ISO7221C-Q1 [TI]

DUAL DIGITAL ISOLATORS; 双通道数字隔离器
ISO7221C-Q1
型号: ISO7221C-Q1
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

DUAL DIGITAL ISOLATORS
双通道数字隔离器

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ISO7220A-Q1  
ISO7221A-Q1  
ISO7221C-Q1  
www.ti.com  
SLLS965C JULY 2009REVISED MAY 2012  
DUAL DIGITAL ISOLATORS  
Check for Samples: ISO7220A-Q1, ISO7221A-Q1, ISO7221C-Q1  
1
FEATURES  
Qualified for Automotive Applications  
4000-Vpeak Isolation, 560 Vpeak VIORM  
1-Mbps and 25-Mbps Signaling Rate Options  
UL 1577, IEC 60747-5-2 (VDE 0884, Rev 2),  
IEC 61010-1, IEC 60950-1 and CSA  
Approved  
Low Channel-to-Channel Output Skew:  
1 ns (Max)  
50 kV/μs Typical Transient Immunity  
Low Pulse-Width Distortion (PWD):  
1 ns (Max)  
Operates with 3.3-V or 5-V Supplies  
4 kV ESD Protection  
Low Jitter Content: 1 ns (Typ) at 150 Mbps  
25-Year (Typ) Life at Rated Voltage  
(See Application Report SLLA197 and  
Figure 14)  
High Electromagnetic Immunity  
–40°C to 125°C Operating Free-Air  
Temperature Range  
DESCRIPTION  
The ISO7220 and ISO7221 are dual-channel digital isolators. To facilitate PCB layout, the channels are oriented  
in the same direction in the ISO7220 and in opposite directions in the ISO7221. These devices have a logic input  
and output buffer separated by TI’s silicon-dioxide (SiO2) isolation barrier, providing galvanic isolation of up to  
4000 V. Used in conjunction with isolated power supplies, these devices block high voltage, isolate grounds, and  
prevent noise currents on a data bus or other circuits from entering the local ground and interfering with or  
damaging sensitive circuitry.  
A binary input signal is conditioned, translated to a balanced signal, then differentiated by the capacitive isolation  
barrier. Across the isolation barrier, a differential comparator receives the logic transition information, then sets or  
resets a flip-flop and the output circuit accordingly. A periodic update pulse is sent across the barrier to ensure  
the proper dc level of the output. If this dc-refresh pulse is not received every 4 μs, the input is assumed to be  
unpowered or not being actively driven, and the failsafe circuit drives the output to a logic high state.  
The small capacitance and resulting time constant provide fast operation with signaling rates available from 0  
Mbps (dc) to 25 Mbps.(1)The A-option and C-option devices have TTL input thresholds and a noise filter at the  
input that prevents transient pulses from being passed to the output of the device.  
These devices require two supply voltages of 3.3 V, 5 V, or any combination. All inputs are 5-V tolerant when  
supplied from a 3.3-V supply and all outputs are 4-mA CMOS.  
These devices are characterized for operation over the ambient temperature range of –40°C to 125°C.  
(1) The signaling rate of a line is the number of voltage transitions that are made per second expressed in the units bps (bits per second).  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2009–2012, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
ISO7220A-Q1  
ISO7221A-Q1  
ISO7221C-Q1  
SLLS965C JULY 2009REVISED MAY 2012  
www.ti.com  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more  
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.  
ORDERING INFORMATION(1)  
SIGNALING  
TA  
PACKAGE(2)  
ORDERABLE PART NUMBER  
TOP-SIDE MARKING  
RATE  
1 Mbps  
1 Mbps  
25 Mbps  
SOIC – D  
SOIC – D  
SOIC – D  
Reel of 2500  
ISO7220AQDRQ1  
ISO7221AQDRQ1  
ISO7221CQDRQ1  
7220AQ  
7221AQ  
7221CQ  
–40°C to 125°C  
Reel of 2500  
Reel of 2500  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.  
ISO7221  
ISO7220  
1
2
3
4
8
7
6
5
VCC1  
OUTA  
INB  
VCC2  
1
2
3
4
8
7
6
5
VCC1  
INA  
INB  
VCC2  
INA  
OUTA  
OUTB  
GND2  
OUTB  
GND2  
GND1  
GND1  
SINGLE-CHANNEL FUNCTION DIAGRAM  
Galvanic Isolation  
Barrier  
DC Channel  
Filter  
OSC  
+
PWM  
Pulse Width  
Demodulation  
Vref  
Carrier Detect  
Data MUX  
AC Detect  
Input  
+
Filter  
Vref  
IN  
OUT  
Output Buffer  
AC Channel  
REGULATORY INFORMATION  
VDE  
CSA  
UL  
Approved under CSA Component  
Acceptance Notice  
Recognized under 1577 Component  
Recognition Program(1)  
Certified according to IEC 60747-5-2  
File Number: 40016131  
File Number: 1698195  
File Number: E181974  
(1) Production tested 3000 VRMS for 1 second in accordance with UL 1577.  
