TMUX1219DCKR [TI]
具有 1.8V 输入逻辑的 5V、2:1 (SPDT)、单通道通用模拟开关 | DCK | 6 | -40 to 125;型号: | TMUX1219DCKR |
厂家: | TEXAS INSTRUMENTS |
描述: | 具有 1.8V 输入逻辑的 5V、2:1 (SPDT)、单通道通用模拟开关 | DCK | 6 | -40 to 125 开关 光电二极管 |
文件: | 总34页 (文件大小:1633K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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TMUX1219
ZHCSJR5 –MAY 2019
TMUX1219 5V 双向、2:1 通用开关
1 特性
3 说明
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轨至轨运行
TMUX1219 是一款通用互补金属氧化物半导体
(CMOS) 单极双投 (SPDT) 开关。TMUX1219 可根据
SEL 引脚的状态在两个输入电源之间切换。1.08V 至
5.5V 的宽电源电压工作范围 可支持 从个人电子设备到
楼宇自动化的各种应用。该器件可在源极 (Sx) 和漏极
(D) 引脚上支持从 GND 到 VDD 范围的双向模拟和数字
信号。4nA 的低电源电流可用于便携式 应用。
双向信号路径
1.8V 逻辑兼容
失效防护逻辑
低导通电阻:3Ω
宽电源电压范围:1.08V 至 5.5V
-40°C 至 +125°C 的工作温度
低电源电流:4nA
转换时间:14ns
所有逻辑输入均具有兼容 1.8V 逻辑的阈值,当器件在
有效电源电压范围内运行时,这些阈值可确保 TTL 和
CMOS 逻辑兼容性。失效防护逻辑 电路允许在电源引
脚之前的控制引脚上施加电压,从而保护器件免受潜在
的损害。
先断后合开关
ESD 保护 HBM:2000V
2 应用
器件信息(1)
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模拟和数字开关
器件型号
TMUX1219
封装
SC70 (6)
SOT-23 (6)(2)
封装尺寸(标称值)
2.00mm × 1.25mm
2.90mm x 1.60mm
I2C 和 SPI 总线多路复用
远程无线电单元
条形码扫描仪
电机驱动器
(1) 如需了解所有可用封装,请参阅数据表末尾的封装选项附录。
(2) 产品预览
楼宇自动化
模拟输入模块
电力输送
空白
空白
空白
视频监控
电子销售终端
电器
空白
空白
空白
消费类音频
应用示例
方框图
TMUX1219
Input
R
R
S1
Output
S1
S2
Unity Gain
Inverting
D
D
S2
TLV9001
1.8 V
SEL
SEL
TMUX1219
1
本文档旨在为方便起见,提供有关 TI 产品中文版本的信息,以确认产品的概要。 有关适用的官方英文版本的最新信息,请访问 www.ti.com,其内容始终优先。 TI 不保证翻译的准确
性和有效性。 在实际设计之前,请务必参考最新版本的英文版本。
English Data Sheet: SCDS409
TMUX1219
ZHCSJR5 –MAY 2019
www.ti.com.cn
目录
7.8 Crosstalk ................................................................. 17
7.9 Bandwidth ............................................................... 18
Detailed Description ............................................ 19
8.1 Functional Block Diagram ....................................... 19
8.2 Feature Description................................................. 19
8.3 Device Functional Modes........................................ 19
8.4 Truth Tables............................................................ 19
Application and Implementation ........................ 20
9.1 Application Information............................................ 20
9.2 Typical Application ................................................. 20
1
2
3
4
5
6
特性.......................................................................... 1
应用.......................................................................... 1
说明.......................................................................... 1
修订历史记录 ........................................................... 2
Pin Configuration and Functions......................... 3
Specifications......................................................... 4
6.1 Absolute Maximum Ratings ...................................... 4
6.2 ESD Ratings.............................................................. 4
6.3 Recommended Operating Conditions....................... 4
6.4 Thermal Information.................................................. 4
6.5 Electrical Characteristics (VDD = 5 V ±10 %)............ 5
6.6 Electrical Characteristics (VDD = 3.3 V ±10 %)......... 7
6.7 Electrical Characteristics (VDD = 1.8 V ±10 %)......... 9
6.8 Electrical Characteristics (VDD = 1.2 V ±10 %)....... 11
6.9 Typical Characteristics............................................ 13
Parameter Measurement Information ................ 14
7.1 On-Resistance ........................................................ 14
7.2 Off-Leakage Current ............................................... 14
7.3 On-Leakage Current ............................................... 15
7.4 Transition Time ....................................................... 15
7.5 Break-Before-Make................................................. 16
7.6 Charge Injection...................................................... 16
7.7 Off Isolation............................................................. 17
8
9
10 Power Supply Recommendations ..................... 22
11 Layout................................................................... 23
11.1 Layout Guidelines ................................................. 23
11.2 Layout Example .................................................... 23
12 器件和文档支持 ..................................................... 24
12.1 文档支持................................................................ 24
12.2 接收文档更新通知 ................................................. 24
12.3 社区资源................................................................ 24
12.4 商标....................................................................... 24
12.5 静电放电警告......................................................... 24
12.6 Glossary................................................................ 24
13 机械、封装和可订购信息....................................... 24
7
4 修订历史记录
注:之前版本的页码可能与当前版本有所不同。
日期
修订版本
说明
2019 年 5 月
*
初始发行版。
2
Copyright © 2019, Texas Instruments Incorporated
TMUX1219
www.ti.com.cn
ZHCSJR5 –MAY 2019
5 Pin Configuration and Functions
DCK Package
6-Pin SC70
Top View
DBV Package
6-Pin SOT-23
Top View
SEL
VDD
GND
1
2
3
6
5
4
S2
D
SEL
VDD
GND
1
2
3
6
5
4
S2
D
S1
S1
Not to scale
Not to scale
Product Preview
Pin Functions
PIN
TYPE(1)
DESCRIPTION
NAME
NO.
