LMK1D1208 [TI]

LMK1D120x Low Additive Jitter LVDS Buffer;
LMK1D1208
型号: LMK1D1208
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
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LMK1D120x Low Additive Jitter LVDS Buffer

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LMK1D1204, LMK1D1208  
SNAS815A – DECEMBER 2020 – REVISED AUGUST 2021  
LMK1D120x Low Additive Jitter LVDS Buffer  
1 Features  
3 Description  
High-performance LVDS clock buffer family with 2  
inputs and 4 (2:4) or 8 (2:8) outputs.  
Output frequency up to 2 GHz.  
Supply voltage: 1.71 V to 3.465 V  
Low additive jitter: < maximum 60 fs RMS in 12-  
kHz to 20-MHz at 156.25 MHz  
– Very low phase noise floor: –164 dBc/Hz  
(typical)  
Very low propagation delay: < 575 ps maximum  
Output skew: 20 ps maximum  
Universal inputs accept LVDS, LVPECL, LVCMOS,  
LP-HCSL, HCSL and CML inputs  
LVDS reference voltage, VAC_REF, available for  
capacitive-coupled inputs  
Industrial temperature range: –40°C to 105°C  
Packages available:  
– LMK1D1204: 3-mm × 3-mm, 16-pin VQFN  
(RGT)  
– LMK1D1208: 5-mm × 5-mm, 28-pin VQFN  
(RHD)  
The LMK1D120x clock buffer distributes one of two  
selectable clock inputs (IN0 and IN1) to 4 or 8 pairs  
of differential LVDS clock outputs (OUT0 through  
OUT7) with minimum skew for clock distribution. The  
LMK1D12x family can accept two clock sources into  
an input multiplexer. The inputs can either be LVDS,  
LVPECL, LP-HCSL, HCSL, CML or LVCMOS.  
The LMK1D12x is specifically designed for driving 50-  
Ω transmission lines. In case of driving the inputs in  
single-ended mode, the appropriate bias voltage as  
shown in Figure 8-6 must be applied to the unused  
negative input pin.  
The IN_SEL pin selects the input which is routed  
to the outputs. If this pin is left open, it disables  
the outputs (logic low). The part supports a fail-safe  
function. The device further incorporates an input  
hysteresis which prevents random oscillation of the  
outputs in the absence of an input signal.  
The device operates in 1.8-V or 2.5-V or 3.3-V  
supply environment and is characterized from –40°C  
to 105°C (ambient temperature). The LMK1D12x  
package variant is shown in the table below:  
2 Applications  
Telecommunications and networking  
Medical imaging  
Test and measurement  
Wireless infrastructure  
Pro audio, video and signage  
Device Information  
PART NUMBER(1)  
LMK1D1204  
PACKAGE  
VQFN (16)  
VQFN (28)  
BODY SIZE (NOM)  
3.00 mm × 3.00 mm  
5.00 mm × 5.00 mm  
LMK1D1208  
(1) For all available packages, see the orderable addendum at  
the end of the data sheet.  
ADC CLOCK  
F1 MHz  
100 Ω  
156.25 MHz  
Oscillator  
LMK1D 12XX  
LVDS Buffer  
IN_SEL  
FPGA CLOCK  
100 Ω  
Application Example  
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  
 
 
 
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Table of Contents  
1 Features............................................................................1  
2 Applications.....................................................................1  
3 Description.......................................................................1  
4 Revision History.............................................................. 2  
5 Pin Configuration and Functions...................................3  
6 Specifications.................................................................. 5  
6.1 Absolute Maximum Ratings ....................................... 5  
6.2 ESD Ratings .............................................................. 5  
6.3 Recommended Operating Conditions ........................5  
6.4 Thermal Information ...................................................6  
6.5 Electrical Characteristics ............................................6  
6.6 Typical Characteristics................................................9  
7 Parameter Measurement Information..........................10  
8 Detailed Description......................................................12  
8.1 Overview...................................................................12  
8.2 Functional Block Diagram.........................................12  
8.3 Feature Description...................................................12  
8.4 Device Functional Modes..........................................13  
9 Application and Implementation..................................15  
9.1 Application Information............................................. 15  
9.2 Typical Application.................................................... 15  
10 Power Supply Recommendations..............................19  
11 Layout...........................................................................20  
11.1 Layout Guidelines................................................... 20  
11.2 Layout Example...................................................... 20  
12 Device and Documentation Support..........................22  
12.1 Documentation Support.......................................... 22  
12.2 Receiving Notification of Documentation Updates..22  
12.3 Support Resources................................................. 22  
12.4 Trademarks.............................................................22  
12.5 Electrostatic Discharge Caution..............................22  
12.6 Glossary..................................................................22  
13 Mechanical, Packaging, and Orderable  
Information.................................................................... 22  
4 Revision History  
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.  
Changes from Revision * (December 2020) to Revision A (August 2021)  
Page  
First public release..............................................................................................................................................1  
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SNAS815A – DECEMBER 2020 – REVISED AUGUST 2021  
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5 Pin Configuration and Functions  
12  
11  
10  
9
VAC_REF0  
IN0_N  
IN0_P  
VDD  
OUT2_P  
OUT2_N  
OUT3_P  
OUT3_N  
13  
8
7
3mm x 3mm  
16 pin QFN  
14  
15  
16  
6
5
Thermal Pad  
1
2
3
4
Figure 5-1. LMK1D1204: RGT Package 16-Pin VQFN Top View  
21  
20  
19  
18  
17  
16  
15  
OUT4_P  
OUT4_N  
OUT5_P  
OUT5_N  
OUT6_P  
OUT6_N  
V
GND  
22  
23  
24  
25  
26  
27  
28  
14  
13  
12  
11  
10  
9
OUT0_N  
OUT0_P  
5mm x 5mm  
28 pin QFN  
V
AC_REF0  
IN0_N  
IN0_P  
Thermal Pad  
V
8
DD  
DD  
1
2
3
4
5
6
7
Figure 5-2. LMK1D1208: RHD Package 28-Pin VQFN Top View  
Table 5-1. Pin Functions  
PIN  
TYPE(1)  
DESCRIPTION  
NAME  
LMK1D1204  
LMK1D1208  
DIFFERENTIAL/SINGLE-ENDED CLOCK INPUT  
IN0_P  
IN0_N  
IN1_P  
6
7
3
4
9
10  
5
I
I
Primary: Differential input pair or single-ended input  
Secondary: Differential input pair or single-ended input.  
