TLC1543QDWRG4 [TI]

10-BIT ANALOG-TO-DIGITAL CONVERTERS WITH SERIAL CONTROL AND 11 ANALOG INPUTS; 10位模拟数字转换器带串行控制和11个模拟输入
TLC1543QDWRG4
型号: TLC1543QDWRG4
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

10-BIT ANALOG-TO-DIGITAL CONVERTERS WITH SERIAL CONTROL AND 11 ANALOG INPUTS
10位模拟数字转换器带串行控制和11个模拟输入

转换器 模数转换器 光电二极管 输入元件
文件: 总33页 (文件大小:1154K)
中文:  中文翻译
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TLC1542I, TLC1542M, TLC1542Q  
TLC1542C, TLC1543C, TLC1543I, TLC1543Q  
www.ti.com  
SLAS052GMARCH 1992REVISED JANUARY 2006  
10-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
FEATURES  
DB, DW, J, OR N PACKAGE  
10-Bit Resolution A/D Converter  
(TOP VIEW)  
11 Analog Input Channels  
A0  
A1  
A2  
V
CC  
1
2
3
4
5
6
7
8
9
10  
20  
19  
18  
17  
16  
Three Built-In Self-Test Modes  
Inherent Sample-and-Hold Function  
Total Unadjusted Error: ±1LSB Max  
On-Chip System Clock  
EOC  
I/O CLOCK  
ADDRESS  
DATA OUT  
A3  
A4  
End-of-Conversion (EOC) Output  
Terminal Compatible With TLC542  
CMOS Technology  
A5  
15 CS  
14  
13  
12  
11  
A6  
A7  
REF+  
REF−  
A10  
A8  
GND  
A9  
DESCRIPTION  
The TLC1542C, TLC1542I, TLC1542M, TLC1542Q,  
TLC1543C, TLC1543I, and TLC1543Q are CMOS  
10-bit switched-capacitor successive-approximation  
analog-to-digital converters. These devices have  
three inputs and a 3-state output [chip select (CS),  
input-output clock (I/O CLOCK), address input  
(ADDRESS), and data output (DATA OUT)] that  
provide a direct 4-wire interface to the serial port of a  
host processor. These devices allow high-speed data  
transfers from the host.  
FK OR FN PACKAGE  
(TOP VIEW)  
3
2
1
20 19  
18  
I/O CLOCK  
ADDRESS  
DATA OUT  
CS  
A3  
A4  
A5  
A6  
A7  
4
5
6
7
8
17  
16  
15  
14  
In addition to a high-speed A/D converter and  
versatile control capability, these devices have an  
on-chip 14-channel multiplexer that can select any  
one of 11 analog inputs or any one of three internal  
self-test voltages. The sample-and-hold function is  
automatic. At the end of A/D conversion, the  
end-of-conversion (EOC) output goes high to  
indicate that conversion is complete. The converter  
incorporated in the devices features differential  
high-impedance reference inputs that facilitate  
ratiometric conversion, scaling, and isolation of  
analog circuitry from logic and supply noise. A  
REF+  
9 10 11 12 13  
switched-capacitor  
design  
allows  
low-error  
conversion over the full operating free-air  
temperature range.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 1992–2006, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
TLC1542I, TLC1542M, TLC1542Q  
TLC1542C, TLC1543C, TLC1543I, TLC1543Q  
www.ti.com  
SLAS052GMARCH 1992REVISED JANUARY 2006  
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam  
during storage or handling to prevent electrostatic damage to the MOS gates.  
AVAILABLE OPTIONS  
PACKAGE  
SMALL  
OUTLINE  
(DB)  
TA  
SMALL OUTLINE  
(DW)  
CHIP CARRIER  
(FN)  
PLASTIC DIP  
(N)  
CHIP CARRIER  
(FK)  
CERAMIC DIP  
(J)  
TLC1542CDW  
TLC1543CDW  
TLC1542IDW  
TLC1543IDW  
TLC1542CFN  
TLC1543CFN  
TLC1542IFN  
TLC1543IFN  
TLC1542QFN  
TLC1543QFN  
TLC1542CN  
TLC1543CN  
TLC1542IN  
TLC1543IN  
0°C to 70°C  
TLC1543CDB  
TLC1543IDB  
TLC1543QDB  
-40°C to 85°C  
-40°C to 125°C  
-55°C to 125°C  
TLC1543QDW  
TLC1542MFK  
TLC1542MJ  
FUNCTIONAL BLOCK DIAGRAM  
REF+  
14  
REF−  
13  
1
2
A0  
A1  
10-Bit  
Analog-to-Digital  
Converter  
Sample and  
Hold  
3
4
5
6
7
8
9
A2  
A3  
(switched capacitors)  
A4  
A5  
A6  
10  
14-Channel  
Analog  
Multiplexer  
A7  
A8  
Output  
Data  
Register  
10-to-1 Data  
Selector and  
Driver  
10  
16  
DATA  
OUT  
11  
12  
4
A9  
Input Address  
Register  
A10  
4
3
System Clock,  
Control Logic,  
and I/O  
Self-Test  
Reference  
19  
Counters  
EOC  
17  
ADDRESS  
18  
15  
I/O CLOCK  
CS  
TYPICAL EQUIVALENT INPUTS  
INPUT CIRCUIT IMPEDANCE DURING SAMPLING MODE  
INPUT CIRCUIT IMPEDANCE DURING HOLD MODE  
1 kTYP  
A0−A10  
A0−A10  
C = 60 pF TYP  
i
(equivalent input  
capacitance)  
5 MTYP  
2
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SLAS052GMARCH 1992REVISED JANUARY 2006  
TERMINAL FUNCTIONS  
TERMINAL  
I/O  
DESCRIPTION  
NAME  
NO.  
ADDRESS  
17  
I
Serial address input. A 4-bit serial address selects the desired analog input or test voltage that is to be  
converted next. The address data is presented with the MSB first and shifts in on the first four rising  
edges of I/O CLOCK. After the four address bits have been read into the address register, this input is  
ignored for the remainder of the current conversion period.  
A0-A10  
CS  
1-9, 11, 12  
15  
I
I
Analog signal inputs. The 11 analog inputs are applied to these terminals and are internally  
multiplexed. The driving source impedance should be less than or equal to 1 k.  
Chip select. A high-to-low transition on this input resets the internal counters and controls and enables  
DATA OUT, ADDRESS, and I/O CLOCK within a maximum of a setup time plus two falling edges of  
the internal system clock. A low-to-high transition disables ADDRESS and I/O CLOCK within a setup  
time plus two falling edges of the internal system clock.  
DATA OUT  
16  
O
The 3-state serial output for the A/D conversion result. This output is in the high-impedance state  
when CS is high and active when CS is low. With a valid chip select, DATA OUT is removed from the  
high-impedance state and is driven to the logic level corresponding to the MSB value of the previous  
conversion result. The next falling edge of I/O CLOCK drives this output to the logic level  
corresponding to the next most significant bit, and the remaining bits shift out in order with the LSB  
appearing on the ninth falling edge of I/O CLOCK. On the tenth falling edge of I/O CLOCK, DATA  
OUT is driven to a low logic level so that serial interface data transfers of more than ten clocks  
produce zeroes as the unused LSBs.  
EOC  
19  
10  
18  
O
I
End of conversion. This output goes from a high to a low logic level on the trailing edge of the tenth  
I/O CLOCK and remains low until the conversion is complete and data are ready for transfer.  
GND  
The ground return terminal for the internal circuitry. Unless otherwise noted, all voltage measurements  
are with respect to this terminal.  
