TPS7A1413PYBKR [TI]

1A、低输入和输出电压、超低压降 (LDO) 稳压器 | YBK | 6 | -40 to 125;
TPS7A1413PYBKR
型号: TPS7A1413PYBKR
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

1A、低输入和输出电压、超低压降 (LDO) 稳压器 | YBK | 6 | -40 to 125

稳压器
文件: 总34页 (文件大小:3140K)
中文:  中文翻译
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TPS7A14  
ZHCSPG4B DECEMBER 2021 REVISED MAY 2022  
TPS7A14 1AVINVOUT、超低压降稳压器  
1 特性  
3 说明  
• 超低输入电压范围0.7V 2.2V  
• 高效率:  
1A 时的压降电压为70mV最大值)  
– 适用VIN = VOUT +100mV  
• 出色的负载瞬态响应:  
TPS7A14 是一款小型超低压差稳压器 (LDO)具有出  
色的瞬态响应。该器件可提供 1A 电流并具有出色的  
交流性能负载和线路瞬态响应。输入电压范围为  
0.7V 2.2V输出范围为 0.5V 2.05V且在负  
载、线路和温度范围内具1% 的超高精度。  
ILOAD 20µs 3mA 变化600mA 时为  
主电源路径通过 IN 引脚可连接至电压至少高于输出  
电压 50mV 的电源。所有电气特性包括出色的输出  
电压容差、瞬态响应和 PSRR均针对输入电压比  
输出电压高 100mV进行规定因此可实现高效率。  
该稳压器使用一个为 LDO 内部电路供电的外部较高  
20mV  
• 在负载、线路和温度范围内的精度为1%  
PSRR:  
1kHz 80dBVOUT = 0.8VIOUT  
500mA)  
=
V
BIAS 电压轨支持很低的输入电压。例如IN 引脚的  
电源电压可以是高效直流/直流降压稳压器的输出而  
BIAS 引脚电源电压可来自可再充电电池。  
• 可提供固定输出电压:  
0.5V 2.05V阶跃25mV)  
VBIAS 范围2.2V 5.5V  
• 封装:  
TPS7A14 配备了一个有源下拉电路用于在输出处于  
禁用状态时使其快速放电并提供已知的启动状态。  
6 DSBGA0.71mm × 1.16mm  
• 有源输出放电  
TPS7A14 可采用超小型 0.71mm × 1.16mm6 凸点  
DSBGA 封装非常适合空间受限的应用。  
2 应用  
器件信息(1)  
摄像头模块  
封装尺寸标称值)  
器件型号  
TPS7A14  
封装  
DSBGA (6)  
无线耳机和耳塞  
智能手表和健身追踪器  
智能手机平板电脑  
便携式医疗设备  
固态硬(SSD)  
0.71mm × 1.16mm  
(1) 如需了解所有可用封装请参阅数据表末尾的可订购产品附  
录。  
CBIAS  
BIAS  
VOUT  
IN  
OUT  
Standalone  
IN  
OUT  
CIN  
COUT  
DC/DC Converter  
Or PMU  
TPS7A14  
EN  
SENSE  
GND  
GND  
典型应用电路  
本文档旨在为方便起见提供有TI 产品中文版本的信息以确认产品的概要。有关适用的官方英文版本的最新信息请访问  
www.ti.com其内容始终优先。TI 不保证翻译的准确性和有效性。在实际设计之前请务必参考最新版本的英文版本。  
English Data Sheet: SBVS400  
 
 
 
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ZHCSPG4B DECEMBER 2021 REVISED MAY 2022  
Table of Contents  
7.4 Device Functional Modes..........................................16  
8 Application and Implementation..................................17  
8.1 Application Information............................................. 17  
8.2 Typical Application.................................................... 21  
9 Power Supply Recommendations................................23  
10 Layout...........................................................................23  
10.1 Layout Guidelines................................................... 23  
10.2 Layout Example...................................................... 24  
11 Device and Documentation Support..........................25  
11.1 Device Support........................................................25  
11.2 Documentation Support.......................................... 25  
11.3 接收文档更新通知................................................... 25  
11.4 支持资源..................................................................25  
11.5 Trademarks............................................................. 25  
11.6 Electrostatic Discharge Caution..............................25  
11.7 术语表..................................................................... 25  
1 特性................................................................................... 1  
2 应用................................................................................... 1  
3 说明................................................................................... 1  
4 Revision History.............................................................. 2  
5 Pin Configuration and Functions...................................3  
6 Specifications.................................................................. 4  
6.1 Absolute Maximum Ratings........................................ 4  
6.2 ESD Ratings............................................................... 4  
6.3 Recommended Operating Conditions.........................4  
6.4 Thermal Information....................................................5  
6.5 Electrical Characteristics.............................................5  
6.6 Switching Characteristics............................................7  
6.7 Typical Characteristics................................................8  
7 Detailed Description......................................................13  
7.1 Overview...................................................................13  
7.2 Functional Block Diagram.........................................13  
7.3 Feature Description...................................................14  
4 Revision History  
以前版本的页码可能与当前版本的页码不同  
Changes from Revision A (January 2022) to Revision B (May 2022)  
Page  
Changed Functional Block Diagram image...................................................................................................... 13  
Changes from Revision * (December 2021) to Revision A (January 2022)  
Page  
Changed PSRR vs Frequency and VIN VOUT figure legend to align with Electrical Characteristics ..............8  
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5 Pin Configuration and Functions  
1
2
A
B
C
OUT  
IN  
SENSE  
GND  
EN  
BIAS  
Not to scale  
5-1. YBK Package, 6-Pin WCSP (Top View)  
5-1. Pin Functions  
PIN  
TYPE  
DESCRIPTION  
NO. NAME  
Regulated output pin. A 2.2 µF or greater capacitance is required from OUT to ground for stability.  
For best transient response, use an 8-µF (nominal) or larger ceramic capacitor from OUT to  
ground. Place the output capacitor as close to OUT as possible.  
A1  
A2  
B1  
OUT  
Output  
Input  
Input pin. A 0.75 µF or greater capacitance is required from IN to ground for stability. Place the  
input capacitor as close to IN as possible.  
IN  
SENSE input. This pin is a feedback input to the regulator for SENSE connections. Connecting  
SENSE to the load helps eliminate voltage errors resulting from trace resistance between OUT  
and the load.  
SENSE  
Input  
Enable pin. Driving this pin to logic high enables the LDO. Driving this pin to logic low disables the  
LDO. If enable functionality is not required, EN must be connected to IN or BIAS.  
B2  
C1  
EN  
Input  
GND  
Ground pin. This pin must be connected to ground.  
BIAS pin. This pin enables operation in low-input voltage, low-output voltage (LILO) conditions.  
For best performance, use 0.47-µF or larger ceramic capacitor from BIAS to ground. Place the  
bias capacitor as close to BIAS as possible.  