SEL
1
2
I
Select pin: controls state of the switch according to 表 1. (Logic Low = S1 to D, Logic High = S2 to D)
Positive power supply. This pin is the most positive power-supply potential. For reliable operation, connect
a decoupling capacitor ranging from 0.1 µF to 10 µF between VDD and GND.
VDD
P
GND
S1
3
4
5
6
P
Ground (0 V) reference
I/O
I/O
I/O
Source pin 1. Can be an input or output.
Drain pin. Can be an input or output.
Source pin 2. Can be an input or output.
D
S2
(1) I = input, O = output, I/O = input and output, P = power
Copyright © 2019, Texas Instruments Incorporated
3
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ZHCSJR5 –MAY 2019
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6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)(2)
MIN
–0.5
–0.5
–30
–0.5
–30
–65
MAX
UNIT
V
VDD
Supply voltage
6
6
VSEL
Logic control input pin voltage (SEL)
Logic control input pin current (SEL)
Source or drain voltage (Sx, D)
Source or drain continuous current (Sx, D)
Storage temperature
V
ISEL
30
mA
V
VS or VD
IS or ID (CONT)
Tstg
VDD+0.5
30
mA
°C
°C
150
TJ
Junction temperature
150
(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The algebraic convention, whereby the most negative value is a minimum and the most positive value is a maximum.
6.2 ESD Ratings
VALUE
UNIT
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1)
±2000
V(ESD)
Electrostatic discharge
V
Charged device model (CDM), per JEDEC specification JESD22-C101
or ANSI/ESDA/JEDEC JS-002, all pins(2)
±750
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
1.08
0
NOM
MAX
5.5
UNIT
VDD
Supply voltage
V
V
VS or VD
VSEL
TA
Signal path input/output voltage (source or drain pin) (Sx, D)
Logic control input pin voltage (SEL)
Ambient temperature
VDD
5.5
0
V
–40
125
°C
6.4 Thermal Information
TMUX1219
THERMAL METRIC(1)
SC70 (DCK)
6 PINS
243.1
UNIT
RθJA
Junction-to-ambient thermal resistance
Junction-to-case (top) thermal resistance
Junction-to-board thermal resistance
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
RθJC(top)
RθJB
206.0
128.3
ΨJT
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case (bottom) thermal resistance
107.8
ΨJB
128.0
RθJC(bot)
N/A
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
4
Copyright © 2019, Texas Instruments Incorporated
TMUX1219
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ZHCSJR5 –MAY 2019
6.5 Electrical Characteristics (VDD = 5 V ±10 %)
at TA = 25°C, VDD = 5 V (unless otherwise noted)
PARAMETER
ANALOG SWITCH
TEST CONDITIONS
TA
MIN
TYP
MAX UNIT
25°C
3
Ω
VS = 0 V to VDD
RON
On-resistance
ISD = 10 mA
Refer to On-Resistance
–40°C to +85°C
–40°C to +125°C
25°C
5
6
Ω
Ω
0.15
Ω
VS = 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
On-resistance matching between
channels
ΔRON
–40°C to +85°C
–40°C to +125°C
25°C
0.4
1
Ω
Ω
1.5
2
Ω
VS = 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
RON
FLAT
On-resistance flatness
–40°C to +85°C
–40°C to +125°C
25°C
Ω
3
Ω
VDD = 5 V
Switch Off
VD = 4.5 V / 1.5 V
VS = 1.5 V / 4.5 V
Refer to Off-Leakage Current
±5
nA
nA
–40°C to +85°C
–25
–40
25
40
IS(OFF)
Source off leakage current(1)
–40°C to +125°C
nA
VDD = 5 V
Switch On
VD = VS = 4.5 V / 1.5 V
Refer to On-Leakage Current
25°C
±15
nA
nA
ID(ON)
IS(ON)
–40°C to +85°C
–50
–80
50
80
Channel on leakage current
–40°C to +125°C
nA
LOGIC INPUTS (SEL)
VIH
VIL
Input logic high
Input logic low
–40°C to +125°C
–40°C to +125°C
1.49
0
5.5
V
V
0.87
IIH
IIL
Input leakage current
Input leakage current
25°C
±0.005
µA
µA
IIH
IIL
–40°C to +125°C
±0.05
2
CIN
CIN
Logic input capacitance
Logic input capacitance
25°C
1
pF
pF
–40°C to +125°C
POWER SUPPLY
25°C
0.003
µA
µA
IDD VDD supply current
Logic inputs = 0 V or 5.5 V
–40°C to +125°C
1.5
(1) When VS is 4.5 V, VD is 1.5 V or when VS is 1.5 V, VD is 4.5 V.
