DSLVDS1001DBVT [TI]

400Mbps LVDS 单路高速差动驱动器 | DBV | 5 | -40 to 85;
DSLVDS1001DBVT
型号: DSLVDS1001DBVT
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

400Mbps LVDS 单路高速差动驱动器 | DBV | 5 | -40 to 85

驱动 驱动器
文件: 总27页 (文件大小:1435K)
中文:  中文翻译
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DSLVDS1001  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
DSLVDS1001 400Mbps 单通道 LVDS 驱动器  
1 特性  
3 说明  
1
旨在用于信号传输速率高达 400Mbps 的应用  
DSLVDS1001 器件是一款单通道、低电压差动信号  
(LVDS) 驱动器,专为需要低功耗、低噪声和高数据速  
率的 应用 而设计。此外,它还可以尽可能减小短路故  
障电流。该器件旨在使用 LVDS 技术支持高达  
400Mbps (200MHz) 的数据速率。  
单个 3.3V 电源(3V 3.6V 的范围)  
700ps100ps 典型值)最大差动偏斜  
1.5ns 最大传播延迟  
驱动小摆幅 (±350mV) 差动信号电平  
断电保护(TRI-STATE 中的输出)  
直通引脚排列可简化 PCB 布局  
低功耗(3.3V 典型电压下为 23mW)  
5 引脚 SOT-23 封装  
DSLVDS1001 接受 3.3V LVCMOS/LVTTL 输入电平,  
输出具有低电磁干扰 (EMI) 的低电压(±350mV 典型  
值)差动信号。该器件采用旨在轻松实施 PCB 布局的  
5 引脚 SOT-23 封装。DSLVDS1001 可与配套的单线  
接收器 DSLVDS1002 或任何 LVDS 接收器配对,提  
供高速 LVDS 接口。  
符合或超出 ANSI TIA/EIA-644-A 标准  
工业工作温度范围(–40°C +85°C)  
器件信息(1)  
2 应用  
器件型号  
封装  
SOT-23 (5)  
封装尺寸(标称值)  
板对板通信  
DSLVDS1001  
2.90mm × 1.60mm  
测试和测量  
电机驱动器  
LED 视频墙  
无线基础设施  
电信基础设施  
多功能打印机  
NIC 卡  
(1) 如需了解所有可用封装,请参阅数据表末尾的可订购产品附  
录。  
功能图  
OUT +  
LVCMOS/LVTLL IN  
机架式服务器  
超声波扫描仪  
OUT -  
典型应用  
VCC  
GND  
OUT +  
OUT -  
LVCMOS/LVTTL IN  
Driver  
Receiver  
DSLVDS1001  
DSLVDS1002  
1
本文档旨在为方便起见,提供有关 TI 产品中文版本的信息,以确认产品的概要。 有关适用的官方英文版本的最新信息,请访问 www.ti.com,其内容始终优先。 TI 不保证翻译的准确  
性和有效性。 在实际设计之前,请务必参考最新版本的英文版本。  
English Data Sheet: SNLS622  
 
 
 
DSLVDS1001  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
www.ti.com.cn  
目录  
1
2
3
4
5
6
特性.......................................................................... 1  
应用.......................................................................... 1  
说明.......................................................................... 1  
修订历史记录 ........................................................... 2  
Pin Configuration and Functions......................... 3  
Specifications......................................................... 4  
6.1 Absolute Maximum Ratings ...................................... 4  
6.2 ESD Ratings ............................................................ 4  
6.3 Recommended Operating Conditions....................... 4  
6.4 Thermal Information.................................................. 4  
6.5 Electrical Characteristics........................................... 5  
6.6 Switching Characteristics.......................................... 5  
6.7 Typical Characteristics ............................................. 6  
Parameter Measurement Information .................. 7  
Detailed Description .............................................. 8  
8.1 Overview ................................................................... 8  
8.2 Functional Block Diagram ......................................... 8  
8.3 Feature Description................................................... 8  
8.4 Device Functional Modes.......................................... 8  
9
Application and Implementation .......................... 9  
9.1 Application Information.............................................. 9  
9.2 Typical Application .................................................... 9  
9.3 Design Requirements................................................ 9  
9.4 Detailed Design Procedure ..................................... 10  
9.5 Application Curve.................................................... 13  
10 Power Supply Recommendations ..................... 14  
10.1 Power Supply Considerations............................... 14  
11 Layout................................................................... 14  
11.1 Layout Guidelines ................................................. 14  
11.2 Layout Example .................................................... 18  
12 器件和文档支持 ..................................................... 19  
12.1 文档支持................................................................ 19  
12.2 接收文档更新通知 ................................................. 19  
12.3 社区资源................................................................ 19  
12.4 ....................................................................... 19  
12.5 静电放电警告......................................................... 19  
12.6 术语表 ................................................................... 19  
13 机械、封装和可订购信息....................................... 19  
7
8
4 修订历史记录  
注:之前版本的页码可能与当前版本有所不同。  
Changes from Original (July 2018) to Revision A  
Page  
将器件状态从预告信息更改为生产数据” ............................................................................................................................. 1  
添加了文档支持 部分 ............................................................................................................................................................ 19  
2
Copyright © 2018, Texas Instruments Incorporated  
 
DSLVDS1001  
www.ti.com.cn  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
5 Pin Configuration and Functions  
DVB Package  
5-Pin SOT-23  
Top View  
(1) See Package Number DBV (R-PDSO-G5)  
Pin Functions  
PIN  
I/O  
DESCRIPTION  
NO.  
