TM893NBM36A-80 [TI]

8MX36 FAST PAGE DRAM MODULE, 80ns, SMA72, SIMM-72;
TM893NBM36A-80
型号: TM893NBM36A-80
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

8MX36 FAST PAGE DRAM MODULE, 80ns, SMA72, SIMM-72

动态存储器 内存集成电路
文件: 总11页 (文件大小:166K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
TM497MBM36A, TM497MBM36Q 4194304 BY 36-BIT  
TM893NBM36A, TM893NBM36Q 8388608 BY 36-BIT  
DYNAMIC RANDOM-ACCESS MEMORY MODULES  
SMMS653B – MAY 1995 – REVISED JULY 1995  
Organization  
Present Detect  
TM497MBM36A . . . 4194304 × 36  
TM893NBM36A . . . 8388608 × 36  
Operating Free-Air Temperature Range  
0°C to 70°C  
Single 5-V Power Supply (±10% Tolerance)  
Performance Ranges:  
ACCESS ACCESS ACCESS READ  
72-Pin Leadless Single In-Line Memory  
Module (SIMM) for Use With Sockets  
TIME  
TIME  
TIME  
OR  
t
t
t
WRITE  
CYCLE  
RAC  
AA  
CAC  
TM497MBM36A – Utilizes Eight 16-Megabit  
and Four 4-Megabit DRAMs in Plastic  
Small-Outline J-Lead (SOJ) Packages  
(MAX)  
’497MBM36A-60 60 ns  
’497MBM36A-70 70 ns  
’497MBM36A-80 80 ns  
(MAX)  
30 ns  
35 ns  
40 ns  
(MAX)  
15 ns  
18 ns  
20 ns  
(MIN)  
110 ns  
130 ns  
150 ns  
TM893NBM36A – Utilizes Sixteen  
16-Megabit and Eight 4-Megabit DRAMs in  
Plastic Small-Outline J-Lead (SOJ)  
Packages  
’893NBM36A-60 60 ns  
’893NBM36A-70 70 ns  
’893NBM36A-80 80 ns  
30 ns  
35 ns  
40 ns  
15 ns  
18 ns  
20 ns  
110 ns  
130 ns  
150 ns  
Gold-Tabbed Versions Available:  
TM497MBM36A  
Long Refresh Period  
32 ms (2048 Cycles)  
TM893NBM36A  
All Inputs, Outputs, Clocks Fully  
TTL-Compatible  
Tin-Lead (Solder)-Tabbed Versions  
Available:  
3-State Output  
TM497MBM36Q  
Common CAS Control for Nine Common  
Data-In and Data-Out Lines in Four Blocks  
TM893NBM36Q  
Enhanced Page-Mode Operation With  
CAS-Before-RAS (CBR), RAS-Only, and  
Hidden Refresh  
description  
TM497MBM36A  
The TM497MBM36A is a 16-megabyte dynamic random-access memory (DRAM) organized as four times  
4194304 × 9 (bit 9 is generally used for parity) in a 72-pin leadless single in-line memory module (SIMM). The  
SIMM is composed of eight TMS417400DJ 4194304 × 4-bit DRAMs, each in a 24/26-lead plastic small-outline  
J-lead (SOJ) package, and four TMS44100DJ 4194304 × 1-bit DRAMs, each in a 20/26-lead plastic SOJ  
package mounted on a substrate with decoupling capacitors. The TMS417400DJ and TMS44100DJ are  
described in the TMS417400 and TMS44100 data sheets, respectively. The TM497MBM36A SIMM is available  
in the single-sided, BM leadless module for use with sockets.  
TM893NBM36A  
The TM893NBM36A is a 32-megabyte DRAM organized as four times 8388608 × 9 (bit 9 is generally used for  
parity) in a 72-pin leadless SIMM. The SIMM is composed of sixteen TMS417400DJ 4194304 × 4-bit DRAMs,  
each in a 24/26-lead plastic SOJ package, and eight TMS44100DJ 4194304 × 1-bit DRAMs, each in a  
20/26-lead plastic SOJ package, mounted on a substrate with decoupling capacitors. The TMS417400DJ and  
TMS44100DJ are described in the TMS417400 and TMS44100 data sheets, respectively. The TM893NBM36A  
SIMM is available in the double-sided, BM leadless module for use with sockets.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Part numbers in this data sheet refer only to the gold-tabbed version; the information applies to both gold-tabbed and solder-tabbed versions.  