2
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Copyright © 2009–2012, Texas Instruments Incorporated  
Product Folder Link(s): ISO7220A-Q1 ISO7221A-Q1 ISO7221C-Q1  
ISO7220A-Q1  
ISO7221A-Q1  
ISO7221C-Q1  
www.ti.com  
SLLS965C JULY 2009REVISED MAY 2012  
ABSOLUTE MAXIMUM RATINGS(1)  
VCC  
Supply voltage(2), VCC1, VCC2  
Voltage at IN, OUT  
Output current  
–0.5 V to 6 V  
–0.5 V to 6 V  
±15 mA  
VI  
IO  
Human-Body Model  
±4 kV  
Electrostatic  
discharge  
ESD  
Field-Induced Charged-Device Model  
Machine Model  
All pins  
±1 kV  
±200 V  
TJ  
Maximum junction temperature  
Storage temperature  
150°C  
Tstg  
–65°C to 150°C  
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings  
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating  
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
(2) All voltage values except differential I/O bus voltages are with respect to network ground terminal and are peak voltage values.  
RECOMMENDED OPERATING CONDITIONS  
MIN  
TYP  
MAX UNIT  
VCC  
IOH  
IOL  
Supply voltage(1)  
VCC1, VCC2  
3
5.5  
4
V
High-level output current  
Low-level output current  
mA  
mA  
μs  
–4  
1
ISO722xA  
ISO722xC  
ISO722xA  
ISO722xC  
0.67  
33  
tui  
Input pulse width  
Signaling rate  
40  
0
ns  
1500  
30  
1000 kbps  
25 Mbps  
1/tui  
0
VIH  
VIL  
TJ  
High-level input voltage  
2
VCC  
0.8  
V
V
Low-level input voltage  
0
Operating virtual-junction temperature  
–40  
150  
°C  
H
External magnetic field-strength immunity per IEC 61000-4-8 and IEC 61000-4-9 certification  
1000 A/m  
(1) For the 5-V operation, VCC1 or VCC2 is specified from 4.5 V to 5.5 V.  
For the 3-V operation, VCC1 or VCC2 is specified from 3 V to 3.6 V.  
Copyright © 2009–2012, Texas Instruments Incorporated  
Submit Documentation Feedback  
3
Product Folder Link(s): ISO7220A-Q1 ISO7221A-Q1 ISO7221C-Q1  
 
ISO7220A-Q1  
ISO7221A-Q1  
ISO7221C-Q1  
SLLS965C JULY 2009REVISED MAY 2012  
www.ti.com  
ELECTRICAL CHARACTERISTICS  
VCC1 and VCC2 at 5 V(1), over recommended operating conditions (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
1
MAX UNIT  
ISO7220x  
ISO7221x  
ISO7220A  
ISO7221A  
2
Quiescent  
1 Mbps  
8.5  
2
17  
ICC1  
Supply current, VCC1  
VI = VCC or 0 V, no load  
3
18  
22  
31  
17  
32  
18  
22  
mA  
mA  
10  
12  
16  
8.5  
17  
10  
12  
4.6  
5
ISO7221C 25 Mbps  
ISO7220x  
Quiescent  
ISO7221x  
ICC2  
Supply current, VCC2  
ISO7220A  
1 Mbps  
VI = VCC or 0 V, no load  
ISO7221A  
ISO7221C 25 Mbps  
IOH = –4 mA, See Figure 1  
IOH = –20 μA, See Figure 1  
IOL = 4 mA, See Figure 1  
IOL = 20 μA, See Figure 1  
VCC – 0.8  
VCC – 0.1  
VOH  
High-level output voltage  
Low-level output voltage  
V
V
0.2  
0
0.4  
0.1  
VOL  
VI(HYS) Input voltage hysteresis  
150  
mV  
μA  
IIH  
IIL  
CI  
High-level input current  
Low-level input current  
Input capacitance to ground  
IN from 0 V to VCC  
10  
IN from 0 V to VCC  
–10  
25  
μA  
IN at VCC, VI = 0.4 sin (4E6πt)  
VI = VCC or 0 V, See Figure 3  
1
pF  
CMTI Common-mode transient immunity  
50  
kV/μs  
(1) For the 5-V operation, VCC1 or VCC2 is specified from 4.5 V to 5.5 V.  
For the 3-V operation, VCC1 or VCC2 is specified from 3 V to 3.6 V.  
SWITCHING CHARACTERISTICS  
VCC1 = VCC2 = 5 V, over recommended operating conditions (unless otherwise noted)  
PARAMETER  
Propagation delay  
TEST CONDITIONS  
MIN  
TYP  
405  
1
MAX UNIT  
tpLH, tpHL  
PWD  
280  
480  
14  
42  
2
ns  
ns  
ns  
ns  
ISO722xA See Figure 1  
(1)  
(1)  
Pulse-width distortion |tpHL – tpLH  
|
|
tpLH, tpHL  
PWD  
Propagation delay  
22  
32  
1
ISO722xC See Figure 1  
Pulse-width distortion |tpHL – tpLH  
ISO722xA  
ISO722xC  
ISO722xA  
ISO722xC  
See Figure 1  
See Figure 1  
180  
10  
15  
1
(2)  
tsk(pp)  
Part-to-part skew  
ns  
ns  
3
0.2  
1
(3)  
tsk(o)  
Channel-to-channel output skew  
tr  
Output signal rise time  
Output signal fall time  
ns  
ns  
μs  
tf  
1
tfs  
Failsafe output delay time from input power loss  
See Figure 2  
3
(1) Also referred to as pulse skew.  