1
NAME  
VDD  
I
I
Power Supply Pin, +3.3 V ± 0.3 V  
Ground Pin  
2
GND  
3
OUT-  
O
O
I
Inverting Driver Output Pin  
Noninverting Driver Output Pin  
LVCMOS/LVTTL Driver Input Pin  
4
OUT+  
5
LVCMOS/LVTTL IN  
Copyright © 2018, Texas Instruments Incorporated  
3
DSLVDS1001  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
www.ti.com.cn  
6 Specifications  
6.1 Absolute Maximum Ratings  
over operating free-air temperature range (unless otherwise noted)(1)  
MIN  
–0.3  
–0.3  
–0.3  
MAX  
4
UNIT  
V
Supply Voltage  
VDD  
LVCMOS input voltage (TTL IN)  
LVDS output voltage (OUT±)  
LVDS output short circuit current  
Lead Temperature – Soldering  
Maximum Junction Temperature  
Storage temperature, Tstg  
3.6  
3.9  
24  
V
V
mA  
°C  
°C  
°C  
260  
150  
150  
65  
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings  
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended  
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
6.2 ESD Ratings  
VALUE  
UNIT  
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)  
±9000  
V(ESD)  
Electrostatic discharge  
V
Charged-device model (CDM), per JEDEC specification JESD22-  
C101(2)  
±2000  
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Pins listed as ±9000  
V may actually have higher performance.  
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. Pins listed as ±2000  
V may actually have higher performance.  
6.3 Recommended Operating Conditions  
MIN  
3
TYP  
3.3  
MAX  
3.6  
UNIT  
V
Supply Voltage (VDD  
)
Temperature (TA)  
–40  
+25  
+85  
°C  
6.4 Thermal Information  
DSLVDS1001  
DBV (SOT-23)  
5 PINS  
179.4  
THERMAL METRIC(1)  
UNIT  
RθJA  
Junction-to-ambient thermal resistance  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
RθJC(top)  
RθJB  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance  
88.7  
36.2  
ψJT  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case (bottom) thermal resistance  
4.6  
ψJB  
35.7  
RθJC(bot)  
N/A  
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application  
report (SPRA953).  
4
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DSLVDS1001  
www.ti.com.cn  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
6.5 Electrical Characteristics  
Over Recommended Supply Voltage and Operating Temperature ranges, unless otherwise specified.(1)(2)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
|VOD  
|
Output Differential Voltage  
RL = 100 Ω  
(7)  
250  
350  
450  
mV  
OUT+, OUT– Pins  
ΔVOD  
VOD Magnitude Change  
Offset Voltage  
RL = 100 Ω  
(8)  
OUT+, OUT– Pins  
3
35  
1.375  
25  
mV  
V
VOS  
RL = 100 Ω  
(7)  
OUT+, OUT– Pins  
1.125  
1.25  
ΔVOS  
Offset Magnitude Change  
Power-off Leakage  
RL = 100 Ω  
(7)  
OUT+, OUT– Pins  
mV  
IOFF  
IOS  
VOUT = 3.6 V or GND, VDD = 0 V  
OUT+, OUT– Pins  
±2  
5  
5  
±15  
20  
12  
μA  
mA  
mA  
Output Short Circuit  
Current(3)  
VOUT+ and VOUT= 0 V  
OUT+, OUT– Pins  
IOSD  
Differential Output Short  
Circuit Current(3)  
VOD = 0 V  
OUT+, OUT– Pins  
VIH  
VIL  
IIH  
Input High Voltage  
Input Low Voltage  
Input High Current  
TTL IN Pin  
TTL IN Pin  
2
VDD  
0.8  
V
V
GND  
VIN = 3.3 V or 2.4 V  
TTL IN Pin  
±2  
±2  
±15  
μA  
IIL  
Input Low Current  
VIN = GND or 0.5 V  
TTL IN Pin  
±15  
μA  
CIN  
IDD  
Input Capacitance  
TTL IN Pin  
3
5
7
pF  
Power Supply Current  
No Load  
VIN = VDD or GND  
VIN = VDD or GND  
8
mA  
RL = 100 Ω  
10  
(1) Current into device pins is defined as positive. Current out of device pins is defined as negative. All voltages are referenced to ground  
except VOD  
.
(2) All typicals are given for: VDD = +3.3 V and TA = +25°C.  
(3) Output short circuit current (IOS) is specified as magnitude only, minus sign indicates direction only.  
6.6 Switching Characteristics  
Over Recommended Supply Voltage and Operating Temperature Ranges, unless otherwise specified.(1)(2)(3)(4)  
PARAMETER  
TEST CONDITIONS  
RL = 100Ω, CL = 15 pF  
(9 and 10)  
MIN  
0.5  
0.5  
0
TYP  
1
MAX UNIT  
tPHLD  
tPLHD  
tSKD1  
tSKD4  
tr  
Differential Propagation Delay High to Low  
1.5  
1.5  
0.7  
1.2  
1
ns  
ns  
Differential Propagation Delay Low to High  
1.1  
0.1  
0.4  
0.5  
0.5  
250  
(5)  
Differential Pulse Skew |tPHLD tPLHD  
Differential Part to Part Skew(6)  
Rise Time  
|
ns  
0
ns  
0.2  
0.2  
200  
ns  
tf  
Fall Time  
1
ns  
fMAX  
Maximum Operating Frequency(7)  
MHz  
(1) All typicals are given for: VDD = +3.3 V and TA = +25°C.  
(2) These parameters are specified by design, and not tested in production. The limits are based on statistical analysis of the device  
performance over PVT (process, voltage, temperature) ranges.  
