ESDS314 [TI]

适用于 USB 和以太网且具有 25A 8/20us 浪涌额定值的四路 4.5pF、3.6V、±30kV ESD 保护二极管;
ESDS314
型号: ESDS314
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

适用于 USB 和以太网且具有 25A 8/20us 浪涌额定值的四路 4.5pF、3.6V、±30kV ESD 保护二极管

以太网 二极管
文件: 总20页 (文件大小:1428K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
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ESDS312, ESDS314  
ZHCSIH2B MAY 2018REVISED SEPTEMBER 2018  
ESDS312ESDS314 数据线路浪涌和 ESD 保护二极管矩阵  
1 特性  
3 说明  
1
IEC 61000-4-2 4 级静电放电 (ESD) 保护  
ESDS314ESDS312 是一种单向 TVS ESD 保护二极  
管阵列,用于高达 25A (8/20μs) 的以太网、USB 和通  
用数据线路浪涌保护。ESDS314ESDS312 器件的  
额定 ESD 冲击消散值达到了 IEC 61000-4-24 级)  
国际标准中规定的最高水平。  
±30kV 接触放电  
±30kV 气隙放电  
IEC 61000-4-4 瞬态放电 (EFT) 保护  
80A (5/50ns)  
IEC 61000-4-5 浪涌保护  
这些器件 每通道 具有 4.5pF IO 电容,因此非常适合  
用于保护高速接口,如以太网 10/100/1000USB 2.0  
GPIO。低动态电阻和低钳位电压确保系统级抗瞬变  
事件保护。  
25A (8/20μs)  
低浪涌钳位电压在 25A Ipp 下为 6.5V  
IO 电容:  
4.5pF(典型值)  
ESDS314ESDS312 器件采用符合行业标准的 5 引  
SOT23 封装。  
直流击穿电压:5.5V(最小值)  
超低泄漏电流:5nA(典型值)  
支持速率高达 5Gbps 的高速接口  
工业温度范围:-40°C +125°C  
简易直通布线封装 (ESDS312)  
器件信息(1)  
器件编号  
ESDS314  
ESDS312  
封装  
封装尺寸(标称值)  
2.9mm x 1.6mm x  
1.25mm  
SOT23 (5)  
SOT23 (5)2 NC  
引脚  
2.9mm x 1.6mm x  
1.25mm  
2 应用  
终端设备  
(1) 如需了解所有可用封装,请参阅数据表末尾的可订购产品附  
录。  
以太网交换机  
接入点  
典型应用原理图  
网关  
TP1+  
打印机  
RJ-45  
Connector  
TP1-  
数字视频录像机 (DVR) 和网络视频录像机  
(NVR)  
ESDS314  
TP2+  
接口  
TP2-  
以太网 10/100/1000Mbps  
Ethernet  
PHY  
TP3+  
TP3-  
USB 2.0  
通用输入/输出 (GPIO)  
ESDS314  
TP4+  
TP4-  
1
本文档旨在为方便起见,提供有关 TI 产品中文版本的信息,以确认产品的概要。 有关适用的官方英文版本的最新信息,请访问 www.ti.com,其内容始终优先。 TI 不保证翻译的准确  
性和有效性。 在实际设计之前,请务必参考最新版本的英文版本。  
English Data Sheet: SLVSEG9  
 
 
 
 
ESDS312, ESDS314  
ZHCSIH2B MAY 2018REVISED SEPTEMBER 2018  
www.ti.com.cn  
目录  
7.3 Feature Description................................................... 8  
7.4 Device Functional Modes.......................................... 8  
Application and Implementation .......................... 9  
8.1 Application Information.............................................. 9  
8.2 Typical Application ................................................... 9  
Power Supply Recommendations...................... 11  
1
2
3
4
5
6
特性.......................................................................... 1  
应用.......................................................................... 1  
说明.......................................................................... 1  
修订历史记录 ........................................................... 2  
Pin Configuration and Functions......................... 3  
Specifications......................................................... 4  
6.1 Absolute Maximum Ratings ...................................... 4  
6.2 ESD Ratings -JEDEC Specifications ........................ 4  
6.3 ESD Ratings - IEC Specifications............................. 4  
6.4 Recommended Operating Conditions....................... 4  
6.5 Thermal Information.................................................. 4  
6.6 Electrical Characteristics........................................... 5  
6.7 Typical Characteristics.............................................. 6  
Detailed Description .............................................. 8  
7.1 Overview ................................................................... 8  
7.2 Functional Block Diagram ......................................... 8  
8
9
10 Layout................................................................... 11  
10.1 Layout Guidelines ................................................. 11  
