SSM6N03FE_07 [TOSHIBA]

High Speed Switching Applications; 高速开关应用
SSM6N03FE_07
型号: SSM6N03FE_07
厂家: TOSHIBA    TOSHIBA
描述:

High Speed Switching Applications
高速开关应用

开关
文件: 总5页 (文件大小:147K)
中文:  中文翻译
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SSM6N03FE  
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type  
SSM6N03FE  
High Speed Switching Applications  
Unit: mm  
Analog Switch Applications  
Input impedance is high. Driving current is extremely low.  
Can be directly driven by a CMOS device even at low voltage due to  
low gate threshold voltage.  
High-speed switching.  
Housed in a ultra-small package which is suitable for high density  
mounting.  
Absolute Maximum Ratings (Ta = 25°C)  
(Q1, Q2 Common)  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
20  
10  
V
V
DS  
Gate-source voltage  
Drain current  
V
D
GSS  
I
100  
mA  
mW  
°C  
D
Drain power dissipation  
Channel temperature  
Storage temperature  
P
(Note 1)  
150  
T
ch  
150  
JEDEC  
JEITA  
T
stg  
55~150  
°C  
Note:  
Using continuously under heavy loads (e.g. the application of  
high temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the  
absolute maximum ratings.  
TOSHIBA  
Weight:  
2-2N1D  
g (typ.)  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: Total rating, mounted on FR4 board  
2
(25.4 mm × 25.4 mm × 1.6 t, Cu Pad: 0.135 mm × 6)  
0.3 mm  
Equivalent Circuit (top view)  
Marking  
6 PIN  
5 PIN  
4 PIN  
6 PIN  
5 PIN  
4 PIN  
D A  
Q1  
1 PIN  
Q2  
2 PIN  
3 PIN  
1 PIN  
2 PIN  
3 PIN  
1
2007-11-01  
SSM6N03FE  
Electrical Characteristics (Ta = 25°C) (Q1, Q2 Common)  
Characteristics  
Gate leakage current  
Symbol  
Test Condition  
Min  
Typ.  
Max  
Unit  
I
V
= 10 V, V = 0 V  
DS  
20  
0.7  
25  
1
1
μA  
V
GSS  
GS  
Drain-source breakdown voltage  
Drain cut-off current  
V
I
= 100 μA, V  
= 0 V  
= 0 V  
(BR) DSS  
D
GS  
GS  
I
V
V
V
= 20 V, V  
μA  
V
DSS  
DS  
DS  
DS  
Gate threshold voltage  
Forward transfer admittance  
Drain-source ON resistance  
Input capacitance  
V
= 3 V, I = 0.1 mA  
1.3  
12  
th  
D
|Y |  
fs  
= 3 V, I = 10 mA  
60  
4
mS  
Ω
D
R
I
= 10 mA, V  
= 2.5 V  
GS  
DS (ON)  
D
C
V
V
V
= 3 V, V  
= 3 V, V  
= 3 V, V  
= 0 V, f = 1 MHz  
= 0 V, f = 1 MHz  
= 0 V, f = 1 MHz  
11.0  
3.3  
9.3  
pF  
pF  
pF  
iss  
rss  
oss  
DS  
DS  
DS  
GS  
GS  
GS  
Reverse transfer capacitance  
Output capacitance  
C
C
t
V
V
= 3 V, I = 10 mA,  
DD  
GS  
D
Turn-on time  
Switching time  
0.16  
0.19  
on  
off  
= 0~2.5 V  
μs  
V
V
= 3 V, I = 10 mA,  
DD  
GS  
D
Turn-off time  
t
= 0~2.5 V  
Switching Time Test Circuit  
(a) Test circuit  
2.5 V  
0
V
= 3 V  
90%  
DD  
I
(b) V  
(c) V  
D
IN  
2.5 V  
0
Output  
<
D.U. 1%  
=
V
Input  
GS  
Input: t , t < 5 ns  
(Z  
out  
Common Source  
10%  
r
f
= 50 Ω)  
V
DD  
R
L
10 μs  
10%  
OUT  
Ta = 25°C  
V
IN  
V
90%  
DS  
V
DD  
V
DS (ON)  
t
t
f
r
t
t
off  
on  
Precaution  
V
th  
can be expressed as voltage between gate and source when low operating current value is I = 100 μA for this  
D
product. For normal switching operation, V  
requires higher voltage than V and V  
requires lower  
GS (on)  
th  
GS (off)  
voltage than V . (Relationship can be established as follows: V  
th  
< V < V  
)
GS (off)  
th  
GS (on)  
Please take this into consideration for using the device.  
2
2007-11-01  
SSM6N03FE  
(Q1, Q2 Common)  
I
– V  
I
– V (Low voltage region)  
D
DS  
D
DS  
100  
100  
80  
2.5  
2.0  
2.0  
4.0  
2.5  
2.2  
Common Source  
Ta = 25°C  
80  
1.9  
Common Source  
Ta = 25°C  
60  
40  
60  
40  
20  
0
1.8  
1.8  
1.6  
1.7  
1.6  
20  
0
V
= 1.4 V  
GS  
V
= 1.4 V  
