SN54HC373-SP [TI]

OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS;
SN54HC373-SP
型号: SN54HC373-SP
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS

输出元件
文件: 总7页 (文件大小:109K)
中文:  中文翻译
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SN54HC373, SN74HC373  
OCTAL TRANSPARENT D-TYPE LATCHES  
WITH 3-STATE OUTPUTS  
SCLS140B – DECEMBER 1982 – REVISED MAY 1997  
SN54HC373 . . . J OR W PACKAGE  
SN74HC373 . . . DB, DW, N, OR PW PACKAGE  
(TOP VIEW)  
Eight High-Current Latches in a Single  
Package  
High-Current 3-State True Outputs Can  
Drive up to 15 LSTTL Loads  
OE  
1Q  
1D  
2D  
2Q  
3Q  
3D  
4D  
4Q  
V
CC  
8Q  
8D  
1
2
3
4
5
6
7
8
9
20  
19  
18  
Full Parallel Access for Loading  
Package Options Include Plastic  
17 7D  
16 7Q  
15 6Q  
14 6D  
Small-Outline (DW), Shrink Small-Outline  
(DB), Thin Shrink Small-Outline (PW), and  
Ceramic Flat (W) Packages, Ceramic Chip  
Carriers (FK), and Standard Plastic (N) and  
Ceramic (J) 300-mil DIPs  
13  
5D  
12 5Q  
11 LE  
description  
GND 10  
These 8-bit latches feature 3-state outputs  
designed specifically for driving highly capacitive  
or relatively low-impedance loads. They are  
particularly suitable for implementing buffer  
registers, I/O ports, bidirectional bus drivers, and  
working registers.  
SN54HC373 . . . FK PACKAGE  
(TOP VIEW)  
3
2
1
20 19  
18  
8D  
7D  
7Q  
2D  
2Q  
3Q  
3D  
4D  
4
5
6
7
8
The eight latches of the ’HC373 are transparent  
D-type latches. While the latch-enable (LE) input  
is high, the Q outputs follow the data (D) inputs.  
When LE is taken low, the Q outputs are latched  
at the levels that were set up at the D inputs.  
17  
16  
15 6Q  
14  
9 10 11 12 13  
6D  
An output-enable (OE) input places the eight  
outputs in either a normal logic state (high or low  
logic levels) or the high-impedance state. In the  
high-impedance state, the outputs neither load  
nor drive the bus lines significantly. The  
high-impedance state and increased drive  
provide the capability to drive bus lines without  
interface or pullup components.  
OE does not affect the internal operations of the latches. Old data can be retained or new data can be entered  
while the outputs are off.  
The SN54HC373 is characterized for operation over the full military temperature range of –55°C to 125°C. The  
SN74HC373 is characterized for operation from –40°C to 85°C.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Copyright 1997, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54HC373, SN74HC373  
OCTAL TRANSPARENT D-TYPE LATCHES  
WITH 3-STATE OUTPUTS  
SCLS140B – DECEMBER 1982 – REVISED MAY 1997  
FUNCTION TABLE  
(each latch)  
INPUTS  
OUTPUT  
Q
OE  
L
LE  
H
H
L
D
H
L
H
L
L
L
X
X
Q
0
H
X
Z
logic symbol  
1
EN  
OE  
LE  
11  
C1  
3
2
5
1D  
2D  
3D  
4D  
5D  
6D  
1D  
1Q  
2Q  
3Q  
4Q  
5Q  
6Q  
4
7
6
8
9
13  
14  
12  
15  
17  
18  
16  
19  
7D  
8D  
7Q  
8Q  
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.  
logic diagram (positive logic)  
1
OE  
11  
LE  
C1  
1D  
2
1Q  
3
1D  
To Seven Other Channels  
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54HC373, SN74HC373  
OCTAL TRANSPARENT D-TYPE LATCHES  
WITH 3-STATE OUTPUTS  
SCLS140B – DECEMBER 1982 – REVISED MAY 1997  
absolute maximum ratings over operating free-air temperature range  
Supply voltage range, V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V  
CC  
I
Input clamp current, I (V < 0 or V > V ) (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA  
IK  
I
CC  
Output clamp current, I  
(V < 0 or V > V ) (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA  
OK  
O O CC  
Continuous output current, I (V = 0 to V ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±35 mA  
Continuous current through V  
Package thermal impedance, θ (see Note 2): DB package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115°C/W  
O
O
CC  
CC  
or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±70 mA  
JA  
DW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97°C/W  
N package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67°C/W  
PW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128°C/W  
Storage temperature range, T  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C  
stg  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.  
