SN54AHC00J [TI]

QUADRUPLE 2-INPUT POSITIVE-NAND GATES; 四路2输入正与非门
SN54AHC00J
型号: SN54AHC00J
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

QUADRUPLE 2-INPUT POSITIVE-NAND GATES
四路2输入正与非门

栅极 逻辑集成电路 输入元件
文件: 总6页 (文件大小:88K)
中文:  中文翻译
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SN54AHC00, SN74AHC00  
QUADRUPLE 2-INPUT POSITIVE-NAND GATES  
SCLS227F – OCTOBER 1995 – REVISED JANUARY 2000  
SN54AHC00 . . . J OR W PACKAGE  
SN74AHC00 . . . D, DB, DGV, N, OR PW PACKAGE  
(TOP VIEW)  
EPIC (Enhanced-Performance Implanted  
CMOS) Process  
Operating Range 2-V to 5.5-V V  
CC  
Latch-Up Performance Exceeds 250 mA Per  
JESD 17  
1A  
1B  
V
CC  
1
2
3
4
5
6
7
14  
13  
12  
11  
4B  
4A  
4Y  
1Y  
ESD Protection Exceeds 2000 V Per  
MIL-STD-883, Method 3015; Exceeds 200 V  
Using Machine Model (C = 200 pF, R = 0)  
2A  
2B  
10 3B  
9
8
2Y  
3A  
3Y  
Package Options Include Plastic  
Small-Outline (D), Shrink Small-Outline  
(DB), Thin Very Small-Outline (DGV), Thin  
Shrink Small-Outline (PW), and Ceramic Flat  
(W) Packages, Ceramic Chip Carriers (FK),  
and Standard Plastic (N) and Ceramic (J)  
DIPs  
GND  
SN54AHC00 . . . FK PACKAGE  
(TOP VIEW)  
3
2
1
20 19  
18  
description  
4A  
NC  
4Y  
1Y  
NC  
2A  
4
5
6
7
8
17  
16  
The ’AHC00 devices perform the Boolean  
function Y  
logic.  
A B or Y  
A
B in positive  
15 NC  
14  
9 10 11 12 13  
NC  
2B  
3B  
The SN54AHC00 is characterized for operation  
over the full military temperature range of –55°C  
to 125°C. The SN74AHC00 is characterized for  
operation from –40°C to 85°C.  
NC – No internal connection  
FUNCTION TABLE  
(each gate)  
INPUTS  
OUTPUT  
Y
A
B
H
X
L
H
L
L
H
H
X
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
EPIC is a trademark of Texas Instruments Incorporated.  
Copyright 2000, Texas Instruments Incorporated  
On products compliant to MIL-PRF-38535, all parameters are tested  
unless otherwise noted. On all other products, production  
processing does not necessarily include testing of all parameters.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54AHC00, SN74AHC00  
QUADRUPLE 2-INPUT POSITIVE-NAND GATES  
SCLS227F – OCTOBER 1995 – REVISED JANUARY 2000  
logic symbol  
1
1A  
1B  
2A  
2B  
3A  
3B  
4A  
4B  
&
3
6
2
1Y  
2Y  
3Y  
4Y  
4
5
9
8
10  
12  
13  
11  
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.  
Pin numbers shown are for the D, DB, DGV, J, N, PW, and W packages.  
logic diagram, each gate (positive logic)  
A
B
Y
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)  
Supply voltage range, V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V  
CC  
Input voltage range, V (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V  
I
Output voltage range, V (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to V  
+ 0.5 V  
O
CC  
Input clamp current, I (V < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –20 mA  
IK  
I
Output clamp current, I  
(V < 0 or V > V ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA  
OK  
O O CC  
Continuous output current, I (V = 0 to V ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±25 mA  
Continuous current through V  
Package thermal impedance, θ (see Note 2): D package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86°C/W  
O
O
CC  
CC  
or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA  
JA  
DB package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96°C/W  
DGV package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127°C/W  
N package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80°C/W  
PW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 113°C/W  
Storage temperature range, T  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C  
stg  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.  