GS  
0
2
4
6
8
10  
0
0.2  
0.4  
0.6  
0.8  
1.0  
Drain-source voltage  
V
DS  
(V)  
Drain-source voltage  
V
DS  
(V)  
I
– V  
I – V  
D GS  
DR  
DS  
100  
1000  
100  
10  
Common Source  
= 0  
Common Source  
V
GS  
Ta = 25°C  
V
= 3 V  
DS  
D
10  
1
G
I
DR  
Ta = 100°C  
1
0.1  
25°C  
S
25°C  
0.1  
0.01  
0.01  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
0
0.5  
1
1.5  
2
2.5  
3
0
Drain-source voltage  
V
DS  
(V)  
Gate-source voltage  
V
GS  
(V)  
Y – I  
fs  
D
300  
100  
C – V  
DS  
Common Source  
100  
V
= 3 V  
DS  
Common Source  
= 0  
Ta = 25°C  
V
GS  
50  
30  
f = 1 MHz  
Ta = 25°C  
50  
30  
C
iss  
10  
C
oss  
5
3
10  
5
C
rss  
1
0.1  
1
3
5
10  
30  
50  
100  
0.3  
1
3
10  
30  
Drain current  
I
(mA)  
Drain-source voltage  
V
DS  
(V)  
D
3
2007-11-01  
SSM6N03FE  
(Q1, Q2 Common)  
R
– I  
t – I  
D
DS (ON)  
D
10  
10000  
Common Source  
Common Source  
V
V
= 3 V  
DD  
GS  
5000  
3000  
Ta = 25°C  
= 0~2.5 V  
8
Ta = 25°C  
t
off  
1000  
6
4
2
0
t
f
500  
300  
2.5  
t
on  
100  
V
= 4 V  
GS  
t
r
50  
30  
0.1  
0.3  
1
3
10  
30  
100  
0
20  
40  
60  
80  
100  
Drain current  
I
(mA)  
D
Drain current  
I
(mA)  
D
R
Ta  
P * Ta  
D
DS (ON)  
10  
250  
200  
150  
100  
50  
Common Source  
Mounted on FR4 board.  
I
= 10 mA  
D
(25.4 mm × 25.4 mm × 1.6 t  
2
8
6
4
2
Cu Pad: 0.135 mm × 6)  
2.5  
V
= 4 V  
GS  
0
25  
0
0
0
25  
50  
75  
100  
125  
150  
20  
40  
60  
80  
100  
120  
140  
160  
Ambient temperature Ta (°C)  
Ambient temperature Ta (°C)  
*: Total rating  
4
2007-11-01  
SSM6N03FE  
RESTRICTIONS ON PRODUCT USE  
20070701-EN GENERAL  
The information contained herein is subject to change without notice.  
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor  
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical  
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of  
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of  
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.  
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as  
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and  
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability  
Handbook” etc.  
The TOSHIBA products listed in this document are intended for usage in general electronics applications  
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,  
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires  
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or  
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or  
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,  
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his  
document shall be made at the customer’s own risk.  
The products described in this document shall not be used or embedded to any downstream products of which  
manufacture, use and/or sale are prohibited under any applicable laws and regulations.  
The information contained herein is presented only as a guide for the applications of our products. No  
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which  
may result from its use. No license is granted by implication or otherwise under any patents or other rights of  
TOSHIBA or the third parties.  
Please contact your sales representative for product-by-product details in this document regarding RoHS  
compatibility. Please use these products in this document in compliance with all applicable laws and regulations  
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses  
occurring as a result of noncompliance with applicable laws and regulations.  
5
2007-11-01  

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