ISO7730FQDWRQ1 [TI]

EMC 性能优异的汽车类三通道、3/0、增强型数字隔离器 | DW | 16 | -40 to 125;
ISO7730FQDWRQ1
型号: ISO7730FQDWRQ1
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

EMC 性能优异的汽车类三通道、3/0、增强型数字隔离器 | DW | 16 | -40 to 125

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中文:  中文翻译
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ISO7730-Q1, ISO7731-Q1  
ZHCSFU6D NOVEMBER 2016 REVISED OCTOBER 2020  
ISO773x-Q1 EMC 性能优异的高速、增强型三通道数字隔离器  
1 特性  
3 说明  
• 符合汽车应用要求  
• 具有符AEC-Q100 标准的下列特性:  
– 器件温度等140°C +125°C 环境工作  
温度范围  
功能安全型  
ISO773x-Q1 器件是高性能三通道数字隔离器可提供  
UL 1577 5000VRMSDW 封装3000VRMS  
DBQ 封装隔离额定值。  
该系列包含的器件具有符合 VDECSATUV 和  
CQC 标准的增强绝缘等级。  
– 可提供用于功能安全系统设计的文档:  
ISO7730-Q1, ISO7731-Q1  
100Mbps 数据速率  
在隔离 CMOS LVCMOS 数字 I/O ISO773x-Q1  
系列器件可提供高电磁抗扰度和低辐射并具备低功耗  
特性。每条隔离通道的逻辑输入和输出缓冲器均由双电  
容二氧化硅 (SiO2) 绝缘栅相隔离。该器件配有使能引  
可用于将各自输出置于高阻态以适用于多主驱动应  
用中并降低功耗。  
• 稳健可靠的隔离栅:  
1500VRMS 工作电压下预计寿命超100 年  
– 隔离等级高5000 VRMS  
– 浪涌能力高12.8 kV  
CMTI 典型值±100kV/μs  
器件信息  
• 宽电源电压范围2.25V 5.5V  
2.25V 5.5V 电平转换  
• 默认输出高电(ISO773x) 低电(ISO773xF)  
选项  
器件型号(1)  
封装尺寸标称值)  
10.30mm × 7.50mm  
4.90mm × 3.90mm  
封装  
SOIC (DW)  
SSOP (DBQ)  
ISO7730-Q1  
ISO7731-Q1  
• 低功耗1Mbps 时每通道的电流典型值1.5mA  
• 低传播延迟典型值11ns5V 电源)  
• 优异的电磁兼容(EMC)  
(1) 如需了解所有可用封装请参阅数据表末尾的可订购产品附  
录。  
– 系统ESDEFT 和浪涌抗扰性  
– 在整个隔离栅具±8kV IEC 61000-4-2 接触放  
电保护  
VCCO  
VCCI  
Series Isolation  
Capacitors  
– 低辐射  
• 宽SOIC (DW-16) QSOP (DBQ-16) 封装选项  
• 安全相关认证:  
INx  
OUTx  
ENx  
DIN VDE V 0884-11:2017-01  
UL 1577 组件认证计划  
GNDI  
GNDO  
Copyright © 2016, Texas Instruments Incorporated  
CSACQC TUV 认证  
VCCI = 输入电源VCCO = 输出电源  
GNDI = 输入接地GNDO = 输出接地  
2 应用  
混合动力、电动和动力总成系(EV/HEV)  
简化版原理图  
电池管理系(BMS)  
车载充电器  
牵引逆变器  
直流/直流转换器  
逆变器和电机控制  
本文档旨在为方便起见提供有TI 产品中文版本的信息以确认产品的概要。有关适用的官方英文版本的最新信息请访问  
www.ti.com其内容始终优先。TI 不保证翻译的准确性和有效性。在实际设计之前请务必参考最新版本的英文版本。  
English Data Sheet: SLLSEU3  
 
 
 
 
 
 
ISO7730-Q1, ISO7731-Q1  
ZHCSFU6D NOVEMBER 2016 REVISED OCTOBER 2020  
www.ti.com.cn  
Table of Contents  
7.19 Typical Characteristics............................................18  
8 Parameter Measurement Information..........................20  
9 Detailed Description......................................................22  
9.1 Overview...................................................................22  
9.2 Functional Block Diagram.........................................22  
9.3 Feature Description...................................................23  
9.4 Device Functional Modes..........................................24  
10 Application and Implementation................................26  
10.1 Application Information........................................... 26  
10.2 Typical Application.................................................. 26  
11 Power Supply Recommendations..............................30  
12 Layout...........................................................................31  
12.1 Layout Guidelines................................................... 31  
12.2 Layout Example...................................................... 31  
13 Device and Documentation Support..........................32  
13.1 Documentation Support.......................................... 32  
13.2 Related Links.......................................................... 32  
13.3 Receiving Notification of Documentation Updates..32  
13.4 支持资源..................................................................32  
13.5 Trademarks.............................................................32  
13.6 静电放电警告.......................................................... 32  
13.7 术语表..................................................................... 32  
14 Mechanical, Packaging, and Orderable  
1 特性................................................................................... 1  
2 应用................................................................................... 1  
3 说明................................................................................... 1  
4 Revision History.............................................................. 2  
5 Description Continued....................................................4  
6 Pin Configuration and Functions...................................5  
7 Specifications.................................................................. 7  
7.1 Absolute Maximum Ratings........................................ 7  
7.2 ESD Ratings............................................................... 7  
7.3 Recommended Operating Conditions.........................7  
7.4 Thermal Information....................................................8  
7.5 Power Ratings.............................................................8  
7.6 Insulation Specifications............................................. 9  
7.7 Safety-Related Certifications.................................... 10  
7.8 Safety Limiting Values...............................................10  
7.9 Electrical Characteristics5-V Supply......................11  
7.10 Supply Current Characteristics5-V Supply.......... 11  
7.11 Electrical Characteristics3.3-V Supply.................13  
7.12 Supply Current Characteristics3.3-V Supply.......13  
7.13 Electrical Characteristics2.5-V Supply................ 14  
7.14 Supply Current Characteristics2.5-V Supply.......14  
7.15 Switching Characteristics5-V Supply...................15  
7.16 Switching Characteristics3.3-V Supply................16  
7.17 Switching Characteristics2.5-V Supply................16  
7.18 Insulation Characteristics Curves........................... 17  
Information.................................................................... 33  
4 Revision History  
以前版本的页码可能与当前版本的页码不同  
Changes from Revision C (March 2020) to Revision D (October 2020)  
Page  
• 在1 中添加了“功能安全”要点..................................................................................................................... 1  
Changes from Revision B (September 2018) to Revision C (March 2020)  
Page  
• 通篇进行了编辑性和修饰性更改.........................................................................................................................1  
• 将“隔离栅寿命40 年”更改为“1500VRMS 工作电压下预计寿命超过 100 年”位于1..........1  
• 在1 中添加了“隔离等级高达 5000VRMS....................................................................................................1  
• 在1 中添加了“浪涌能力高达 12.8kV.........................................................................................................1  
• 在1 中添加了“在整个隔离栅具有 ±8kV IEC 61000-4-2 接触放电保护”......................................................1  
UL 认证要点从“符UL 1577 5000VRMS (DW) 2500VRMS (DBQ) 隔离额定值”更改为“UL 1577 组  
件认证计划”1 ................................................................................................................................1  
• 删除了1 中的“DBQ-16 封装器件的 CQC 认证外所有认证均已完成”要点..........................................1  
• 更新了2 部分的应用列表................................................................................................................................1  
• 更新了3-1以便显示每个通道的两个串联隔离电容器而不是单个隔离电容器...........................................1  
Added "Contact discharge per IEC 61000-4-2" specification of ±8000 V in 7.2 table....................................7  
Added the following table note to Data rate specification in 7.3 table: "100 Mbps is the maximum specified  
data rate, although higher data rates are possible." .......................................................................................... 7  
Changed VIORM value for DW-16 package From: "1414 VPK" To: "2121 VPK" in 7.6 table ............................9  
Changed VIOWM value for DW-16 package AC voltage From: "1000 VRMS" To: "1500 VRMS" and DC voltage  
From: "1414 VDC" To: "2121 VDC" in 7.6 table ...............................................................................................9  
Added 'see 10-8' to TEST CONDITIONS of VIOWM specification in 7.6 ................................................... 9  
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English Data Sheet: SLLSEU3  
 
ISO7730-Q1, ISO7731-Q1  
ZHCSFU6D NOVEMBER 2016 REVISED OCTOBER 2020  
www.ti.com.cn  
Changed VIOSM TEST CONDITIONS From: "Test method per IEC 60065" To: "Test method per IEC 62368-1"  
in 7.6 table......................................................................................................................................................9  
Updated certification information in 7.7 table ..............................................................................................10  
Corrected ground symbols for "Input (Devices with F suffix)" in 9.4.1 ........................................................ 25  
Added 10.2.3.1 sub-section under 10.2.3 section................................................................................... 29  
Added 'How to use isolation to improve ESD, EFT, and Surge immunity in industrial systems' application  
report to 13.1 section .................................................................................................................................. 32  
Changes from Revision A (May 2017) to Revision B (June 2018)  
Page  
• 通篇更改了 DIN 认证编号和认证状态.................................................................................................................1  
DBQ 封装的隔离等级从 2500VRMS 更改3000VRMS ..................................................................................1  
Moved the HBM and CDM values from the Features section to the ESD Ratings table.................................... 7  
Added VTEST to the conditions for the maximum transient isolation voltage parameter in the Insulation  
Specifications table.............................................................................................................................................9  
Changed the value for the DBQ package from 3600 VPK to 4242 VPK throughout the document.....................9  
Changed the method b1 Vini condition for apparent charge in the Insulation Specifications table..................... 9  
Changes from Revision * (November 2016) to Revision A (May 2017)  
Page  
Updated the Safety-Related Certifications table...............................................................................................10  
Changed the minimum CMTI from 40 to 85 in all Electrical Characteristics tables ..........................................11  
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English Data Sheet: SLLSEU3  
ISO7730-Q1, ISO7731-Q1  
ZHCSFU6D NOVEMBER 2016 REVISED OCTOBER 2020  
www.ti.com.cn  
5 Description Continued  
The ISO7730-Q1 device has all three channels in the same direction and the ISO7731-Q1 device has two  
forward and one reverse-direction channel. If the input power or signal is lost, the default output is high for  
devices without suffix F and low for devices with suffix F. See the Device Functional Modes section for further  
details.  
Used in conjunction with isolated power supplies, this family of devices helps prevent noise currents on data  
buses, such as CAN and LIN, or other circuits from entering the local ground and interfering with or damaging  
sensitive circuitry. Through innovative chip design and layout techniques, electromagnetic compatibility of the  
ISO773x-Q1 device has been significantly enhanced to ease system-level ESD, EFT, surge, and emissions  
compliance. The ISO773x-Q1 family of devices is available in 16-pin wide-SOIC and QSOP packages.  
Copyright © 2023 Texas Instruments Incorporated  
English Data Sheet: SLLSEU3  
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ISO7730-Q1, ISO7731-Q1  
ZHCSFU6D NOVEMBER 2016 REVISED OCTOBER 2020  
www.ti.com.cn  
6 Pin Configuration and Functions  
1
2
3
4
5
6
7
8
16  
V
V
CC1  
CC2  
GND1  
INA  
15 GND2  
14 OUTA  
13 OUTB  
12 OUTC  
11 NC  
INB  
INC  
NC  
NC  
10 EN2  
9 GND2  
GND1  
6-1. ISO7730-Q1 DW and DBQ Packages 16-Pin SOIC-WB and QSOP Top View  
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English Data Sheet: SLLSEU3  
 