Copyright © 2019, Texas Instruments Incorporated
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ZHCSJR5 –MAY 2019
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Electrical Characteristics (VDD = 5 V ±10 %) (continued)
at TA = 25°C, VDD = 5 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
TA
MIN
TYP
MAX UNIT
DYNAMIC CHARACTERISTICS
25°C
12
ns
VS = 3 V
tTRAN
Switching time between channels RL = 200 Ω, CL = 15 pF
–40°C to +85°C
–40°C to +125°C
25°C
18
19
ns
ns
ns
ns
ns
Refer to Transition Time
8
VS = 3 V
tOPEN
(BBM)
Break before make time
Charge Injection
RL = 200 Ω, CL = 15 pF
Refer to Break-Before-Make
–40°C to +85°C
–40°C to +125°C
1
1
VD = 1 V
RS = 0 Ω, CL = 1 nF
Refer to Charge Injection
QC
25°C
25°C
25°C
25°C
25°C
–10
–65
–45
–65
–45
pC
dB
dB
dB
dB
RL = 50 Ω, CL = 5 pF
f = 1 MHz
Refer to Off Isolation
OISO
Off Isolation
Crosstalk
RL = 50 Ω, CL = 5 pF
f = 10 MHz
Refer to Off Isolation
RL = 50 Ω, CL = 5 pF
f = 1 MHz
Refer to Crosstalk
XTALK
RL = 50 Ω, CL = 5 pF
f = 10 MHz
Refer to Crosstalk
RL = 50 Ω, CL = 5 pF
Refer to Bandwidth
BW
Bandwidth
25°C
25°C
25°C
250
7
MHz
pF
CSOFF
Source off capacitance
On capacitance
f = 1 MHz
CSON
CDON
f = 1 MHz
23
pF
6
Copyright © 2019, Texas Instruments Incorporated
TMUX1219
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ZHCSJR5 –MAY 2019
6.6 Electrical Characteristics (VDD = 3.3 V ±10 %)
at TA = 25°C, VDD = 3.3 V (unless otherwise noted)
PARAMETER
ANALOG SWITCH
TEST CONDITIONS
TA
MIN
TYP
MAX UNIT
25°C
5
Ω
VS = 0 V to VDD
RON
On-resistance
ISD = 10 mA
Refer to On-Resistance
–40°C to +85°C
–40°C to +125°C
25°C
10
12
Ω
Ω
0.15
Ω
VS = 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
On-resistance matching between
channels
ΔRON
–40°C to +85°C
–40°C to +125°C
25°C
1
1
Ω
Ω
3.5
4
Ω
VS = 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
RON
FLAT
On-resistance flatness
–40°C to +85°C
–40°C to +125°C
25°C
Ω
5
Ω
VDD = 3.3 V
Switch Off
VD = 3 V / 1 V
VS = 1 V / 3 V
±5
nA
nA
–40°C to +85°C
–25
–40
25
40
IS(OFF)
Source off leakage current(1)
–40°C to +125°C
nA
Refer to Off-Leakage Current
VDD = 3.3 V
Switch On
VD = VS = 3 V / 1 V
Refer to On-Leakage Current
25°C
±15
nA
nA
ID(ON)
IS(ON)
–40°C to +85°C
–50
–80
50
80
Channel on leakage current
–40°C to +125°C
nA
LOGIC INPUTS (SEL)
VIH
VIL
Input logic high
Input logic low
–40°C to +125°C
–40°C to +125°C
1.35
0
5.5
0.8
V
V
IIH
IIL
Input leakage current
Input leakage current
25°C
±0.005
µA
µA
IIH
IIL
-40°C to 125°C
±0.05
2
CIN
CIN
Logic input capacitance
Logic input capacitance
25°C
1
pF
pF
–40°C to +125°C
POWER SUPPLY
25°C
0.003
µA
µA
IDD VDD supply current
Logic inputs = 0 V or 5.5 V
–40°C to +125°C
0.8
(1) When VS is 3 V, VD is 1 V or when VS is 1 V, VD is 3 V.
Copyright © 2019, Texas Instruments Incorporated
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ZHCSJR5 –MAY 2019
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Electrical Characteristics (VDD = 3.3 V ±10 %) (continued)
at TA = 25°C, VDD = 3.3 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
TA
MIN
TYP
MAX UNIT
DYNAMIC CHARACTERISTICS
25°C
14
ns
VS = 2 V
tTRAN
Switching time between channels RL = 200 Ω, CL = 15 pF
–40°C to +85°C
–40°C to +125°C
25°C
20
21
ns
ns
ns
ns
ns
Refer to Transition Time
9
VS = 2 V
tOPEN
(BBM)
Break before make time
Charge Injection
RL = 200 Ω, CL = 15 pF
Refer to Break-Before-Make
–40°C to +85°C
–40°C to +125°C
1
1
VD = 1 V
RS = 0 Ω, CL = 1 nF
Refer to Charge Injection
QC
25°C
25°C
25°C
25°C
25°C
–6
–65
–45
–65
–45
pC
dB
dB
dB
dB
RL = 50 Ω, CL = 5 pF
f = 1 MHz
Refer to Off Isolation
OISO
Off Isolation
Crosstalk
RL = 50 Ω, CL = 5 pF
f = 10 MHz
Refer to Off Isolation
RL = 50 Ω, CL = 5 pF
f = 1 MHz
Refer to Crosstalk
XTALK
RL = 50 Ω, CL = 5 pF
f = 10 MHz
Refer to Crosstalk
RL = 50 Ω, CL = 5 pF
Refer to Bandwidth
BW
Bandwidth
25°C
25°C
25°C
250
7
MHz
pF
CSOFF
Source off capacitance
On capacitance
f = 1 MHz
CSON
CDON
f = 1 MHz
23
pF
8
Copyright © 2019, Texas Instruments Incorporated
TMUX1219
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ZHCSJR5 –MAY 2019
6.7 Electrical Characteristics (VDD = 1.8 V ±10 %)
at TA = 25°C, VDD = 1.8 V (unless otherwise noted)
PARAMETER
ANALOG SWITCH
TEST CONDITIONS
TA
MIN
TYP
MAX UNIT
25°C
40
Ω
VS = 0 V to VDD
RON
On-resistance
ISD = 10 mA
Refer to On-Resistance
–40°C to +85°C
–40°C to +125°C
25°C
80
80
Ω
Ω
0.4
±5
Ω
VS = 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
On-resistance matching between
channels
ΔRON
–40°C to +85°C
–40°C to +125°C
25°C
1.5
1.5
Ω
Ω
VDD = 1.98 V
Switch Off
VD = 1.62 V / 1 V
VS = 1 V / 1.62 V
Refer to Off-Leakage Current
nA
nA
–40°C to +85°C
–25
–40
25
40
IS(OFF)
Source off leakage current(1)
Channel on leakage current
–40°C to +125°C
nA
VDD = 1.98 V
Switch On
VD = VS = 1.62 V / 1 V
Refer to On-Leakage Current
25°C
±15
nA
nA
ID(ON)
IS(ON)
–40°C to +85°C
–50
–80
50
80
–40°C to +125°C
nA
LOGIC INPUTS (SEL)
VIH
VIL
Input logic high
Input logic low
–40°C to +125°C
–40°C to +125°C
1.07
0
5.5
V
V
0.68
IIH
IIL
Input leakage current
Input leakage current
25°C
±0.005
µA
µA
IIH
IIL
–40°C to +125°C
±0.05
2
CIN
CIN
Logic input capacitance
Logic input capacitance
25°C
1
pF
pF
–40°C to +125°C
POWER SUPPLY
25°C
0.001
µA
µA
IDD VDD supply current
Logic inputs = 0 V or 5.5 V
–40°C to +125°C
0.6
(1) When VS is 1.62 V, VD is 1 V or when VS is 1 V, VD is 1.62 V.
