TLK1201AIRCP [TI]

ETHERNET TRANSCEIVERS; 以太网收发器
TLK1201AIRCP
型号: TLK1201AIRCP
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

ETHERNET TRANSCEIVERS
以太网收发器

以太网 以太网:16GBASE-T
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TLK1201ARCP, TLK1201AIRCP  
ETHERNET TRANSCEIVERS  
www.ti.com  
SLLS580AFEBRUARY 2004REVISED JUNE 2004  
0.6-Gbps to 1.3-Gbps Serializer/Deserializer  
No External Filter Capacitors Required  
Comprehensive Suite of Built-In Testability  
IEEE 1149.1 JTAG Support  
Low Power Consumption <200 mW at 1.25  
Gbps  
LVPECL Compatible Differential I/O on High  
Speed Interface  
2.5-V Supply Voltage for Lowest Power  
Operation  
Single Monolithic PLL Design  
3.3-V Tolerant on LVTTL Inputs  
Hot Plug Protection  
Support For 10-Bit Interface or Reduced  
Interface 5-Bit DDR (Double Data Rate)  
Clocking  
64-Pin VQFP With Thermally Enhanced  
Package (PowerPAD™)  
Receiver Differential Input Thresholds 200 mV  
Minimum  
CPRI Data Rate Compatible (614 Mbps, 1.22  
Gbps)  
IEEE 802.3 Gigabit Ethernet Compliant  
Industrial Temperature Range Supported:  
–40°C to 85°C  
ANSI X3.230-1994 (FC-PH) Fibre Channel  
Compliant  
Advanced 0.25-µm CMOS Technology  
64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49  
GND  
TD0  
TD1  
TD2  
VDD  
TD3  
TD4  
TD5  
TD6  
JTDI  
48  
47  
46  
45  
44  
43  
42  
1
2
3
4
5
6
7
8
9
SYNC/PASS  
GND  
RD0  
RD1  
RD2  
VDD  
41 RD3  
40 RD4  
39  
38  
37  
36  
35  
34  
33  
VDD 10  
TD7 11  
RD5  
RD6  
VDD  
RD7  
RD8  
RD9  
GND  
12  
TD8  
TD9 13  
14  
15  
16  
GND  
MODESEL  
PRBSEN  
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32  
DESCRIPTION  
The TLK1201A/TLK1201AI gigabit ethernet transceiver provides for ultrahigh-speed, full-duplex, point-to-point  
data transmissions. This device is based on the timing requirements of the 10-bit interface specification by the  
IEEE 802.3 gigabit ethernet specification and is also compliant with the ANSI X3.230-1994 (FC-PH) fibre channel  
standard. The device supports data rates from 0.6 Gbps to 1.3 Gbps.  
The primary application of the transceiver is to provide building blocks for point-to-point baseband data  
transmission over controlled impedance media of 50 or 75 . The transmission media can be printed-circuit  
board traces, copper cables, or fiber-optical media. The ultimate rate and distance of data transfer is dependent  
upon the attenuation characteristics of the media and the noise coupling to the environment.  
PowerPAD is a trademark of Texas Instruments.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2004, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
TLK1201ARCP, TLK1201AIRCP  
ETHERNET TRANSCEIVERS  
www.ti.com  
SLLS580AFEBRUARY 2004REVISED JUNE 2004  
The transceiver performs the data serialization, deserialization, and clock extraction functions for a physical layer  
interface device. The transceiver operates at 1.25 Gbps (typical), providing up to 1 Gbps of data bandwidth over  
a copper or optical media interface.  
The transceiver supports both the defined 10-bit interface (TBI) and a reduced 5-bit interface utilizing double data  
rate (DDR) clocking. In the TBI mode the serializer/deserializer (SERDES) accepts 10-bit wide 8b/10b parallel  
encoded data bytes. The parallel data bytes are serialized and transmitted differentially at PECL compatible  
voltage levels. The SERDES extracts clock information from the input serial stream and deserializes the data,  
outputting a parallel 10-bit data byte.  
In the DDR mode the parallel interface accepts 5-bit wide 8b/10b encoded data aligned on both the rising and  
falling edges of the reference clock. The data is clocked most significant bit first (bits 0–4 of the 8b/10b encoded  
data) on the rising edge of the clock and the least significant bits (bits 5–9 of the 8b/10b encoded data) are  
clocked on the falling edge of the clock.  
The transceiver provides a comprehensive series of built-in tests for self-test purposes including loopback and  
pseudorandom binary sequence (PRBS) generation and verification. An IEEE 1149.1 JTAG port is also  
supported.  
The transceiver is housed in a high-performance, thermally enhanced, 64-pin VQFP PowerPAD package. Use of  
the PowerPAD package does not require any special considerations except to note that the PowerPAD, which is  
an exposed die pad on the bottom of the device, is a metallic thermal and electrical conductor. It is  
recommended that the device PowerPAD be soldered to the thermal land on the board.  
The transceiver is characterized for operation from 0°C to 70°C (TLK1201A) or –40°C to 85°C (TLK1201AI).  
The transceiver uses a 2.5-V supply. The I/O section is 3.3-V compatible. With a 2.5-V supply the chipset is very  
power-efficient, dissipating less than 200 mW typical power when operating at 1.25 Gbps.  
The transceiver is designed to be hot plug capable. A power-on reset causes RBC0, RBC1, the parallel output  
signal terminals, TXP, and TXN to be held in a high-impedance state.  
Differences Between TLK1201A/TLK1201AI and TNETE2201  
The TLK1201A/TLK1201AI transceiver is the functional equivalent of the TNETE2201. There are several  
differences between the devices as noted below. See Figure 12 in the Application Information section for an  
example of a typical application circuit.  