ISO7730-Q1, ISO7731-Q1  
ZHCSFU6D NOVEMBER 2016 REVISED OCTOBER 2020  
www.ti.com.cn  
1
2
3
4
5
6
7
8
16  
V
V
CC1  
CC2  
GND1  
INA  
15 GND2  
14 OUTA  
13 OUTB  
12 INC  
11 NC  
10 EN2  
9 GND2  
INB  
OUTC  
NC  
EN1  
GND1  
6-2. ISO7731-Q1 DW and DBQ Packages 16-Pin SOIC-WB and QSOP Top View  
6-1. Pin Functions  
PIN  
NO.  
I/O  
DESCRIPTION  
NAME  
ISO7730-Q1  
ISO7731-Q1  
Output enable 1. Output pins on side 1 are enabled when EN1 is high or  
open and in high-impedance state when EN1 is low.  
EN1  
EN2  
7
I
I
Output enable 2. Output pins on side 2 are enabled when EN2 is high or  
open and in high-impedance state when EN2 is low.  
10  
10  
GND1  
GND2  
INA  
2, 8  
2, 8  
9, 15  
3
Ground connection for VCC1  
Ground connection for VCC2  
Input, channel A  
I
9, 15  
3
INB  
4
5
4
I
Input, channel B  
INC  
12  
6, 11  
14  
13  
5
I
Input, channel C  
NC  
6, 7, 11  
14  
Not connected  
O
O
O
OUTA  
OUTB  
OUTC  
VCC1  
VCC2  
Output, channel A  
Output, channel B  
Output, channel C  
Power supply, VCC1  
Power supply, VCC2  
13  
12  
1
1
16  
16  
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Product Folder Links: ISO7730-Q1 ISO7731-Q1  
English Data Sheet: SLLSEU3  
ISO7730-Q1, ISO7731-Q1  
ZHCSFU6D NOVEMBER 2016 REVISED OCTOBER 2020  
www.ti.com.cn  
7 Specifications  
7.1 Absolute Maximum Ratings  
See (1)  
MIN  
0.5  
0.5  
15  
MAX  
UNIT  
V
VCC1, VCC2  
Supply voltage(2)  
6
VCCX + 0.5(3)  
15  
V
Voltage at INx, OUTx, ENx  
Output current  
V
IO  
mA  
°C  
TJ  
Tstg  
Junction temperature  
Storage temperature  
150  
150  
°C  
65  
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings  
only and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating  
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
(2) All voltage values except differential I/O bus voltages are with respect to the local ground terminal (GND1 or GND2) and are peak  
voltage values.  
(3) Maximum voltage must not exceed 6 V.  
7.2 ESD Ratings  
VALUE  
UNIT  
Human-body model (HBM), per AEC Q100-002(1)  
HBM ESD Classification Level 3A  
±6000  
Electrostatic  
discharge  
V(ESD)  
Charged-device model (CDM), per AEC Q100-011  
CDM ESD Classification Level C6  
V
±1500  
±8000  
Contact discharge per IEC 61000-4-2; Isolation barrier withstand test(2) (3)  
(1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.  
(2) IEC ESD strike is applied across the barrier with all pins on each side tied together creating a two-terminal device.  
(3) Testing is carried out in air or oil to determine the intrinsic contact discharge capability of the device.  
7.3 Recommended Operating Conditions  
MIN  
NOM  
MAX  
5.5  
UNIT  
VCC1, VCC2  
VCC(UVLO+)  
VCC(UVLO)  
VHYS(UVLO)  
Supply voltage  
2.25  
V
V
UVLO threshold when supply voltage is rising  
UVLO threshold when supply voltage is falling  
Supply voltage UVLO hysteresis  
VCCO (1) = 5 V  
2
1.8  
2.25  
1.7  
100  
4  
2  
1  
V
200  
mV  
IOH  
High-level output current  
VCCO = 3.3 V  
VCCO = 2.5 V  
VCCO = 5 V  
mA  
mA  
4
IOL  
Low-level output current  
VCCO = 3.3 V  
VCCO = 2.5 V  
2
1
(1)  
VIH  
VIL  
High-level input voltage  
Low-level input voltage  
Data rate(2)  
0.7 × VCCI  
VCCI  
V
V
0
0
0.3 × VCCI  
100  
DR(2)  
Mbps  
°C  
TA  
Ambient temperature  
-40  
25  
125  
(1) VCCI = Input-side VCC; VCCO = Output-side VCC  
.
(2) 100 Mbps is the maximum specified data rate, although higher data rates are possible.  
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Product Folder Links: ISO7730-Q1 ISO7731-Q1  
English Data Sheet: SLLSEU3  
 
 
 
 
 
 
 
 
 
 
 