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Electrical Characteristics (VDD = 1.8 V ±10 %) (continued)
at TA = 25°C, VDD = 1.8 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
TA
MIN
TYP
MAX UNIT
DYNAMIC CHARACTERISTICS
25°C
28
ns
VS = 1 V
tTRAN
Transition time between channels RL = 200 Ω, CL = 15 pF
–40°C to +85°C
–40°C to +125°C
25°C
44
44
ns
ns
ns
ns
ns
Refer to Transition Time
16
VS = 1 V
tOPEN
(BBM)
Break before make time
Charge Injection
RL = 200 Ω, CL = 15 pF
Refer to Break-Before-Make
–40°C to +85°C
–40°C to +125°C
1
1
VD = 1 V
RS = 0 Ω, CL = 1 nF
Refer to Charge Injection
QC
25°C
25°C
25°C
25°C
25°C
–3
–65
–45
–65
–45
pC
dB
dB
dB
dB
RL = 50 Ω, CL = 5 pF
f = 1 MHz
Refer to Off Isolation
OISO
Off Isolation
Crosstalk
RL = 50 Ω, CL = 5 pF
f = 10 MHz
Refer to Off Isolation
RL = 50 Ω, CL = 5 pF
f = 1 MHz
Refer to Crosstalk
XTALK
RL = 50 Ω, CL = 5 pF
f = 10 MHz
Refer to Crosstalk
BW
Bandwidth
RL = 50 Ω, CL = 5 pF
25°C
25°C
250
7
MHz
pF
CSOFF
Source off capacitance
f = 1 MHz
CSON
CDON
On capacitance
f = 1 MHz
25°C
23
pF
10
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TMUX1219
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ZHCSJR5 –MAY 2019
6.8 Electrical Characteristics (VDD = 1.2 V ±10 %)
at TA = 25°C, VDD = 1.2 V (unless otherwise noted)
PARAMETER
ANALOG SWITCH
TEST CONDITIONS
TA
MIN
TYP
MAX UNIT
25°C
70
Ω
VS = 0 V to VDD
RON
On-resistance
ISD = 10 mA
Refer to On-Resistance
–40°C to +85°C
–40°C to +125°C
25°C
105
105
Ω
Ω
0.4
±5
Ω
VS = 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
On-resistance matching between
channels
ΔRON
–40°C to +85°C
–40°C to +125°C
25°C
1.5
1.5
Ω
Ω
VDD = 1.32 V
Switch Off
VD = 1 V / 0.8 V
VS = 0.8 V / 1 V
Refer to Off-Leakage Current
nA
nA
–40°C to +85°C
–25
–40
25
40
IS(OFF)
Source off leakage current(1)
Channel on leakage current
–40°C to +125°C
nA
VDD = 1.32 V
Switch On
VD = VS = 1 V / 0.8 V
Refer to On-Leakage Current
25°C
±15
nA
nA
ID(ON)
IS(ON)
–40°C to +85°C
–50
–80
50
80
–40°C to +125°C
nA
LOGIC INPUTS (SEL)
VIH
VIL
Input logic high
Input logic low
–40°C to +125°C
–40°C to +125°C
0.96
0
5.5
V
V
0.36
IIH
IIL
Input leakage current
Input leakage current
25°C
±0.005
µA
µA
IIH
IIL
–40°C to +125°C
±0.05
2
CIN
CIN
Logic input capacitance
Logic input capacitance
25°C
1
pF
pF
–40°C to +125°C
POWER SUPPLY
25°C
0.003
µA
µA
IDD VDD supply current
Logic inputs = 0 V or 5.5 V
–40°C to +125°C
0.5
(1) When VS is 1 V, VD is 0.8 V or when VS is 0.8 V, VD is 1 V.