I/O CLOCK  
I
Input/output clock. This terminal receives the serial I/O CLOCK input and performs the following four  
functions: 1) It clocks the four input address bits into the address register on the first four rising edges  
of the I/O CLOCK with the multiplex address available after the fourth rising edge. 2) On the fourth  
falling edge of I/O CLOCK, the analog input voltage on the selected multiplex input begins charging  
the capacitor array and continues to do so until the tenth falling edge of I/O CLOCK. 3) It shifts the  
nine remaining bits of the previous conversion data out on DATA OUT. 4) It transfers control of the  
conversion to the internal state controller on the falling edge of the tenth clock.  
REF+  
14  
I
The upper reference voltage value (nominally VCC) is applied to this terminal. The maximum input  
voltage range is determined by the difference between the voltage applied to this terminal and the  
voltage applied to the REF- terminal.  
REF-  
VCC  
13  
20  
I
I
The lower reference voltage value (nominally ground) is applied to this terminal.  
Positive supply voltage  
DETAILED DESCRIPTION  
With chip select (CS) inactive (high), the ADDRESS and I/O CLOCK inputs are initially disabled and DATA OUT  
is in the high-impedance state. When the serial interface takes CS active (low), the conversion sequence begins  
with the enabling of I/O CLOCK and ADDRESS and the removal of DATA OUT from the high-impedance state.  
The serial interface then provides the 4-bit channel address to ADDRESS and the I/O CLOCK sequence to I/O  
CLOCK. During this transfer, the serial interface also receives the previous conversion result from DATA OUT.  
I/O CLOCK receives an input sequence that is between 10 and 16 clocks long from the host serial interface. The  
first four I/O clocks load the address register with the 4-bit address on ADDRESS, selecting the desired analog  
channel, and the next six clocks providing the control timing for sampling the analog input.  
There are six basic serial-interface timing modes that can be used with the device. These modes are determined  
by the speed of I/O CLOCK and the operation of CS as shown in Table 1. These modes are (1) a fast mode with  
a 10-clock transfer and CS inactive (high) between conversion cycles, (2) a fast mode with a 10-clock transfer  
and CS active (low) continuously, (3) a fast mode with an 11- to 16-clock transfer and CS inactive (high)  
between conversion cycles, (4) a fast mode with a 16-clock transfer and CS active (low) continuously, (5) a slow  
mode with an 11- to 16-clock transfer and CS inactive (high) between conversion cycles, and (6) a slow mode  
with a 16-clock transfer and CS active (low) continuously.  
3
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SLAS052GMARCH 1992REVISED JANUARY 2006  
The MSB of the previous conversion appears at DATA OUT on the falling edge of CS in mode 1, mode 3, and  
mode 5, on the rising edge of EOC in mode 2 and mode 4, and following the sixteenth clock falling edge in  
mode 6. The remaining nine bits are shifted out on the next nine falling edges of I/O CLOCK. Ten bits of data  
are transmitted to the host-serial interface through DATA OUT. The number of serial clock pulses used also  
depends on the mode of operation, but a minimum of ten clock pulses is required for conversion to begin. On  
the tenth clock falling edge, the EOC output goes low and returns to the high logic level when conversion is  
complete and the result can be read by the host. Also, on the tenth clock falling edge, the internal logic takes  
DATA OUT low to ensure that the remaining bit values are zero when the I/O CLOCK transfer is more than ten  
clocks long.  
Table 1 lists the operational modes with respect to the state of CS, the number of I/O serial transfer clocks that  
can be used, and the timing edge on which the MSB of the previous conversion appears at the output.  
Table 1. MODE OPERATION  
TIMING  
DIAGRAM  
MODES  
CS  
NO. OF 1/O CLOCK  
MSB AT DATA OUT(1)  
Mode 1 High between conversion cycles  
Mode 2 Low continuously  
10  
10  
CS falling edge  
Figure 9  
EOC rising edge  
CS falling edge  
Figure 10  
Figure 11  
Figure 12  
Figure 13  
Figure 14  
Fast Modes  
Mode 3 High between conversion cycles  
Mode 4 Low continuously  
11 TO 16(2)  
16(2)  
11 to 16(3)  
16(3)  
EOC rising edge  
CS falling edge  
Mode 5 High between conversion cycles  
Mode 6 Low continuously  
Slow Modes  
16th clock falling edge  
(1) These edges also initiate serial-interface communication.  
(2) No more than 16 clocks should be used.  
(3) No more than 16 clocks should be used.  
FAST MODES  
The device is in a fast mode when the serial I/O CLOCK data transfer is completed before the conversion is  
completed. With a 10-clock serial transfer, the device can only run in a fast mode since a conversion does not  
begin until the falling edge of the tenth I/O CLOCK.  
MODE 1: FAST MODE, CS INACTIVE (HIGH) BETWEEN CONVERSION CYCLES, 10-CLOCK TRANSFER  
In this mode, CS is inactive (high) between serial I/O CLOCK transfers and each transfer is ten clocks long. The  
falling edge of CS begins the sequence by removing DATA OUT from the high-impedance state. The rising edge  
of CS ends the sequence by returning DATA OUT to the high-impedance state within the specified delay time.  
Also, the rising edge of CS disables the I/O CLOCK and ADDRESS terminals within a setup time plus two falling  
edges of the internal system clock.  
MODE 2: FAST MODE, CS ACTIVE (LOW) CONTINUOUSLY, 10-CLOCK TRANSFER  
In this mode, CS is active (low) between serial I/O CLOCK transfers and each transfer is ten clocks long. After  
the initial conversion cycle, CS is held active (low) for subsequent conversions; the rising edge of EOC then  
begins each sequence by removing DATA OUT from the low logic level, allowing the MSB of the previous  
conversion to appear immediately on this output.  
MODE 3: FAST MODE, CS INACTIVE (HIGH) BETWEEN CONVERSION CYCLES, 11- to 16-CLOCK  
TRANSFER  
In this mode, CS is inactive (high) between serial I/O CLOCK transfers, and each transfer can be 11 to 16 clocks  
long. The falling edge of CS begins the sequence by removing DATA OUT from the high-impedance state. The  
rising edge of CS ends the sequence by returning DATA OUT to the high-impedance state within the specified  
delay time. Also, the rising edge of CS disables the I/O CLOCK and ADDRESS terminals within a setup time  
plus two falling edges of the internal system clock.  
4
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SLAS052GMARCH 1992REVISED JANUARY 2006  
MODE 4: FAST MODE, CS ACTIVE (LOW) CONTINUOUSLY, 16-CLOCK TRANSFER  
In this mode, CS is active (low) between serial I/O CLOCK transfers and each transfer must be exactly 16 clocks  
long. After the initial conversion cycle, CS is held active (low) for subsequent conversions; the rising edge of  
EOC then begins each sequence by removing DATA OUT from the low logic level, allowing the MSB of the  
previous conversion to appear immediately on this output.  
SLOW MODES  
In a slow mode, the conversion is completed before the serial I/O CLOCK data transfer is completed. A slow  
mode requires a minimum 11-clock transfer into I/O CLOCK, and the rising edge of the eleventh clock must  
occur before the conversion period is complete; otherwise, the device loses synchronization with the host-serial  
interface and CS has to be toggled to initialize the system. The eleventh rising edge of the I/O CLOCK must  
occur within 9.5 µs after the tenth I/O clock falling edge.  