(3) CL includes probe and fixture capacitance.  
(4) Generator waveform for all tests unless otherwise specified: f = 1 MHz, ZO = 50 Ω, tr 1 ns, tf 1 ns (10%-90%).  
(5) tSKD1, |tPHLD tPLHD|, is the magnitude difference in differential propagation delay time between the positive going edge and the negative  
going edge of the same channel.  
(6) tSKD2, part to part skew, is the differential channel to channel skew of any event between devices. This specification applies to devices  
over recommended operating temperature and voltage ranges, and across process distribution. tSKD4 is defined as |Max Min|  
differential propagation delay.  
(7) fMAX generator input conditions: tr = tf < 1 ns (0% to 100%), 50% duty cycle, 0V to 3V. Output criteria: duty cycle = 45%/55%, VOD > 250  
mV. The parameter is specified by design. The limit is based on the statistical analysis of the device over the PVT range by the  
transitions times (tTLH and tTHL).  
Copyright © 2018, Texas Instruments Incorporated  
5
DSLVDS1001  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
www.ti.com.cn  
6.7 Typical Characteristics  
1. Loaded Supply Current vs Power Supply Voltage  
2. No Load Supply Current vs Power Supply Voltage  
3. Output Short-Circuit Current vs Power Supply Voltage  
4. Differential Output Short-Circuit Current vs Power  
Supply Voltage  
5. Output Differential Voltage vs Power Supply Voltage  
6. Offset Voltage vs Power Supply Voltage  
6
版权 © 2018, Texas Instruments Incorporated  
DSLVDS1001  
www.ti.com.cn  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
7 Parameter Measurement Information  
7. Differential Driver DC Test Circuit  
8. Differential Driver Full Load DC Test Circuit  
9. Differential Driver Propagation Delay and Transition Time Test Circuit  
10. Differential Driver Propagation Delay and Transition Time Waveforms  
版权 © 2018, Texas Instruments Incorporated  
7
DSLVDS1001  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
www.ti.com.cn  
8 Detailed Description  
8.1 Overview  
The DSLVDS1001 device is a single-channel, low-voltage differential signaling (LVDS) line driver. It operates  
from a single supply that is nominally 3.3-V, but can be as low as 3-V and as high as 3.6-V. The input signal to  
the DSLVDS1001 is an LVCMOS/LVTTL signal. The output of the device is a differential signal complying with  
the LVDS standard (TIA/EIA-644). The differential output signal operates with a signal level of 350 mV,  
nominally, at a common-mode voltage of 1.2 V. This low differential output voltage results in low emmsions  
durning electromagnetic compatability (EMC) testing. The differential nature of the output provides immunity to  
common-mode coupled signals that the driven signal may experience. The DSLVDS1001 device is intended to  
drive a 100-Ω transmission line. This transmission line may be a printed-circuit board (PCB) or cabled  
interconnect. With transmission lines, the optimum signal quality and power delivery is reached when the  
transmission line is terminated with a load equal to the characteristic impedance of the interconnect. Likewise,  
the driven 100-Ω transmission line should be terminated with a matched resistance.  
8.2 Functional Block Diagram  
OUT +  
LVCMOS/LVTLL IN  
OUT -  
8.3 Feature Description  
8.3.1 DSLVDS1001 Driver Functionality  
As can be seen in 1, the driver single-ended input to differential output relationship is defined. When the driver  
input is left open, the differential output is undefined.  
1. DSLVDS1001 Driver Functionality  
INPUT  
OUTPUTS  
LVCMOS/LVTTL IN  
OUT +  
OUT -  
H
L
H
L
?
L
H
?
Open  
8.3.2 Driver Output Voltage and Power-On Reset  
The DSLVDS1001 driver operates and meets all the specified performance requirements for supply voltages in  
the range of 3 V to 3.6 V. When the supply voltage drops below 1.5-V (or is turning on and has not yet reached  
1.5-V), power-on reset circuitry set the driver output to a high-impedance state.  
8.3.3 Driver Offset  
An LVDS-compliant driver is required to maintain the common-mode output voltage at 1.2 V (±75 mV). The  
DSLVDS1001 incorporates sense circuitry and a control loop to source common-mode current and keep the  
output signal within specified values. Further, the device maintains the output common-mode voltage at this set  
point over the full 3-V to 3.6-V supply range.  
8.4 Device Functional Modes  
The device has one mode of operation that applies when operated within the Recommended Operating  
Conditions.  
8
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DSLVDS1001  
www.ti.com.cn  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
9 Application and Implementation  
Information in the following applications sections is not part of the TI component  
specification, and TI does not warrant its accuracy or completeness. TI’s customers are  
responsible for determining suitability of components for their purposes. Customers should  
validate and test their design implementation to confirm system functionality.  
9.1 Application Information  
The DSLVDS1001 device is a single-channel LVDS driver. The functionality of this device is simple, yet  
extremely flexible, leading to its use in designs ranging from wireless base stations to desktop computers. The  
varied class of potential applications share features and applications discussed in the paragraphs below.  
9.2 Typical Application  
9.2.1 Point-to-Point Communications  
The most basic application for LVDS buffers, as found in this data sheet, is for point-to-point communications of  
digital data, as shown in 11.  
