01005B0R5G6R3CT [WALSIN]
High precision dimensional tolerances;
| 型号： | 01005B0R5G6R3CT |
| 厂家： | 
Walsin Technology |
| 描述： | High precision dimensional tolerances |
| 文件： | 总8页 (文件大小：2644K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Multilayer Ceramic Capacitors
Approval Sheet
MULTILAYER CERAMIC CAPACITORS
Ultra-small Series (6.3V to 50V)
01005 Size
NP0, X7R & X5R Dielectrics
Halogen Free & RoHS Compliance
*Contents in this sheet are subject to change without prior notice.
Page 1 of 8
ASC_Ultra Small_(01R5)_026F_AS
Dec. 2018
Multilayer Ceramic Capacitors
Approval Sheet
1. INTRODUCTION
MLCC consists of a conducting material and electrodes. To manufacture a chip-type SMT and achieve
miniaturization, high density and high efficiency, ceramic condensers are used.
01R5 MLCC is performed by high precision technology achieve high capacitance in unit size and ensure the
stability and reliability of products.
2. FEATURES
3. APPLICATIONS
a. High capacitance in unit size.
b. High precision dimensional tolerances.
c. Suitable used in high-accuracy automatic mounting
machine.
a. Miniature microwave module.
b. Portable equipments (ex. Mobile phone, PDA).
c. High frequency circuits.
4. HOW TO ORDER
01R5
N
100
C
160
C
T
Size
Dielectric
Capacitance
Tolerance
Rated voltage
Termination
Packaging
Inch (mm)
N=NP0
(C0G)
Two significant digits
A=±0.05pF
Two significant digits C=Cu/Ni/Sn
followed by no. of
T=7” reeled
01R5 =
followed by no. of zeros. B=±0.1pF
01005 (0402)
B=X7R
X=X5R
And R is in place of
decimal point.
C=±0.25pF
D=±0.5pF
F=±1%
zeros. And R is in
place of decimal point.
eg.:
G=±2%
6R3=6.3 VDC
100=10 VDC
160=16 VDC
250=25 VDC
500=50 VDC
0R5=0.5pF
1R0=1.0pF
100=10x100
=10pF
J=±5%
K=±10%
M=±20%
Page 2 of 8
ASC_Ultra Small_(01R5)_026F_AS
Dec. 2018
Multilayer Ceramic Capacitors
Approval Sheet
5. EXTERNAL DIMENSIONS
Size
L
L (mm)
W (mm)
T (mm)/Symbol
0.20±0.02
MB (mm)
Inch (mm)
01R5 (0402)
0.40±0.02
0.20±0.02
V
0.10±0.03
T
* Reflow soldering only.
W
MB
MB
Fig. 1 The outline of MLCC
6. GENERAL ELECTRICAL DATA
Size
01R5
Dielectric
NP0
X7R
X5R
Capacitance*
0.2pF to 100pF
100pF to 1000pF
1000pF to 0.1µF
Cap≤5pF:
A (±0.05pF), B (±0.1pF),
C (±0.25pF)
Capacitance tolerance**
K (±10%), M (±20%)
5pF<Cap<10pF:
C (±0.25pF), D (±0.5pF)
Cap≥10pF:
F (±1%), G (±2%), J (±5%)
Rated voltage (WVDC)
DF / Q#1
16V, 25V, 50V
Cap<30pF, Q≥400+20C
Cap≥30pF, Q≥1000
10V
6.3V, 10V
≤5 %
≤10 %
Insulation resistance at Ur
Operating temperature
Capacitance change
≥10GΩ or RxC≥500Ω*F whichever is less
RxC≥50Ω*F
-55 to +125°C
±30ppm
-55 to +125°C
-55 to +85°C
±15%
Termination
Ni/Sn (lead-free termination)
* Measured at 30~70% related humidity.
NP0: Apply 0.5~5Vrms, 1.0MHz±10% at the condition of 25°C ambient temperature.
X7R: Apply 1.0±0.2Vrms, 1.0kHz±10%, at 25°C ambient temperature.
#1
X5R: Apply 0.5±0.2Vrms or 1.0±0.2Vrms , 1.0kHz±10%, at the condition of 25°C ambient temp erature.
** Preconditioning for Class II MLCC: Perform a heat treatment at 150±10°C for 1 hour, then leave in a mbient condition for 24±2 hours
before measurement.