MODE 5: SLOW MODE, CS INACTIVE (HIGH) BETWEEN CONVERSION CYCLES, 11- to 16-CLOCK  
TRANSFER  
In this mode, CS is inactive (high) between serial I/O CLOCK transfers and each transfer can be 11 to 16 clocks  
long. The falling edge of CS begins the sequence by removing DATA OUT from the high-impedance state. The  
rising edge of CS ends the sequence by returning DATA OUT to the high-impedance state within the specified  
delay time. Also, the rising edge of CS disables the I/O CLOCK and ADDRESS terminals within a setup time  
plus two falling edges of the internal system clock.  
MODE 6: SLOW MODE, CS ACTIVE (LOW) CONTINUOUSLY, 16-CLOCK TRANSFER  
In this mode, CS is active (low) between serial I/O CLOCK transfers and each transfer must be exactly 16 clocks  
long. After the initial conversion cycle, CS is held active (low) for subsequent conversions. The falling edge of  
the sixteenth I/O CLOCK then begins each sequence by removing DATA OUT from the low state, allowing the  
MSB of the previous conversion to appear immediately at DATA OUT. The device is then ready for the next  
16-clock transfer initiated by the serial interface.  
ADDRESS BITS  
The 4-bit analog channel-select address for the next conversion cycle is presented to the ADDRESS terminal  
(MSB first) and is clocked into the address register on the first four leading edges of I/O CLOCK. This address  
selects one of 14 inputs (11 analog inputs or three internal test inputs).  
ANALOG INPUTS AND TEST MODES  
The 11 analog inputs and the three internal test inputs are selected by the 14-channel multiplexer according to  
the input address as shown in Tables 2 and 3. The input multiplexer is a break-before-make type to reduce  
input-to-input noise injection resulting from channel switching.  
Sampling of the analog input starts on the falling edge of the fourth I/O CLOCK, and sampling continues for six  
I/O CLOCK periods. The sample is held on the falling edge of the tenth I/O CLOCK. The three test inputs are  
applied to the multiplexer, sampled, and converted in the same manner as the external analog inputs.  
5
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SLAS052GMARCH 1992REVISED JANUARY 2006  
Table 2. ANALOG-CHANNEL-SELECT ADDRESS  
VALUE SHIFTED INTO ADDRESS  
INPUT  
ANALOG INPUT SELECTED  
BINARY  
0000  
0001  
0010  
0011  
0100  
0101  
0110  
0111  
1000  
1001  
1010  
HEX  
0
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
A8  
A9  
A10  
1
2
3
4
5
6
7
8
9
A
Table 3. TEST-MODE-SELECT ADDRESS  
VALUE SHIFTED INTO  
ADDRESS INPUT  
INTERNAL SELF-TEST  
VOLTAGE SELECTED(1)  
OUTPUT RESULT (HEX)(2)  
BINARY  
HEX  
V
ref+  
− V  
ref−  
1011  
B
200  
2
Vref-  
Vref+  
1100  
1101  
C
D
000  
3FF  
(1) Vref+ is the voltage applied to the REF+ input, and Vref- is the voltage applied to the REF- input.  
(2) The output results shown are the ideal values and vary with the reference stability and with internal  
offsets.  
CONVERTER AND ANALOG INPUT  
The CMOS threshold detector in the successive-approximation conversion system determines each bit by  
examining the charge on a series of binary-weighted capacitors (see Figure 1). In the first phase of the  
conversion process, the analog input is sampled by closing the SC switch and all ST switches simultaneously.  
This action charges all the capacitors to the input voltage.  
In the next phase of the conversion process, all ST and SC switches are opened and the threshold detector  
begins identifying bits by identifying the charge (voltage) on each capacitor relative to the reference (REF-)  
voltage. In the switching sequence, ten capacitors are examined separately until all ten bits are identified and  
then the charge-convert sequence is repeated. In the first step of the conversion phase, the threshold detector  
looks at the first capacitor (weight = 512). Node 512 of this capacitor is switched to the REF+ voltage, and the  
equivalent nodes of all the other capacitors on the ladder are switched to REF-. If the voltage at the summing  
node is greater than the trip point of the threshold detector (approximately one-half VCC), a 0 bit is placed in the  
output register and the 512-weight capacitor is switched to REF-. If the voltage at the summing node is less than  
the trip point of the threshold detector, a 1 bit is placed in the register and the 512-weight capacitor remains  
connected to REF+ through the remainder of the successive-approximation process. The process is repeated for  
the 256-weight capacitor, the 128-weight capacitor, and so forth down the line until all bits are counted.  
With each step of the successive-approximation process, the initial charge is redistributed among the capacitors.  
The conversion process relies on charge redistribution to count and weigh the bits from MSB to LSB.  
6
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S
C
Threshold  
Detector  
To Output  
Latches  
512  
256  
128  
16  
8
4
2
1
1
Node 512  
REF+  
REF+  
REF+  
REF+  
REF+  
REF+  
REF+  
REF−  
REF−  
REF−  
REF−  
REF−  
REF−  
REF−  
REF−  
REF−  
S
T
S
T
S
T
S
T
S
T
S
T
S
T
S
T
S
T
V
I
Figure 1. Simplified Model of the Successive-Approximation System  
CHIP-SELECT OPERATION  
The trailing edge of CS starts all modes of operation, and CS can abort a conversion sequence in any mode. A  
high-to-low transition on CS within the specified time during an ongoing cycle aborts the cycle, and the device  
returns to the initial state (the contents of the output data register remain at the previous conversion result).  
Exercise care to prevent CS from being taken low close to completion of conversion because the output data  
can be corrupted.  
REFERENCE VOLTAGE INPUTS  
There are two reference inputs used with the device: REF+ and REF-. These voltage values establish the upper  
and lower limits of the analog input to produce a full-scale and zero reading respectively. The values of REF+,  
REF-, and the analog input should not exceed the positive supply or be lower than GND consistent with the  
specified absolute maximum ratings. The digital output is at full scale when the input signal is equal to or higher  
than REF+ and at zero when the input signal is equal to or lower than REF-.  
7
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ABSOLUTE MAXIMUM RATINGS  
over operating free-air temperature range (unless otherwise noted)  
(1)  
UNIT  
(2)  
VCC, see  
VI  
Supply voltage range  
-0.5 V to 6.5 V  
-0.3 V to VCC + 0.3 V  
-0.3 V to VCC + 0.3 V  
VCC + 0.1 V  
Input voltage range  
VO  
Output voltage range  
Vref+  
Vref-  
Positive reference voltage  
Negative reference voltage  
Peak input current (any input)  
Peak total input current (all inputs)  
-0.1 V  
±20 mA  
±30 mA  
TLC1542C, TLC1543C  
TLC1542I, TLC1543I  
TLC1542Q, TLC1543Q  
TLC1542M  
0°C to 70°C  
-40°C to 85°C  
-40°C to 125°C  
-55°C to 125°C  
-65°C to 150°C  
260°C  
TA  
Operating free-air temperature range  
Storage temperature range,  
Tstg  
Lead temperature 1,6 mm (1/16 inch) from the case for 10 seconds  
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings  
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating  
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
(2) All voltage values are with respect to digital ground with REF- and GND wired together (unless otherwise noted).  
RECOMMENDED OPERATING CONDITIONS  
MIN  
NOM  
5
MAX  
UNIT  
VCC  
Supply voltage  
4.5  
5.5  
V
V
V
Vref+, see(1)  
Positive reference voltage  
Negative reference voltage  
VCC  
0
(1)  
Vref-, see  
VCC+0.  