The VCC is 2.5 V for the TLK1201A vs 3.3 V for TNETE2201.  
The PLL filter capacitors on terminals 16, 17, 48, and 49 of the TNETE2201 are no longer required. The  
TLK1201A uses these terminals to provide added test capabilities. The capacitors, if present, do not affect  
the operation of the device.  
No pulldown resistors are required on the TXP/TXN outputs.  
AVAILABLE OPTIONS  
PACKAGE  
TA  
PLASTIC QUAD FLAT PACK (RCP)  
0°C to 70°C  
TLK1201ARCP  
TLK1201AIRCP  
–40°C to 85°C  
2
TLK1201ARCP, TLK1201AIRCP  
ETHERNET TRANSCEIVERS  
www.ti.com  
SLLS580AFEBRUARY 2004REVISED JUNE 2004  
BLOCK DIAGRAM  
PRBSEN  
LOOPEN  
PRBS  
Generator  
TXP  
TXN  
2:1  
MUX  
Parallel to  
Serial  
10 Bit  
Registers  
TD(0-9)  
Clock  
Phase Generator  
REFCLK  
MODESEL  
ENABLE  
TESTEN  
Control  
Logic  
Clock  
2:1  
MUX  
Interpolator  
and  
Clock Extraction  
PRBS  
Verification  
RBC1  
RBC0  
Clock  
SYNC/PASS  
Serial to Parallel  
and  
Comma Detect  
2:1  
MUX  
Data  
RD(0-9)  
RXP  
RXN  
SYNCEN  
LOS  
RBCMODE  
JTMS  
JTAG  
Control  
Register  
JTDO  
JTRSTN  
JTDI  
TCK  
Terminal Functions  
TERMINAL  
NAME  
SIGNAL  
I/O  
DESCRIPTION  
NO.  
MODESEL  
15  
26  
I
Mode select. This terminal selects between the 10-bit interface and a reduced 5-bit DDR  
interface. When low, the 10-bit interface (TBI) is selected. When pulled high, the 5-bit DDR mode  
is selected. The default mode is the TBI.  
P/D(1)  
LOS  
O
Loss of signal. Indicates a loss of signal on the high-speed differential inputs RXP and RXN.  
If the magnitude of RXP-RXN > 150 mV, then LOS = 1 which is a valid input signal.  
If the magnitude of RXP-RXN > 50 mV and < 150 mV, then LOS is undefined.  
If the magnitude of RXP-RXN < 50 mV, then LOS = 0 which is a loss of signal.  
RBCMODE  
32  
I
Receive clock mode select. When RBCMODE and MODESEL are low, half-rate clocks are output  
on RBC0 and RBC1. When MODESEL is low and RBCMODE is high, a full baud-rate clock is  
output on RBC0 and RBC1 is held low. When MODESEL is high, RBCMODE is ignored and a full  
baud-rate clock is output on RBC0 and RBC1 is held low.  
P/D(1)  
RBC0  
RBC1  
31  
30  
O
Receive byte clock. RBC0 and RBC1 are recovered clocks used for synchronizing the 10-bit  
output data on RD0–RD9. The operation of these clocks is dependent upon the receive clock  
mode selected.  
In the half-rate mode, the 10-bit output data words are valid on the rising edges of RBC0 and  
RBC1. These clocks are adjusted to half-word boundaries in conjunction with synchronous  
detect. The clocks are always expanded during data realignment and never slivered or truncated.  
RBC0 registers bytes 1 and 3 of received data. RBC1 registers bytes 0 and 2 of received data.  
In the normal rate mode, only RBC0 is valid and operates at 1/10th the serial data rate. Data is  
aligned to the rising edge.  
In the DDR mode, only RBC0 is valid and operates at 1/10th the serial data rate. Data is aligned  
on both the rising and falling edges.  
(1) P/D = Internal pulldown  
3
TLK1201ARCP, TLK1201AIRCP  
ETHERNET TRANSCEIVERS  
www.ti.com  
SLLS580AFEBRUARY 2004REVISED JUNE 2004  
Terminal Functions (continued)  
TERMINAL  
I/O  
DESCRIPTION  
NAME  
NO.  
RD0–RD9  
45, 44,  
43, 41,  
40, 39,  
38, 36,  
35, 34  
O
Receive data. When in TBI mode (MODESEL = low), these outputs carry 10-bit parallel data  
output from the transceiver to the protocol layer. The data is referenced to terminals RBC0 and  
RBC1, depending on the receive clock mode selected. RD0 is the first bit received.When in the  
DDR mode (MODESEL = high), only RD0–RD4 are valid. RD5–RD9 are held low. The 5-bit  
parallel data is clocked out of the transceiver on the rising edge of RBC0.  
REFCLK  
22  
I
Reference clock. REFCLK is an external input clock that synchronizes the receiver and  
transmitter interface (60 MHz to 130 MHz). The transmitter uses this clock to register the input  
data (TD0–TD9) for serialization.In the TBI mode that data is registered on the rising edge of  
REFCLK.  
In the DDR mode, the data is registered on both the rising and falling edges of REFCLK with the  
most significant bits aligned on the rising edge of REFCLK.  
RXP  
RXN  
54  
52  
PECL I  
Differential input receive. RXP and RXN together are the differential serial input interface from a  
copper or an optical I/F module.  
SYNCEN  
24  
I
Synchronous function enable. When SYNCEN is high, the internal synchronization function is  
activated. When this function is activated, the transceiver detects the K28.5 comma character  
(0011111 negative beginning disparity) in the serial data stream and realigns data on byte  
boundaries if required. When SYNCEN is low, serial input data is unframed in RD0–RD9.  
