在说明 中将 UVA 光谱的最小值从 365nm 更正为 363nm...................................................................................................... 1
Changes from Original (May 2015) to Revision A
Page
•
更正了器件的部件号 ............................................................................................................................................................... 1
版权 © 2015–2017, Texas Instruments Incorporated
3
DLP7000UV
ZHCSE66D –MAY 2015–REVISED MAY 2017
www.ti.com.cn
5 说明 (续)
DLP7000UV 需要与芯片组的其他组件结合使用才能实现可靠功能和运行。一套专用的芯片组能够使开发人员更加
轻松地访问 DMD 并使用高速而独立的微镜控制。
电子方面,DLP7000UV 由 1 位 CMOS 存储器单元的两维阵列组成,其组织结构为 1024 存储器单元列乘以 768
存储器单元行的栅格。CMOS 存储器阵列通过两条 16 位低压差分信令 (LVDS) 双倍数据速率 (DDR) 总线逐行进行
寻址。寻址由一个串行控制总线处理。特定的 CMOS 存储器访问协议由 DLPC410 数字控制器处理。
6 Pin Configuration and Functions
FLP Package
203-Pin LCCC
Bottom View
A
B
C
D
E
F
074
G
H
J
K
L
M
N
P
R
T
U
V
W
Y
AA
AB
AC
30
28
26
24
22
20
18
16
14
12
10
8
6
4
2
29
27
25
23
21
19
17
15
13
11
9
7
5
3
1
4
Copyright © 2015–2017, Texas Instruments Incorporated
DLP7000UV
www.ti.com.cn
ZHCSE66D –MAY 2015–REVISED MAY 2017
Pin Functions
(1)
PIN
NAME
TYPE
(I/O/P)
DATA
INTERNAL
SIGNAL
CLOCK
DESCRIPTION
TRACE (MILS)
(2)
(3)
RATE
TERM
NO.
DATA INPUT
Differential
Terminated -
100 Ω
D_AN(0)
D_AN(1)
D_AN(2)
D_AN(3)
D_AN(4)
D_AN(5)
D_AN(6)
D_AN(7)
D_AN(8)
D_AN(9)
D_AN(10)
D_AN(11)
D_AN(12)
D_AN(13)
D_AN(14)
D_AN(15)
D_AP(0)
D_AP(1)
B10
A13
D16
C17
B18
A17
A25
D22
C29
D28
E27
F26
G29
H28
J27
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
368.72
424.61
433.87
391.39
438.57
391.13
563.26
411.62
595.11
543.07
455.98
359.5
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Input data bus A
(2x LVDS)
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
542.67
551.51
528.04
484.38
366.99
417.47
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
K26
B12
A11
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
(1) The following power supplies are required to operate the DMD: VCC, VCC1, VCC2. VSS must also be connected.
(2) DDR = Double Data Rate. SDR = Single Data Rate. Refer to the LVDS Timing Requirements for specifications and relationships.
(3) Refer to Electrical Characteristics for differential termination specification.
Copyright © 2015–2017, Texas Instruments Incorporated
5
DLP7000UV
ZHCSE66D –MAY 2015–REVISED MAY 2017
www.ti.com.cn
Pin Functions (continued)
(1)
PIN
TYPE
(I/O/P)
DATA
RATE
INTERNAL
TERM
SIGNAL
CLOCK
DESCRIPTION
TRACE (MILS)
(2)
(3)
NAME
NO.
Differential
Terminated -
100 Ω
D_AP(2)
D14
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
LVCMOS
DDR
DCLK_A
434.89
Differential
Terminated -
100 Ω
D_AP(3)
D_AP(4)
D_AP(5)
D_AP(6)
D_AP(7)
D_AP(8)
D_AP(9)
D_AP(10)
D_AP(11)
D_AP(12)
D_AP(13)
D_AP(14)
D_AP(15)
D_BN(0)
D_BN(1)
D_BN(2)
D_BN(3)
D_BN(4)
C15
B16
A19
A23
D20
A29
B28
C27
D26
F30
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_A
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
394.67
437.3
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
389.01
562.92
410.34
594.61
539.88
456.78
360.68
543.97
570.85
527.18
481.02
368.72
424.61
433.87
391.39
438.57
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Input data bus A
(2x LVDS)
Differential
Terminated -
100 Ω
H30
J29
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
K28
AB10
AC13
Y16
AA17
AB18
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
6
Copyright © 2015–2017, Texas Instruments Incorporated
DLP7000UV
www.ti.com.cn
ZHCSE66D –MAY 2015–REVISED MAY 2017
Pin Functions (continued)
(1)
PIN
TYPE
(I/O/P)
DATA
RATE
INTERNAL
TERM
SIGNAL
CLOCK
DESCRIPTION
TRACE (MILS)
(2)
(3)
NAME
NO.
Differential
Terminated -
100 Ω
D_BN(5)
D_BN(6)
D_BN(7)
D_BN(8)
D_BN(9)
D_BN(10)
D_BN(11)
D_BN(12)
D_BN(13)
D_BN(14)
D_BN(15)
D_BP(0)
D_BP(1)
D_BP(2)
D_BP(3)
D_BP(4)
D_BP(5)
AC17
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
LVCMOS
DDR
DCLK_B
391.13
Differential
Terminated -
100 Ω
AC25
Y22
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
563.26
411.62
595.11
543.07
455.98
360.94
575.85
519.37
532.59
441.14
366.99
417.47
434.89
394.67
437.3
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
AA29
Y28
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
W27
V26
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
T30
Differential
Terminated -
100 Ω
R29
Differential
Terminated -
100 Ω
R27
Differential
Terminated -
100 Ω
N27
Differential
Terminated -
100 Ω
AB12
AC11
Y14
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
AA15
AB16
AC19
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
389.01
Input data bus B
(2x LVDS) Input
data bus B (2x
LVDS)
Differential
Terminated -
100 Ω
D_BP(6)
D_BP(7)
AC23
Y20
Input
Input
LVCMOS
LVCMOS
DDR
DDR
DCLK_B
DCLK_B
562.92
410.34
Differential
Terminated -
100 Ω
Copyright © 2015–2017, Texas Instruments Incorporated
7
DLP7000UV
ZHCSE66D –MAY 2015–REVISED MAY 2017
www.ti.com.cn
Pin Functions (continued)
(1)
PIN
TYPE
(I/O/P)
DATA
RATE
INTERNAL
TERM
SIGNAL
CLOCK
DESCRIPTION
TRACE (MILS)
(2)
(3)
NAME
NO.
Differential
Terminated -
100 Ω
D_BP(8)
AC29
Input
Input
Input
Input
Input
Input
Input
Input
LVCMOS
DDR
DCLK_B
594.61
Differential
Terminated -
100 Ω
D_BP(9)
AB28
AA27
Y26
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
DDR
DDR
DDR
DDR
DDR
DDR
DDR
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
DCLK_B
539.88
456.78
360.68
578.46
509.74
534.59
440
Differential
Terminated -
100 Ω
D_BP(10)
D_BP(11)
D_BP(12)
D_BP(13)
D_BP(14)
D_BP(15)
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
U29
T28
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Input data bus B
(2x LVDS)
P28
Differential
Terminated -
100 Ω
P26
DATA CLOCK
Differential
Terminated -
100 Ω
DCLK_AN
B22
B24
Input
Input
Input
Input
LVCMOS
LVCMOS
LVCMOS
LVCMOS
–
–
–
–
–
–
–
–
477.10
477.11
477.10
477.11
Differential
Terminated -
100 Ω
DCLK_AP
DCLK_BN
DCLK_BP
Differential
Terminated -
100 Ω
AB22
AB24
Differential
Terminated -
100 Ω
DATA CONTROL INPUTS
Differential
Terminated -
100 Ω
Serial control for
data bus A (2x
LVDS)
SCTRL_AN
SCTRL_AP
SCTRL_BN
SCTRL_BP
C21
C23
Input
Input
Input
Input
LVCMOS
LVCMOS
LVCMOS
LVCMOS
DDR
DDR
DDR
DDR
DCLK_A
DCLK_A
DCLK_B
DCLK_B
477.07
477.14
477.07
477.14
Differential
Terminated -
100 Ω
Differential
Terminated -
100 Ω
Serial control for
data bus B (2x
LVDS)
AA21
AA23
Differential
Terminated -
100 Ω
SERIAL COMMUNICATION AND CONFIGURATION
SCPCLK
SCPDO
SCPDI
E3
B2
F4
D4
C3
Input
Output
Input
LVCMOS
LVCMOS
LVCMOS
LVCMOS
LVCMOS
–
–
–
–
–
Pull-down
–
–
Serial port clock
Serial port output
Serial port input
Serial port enable
Device Reset
379.29
480.91
323.56
326.99
406.28
SCPCLK
SCPCLK
SCPCLK
–
Pull-down
Pull-down
Pull-down
SCPENZ
PWRDNZ
Input
Input
8
Copyright © 2015–2017, Texas Instruments Incorporated
DLP7000UV
www.ti.com.cn
ZHCSE66D –MAY 2015–REVISED MAY 2017
Pin Functions (continued)
(1)
PIN
TYPE
(I/O/P)
DATA
RATE
INTERNAL
TERM
SIGNAL
CLOCK
DESCRIPTION
TRACE (MILS)
(2)
(3)
NAME
NO.