2. The package thermal impedance is calculated in accordance with JESD 51.  
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54AHC00, SN74AHC00  
QUADRUPLE 2-INPUT POSITIVE-NAND GATES  
SCLS227F – OCTOBER 1995 – REVISED JANUARY 2000  
recommended operating conditions (see Note 3)  
SN54AHC00  
SN74AHC00  
UNIT  
MIN  
2
MAX  
MIN  
2
MAX  
V
V
Supply voltage  
5.5  
5.5  
V
CC  
V
V
V
V
V
V
= 2 V  
1.5  
2.1  
3.85  
1.5  
2.1  
3.85  
CC  
CC  
CC  
CC  
CC  
CC  
High-level input voltage  
= 3 V  
V
V
IH  
= 5.5 V  
= 2 V  
0.5  
0.9  
0.5  
0.9  
V
IL  
Low-level input voltage  
= 3 V  
= 5.5 V  
1.65  
5.5  
1.65  
5.5  
V
V
Input voltage  
0
0
0
0
V
V
A
I
Output voltage  
V
V
CC  
O
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
= 2 V  
–50  
–4  
–8  
50  
4
–50  
–4  
–8  
50  
4
I
High-level output current  
Low-level output current  
= 3.3 V ± 0.3 V  
= 5 V ± 0.5 V  
= 2 V  
OH  
OL  
mA  
A
I
= 3.3 V ± 0.3 V  
= 5 V ± 0.5 V  
= 3.3 V ± 0.3 V  
= 5 V ± 0.5 V  
mA  
8
8
100  
20  
125  
100  
20  
85  
t/v  
Input transition rise or fall rate  
Operating free-air temperature  
ns/V  
T
A
–55  
–40  
°C  
NOTE 3: All unused inputs of the device must be held at V  
or GND to ensure proper device operation. Refer to the TI application report,  
CC  
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.  
electrical characteristics over recommended operating free-air temperature range (unless  
otherwise noted)  
T
A
= 25°C  
TYP  
2
SN54AHC00  
SN74AHC00  
PARAMETER  
TEST CONDITIONS  
V
UNIT  
CC  
MIN  
1.9  
MAX  
MIN  
1.9  
MAX  
MIN  
1.9  
MAX  
2 V  
3 V  
I
= –50  
A
2.9  
3
2.9  
2.9  
OH  
V
4.5 V  
3 V  
4.4  
4.5  
4.4  
4.4  
V
OH  
OL  
I
I
= –4 mA  
2.58  
3.94  
2.48  
3.8  
2.48  
3.8  
OH  
= –8 mA  
4.5 V  
2 V  
OH  
0.1  
0.1  
0.1  
0.1  
0.1  
0.5  
0.5  
±1*  
20  
0.1  
0.1  
0.1  
0.44  
0.44  
±1  
I
= 50  
A
3 V  
OL  
V
4.5 V  
3 V  
0.1  
V
I
I
= 4 mA  
= 8 mA  
0.36  
0.36  
±0.1  
2
OL  
4.5 V  
0 V to 5.5 V  
5.5 V  
5 V  
OL  
I
I
V = V  
or GND  
or GND,  
or GND  
A
A
I
I
CC  
CC  
CC  
V = V  
I = 0  
O
20  
CC  
I
C
V = V  
2
10  
10  
pF  
i
I
* On products compliant to MIL-PRF-38535, this parameter is not production tested at V  
CC  
= 0 V.  
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54AHC00, SN74AHC00  
QUADRUPLE 2-INPUT POSITIVE-NAND GATES  
SCLS227F – OCTOBER 1995 – REVISED JANUARY 2000  
switching characteristics over recommended operating free-air temperature range,  
V
= 3.3 V ± 0.3 V (unless otherwise noted) (see Figure 1)  
CC  
T
A
= 25°C  
TYP  
5.5*  
5.5*  
8
SN54AHC00  
SN74AHC00  
FROM  
(INPUT)  
TO  
(OUTPUT)  
LOAD  
CAPACITANCE  
PARAMETER  
UNIT  
ns  
MIN  
MAX  
7.9*  
7.9*  
11.4  
11.4  
MIN  
1*  
1*  
1
MAX  
9.5*  
9.5*  
13  
MIN  
1
MAX  
9.5  
9.5  
13  
t
t
t
t
PLH  
PHL  
PLH  
PHL  
A or B  
A or B  
Y
Y
C
C
= 15 pF  
= 50 pF  
L
L
1
1
ns  
8
1
13  
1
13  
* On products compliant to MIL-PRF-38535, this parameter is not production tested.  
switching characteristics over recommended operating free-air temperature range,  
V
= 5 V ± 0.5 V (unless otherwise noted) (see Figure 1)  
CC  
T
A
= 25°C  
TYP  
3.7*  
3.7*  
5.2  
SN54AHC00  
SN74AHC00  
FROM  
(INPUT)  
TO  
(OUTPUT)  
LOAD  
CAPACITANCE  
PARAMETER  
UNIT  
ns  
MIN  
MAX  
5.5*  
5.5*  
7.5  
MIN  
1*  
1*  
1
MAX  
6.5*  
6.5*  
8.5  
MIN  
1
MAX  
6.5  
t
t
t
t
PLH  
PHL  
PLH  
PHL  
A or B  
A or B  
Y
Y
C
C
= 15 pF  
= 50 pF  
L
L
1
6.5  
1
8.5  
ns  
5.2  
7.5  
1
8.5  
1
8.5  
* On products compliant to MIL-PRF-38535, this parameter is not production tested.  