#1: Please refer to “RELIABILITY TEST CONDITIONS AND REQUIREMENTS” for detail
Page 3 of 8
ASC_Ultra Small_(01R5)_026F_AS
Dec. 2018
Multilayer Ceramic Capacitors
Approval Sheet
7. CAPACITANCE RANGE
SIZE
01R5
SIZE
DIELECTRIC
RATED VOLTAGE (VDC)
100pF (101)
01R5
DIELECTRIC
NP0
X7R
10
V
RATED VOLTAGE (VDC)
0.2pF (0R2)
0.3pF (0R3)
0.4pF (0R4)
0.5pF (0R5)
1.0pF (1R0)
1.5pF (1R5)
2.0pF (2R0)
3.0pF (3R0)
4.0pF (4R0)
5.0pF (5R0)
6.0pF (6R0)
7.0pF (7R0)
8.0pF (8R0)
9.0pF (9R0)
10pF (100)
12pF (120)
15pF (150)
18pF (180)
22pF (220)
27pF (270)
33pF (330)
39pF (390)
47pF (470)
56pF (560)
68pF (680)
82pF (820)
100pF (101)
16
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
25
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
50
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
150pF (151)
V
220pF (221)
V
330pF (331)
V
470pF (471)
V
1,000pF (102)
V
SIZE
01R5
X5R
DIELECTRIC
RATED VOLTAGE (VDC)
1,000pF (102)
1,500pF (152)
2,200pF (222)
3,300pF (332)
4,700pF (472)
6,800pF (682)
0.010µF (103)
0.015µF (153)
0.022µF (223)
0.033µF (333)
0.047µF (473)
0.068µF (683)
0.10µF (104)
6.3
10
V
V
V
V
V
V
V
V
V
V
V
V
V
1. The letter in cell is expressed the symbol of product thickness.
2. For more information about products with special capacitance
or other data, please contact WTC local representative.
8. PACKAGING DIMENSION AND QUANTITY
Paper tape
Size
Thickness (mm)/Symbol
7” reel
13” reel
01R5 (0402)
0.20±0.02
V
20,000
-
Unit: pieces
Page 4 of 8
ASC_Ultra Small_(01R5)_026F_AS
Dec. 2018
Multilayer Ceramic Capacitors
Approval Sheet
9. RELIABILITY TEST CONDITIONS AND REQUIREMENTS
No.
Item
Test Condition
Requirements
1. Visual and
Mechanical
---
* No remarkable defect.
* Dimensions to conform to individual specification sheet.
2. Capacitance
Class I: NP0
* Shall not exceed the limits given in the detailed spec.
Cap≤1000pF, 0.5~5Vrms, 1MHz±10%
Cap>1000pF, 1.0±0.2Vrms, 1KHz±10%
Class II: , X7R & X5R(≥10V)
3. Q/ D.F.
(Dissipation
Factor)
* NP0: Cap≥30pF, Q≥1000; Cap<30pF, Q≥400+20C
X7R: ≤5.0 %
X5R: ≤10 %
1.0±0.2Vrms, 1KHz±10%
Class II: , X5R(≤6.3V)
0.5±0.2Vrms, 1kHz±10%
*Before initial measurement (Class II only): To apply de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
* To apply voltage (≤100V) 250%.
* Duration: 1 to 5 sec.
4. Dielectric
Strength
* No evidence of damage or flash over during test.
* Charge and discharge current less than 50mA.
5. Insulation
Resistance
To apply rated voltage for max. 120 sec.
* NP0, X7R: ≥10GΩ or RxC≥500Ω-F whichever is smaller.
X5R: RxC≥50Ω-F
6. Temperature
Coefficient
With no electrical load.
T.C.
NPO
X7R
X5R
Operating Temp
-55~125°C at 25°C
-55~125°C at 25°C
-55~ 85°C at 25°C
T.C.
NPO
X7R
X5R
Capacitance Change
Within ±30ppm/°C
Within ±15%
Within ±15%
*Before initial measurement (Class II only):
To apply de-aging at 150°C for 1hr then set for 24± 2 hrs at
room temp.
*Measurement voltage for Class II
Cap≤0.01µF: 0.5V
Cap>0.01µF: 0.2V
7. Adhesive
Strength of
Termination
* Pressurizing force：1N
* No remarkable damage or removal of the terminations.