6
Note that INP0, INN0 are used indistinguishably with IN0_P,  
IN0_N.  
IN1_N  
INPUT SELECT  
IN_SEL  
Input Selection with an internal 500-kΩ pullup and 320-kΩ  
pulldown resistor, selects input port; (See Table 8-1)  
2
4
I
BIAS VOLTAGE OUTPUT  
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Table 5-1. Pin Functions (continued)  
PIN  
TYPE(1)  
DESCRIPTION  
NAME  
VAC_REF0  
VAC_REF1  
LMK1D1204  
LMK1D1208  
8
11  
7
Bias voltage output for capacitive coupled inputs. If used, TI  
recommends using a 0.1-µF capacitor to GND on this pin.  
O
DIFFERENTIAL CLOCK OUTPUT  
OUT0_P  
OUT0_N  
OUT1_P  
OUT1_N  
OUT2_P  
OUT2_N  
OUT3_P  
OUT3_N  
OUT4_P  
OUT4_N  
OUT5_P  
OUT5_N  
OUT6_P  
OUT6_N  
OUT7_P  
OUT7_N  
SUPPLY VOLTAGE  
9
12  
13  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
2
O
O
O
O
O
O
O
O
Differential LVDS output pair number 0  
Differential LVDS output pair number 1  
Differential LVDS output pair number 2  
Differential LVDS output pair number 3  
Differential LVDS output pair number 4  
Differential LVDS output pair number 5  
Differential LVDS output pair number 6  
Differential LVDS output pair number 7  
10  
11  
12  
13  
14  
15  
16  
3
8
VDD  
5
15  
28  
P
Device Power Supply (1.8V or 2.5V or 3.3V)  
GROUND  
GND  
1
1
G
Ground  
14  
MISC  
DAP  
NC  
DAP  
DAP  
GND  
NC  
Die Attach Pad. Connect to the PCB ground plane for heat  
dissipation.  
No Connection  
(1) G = Ground, I = Input, O = Output, P = Power  
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6 Specifications  
6.1 Absolute Maximum Ratings  
over operating free-air temperature range (unless otherwise noted)(1)  
MIN  
–0.3  
–0.3  
–0.3  
–20  
MAX  
3.6  
UNIT  
V
VDD  
VIN  
VO  
IIN  
Supply voltage  
Input voltage  
3.6  
V
Output voltage  
VDD + 0.3  
20  
V
Input current  
mA  
mA  
°C  
°C  
IO  
Continuous output current  
Junction temperature  
Storage temperature (2)  
–50  
50  
TJ  
135  
Tstg  
–65  
150  
(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress  
ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated  
under Recommended Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device  
reliability.  
(2) Device unpowered  
6.2 ESD Ratings  
VALUE  
UNIT  
Human body model (HBM), per ANSI/ESDA/  
JEDEC JS-001, all pins(1)  
±3000  
V(ESD)  
Electrostatic discharge  
V
Charged device model (CDM), per JEDEC  
specification JESD22-C101, all pins(2)  
±1000  
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.  
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.  
6.3 Recommended Operating Conditions  
over operating free-air temperature range (unless otherwise noted)  
MIN  
3.135  
2.375  
1.71  
NOM  
3.3  
MAX  
3.465  
2.625  
1.89  
UNIT  
3.3-V supply  
VDD  
Core supply voltage  
Supply voltage ramp  
2.5-V supply  
2.5  
V
1.8-V supply  
1.8  
Supply  
Ramp  
Requires monotonic ramp (10-90% of  
0.1  
20  
ms  
VDD  
)
TA  
TJ  
Operating free-air temperature  
Operating junction temperature  
–40  
–40  
105  
135  
°C  
°C  
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UNIT  
SNAS815A – DECEMBER 2020 – REVISED AUGUST 2021  
6.4 Thermal Information  
LMK1D1204  
VQFN  
16 PINS  
48.7  
LMK1D1208  
VQFN  
28 PINS  
38.9  
THERMAL METRIC(1)  
RθJA  
Junction-to-ambient thermal resistance  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
RθJC(top)  
RθJB  
56.4  
32.1  
23.6  
18.7  
ΨJT  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case (bottom) thermal resistance  
1.6  
1
ΨJB  
23.6  
18.7  
RθJC(bot)  
8.6  
8.2  
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application  
report.  