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Electrical Characteristics (VDD = 1.2 V ±10 %) (continued)
at TA = 25°C, VDD = 1.2 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
TA
MIN
TYP
MAX UNIT
DYNAMIC CHARACTERISTICS
25°C
55
ns
VS = 1 V
tTRAN
Transition time between channels RL = 200 Ω, CL = 15 pF
–40°C to +85°C
–40°C to +125°C
25°C
190
190
ns
ns
ns
ns
ns
Refer to Transition Time
28
VS = 1 V
tOPEN
(BBM)
Break before make time
Charge Injection
RL = 200 Ω, CL = 15 pF
Refer to Break-Before-Make
–40°C to +85°C
–40°C to +125°C
1
1
VD = 1 V
RS = 0 Ω, CL = 1 nF
Refer to Charge Injection
QC
25°C
25°C
25°C
25°C
25°C
–2
–65
–45
–65
–45
pC
dB
dB
dB
dB
RL = 50 Ω, CL = 5 pF
f = 1 MHz
Refer to Off Isolation
OISO
Off Isolation
Crosstalk
RL = 50 Ω, CL = 5 pF
f = 10 MHz
Refer to Off Isolation
RL = 50 Ω, CL = 5 pF
f = 1 MHz
Refer to Crosstalk
XTALK
RL = 50 Ω, CL = 5 pF
f = 10 MHz
Refer to Crosstalk
BW
Bandwidth
RL = 50 Ω, CL = 5 pF
25°C
25°C
250
7
MHz
pF
CSOFF
Source off capacitance
f = 1 MHz
CSON
CDON
On capacitance
f = 1 MHz
25°C
23
pF
12
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6.9 Typical Characteristics
at TA = 25°C, VDD = 5 V (unless otherwise noted)
80
10
8
VDD = 1.08V
60
TA = 125èC
TA = 85èC
6
40
VDD = 1.62 V
4
20
2
VDD = 3 V
VDD = 4.5 V
TA = 25èC
TA = -40èC
0
0
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
0
0.5
1
1.5
2
2.5
3
Source or Drain Voltage (V)
Source or Drain Voltage (V)
D001
D002
TA = 25°C
VDD = 3 V
图 1. On-Resistance vs Source or Drain Voltage
图 2. On-Resistance vs Source or Drain Voltage
500
400
300
200
100
0
30
25
20
15
10
5
Rising
Falling
VDD = 3.3 V
VDD = 5 V
0
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
0.5
1.5
2.5
3.5
4.5
5.5
Logic Voltage (V)
VDD - Supply Voltage (V)
D003
D004
TA = 25°C
TA = 25°C
图 3. Supply Current vs Logic Voltage
图 4. Ttransition vs Supply Voltage
0
-10
-20
-30
-40
-50
-60
-70
-80
-90
0
-1
-2
-3
-4
-5
-6
-7
-8
100k
1M
10M
100M
1M
10M
100M
Frequency (Hz)
Frequency (Hz)
D005
D006
TA = 25°C
TA = 25°C
图 5. Crosstalk and Off-Isolation vs Frequency
图 6. Frequency Response
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7 Parameter Measurement Information
7.1 On-Resistance
The on-resistance of a device is the ohmic resistance between the source (Sx) and drain (D) pins of the device.
The on-resistance varies with input voltage and supply voltage. The symbol RON is used to denote on-resistance.
The measurement setup used to measure RON is shown in 图 7. Voltage (V) and current (ISD) are measured
using this setup, and RON is computed with RON = V / ISD
:
V
ISD
Sx
D
VS
图 7. On-Resistance Measurement Setup
7.2 Off-Leakage Current
Source leakage current is defined as the leakage current flowing into or out of the source pin when the switch is
off. This current is denoted by the symbol IS(OFF)
.
The setup used to measure off-leakage current is shown in 图 8.
VDD
VDD
Is (OFF)
S1
A
D
S2
VS
VD
GND
图 8. Off-Leakage Measurement Setup
14
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7.3 On-Leakage Current
Source on-leakage current is defined as the leakage current flowing into or out of the source pin when the switch
is on. This current is denoted by the symbol IS(ON)
.
Drain on-leakage current is defined as the leakage current flowing into or out of the drain pin when the switch is
on. This current is denoted by the symbol ID(ON)
.
Either the source pin or drain pin is left floating during the measurement. 图 9 shows the circuit used for
measuring the on-leakage current, denoted by IS(ON) or ID(ON)
.
VDD
VDD
VDD
VDD
IS (ON)
S1
S2
S1
S2
ID (ON)
N.C.
A
D
D
A
N.C.
Vs
VS
VS
VD
GND
GND
图 9. On-Leakage Measurement Setup
7.4 Transition Time
Transition time is defined as the time taken by the output of the device to rise or fall 10% after the logic control
signal has risen or fallen past the logic threshold. The 10% transition measurement is utilized to provide the
timing of the device. System level timing can then account for the time constant added from the load resistance
and load capacitance. 图 10 shows the setup used to measure transition time, denoted by the symbol tTRANSITION
.
VDD
0.1…F
VDD
VDD
Logic
tf < 5ns
tr < 5ns
Control
(VSEL
VIH
)
VIL
S1
S2
VS
OUTPUT
0 V
D
RL
CL
tTRANSITION
tTRANSITION
SEL
90%
OUTPUT
VSEL
10%
GND
0 V
图 10. Transition-Time Measurement Setup
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7.5 Break-Before-Make
Break-before-make delay is a safety feature that prevents two inputs from connecting when the device is
switching. The output first breaks from the on-state switch before making the connection with the next on-state
switch. The time delay between the break and the make is known as break-before-make delay. 图 11 shows the
setup used to measure break-before-make delay, denoted by the symbol tOPEN(BBM)
.
VDD
0.1…F
VDD
VDD
Logic
S1
S2
Control
tr < 5ns
tf < 5ns
VS
OUTPUT
D
(VSEL
)
0 V
RL
CL
90%
Output
SEL
tBBM
1
tBBM 2
0 V
VSEL
tOPEN (BBM) = min ( tBBM 1, tBBM 2)
GND
图 11. Break-Before-Make Delay Measurement Setup
7.6 Charge Injection
The TMUX1219 has a transmission-gate topology. Any mismatch in capacitance between the NMOS and PMOS
transistors results in a charge injected into the drain or source during the falling or rising edge of the gate signal.