2. The package thermal impedance is calculated in accordance with JESD 51, except for through-hole packages, which use a trace  
length of zero.  
recommended operating conditions  
SN54HC373  
MIN NOM  
SN74HC373  
MIN NOM  
UNIT  
MAX  
MAX  
V
V
Supply voltage  
2
1.5  
3.15  
4.2  
0
5
6
2
1.5  
3.15  
4.2  
0
5
6
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
= 2 V  
High-level input voltage  
= 4.5 V  
= 6 V  
V
V
IH  
= 2 V  
0.5  
1.35  
1.8  
0.5  
1.35  
1.8  
V
IL  
Low-level input voltage  
= 4.5 V  
= 6 V  
0
0
0
0
V
V
Input voltage  
0
V
V
0
V
V
V
V
I
CC  
CC  
Output voltage  
0
0
O
CC  
CC  
V
CC  
V
CC  
V
CC  
= 2 V  
0
1000  
500  
400  
125  
0
1000  
500  
400  
85  
t
Input transition (rise and fall) time  
Operating free-air temperature  
= 4.5 V  
= 6 V  
0
0
ns  
t
0
0
T
–55  
–40  
°C  
A
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54HC373, SN74HC373  
OCTAL TRANSPARENT D-TYPE LATCHES  
WITH 3-STATE OUTPUTS  
SCLS140B – DECEMBER 1982 – REVISED MAY 1997  
electrical characteristics over recommended operating free-air temperature range (unless  
otherwise noted)  
T
= 25°C  
SN54HC373  
SN74HC373  
A
PARAMETER  
TEST CONDITIONS  
V
UNIT  
CC  
MIN  
TYP  
MAX  
MIN  
1.9  
4.4  
5.9  
3.7  
5.2  
MAX  
MIN  
1.9  
MAX  
2 V  
4.5 V  
6 V  
1.9 1.998  
4.4 4.499  
5.9 5.999  
I
= –20 µA  
4.4  
OH  
V
V = V or V  
IH  
5.9  
V
OH  
OL  
I
IL  
IL  
I
I
= –6 mA  
4.5 V  
6 V  
3.98  
5.48  
4.3  
5.8  
3.84  
5.34  
OH  
= –7.8 mA  
OH  
2 V  
0.002  
0.001  
0.001  
0.17  
0.1  
0.1  
0.1  
0.1  
0.1  
0.1  
I
= 20 µA  
4.5 V  
6 V  
OL  
V
V = V or V  
0.1  
0.1  
0.1  
V
I
IH  
I
I
= 6 mA  
4.5 V  
6 V  
0.26  
0.26  
±100  
±0.5  
8
0.4  
0.33  
0.33  
±1000  
±5  
OL  
= 7.8 mA  
0.15  
0.4  
OL  
I
I
I
V = V  
I
or 0  
6 V  
±0.1  
±1000  
±10  
160  
10  
nA  
µA  
µA  
pF  
I
CC  
CC  
V
O
= V  
or 0  
6 V  
±0.01  
OZ  
CC  
CC  
V = V  
I
or 0,  
I
O
= 0  
6 V  
80  
C
2 V to 6 V  
3
10  
10  
i
timing requirements over recommended operating free-air temperature range (unless otherwise  
noted)  
T
= 25°C  
SN54HC373  
SN74HC373  
A
V
UNIT  
CC  
MIN  
80  
16  
14  
50  
10  
9
MAX  
MIN  
120  
24  
MAX  
MIN  
100  
20  
MAX  
2 V  
4.5 V  
6 V  
t
w
t
su  
t
h
Pulse duration, LE high  
Setup time, data before LE↓  
Hold time, data after LE↓  
ns  
20  
17  
2 V  
75  
63  
4.5 V  
6 V  
15  
13  
ns  
ns  
13  
11  
2 V  
20  
10  
10  
26  
24  
4.5 V  
6 V  
13  
12  
13  
12  
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54HC373, SN74HC373  
OCTAL TRANSPARENT D-TYPE LATCHES  
WITH 3-STATE OUTPUTS  
SCLS140B – DECEMBER 1982 – REVISED MAY 1997  
switching characteristics over recommended operating free-air temperature range, C = 50 pF  
L
(unless otherwise noted) (see Figure 1)  
T
A
= 25°C  
TYP  
58  
15  
13  
73  
18  
15  
65  
17  
14  
50  
15  
13  
28  
8
SN54HC373  
SN74HC373  
FROM  
(INPUT)  
TO  
(OUTPUT)  
PARAMETER  
V
UNIT  
CC  
MIN  
MAX  
150  
30  
MIN  
MAX  
225  
45  
MIN  
MAX  
190  
38  
2 V  
4.5 V  
6 V  
D
Q
26  
38  
32  
t
pd  
ns  
2 V  
175  
35  
265  
53  
220  
44  
LE  
OE  
OE  
Any Q  
Any Q  
Any Q  
Any Q  
4.5 V  
6 V  
30  
45  
38  
2 V  
150  
30  
225  
45  
190  
38  
t
t
t
4.5 V  
6 V  
ns  
ns  
ns  
en  
dis  
t
26  
38  
32  
2 V  
150  
30  
225  
45  
190  
38  
4.5 V  
6 V  
26  
38  
32  
2 V  
60  
90  
75  
4.5 V  
6 V  
12  
18  
15  
6
10  
15  
13  
switching characteristics over recommended operating free-air temperature range, C = 150 pF  
L
(unless otherwise noted) (see Figure 1)  