2
(1)  
Vref+-Vref-, see  
Differential reference voltage  
2.5  
VCC  
V
(1)  
Analog input voltage ,see  
0
2
VCC  
V
V
V
VIH  
VIL  
High-level control input voltage  
Low-level control input voltage  
VCC = 4.5 V to 5.5 V  
VCC = 4.5 V to 5.5 V  
0.8  
Setup time, address bits at data input before I/O  
CLOCK↑  
tsu(A), see Figure 4  
100  
ns  
th(A), see Figure 4  
th(CS), see Figure 5  
Hold time, address bits after I/O CLOCK↑  
Hold time, CS low after last I/O CLOCK↓  
0
0
ns  
ns  
tsu(CS), see (2) and  
Figure 5  
Setup time, CS low before clocking in first  
address bit  
1.425  
µs  
(3)  
Clock frequency at I/O CLOCK, see  
0
190  
190  
2.1  
MHz  
ns  
twH(I/O)  
twL(I/O)  
Pulse duration, I/O CLOCK high,  
Pulse duration, I/O CLOCK low,  
ns  
tt(I/O), see (4) and  
Figure 6  
Transition time, I/O CLOCK,  
1
µs  
µs  
tt(CS)  
Transition time, ADDRESS and CS,  
10  
(1) Analog input voltages greater than that applied to REF+ convert as all ones (1111111111), while input voltages less than that applied to  
REF- convert as all zeros (0000000000). The device is functional with reference voltages down to 1 V (Vref+ - Vref-); however, the  
electrical specifications are no longer applicable.  
(2) To minimize errors caused by noise at CS, the internal circuitry waits for a setup time plus two falling edges of the internal system clock  
after CSbefore responding to control input signals. Therefore, no attempt should be made to clock in an address until the minimum CS  
setup time has elapsed.  
(3) For 11- to 16-bit transfers, after the tenth I/O CLOCK falling edge (2 V) at least 1 I/O CLOCK rising edge (2 V) must occur within 9.5  
µs.  
(4) This is the time required for the clock input signal to fall from VIHmin to VILmax or to rise from VILmax to VIHmin. In the vicinity of normal  
room temperature, the devices function with input clock transition time as slow as 1 µs for remote data-acquisition applications where  
the sensor and the A/D converter are placed several feet away from the controlling microprocessor.  
8
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SLAS052GMARCH 1992REVISED JANUARY 2006  
RECOMMENDED OPERATING CONDITIONS (continued)  
MIN  
0
NOM  
MAX  
70  
UNIT  
TLC1542C, TLC1543C  
TLC1542I, TLC1543I  
TLC1542Q, TLC1543Q  
TLC1542M  
-40  
-40  
-55  
85  
TA  
Operating free-air temperature,  
°C  
125  
125  
ELECTRICAL CHARACTERISTICS  
over recommended operating free-air temperature range, VCC = Vref+ = 4.5 V to 5.5 V, I/O CLOCK frequency = 2.1 MHz  
(unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
IOH = -1.6 mA  
MIN TYP(1)  
MAX  
UNIT  
VCC = 4.5 V,  
2.4  
VOH High-level output voltage  
V
VCC = 4.5 V to 5.5 V,  
VCC = 4.5 V,  
IOH = -20 µA  
IOL = 1.6 mA  
IOL = 20 µA  
CS at VCC  
VCC-0.1  
0.4  
0.1  
10  
VOL Low-level output voltage  
Off-state  
V
VCC = 4.5 V to 5.5 V,  
VO = VCC  
,
IOZ  
(high-impedance-state)  
output current  
µA  
VO = 0,  
CS at VCC  
-10  
IIH  
IIL  
High-level input current  
Low-level input current  
Operating supply current  
VI = VCC  
VI = 0  
0.005  
0.005  
0.8  
2.5  
-2.5  
2.5  
1
µA  
µA  
ICC  
CS at 0 V  
mA  
Selected channel leakage  
current TLC1542/TLC1543  
C, I, or Q  
Selected channel at VCC  
,
Unselected channel at 0 V  
Unselected channel at VCC  
µA  
Selected channel at 0 V,  
-1  
1
Selected channel at VCC  
TA= 25°C  
,
Unselected channel at 0 V,  
Selected channel at 0 V,  
TA = 25°C  
Selected channel leakage  
current TLC1542M  
Unselected channel at VCC  
,
-1  
µA  
Selected channel at VCC  
,
Unselected channel at 0 V  
Unselected channel at VCC  
2.5  
Selected channel at 0 V,  
-2.5  
Maximum static analog  
reference current into REF+  
Vref+ = VCC  
,
Vref- = GND  
10  
µA  
Analog  
inputs  
7
5
Input  
capacitance  
Ci  
pF  
Control  
inputs  
(1) All typical values are at VCC = 5 V, TA = 25°C.  
OPERATING CHARACTERISTICS  
over recommended operating free-air temperature range, VCC = Vref+ = 4.5 V to 5.5 V, I/O CLOCK frequency = 2.1 MHz  
(unless otherwise noted)  
TEST  
CONDITIONS  
(1)  
MIN TYP  
MAX  
UNIT  
TLC1542C, I, or Q  
TLC1543C, I, or Q  
TLC1542M  
±0.5  
±1  
LSB  
LSB  
LSB  
(2)  
EL  
Linearity error, see  
)
±1  
(1) All typical values are at TA = 25°C.  
(2) Linearity error is the maximum deviation from the best straight line through the A/D transfer characteristics.  
9
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SLAS052GMARCH 1992REVISED JANUARY 2006  
OPERATING CHARACTERISTICS (continued)  
over recommended operating free-air temperature range, VCC = Vref+ = 4.5 V to 5.5 V, I/O CLOCK frequency = 2.1 MHz  
(unless otherwise noted)  
TEST  
CONDITIONS  
(1)  
MIN TYP  
MAX  
UNIT  
(4)  
TLC1542C, I, or Q  
TLC1543C, I, or Q  
TLC1542M  
See  
±1  
±1  
±1  
±1  
±1  
±1  
±1  
±1  
±1  
LSB  
LSB  
LSB  
LSB  
LSB  
LSB  
LSB  
LSB  
LSB  
(3)  
(4)  
(4)  
(4)  
(4)  
(4)  
EZS  
Zero-scale error, see  
See  
See  
See  
See  
See  
TLC1542C, I, or Q  
TLC1543C, I, or Q  
TLC1542M  
(3)  
EFS  
Full-scale error, see  
TLC1542C, I, or Q  
TLC1543C, I, or Q  
TLC1542M  
(5)  
Total unadjusted error, see  
ADDRESS = 1011  
ADDRESS = 1100  
ADDRESS = 1101  
512  
(6)  
Self-test output code, see Table 3 and  
Conversion time  
0
1023  
See timing  
diagrams  
tconv  
21  
µs  
µs  
21  
See timing  
diagrams and  
+10 I/O  
CLOCK  
periods  
tc  
Total cycle time (access, sample, and conversion)  
Channel acquisition time (sample)  
(7)  
See timing  
diagrams and  
I/O CLOCK  
periods  
tacq  
6
(7)  
tv  
Valid time, DATA OUT remains valid after I/O CLOCKSee Figure 6  
10  
ns  
ns  
ns  
ns  
µs  
ns  
ns  
ns  
ns  
ns  
td(I/O-DATA)  
td(I/O-EOC)  
td(EOC-DATA)  
tPZH, tPZL  
tPHZ, tPLZ  
tr(EOC)  
Delay time, I/O CLOCKto DATA OUT valid  
Delay time, tenth I/O CLOCKto EOC↓  
Delay time, EOCto DATA OUT (MSB)  
Enable time, CSto DATA OUT (MSB driven)  
Disable time, CSto DATA OUT (high impedance)  
Rise time, EOC  
See Figure 6  
See Figure 7  
See Figure 8  
See Figure 3  
See Figure 3  
See Figure 8  
See Figure 7  
See Figure 6  
See Figure 6  
240  
240  
100  
1.3  
70  
150  
300  
300  
300  
300  
tf(EOC)  
Fall time, EOC  
tr(DATA)  
Rise time, data bus  
tf(DATA)  
Fall time, data bus  
Delay time, tenth I/O CLOCKto CSto abort  
td(I/O-CS)  
9
µs  
(8)  
conversion (see Note  
)
(3) Zero-scale error is the difference between 0000000000 and the converted output for zero input voltage; full-scale error is the difference  
between 1111111111 and the converted output for full-scale input voltage.  