10.2 Layout Example .................................................... 11  
11 器件和文档支持 ..................................................... 12  
11.1 接收文档更新通知 ................................................. 12  
11.2 社区资源................................................................ 12  
11.3 ....................................................................... 12  
11.4 静电放电警告......................................................... 12  
11.5 术语表 ................................................................... 12  
12 机械、封装和可订购信息....................................... 12  
7
4 修订历史记录  
Changes from Revision A (July 2018) to Revision B  
Page  
已更改 将预告信息更改成了生产数据” ................................................................................................................................ 1  
Changes from Original (May 2018) to Revision A  
Page  
已更改 将产品预览更改成了预告信息” ................................................................................................................................ 1  
2
Copyright © 2018, Texas Instruments Incorporated  
 
ESDS312, ESDS314  
www.ti.com.cn  
ZHCSIH2B MAY 2018REVISED SEPTEMBER 2018  
5 Pin Configuration and Functions  
ESDS312 DBV Package  
5-Pin SOT23  
ESDS314 DBV Package  
5-Pin SOT23  
Top View  
Top View  
2.8  
1.6  
2.8  
1.6  
1
5
1
5
NC  
I/O2  
I/O1  
I/O4  
2
2.9  
2
2.9  
GND  
GND  
3
4
3
4
I/O1  
NC  
I/O3  
I/O2  
Pin Functions for ESDS312  
PIN  
TYPE  
DESCRIPTION  
NAME  
NO.  
I/O1  
4
5
2
1
3
I/O  
GND  
NC  
Surge/ESD protected channels. Connect to the lines being protected.  
Ground. Connect to ground.  
I/O2  
GND  
NC  
Not connected; Used for optional straight-through routing. Can be left floating or  
grounded  
NC  
Pin Functions for ESDS314  
PIN  
TYPE  
DESCRIPTION  
Name  
I/O1  
No.  
1
I/O2  
3
I/O  
Surge/ESD protected channels. Connect to the lines being protected.  
Ground. Connect to ground  
I/O3  
4
I/O4  
5
GND  
2
GND  
Copyright © 2018, Texas Instruments Incorporated  
3
ESDS312, ESDS314  
ZHCSIH2B MAY 2018REVISED SEPTEMBER 2018  
www.ti.com.cn  
6 Specifications  
6.1 Absolute Maximum Ratings  
over operating free-air temperature range (unless otherwise noted)(1)  
MIN  
MAX  
UNIT  
IEC 61000-4-4  
Electrical Fast  
Transient  
Peak Power at 25 °C  
80  
A
IEC 61000-4-5  
Surge (tp 8/20  
µs  
Peak Power at 25 °C  
Peak Current at 25 °C  
170  
25  
W
A
TA  
Operating free-air temperature  
Storage temperature  
–40  
–65  
125  
155  
°C  
°C  
Tstg  
(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress ratings  
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended  
Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
6.2 ESD Ratings -JEDEC Specifications  
VALUE  
UNIT  
Human body model (HBM), per  
±2500  
ANSI/ESDA/JEDEC JS-001, allpins(1)  
V(ESD)  
Electrostatic discharge  
V
Charged device model (CDM), per JEDEC  
specificationJESD22-C101, all pins(2)  
±1000  
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. [Following sentence  
optional; see the wiki.] Manufacturing with less than 500-V HBM is possible with the necessary precautions. [Following sentence  
optional; see the wiki.] Pins listed as ±WWW V and/or ±XXX V may actually have higher performance.  
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. [Following sentence  
optional; see the wiki.] Manufacturing with less than 250-V CDM is possible with the necessary precautions. [Following sentence  
optional; see the wiki.] Pins listed as ±YYY V and/or ±ZZZ V may actually have higher performance.  