 
ISO7730-Q1, ISO7731-Q1  
ZHCSFU6D NOVEMBER 2016 REVISED OCTOBER 2020  
www.ti.com.cn  
7.4 Thermal Information  
ISO773x-Q1  
DW (SOIC) DBQ (QSOP)  
THERMAL METRIC(1)  
UNIT  
16 Pins  
81.4  
16 Pins  
109  
RθJA  
Junction-to-ambient thermal resistance  
Junction-to-case(top) thermal resistance  
Junction-to-board thermal resistance  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
RθJC(top)  
RθJB  
44.9  
46.8  
60.6  
35.9  
60  
45.9  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case(bottom) thermal resistance  
28.1  
ψJT  
45.5  
ψJB  
RθJC(bottom)  
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application  
report.  
7.5 Power Ratings  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
ISO7730-Q1  
PD  
Maximum power dissipation  
150  
25  
mW  
mW  
mW  
VCC1 = VCC2 = 5.5 V, TJ = 150°C, CL = 15 pF, input  
a 50-MHz 50% duty cycle square wave  
PD1  
PD2  
Maximum power dissipation by side-1  
Maximum power dissipation by side-2  
125  
ISO7731-Q1  
PD  
Maximum power dissipation  
150  
50  
mW  
mW  
mW  
VCC1 = VCC2 = 5.5 V, TJ = 150°C, CL = 15 pF, input  
a 50-MHz 50% duty cycle square wave  
PD1  
PD2  
Maximum power dissipation by side-1  
Maximum power dissipation by side-2  
100  
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English Data Sheet: SLLSEU3  
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7.6 Insulation Specifications  
SPECIFICATION  
PARAMETER  
TEST CONDITIONS  
UNIT  
DW-16  
DBQ-16  
CLR  
External clearance (1)  
Shortest terminal-to-terminal distance through air  
>8  
>3.7  
mm  
mm  
Shortest terminal-to-terminal distance across the  
package surface  
CPG External creepage (1)  
>8  
>3.7  
DTI  
CTI  
Distance through the insulation  
Minimum internal gap (internal clearance)  
DIN EN 60112 (VDE 0303-11); IEC 60112; UL 746A  
According to IEC 60664-1  
>21  
>600  
I
>21  
>600  
I
μm  
Comparative tracking index  
Material group  
V
Rated mains voltage 150 VRMS  
Rated mains voltage 300 VRMS  
Rated mains voltage 600 VRMS  
Rated mains voltage 1000 VRMS  
IIV  
IIV  
IIV  
IIII  
IIV  
IIII  
n/a  
Overvoltage category per IEC 60664-1  
n/a  
DIN VDE V 0884-11:2017-01(2)  
Maximum repetitive peak isolation  
VIORM  
AC voltage (bipolar)  
2121  
566  
VPK  
voltage  
AC voltage; Time dependent dielectric breakdown  
(TDDB) Test; See 10-8  
1500  
2121  
400  
566  
VRMS  
VDC  
VIOWM Maximum working isolation voltage  
DC Voltage  
VTEST = VIOTM  
,
t = 60 s (qualification);  
VTEST = 1.2 × VIOTM,  
t = 1 s (100% production)  
VIOTM Maximum transient isolation voltage  
VIOSM Maximum surge isolation voltage (3)  
8000  
4242  
VPK  
Test method per IEC 62368-1; 1.2/50 µs waveform,  
VTEST = 1.6 × VIOSM (qualification)  
8000  
5  
4000  
5  
VPK  
Method a, After Input/Output safety test subgroup 2/3,  
Vini = VIOTM, tini = 60 s; Vpd(m) = 1.2 × VIORM, tm = 10 s  
Method a, After environmental tests subgroup 1,  
Vini = VIOTM, tini = 60 s; Vpd(m) = 1.6 × VIORM, tm = 10 s  
5  
5  
qpd  
Apparent charge(4)  
pC  
Method b1; At routine test (100% production) and  
preconditioning (type test)  
Vini = 1.2 × VIOTM, tini = 1 s;  
5  
5  
Vpd(m) = 1.875 × VIORM, tm = 1 s  
CIO  
RIO  
Barrier capacitance, input to output(5)  
Isolation resistance(5)  
~0.7  
>1012  
>1011  
>109  
2
~0.7  
>1012  
>1011  
>109  
2
pF  
VIO = 0.4 x sin (2πft), f = 1 MHz  
VIO = 500 V, TA = 25°C  
VIO = 500 V, 100°C TA 125°C  
VIO = 500 V at TS = 150°C  
Pollution degree  
Climatic category  
55/125/21 55/125/21  
UL 1577  
VISO Withstanding isolation voltage  
VTEST = VISO , t = 60 s (qualificati  
on), VTEST = 1.2 × VISO , t = 1 s (100% production)  
5000  
3000  
VRMS  
(1) Creepage and clearance requirements should be applied according to the specific equipment isolation standards of an application.  
Care should be taken to maintain the creepage and clearance distance of a board design to ensure that the mounting pads of the  
isolator on the printed-circuit board do not reduce this distance. Creepage and clearance on a printed-circuit board become equal in  
certain cases. Techniques such as inserting grooves and/or ribs on a printed circuit board are used to help increase these  
specifications.  
(2) This coupler is suitable for safe electrical insulation only within the safety ratings. Compliance with the safety ratings shall be ensured  
by means of suitable protective circuits.  
(3) Testing is carried out in air or oil to determine the intrinsic surge immunity of the isolation barrier.  
(4) Apparent charge is electrical discharge caused by a partial discharge (pd).  
(5) All pins on each side of the barrier tied together creating a two-terminal device.  
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ISO7730-Q1, ISO7731-Q1  
ZHCSFU6D NOVEMBER 2016 REVISED OCTOBER 2020  
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TUV  
7.7 Safety-Related Certifications  
VDE  
CSA  
UL  
CQC  
Certified according to EN  
Certified according to IEC  
60950-1, IEC 62368-1 and IEC Component Recognition  
60601-1  
Certified according to UL 1577  
Certified according to DIN  
VDE V 0884-11:2017-01  
Certified according to GB  
4943.1-2011  
61010-1:2010/A1:2019, EN  
60950-1:2006/A2:2013 and  
EN 62368-1:2014  
Program  
5000 VRMS (DW-16) and  
3000 VRMS (DBQ-16)  
Reinforced insulation per CSA  
60950-1-07+A1+A2, IEC  
60950-1 2nd Ed.+A1+A2, CSA  
62368-1-14 and IEC  
Reinforced insulation per  
EN 61010-1:2010/A1:2019  
up to working voltage of 600  
VRMS (DW-16) and 300  
VRMS (DBQ-16)  
Maximum transient isolation  
voltage, 8000 VPK (DW-16)  
and 4242 VPK (DBQ-16);  
Maximum repetitive peak  
isolation voltage, 2121 VPK  
(DW-16, Reinforced) and  
566 VPK (DBQ-16);  
Maximum surge isolation  
voltage, 8000 VPK (DW-16)  
and 4000 VPK (DBQ-16)  
DW-16: Reinforced Insulation,  
Altitude 5000 m, Tropical  
DW-16: Single protection, 5000 Climate, 700 VRMS maximum  
62368-1:2014,  
800 VRMS (DW-16) max working  
voltage (pollution degree 2,  
material group I);  
2 MOPP (Means of Patient  
Protection) per CSA 60601-1:14  
and IEC 60601-1 Ed. 3.1, 250  
VRMS (DW-16) max working  
voltage  
VRMS  
;
working voltage;  
5000 VRMS (DW-16) and  
3000 VRMS (DBQ-16)  
DBQ-16: Single protection,  
3000 VRMS  
DBQ-16: Basic Insulation,  
Altitude 5000 m, Tropical  
Climate, 400 VRMS maximum  
working voltage  
Reinforced insulation per  
EN 60950-1:2006/A2:2013  
and EN 62368-1:2014 up to  
working voltage of 800  
VRMS (DW -16) and 370  
VRMS (DBQ-16)  
Certificate numbers:  
CQC15001121716 (DW-16)  
CQC18001199097 (DBQ-16)  
Certificate number:  
40040142  
Master contract number: 220991 File number: E181974  
Client ID number: 77311  
7.8 Safety Limiting Values  
Safety limiting(1) intends to minimize potential damage to the isolation barrier upon failure of input or output circuitry. A failure  
of the I/O can allow low resistance to ground or the supply and, without current limiting, dissipate sufficient power to overheat  
the die and damage the isolation barrier potentially leading to secondary system failures.  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
DW-16 PACKAGE  
279  
RθJA = 81.4 °C/W, VI = 5.5 V, TJ = 150°C, TA = 25°C, see 7-1  
RθJA = 81.4 °C/W, VI = 3.6 V, TJ = 150°C, TA = 25°C, see 7-1  
RθJA = 81.4 °C/W, VI = 2.75 V, TJ = 150°C, TA = 25°C, see 7-1  
Safety input, output, or  
supply current  
IS  
427  
558  
mA  
Safety input, output, or total  
power  
PS  
TS  
1536 mW  
RθJA = 81.4 °C/W, TJ = 150°C, TA = 25°C, see 7-3  
Maximum safety  
temperature  
150  
°C  
DBQ-16 PACKAGE  
209  
319  
417  
RθJA = 109.0°C/W, VI = 5.5 V, TJ = 150°C, TA = 25°C, see 7-2  
RθJA = 109.0 °C/W, VI = 3.6 V, TJ = 150°C, TA = 25°C, see 7-2  
RθJA = 109.0°C/W, VI = 2.75 V, TJ = 150°C, TA = 25°C, see 7-2  
Safety input, output, or  
supply current  
IS  
mA  
Safety input, output, or total  
power  
PS  
TS  
1147 mW  
150 °C  
RθJA = 109.0°C/W, TJ = 150°C, TA = 25°C, see 7-4  
Maximum safety  
temperature  
(1) The maximum safety temperature is the maximum junction temperature specified for the device. The power dissipation and junction-to-  
air thermal impedance of the device installed in the application hardware determines the junction temperature. The assumed junction-  
to-air thermal resistance in the 7.4 is that of a device installed on a High-K test board for leaded surface mount packages. The  
power is the recommended maximum input voltage times the current. The junction temperature is then the ambient temperature plus  
the power times the junction-to-air thermal resistance.  
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7.9 Electrical Characteristics5-V Supply  
VCC1 = VCC2 = 5 V ±10% (over recommended operating conditions unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
4.8  
MAX  
UNIT  
IOH = 4 mA; see 8-1  
VCCO (1) 0.4  
VOH  
High-level output voltage  
Low-level output voltage  
Rising input voltage threshold  
Falling input voltage threshold  
V
V
V
V
VOL  
0.2  
0.4  
IOL = 4 mA; see 8-1  
VIT+(IN)  
VIT-(IN)  
0.6 × VCCI 0.7 × VCCI  
0.4 × VCCI  
0.3 × VCCI  
0.1 × VCCI  
Input threshold voltage  
hysteresis  
VI(HYS)  
0.2 × VCCI  
V
IIH  
IIL  
High-level input current  
Low-level input current  
VIH = VCCI (1) at INx or ENx  
VIL = 0 V at INx or ENx  
10  
μA  
μA  
10  
Common-mode transient  
immunity  
CMTI  
CI  
85  
100  
2
VI = VCCI or 0 V, VCM = 1200 V; see 8-4  
kV/μs  
Input Capacitance(2)  
pF  
VI = VCC/ 2 + 0.4×sin(2πft), f = 1 MHz, VCC = 5 V  
(1) VCCI = Input-side VCC; VCCO = Output-side VCC  
.
(2) Measured from input pin to ground.  
7.10 Supply Current Characteristics5-V Supply  
VCC1 = VCC2 = 5 V ±10% (over recommended operating conditions unless otherwise noted)  
SUPPLY  
CURRENT  
PARAMETER  
ISO7730-Q1  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
1
0.3  
4.3  
0.3  
1
1.4  
0.4  
6