Copyright 1995, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
TM497MBM36A, TM497MBM36Q 4194304 BY 36-BIT  
TM893NBM36A, TM893NBM36Q 8388608 BY 36-BIT  
DYNAMIC RANDOM-ACCESS MEMORY MODULES  
SMMS653B – MAY 1995 – REVISED JULY 1995  
operation  
TM497MBM36A  
The TM497MBM36A operates as eight TMS417400DJs and four TMS44100DJs connected as shown in the  
functionalblockdiagramandinTable1. ThecommonI/Ofeaturedictatestheuseofearly-writecyclestoprevent  
contention on D and Q.  
TM893NBM36A  
The TM893NBM36A operates as sixteen TMS417400DJs and eight TMS44100DJs connected as shown in the  
functionalblockdiagramandinTable1. ThecommonI/Ofeaturedictatestheuseofearly-writecyclestoprevent  
contention on D and Q.  
refresh  
The refresh period is extended to 32 ms, and, during this period, each of the 2048 rows must be strobed with  
RAS in order to retain data. Address line A10 must be used as the most significant refresh address line (lowest  
frequency) to ensure correct refresh for both TMS417400 and TMS44100. Address lines A0A9 must be  
refreshed every 16 ms as required by the TMS44100 DRAM. To conserve power, CAS can remain high during  
the refresh sequence.  
power up  
To achieve proper operation, an initial pause of 200 µs followed by a minimum of eight initialization cycles is  
required after full V  
(RAS-only or CBR-refresh) cycle.  
level is achieved. These eight initialization cycles must include at least one refresh  
CC  
Table 1. Connection Table  
RASx  
DATA BLOCK  
CASx  
CAS0  
CAS1  
CAS2  
CAS3  
SIDE 1  
SIDE 2  
DQ0DQ7  
DQ8  
RAS0  
RAS1  
DQ9DQ16  
DQ17  
RAS0  
RAS2  
RAS1  
RAS3  
RAS3  
DQ18DQ25  
DQ26  
DQ27DQ34  
DQ35  
RAS2  
Side 2 applies to the TM893NBM36A.  
single in-line memory module and components  
PC substrate: 1, 27 ± 0,1 mm (0.05 inch) nominal thickness; inch/inch maximum warpage  
Bypass capacitors: Multilayer ceramic  
Contact area for TM497MBM36A and TM893NBM36A: Nickel plate and gold plate over copper  
Contact area for TM497MBM36Q and TM893NBM36Q: Nickel plate and tin/lead over copper  
2
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
TM497MBM36A, TM497MBM36Q 4194304 BY 36-BIT  
TM893NBM36A, TM893NBM36Q 8388608 BY 36-BIT  
DYNAMIC RANDOM-ACCESS MEMORY MODULES  
SMMS653B – MAY 1995 – REVISED JULY 1995  
TM497MBM36A  
(SIDE VIEW)  
TM893NBM36A  
(SIDE VIEW)  
BM SINGLE IN-LINE PACKAGE  
(TOP VIEW)  
fRnrce  
V
1
2
3
4
SS  
DQ0  
DQ18  
DQ1  
DQ19  
DQ2  
5
6
DQ20  
DQ3  
7
8
DQ21  
9
V
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
31  
32  
33  
34  
35  
36  
CC  
NC  
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A10  
DQ4  
DQ22  
DQ5  
DQ23  
DQ6  
DQ24  
DQ7  
DQ25  
A7  
NC  
V
CC  
A8  
A9  
RAS3  
RAS2  
DQ26  
DQ8  
DQ17  
DQ35  
37  
38  
39  
40  
41  
42  
43  
44  
45  
46  
47  
48  
49  
50  
51  
52  
53  
54  
55  
56  
57  
58  
59  
60  
61  
62  
63  
64  
65  
66  
67  
68  
69  
70  
71  
72  
V
SS  
PIN NOMENCLATURE  
CAS0  
CAS2  
CAS3  
CAS1  
RAS0  
RAS1  
NC  
W
NC  
DQ9  
DQ27  
DQ10  
DQ28  
DQ11  
DQ29  
DQ12  
DQ30  
DQ13  
DQ31  
A0A10  
Address Inputs  
CAS0CAS3  
DQ0DQ35  
NC  
PD1PD4  
RAS0RAS3  
Column-Address Strobe  
Data In/Data Out  
No Connection  
Presence Detects  