(2) tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices  
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.  
(3) tsk(o) is the skew between specified outputs of a single device with all driving inputs connected together and the outputs switching in the  
same direction while driving identical specified loads.  
4
Submit Documentation Feedback  
Copyright © 2009–2012, Texas Instruments Incorporated  
Product Folder Link(s): ISO7220A-Q1 ISO7221A-Q1 ISO7221C-Q1  
ISO7220A-Q1  
ISO7221A-Q1  
ISO7221C-Q1  
www.ti.com  
SLLS965C JULY 2009REVISED MAY 2012  
ELECTRICAL CHARACTERISTICS  
VCC1 = 5 V, VCC2 = 3.3 V(1), over recommended operating conditions (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
1
MAX UNIT  
ISO7220x  
ISO7221x  
ISO7220A  
ISO7221A  
2
Quiescent VI = VCC or 0 V, no load  
8.5  
2
17  
ICC1  
Supply current, VCC1  
3
18  
22  
18  
9.5  
19  
11  
12  
mA  
mA  
1 Mbps  
VI = VCC or 0 V, no load  
VI = VCC or 0 V, no load  
10  
12  
8
ISO7221C 25 Mbps  
ISO7220x  
Quiescent VI = VCC or 0 V, no load  
ISO7221x  
ISO7220A  
ISO7221A  
4.3  
9
ICC2  
Supply current, VCC2  
1 Mbps  
VI = VCC or 0 V, no load  
VI = VCC or 0 V, no load  
5
ISO7221C 25 Mbps  
ISO7220x  
6
VCC – 0.4  
VCC – 0.8  
VCC – 0.1  
IOH = –4 mA, See Figure 1  
ISO7221x  
(5-V side)  
VOH  
High-level output voltage  
Low-level output voltage  
V
V
IOH = –20 μA, See Figure 1  
IOL = 4 mA, See Figure 1  
IOL = 20 μA, See Figure 1  
0.4  
0.1  
VOL  
VI(HYS) Input voltage hysteresis  
150  
mV  
μA  
IIH  
IIL  
CI  
High-level input current  
Low-level input current  
Input capacitance to ground  
IN from 0 V to VCC  
10  
IN from 0 V to VCC  
–10  
15  
μA  
IN at VCC, VI = 0.4 sin (4E6πt)  
VI = VCC or 0 V, See Figure 3  
1
pF  
CMTI Common-mode transient immunity  
40  
kV/μs  
(1) For the 5-V operation, VCC1 or VCC2 is specified from 4.5 V to 5.5 V.  
For the 3-V operation, VCC1 or VCC2 is specified from 3 V to 3.6 V.  
SWITCHING CHARACTERISTICS  
VCC1 = 5 V, VCC2 = 3.3 V, over recommended operating conditions (unless otherwise noted)  
PARAMETER  
Propagation delay  
TEST CONDITIONS  
MIN  
TYP  
410  
1
MAX UNIT  
tpLH, tpHL  
PWD  
285  
480  
14  
48  
2
ns  
ns  
ns  
ns  
ISO722xA See Figure 1  
(1)  
(1)  
Pulse-width distortion |tpHL – tpLH  
|
|
tpLH, tpHL  
PWD  
Propagation delay  
25  
36  
1
ISO722xC See Figure 1  
Pulse-width distortion |tpHL – tpLH  
ISO722xA  
ISO722xC  
ISO722xA  
ISO722xC  
See Figure 1  
See Figure 1  
180  
10  
15  
1
(2)  
tsk(pp)  
Part-to-part skew  
ns  
ns  
3
0.2  
2
(3)  
tsk(o)  
Channel-to-channel output skew  
tr  
Output signal rise time  
Output signal fall time  
ns  
tf  
2
tfs  
Failsafe output delay time from input power loss  
See Figure 2  
3
μs  
(1) Also referred to as pulse skew.  
(2) tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices  
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.  
(3) tsk(o) is the skew between specified outputs of a single device with all driving inputs connected together and the outputs switching in the  
same direction while driving identical specified loads.  