6.3 ESD Ratings - IEC Specifications  
VALUE  
±30000  
±30000  
UNIT  
IEC 61000-4-2 Contact Discharge, all pins  
IEC 61000-4-2 Air Discharge, all pins  
V(ESD)  
Electrostatic discharge  
V
6.4 Recommended Operating Conditions  
over operating free-air temperature range (unless otherwise noted)  
MIN  
0
NOM  
MAX  
UNIT  
V
VIN  
TA  
Input voltage  
3.6  
Operating Free Air Temperature  
–40  
125  
°C  
6.5 Thermal Information  
ESDS312  
DBV (SOT-23)  
5 PINS  
163.9  
ESDS314  
DBV (SOT-23)  
5 PINS  
127.6  
(1)  
THERMAL METRIC  
UNIT  
RθJA  
Junction-to-ambient thermal resistance  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
RθJC(top)  
RθJB  
113.4  
78.9  
76.9  
43.9  
ΨJT  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case (bottom) thermal resistance  
59.8  
24.5  
ΨJB  
76.8  
43.7  
RθJC(bot)  
N/A  
N/A  
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application  
report.  
4
Copyright © 2018, Texas Instruments Incorporated  
ESDS312, ESDS314  
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ZHCSIH2B MAY 2018REVISED SEPTEMBER 2018  
6.6 Electrical Characteristics  
At TA = 25°C unless otherwise noted  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
IIO < 500 nA, across operating  
temperature range  
VRWM  
Reverse stand-off voltage  
3.6  
V
ILEAKAGE  
VBRF  
Leakage current at 3.6 V  
VIO = 3.6 V, Any IO pin to GND  
IIO = 1 mA  
5
50  
nA  
V
(1)  
Breakdown voltage, IO to GND  
Forward Voltage, GND to IO  
4.5  
7.5  
VFWD  
IIO = 1 mA  
0.8  
5
V
(2)  
VHOLD  
Holding Voltage, IO to GND  
IIO = 1 mA  
V
VCLAMP  
VCLAMP  
VCLAMP  
VCLAMP  
VCLAMP  
VCLAMP  
VCLAMP  
VCLAMP  
CLINE  
IPP = 1 A, Any IO pin to GND  
IPP = 12 A, Any IO pin to GND  
IPP = 25 A, Any IO pin to GND  
IPP = 1 A, GND to any IO pin  
IPP = 12 A, GND to any IO pin  
IPP = 25 A, GND to any IO pin  
IPP = 16 A, Any IO pin to GND  
IPP = 16 A, GND to any IO pin  
VIO = 0 V, Vp-p = 30 mV, f = 1 MHz  
5
V
5.6  
6.5  
1
V
V
Surge Clamping voltage, tp = 8/20 µs  
V
2.1  
3.6  
5.5  
2.2  
4.5  
V
V
V
TLP Clamping Voltage, tp = 100 ns  
V
Line capacitance, Any IO to GND  
Variation of line capacitance  
Line-to-line capacitance  
5.5  
0.1  
pF  
CLINE1 - CLINE2, VIO = 0 V, Vp-p = 30  
mV, f = 1 MHz  
ΔCLINE  
0.05  
2.25  
pF  
pF  
CCROSS  
VIO = 0V, Vrms = 30 mV, f = 1 MHz  
2.75  
(1) VBRF and VBRR are defined as the voltage obtained at 1 mA when sweeping the voltage up, before the device latches into the  
snapback state  
(2) VHOLD is defined as the voltage when 1 mA is applied, after the device has successfully latched into the snapback state.  
