SN74CBT3126D [TI]

QUADRUPLE FET BUS SWITCH; 四路FET总线开关
SN74CBT3126D
型号: SN74CBT3126D
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

QUADRUPLE FET BUS SWITCH
四路FET总线开关

开关
文件: 总4页 (文件大小:66K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SN74CBT3126  
QUADRUPLE FET BUS SWITCH  
SCDS020E – MAY 1995 – REVISED MAY 1998  
D, DGV, OR PW PACKAGE  
(TOP VIEW)  
Standard ’126-Type Pinout (D, DGV, and PW  
Packages)  
5-Switch Connection Between Two Ports  
1OE  
1A  
1B  
2OE  
2A  
2B  
V
CC  
13 4OE  
1
2
3
4
5
6
7
14  
TTL-Compatible Input Levels  
Latch-Up Performance Exceeds 250 mA Per  
JESD 17  
12 4A  
11 4B  
10 3OE  
Package Options Include Plastic  
9
8
3A  
3B  
Small-Outline (D), Shrink Small-Outline  
(DBQ), Thin Very Small-Outline (DGV), and  
Thin Shrink Small-Outline (PW) Packages  
GND  
DBQ PACKAGE  
(TOP VIEW)  
description  
The SN74CBT3126 quadruple FET bus switch  
features independent line switches. Each switch  
is disabled when the associated output-enable  
(OE) input is low.  
V
4OE  
NC  
1OE  
1A  
1B  
2OE  
2A  
1
2
3
4
5
6
7
8
16  
15  
CC  
14 4A  
13 4B  
12 3OE  
11 3A  
The SN74CBT3126 is characterized for operation  
from –40°C to 85°C.  
10  
9
3B  
NC  
2B  
GND  
FUNCTION TABLE  
(each bus switch)  
INPUT  
FUNCTION  
OE  
NC – No internal connection  
L
Disconnect  
A = B  
H
logic diagram (positive logic)  
2
3
1A  
1B  
1
5
1OE  
2A  
6
8
2B  
3B  
4
9
2OE  
3A  
10  
12  
3OE  
4A  
11  
4B  
13  
4OE  
Pin numbers shown are for the D, DGV, and PW packages.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Copyright 1998, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN74CBT3126  
QUADRUPLE FET BUS SWITCH  
SCDS020E – MAY 1995 – REVISED MAY 1998  
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)  
Supply voltage range, V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V  
CC  
Input voltage range, V (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V  
I
Continuous channel current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128 mA  
Input clamp current, I (V < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –50 mA  
K
I/O  
Package thermal impedance, θ (see Note 2): D package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127°C/W  
JA  
DBQ package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 139°C/W  
DGV package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 182°C/W  
PW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 170°C/W  
Storage temperature range, T  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C  
stg  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.  
2. The package thermal impedance is calculated in accordance with JESD 51.  
recommended operating conditions (see Note 3)  
MIN  
4
MAX  
UNIT  
V
V
V
V
Supply voltage  
5.5  
CC  
IH  
IL  
High-level control input voltage  
Low-level control input voltage  
Operating free-air temperature  
2
V
0.8  
85  
V
T
A
–40  
°C  
NOTE 3: All unused control inputs of the device must be held at V  
or GND to ensure proper device operation. Refer to the TI application report,  
CC  
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.  
electrical characteristics over recommended operating free-air temperature range (unless  
otherwise noted)  
PARAMETER  
TEST CONDITIONS  
I = –18 mA  
MIN TYP  
MAX  
–1.2  
±1  
UNIT  
V
V
V
V
V
V
= 4 V,  
IK  
CC  
CC  
CC  
CC  
I
I
I
= 5.5 V,  
= 5.5 V,  
= 5.5 V,  
V = 5.5 V or GND  
I
µA  
µA  
mA  
pF  
I
I
O
= 0,  
V = V  
I
or GND  