* Test time: 10±1 sec.
8. Vibration
Resistance
* Vibration frequency: 10~55 Hz/min.
* Total amplitude: 1.5mm
* No remarkable damage.
* Cap change and Q/D.F.: To meet initial spec.
* Test time: 6 hrs. (Two hrs each in three mutually
perpendicular directions.)
* Before initial measurement (Class II only):
To apply de-aging at 150°C for 1hr then set for 24± 2 hrs at
room temp.
* Cap./DF(Q) Measurement to be made after de-aging at
150°C for 1hr then set for 24±2 hrs at room temp.
9. Solderability
* Solder temperature: 235±5°C
* Dipping time: 2±0.5 sec.
95% min. coverage of all metalized area.
10. Bending Test * The middle part of substrate shall be pressurized by means * No remarkable damage.
of the pressurizing rod at a rate of about 1 mm per second until * Cap change:
the deflection becomes 1 mm and then the pressure shall be
maintained for 5±1 sec.
NP0: within ±5.0% or ±0.5pF whichever is larger.
X7R: within ±12.5%
* Before initial measurement (Class II only):
To apply de-aging at 150°C for 1hr then set for 24± 2 hrs at
room temp.
X5R: within ±25.0%
(This capacitance change means the change of capacitance under
specified flexure of substrate from the capacitance measured before
the test.)
* Measurement to be made after keeping at room temp. for
24±2 hrs.
Page 5 of 8
ASC_Ultra Small_(01R5)_026F_AS
Dec. 2018
Multilayer Ceramic Capacitors
Approval Sheet
No.
Item
Test Condition
Requirements
11. Resistance to * Solder temperature: 260±5°C
Soldering Heat * Dipping time: 10±1 sec
* No remarkable damage.
* Cap change:
* Preheating: 120 to 150°C for 1 minute before imme rse the
NP0: within ±2.5% or ±0.25pF whichever is larger.
X7R: within ±7.5%
capacitor in a eutectic solder.
* Before initial measurement (Class II only): To apply de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
X5R: within ±15.0%
Q/D.F., I.R. and dielectric strength: To meet initial requirements.
* 25% max. leaching on each edge.
12. Temperature
Cycle
* Conduct the five cycles according to the temperatures and * No remarkable damage.
time.
Step Temp. (°C)
* Cap change:
NP0: within ±2.5% or ±0.25pF whichever is larger.
X7R: within ±7.5%
Time (min.)
30±3
1
2
3
4
Min. operating temp. +0/-3
Room temp.
X5R: within ±15.0%
2~3
* Q/D.F., I.R. and dielectric strength: To meet initial requirements.
Max. operating temp. +3/-0
Room temp.
30±3
2~3
* Before initial measurement (Class II only): To apply de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
13. Humidity
* Test temp.: 40±2°C
* No remarkable damage.
(Steady State) * Humidity: 90~95% RH
* Cap change:
* Test time: 500+24/-0hrs.
NP0: within ±5.0% or ±0.5pF whichever is larger.
* Before initial measurement (Class II only): To apply de-aging X7R: within ±12.5%
at 150°C for 1hr then set for 24±2 hrs at room temp . X5R: within ±25.0%
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging * Q/D.F. value:
at 150°C for 1hr then set for 24±2 hrs at room temp . NP0: Cap≥30pF, Q≥350; 10pF≤Cap<30pF, Q≥275+2.5C
Cap<10pF; Q≥200+10C
X7R: ≤7.5%
X5R: ≤20%
* I.R.:
NP0, X7R: ≥1GΩ or RxC≥50Ω-F whichever is smaller.
X5R: RxC≥10Ω-F.
14. Humidity Load * Test temp.: 40±2°C
* No remarkable damage.
(Damp Heat)
* Humidity: 90~95%RH
* Cap change:
* Test time: 500+24/-0 hrs.
* To apply voltage：rated voltage.
NP0: within ±7.5% or ±0.75pF whichever is larger.
X7R: within ±15.0%
* Before initial measurement (Class II only): To apply de-aging X5R: within ±25.0%
at 150°C for 1hr then set for 24±2 hrs at room temp .