P/U(2)  
SYNC/PASS  
TD0–TD9  
47  
O
I
Synchronous detect. The SYNC output is asserted high upon detection of the comma pattern in  
the serial data path. SYNC pulses are output only when SYNCEN is activated (asserted high). In  
PRBS test mode (PRBSEN = high), SYNC/PASS outputs the status of the PRBS test results  
(high = pass).  
2-4, 6-9,  
11-13  
Transmit data. When in the TBI mode (MODESEL = low) these inputs carry 10-bit parallel data  
output from a protocol device to the transceiver for serialization and transmission. This 10-bit  
parallel data is clocked into the transceiver on the rising edge of REFCLK and transmitted as a  
serial stream with TD0 sent as the first bit.  
When in the DDR mode (MODESEL = high) only TD0–TD4 are valid. The 5-bit parallel data is  
clocked into the transceiver on the rising and falling edge of REFCLK and transmitted as a serial  
stream with TD0 sent as the first bit.  
TXP  
TXN  
62  
61  
PECL  
O
Differential output transmit. TXP and TXN are differential serial outputs that interface to a copper  
or an optical I/F module. TXP and TXN are put in a high-impedance state when LOOPEN is high  
and are active when LOOPEN is low.  
TEST  
ENABLE  
28  
48  
I
When this terminal is low, the device is disabled for Iddq testing. RD0–RD9, RBCn, TXP, and  
TXN are high impedance. The pullup and pulldown resistors on any input are disabled. When  
ENABLE is high, the device operates normally.  
P/U(3)  
JTDI  
I
Test data input. IEEE1149.1 (JTAG)  
P/U(3)  
JTDO  
JTMS  
27  
55  
O
Test data output. IEEE1149.1 (JTAG)  
Test mode select. IEEE1149.1 (JTAG)  
I
P/U(3)  
JTRSTN  
LOOPEN  
56  
19  
I
Reset signal. IEEE1149.1 (JTAG)  
P/U(3)  
I
Loop enable. When LOOPEN is high (active), the internal loop-back path is activated. The  
transmitted serial data is directly routed to the inputs of the receiver. This provides a self-test  
capability in conjunction with the protocol device. The TXP and TXN outputs are held in a  
high-impedance state during the loop-back test. LOOPEN is held low during standard operational  
state with external serial outputs and inputs active.  
P/D(4)  
PRBSEN  
16  
I
PRBS enable. When PRBSEN is high, the PRBS generation circuitry is enabled. The PRBS  
verification circuit in the receive side is also enabled. A PRBS signal can be fed to the receive  
inputs and checked for errors, that are reported by the SYNC/PASS terminal indicating low.  
P/D(4)  
TCK  
49  
17  
I
Test clock. IEEE1149.1 (JTAG)  
Manufacturing test terminal  
TESTEN  
I
P/D(4)  
(2) P/U = Internal pullup  
(3) P/U = Internal pullup  
(4) P/D = Internal pulldown  
4
TLK1201ARCP, TLK1201AIRCP  
ETHERNET TRANSCEIVERS  
www.ti.com  
SLLS580AFEBRUARY 2004REVISED JUNE 2004  
Terminal Functions (continued)  
TERMINAL  
I/O  
DESCRIPTION  
NAME  
POWER  
NO.  
VDD  
5, 10,  
20, 23,  
29, 37,  
42, 50,  
63  
Supply  
Digital logic power. Provides power for all digital circuitry and digital I/O buffers.  
VDDA  
53, 57,  
59, 60  
Supply  
Supply  
Analog power. VDDA provides power for the high-speed analog circuits, receiver, and transmitter  
PLL power. Provides power for the PLL circuitry. This terminal requires additional filtering.  
VDDPLL  
GROUND  
GND  
18  
1, 14,  
21,25,  
33, 46  
Ground  
Digital logic ground. Provides a ground for the logic circuits and digital I/O buffers.  
GNDA  
51, 58  
64  
Ground  
Ground  
Analog ground. GNDA provides a ground for the high-speed analog circuits RX and TX.  
PLL ground. Provides a ground for the PLL circuitry.  
GNDPLL  
DETAILED DESCRIPTION  
Data Transmission  
This device supports both the defined 10-bit interface (TBI) and a reduced 5-bit interface utilizing DDR clocking.  
When MODESEL is low, the TBI mode is selected. When MODESEL is high, the DDR mode is selected.  
In the TBI mode, the transmitter portion registers incoming 10-bit wide data words (8b/10b encoded data,  
TD0–TD9) on the rising edge of REFCLK. The REFCLK is also used by the serializer, which multiplies the clock  
by a factor of 10, providing a signal that is fed to the shift register. The 8b/10b encoded data is transmitted  
sequentially bits 0 through 9 over the differential high-speed I/O channel.  
In the DDR mode, the transmitter accepts 5-bit wide 8b/10b encoded data on pins TD0–TD4. In this mode, data  
is aligned to both the rising and falling edges of REFCLK. The data is then formed into a 10-bit wide word and  
sent to the serializer. The rising edge REFCLK clocks in bits 0–4, and the falling edge of REFCLK clocks in bits  
5–9. Bit 0 is the first bit transmitted.  
Transmission Latency  
Data transmission latency is defined as the delay from the initial 10-bit word load to the serial transmission of bit  
9. The minimum latency in TBI mode is 19 bit times. The maximum latency in TBI mode is 20 bit times. The  
minimum latency in DDR mode is 29 bit times, and maximum latency in DDR mode is 30 bit times.  