3
CC  
CC  
§
I  
CC  
Control inputs  
One input at 3.4 V,  
Other inputs at V  
or GND  
2.5  
CC  
C
C
Control inputs V = 3 V or 0  
3
4
i
I
V
O
= 3 V or 0,  
OE = GND  
pF  
io(OFF)  
V
= 4 V,  
TYP at V  
= 4 V,  
V
= 2.4 V,  
I = 15 mA  
I
16  
5
22  
7
CC  
CC  
I
I = 64 mA  
I
r
V
V
= 0  
on  
I
V
CC  
= 4.5 V  
I = 30 mA  
I
5
7
= 2.4 V,  
I = 15 mA  
I
10  
15  
I
§
All typical values are at V  
= 5 V (unless otherwise noted), T = 25°C.  
A
CC  
This is the increase in supply current for each input that is at the specified TTL voltage level rather than V  
or GND.  
CC  
Measured by the voltage drop between the A and the B terminals at the indicated current through the switch. On-state resistance is determined  
by the lower of the voltages of the two (A or B) terminals.  
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN74CBT3126  
QUADRUPLE FET BUS SWITCH  
SCDS020E – MAY 1995 – REVISED MAY 1998  
switching characteristics over recommended operating free-air temperature range, C = 50 pF  
L
(unless otherwise noted) (see Figure 1)  
V
= 5 V  
CC  
± 0.5 V  
V
= 4 V  
FROM  
(INPUT)  
TO  
(OUTPUT)  
CC  
PARAMETER  
UNIT  
MIN  
MAX  
MIN  
MAX  
0.25  
5.1  
A or B  
OE  
B or A  
A or B  
A or B  
0.35  
5.4  
5
ns  
ns  
ns  
t
t
t
pd  
en  
dis  
1.6  
1
OE  
4.5  
Thepropagation delay is the calculated RC time constant of the typical on-state resistance of the switch and the specified load capacitance, when  
driven by an ideal voltage source (zero output impedance).  
PARAMETER MEASUREMENT INFORMATION  
7 V  
TEST  
S1  
S1  
Open  
GND  
500 Ω  
t
Open  
7 V  
pd  
/t  
From Output  
Under Test  
t
PLZ PZL  
t
/t  
Open  
PHZ PZH  
C
= 50 pF  
L
500 Ω  
(see Note A)  
Output  
Control  
(low-level  
enabling)  
3 V  
0 V  
1.5 V  
1.5 V  
LOAD CIRCUIT  
t
t
PZL  
t
PLZ  
Output  
Waveform 1  
S1 at 7 V  
3.5 V  
3 V  
0 V  
1.5 V  
Input  
V
OL  
+ 0.3 V  
1.5 V  
1.5 V  
(see Note B)  
V
OL  
t
PHZ  
t
t
PZH  
PLH  
PHL  
Output  
Waveform 2  
S1 at Open  
(see Note B)  
V
OH  
V
V
OH  
V
OH  
– 0.3 V  
0 V  
1.5 V  
Output  
1.5 V  
1.5 V  
OL  
VOLTAGE WAVEFORMS  
VOLTAGE WAVEFORMS  
ENABLE AND DISABLE TIMES  
PROPAGATION DELAY TIMES  
C includes probe and jig capacitance.  
L
NOTES: A.  
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.  
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.  
C. All input pulses are supplied by generators having the following characteristics: PRR 10 MHz, Z = 50 , t 2.5 ns, t 2.5 ns.  
O
r
f
D. The outputs are measured one at a time with one transition per measurement.  
E.  
F.  
G.  
t
t
t
and t  
and t  
andt  
are the same as t  
.
dis  
PLZ  
PZL  
PLH  
PHZ  
PZH  
PHL  
are the same as t  
.
en  
are the same as t .  
pd  
Figure 1. Load Circuit and Voltage Waveforms  
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL  
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR  
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER  
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO  
BE FULLY AT THE CUSTOMER’S RISK.  
In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other  
intellectual property right of TI covering or relating to any combination, machine, or process in which such  
semiconductor products or services might be or are used. TI’s publication of information regarding any third  
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.  
Copyright 1998, Texas Instruments Incorporated  

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