(4) Analog input voltages greater than that applied to REF+ convert as all ones (1111111111), while input voltages less than that applied to  
REF- convert as all zeros (0000000000). The device is functional with reference voltages down to 1 V (Vref+-Vref-); however, the  
electrical specifications are no longer applicable.  
(5) Total unadjusted error comprises linearity, zero-scale, and full-scale errors.  
(6) Both the input address and the output codes are expressed in positive logic.  
(7) I/O CLOCK period = 1/(I/O CLOCK frequency) (see Figure 6)  
(8) Any transitions of CS are recognized as valid only if the level is maintained for a setup time plus two falling edges of the internal clock  
(1.425 µs) after the transition.  
10  
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SLAS052GMARCH 1992REVISED JANUARY 2006  
PARAMETER MEASUREMENT INFORMATION  
V
CC  
V
CC  
Test Point  
Test Point  
R
L
= 2.18 k  
R
L
= 2.18 kΩ  
DATA OUT  
EOC  
12 kΩ  
12 kΩ  
C
L
= 50 pF  
C = 100 pF  
L
Figure 2. Load Circuits  
2 V  
CS  
0.8 V  
t
, t  
PZH PZL  
t
, t  
PHZ PLZ  
2.4 V  
0.4 V  
90%  
10%  
DATA  
OUT  
Figure 3. DATA OUT Enable and Disable Voltage Waveforms  
Address  
Valid  
2 V  
ADDRESS  
0.8 V  
t
h(A)  
t
su(A)  
I/O CLOCK  
0.8 V  
Figure 4. ADDRESS Setup and Hold Time Voltage Waveforms  
2 V  
CS  
0.8 V  
t
su(CS)  
t
h(CS)  
I/O CLOCK  
First  
Clock  
Last  
Clock  
0.8 V  
0.8 V  
Figure 5. I/O CLOCK Setup and Hold Time Voltage Waveforms  
11  
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SLAS052GMARCH 1992REVISED JANUARY 2006  
PARAMETER MEASUREMENT INFORMATION (continued)  
t
t(I/O)  
t
t(I/O)  
2 V  
2 V  
0.8 V  
I/O CLOCK  
0.8 V  
0.8 V  
I/O CLOCK Period  
t
d(I/O-DATA)  
t
v
2.4 V  
0.4 V  
2.4 V  
0.4 V  
DATA OUT  
t
, t  
r(DATA) f(DATA)  
Figure 6. I/O CLOCK and DATA OUT Voltage Waveforms  
I/O CLOCK  
10th  
0.8 V  
Clock  
t
d(I/O-EOC)  
2.4 V  
0.4 V  
EOC  
t
f(EOC)  
Figure 7. I/O CLOCK and EOC Voltage Waveforms  
t
r(EOC)  
2.4 V  
EOC  
0.4 V  
t
d(EOC-DATA)  
2.4 V  
0.4 V  
DATA OUT  
Valid MSB  
Figure 8. EOC and DATA OUT Voltage Waveforms  
12  
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SLAS052GMARCH 1992REVISED JANUARY 2006  
PARAMETER MEASUREMENT INFORMATION (continued)  
TIMING DIAGRAMS  
CS  
(see Note A)  
I/O  
CLOCK  
1
2
3
4
5
6
7
8
9
10  
1
Access Cycle B  
Sample Cycle B  
Hi-Z State  
DATA  
A9  
A8  
B2  
A7  
A6  
A5  
A4  
A3  
A2  
A1  
A0  
B9  
OUT  
Previous Conversion Data  
MSB  
LSB  
ADDRESS  
B3  
MSB  
B1  
B0  
LSB  
C3  
EOC  
Shift in New Multiplexer Address;  
Simultaneously Shift Out Previous  
Conversion Value  
A/D Conversion  
Interval  
Initialize  
Initialize  
A. To minimize errors caused by noise at CS, the internal circuitry waits for a setup time plus two falling edges of the  
internal system clock after CSbefore responding to control input signals. Therefore, no attempt should be made to  
clock in an address until the minimum CS setup time has elapsed.  
Figure 9. Timing for 10-Clock Transfer Using CS  
Must be High on Power Up  
CS  
(see Note A)  
I/O  
CLOCK  
1
2
3
4
5
6
7
8
9
10  
1
Access Cycle B  
Sample Cycle B  
DATA  
OUT  
A9  
A8  
B2  
A7  
A6  
A5  
A4  
A3  
A2  
A1  
A0  
B9  
Low Level  
Previous Conversion Data  
MSB  
LSB  
ADDRESS  
EOC  
B3  
MSB  
B1  
B0  
LSB  
C3  
Shift in New Multiplexer Address;  
Simultaneously Shift Out Previous  
Conversion Value  
A/D Conversion  
Interval  
Initialize  
Initialize  
A. To minimize errors caused by noise at CS, the internal circuitry waits for a setup time plus two falling edges of the  
internal system clock after CSbefore responding to control input signals. Therefore, no attempt should be made to  
clock in an address until the minimum CS setup time has elapsed.  
Figure 10. Timing for 10-Clock Transfer Not Using CS  
13  
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SLAS052GMARCH 1992REVISED JANUARY 2006  
PARAMETER MEASUREMENT INFORMATION (continued)  
See Note B  
CS  
(see Note A)  
I/O  
CLOCK  
1
2
3
4
5
6
7
8
9
10  
11  
16  
1
Access Cycle B  
Sample Cycle B  
Low  
Level  
Hi-Z  
DATA  
OUT  
A9  
A8  
B2  
A7  
B1  
A6  
A5  
A4  
A3  
A2  
A1  
A0  
B9  
Previous Conversion Data  
MSB  
LSB  
ADDRESS  
EOC  
B3  
MSB  
B0  
LSB  
C3  
Shift in New Multiplexer Address;  
Simultaneously Shift Out Previous  
Conversion Value  
A/D Conversion  
Interval  
Initialize  
Initialize  
A. To minimize errors caused by noise at CS, the internal circuitry waits for a setup time plus two falling edges of the  
internal system clock after CSbefore responding to control input signals. Therefore, no attempt should be made to  
clock in an address until the minimum CS setup time has elapsed.  
B. A low-to-high transition of CS disables ADDRESS and the I/O CLOCK within a maximum of a setup time plus two  
falling edges of the internal system clock.  