Measured 10-Bits  
Next 10-Bit Code  
TXP, TXN  
b7 b8 b9 b0 b1 b2 b3  
t
d(Tx latency)  
10-Bit Code  
TD(0−9)  
REFCLK  
Figure 1. Transmitter Latency Full Rate Mode  
5
 
TLK1201ARCP, TLK1201AIRCP  
ETHERNET TRANSCEIVERS  
www.ti.com  
SLLS580AFEBRUARY 2004REVISED JUNE 2004  
DETAILED DESCRIPTION (continued)  
Data Reception  
The receiver portion deserializes the differential serial data. The serial data is retimed based on an interpolated  
clock generated from the reference clock. The serial data is then aligned to the 10-bit word boundaries and  
presented to the protocol controller along with receive byte clocks (RBC0 and RBC1).  
Receiver Clock Select Mode  
There are two modes of operation for the parallel bus: 1) the 10-bit (TBI) mode and 2) 5-bit (DDR) mode. When  
in TBI mode, there are two user-selectable clock modes that are controlled by the RBCMODE terminal: 1)  
full-rate clock on RBC0 and 2) half-rate clocks on RBC0 and RBC1. When in the DDR mode, only a full-rate  
clock is available on RBC0; see Table 1.  
Table 1. Mode Selection  
RECEIVE BYTE CLOCK  
MODESEL RBCMODE  
MODE  
TLK1201A  
TBI half-rate 30–65 MHz  
TLK1201AI  
0
0
1
1
0
1
0
1
30–65 MHz  
TBI full-rate 60–130 MHz 60–130 MHz  
DDR  
DDR  
60–130 MHz 60–130 MHz  
60–130 MHz 60–130 MHz  
In the half-rate mode, two receive byte clocks (RBC0 and RBC1) are 180 degrees out of phase and operate at  
one-half the data rate. The clocks are generated by dividing down the recovered clock. The received data is  
output with respect to the two receive byte clocks (RBC0 and RBC1) allowing a protocol device to clock the  
parallel bytes using the RBC0 and RBC1 rising edges. The outputs to the protocol device, byte 0 of the received  
data is valid on the rising edge of RBC1. See the timing diagram shown in Figure 2.  
t
d(S)  
RBC0  
RBC1  
SYNC  
t
d(S)  
t
d(H)  
t
d(H)  
RD(0-9)  
K28.5  
DXX.X  
DXX.X  
DXX.X  
K28.5  
DXX.X  
Figure 2. Synchronous Timing Characteristics Waveforms (TBI Half-Rate Mode)  
In the normal-rate mode, only RBC0 is used and operates at full data rate (that is, 1.25-Gbps data rate produces  
a 125-MHz clock). The received data is output with respect to the rising edge of RBC0. RBC1 is low in this  
mode. See the timing diagram shown in Figure 3.  
RBC0  
t
t
d(H)  
d(S)  
SYNC  
RD(0-9)  
K28.5  
DXX.X  
DXX.X  
DXX.X  
K28.5  
DXX.X  
Figure 3. Synchronous Timing Characteristics Waveforms (TBI Full-Rate Mode)  
6
 
 
TLK1201ARCP, TLK1201AIRCP  
ETHERNET TRANSCEIVERS  
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In the double data rate mode, the receiver presents the data on both the rising and falling edges of RBC0. RBC1  
is low impedance. The data is clocked bit 0 first, and aligned to the rising edge of RBC0. See the timing diagram  
shown in Figure 4.  
t
d(S)  
RBC0  
t
d(S)  
t
d(H)  
t
d(H)  
SYNC  
RD(0-4)  
K28.5  
K28.5 DXX.X DXX.X DXX.X DXX.X DXX.X DXX.X K28.5 K28.5 DXX.X  
Bits 0-4 Bits 5-9  
Figure 4. Synchronous Timing Characteristics Waveforms (DDR Mode)  
The receiver clock interpolator can lock to the incoming data without the need for a lock-to-reference preset. The  
received serial data rate (RXP and RXN) is at the same baud rate as the transmitted data stream, ±0.02% (200  
PPM) for proper operation (see the recommended operating tables).  
Receiver Word Alignment  
This device uses the IEEE 802.3 gigabit ethernet defined 10-bit K28.5 character (comma character) word  
alignment scheme. The following sections explain how this scheme works and how it realigns itself.  
Comma Character on Expected Boundary  
This device provides 10-bit K28.5 character recognition and word alignment. The 10-bit word alignment is  
enabled by forcing the SYNCEN terminal high. This enables the function that examines and compares serial  
input data to the 7-bit synchronization pattern. The K28.5 character is defined by 8-bit/10-bit coding scheme as a  
pattern consisting of 0011111010 (a negative number beginning with disparity) with the 7 MSBs (0011111),  
referred to as the comma character. The K28.5 character was implemented specifically for aligning data words.  
As long as the K28.5 character falls within the expected 10-bit boundary, the received 10-bit data is properly  
aligned and data realignment is not required. Figure 2 shows the timing characteristics of RBC0, RBC1, SYNC,  
and RD0–RD9 while synchronized. (Note: the K28.5 character is valid on the rising edge of RBC1.)  
Comma Character Not on Expected Boundary  
If synchronization is enabled and a K28.5 character straddles the expected 10-bit word boundary, then word  
realignment is necessary. Realignment or shifting the 10-bit word boundary truncates the character following the  
misaligned K28.5, but the following K28.5 and all subsequent data is aligned properly as shown in Figure 5. The  
RBC0 and RBC1 pulse widths are stretched or stalled in their current state during realignment. With this design,  
the maximum stretch that occurs is 20 bit times. This occurs during a worst case scenario when the K28.5 is  
aligned to the falling edge of RBC1 instead of the rising edge. Figure 5 shows the timing characteristics of the  
data realignment.  