6.5 Electrical Characteristics  
VDD = 1.8 V ± 5 %, –40 °C ≤T_A ≤ 105 °C. Typical values are at VDD = 1.8 V, 25 °C (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
POWER SUPPLY CHARACTERISTICS  
All-outputs enabled and  
unterminated, f = 0 Hz  
IDDSTAT  
IDDSTAT  
IDD100M  
IDD100M  
LMK1D1204  
LMK1D1208  
LMK1D1204  
LMK1D1208  
50  
55  
60  
78  
mA  
mA  
mA  
mA  
All-outputs enabled and  
unterminated, f = 0 Hz  
All-outputs enabled, RL = 100 Ω, f  
=100 MHz  
72  
95  
All-outputs enabled, RL = 100 Ω, f  
=100 MHz  
IN_SEL CONTROL INPUT CHARACTERISTICS (Applies to VDD = 1.8 V ± 5%, 2.5 V ± 5% and 3.3 V ± 5%)  
VdI3  
VIH  
3-state input  
Open  
0.4*VCC  
V
V
Minimun input voltage for a logical  
"1" state in table 1  
Input high voltage  
0.7*VCC  
–0.3  
VCC + 0.3  
0.3*VCC  
30  
Maximum input voltage for a  
logical "0" state in table 1  
VIL  
IIH  
IIL  
Input low voltage  
V
VDD can be 1.8V/2.5V/3.3V with  
VIH = VDD  
Input high current  
Input low current  
uA  
uA  
kΩ  
kΩ  
VDD can be 1.8V/2.5V/3.3V with  
VIH = VDD  
–30  
Rpull-  
Input pullup resistor  
Input pulldown resistor  
500  
320  
up(IN_SEL)  
Rpull-  
down(IN_SEL)  
SINGLE-ENDED LVCMOS/LVTTL CLOCK INPUT (Applies to VDD = 1.8 V ± 5%, 2.5 V ± 5% and 3.3 V ± 5%)  
fIN  
Input frequency  
Clock input  
DC  
0.4  
250  
MHz  
V
Assumes a square wave input  
with two levels  
VIN_S-E  
Single-ended Input Voltage Swing  
3.465  
Input Slew Rate (20% to 80% of the  
amplitude)  
dVIN/dt  
0.05  
-30  
V/ns  
IIH  
Input high current  
Input low current  
Input capacitance  
VDD = 3.465 V, VIH = 3.465 V  
VDD = 3.465 V, VIL = 0 V  
at 25°C  
50  
2
uA  
uA  
pF  
IIL  
CIN_SE  
3.5  
DIFFERENTIAL CLOCK INPUT (Applies to VDD = 1.8 V ± 5%, 2.5 V ± 5% and 3.3 V ± 5%)  
fIN  
Input frequency  
Clock input  
GHz  
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VDD = 1.8 V ± 5 %, –40 °C ≤T_A ≤ 105 °C. Typical values are at VDD = 1.8 V, 25 °C (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
VICM = 1 V (VDD = 1.8 V)  
0.3  
2.4  
Differential input voltage peak-to-peak  
{2*(VINP-VINN)}  
VIN,DIFF(p-p)  
VPP  
VICM = 1.25 V (VDD = 2.5 V/3.3 V)  
0.3  
2.4  
VIN,DIFF(P-P) > 0.4 V (VDD = 1.8  
V/2.5/3.3 V)  
VICM  
IIH  
Input common mode voltage  
Input high current  
0.25  
2.3  
30  
V
VDD = 3.465 V, VINP = 2.4 V, VINN  
= 1.2 V  
uA  
VDD = 3.465 V, VINP = 0 V, VINN  
1.2 V  
=
IIL  
Input low current  
–30  
uA  
pF  
CIN_S-E  
Input capacitance (Single-ended)  
at 25°C  
3.5  
LVDS DC OUTPUT CHARACTERISTICS  
Differential output voltage magnitude |  
VOUTP - VOUTN  
VIN,DIFF(P-P) = 0.3 V, RLOAD = 100  
Ω
|VOD|  
ΔVOD  
250  
–15  
350  
450  
15  
mV  
mV  
|
Change in differential output voltage  
magnitude. Per output, defined as the  
difference between VOD in logic hi/lo  
states.  
VIN,DIFF(P-P) = 0.3 V, RLOAD = 100  
Ω
VIN,DIFF(P-P) = 0.3 V, RLOAD = 100  
Ω (VDD = 1.8 V)  
1
1.2  
Steady-state common mode output  
voltage  
VOC(SS)  
V
VIN,DIFF(P-P) = 0.3 V, RLOAD = 100  
Ω (VDD = 2.5 V/3.3 V)  
1.1  
1.375  
Change in steady-state common mode  
output voltage. Per output, defined as the  
difference in VOC in logic hi/lo states.  
VIN,DIFF(P-P) = 0.3 V, RLOAD = 100  
Ω
ΔVOC(SS)  
–15  
15  
mV  
LVDS AC OUTPUT CHARACTERISTICS  
VIN,DIFF(P-P) = 0.3 V, RLOAD = 100  
Ω, fOUT = 491.52 MHz  
Vring  
Output overshoot and undershoot  
–0.1  
0.1  
VOD  
VIN,DIFF(P-P) = 0.3 V, RLOAD = 100  
Ω
VOS  
Output AC common mode  
50  
100  
12  
mVpp  
mA  
IOS  
Short-circuit output current (differential)  
VOUTP = VOUTN  
–12  
–24  
Short-circuit output current (common-  
mode)  
IOS(cm)  
VOUTP = VOUTN = 0  
24  
mA  
VIN,DIFF(P-P) = 0.3 V, RLOAD = 100  
Ω (1)  
tPD  
Propagation delay  
Output skew  
0.3  
0.575  
20  
ns  
ps  
skew between outputs with the  
same load conditions (4 and 8  
channel) (2)  
tSK, O  
Skew between outputs on  
different parts subjected to the  
same operating conditions with  
the same input and output  
loading.  