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ESDS312, ESDS314  
ZHCSIH2B MAY 2018REVISED SEPTEMBER 2018  
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6.7 Typical Characteristics  
5
4
3
2
1
0
7
6.5  
6
5.5  
5
4.5  
4
3.5  
3
2.5  
2
1.5  
1
0.5  
0
0
5
10  
15  
20  
25  
30  
0
5
10  
15  
20  
25  
30  
Peak Pulse Cuurent (A)  
Peak Pulse Current (A)  
D001  
D002  
1. Clamping Voltage vs. Peak Pulse Current (tp= 8/20 µs),  
2. Clamping Voltage vs. Peak Pulse Current (tp= 8/20 µs),  
Any IO Pin to GND  
GND to Any IO Pin  
27.5  
25  
220  
200  
180  
160  
140  
120  
100  
80  
0.001  
0.0008  
0.0006  
0.0004  
0.0002  
0
Voltage (V)  
Current (A)  
Power (W)  
22.5  
20  
17.5  
15  
12.5  
10  
-0.0002  
-0.0004  
-0.0006  
-0.0008  
-0.001  
-0.0012  
7.5  
5
60  
40  
2.5  
0
20  
0
-2.5  
-20  
-1  
0
1
2
3
4
5
6
0
20  
40  
60  
80 100 120 140 160 180 200  
Voltage (V)  
Time (ms)  
D004  
D003  
D004_DC_Plot.grf  
3. Surge Current, Clamping Voltage and Power Curve (tp  
= 8/20 µs), Any IO Pin to GND  
4. DC I-V Curve  
32  
28  
24  
20  
16  
12  
8
4
0
-4  
-8  
-12  
-16  
-20  
-24  
-28  
-32  
4
0
-4  
0
1
2
3
4
5
6
7
-3.5  
-3  
-2.5  
-2  
-1.5  
-1  
-0.5  
0
Voltage (V)  
Voltage (V)  
D005  
D006  
D005_TLP_Pos.grf  
D006_TLP_Neg.grf  
5. TLP I-V Curve, IO to GND, tp = 100 ns  
6. TLP I-V Curve, IO to GND Negative, tp=100 ns  
80  
70  
60  
50  
40  
30  
20  
10  
0
40  
30  
20  
10  
0
-10  
-20  
-30  
-40  
-50  
-60  
-70  
-80  
-10  
-20  
-30  
-40  
-10  
0
10  
20  
30  
40  
50  
60  
70  
80  
90  
-10  
0
10  
20  
30  
40  
50  
60  
70  
80  
90  
Time (ns)  
Time (ns)  
D007  
D008  
D007_IEC_Pos.grf  
D008_IEC_Neg.grf  
7. +8 kV IEC 61000-4-2 Clamping Voltage Waveform  
8. -8 kV IEC 61000-4-2 Clamping Voltage Waveform  
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ZHCSIH2B MAY 2018REVISED SEPTEMBER 2018  
Typical Characteristics (接下页)  
8
7.5  
7
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
6.5  
6
5.5  
5
4.5  
4
-50  
-25  
0
25  
50  
75  
100  
125  
0
0.5  
1
1.5  
2
2.5  
3
3.5  
4
Temperature (èC)  
Voltage (V)  
D009  
D010  
D009_Leakage.grf  
D010_Cap_Vbias.grf  
9. DC Leakage vs. Ambient Temperature, Bias Voltage =  
10. Capacitance vs. Bias Voltage at 25°C  
3.6 V  
0
-1  
105  
-2  
100  
95  
90  
85  
80  
75  
-3  
-4  
-5  
-6  
-7  
-8  
-9  
-10  
-11  
-12  
0
25  
50  
75  
100  
125  
0.1  
0.2  
0.3 0.4 0.5 0.60.7  
Frequency (GHz)  
1
2
Temperature (èC)  
D011  
D012  
D011_Power_Derating.grf  
D012_S21.grf  
11. Surge Power Derating with Respect To Ambient  
12. Differential Insertion Loss  
Temperature  
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ESDS312, ESDS314  
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7 Detailed Description  
7.1 Overview  
The ESDS314, ESDS312 devices are unidirectional ESD Protection Diode with a low capacitance. These  
devices can dissipate high surge currents upto 25 A (8/20 µs) and ESD strikes above the maximum level  
specified by the IEC 61000-4-2 International Standard. The low capacitance makes this device ideal for  
protecting high-speed signal interfaces such as Ethernet 10/100/1000 Mbps and general purpose high speed  
data lines.  