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
EN2 = 0 V; VI = VCC1 (ISO7730-Q1);  
VI = 0 V (ISO7730-Q1 with F suffix)  
Supply current - disable  
EN2 = 0 V; VI = 0 V (ISO7730-Q1);  
VI = VCC1 (ISO7730-Q1 with F suffix)  
0.4  
1.4  
2.5  
6
EN2 = VCC2; VI = VCC1 (ISO7730-Q1);  
VI = 0 V (ISO7730-Q1 with F suffix)  
1.6  
4.3  
1.8  
2.6  
1.9  
2.7  
3.3  
3.6  
17.5  
Supply current - DC signal  
EN2 = VCC2; VI = 0 V (ISO7730-Q1);  
VI = VCC1 (ISO7730-Q1 with F suffix)  
2.7  
3.7  
2.8  
3.8  
4.5  
4.6  
21  
1 Mbps  
EN2 = VCCI; All channels switching with  
square wave clock input; CL = 15 pF  
Supply current - AC signal  
10 Mbps  
100 Mbps  
ISO7731-Q1  
EN1 = EN2 = 0 V; VI = VCCI (1) (ISO7731-Q1);  
VI = 0 V (ISO7731-Q1 with F suffix)  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
0.8  
0.7  
3
1.2  
1
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
Supply current - disable  
4.3  
2.6  
1.7  
2.2  
5
EN1 = EN2 = 0 V; VI = 0 V (ISO7731-Q1);  
VI = VCCI (ISO7731-Q1 with F suffix)  
1.8  
1.3  
1.6  
3.5  
2.8  
EN1 = EN2 = VCCI; VI = VCCI (ISO7731-Q1);  
VI = 0 V (ISO7731-Q1 with F suffix)  
Supply current - DC signal  
EN1 = EN2 = VCCI; VI = 0 V (ISO7731-Q1);  
VI = VCCI (ISO7731-Q1 with F suffix)  
4.1  
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VCC1 = VCC2 = 5 V ±10% (over recommended operating conditions unless otherwise noted)  
SUPPLY  
CURRENT  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
ICC1  
2.7  
2.3  
3
3.4  
3.3  
4
mA  
mA  
mA  
mA  
mA  
mA  
1 Mbps  
ICC2  
ICC1  
EN1 = EN2 = VCCI; All channels switching  
with square wave clock input; CL = 15 pF  
Supply current - AC signal  
10 Mbps  
100 Mbps  
ICC2  
3.3  
8.5  
13.1  
4.4  
11  
ICC1  
ICC2  
16  
(1) VCCI = Input-side VCC  
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7.11 Electrical Characteristics3.3-V Supply  
VCC1 = VCC2 = 3.3 V ±10% (over recommended operating conditions unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
3.2  
MAX  
UNIT  
V
IOH = 2 mA; see 8-1  
VCCO (1) 0.3  
VOH  
High-level output voltage  
Low-level output voltage  
Rising input voltage threshold  
Falling input voltage threshold  
Input threshold voltage hysteresis  
High-level input current  
VOL  
0.1  
0.3  
V
IOL = 2 mA; see 8-1  
VIT+(IN)  
VIT-(IN)  
VI(HYS)  
IIH  
0.6 × VCCI 0.7 × VCCI  
V
0.3 × VCCI  
0.1 × VCCI  
0.4 × VCCI  
0.2 × VCCI  
10  
V
V
VIH = VCCI (1) at INx or ENx  
VIL = 0 V at INx or ENx  
μA  
μA  
IIL  
Low-level input current  
10  
Common-mode transient  
immunity  
CMTI  
85  
100  
VI = VCCI or 0 V, VCM = 1200 V; see 8-4  
kV/μs  
(1) VCCI = Input-side VCC; VCCO = Output-side VCC  
.
7.12 Supply Current Characteristics3.3-V Supply  
VCC1 = VCC2 = 3.3 V ±10% (over recommended operating conditions unless otherwise noted)  
SUPPLY  
CURRENT  
PARAMETER  
ISO7730-Q1  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
1
0.3  
4.3  
0.3  
1
1.4  
0.4  
6
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
EN2 = 0 V; VI = VCC1 (ISO7730-Q1);  
VI = 0 V (ISO7730-Q1 with F suffix)  
Supply current - disable  
EN2 = 0 V; VI = 0 V (ISO7730-Q1);  
VI = VCC1 (ISO7730-Q1 with F suffix)  
0.4  
1.4  
2.5  
6
EN2 = VCC2; VI = VCC1 (ISO7730-Q1);  
VI = 0 V (ISO7730-Q1 with F suffix)  
1.6  
4.3  
1.8  
2.6  
1.8  
2.7  
2.8  
3.3  
13  
Supply current - DC signal  
EN2 = VCC2; VI = 0 V (ISO7730-Q1);  
VI = VCC1 (ISO7730-Q1 with F suffix)  
2.7  
3.7  
2.8  
3.8  
3.9  
4.3  
17  
1 Mbps  
EN2 = VCCI; All channels switching with  
square wave clock input; CL = 15 pF  
Supply current - AC signal  
10 Mbps  
100 Mbps  
ISO7731-Q1  
EN1 = EN2 = 0 V; VI = VCCI (1) (ISO7731-Q1);  
VI = 0 V (ISO7731-Q1 with F suffix)  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
0.8  
0.7  
3
1.2  
1
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
Supply current - disable  
4.3  
2.6  
1.7  
2.2  
5
EN1 = EN2 = 0 V; VI = 0 V (ISO7731-Q1);  
VI = VCCI (ISO7731-Q1 with F suffix)  
1.8  
1.3  
1.6  
3.5  
2.8  
2.4  
2.2  
2.8  
2.9  
6.7  
10  
EN1 = EN2 = VCCI; VI = VCCI (ISO7731-Q1);  
VI = 0 V (ISO7731-Q1 with F suffix)  
Supply current - DC signal  
EN1 = EN2 = VCCI; VI = 0 V (ISO7731-Q1);  
VI = VCCI (ISO7731-Q1 with F suffix)  
4.1  
3.4  
3.3  
3.8  
4
1 Mbps  
EN1 = EN2 = VCCI; All channels switching  
with square wave clock input; CL = 15 pF  
Supply current - AC signal  
10 Mbps  
100 Mbps  
8.5  
12.5  
(1) VCCI = Input-side VCC  
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7.13 Electrical Characteristics2.5-V Supply  
VCC1 = VCC2 = 2.5 V ±10% (over recommended operating conditions unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
2.45  
0.05  
MAX  
UNIT  
V
IOH = 1 mA; see 8-1  
VCCO (1) 0.2  
VOH  
High-level output voltage  
Low-level output voltage  
VOL  
0.2  
V
IOL = 1 mA; see 8-1  
VIT+(IN)  
VIT-(IN)  
VI(HYS)  
IIH  
Rising input voltage threshold  
Falling input voltage threshold  
Input threshold voltage hysteresis  
High-level input current  
0.6 × VCCI 0.7 × VCCI  
0.4 × VCCI  
V
0.3 × VCCI  
0.1 × VCCI  
V
0.2 × VCCI  
V
VIH = VCCI (1) at INx or ENx  
10  
μA  
μA  
kV/μs  
IIL  
Low-level input current  
VIL = 0 V at INx or ENx  
10  
CMTI  
Common-mode transient immunity  
85  
100  
VI = VCCI or 0 V, VCM = 1200 V; see 8-4  
(1) VCCI = Input-side VCC; VCCO = Output-side VCC  
.
7.14 Supply Current Characteristics2.5-V Supply  
VCC1 = VCC2 = 2.5 V ±10% (over recommended operating conditions unless otherwise noted)  
SUPPLY  
CURRENT  
PARAMETER  
ISO7730-Q1  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
1
0.3  
4.3  
0.3  
1
1.4  
0.4  
6
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
EN2 = 0 V; VI = VCC1 (ISO7730-Q1);  
VI = 0 V (ISO7730-Q1 with F suffix)  
Supply current - disable  
EN2 = 0 V; VI = 0 V (ISO7730-Q1);  
VI = VCC1 (ISO7730-Q1 with F suffix)  
0.4  
1.4  
2.5  
6
EN2 = VCC2; VI = VCC1 (ISO7730-Q1);  
VI = 0 V (ISO7730-Q1 with F suffix)  
1.6  
4.3  
1.8  
2.6  
1.8  
2.6  
2.5  
3.1  
10.2  
Supply current - DC signal  
EN2 = VCC2; VI = 0 V (ISO7730-Q1);  
VI = VCC1 (ISO7730-Q1 with F suffix)  
2.7  
3.7  
2.7  
3.8  
3.6  
4.2  
14  
1 Mbps  
EN2 = VCC2; All channels switching with  
square wave clock input; CL = 15 pF  
Supply current - AC signal  
10 Mbps  
100 Mbps  
ISO7731-Q1  
EN1 = EN2 = 0 V; VI = VCCI (1) (ISO7731-Q1);  
VI = 0 V (ISO7731-Q1 with F suffix)  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
ICC1  
ICC2  
0.8  
0.7  
3
1.2  
1
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
Supply current - disable  
4.3  
2.6  
1.7  
2.2  
5
EN1 = EN2 = 0 V; VI = 0 V (ISO7731-Q1);  
VI = VCCI (ISO7731-Q1 with F suffix)  
1.8  
1.3  
1.6  
3.5  
2.8  
2.4  
2.2  
2.7  
2.7  
5.6  
8
EN1 = EN2 = VCCI; VI = VCCI (ISO7731-Q1);  
VI = 0 V (ISO7731-Q1 with F suffix)  
Supply current - DC signal  
EN1 = EN2 = VCCI; VI = 0 V (ISO7731-Q1);  
VI = VCCI (ISO7731-Q1 with F suffix)  
4.1  
3.4  
3.2  
3.7  
3.8  
7
1 Mbps  
EN1 = EN2 = VCCI; All channels switching  
with square wave clock input; CL = 15 pF  
Supply current - AC signal  
10 Mbps  
100 Mbps  
10  
(1) VCCI = Input-side VCC  
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7.15 Switching Characteristics5-V Supply  
VCC1 = VCC2 = 5 V ±10% (over recommended operating conditions unless otherwise noted)  
PARAMETER  
Propagation delay time  
Pulse width distortion(1) |tPHL tPLH  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
ns  
tPLH, tPHL  
PWD  
tsk(o)  
tsk(pp)  
tr  
6
11  
16  
See 8-1  
0.6  
4.9  
4
ns  
|
Channel-to-channel output skew time(2)  
Part-to-part skew time(3)  
Same-direction channels  
ns  
4.5  
3.9  
3.9  
20  
20  
ns  
Output signal rise time  
1.3  
1.4  
8
ns  
See 8-1  
tf  
Output signal fall time  
ns  
tPHZ  
tPLZ  
Disable propagation delay, high-to-high impedance output  
Disable propagation delay, low-to-high impedance output  
ns  
8
ns  
Enable propagation delay, high impedance-to-high output for  
ISO773x-Q1  
7
3
3
7
20  
8.5  
8.5  
20  
ns  
μs  
μs  
ns  
tPZH  
Enable propagation delay, high impedance-to-high output for  
ISO773x-Q1 with F suffix  
See 8-2  
Enable propagation delay, high impedance-to-low output for  
ISO773x-Q1  
tPZL  
Enable propagation delay, high impedance-to-low output for  
ISO773x-Q1 with F suffix  
Measured from the time VCC goes  
below 1.7 V. See 8-3  
tDO  
tie  
Default output delay time from input power loss  
Time interval error  
0.1  
0.6  
0.3  
μs  
216 1 PRBS data at 100 Mbps  
ns  
(1) Also known as pulse skew.  
(2) tsk(o) is the skew between outputs of a single device with all driving inputs connected together and the outputs switching in the same  
direction while driving identical loads.  
(3) tsk(pp) is the magnitude of the difference in propagation delay times between any terminals of different devices switching in the same  
direction while operating at identical supply voltages, temperature, input signals and loads.  
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7.16 Switching Characteristics3.3-V Supply  
VCC1 = VCC2 = 3.3 V ±10% (over recommended operating conditions unless otherwise noted)  
PARAMETER  
Propagation delay time  
Pulse width distortion(1) |tPHL tPLH  
TEST CONDITIONS  
MIN  
TYP  
11  
MAX  
16  
5
UNIT  
ns  
tPLH, tPHL  
PWD  
tsk(o)  
tsk(pp)  
tr  
6
See 8-1  
0.1  
ns  
|
Channel-to-channel output skew time(2)  
Part-to-part skew time(3)  
Same-direction channels  
4.1  
4.5  
3
ns  
ns  
Output signal rise time  
1.3  
1.3  
17  
ns  
See 8-1  
tf  
Output signal fall time  
3
ns  
tPHZ  
tPLZ  
Disable propagation delay, high-to-high impedance output  
Disable propagation delay, low-to-high impedance output  
30  
30  
ns  
17  
ns  
Enable propagation delay, high impedance-to-high output for  
ISO773x-Q1  
17  
3.2  
3.2  
17  
30  
8.5  
8.5  
30  
ns  
μs  
μs  
ns  
tPZH  
Enable propagation delay, high impedance-to-high output for  
ISO773x-Q1 with F suffix  