T
A
= 25°C  
TYP  
82  
SN54HC373  
SN74HC373  
FROM  
(INPUT)  
TO  
(OUTPUT)  
PARAMETER  
V
UNIT  
CC  
MIN  
MAX  
200  
40  
MIN  
MAX  
300  
60  
MIN  
MAX  
250  
50  
2 V  
4.5 V  
6 V  
D
Q
22  
19  
34  
51  
43  
t
pd  
ns  
2 V  
100  
24  
225  
45  
335  
67  
285  
57  
LE  
OE  
Any Q  
Any Q  
Any Q  
4.5 V  
6 V  
20  
38  
57  
48  
2 V  
90  
200  
40  
300  
60  
250  
50  
t
t
4.5 V  
6 V  
23  
ns  
ns  
en  
19  
34  
51  
43  
2 V  
45  
210  
42  
315  
63  
265  
53  
4.5 V  
6 V  
17  
t
13  
36  
53  
45  
operating characteristics, T = 25°C  
A
PARAMETER  
Power dissipation capacitance per latch  
TEST CONDITIONS  
TYP  
UNIT  
C
No load  
100  
pF  
pd  
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54HC373, SN74HC373  
OCTAL TRANSPARENT D-TYPE LATCHES  
WITH 3-STATE OUTPUTS  
SCLS140B – DECEMBER 1982 – REVISED MAY 1997  
PARAMETER MEASUREMENT INFORMATION  
V
CC  
PARAMETER  
R
C
L
S1  
S2  
L
50 pF  
or  
150 pF  
t
Open  
Closed  
Closed  
Open  
S1  
S2  
PZH  
Test  
Point  
t
t
1 kΩ  
1 kΩ  
en  
R
t
L
PZL  
From Output  
Under Test  
t
t
Open  
Closed  
Open  
PHZ  
PLZ  
50 pF  
C
dis  
L
Closed  
(see Note A)  
50 pF  
or  
150 pF  
t
or t  
––  
Open  
Open  
pd  
t
LOAD CIRCUIT  
V
CC  
Reference  
Input  
50%  
V
CC  
0 V  
High-Level  
Pulse  
50%  
50%  
t
t
h
su  
0 V  
V
CC  
t
Data  
Input  
w
90%  
90%  
50%  
10%  
50%  
10%  
V
CC  
Low-Level  
Pulse  
0 V  
50%  
50%  
t
t
f
r
0 V  
VOLTAGE WAVEFORMS  
SETUP AND HOLD AND INPUT RISE AND FALL TIMES  
VOLTAGE WAVEFORMS  
PULSE DURATIONS  
Output  
V
CC  
V
CC  
Control  
(Low-Level  
Enabling)  
Input  
50%  
50%  
50%  
50%  
0 V  
0 V  
t
t
PLH  
PHL  
90%  
t
t
PLZ  
PZL  
V
V
OH  
V  
CC  
50%  
V  
CC  
Output  
Waveform 1  
(See Note B)  
In-Phase  
Output  
90%  
t
50%  
10%  
50%  
10%  
10%  
90%  
OL  
V
OL  
t
r
f
t
t
t
PZH  
PHL  
90%  
PLH  
V
V
OH  
V
Output  
Waveform 2  
(See Note B)  
OH  
90%  
t
Out-of-  
Phase  
Output  
50%  
10%  
50%  
10%  
50%  
0 V  
OL  
t
t
PHZ  
f
r
VOLTAGE WAVEFORMS  
ENABLE AND DISABLE TIMES FOR 3-STATE OUTPUTS  
VOLTAGE WAVEFORMS  
PROPAGATION DELAY AND OUTPUT TRANSITION TIMES  
NOTES: A.  
C includes probe and test-fixture capacitance.  
L
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.  
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.  
C. Phase relationships between waveforms were chosen arbitrarily. All input pulses are supplied by generators having the following  
characteristics: PRR 1 MHz, Z = 50 , t = 6 ns, t = 6 ns.  
O
r
f
D. The outputs are measured one at a time with one input transition per measurement.  
E.  
F.  
G.  
t
t
t
and t  
and t  
and t  
are the same as t  
are the same as t  
are the same as t  
.
dis  
en  
.
pd  
PLZ  
PZL  
PLH  
PHZ  
PZH  
PHL  
.
Figure 1. Load Circuit and Voltage Waveforms  
6
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL  
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR  
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER  
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO  
BE FULLY AT THE CUSTOMER’S RISK.  
In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other  
intellectual property right of TI covering or relating to any combination, machine, or process in which such  
semiconductor products or services might be or are used. TI’s publication of information regarding any third  
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.  
Copyright 1998, Texas Instruments Incorporated  

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