TPS23521PWR [TI]

具有双路电流限制和双路栅极驱动的 -10V 至 -80V 热插拔控制器 | PW | 16 | -40 to 125;
TPS23521PWR
型号: TPS23521PWR
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

具有双路电流限制和双路栅极驱动的 -10V 至 -80V 热插拔控制器 | PW | 16 | -40 to 125

栅极驱动 控制器 光电二极管
文件: 总38页 (文件大小:1842K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
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TPS23521  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
TPS23521–48V 高性能热插拔控制器  
1 特性  
3 说明  
1
–10V –80V 直流工作电压,绝对最大电压为  
TPS23521 是一款高性能热插拔可使大功率电信系统  
–200V  
符合严苛的瞬态要求。该器件具有 200V 的绝对最大额  
定电压,因此可轻松通过雷击浪涌测试 (IEC61000-4-  
5)。借助软启动电容器断开功能,可通过限制浪涌电流  
来使用较小的热插拔 FET,而不会影响瞬态响应。双  
路热插拔栅极驱动器可以在需要多个热插拔 FET 的 应  
用 中节省空间并降低 BOM 成本。400µA 拉电流支持  
快速恢复,有助于避免雷击浪涌测试期间的系统复位。  
借助双路限流功能,可轻松达到 ATIS 0600315.2013  
等标准所规定的掉电和输入阶跃要求。最后,该器件还  
可提供带可编程阈值和迟滞的精确欠压和过压保护。  
软启动电容器断开  
双路热插拔栅极驱动器  
400µA 栅极拉电流  
双路限流(基于 VDS  
25mV ±4%VDS 低时)  
3mV ±25%VDS 高时)  
可编程过压 (±1.5%) 与欠压 (±2%)  
可编程迟滞 (±11%)  
超时后重试  
16 引脚 TSSOP 封装  
器件信息(1)  
器件型号  
TPS23521  
封装  
封装尺寸(标称值)  
2 应用  
TSSOP (16)  
5.00mm x 4.40mm  
远程无线电单元  
(1) 如需了解所有可用封装,请参阅数据表末尾的可订购产品附  
录。  
基带单元  
路由器和切换器  
小型基站  
–48V 电信基础设施  
简化原理图  
RTN  
To  
Load  
COUT  
VCC  
Vref/PG  
CSS  
1 k  
-48 V_OUT  
SS  
D
R1  
TPS23521 PW  
RD  
UVEN  
OV  
Q1  
Optional  
Q2  
GATE  
GATE2  
SNS  
R2  
R3  
TMR  
VEE  
PROG  
CSS,VEE  
CTMR  
RSNS  
-48 V  
Copyright © 2017, Texas Instruments Incorporated  
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  
English Data Sheet: SLVSDX2  
 
 
TPS23521  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
www.ti.com.cn  
目录  
8.3 Feature Description................................................. 12  
8.4 Device Functional Modes........................................ 16  
Application and Implementation ........................ 19  
9.1 Application Information............................................ 19  
9.2 Typical Application ................................................. 19  
1
2
3
4
5
6
特性.......................................................................... 1  
应用.......................................................................... 1  
说明.......................................................................... 1  
修订历史记录 ........................................................... 2  
Pin Configuration and Functions......................... 3  
Specifications......................................................... 4  
6.1 Absolute Maximum Ratings ...................................... 4  
6.2 ESD Ratings ............................................................ 4  
6.3 Recommended Operating Conditions....................... 4  
6.4 Thermal Information.................................................. 4  
6.5 Electrical Characteristics........................................... 5  
6.6 Switching Characteristics.......................................... 8  
6.7 Typical Characteristics.............................................. 9  
Parameter Measurement Information ................ 10  
9
10 Power Supply Recommendations ..................... 28  
11 Layout................................................................... 29  
11.1 Layout Guidelines ................................................. 29  
11.2 Layout Example .................................................... 29  
12 器件和文档支持 ..................................................... 30  
12.1 器件支持................................................................ 30  
12.2 文档支持 ............................................................... 30  
12.3 接收文档更新通知 ................................................. 30  
12.4 社区资源................................................................ 30  
12.5 ....................................................................... 30  
12.6 静电放电警告......................................................... 30  
12.7 Glossary................................................................ 30  
13 机械、封装和可订购信息....................................... 30  
7
8
7.1 Relationship between Sense Voltage, Gate Current,  
and Timer................................................................. 10  
Detailed Description ............................................ 11  
8.1 Overview ................................................................. 11  
8.2 Functional Block Diagram ....................................... 11  
4 修订历史记录  
注:之前版本的页码可能与当前版本有所不同。  
Changes from Original (September 2017) to Revision A  
Page  
已更改 将预告信息更改成了生产数据” ................................................................................................................................ 1  
2
Copyright © 2017, Texas Instruments Incorporated  
 
TPS23521  
www.ti.com.cn  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
5 Pin Configuration and Functions  
PW Package  
16-Pin (TSSOP)  
Top View  
NC  
NC  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
Vref/PG  
PROG  
NC  
GATE2  
NC  
VCC  
UVEN  
OV  
VEE  
SNS  
GATE  
SS  
TMR  
D
Not to scale  
Pin Functions  
PIN  
TYPE  
DESCRIPTION  
NAME  
NC  
NO.  
1
No connect.  
No connect .  
NC  
2
GATE2  
NC  
3
O
Gate driver for the 2nd hot swap FET. NC if feature isn’t used.  
No connect.  
4
This pin corresponds to the IC GND. Kelvin sense to the bottom of RSNS to ensure accurate  
current limit.  
VEE  
5
GND  
Sense pin, used to measure current and regulate it. Kelvin Sense to RSNS to ensure accurate  
current limits.  
SNS  
6
7
I
GATE  
O
Gate drive for the main hot swap FET.  
Pin used for soft starting the output. Connect a capacitor (CSS) between the SS pin and  
-48V_OUT. The dv/dt rate on the -48V_OUT pin is proportional to the gate sourcing current  
SS  
D
8
9
O
I
divided by CSS  
.
Pin used to sense the drain of the hot swap FET and to program the threshold where the hot  
swap switches from the CL1 and CL2. Connect a resistor from this pin to the drain of the hot  
swap FET (also called -48V_OUT) to program the threshold.  
Timer pin used to program the duration when the hot swap FET can be in current limit.  
Program this time by adding a capacitor between the TMR pin and VEE.  
TMR  
OV  
10  
11  
12  
O
I
Input over voltage comparator. Tie a resistor divider to program the threshold where the  
device turns off due to over voltage event.  
Input under voltage comparator. Tie a resistor divider to program the threshold where the  
device turns on.  
UVEN  
I
VCC  
NC  
13  
14  
S
Clamped supply. Tie to RTN through resistor.  
No connect.  
Adjust current limit and fast trip threshold by tying to VEE, floating, or tying to VEE through  
resistor.  
PROG  
15  
I
5V reference output. Connect to the base of a BJT to generate a rail that can be used to  
power current monitors and digital Isolators. It can also be used as a PG for the downstream  
DC/DC converters.  