C2  
BIAS  
Input  
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6 Specifications  
6.1 Absolute Maximum Ratings  
over operating free-air temperature range unless otherwise noted.(1)  
MIN  
0.3  
MAX UNIT  
Input, VIN  
2.4  
6.0  
Enable, VEN  
0.3  
Voltage  
Bias, VBIAS  
6.0  
VIN + 0.3 (2)  
VIN + 0.3 (2)  
V
0.3  
Sense, VSENSE  
Output, VOUT  
0.3  
0.3  
Current  
Maximum output  
Operating junction, TJ  
Storage, Tstg  
Internally limited  
40  
A
150  
150  
°C  
°C  
Temperature  
65  
(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute maximum ratings do not imply  
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions. If  
briefly operating outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not  
sustain damage, but it may not be fully functional. Operating the device in this manner may affect device reliability, functionality,  
performance, and shorten the device lifetime.  
(2) The absolute maximum rating is 2.4 V or (VIN + 0.3 V), whichever is less.  
6.2 ESD Ratings  
VALUE  
±3000  
±750  
UNIT  
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)  
V(ESD)  
Electrostatic discharge  
V
Charged-device model (CDM), per JEDEC specification JESD22-C101(2)  
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.  
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.  
6.3 Recommended Operating Conditions  
over operating junction temperature range (unless otherwise noted).(1)  
MIN  
NOM  
MAX  
UNIT  
VIN  
Input voltage  
Bias voltage  
0.7  
2.2  
V
Greater of 2.2 or  
VOUT(NOM) + 1.4  
VBIAS  
5.5  
V
VOUT  
IOUT  
CIN  
Output voltage  
0.5  
0
2.05  
1
V
A
Peak output current  
Input capacitance (2)  
0.75  
µF  
µF  
µF  
m  
CBIAS  
COUT  
ESR  
TJ  
Bias capacitance (3)  
0.1  
Output capacitance  
2.2  
47  
100  
125  
Output capacitor series resistance  
Operating junction temperature  
40  
(1) All voltages are with respect to GND.  
(2) An input capacitor is required to counteract the effect of source resistance and inductance, which may in some cases cause symptoms  
of system level instability such as ringing or oscillation, especially in the presence of load transients. A larger input capacitor may be  
necessary depending on the source impedance and system requirements.  
(3) A BIAS input capacitor is not required for LDO stability. However, a capacitor with a derated value of at least 0.1 µF is recommended to  
maintain transient, PSRR, and noise performance.  
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6.4 Thermal Information  
TPS7A14  
THERMAL METRIC(1)  
DSBGA  
6 PINS  
136.7  
1.1  
UNIT  
RθJA  
Junction-to-ambient thermal resistance  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
RθJC(top)  
RθJB  
38.1  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case (bottom) thermal resistance  
0.5  
ψJT  
38.1  
ψJB  
RθJC(bot)  
n/a  
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application  
report.  
6.5 Electrical Characteristics  
specified at TJ = 40°C to +85°C, VIN = VOUT(NOM) + 0.1 V, VBIAS = greater of 2.2 V or VOUT(NOM) + 1.4 V, IOUT = 1 mA, VEN  
1.0 V, CIN = 1 μF, COUT = 2.2 μF, and CBIAS = 0.1 μF (unless otherwise noted); all typical values are at TJ = 25°C  
=
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
1
VOUT(NOM) + 0.1 V ≤  
TJ = 40°C to +125°C  
1.5  
VIN 2.2 V,  
Greater of 2.2 V or  
VOUT(NOM) + 1.4 V ≤  
Accuracy over temperature  
%
1
TJ = 40°C to +85°C  
1  
V
BIAS 5.5 V,  
1 mA IOUT 1 A  
VIN line regulation  
VBIAS line regulation  
Load regulation  
2.5  
2.5  
mV  
mV  
%/A  
µA  
ΔVOUT / ΔVIN  
ΔVOUT / ΔVBIAS  
ΔVOUT / ΔIOUT  
VOUT(NOM) + 0.1 V VIN 2.2 V  
VOUT(NOM) + 1.4 V VBIAS 5.5 V  
1 mA IOUT 1 A  
2.5  
2.5  
±0.15  
0.2  
IOUT = 0 mA  
26  
12  
IQ(BIAS)  
Bias pin current  
IOUT = 1 A  
mA  
µA  
IQ(IN)  
Input pin current(1)  
IOUT = 0 mA  
5.7  
620  
3.8  
9.2  
IGND  
Ground pin current  
VBIAS shutdown current  
VIN shutdown current  
IOUT = 1 A  
480  
0.3  
1
µA  
ISHDN(BIAS)  
ISHDN(IN)  
µA  
VIN = 2.2 V, VBIAS = 5.5 V, VEN 0.2 V  
VIN = 1.8 V, VBIAS = 5.5 V, VEN 0.2 V  
µA  
VOUT = 0.95 × VOUT(NOM)  
TJ = 40°C to +125°C  
,
ICL  
ISC  
Output current limit  
1.035  
1.6  
2.45  
A
Short circuit current limit  
VOUT = 0 V  
600  
mA  
mV  
mV  
99  
70  
TJ = 40°C to + 125°C  
TJ = 40°C to + 85°C  
VIN = 0.95 x VOUT(NOM)  
,
VDO(IN)  
VIN dropout voltage(2)  
IOUT = 1 A  
VBIAS = greater of 1.7V or VOUT(nom) + 0.6 V,  
VSENSE = 0.95 x VOUT(nom), IOUT = 1 A,  
TJ = 40°C to +125°C  
VDO(BIAS)  
VBIAS dropout voltage(2)  
1.1  
V
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6.5 Electrical Characteristics (continued)  
specified at TJ = 40°C to +85°C, VIN = VOUT(NOM) + 0.1 V, VBIAS = greater of 2.2 V or VOUT(NOM) + 1.4 V, IOUT = 1 mA, VEN  
1.0 V, CIN = 1 μF, COUT = 2.2 μF, and CBIAS = 0.1 μF (unless otherwise noted); all typical values are at TJ = 25°C  
=
PARAMETER  
TEST CONDITIONS  
IOUT = 3 mA  
IOUT = 500 mA  
IOUT = 1 A  
MIN  
TYP  
90  
80  
80  
90  
80  
70  
70  
60  
50  
60  
43  
33  
60  
24  
15  
69  
42  
33  
65  
45  
25  
MAX  
UNIT  
f = 100 Hz  
f = 1 kHz  
IOUT = 3 mA  
IOUT = 500 mA  
IOUT = 1 A  
IOUT = 3 mA  
IOUT = 500 mA  
IOUT = 1 A  
f = 10 kHz  
f = 100 kHz  
VIN power-supply rejection  
ratio  
VIN PSRR  
dB  
IOUT = 3 mA  
IOUT = 500 mA  
IOUT = 1 A  
IOUT = 3 mA  
IOUT = 500 mA  
IOUT = 1 A  
f = 1 MHz  
f = 1 MHz,  
IOUT = 3 mA  
IOUT = 500 mA  
VIN = VOUT + 150 mV  
IOUT = 1 A  
f = 1 kHz  
VBIAS power-supply rejection  
ratio  
VBIAS PSRR  
f = 100 kHz  
f = 1 MHz  
IOUT = 500 mA  
dB  
Bandwidth = 10 Hz to 100 kHz,  
VOUT = 0.8 V, 5mA IOUT 1 A  
Vn  
Output voltage noise  
7.2  
µVRMS  
VBIAS rising  
1.15  
1.0  
