SN74BCT8373NT [TI]

Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70;
SN74BCT8373NT
型号: SN74BCT8373NT
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70

锁存器 测试
文件: 总21页 (文件大小:293K)
下载:  下载PDF数据表文档文件

SN74BCT8374A

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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17 TI

SN74BCT8374A

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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12 TI

SN74BCT8374ADW

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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14 TI

SN74BCT8374ADW

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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22 TI

SN74BCT8374ADWE4

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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7 TI

SN74BCT8374ADWE4

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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20 TI

SN74BCT8374ADWG4

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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16 TI

SN74BCT8374ADWR

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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24 TI

SN74BCT8374ADWR

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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29 TI

SN74BCT8374ADWRE4

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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12 TI

SN74BCT8374ADWRE4

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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12 TI

SN74BCT8374ADWRG4

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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11 TI

SN74BCT8374ANT

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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24 TI

SN74BCT8374ANT

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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16 TI

SN74BCT8374ANTE4

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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19 TI