Vref/PG  
16  
O
Copyright © 2017, Texas Instruments Incorporated  
3
TPS23521  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
www.ti.com.cn  
6 Specifications  
6.1 Absolute Maximum Ratings  
over operating free-air temperature range (unless otherwise noted)(1)  
MIN  
–0.3  
–0.3  
–0.3  
–0.3  
–0.3  
–40  
MAX  
20  
UNIT  
V
Supply voltage  
Input voltage  
VVCC (current into VCC <10 mA)  
VSNS, VOV  
6.5  
V
VUVEN, VD, VSS  
30  
V
VGATE, VGATE2  
VCC  
6.5  
V
Output voltage  
VTMR , VPROG, VVREF/PG  
V
Operating junction temperature, TJ  
Storage temperature, Tstg  
125  
150  
°C  
°C  
–55  
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings  
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended  
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
6.2 ESD Ratings  
VALUE  
UNIT  
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)  
2000  
V(ESD)  
Electrostatic discharge  
V
Charged-device model (CDM), per JEDEC specification JESD22-  
C101(2)  
500  
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.  
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.  
6.3 Recommended Operating Conditions  
over operating free-air temperature range (unless otherwise noted)  
MIN  
0
NOM  
MAX  
20  
UNIT  
V
VVCC  
Supply voltage (current into VCC <10 mA)  
Input voltage  
VSNS, VOV  
0
5.5  
V
VUVEN, VD, VSS  
VGATE, VGATE2  
Input voltage  
0
18  
V
Output voltage  
0
VCC  
5.5  
V
VTMR , VPROG, VVREF/PG Output voltage  
0
V
CSS  
RSS  
RD  
Capacitance  
Resistance  
Resistance  
1
200  
10  
nF  
kΩ  
kΩ  
1
120  
2,000  
6.4 Thermal Information  
TPS23521  
THERMAL METRIC(1)  
PW (TSSOP)  
16 PINS  
98.4  
UNIT  
RθJA  
Junction-to-ambient thermal resistance  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
RθJC(top)  
RθJB  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance  
31.3  
44.3  
ψJT  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case (bottom) thermal resistance  
1.8  
ψJB  
43.6  
RθJC(bot)  
N/A  
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application  
report.  
4
Copyright © 2017, Texas Instruments Incorporated  
TPS23521  
www.ti.com.cn  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
6.5 Electrical Characteristics  
–40°C TJ 125°C, 1.1 mA < IVCC < 10 mA, V(UVEN) = 2 V, V(OV) = V(SNS) = V(D) = 0 V, V(SS) = GATEx = Hi-Z , V(TMR) = 0 V,  
VVref,PG = VPROG = Hi-Z; All pin voltages are relative to VEE (unless otherwise noted)  
PARAMETER  
VCC – Clamped Supply  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
V(UVLO_VCC)  
UVLO on VCC  
rising  
9
9.5  
1
10  
V
V
V(UVLO_VCC,hyst)  
UVLO hysteresis on VCC  
hysteresis  
1.1< I(VCC) < 10 mA (current into  
VCC)  
V(VCC)  
VCC regulation  
12  
14.5  
18  
V
VVCC = 10 V. Off  
1
1
mA  
mA  
mA  
IQ  
Quiescent Current  
VVCC = 10 V. On  
VVCC = 10 V, Gate in regulation  
1.1  
UVEN – Under Voltage and Enable  
V(UVEN_T) Threshold voltage for V(UVEN)  
0.985  
9
1
1.015  
11.2  
V
Hysteresis current, sourcing  
from UV pin  
I(UV_hyst)  
VUV = 1.5 V  
10  
µA  
OV – Over Voltage  
V(OV_T)  
Threshold voltage for VOV  
0.98  
9
1
1.02  
11.2  
V
Hysteresis current, sourcing  
from OV pin  
I(OV_hyst)  
TMR – Timer  
VTMR  
VOV = 1.5 V  
10  
µA  
Voltage on timer when part  
times out.  
VD = 0 V, TMR , measure VTMR  
when VGATE = 0  
1.47  
0.735  
9
1.5  
0.75  
10  
1.53  
0.765  
11  
V
Voltage on timer when part  
times out.  
VD = 1 V, TMR , measure VTMR  
when VGATE = 0  
VTMR2  
V
VSNS = 0.1 V, VD = 0 V, VTMR = 0 V,  
measure I out from TMR  
µA  
µA  
µA  
Timer Sourcing current when  
in fault condition or when  
retrying.  
ITMR,SRs  
VSNS = 0.1 V, VD = 2 V, VTMR = 0 V,  
measure I out from TMR  
45  
50  
55  
Timer sinking current when  
not in fault condition.  
ITMR,SNC  
VSNS = 0 V, VD = 0 V, VTMR = 2 V,  
1.5  
2
2.5  
Voltage on timer when the  
VSNS = 0 V, VD = 0 V, TMR = 2 V,  
VTMR,RETRY  
timer starts going back up in TMR , measure VTMR when I into  
0.475  
0.5  
0.525  
V
retry. Retry version only.  
TMR change polarity  
Number of retry duty cycles.  
Retry version only.  
NRETRY  
DRETRY  
64  
Retry duty cycle. Retry  
version only.  
0.4%  
Gate Sourcing Current  
VG = 5 V, VD = 2 V, VSNS ,  
IGATE,TIMER  
VSNS,TMR1  
VSNS,TMR2  
Threshold When timer starts measure IGATE when TMR sources  
5
1.5  
10  
2.5  
15  
µA  
mV  
mV  
to run.  
current  
VD = 2 V, VTMR = 0 V, VG = 5 V;  
Sense Voltage when Timer  
starts to run.  
VSNS , measure VSNS when TMR  
sources current  
VD = 0 V, VTMR = 0 V , VG = 5 V;  
Sense Voltage when Timer  
starts to run.  
VSNS , measure VSNS when TMR  
23.25  
24.5  
sources current  
SNS – Sense Pin For Current Limit  
Leakage current on sense  
ISNS,LEAK  
-2  
2
µA  
pin  
PROG = Float  
PROG = VEE  
PROG = FLOAT  
PROG = VEE  
RPROG = 78.7kΩ  
RPROG = 162 kΩ  
24  
38  
25  
40  
26  
42  
mV  
mV  
mV  
mV  
mV  
mV  
VTMR = 0 V. VGATE = 5 V. VD = 0 V,  
VSNS,CL1  
VSNS , measure when IGATE = 0;  
45  
50  
55  
VTMR = 0 V. VGATE = 5 V. VD = 0 V,  
SNS ,measure when IGATE> 100  
mA  
72  
80  
88  
VSNS,FST  
V
110  
68  
120  
75  
130  
82  
Copyright © 2017, Texas Instruments Incorporated  
5
TPS23521  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
www.ti.com.cn  
Electrical Characteristics (continued)  
–40°C TJ 125°C, 1.1 mA < IVCC < 10 mA, V(UVEN) = 2 V, V(OV) = V(SNS) = V(D) = 0 V, V(SS) = GATEx = Hi-Z , V(TMR) = 0 V,  
VVref,PG = VPROG = Hi-Z; All pin voltages are relative to VEE (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
VTMR = 0 V, VGATE = 5 V, VD = 5 V,  
VSNS,CL2  
Fold Back Current Limit  
2.25  
3
3.75  
mV  
V
SNS , measure when IGATE = 0;  
VTMR = 0 V, VGATE = 5 V, VD = 5 V,  
SNS , Measure when IGATE> 100  
mA  
PROG – Programing Pin to Set Current Limit (CL) and Fast Trip  
VSNS,FST2  
Fast Trip during start-up  
V
6
9
12  
mV  
iPROG  
PROG pin current  
7.9  
10.1  
12  
µA  
V
Threshold on VPROG, where the fast  
trip setting changes from 80mV to  
120mV.  
VPROG,LOW  
Prog pin voltage  
0.48  
Threshold on VPROG, where the  
current limit setting changes from  
25mV to 40mV.  