noise characteristics, V  
= 5 V, C = 50 pF, T = 25°C (see Note 4)  
CC  
L
A
SN74AHC00  
PARAMETER  
UNIT  
MIN  
TYP  
0.3  
MAX  
0.8  
V
V
V
V
V
Quiet output, maximum dynamic V  
V
V
V
V
V
OL(P)  
OL(V)  
OH(V)  
IH(D)  
IL(D)  
OL  
Quiet output, minimum dynamic V  
Quiet output, minimum dynamic V  
High-level dynamic input voltage  
Low-level dynamic input voltage  
–0.3  
4.6  
–0.8  
OL  
OH  
3.5  
1.5  
NOTE 4: Characteristics are for surface-mount packages only.  
operating characteristics, V  
= 5 V, T = 25°C  
A
CC  
PARAMETER  
TEST CONDITIONS  
No load, f = 1 MHz  
TYP  
UNIT  
C
Power dissipation capacitance  
9.5  
pF  
pd  
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54AHC00, SN74AHC00  
QUADRUPLE 2-INPUT POSITIVE-NAND GATES  
SCLS227F – OCTOBER 1995 – REVISED JANUARY 2000  
PARAMETER MEASUREMENT INFORMATION  
V
CC  
Open  
GND  
S1  
R
= 1 kΩ  
L
TEST  
S1  
From Output  
Under Test  
Test  
Point  
From Output  
Under Test  
t
t
/t  
Open  
PLH PHL  
/t  
C
C
L
t
V
CC  
L
PLZ PZL  
/t  
(see Note A)  
(see Note A)  
GND  
PHZ PZH  
Open Drain  
V
CC  
LOAD CIRCUIT FOR  
LOAD CIRCUIT FOR  
TOTEM-POLE OUTPUTS  
3-STATE AND OPEN-DRAIN OUTPUTS  
V
CC  
50% V  
CC  
Timing Input  
0 V  
t
w
t
h
t
su  
V
CC  
V
CC  
50% V  
50% V  
CC  
Input  
CC  
50% V  
50% V  
CC  
Data Input  
CC  
0 V  
0 V  
VOLTAGE WAVEFORMS  
PULSE DURATION  
VOLTAGE WAVEFORMS  
SETUP AND HOLD TIMES  
V
V
CC  
CC  
Output  
Control  
50% V  
50% V  
50% V  
50% V  
t
Input  
CC  
CC  
CC  
CC  
0 V  
0 V  
t
PZL  
t
t
t
PLZ  
PLH  
PHL  
Output  
Waveform 1  
V
OH  
V  
CC  
In-Phase  
Output  
50% V  
50% V  
CC  
50% V  
CC  
CC  
V
S1 at V  
(see Note B)  
V
OL  
+ 0.3 V  
CC  
V
OL  
OL  
t
t
t
PHL  
PLH  
PZH  
PHZ  
Output  
Waveform 2  
S1 at GND  
V
V
OH  
OH  
Out-of-Phase  
Output  
V
OH  
– 0.3 V  
50% V  
50% V  
50% V  
CC  
CC  
CC  
V
0 V  
(see Note B)  
OL  
VOLTAGE WAVEFORMS  
PROPAGATION DELAY TIMES  
INVERTING AND NONINVERTING OUTPUTS  
VOLTAGE WAVEFORMS  
ENABLE AND DISABLE TIMES  
LOW- AND HIGH-LEVEL ENABLING  
NOTES: A. includes probe and jig capacitance.  
C
L
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.  
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.  
C. All input pulses are supplied by generators having the following characteristics: PRR 1 MHz, Z = 50 , t 3 ns, t 3 ns.  
O
r
f
D. The outputs are measured one at a time with one input transition per measurement.  
Figure 1. Load Circuit and Voltage Waveforms  
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL  
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR  
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER  
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO  
BE FULLY AT THE CUSTOMER’S RISK.  
In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other  
intellectual property right of TI covering or relating to any combination, machine, or process in which such  
semiconductor products or services might be or are used. TI’s publication of information regarding any third  
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.  
Copyright 2000, Texas Instruments Incorporated  

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