VCC  
GND  
OUT +  
OUT -  
LVCMOS/LVTTL IN  
Driver  
Receiver  
DSLVDS1001  
DSLVDS1002  
11. Typical Application  
A point-to-point communications channel has a single transmitter (driver) and a single receiver. This  
communications topology is often referred to as simplex. In 11, the driver receives a single-ended input signal  
and the receiver outputs a single-ended recovered signal. The LVDS driver converts the single-ended input to a  
differential signal for transmission over a balanced interconnecting media of 100-Ω characteristic impedance. The  
conversion from a single-ended signal to an LVDS signal retains the digital data payload while translating to a  
signal whose features are more appropriate for communication over extended distances or in a noisy  
environment.  
9.3 Design Requirements  
2 shows the design parameters for this example.  
2. Design Parameters  
DESIGN PARAMETERS  
Driver Supply Voltage (VCC  
Driver Input Voltage  
EXAMPLE VALUE  
3 to 3.6 V  
0 to 3.6 V  
DC to 400 Mbps  
100 Ω  
)
Driver Signaling Rate  
Interconnect Characteristic Impedance  
Termination Resistance  
100 Ω  
Number of Receiver Nodes  
1
Ground shift between driver and receiver  
±1 V  
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9
 
 
DSLVDS1001  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
www.ti.com.cn  
9.4 Detailed Design Procedure  
9.4.1 Driver Supply Voltage  
The DSLVDS1001 driver is operated from a single supply. The device can support operation with a supply as low  
as 3 V and as high as 3.6 V. The driver output voltage is dependent upon the chosen supply voltage. The  
minimum output voltage stays within the specified LVDS limits (247 mV to 450 mV) for a 3.3 V supply. If the  
supply range is between 3 V and 3.6 V, the minimum output voltage may be as low as 150 mV. If a  
communication link is designed to operate with a supply within this lower range, the channel noise margin must  
be looked at carefully to ensure error-free operation.  
9.4.2 Driver Bypass Capacitance  
Bypass capacitors play a key role in power distribution circuitry. Specifically, they create low-impedance paths  
between power and ground. At low frequencies, a good digital power supply offers very low-impedance paths  
between its terminals. However, as higher frequency currents propagate through power traces, the source is  
quite often incapable of maintaining a low-impedance path to ground. Bypass capacitors are used to address this  
shortcoming. Usually, large bypass capacitors (10 μF to 1000 μF) at the board-level do a good job up into the  
kHz range. Due to their size and length of their leads, they tend to have large inductance values at the switching  
frequencies of modern digital circuitry. To solve this problem, one must resort to the use of smaller capacitors  
(nF to μF range) installed locally next to the integrated circuit.  
Multilayer ceramic chip or surface-mount capacitors (size 0603 or 0805) minimize lead inductances of bypass  
capacitors in high-speed environments, because their lead inductance is about 1 nH. For comparison purposes,  
a typical capacitor with leads has a lead inductance around 5 nH.  
The value of the bypass capacitors used locally with LVDS chips can be determined by the following formula  
according to Johnson(1), equations 8.18 to 8.21. A conservative rise time of 200 ps and a worst-case change in  
supply current of 1 A covers the whole range of LVDS devices offered by Texas Instruments. In this example, the  
maximum power supply noise tolerated is 200 mV. This figure varies, however, depending on the noise budget  
(1)  
available in the design.  
DIMaximum Step Change Supply Current  
æ
ö
Cchip  
=
´ TRise Time  
ç
÷
DVMaximum Power Supply Noise  
è
ø
(1)  
(2)  
1A  
æ
ö
CLVDS  
=
´ 200 ps = 0.001mF  
ç
è
÷
ø
0.2V  
12 lowers lead inductance and covers intermediate frequencies between the board-level capacitor (>10 µF)  
and the value of capacitance found above (0.001 µF). Place the smallest value of capacitance as close to the  
chip as possible.  
3.3 V  
0.1 µF  
0.001 µF  
12. Recommended LVDS Bypass Capacitor Layout  
9.4.3 Driver Input Voltage  
The DSLVDS1001 input is designed to support a wide input voltage range. The input stage can accept signals as  
high as 3.6 V.  
9.4.4 Driver Output Voltage  
The DSLVDS1001 driver output is a 1.2-V common-mode voltage, with a nominal differential output signal of 350  
mV. This 350 mV is the absolute value of the differential swing (VOD = |V+– V|). The peak-to-peak differential  
voltage is twice this value, or 700 mV.  
(1) Howard Johnson & Martin Graham.1993. High Speed Digital Design – A Handbook of Black Magic. Prentice Hall PRT. ISBN number  
013395724.  
10  
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DSLVDS1001  
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ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
Detailed Design Procedure (接下页)  
In this example, the LVDS receiver thresholds are ±100 mV. With these receiver decision thresholds, it is clear  
that the disadvantage of operating the driver with a lower supply will be noise margin. With fully-compliant LVDS  
drivers and receivers, TI expects a minimum noise margin of approximately 150 mV (247-mV minimum output  
voltage – 100-mV maximum input requirement). If the DSLVDS1001 operates within the 3 V to 3.6 V supply  
range, the minimum noise margin will drop to 150 mV.  
9.4.5 Interconnecting Media  
The physical communication channel between the driver and the receiver may be any balanced paired metal  
conductors meeting the requirements of the LVDS standard, with the key points included here. This media may  
be a twisted pair, a twinax cable, a flat ribbon cable, or PCB traces.  
The nominal characteristic impedance of the interconnect should be between 100 Ω and 120 Ω with a variation  
no more than 10% (90 Ω to 132 Ω).  