VPROG,MID  
Prog pin voltage  
Prog pin voltage  
0.94  
2.4  
1.23  
1.51  
V
V
Threshold on VPROG, where the fast  
trip setting changes from 80mV to  
120mV.  
VPROG,High  
GATE – Gate Drive for Main Hot Swap FET  
V(VCC-GATE)  
Output gate voltage  
V(SNS) = 0 V  
1
V
Sourcing Current during  
normal operation.  
V(TMR) = 0 V. V(GATE) = 8 V. VD = 0  
V, V(SNS) = 0 V  
I(GATE,SRS,NORM)  
250  
400  
µA  
Sourcing Current during star- V(TMR) = 0 V. V(GATE) = 5 V. VD = 0  
I(GATE,SRS,START)  
I(GATE,wkpd)  
15  
3
20  
5
25  
7
µA  
mA  
A
up  
V, V(SNS) = 0 V  
Weak pull down current  
V(SNS) = 0 V. VUVEN = 0 V  
Fast Pull down current with  
10mV overdrive  
I(GATE,FST)  
0.4  
1
1.5  
GATE2 – Gate Drive for Auxiliary Hot Swap FET  
V(VCC-GATE2)  
I(GATE2,wkpd)  
I(GATE2,SRC)  
Output gate voltage  
weak pull down  
V(SNS) = 0 V  
VGATE = 0 V  
1
V
5
mA  
µA  
Sourcing Current  
50  
Fast Pull down current with  
10 mV overdrive  
IGATE2,FST  
VGATE,TH  
0.4  
1
7.25  
0.5  
1.5  
8
A
V
V
Threshold on VGATE when  
GATE2 turns on  
Raise VGATE, measure when VGATE2  
comes up.  
6.25  
Hysteresis of threshold on  
VGATE when GATE2 turns on  
VGATE,TH,hyst  
D – Drain Sense  
R(D,INT)  
hysteresis  
Resistance from the drain pin  
to GND.  
28.5  
1.46  
30  
31.5  
1.54  
kΩ  
Voltage on drain that  
switches between two current 20 mV, D, measure V when I(GATE)  
V(TMR) = 0 V, V(GATE) = 5 V, V(SNS) =  
V(D,CL_SW)  
1.5  
V
limits  
= 0  
V(TMR) = 1 V, V(GATE) = 5 V, V(SNS)  
20 mV, D, measure V when I(GATE)  
= 0  
=
Voltage on drain that  
switches the VTMR threshold.  
V(D,TMR_SW)  
0.73  
100  
4
0.75  
75  
0.77  
V
V(D,TMR_SW,hyst)  
hysteresis for V(D,TMR,SW)  
hysteresis  
mV  
SS (Soft Start)  
Pull down current when not in  
inrush  
I(SS,PD)  
VSS = 5 V  
mA  
Resistance between GATE  
and SS in the start-up phase  
R(SS,GATE)  
80  
Ω
Vref/PG  
VVref/PG  
Reference output  
0 < IVref/PG < 800 µA  
4.9  
5.5  
V
6
Copyright © 2017, Texas Instruments Incorporated  
TPS23521  
www.ti.com.cn  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
Electrical Characteristics (continued)  
–40°C TJ 125°C, 1.1 mA < IVCC < 10 mA, V(UVEN) = 2 V, V(OV) = V(SNS) = V(D) = 0 V, V(SS) = GATEx = Hi-Z , V(TMR) = 0 V,  
VVref,PG = VPROG = Hi-Z; All pin voltages are relative to VEE (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
7.25  
2
MAX  
UNIT  
V
Raise GATE2 until Vref/PG goes  
high  
VGATE2,PG  
IVref/PG  
6.5  
8
VVref/PG SC current  
Vref/PG ON, VVref/PG (shorted)  
mA  
OTSD (Over Temperature Shut Down)  
TSD  
Shutdown temperature  
Temp Rising  
135  
155  
8
175  
°C  
°C  
Shutdown temperature  
Hysteresis  
TSD,hyst  
Copyright © 2017, Texas Instruments Incorporated  
7
TPS23521  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
www.ti.com.cn  
6.6 Switching Characteristics  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
VCC – Clamped Supply  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
VVCC: 0 V 10 V, measure delay  
before VGATE  
tID  
Insertion Delay  
32  
ms  
UVEN  
TUV,degl  
OV  
Deglitch on UVEN  
Deglitch on OV  
4
4
µs  
µs  
TOV,degl  
SNS  
VSNS steps from 0 mV to 60 mV.  
Response time to large over current Measure time for GATE and GATE2  
to come down.  
TSNS,FST,R  
ESP  
300  
ns  
Vref/PG  
Power Good (V(GATE) 0 V 10 V)  
Look for Vref/PG ↑  
1
ms  
ms  
Deglitch of Vref/PG. (GATE2 =  
unloaded, raise GATE, measure  
delay between GATE and Vref/PG)  
tVref/PG,DEG  
L
Power Good (V(GATE) 10 V 0 V)  
Look for Vref/PG ↓  
32  
8
Copyright © 2017, Texas Instruments Incorporated  
TPS23521  
www.ti.com.cn  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
6.7 Typical Characteristics  
Unless otherwise noted: –40°C TJ 125°C, 1.1 mA < IVCC < 10 mA, V(UVEN) = 2 V, V(OV) = V(SNS) = V(D) = 0 V, V(SS) = GATEx  
= Hi-Z , V(TMR) = 0 V, VVref/PG = VPROG = Hi-Z;  
Ivcc injected into VCC pin  
Figure 1. VCC Regulation Voltage vs Current and  
VVCC = 10 V, Regulation is current limit  
Figure 2. Iq vs Temperature and Operating Condition  
Temperature  
Figure 3. Isns Current Vs Temperature  
Figure 4. VVref/PG vs Temperature and IVREF  
Figure 5. VVCC-GATE vs Temperature  
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7 Parameter Measurement Information  
7.1 Relationship between Sense Voltage, Gate Current, and Timer  
The diagram below illustrates the relationship between the VSNS (voltage across RSNS), Gate current, and the  
timer operation. The diagram is intended to help explain the various parameters in the electrical characteristic  
table and is not drawn to scale.  
Note that IGATE reduces as the sense voltage approaches the current limit threshold and it equals zero at the  
current limit regulation point. To ensure that the timer always runs when the IC is in regulation the timer starts at  
a slightly positive IGATE  
.
Figure 6. Relationship Between Timer, Gate Current, and Sense Voltage (VGATE = 5 V)  
10  
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8 Detailed Description  
8.1 Overview  
The TPS23521 is a high performance hot swap controller that enables high power telecom systems to comply  
with stringent transient requirements. The soft start cap disconnect allows soft start at start-up and disconnects  
the soft start cap during normal operation. This allows for the use of smaller hot swap FETs without hurting the  
transient response. GATE2 is a second hot swap FET driver, which only turns ON when the main hot swap FET  
is fully on. Thus the FETs driven by GATE2 don't need to have strong SOA. This saves space and BOM cost in  
high power applications that require multiple hot swap FETs.The 400 µA sourcing current allows fast recovery,  
which helps to avoid system resets during lightning surge tests. The dual current limit makes it easier to pass  
brown outs and input steps such as required by the ATIS 0600315.2013. Finally, the TPS23521 offers accurate  
under voltage and over voltage protection with programmable thresholds and hysteresis.  