7
 
TLK1201ARCP, TLK1201AIRCP  
ETHERNET TRANSCEIVERS  
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31 Bit  
Times  
30 Bit  
Times (Max)  
Max Receive  
Path Latency  
K28.5  
DXX.X  
K28.5  
DXX.X  
DXX.X  
K28.5  
DXX.X  
DXX.X  
INPUT DATA  
RBC0  
RBC1  
Worst Case  
Misaligned K28.5  
Corrupt Data  
DXX.X  
Misalignment Corrected  
DXX.X  
RD(0-9)  
SYNC  
DXX.X  
DXX.X  
K28.5  
DXX.X  
K28.5  
DXX.X  
K28.5  
DXX.X  
Figure 5. Word Realignment Timing Characteristics Waveforms  
Systems that do not require framed data may disable byte alignment by tying SYNCEN low.  
When a SYNC character is detected, the SYNC signal is brought high and is aligned with the K28.5 character.  
The duration of the SYNC pulse is equal to the duration of the data when in TBI mode. When in DDR mode the  
SYNC pulse is present for the entire RBC0 period.  
Data Reception Latency  
The serial-to-parallel data latency is the time from when the first bit arrives at the receiver until it is output in the  
aligned parallel word with RD0 received as first bit. The minimum latency in TBI mode is 21 bit times, and the  
maximum latency is 31 bit times. The minimum latency in DDR mode is 27 bit times and maximum latency is 34  
bit times.  
10-Bit Code  
b0 b1 b2 b3 b4 b5 b6 b7 b8 b9  
RXP, RXN  
t
d(Rx latency)  
RD(0−9)  
RBC0  
10-Bit Code  
Figure 6. Receiver Latency - TBI Normal Mode Shown  
Loss of Signal Detection  
This device has a loss-of-signal (LOS) detection circuit for conditions where the incoming signal no longer has  
sufficient voltage level to keep the clock recovery circuit in lock. The LOS is intended to be an indication of gross  
signal error conditions, such as a detached cable or no signal being transmitted, and not an indication of signal  
coding health. Under a PRBS serial input pattern, LOS is high for signal amplitudes greater than 150 mV. The  
LOS is low for all amplitudes below 50 mV. Between 50 mV and 150 mV, LOS is undetermined.  
8
 
TLK1201ARCP, TLK1201AIRCP  
ETHERNET TRANSCEIVERS  
www.ti.com  
SLLS580AFEBRUARY 2004REVISED JUNE 2004  
Testability  
The loopback function provides for at-speed testing of the transmit/receive portions of the circuitry. The enable  
function allows for all circuitry to be disabled so that an Iddq test can be performed. The PRBS function also  
allows for a BIST (built-in self test). The terminal setting, TESTEN high, enables the test mode. The terminal  
TESTEN has an internal pulldown resistor, so it defaults to normal operation. The TESTEN is only used for  
factory testing, and is not intended for end-user control.  
Loopback Testing  
The transceiver can provide a self-test function by enabling (setting LOOPEN to high level) the internal loopback  
path. Enabling this function causes serial transmitted data to be routed internally to the receiver. The parallel  
data output can be compared to the parallel input data for functional verification. The external differential output  
is held in a high-impedance state during the loopback testing.  
Enable Function  
When held low, ENABLE disables all quiescent power in both the analog and digital circuitry. This allows an  
ultralow-power idle state when the link is not active.  
PRBS Function  
This device has a built-in 27–1 PRBS function. When the PRBSEN control bit is set high, the PRBS test is  
enabled. A PRBS is generated and fed into the 10-bit parallel transmitter input bus. Data from the normal parallel  
input source is ignored during PRBS test mode. The PRBS pattern is then fed through the transmit circuitry as if  
it were normal data and sent out to the transmitter. The output can be sent to a bit error rate tester (BERT) or to  
the receiver of another TLK1201AI. Since the PRBS is not really random and is really a predetermined sequence  
of 1s and 0s, the data can be captured and checked for errors by a BERT. This device also has a built-in BERT  
function on the receiver side that is enabled by PRBSEN. It can receive a PRBS pattern and check for errors,  
and then reports the errors by forcing the SYNC/PASS terminal low. The PRBS testing supports two modes  
(normal and latched), which are controlled by the SYNCEN input. When SYNCEN is low, the result of the PRBS  
bit error rate test is passed to the SYNC/PASS terminal. When SYNCEN is high the result of the PRBS  
verification is latched on the SYNC/PASS output (that is, a single failure forces SYNC/PASS to remain low).  
ABSOLUTE MAXIMUM RATINGS(1)  
over operating free-air temperature range (unless otherwise noted)  
TLK1201A/TLK1201AI  
(2)  
Supply voltage, VDD (see  
)
–0.3 V to 3 V  
–0.5 V to 4 V  
Input voltage range at TTL terminals, VI  
Input voltage range at any other terminal  
Storage temperature, Tstg  
–0.3 V to VDD +0.3 V  
–65°C to 150°C  
Electrostatic discharge  
CDM: 1 kV, HBM:2 kV  
0°C to 70°C  
TLK1201A  
TLK1201AI  
Characterized free-air operating temperature range  
–40°C to 85°C  
(1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings  
only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating  
conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
(2) All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.  
9
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DISSIPATION RATING TABLE  
TA25°C  
PACKAGE  
OPERATING FACTOR(1)  
TA = 70°C  
POWER RATING  
POWER RATING  
ABOVE TA = 25°C  
RCP64(2)  
RCP64(3)  
RCP64(4)  
5.25 W  
3.17 W  
2.01 W  
46.58 mW/°C  
23.70 mW/°C  
13.19 mW/°C  
2.89 W  
1.74 W  
1.11 W  
(1) This is the inverse of the traditional junction-to-ambient thermal resistance (RΘJA).  