D8
Data bandwidth
mode select
MODE_A
MODE_B
Input
Input
LVCMOS
LVCMOS
–
–
Pull-down
Pull-down
–
–
396.05
208.86
C11
MICROMIRROR BIAS CLOCKING PULSE
MBRST(0)
MBRST(1)
MBRST(2)
MBRST(3)
MBRST(4)
MBRST(5)
MBRST(6)
P2
AB4
AA7
N3
Input
Input
Input
Input
Input
Input
Input
Analog
Analog
Analog
Analog
Analog
Analog
Analog
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
M4
AB6
AA5
Micromirror Bias
Clocking Pulse
MBRST signals
clock micromirrors
into state of
MBRST(7)
L3
Input
Analog
–
–
–
LVCMOS memory
cell associated
with each mirror.
MBRST(8)
MBRST(9)
MBRST(10)
MBRST(11)
MBRST(12)
MBRST(13)
MBRST(14)
MBRST(15)
POWER
Y6
K4
Input
Input
Input
Input
Input
Input
Input
Input
Analog
Analog
Analog
Analog
Analog
Analog
Analog
Analog
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
L5
AC5
Y8
J5
K6
AC7
A7, A15,
C1, E1, U1,
W1,
AB2,AC9,
AC15
Power for
LVCMOS Logic
VCC
Power
Analog
–
–
–
–
A21, A27,
D30, M30,
Y30, AC21,
AC27
Power supply for
LVDS Interface
VCC1
VCC2
Power
Power
Analog
Analog
–
–
–
–
–
–
–
–
Power for High
Voltage CMOS
Logic
G1, J1, L1,
N1, R1
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TRACE (MILS)
Pin Functions (continued)
(1)
PIN
TYPE
DATA
INTERNAL
SIGNAL
CLOCK
DESCRIPTION
(2)
(3)
(I/O/P)
RATE
TERM
NAME
NO.
A1, A3, A5,
A9, B4, B8,
B14, B20,
B26, B30,
C7,
C13, C19,
C25, D6,
D12, D18,
D24, E29,
F2, F28,
G3, G27,
H2, H4,
H26, J3,
J25 ,K2,
K30, L25,
L27, L29,
M2, M6,
M26, M28,
N5, N25,
N29, P4,
Common return
for all power
inputs
VSS
Power
Analog
–
–
–
–
P30, R3,
R5, R25,
T2, T26,
U27, V28,
V30, W5,
W29, Y4,
Y12, Y18,
Y24,
AA3,AA9,
AA13,
AA19,
AA25, AB8,
AB14,
AB20,
AB26, AB30
RESERVED SIGNALS (NOT FOR USE IN SYSTEM)
RESERVED
_AA1
Pins should be
connected to VSS
AA1
B6
Input
Input
Input
Input
LVCMOS
LVCMOS
LVCMOS
LVCMOS
–
–
–
–
Pull-down
Pull-down
Pull-down
Pull-down
–
–
–
–
–
–
–
–
RESERVED
_B6
–
–
–
RESERVED
_T4
T4
RESERVED
_U5
U5
AA11, AC3,
C5, C9,
D10, D2,
E5,G5, H6,
P6, T6,
NO_CONN
ECT
DO NOT
CONNECT
–
–
–
–
–
–
U3, V2, V4,
W3, Y10,
Y2
10
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7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
(1)
MIN
MAX
UNIT
ELECTRICAL
(2) (3)
VCC
Voltage applied to VCC
Voltage applied to VCCI
–0.5
–0.5
–0.5
4
4
8
V
V
V
(2) (3)
VCCI
VCC2
(2) (3) (4)
Voltage applied to VVCC2
Micromirror clocking pulse waveform voltage applied to MBRST[15:0]
Input Pins (supplied by DLPA200)
VMBRST
–28
28
V
(4)
|VCC – VCCI
|
Supply voltage delta (absolute value)
0.3
V
V
(2)
Voltage applied to all other input pins
–0.5
VCC + 0.3
Maximum differential voltage, damage can occur to internal termination
resistor if exceeded, see Figure 2
|VID
|
700
mV
IOH
IOL
Current required from a high-level output
Current required from a low-level output
VOH = 2.4 V
VOL = 0.4 V
–20
15
mA
mA
ENVIRONMENTAL
(5)
Case temperature – operational
20
30
80
10
95
°C
°C
TC
(5)
Case temperature – non-operational
–40
(6)
TGRADIENT
RH
Device temperature gradient – operational
Relative humidity (non-condensing)
°C
%RH
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages referenced to VSS (ground).
(3) Voltages VCC, VCCI, and VCC2 are required for proper DMD operation.
(4) Exceeding the recommended allowable absolute voltage difference between VCC and VCCI may result in excess current draw. The
difference between VCC and VCCI, |VCC – VCCI|, should be less than the specified limit.
(5) DMD Temperature is the worst-case of any test point shown in Case Temperature, or the active array as calculated by the Micromirror
Array Temperature Calculation.
(6) As either measured, predicted, or both between any two points -- measured on the exterior of the package, or as predicted at any point
inside the micromirror array cavity. Refer to Case Temperature and Micromirror Array Temperature Calculation.
7.2 Storage Conditions
are applicable before the DMD is installed in the final product.
MIN
MAX
80
UNIT
°C
TDMD
RH
Storage temperature
–40
Relative humidity (non-condensing)
95
%RH
7.3 ESD Ratings
VALUE
±2000
<250
UNIT
All pins except MBRST[0:15]
MBRST[0:15] pins
Electrostatic
V(ESD)
Human-body model (HBM), per
ANSI/ESDA/JEDEC JS-001
V
(1)
discharge
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Manufacturing with
less than 500-V HBM is possible if necessary precautions are taken.
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7.4 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
(1)
MIN NOM
MAX
UNIT
ELECTRICAL
(2) (3)
VCC
Supply voltage for LVCMOS core logic
3.0
3.0
3.3
3.3
7.5
3.6
3.6
V
V
V
V
V
(2) (3)
VCCI
Supply voltage for LVDS receivers
(2) (3)
VCC2
Mirror electrode and HVCMOS supply voltage
7.25
–27
7.75
26.5
0.3
VMBRST
|VCC – VCCI
Clocking pulse waveform voltage applied to MBRST[15:0] input pins (supplied by DLPA200)
(3)
|
Supply voltage delta (absolute value)
ENVIRONMENTAL
(6)
mW/cm2
W/cm2
W
< 363 nm
2
2.5
3.7
11
(7)
363 to 400 nm
W/cm2
W
(4) (5)
(7)
Illumination power density
400 to 420 nm
16.2
11
W/cm2
W
(7)(8)
363 to 420 nm total
> 420 nm
16.2
(7)
W/cm2
°C
Thermally limited
(9) (10)
(11)
TC
Case/array temperature
20
30
(12)
TGRADIENT
RH
Device temperature gradient – operational
Relative humidity (non-condensing)
10
95
°C
%RH
(13)
Operating landed duty cycle
25%
(1) The functional performance of the device specified in this datasheet is achieved when operating the device within the limits defined by
the Recommended Operating Conditions. No level of performance is implied when operating the device above or below the
Recommended Operating Conditions limits.
(2) All voltages referenced to VSS (ground).
(3) Voltages VCC, VCCI, and VCC2, are required for proper DMD operation.
(4) Various application parameters can affect optimal, long-term performance of the DMD, including illumination spectrum, illumination
power density, micromirror landed duty cycle, ambient temperature (both storage and operating), case temperature, and power-on or
power-off duty cycle. TI recommends that application-specific effects be considered as early as possible in the design cycle.
(5) Total integrated illumination power density, above or below the indicated wavelength threshold or in the indicated wavelength range.
(6) The maximum operating conditions for operating temperature and illumination power density for wavelengths < 363 nm should not be
implemented simultaneously.
(7) Also limited by the resulting micromirror array temperature. Refer to Case Temperature and Micromirror Array Temperature Calculation
for information related to calculating the micromirror array temperature.
(8) The total integrated illumination power density from 363 to 420 nm shall not exceed 11 W/cm2 (or 16.2 W evenly distributed on the
active array area). Therefore if 2.5 W/cm2 of illumination is used in the 363 to 400 nm range, then illumination in the 400 to 420 nm
range must be limited to 8.5 W/cm2.
(9) In some applications, the total DMD heat load can be dominated by the amount of incident light energy absorbed. Refer to Micromirror
Array Temperature Calculation for further details.
(10) Temperature is the highest measured value of any test point shown in Figure 17 or the active array as calculated by the Micromirror
Array Temperature Calculation.
(11) Refer to Micromirror Array Temperature Calculation for thermal test point locations, package thermal resistance, and device
temperature calculation.
(12) As either measured, predicted, or both between any two points -- measured on the exterior of the package, or as predicted at any point
inside the micromirror array cavity. Refer to Case Temperature and Micromirror Array Temperature Calculation.
(13) Landed duty cycle refers to the percentage of time an individual micromirror spends landed in one state (12° or –12°) versus the other
state (–12° or 12°).
