SN74ABT16241ADL [TI]
16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS; 16位缓冲器/驱动器,具有三态输出型号: | SN74ABT16241ADL |
厂家: | TEXAS INSTRUMENTS |
描述: | 16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
文件: | 总7页 (文件大小:109K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
SN54ABT16241A, SN74ABT16241A
16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS096G – FEBRUARY 1991 – REVISED OCTOBER 1998
SN54ABT16241A . . . WD PACKAGE
SN74ABT16241A . . . DGG, DGV, OR DL PACKAGE
(TOP VIEW)
Members of the Texas Instruments
Widebus Family
State-of-the-Art EPIC-ΙΙB BiCMOS Design
Significantly Reduces Power Dissipation
1
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
1OE
1Y1
1Y2
GND
1Y3
1Y4
2OE
1A1
1A2
GND
1A3
1A4
Typical V
(Output Ground Bounce) < 1 V
2
OLP
at V
= 5 V, T = 25°C
3
CC
A
4
Distributed V
Minimizes High-Speed Switching Noise
and GND Pin Configuration
CC
5
6
Flow-Through Architecture Optimizes PCB
Layout
7
V
V
CC
CC
8
2Y1
2Y2
GND
2Y3
2Y4
3Y1
3Y2
GND
3Y3
3Y4
2A1
2A2
GND
2A3
2A4
3A1
3A2
GND
3A3
3A4
High-Drive Outputs (–32-mA I , 64-mA I
OH
)
OL
9
Latch-Up Performance Exceeds 500 mA
Per JESD 17
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
Package Options Include Plastic 300-mil
Shrink Small-Outline (DL), Thin Shrink
Small-Outline (DGG), and Thin Very
Small-Outline (DGV) Packages and 380-mil
Fine-Pitch Ceramic Flat (WD) Package
Using 25-mil Center-to-Center Spacings
V
V
CC
CC
4Y1
4Y2
GND
4Y3
4Y4
4OE
4A1
4A2
GND
4A3
4A4
3OE
description
The ’ABT16241A devices are 16-bit buffers and
line drivers designed specifically to improve both
the performance and density of 3-state memory
address drivers, clock drivers, and bus-oriented
receivers and transmitters.
These devices can be used as four 4-bit buffers, two 8-bit buffers, or one 16-bit buffer. These devices provide
true outputs and complementary output-enable (OE and OE) inputs.
To ensure the high-impedance state during power up or power down, OE should be tied to V through a pullup
CC
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver. OE
should be tied to GND through a pulldown resistor; the minimum value of the resistor is determined by the
current-sourcing capability of the driver.
The SN54ABT16241A is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74ABT16241A is characterized for operation from –40°C to 85°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.
Copyright 1998, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ABT16241A, SN74ABT16241A
16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS096G – FEBRUARY 1991 – REVISED OCTOBER 1998
FUNCTION TABLES
INPUTS
OUTPUTS
1Y, 4Y
1OE, 4OE 1A, 4A
L
L
H
L
H
L
H
X
Z
INPUTS
2OE, 3OE 2A, 3A
OUTPUTS
2Y, 3Y
H
H
L
H
L
H
L
X
Z
†
logic symbol
1
1OE
EN1
EN2
EN3
48
2OE
25
3OE
24
EN4
4OE
47
1A1
46
2
3
1Y1
1Y2
1Y3
1Y4
2Y1
2Y2
2Y3
2Y4
3Y1
3Y2
3Y3
3Y4
4Y1
4Y2
4Y3
4Y4
1
1
1
1
1
2
3
4
1A2
44
5
1A3
43
6
1A4
41
8
2A1
40
9
2A2
38
11
12
13
14
16
17
19
20
22
23
2A3
37
2A4
36
3A1
35
3A2
33
3A3
32
3A4
30
4A1
29
4A2
27
4A3
26
4A4
†
ThissymbolisinaccordancewithANSI/IEEEStd91-1984andIECPublication617-12.