(2) 2 oz. Trace and copper pad with solder  
(3) 2 oz. Trace and copper pad without solder  
(4) Standard JEDEC high-K board  
Thermal Characteristics  
PARAMETER  
TEST CONDITION  
MIN  
TYP  
MAX UNIT  
Board-mounted, no air flow, high conductivity TI rec-  
ommended test board, chip soldered or greased to thermal  
land  
21.47  
Junction-to-free-air thermal re-  
sistance  
RΘJA  
Board-mounted, no air flow, high conductivity TI rec-  
ommended test board with thermal land but no solder or  
grease thermal connection to thermal land  
°C/W  
42.2  
75.83  
0.38  
Board-mounted, no air flow, JEDEC test board  
Board-mounted, no air flow, high conductivity TI rec-  
ommended test board, chip soldered or greased to thermal  
land  
Junction-to-case-thermal resist-  
ance  
RΘJC  
Board-mounted, no air flow, high conductivity TI rec-  
ommended test board with thermal land but no solder or  
grease thermal connection to thermal land  
°C/W  
0.38  
7.8  
Board-mounted, no air flow, JEDEC test board  
RECOMMENDED OPERATING CONDITIONS  
MIN NOM  
MAX UNIT  
Supply voltage, VDD, VDD(A)  
2.3  
2.5  
2.7  
90  
V
Total supply current, IDD, IDD(A)  
Frequency = 1.25 Gbps, PRBS pattern  
mA  
mW  
mW  
µA  
Frequency = 1.25 Gbps, PRBS pattern  
Frequency = 1.25 Gbps, worst case(1)  
Enable = 0, VDD(A), VDD = 2.7 V  
VDD, VDD(A) = 2.5 V, ENto PLL acquire  
TLK1201A  
250  
Total power dissipation, PD  
245  
50  
Total shutdown current, IDD, IDD(A)  
Startup lock time, PLL  
500  
70  
µs  
0
Operating free-air temperature, TA  
°C  
TLK1201AI  
-40  
85  
(1) The worst case pattern is a pattern that creates a maximum transition density on the serial transceiver.  
REFERENCE CLOCK (REFCLK) TIMING REQUIREMENTS  
over recommended operating conditions (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
TLK1201A  
MIN  
TYP–0.01%  
TYP–0.01%  
TYP–0.01%  
100  
TYP  
MAX UNIT  
60  
60  
TYP+0.01%  
TYP+0.01%  
TYP+0.01%  
100  
Frequency  
Minimum data rate  
Maximum data rate  
TLK1201AI  
MHz  
ppm  
ps  
Frequency  
Accuracy  
Duty cycle  
Jitter  
130  
40%  
50%  
60%  
Random plus deterministic  
40  
10  
TLK1201ARCP, TLK1201AIRCP  
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TTL ELECTRICAL CHARACTERISTICS  
over recommended operating conditions (unless otherwise noted)  
PARAMETER  
High-level output voltage  
Low-level output voltage  
High-level input voltage  
Low-level input voltage  
High-level Input current  
Low-level Input current  
Input capacitance  
TEST CONDITIONS  
MIN  
VDD–0.2  
GND  
TYP  
2.3  
MAX UNIT  
VOH  
VOL  
VIH  
VIL  
IIH  
IOH= –400 µA  
IOL= 1 mA  
V
0.25  
0.5  
3.6  
0.8  
40  
V
V
1.7  
V
VDD= 2.3 V, VIN = 2 V  
VDD= 2.3 V, VIN = 0.4 V  
µA  
µA  
pF  
IIL  
–40  
CIN  
4
11  
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TRANSMITTER/RECEIVER CHARACTERISTICS  
PARAMETER  
TEST CONDITIONS  
MIN  
600  
800  
TYP  
MAX UNIT(1)  
Rt = 50Ω  
850  
1100  
1200  
VOD = |TxD-TxN|  
mV  
mV  
Rt = 75 Ω  
Rt = 50Ω  
Rt = 75 Ω  
1050  
V(cm)  
Transmit common mode voltage range  
1100  
200  
1250  
1250  
1400  
Receiver input voltage requirement,  
VID = |RxP - RxN|  
1600  
2250  
mV  
mV  
Receiver common mode voltage range, (RxP  
+ RxN)/2  
1000  
-350  
Ilkg(R)  
CI  
Receiver input leakage current  
Receiver input capacitance  
350  
2
µA  
pF  
Differential output jitter, Random +  
deterministic, PRBS pattern,  
Rω = 125 MHz  
0.24  
0.2  
UI  
UI  
t(TJ)  
Serial data total jitter (peak-to-peak)  
Differential output jitter, Random +  
deterministic, PRBS pattern,  
Rω = 106.25 MHz  
Differential output jitter, PRBS pattern,  
Rω = 125 MHz  
t(DJ)  
tr, tf  
Serial data deterministic jitter (peak-to-peak)  
Differential signal rise, fall time (20% to 80%)  
0.10  
250  
UI  
ps  
UI  
RL = 50 , CL = 5 pF, See NoLabel  
and NoLabel  
100  
Differential input jitter, Random +  
deterministic, Rω = 125 MHz  
0.25  
Serial data jitter tolerance minimum required  
eye opening, (per IEEE-802.3 specification)  
Differential input jitter, random +  
determinisitc, PRBS pattern at zero  