8.2 Functional Block Diagram  
RTN  
VCC  
Vref/PG  
Internal  
Regulator  
VINT  
VINT,GD  
& Band Gap  
V1V  
HS_ON  
iHYST  
To  
Load  
R1  
R2  
DIS_RTN  
COUT  
UVEN  
OV  
Logic, Timing, and  
Control  
Time Out  
PROG  
V1V  
VING  
OV_GD  
V1.5V  
RD  
D
R3  
VINT  
iHYST  
30k  
CSS  
1k  
SS  
SS  
Disconnect  
GATE2  
Q2  
Time  
Out  
VVCC  
Current Limit  
& Gate Drive  
GATE  
SNS  
Q1  
Timer  
Block  
in ILIM  
HS_ON  
IC_GND  
RSNS  
VEE  
TMR  
CTMR  
-48V  
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8.3 Feature Description  
8.3.1 Current Limit  
The TPS23521 utilizes two current limit thresholds:  
ICL1 – also referred to as high current limit threshold, which is used when the VDS of the hot swap FET is low.  
ICL2 – lower current limit threshold, which is used when the VDS of the hot swap FET is high.  
This dual level protection scheme ensures that the part has a higher chance of riding out voltage steps and other  
transients due to the higher current limit at low VDS, while protecting the MOSFET during start into short and hot-  
short events, by setting a lower current limit threshold for conditions with high VDS. The transition threshold is  
programmed with a resistor that is connected from the drain of the hot swap FET to the D pin of the TPS23521.  
The figure below illustrates an example with a ICL1 set to 25 A and ICL2 set to 3 A. Note that compared to a  
traditional SOA protection scheme this approach allows better utilization of the SOA in the 10 V < VDS. < 40-V  
range, which is critical in riding through transients and voltage steps.  
Note that in both cases the TPS23521 regulated the gate voltage to enforce the current limit. However, this  
regulation is not very fast and doesn’t offer the best protection against hot-shorts on the output. To protect in this  
scenario a fast comparator is used, which quickly pulls down the gate in case of severe over current events (2x  
bigger than VCL1).  
Figure 7. Dual Current Limit vs FET Power Limit  
8.3.1.1 Programming the CL Switch-Over Threshold  
The VDS threshold when the TPS23521 switches over from ICL1 to ICL2 (VD,SW) can be computed using  
Equation 1. For example, if a 15-V switch over is desired, RD should be set to 270 kΩ.  
1.5 V ì 30 kß + R  
(
)
D
VDS,SW  
=
30 kß  
(1)  
8.3.1.2 Setting Up the PROG Pin  
The PROG pin can be tied to VEE, left floating, or tied to VEE through a resistor to adjust VSNS,CL1 and the ratio  
of fast trip to current limit. The options are set as follows:  
PROG = NC or Float: VSNS,CL1 = 25 mV, VSNS,FST is 2x VSNS,CL1  
RPROG = 196 k(1%): VSNS,CL1 = 25 mV, VSNS,FST is 3x VSNS,CL1  
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Feature Description (continued)  
RPROG = 66.5 k(1%): VSNS,CL1 = 40 mV, VSNS,FST is 3x VSNS,CL1  
PROG = VEE: VSNS,CL1 = 40 mV, VSNS,FST is 2x VSNS,CL1  
8.3.1.3 Programming CL1  
The current limit at low VDS (ICL1) of the TPS23521 can be computed using Equation 2 below.  
VSNS,CL1  
ICL1  
=
R SNS  
(2)  
(3)  
To compute ICL1 for a 1-msense resistor use Equation 3 below.  
VSNS,CL1  
25 mV  
ICL1  
=
=
= 25 A  
R SNS  
1mß  
8.3.1.4 Programming CL2  
The current limit at high VDS (ICL2) of the TPS23521 can be computed using Equation 4 below.  
VSNS,CL2  
ICL2  
=
R SNS  
(4)  
(5)  
To compute ICL2 for a 1-msense resistor use Equation 5 below.  
VSNS,CL2  
3 mV  
ICL2  
=
=
= 3 A  
R SNS  
1mß  
8.3.2 Soft Start Disconnect  
The inrush current into the output capacitor (COUT) can be limited by placing a capacitor between the SS (Soft  
Start) pin and the drain of the hot swap MOSFET. In that case the inrush current can be computed using  
equation below.  
COUT ì IGATE,SRS,START  
660 µFì 20 µA  
IINR  
=
=
= 0.4 A  
CSS  
33 nF  
(6)  
Note that with most hot swap the CSS pin is tied simply to the gate pin, but this can interfere with performance  
during normal operation if transients or short circuits are encountered. In addition the CSS capacitor tends to pull  
up the gate during hot plug and cause shoot through current if it is always tied to the gate. For that reason the  
TPS23521 has a disconnect switch between the gate pin and the SS pin as well as a discharge resistor. During  
the initial hot plug and during the insertion delay the switch between SS and GATE is open and SS is being  
discharged to GND through a resistor. Then during start-up SS and GATE are connected to limit the slew rate.  
Once in normal operation the SS pin is not tied to GATE and it is not shorted to GND, which prevents it from  
interfering with the operation during transients.  
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Feature Description (continued)  
CSS  
SS 1 k  
SS_Dis  
CSS,GND  
SS_ON  
Q1  
GATE  
Figure 8. Implementation of SS Disconnect  
8.3.3 Timer  
Timer is a critical feature in the hot swap, which manages the stress level in the MOSFET. The timer will source  
and sink current into the timer capacitor as follows:  
Not in current limit: sink 2 µA  
If the part is in current limit and VGATE < VGATE,TH, the timer sources current as follows:  
VD < VD,CL_SW: source 10 µA  
VD > VD,CL_SW: source 50 µA  
The TPS23521 times out and shuts down the hot swap as follows.  
If VD < VD,TMR_SW then the hot swap times out when VTMR reaches 1.5 V.  
If VD > VD,TMR_SW then the hot swap times out when VTMR reaches 0.75 V.  
The above behavior maximizes the ability of the hot swap to ride out voltage steps, while ensuring that the FET  
remains safe even if the part can not ride out a voltage step.  
A cool down period follows after the part times out. During this time the timer performs the following:  
Discharge CTMR with a 2-µA current source until 0.5 V  
Charge CTMR with a 10-µA current source until it is back to 1.5 V.  
Repeat the above 64 times  
Discharge timer to 0 V.  
The part attempts to restart after finishing the above. If the UVEN signal is toggled while the 64 cycles are in  
progress the part restarts immediately after the 64 cycles are completed.  
The timer operates as follows when recovering from POR:  
If VTMR < 0.5 V:  
Proceed to regular startup  
Do not discharge VTMR  
If VTMR > 0.5 V:  
Go through 64 charge/discharge cycles  
Discharge VTMR  
Proceed to startup  
The Time Out (TTO) can be computed using the equations below. Note that the time out depends on the VDS of  
the MOSFET.  
14  
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Feature Description (continued)  
C TMR ì VTMR  
TTO  
=
ITMR,SRS  
(7)  
(8)  
C TMR ì 1.5 V  
10 mA  
TTO(VD < 0.75 V) =  
CTMR ì 0.75 V  
10 mA  
TTO(0.75 V < VD < 1.5 V) =  
(9)  
C TMR ì 0.75 V  
TTO(VD > 1.5 V) =  
50 mA  
(10)  
8.3.4 Gate 2  
The TPS23521 features a second hot swap Gate drive, which can be used to save BOM cost and size in  
applications that require multiple hot swap MOSFETs. The 2nd MOSFET is only turned ON when the main FET  
is enhanced. As a result the 2nd MOSFET doesn't operate with large current and large voltage across it, thus  
reducing the SOA requirements. In many cases a 5x6 QFN FET can replace a D2PACK FET. The following  
figures show the operation during start-up and Hot Short event. It can be seen that the second FET is OFF  
during stressful operation and turns on during normal operation to improve steady state efficiency and reduce  
power losses.  