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ABT16241A, SN74ABT16241A
16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS096G – FEBRUARY 1991 – REVISED OCTOBER 1998
logic diagram (positive logic)
1
25
36
1OE
3OE
3A1
47
2
3
5
6
13
1A1
1Y1
1Y2
1Y3
1Y4
3Y1
46
35
33
32
14
1A2
3A2
3A3
3A4
3Y2
44
16
1A3
3Y3
43
17
1A4
3Y4
48
24
30
2OE
4OE
4A1
41
8
9
19
2A1
2Y1
2Y2
2Y3
2Y4
4Y1
40
29
27
26
20
2A2
4A2
4A3
4A4
4Y2
38
11
12
22
2A3
4Y3
37
23
2A4
4Y4
†
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
CC
Input voltage range, V (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
I
Voltage range applied to any output in the high or power-off state, V
. . . . . . . . . . . . . . . . . . . –0.5 V to 5.5 V
O
Current into any output in the low state, I : SN54ABT16241A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96 mA
O
SN74ABT16241A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128 mA
Input clamp current, I (V < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –18 mA
IK
OK
I
Output clamp current, I
(V < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –50 mA
O
Package thermal impedance, θ (see Note 2): DGG package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89°C/W
JA
DGV package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93°C/W
DL package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94°C/W
Storage temperature range, T
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
stg
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
3
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ABT16241A, SN74ABT16241A
16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS096G – FEBRUARY 1991 – REVISED OCTOBER 1998
recommended operating conditions (see Note 3)
SN54ABT16241A SN74ABT16241A
UNIT
MIN
4.5
2
MAX
MIN
4.5
2
MAX
V
V
V
V
Supply voltage
5.5
5.5
V
V
CC
High-level input voltage
Low-level input voltage
Input voltage
IH
0.8
0.8
V
IL
0
V
0
V
CC
V
I
CC
I
I
High-level output current
Low-level output current
Input transition rise or fall rate
Operating free-air temperature
–24
48
–32
64
mA
mA
ns/V
°C
OH
OL
∆t/∆v
Outputs enabled
10
10
T
–55
125
–40
85
A
NOTE 3: All unused inputs of the device must be held at V
or GND to ensure proper device operation. Refer to the TI application report,
CC
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
T
= 25°C
SN54ABT16241A SN74ABT16241A
A
PARAMETER
TEST CONDITIONS
UNIT
†
MIN TYP
MAX
MIN
MAX
MIN
MAX
V
V
V
V
= 4.5 V,
= 4.5 V,
= 5 V,
I = –18 mA
–1.2
–1.2
–1.2
V
IK
CC
CC
CC
I
I
I
I
I
I
I
= –3 mA
= –3 mA
= –24 mA
= –32 mA
= 48 mA
= 64 mA
2.5
3
2.5
3
2.5
3
OH
OH
OH
OH
OL
OL
V
OH
V
2
2
V
= 4.5 V
= 4.5 V
CC
CC
2*
2
0.55
0.55
V
V
V
V
OL
0.55*
0.55
100
mV
µA
µA
µA
µA
hys
I
I
I
I
V
V
V
V
= 5.5 V,
= 5.5 V,
= 5.5 V,
= 0,
V = V or GND
I CC
±1
10
±1
10
±1
10
I
CC
CC
CC
CC
CC
V
O
V
O
= 2.7 V
= 0.5 V
OZH
OZL
off
–10
±100
–10
–10
±100
V or V ≤ 4.5 V
I
O
V
V
= 5.5 V,
= 5.5 V
I
Outputs high
= 2.5 V
50
50
50
µA
CEX
O
‡
I
O
V
CC
= 5.5 V,
V
O
–50
–100
–180
3
–50
–180
3
–50
–180
3
mA
Outputs high
Outputs low
V
I
= 5.5 V,
= 0,
CC
O
I
34
3
34
3
34
3
mA
mA
CC
V = V
I
or GND
CC
Outputs disabled
V
CC
= 5.5 V,
Outputs enabled
Outputs disabled
1
0.05
1.5
1.5
1
1
0.05
1.5
Data
inputs
One input at 3.4 V,
Other inputs at
§
∆I
CC
V
CC
or GND
Control
inputs
V
CC
= 5.5 V, One input at 3.4 V,
or GND
1.5
Other inputs at V
CC
C
C
V = 2.5 V or 0.5 V
3.5
7.5
pF
pF
i
I
V
O
= 2.5 V or 0.5 V
o
* On products compliant to MIL-PRF-38535, this parameter does not apply.