12
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7.5 Thermal Information
DLP7000UV
(1) (2)
THERMAL METRIC
FLP (LCCC)
203 PINS
0.9
UNIT
Active micromirror array resistance to TP1
°C/W
(1) The DMD is designed to conduct absorbed and dissipated heat to the back of the package where it can be removed by an appropriate
heat sink. The heat sink and cooling system must be capable of maintaining the package within the temperature range specified in the
Recommended Operating Conditions. The total heat load on the DMD is largely driven by the incident light absorbed by the active area;
although other contributions include light energy absorbed by the window aperture and electrical power dissipation of the array. Optical
systems should be designed to minimize the light energy falling outside the window clear aperture since any additional thermal load in
this area can significantly degrade the reliability of the device.
(2) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
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7.6 Electrical Characteristics
over the range of recommended supply voltage and recommended case operating temperature (unless otherwise noted)
PARAMETERS
TEST CONDITIONS
VCC = 3.0 V, IOH = –20 mA
MIN
TYP
MAX
UNIT
(1)
High-level output voltage
See Figure 10
,
VOH
VOL
2.4
V
(1)
Low-level output voltage
See Figure 10
,
VCC = 3.6 V, IOH = 15 mA
0.4
V
V
Clocking Pulse Waveform applied to
VMBRST MBRST[29:0] Input Pins (supplied
-27
26.5
by DLPA200)
(1)
IOZ
IOH
IOL
High impedance output current
VCC = 3.6 V
10
–20
µA
VOH = 2.4 V, VCC ≥ 3 V
VOH = 1.7 V, VCC ≥ 2.25 V
VOL = 0.4 V, VCC ≥ 3 V
VOL = 0.4 V, VCC ≥ 2.25 V
(1)
High-level output current
mA
–15
15
(1)
Low-level output current
mA
14
(1)
VIH
VIL
IIL
High-level input voltage
1.7
VCC + .3
0.7
V
V
(1)
Low-level input voltage
–0.3
(1)
Low-level input current
VCC = 3.6 V, VI = 0 V
VCC = 3.6 V, VI = VCC
VCC = 3.6 V
–60
µA
µA
mA
mA
mA
W
(1)
IIH
High-level input current
200
ICC
ICCI
ICC2
PD
ZIN
Current into VCC pin
1475
450
(2)
Current into VCCI pin
VCCI = 3.6 V
Current into VCC2 pin
Power dissipation
VCC2 = 8.75 V
25
2.0
Internal differential impedance
95
90
105
110
Ω
Line differential impedance (PWB,
Trace)
ZLINE
100
Ω
(1)
CI
Input capacitance
f = 1 MHz
f = 1 MHz
10
10
pF
pF
(1)
CO
CIM
Output capacitance
Input capacitance for MBRST[0:15]
pins
f = 1 MHz
220
270
pF
(1) Applies to LVCMOS pins only.
(2) Exceeding the maximum allowable absolute voltage difference between VCC and VCCI may result in excess current draw. See the
Absolute Maximum Ratings for details.
14
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7.7 LVDS Timing Requirements
over operating free-air temperature range (unless otherwise noted); see Figure 1
MIN
200
2.5
NOM
MAX
UNIT
MHz
ns
fDCLK_*
DCLK_* clock frequency {where * = [A, or B]}
Clock cycle - DLCK_*
400
tc
tw
Pulse width - DLCK_*
1.25
ns
ts
Setup time - D_*[15:0] and SCTRL_* before DCLK_*
Hold time, D_*[15:0] and SCTRL_* after DCLK_*
Skew between bus A and B
0.35
0.35
ns
th
ns
tskew
–1.25
1.25
ns
DCLK_AN
DCLK_AP
t
t
h
s
t
c
t
t
s
h
SCTRL_AN
SCTRL_AP
D_AN(15:0)
D_AP(15:0)
DCLK_BN
DCLK_BP
t
t
s
h
t
c
t
t
s
h
SCTRL_BN
SCTRL_BP
D_BN(15:0)
D_BP(15:0)
Figure 1. LVDS Timing Waveforms
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7.8 LVDS Waveform Requirements
over operating free-air temperature range (unless otherwise noted); see Figure 2
MIN
NOM
400
MAX
UNIT
mV
mV
mV
ps
|VID
|
Input differential voltage (absolute difference)
Common mode voltage
100
600
VCM
1200
VLVDS
LVDS voltage
0
100
100
2000
400
tr
tr
Rise time (20% to 80%)
Fall time (80% to 20%)
400
ps
VLVDS (v)
VLVDSmax = VCM + |½VID|
VLVDSmax
Tf (20% - 80%)
VLVDS = VCM +/- | 1/2 VID
|
VCM
VID
Tr (20% - 80%)
VLVDS min
VLVDS min = 0
Time
Figure 2. LVDS Waveform Requirements
16
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7.9 Serial Control Bus Timing Requirements
over operating free-air temperature range (unless otherwise noted); see Figure 3 and Figure 4
MIN
NOM
MAX
500
300
960
UNIT
kHz
ns
fSCP_CLK
SCP clock frequency
50
tSCP_SKEW
tSCP_DELAY
Time between valid SCP_DI and rising edge of SCP_CLK
Time between valid SCP_DO and rising edge of SCP_CLK
–300
ns
Time between falling edge of SCP_EN and the first rising edge of
SCP_CLK
t SCP_EN
30
ns
t_SCP
tf_SCP
Rise time for SCP signals
Fall time for SCP signals
200
200
ns
ns
t
f
= 1 / t
c
c
clock
SCPCLK
50%
50%
tSCP_SKEW
SCPDI
50%
tSCP_DELAY
SCPD0
50%
Figure 3. Serial Communications Bus Timing Parameters
tf_SCP
tr_SCP
Input Controller VCC
SCP_CLK,
SCP_DI,
SCP_EN
VCC/2
0 v
Figure 4. Serial Communications Bus Waveform Requirements
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MAX UNIT
7.10 Systems Mounting Interface Loads
PARAMETER
MIN
NOM
Thermal interface area (see Figure 5)
111
423
400
N
N
N
Maximum system mounting interface
load to be applied to the:
Electrical interface area
(1)
Datum A Interface area (see Figure 5 )
(1) Combined loads of the thermal and electrical interface areas in excess of Datum A load shall be evenly distributed outside the Datum A
area (423 + 111 – Datum A).
Thermal
Interface Area
Electrical
Interface Area
(all area less thermal interface)
Other Areas
Datum ‘A’ Area
Figure 5. System Interface Loads
18
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7.11 Micromirror Array Physical Characteristics
VALUE
1024
768
UNIT
micromirrors
micromirrors
µm
M
N
P
Number of active columns
Number of active rows
See Figure 6
Micromirror (pixel) pitch
13.68
14.008
10.506
6
Micromirror active array width
Micromirror active array height
Micromirror active border
M × P
mm
N × P
mm
(1)
Pond of micromirror (POM)
micromirrors/side
(1) The structure and qualities of the border around the active array includes a band of partially functional micromirrors called the POM.
These micromirrors are structurally and/or electrically prevented from tilting toward the bright or ON state, but still require an electrical
bias to tilt toward OFF.
0
1
2
3
DMD Active Array
N x P
M x N Micromirrors
N œ 4
N œ 3
N œ 2
N œ 1
M x P
P
Pond of micromirrors (POM) omitted for clarity.
Details omitted for clarity.
P
Not to scale.
P
P
Refer to Micromirror Array Physical Characteristics for M, N, and P specifications.
Figure 6. Micromirror Array Physical Characteristics
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7.12 Micromirror Array Optical Characteristics
TI assumes no responsibility for end-equipment optical performance. Achieving the desired end-equipment
optical performance involves making trade-offs between numerous component and system design parameters.
PARAMETER
TEST CONDITIONS
MIN
NOM
MAX
UNIT
DMD parked state (1) (2) (3), See
Figure 12
0
a
Micromirror tilt angle
degrees
DMD landed state (1) (4) (5)
See Figure 12
12
(1) (4) (6) (7) (8)
β
Micromirror tilt angle tolerance
Micromirror crossover time (9)
Micromirror switching time (10)
See Figure 12
–1
43
1
22
22
degrees
µs
4
13
µs
Array switching time at 400 MHz with global
reset (11)
µs
Non-adjacent micromirrors
Adjacent micromirrors
10
0
Non operating micromirrors (12)
micromirrors
degrees
Orientation of the micromirror axis-of-rotation
See Figure 11
44
45
46
(13)
363 to 420 nm, with all micromirrors
in the ON state
(14) (15)
Micromirror array optical efficiency
66%
(1) Measured relative to the plane formed by the overall micromirror array.
(2) Parking the micromirror array returns all of the micromirrors to an essentially flat (0˚) state (as measured relative to the plane formed by
the overall micromirror array).
(3) When the micromirror array is parked, the tilt angle of each individual micromirror is uncontrolled.
(4) Additional variation exists between the micromirror array and the package datums, as shown in the 机械、封装和可订购信息.
(5) When the micromirror array is landed, the tilt angle of each individual micromirror is dictated by the binary contents of the CMOS
memory cell associated with each individual micromirror. A binary value of 1 will result in a micromirror landing in an nominal angular
position of +12°. A binary value of 0 results in a micromirror landing in an nominal angular position of –12°.
(6) Represents the landed tilt angle variation relative to the Nominal landed tilt angle.
(7) Represents the variation that can occur between any two individual micromirrors, located on the same device or located on different
devices.