7.2 Functional Block Diagram  
ESDS312  
I/O1 I/O2  
ESDS314  
I/O1 I/O3  
I/O1  
I/O4  
GND  
GND  
7.3 Feature Description  
7.3.1 IEC 61000-4-4 EFT Protection  
The I/O pins of ESDS314 and ESDS312 can withstand surge events (IEC 61000-4-5, 8/20 µs waveform) up to  
25 A and 170 W. These devices also provide ESD protection up to ±30-kV contact and ±30-kV air gap per IEC  
61000-4-2 standard. The I/O pins can withstand an electrical fast transient burst of up to 80 A (IEC 61000-4-4  
5/50 ns waveform, 4 kV with 50-impedance). The capacitance between each I/O pin to ground is 4.5 pF  
(typical) and 5.5 pF (maximum). This device supports data rates up to 1 Gbps.  
The reverse DC breakdown voltage of each I/O pin is a minimum of 4.5 V. This ensures that sensitive equipment  
is protected from surges above the reverse standoff voltage of 3.6 V. The I/O pins feature an ultra-low leakage  
current of 100 nA (maximum) with a bias of 3.6 V. This device features an industrial operating range of –40°C to  
+125°C.  
7.4 Device Functional Modes  
The ESDS314, ESDS312 devices are a passive integrated circuit that triggers when voltages are above VBRF or  
below 0.7 V. During ESD events, voltages as high as ±30 kV (air) can be directed to ground via the internal  
diode network. When the voltages on the protected line fall below the trigger levels of ESDS314, ESDS312  
(usually within a few nano-seconds) the devices reverts to passive.  
8
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ESDS312, ESDS314  
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ZHCSIH2B MAY 2018REVISED SEPTEMBER 2018  
8 Application and Implementation  
Information in the following applications sections is not part of the TI component  
specification, and TI does not warrant its accuracy or completeness. TI’s customers are  
responsible for determining suitability of components for their purposes. Customers should  
validate and test their design implementation to confirm system functionality.  
8.1 Application Information  
The ESDS314, ESDS312 devices are diode type TVS which is used to provide a path to ground for dissipating  
surge and ESD events on high-speed signal lines between a human interface connector and a system. As the  
current from surge or ESD passes through the TVS, only a small voltage drop is present across the diode. This  
is the voltage presented to the protected IC. The low RDYN of the triggered TVS holds this voltage, VCLAMP, to a  
safe level for the protected IC.  
8.2 Typical Application  
TP1+  
RJ-45  
Connector  
TP1-  
ESDS314  
TP2+  
TP2-  
Ethernet  
PHY  
TP3+  
TP3-  
ESDS314  
TP4+  
TP4-  
13. ESDS314 Protecting the Ethernet 1Gbps Interface  
8.2.1 Design Requirements  
A typical operation for the ESDS314 would be protecting a high speed dataline similar to one shown in 13. In  
this example, the ESDS314 is protecting an Ethernet PHY's data lines that has a nominal operating voltage of  
3.6 V. Many of the Ethernet interfaces that connect to long cables require protection against ±1 kV surge test  
through a 42-Ω coupling resistor and a 0.5 µF capacitor, equaling roughly 24 A of surge current. Without any  
input protection, if a surge event is caused by lightning, coupling, ringing, or any other fault condition, this input  
voltage will rise to hundreds of volts for multiple microseconds, harming the device.  
For Ethernet 1000Base-T (1Gbps), application design parameters listed in 1 are known.  
1. Design Parameters  
DESIGN PARAMETER  
Signal range on differential data line pairs  
Operating frequency  
VALUE  
0 to 3.6 V  
125 MHz  
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8.2.2 Detailed Design Procedure  
8.2.2.1 Signal Range  
The ESDS314 has 4 identical surge protection channels with each channel supporting a signal range of 0 to 3.6  
V. The device will work well with any Ethernet PHY that drives the single ended voltage on the data line up to a  
3.6 V.  
8.2.2.2 Operating Frequency  
The ESDS314 has a capacitance of 4.5 pF (typical) and can support the 125 MHz operation of Ethernet  
1000Base-T application  
8.2.3 Application Curves  
0
-1  
-2  
-3  
-4  
-5  
-6  
-7  
-8  
-9  
-10  
-11  
-12  
0.1  
0.2  
0.3 0.4 0.5 0.60.7  
Frequency (GHz)  
1
2
D012  
D012_S21.grf  
14. Differential Insertion Loss vs. Frequency  
10  
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ESDS312, ESDS314  
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ZHCSIH2B MAY 2018REVISED SEPTEMBER 2018  
9 Power Supply Recommendations  
The ESDS314, ESDS312 devices are passive ESD devices and there is no need to power it. Take care not to  
violate the recommended I/O specification (0 V to 3.6 V) to ensure the device functions properly.  