tSK, PP  
Part-to-part skew  
250  
20  
ps  
ps  
50% duty cycle input, crossing  
tSK, P  
Pulse skew  
point-to-crossing-point distortion  
–20  
(3)  
fIN = 156.25 MHz with 50% duty-  
cycle, Input slew rate = 1.5V/ns,  
Integration range = 12kHz -  
tRJIT(ADD)  
Random additive Jitter (rms)  
50  
60 fs, RMS  
20MHz, with output load RLOAD  
100 Ω  
=
PN1kHz  
PN10kHz  
PN100kHz  
PN1MHz  
PNfloor  
–143  
-152  
-157  
-160  
–164  
Phase Noise for a carrier frequency of  
156.25 MHz with 50% duty-cycle, Input  
slew rate = 1.5V/ns with output load  
RLOAD = 100 Ω  
Phase noise  
dBc/Hz  
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UNIT  
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VDD = 1.8 V ± 5 %, –40 °C ≤T_A ≤ 105 °C. Typical values are at VDD = 1.8 V, 25 °C (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
fIN = 156.25 MHz. The difference  
in power level @ fIN when the  
selected clock is active and the  
unselected clock is static versus  
when the selected clock is inactive  
and the unselected clock is active.  
MUXISO  
Mux Isolation  
80  
dB  
ODC  
Output duty cycle  
With 50% duty cycle input  
45  
55  
300  
%
ps  
V
tR/tF  
Output rise and fall time  
Reference output voltage  
20% to 80% with RLOAD = 100 Ω  
VDD = 2.5 V, ILOAD = 100 uA  
VAC_REF  
0.9  
1.25  
1.375  
POWER SUPPLY NOISE REJECTION (PSNR) VDD = 2.5 V/ 3.3 V  
10 kHz, 100 mVpp ripple injected  
–70  
–50  
on VDD  
Power Supply Noise Rejection (fcarrier  
156.25 MHz)  
=
PSNR  
dBc  
1 MHz, 100 mVpp ripple injected  
on VDD  
(1) Measured between single-ended/differential input crossing point to the differential output crossing point.  
(2) For the dual bank devices, the inputs are phase aligned and have 50% duty cycle.  
(3) Defined as the magnitude of the time difference between the high-to-low and low-to-high propagation delay times at an output.  
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6.6 Typical Characteristics  
The Figure 6-1 captures the variation of the LMK1D1208 current consumption with input frequency and supply  
voltage. The LMK1D1204 follows a similar trend. Figure 6-2 shows the variation of the differential output voltage  
(VOD) swept across frequency. This result is applicable to LMK1D1204 as well.  
It is important to note that Figure 6-1 and Figure 6-2 serve as a guidance to the users on what to expect for the  
range of operating frequency supported by LMK1D120x. It is crucial to note that these graphs were plotted for a  
limited number of frequencies and load conditions which may not represent the customer system.  
130  
125  
120  
115  
110  
105  
100  
95  
VDD = 1.8 V, TA = -40  
VDD = 1.8 V, TA = 25  
VDD = 1.8 V, TA = 105  
VDD = 2.5 V, TA = -40  
VDD = 2.5 V, TA = 25  
VDD = 2.5 V, TA = 105  
VDD = 3.3 V, TA = -40  
VDD = 3.3 V, TA = 25  
VDD = 3.3 V, TA = 105  
90  
85  
80  
75  
70  
0
100 200 300 400 500 600 700 800 900 1000 1100 1200 1300 1400 1500 1600 1700 1800 1900 2000  
Frequency (MHz)  
Figure 6-1. LMK1D1208 Current Consumption vs. Frequency  
380  
370  
360  
350  
340  
330  
320  
310  
300  
290  
280  
270  
260  
250  
240  
VDD = 1.8 V, TA = -40  
VDD = 1.8 V, TA = 25  
VDD = 1.8 V, Ta = 105  
VDD = 2.5 V, TA = -40  
VDD = 2.5 V, TA = 25  
VDD = 2.5 V, TA = 105  
VDD = 3.3 V, TA = -40  
VDD = 3.3 V, TA = 25  
VDD = 3.3 V, TA = 105  
100  
200  
300  
400  
500  
600 700 800 9001000  
2000  
Frequency (MHz)  
Figure 6-2. LMK1D1208 VOD vs. Frequency  
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7 Parameter Measurement Information  
Oscilloscope  
100 W  
LVDS  
Figure 7-1. LVDS Output DC Configuration During Device Test  
Phase Noise/  
Spectrum Analyzer  
LMK1D120X  
Balun  
100 Ω  
Figure 7-2. LVDS Output AC Configuration During Device Test  
V
IH  
V
th  
IN  
V
IL  
IN  
V
th  
Figure 7-3. DC-Coupled LVCMOS Input During Device Test  
V
OUTNx  
OUTPx  
OH  
V
OD  
V
OL  
80%  
V
(= 2 x V  
)
OD  
20%  
0 V  
OUT,DIFF,PP  
t
r
t
f
Figure 7-4. Output Voltage and Rise/Fall Time  
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INNx  
INPx  
t
t
t
PLH0  
PHL0  
PHL1  
OUTN0  
OUTP0  
t
PLH1  
OUTN1  
OUTP1  
t
t
PLH2  
PHL2  
OUTN2  
OUTP2  
t
t
PLH7  
PHL7  
OUTN7  
OUTP7  
A. Output skew is calculated as the greater of the following: the difference between the fastest and the slowest tPLHn or the difference  
between the fastest and the slowest tPHLn (n = 0, 1, 2, ..7)  
B. Part to part skew is calculated as the greater of the following: the difference between the fastest and the slowest tPLHn or the difference  
between the fastest and the slowest tPHLn across multiple devices (n = 0, 1, 2, ..7)  
Figure 7-5. Output Skew and Part-to-Part Skew  
V
ring  
OUTNx  
V
OD  
0 V Differential  
OUTPx  
Figure 7-6. Output Overshoot and Undershoot  
V
OS  
GND  
Figure 7-7. Output AC Common Mode  
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8 Detailed Description  
8.1 Overview  
The LMK1D120x LVDS drivers use CMOS transistors to control the output current. Therefore, proper biasing  
and termination are required to ensure correct operation of the device and to maximize signal integrity.  