(8) For some applications, it is critical to account for the micromirror tilt angle variation in the overall System Optical Design. With some
System Optical Designs, the micromirror tilt angle variation within a device may result in perceivable non-uniformities in the light field
reflected from the micromirror array. With some System Optical Designs, the micromirror tilt angle variation between devices may result
in colorimetry variations and/or system contrast variations.
(9) Micromirror crossover time is primarily a function of the natural response time of the micromirrors and is the time it takes for the
micromirror to crossover to the other state, but does not include mechanical settling time.
(10) Micromirror switching time is the time before a micromirror may be addressed again. Crossover time plus mechanical settling time.
(11) Array switching is controlled and coordinated by the DLPC410 (DLPS024) and DLPA200 (DLPS015). Nominal Switching time depends
on the system implementation and represents the time for the entire micromirror array to be refreshed (array loaded plus reset and
mirror settling time).
(12) Non-operating micromirror is defined as a micromirror that is unable to transition nominally from the –12° position to +12° or vice versa.
(13) Measured relative to the package datums B and C, shown in the 机械、封装和可订购信息.
(14) The minimum or maximum DMD optical efficiency observed depends on numerous application-specific design variables, such as:
–
–
–
–
–
–
Illumination wavelength, bandwidth/line-width, degree of coherence
Illumination angle, plus angle tolerance
Illumination and projection aperture size, and location in the system optical path
IIlumination overfill of the DMD micromirror array
Aberrations present in the illumination source and/or path
Aberrations present in the projection path
The specified nominal DMD optical efficiency is based on the following use conditions:
–
–
–
–
–
Visible illumination (363 to 420 nm)
Input illumination optical axis oriented at 24° relative to the window normal
Projection optical axis oriented at 0° relative to the window normal
f / 3.0 illumination aperture
f / 2.4 projection aperture
Based on these use conditions, the nominal DMD optical efficiency results from the following four components:
20
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–
–
–
–
Micromirror array fill factor: nominally 92%
Micromirror array diffraction efficiency: nominally 85%
Micromirror surface reflectivity: nominally 88%
Window transmission: nominally 98% for wavelengths 363 nm to 420 nm, applies to all angles 0° to 30° AOI (Angle of Incidence)
(single pass, through two surface transitions)
(15) Does not account for the effect of micromirror switching duty cycle, which is application dependent. Micromirror switching duty cycle
represents the percentage of time that the micromirror is actually reflecting light from the optical illumination path to the optical projection
path. This duty cycle depends on the illumination aperture size, the projection aperture size, and the micromirror array update rate.
7.13 Window Characteristics
(1)
PARAMETER
Window material designation
Window refractive index
CONDITIONS
MIN
TYP
MAX UNIT
Corning 7056
At wavelength 589 nm
Per 25 mm
1.487
(2)
Window flatness
4
fringes
µm
(3)
Window artifact size
Within the Window Aperture
400
(4)
Window aperture
See
Illumination overfill
Refer to Illumination Overfill
Window transmittance, single–pass
through both surfaces and glass
Within the wavelength range 363 nm to 420 nm. Applies to all
angles 0 to 30 AOI
98%
(5)
(1) See Window Characteristics and Optics for more information.
(2) At a wavelength of 632.8 nm.
(3) See the 机械、封装和可订购信息 section at the end of this document for details regarding the size and location of the window aperture.
(4) For details regarding the size and location of the window aperture, see the package mechanical characteristics listed in the 机械、封装
和可订购信息 section.
(5) See the TI application report Wavelength Transmittance Considerations for DMD Window, DLPA031.
7.14 Chipset Component Usage Specification
The DLP7000UV is a component of one or more DLP chipsets. Reliable function and operation of the
DLP7000UV requires that it be used in conjunction with the other components of the applicable DLP chipset,
including those components that contain or implement TI DMD control technology. TI DMD control technology
consists of the TI technology and devices for operating or controlling a DLP DMD.
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8 Detailed Description
8.1 Overview
Optically, the DLP7000UV consists of 786432 highly reflective, digitally switchable, micrometer-sized mirrors
(micromirrors), organized in a two-dimensional array of 1024 micromirror columns by 768 micromirror rows
(Figure 11). Each aluminum micromirror is approximately 13.68 microns in size (see the Micromirror Pitch in
Figure 11), and is switchable between two discrete angular positions: –12° and +12°. The angular positions are
measured relative to a 0° flat state, which is parallel to the array plane (see Figure 12). The tilt direction is
perpendicular to the hinge-axis which is positioned diagonally relative to the overall array. The On State landed
position is directed towards Row 0, Column 0 (upper left) corner of the device package (see the Micromirror
Hinge-Axis Orientation in Figure 11). In the field of visual displays, the 1024 by 768 pixel resolution is referred to
as XGA.
Each individual micromirror is positioned over a corresponding CMOS memory cell. The angular position of a
specific micromirror is determined by the binary state (logic 0 or 1) of the corresponding CMOS memory cell
contents, after the micromirror clocking pulse is applied. The angular position (–12° or +12°) of the individual
micromirrors changes synchronously with a micromirror clocking pulse, rather than being synchronous with the
CMOS memory cell data update. Therefore, writing a logic 1 into a memory cell followed by a micromirror
clocking pulse will result in the corresponding micromirror switching to a +12° position. Writing a logic 0 into a
memory cell followed by a micromirror clocking pulse will result in the corresponding micromirror switching to a
–12° position.
Updating the angular position of the micromirror array consists of two steps. First, updating the contents of the
CMOS memory. Second, application of a Micromirror Clocking Pulse to all or a portion of the micromirror array
(depending upon the configuration of the system). Micromirror Clocking Pulses are generated externally by a
DLPA200, with application of the pulses being coordinated by the DLPC410 controller.
Around the perimeter of the 1024 by 768 array of micromirrors is a uniform band of active border micromirrors.
The pond of micromirror (POM) is not user-addressable. The border micromirrors land in the –12° position once
power has been applied to the device. There are 10 border micromirrors on each side of the 1024 by 768 active
array.
Figure 7 shows a DLPC410 and DLP7000UV Chipset Block Diagram. The DLPC410 and DLPA200 control and
coordinate the data loading and micromirror switching for reliable DLP7000UV operation. The DLPR410 is the
programmed PROM required to properly configure the DLPC410 controller. For more information on the chipset
components, see Application and Implementation. For a typical system application using the DLP Discovery 4100
chipset including the DLP7000UV, see Figure 19.
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8.2 Functional Block Diagram
DLP7000UV
Figure 7. DLPC410 and DLP7000UV Chipset Block Diagram
8.3 Feature Description
Table 1. DLPC410 DMD Types Overview
DMD
ARRAY
1024 × 768
PATTERNS/s
DATA RATE (Gbs)
25.6
MIRROR PITCH
(1)
DLP7000UV - 0.7” XGA
32552
13.6 µm
(1) This is for single block mode resets.
Figure 7 is a simplified system block diagram showing the use of the following components:
– Xilinx [XC5VLX30] FPGA configured to provide high-speed DMD data and control,
and DLPA200 timing and control
•
•
DLPC410
DLPR410
– [XCF16PFSG48C] serial flash PROM contains startup configuration information
(EEPROM)
•
•
DLPA200
– DMD micromirror driver for the DLP7000UV DMD
– Spatial Light Modulator (DMD)
DLP7000UV
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8.3.1 DLPC410 - Digital Controller for DLP Discovery 4100 Chipset
The DLP7000UV chipset includes the DLPC410 controller which provides a high-speed LVDS data and control
interface for DMD control. This interface is also connected to a second FPGA used to drive applications (not
included in the chipset). The DLPC410 generates DMD and DLPA200 initialization and control signals in
response to the inputs on the control interface.
For more information, see the DLPC410 data sheet (DLPS024).
8.3.2 DLPA200 DMD Micromirror Driver
DLPA200 micromirror driver provides the micromirror clocking pulse driver functions for the DMD. One DLPA200
is required for DLP7000UV.
For more information on the DLPA200, see the DLPA200 data sheet (DLPS015).
8.3.3 DLPR410 - PROM for DLP Discovery 4100 Chipset
The DLPC410 is configured at startup from the serial flash PROM. The contents of this PROM can not be
altered. For more information, see the DLPR410 data sheet (DLPS027) and the DLPC410 data sheet
(DLPS024).
8.3.4 DLP7000 - DLP 0.7 XGA 2xLVDS UV Type-A DMD
8.3.4.1 DLP7000UV Chipset Interfaces
This section will describe the interface between the different components included in the chipset. For more
information on component interfacing, see Application and Implementation.
8.3.4.1.1 DLPC410 Interface Description
8.3.4.1.1.1 DLPC410 IO
Table 2 describes the inputs and outputs of the DLPC410 to the user. For more details on these signals, see the
DLPC410 data sheet.