Figure 9. Gate 2 Operation During Start-Up  
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Feature Description (continued)  
Figure 10. Gate2 Operation During Hot Short  
8.4 Device Functional Modes  
Figure 11. Simplified Hot Swap State Machine  
The Figure above shows a simplified state machine of the hot swap controller. It has 4 distinct operating states  
and the controller switches between these states based on the following signals:  
Ving_rc: This means that both the input voltage is in the right range and the IC has power with Vcc. A 4-µs  
delay is added for deglitching. If the input voltage is above the OV threshold, input voltage is below the UV  
threshold, or VCC is below its internal UVLO, Ving_rc will be low.  
TimeOut: This signal comes from the timer block and will be asserted Hi if the IC has timed out due to an  
over-current condition. This signal is also Hi while the timer is going through the restart cycles. Once the  
cycles are completed this signal will go Low.  
16  
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Device Functional Modes (continued)  
ins_over: This signal states that the insertion delay has been completed and the hot swap is ready to start-up.  
FT: this is the fast trip signal coming from the fast trip comparator. It goes Hi if an extreme over current event  
is detected.  
PG: Internal Power good signal. This is high when the hot swap is fully on and the load can draw full power.  
For PG to be Hi, the GATE has to be Hi, GATE2 needs to be Hi, and the drain pin needs to be below 0.75 V.  
PG_degl: This is a deglitched version of the PG and is the signal used to move between states and controls  
the external PGb pin.  
8.4.1 OFF State  
In this state the hot swap FET is turned off and the controller is waiting to start-up. The controller can be in this  
state due to any of these scenarios:  
Input voltage is not in the valid range.  
The hot swap is in the cool down state and the timer is going through the retry cycle after a fault condition  
such as output hot short or over current.  
VCC is below its UVLO threshold and the IC doesn’t have enough power to operate properly.  
8.4.2 Insertion Delay State  
In this state the hot swap FET is turned off and the controller is waiting for the insertion delay to finish. This  
allows the input supply to settle after a Hot Plug. If any of the following occur, the controller will be kicked back to  
the OFF state:  
Input voltage is not in the valid range.  
VCC is below its UVLO threshold and the IC doesn’t have enough power to operate properly.  
Once the insertion delay is finished, the controller will move to the Start-up state.  
8.4.3 Start-up State  
In this state the controller is turning on and charging the output cap. The operation is set as follows:  
The SS pin is internally connected to the GATE pin to allow for output dv/dt control.  
Lower gate sourcing current is applied to the GATE pin to allow for smaller SS caps.  
The lower current limit setting of VSNS,CL2 and a lower fast trip setting of VSNS,FST2 is used to minimize the  
MOSFET stress in case of a fault condition.  
If any of the following occur, the controller will be kicked back to the OFF state:  
Input voltage is not in the valid range.  
The timer times out due to over-current.  
VCC is below its UVLO threshold and the IC doesn’t have enough power to operate properly.  
Fast trip is triggered.  
Once the PG_degl signal goes Hi, the controller will move to the Normal Operation state.  
8.4.4 Normal Operation State  
In this state the hot swap is fully on and the operation is set as follows:  
The SS pin is disconnected from the GATE pin to improve transient response.  
The full gate sourcing current is used to improve transient response.  
The current limit and fast trip threshold are a function of the D pin to optimize the transient response while  
protecting the MOSFET.  
If any of the following occur, the controller will be kicked back to the OFF state:  
PG_degl goes low.  
The timer times out due to over-current.  
VCC is below its UVLO threshold and the IC doesn’t have enough power to operate properly.  
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Device Functional Modes (continued)  
Note that if the input voltage is outside the valid range or the fast trip is triggered, the hot swap FET will turn off,  
but the controller will not exit the Normal Operation state. In this case the PG signal would go low immediately. If  
this condition persists, the PG_degl will go low as well and the controller would move to the OFF state. This  
operation prevents the controller from re-starting the system during quick transients.  
18  
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9 Application and Implementation  
NOTE  
Information in the following applications sections is not part of the TI component  
specification, and TI does not warrant its accuracy or completeness. TI’s customers are  
responsible for determining suitability of components for their purposes. Customers should  
validate and test their design implementation to confirm system functionality.  
9.1 Application Information  
The TPS23521 is a hot swap controller for –48-V applications and is used to manage inrush current and protect  
downstream circuitry and the upstream bus in case of fault conditions. The following key scenarios should be  
considered when designing a –48-V hot swap circuit:  
Start Up.  
Output of a hot swap is shorted to ground while the hot swap is on. This is often referred to as a Hot Short.  
Powering up a board when the output and ground are shorted. This is usually called a start-into-short.  
Input lightning surge. Here it is usually desired to avoid damage to downstream circuitry and to avoid system  
restarts.  
These scenarios place a lot of stress on the hot swap MOSFET and the board designer should take special care  
to ensure that the MOSFET stays within it's Safe Operating Area (SOA) under all of these conditions. A detailed  
design example is provided below and the key equations are written out. Note that solving all of these equations  
by hand is cumbersome and can result in errors. Instead, TI recommends using the TPS2352X Design  
Calculator provided on the product page.  
9.2 Typical Application  
Figure 12. Application Diagram for Design Example  
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Typical Application (continued)  
9.2.1 Design Requirements  
The table below summarizes the design parameters that must be known before designing a hot swap circuit.  
When charging the output capacitor through the hot swap MOSFET, the FET’s total energy dissipation equals  
the total energy stored in the output capacitor (1/2CV2). Thus both the input voltage and output capacitance will  
determine the stress experienced by the MOSFET. The maximum load power will drive the current limit and  
sense resistor selection. In addition, the maximum load current, maximum ambient temperature, and the thermal  
properties of the PCB (RθCA) will drive the selection of the MOSFET's RDSON and the number of MOSFETs used.  
RθCA is a strong function of the layout and the amount of copper that is connected to the drain of the MOSFET.  
Air cooling will also reduce RθCA substantially. Finally, it's important to know what transients the circuit has to  
pass in order to size up the input protection accordingly.  
Table 1. Design Requirements for a –38 V to –60 V, 400-W Protection Circuit  
DESIGN PARAMETER  
Input voltage range  
EXAMPLE VALUE  
–36 V to –72 V  
1200 W  
Maximum Load Power  
Output Capacitance  
4 x 330 µF  
After EMI filter.  
65°C  
Location of Output Cap  
Maximum Ambient Temperature  
MOSFET RθCA (function of layout)  
Pass “Hot-Short” on Output?  
Pass a “Start into short”?  
Is the load off until PG asserted?  
20°C/W  
Yes  
Yes  
Yes  
9.2.2 Detailed Design Procedure  
9.2.2.1 Selecting RSNS  
Before selecting RSNS, first compute the maximum load current. For this example the worst case load current  
happens at the minimum input voltage of 36 V. Thus the maximum current is 1200 W/36 V = 33.3 A. To provide  
some margin, set the target current limit to 36.6 A (10% higher). Set VSNS,CL1 to 40mV by tying the PROG pin to  
VEE and compute RSNS using equation below:  
VSNS,CL1  
40 mV  
36.6A  
RSNS,CLC  
=
=
= 1.1 mW  
ICL1  
(11)  
Use next available RSNS of 1 mΩ.  
9.2.2.2 Selecting Soft Start Setting: CSS and CSS,VEE  
First, compute the minimum inrush current where the timer will trip using equation below.  