1.42  
1.3  
1.7  
VUVLO(BIAS)  
VUVLO_HYST(BIAS)  
VUVLO(IN)  
Bias supply UVLO  
Bias supply hysteresis  
Input supply UVLO  
V
TJ = 40°C to + 125°C  
VBIAS falling  
VBIAS hysteresis  
VIN rising  
1.63  
100  
603  
552  
50  
mV  
mV  
584  
530  
623  
566  
TJ = 40°C to + 125°C  
VIN falling  
VUVLO_HYST(IN)  
tSTR  
Input supply hysteresis  
Start-up time(3)  
VIN hysteresis  
mV  
µs  
V
186  
VEN(HI)  
EN pin logic high voltage(4)  
EN pin logic low voltage(4)  
EN pin current  
0.6  
0
6
0.25  
20  
TJ = 40°C to +125°C  
TJ = 40°C to +125°C  
EN = 5.5 V  
VEN(LOW)  
IEN  
V
-20  
10  
36  
nA  
VIN = 0.9 V, VOUT(nom) = 0.8 V, VBIAS = 1 V,  
VEN = 0 V, P version only  
RPULLDOWN  
Pulldown resistor  
Ω
Shutdown, temperature rising  
Reset, temperature falling  
165  
140  
Thermal shutdown  
temperature  
TSD  
°C  
(1) This is the current flowing from VIN to GND.  
(2) Dropout is not measured for VOUT < 0.6 V. VBIAS dropout applies only for VBIAS of 2.2 V or greater.  
(3) Startup time = time from EN assertion to 0.95 × VOUT(NOM).  
(4) An input voltage within the minimum to maximum range is interpreted as the correct logic level.  
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6.6 Switching Characteristics  
specified at TJ = 40°C to +125°C, VIN = VOUT(NOM) + 0.1 V, VBIAS = greater of 2.2 V or VOUT(NOM) + 1.4 V, IOUT = 1 mA, VEN  
= 1.0 V, CIN = 1 μF, COUT = 2.2 μF, and CBIAS = 0.1 μF (unless otherwise noted); all typical values are at TJ = 25°C; all  
transients values are over multiple load or line pulses with periods of 100µs on (high load) and 100µs off (low load)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
VIN = (VOUT(NOM)  
0.1 V) to 2.1 V  
+
Transition time, tR = 1 V / µs  
1
Line transient(1)  
% VOUT  
ΔVOUT  
VIN = 2.1 V to  
(VOUT(NOM) + 0.1 V)  
Transition time, tF = 1 V / µs  
1  
2  
IOUT = 3 mA to 600 mA  
IOUT = 600 mA to 3 mA  
Transition time, tR = 20 µs, tF = 20 µs, tOFF  
200 µs, tON = 1 ms, CIN = 5 μF, COUT = 5 μF  
=
Load transient(1)  
% VOUT  
ΔVOUT  
2
(1) This specification is verified by design.  
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6.7 Typical Characteristics  
at operating temperature TJ = 25°C, VOUT(NOM) = 0.8 V, VIN = VOUT(NOM) + 0.1 V, VBIAS = VOUT(NOM) + 1.4 V, IOUT = 1 mA, VEN  
= VIN, CIN = 2.2 µF, COUT = 2.2 µF, and CBIAS = 0.47 µF (unless otherwise noted)  
6-2. Output Voltage Accuracy vs VBIAS  
6-1. Output Voltage Accuracy vs VIN  
6-3. Output Voltage Accuracy vs IOUT  
6-5. VBIAS Dropout Voltage vs IOUT  
6-4. VIN Dropout Voltage vs IOUT  
6-6. VBIAS Input Current vs VBIAS  
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6.7 Typical Characteristics (continued)  
at operating temperature TJ = 25°C, VOUT(NOM) = 0.8 V, VIN = VOUT(NOM) + 0.1 V, VBIAS = VOUT(NOM) + 1.4 V, IOUT = 1 mA, VEN  
= VIN, CIN = 2.2 µF, COUT = 2.2 µF, and CBIAS = 0.47 µF (unless otherwise noted)  
IOUT = 1 A  
IOUT = 0 mA  
6-7. VBIAS Input Current vs VBIAS  
6-8. VIN Shutdown IQ vs VIN  
IOUT = 0 A, VIN = 1 V  
6-10. VOUT Foldback Current Limit vs Output Current  
6-9. VBIAS Shutdown IQ vs VBIAS  
6-12. VIN UVLO vs Temperature  
6-11. Enable Threshold vs Temperature  
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6.7 Typical Characteristics (continued)  
at operating temperature TJ = 25°C, VOUT(NOM) = 0.8 V, VIN = VOUT(NOM) + 0.1 V, VBIAS = VOUT(NOM) + 1.4 V, IOUT = 1 mA, VEN  
= VIN, CIN = 2.2 µF, COUT = 2.2 µF, and CBIAS = 0.47 µF (unless otherwise noted)  
tr = 1 μs  
6-13. VBIAS UVLO vs Temperature  
6-14. Start-Up With VBIAS Before VIN  
tr = 1 μs  
tr = 1 μs  
6-15. Start-Up With VIN Before VBIAS and VEN  
6-16. Start-Up With VIN and VBIAS Before VEN  
tr = tf = 10 μs, IOUT = 1 mA  
tr = 1 μs  
6-18. Line Transient From 1 V to 2.2 V  
6-17. Start-Up With VIN and VEN Before VBIAS  
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6.7 Typical Characteristics (continued)  
at operating temperature TJ = 25°C, VOUT(NOM) = 0.8 V, VIN = VOUT(NOM) + 0.1 V, VBIAS = VOUT(NOM) + 1.4 V, IOUT = 1 mA, VEN  
= VIN, CIN = 2.2 µF, COUT = 2.2 µF, and CBIAS = 0.47 µF (unless otherwise noted)  
tr = tf = 10 μs, IOUT = 500 mA  
tr = tf = 10 μs, IOUT = 1 A  
6-19. Line Transient From 1 V to 2.2 V  
6-20. Line Transient From 1 V to 2.2 V  
tr = tf = 1 μs  
tr = tf = 20 μs  
6-21. Load Transient From 100 μA to 1 A  
6-22. Load Transient From 100 μA to 1 A  
CBIAS = 0 μF, IOUT = 1 A  
CBIAS = 0 μF, IOUT = 1 A  
6-23. PSRR vs Frequency and VIN VOUT  
6-24. PSRR vs Frequency and COUT  
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6.7 Typical Characteristics (continued)  
at operating temperature TJ = 25°C, VOUT(NOM) = 0.8 V, VIN = VOUT(NOM) + 0.1 V, VBIAS = VOUT(NOM) + 1.4 V, IOUT = 1 mA, VEN  
= VIN, CIN = 2.2 µF, COUT = 2.2 µF, and CBIAS = 0.47 µF (unless otherwise noted)  
CBIAS = 0 μF  
CBIAS = 0 μF  
6-25. PSRR vs Frequency and IOUT  
6-26. PSRR vs Frequency and VBIAS VOUT  
6-27. Output Noise vs Frequency and IOUT  
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7 Detailed Description  
7.1 Overview  
The TPS7A14 is a low-input, ultra-low dropout, low-quiescent-current linear regulator that is optimized for  
excellent transient performance. These characteristics make the device designed for most battery-powered  
applications. The low operating VIN VOUT, combined with the BIAS pin, dramatically improve the efficiency of  
low-voltage output applications by powering the voltage reference and control circuitry and allowing the use of a  
pre-regulated, low-voltage input supply (IN) for the main power path. This low-dropout regulator (LDO) offers  
foldback current limit, shutdown, thermal protection, and an optional active discharge.  