See 8-2  
Enable propagation delay, high impedance-to-low output for  
ISO773x-Q1  
tPZL  
Enable propagation delay, high impedance-to-low output for  
ISO773x-Q1 with F suffix  
Measured from the time VCC goes  
below 1.7 V. See 8-3  
tDO  
tie  
Default output delay time from input power loss  
Time interval error  
0.1  
0.6  
0.3  
μs  
216 1 PRBS data at 100 Mbps  
ns  
(1) Also known as Pulse Skew.  
(2) tsk(o) is the skew between outputs of a single device with all driving inputs connected together and the outputs switching in the same  
direction while driving identical loads.  
(3) tsk(pp) is the magnitude of the difference in propagation delay times between any terminals of different devices switching in the same  
direction while operating at identical supply voltages, temperature, input signals and loads.  
7.17 Switching Characteristics2.5-V Supply  
VCC1 = VCC2 = 2.5 V ±10% (over recommended operating conditions unless otherwise noted)  
PARAMETER  
Propagation delay time  
Pulse width distortion(1) |tPHL tPLH  
TEST CONDITIONS  
MIN  
7.5  
TYP  
MAX  
18.5  
UNIT  
ns  
tPLH, tPHL  
PWD  
tsk(o)  
tsk(pp)  
tr  
12  
See 8-1  
0.2  
5.1  
4.1  
4.6  
3.5  
3.5  
40  
ns  
|
Channel-to-channel output skew time(2)  
Part-to-part skew time(3)  
Same-direction Channels  
ns  
ns  
Output signal rise time  
1
1
ns  
See 8-1  
tf  
Output signal fall time  
ns  
tPHZ  
tPLZ  
Disable propagation delay, high-to-high impedance output  
Disable propagation delay, low-to-high impedance output  
22  
22  
ns  
40  
ns  
Enable propagation delay, high impedance-to-high output for  
ISO773x-Q1  
18  
3.3  
3.3  
18  
40  
8.5  
8.5  
40  
ns  
μs  
μs  
ns  
tPZH  
Enable propagation delay, high impedance-to-high output for  
ISO773x-Q1 with F suffix  
See 8-2  
Enable propagation delay, high impedance-to-low output for  
ISO773x-Q1  
tPZL  
Enable propagation delay, high impedance-to-low output for  
ISO773x-Q1 with F suffix  
Measured from the time VCC goes  
below 1.7 V. See 8-3  
tDO  
tie  
Default output delay time from input power loss  
Time interval error  
0.1  
0.6  
0.3  
μs  
216 1 PRBS data at 100 Mbps  
ns  
(1) Also known as pulse skew.  
(2) tsk(o) is the skew between outputs of a single device with all driving inputs connected together and the outputs switching in the same  
direction while driving identical loads.  
(3) tsk(pp) is the magnitude of the difference in propagation delay times between any terminals of different devices switching in the same  
direction while operating at identical supply voltages, temperature, input signals and loads.  
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7.18 Insulation Characteristics Curves  
600  
450  
400  
350  
300  
250  
200  
150  
100  
50  
VCC1 = VCC2 = 2.75 V  
VCC1 = VCC2 = 3.6 V  
VCC1 = VCC2 = 5.5 V  
VCC1 = VCC2 = 2.75 V  
VCC1 = VCC2 = 3.6 V  
VCC1 = VCC2 = 5.5 V  
500  
400  
300  
200  
100  
0
0
0
50  
100  
Ambient Temperature (èC)  
150  
200  
0
50  
100  
Ambient Temperature (èC)  
150  
200  
D002  
D001  
7-2. Thermal Derating Curve for Safety Limiting  
7-1. Thermal Derating Curve for Safety Limiting  
Current per VDE for DBQ-16 Package  
Current per VDE for DW-16 Package  
1800  
1600  
1400  
1200  
1000  
800  
600  
400  
200  
0
1400  
1200  
1000  
800  
600  
400  
200  
0
0
50  
100  
Ambient Temperature (èC)  
150  
200  
0
50  
100  
Ambient Temperature (èC)  
150  
200  
D003  
D004  
7-3. Thermal Derating Curve for Safety Limiting 7-4. Thermal Derating Curve for Safety Limiting  
Power per VDE for DW-16 Package  
Power per VDE for DBQ-16 Package  
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7.19 Typical Characteristics  
20  
7
6
5
4
3
2
1
ICC1 at 2.5 V  
ICC2 at 2.5 V  
ICC1 at 3.3 V  
ICC2 at 3.3 V  
ICC1 at 5 V  
ICC2 at 5 V  
ICC1 at 2.5 V  
ICC2 at 2.5 V  
ICC1 at 3.3 V  
ICC2 at 3.3 V  
ICC1 at 5 V  
18  
16  
14  
12  
10  
8
ICC2 at 5 V  
6
4
2
0
0
25  
50  
Data Rate (Mbps)  
75  
100  
1
26  
51  
Data Rate (Mbps)  
76  
100  
D005  
D006  
TA = 25°C  
CL = 15 pF  
TA = 25°C  
CL = No Load  
7-5. ISO7730-Q1 Supply Current vs Data Rate  
7-6. ISO7730-Q1 Supply Current vs Data Rate  
(With 15-pF Load)  
(With No Load)  
14  
6
5
4
3
ICC1 at 2.5 V  
ICC2 at 2.5 V  
ICC1 at 3.3 V  
ICC2 at 3.3 V  
ICC1 at 5 V  
ICC2 at 5 V  
12  
10  
8
6
ICC1 at 2.5 V  
ICC2 at 2.5 V  
ICC1 at 3.3 V  
2
4
ICC2 at 3.3 V  
ICC1 at 5 V  
ICC2 at 5 V  
1
0
2
0
0
25  
50  
Data Rate (Mbps)  
75  
100  
0
25  
50  
Data Rate (Mbps)  
75  
100  
D007  
D008  
TA = 25°C  
CL = 15 pF  
A.  
TA = 25°C  
CL = No Load  
7-7. ISO7731-Q1 Supply Current vs Data Rate  
7-8. ISO7731-Q1 Supply Current vs Data Rate  
(With 15-pF Load)  
(With No Load)  
6
5
4
3
2
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
VCC at 2.5 V  
VCC at 3.3 V  
VCC at 5 V  
VCC at 2.5 V  
VCC at 3.3 V  
VCC at 5 V  
1
0.1  
0
0
0
5
10  
Low-Level Output Current (mA)  
15  
-15  
-10 -5  
High-Level Output Current (mA)  
0
D012  
D011  
TA = 25°C  
TA = 25°C  
7-10. Low-Level Output Voltage vs Low-Level  
7-9. High-Level Output Voltage vs High-level  
Output Current  
Output Current  
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2.10  
2.05  
2.00  
1.95  
1.90  
1.85  
1.80  
1.75  
1.70  
1.65  
1.60  
14  
13  
12  
11  
10  
9
VCC1 Rising  
VCC1 Falling  
VCC2 Rising  
VCC2 Falling  
tPLH at 2.5 V  
tPHL at 2.5 V  
tPLH at 3.3 V  
tPHL at 3.3 V  
tPLH at 5 V  
tPHL at 5 V  
8
-55  
-55 -40 -25 -10  
5
20 35 50 65 80 95 110 125  
-25  
5
35  
65  
95  
125  
Free-Air Temperature (èC)  
D009  
Free-Air Temperature (èC)  
D010  
7-11. Power Supply Undervoltage Threshold vs  
7-12. Propagation Delay Time vs Free-Air  
Free-Air Temperature  
Temperature  
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8 Parameter Measurement Information  
V
CCI  
V
50%  
I
50%  
IN  
OUT  
0 V  
t
t
PHL  
PLH  
Input Generator  
(See Note A)  
C
L
V
I
V
50  
O
V
See Note B  
OH  
90%  
10%  
50%  
50%  
V
O
V
OL  
t
r
t
f
A. The input pulse is supplied by a generator having the following characteristics: PRR 50 kHz, 50% duty cycle, tr 3 ns, tf 3ns, ZO  
= 50 Ω. At the input, 50 Ωresistor is required to terminate Input Generator signal. It is not needed in actual application.  
B. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.  
8-1. Switching Characteristics Test Circuit and Voltage Waveforms  
V
CCO  
V
CC  
R
L
= 1 k1%  
V
/ 2  
CC  
V
/ 2  
CC  
V
I
IN  
OUT  
0 V  
V
0 V  
O
t
t
PZL  
PLZ  
V
OH  
EN  
0.5 V  
V
V
O
50%  
C
L
OL  
See Note B  
Input  
Generator  
(See Note A)  
V
I
50 ꢀ  
V
CC  
V
O
IN  
OUT  
3 V  
V / 2  
CC  
V
/ 2  
CC  
V
I
0 V  
t
PZH  
EN  
See Note B  
R
L
= 1 k1%  
V
OH  
C
L
50%  
Input  
Generator  
(See Note A)  
0.5 V  
V
O
V
I
0 V  
t
50 ꢀ  
PHZ  
Copyright © 2016, Texas Instruments Incorporated  
A. The input pulse is supplied by a generator having the following characteristics: PRR 10 kHz, 50% duty cycle,  
tr 3 ns, tf 3 ns, ZO = 50 Ω.  
B. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.  
8-2. Enable/Disable Propagation Delay Time Test Circuit and Waveform  
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V
I
See Note B  
V
CC  
V
CC  
V
1.7 V  
I
0 V  
default high  
IN  
OUT  
IN = 0 V (Devices without suffix F)  
IN = V (Devices with suffix F)  
V
O
t
DO  
CC  
V
OH  
C
L
50%  
V
O
See Note A  
V
OL  
default low  
A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.  
B. Power Supply Ramp Rate = 10 mV/ns  
8-3. Default Output Delay Time Test Circuit and Voltage Waveforms  
V
V
CCO  
CCI  
C = 0.1 µF 1%  
C = 0.1 µF 1%  
Pass-fail criteria:  
The output must  
remain stable.  
IN  
OUT  
S1  
+
C
L
V
or V  
OL  
OH  
See Note A  
œ
GNDO  
GNDI  
+
œ
V
CM  
A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.  
8-4. Common-Mode Transient Immunity Test Circuit  
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9 Detailed Description  
9.1 Overview  
The ISO773x-Q1 family of devices has an ON-OFF keying (OOK) modulation scheme to transmit the digital data  
across a silicon dioxide based isolation barrier. The transmitter sends a high frequency carrier across the barrier  
to represent one digital state and sends no signal to represent the other digital state. The receiver demodulates  
the signal after advanced signal conditioning and produces the output through a buffer stage. If the ENx pin is  
low then the output goes to high impedance. The ISO773x-Q1 family of devices also incorporates advanced  
circuit techniques to maximize the CMTI performance and minimize the radiated emissions due the high  
frequency carrier and IO buffer switching. The conceptual block diagram of a digital capacitive isolator, 9-1,  
shows a functional block diagram of a typical channel.  
9.2 Functional Block Diagram  
Transmitter  
Receiver  
EN  
OOK  
Modulation  
TX IN  
SiO based  
2
RX OUT  
TX Signal  
Conditioning  
RX Signal  
Conditioning  
Envelope  
Detection  
Capacitive  
Isolation  
Barrier  
Emissions  
Reduction  
Techniques  
Oscillator  
Copyright © 2016, Texas Instruments Incorporated  
9-1. Conceptual Block Diagram of a Digital Capacitive Isolator  
9-2 shows a conceptual detail of how the ON-OFF keying scheme works.  
TX IN  
Carrier signal through  
isolation barrier  
RX OUT  
9-2. On-Off Keying (OOK) Based Modulation Scheme  
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9.3 Feature Description  
9-1 provides an overview of the device features.  
9-1. Device Features  
MAXIMUM DATA  
RATE  
PART NUMBER  
CHANNEL DIRECTION  
DEFAULT OUTPUT  
PACKAGE  
RATED ISOLATION(1)  
DW-16  
DBQ-16  
DW-16  
DBQ-16  
DW-16  
DBQ-16  
DW-16  
DBQ-16  
5000 VRMS / 8000 VPK  
3000 VRMS / 4242 VPK  
5000 VRMS / 8000 VPK  
3000 VRMS / 4242 VPK  
5000 VRMS / 8000 VPK  
3000 VRMS / 4242 VPK  
5000 VRMS / 8000 VPK  
3000 VRMS / 4242 VPK  
3 Forward,  
0 Reverse  
ISO7730-Q1  
100 Mbps  
100 Mbps  
100 Mbps  