crossing  
0.3  
UI  
µs  
Receiver data acquisition lock time from  
powerup  
500  
Data relock time from loss of synchronization  
1024 Bit times  
TBI modes  
See Figure 1  
See Figure 6  
19  
29  
20  
27  
24  
27  
25  
27  
20  
UI  
30  
td(Txlatency)  
Tx latency  
DDR mode  
TBI modes  
DDR mode  
31  
34  
TBI mode  
600–620 Mbps  
600–620 Mbps  
1228.8 Mbps  
1228.8 Mbps  
28  
UI  
31  
td(Rxlatency)  
Rx latency  
DDR mode  
TBI mode  
29  
33  
DDR mode  
(1) UI = serial bit time  
V
80%  
50%  
TX+  
20%  
V
t
f
t
r
V
80%  
50%  
TX−  
V
20%  
t
f
t
r
1V  
80%  
20%  
0 V  
VOD  
−1V  
Figure 7. Differential and Common-Mode Output Voltage Definitions  
12  
TLK1201ARCP, TLK1201AIRCP  
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C
5 pF  
L
50  
50 Ω  
C
L
5 pF  
Figure 8. Transmitter Test Setup  
LVTTL OUTPUT SWITCHING CHARACTERISTICS  
over recommended operating conditions (unless otherwise noted)  
PARAMETER  
Clock rise time  
TEST CONDITIONS  
MIN  
0.3  
0.3  
0.3  
0.3  
TYP  
MAX UNIT  
tr(RBC)  
1.5  
ns  
tf(RBC)  
Clock fall time  
Data rise time  
Data fall time  
1.5  
80% to 20% output voltage, C = 5 pF (see  
Figure 9)  
tr  
tf  
1.5  
ns  
1.5  
Data setup time (RD0–RD9), Data  
valid prior to RBC0 rising  
tsu(D1)  
th(D1)  
TBI normal mode, (see Figure 3)  
TBI normal mode, (see Figure 3)  
2.5  
2
ns  
ns  
Data hold time (RD0–RD9), Data valid  
after RBC0 rising  
tsu(D2)  
th(D2)  
tsu(D3)  
th(D3)  
Data setup time (RD0–RD4)  
Data hold time (RD0–RD4)  
Data setup time (RD0–RD9)  
Data hold time (RD0–RD9)  
DDR mode, Rω = 125 MHz, (see Figure 4)  
DDR mode, Rω = 125 MHz, (see Figure 4)  
TBI half-rate mode, Rω = 125 MHz, (see Figure 2)  
TBI half-rate mode, Rω = 125 MHz, (see Figure 2)  
2
0.8  
2.5  
1.5  
ns  
ns  
ns  
ns  
1.4 V  
CLOCK  
DATA  
t
t
r
f
2 V  
80%  
50%  
20%  
0.8 V  
t
f
t
r
Figure 9. TTL Data I/O Valid Levels for AC Measurement  
TRANSMITTER TIMING REQUIREMENTS  
over recommended operating conditions (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
1.6  
0.8  
0.7  
0.5  
TYP  
MAX  
UNIT  
tsu(D4)  
th(D4)  
tsu(D5)  
th(D5)  
tr, tf  
Data setup time (TD0–TD9)  
Data hold time (TD0–TD9)  
Data setup time (TD0–TD9)  
Data hold time (TD0–TD9)  
TD[0,9] data rise and fall time  
TBI modes  
ns  
DDR modes  
See Figure 9  
ns  
ns  
2
13  
 
TLK1201ARCP, TLK1201AIRCP  
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APPLICATION INFORMATION  
8B/10B TRANSMISSION CODE  
The PCS maps GMII signals into 10-bit code groups and vice versa, using an 8b/10b block coding scheme. The  
PCS uses the transmission code to improve the transmission characteristics of information to be transferred  
across the link. The encoding defined by the transmission code ensures that sufficient transitions are present in  
the PHY bit stream to make clock recovery possible in the receiver. Such encoding also greatly increases the  
likelihood of detecting any single or multiple bit errors that may occur during transmission and reception of  
information. The 8b/10b transmission code specified for use has a high-transition density, is run length limited,  
and is dc-balanced. The transition density of the 8b/10b symbols range from 3 to 8 transitions per symbol. The  
definition of the 8b/10b transmission code is specified in IEEE 802.3 gigabit ethernet and ANSI X3.230-1994  
(FC-PH), clause 11.  
The 8b/10b transmission code uses letter notation describing the bits of an unencoded information octet. The bit  
notation of A,B,C,D,E,F,G,H for an unencoded information octet is used in the description of the 8b/10b  
transmission code-groups, where A is the LSB. Each valid code group has been given a name using the  
following convention: /Dx.y/ for the 256 valid data code-groups and /Kx.y/ for the special control code-groups,  
where y is the decimal value of bits EDCBA and x is the decimal value of bits HGF (noted as K<HGF.EDCBA>).  
Thus, an octet value of FE representing a code-group value of K30.7 would be represented in bit notation as 111  
11110.  