†
‡
§
All typical values are at V
= 5 V.
CC
Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
This is the increase in supply current for each input that is at the specified TTL voltage level rather than V
or GND.
CC
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ABT16241A, SN74ABT16241A
16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS096G – FEBRUARY 1991 – REVISED OCTOBER 1998
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature, C = 50 pF (unless otherwise noted) (see Figure 1)
L
SN54ABT16241A
= 5 V,
FROM
(INPUT)
TO
(OUTPUT)
V
CC
A
PARAMETER
UNIT
T
= 25°C
TYP
2.7
MIN
MAX
MIN
0.9
0.9
1.2
1.3
1.5
1.7
MAX
3.4
3.9
4.2
5.9
5.5
5.1
t
t
t
t
t
t
0.9
0.9
1.2
1.3
1.5
1.7
3.8
4.6
5.1
7
PLH
PHL
PZH
PZL
PHZ
PLZ
A
Y
Y
Y
ns
ns
ns
2.7
3.3
OE or OE
OE or OE
3.4
4.1
7
3.6
5.7
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature, C = 50 pF (unless otherwise noted) (see Figure 1)
L
SN74ABT16241A
= 5 V,
FROM
(INPUT)
TO
(OUTPUT)
V
CC
A
PARAMETER
UNIT
T
= 25°C
TYP
2.7
MIN
MAX
MIN
1
MAX
3.4
3.9
4.2
5.9
5.2
5.1
t
t
t
t
t
t
1
1
3.7
4.5
5
PLH
PHL
PZH
PZL
PHZ
PLZ
A
Y
Y
Y
ns
ns
ns
1
2.7
1.2
1.3
1.5
1.7
3.3
1.2
1.3
1.5
1.7
OE or OE
OE or OE
3.4
6.9
6.2
5.6
4.1
3.6
5
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ABT16241A, SN74ABT16241A
16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS096G – FEBRUARY 1991 – REVISED OCTOBER 1998
PARAMETER MEASUREMENT INFORMATION
7 V
Open
TEST
/t
S1
S1
500 Ω
From Output
Under Test
t
Open
7 V
PLH PHL
GND
t
/t
PLZ PZL
C
= 50 pF
t
/t
Open
L
PHZ PZH
500 Ω
(see Note A)
3 V
0 V
LOAD CIRCUIT
Timing Input
Data Input
1.5 V
t
w
t
t
h
su
3 V
0 V
3 V
0 V
Input
1.5 V
1.5 V
1.5 V
1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
3 V
0 V
3 V
0 V
Output
Control
1.5 V
1.5 V
1.5 V
1.5 V
Input
t
PZL
t
t
t
PHL
PLH
t
PLZ
Output
Waveform 1
S1 at 7 V
3.5 V
V
V
OH
1.5 V
1.5 V
1.5 V
1.5 V
Output
V
V
+ 0.3 V
OL
V
OL
OL
(see Note B)
t
PHZ
t
PHL
PLH
t
PZH
Output
Waveform 2
S1 at Open
(see Note B)
V
OH
V
V
OH
– 0.3 V
OH
1.5 V
1.5 V
Output
≈ 0 V
OL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
NOTES: A. includes probe and jig capacitance.
C
L
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, Z = 50 Ω, t ≤ 2.5 ns, t ≤ 2.5 ns.
O
r
f
D. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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