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
* Q/D.F. value:
NP0: Cap≥30pF, Q≥200; Cap<30pF; Q≥100+10/3C
X7R:
X5R:
≤
7.5%
≤20%
* I.R.:
NP0, X7R: ≥500MΩ or RxC≥25Ω-F whichever is smaller.
X5R: RxC≥5Ω-F.
15. High
* Test temp.:
Temperature
NP0, X7R: 125±3°C
X5R: 85±3°C
Load
(Endurance)
* To apply voltage:
(1) NP0, X7R : 200% of rated voltage
* No remarkable damage.
* Cap change:
(2) X5R: 10V : 150 % of rated voltage
6.3V : 100 % of rated voltage
* Test time: 1000+24/-0 hrs.
NP0: within ±3.0% or ±0.3pF whichever is larger.
X7R: within ±12.5%
* Before initial measurement (Class II only): To apply de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging at
150°C for 1hr then set for 24±2 hrs at room temp.
X5R: within ±25.0%
* Q/D.F. value:
NP0: Cap≥30pF, Q≥350; 10pF≤Cap<30pF, Q≥275+2.5C
Cap<10pF; Q≥200+10C
** De-rating conditions:
X7R:
X5R:
≤
7.5%
≤20%
* I.R.:
NP0, X7R: ≥1GΩ or RxC≥50Ω-F whichever is smaller.
X5R: RxC≥10Ω-F.
Page 6 of 8
ASC_Ultra Small_(01R5)_026F_AS
Dec. 2018
Multilayer Ceramic Capacitors
APPENDIXES
Approval Sheet
◙ Tape & reel dimensions
Size
01R5
Thickness
V
0.25
A0
B0
T
+/-0.05
0.45
+/-0.05
≦0.50
-
K0
W
8.00
+/-0.30
4.00
+/-0.10
P0
Fig. 2 The dimension of paper tape
40.00
10xP0
P1
+/-0.10
2.00
+/-0.05
2.00
+/-0.05
P2
1.50
D0
D1
E
+0.1/-0
-
1.75
+/-0.10
3.50
+/-0.05
F
Size
01R5
7”
Reel size
C
W1
A
13.0+0.5/-0.2
8.4+1.5/-0
178.0±1.0
60.0+1.0/-0
Fig. 3 The dimension of reel
N
◙ Example of customer label
a. Customer name
b. WTC order series and item number
c. Customer P/O
d. Customer P/N
e. Description of product
f. Quantity
g. Bar code including quantity & WTC P/N or customer
h. WTC P/N
i. Shipping date
j. Order bar code including series and item numbers
k. Serial number of label
*Customized label is available upon request
Page 7 of 8
ASC_Ultra Small_(01R5)_026F_AS
Dec. 2018
Multilayer Ceramic Capacitors
Approval Sheet
◙ Constructions
No.
1
2
3
4
5
Name
NP0
X7R, X5R
Ceramic material
Inner electrode
CaZrO3 based
BaTiO3 based
Ni
Cu
Ni
Inner layer
Termination
Middle layer
Outer layer
Sn (Matt)
Fig. 4 The construction of MLCC
◙ Storage and handling conditions
(1) To store products at 5 to 40°C ambient temperature and 20 to 70%. related humidity conditions.
(2) The product is recommended to be used within one year after shipment. Check solderability in case of shelf life
extension is needed.
Cautions:
a. The corrosive gas reacts on the terminal electrodes of capacitors, and results in the poor solderability.
Do not store the capacitors in the ambience of corrosive gas (e.g., hydrogen sulfide, sulfur dioxide,
chlorine, ammonia gas etc.)
b. In corrosive atmosphere, solderability might be degraded, and silver migration might occur to cause low
reliability.
c. Due to the dewing by rapid humidity change, or the photochemical change of the terminal electrode by
direct sunlight,the solderability and electrical performance may deteriorate. Do not store capacitors under
direct sunlight or dewing condition. To store products on the shelf and avoid exposure to moisture.
◙ Recommended soldering conditions
The lead-free termination MLCCs are not only to be used on SMT against lead-free solder paste, but also suitable
against lead-containing solder paste. If the optimized solder joint is requested, increasing soldering time, temperature and
concentration of N2 within oven are recommended.
Fig. 5 Recommended reflow soldering profile for SMT process
with SnAgCu series solder paste.
Page 8 of 8
ASC_Ultra Small_(01R5)_026F_AS
Dec. 2018
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