10 Layout  
10.1 Layout Guidelines  
The optimum placement is as close to the connector as possible.  
EMI during an ESD event can couple from the trace being struck to other nearby unprotected traces,  
resulting in early system failures.  
The PCB designer must minimize the possibility of EMI coupling by keeping any unprotected traces away  
from the protected traces which are between the TVS and the connector.  
Route the protected traces as straight as possible.  
Eliminate any sharp corners on the protected traces between the TVS and the connector by using rounded  
corners with the largest radii possible.  
Electric fields tend to build up on corners, increasing EMI coupling.  
10.2 Layout Example  
15. Layout Example for 4-channel Device  
版权 © 2018, Texas Instruments Incorporated  
11  
ESDS312, ESDS314  
ZHCSIH2B MAY 2018REVISED SEPTEMBER 2018  
www.ti.com.cn  
11 器件和文档支持  
11.1 接收文档更新通知  
要接收文档更新通知,请导航至 TI.com.cn 上的器件产品文件夹。单击右上角的通知我 进行注册,即可每周接收产  
品信息更改摘要。有关更改的详细信息,请查看任何已修订文档中包含的修订历史记录。  
11.2 社区资源  
下列链接提供到 TI 社区资源的连接。链接的内容由各个分销商按照原样提供。这些内容并不构成 TI 技术规范,  
并且不一定反映 TI 的观点;请参阅 TI 《使用条款》。  
TI E2E™ 在线社区 TI 的工程师对工程师 (E2E) 社区。此社区的创建目的在于促进工程师之间的协作。在  
e2e.ti.com 中,您可以咨询问题、分享知识、拓展思路并与同行工程师一道帮助解决问题。  
设计支持  
TI 参考设计支持 可帮助您快速查找有帮助的 E2E 论坛、设计支持工具以及技术支持的联系信息。  
11.3 商标  
E2E is a trademark of Texas Instruments.  
11.4 静电放电警告  
ESD 可能会损坏该集成电路。德州仪器 (TI) 建议通过适当的预防措施处理所有集成电路。如果不遵守正确的处理措施和安装程序 , 可  
能会损坏集成电路。  
ESD 的损坏小至导致微小的性能降级 , 大至整个器件故障。 精密的集成电路可能更容易受到损坏 , 这是因为非常细微的参数更改都可  
能会导致器件与其发布的规格不相符。  
11.5 术语表  
SLYZ022 TI 术语表。  
这份术语表列出并解释术语、缩写和定义。  
12 机械、封装和可订购信息  
以下页面包含机械、封装和可订购信息。这些信息是指定器件的最新可用数据。数据如有变更,恕不另行通知,且  
不会对此文档进行修订。如需获取此数据表的浏览器版本,请查阅左侧的导航栏。  
12  
版权 © 2018, Texas Instruments Incorporated  
PACKAGE OPTION ADDENDUM  
www.ti.com  
10-Dec-2020  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
ESDS312DBVR  
ESDS314DBVR  
ACTIVE  
ACTIVE  
SOT-23  
SOT-23  
DBV  
DBV  
5
5
3000 RoHS & Green  
3000 RoHS & Green  
SN  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
-40 to 125  
-40 to 125  
1R4B  
1R2B  
SN  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
10-Dec-2020  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
25-Sep-2018  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
ESDS312DBVR  
ESDS314DBVR  
SOT-23  
SOT-23  
DBV  
DBV  
5
5
3000  
3000  
178.0  
178.0  
9.0  
9.0  
3.3  
3.3  
3.2  
3.2  
1.4  
1.4  
4.0  
4.0  
8.0  
8.0  
Q3  
Q3  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
25-Sep-2018  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SPQ  
Length (mm) Width (mm) Height (mm)  
ESDS312DBVR  
ESDS314DBVR  
SOT-23  
SOT-23  
DBV  
DBV  
5
5
3000  
3000  
180.0  
180.0  
180.0  
180.0  
18.0  
18.0  
Pack Materials-Page 2  
PACKAGE OUTLINE  
DBV0005A  
SOT-23 - 1.45 mm max height  
S
C
A
L
E
4
.