The proper LVDS termination for signal integrity over two 50-Ω lines is 100 Ω between the outputs on the  
receiver end. Either DC-coupled termination or AC-coupled termination can be used for LVDS outputs. TI  
recommends placing a termination resistor close to the receiver. If the receiver is internally biased to a voltage  
different than the output common-mode voltage of the LMK1D12XX, AC-coupling must be used. If the LVDS  
receiver has internal 100-Ω termination, external termination must be omitted.  
8.2 Functional Block Diagram  
VDD  
1.8 to 3.3 V  
Reference  
Generator  
VAC_REF  
IN0  
OUT[0:N-1]  
LVDS  
IN_MUX  
IN1  
VDD  
Rpull-up  
IN_SEL  
Rpull-down  
GND  
8.3 Feature Description  
The LMK1D120x is a low additive jitter LVDS fan-out buffer that can generate up to eight copies of two  
selectable LVPECL, LVDS, LP-HCSL, HCSL or LVCMOS inputs. The LMK1D120x can accept reference clock  
frequencies up to 2 GHz while providing low output skew.  
8.3.1 Fail-Safe Input and Hysteresis  
The LMK1D120x family of devices is designed to support fail-safe input operation feature. This feature allows  
the user to drive the device inputs before VDD is applied without damaging the device. Refer to Specifications  
for more information on the maximum input supported by the device. User should note that incorporating the  
fail-safe inputs also results in a slight increase in clock input pin capacitance.  
The device also incorporates an input hysteresis which prevents random oscillation in absence of an input  
signal. Furthermore, this feature allows the input pins to be left open.  
8.3.2 Input Mux  
The LMK1D120x family of devices has a 2:1 input mux. This feature allows the user to select between the two  
clock inputs (using the IN_SEL pin) to the device and fan it out to the outputs. More information on the input  
selection is provided in the next section.  
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8.4 Device Functional Modes  
The two inputs of the LMK1D120x are internally muxed together and can be selected through the control pin  
(see Table 8-1). Unused input can be left floating thus reducing the need for additional components. Both AC-  
and DC-coupling schemes can be used with the LMK1D120x to provide greater system flexibility.  
Table 8-1. Input Selection Table  
IN_SEL  
ACTIVE CLOCK INPUT  
IN0_P, IN0_N  
IN1_P, IN1_N  
None (1)  
0
1
Open  
(1) The input buffers are disabled and the outputs are static logic  
low.  
8.4.1 LVDS Output Termination  
TI recommends unused outputs to be terminated differentially with a 100-Ω resistor for optimum performance,  
although unterminated outputs are also okay but will result in slight degradation in performance (Output AC  
common-mode VOS ) in the outputs being used.  
The LMK1D120x can be connected to LVDS receiver inputs with DC- and AC-coupling as shown in Figure 8-1  
and Figure 8-2 (respectively).  
100 W  
LVDS  
LMK1D12XX  
Z = 50 W  
Figure 8-1. Output DC Termination  
100 nF  
100 W  
LVDS  
LMK1D12XX  
Z = 50 W  
100 nF  
Figure 8-2. Output AC Termination (With the Receiver Internally Biased)  
8.4.2 Input Termination  
The LMK1D120x input stage is designed with flexibility in mind to allow the user to drive the device with a wide  
variety of signal types. This device can be interfaced with LVDS, LVPECL, LP-HCSL, HCSL, CML or LVCMOS  
drivers. Please refer to Electrical Characteristics for more details.  
LVDS drivers can be connected to LMK1D120x inputs with DC- and AC-coupling as shown Figure 8-3 and  
Figure 8-4 (respectively).  
100 W  
LVDS  
LMK1D12XX  
Z = 50 W  
Figure 8-3. LVDS Clock Driver Connected to LMK1D120x Input (DC-Coupled)  
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100 nF  
LVDS  
LMK1D12XX  
Z = 50 W  
100 nF  
50 W  
50 W  
V
AC_REF  
Figure 8-4. LVDS Clock Driver Connected to LMK1D120x Input (AC-Coupled)  
Figure 8-5 shows how to connect LVPECL inputs to the LMK1D120x. The series resistors are required to reduce  
the LVPECL signal swing if the signal swing is >1.6 VPP  
.
75 W  
100 nF  
LMK1D12XX  
LVPECL  
Z = 50 W  
100 nF  
50 W  
75 W  
150 W  
150 W  
50 W  
V
AC_REF  
Figure 8-5. LVPECL Clock Driver Connected to LMK1D120x Input  
Figure 8-6 illustrates how to couple a LVCMOS clock input to the LMK1D120x directly.  
R
S
LVCMOS  
(1.8/2.5/3.3 V)  
LMK1D12XX  
VIH + VIL  
Vth =  
2
Figure 8-6. 1.8-V/2.5-V/3.3-V LVCMOS Clock Driver Connected to LMK1D120x Input  
For unused input, TI recommends grounding both input pins (INP, INN) using 1-kΩ resistors.  
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9 Application and Implementation  
Note  
Information in the following applications sections is not part of the TI component specification,  
and TI does not warrant its accuracy or completeness. TI’s customers are responsible for  
determining suitability of components for their purposes, as well as validating and testing their design  
implementation to confirm system functionality.  
9.1 Application Information  
The LMK1D120x is a low additive jitter universal to LVDS fan-out buffer with 2 selectable inputs. The small  
package, low output skew, and low additive jitter make for a flexible device in demanding applications.  