VSNS,TMR2,min  
1.5 mV  
IINR,TMR.min  
=
=
= 1.5 A  
RSNS  
1 mW  
(12)  
To avoid running the timer the inrush current needs to be sufficiently low. Target 0.5 A of inrush current to allow  
margin, and compute the target CSS using equation below. Note that a 10% total tolerance capacitance was  
assumed on Cout.  
COUT,MAX ìIGATE,SRS,START  
1452 mFì20 mA  
CSS  
=
=
= 58.08 nF  
I
0.5 A  
INR,TGT  
(13)  
Chose CSS close to 58 nF. For this example 55 nF was used, which assumes a 33 nF and 22 nF cap in parallel.  
This results in an inrush current of 0.53 A at max COUT (1452 µF) and inrush current of 0.48 A at typical COUT  
(1320 µF). Also it is recommended to add a capacitor between the soft start pin and VEE (CSS,VEE) to improve  
immunity to input voltage noise during soft start. It's recommended to chose a capacitor that's 3x larger than CSS  
.
In this case a 150 nF capacitor was chosen.  
20  
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Finally the start-up time at maximum input voltage can be computed using the equation below:  
CSS ì VIN,MAX  
55 nFì72 V  
20 mA  
TSTART (VIN,MAX ) =  
=
= 198 ms  
IGATE,SRS,START  
(14)  
9.2.2.3 Selecting VDS Switch Over Threshold  
The VDS threshold where the current limit switches from CL1 to CL2 can be programmed using RD. In general a  
higher threshold improves ability to ride through voltage steps, brown outs, and other transients. However, a  
larger setting can also expose the MOSFET to more stress, because the larger current limit is now allowed at  
higher VDS voltages. If there are no specific voltage step requirements, 20 V is a good starting point. Use the  
equation below to compute the target RD.  
V
«
DS,SW  
R = 30 kW ì  
- 1 = 370 kW  
÷
D
1.5 V  
(15)  
9.2.2.4 Timer Selection  
The timer determines how long the hot swap can be in current limit before timing out and can be programmed  
using CTMR. In general a longer time out (TTO) improves ability to ride through voltage steps, brown outs, and  
other transients. However, a larger setting can also expose the MOSFET to more stress, because it takes longer  
for the FET to shut down during fault conditions. If there are no specific voltage step or transient requirements, 2  
ms is a good starting point. Use the equation below to compute the target CTMR. Choose the next available  
capacitor value of 15 nF, which results in a 2.25 ms time out.  
TTO ìITMR,SRS  
2 msì10 mA  
CTMR  
=
=
= 13.3 nF  
VTMR  
1.5 V  
(16)  
9.2.2.5 MOSFET Selection and SOA Checks  
When selecting MOSFETs for the –48 V application the three key parameters are: VDS rating, RDSON, and safe  
operating area (SOA). For this application the PSMN4R8-100BSE was selected as the Main hot swap FET (Q1)  
to provide a 100 V VDS rating, low RDSON, and great SOA. Since this is a high power application 2  
CSD19532Q5B FETs were used as auxiliary FETs (Q2) to reduce steady state power dissipation. After selecting  
the MOSFET, it is important to double check that it has sufficient SOA to handle the key stress scenarios: start-  
up, output Hot Short, and Start into Short. MOSFET's SOA is usually specified at a case temperature of 25°C  
and should be derated based on the maximum case temperature expected in the application.  
First, compute how much current will flow through Q1 using a current division formula shown below. For this  
example the FET RDSON at 100°C was used. RDSON of Q1 (RDSON1) is 4.8 mΩ (PSMNR8-100BSE max RDSON at  
25°C) x 1.8 (temperature coefficient), which equals 8.64 mΩ. RDSON of Q2 (RDSON2) is 4.9 mΩ (CSD19532Q5B  
max RDSON at 25°C) x 1.6 (temperature coefficient), which equals 7.84 mΩ.  
RDSON2  
7.84 mW  
N2  
2
IQ1,MAX = ILOAD,MAX  
ì
=
ì 33.3 A = 10.4 A  
RDSON2  
N2  
7.84 mW  
+ 8.64mW  
+RDSON1  
2
(17)  
Next the maximum temperature of Q1 can be computed using the equations below.  
TC,MAX = TA,MAX + RqCA ì (IQ1,MAX )2 ì RDSON(TJ )  
(18)  
(19)  
C
2
TC,MAX = 65èC + 20è ì 10.4A ì8.64mW = 83.7èC  
(
)
W
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Next the stress the MOSFET will experience during operation should be compared to the FETs capability. First,  
consider the power up. The inrush current with max COUT will be 0.53 A and the inrush will last for 198 ms. Note  
that the power dissipation of the FET will start at VIN,MAX × IINR and reduce to zero as the VDS of the MOSFET is  
reduced. The SOA curve of a typical MOSFET assume the same power dissipation for a given time. A  
conservative approach is to assume an equivalent power profile where PFET = VIN,MAX × IINR for t = Tstart-up /2. In  
this instance, the SOA can be checked by looking at a 72 V, 0.53 A, 99 ms pulse. Based on the SOA of the  
PSMN4R8-100BSE, it can handle 72 V, 3 A for 10 ms and it can handle 72 V, 1.3 A for 100 ms. The SOA at TC  
= 25°C for 99 ms can be extrapolated by approximating SOA vs time as a power function as shown in equations  
below:  
ISOA t = a ì t m  
( )  
(20)  
ISOA  
t
( )  
1
3A  
«
÷
÷
ln  
ln  
÷
ISOA (t 2 )  
1.3A  
«
m =  
a =  
=
= -0.36  
10 ms  
t1  
t 2  
ln  
ln  
÷
÷
÷
100 ms  
«
«
(21)  
ISOA (t 2 )  
1.3A  
=
= 6.82 A ì (ms)0.36  
-0.36  
tm2  
100ms  
(
)
(22)  
(23)  
ISOA 99 ms,25èC = 6.82 A ì(ms)0.36 ì(99 ms)-0.36 =1.3 A  
(
)
Finally, the FET SOA needs to be derated based on the maximum case temperature as shown below. Note that  
the FET can handle 0.79 A, while it will have 0.53 A during start-up. Thus there is a lot of margin during this test  
condition.  
175èC -83.7èC  
175
è
C
-
25
è
C  
ISOA 99 ms,T  
= 1.3A ì  
= 0.79A  
(
)
C,MAX  
(24)  
A similar approach should be taken to compute the FETs SOA capability during a Hot Short and start into short.  
As shown in the following figure, during a start into short the gate is coming up very slowly due to a large  
capacitance tied to the gate through the SS pin. Thus it is more stressful than a Hot Short and should be used for  
worst case SOA calculations. To compare the FET stress during start-up into short to the SOA curves the stress  
needs to be approximated as a square pulse as showing in the figure below. In this example, the stress is  
approximated with a 1.3 ms (Teq), 3 A, 72 V pulse. The FET can handle 18 A, 72 V for 1 ms and 3 A, 72 V for  
10 ms. Using approximation and temp derating as shown earlier, the FET's capability can be computed as 8.9 A,  
72 V, for 1.3 ms at 83.7°C. 8.9 A is significantly larger than 3 A implying great margin.  
22  
Copyright © 2017, Texas Instruments Incorporated  
TPS23521  
www.ti.com.cn  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
Figure 13. Teq During a Start Into a Short  
The final operating point to check is the operation with high current and VDS just below the VDS,SW threshold. In  
this example, the time out would be 1.1ms (one half of the time out at Vd = 0 V), the current will be 40 A, and the  
voltage would be 20 V. Looking up the SOA curve, the FET can handle 100 A, 20 V for 1 ms and 40 A, 20 V for  
10 ms. Repeating previously shown approximations and temp derating, the FET's capability is computed to be 58  
A, 20 V, for 1.1 ms at 83.7°C. Again this is below the worst case operating point of 40 A and 20 V suggesting  
good margin.  