Table 2. Input/Output Description
PIN NAME
DESCRIPTION
I/O
I
ARST
Asynchronous active low reset
Reference clock, 50 MHz
CLKIN_R
I
DIN_[A,B,C,D](15:0)
DCLKIN[A,B,C,D]
DVALID[A,B,C,D]
ROWMD(1:0)
ROWAD(10:0)
BLK_AD(3:0)
BLK_MD(1:0)
PWR_FLOAT
DMD_TYPE(3:0)
RST_ACTIVE
INIT_ACTIVE
VLED0
LVDS DDR input for data bus A,B,C,D (15:0)
LVDS inputs for data clock (200 - 400 MHz) on bus A, B, C, and D
LVDS input used to start write sequence for bus A, B, C, and D
DMD row address and row counter control
DMD row address pointer
I
I
I
I
I
DMD mirror block address pointer
I
DMD mirror block reset and clear command modes
Used to float DMD mirrors before complete loss of power
DMD type in use
I
I
O
O
O
O
O
Indicates DMD mirror reset in progress
Initialization in progress
System heartbeat signal
VLED1
Denotes initialization complete
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8.3.4.1.1.2 Initialization
The INIT_ACTIVE (Table 2) signal indicates that the DLP7000UV, DLPA200, and DLPC410 are in an
initialization state after power is applied. During this initialization period, the DLPC410 is initializing the
DLP7000UV and DLPA200 by setting all internal registers to their correct states. When this signal goes low, the
system has completed initialization. System initialization takes approximately 220 ms to complete. Data and
command write cycles should not be asserted during the initialization.
During initialization the user must send a training pattern to the DLPC410 on all data and DVALID lines to
correctly align the data inputs to the data clock. For more information, see the DLPC410 data sheet – Interface
Training Pattern.
8.3.4.1.1.3 DMD Device Detection
The DLPC410 automatically detects the DMD type and device ID. DMD_TYPE (Table 2) is an output from the
DLPC410 that contains the DMD information. Only DMDs sold with the chipset or kit are recognized by the
automatic detection function. All other DMDs do not operate with the DLPC410.
8.3.4.1.1.4 Power Down
To ensure long term reliability of the DLP7000UV, a shutdown procedure must be executed. Prior to power
removal, assert the PWR_FLOAT (Table 2) signal and allow approximately 300 µs for the procedure to complete.
This procedure assures the mirrors are in a flat state.
8.3.4.2 DLPC410 to DMD Interface
8.3.4.2.1 DLPC410 to DMD IO Description
Table 3 lists the available controls and status pin names and their corresponding signal type, along with a brief
functional description.
Table 3. DLPC410 to DMD I/O Pin Descriptions
PIN NAME
DDC_DOUT_[A,B,C,D](15:0)
DDC_DCLKOUT_[A,B,C,D]
DDC_SCTRL_[A,B,C,D]
DESCRIPTION
I/O
O
LVDS DDR output to DMD data bus A, B, C, D (15:0)
LVDS output to DMD data clock A, B, C, D
LVDS DDR output to DMD data control A, B, C, D
O
O
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8.3.4.2.2 Data Flow
Figure 8 shows the data traffic through the DLPC410. Special considerations are necessary when laying out the
DLPC410 to allow best signal flow.
LVDS BUS D
sDIN_D(15:0)
sDCLK_D
LVDS BUS C
sDIN_C(15:0)
sDCLK_C
sDVALID_C
sDVALID_D
DLPC410
LVDS BUS D
sDOUT_D(15:0)
sDCLKOUT_D
sSCTRL_D
LVDS BUS A
sDOUT_A(15:0)
sDCLKOUT_A
sSCTRL_A
Figure 8. DLPC410 Data Flow
Two LVDS buses transfer the data from the user to the DLPC410. Each bus has its data clock that is input edge
aligned with the data (DCLK). Each bus also has its own validation signal that qualifies the data input to the
DLPC410 (DVALID).
Output LVDS buses transfer data from the DLPC410 to the DLP7000UV. Output buses LVDS A and LVDS B are
used as highlighted in Figure 8.
8.3.4.3 DLPC410 to DLPA200 Interface
8.3.4.3.1 DLPA200 Operation
The DLPA200 DMD Micromirror Driver is a mixed-signal Application Specific Integrated Circuit (ASIC) that
combines the necessary high-voltage power supply generation and Micromirror Clocking Pulse functions for a
family of DMDs. The DLPA200 is programmable and controllable to meet all current and anticipated DMD
requirements.
The DLPA200 operates from a +12 volt power supply input. For more detailed information on the DLPA200, see
the DLPA200 data sheet.
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8.3.4.3.2 DLPC410 to DLPA200 IO Description
The Serial Communications Port (SCP) is a full duplex, synchronous, character-oriented (byte) port that allows
exchange of commands from the DLPC410 to the DLPA200. One SCP bus is used for the DLP7000UV.
DLPA200
SCP bus
DLPC410
SCP bus
DLPA200
(Only with 1080p DMD)
Figure 9. Serial Port System Configuration
There are five signal lines associated with the SCP bus: SCPEN, SCPCK, SCPDI, SCPDO, and IRQ.
Table 4 lists the available controls and status pin names and their corresponding signal type, along with a brief
functional description.
Table 4. DLPC410 to DLPA200 I/O Pin Descriptions
PIN NAME
A_SCPEN
DESCRIPTION
Active low chip select for DLPA200 serial bus
DLPA200 control signal strobe
DLPA200 mode control
I/O
O
O
O
O
O
O
O
O
O
O
A_STROBE
A_MODE(1:0)
A_SEL(1:0)
A_ADDR(3:0)
B_SCPEN
DLPA200 select control
DLPA200 address control
Active low chip select for DLPA200 serial bus (2)
DLPA200 control signal strobe (2)
DLPA200 mode control
B_STROBE
B_MODE(1:0)
B_SEL(1:0)
B_ADDR(3:0)
DLPA200 select control
DLPA200 address control
The DLPA200 provides a variety of output options to the DMD by selecting logic control inputs: MODE[1:0],
SEL[1:0] and reset group address A[3:0] (Table 4). The MODE[1:0] input determines whether a single output, two
outputs, four outputs, or all outputs, will be selected. Output levels (VBIAS, VOFFSET, or VRESET) are selected
by SEL[1:0] pins. Selected outputs are tri-stated on the rising edge of the STROBE signal and latched to the
selected voltage level after a break-before-make delay. Outputs will remain latched at the last Micromirror
Clocking Pulse waveform level until the next Micromirror Clocking Pulse waveform cycle.
8.3.4.4 DLPA200 to DLP7000UV Interface Overview
The DLPA200 generates three voltages: VBIAS, VRESET, and VOFFSET that are supplied to the DMD MBRST
lines in various sequences through the Micromirror Clocking Pulse driver function. VOFFSET is also supplied
directly to the DMD as DMDVCC2. A fourth DMD power supply, DMDVCC, is supplied directly to the DMD by
regulators.
The function of the Micromirror Clocking Pulse driver is to switch selected outputs in patterns between the three
voltage levels (VBIAS, VRESET and VOFFSET) to generate one of several Micromirror Clocking Pulse
waveforms. The order of these Micromirror Clocking Pulse waveform events is controlled externally by the logic
control inputs and timed by the STROBE signal. DLPC410 automatically detects the DMD type and then uses the
DMD type to determine the appropriate Micromirror Clocking Pulse waveform.
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A direct Micromirror Clocking Pulse operation causes a mirror to transition directly from one latched state to the
next. The address must already be set up on the mirror electrodes when the Micromirror Clocking Pulse is
initiated. Where the desired mirror display period does not allow for time to set up the address, a Micromirror
Clocking Pulse with release can be performed. This operation allows the mirror to go to a relaxed state
regardless of the address while a new address is set up, after which the mirror can be driven to a new latched
state.
A mirror in the relaxed state typically reflects light into a system collection aperture and can be thought of as off
although the light is likely to be more than a mirror latched in the off state. System designers should carefully
evaluate the impact of relaxed mirror conditions on optical performance.
8.3.5 Measurement Conditions
The data sheet provides timing at the device pin. For output timing analysis, the tester pin electronics and its
transmission line effects must be taken into account. Figure 10 shows an equivalent test load circuit for the
output under test. The load capacitance value stated is only for characterization and measurement of AC timing
signals. This load capacitance value does not indicate the maximum load the device is capable of driving. All rise
and fall transition timing parameters are referenced to VIL MAX and VIH MIN for input clocks, VOL MAX and VOH
MIN for output clocks.
LOAD CIRCUIT
R
L
From Output
Under Test
Tester
Channel
C
C
= 50 pF
L
L
= 5 pF for Disable Time
Figure 10. Test Load Circuit for AC Timing Measurements
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Incident
Illumination
Package Pin
A1 Corner
Details Omitted For Clarity.
Not To Scale.
DMD
Micromirror
Array
Active Micromirror Array
(Border micromirrors eliminated for clarity)
0
Nœ1
Micromirror Pitch
Micromirror Hinge-Axis Orientation
P (um)
—On-State“
Tilt Direction
45°
—Off-State“
Tilt Direction
P (um)
Figure 11. DMD Micromirror Array, Pitch, and Hinge-Axis Orientation
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Package Pin
A1 Corner
DLP7000UV
Two Two
“On-State” “Off-State”
Micromirrors Micromirrors
For Reference
Flat-State
( “parked” )
Micromirror Position
a
b
-a
b
Silicon Substrate
Silicon Substrate
“On-State”
Micromirror
“Off-State”
Micromirror
Figure 12. Micromirror Landed Positions and Light Paths
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8.4 Device Functional Modes
8.4.1 DMD Operation
The DLP7000UV has only one functional mode, it is set to be highly optimized for low latency and high speed in
generating mirror clocking pulses and timings.
When operated with the DLPC410 controller in conjunction with the DLPA200 driver, the DLP7000UV can be
operated in several display modes. The DLP7000UV is loaded as 16 blocks of 48 rows each. Figure 13,
Figure 14, Figure 15, and Figure 16 show how the image is loaded by the different Micromirror Clocking Pulse
modes.