Row-Address Strobe  
5-V Supply  
V
V
W
CC  
SS  
Ground  
Write Enable  
V
CC  
PRESENCE DETECT  
DQ32  
DQ14  
DQ33  
DQ15  
DQ34  
DQ16  
NC  
SIGNAL  
(PIN)  
PD1  
(67)  
PD2  
(68)  
PD3  
(69)  
PD4  
(70)  
80 ns  
70 ns  
60 ns  
80 ns  
70 ns  
60 ns  
V
V
V
NC  
NC  
NC  
NC  
V
SS  
SS  
SS  
SS  
TM497MBM36A  
TM893NBM36A  
V
SS  
NC  
NC  
PD1  
PD2  
PD3  
PD4  
NC  
NC  
NC  
NC  
NC  
V
SS  
V
SS  
NC  
NC  
V
V
SS  
NC  
SS  
SS  
V
SS  
V
NC  
3
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
functional block diagram (TM497MBM36A and TM893NBM36A, side 1)  
11  
A0A10  
RAS0  
W
RAS2  
CAS2  
CAS3  
CAS0  
CAS1  
4M × 4  
A0A10  
RAS  
4M × 4  
A0A10  
RAS  
4M × 4  
A0A10  
RAS  
4M × 4  
A0A10  
RAS  
11  
11  
11  
11  
W
W
W
W
CAS  
CAS  
CAS  
CAS  
OE  
DQ1–  
DQ4  
OE  
DQ1–  
DQ4  
OE  
DQ1–  
DQ4  
OE  
DQ1–  
DQ4  
DQ18–  
DQ21  
DQ27–  
DQ30  
DQ0–  
DQ3  
DQ9–  
DQ12  
4M × 4  
A0A10  
RAS  
4M × 4  
A0A10  
RAS  
4M × 4  
A0A10  
RAS  
4M × 4  
A0A10  
RAS  
11  
11  
11  
11  
W
W
W
W
CAS  
CAS  
CAS  
CAS  
OE  
DQ1–  
DQ4  
OE  
DQ1–  
DQ4  
OE  
DQ1–  
DQ4  
OE  
DQ1–  
DQ4  
DQ22–  
DQ25  
DQ31–  
DQ34  
DQ4–  
DQ7  
DQ13–  
DQ16  
4M × 1  
A0A10  
RAS  
W
CAS  
4M × 1  
A0A10  
RAS  
W
CAS  
4M × 1  
A0A10  
RAS  
W
CAS  
4M × 1  
A0A10  
RAS  
W
CAS  
11  
11  
11  
11  
D
Q
DQ26  
D
Q
DQ35  
DQ8  
DQ17  
D
Q
D
Q
functional block diagram (TM893NBM36A, side 2)  
11  
A0A10  
RAS1  
W
RAS3  
CAS2  
CAS3  
CAS0  
CAS1  
4M × 4  
A0A10  
RAS  
4M × 4  
A0A10  
RAS  
4M × 4  
A0A10  
RAS  
4M × 4  
A0A10  
RAS  
11  
11  
11  
11  
W
W
W
W
CAS  
CAS  
CAS  
CAS  
OE  
DQ1–  
DQ4  
OE  
DQ1–  
DQ4  
OE  
DQ1–  
DQ4  
OE  
DQ1–  
DQ4  
DQ18–  
DQ21  
DQ27–  
DQ30  
DQ0–  
DQ3  
DQ9–  
DQ12  
4M × 4  
A0A10  
RAS  
4M × 4  
A0A10  
RAS  
4M × 4  
A0A10  
RAS  
4M × 4  
A0A10  
RAS  
11  
11  
11  
11  
W
W
W
W
CAS  
CAS  
CAS  
CAS  
OE  
DQ1–  
DQ4  
OE  
DQ1–  
DQ4  
OE  
DQ1–  
DQ4  
OE  
DQ1–  
DQ4  
DQ22–  
DQ25  
DQ31–  
DQ34  
DQ4–  
DQ7  
DQ13–  
DQ16  
4M × 1  
A0A10  
RAS  
W
CAS  
4M × 1  
A0A10  
RAS  
W
CAS  
4M × 1  
A0A10  
RAS  
W
CAS  
4M × 1  
A0A10  
RAS  
W
CAS  
11  
11  
11  
11  
D
Q
DQ26  
D
Q
DQ35  
DQ8  
DQ17  
D
Q
D
Q
TM497MBM36A, TM497MBM36Q 4194304 BY 36-BIT  
TM893NBM36A, TM893NBM36Q 8388608 BY 36-BIT  
DYNAMIC RANDOM-ACCESS MEMORY MODULES  
SMMS653B – MAY 1995 – REVISED JULY 1995  
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)  
Supply voltage range, V  
(see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 1 V to 7 V  
CC  
Voltage range on any pin (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 1 V to 7 V  
Short-circuit output current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA  
Power dissipation: TM497MBM36A, TM497MBM36Q . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 W  
TM893NBM36A, TM893NBM36Q . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 W  
Operating free-air temperature range, T  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C  
A
Storage temperature range, T  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 55°C to 125°C  
stg  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
NOTE 1: All voltage values are with respect to V  
.