Copyright © 2009–2012, Texas Instruments Incorporated  
Submit Documentation Feedback  
5
Product Folder Link(s): ISO7220A-Q1 ISO7221A-Q1 ISO7221C-Q1  
ISO7220A-Q1  
ISO7221A-Q1  
ISO7221C-Q1  
SLLS965C JULY 2009REVISED MAY 2012  
www.ti.com  
ELECTRICAL CHARACTERISTICS  
VCC1 = 3.3 V, VCC2 = 5 V(1), over recommended operating conditions (unless otherwise noted)  
PARAMETER  
ISO7220x  
TEST CONDITIONS  
MIN  
TYP  
0.6  
4.3  
1
MAX UNIT  
1
Quiescent  
1 Mbps  
ISO7221x  
ISO7220A  
ISO7221A  
9.5  
ICC1  
Supply current, VCC1  
VI = VCC or 0 V, no load  
2
11  
12  
31  
17  
32  
18  
22  
mA  
mA  
5
ISO7221C 25 Mbps  
6
ISO7220x  
Quiescent  
ISO7221x  
16  
8.5  
18  
10  
12  
ICC2  
Supply current, VCC2  
ISO7220A  
1 Mbps  
VI = VCC or 0 V, no load  
ISO7221A  
ISO7221C 25 Mbps  
ISO7220x  
VCC – 0.8  
VCC – 0.4  
VCC – 0.1  
IOH = –4 mA, See Figure 1  
ISO7221x  
(3.3-V side)  
VOH  
High-level output voltage  
Low-level output voltage  
V
V
IOH = –20 μA, See Figure 1  
IOL = 4 mA, See Figure 1  
IOL = 20 μA, See Figure 1  
0.4  
0.1  
VOL  
0
VI(HYS) Input threshold voltage hysteresis  
150  
mV  
μA  
IIH  
IIL  
CI  
High-level input current  
Low-level input current  
Input capacitance to ground  
IN from 0 V or VCC  
10  
IN from 0 V or VCC  
–10  
15  
μA  
IN at VCC, VI = 0.4 sin (4E6πt)  
VI = VCC or 0 V, See Figure 3  
1
pF  
CMTI Common-mode transient immunity  
40  
kV/μs  
(1) For the 5-V operation, VCC1 or VCC2 is specified from 4.5 V to 5.5 V.  
For the 3-V operation, VCC1 or VCC2 is specified from 3 V to 3.6 V.  
SWITCHING CHARACTERISTICS  
VCC1 = 3.3 V, VCC2 = 5 V, over recommended operating conditions (unless otherwise noted)  
PARAMETER  
Propagation delay  
TEST CONDITIONS  
MIN  
TYP  
395  
1
MAX UNIT  
tpLH, tpHL  
PWD  
285  
480  
18  
48  
3
ns  
ns  
ns  
ns  
ISO722xA See Figure 1  
(1)  
(1)  
Pulse-width distortion |tpHL – tpLH  
|
|
tpLH, tpHL  
PWD  
Propagation delay  
24  
36  
1
ISO722xC See Figure 1  
Pulse-width distortion |tpHL – tpLH  
ISO722xA  
ISO722xC  
ISO722xA  
ISO722xC  
See Figure 1  
See Figure 1  
190  
10  
15  
1
(2)  
tsk(pp)  
Part-to-part skew  
ns  
ns  
3
0.2  
1
(3)  
tsk(o)  
Channel-to-channel output skew  
tr  
Output signal rise time  
Output signal fall time  
ns  
ns  
μs  
tf  
1
tfs  
Failsafe output delay time from input power loss  
See Figure 2  
3
(1) Also referred to as pulse skew.  
(2) tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices  
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.  
(3) tsk(o) is the skew between specified outputs of a single device with all driving inputs connected together and the outputs switching in the  
same direction while driving identical specified loads.  
6
Submit Documentation Feedback  
Copyright © 2009–2012, Texas Instruments Incorporated  
Product Folder Link(s): ISO7220A-Q1 ISO7221A-Q1 ISO7221C-Q1  
ISO7220A-Q1  
ISO7221A-Q1  
ISO7221C-Q1  
www.ti.com  
SLLS965C JULY 2009REVISED MAY 2012  
ELECTRICAL CHARACTERISTICS  
VCC1 = VCC2 = 3.3 V(1), over recommended operating conditions (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
0.6  
4.3  
1
MAX UNIT  
ISO7220x  
ISO7221x  
ISO7220A  
ISO7221A  
1
Quiescent  
1 Mbps  
9.5  
ICC1  
Supply current, VCC1  
VI = VCC or 0 V, no load  
2
11  
12  
18  
9.5  
19  
11  
12  
mA  
mA  
5
ISO7221C 25 Mbps  
6
ISO7220x  
Quiescent  
ISO7221x  
8
4.3  
9
ICC2  
Supply current, VCC2  
ISO7220A  
1 Mbps  
VI = VCC or 0 V, no load  
ISO7221A  
5
ISO7221C 25 Mbps  
6
IOH = –4 mA, See Figure 1  
IOH = –20 μA, See Figure 1  
IOL = 4 mA, See Figure 1  
IOL = 20 μA, See Figure 1  
VCC – 0.4  
VCC – 0.1  
3
VOH  
High-level output voltage  
Low-level output voltage  
V
V
3.3  
0.2  
0
0.4  
0.1  
VOL  
VI(HYS) Input voltage hysteresis  
150  
mV  
μA  
IIH  
IIL  
CI  
High-level input current  
Low-level input current  
Input capacitance to ground  
IN from 0 V or VCC  
10  
IN from 0 V or VCC  
–10  
15  
μA  
IN at VCC, VI = 0.4 sin (4E6πt)  
VI = VCC or 0 V, See Figure 3  
1
pF  
CMTI Common-mode transient immunity  
40  
kV/μs  
(1) For the 5-V operation, VCC1 or VCC2 is specified from 4.5 V to 5.5 V.  