There are four Micromirror Clocking Pulse modes that determine which blocks are reset when a Micromirror
Clocking Pulse command is issued:
•
•
•
•
Single block mode
Dual block mode
Quad block mode
Global mode
8.4.1.1 Single Block Mode
In single block mode, a single block can be loaded and reset in any order. After a block is loaded, it can be reset
to transfer the information to the mechanical state of the mirrors.
Data Loaded
Reset
Figure 13. Single Block Mode
8.4.1.2 Dual Block Mode
In dual block mode, reset blocks are paired together as follows (0-1), (2-3), (4-5) . . . (14-15). These pairs can be
reset in any order. After data is loaded a pair can be reset to transfer the information to the mechanical state of
the mirrors.
Data Loaded
Reset
Figure 14. Dual Block Mode
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Device Functional Modes (continued)
8.4.1.3 Quad Block Mode
In quad block mode, reset blocks are grouped together in fours as follows (0-3), (4-7), (8-11) and (12-15). Each
quad group can be randomly addressed and reset. After a quad group is loaded, it can be reset to transfer the
information to the mechanical state of the mirrors.
Data Loaded
Reset
Figure 15. Quad Block Mode
8.4.1.4 Global Mode
In global mode, all reset blocks are grouped into a single group and reset together. The entire DMD must be
loaded with the desired data before issuing a Global Reset to transfer the information to the mechanical state of
the mirrors.
Reset
Data Loaded
Figure 16. Global Mode
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8.5 Window Characteristics and Optics
NOTE
TI assumes no responsibility for image quality artifacts or DMD failures caused by optical
system operating conditions exceeding limits described previously.
8.5.1 Optical Interface and System Image Quality
TI assumes no responsibility for end-equipment optical performance. Achieving the desired end-equipment
optical performance involves making trade-offs between numerous component and system design parameters.
Optimizing system optical performance and image quality strongly relate to optical system design parameter
trades. Although it is not possible to anticipate every conceivable application, projector image quality and optical
performance is contingent on compliance to the optical system operating conditions described in the following
sections.
8.5.2 Numerical Aperture and Stray Light Control
The angle defined by the numerical aperture of the illumination and projection optics at the DMD optical area
should be the same. This angle should not exceed the nominal device mirror tilt angle unless appropriate
apertures are added in the illumination and/or projection pupils to block out flat-state and stray light from the
projection lens. The mirror tilt angle defines DMD capability to separate the ON optical path from any other light
path, including undesirable flat-state specular reflections from the DMD window, DMD border structures, or other
system surfaces near the DMD such as prism or lens surfaces. If the numerical aperture exceeds the mirror tilt
angle, or if the projection numerical aperture angle is more than two degrees larger than the illumination
numerical aperture angle, objectionable artifacts in the display’s border and/or active area could occur.
8.5.3 Pupil Match
TI recommends the exit pupil of the illumination is nominally centered within 2° (two degrees) of the entrance
pupil of the projection optics. Misalignment of pupils can create objectionable artifacts in the display’s border
and/or active area, which may require additional system apertures to control, especially if the numerical aperture
of the system exceeds the pixel tilt angle.
8.5.4 Illumination Overfill
The active area of the device is surrounded by an aperture on the inside DMD window surface that masks
structures of the DMD device assembly from normal view. The aperture is sized to anticipate several optical
operating conditions. Overfill light illuminating the window aperture can create artifacts from the edge of the
window aperture opening and other surface anomalies that may be visible on the screen. The illumination optical
system should be designed to limit light flux incident anywhere on the window aperture from exceeding
approximately 10% of the average flux level in the active area. Depending on the particular system’s optical
architecture, overfill light may have to be further reduced below the suggested 10% level in order to be
acceptable.
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8.6 Micromirror Array Temperature Calculation
Achieving optimal DMD performance requires proper management of the maximum DMD case temperature, the
maximum temperature of any individual micromirror in the active array, the maximum temperature of the window
aperture, and the temperature gradient between case temperature and the predicted micromirror array
temperature (See Figure 17).
See the Recommended Operating Conditions for applicable temperature limits.
8.6.1 Package Thermal Resistance
The DMD is designed to conduct absorbed and dissipated heat to the back of the Type A package where it can
be removed by an appropriate heat sink. The heat sink and cooling system must be capable of maintaining the
package within the specified operational temperatures, refer to Figure 17. The total heat load on the DMD is
typically driven by the incident light absorbed by the active area; although other contributions include light energy
absorbed by the window aperture and electrical power dissipation of the array.
8.6.2 Case Temperature
The temperature of the DMD case can be measured directly. For consistency, Thermal Test Point locations 1, 2,
and 3 are defined, as shown in Figure 17.
3X 15.88
TP1
TP3
TP2
TP3 (TP2)
Array
TP2
TP3
TP1
10.16
Figure 17. Thermal Test Point Location
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Micromirror Array Temperature Calculation (continued)
8.6.3 Micromirror Array Temperature Calculation
Active array temperature cannot be measured directly; therefore, it must be computed analytically from
measurement points on the outside of the package, package thermal resistance, electrical power, and
illumination heat load. The relationship between array temperature and the reference ceramic temperature (test
point number 1 in Figure 17) is provided by the following equations:
TArray = Measured Ceramic temperature at location (test point number 3) + (Temperature increase due to power incident
to the array × array-to-ceramic resistance)
(1)
TArray = TCeramic+ (QArray × RArray-To-Ceramic
)
where
•
•
•
•
TCeramic = Measured ceramic temperature (°C) at location (test point number 3)
RArray-To-Ceramic = DMD package thermal resistance from array to outside ceramic (°C/W)
QArray = Total DMD array power, which is both electrical plus absorbed on the DMD active array (W)
QArray = QElectrical + (QIllumination × DMD absorption constant (0.42))
where
•
•
•
QElectrical = Approximate nominal electrical internal power dissipation (W)
QIllumination = [Illumination power density × illumination area on DMD] (W)
DMD absorption constant = 0.42
(2)
The electrical power dissipation of the DMD is variable and depends on the voltages, data rates and operating
frequencies. The nominal electrical power dissipation of the DMD is variable and depends on the operating state
of mirrors and the intensity of the light source. The DMD absorption constant of 0.42 assumes nominal operation
with an illumination distribution of 83.7% on the active array, 11.9% on the array border, and 4.4% on the window
aperture. A system aperture may be required to limit power incident on the package aperture since this area
absorbs much more efficiently than the array.
Sample Calculation:
•
•
Illumination power density = 2 W/cm2
Illumination area = (1.4008 cm × 1.0506 cm) / 83.7% = 1.76 cm2 (assumes 83.7% on the active array and
16.3% overfill)
•
•
•
•
•
•
QIllumination= 2 W/cm2 × 1.76 cm2 = 3.52 W
QElectrical= 2.0 W
RArray-To-Ceramic = 0.9°C/W
TCeramic= 20°C (measured on ceramic)
QArray = 2.0 W + (3.52 W × 0.42) = 3.48 W
TArray = 20°C + (3.48 W × 0.9°C/W) =23.1°C
(3)
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8.7 Micromirror Landed-On/Landed-Off Duty Cycle
8.7.1 Definition of Micromirror Landed-On/Landed-Off Duty Cycle
The micromirror landed-on/landed-off duty cycle (landed duty cycle) denotes the amount of time (as a
percentage) that an individual micromirror is landed in the On–state versus the amount of time the same
micromirror is landed in the Off–state.
As an example, a landed duty cycle of 100/0 indicates that the referenced pixel is in the On-state 100% of the
time (and in the Off-state 0% of the time); whereas 0/100 would indicate that the pixel is in the Off-state 100% of
the time. Likewise, 50/50 indicates that the pixel is On 50% of the time and Off 50% of the time.
Note that when assessing landed duty cycle, the time spent switching from one state (ON or OFF) to the other
state (OFF or ON) is considered negligible and is thus ignored.
Since a micromirror can only be landed in one state or the other (On or Off), the two numbers (percentages)
always add to 100.
8.7.2 Landed Duty Cycle and Useful Life of the DMD
Knowing the long-term average landed duty cycle (of the end product or application) is important because
subjecting all (or a portion) of the DMD’s micromirror array (also called the active array) to an asymmetric landed
duty cycle for a prolonged period of time can reduce the DMD’s usable life.
Note that it is the symmetry/asymmetry of the landed duty cycle that is of relevance. The symmetry of the landed
duty cycle is determined by how close the two numbers (percentages) are to being equal. For example, a landed
duty cycle of 50/50 is perfectly symmetrical whereas a landed duty cycle of 100/0 or 0/100 is perfectly
asymmetrical.
8.7.3 Landed Duty Cycle and Operational DMD Temperature
Operational DMD Temperature and Landed Duty Cycle interact to affect the DMD’s usable life, and this
interaction can be exploited to reduce the impact that an asymmetrical Landed Duty Cycle has on the DMD’s
usable life.
In practice, this curve specifies the Maximum Operating DMD Temperature that the DMD should be operated at
for a given long-term average Landed Duty Cycle.
8.7.4 Estimating the Long-Term Average Landed Duty Cycle of a Product or Application
During a given period of time, the Landed Duty Cycle of a given pixel follows from the image content being
displayed by that pixel.