SS  
recommended operating conditions  
MIN NOM  
MAX UNIT  
V
V
V
Supply voltage  
4.5  
2.4  
– 1  
0
5
5.5  
6.5  
0.8  
70  
V
V
CC  
IH  
IL  
High-level input voltage  
Low-level input voltage (see Note 2)  
Operating free-air temperature  
V
T
A
°C  
NOTE 2: The algebraic convention, where the more negative (less positive) limit is designated as minimum, is used for logic-voltage levels only.  
electrical characteristics over recommended ranges of supply voltage and operating free-air  
temperature (unless otherwise noted)  
’497MBM36A-60 ’497MBM36A-70 ’497MBM36A-80  
PARAMETER  
UNIT  
TEST CONDITIONS  
= – 5 mA  
MIN  
MAX  
MIN  
MAX  
MIN  
MAX  
High-level output  
voltage  
V
V
I
I
2.4  
2.4  
2.4  
V
V
OH  
OH  
Low-level output  
voltage  
= 4.2 mA  
= 5.5 V,  
0.4  
± 10  
± 10  
1300  
0.4  
± 10  
± 10  
1160  
0.4  
± 10  
± 10  
1040  
OL  
OL  
V
V = 0 V to 6.5 V,  
I
Input current  
(leakage)  
CC  
I
I
I
µA  
µA  
mA  
I
All other pins = 0 V to V  
CC  
= 0 V to V  
V
= 5.5 V,  
CC  
CAS high  
V
,
CC  
Output current  
(leakage)  
O
O
Read- or write-cycle  
current  
V
V
= 5.5 V,  
Minimum cycle  
CC1  
CC  
= 2.4 V (TTL),  
After 1 memory cycle,  
RAS and CAS high  
IH  
24  
12  
24  
12  
24  
12  
mA  
mA  
I
Standby current  
CC2  
V
= V  
– 0.2 V (CMOS),  
CC  
IH  
After 1 memory cycle,  
RAS and CAS high  
V
= 5.5 V,  
Minimum cycle,  
Average refresh  
current  
CC  
RAS cycling,  
I
I
1300  
920  
1160  
800  
1040  
680  
mA  
mA  
CC3  
(RAS-only refresh  
or CBR)  
CAS high (RAS-only refresh);  
RAS low after CAS low (CBR)  
V
= 5.5 V,  
t
= MIN,  
Average page  
current  
CC  
RAS low,  
PC  
CAS cycling  
CC4  
For test conditions shown as MIN/MAX, use the appropriate value specified in the timing requirements.  
6
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
TM497MBM36A, TM497MBM36Q 4194304 BY 36-BIT  
TM893NBM36A, TM893NBM36Q 8388608 BY 36-BIT  
DYNAMIC RANDOM-ACCESS MEMORY MODULES  
SMMS653B – MAY 1995 – REVISED JULY 1995  
electrical characteristics over recommended ranges of supply voltage and operating free-air  
temperature (unless otherwise noted) (continued)  
’893NBM36A-60 ’893NBM36A-70 ’893NBM36A-80  
PARAMETER  
UNIT  
TEST CONDITIONS  
= – 5 mA  
MIN  
MAX  
MIN  
MAX  
MIN  
MAX  
High-level output  
voltage  
V
V
I
I
2.4  
2.4  
2.4  
V
V
OH  
OH  
Low-level output  
voltage  
= 4.2 mA  
= 5.5 V,  
0.4  
± 20  
± 20  
0.4  
± 20  
± 20  
0.4  
± 20  
± 20  
OL  
OL  
V
V = 0 V to 6.5 V,  
I
Input current  
(leakage)  
CC  
I
I
µA  
µA  
All other pins = 0 V to V  
CC  
= 0 V to V  
V
= 5.5 V,  
CC  
CAS high  
V
,
CC  
Output current  
(leakage)  
O
I
O
Read- or write-cycle  
current (one RAS  
active, see Note 3)  
I
V
V
= 5.5 V,  
Minimum cycle  
1324  
48  
1184  
48  
1064  
48  
mA  
mA  
mA  
CC1  
CC  
= 2.4 V (TTL),  
IH  
After 1 memory cycle,  
RAS and CAS high  
I
Standby current  
CC2  
V
IH  
= V  
– 0.2 V (CMOS),  
CC  
After 1 memory cycle,  
RAS and CAS high  
24  
24  
24  
V
= 5.5 V,  
Minimum cycle,  
Average refresh  
current  
CC  
RAS cycling,  
I
I
1324  
944  
1184  
824  
1064  
704  
mA  
mA  
CC3  
(RAS only or CBR,  
see Note 3)  
CAS high (RAS-only refresh);  
RAS low after CAS low (CBR)  
Average page  
current  
(one RAS active,  
see Note 4)  
V
= 5.5 V,  
t
= MIN,  
CC  
RAS low,  
PC  
CAS cycling  
CC4  
For test conditions shown as MIN/MAX, use the appropriate value specified in the timing requirements.  