For the 3-V operation, VCC1 or VCC2 is specified from 3 V to 3.6 V.  
SWITCHING CHARACTERISTICS  
VCC1 = VCC2 = 3.3 V, over recommended operating conditions (unless otherwise noted)  
PARAMETER  
Propagation delay  
TEST CONDITIONS  
MIN  
TYP  
400  
1
MAX UNIT  
tpLH, tpHL  
PWD  
290  
485  
18  
52  
3
ns  
ns  
ns  
ns  
ISO722xA See Figure 1  
(1)  
(1)  
Pulse-width distortion |tpHL – tpLH  
|
|
tpLH, tpHL  
PWD  
Propagation delay  
25  
40  
1
ISO722xC See Figure 1  
Pulse-width distortion |tpHL – tpLH  
ISO722xA  
ISO722xC  
ISO722xA  
ISO722xC  
See Figure 1  
See Figure 1  
190  
10  
15  
1
tsk(pp)  
Part-to-part skew(2)  
ns  
ns  
3
0.2  
2
(3)  
tsk(o)  
Channel-to-channel output skew  
tr  
Output signal rise time  
Output signal fall time  
ns  
ns  
μs  
tf  
2
tfs  
Failsafe output delay time from input power loss  
See Figure 2  
3
(1) Also referred to as pulse skew.  
(2) tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices  
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.  
(3) tsk(o) is the skew between specified outputs of a single device with all driving inputs connected together and the outputs switching in the  
same direction while driving identical specified loads.  
Copyright © 2009–2012, Texas Instruments Incorporated  
Submit Documentation Feedback  
7
Product Folder Link(s): ISO7220A-Q1 ISO7221A-Q1 ISO7221C-Q1  
ISO7220A-Q1  
ISO7221A-Q1  
ISO7221C-Q1  
SLLS965C JULY 2009REVISED MAY 2012  
www.ti.com  
PARAMETER MEASUREMENT INFORMATION  
V
1
CC  
V
V
1/2  
V
1/2  
I
CC  
CC  
IN  
OUT  
0 V  
t
t
PHL  
PLH  
Input  
Generator  
V
C
V
V
O
50 W  
OH  
OL  
L
NOTE B  
I
90%  
10%  
V
O
50%  
50%  
NOTE A  
V
t
t
f
r
A. The input pulse is supplied by a generator having the following characteristics: PRR 50 kHz, 50% duty cycle, tr 3  
ns, tf 3 ns, ZO = 50.  
B. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.  
Figure 1. Switching Characteristic Test Circuit and Voltage Waveforms  
V
I
V
1
CC  
V
1
CC  
V
I
0 V  
or  
2.7 V  
OUT  
IN  
V
0 V  
V
O
V
1
t
CC  
fs  
OH  
C
V
L
FAILSAFE HIGH  
50%  
O
NOTE A  
V
OL  
A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.  
Figure 2. Failsafe Delay Time Test Circuit and Voltage Waveforms  
V
1
V
2
CC  
CC  
C = 0.1 mF 1ꢀ  
C = 0.1 mF 1ꢀ  
Pass-fail criteria:  
Output must  
remain stable  
OUT  
IN  
S1  
NOTE A  
V
or V  
OL  
OH  
GND1  
GND2  
V
CM  
A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.  
Figure 3. Common-Mode Transient Immunity Test Circuit  
V
1
CC  
DUT  
Tektronix  
HFS9009  
IN  
0 V  
V
Tektronix  
OUT  
784D  
PATTERN  
/2  
GENERATOR  
CC  
Jitter  
NOTE: PRBS bit pattern run length is 216 – 1. Transition time is 800 ps.  
Figure 4. Peak-to-Peak Eye-Pattern Jitter Test Circuit and Voltage Waveform  
8
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ISO7220A-Q1  
ISO7221A-Q1  
ISO7221C-Q1  
www.ti.com  
SLLS965C JULY 2009REVISED MAY 2012  
DEVICE INFORMATION  
IEC PACKAGE CHARACTERISTICS  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
L(I01) Minimum air gap (clearance)  
Shortest terminal-to-terminal distance through air  
4.8  
mm  
SOIC-8  
Minimum external tracking  
(creepage)  
Shortest terminal-to-terminal distance across the  
package surface  
L(I02)  
4.3  
175  
0.008  
mm  
V
Tracking resistance  
CTI  
DIN IEC 60112 / VDE 0303 Part 1  
Distance through the insulation  
(comparative tracking index)  
Minimum internal gap (internal  
clearance)  
mm  
Input to output, VIO = 500 V, all pins on each side of the barrier  
tied together creating a two-terminal device, TA < 100°C  
>1012  
>1011  
1
RIO  
Isolation resistance  
Input to output, VIO = 500 V, 100°C TA max  
CIO  
CI  
Barrier capacitance input to  
output  
VI = 0.4 sin (4E6πt)  
pF  
pF  
Input capacitance to ground  
VI = 0.4 sin (4E6πt)  
1
NOTE: Creepage and clearance requirements should be applied according to the specific equipment isolation  
standards of an application. Care should be taken to maintain the creepage and clearance distance of a board  
design to ensure that the mounting pads of the isolator on the printed circuit board do not reduce this distance.  