For example, in the simplest case, when displaying pure-white on a given pixel for a given time period, that pixel
will experience a 100/0 Landed Duty Cycle during that time period. Likewise, when displaying pure-black, the
pixel will experience a 0/100 Landed Duty Cycle.
Between the two extremes (ignoring for the moment color and any image processing that may be applied to an
incoming image), the Landed Duty Cycle tracks one-to-one with the gray scale value, as shown in Table 5.
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Table 5. Grayscale Value and Landed Duty Cycle
GRAYSCALE VALUE
LANDED DUTY CYCLE
0%
10%
20%
30%
40%
50%
60%
70%
80%
90%
100%
0/100
10/90
20/80
30/70
40/60
50/50
60/40
70/30
80/20
90/10
100/0
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
The DLP7000UV devices require they be coupled with the DLPC410 controller to provide a reliable solution for
many different applications. The DMDs are spatial light modulators which reflect incoming light from an
illumination source to one of two directions, with the primary direction being into a projection collection optic.
Each application is derived primarily from the optical architecture of the system and the format of the data
coming into the DLPC410. Applications of interest include lithography, 3D Printing, medical systems, and
compressive sensing.
9.1.1 DMD Reflectivity Characteristics
TI assumes no responsibility for end-equipment reflectivity performance. Achieving the desired end-equipment
reflectivity performance involves making trade-offs between numerous component and system design
parameters. DMD reflectivity characteristics over UV exposure times are represented in Figure 18.
100
90
80
70
60
50
40
30
20
20èC
25èC
10
30èC
0
0
10000
20000
30000
40000
50000
Exposure Hours
D001
2.3 W/cm2, 363 to 400 nm
Figure 18. Nominal DMD Relative Reflectivity Percentage and Exposure Hours
DMD reflectivity includes micromirror surface reflectivity and window transmission. The DMD was characterized
for DMD reflectivity using a broadband light source (200-W metal-halide lamp). Data is based off of a 2.3-W/cm2
UV exposure at the DMD surface (363-nm peak output) using a 363-nm high-pass filter between the light source
and the DMD. (Contact your local Texas Instruments representative for additional information about power
density measurements and UV filter details.)
9.1.2 Design Considerations Influencing DMD Reflectivity
Optimal, long-term performance of the digital micromirror device (DMD) can be affected by various application
parameters. Below is a list of some of these application parameters and includes high level design
recommendations that may help extend relative reflectivity from time zero:
•
Illumination spectrum – using longer wavelengths for operation while preventing shorter wavelengths from
striking the DMD
•
•
•
Illumination power density – using lower power density
DMD case temperature – operating the DMD with the case temperature at the low end of its specification
Cumulative incident illumination – limiting the total hours of UV illumination exposure when the DMD is not
38
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DLP7000UV
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Application Information (continued)
actively steering UV light in the application. For example, a design might include a shutter to block the
illumination or LED illumination where the LEDs can be strobed off during periods not requiring UV exposure.
•
Micromirror landed duty cycle – applying a 50/50 duty cycle pattern during periods where operational patterns
are not required.
9.2 Typical Application
OPTICAL
SENSOR
(CAMERA)
LED
DRIVERS
LEDS
O
LED
SENSORS
LVDS BUS (A,B)
DDC_DCLK, DVALID, DDC_DIN(15:0)
LVDS BUS (A,B)
DDC_DCLKOUT, DDCSCTRL, DDC_DOUT(15:0)
USER
INTERFACE
SCP BUS
SCPCLK, SCPDO, SCPDI, DMD_SCPENZ, A_SCPENZ
ROW and BLOCK SIGNALS
ROWMD(1:0), ROWAD(10:0), BLKMD(1:0), BLKAD(3:0), RST2BLKZ
CONTROL SIGNALS
COMP_DATA, NS_FLIP, WDT_ENBLZ, PWR_FLOAT
DLP7000UV
DLPA200 CONTROL
A_MODE(1:0), A_SEL(1:0),
DLPA200
MBRST1_(15:0)
CONNECTIVITY
USER - MAIN
DLPC410 INFO SIGNALS
RST_ACTIVE, INIT_ACTIVE, ECP2_FINISHED,
DMD_TYPE(3:0), DDC_VERSION(2:0)
(USB, ETHERNET, ETC.)
A_ADDR(3:0), OEZ, INIT
PROCESSOR / FPGA
A
DLPC410
PGM SIGNALS
PROM_CCK_DDC, PROGB_DDC,
PROM_DO_DDC, DONE_DDC, INTB_DDC
DLPR410
VOLATILE
and
NON-VOLATILE
STORAGE
JTAG
VLED0
VLED1
ARSTZ
CLKIN_R
OSC
50 MHz
DMD_RESET
POWER MANAGMENT
~
Figure 19. DLPC410 and DLP7000UV Embedded Example Block Diagram
9.2.1 Design Requirements
All applications using the DLP7000UV chipset require both the controller and the DMD components for operation.
The system also requires an external parallel flash memory device loaded with the DLPC410 Configuration and
Support Firmware. The chipset has several system interfaces and requires some support circuitry. The following
interfaces and support circuitry are required:
•
DLPC410 system interfaces:
–
–
–
–
–
Control interface
Trigger interface
Input data interface
Illumination interface
Reference clock
•
DLP7000UV interfaces:
–
–
–
–
–
DLPC410 to DLP7000UV digital data
DLPC410 to DLP7000UV control interface
DLPC410 to DLP7000UV micromirror reset control interface
DLPC410 to DLPA200 micromirror driver
DLPA200 to DLP7000UV micromirror reset
Device Description:
The DLP7000UV XGA chipset offers developers a convenient way to design a wide variety of industrial, medical,
telecom and advanced display applications by delivering maximum flexibility in formatting data, sequencing data,
and light patterns.
The DLP7000UV XGA chipset includes the following four components: DMD Digital Controller (DLPC410),
EEPROM (DLPR410), DMD Micromirror Driver (DLPA200), and a DMD (DLP7000UV).
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Typical Application (continued)
DLPC410 Digital Controller for DLP Discovery 4100 chipset
•
•
•
Provides high speed LVDS data and control interface to the DLP7000UV.
Drives mirror clocking pulse and timing information to the DLPA200.
Supports random row addressing.
DLPR410 PROM for DLP Discovery 4100 chipset
Contains startup configuration information for the DLPC410.
DLPA200 DMD Micromirror Driver
Generates Micromirror Clocking Pulse control (sometimes referred to as a Reset) of DMD mirrors.
DLP7000UV DLP 0.7XGA 2xLVDS UV Type-A DMD
•
•
•
Steers light in two digital positions (+12° and –12°) using 1024 × 768 micromirror array of aluminum mirrors.
Table 6. DLP Discovery 4100 Chipset Configuration: 0.7 XGA Chipset
QTY
TI PART
DLP7000UV
DLPC410
DLPR410
DLPA200
DESCRIPTION
DLP 0.7XGA 2xLVDS UV Type-A DMD
Digital Controller for DLP Discovery 4100 chipset
DLP Discovery 4100 configuration PROM
DMD micromirror driver
1
1
1
1
Reliable function and operation of DLP7000UV XGA chipsets require the components be used in conjunction
with each other. This document describes the proper integration and use of the DLP7000UV XGA chipset
components.
The DLP7000UV XGA chipset can be combined with a user programmable Application FPGA (not included) to
create high performance systems.
9.2.2 Detailed Design Procedure
The DLP7000UV DMD is designed with a window which allows transmission of Ultra-Violet (UV) light. This
makes it well suited for UV applications requiring fast, spatially programmable light patterns using the micromirror
array. UV wavelengths can affect the DMD differently than visible wavelengths. There are system level
considerations which should be leveraged when designing systems using this DMD.
40
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9.2.3 Application Curve
100
90
80
70
UV AOI = 0o
60
50
40
30
20
10
0
300
320
340
360
380
400
420
440
460
480
500
Wavelength (nm)
Type A UVA on 7056 glass (3-mm thick)
Figure 20. Corning 7056 Nominal UV Window Transmittance (Maximum Transmission Region)
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10 Power Supply Recommendations
10.1 Power-Up Sequence (Handled by the DLPC410)
The sequence of events for DMD system power-up is:
1. Apply logic supply voltages to the DLPA200 and to the DMD according to DMD specifications.
2. Place DLPA200 drivers into high impedance states.
3. Turn on DLPA200 bias, offset, or reset supplies according to driver specifications.
4. After all supply voltages are assured to be within the limits specified and with all micromirror clocking pulse
operations logically suspended, enable all drivers to either VOFFSET or VBIAS level.
5. Begin micromirror clocking pulse operations.
Repeated failure to adhere to the prescribed power-up and power-down procedures may affect device reliability.
The DLP7000UV power-up and power-down procedures are defined by the DLPC410 data sheet (DLPS024).
These procedures must be followed to ensure reliable operation of the device.
11 Layout
11.1 Layout Guidelines
The DLP7000UV is part of a chipset that is controlled by the DLPC410 in conjunction with the DLPA200. These
guidelines are targeted at designing a PCB board with these components.
11.1.1 Impedance Requirements
Signals should be routed to have a matched impedance of 50 Ω ±10% except for LVDS differential pairs
(DMD_DAT_Xnn, DMD_DCKL_Xn, and DMD_SCTRL_Xn), which should be matched to 100 Ω ±10% across
each pair.
