New Product
Si7625DN
Vishay Siliconix
SPECIFICATIONS T = 25 °C, unless otherwise noted
J
Parameter
Symbol
Test Conditions
Min.
Typ.
Max.
Unit
Static
VDS
ΔVDS/TJ
ΔVGS(th)/TJ
VGS(th)
VGS = 0 V, ID = - 250 µA
ID = - 250 µA
Drain-Source Breakdown Voltage
- 30
V
V
DS Temperature Coefficient
- 23
5.0
mV/°C
VGS(th) Temperature Coefficient
Gate-Source Threshold Voltage
Gate-Source Leakage
VDS = VGS, ID = - 250 µA
- 1.0
- 30
- 2.5
100
- 1
V
IGSS
VDS = 0 V, VGS
=
20 V
nA
VDS = - 30 V, VGS = 0 V
IDSS
ID(on)
RDS(on)
gfs
Zero Gate Voltage Drain Current
On-State Drain Currenta
µA
A
VDS = - 30 V, VGS = 0 V, TJ = 55 °C
- 5
VDS ≥ - 10 V, VGS = - 10 V
VGS = - 10 V, ID = - 15 A
0.0056
0.0088
47
0.007
0.011
Drain-Source On-State Resistancea
Ω
S
V
GS = - 4.5 V, ID = - 10 A
Forward Transconductancea
Dynamicb
VDS = - 10 V, ID = - 15 A
Ciss
Coss
Crss
Input Capacitance
4427
452
430
84.5
39.5
11
VDS = - 15 V, VGS = 0 V, f = 1 MHz
DS = - 15 V, VGS = - 10 V, ID = - 10 A
DS = - 15 V, VGS = - 4.5 V, ID = - 10 A
f = 1 MHz
Output Capacitance
Reverse Transfer Capacitance
pF
V
V
126
60
Qg
Total Gate Charge
nC
Qgs
Qgd
Rg
Gate-Source Charge
Gate-Drain Charge
Gate Resistance
Turn-On Delay Time
Rise Time
13.5
1.8
15
0.4
3.6
30
Ω
td(on)
tr
td(off)
tf
td(on)
tr
td(off)
tf
V
DD = - 15 V, RL = 1.5 Ω
13
26
ID ≅ - 10 A, VGEN = - 10 V, Rg = 1 Ω
Turn-Off DelayTime
Fall Time
55
100
20
10
ns
Turn-On Delay Time
Rise Time
55
100
80
V
DD = - 15 V, RL = 1.5 Ω
42
ID ≅ - 10 A, VGEN = - 4.5 V, Rg = 1 Ω
Turn-Off DelayTime
Fall Time
52
100
34
17
Drain-Source Body Diode Characteristics
Continous Source-Drain Diode Current
Pulse Diode Forward Current
IS
ISM
VSD
trr
TC = 25 °C
- 35
- 80
- 1.2
24
A
Body Diode Voltage
IS = - 3 A, VGS = 0 V
- 0.74
V
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Charge
Reverse Recovery Fall Time
14
4
ns
nC
Qrr
ta
8
I = - 10 A, dI/dt = 100 A/µs, T = 25 °C
F
J
8
ns
Reverse Recovery Rise Time
tb
6
Notes:
a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 65737
S10-0638-Rev. A, 22-Mar-10