Creepage and clearance on a printed circuit board become equal according to the measurement techniques  
shown in the Isolation Glossary . Techniques such as inserting grooves and/or ribs on a printed circuit board are  
used to help increase these specifications.  
IEC 60664-1 RATINGS TABLE  
PARAMETER  
TEST CONDITIONS  
Material group  
SPECIFICATION  
Basic isolation group  
IIIa  
I-IV  
I-III  
I-II  
Rated mains voltage 150 VRMS  
Rated mains voltage 300 VRMS  
Rated mains voltage 400 VRMS  
Installation classification  
IEC 60747-5-2 INSULATION CHARACTERISTICS(1)  
PARAMETER  
TEST CONDITIONS  
SPECIFICATION  
UNIT  
VIORM  
VPR  
Maximum working insulation voltage  
560  
V
Method b1, VPR = VIORM × 1.875,  
100% Production test with t = 1 s,  
Partial discharge <5 pC  
Input to output test voltage  
1050  
V
VIOTM  
RS  
Transient overvoltage  
Insulation resistance  
Pollution degree  
t = 60 s  
4000  
>109  
2
V
VIO = 500 V at TS  
(1) Climatic Classification 40/125/21  
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ISO7220A-Q1  
ISO7221A-Q1  
ISO7221C-Q1  
SLLS965C JULY 2009REVISED MAY 2012  
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DEVICE I/O SCHEMATICS  
Input  
Output  
V
CC2  
V
V
V
CC1  
CC1  
CC1  
750 kW  
8 W  
500 W  
IN  
OUT  
13 W  
IEC SAFETY LIMITING VALUES  
Safety limiting intends to prevent potential damage to the isolation barrier upon failure of input or output circuitry.  
A failure of the IO can allow low resistance to ground or the supply and, without current limiting, dissipate  
sufficient power to overheat the die and damage the isolation barrier potentially leading to secondary system  
failures.  
PARAMETER  
TEST CONDITIONS  
MIN  
MAX UNIT  
θJA = 212°C/W, VI = 5.5 V, TJ = 170°C, TA = 25°C  
θJA = 212°C/W, VI = 3.6 V, TJ = 170°C, TA = 25°C  
124  
mA  
190  
Safety input, output, or  
supply current  
IS  
SOIC-8  
SOIC-8  
TS  
Maximum case temperature  
150  
°C  
The safety-limiting constraint is the absolute maximum junction temperature specified in the absolute maximum  
ratings table. The power dissipation and junction-to-air thermal impedance of the device installed in the  
application hardware determines the junction temperature. The assumed junction-to-air thermal resistance in the  
Thermal Characteristics table is that of a device installed in the JESD51-3, Low Effective Thermal Conductivity  
Test Board for Leaded Surface Mount Packages and is conservative. The power is the recommended maximum  
input voltage times the current. The junction temperature is then the ambient temperature plus the power times  
the junction-to-air thermal resistance.  
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ISO7220A-Q1  
ISO7221A-Q1  
ISO7221C-Q1  
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SLLS965C JULY 2009REVISED MAY 2012  
SOIC-8 PACKAGE THERMAL CHARACTERISTICS  
over recommended operating conditions (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
Low-K thermal resistance(1)  
MIN  
TYP  
212  
122  
37  
MAX UNIT  
θJA  
Junction-to-air thermal resistance  
°C/W  
High-K thermal resistance  
θJB  
θJC  
Junction-to-board thermal resistance  
Junction-to-case thermal resistance  
°C/W  
°C/W  
69.1  
(1) Tested in accordance with the Low-K or High-K thermal metric definitions of EIA/JESD51-3 for leaded surface mount packages.  