V
DD  
5 k  
TXP  
Z
O
RXP  
7.5 kΩ  
Z
Z
O
GND  
VDD  
+
_
O
5 kΩ  
Z
O
TXN  
RXN  
7.5 kΩ  
GND  
Receiver  
Transmitter  
Media  
Figure 10. High-Speed I/O Directly-Coupled Mode  
14  
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APPLICATION INFORMATION (continued)  
V
DD  
5 k  
TXP  
Z
O
RXP  
7.5 kΩ  
Z
Z
O
GND  
VDD  
+
_
O
5 kΩ  
Z
O
TXN  
RXN  
7.5 kΩ  
GND  
Receiver  
Transmitter  
Media  
Figure 11. High-Speed I/O AC-Coupled Mode  
15  
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APPLICATION INFORMATION (continued)  
5 at 100 MHz  
0.01 µF  
2.5 V  
2.5 V  
18  
VDD VDDA  
VDDPLL  
64  
GND  
GNDPLL  
GNDA  
TLK1201AI  
TLK1201AII  
17  
22  
TESTEN  
10  
Controlled Impedance  
Transmission Line  
62  
61  
TD0-TD9  
REFCLK  
PRBSEN  
TXP  
TXN  
16  
19  
LOOPEN  
SYNCEN  
24  
47  
Controlled Impedance  
Transmission Line  
Host  
Protocol  
Device  
SYNC/PASS  
RD0-RD9  
10  
2
RBC0-RBC1  
ENABLE  
28  
Controlled Impedance  
Transmission Line  
54  
RXP  
26  
32  
LOS  
50 Ω  
50 Ω  
R
t
RBCMODE  
MODESEL  
TCK  
15  
49  
55  
48  
56  
R
t
Controlled Impedance  
Transmission Line  
52  
RXN  
JTMS  
JTAG  
Controller  
JTDI  
JTRSTN  
JTDO  
27  
Figure 12. Typical Application Circuit (AC mode)  
DESIGNING WITH PowerPAD  
The TLK1201A/TLK1201AI is housed in a high-performance, thermally enhanced, 64-pin VQFP (RCP64)  
PowerPAD package. Use of the PowerPAD package does not require any special considerations except to note  
that the PowerPAD, which is an exposed die pad on the bottom of the device, is a metallic thermal and electrical  
conductor. Therefore, if not implementing PowerPAD PCB features, the use of solder masks (or other assembly  
techniques) may be required to prevent any inadvertent shorting by the exposed PowerPAD of connection etches  
or vias under the package. It is strongly recommended that the PowerPAD be soldered to the thermal land. The  
recommended convention, however, is to not run any etches or signal vias under the device, but to have only a  
grounded thermal land as explained below. Although the actual size of the exposed die pad may vary, the  
minimum size required for the keepout area for the 64-pin PFP PowerPAD package is 8 mm × 8 mm.  
It is recommended that there be a thermal land, which is an area of solder-tinned-copper, underneath the  
PowerPAD package. The thermal land varies in size depending on the PowerPAD package being used, the PCB  
construction, and the amount of heat that needs to be removed. In addition, the thermal land may or may not  
contain numerous thermal vias depending on PCB construction.  
16  
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APPLICATION INFORMATION (continued)  
Other requirements for thermal lands and thermal vias are detailed in the TI application note PowerPAD  
Thermally Enhanced Package Application Report, TI literature number SLMA002, available via the TI Web pages  
beginning at URL: http://www.ti.com.  
Figure 13. Example of a Thermal Land  
For the TLK1201AI, this thermal land must be grounded to the low-impedance ground plane of the device. This  
improves not only thermal performance but also the electrical grounding of the device. It is also recommended  
that the device ground terminal landing pads be connected directly to the grounded thermal land. The land size  
must be as large as possible without shorting device signal terminals. The thermal land may be soldered to the  
exposed PowerPAD using standard reflow soldering techniques.  
While the thermal land may be electrically floated and configured to remove heat to an external heat sink, it is  
recommended that the thermal land be connected to the low-impedance ground plane for the device. More  
information may be obtained from the TI application note PHY Layout, TI literature number SLLA020.  
17  
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MECHANICAL DATA  
RCP (S-PQFP-G84)  
PowerPAD™ PLASTIC QUAD FLATPACK  
0,27  
M
0,08  
0,50  
48  
0,17  
33  
49  
32  
Thermal Pad  
(See Note D)  
64  
17  
0,13 NOM  
1
16  
7,50 TYP  
Gage Plane  
10,20  
SQ  
9,80  
0,25  
12,20  
SQ  
0,15  
0,05  
0° - 7°  
11,80  
0,85  
0,75  
0,75  
0,45  
Seating Plane  
0,08  
1,00 MAX  
4147711/A 10/98  
A. All linear dimensions are in millimeters.  
B. This drawing is subject to change without notice.  
C. Body dimensions do not include mold flash or protrusion.  
D. The package thermal performance may be enhanced by bonding the thermal pad to an external thermal plane. This  
pad is electrically and thermally connected to the backside of the die and possibly selected leads.  
E. Falls within JEDEC MS-026  
#IMPLIED. Dummy target for KhKIz262casm  
#IMPLIED. Dummy target for BhKIz1f4casm  
18  
PACKAGE OPTION ADDENDUM  
www.ti.com  
4-Feb-2005  
PACKAGING INFORMATION  
Orderable Device  
Status (1)  
Package Package  
Pins Package Eco Plan (2) Lead/Ball Finish MSL Peak Temp (3)  
Qty  
Type  
Drawing  
TLK1201AIRCP  
TLK1201AIRCPR  
TLK1201ARCP  
TLK1201ARCPR  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
HVQFP  
HVQFP  
HVQFP  
HVQFP  
RCP  
64  
64  
64  
64  
160  
1000  
160  
None  
None  
None  
None  
CU NIPDAU Level-3-235C-168 HR  
CU NIPDAU Level-3-235C-168 HR  
CU NIPDAU Level-3-235C-168 HR  
CU NIPDAU Level-3-235C-168 HR  
RCP  
RCP  
RCP  
1000  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in  
a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2)  
Eco Plan - May not be currently available - please check http://www.ti.com/productcontent for the latest availability information and additional  
product content details.  
None: Not yet available Lead (Pb-Free).  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements  
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered  
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean "Pb-Free" and in addition, uses package materials that do not contain halogens,  
including bromine (Br) or antimony (Sb) above 0.1% of total product weight.  
(3)  
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDECindustry standard classifications, and peak solder  
temperature.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is  
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the  
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take  
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on  
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited  
information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI  
to Customer on an annual basis.  
Addendum-Page 1  
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