9.2 Typical Application  
1.8 V / 2.5 V / 3.3 V  
PHY  
PRIREF_P  
156.25 MHz LVDS  
From Backplane  
100  
PRIREF_N  
50  
50  
VAC_REF  
ASIC  
100  
156.25 MHz LVCMOS  
Oscillator  
SECREF_P  
FPGA  
100  
2.5 V  
1k  
SECREF_N  
CPU  
1k  
100  
Figure 9-1. Fan-Out Buffer for Line Card Application  
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9.2.1 Design Requirements  
The LMK1D120x shown in Figure 9-1 is configured to select two inputs: a 156.25-MHz LVDS clock from the  
backplane, or a secondary 156.25-MHz LVCMOS 2.5-V oscillator. The LVDS clock is AC-coupled and biased  
using the integrated reference voltage generator. A resistor divider is used to set the threshold voltage correctly  
for the LVCMOS clock. 0.1-µF capacitors are used to reduce noise on both VAC_REF and SECREF_N. Either  
input signal can be then fanned out to desired devices, as shown. The configuration example is driving 4 LVDS  
receivers in a line card application with the following properties:  
The PHY device is capable of DC-coupling with an LVDS driver such as the LMK1D120x. This PHY device  
features internal termination so no additional components are required for proper operation.  
The ASIC LVDS receiver features internal termination and operates at the same common-mode voltage as  
the LMK1D120x. Again, no additional components are required.  
The FPGA requires external AC-coupling, but has internal termination. 0.1-µF capacitors are placed to  
provide AC-coupling. Similarly, the CPU is internally terminated, and requires only external AC-coupling  
capacitors.  
Unused outputs of the LMK1D device are terminated differentially with a 100-Ω resistor for optimum  
performance.  
9.2.2 Detailed Design Procedure  
See Input Termination for proper input terminations, dependent on single-ended or differential inputs.  
See LVDS Output Termination for output termination schemes depending on the receiver application.  
TI recommends unused outputs to be terminated differentially with a 100-Ω resistor for optimum performance,  
although unterminated outputs are also okay but will result in slight degradation in performance (Output AC  
common-mode VOS ) in the outputs being used.  
In this example, the PHY, ASIC, and FPGA or CPU require different schemes. Power-supply filtering and  
bypassing is critical for low-noise applications.  
See Power Supply Recommendations for recommended filtering techniques. A reference layout is provided in  
Low-Additive Jitter, Four LVDS Outputs Clock Buffer Evaluation Board (SCAU043).  
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9.2.3 Application Curves  
The LMK1D1208's low additive noise is shown below. The low noise 156.25-MHz source with 24-fs RMS jitter  
shown in Figure 9-2 drives the LMK1D1208, resulting in 46.4-fs RMS when integrated from 12 kHz to 20 MHz  
(Figure 9-3). The resultant additive jitter is a low 39.7-fs RMS for this configuration. Note that this result applies  
to the LMK1D1204 device as well.  
A.  
Reference signal is low-noise Rohde and Schwarz SMA100B  
Figure 9-2. LMK1D208 Reference Phase Noise, 156.25 MHz, 24-fs RMS (12 kHz to 20 MHz)  
Figure 9-3. LMK1D1208 Output Phase Noise, 156.25 MHz, 46.4-fs RMS (12 kHz to 20 MHz)  
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The Figure 9-4 captures the low close-in phase noise of the LMK1D1208 device. The LMK1D1204 and  
LMK1D1208 have excellent flicker noise as a result of superior process technology and design. This enables  
their use for clock distribution in radar systems, medical imaging systems etc which require ultra-low close-in  
phase noise clocks.  
Figure 9-4. LMK1D1208 Output Phase Noise, 100 MHz, 1 kHz offset: -147 dBc/Hz  
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10 Power Supply Recommendations  
High-performance clock buffers are sensitive to noise on the power supply, which can dramatically increase the  
additive jitter of the buffer. Thus, it is essential to reduce noise from the system power supply, especially when  
jitter or phase noise is critical to applications.  
Filter capacitors are used to eliminate the low-frequency noise from the power supply, where the bypass  
capacitors provide the low impedance path for high-frequency noise and guard the power-supply system against  
the induced fluctuations. These bypass capacitors also provide instantaneous current surges as required by the  
device and must have low equivalent series resistance (ESR). To properly use the bypass capacitors, they must  
be placed close to the power-supply pins and laid out with short loops to minimize inductance. TI recommends  
adding as many high-frequency (for example, 0.1-µF) bypass capacitors as there are supply pins in the package.  
TI recommends, but does not require, inserting a ferrite bead between the board power supply and the chip  
power supply that isolates the high-frequency switching noises generated by the clock driver; these beads  
prevent the switching noise from leaking into the board supply. Choose an appropriate ferrite bead with low  
DC-resistance because it is imperative to provide adequate isolation between the board supply and the chip  
supply, as well as to maintain a voltage at the supply pins that is greater than the minimum voltage required for  
proper operation.  
Figure 10-1 shows this recommended power-supply decoupling method.  
Chip  
Supply  
Board  
Supply  
Ferrite Bead  
1µF  
10µF  
0.1µF  
(x3)  
Figure 10-1. Power Supply Decoupling  
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11 Layout  
11.1 Layout Guidelines  
For reliability and performance reasons, the die temperature must be limited to a maximum of 135°C.  
The device package has an exposed pad that provides the primary heat removal path to the printed circuit board  
(PCB). To maximize the heat dissipation from the package, a thermal landing pattern including multiple vias to a  
ground plane must be incorporated into the PCB within the footprint of the package. The thermal pad must be  
soldered down to ensure adequate heat conduction to of the package. Figure 11-1 shows a recommended land  
and via pattern for LMK1D1208.  