250  
225  
V
at 3.6 V  
CC1,2  
200  
175  
150  
125  
100  
75  
V
at 5.5 V  
CC1,2  
50  
25  
0
0
50  
100  
- Case Temperature - °C  
150  
200  
T
C
Figure 5. SOIC-8 θJC THERMAL DERATING CURVE per IEC 60747-5-2  
DEVICE FUNCTION TABLE  
Table 1. ISO7220x or ISO7221x(1)  
INPUT SIDE VCC  
OUTPUT SIDE VCC  
INPUT IN  
OUTPUT OUT  
H
L
H
L
PU  
PD  
PU  
PU  
Open  
X
H
H
(1) PU = Powered up(Vcc 3.0 V), PD = Powered down (Vcc 2.5 V), X = Irrelevant, H = High level,  
L = Low level  
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ISO7220A-Q1  
ISO7221A-Q1  
ISO7221C-Q1  
SLLS965C JULY 2009REVISED MAY 2012  
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TYPICAL CHARACTERISTIC CURVES  
3.3-V RMS SUPPLY CURRENT  
5-V RMS SUPPLY CURRENT  
vs  
vs  
SIGNALING RATE (Mbps)  
SIGNALING RATE (Mbps)  
20  
18  
16  
14  
30  
28  
26  
24  
22  
T
= 25°C,  
T
= 25°C,  
A
A
ISO7220x I  
CC2  
15 pF Load  
15 pF Load  
ISO7220x I  
CC2  
20  
18  
16  
ISO7221x I  
CC1&2  
12  
10  
14  
12  
10  
ISO7221x I  
CC1&2  
8
6
ISO7220x I  
CC1  
8
6
4
4
2
0
ISO7220x I  
CC1  
2
0
0
25  
50  
75  
100  
0
25  
50  
75  
100  
Signaling Rate - Mbps  
Signaling Rate - Mbps  
Figure 6.  
Figure 7.  
ISO722xA AND ISO722xC INPUT VOLTAGE LOW-TO-HIGH  
SWITCHING THRESHOLD  
VCC FAILSAFE THRESHOLD  
vs  
vs  
FREE-AIR TEMPERATURE  
FREE-AIR TEMPERATURE  
2.92  
2.9  
1.4  
15 pF Load  
VCC = 3.3 V or 5 V  
5-V Vth+  
1.35  
VFS  
1.3  
3.3-V Vth+  
2.88  
2.86  
2.84  
2.82  
2.8  
1.25  
1.2  
1.15  
1.1  
15 pF Load  
5-V Vth-  
VFS-  
1.05  
3.3-V Vth-  
1
2.78  
-40 -25 -10  
5
20 35 50 65 80 95 110 125  
Temperature - °C  
-40 -25 -10  
5
20 35 50 65 80 95 110 125  
Temperature - °C  
Figure 8.  
Figure 9.  
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ISO7221C-Q1  
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SLLS965C JULY 2009REVISED MAY 2012  
TYPICAL CHARACTERISTIC CURVES (continued)  
HIGH-LEVEL OUTPUT CURRENT  
LOW-LEVEL OUTPUT CURRENT  
vs  
vs  
HIGH-LEVEL OUTPUT VOLTAGE  
LOW-LEVEL OUTPUT VOLTAGE  
70  
60  
50  
40  
30  
20  
10  
0
-80  
15 pF Load  
TA = 25°C  
15 pF Load  
TA = 25°C  
-70  
-60  
-50  
-40  
-30  
-20  
-10  
0
VCC = 5 V  
VCC = 5 V  
VCC = 3.3 V  
VCC = 3.3 V  
0
2
4
6
0
1
2
3
4
5
VOUT - V  
Figure 10.  
VOUT - V  
Figure 11.  
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ISO7220A-Q1  
ISO7221A-Q1  
ISO7221C-Q1  
SLLS965C JULY 2009REVISED MAY 2012  
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APPLICATION INFORMATION  
Typical Applications  
VCC 1  
VCC2  
2 mm  
max .  
from  
2 mm  
max .  
from  
m
0.1 F  
m
0.1 F  
Vcc 1  
Vcc 2  
1
2
8
7
6
5
INA  
INB  
OUTA  
OUTB  
OUTPUT  
OUTPUT  
INPUT  
INPUT  
3
4
ISO7220  
GND 1  
GND 2  
Figure 12. Typical ISO7220 Application Circuit  
VCC 1  
VCC2  
2 mm  
max .  
from  
2 mm  
max .  
from  
m
0.1 F  
m
0.1 F  
Vcc 1  
Vcc 2  
1
2
8
7
OUTA  
INB  
INA  
OUTPUT  
INPUT  
INPUT  
OUTB  
OUTPUT  
3
4
6
5
ISO 7221  
GND 1  
GND 2  
Figure 13. Typical ISO7221 Application Circuit  
100  
VIORM at 560 V  
28  
10  
0
250  
500  
750  
1000  
120  
880  
WORKING VOLTAGE (VIORM) -- V  
Figure 14. Time-Dependent Dielectric Breakdown Test Results  
14  
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SLLS965C JULY 2009REVISED MAY 2012  
ISOLATION GLOSSARY  
Creepage Distance — The shortest path between two conductive input to output leads measured along the  
surface of the insulation. The shortest distance path is found around the end of the package body.  
Clearance — The shortest distance between two conductive input to output leads measured through air (line of  
sight).  
Input-to Output Barrier Capacitance — The total capacitance between all input terminals connected together,  
and all output terminals connected together.  
Input-to Output Barrier Resistance — The total resistance between all input terminals connected together, and  
all output terminals connected together.  