100 Mbps  
High  
ISO7730-Q1 with F  
suffix  
3 Forward,  
0 Reverse  
Low  
High  
Low  
2 Forward,  
1 Reverse  
ISO7731-Q1  
ISO7731-Q1 with F  
suffix  
2 Forward,  
1 Reverse  
(1) See 7.7 for detailed isolation ratings.  
9.3.1 Electromagnetic Compatibility (EMC) Considerations  
Many applications in harsh industrial environment are sensitive to disturbances such as electrostatic discharge  
(ESD), electrical fast transient (EFT), surge and electromagnetic emissions. These electromagnetic disturbances  
are regulated by international standards such as IEC 61000-4-x and CISPR 22. Although system-level  
performance and reliability depends, to a large extent, on the application board design and layout, the ISO773x-  
Q1 family of devices incorporates many chip-level design improvements for overall system robustness. Some of  
these improvements include:  
Robust ESD protection cells for input and output signal pins and inter-chip bond pads.  
Low-resistance connectivity of ESD cells to supply and ground pins.  
Enhanced performance of high voltage isolation capacitor for better tolerance of ESD, EFT and surge events.  
Bigger on-chip decoupling capacitors to bypass undesirable high energy signals through a low impedance  
path.  
PMOS and NMOS devices isolated from each other by using guard rings to avoid triggering of parasitic  
SCRs.  
Reduced common mode currents across the isolation barrier by ensuring purely differential internal operation.  
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9.4 Device Functional Modes  
9-2 lists the functional modes for the ISO773x-Q1 devices.  
9-2. Function Table  
OUTPUT  
ENABLE  
(ENx)  
INPUT  
(INx)(3)  
OUTPUT  
(OUTx)  
(1)  
VCCI  
VCCO  
COMMENTS  
H
L
H or open  
H or open  
H
L
Normal Operation:  
A channel output assumes the logic state of its input.  
PU  
X
PU  
PU  
Default mode: When INx is open, the corresponding channel output goes  
to its default logic state. Default is High for ISO773x-Q1 and Low for  
ISO773x-Q1 with F suffix.  
Open  
X
H or open  
L
Default  
Z
A low value of Output Enable causes the outputs to be high-impedance  
Default mode: When VCCI is unpowered, a channel output assumes the  
logic state based on the selected default option. Default is High for  
ISO773x-Q1 and Low for ISO773x-Q1 with F suffix.  
PD  
X
PU  
PD  
X
X
H or open  
Default  
When VCCI transitions from unpowered to powered-up, a channel output  
assumes the logic state of its input.  
When VCCI transitions from powered-up to unpowered, channel output  
assumes the selected default state.  
When VCCO is unpowered, a channel output is undetermined(2)  
.
X
Undetermined When VCCO transitions from unpowered to powered-up, a channel output  
assumes the logic state of its input  
(1) VCCI = Input-side VCC; VCCO = Output-side VCC; PU = Powered up (VCC 2.25 V); PD = Powered down (VCC 1.7 V); X = Irrelevant;  
H = High level; L = Low level ; Z = High Impedance  
(2) The outputs are in undetermined state when 1.7 V < VCCI, VCCO < 2.25 V.  
(3) A strongly driven input signal can weakly power the floating VCC via an internal protection diode and cause undetermined output.  
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9.4.1 Device I/O Schematics  
Input (Devices without F suffix)  
Input (Devices with F suffix)  
V
V
V
V
CCI  
V
V
CCI  
V
CCI  
CCI  
CCI  
CCI  
CCI  
1.5 M  
985 ꢀ  
985 ꢀ  
INx  
INx  
1.5 Mꢀ  
Output  
Enable  
V
CCO  
V
V
V
V
CCO  
CCO  
CCO  
CCO  
2 Mꢀ  
~20 ꢀ  
1970 ꢀ  
OUTx  
ENx  
Copyright © 2016, Texas Instruments Incorporated  
9-3. Device I/O Schematics  
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10 Application and Implementation  
备注  
以下应用部分的信息不属TI 组件规范TI 不担保其准确性和完整性。客户应负责确定 TI 组件是否适  
用于其应用。客户应验证并测试其设计以确保系统功能。  
10.1 Application Information  
The ISO773x-Q1 devices are high-performance, triple-channel digital isolators. These devices come with enable  
pins on each side which can be used to put the respective outputs in high impedance for multi-master driving  
applications and reduce power consumption. The ISO773x-Q1 family of devices use single-ended CMOS-logic  
switching technology. The voltage range is from 2.25 V to 5.5 V for both supplies, VCC1 and VCC2. When  
designing with digital isolators, keep in mind that because of the single-ended design structure, digital isolators  
do not conform to any specific interface standard and are only intended for isolating single-ended CMOS or TTL  
digital signal lines. The isolator is typically placed between the data controller (that is, μC or UART), and a data  
converter or a line transceiver, regardless of the interface type or standard.  
10.2 Typical Application  
The ISO7731-Q1 device combined with Texas Instruments' Piccolomicrocontroller, analog-to-digital receiver,  
transformer driver, and voltage regulator can create an isolated serial peripheral interface (SPI) as shown in 图  
10-1.  
V
S
0.1 µF  
3.3 V  
2
MBR0520L  
MBR0520L  
1:1.33  
3.3VISO  
3
1
4
3
1
2
V
CC  
D2  
IN  
OUT  
TPS76333-Q1  
SN6501-Q1  
EN  
GND  
10 µF  
0.1 µF  
10 µF  
2
4
6
D1  
GND  
4, 5  
V
V
OUT  
IN  
1 µF  
REF5025A-Q1  
GND  
22 µF  
10 µF  
ISO Barrier  
0.1 µF  
0.1 µF  
0.1 µF  
0.1 µF  
1
16  
4.7 k  
4.7 kꢀ  
V
V
CC2  
CC1  
29, 57  
8
7
36  
5
4
7
10  
EN1  
EN2  
V
DDIO  
AINP MXO +VBD +VA REFP  
28  
6
3
NC  
NC 11  
CS  
CH0  
TMS320F28035PAGQ  
SPICLKA  
ISO7731-Q1  
33  
36  
34  
14  
13  
12  
32  
33  
34  
INA  
INB  
OUTA  
OUTB  
SCLK  
SDI  
16 Analog  
Inputs  
ADS7953-Q1  
4
5
SPISIMOA  
SPISOMIA  
11  
OUTC  
GND1  
2, 8  
INC  
SDO  
CH15  
V
BDGND AGND  
27 1, 22  
REFM  
30  
SS  
GND2  
6, 28  
9, 15  
Copyright © 2016, Texas Instruments Incorporated  
Multiple pins and discrete components are omitted for clarity.  
10-1. Isolated SPI for an Analog Input Module With 16 Inputs and a Single Slave  
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10.2.1 Design Requirements  
To design with these devices, use the parameters listed in 10-1.  
10-1. Design Parameters  
PARAMETER  
VALUE  
2.25 to 5.5 V  
0.1 µF  
Supply voltage, VCC1 and VCC2  
Decoupling capacitor between VCC1 and GND1  
Decoupling capacitor from VCC2 and GND2  
0.1 µF  
10.2.2 Detailed Design Procedure  
Unlike optocouplers, which require external components to improve performance, provide bias, or limit current,  
the ISO773x-Q1 family of devices only requires two external bypass capacitors to operate. 10-2 and 10-3  
show the typical circuit hook-up for the devices.  
2 mm maximum  
from VCC1  
2 mm maximum  
from VCC2  
0.1 µF  
0.1 µF  
VCC2  
VCC1  
1
2
3
16  
GND1  
GND2  
15  
14  
13  
INA  
INB  
INC  
OUTA  
OUTB  
OUTC  
4
12  
11  
10  
9
5
6
7
8
NC  
EN  
NC  
NC  
GND2  
GND1  
10-2. Typical ISO7730-Q1 Circuit Hook-Up  
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2 mm maximum  
from VCC1  
2 mm maximum  
from VCC2  
0.1 µF  
0.1 µF  
VCC2  
VCC1  
1
16  
GND1  
2
GND2  
15  
14  
13  
INA  
INB  
3
4
OUTA  
OUTB  
INC  
OUTC  
12  
11  
10  
9
5
6
7
8
NC  
NC  
EN1  
EN2  
GND2  
GND1  
10-3. Typical ISO7731-Q1 Circuit Hook-Up  
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10.2.3 Application Curves  
The following typical eye diagrams of the ISO773x-Q1 family of devices indicate low jitter and wide open eye at  
the maximum data rate of 100 Mbps.  
Time = 2.5 ns / div  
Time = 2.5 ns / div  
10-4. Eye Diagram at 100 Mbps PRBS 216 1, 5 10-5. Eye Diagram at 100 Mbps PRBS 216 1,  
V and 25°C 3.3 V and 25°C  
Time = 2.5 ns / div  
10-6. Eye Diagram at 100 Mbps PRBS 216 1, 2.5 V and 25°C  
10.2.3.1 Insulation Lifetime  
Insulation lifetime projection data is collected by using industry-standard Time Dependent Dielectric Breakdown  
(TDDB) test method. In this test, all pins on each side of the barrier are tied together creating a two-terminal  
device and high voltage applied between the two sides; See 10-7 for TDDB test setup. The insulation  
breakdown data is collected at various high voltages switching at 60 Hz over temperature. For reinforced  
insulation, VDE standard requires the use of TDDB projection line with failure rate of less than 1 part per million  
(ppm). Even though the expected minimum insulation lifetime is 20 years at the specified working isolation  
voltage, VDE reinforced certification requires additional safety margin of 20% for working voltage and 87.5% for  
lifetime which translates into minimum required insulation lifetime of 37.5 years at a working voltage that's 20%  
higher than the specified value.  
10-8 shows the intrinsic capability of the isolation barrier to withstand high voltage stress over its lifetime.  
Based on the TDDB data, the intrinsic capability of the insulation is 1500 VRMS with a lifetime of 135 years. Other  
factors, such as package size, pollution degree, material group, etc. can further limit the working voltage of the  
component. The working voltage of DW-16 package is specified upto 1500 VRMS and DBQ-16 package up to  
400 VRMS. At the lower working voltages, the corresponding insulation lifetime is much longer than 135 years.  
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A
Vcc 1  
Vcc 2  
Time Counter  
> 1 mA  
DUT  
GND 1  
GND 2  
V
S
Oven at 150 °C  
10-7. Test Setup for Insulation Lifetime Measurement  
10-8. Insulation Lifetime Projection Data  
11 Power Supply Recommendations  
To help ensure reliable operation at data rates and supply voltages, a 0.1-μF bypass capacitor is recommended  
at the input and output supply pins (VCC1 and VCC2). The capacitors should be placed as close to the supply pins  
as possible. If only a single primary-side power supply is available in an application, isolated power can be  
generated for the secondary-side with the help of a transformer driver such as Texas Instruments' SN6501-Q1.  
For such applications, detailed power supply design and transformer selection recommendations are available in  