11.1.2 PCB Signal Routing
When designing a PCB board for the DLP7000UV controlled by the DLPC410 in conjunction with the DLPA200,
the following are recommended:
Signal trace corners should be no sharper than 45°. Adjacent signal layers should have the predominate traces
routed orthogonal to each other. TI recommends that critical signals be hand routed in the following order: DDR2
Memory, DMD (LVDS signals), then DLPA200 signals.
TI does not recommend signal routing on power or ground planes.
TI does not recommend ground plane slots.
High speed signal traces should not crossover slots in adjacent power and/or ground planes.
Table 7. Important Signal Trace Constraints
SIGNAL
CONSTRAINTS
P-to-N data, clock, and SCTRL: <10 mils (0.25 mm); Pair-to-pair <10 mils (0.25 mm); Bundle-to-bundle
<2000 mils (50 mm, for example DMD_DAT_Ann to DMD_DAT_Bnn)
Trace width: 4 mil (0.1 mm)
Trace spacing: In ball field – 4 mil (0.11 mm); PCB etch – 14 mil (0.36 mm)
Maximum recommended trace length <6 inches (150 mm)
LVDS (DMD_DAT_xnn,
DMD_DCKL_xn, and
DMD_SCTRL_xn)
Table 8. Power Trace Widths and Spacing
MINIMUM TRACE
MINIMUM TRACE
SPACING
SIGNAL NAME
LAYOUT REQUIREMENTS
WIDTH
GND
Maximize
5 mil (0.13 mm)
10 mil (0.25 mm)
10 mil (0.25 mm)
Maximize trace width to connecting pin as a minimum
VCC, VCC2
MBRST[15:0]
20 mil (0.51 mm)
10 mil (0.25 mm)
42
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11.1.3 Fiducials
Fiducials for automatic component insertion should be 0.05-inch copper with a 0.1-inch cutout (antipad). Fiducials
for optical auto insertion are placed on three corners of both sides of the PCB.
11.1.4 PCB Layout Guidelines
A target impedance of 50 Ω for single ended signals and 100 Ω between LVDS signals is specified for all signal
layers.
11.1.4.1 DMD Interface
The digital interface from the DLPC410 to the DMD are LVDS signals that run at clock rates up to 400 MHz. Data
is clocked into the DMD on both the rising and falling edge of the clock, so the data rate is 800 MHz. The LVDS
signals should have 100-Ω differential impedance. The differential signals should be matched but kept as short
as possible. Parallel termination at the LVDS receiver is in the DMD; therefore, on board termination is not
necessary.
11.1.4.1.1 Trace Length Matching
The DLPC410 DMD data signals require precise length matching. Differential signals should have impedance of
100 Ω (with 5% tolerance). It is important that the propagation delays are matched. The maximum differential pair
uncoupled length is 100 mils with a relative propagation delay of ±25 mil between the p and n. Matching all
signals exactly will maximize the channel margin. The signal path through all boards, flex cables and internal
DMD routing must be considered in this calculation.
11.1.4.2 DLP7000UV Decoupling
General decoupling capacitors for the DLP7000UV should be distributed around the PCB and placed to minimize
the distance from IC voltage and ground pads. Each decoupling capacitor (0.1 µF recommended) should have
vias directly to the ground and power planes. Via sharing between components (discreet or integrated) is
discouraged. The power and ground pads of the DLP7000UV should be tied to the voltage and ground planes
with their own vias.
11.1.4.2.1 Decoupling Capacitors
Decoupling capacitors should be placed to minimize the distance from the decoupling capacitor to the supply and
ground pin of the component. It is recommended that the placement of and routing for the decoupling capacitors
meet the following guidelines:
•
The supply voltage pin of the capacitor should be located close to the device supply voltage pin(s). The
decoupling capacitor should have vias to ground and voltage planes. The device can be connected directly to
the decoupling capacitor (no via) if the trace length is less than 0.1 inch. Otherwise, the component should be
tied to the voltage or ground plane through separate vias.
•
•
•
•
The trace lengths of the voltage and ground connections for decoupling capacitors and components should
be less than 0.1 inch to minimize inductance.
The trace width of the power and ground connection to decoupling capacitors and components should be as
wide as possible to minimize inductance.
Connecting decoupling capacitors to ground and power planes through multiple vias can reduce inductance
and improve noise performance.
Decoupling performance can be improved by utilizing low ESR and low ESL capacitors.
11.1.4.3 VCC and VCC2
The VCC pins of the DMD should be connected directly to the DMD VCC plane. Decoupling for the VCC should
be distributed around the DMD and placed to minimize the distance from the voltage and ground pads. Each
decoupling capacitor should have vias directly connected to the ground and power planes. The VCC and GND
pads of the DMD should be tied to the VCC and ground planes with their own vias.
The VCC2 voltage can be routed to the DMD as a trace. Decoupling capacitors should be placed to minimize the
distance from the VCC2 and ground pads of the DMD. Using wide etch from the decoupling capacitors to the
DMD connection will reduce inductance and improve decoupling performance.
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11.1.4.4 DMD Layout
See the respective sections in this data sheet for package dimensions, timing and pin out information.
11.1.4.5 DLPA200
The DLPA200 generates the micromirror clocking pulses for the DMD. The DMD-drive outputs from the
DLPA200 (MBRST[15:0]) should be routed with minimum trace width of 11 mil and a minimum spacing of 15 mil.
The VCC and VCC2 traces from the output capacitors to the DLPA200 should also be routed with a minimum
trace width and spacing of 11 mil and 15 mil, respectively. See the DLPA200 customer data sheet (DLPS015) for
mechanical package and layout information.
11.2 Layout Example
For LVDS (and other differential signal) pairs and groups, it is important to match trace lengths. In the area of the
dashed lines, Figure 21 shows correct matching of signal pair lengths with serpentine sections to maintain the
correct impedance.
Figure 21. Mitering LVDS Traces to Match Lengths
44
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12 器件和文档支持
12.1 器件支持
12.1.1 器件命名规则
图 22 提供了读取任一 DLP 器件完整器件名称的图例。
图 22. 器件命名规则
12.1.1.1 器件标记
器件标记由 图 23 中显示的字段组成。
TI Internal Numbering
2-Dimensional Matrix Code
(DMD Part Number and
Serial Number)
DMD Part Number
YYYYYYY
DLP7000UVFLP
GHXXXXX LLLLLLM
LLLLLL
Part 2 of Serial Number
(7 characters)
Part 1 of Serial Number
(7 characters)
TI Internal Numbering
图 23. 器件标记
12.2 文档支持
12.2.1 相关文档
以下文档包含关于使用 DLP7000UV 器件的更多信息:
表 9. 相关文档
文档标题
文档链接
《适用于 DLP Discovery 4100 芯片组的 DLPC410 数字控制器产品说明书》
《DLPA200 DMD 微镜驱动器产品说明书》
DLPS024
DLPS015
DLPS027
《适用于 DLP Discovery 4100 芯片组的 DLPR410 PROM 产品说明书》
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12.3 相关链接
下面的表格列出了快速访问链接。类别包括技术文档、支持与社区资源、工具和软件,以及申请样片或购买产品的
快速链接。
表 10. 相关链接
器件
产品文件夹
请单击此处
请单击此处
请单击此处
请单击此处
样片与购买
请单击此处
请单击此处
请单击此处
请单击此处
技术文档
请单击此处
请单击此处
请单击此处
请单击此处
工具和软件
请单击此处
请单击此处
请单击此处
请单击此处
支持和社区
请单击此处
请单击此处
请单击此处
请单击此处
DLP7000UV
DLPA200
DLPC410
DLPR410
46
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12.4 社区资源
下列链接提供到 TI 社区资源的连接。链接的内容由各个分销商“按照原样”提供。这些内容并不构成 TI 技术规范,
并且不一定反映 TI 的观点;请参阅 TI 的 《使用条款》。
TI E2E™ 在线社区 TI 的工程师对工程师 (E2E) 社区。此社区的创建目的在于促进工程师之间的协作。在
e2e.ti.com 中,您可以咨询问题、分享知识、拓展思路并与同行工程师一道帮助解决问题。
设计支持
TI 参考设计支持 可帮助您快速查找有帮助的 E2E 论坛、设计支持工具以及技术支持的联系信息。
12.5 商标
Discovery, E2E are trademarks of Texas Instruments.
DLP is a registered trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
12.6 静电放电警告
这些装置包含有限的内置 ESD 保护。 存储或装卸时,应将导线一起截短或将装置放置于导电泡棉中,以防止 MOS 门极遭受静电损
伤。
12.7 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 机械、封装和可订购信息
以下页面包含机械、封装和可订购信息。这些信息是指定器件的最新可用数据。这些数据如有变更,恕不另行通知
和修订此文档。如欲获取此产品说明书的浏览器版本,请参阅左侧的导航。
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47
PACKAGE OPTION ADDENDUM
www.ti.com
16-Dec-2022
PACKAGING INFORMATION
Orderable Device
Status Package Type Package Pins Package
Eco Plan
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
Samples
Drawing
Qty
(1)
(2)
(3)
(4/5)
(6)
DLP7000UVFLP
ACTIVE
CLGA
FLP
203
18
RoHS & Green
NI-PD-AU
N / A for Pkg Type
20 to 30
Samples
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
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