The amount of charge injected into the source or drain of the device is known as charge injection, and is denoted
by the symbol QC. 图 12 shows the setup used to measure charge injection from Drain (D) to Source (Sx).
VDD
VSS
0.1…F
0.1…F
VSS
VDD
VDD
VSEL
S2
N.C.
D
VD
OUTPUT
S1
VOUT
0 V
CL
Output
VOUT
SEL
VS
QC = CL
×
VOUT
VSEL
GND
图 12. Charge-Injection Measurement Setup
16
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7.7 Off Isolation
Off isolation is defined as the ratio of the signal at the drain pin (D) of the device when a signal is applied to the
source pin (Sx) of an off-channel. 图 13 shows the setup used to measure, and the equation used to calculate off
isolation.
0.1µF
NETWORK
VDD
ANALYZER
VS
50Q
S
VSIG
D
VOUT
RL
50Q
SX
GND
RL
50Q
图 13. Off Isolation Measurement Setup
≈
∆
«
’
÷
◊
VOUT
VS
Off Isolation = 20 ∂ Log
(1)
7.8 Crosstalk
Crosstalk is defined as the ratio of the signal at the drain pin (D) of a different channel, when a signal is applied
at the source pin (Sx) of an on-channel. 图 14 shows the setup used to measure, and the equation used to
calculate crosstalk.
0.1µF
NETWORK
VDD
ANALYZER
S1
VOUT
RL
D
50Q
VS
RL
S2
50Q
50Q
VSIG
GND
图 14. Crosstalk Measurement Setup
≈
∆
«
’
÷
◊
VOUT
VS
Channel-to-Channel Crosstalk = 20 ∂ Log
(2)
17
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7.9 Bandwidth
Bandwidth is defined as the range of frequencies that are attenuated by less than 3 dB when the input is applied
to the source pin (Sx) of an on-channel, and the output is measured at the drain pin (D) of the device. 图 15
shows the setup used to measure bandwidth.
0.1µF
NETWORK
VDD
ANALYZER
VS
S
50Q
VSIG
D
VOUT
RL
50Q
SX
GND
RL
50Q
图 15. Bandwidth Measurement Setup
18
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8 Detailed Description
8.1 Functional Block Diagram
The TMUX1219 is an 2:1 (SPDT), 1-channel switch where the input is controlled with a single select (SEL)
control pin.
TMUX1219
S1
D
S2
SEL
图 16. TMUX1219 Functional Block Diagram
8.2 Feature Description
8.2.1 Bidirectional Operation
The TMUX1219 conducts equally well from source (Sx) to drain (D) or from drain (D) to source (Sx). The device
has very similar characteristics in both directions and supports both analog and digital signals.
8.2.2 Rail to Rail Operation
The valid signal path input/output voltage for TMUX1219 ranges from GND to VDD
.
8.2.3 1.8 V Logic Compatible Inputs
The TMUX1219 has 1.8-V logic compatible control for the logic control input (SEL). The logic input threshold
scales with supply but still provides 1.8-V logic control when operating at 5.5 V supply voltage. 1.8-V logic level
inputs allow the TMUX1219 to interface with processors that have lower logic I/O rails and eliminates the need
for an external translator, which saves both space and BOM cost. For more information on 1.8 V logic
implementations refer to Simplifying Design with 1.8 V logic Muxes and Switches
8.2.4 Fail-Safe Logic
The TMUX1219 supports Fail-Safe Logic on the control input pin (SEL) allowing for operation up to 5.5 V,
regardless of the state of the supply pin. This feature allows voltages on the control pin to be applied before the
supply pin, protecting the device from potential damage. Fail-Safe Logic minimizes system complexity by
removing the need for power supply sequencing on the logic control pins. For example, the Fail-Safe Logic
feature allows the select pin of the TMUX1219 to be ramped to 5.5 V while VDD = 0 V. Additionally, the feature
enables operation of the TMUX1219 with VDD = 1.2 V while allowing the select pin to interface with a logic level
of another device up to 5.5 V.
8.3 Device Functional Modes
The select (SEL) pin of the TMUX1219 controls which source channel is connected to the drain of the device.
When a signal path is not selected, that source pin is in high impedance mode (HI-Z). The control pin can be as
high as 5.5 V.
8.4 Truth Tables
表 1. TMUX1219 Truth Table
CONTROL LOGIC (SEL)
Selected Source (Sx) Connected To Drain (D) Pin
0
1
S1
S2
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9 Application and Implementation
注
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
The TMUX12xx family offers good system performance across a wide operating supply (1.08V to 5.5V). These
devices include 1.8V logic compatible control input pins that enable operation in systems with 1.8V I/O rails.
Additionally, the control input pin supports Fail-Safe Logic which allows for operation up to 5.5V, regardless of
the state of the supply pin. This protection stops the logic pins from back-powering the supply rail. These
features of the TMUX12xx, a family of general purpose multiplexers and switches, reduce system complexity,
board size, and overall system cost.
9.2 Typical Application
9.2.1 Switchable Operational Amplifier Gain Setting
One example application of the TMUX1219 is to change an Op Amp from unity gain setting to an inverting
amplifier configuration. Utilizing a switch allows a system to have a configurable gain and allows the same
architecture to be utilized across the board for various inputs to the system. 图 17 shows the TMUX1219
configured for gain setting application.