the SN6501-Q1 Transformer Driver for Isolated Power Supplies data sheet.  
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12 Layout  
12.1 Layout Guidelines  
A minimum of four layers is required to accomplish a low EMI PCB design (see 12-1). Layer stacking should  
be in the following order (top-to-bottom): high-speed signal layer, ground plane, power plane and low-frequency  
signal layer.  
Routing the high-speed traces on the top layer avoids the use of vias (and the introduction of their  
inductances) and allows for clean interconnects between the isolator and the transmitter and receiver circuits  
of the data link.  
Placing a solid ground plane next to the high-speed signal layer establishes controlled impedance for  
transmission line interconnects and provides an excellent low-inductance path for the return current flow.  
Placing the power plane next to the ground plane creates additional high-frequency bypass capacitance of  
approximately 100 pF/inch2.  
Routing the slower speed control signals on the bottom layer allows for greater flexibility as these signal links  
usually have margin to tolerate discontinuities such as vias.  
If an additional supply voltage plane or signal layer is needed, add a second power or ground plane system to  
the stack to keep it symmetrical. This makes the stack mechanically stable and prevents it from warping. Also  
the power and ground plane of each power system can be placed closer together, thus increasing the high-  
frequency bypass capacitance significantly.  
For detailed layout recommendations, refer to the Digital Isolator Design Guide.  
12.1.1 PCB Material  
For digital circuit boards operating below 150 Mbps, (or rise and fall times higher than 1 ns), and trace lengths of  
up to 10 inches, use standard FR-4 UL94V-0 printed circuit boards. This PCB is preferred over cheaper  
alternatives due to its lower dielectric losses at high frequencies, less moisture absorption, greater strength and  
stiffness, and self-extinguishing flammability-characteristics.  
12.2 Layout Example  
High-speed traces  
10 mils  
Ground plane  
Keep this  
FR-4  
space free  
from planes,  
traces, pads,  
and vias  
40 mils  
10 mils  
0 ~ 4.5  
r
Power plane  
Low-speed traces  
12-1. Layout Example Schematic  
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13 Device and Documentation Support  
13.1 Documentation Support  
13.1.1 Related Documentation  
For related documentation, see the following:  
Texas Instruments, Digital Isolator Design Guide  
Texas Instruments, Isolation Glossary  
Texas Instruments, How to use isolation to improve ESD, EFT, and Surge immunity in industrial systems  
application report  
Texas Instruments, REF50xxA-Q1 Low-Noise, Very Low Drift, Precision Voltage Reference data sheet  
Texas Instruments, SN6501-Q1 Transformer Driver for Isolated Power Supplies data sheet  
Texas Instruments, TPS76333-Q1 Low-Power 150-mA Low-Dropout Linear Regulators data sheet  
Texas Instruments, TMS320F28035 Piccolo™ Microcontrollers data sheet  
13.2 Related Links  
The table below lists quick access links. Categories include technical documents, support and community  
resources, tools and software, and quick access to sample or buy.  
13-1. Related Links  
TECHNICAL  
DOCUMENTS  
TOOLS &  
SOFTWARE  
SUPPORT &  
COMMUNITY  
PARTS  
PRODUCT FOLDER  
ORDER NOW  
ISO7730-Q1  
ISO7731-Q1  
Click here  
Click here  
Click here  
Click here  
Click here  
Click here  
Click here  
Click here  
Click here  
Click here  
13.3 Receiving Notification of Documentation Updates  
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper  
right corner, click on Alert me to register and receive a weekly digest of any product information that has  
changed. For change details, review the revision history included in any revised document.  
13.4 支持资源  
TI E2E支持论坛是工程师的重要参考资料可直接从专家获得快速、经过验证的解答和设计帮助。搜索现有解  
答或提出自己的问题可获得所需的快速设计帮助。  
链接的内容由各个贡献者“按原样”提供。这些内容并不构成 TI 技术规范并且不一定反映 TI 的观点请参阅  
TI 《使用条款》。  
13.5 Trademarks  
Piccolois a trademark of Texas Instruments.  
TI E2Eis a trademark of Texas Instruments.  
所有商标均为其各自所有者的财产。  
13.6 静电放电警告  
静电放(ESD) 会损坏这个集成电路。德州仪(TI) 建议通过适当的预防措施处理所有集成电路。如果不遵守正确的处理  
和安装程序可能会损坏集成电路。  
ESD 的损坏小至导致微小的性能降级大至整个器件故障。精密的集成电路可能更容易受到损坏这是因为非常细微的参  
数更改都可能会导致器件与其发布的规格不相符。  
13.7 术语表  
TI 术语表  
本术语表列出并解释了术语、首字母缩略词和定义。  
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14 Mechanical, Packaging, and Orderable Information  
The following pages include mechanical, packaging, and orderable information. This information is the most  
current data available for the designated devices. This data is subject to change without notice and revision of  
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.  
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PACKAGE OUTLINE  
DW0016B  
SOIC - 2.65 mm max height  
S
C
A
L
E
1
.
5
0
0
SOIC  
C
10.63  
TYP  
9.97  
SEATING PLANE  
PIN 1 ID  
AREA  
0.1 C  
A
14X 1.27  
16  
1
2X  
10.5  
10.1  
NOTE 3  
8.89  
8
9
0.51  
0.31  
16X  
7.6  
7.4  
B
2.65 MAX  
0.25  
C A  
B
NOTE 4  
0.33  
0.10  
TYP  
SEE DETAIL A  
0.25  
GAGE PLANE  
0.3  
0.1  
0 - 8  
1.27  
0.40  
DETAIL A  
TYPICAL  
(1.4)  
4221009/B 07/2016  
NOTES:  
1. All linear dimensions are in millimeters. Dimensions in parenthesis are for reference only. Dimensioning and tolerancing  
per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not  
exceed 0.15 mm, per side.  
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm, per side.  
5. Reference JEDEC registration MS-013.  
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EXAMPLE BOARD LAYOUT  
DW0016B  
SOIC - 2.65 mm max height  
SOIC  
SYMM  
SYMM  
16X (2)  
16X (1.65)  
SEE  
DETAILS  
SEE  
DETAILS  
1
1
16  
16  
16X (0.6)  
16X (0.6)  
SYMM  
SYMM  
14X (1.27)  
R0.05 TYP  
14X (1.27)  
R0.05 TYP  
9
9
8
8
(9.75)  
(9.3)  
HV / ISOLATION OPTION  
8.1 mm CLEARANCE/CREEPAGE  
IPC-7351 NOMINAL  
7.3 mm CLEARANCE/CREEPAGE  
LAND PATTERN EXAMPLE  
SCALE:4X  
SOLDER MASK  
OPENING  
SOLDER MASK  
OPENING  
METAL  
METAL  
0.07 MAX  
ALL AROUND  
0.07 MIN  
ALL AROUND  
SOLDER MASK  
DEFINED  
NON SOLDER MASK  
DEFINED  
SOLDER MASK DETAILS  
4221009/B 07/2016  
NOTES: (continued)  
6. Publication IPC-7351 may have alternate designs.  
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.  
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EXAMPLE STENCIL DESIGN  
DW0016B  
SOIC - 2.65 mm max height  
SOIC  
SYMM  
SYMM  
16X (1.65)  
16X (0.6)  
16X (2)  
1
1
16  
16  
16X (0.6)  
SYMM  
SYMM  
14X (1.27)  
14X (1.27)  
8
9
8
9
R0.05 TYP  
R0.05 TYP  
(9.75)  
(9.3)  
HV / ISOLATION OPTION  
8.1 mm CLEARANCE/CREEPAGE  
IPC-7351 NOMINAL  
7.3 mm CLEARANCE/CREEPAGE  
SOLDER PASTE EXAMPLE  
BASED ON 0.125 mm THICK STENCIL  
SCALE:4X  
4221009/B 07/2016  
NOTES: (continued)  
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
9. Board assembly site may have different recommendations for stencil design.  
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PACKAGE OUTLINE  
DBQ0016A  
SSOP - 1.75 mm max height  
SCALE 2.800  
SHRINK SMALL-OUTLINE PACKAGE  
C
SEATING PLANE  
.228-.244 TYP  
[5.80-6.19]  
.004 [0.1] C  
A
PIN 1 ID AREA  
14X .0250  
[0.635]  
16  
1
2X  
.189-.197  
[4.81-5.00]  
NOTE 3  
.175  
[4.45]  
8
9
16X .008-.012  
[0.21-0.30]  
B
.150-.157  
[3.81-3.98]  
NOTE 4  
.069 MAX  
[1.75]  
.007 [0.17]  
C A  
B
.005-.010 TYP  
[0.13-0.25]  
SEE DETAIL A  
.010  
[0.25]  
GAGE PLANE  
.004-.010  
[0.11-0.25]  
0 - 8  
.016-.035  
[0.41-0.88]  
DETAIL A  
TYPICAL  
(.041 )  
[1.04]  
4214846/A 03/2014  
NOTES:  
1. Linear dimensions are in inches [millimeters]. Dimensions in parenthesis are for reference only. Controlling dimensions are in inches.  
Dimensioning and tolerancing per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not  
exceed .006 inch, per side.  
4. This dimension does not include interlead flash.  
5. Reference JEDEC registration MO-137, variation AB.  
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EXAMPLE BOARD LAYOUT  
DBQ0016A  
SSOP - 1.75 mm max height  
SHRINK SMALL-OUTLINE PACKAGE  
16X (.063)  
[1.6]  
SEE  
DETAILS  
SYMM  
1
16  
16X (.016 )  
[0.41]  
14X (.0250 )  
[0.635]  
8
9
(.213)  
[5.4]  
LAND PATTERN EXAMPLE  
SCALE:8X  
SOLDER MASK  
OPENING  
SOLDER MASK  
OPENING  
METAL  
METAL  
.002 MAX  
[0.05]  
ALL AROUND  
.002 MIN  
[0.05]  
ALL AROUND  
SOLDER MASK  
DEFINED  
NON SOLDER MASK  
DEFINED  
SOLDER MASK DETAILS  
4214846/A 03/2014  
NOTES: (continued)  
6. Publication IPC-7351 may have alternate designs.  
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.  
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EXAMPLE STENCIL DESIGN  
DBQ0016A  
SSOP - 1.75 mm max height  
SHRINK SMALL-OUTLINE PACKAGE  
16X (.063)  
[1.6]  
SYMM  
1
16  
16X (.016 )  
[0.41]  
SYMM  
14X (.0250 )  
[0.635]  
9
8
(.213)  
[5.4]  
SOLDER PASTE EXAMPLE  
BASED ON .005 INCH [0.127 MM] THICK STENCIL  
SCALE:8X  
4214846/A 03/2014  
NOTES: (continued)  
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
9. Board assembly site may have different recommendations for stencil design.  
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PACKAGE OPTION ADDENDUM  
www.ti.com  
10-Dec-2020  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
ISO7730FQDBQQ1  
ISO7730FQDBQRQ1  
ISO7730FQDWQ1  
ISO7730FQDWRQ1  
ISO7730QDBQQ1  
ISO7730QDBQRQ1  
ISO7730QDWQ1  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
SSOP  
SSOP  
SOIC  
SOIC  
SSOP  
SSOP  
SOIC  
SOIC  
SSOP  
SSOP  
SOIC  
SOIC  
SSOP  
SSOP  
SOIC  
SOIC  
DBQ  
DBQ  
DW  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
75  
RoHS & Green  
NIPDAU  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
7730FQ  
2500 RoHS & Green  
40 RoHS & Green  
2000 RoHS & Green  
75 RoHS & Green  
2500 RoHS & Green  
40 RoHS & Green  
2000 RoHS & Green  
75 RoHS & Green  