9.2.2.6 EMI Filter Consideration  
In this example it is assumed that the EMI filter is right after the hot swap and the bulk cap is after the EMI filter.  
The EMI filter adds significant inductance and needs to be accounted for. During a Hot Short, the inductor builds  
up significant current that needs to go somewhere after the FET opens. For that a free wheeling diode should be  
used along with a snubber. For this example a 150 V, SMA diode was used: STPS1150A. The snubber  
consisted of a 10-Ω resistor in series with a 1-µF ceramic capacitor. In addition a 0.1-µF ceramic cap was tied  
directly on the output.  
9.2.2.7 Under Voltage and Over Voltage Settings  
Both the threshold and hysteresis can be programmed for under voltage and over voltage protection. In general  
the rising UV threshold should be set sufficiently below the minimum input voltage and the falling OV threshold  
should be set sufficiently above the maximum input voltage to account for tolerances. For this example a rising  
UV threshold of 35 V and a falling UV threshold of 33 V was chosen as the target. First, choose RUV1 based on  
the 2 V UV hysteresis as shown below.  
VUV,hyst,tgt  
2 V  
RUV1  
=
=
= 200 kßd  
iUV,hyst  
10 µA  
(25)  
Once RUV1 is known RUV2 can be computed based on the target rising UV threshold as shown below.  
RUV1  
200 kW  
RUV2  
=
=
= 5.88 kW  
VUV,TGT,Rising - 1V 35 V -1 V  
(26)  
23  
The OV setting can be programmed in a similar fashion as shown in equations below.  
Copyright © 2017, Texas Instruments Incorporated  
TPS23521  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
www.ti.com.cn  
VOV,hyst,tgt  
2 V  
ROV1  
=
=
= 200 kW  
200 kW  
iOV,hyst  
ROV1  
10 mA  
(27)  
(28)  
ROV2  
=
=
= 2.67 kW  
VOV,TGT,Rising -1 V 76 V -1 V  
Optional filtering capacitors can be added to the UV and OV to improve immunity to noise and transients on the  
input bus. These should be tuned based on system requirements and input inductance. In this example place  
holders were added to the PCB, but the components were not populated.  
9.2.2.8 Choosing RVCC and CVCC  
The VCC is used as internal supply rail and is a shunt regulator. To ensure stability of internal loop a minimum of  
0.1 µF is required for CVCC. To ensure reasonable power on time it is recommended to keep CVCC below 1 µF.  
RVCC should be sized in such a way to ensure that sufficient current is supplied to the IC at minimum operating  
voltage corresponding to the falling UV threshold. To allow for some margin it is recommended that the current  
through RVCC is at least 1.2x of IQ,MAX when RTN = Falling UV threshold and VCC = 10 V (minimum  
recommended operating voltage on VCC). For this example RVCC of 16.2 kΩ was used.  
9.2.2.9 Power Good Interface to Downstream DC/DC  
It is critical to keep the downstream DC/DC off while the hot swap is charging the bulk capacitor. This can be  
accomplished through the PGb pin. Note that the VEE of the hot swap and the DC/DC are different and the  
Power Good cannot be directly tied to the EN or UV of the DC/DC. The application circuit below provides a  
simple way to control the downstream converter with the PGb pin of the hot swap.  
Figure 14. Interface to DC/DC  
24  
Copyright © 2017, Texas Instruments Incorporated  
TPS23521  
www.ti.com.cn  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
9.2.3 Application Curves  
Figure 15. Start Up (Vin = 36 V)  
Figure 16. Start Up (Vin = 48 V)  
Figure 17. Start Up (Vin = 72 V)  
Figure 18. Start Up (Showing GATE2 and Vref/PG)  
Zoomed In  
Figure 19. Hot Short (Vin = 72 V, no load)  
Figure 20. Hot Short (Vin = 72 V, no load)  
Copyright © 2017, Texas Instruments Incorporated  
25  
TPS23521  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
www.ti.com.cn  
Figure 21. Hot Short (Vin = 72V, 1.2kW load)  
Figure 22. Gradual Over Current  
Figure 23. Retry Behavior  
Figure 24. Start Into Short (Vin =72V)  
Figure 25. Start Into Short (Zoomed in)  
26  
Copyright © 2017, Texas Instruments Incorporated  
TPS23521  
www.ti.com.cn  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
OR-ing circuit between surge and EVM  
OR-ing circuit between surge and EVM  
Figure 26. +2kV (2Ω) Lightning Surge  
Figure 27. +2kV (2Ω) Lightning Surge (zoomed in)  
OR-ing circuit between surge and EVM  
Figure 28. -2kV (2Ω) Lightning Surge  
OR-ing circuit between surge and EVM  
Figure 29. -2kV (2Ω) Lightning Surge (zoomed in)  
Copyright © 2017, Texas Instruments Incorporated  
27  
TPS23521  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
www.ti.com.cn  
10 Power Supply Recommendations  
In general, the TPS23521 is designed to have robust operation from a non-ideal –48 V bus with various  
transients such as the lightning surge. The IC is powered through RVCC making it more immune to supply drop  
outs and high voltage spikes. Regardless, TI recommends following several key precautions:  
Always test the solution with the various transients that can be encountered in the systems. This especially  
applies to transients that were not tested with TI’s EVM.  
If large input ripple is expected during start-up, increase the ratio of CSS, VEE to CSS to reduce input current  
ripple at start-up.  
Operating from large input inductance (>40 µH) can cause instability to the current limit loop or oscillations  
during start-up. Add a capacitor from Gate to VEE to help stabilize the current limit loop. Add an input  
snubber if oscillations are observed at start-up.  
28  
Copyright © 2017, Texas Instruments Incorporated  
TPS23521  
www.ti.com.cn  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
11 Layout  
11.1 Layout Guidelines  
There are several things to keep in mind during layout of the TPS23521 circuit:  
The VEE and SNS pin need to have a Kelvin Sense connection to the sense resistor.  
The VEE trace carries current and needs to be thick and short in order to minimize IR drop and to avoid  
introducing current sensing error.  
It is recommended to use a net-tie to separate the power plane coming into the RSNS and the Kelvin connection  
to VEE.  
Connect the UVEN resistor divider, OV resistor divider, and TMR cap to the "VEE" to insure maximum  
accuracy.  
The filtering caps on SNS should be placed as close to the IC as possible.  
11.2 Layout Example  
Figure 30. Layout Example  
版权 © 2017, Texas Instruments Incorporated  
29  
TPS23521  
ZHCSHW5A SEPTEMBER 2017REVISED DECEMBER 2017  
www.ti.com.cn  
12 器件和文档支持  
12.1 器件支持  
12.1.1 第三方产品免责声明  
TI 发布的与第三方产品或服务有关的信息,不能构成与此类产品或服务或保修的适用性有关的认可,不能构成此类  
产品或服务单独或与任何 TI 产品或服务一起的表示或认可。  
12.2 文档支持  
12.2.1 相关文档  
如需相关文档,请参阅:  
TPS23525EVM-815 评估模块用户指南》(SLVUB36)  
12.3 接收文档更新通知  
要接收文档更新通知,请导航至 TI.com 上的器件产品文件夹。请单击右上角的提醒我 进行注册,即可每周接收产  
品信息更改摘要。有关更改的详细信息,请查看任何已修订文档中包含的修订历史记录。  
12.4 社区资源  
下列链接提供到 TI 社区资源的连接。链接的内容由各个分销商按照原样提供。这些内容并不构成 TI 技术规范,  
并且不一定反映 TI 的观点;请参阅 TI 《使用条款》。  
TI E2E™ 在线社区 TI 的工程师对工程师 (E2E) 社区。此社区的创建目的在于促进工程师之间的协作。在  
e2e.ti.com 中,您可以咨询问题、分享知识、拓展思路并与同行工程师一道帮助解决问题。  
设计支持  
TI 参考设计支持 可帮助您快速查找有帮助的 E2E 论坛、设计支持工具以及技术支持的联系信息。  
12.5 商标  
E2E is a trademark of Texas Instruments.  