Figure 11. Timing for 11- to 16-Clock Transfer Using  
CS (Serial Transfer Interval Shorter Than Conversion)  
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SLAS052GMARCH 1992REVISED JANUARY 2006  
PARAMETER MEASUREMENT INFORMATION (continued)  
Must Be High on Power Up  
CS  
(see Note A)  
I/O  
CLOCK  
1
2
3
4
5
6
7
8
9
10  
14  
15  
16  
1
Access Cycle B  
Sample Cycle B  
See Note B  
DATA  
OUT  
Low Level  
A9  
A8  
B2  
A7  
A6  
A5  
A4  
A3  
A2  
A1  
A0  
B9  
C3  
Previous Conversion Data  
MSB  
LSB  
ADDRESS  
EOC  
B3  
MSB  
B1  
B0  
LSB  
Shift in New Multiplexer Address;  
Simultaneously Shift Out Previous  
Conversion Value  
A/D Conversion  
Interval  
Initialize  
Initialize  
A. To minimize errors caused by noise at CS, the internal circuitry waits for a setup time plus two falling edges of the  
internal system clock after CSbefore responding to control input signals. Therefore, no attempt should be made to  
clock in an address until the minimum CS setup time has elapsed.  
B. The first I/O CLOCK must occur after the rising edge of EOC.  
Figure 12. Timing for 16-Clock Transfer Not Using  
CS (Serial Transfer Interval Shorter Than Conversion)  
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SLAS052GMARCH 1992REVISED JANUARY 2006  
PARAMETER MEASUREMENT INFORMATION (continued)  
CS  
(see Note A)  
I/O  
CLOCK  
1
2
3
4
5
6
7
8
9
10  
11  
16  
1
See Note B  
Access Cycle B  
Sample Cycle B  
Hi-Z State  
Low  
Level  
DATA  
OUT  
A9  
A8  
B2  
A7  
A6  
A5  
A4  
A3  
A2  
A1  
A0  
B9  
Previous Conversion Data  
MSB  
LSB  
ADDRESS  
EOC  
B3  
MSB  
B1  
B0  
LSB  
C3  
Shift in New Multiplexer Address;  
Simultaneously Shift Out Previous  
Conversion Value  
A/D Conversion  
Interval  
Initialize  
Initialize  
A. To minimize errors caused by noise at CS, the internal circuitry waits for a setup time plus two falling edges of the  
internal system clock after CSbefore responding to control input signals. Therefore, no attempt should be made to  
clock in an address until the minimum CS setup time has elapsed.  
B. The 11th rising edge of the I/O CLOCK sequence must occur before the conversion is complete to prevent losing  
serial interface synchronization.  
Figure 13. Timing for 11- to 16-Clock Transfer Using  
CS (Serial Transfer Interval Longer Than Conversion)  
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SLAS052GMARCH 1992REVISED JANUARY 2006  
PARAMETER MEASUREMENT INFORMATION (continued)  
Must be High on Power Up  
CS  
(see Note A)  
I/O  
CLOCK  
1
2
3
4
5
6
7
8
9
10  
14  
15  
16  
1
Access Cycle B  
Sample Cycle B  
See Note B  
Low Level  
See Note C  
DATA  
OUT  
A9  
A8  
A7  
B1  
A6  
A5  
A4  
A3  
A2  
A1  
A0  
B9  
Previous Conversion Data  
MSB  
LSB  
ADDRESS  
EOC  
B3  
MSB  
B2  
B0  
LSB  
C3  
Shift in New Multiplexer Address;  
Simultaneously Shift Out Previous  
Conversion Value  
A/D Conversion  
Interval  
Initialize  
A. A. To minimize errors caused by noise at CS, the internal circuitry waits for a setup time plus two falling edges of the  
internal system clock after CSbefore responding to control input signals. Therefore, no attempt should be made to  
clock in an address until the minimum CS setup time has elapsed.  
B. The 11th rising edge of the I/O CLOCK sequence must occur before the conversion is complete to prevent losing  
serial interface synchronization.  
C. C. The I/O CLOCK sequence is exactly 16 clock pulses long.  
Figure 14. Timing for 16-Clock Transfer Not Using  
CS (Serial Transfer Interval Longer Than Conversion)  
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SLAS052GMARCH 1992REVISED JANUARY 2006  
APPLICATION INFORMATION  
1023  
1022  
1021  
1111111111  
1111111110  
1111111101  
See Notes A and B  
V
FS  
V
FT  
= V − 1/2 LSB  
FS  
513  
512  
1000000001  
1000000000  
V
ZT  
=V + 1/2 LSB  
ZS  
511  
0111111111  
V
ZS  
2
1
0
0000000010  
0000000001  
0000000000  
0
0.0048 0.0096  
2.4528 2.4576 2.4624  
V − Analog Input Voltage − V  
4.9056  
4.9104 4.9152  
I
A. This curve is based on the assumption that Vref+ and Vref- have been adjusted so that the voltage at the transition  
from digital 0 to 1 (VZT) is 0.0024 V and the transition to full scale (VFT) is 4.908 V. 1 LSB = 4.8 mV.  
B. The full-scale value (VFS) is the step whose nominal midstep value has the highest absolute value. The zero-scale  
value (VZS) is the step whose nominal midstep value equals zero.  
Figure 15. Ideal Conversion Characteristics  
TLC1542/43  
15  
18  
17  
1
2
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
A8  
A9  
A10  
CS  
I/O CLOCK  
ADDRESS  
3
Control  
Circuit  
4
Processor  
5
16  
19  
DATA OUT  
EOC  
6
Analog  
Inputs  
7
8
9
14  
13  
5-V DC Regulator  
REF+  
REF−  
11  
12  
GND  
10  
To Source  
Ground  
Figure 16. Serial Interface  
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SLAS052GMARCH 1992REVISED JANUARY 2006  
APPLICATION INFORMATION (continued)  
SIMPLIFIED ANALOG INPUT ANALYSIS  
Using the equivalent circuit in Figure 17Figure 17, the time required to charge the analog input capacitance from  
0 to VS within 1/2 LSB can be derived as follows:  
The capacitance charging voltage is given by  
−t /R C  
t i  
c
V = V  
(1−e  
)
C
S
where  
R = R + r  
i
t
s
(1)  
(2)  
The final voltage to 1/2 LSB is given by  
V (1/2 LSB) = V − (V /2048)  
C
S
S
Equating equation 1 to equation 2 and solving for time tc gives  
−t /R C  
c
t i  
V −(V /2048) = V 1−e  
(
)
S
S
S
and  
t (1/2 LSB) = R × C × ln(2048)  
c
t
i
(3)  
(4)  
Therefore, with the values given the time for the analog input signal to settle is  
t (1/2 LSB) = (R + 1 k) × 60 pF × ln(2048)  
c
s
This time must be less than the converter sample time shown in the timing diagrams.  
Driving Source  
TLC1542/3  
R
s
r
i
V
I
V
S
V
C
1 kMAX  
C
i
50 pF MAX  
V
V
R
= Input Voltage at A0A10  
= External Driving Source Voltage  
= Source Resistance  
I
S
s
r
= Input Resistance  
i
C
i
= Equivalent Input Capacitance  
Driving source requirements:  
Noise and distortion for the source must be equivalent to the  
resolution of the converter.  