0
0
0
SMALL OUTLINE TRANSISTOR  
C
3.0  
2.6  
0.1 C  
1.75  
1.45  
1.45  
0.90  
B
A
PIN 1  
INDEX AREA  
1
2
5
(0.1)  
2X 0.95  
1.9  
3.05  
2.75  
1.9  
(0.15)  
4
3
0.5  
5X  
0.3  
0.15  
0.00  
(1.1)  
TYP  
0.2  
C A B  
NOTE 5  
0.25  
GAGE PLANE  
0.22  
0.08  
TYP  
8
0
TYP  
0.6  
0.3  
TYP  
SEATING PLANE  
4214839/G 03/2023  
NOTES:  
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing  
per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. Refernce JEDEC MO-178.  
4. Body dimensions do not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not  
exceed 0.25 mm per side.  
5. Support pin may differ or may not be present.  
www.ti.com  
EXAMPLE BOARD LAYOUT  
DBV0005A  
SOT-23 - 1.45 mm max height  
SMALL OUTLINE TRANSISTOR  
PKG  
5X (1.1)  
1
5
5X (0.6)  
SYMM  
(1.9)  
2
3
2X (0.95)  
4
(R0.05) TYP  
(2.6)  
LAND PATTERN EXAMPLE  
EXPOSED METAL SHOWN  
SCALE:15X  
SOLDER MASK  
OPENING  
SOLDER MASK  
OPENING  
METAL UNDER  
SOLDER MASK  
METAL  
EXPOSED METAL  
EXPOSED METAL  
0.07 MIN  
ARROUND  
0.07 MAX  
ARROUND  
NON SOLDER MASK  
DEFINED  
SOLDER MASK  
DEFINED  
(PREFERRED)  
SOLDER MASK DETAILS  
4214839/G 03/2023  
NOTES: (continued)  
6. Publication IPC-7351 may have alternate designs.  
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.  
www.ti.com  
EXAMPLE STENCIL DESIGN  
DBV0005A  
SOT-23 - 1.45 mm max height  
SMALL OUTLINE TRANSISTOR  
PKG  
5X (1.1)  
1
5
5X (0.6)  
SYMM  
(1.9)  
2
3
2X(0.95)  
4
(R0.05) TYP  
(2.6)  
SOLDER PASTE EXAMPLE  
BASED ON 0.125 mm THICK STENCIL  
SCALE:15X  
4214839/G 03/2023  
NOTES: (continued)  
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
9. Board assembly site may have different recommendations for stencil design.  
www.ti.com  
重要声明和免责声明  
TI“按原样提供技术和可靠性数据(包括数据表)、设计资源(包括参考设计)、应用或其他设计建议、网络工具、安全信息和其他资源,  
不保证没有瑕疵且不做出任何明示或暗示的担保,包括但不限于对适销性、某特定用途方面的适用性或不侵犯任何第三方知识产权的暗示担  
保。  
这些资源可供使用 TI 产品进行设计的熟练开发人员使用。您将自行承担以下全部责任:(1) 针对您的应用选择合适的 TI 产品,(2) 设计、验  
证并测试您的应用,(3) 确保您的应用满足相应标准以及任何其他功能安全、信息安全、监管或其他要求。  
这些资源如有变更,恕不另行通知。TI 授权您仅可将这些资源用于研发本资源所述的 TI 产品的应用。严禁对这些资源进行其他复制或展示。  
您无权使用任何其他 TI 知识产权或任何第三方知识产权。您应全额赔偿因在这些资源的使用中对 TI 及其代表造成的任何索赔、损害、成  
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TI 提供的产品受 TI 的销售条款ti.com 上其他适用条款/TI 产品随附的其他适用条款的约束。TI 提供这些资源并不会扩展或以其他方式更改  
TI 针对 TI 产品发布的适用的担保或担保免责声明。  
TI 反对并拒绝您可能提出的任何其他或不同的条款。IMPORTANT NOTICE  
邮寄地址:Texas Instruments, Post Office Box 655303, Dallas, Texas 75265  
Copyright © 2023,德州仪器 (TI) 公司  

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