11.2 Layout Example  
Figure 11-1. Recommended PCB Layout, Top Layer  
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Figure 11-2. PCB Layout, GND Layer  
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12 Device and Documentation Support  
12.1 Documentation Support  
12.1.1 Related Documentation  
For related documentation see the following:  
Low-Additive Jitter, Four LVDS Outputs Clock Buffer Evaluation Board (SCAU043)  
Power Consumption of LVPECL and LVDS (SLYT127)  
Semiconductor and IC Package Thermal Metrics (SPRA953)  
Using Thermal Calculation Tools for Analog Components (SLUA556)  
12.2 Receiving Notification of Documentation Updates  
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on  
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For  
change details, review the revision history included in any revised document.  
12.3 Support Resources  
TI E2Esupport forums are an engineer's go-to source for fast, verified answers and design help — straight  
from the experts. Search existing answers or ask your own question to get the quick design help you need.  
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do  
not necessarily reflect TI's views; see TI's Terms of Use.  
12.4 Trademarks  
TI E2Eis a trademark of Texas Instruments.  
All trademarks are the property of their respective owners.  
12.5 Electrostatic Discharge Caution  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled  
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may  
be more susceptible to damage because very small parametric changes could cause the device not to meet its published  
specifications.  
12.6 Glossary  
TI Glossary  
This glossary lists and explains terms, acronyms, and definitions.  
13 Mechanical, Packaging, and Orderable Information  
The following pages include mechanical, packaging, and orderable information. This information is the most  
current data available for the designated devices. This data is subject to change without notice and revision of  
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.  
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PACKAGE OPTION ADDENDUM  
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20-Aug-2021  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
LMK1D1204RGTR  
LMK1D1204RGTT  
LMK1D1208RHDR  
ACTIVE  
ACTIVE  
ACTIVE  
VQFN  
VQFN  
VQFN  
RGT  
RGT  
RHD  
16  
16  
28  
3000 RoHS & Green  
250 RoHS & Green  
3000 RoHS & Green  
250 RoHS & Green  
NIPDAU  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
-40 to 105  
-40 to 105  
-40 to 105  
LD1204  
NIPDAU  
NIPDAU  
LD1204  
LMK1D  
1208  
LMK1D1208RHDT  
ACTIVE  
VQFN  
RHD  
28  
NIPDAU  
Level-2-260C-1 YEAR  
-40 to 105  
LMK1D  
1208  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
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20-Aug-2021  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
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21-Aug-2021  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
LMK1D1204RGTR  
LMK1D1204RGTT  
LMK1D1208RHDR  
LMK1D1208RHDT  
VQFN  
VQFN  
VQFN  
VQFN  
RGT  
RGT  
RHD  
RHD  
16  
16  
28  
28  
3000  
250  
330.0  
180.0  
330.0  
180.0  
12.4  
12.4  
12.4  
12.4  
3.3  
3.3  
5.3  
5.3  
3.3  
3.3  
5.3  
5.3  
1.1  
1.1  
1.1  
1.1  
8.0  
8.0  
8.0  
8.0  
12.0  
12.0  
12.0  
12.0  
Q2  
Q2  
Q2  
Q2  
3000  
250  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
21-Aug-2021  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SPQ  
Length (mm) Width (mm) Height (mm)  
LMK1D1204RGTR  
LMK1D1204RGTT  
LMK1D1208RHDR  
LMK1D1208RHDT  
VQFN  
VQFN  
VQFN  
VQFN  
RGT  
RGT  
RHD  
RHD  
16  
16  
28  
28  
3000  
250  
367.0  
210.0  
367.0  
210.0  
367.0  
185.0  
367.0  
185.0  
35.0  
35.0  
35.0  
35.0  
3000  
250  
Pack Materials-Page 2  
PACKAGE OUTLINE  
RHD0028B  
VQFN - 1 mm max height  
S
C
A
L
E
2
.
5
0
0
PLASTIC QUAD FLATPACK - NO LEAD  
5.15  
4.85  
A
B
PIN 1 INDEX AREA  
5.15  
4.85  
1.0  
0.8  
C
SEATING PLANE  
0.08 C  
0.05  
0.00  
3.15 0.1  
2X 3  
SYMM  
(0.2) TYP  
8
14  
EXPOSED  
THERMAL PAD  
15  
7
SYMM  
29  
2X 3  
3.15 0.1  
24X 0.5  
1
21  
PIN 1 ID  
0.30  
0.18  
28X  
22  
28  
0.1  
C A B  
0.65  
0.45  
28X  
0.05  
4226146/A 08/2020  
NOTES:  
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing  
per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.  
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EXAMPLE BOARD LAYOUT  
RHD0028B  
VQFN - 1 mm max height  
PLASTIC QUAD FLATPACK - NO LEAD  
(
3.15)  
SYMM  
28  
SEE SOLDER MASK  
DETAIL  
22  
28X (0.75)  
28X (0.24)  
24X (0.5)  
21  
1
29  
SYMM  
(4.65)  
(1.325)  
(R0.05) TYP  
7
15  
(
0.2) TYP  
VIA  
8
14  
(1.325)  
(4.65)  
LAND PATTERN EXAMPLE  
EXPOSED METAL SHOWN  
SCALE: 18X  
0.07 MIN  
ALL AROUND  
0.07 MAX  
ALL AROUND  
METAL UNDER  
SOLDER MASK  
METAL EDGE  
EXPOSED METAL  
SOLDER MASK  
OPENING  
EXPOSED  
METAL  
SOLDER MASK  
OPENING  
NON SOLDER MASK  
DEFINED  
SOLDER MASK DEFINED  
(PREFERRED)  
SOLDER MASK DETAILS  
4226146/A 08/2020  
NOTES: (continued)  
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature  
number SLUA271 (www.ti.com/lit/slua271).  