NOTES: 3. Measured with a maximum of one address change while RAS = V  
IL  
4. Measured with a maximum of one address change while CAS = V  
IH  
capacitance over recommended supply voltage range and operating free-air temperature range,  
f = 1 MHz (see Note 5)  
’497MBM36A ’893NMB36A  
PARAMETER  
UNIT  
MIN  
MAX  
60  
42  
21  
84  
7
MIN  
MAX  
120  
42  
C
C
C
C
Input capacitance, A0A10  
Input capacitance, RAS inputs  
Input capacitance, CAS inputs  
pF  
pF  
pF  
pF  
pF  
pF  
i(A)  
i(R)  
i(C)  
i(W)  
42  
Input capacitance, write-enable input  
168  
14  
DQ pins  
C
Output capacitance  
o(DQ)  
Parity pins  
12  
24  
NOTE 5:  
V
CC  
= 5 V ± 0.5 V, and the bias on pins under test is 0 V.  
7
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
TM497MBM36A, TM497MBM36Q 4194304 BY 36-BIT  
TM893NBM36A, TM893NBM36Q 8388608 BY 36-BIT  
DYNAMIC RANDOM-ACCESS MEMORY MODULES  
SMMS653B – MAY 1995 – REVISED JULY 1995  
switching characteristics over recommended ranges of supply voltage and operating free-air  
temperature  
’497MBM36A-60 ’497MBM36A-70 ’497MBM36A-80  
’893NBM36A-60 ’893NBM36A-70 ’893NBM36A-80  
PARAMETER  
UNIT  
MIN  
MAX  
30  
MIN  
MAX  
35  
MIN  
MAX  
40  
t
t
t
t
t
t
t
Access time from column address  
Access time from CAS low  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
AA  
15  
18  
20  
CAC  
RAC  
CPA  
CLZ  
OFF  
OH  
Access time from RAS low  
60  
70  
80  
Access time from column precharge  
CAS low to output in the low-impedance state  
Output disable time after CAS high (see Note 6)  
Output disable time, start of CAS high  
35  
40  
45  
0
0
3
0
0
3
0
0
3
15  
18  
20  
NOTE 6:  
t
is specified when the output is no longer driven.  
OFF  
timing requirements over recommended ranges of supply voltage and operating free-air  
temperature  
’497MBM36A-60 ’497MBM36A-70 ’497MBM36A-80  
’893NBM36A-60 ’893NBM36A-70 ’893NBM36A-80  
UNIT  
MIN  
110  
40  
MAX  
MIN  
130  
45  
MAX  
MIN  
150  
50  
MAX  
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
Cycle time, random read or write (see Note 7)  
Cycle time, page-mode read or write (see Notes 7 and 8)  
Pulse duration, page mode, RAS low  
Pulse duration, nonpage mode, RAS low  
Pulse duration, CAS low  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
RC  
PC  
60 100 000  
70 100 000  
80 100 000  
RASP  
RAS  
CAS  
CP  
60  
15  
10  
40  
10  
0
10 000  
10 000  
70  
18  
10  
50  
10  
0
10 000  
10 000  
80  
20  
10  
60  
10  
0
10 000  
10 000  
Pulse duration, CAS high  
Pulse duration, RAS high (precharge)  
Pulse duration, W low  
RP  
WP  
Setup time, column address before CAS low  
Setup time, row address before RAS low  
Setup time, data before CAS low  
ASC  
ASR  
DS  
0
0
0
0
0
0
Setup time, W high before CAS low  
Setup time, W low before CAS high  
Setup time, W low before RAS high  
Setup time, W low before CAS low  
0
0
0
RCS  
CWL  
RWL  
WCS  
WRP  
CAH  
RHCP  
DH  
15  
15  
0
18  
18  
0
20  
20  
0
Setup time, W high before RAS low (CBR refresh only)  
Hold time, column address after CAS low  
Hold time, RAS high from CAS precharge  
Hold time, data after CAS low  
10  
10  
35  
10  
10  
0
10  
15  
40  
15  
10  
0
10  
15  
45  
15  
10  
0
Hold time, row address after RAS low  
Hold time, W high after CAS high (see Note 9)  
Hold time, W high after RAS high (see Note 9)  
Hold time, W low after CAS low  
RAH  
RCH  
RRH  
WCH  
WRH  
0
0
0
10  
10  
15  
10  
15  
10  
Hold time, W high after RAS low (CBR refresh only)  
NOTES: 7. All cycle times assume t = 5 ns.  
