OPA857TD1 [TI]

低噪声、宽带、可选增益、跨阻放大器 | TD | 0 | -40 to 85;
OPA857TD1
型号: OPA857TD1
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

低噪声、宽带、可选增益、跨阻放大器 | TD | 0 | -40 to 85

放大器
文件: 总6页 (文件大小:242K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
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OPA857-DIE  
ZHCSFE9 AUGUST 2016  
OPA857-DIE  
超低噪声、宽频带、可选反馈电阻互阻抗放大器  
1 特性  
2 应用  
1
内部中级基准电压  
光二极管监控  
高速 I/V 转换  
光学放大器  
伪差分输出电压  
宽动态范围  
闭环互阻抗带宽:  
计算机轴向断层 (CAT) 扫描仪前端  
125MHz5kΩ 互阻抗增益,1.5pF 外部寄生电  
容)  
3 说明  
OPA857-DIE 是一款针对光二极管监控应用的宽频  
带、快速过驱恢复、快速稳定、超低噪声互感抗 放大  
器。借助于可选反馈电阻,OPA857-DIE 简化了高性  
能光系统的设计。极快速过载恢复时间和内部输入保护  
提供了最佳组合,以便在最大限度地减少恢复时间的同  
时,保护信号链的剩余部分。两个可选的互阻抗增益配  
置可实现当代互阻抗放大器应用所需要的高动态范围和  
灵活性。  
105MHz20kΩ 互阻抗增益,1.5pF 外部寄生  
电容)  
输入引入的电流噪声非常低(Brickwall 滤波器 BW  
= 135MHz):  
15 nARMS20kΩ 互阻抗)  
超短过载恢复时间:< 25ns  
内部输入保护二极管  
电源:  
电压:2.7V 3.6V  
电流:23.4mA  
此器件可在 -40°C +85°C 的整个工业级温度范围内  
额定运行。  
扩展温度范围:-40°C +85°C  
Ordering Information(1)  
PACKAGE  
PRODUCT  
PACKAGE  
ORDERABLE PART NUMBER  
PACKAGE QUANTITY  
DESIGNATOR  
OPA857TD1  
OPA857TD2  
324  
10  
OPA857-DIE  
TD  
Bare die in gel pak VR(2)  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality  
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room  
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not  
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.  
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  
English Data Sheet: SBOS813  
OPA857-DIE  
ZHCSFE9 AUGUST 2016  
www.ti.com.cn  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more  
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.  
4 Bare Die Information  
BACKSIDE  
POTENTIAL  
BOND PAD  
METALLIZATION COMPOSITION  
BOND PAD  
THICKNESS  
DIE THICKNESS  
BACKSIDE FINISH  
15 mils.  
Silicon with backgrind  
GND  
TiW/AlCu (0.5%)  
1100 nm  
1
14  
13  
12  
15  
2
3
4
5
11  
10  
9
807.0  
6
7
8
0
40  
0
40  
785.0  
2
Copyright © 2016, Texas Instruments Incorporated  
OPA857-DIE  
www.ti.com.cn  
ZHCSFE9 AUGUST 2016  
Bond Pad Coordinates in Microns  
PAD  
NUMBER  
NAME  
GND  
X MIN  
15  
Y MIN  
637  
X MAX  
90  
Y MAX  
712  
DESCRIPTION  
1
Ground  
Control pin for transimpedance gain. GND, logic 0 = 5-kΩ  
internal resistance; +VS, logic 1 = 20-kΩ internal resistance.  
CTRL  
2
15  
465  
90  
540  
GND  
GND  
OUTN  
GND  
GND  
OUT  
+VS  
3
4
15  
315  
165  
15  
90  
390  
240  
90  
Ground  
15  
90  
Ground  
5
15  
90  
Common-mode voltage output reference  
6
165  
465  
615  
615  
615  
615  
615  
15  
240  
540  
690  
690  
690  
690  
690  
90  
Ground  
7
15  
90  
Ground  
8
15  
90  
Signal output  
Supply voltage  
Supply voltage  
Supply voltage  
Ground  
9
165  
315  
465  
637  
240  
390  
540  
712  
+VS  
10  
11  
12  
+VS  
GND  
Test mode enable. Connect to GND for normal operation, and  
connect to +VS to enable test mode.  
TESD_SD  
13  
493.7  
637  
568.7  
712  
TEST_IN  
IN  
14  
15  
343.7  
193.7  
637  
418.7  
268.7  
712  
Test mode input. Connect to +VS during normal operation.  
Input  
561.95  
636.95  
版权 © 2016, Texas Instruments Incorporated  
3
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IMPORTANT NOTICE  
邮寄地址: 上海市浦东新区世纪大道1568 号,中建大厦32 楼邮政编码: 200122  
Copyright © 2016, 德州仪器半导体技术(上海)有限公司  
PACKAGE OPTION ADDENDUM  
www.ti.com  
24-Apr-2019  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead/Ball Finish  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(6)  
(3)  
(4/5)  
OPA857TD1  
OPA857TD2  
ACTIVE  
0
0
324  
TBD  
TBD  
Call TI  
Call TI  
Call TI  
Call TI  
-40 to 85  
-40 to 85  
ACTIVE  
120  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
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value exceeds the maximum column width.  
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In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
重要声明和免责声明  
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Copyright © 2019 德州仪器半导体技术(上海)有限公司  

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