9.4.6 PCB Transmission Lines  
As per the LVDS Owner's Manual Design Guide, 4th Edition (SNLA187), 13 depicts several transmission line  
structures commonly used in printed-circuit boards (PCBs). Each structure has a signal line and a return path  
with a uniform cross-section along its length. A microstrip is a signal trace on the top (or bottom) layer, separated  
by a dielectric layer from its return path in a ground or power plane. A stripline is a signal trace in the inner layer,  
with a dielectric layer in between a ground plane above and below the signal trace. The dimensions of the  
structure and the dielectric material properties determine the characteristic impedance of the transmission line  
(also called controlled-impedance transmission line).  
When two signal lines are placed close by, they form a pair of coupled transmission lines. 13 shows examples  
of edge-coupled microstrip lines, and edge-coupled or broad-side-coupled striplines. When excited by differential  
signals, the coupled transmission line is referred to as a differential pair. The characteristic impedance of each  
line is called odd-mode impedance. The sum of the odd-mode impedances of each line is the differential  
impedance of the differential pair. In addition to the trace dimensions and dielectric material properties, the  
spacing between the two traces determines the mutual coupling and impacts the differential impedance. When  
the two lines are immediately adjacent (like when S is less than 2W, for example), the differential pair is called a  
tightly-coupled differential pair. To maintain constant differential impedance along the length, it is important to  
keep the trace width and spacing uniform along the length, as well as maintain good symmetry between the two  
lines.  
版权 © 2018, Texas Instruments Incorporated  
11  
DSLVDS1001  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
www.ti.com.cn  
Detailed Design Procedure (接下页)  
Single-Ended Microstrip  
Single-Ended Stripline  
W
W
T
H
H
T
H
«
5.98 H  
0.8 W + T  
÷
1.9 2 H+ T  
87  
[
]
60  
Z0  
=
ln  
Z0  
=
ln  
÷
÷
er +1.41  
0.8 W + T  
[
]
er  
«
Edge-Coupled  
Edge-Coupled  
S
S
H
H
Differential Microstrip  
Differential Stripline  
s
s
÷
÷
-0.96 ì  
-2.9 ì  
H
H
Zdiff = 2 ì Z0  
ì
1- 0.48 ì e  
Zdiff = 2 ì Z0  
ì
1- 0.347e  
«
÷
«
÷
Co-Planar Coupled  
Microstrips  
Broad-Side Coupled  
Striplines  
W
W
W
G
S
G
H
S
H
13. Controlled-Impedance Transmission Lines  
9.4.7 Termination Resistor  
As shown earlier, an LVDS communication channel employs a current source driving a transmission line that is  
terminated with a resistive load. This load serves to convert the transmitted current into a voltage at the receiver  
input. To ensure incident wave switching (which is necessary to operate the channel at the highest signaling  
rate), the termination resistance should be matched to the characteristic impedance of the transmission line. The  
designer should ensure that the termination resistance is within 10% of the nominal media characteristic  
impedance. If the transmission line is targeted for 100-Ω impedance, the termination resistance should be  
between 90 Ω and 110 Ω.  
The line termination resistance should be placed as close to the receiver as possible to minimize the stub length  
from the resistor to the receiver.  
Remember to only place line termination resistors at the end(s) of the transmission line in these multidrop  
topologies.  
12  
版权 © 2018, Texas Instruments Incorporated  
 
DSLVDS1001  
www.ti.com.cn  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
9.5 Application Curve  
14. DSLVDS1001 Performance: Data Rate vs Cable Length  
版权 © 2018, Texas Instruments Incorporated  
13  
DSLVDS1001  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
www.ti.com.cn  
10 Power Supply Recommendations  
10.1 Power Supply Considerations  
The DSLVDS1001 driver is designed to operate from a single power supply with supply voltage in the range of 3  
V to 3.6 V. In a typical application, a driver and a receiver may be on separate boards, or even separate  
equipment. In these cases, separate supplies would be used at each location. The expected ground potential  
difference between the driver power supply and the receiver power supply would be less than |±1 V|. Board level  
and local device level bypass capacitance should be used.  
11 Layout  
11.1 Layout Guidelines  
11.1.1 Microstrip vs. Stripline Topologies  
As per the LVDS Application and Data Handbook (SLLD009), printed-circuit boards usually offer designers two  
transmission line options: microstrip and stripline. Microstrips are traces on the outer layer of a PCB, as shown in  
15.  
15. Microstrip Topology  
On the other hand, striplines are traces between two ground planes. Striplines are less prone to emissions and  
susceptibility problems because the reference planes effectively shield the embedded traces. However, from the  
standpoint of high-speed transmission, juxtaposing two planes creates additional capacitance. TI recommends  
routing LVDS signals on microstrip transmission lines, if possible. The PCB traces allow designers to specify the  
necessary tolerances for ZO based on the overall noise budget and reflection allowances. Footnotes 1(2), 2(3)  
,
and 3(4) provide formulas for ZO and tPD for differential and single-ended traces.  
(2) (3) (4)  
16. Stripline Topology  
(2) Howard Johnson & Martin Graham.1993. High Speed Digital Design – A Handbook of Black Magic. Prentice Hall PRT. ISBN number  
013395724.  
(3) Mark I. Montrose. 1996. Printed Circuit Board Design Techniques for EMC Compliance. IEEE Press. ISBN number 0780311310.  
(4) Clyde F. Coombs, Jr. Ed, Printed Circuits Handbook, McGraw Hill, ISBN number 0070127549.  