Primary Circuit — An internal circuit directly connected to an external supply mains or other equivalent source  
which supplies the primary circuit electric power.  
Secondary Circuit — A circuit with no direct connection to primary power, and derives its power from a separate  
isolated source.  
Comparative Tracking Index (CTI) — CTI is an index used for electrical insulating materials which is defined as  
the numerical value of the voltage which causes failure by tracking during standard testing. Tracking is the  
process that produces a partially conducting path of localized deterioration on or through the surface of an  
insulating material as a result of the action of electric discharges on or close to an insulation surface -- the higher  
CTI value of the insulating material, the smaller the minimum creepage distance.  
Generally, insulation breakdown occurs either through the material, over its surface, or both. Surface failure may  
arise from flashover or from the progressive degradation of the insulation surface by small localized sparks. Such  
sparks are the result of the breaking of a surface film of conducting contaminant on the insulation. The resulting  
break in the leakage current produces an overvoltage at the site of the discontinuity, and an electric spark is  
generated. These sparks often cause carbonization on insulation material and lead to a carbon track between  
points of different potential. This process is known as tracking.  
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Insulation:  
Operational insulation — Insulation needed for the correct operation of the equipment.  
Basic insulation — Insulation to provide basic protection against electric shock.  
Supplementary insulation — Independent insulation applied in addition to basic insulation in order to ensure  
protection against electric shock in the event of a failure of the basic insulation.  
Double insulation — Insulation comprising both basic and supplementary insulation.  
Reinforced insulation — A single insulation system which provides a degree of protection against electric shock  
equivalent to double insulation.  
Pollution Degree:  
Pollution Degree 1 — No pollution, or only dry, nonconductive pollution occurs. The pollution has no influence.  
Pollution Degree 2 — Normally, only nonconductive pollution occurs. However, a temporary conductivity caused  
by condensation must be expected.  
Pollution Degree 3 — Conductive pollution occurs or dry nonconductive pollution occurs which becomes  
conductive due to condensation which is to be expected.  
Pollution Degree 4 – Continuous conductivity occurs due to conductive dust, rain, or other wet conditions.  
Installation Category:  
Overvoltage Category — This section is directed at insulation co-ordination by identifying the transient  
overvoltages which may occur, and by assigning 4 different levels as indicated in IEC 60664.  
I: Signal Level — Special equipment or parts of equipment.  
II: Local Level — Portable equipment etc.  
III: Distribution Level — Fixed installation  
IV: Primary Supply Level — Overhead lines, cable systems  
Each category should be subject to smaller transients than the category above.  
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ISO7221C-Q1  
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SLLS965C JULY 2009REVISED MAY 2012  
REVISION HISTORY  
Changes from Revision B (March 2010) to Revision C  
Page  
Added storage temperature to Abs Max table. ..................................................................................................................... 3  
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PACKAGE OPTION ADDENDUM  
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22-May-2012  
PACKAGING INFORMATION  
Status (1)  
Eco Plan (2)  
MSL Peak Temp (3)  
Samples  
Orderable Device  
Package Type Package  
Drawing  
Pins  
Package Qty  
Lead/  
Ball Finish  
(Requires Login)  
ISO7220AQDRQ1  
ISO7221AQDRQ1  
ISO7221CQDRQ1  
ACTIVE  
ACTIVE  
ACTIVE  
SOIC  
SOIC  
SOIC  
D
D
D
8
8
8
2500  
2500  
2500  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU Level-3-260C-168 HR  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU Level-3-260C-168 HR  
CU NIPDAU Level-3-260C-168 HR  
Green (RoHS  
& no Sb/Br)  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability  
information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that  
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between  
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight  
in homogeneous material)  
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
OTHER QUALIFIED VERSIONS OF ISO7220A-Q1, ISO7221A-Q1, ISO7221C-Q1 :  
Catalog: ISO7220A, ISO7221A, ISO7221C  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
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22-May-2012  
NOTE: Qualified Version Definitions:  
Catalog - TI's standard catalog product  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
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14-Jul-2012  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
ISO7220AQDRQ1  
ISO7221AQDRQ1  
ISO7221CQDRQ1  
SOIC  
SOIC  
SOIC  
D
D
D
8
8
8
2500  
2500  
2500  
330.0  
330.0  
330.0  
12.4  
12.4  
12.4  
6.4  
6.4  
6.4  
5.2  
5.2  
5.2  
2.1  
2.1  
2.1  
8.0  
8.0  
8.0  
12.0  
12.0  
12.0  
Q1  
Q1  
Q1  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
14-Jul-2012  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SPQ  
Length (mm) Width (mm) Height (mm)  
ISO7220AQDRQ1  
ISO7221AQDRQ1  
ISO7221CQDRQ1  
SOIC  
SOIC  
SOIC  
D
D
D
8
8
8
2500  
2500  
2500  
367.0  
367.0  
367.0  
367.0  
367.0  
367.0  
35.0  
35.0  
35.0  
Pack Materials-Page 2  
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