All other trademarks are the property of their respective owners.  
12.6 静电放电警告  
ESD 可能会损坏该集成电路。德州仪器 (TI) 建议通过适当的预防措施处理所有集成电路。如果不遵守正确的处理措施和安装程序 , 可  
能会损坏集成电路。  
ESD 的损坏小至导致微小的性能降级 , 大至整个器件故障。 精密的集成电路可能更容易受到损坏 , 这是因为非常细微的参数更改都可  
能会导致器件与其发布的规格不相符。  
12.7 Glossary  
SLYZ022 TI Glossary.  
This glossary lists and explains terms, acronyms, and definitions.  
13 机械、封装和可订购信息  
以下页面包含机械、封装和可订购信息。这些信息是指定器件的最新可用数据。数据如有变更,恕不另行通知,也  
不会对此文档进行修订。如欲获取此数据表的浏览器版本,请参阅左侧的导航栏。  
30  
版权 © 2017, Texas Instruments Incorporated  
PACKAGE OPTION ADDENDUM  
www.ti.com  
10-Dec-2020  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
TPS23521PWR  
TPS23521PWT  
ACTIVE  
ACTIVE  
TSSOP  
TSSOP  
PW  
PW  
16  
16  
2000 RoHS & Green  
250 RoHS & Green  
NIPDAU  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
-40 to 125  
-40 to 125  
23521  
23521  
NIPDAU  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
10-Dec-2020  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
3-Jun-2022  
TAPE AND REEL INFORMATION  
REEL DIMENSIONS  
TAPE DIMENSIONS  
K0  
P1  
W
B0  
Reel  
Diameter  
Cavity  
A0  
A0 Dimension designed to accommodate the component width  
B0 Dimension designed to accommodate the component length  
K0 Dimension designed to accommodate the component thickness  
Overall width of the carrier tape  
W
P1 Pitch between successive cavity centers  
Reel Width (W1)  
QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE  
Sprocket Holes  
Q1 Q2  
Q3 Q4  
Q1 Q2  
Q3 Q4  
User Direction of Feed  
Pocket Quadrants  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
TPS23521PWR  
TPS23521PWT  
TSSOP  
TSSOP  
PW  
PW  
16  
16  
2000  
250  
330.0  
180.0  
12.4  
12.4  
6.9  
6.9  
5.6  
5.6  
1.6  
1.6  
8.0  
8.0  
12.0  
12.0  
Q1  
Q1  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
3-Jun-2022  
TAPE AND REEL BOX DIMENSIONS  
Width (mm)  
H
W
L
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SPQ  
Length (mm) Width (mm) Height (mm)  
TPS23521PWR  
TPS23521PWT  
TSSOP  
TSSOP  
PW  
PW  
16  
16  
2000  
250  
356.0  
210.0  
356.0  
185.0  
35.0  
35.0  
Pack Materials-Page 2  
PACKAGE OUTLINE  
PW0016A  
TSSOP - 1.2 mm max height  
S
C
A
L
E
2
.
5
0
0
SMALL OUTLINE PACKAGE  
SEATING  
PLANE  
C
6.6  
6.2  
TYP  
A
0.1 C  
PIN 1 INDEX AREA  
14X 0.65  
16  
1
2X  
5.1  
4.9  
4.55  
NOTE 3  
8
9
0.30  
16X  
4.5  
4.3  
NOTE 4  
1.2 MAX  
0.19  
B
0.1  
C A B  
(0.15) TYP  
SEE DETAIL A  
0.25  
GAGE PLANE  
0.15  
0.05  
0.75  
0.50  
A
20  
0 -8  
DETAIL A  
TYPICAL  
4220204/A 02/2017  
NOTES:  
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing  
per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not  
exceed 0.15 mm per side.  
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm per side.  
5. Reference JEDEC registration MO-153.  
www.ti.com  
EXAMPLE BOARD LAYOUT  
PW0016A  
TSSOP - 1.2 mm max height  
SMALL OUTLINE PACKAGE  
SYMM  
16X (1.5)  
(R0.05) TYP  
16  
1
16X (0.45)  
SYMM  
14X (0.65)  
8
9
(5.8)  
LAND PATTERN EXAMPLE  
EXPOSED METAL SHOWN  
SCALE: 10X  
METAL UNDER  
SOLDER MASK  
SOLDER MASK  
OPENING  
SOLDER MASK  
OPENING  
METAL  
EXPOSED METAL  
EXPOSED METAL  
0.05 MAX  
ALL AROUND  
0.05 MIN  
ALL AROUND  
NON-SOLDER MASK  
DEFINED  
SOLDER MASK  
DEFINED  
15.000  
(PREFERRED)  
SOLDER MASK DETAILS  
4220204/A 02/2017  
NOTES: (continued)  
6. Publication IPC-7351 may have alternate designs.  
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.  
www.ti.com  
EXAMPLE STENCIL DESIGN  
PW0016A  
TSSOP - 1.2 mm max height  
SMALL OUTLINE PACKAGE  
16X (1.5)  
SYMM  
(R0.05) TYP  
16  
1
16X (0.45)  
SYMM  
14X (0.65)  
8
9
(5.8)  
SOLDER PASTE EXAMPLE  
BASED ON 0.125 mm THICK STENCIL  
SCALE: 10X  
4220204/A 02/2017  
NOTES: (continued)  
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
9. Board assembly site may have different recommendations for stencil design.  
www.ti.com  
重要声明和免责声明  
TI“按原样提供技术和可靠性数据(包括数据表)、设计资源(包括参考设计)、应用或其他设计建议、网络工具、安全信息和其他资源,  
不保证没有瑕疵且不做出任何明示或暗示的担保,包括但不限于对适销性、某特定用途方面的适用性或不侵犯任何第三方知识产权的暗示担  
保。  
这些资源可供使用 TI 产品进行设计的熟练开发人员使用。您将自行承担以下全部责任:(1) 针对您的应用选择合适的 TI 产品,(2) 设计、验  
证并测试您的应用,(3) 确保您的应用满足相应标准以及任何其他功能安全、信息安全、监管或其他要求。  
这些资源如有变更,恕不另行通知。TI 授权您仅可将这些资源用于研发本资源所述的 TI 产品的应用。严禁对这些资源进行其他复制或展示。  
您无权使用任何其他 TI 知识产权或任何第三方知识产权。您应全额赔偿因在这些资源的使用中对 TI 及其代表造成的任何索赔、损害、成  
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TI 针对 TI 产品发布的适用的担保或担保免责声明。  
TI 反对并拒绝您可能提出的任何其他或不同的条款。IMPORTANT NOTICE  
邮寄地址:Texas Instruments, Post Office Box 655303, Dallas, Texas 75265  
Copyright © 2022,德州仪器 (TI) 公司  

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