5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown  
on this view. It is recommended that vias under paste be filled, plugged or tented.  
www.ti.com  
EXAMPLE STENCIL DESIGN  
RHD0028B  
VQFN - 1 mm max height  
PLASTIC QUAD FLATPACK - NO LEAD  
(0.785) TYP  
22  
28  
28X (0.75)  
28X (0.24)  
21  
1
24X (0.5)  
(0.785) TYP  
(4.65)  
29  
SYMM  
(R0.05) TYP  
4X (1.37)  
7
15  
14  
8
4X (1.37)  
SYMM  
(4.65)  
SOLDER PASTE EXAMPLE  
BASED ON 0.125 MM THICK STENCIL  
SCALE: 20X  
EXPOSED PAD 29  
76% PRINTED SOLDER COVERAGE BY AREA UNDER PACKAGE  
4226146/A 08/2020  
NOTES: (continued)  
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
www.ti.com  
PACKAGE OUTLINE  
RGT0016C  
VQFN - 1 mm max height  
S
C
A
L
E
3
.
6
0
0
PLASTIC QUAD FLATPACK - NO LEAD  
3.1  
2.9  
B
A
PIN 1 INDEX AREA  
3.1  
2.9  
1.0  
0.8  
C
SEATING PLANE  
0.08  
0.05  
0.00  
1.68 0.07  
(0.2) TYP  
5
8
EXPOSED  
THERMAL PAD  
12X 0.5  
4
9
4X  
SYMM  
1.5  
1
12  
0.30  
16X  
0.18  
13  
16  
0.1  
C A B  
PIN 1 ID  
(OPTIONAL)  
SYMM  
0.05  
0.5  
0.3  
16X  
4222419/C 04/2021  
NOTES:  
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing  
per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.  
www.ti.com  
EXAMPLE BOARD LAYOUT  
RGT0016C  
VQFN - 1 mm max height  
PLASTIC QUAD FLATPACK - NO LEAD  
(
1.68)  
SYMM  
13  
16  
16X (0.6)  
1
12  
16X (0.24)  
SYMM  
(2.8)  
(0.58)  
TYP  
12X (0.5)  
9
4
(
0.2) TYP  
VIA  
5
(0.58) TYP  
8
(R0.05)  
ALL PAD CORNERS  
(2.8)  
LAND PATTERN EXAMPLE  
SCALE:20X  
0.07 MIN  
ALL AROUND  
0.07 MAX  
ALL AROUND  
SOLDER MASK  
OPENING  
METAL  
SOLDER MASK  
OPENING  
METAL UNDER  
SOLDER MASK  
NON SOLDER MASK  
SOLDER MASK  
DEFINED  
DEFINED  
(PREFERRED)  
SOLDER MASK DETAILS  
4222419/C 04/2021  
NOTES: (continued)  
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature  
number SLUA271 (www.ti.com/lit/slua271).  
5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown  
on this view. It is recommended that vias under paste be filled, plugged or tented.  
www.ti.com  
EXAMPLE STENCIL DESIGN  
RGT0016C  
VQFN - 1 mm max height  
PLASTIC QUAD FLATPACK - NO LEAD  
(
1.55)  
16  
13  
16X (0.6)  
1
12  
16X (0.24)  
17  
SYMM  
(2.8)  
12X (0.5)  
9
4
METAL  
ALL AROUND  
5
8
SYMM  
(2.8)  
(R0.05) TYP  
SOLDER PASTE EXAMPLE  
BASED ON 0.125 mm THICK STENCIL  
EXPOSED PAD 17:  
85% PRINTED SOLDER COVERAGE BY AREA UNDER PACKAGE  
SCALE:25X  
4222419/C 04/2021  
NOTES: (continued)  
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
www.ti.com  
IMPORTANT NOTICE AND DISCLAIMER  
TI PROVIDES TECHNICAL AND RELIABILITY DATA (INCLUDING DATASHEETS), DESIGN RESOURCES (INCLUDING REFERENCE  
DESIGNS), APPLICATION OR OTHER DESIGN ADVICE, WEB TOOLS, SAFETY INFORMATION, AND OTHER RESOURCES “AS IS”  
AND WITH ALL FAULTS, AND DISCLAIMS ALL WARRANTIES, EXPRESS AND IMPLIED, INCLUDING WITHOUT LIMITATION ANY  
IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE OR NON-INFRINGEMENT OF THIRD  
PARTY INTELLECTUAL PROPERTY RIGHTS.  
These resources are intended for skilled developers designing with TI products. You are solely responsible for (1) selecting the appropriate  
TI products for your application, (2) designing, validating and testing your application, and (3) ensuring your application meets applicable  
standards, and any other safety, security, or other requirements. These resources are subject to change without notice. TI grants you  
permission to use these resources only for development of an application that uses the TI products described in the resource. Other  
reproduction and display of these resources is prohibited. No license is granted to any other TI intellectual property right or to any third party  
intellectual property right. TI disclaims responsibility for, and you will fully indemnify TI and its representatives against, any claims, damages,  
costs, losses, and liabilities arising out of your use of these resources.  
TI’s products are provided subject to TI’s Terms of Sale (https:www.ti.com/legal/termsofsale.html) or other applicable terms available either  
on ti.com or provided in conjunction with such TI products. TI’s provision of these resources does not expand or otherwise alter TI’s  
applicable warranties or warranty disclaimers for TI products.IMPORTANT NOTICE  
Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265  
Copyright © 2021, Texas Instruments Incorporated  

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