T
8. To assure t  
min, t  
should be t .  
CP  
PC  
or t  
ASC  
must be satisfied for a read cycle.  
RCH  
9. Either t  
RRH  
8
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
TM497MBM36A, TM497MBM36Q 4194304 BY 36-BIT  
TM893NBM36A, TM893NBM36Q 8388608 BY 36-BIT  
DYNAMIC RANDOM-ACCESS MEMORY MODULES  
SMMS653B – MAY 1995 – REVISED JULY 1995  
timing requirements over recommended ranges of supply voltage and operating free-air  
temperature (continued)  
’497MBM36A-60 ’497MBM36A-70 ’497MBM36A-80  
’893NBM36A-60 ’893NBM36A-70 ’893NBM36A-80  
UNIT  
MIN  
10  
5
MAX  
MIN  
10  
5
MAX  
MIN  
10  
5
MAX  
t
t
t
t
t
t
t
t
t
t
t
t
Delay time, RAS low to CAS high (CBR refresh only)  
Delay time, CAS high to RAS low  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ms  
ns  
CHR  
CRP  
CSH  
CSR  
RAD  
RAL  
CAL  
RCD  
RPC  
RSH  
REF  
T
Delay time, RAS low to CAS high  
60  
5
70  
5
80  
5
Delay time, CAS low to RAS low (CBR refresh only)  
Delay time, RAS low to column address (see Note 10)  
Delay time, column address to RAS high  
Delay time, column address to CAS high  
Delay time, RAS low to CAS low (see Note 10)  
Delay time, RAS high to CAS low (CBR refresh only)  
Delay time, CAS low to RAS high  
15  
30  
30  
20  
0
30  
45  
15  
35  
35  
20  
0
35  
52  
15  
40  
40  
20  
0
40  
60  
15  
18  
20  
Refresh time interval  
32  
30  
32  
30  
32  
30  
Transition time  
3
3
3
NOTE 10: The maximum value is specified only to assure access time.  
9
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
TM497MBM36A, TM497MBM36Q 4194304 BY 36-BIT  
TM893NBM36A, TM893NBM36Q 8388608 BY 36-BIT  
DYNAMIC RANDOM-ACCESS MEMORY MODULES  
SMMS653B – MAY 1995 – REVISED JULY 1995  
MECHANICAL DATA  
BM (R-PSIM-N72)  
SINGLE/DOUBLE-SIDED IN-LINE MEMORY MODULE  
4.255 (108,08)  
4.245 (107,82)  
0.054 (1,37)  
0.047 (1,19)  
0.125 (3,18) TYP  
1.305 (33,15)  
1.295 (32,89)  
0.128 (3,25)  
0.120 (3,05)  
0.050 (1,27)  
0.040 (1,02) TYP  
0.010 (0,25) MAX  
0.400 (10,16) TYP  
0.208 (5,28) MAX  
0.360 (9,14) MAX  
4088175/A 4/95  
NOTES: A. All linear dimensions are in inches (millimeters).  
B. This drawing is subject to change without notice.  
device symbolization (TM497MBM36A illustrated)  
TM497MBM36A  
–SS  
YYMMT  
YY = Year Code  
MM = Month Code  
T = Assembly Site Code  
-SS = Speed Code  
NOTE: Location of symbolization may vary.  
10  
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
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any product or service without notice, and advise customers to obtain the latest version of relevant information  
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pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
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CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
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In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
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Copyright 1998, Texas Instruments Incorporated  

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