7.2 Functional Block Diagram  
Current  
Limit  
IN  
OUT  
+
Overshoot  
Pull-Down  
BIAS  
Bandgap  
UVLO  
SENSE  
+
Active Discharge  
P-Version Only  
Internal  
Controller  
GND  
EN  
Thermal  
Shutdown  
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7.3 Feature Description  
7.3.1 Excellent Transient Response  
The TPS7A14 responds quickly to a change on the input supply (line transient) or the output current (load  
transient) given the device high input impedance and low output impedance across frequency. This same  
capability also means that this LDO has a high power-supply rejection ratio (PSRR) and, when coupled with a  
low internal noise floor (en), the LDO can be used to create an excellent power supply with outstanding line and  
load transient performance.  
The choice of external component values optimizes the transient response; see the Input, Output, and Bias  
Capacitor Requirements section for proper capacitor selection.  
7.3.2 Global Undervoltage Lockout (UVLO)  
The TPS7A14 uses two undervoltage lockout circuits: one on the BIAS pin and one on the IN pin to prevent the  
device from turning on before both VBIAS and VIN rise above their lockout voltages. The two UVLO signals are  
connected internally through an AND gate, as shown in 7-1, that turns off the device when the voltage on  
either input is below their respective UVLO thresholds.  
UVLO(IN)  
Global UVLO  
UVLO(BIAS)  
7-1. Global UVLO circuit  
7.3.3 Enable Input  
The enable input (EN) is active high. Applying a voltage greater than VEN(HI) to EN enables the regulator output  
voltage, and applying a voltage less than VEN(LOW) to EN disables the regulator output. If independent control of  
the output voltage is not needed, connect EN to either IN or BIAS.  
7.3.4 Internal Foldback Current Limit  
The device has an internal current limit circuit that protects the regulator during transient high-load current faults  
or shorting events. The current limit is a hybrid brick-wall foldback scheme. The current limit transitions from a  
brick-wall scheme to a foldback scheme at the foldback voltage (VFOLDBACK). In a high-load current fault with the  
output voltage above VFOLDBACK, the brick-wall scheme limits the output current to the current limit (ICL). When  
the voltage drops below VFOLDBACK, a foldback current limit activates that scales back the current as the output  
voltage approaches GND. When the output is shorted, the device supplies a typical current called the short-  
circuit current limit (ISC). ICL and ISC are listed in the Electrical Characteristics table.  
For this device, VFOLDBACK is approximately 60% × VOUT(nom)  
.
The output voltage is not regulated when the device is in current limit. When a current limit event occurs, the  
device begins to heat up because of the increase in power dissipation. When the device is in brick-wall current  
limit, the pass transistor dissipates power [(VIN VOUT) × ICL]. When the device output is shorted and the output  
is below VFOLDBACK, the pass transistor dissipates power [(VIN VOUT) × ISC]. If thermal shutdown is triggered,  
the device turns off. After the device cools down, the internal thermal shutdown circuit turns the device back on.  
If the output current fault condition continues, the device cycles between current limit and thermal shutdown. For  
more information on current limits, see the Know Your Limits application report.  
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7-2 shows a diagram of the foldback current limit.  
VOUT  
Brickwall  
VOUT(NOM)  
VFOLDBACK  
Foldback  
0 V  
IOUT  
IRATED  
0 mA  
ISC  
ICL  
7-2. Foldback Current Limit  
7.3.5 Active Discharge  
The active discharge function uses an internal MOSFET that connects a resistor (RPULLDOWN) to ground when  
the LDO is disabled in order to actively discharge the output voltage. The active discharge circuit is activated by  
driving EN to logic low to disable the device, when the voltage at IN or BIAS is below the UVLO threshold, or  
when the regulator is in thermal shutdown.  
The discharge time after disabling the device depends on the output capacitance (COUT) and the load resistance  
(RL) in parallel with the pulldown resistor.  
Do not rely on the active discharge circuit for discharging a large amount of output capacitance after the input  
supply has collapsed because reverse current can flow from the output to the input. This reverse current flow  
can cause damage to the device. Limit reverse current to no more than 5% of the rated output current for a short  
period of time.  
7.3.6 Thermal Shutdown  
The internal thermal shutdown protection circuit disables the output when the thermal junction temperature (TJ )  
of the pass transistor rises to the thermal shutdown temperature threshold, TSD(shutdown) (typical). The thermal  
shutdown circuit hysteresis ensures that the LDO resets (turns on) when the temperature falls to TSD(reset)  
(typical).  
The thermal time constant of the semiconductor die is fairly short; thus, the device may cycle on and off when  
thermal shutdown is reached until the power dissipation is reduced. Power dissipation during start up can be  
high from large VIN VOUT voltage drops across the device or from high inrush currents charging large output  
capacitors. Under some conditions, the thermal shutdown protection disables the device before start up  
completes.  
For reliable operation, limit the junction temperature to the maximum listed in the Recommended Operating  
Conditions table. Operation above this maximum temperature causes the device to exceed its operational  
specifications. Although the internal protection circuitry is designed to protect against thermal overload  
conditions, this circuitry is not intended to replace proper heat sinking. Continuously running the regulator into  
thermal shutdown or above the maximum recommended junction temperature reduces long-term reliability.  