14  
版权 © 2018, Texas Instruments Incorporated  
 
DSLVDS1001  
www.ti.com.cn  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
Layout Guidelines (接下页)  
11.1.2 Dielectric Type and Board Construction  
The speeds at which signals travel across the board dictates the choice of dielectric. FR-4, or equivalent, usually  
provides adequate performance for use with LVDS signals. If rise or fall times of LVCMOS/LVTTL signals are  
less than 500 ps, empirical results indicate that a material with a dielectric constant near 3.4, such as Rogers™  
4350 or Nelco N4000-13 is better suited. When the designer chooses the dielectric, there are several parameters  
pertaining to the board construction that can affect performance. The following set of guidelines were developed  
experimentally through several designs involving LVDS devices:  
Copper weight: 15 g or 1/2 oz start, plated to 30 g or 1 oz  
All exposed circuitry should be solder-plated (60/40) to 7.62 μm or 0.0003 in (minimum).  
Copper plating should be 25.4 μm or 0.001 in (minimum) in plated-through-holes.  
Solder mask over bare copper with solder hot-air leveling  
11.1.3 Recommended Stack Layout  
Following the choice of dielectrics and design specifications, the designer must decide how many levels to use in  
the stack. To reduce the LVCMOS/LVTTL to LVDS crosstalk, it is a good practice to have at least two separate  
signal planes as shown in 17.  
Layer 1: Routed Plane (LVDS Signals)  
Layer 2: Ground Plane  
Layer 3: Power Plane  
Layer 4: Routed Plane (TTL/CMOS Signals)  
17. Four-Layer PCB  
The separation between layers 2 and 3 should be 127 μm (0.005 in). By keeping the  
power and ground planes tightly coupled, the increased capacitance acts as a bypass for  
transients.  
One of the most common stack configurations is the six-layer board, as shown in 18.  
Layer 1: Routed Plane (LVDS Signals)  
Layer 2: Ground Plane  
Layer 3: Power Plane  
Layer 4: Ground Plane  
Layer 5: Ground Plane  
Layer 4: Routed Plane (TTL Signals)  
18. Six-Layer PCB  
In this particular configuration, it is possible to isolate each signal layer from the power plane by at least one  
ground plane. The result is improved signal integrity, but fabrication is more expensive. Using the 6-layer board is  
preferable, because it offers the layout designer more flexibility in varying the distance between signal layers and  
referenced planes, in addition to ensuring reference to a ground plane for signal layers 1 and 6.  
11.1.4 Separation Between Traces  
The separation between traces can depend on several factors, but the amount of coupling that can be tolerated  
usually dictates the actual separation. Low-noise coupling requires close coupling between the differential pair of  
an LVDS link to benefit from the electromagnetic field cancellation. The traces should be 100-differential and  
thus coupled in the manner that best fits this requirement. In addition, differential pairs should have the same  
electrical length to ensure that they are balanced, thus minimizing problems with skew and signal reflection.  
版权 © 2018, Texas Instruments Incorporated  
15  
 
 
DSLVDS1001  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
www.ti.com.cn  
Layout Guidelines (接下页)  
In the case of two adjacent single-ended traces, one should use the 3-W rule: the distance between two traces  
must be greater than two times the width of a single trace, or three times its width measured from trace center to  
trace center. This increased separation effectively reduces the potential for crosstalk. The same rule should be  
applied to the separation between adjacent LVDS differential pairs, whether the traces are edge-coupled or  
broad-side-coupled.  
W
LVDS  
Pair  
Minimum spacing as  
defined by PCB vendor  
Differential Traces  
S =  
W
í 2 W  
Single-Ended Traces  
TTL/CMOS  
Trace  
W
19. 3-W Rule for Single-Ended and Differential Traces (Top View)  
Exercise caution when using autorouters, because they do not always account for all  
factors affecting crosstalk and signal reflection. For instance, it is best to avoid sharp 90°  
turns to prevent discontinuities in the signal path. Using successive 45° turns tends to  
minimize reflections.  
11.1.5 Crosstalk and Ground Bounce Minimization  
To reduce crosstalk, it is important to provide a return path to high-frequency currents that is as close as possible  
to its originating trace. A ground plane usually achieves this. Because the returning currents always choose the  
path of lowest inductance, they are most likely to return directly under the original trace, thus minimizing  
crosstalk. Lowering the area of the current loop lowers the potential for crosstalk. Traces kept as short as  
possible with an uninterrupted ground plane running beneath them emit the minimum amount of electromagnetic  
field strength. Discontinuities in the ground plane increase the return path inductance and should be avoided.  
11.1.6 Decoupling  
Each power or ground lead of a high-speed device should be connected to the PCB through a low inductance  
path. For best results, one or more vias are used to connect a power or ground pin to the nearby plane. Ideally,  
via placement is immediately adjacent to the pin to avoid adding trace inductance. Placing a power plane closer  
to the top of the board reduces the effective via length and its associated inductance.  
V
Via  
GND  
Via  
CC  
TOP signal layer + GND fill  
1 plane  
4 mil  
6 mil  
V
DD  
2 mil  
Buried capacitor  
>
GND plane  
Signal layer  
GND plane  
Signal layers  
V
plane  
CC  
Signal layer  
GND plane  
Buried capacitor  
>
V
2 plane  
DD  
4 mil  
6 mil  
BOTTOM signal layer + GND fill  
Typical 12-Layer PCB  
20. Low-Inductance, High-Capacitance Power Connection  
16  
版权 © 2018, Texas Instruments Incorporated  
DSLVDS1001  
www.ti.com.cn  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
Layout Guidelines (接下页)  
Bypass capacitors should be placed close to VDD pins. They can be placed conveniently near the corners or  
underneath the package to minimize the loop area. This extends the useful frequency range of the added  
capacitance. Small-physical-size capacitors, such as 0402 or even 0201, or X7R surface-mount capacitors  
should be used to minimize body inductance of capacitors. Each bypass capacitor is connected to the power and  
ground plane through vias tangent to the pads of the capacitor as shown in 21(a).  