R must be real at the input frequency.  
s
Figure 17. Equivalent Input Circuit Including the Driving Source  
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PACKAGE OPTION ADDENDUM  
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3-Feb-2013  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package Qty  
Eco Plan Lead/Ball Finish  
MSL Peak Temp  
Op Temp (°C)  
Top-Side Markings  
Samples  
Drawing  
(1)  
(2)  
(3)  
(4)  
5962-9064202Q2A  
5962-9064202QRA  
TLC1542CDW  
OBSOLETE  
OBSOLETE  
ACTIVE  
LCCC  
CDIP  
SOIC  
FK  
J
20  
20  
20  
TBD  
TBD  
Call TI  
Call TI  
Call TI  
Call TI  
-55 to 125  
-55 to 125  
DW  
25  
25  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU  
Level-1-260C-UNLIM  
TLC1542C  
TLC1542C  
TLC1542C  
TLC1542C  
TLC1542C  
TLC1542C  
TLC1542CN  
TLC1542CN  
TLC1542I  
TLC1542I  
TLC1542I  
TLC1542I  
TLC1542CDWG4  
TLC1542CDWR  
TLC1542CDWRG4  
TLC1542CFN  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
SOIC  
SOIC  
SOIC  
PLCC  
PLCC  
PDIP  
PDIP  
SOIC  
SOIC  
SOIC  
SOIC  
DW  
DW  
DW  
FN  
FN  
N
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU SN  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
N / A for Pkg Type  
2000  
2000  
46  
Green (RoHS  
& no Sb/Br)  
0 to 70  
0 to 70  
Green (RoHS  
& no Sb/Br)  
Green (RoHS  
& no Sb/Br)  
TLC1542CFNG3  
TLC1542CN  
46  
Green (RoHS  
& no Sb/Br)  
CU SN  
20  
Pb-Free  
(RoHS)  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
TLC1542CNE4  
TLC1542IDW  
N
20  
Pb-Free  
(RoHS)  
N / A for Pkg Type  
DW  
DW  
DW  
DW  
25  
Green (RoHS  
& no Sb/Br)  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
TLC1542IDWG4  
TLC1542IDWR  
TLC1542IDWRG4  
25  
Green (RoHS  
& no Sb/Br)  
2000  
2000  
Green (RoHS  
& no Sb/Br)  
Green (RoHS  
& no Sb/Br)  
TLC1542IFN  
TLC1542IN  
OBSOLETE  
ACTIVE  
PLCC  
PDIP  
FN  
N
20  
20  
TBD  
Call TI  
Call TI  
20  
20  
Pb-Free  
(RoHS)  
CU NIPDAU  
N / A for Pkg Type  
TLC1542IN  
TLC1542IN  
TLC1542INE4  
ACTIVE  
PDIP  
N
20  
Pb-Free  
(RoHS)  
CU NIPDAU  
N / A for Pkg Type  
TLC1542MFKB  
TLC1542MJB  
OBSOLETE  
OBSOLETE  
LCCC  
CDIP  
FK  
J
20  
20  
TBD  
TBD  
Call TI  
Call TI  
Call TI  
Call TI  
-55 to 125  
-55 to 125  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
3-Feb-2013  
Orderable Device  
Status Package Type Package Pins Package Qty  
Eco Plan Lead/Ball Finish  
MSL Peak Temp  
Op Temp (°C)  
Top-Side Markings  
Samples  
Drawing  
(1)  
(2)  
(3)  
(4)  
TLC1542QFN  
TLC1543CDB  
ACTIVE  
ACTIVE  
ACTIVE  
PLCC  
SSOP  
SSOP  
FN  
DB  
DB  
20  
20  
20  
46  
70  
70  
Green (RoHS  
& no Sb/Br)  
CU SN  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
-40 to 125 TLC1542Q  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU  
CU NIPDAU  
P1543  
P1543  
TLC1543CDBG4  
Green (RoHS  
& no Sb/Br)  
TLC1543CDBLE  
TLC1543CDBR  
OBSOLETE  
ACTIVE  
SSOP  
SSOP  
DB  
DB  
20  
20  
TBD  
Call TI  
Call TI  
2000  
2000  
25  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU  
Level-1-260C-UNLIM  
P1543  
TLC1543CDBRG4  
TLC1543CDW  
TLC1543CDWG4  
TLC1543CDWR  
TLC1543CDWRG4  
TLC1543CFN  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
OBSOLETE  
SSOP  
SOIC  
SOIC  
SOIC  
SOIC  
PLCC  
PLCC  
PLCC  
PLCC  
PDIP  
DB  
DW  
DW  
DW  
DW  
FN  
FN  
FN  
FN  
N
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU SN  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
N / A for Pkg Type  
N / A for Pkg Type  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Call TI  
P1543  
Green (RoHS  
& no Sb/Br)  
TLC1543C  
TLC1543C  
TLC1543C  
TLC1543C  
TLC1543C  
TLC1543C  
25  
Green (RoHS  
& no Sb/Br)  
2000  
2000  
46  
Green (RoHS  
& no Sb/Br)  
Green (RoHS  
& no Sb/Br)  
Green (RoHS  
& no Sb/Br)  
TLC1543CFNG3  
TLC1543CFNR  
TLC1543CFNRG3  
TLC1543CN  
46  
Green (RoHS  
& no Sb/Br)  
CU SN  
1000  
1000  
20  
Green (RoHS  
& no Sb/Br)  
CU SN  
0 to 70  
0 to 70  
TLC1543C  
TLC1543C  
TLC1543CN  
TLC1543CN  
Y1543  
Green (RoHS  
& no Sb/Br)  
CU SN  
Pb-Free  
(RoHS)  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
Call TI  
TLC1543CNE4  
TLC1543IDB  
PDIP  
N
20  
Pb-Free  
(RoHS)  
SSOP  
SSOP  
SSOP  
DB  
DB  
DB  
70  
Green (RoHS  
& no Sb/Br)  
TLC1543IDBG4  
TLC1543IDBLE  
70  
Green (RoHS  
& no Sb/Br)  
Y1543  
TBD  
Addendum-Page 2  
PACKAGE OPTION ADDENDUM  
www.ti.com  
3-Feb-2013  
Orderable Device  
Status Package Type Package Pins Package Qty  
Eco Plan Lead/Ball Finish  
MSL Peak Temp  
Op Temp (°C)  
Top-Side Markings  
Samples  
Drawing  
(1)  
(2)  
(3)  
(4)  
TLC1543IDBR  
TLC1543IDBRG4  
TLC1543IDW  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
SSOP  
SSOP  
SOIC  
SOIC  
SOIC  
SOIC  
PLCC  
PLCC  
PDIP  
PDIP  
DB  
DB  
DW  
DW  
DW  
DW  
FN  
FN  
N
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
2000  
2000  
25  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU SN  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
N / A for Pkg Type  
Y1543  
Green (RoHS  
& no Sb/Br)  
Y1543  
Green (RoHS  
& no Sb/Br)  
TLC1543I  
TLC1543I  
TLC1543I  
TLC1543I  
TLC1543I  
TLC1543I  
TLC1543IN  
TLC1543IN  
TLC1543IDWG4  
TLC1543IDWR  
TLC1543IDWRG4  
TLC1543IFN  
25  
Green (RoHS  
& no Sb/Br)  
2000  
2000  
46  
Green (RoHS  
& no Sb/Br)  
Green (RoHS  
& no Sb/Br)  
Green (RoHS  
& no Sb/Br)  
TLC1543IFNG3  
TLC1543IN  
46  
Green (RoHS  
& no Sb/Br)  
CU SN  
20  
Pb-Free  
(RoHS)  
CU NIPDAU  
CU NIPDAU  
TLC1543INE4  
N
20  
Pb-Free  
(RoHS)  
N / A for Pkg Type  
TLC1543QDB  
ACTIVE  
ACTIVE  
SSOP  
SSOP  
DB  
DB  
20  
20  
70  
70  
TBD  
CU NIPDAU  
CU NIPDAU  
Level-1-220C-UNLIM  
Level-1-260C-UNLIM  