Input
R
R
Output
S1
S2
Unity Gain
Inverting
D
TLV9001
1.8 V
SEL
TMUX1219
图 17. Switchable Op Amp Gain Setting
9.2.1.1 Design Requirements
This design example uses the parameters listed in 表 2.
表 2. Design Parameters
PARAMETERS
Input Signal
VALUES
0 V to 2.75 V
Mux Supply (VDD
)
2.75 V
Op Amp Supply (V+/ V-)
Mux I/O signal range
Control logic thresholds
±2.75 V
0 V to VDD (Rail to Rail)
1.8 V compatible (up to 5.5V)
20
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9.2.1.2 Detailed Design Procedure
The application shown in 图 17 demonstrates how to use a single control input and toggle between gain settings
of -1 and +1. If switching between inverting and unity gain is not required, the TMUX1219 can be utilized in the
feedback path to select different feedback resistors and provide scalable gain settings for configurable signal
conditioning.
The TMUX1219 can be operated without any external components except for the supply decoupling capacitors.
The select pin is recommended to have a weak pull-down or pull-up resistor to ensure the input is in a known
state. All inputs to the switch must fall within the recommend operating conditions of the TMUX1219 including
signal range and continuous current. For this design with a supply of 2.75 V the signal range can be 0 V to 2.75
V and the max continuous current can be 30 mA.
9.2.1.3 Application Curve
80
VDD = 1.08V
60
40
VDD = 1.62 V
20
VDD = 3 V
VDD = 4.5 V
0
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
Source or Drain Voltage (V)
D001
TA = 25°C
图 18. On-Resistance vs Source or Drain Voltage
9.2.2 Input Control for Power Amplifier
Another application of the TMUX1219 is for input control of a power amplifier. Utilizing a switch allows a system
to control when the DAC is connected to the power amplifier, and can stop biasing the power amplifier by
switching the gate to GND. 图 19 shows the TMUX1219 configured for control of the power amplifier.
RF Input
RF Output
5 V
TMUX1219
0 V
DAC
1.8 V
SEL
图 19. Input Control of Power Amplifier
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9.2.2.1 Design Requirements
This design example uses the parameters listed in 表 2.
表 3. Design Parameters
PARAMETERS
Supply (VDD
VALUES
5 V
)
Mux I/O signal range
0 V to VDD (Rail to Rail)
1.8 V compatible (up to 5.5V)
Control logic thresholds
9.2.2.2 Detailed Design Procedure
The application shown in 图 19 demonstrates how to toggle between the DAC output and GND for control of a
power amplifier using a single control input. The DAC output is utilized to bias the gate of the power amplifier and
can be disconnected from the circuit using the select pin of the switch. The TMUX1219 can support 1.8-V logic
signals on the control input, allowing the device to interface with low logic controls of an FPGA or MCU. The
TMUX1219 can be operated without any external components except for the supply decoupling capacitors. The
select pin is recommended to have a weak pull-down or pull-up resistor to ensure the input is in a known state.
All inputs to the switch must fall within the recommend operating conditions of the TMUX1219 including signal
range and continuous current. For this design with a supply of 5 V the signal range can be 0 V to 5 V and the
max continuous current can be 30 mA.
9.2.2.3 Application Curve
A key parameter for this application is the transition time of the device. Faster transition time allows the system to
toggle between input sources at a faster rate and allows the output to settle to the final value. The TMUX1219
has a transition time that varies with supply voltage and is shown in 图 20
30
25
20
Rising
15
Falling
10
5
0
0.5
1.5
2.5
3.5
4.5
5.5
VDD - Supply Voltage (V)
D004
TA = 25°C
图 20. Ttransition vs Supply Voltage
10 Power Supply Recommendations
The TMUX1219 operates across a wide supply range of 1.08 V to 5.5 V. Do not exceed the absolute maximum
ratings because stresses beyond the listed ratings can cause permanent damage to the devices.
Power-supply bypassing improves noise margin and prevents switching noise propagation from the VDD supply to
other components. Good power-supply decoupling is important to achieve optimum performance. For improved
supply noise immunity, use a supply decoupling capacitor ranging from 0.1 μF to 10 μF from VDD to ground.
Place the bypass capacitors as close to the power supply pins of the device as possible using low-impedance
connections. TI recommends using multi-layer ceramic chip capacitors (MLCCs) that offer low equivalent series
resistance (ESR) and inductance (ESL) characteristics for power-supply decoupling purposes. For very sensitive
systems, or for systems in harsh noise environments, avoiding the use of vias for connecting the capacitors to
the device pins may offer superior noise immunity. The use of multiple vias in parallel lowers the overall
inductance and is beneficial for connections to ground planes.
22
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11 Layout
11.1 Layout Guidelines
11.1.1 Layout Information
When a PCB trace turns a corner at a 90° angle, a reflection can occur. A reflection occurs primarily because of
the change of width of the trace. At the apex of the turn, the trace width increases to 1.414 times the width. This
increase upsets the transmission-line characteristics, especially the distributed capacitance and self–inductance
of the trace which results in the reflection. Not all PCB traces can be straight and therefore some traces must
turn corners. 图 21 shows progressively better techniques of rounding corners. Only the last example (BEST)
maintains constant trace width and minimizes reflections.
WORST
BETTER
BEST
1W min.
W
图 21. Trace Example
Route high-speed signals using a minimum of vias and corners which reduces signal reflections and
impedance changes. When a via must be used, increase the clearance size around it to minimize its
capacitance. Each via introduces discontinuities in the signal’s transmission line and increases the chance of
picking up interference from the other layers of the board. Be careful when designing test points, through-
hole pins are not recommended at high frequencies.