An X7R surface-mount capacitor of size 0402 has about 0.5-nH body inductance. At frequencies above 30 MHz  
or so, X7R capacitors behave as low-impedance inductors. To extend the operating frequency range to a few  
hundred MHz, an array of different capacitor values like 100 pF, 1 nF, 0.03 μF, and 0.1 μF are commonly used in  
parallel. The most effective bypass capacitor can be built using sandwiched layers of power and ground at a  
separation of 2 to 3 mils. With a 2-mil FR4 dielectric, there is approximately 500 pF per square inch of PCB.  
Refer back to 13 for some examples. Many high-speed devices provide a low-inductance GND connection on  
the backside of the package. This center dap must be connected to a ground plane through an array of vias. The  
via array reduces the effective inductance to ground and enhances the thermal performance of the small Surface  
Mount Technology (SMT) package. Placing vias around the perimeter of the dap connection ensures proper heat  
spreading and the lowest possible die temperature. Placing high-performance devices on opposing sides of the  
PCB using two GND planes (as shown in 13) creates multiple paths for heat transfer. Often thermal PCB  
issues are the result of one device adding heat to another, resulting in a very high local temperature. Multiple  
paths for heat transfer minimize this possibility. In many cases, the GND dap that is so important for heat  
dissipation makes the optimal decoupling layout impossible to achieve due to insufficient pad-to-dap spacing as  
shown in 21(b). When this occurs, placing the decoupling capacitor on the backside of the board keeps the  
extra inductance to a minimum. It is important to place the VDD via as close to the device pin as possible while  
still allowing for sufficient solder mask coverage. If the via is left open, solder may flow from the pad and into the  
via barrel. This will result in a poor solder connection.  
V
DD  
INœ  
0402  
(a)  
IN+  
0402  
(b)  
21. Typical Decoupling Capacitor Layouts  
At least two or three times the width of an individual trace should separate single-ended traces and differential  
pairs to minimize the potential for crosstalk. Single-ended traces that run in parallel for less than the wavelength  
of the rise or fall times usually have negligible crosstalk. Increase the spacing between signal paths for long  
parallel runs to reduce crosstalk. Boards with limited real estate can benefit from the staggered trace layout, as  
shown in 22.  
Layer 1  
Layer 6  
22. Staggered Trace Layout  
This configuration lays out alternating signal traces on different layers. Thus, the horizontal separation between  
traces can be less than 2 or 3 times the width of individual traces. To ensure continuity in the ground signal path,  
TI recommends that the designer have an adjacent ground via for every signal via, as shown in 23. Note that  
vias create additional capacitance. For example, a typical via has a lumped capacitance effect of 1/2 pF to 1 pF  
in FR4.  
版权 © 2018, Texas Instruments Incorporated  
17  
 
 
DSLVDS1001  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
www.ti.com.cn  
Layout Guidelines (接下页)  
Signal Via  
Signal Trace  
Uninterrupted Ground Plane  
Signal Trace  
Uninterrupted Ground Plane  
Ground Via  
23. Ground Via Location (Side View)  
Short and low-impedance connection of the device ground pins to the PCB ground plane reduces ground  
bounce. Holes and cutouts in the ground planes can adversely affect current return paths if they create  
discontinuities that increase returning current loop areas.  
To minimize EMI problems, TI recommends avoiding discontinuities below a trace (for example, holes, slits, and  
so on) and keeping traces as short as possible. Zoning the board wisely by placing all similar functions in the  
same area, as opposed to mixing them together, helps reduce susceptibility issues.  
11.2 Layout Example  
24. Layout Example  
18  
版权 © 2018, Texas Instruments Incorporated  
DSLVDS1001  
www.ti.com.cn  
ZHCSIL1A JULY 2018REVISED DECEMBER 2018  
12 器件和文档支持  
12.1 文档支持  
12.1.1 相关文档  
请参阅如下相关文档:  
LVDS 接口的 AN-1194 失效防护偏置》(SNLA051)  
LVDS 用户手册设计指南(第 4 版)》(SNLA187)  
LVDS 应用和数据手册》(SLLD009)  
12.2 接收文档更新通知  
要接收文档更新通知,请导航至 TI.com.cn 上的器件产品文件夹。单击右上角的通知我进行注册,即可每周接收产  
品信息更改摘要。有关更改的详细信息,请查看任何已修订文档中包含的修订历史记录。  
12.3 社区资源  
下列链接提供到 TI 社区资源的连接。链接的内容由各个分销商按照原样提供。这些内容并不构成 TI 技术规范,  
并且不一定反映 TI 的观点;请参阅 TI 《使用条款》。  
TI E2E™ 在线社区 TI 的工程师对工程师 (E2E) 社区。此社区的创建目的在于促进工程师之间的协作。在  
e2e.ti.com 中,您可以咨询问题、分享知识、拓展思路并与同行工程师一道帮助解决问题。  
设计支持  
TI 参考设计支持 可帮助您快速查找有帮助的 E2E 论坛、设计支持工具以及技术支持的联系信息。  
12.4 商标  
E2E is a trademark of Texas Instruments.  
Rogers is a trademark of Rogers Corporation.  
All other trademarks are the property of their respective owners.  