2500 RoHS & Green  
40 RoHS & Green  
2000 RoHS & Green  
75 RoHS & Green  
2500 RoHS & Green  
40 RoHS & Green  
2000 RoHS & Green  
NIPDAU  
NIPDAU  
NIPDAU  
NIPDAU  
NIPDAU  
NIPDAU  
NIPDAU  
NIPDAU  
NIPDAU  
NIPDAU  
NIPDAU  
NIPDAU  
NIPDAU  
NIPDAU  
NIPDAU  
7730FQ  
ISO7730FQ  
ISO7730FQ  
7730Q  
DW  
DBQ  
DBQ  
DW  
7730Q  
ISO7730Q  
ISO7730Q  
7731FQ  
ISO7730QDWRQ1  
ISO7731FQDBQQ1  
ISO7731FQDBQRQ1  
ISO7731FQDWQ1  
ISO7731FQDWRQ1  
ISO7731QDBQQ1  
ISO7731QDBQRQ1  
ISO7731QDWQ1  
DW  
DBQ  
DBQ  
DW  
7731FQ  
ISO7731FQ  
ISO7731FQ  
7731Q  
DW  
DBQ  
DBQ  
DW  
7731Q  
ISO7731Q  
ISO7731Q  
ISO7731QDWRQ1  
DW  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
10-Dec-2020  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
9-Aug-2022  
TAPE AND REEL INFORMATION  
REEL DIMENSIONS  
TAPE DIMENSIONS  
K0  
P1  
W
B0  
Reel  
Diameter  
Cavity  
A0  
A0 Dimension designed to accommodate the component width  
B0 Dimension designed to accommodate the component length  
K0 Dimension designed to accommodate the component thickness  
Overall width of the carrier tape  
W
P1 Pitch between successive cavity centers  
Reel Width (W1)  
QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE  
Sprocket Holes  
Q1 Q2  
Q3 Q4  
Q1 Q2  
Q3 Q4  
User Direction of Feed  
Pocket Quadrants  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
ISO7730FQDBQRQ1  
ISO7730FQDWRQ1  
ISO7730FQDWRQ1  
ISO7730FQDWRQ1  
ISO7730QDBQRQ1  
ISO7730QDWRQ1  
ISO7730QDWRQ1  
ISO7730QDWRQ1  
ISO7731FQDBQRQ1  
ISO7731FQDWRQ1  
ISO7731FQDWRQ1  
ISO7731FQDWRQ1  
ISO7731QDBQRQ1  
ISO7731QDWRQ1  
ISO7731QDWRQ1  
ISO7731QDWRQ1  
SSOP  
SOIC  
SOIC  
SOIC  
SSOP  
SOIC  
SOIC  
SOIC  
SSOP  
SOIC  
SOIC  
SOIC  
SSOP  
SOIC  
SOIC  
SOIC  
DBQ  
DW  
DW  
DW  
DBQ  
DW  
DW  
DW  
DBQ  
DW  
DW  
DW  
DBQ  
DW  
DW  
DW  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
2500  
2000  
2000  
2000  
2500  
2000  
2000  
2000  
2500  
2000  
2000  
2000  
2500  
2000  
2000  
2000  
330.0  
330.0  
330.0  
330.0  
330.0  
330.0  
330.0  
330.0  
330.0  
330.0  
330.0  
330.0  
330.0  
330.0  
330.0  
330.0  
12.4  
16.4  
16.4  
16.4  
12.4  
16.4  
16.4  
16.4  
12.4  
16.4  
16.4  
16.4  
12.4  
16.4  
16.4  
16.4  
6.4  
5.2  
2.1  
2.7  
2.7  
2.7  
2.1  
2.7  
2.7  
2.7  
2.1  
2.7  
2.7  
2.7  
2.1  
2.7  
2.7  
2.7  
8.0  
12.0  
12.0  
12.0  
8.0  
12.0  
16.0  
16.0  
16.0  
12.0  
16.0  
16.0  
16.0  
12.0  
16.0  
16.0  
16.0  
12.0  
16.0  
16.0  
16.0  
Q1  
Q1  
Q1  
Q1  
Q1  
Q1  
Q1  
Q1  
Q1  
Q1  
Q1  
Q1  
Q1  
Q1  
Q1  
Q1  
10.75 10.7  
10.75 10.7  
10.75 10.7  
6.4  
5.2  
10.75 10.7  
10.75 10.7  
10.75 10.7  
12.0  
12.0  
12.0  
8.0  
6.4  
5.2  
10.75 10.7  
10.75 10.7  
10.75 10.7  
12.0  
12.0  
12.0  
8.0  
6.4  
5.2  
10.75 10.7  
10.75 10.7  
10.75 10.7  
12.0  
12.0  
12.0  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
9-Aug-2022  
TAPE AND REEL BOX DIMENSIONS  
Width (mm)  
H
W
L
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SPQ  
Length (mm) Width (mm) Height (mm)  
ISO7730FQDBQRQ1  
ISO7730FQDWRQ1  
ISO7730FQDWRQ1  
ISO7730FQDWRQ1  
ISO7730QDBQRQ1  
ISO7730QDWRQ1  
ISO7730QDWRQ1  
ISO7730QDWRQ1  
ISO7731FQDBQRQ1  
ISO7731FQDWRQ1  
ISO7731FQDWRQ1  
ISO7731FQDWRQ1  
ISO7731QDBQRQ1  
ISO7731QDWRQ1  
ISO7731QDWRQ1  
ISO7731QDWRQ1  
SSOP  
SOIC  
SOIC  
SOIC  
SSOP  
SOIC  
SOIC  
SOIC  
SSOP  
SOIC  
SOIC  
SOIC  
SSOP  
SOIC  
SOIC  
SOIC  
DBQ  
DW  
DW  
DW  
DBQ  
DW  
DW  
DW  
DBQ  
DW  
DW  
DW  
DBQ  
DW  
DW  
DW  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
2500  
2000  
2000  
2000  
2500  
2000  
2000  
2000  
2500  
2000  
2000  
2000  
2500  
2000  
2000  
2000  
350.0  
350.0  
356.0  
356.0  
350.0  
350.0  
356.0  
356.0  
350.0  
356.0  
356.0  
350.0  
350.0  
356.0  
350.0  
356.0  
350.0  
350.0  
356.0  
356.0  
350.0  
350.0  
356.0  
356.0  
350.0  
356.0  
356.0  
350.0  
350.0  
356.0  
350.0  
356.0  
43.0  
43.0  
35.0  
35.0  
43.0  
43.0  
35.0  
35.0  
43.0  
35.0  
35.0  
43.0  
43.0  
35.0  
43.0  
35.0  
Pack Materials-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
9-Aug-2022  
TUBE  
T - Tube  
height  
L - Tube length  
W - Tube  
width  
B - Alignment groove width  
*All dimensions are nominal  
Device  
Package Name Package Type  
Pins  
SPQ  
L (mm)  
W (mm)  
T (µm)  
B (mm)  
ISO7730FQDBQQ1  
ISO7730FQDWQ1  
ISO7730FQDWQ1  
ISO7730QDBQQ1  
ISO7730QDWQ1  
ISO7730QDWQ1  
ISO7731FQDBQQ1  
ISO7731FQDWQ1  
ISO7731FQDWQ1  
ISO7731QDBQQ1  
ISO7731QDWQ1  
ISO7731QDWQ1  
DBQ  
DW  
SSOP  
SOIC  
SOIC  
SSOP  
SOIC  
SOIC  
SSOP  
SOIC  
SOIC  
SSOP  
SOIC  
SOIC  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
75  
40  
40  
75  
40  
40  
75  
40  
40  
75  
40  
40  
505.46  
506.98  
507  
6.76  
12.7  
3810  
4826  
5080  
3810  
5080  
4826  
3810  
5080  
4826  
3810  
4826  
5080  
4
6.6  
6.6  
4
DW  
12.83  
6.76  
DBQ  
DW  
505.46  
507  
12.83  
12.7  
6.6  
6.6  
4
DW  
506.98  
505.46  
507  
DBQ  
DW  
6.76  
12.83  
12.7  
6.6  
6.6  
4
DW  
506.98  
505.46  
506.98  
507  
DBQ  
DW  
6.76  
12.7  
6.6  
6.6  
DW  
12.83  
Pack Materials-Page 3  
GENERIC PACKAGE VIEW  
DW 16  
7.5 x 10.3, 1.27 mm pitch  
SOIC - 2.65 mm max height  
SMALL OUTLINE INTEGRATED CIRCUIT  
This image is a representation of the package family, actual package may vary.  
Refer to the product data sheet for package details.  
4224780/A  
www.ti.com  
PACKAGE OUTLINE  
DW0016B  
SOIC - 2.65 mm max height  
S
C
A
L
E
1
.
5
0
0
SOIC  
C
10.63  
9.97  
SEATING PLANE  
TYP  
PIN 1 ID  
AREA  
0.1 C  
A
14X 1.27  
16  
1
2X  
10.5  
10.1  
NOTE 3  
8.89  
8
9
0.51  
0.31  
16X  
7.6  
7.4  
B
2.65 MAX  
0.25  
C A  
B
NOTE 4  
0.33  
0.10  
TYP  
SEE DETAIL A  
0.25  
GAGE PLANE  
0.3  
0.1  
0 - 8  
1.27  
0.40  
DETAIL A  
TYPICAL  
(1.4)  
4221009/B 07/2016  
NOTES:  
1. All linear dimensions are in millimeters. Dimensions in parenthesis are for reference only. Dimensioning and tolerancing  
per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not  
exceed 0.15 mm, per side.  
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm, per side.  
5. Reference JEDEC registration MS-013.  
www.ti.com  
EXAMPLE BOARD LAYOUT  
DW0016B  
SOIC - 2.65 mm max height  
SOIC  
SYMM  
SYMM  
16X (2)  
1
16X (1.65)  
SEE  
DETAILS  
SEE  
DETAILS  
1
16  
16  
16X (0.6)  
16X (0.6)  
SYMM  
SYMM  
14X (1.27)  
14X (1.27)  
R0.05 TYP  
9
9
8
8
R0.05 TYP  
(9.75)  
(9.3)  
HV / ISOLATION OPTION  
8.1 mm CLEARANCE/CREEPAGE  
IPC-7351 NOMINAL  
7.3 mm CLEARANCE/CREEPAGE  
LAND PATTERN EXAMPLE  
SCALE:4X  
SOLDER MASK  
OPENING  
SOLDER MASK  
OPENING  
METAL  
METAL  
0.07 MAX  
ALL AROUND  
0.07 MIN  
ALL AROUND  
SOLDER MASK  
DEFINED  
NON SOLDER MASK  
DEFINED  
SOLDER MASK DETAILS  
4221009/B 07/2016  
NOTES: (continued)  
6. Publication IPC-7351 may have alternate designs.  
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.  
www.ti.com  
EXAMPLE STENCIL DESIGN  
DW0016B  
SOIC - 2.65 mm max height  
SOIC  
SYMM  
SYMM  
16X (1.65)  
16X (2)  
1
1
16  
16  
16X (0.6)  
16X (0.6)  
SYMM  
SYMM  
14X (1.27)  
14X (1.27)  
8
9
8
9
R0.05 TYP  
R0.05 TYP  
(9.75)  
(9.3)  
HV / ISOLATION OPTION  
8.1 mm CLEARANCE/CREEPAGE  
IPC-7351 NOMINAL  
7.3 mm CLEARANCE/CREEPAGE  
SOLDER PASTE EXAMPLE  
BASED ON 0.125 mm THICK STENCIL  
SCALE:4X  
4221009/B 07/2016  
NOTES: (continued)  
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
9. Board assembly site may have different recommendations for stencil design.  
www.ti.com  
PACKAGE OUTLINE  
DBQ0016A  
SSOP - 1.75 mm max height  
SCALE 2.800  
SHRINK SMALL-OUTLINE PACKAGE  
C
SEATING PLANE  
.228-.244 TYP  
[5.80-6.19]  
.004 [0.1] C  
A
PIN 1 ID AREA  
14X .0250  
[0.635]  
16  
1
2X  
.189-.197  
[4.81-5.00]  
NOTE 3  
.175  
[4.45]  
8
9
16X .008-.012  
[0.21-0.30]  
B
.150-.157  
[3.81-3.98]  
NOTE 4  
.069 MAX  
[1.75]  
.007 [0.17]  
C A  
B
.005-.010 TYP  
[0.13-0.25]  
SEE DETAIL A  
.010  
[0.25]  
GAGE PLANE  
.004-.010  
[0.11-0.25]  
0 - 8  
.016-.035  
[0.41-0.88]  
DETAIL A  
TYPICAL  
(.041 )  
[1.04]  
4214846/A 03/2014  
NOTES:  
1. Linear dimensions are in inches [millimeters]. Dimensions in parenthesis are for reference only. Controlling dimensions are in inches.  
Dimensioning and tolerancing per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not  
exceed .006 inch, per side.  
4. This dimension does not include interlead flash.  
5. Reference JEDEC registration MO-137, variation AB.  
www.ti.com  
EXAMPLE BOARD LAYOUT  
DBQ0016A  
SSOP - 1.75 mm max height  
SHRINK SMALL-OUTLINE PACKAGE  
16X (.063)  
[1.6]  
SEE  
DETAILS  
SYMM  
1
16  
16X (.016 )  
[0.41]  
14X (.0250 )  
[0.635]  
8
9
(.213)  
[5.4]  
LAND PATTERN EXAMPLE  
SCALE:8X  
SOLDER MASK  
OPENING  
SOLDER MASK  
OPENING  
METAL  
METAL  
.002 MAX  
[0.05]  
ALL AROUND  
.002 MIN  
[0.05]  
ALL AROUND  
SOLDER MASK  
DEFINED  
NON SOLDER MASK  
DEFINED  
SOLDER MASK DETAILS  
4214846/A 03/2014  
NOTES: (continued)  
6. Publication IPC-7351 may have alternate designs.  
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.  
www.ti.com  
EXAMPLE STENCIL DESIGN  
DBQ0016A  
SSOP - 1.75 mm max height  
SHRINK SMALL-OUTLINE PACKAGE  
16X (.063)  
[1.6]  
SYMM  
1
16  
16X (.016 )  
[0.41]  
SYMM  
14X (.0250 )  
[0.635]  
9
8
(.213)  
[5.4]  
SOLDER PASTE EXAMPLE  
BASED ON .005 INCH [0.127 MM] THICK STENCIL  
SCALE:8X  
4214846/A 03/2014  
NOTES: (continued)  
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
9. Board assembly site may have different recommendations for stencil design.  
www.ti.com  
重要声明和免责声明  
TI“按原样提供技术和可靠性数据(包括数据表)、设计资源(包括参考设计)、应用或其他设计建议、网络工具、安全信息和其他资源,  
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这些资源可供使用 TI 产品进行设计的熟练开发人员使用。您将自行承担以下全部责任:(1) 针对您的应用选择合适的 TI 产品,(2) 设计、验  
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Copyright © 2023,德州仪器 (TI) 公司  

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