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7.4 Device Functional Modes  
7-1 shows the conditions that lead to the different modes of operation. See the Electrical Characteristics table  
for parameter values.  
7-1. Device Functional Mode Comparison  
PARAMETER  
OPERATING MODE  
VIN  
VBIAS  
VEN  
IOUT  
TJ  
VIN VOUT (nom) + VDO  
and VIN VIN(min)  
TJ < TSD for  
shutdown  
V
BIAS VOUT +  
VDO(BIAS)  
Normal mode  
Dropout mode  
IOUT < ICL  
VEN VIH(EN)  
VIN(min) < VIN < VOUT  
(nom) + VDO(IN)  
TJ < TSD for  
shutdown  
VBIAS < VOUT + VDO(BIAS)  
VEN > VIH(EN)  
IOUT < ICL  
Disabled mode  
(any true condition  
disables the device)  
TJ TSD for  
shutdown  
VIN < VUVLO(IN)  
VBIAS < VBIAS(UVLO)  
VEN < VIL(EN)  
7.4.1 Normal Operation  
The device regulates to the nominal output voltage when the following conditions are met:  
The input voltage is greater than the nominal output voltage plus the dropout voltage (VOUT(nom) + VDO  
The bias voltage is greater than the nominal output voltage plus the dropout voltage (VOUT(nom) + VDO  
The output current is less than the current limit (IOUT < ICL  
The device junction temperature is less than the thermal shutdown temperature ( TJ < TSD(shutdown)  
)
)
)
)
The enable voltage has previously exceeded the enable rising threshold voltage and has not yet decreased  
to less than the enable falling threshold  
7.4.2 Dropout Operation  
If the input voltage is lower than the nominal output voltage plus the specified dropout voltage, but all other  
conditions are met for normal operation, the device operates in dropout mode. Similarly, if the bias voltage is  
lower than the nominal output voltage plus the specified dropout voltage, but all other conditions are met for  
normal operation, the device operates in dropout mode as well. In this mode, the output voltage tracks the input  
voltage. During this mode, the transient performance of the device becomes significantly degraded because the  
pass transistor is in the ohmic or triode region, and acts as a switch. Line or load transients in dropout can result  
in large output voltage deviations.  
When the device is in a steady dropout state, defined as when the device is in dropout, (VIN < VOUT + VDO or  
VBIAS < VOUT + VDO directly after being in normal regulation state, but not during start up), the pass transistor is  
driven into the ohmic or triode region. When the input voltage returns to a value greater than or equal to the  
nominal output voltage plus the dropout voltage (VOUT(NOM) + VDO), the output voltage can overshoot for a short  
time when the device pulls the pass transistor back into the linear region.  
7.4.3 Disable Mode  
The output of the device can be shutdown by forcing the voltage of the enable pin to less than VIL(EN) (see the  
Electrical Characteristics table). When disabled, the pass transistor is turned off, internal circuits are shutdown,  
and the output voltage is actively discharged to ground by an internal discharge circuit from the output to ground.  
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8 Application and Implementation  
备注  
以下应用部分中的信息不属TI 器件规格的范围TI 不担保其准确性和完整性。TI 的客 户应负责确定  
器件是否适用于其应用。客户应验证并测试其设计以确保系统功能。  
8.1 Application Information  
Successfully implementing an LDO in a system depends on the system requirements. This section discusses  
key device features and how to best implement them to achieve a reliable design.  
8.1.1 Recommended Capacitor Types  
The regulator is designed to be stable using low equivalent series resistance (ESR) ceramic capacitors at the  
input, output, and bias pins. Multilayer ceramic capacitors are the industry standard for use with LDOs, but must  
be used with good judgment. Ceramic capacitors that use X7R-, X5R-, and COG-rated dielectric materials  
provide relatively good capacitive stability across temperature, whereas the use of Y5V-rated capacitors is  
discouraged because of large variations in capacitance. Regardless of the ceramic capacitor type selected,  
ceramic capacitance varies with operating voltage and temperature. Generally, assume that effective  
capacitance decreases by as much as 50%. The input, output, and bias capacitors recommended in the  
Recommended Operating Conditions table account for an effective capacitance of approximately 50% of the  
nominal value.  
8.1.2 Input, Output, and Bias Capacitor Requirements  
A minimum input ceramic capacitor is required for stability. A minimum output ceramic capacitor is also required  
for stability, see the Recommended Operating Conditions table for the minimum capacitors values.  
The input capacitor counteracts reactive input sources and improves transient response, input ripple, and PSRR.  
A higher-value input capacitor may be necessary if large, fast rise-time load or line transients are anticipated, or  
if the device is located several inches from the input power source. Dynamic performance of the device is  
improved with the use of an output capacitor larger than the minimum value specified in the Recommended  
Operating Conditions table.  
Although a bias capacitor is not required, good design practice is to connect a 0.1-µF ceramic capacitor from  
BIAS to GND. This capacitor counteracts reactive bias source if the source impedance is not sufficiently low.  
Place the input, output, and bias capacitors as close as possible to the device to minimize trace parasitics.  
If the BIAS source is susceptible to fast voltage drops (for example, a 2-V drop in less than 1 µs) when the LDO  
load current is near the maximum value, the BIAS voltage drop can cause the output voltage to fall briefly. In  
such cases, use a BIAS capacitor large enough to slow the voltage ramp rate to less than 0.5 V/µs. For smaller  
or slower BIAS transients, any output voltage dips must be less than 5% of the nominal voltage.  
8.1.3 Dropout Voltage  
Dropout voltage (VDO) is defined as the input voltage minus the output voltage (VIN VOUT) at the rated output  
current (IRATED), where the pass transistor is fully on. IRATED is the maximum IOUT listed in the Recommended  
Operating Conditions table. The pass transistor is in the ohmic or triode region of operation, and acts as a  
switch. The dropout voltage indirectly specifies a minimum input voltage greater than the nominal programmed  
output voltage at which the output voltage is expected to stay in regulation. If the input voltage falls to less than  
the nominal output regulation, then the output voltage falls as well.  
For a CMOS regulator, the dropout voltage is determined by the drain-source on-state resistance (RDS(ON)) of the  
pass transistor. Therefore, if the linear regulator operates at less than the rated current, the dropout voltage for  
that current scales accordingly. Use 方程1 to calculate the RDS(ON) of the device.  
VDO  
RDS(ON)  
=
IRATED  
(1)  
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The use of bias rail enables the TPS7A14 to achieve a lower dropout voltage between IN and OUT. However, a  
minimum bias voltage above the nominal programmed output voltage must be maintained. 6-13 specifies the  
minimum VBIAS headroom required to maintain output regulation.  