图 22 illustrates an example of a PCB layout with the TMUX1219. Some key considerations are:
•
Decouple the VDD pin with a 0.1-µF capacitor, placed as close to the pin as possible. Make sure that the
capacitor voltage rating is sufficient for the VDD supply.
•
•
•
Keep the input lines as short as possible.
Use a solid ground plane to help reduce electromagnetic interference (EMI) noise pickup.
Do not run sensitive analog traces in parallel with digital traces. Avoid crossing digital and analog traces if
possible, and only make perpendicular crossings when necessary.
11.2 Layout Example
Via to
GND plane
TMUX1219
Wide (low inductance)
trace for power
C
图 22. TMUX1219 Layout Example
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12 器件和文档支持
12.1 文档支持
12.1.1 相关文档
德州仪器 (TI),《使用低 CON 多路复用器改善稳定性问题》。
德州仪器 (TI),《使用 1.8V 逻辑多路复用器和开关简化设计》。
德州仪器 (TI),《利用关断保护信号开关消除电源排序》。
德州仪器 (TI),《高电压模拟多路复用器的系统级保护》。
12.2 接收文档更新通知
要接收文档更新通知,请导航至 TI.com.cn 上的器件产品文件夹。单击右上角的通知我 进行注册,即可每周接收产
品信息更改摘要。有关更改的详细信息,请查看任何已修订文档中包含的修订历史记录。
12.3 社区资源
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.4 商标
E2E is a trademark of Texas Instruments.
12.5 静电放电警告
ESD 可能会损坏该集成电路。德州仪器 (TI) 建议通过适当的预防措施处理所有集成电路。如果不遵守正确的处理措施和安装程序 , 可
能会损坏集成电路。
ESD 的损坏小至导致微小的性能降级 , 大至整个器件故障。 精密的集成电路可能更容易受到损坏 , 这是因为非常细微的参数更改都可
能会导致器件与其发布的规格不相符。
12.6 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 机械、封装和可订购信息
以下页面包含机械、封装和可订购信息。这些信息是指定器件的最新可用数据。数据如有变更,恕不另行通知,且
不会对此文档进行修订。如需获取此数据表的浏览器版本,请查阅左侧的导航栏。
24
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PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status Package Type Package Pins Package
Eco Plan
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
Samples
Drawing
Qty
(1)
(2)
(3)
(4/5)
(6)
TMUX1219DBVR
TMUX1219DCKR
ACTIVE
ACTIVE
SOT-23
SC70
DBV
DCK
6
6
3000 RoHS & Green
3000 RoHS & Green
NIPDAU
Level-1-260C-UNLIM
Level-1-260C-UNLIM
-40 to 125
-40 to 125
26IT
1F5
NIPDAU
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
5-Jun-2020
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
B0
K0
P1
W
Pin1
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
TMUX1219DBVR
TMUX1219DCKR
SOT-23
SC70
DBV
DCK
6
6
3000
3000
178.0
178.0
9.0
9.0
2.4
2.4
2.5
2.5
1.2
1.2
4.0
4.0
8.0
8.0
Q3
Q3
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
5-Jun-2020
*All dimensions are nominal
Device
Package Type Package Drawing Pins
SPQ
Length (mm) Width (mm) Height (mm)
TMUX1219DBVR
TMUX1219DCKR
SOT-23
SC70
DBV
DCK
6
6
3000
3000
180.0
180.0
180.0
180.0
18.0
18.0
Pack Materials-Page 2
PACKAGE OUTLINE
DBV0006A
SOT-23 - 1.45 mm max height
S
C
A
L
E
4
.
0
0
0
SMALL OUTLINE TRANSISTOR
C
3.0
2.6
0.1 C
1.75
1.45
B
1.45 MAX
A
PIN 1
INDEX AREA
1
2
6
5
2X 0.95
1.9
3.05
2.75
4
3
0.50
6X
0.25
C A B
0.15
0.00
0.2
(1.1)
TYP
0.25
GAGE PLANE
0.22
0.08
TYP
8
TYP
0
0.6
0.3
TYP
SEATING PLANE
4214840/C 06/2021
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. Body dimensions do not include mold flash or protrusion. Mold flash and protrusion shall not exceed 0.25 per side.
4. Leads 1,2,3 may be wider than leads 4,5,6 for package orientation.
5. Refernce JEDEC MO-178.
www.ti.com
EXAMPLE BOARD LAYOUT
DBV0006A
SOT-23 - 1.45 mm max height
SMALL OUTLINE TRANSISTOR
PKG
6X (1.1)
1
6X (0.6)
6
SYMM
5
2
3
2X (0.95)
4
(R0.05) TYP
(2.6)
LAND PATTERN EXAMPLE
EXPOSED METAL SHOWN
SCALE:15X
SOLDER MASK
OPENING
SOLDER MASK
OPENING
METAL UNDER
SOLDER MASK
METAL
EXPOSED METAL
EXPOSED METAL
0.07 MIN
ARROUND
0.07 MAX
ARROUND
NON SOLDER MASK
DEFINED
SOLDER MASK
DEFINED
(PREFERRED)
SOLDER MASK DETAILS
4214840/C 06/2021
NOTES: (continued)
6. Publication IPC-7351 may have alternate designs.
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
www.ti.com
EXAMPLE STENCIL DESIGN
DBV0006A
SOT-23 - 1.45 mm max height
SMALL OUTLINE TRANSISTOR
PKG
6X (1.1)
1
6X (0.6)
6
SYMM
5
2
3
2X(0.95)
4
(R0.05) TYP
(2.6)
SOLDER PASTE EXAMPLE
BASED ON 0.125 mm THICK STENCIL
SCALE:15X
4214840/C 06/2021
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
www.ti.com
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