12.5 静电放电警告  
ESD 可能会损坏该集成电路。德州仪器 (TI) 建议通过适当的预防措施处理所有集成电路。如果不遵守正确的处理措施和安装程序 , 可  
能会损坏集成电路。  
ESD 的损坏小至导致微小的性能降级 , 大至整个器件故障。 精密的集成电路可能更容易受到损坏 , 这是因为非常细微的参数更改都可  
能会导致器件与其发布的规格不相符。  
12.6 术语表  
SLYZ022 TI 术语表。  
这份术语表列出并解释术语、缩写和定义。  
13 机械、封装和可订购信息  
以下页面包含机械、封装和可订购信息。这些信息是指定器件的最新可用数据。数据如有变更,恕不另行通知,且  
不会对此文档进行修订。如需获取此数据表的浏览器版本,请查阅左侧的导航栏。  
版权 © 2018, Texas Instruments Incorporated  
19  
PACKAGE OPTION ADDENDUM  
www.ti.com  
30-Sep-2021  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
1000  
250  
(1)  
(2)  
(3)  
(4/5)  
(6)  
DSLVDS1001DBVR  
DSLVDS1001DBVT  
ACTIVE  
SOT-23  
SOT-23  
DBV  
5
5
Non-RoHS  
& Green  
Call TI  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
-40 to 85  
-40 to 85  
1TBX  
1TBX  
ACTIVE  
DBV  
Non-RoHS  
& Green  
Call TI  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
30-Sep-2021  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
9-Aug-2022  
TAPE AND REEL INFORMATION  
REEL DIMENSIONS  
TAPE DIMENSIONS  
K0  
P1  
W
B0  
Reel  
Diameter  
Cavity  
A0  
A0 Dimension designed to accommodate the component width  
B0 Dimension designed to accommodate the component length  
K0 Dimension designed to accommodate the component thickness  
Overall width of the carrier tape  
W
P1 Pitch between successive cavity centers  
Reel Width (W1)  
QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE  
Sprocket Holes  
Q1 Q2  
Q3 Q4  
Q1 Q2  
Q3 Q4  
User Direction of Feed  
Pocket Quadrants  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
DSLVDS1001DBVR  
DSLVDS1001DBVT  
SOT-23  
SOT-23  
DBV  
DBV  
5
5
1000  
250  
178.0  
178.0  
8.4  
8.4  
3.2  
3.2  
3.2  
3.2  
1.4  
1.4  
4.0  
4.0  
8.0  
8.0  
Q3  
Q3  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
9-Aug-2022  
TAPE AND REEL BOX DIMENSIONS  
Width (mm)  
H
W
L
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SPQ  
Length (mm) Width (mm) Height (mm)  
DSLVDS1001DBVR  
DSLVDS1001DBVT  
SOT-23  
SOT-23  
DBV  
DBV  
5
5
1000  
250  
210.0  
210.0  
185.0  
185.0  
35.0  
35.0  
Pack Materials-Page 2  
PACKAGE OUTLINE  
DBV0005A  
SOT-23 - 1.45 mm max height  
S
C
A
L
E
4
.
0
0
0
SMALL OUTLINE TRANSISTOR  
C
3.0  
2.6  
0.1 C  
1.75  
1.45  
1.45  
0.90  
B
A
PIN 1  
INDEX AREA  
1
2
5
(0.1)  
2X 0.95  
1.9  
3.05  
2.75  
1.9  
(0.15)  
4
3
0.5  
5X  
0.3  
0.15  
0.00  
(1.1)  
TYP  
0.2  
C A B  
NOTE 5  
0.25  
GAGE PLANE  
0.22  
0.08  
TYP  
8
0
TYP  
0.6  
0.3  
TYP  
SEATING PLANE  
4214839/G 03/2023  
NOTES:  
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing  
per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. Refernce JEDEC MO-178.  
4. Body dimensions do not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not  
exceed 0.25 mm per side.  
5. Support pin may differ or may not be present.  
www.ti.com  
EXAMPLE BOARD LAYOUT  
DBV0005A  
SOT-23 - 1.45 mm max height  
SMALL OUTLINE TRANSISTOR  
PKG  
5X (1.1)  
1
5
5X (0.6)  
SYMM  
(1.9)  
2
3
2X (0.95)  
4
(R0.05) TYP  
(2.6)  
LAND PATTERN EXAMPLE  
EXPOSED METAL SHOWN  
SCALE:15X  
SOLDER MASK  
OPENING  
SOLDER MASK  
OPENING  
METAL UNDER  
SOLDER MASK  
METAL  
EXPOSED METAL  
EXPOSED METAL  
0.07 MIN  
ARROUND  
0.07 MAX  
ARROUND  
NON SOLDER MASK  
DEFINED  
SOLDER MASK  
DEFINED  
(PREFERRED)  
SOLDER MASK DETAILS  
4214839/G 03/2023  
NOTES: (continued)  
6. Publication IPC-7351 may have alternate designs.  
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.  
www.ti.com  
EXAMPLE STENCIL DESIGN  
DBV0005A  
SOT-23 - 1.45 mm max height  
SMALL OUTLINE TRANSISTOR  
PKG  
5X (1.1)  
1
5
5X (0.6)  
SYMM  
(1.9)  
2
3
2X(0.95)  
4
(R0.05) TYP  
(2.6)  
SOLDER PASTE EXAMPLE  
BASED ON 0.125 mm THICK STENCIL  
SCALE:15X  
4214839/G 03/2023  
NOTES: (continued)  
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
9. Board assembly site may have different recommendations for stencil design.  
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