8.1.4 Behavior During Transition From Dropout Into Regulation  
Some applications may have transients that place this device into dropout, especially when this device can be  
powered from a battery with relatively high ESR. The load transient saturates the output stage of the error  
amplifier when the pass element is driven fully on, making the pass element function like a resistor from VIN to  
VOUT. The error amplifier response time to this load transient is extended because the error amplifier must first  
recover from saturation and then must place the pass element back into active mode. During this recovery  
period, VOUT overshoots because the pass element is functioning as a resistor from VIN to VOUT  
.
When VIN ramps up slowly for start up, the slow ramp-up voltage may place the device in dropout. As with many  
other LDOs, the output can overshoot on recovery from this condition. However, this condition is easily avoided  
through the use of the enable signal.  
If operating under these conditions, apply a higher dc load current or increase the output capacitance to reduce  
the overshoot. These approaches provide a path to absorb the excess charge.  
8.1.5 Device Enable Sequencing Requirement  
The IN, BIAS, and EN pin voltages can be sequenced in any order without causing damage to the device. Start  
up is always monotonic regardless of the sequencing order or the ramp rates of the IN, BIAS, and EN pins. See  
the Recommended Operating Conditions table for proper voltage ranges of the IN, BIAS, and EN pins.  
8.1.6 Load Transient Response  
The load-step transient response is the output voltage response by the LDO to a step in load current while  
output voltage regulation is maintained. See 6-21 and 6-22 for typical load transient response plots. There  
are two key transitions during a load transient response: the transition from a light to a heavy load, and the  
transition from a heavy to a light load. The regions in 8-1 are broken down as described in this section.  
Regions A, E, and H are where the output voltage is in steady-state operation.  
tAt  
tCt  
tDt  
tEt  
tGt  
tHt  
B
F
8-1. Load Transient Waveform  
During transitions from a light load to a heavy load, the following behavior can be observed:  
The initial voltage dip is a result of the depletion of the output capacitor charge and parasitic impedance to  
the output capacitor (region B)  
Recovery from the dip results from the LDO increasing its sourcing current, and leads to output voltage  
regulation (region C)  
During transitions from a heavy load to a light load, the following behavior can be observed:  
The initial voltage rise results from the LDO sourcing a large current, and leads to an increase in the output  
capacitor charge (region F)  
Recovery from the rise results from the LDO decreasing its sourcing current in combination with the load  
discharging the output capacitor (region G)  
A larger output capacitance reduces the peaks during a load transient but slows down the response time of the  
device. A larger dc load also reduces the peaks because the amplitude of the transition is lowered and a higher  
current discharge path is provided for the output capacitor.  
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8.1.7 Undervoltage Lockout Circuit Operation  
The VIN UVLO circuit ensures that the regulator remains disabled when the input supply voltage is below the  
minimum operational voltage range, and ensures that the regulator shuts down when the input supply collapses.  
Similarly, the VBIAS UVLO circuit ensures that the regulator remains disabled when the bias supply voltage is  
less than the minimum operational voltage range, and ensures that the regulator shuts down when the bias  
supply collapses.  
8-2 shows the UVLO circuit response to various input or bias voltage events. The diagram can be separated  
into the following parts:  
Region A: The output remains off while the input or bias voltage is below the UVLO rising threshold  
Region B: Normal operation, regulating device  
Region C: Brownout event above the UVLO falling threshold (UVLO rising threshold UVLO hysteresis).  
The output may fall out of regulation but the device remains enabled.  
Region D: Normal operation, regulating device  
Region E: Brownout event below the UVLO falling threshold. The device is disabled in most cases and the  
output falls as a result of the load and active discharge circuit. The device is re-enabled when the UVLO  
rising threshold is reached and a normal start up follows.  
Region F: Normal operation followed by the input or bias falling to the UVLO falling threshold  
Region G: The device is disabled when the input or bias voltages fall below the UVLO falling threshold to 0 V.  
The output falls as a result of the load and active discharge circuit.  
UVLO Rising Threshold  
UVLO Hysteresis  
VIN / VBIAS  
C
VOUT  
tAt  
tBt  
tDt  
tEt  
tFt  
tGt  
8-2. Typical VIN or VBIAS UVLO Circuit Operation  
8.1.8 Power Dissipation (PD)  
Circuit reliability demands that proper consideration be given to device power dissipation, location of the circuit  
on the printed circuit board (PCB), and correct sizing of the thermal plane. The PCB area around the regulator  
must be as free as possible of other heat-generating devices that cause added thermal stresses.  
方程2 calculates the maximum allowable power dissipation for the device in a given package:  
PD-MAX = [(TJ TA) / RθJA  
]
(2)  
(3)  
(4)  
方程3 represents the actual power being dissipated in the device:  
PD = ((IGND(IN) + IIN) × VIN + IGND(BIAS) × VBIAS ) (IOUT × VOUT  
)
If the load current is much greater than IGND(IN) and IGND(BIAS) 方程3 can be simplified as:  
PD = (VIN VOUT) × IOUT  
Power dissipation can be minimized, and thus greater efficiency achieved, by proper selection of the system  
voltage rails. Proper selection allows the minimum input-to-output voltage differential to be obtained. The low  
dropout of the TPS7A14 allows for maximum efficiency across a wide range of output voltages.  
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The main heat conduction path depends on the ambient temperature and the thermal resistance across the  
various interfaces between the die junction and ambient air.  
The maximum allowable junction temperature (TJ) determines the maximum power dissipation for the device.  
According to 方程式 5, maximum power dissipation and junction temperature are most often related by the  
junction-to-ambient thermal resistance (RθJA) of the combined PCB and device package and the temperature of  
the ambient air (TA). The equation is rearranged in 方程6 for output current.  
TJ = TA + (RθJA × PD)  
(5)  
(6)  
IOUT = (TJ TA) / [RθJA × (VIN VOUT)]  
Unfortunately, this thermal resistance (RθJA) is highly dependent on the heat-spreading capability built into the  
particular PCB design, and therefore varies according to the total copper area, copper weight, and location of the  
planes. The RθJA recorded in the Electrical Characteristics table is determined by the JEDEC standard, PCB,  
and copper-spreading area, and is only used as a relative measure of package thermal performance. For a well-  
designed thermal layout, RθJA is actually the sum of the YBK package junction-to-case (bottom) thermal  
resistance (RθJC(bot)) plus the thermal resistance contribution by the PCB copper.  
8.1.9 Estimating Junction Temperature  
The JEDEC standard now recommends the use of psi (Ψ) thermal metrics to estimate the junction temperatures  
of the LDO when in-circuit on a typical PCB board application. These metrics are not strictly speaking thermal  
resistances, but rather offer practical and relative means of estimating junction temperatures. These psi metrics  
are determined to be significantly independent of the copper-spreading area. The key thermal metrics (ΨJT and  
ΨJB) are used in accordance with 方程7 and are given in the Electrical Characteristics table.  