-40 to 125 1543Q  
-40 to 125 1543Q  
TLC1543QDBG4  
Green (RoHS  
& no Sb/Br)  
TLC1543QDBR  
TLC1543QDBRG4  
TLC1543QDW  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
SSOP  
SSOP  
SOIC  
SOIC  
SOIC  
SOIC  
DB  
DB  
20  
20  
20  
20  
20  
20  
2000  
2000  
25  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
-40 to 125 1543Q  
Green (RoHS  
& no Sb/Br)  
-40 to 125 1543Q  
DW  
DW  
DW  
DW  
Green (RoHS  
& no Sb/Br)  
-40 to 125 TLC1543Q  
-40 to 125 TLC1543Q  
-40 to 125 TLC1543Q  
-40 to 125 TLC1543Q  
TLC1543QDWG4  
TLC1543QDWR  
TLC1543QDWRG4  
25  
Green (RoHS  
& no Sb/Br)  
2000  
2000  
Green (RoHS  
& no Sb/Br)  
Green (RoHS  
& no Sb/Br)  
Addendum-Page 3  
PACKAGE OPTION ADDENDUM  
www.ti.com  
3-Feb-2013  
Orderable Device  
TLC1543QFN  
Status Package Type Package Pins Package Qty  
Eco Plan Lead/Ball Finish  
MSL Peak Temp  
Op Temp (°C)  
Top-Side Markings  
Samples  
Drawing  
(1)  
(2)  
(3)  
(4)  
ACTIVE  
PLCC  
FN  
20  
46  
Green (RoHS  
& no Sb/Br)  
CU SN  
Level-1-260C-UNLIM  
-40 to 125 TLC1543Q  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability  
information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that  
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between  
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight  
in homogeneous material)  
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) Only one of markings shown within the brackets will appear on the physical device.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
OTHER QUALIFIED VERSIONS OF TLC1543 :  
Enhanced Product: TLC1543-EP  
NOTE: Qualified Version Definitions:  
Enhanced Product - Supports Defense, Aerospace and Medical Applications  
Addendum-Page 4  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
26-Mar-2013  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
TLC1542CDWR  
TLC1542IDWR  
TLC1543CDBR  
TLC1543IDBR  
SOIC  
SOIC  
SSOP  
SSOP  
SSOP  
SSOP  
SOIC  
DW  
DW  
DB  
DB  
DB  
DB  
DW  
20  
20  
20  
20  
20  
20  
20  
2000  
2000  
2000  
2000  
2000  
2000  
2000  
330.0  
330.0  
330.0  
330.0  
330.0  
330.0  
330.0  
24.4  
24.4  
16.4  
16.4  
16.4  
16.4  
24.4  
10.8  
10.8  
8.2  
13.3  
13.3  
7.5  
2.7  
2.7  
2.5  
2.5  
2.5  
2.5  
2.7  
12.0  
12.0  
12.0  
12.0  
12.0  
12.0  
12.0  
24.0  
24.0  
16.0  
16.0  
16.0  
16.0  
24.0  
Q1  
Q1  
Q1  
Q1  
Q1  
Q1  
Q1  
8.2  
7.5  
TLC1543QDBR  
TLC1543QDBRG4  
TLC1543QDWR  
8.2  
7.5  
8.2  
7.5  
10.8  
13.3  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
26-Mar-2013  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SPQ  
Length (mm) Width (mm) Height (mm)  
TLC1542CDWR  
TLC1542IDWR  
TLC1543CDBR  
TLC1543IDBR  
SOIC  
SOIC  
SSOP  
SSOP  
SSOP  
SSOP  
SOIC  
DW  
DW  
DB  
DB  
DB  
DB  
DW  
20  
20  
20  
20  
20  
20  
20  
2000  
2000  
2000  
2000  
2000  
2000  
2000  
367.0  
367.0  
367.0  
367.0  
367.0  
367.0  
367.0  
367.0  
367.0  
367.0  
367.0  
367.0  
367.0  
367.0  
45.0  
45.0  
38.0  
38.0  
38.0  
38.0  
45.0  
TLC1543QDBR  
TLC1543QDBRG4  
TLC1543QDWR  
Pack Materials-Page 2  
MECHANICAL DATA  
MPLC004A – OCTOBER 1994  
FN (S-PQCC-J**)  
PLASTIC J-LEADED CHIP CARRIER  
20 PIN SHOWN  
Seating Plane  
0.004 (0,10)  
0.180 (4,57) MAX  
0.120 (3,05)  
D
0.090 (2,29)  
D1  
0.020 (0,51) MIN  
3
1
19  
0.032 (0,81)  
0.026 (0,66)  
4
18  
D2/E2  
D2/E2  
E
E1  
8
14  
0.021 (0,53)  
0.013 (0,33)  
0.050 (1,27)  
9
13  
0.007 (0,18)  
M
0.008 (0,20) NOM  
D/E  
D1/E1  
D2/E2  
NO. OF  
PINS  
**  
MIN  
0.385 (9,78)  
MAX  
MIN  
MAX  
MIN  
MAX  
0.395 (10,03)  
0.350 (8,89)  
0.356 (9,04)  
0.141 (3,58)  
0.191 (4,85)  
0.291 (7,39)  
0.341 (8,66)  
0.169 (4,29)  
0.219 (5,56)  
0.319 (8,10)  
0.369 (9,37)  
20  
28  
44  
52  
68  
84  
0.485 (12,32) 0.495 (12,57) 0.450 (11,43) 0.456 (11,58)  
0.685 (17,40) 0.695 (17,65) 0.650 (16,51) 0.656 (16,66)  
0.785 (19,94) 0.795 (20,19) 0.750 (19,05) 0.756 (19,20)  
0.985 (25,02) 0.995 (25,27) 0.950 (24,13) 0.958 (24,33) 0.441 (11,20) 0.469 (11,91)  
1.185 (30,10) 1.195 (30,35) 1.150 (29,21) 1.158 (29,41) 0.541 (13,74) 0.569 (14,45)  
4040005/B 03/95  
NOTES: A. All linear dimensions are in inches (millimeters).  
B. This drawing is subject to change without notice.  
C. Falls within JEDEC MS-018  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
MECHANICAL DATA  
MSSO002E – JANUARY 1995 – REVISED DECEMBER 2001  
DB (R-PDSO-G**)  
PLASTIC SMALL-OUTLINE  
28 PINS SHOWN  
0,38  
0,22  
0,65  
28  
M
0,15  
15  
0,25  
0,09  
5,60  
5,00  
8,20  
7,40  
Gage Plane  
1
14  
0,25  
A
0°ā8°  
0,95  
0,55  
Seating Plane  
0,10  
2,00 MAX  
0,05 MIN  
PINS **  
14  
16  
20  
24  
28  
30  
38  
DIM  
6,50  
5,90  
6,50  
5,90  
7,50  
8,50  
7,90  
10,50  
9,90  
10,50 12,90  
A MAX  
A MIN  
6,90  
9,90  
12,30  
4040065 /E 12/01  
NOTES: A. All linear dimensions are in millimeters.  
B. This drawing is subject to change without notice.  
C. Body dimensions do not include mold flash or protrusion not to exceed 0,15.  
D. Falls within JEDEC MO-150  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other  
changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest  
issue. Buyers should obtain the latest relevant information before placing orders and should verify that such information is current and  
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supplied at the time of order acknowledgment.  
TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms  
and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary  
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TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and  
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