ΨJT : TJ = TT + ΨJT × PD and ΨJB : TJ = TB + ΨJB × PD  
(7)  
where:  
PD is the power dissipated as explained in 方程3 and the Power Dissipation (PD) section  
TT is the temperature at the center-top of the device package  
TB is the PCB surface temperature measured 1 mm from the device package and centered on the package  
edge  
8.1.10 Recommended Area for Continuous Operation  
The operational area of an LDO is limited by the dropout voltage, output current, junction temperature, and input  
voltage. The recommended area for continuous operation for a linear regulator is provided in 8-3 and can be  
separated into the following regions:  
Dropout voltage limits the minimum differential voltage between the input and the output (VIN VOUT) at a  
given output current level; see the Dropout Operation section for more details.  
The rated output current limits the maximum recommended output current level. Exceeding this rating causes  
the device to fall out of specification.  
The rated junction temperature limits the maximum junction temperature of the device. Exceeding this rating  
causes the device to fall out of specification and reduces long-term reliability.  
方程6 provides the shape of the slope. The slope is nonlinear because the maximum rated junction  
temperature of the LDO is controlled by the power dissipation across the LDO, thus when VIN VOUT  
increases the output current must decrease.  
The rated input voltage range governs both the minimum and maximum of VIN VOUT  
.
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Output Current Limited  
by Dropout  
Rated Output  
Current  
Output Current Limited  
by Thermals  
Limited by  
Minimum VIN  
Limited by  
Maximum VIN  
VIN œ VOUT (V)  
8-3. Continuous Operation Diagram With Description of Regions  
8.2 Typical Application  
CBIAS  
BIAS  
TPS7A14  
SENSE  
VOUT  
IN  
OUT  
IN  
OUT  
CIN  
COUT  
DC/DC Converter  
Or PMU  
EN  
GND  
GND  
8-4. High-Efficiency Supply From a Rechargeable Battery  
8.2.1 Design Requirements  
8-1 lists the parameters for this design example.  
8-1. Design Parameters  
DESIGN PARAMETER  
EXAMPLE VALUE  
VIN  
0.95 V  
VBIAS  
VOUT  
IOUT  
2.4 V to 5.5 V  
0.8 V  
600 mA (typical), 900 mA (peak)  
8.2.2 Detailed Design Procedure  
This design example is powered by a rechargeable battery that can be a building block in many portable  
applications. Noise-sensitive portable electronics require an efficient, small-size solution for their power supply.  
Traditional LDOs are known for their low efficiency in contrast to low-input, low-output voltage (LILO) LDOs such  
as the TPS7A14. The use of a bias rail in the TPS7A14 allows the main power path of the LDO to operate at a  
lower input voltage, thus reducing the voltage drop across the pass transistor and maximizing device efficiency.  
Because the voltage drop across the pass transistor can be so low, the efficiency of the TPS7A14 can  
approximate that of a dc-dc converter. 方程8 calculates the efficiency for this design.  
Efficiency = η= POUT / PIN × 100 % = (VOUT × IOUT) / (VIN × IIN + VBIAS × IBIAS) × 100 %  
(8)  
方程式 8 reduces to 方程式 9 because the design example load current is much greater than the quiescent  
current of the bias rail.  
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Efficiency = η= (VOUT × IOUT) / (VIN × IIN) × 100%  
(9)  
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8.2.3 Application Curve  
VBIAS = VOUT(NOM) + 1.4 V, VEN = VIN, CIN = 2.2 µF, COUT = 2.2 µF, and CBIAS = 0.47 µF  
8-5. VIN Dropout Voltage vs IOUT  
9 Power Supply Recommendations  
This device is designed to operate from an input supply voltage range of 0.6 V to 2.2 V and a bias supply voltage  
range of 1.5 V to 5.5 V. The input and bias supplies must be well regulated and free of spurious noise. To make  
sure that the output voltage is well regulated and dynamic performance is optimum, the input supply must be at  
least VOUT(nom) + VDO and VBIAS = VOUT(nom) + VDO(BIAS)  
.
10 Layout  
10.1 Layout Guidelines  
For correct printed circuit board (PCB) layout, follow these guidelines:  
Place input, output, and bias capacitors as close to the device as possible  
Use copper planes for device connections to optimize thermal performance  
Place thermal vias around the device to distribute heat  
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10.2 Layout Example  
10-1. Recommended Layout  
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11 Device and Documentation Support  
11.1 Device Support  
11.1.1 Development Support  
11.1.1.1 Evaluation Module  
An evaluation module (EVM) is available to assist in the initial circuit performance evaluation using the  
TPS7A14. The EVM can be requested at the Texas Instruments web site through the product folders or  
purchased directly from the TI eStore  
11.1.2 Device Nomenclature  
11-1. Device Nomenclature(1) (2)  
PRODUCT  
DESCRIPTION  
xx(x) is the nominal output voltage. Two or more digits are used in the ordering number (for example, 09  
= 0.9 V, 95 = 0.95 V, 125 = 1.25 V).  
TPS7A14xx(x)(P)yyyz  
P indicates active pull down; if there is no P, then the device does not have the active pull down feature.  
yyy is the package designator.  
z is the package quantity. R is for reel (12000 pieces), T is for tape (250 pieces).  
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the  
device product folder on www.ti.com.  
(2) Output voltages from 0.5 V to 2.05 V in 25-mV increments are available. Contact the factory for details and availability.  
11.2 Documentation Support  
11.2.1 Related Documentation  
For related documentation see the following:  
Texas Instruments, Using New Thermal Metrics application report  
Texas Instruments, AN-1112 DSBGA Wafer Level Chip Scale Package application report  
Texas Instruments, TPS7A14EVM-058 Evaluation Module user guide  
11.3 接收文档更新通知  
要接收文档更新通知请导航至 ti.com 上的器件产品文件夹。点击订阅更新 进行注册即可每周接收产品信息更  
改摘要。有关更改的详细信息请查看任何已修订文档中包含的修订历史记录。  
11.4 支持资源  
TI E2E支持论坛是工程师的重要参考资料可直接从专家获得快速、经过验证的解答和设计帮助。搜索现有解  
答或提出自己的问题可获得所需的快速设计帮助。  
链接的内容由各个贡献者“按原样”提供。这些内容并不构成 TI 技术规范并且不一定反映 TI 的观点请参阅  
TI 《使用条款》。  
11.5 Trademarks  
TI E2Eis a trademark of Texas Instruments.  
所有商标均为其各自所有者的财产。  
11.6 Electrostatic Discharge Caution  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled  
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may  
be more susceptible to damage because very small parametric changes could cause the device not to meet its published  
specifications.  
11.7 术语表  
TI 术语表  
本术语表列出并解释了术语、首字母缩略词和定义。  
Copyright © 2022 Texas Instruments Incorporated  
Submit Document Feedback  
25  
Product Folder Links: TPS7A14  
 
 
 
 
 
 
 
 
 
 
TPS7A14  
www.ti.com.cn  
ZHCSPG4B DECEMBER 2021 REVISED MAY 2022  
Mechanical, Packaging, and Orderable Information  
The following pages include mechanical, packaging, and orderable information. This information is the most  
current data available for the designated devices. This data is subject to change without notice and revision of  
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.  
Copyright © 2022 Texas Instruments Incorporated  
26  
Submit Document Feedback  
Product Folder Links: TPS7A14  
PACKAGE OPTION ADDENDUM  
www.ti.com  
1-Jul-2022  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
TPS7A1408PYBKR  
TPS7A1409PYBKR  
TPS7A1412PYBKR  
TPS7A1413PYBKR  
TPS7A1485PYBKR  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
DSBGA  
DSBGA  
DSBGA  
DSBGA  
DSBGA  
YBK  
YBK  
YBK  
YBK  
YBK  
6
6
6
6
6
12000 RoHS & Green  
12000 RoHS & Green  
12000 RoHS & Green  
12000 RoHS & Green  
12000 RoHS & Green  
SNAGCU  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
M8  
MD  
MG  
MH  
M9  
Samples  
Samples  
Samples  
Samples  
Samples  
SNAGCU  
SNAGCU  
SNAGCU  
SNAGCU  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
1-Jul-2022  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
23-Jun-2023  
TAPE AND REEL INFORMATION  
REEL DIMENSIONS  
TAPE DIMENSIONS  
K0  
P1  
W
B0  
Reel  
Diameter  
Cavity  
A0  
A0 Dimension designed to accommodate the component width  
B0 Dimension designed to accommodate the component length  
K0 Dimension designed to accommodate the component thickness  
Overall width of the carrier tape  
W
P1 Pitch between successive cavity centers  
Reel Width (W1)  
QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE  
Sprocket Holes  
Q1 Q2  
Q3 Q4  
Q1 Q2  
Q3 Q4  
User Direction of Feed  
Pocket Quadrants  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
TPS7A1408PYBKR  
TPS7A1409PYBKR  
TPS7A1412PYBKR  
TPS7A1413PYBKR  
TPS7A1485PYBKR  
DSBGA  
DSBGA  
DSBGA  
DSBGA  
DSBGA  
YBK  
YBK  
YBK  
YBK  
YBK  
6
6
6
6
6
12000  
12000  
12000  
12000  
12000  
180.0  
180.0  
180.0  
180.0  
180.0  
8.4  
8.4  
8.4  
8.4  
8.4  
0.8  
0.8  
0.8  
0.8  
0.8  
1.26  
1.26  
1.26  
1.26  
1.26  
0.36  
0.36  
0.36  
0.36  
0.36  
2.0  
2.0  
2.0  
2.0  
2.0  
8.0  
8.0  
8.0  
8.0  
8.0  
Q1  
Q1  
Q1  
Q1  
Q1  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
23-Jun-2023  
TAPE AND REEL BOX DIMENSIONS  
Width (mm)  
H
W
L
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SPQ  
Length (mm) Width (mm) Height (mm)  
TPS7A1408PYBKR  
TPS7A1409PYBKR  
TPS7A1412PYBKR  
TPS7A1413PYBKR  
TPS7A1485PYBKR  
DSBGA  
DSBGA  
DSBGA  
DSBGA  
DSBGA  
YBK  
YBK  
YBK  
YBK  
YBK  
6
6
6
6
6
12000  
12000  
12000  
12000  
12000  
182.0  
182.0  
182.0  
182.0  
182.0  
182.0  
182.0  
182.0  
182.0  
182.0  
20.0  
20.0  
20.0  
20.0  
20.0  
Pack Materials-Page 2  
PACKAGE OUTLINE  
YBK0006  
DSBGA - 0.33 mm max height  
SCALE 12.000  
DIE SIZE BALL GRID ARRAY  
A
B
E
BALL A1  
CORNER  
D
0.33 MAX  
C
SEATING PLANE  
0.05 C  
0.115  
0.065  
0.4 TYP  
SYMM  
C
B
SYMM  
0.8 TYP  
D: Max = 1.15 mm, Min = 1.09 mm  
E: Max = 0.7 mm, Min = 0.64 mm  
0.4 TYP  
A
1
2
0.22  
6X  
0.015  
0.18  
0.2 TYP  
C A B  
4226139/A 08/2020  
NOTES:  
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing  
per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
www.ti.com  
EXAMPLE BOARD LAYOUT  
YBK0006  
DSBGA - 0.33 mm max height  
DIE SIZE BALL GRID ARRAY  
(0.2) TYP  
2
6X ( 0.2)  
1
A
(0.4) TYP  
SYMM  
B
C
SYMM  
LAND PATTERN EXAMPLE  
EXPOSED METAL SHOWN  
SCALE: 50X  
0.0375 MIN  
0.0375 MAX  
METAL UNDER  
SOLDER MASK  
(
0.2)  
METAL  
EXPOSED  
METAL  
(
0.2)  
SOLDER MASK  
OPENING  
EXPOSED  
METAL  
SOLDER MASK  
OPENING  
SOLDER MASK  
DEFINED  
(PREFERRED)  
NON-SOLDER MASK  
DEFINED  
SOLDER MASK DETAILS  
NOT TO SCALE  
4226139/A 08/2020  
NOTES: (continued)  
3. Final dimensions may vary due to manufacturing tolerance considerations and also routing constraints.  
See Texas Instruments Literature No. SNVA009 (www.ti.com/lit/snva009).  
www.ti.com  
EXAMPLE STENCIL DESIGN  
YBK0006  
DSBGA - 0.33 mm max height  
DIE SIZE BALL GRID ARRAY  
(0.2) TYP  
6X ( 0.21)  
(R0.05) TYP  
1
2
A
(0.4) TYP  
SYMM  
B
C
METAL  
TYP  
SYMM  
SOLDER PASTE EXAMPLE  
BASED ON 0.075 mm THICK STENCIL  
SCALE: 50X  
4226139/A 08/2020  
NOTES: (continued)  
4. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release.  
www.ti.com  
重要声明和免责声明  
TI“按原样提供技术和可靠性数据(包括数据表)、设计资源(包括参考设计)、应用或其他设计建议、网络工具、安全信息和其他资源,  
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保。  
这些资源可供使用 TI 产品进行设计的熟练开发人员使用。您将自行承担以下全部责任:(1) 针对您的应用选择合适的 TI 产品,(2) 设计、验  
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邮寄地址:Texas Instruments, Post Office Box 655303, Dallas, Texas 75265  
Copyright © 2023,德州仪器 (TI) 公司  

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